Automatic testing device for temperature characteristics of capacitor

Abstract

The invention discloses an automatic testing device for temperature characteristics of a capacitor, and relates to the technical field of capacitor performance testing. An automatic testing device for temperature characteristics of a capacitor comprises a testing cabinet, an accommodating cavity is arranged in the testing cabinet, a capacitor to be detected is arranged in the accommodating cavity, and the automatic testing device further comprises a temperature measuring box which is fixedly installed in the accommodating cavity; the temperature measuring unit is arranged in the temperature measuring box to form a modularized layered structure, the detection unit comprises a surface layer bin, a middle layer bin and a bottom layer bin, the layered structure design is adopted for the temperature measuring unit, when a capacitor is tested and heated, airflow flowing is restrained through rapid heat transfer of the bottom layer and heat preservation of the upper layer, and the good heat preservation effect is achieved; through the detachable structural design of the middle-layer bin, on one hand, the replacement and maintenance efficiency can be improved, and on the other hand, the balanced heat conduction and flowability can be effectively improved, and the uniform temperature effect of the heating test of the device is improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of capacitor performance testing, and particularly relates to an automatic testing device for the temperature characteristics of capacitors. Background Art

[0002] Capacitors are components widely used in electronic devices, and their temperature characteristics are one of the important indicators for evaluating the quality of capacitors. During the manufacturing and use of capacitors, in order to determine the relative change degree of the capacitance of the capacitor at different test temperatures with respect to the capacitance at the reference temperature, it is necessary to test the temperature characteristics of the capacitor in order to evaluate its quality and reliability.

[0003] In the prior art, for the temperature test of capacitors, some use a heating box for heating tests. Solid particles are arranged in the heating box to facilitate the positioning of the placed capacitors and at the same time facilitate the conduction and heat absorption of temperature. The capacitor to be detected is buried deep in the solid particles to suppress the interference of air flow and ensure a static constant temperature environment for the capacitor. However, in actual use, since most are filled with quartz sand particle materials, the thermal conductivity is relatively low, which may lead to a large local temperature gradient during heating or cooling, an increase in the deviation between the surface temperature of the capacitor and the set value, and a decrease in the test accuracy. For this reason, we propose an automatic testing device for the temperature characteristics of capacitors to solve the above-mentioned problems. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide an automatic testing device for the temperature characteristics of capacitors that can overcome the above problems or at least partially solve the above problems.

[0005] To solve the above technical problem, the basic concept of the technical solution adopted by the present invention is: an automatic testing device for the temperature characteristics of capacitors, including a test cabinet, an accommodation cavity is arranged inside the test cabinet, and the capacitor to be detected is arranged in the accommodation cavity. The device further includes: a temperature measurement box fixedly installed in the accommodation cavity; a temperature measurement unit arranged in the temperature measurement box to form a modular layered structure. Among them, the detection unit includes a surface layer bin, a middle layer bin, and a bottom layer bin; the middle layer bin adopts a separate detachable structure, and an adjustment component is arranged on the middle layer bin for periodically adjusting the arrangement of the medium particles in the middle layer bin; a vibration component is arranged on the side wall of the temperature measurement box for the fluidity of the medium in the temperature measurement unit.

[0006] Preferably, the interior of the surface layer bin is filled with hollow glass microspheres, and a nanofiber filter membrane is covered on the hollow glass microspheres. The diameter of the hollow glass microspheres is 0.1 mm.

[0007] Preferably, the middle layer bin is filled with mixed quartz sand and magnetic ceramic microspheres. Nano anti-static coatings are provided on the surfaces of both the mixed quartz sand and the magnetic ceramic microspheres. The diameter of the mixed quartz sand is 0.5 - 1 mm, and the diameter of the magnetic ceramic microspheres is 0.1 mm.

[0008] Preferably, the bottom layer bin is filled with ceramic ball particles and SMA particles. The diameter of the ceramic balls is 0.5 mm, and the diameter of the SMA particles is 0.5 - 1 mm.

[0009] Preferably, the middle layer bin includes a storage box slidably connected to the inner wall of the temperature measurement box. A connecting block is fixedly connected to the top of the storage box. Through holes are provided on the upper and lower surfaces of the storage box. A feed door is rotatably connected to the top surface of the storage box through a hinge. A limiting ring is attached to the bottom surface of the storage box, and a fixing ring is fixed to the top of the storage box.

[0010] Preferably, a connecting block is fixed to the top surface of the fixing ring. A limiting groove is provided on one side surface of the connecting block. A pulling rod is slidably connected to the inner wall of the connecting block. A clamping block is fixed to one end of the pulling rod. The clamping block is slidably connected in the limiting groove. A compression spring is fixed between the clamping block and the limiting groove. The compression spring is sleeved on the surface of the pulling rod. Clamping grooves are provided on the inner walls of both sides of the temperature measurement box.

[0011] Preferably, a driving part is installed on the temperature measurement box. A sensor is installed on the inner wall of the storage box of the middle layer bin. A controller is installed on the outer wall of the temperature measurement box. The controller is electrically connected to the driving part and the sensor.

[0012] Preferably, magnetic coils are installed on the inner wall of the storage box at equal intervals. The magnetic coils are electrically connected to the controller and are adapted to the medium particles in the middle layer bin.

[0013] Preferably, the vibration assembly includes a card seat installed in the bottom layer bin through a buckle. A groove is provided on the top surface of the card seat. A capacitor is installed in the groove. A fixed iron sleeve is sleeved on the surface of the capacitor. An electromagnetic block is embedded in the inner wall of the groove. The electromagnetic block is electrically connected to the controller through a wire.

[0014] Preferably, an exhaust fan is provided on the test cabinet. A heat conduction film is installed on the bottom inner wall of the temperature measurement box. One end of the heat conduction film penetrates through the temperature measurement box to the outside and is electrically connected to the heating system in the test cabinet.

[0015] After adopting the above technical solution, the present invention has the following beneficial effects compared with the prior art: In the present invention, by adopting a hierarchical structure design for the temperature measurement unit, when the capacitor is being tested and heated, heat is rapidly transferred through the bottom layer, and the upper layer insulates heat to suppress air flow, achieving a very good heat preservation effect. Through the detachable structure design of the middle layer bin, on the one hand, the replacement and maintenance efficiency can be improved, and on the other hand, the balance between heat conduction and fluidity can be effectively increased, improving the uniform temperature effect of the device during heating and testing.

[0016] In the present invention, through the setting of the vibration assembly, the particles filled in the temperature measurement box can be vibrated to make them loose, breaking the densification of the particles, effectively preventing the occurrence of dense caking of the particles, reducing the damage to the extended pins of the capacitor. At the same time, through linkage control, it can assist in limiting the capacitor buried in the particles to prevent it from toppling, and is applicable to high-precision testing and industrial automation scenarios. Description of the Drawings

[0017] In the drawings: Figure 1 is the overall structural schematic diagram of an automatic test device for the temperature characteristics of a capacitor proposed by the present invention; Figure 2 is the side cross-sectional structural schematic diagram of an automatic test device for the temperature characteristics of a capacitor proposed by the present invention; Figure 3 is the partial top-view three-dimensional structural schematic diagram of the temperature measurement box proposed by the present invention; Figure 4 is the side cross-sectional structural schematic diagram of the temperature measurement box in an automatic test device for the temperature characteristics of a capacitor proposed by the present invention; Figure 5 proposed by the present invention Figure 4 is the enlarged structural schematic diagram of area A; Figure 6 is the partial three-dimensional structural schematic diagram of the middle layer bin proposed by the present invention; Figure 7 is the partial cross-sectional structural schematic diagram of the temperature measurement box in an automatic test device for the temperature characteristics of a capacitor proposed by the present invention; Figure 8 is the partial three-dimensional structural schematic diagram of the capacitor and the card seat proposed by the present invention.

[0018] In the figure: 1, test cabinet; 2, accommodation cavity; 3, temperature measurement box; 41, bottom layer bin; 42, middle layer bin; 421, storage box; 422, fixing ring; 423, connecting block; 424, pulling rod; 425, clamping block; 426, extrusion spring; 427, limiting groove; 428, clamping groove; 429, through hole; 4291, feeding door; 43, surface layer bin; 44, limiting ring; 5, capacitor; 61, driving part; 62, controller; 63, magnetic coil; 64, sensor; 7, card seat; 71, groove; 72, electromagnetic block; 73, fixed iron sleeve; 8, exhaust fan; 9, heat conduction film. Specific implementation manner

[0019] The following further describes the present invention in detail with reference to the drawings and embodiments, so that those skilled in the art can implement it according to the description in the specification.

[0020] It should be understood that terms such as "having", "comprising", and "including" used herein do not exclude the presence or addition of one or more other elements or their combinations.

[0021] In the description of the present invention, the orientation or positional relationship indicated by terms such as "transverse", "longitudinal", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention.

[0022] Example 1: Refer to Figures 1 - 8 , an automatic test device for the temperature characteristics of a capacitor, including a test cabinet 1. An accommodation cavity 2 is arranged inside the test cabinet 1. A capacitor 5 to be detected is arranged in the accommodation cavity 2. It further includes: a temperature measurement box 3, fixedly installed in the accommodation cavity 2; a temperature measurement unit, arranged in the temperature measurement box 3 to form a modular layered structure. Among them, the detection unit includes a surface layer bin 43, a middle layer bin 42, and a bottom layer bin 41; the middle layer bin 42 adopts a separate detachable structure, and an adjustment component is arranged on the middle layer bin 42 for periodically adjusting the arrangement of the medium particles in the middle layer bin 42; a vibration component is arranged on the side wall of the temperature measurement box 3 for testing the fluidity of the medium in the temperature measurement unit. An exhaust fan 8 is arranged on the test cabinet 1, and a heat conduction film 9 is installed on the bottom inner wall of the temperature measurement box 3. One end of the heat conduction film 9 penetrates through the temperature measurement box 3 to the outside and is electrically connected to the heating system in the test cabinet 1.

[0023] This device mainly includes a test cabinet 1, a receiving cavity 2, a temperature measurement box 3 and a hierarchical detection unit. During testing, the capacitor 5 to be tested is placed in the dielectric particles of the bottom layer bin 41. Through the rapid heat conduction of the bottom layer bin 41 and the heat preservation of the surface layer bin 43 to inhibit air flow, combined with the dynamic regulation of the vibration component on the dielectric particles, uniform heating and accurate temperature measurement are achieved. Each component works together to meet the high-efficiency and high-precision requirements in industrial automation scenarios. The setting of the bottom layer bin 41 effectively shortens the heating response time, ensures that the bottom of the capacitor 5 reaches the target temperature first, and simulates the thermal stress in the actual working condition. The middle layer bin 42 is a detachable structure and can be disassembled separately during later maintenance, greatly improving the work efficiency of particle replacement and repair. Moreover, the particles filled inside can be automatically arranged according to the measured temperature during the use of the device, which can effectively increase the balance of heat conduction and fluidity and improve the uniform temperature effect of the device heating test. A vibration component is also installed on the temperature measurement box 3. When arranging the particles in the middle layer bin 42, the particles filled in the temperature measurement box 3 can also be vibrated to make them loose, breaking the densification of the particles and effectively preventing the occurrence of particle densification and caking, reducing the damage to the pins extending from the capacitor 5. At the same time, through linkage control, it can assist in limiting the capacitor 5 buried deep in the particles to prevent tipping. It is suitable for high-precision testing and industrial automation scenarios. During testing, after the heat conduction film 9 is powered on, it can heat the bottom of the bottom layer bin 41, and then heat up and test the capacitor 5. The capacitor 5 is pre-placed in the bottom layer bin 41, then the particles in the bottom layer bin 41 are filled, then the middle layer bin 42 is placed, and the particles in the middle layer bin 42 are filled. The pins of the capacitor 5 penetrate the middle layer bin 42 and extend to the upper part. Finally, the particles in the surface layer bin 43 are filled. The extended pins of the capacitor 5 are connected to the test interface on the test cabinet 1 through elastic contact blocks to avoid affecting the detection of the capacitor 5 under the vibration state.

[0024] Example 2: Refer to Figure 4 , Figure 5 and Figure 6 , which is basically the same as Example 1. Furthermore: The inside of the surface layer bin 43 is filled with hollow glass microspheres, and a nanofiber filter membrane is covered on the hollow glass microspheres. The diameter of the hollow glass microspheres is 0.1 mm. The middle layer bin 42 is filled with a mixture of quartz sand and magnetic ceramic microspheres. Nano anti-static coatings are provided on the surfaces of both the mixture of quartz sand and magnetic ceramic microspheres. The diameter of the mixture of quartz sand is 0.5 - 1 mm, and the diameter of the magnetic ceramic microspheres is 0.1 mm. The bottom layer bin 41 is filled with ceramic ball particles and SMA particles. The diameter of the ceramic balls is 0.5 mm, and the diameter of the SMA particles is 0.5 - 1 mm.

[0025] Among them, the bottom layer bin 41 is filled with ceramic ball particles with a diameter of 0.5 mm and shape memory alloy SMA particles with a diameter of 0.5 - 1 mm. The ceramic balls have a high thermal conductivity and can quickly absorb the heat of the heating system at the bottom of the temperature measuring box 3 and conduct it to the middle layer. The SMA particles undergo a phase change at a specific temperature, and the micro-motion effect generated by the volume change can enhance the fluidity of the medium and assist in heat diffusion. The combination of the two realizes rapid heating of the bottom layer and uniform heat transfer, providing a stable heat source for the middle layer. The surface layer bin 43 is filled with hollow glass microspheres with a diameter of 0.1 mm, covered with a nanofiber filter membrane. The hollow structure reduces the heat conductivity and forms a heat insulation layer. The nanofiber filter membrane further inhibits the diffusion of gas molecules and reduces the internal and external air flow exchange. This layer restricts the upward loss of heat and avoids the interference of the external environmental air flow on the test. The middle layer bin 42 is filled with mixed quartz sand with a diameter of 0.5 - 1 mm and magnetic ceramic microspheres with a diameter of 0.1 mm, and the surface is covered with a nano anti-static coating. The high specific heat capacity of the quartz sand enables it to have a heat storage capacity and delays the temperature fluctuation. The magnetic microspheres can be arranged in an orderly manner under the drive of the external magnetic coil 63 to form a dynamic heat conduction path. The top of the storage box 421 is connected to the feed door 4291 by a hinge, which is convenient for filling the particles in the middle layer bin 42. Through holes 429 and card slots 428 are provided on the side wall. Cooperating with the pull rod 424 and the block 425, the sliding and locking of the storage box 421 along the inner wall of the temperature measuring box 3 can be realized.

[0026] It should be noted that the aperture of the through hole 429 is larger than the pin diameter of the capacitor 5, which is convenient for the pins to penetrate through the through hole 429. Although the particles in the middle layer bin 42 will fall to the bottom layer bin 41 due to vibration, after the 5 mm ceramic balls and 0.5 mm - 1 mm SMA particles in the bottom layer are mixed, a stable support layer can be formed through vibration compaction. At the same time, the SMA particles provide dynamic damping in the gaps, providing a more stable lateral support for the placed capacitor 5. Although some particles in the middle layer bin 42 will enter the bottom layer bin 41, during subsequent maintenance, it can be efficiently solved through structured isolation and rapid maintenance tools, taking into account functionality and maintenance convenience, and effectively improving the maintenance efficiency of maintenance personnel.

[0027] The middle layer bin 42 includes a storage box 421 slidably connected to the inner wall of the temperature measuring box 3. A connecting block 423 is fixedly connected to the top of the storage box 421. Through holes 429 are provided on the upper and lower surfaces of the storage box 421. A feed door 4291 is rotatably connected to the top surface of the storage box 421 through a hinge. A limiting ring 44 is attached to the bottom surface of the storage box 421. A fixing ring 422 is fixed to the top of the storage box 421. A connecting block 423 is fixed to the top surface of the fixing ring 422. A limiting groove 427 is provided on one side surface of the connecting block 423. A pulling rod 424 is slidably connected to the inner wall of the connecting block 423. A clamping block 425 is fixed to one end of the pulling rod 424. The clamping block 425 is slidably connected in the limiting groove 427. An extrusion spring 426 is fixed between the clamping block 425 and the limiting groove 427. The extrusion spring 426 is sleeved on the surface of the pulling rod 424. Card slots 428 are provided on the inner walls of both sides of the temperature measuring box 3.

[0028] When installing the middle layer bin 42, through the provided limiting ring 44, the bottom of the placed storage box 421 can be limited. After placing the storage box 421, the particles in the middle layer bin 42 can be filled into it by manually opening the feed door 4291. Manually pull the pulling rod 424 to drive the clamping block 425 to move, and use the elastic force of the extrusion spring 426 to extrude and clamp it inside the card slot 428, thereby facilitating the overall clamping and limiting of the middle layer bin 42 inside the temperature measuring box 3, preventing the middle layer bin 42 from shifting and loosening during use, and thus ensuring the stability of the structure. On the other hand, when repairing and replacing the particles, after clearing the particles in the surface layer bin 43, the restriction of the storage box 421 can be manually released, and the storage box 421 can be taken out for replacement and removal without completely disassembling, saving repair time and improving work efficiency. Moreover, the separate pull-out design avoids the over-accumulation of particles from causing extrusion damage to the capacitor 5.

[0029] Example 3: Refer to Figure 3 、 Figure 4 、 Figure 5 and Figure 8 ,which is basically the same as Example 2. Furthermore: A driving part 61 is installed on the temperature measuring box 3. A sensor 64 is installed on the inner wall of the storage box 421 of the middle layer bin 42. A controller 62 is installed on the outer wall of the temperature measuring box 3. The controller 62 is electrically connected to the driving part 61 and the sensor 64. Magnet coils 63 are installed on the inner wall of the storage box 421 at equal intervals. The magnet coils 63 are electrically connected to the controller 62. The magnet coils 63 are adapted to the medium particles in the middle layer bin 42. The vibration assembly includes a card seat 7 installed in the bottom layer bin 41 through a buckle. A groove 71 is provided on the top surface of the card seat 7. The capacitor 5 is installed in the groove 71. A fixed iron sleeve 73 is sleeved on the surface of the capacitor 5. An electromagnetic block 72 is embedded in the inner wall of the groove 71. The electromagnetic block 72 is electrically connected to the controller 62 through a wire.

[0030] Among them, a plurality of sensors 64 are evenly distributed in the middle layer bin 42. The sensors 64 are detected using the common NTC model, and the temperature distribution state of the filled particles at the middle layer bin 42 is monitored in real time and fed back to the controller 62. When the temperature difference exceeds the set threshold range, the drive unit 61 is controlled to start by the controller 62. The drive unit 61 is driven by a vibration motor instead. The drive unit 61 drives the eccentric wheel to rotate at high speed, generating high-frequency vibration to vibrate the multi-layer particles filled in the temperature measurement box 3. On the one hand, it can effectively prevent the particles filled inside from being compacted, maintain the flowing state of the particles, and improve the flowing effect of heat conduction. On the other hand, the gaps between the multi-layer particles are supplemented by vibration, improving the efficiency of heat conduction, and it can also play a good protective effect on the pins at the capacitor 5, avoiding the extrusion damage to the pins caused by the compaction of the particle size. At this time, the controller 62 can also control the magnetic coil 63 to be energized. After being energized, an alternating magnetic field is generated to drive the microbeads to be periodically arranged / dispersed, promoting heat diffusion and improving the temperature uniformity.

[0031] When the drive unit 61 vibrates, the electromagnetic block 72 can be controlled to be pulsed and energized by the controller 62 to adsorb and fix the iron sleeve 73, thereby fixing and limiting the capacitor 5. When in the vibration state, it prevents the capacitor 5 from tilting and displacing, avoiding the occurrence of local overheating or temperature measurement error caused by tilting, and further improving the accuracy of temperature measurement. Among them, the fixed iron sleeve 73 is made of a magnet-containing material. In the test installation stage, the capacitor 5 is clamped in the groove 71 on the card seat 7, which can play a preliminary limiting effect on the capacitor 5 and facilitate subsequent particle filling.

[0032] It should be noted that some of the magnetic coils 63 can also be installed on the inner wall of the bottom layer bin 41. When the particles in some of the middle layer bins 42 fall into the bottom layer bin 41, the distribution state of the microbead particles in the bottom layer bin 41 is changed by the magnetic coil 63, improving the overall temperature equalization effect of the device for temperature measurement of the capacitor 5. And three drive units 61 can be installed at the same time. The other two are respectively installed on the opposite side walls of the drive unit 61 and the outer wall of the bottom of the temperature measurement box 3, so as to achieve a better vibration effect on the internally filled particles according to actual needs.

[0033] The above embodiments only represent several implementation manners of the present invention. The description is relatively specific and detailed, but it cannot be understood as a limitation on the scope of the invention patent. It should be pointed out that for those of ordinary skill in the art, without departing from the concept of the present invention, several deformations and improvements can be made. These are all equivalent modifications and evolutions of the above embodiments based on the essence of the present invention, and these all belong to the protection scope of the present invention.

Claims

1. An automatic test device for the temperature characteristics of a capacitor, comprising a test cabinet (1), an accommodation cavity (2) is arranged inside the test cabinet (1), and a capacitor (5) to be detected is arranged in the accommodation cavity (2), characterized in that, It further includes: a temperature measurement box (3), fixedly installed in the accommodation cavity (2); a temperature measurement unit, arranged in the temperature measurement box (3) to form a modular layered structure, wherein the detection unit includes a surface layer bin (43), a middle layer bin (42) and a bottom layer bin (41); the middle layer bin (42) adopts a separate detachable structure, and an adjustment component is arranged on the middle layer bin (42) for periodically adjusting the arrangement of the medium particles in the middle layer bin (42); a vibration component, arranged on the side wall of the temperature measurement box (3) for the fluidity of the medium in the temperature measurement unit.

2. The automatic testing device for the temperature characteristics of a capacitor according to claim 1, characterized in that, The interior of the surface layer bin (43) is filled with hollow glass microspheres, and a nanofiber filter membrane is covered on the hollow glass microspheres, and the diameter of the hollow glass microspheres is 0.1 mm.

3. An automatic test device for the temperature characteristics of a capacitor according to claim 1, characterized in that, The middle layer bin (42) is filled with a mixture of quartz sand and magnetic ceramic microspheres, and nano anti-static coatings are arranged on the surfaces of the mixture of quartz sand and magnetic ceramic microspheres. The diameter of the quartz sand is 0.5 - 1 mm, and the diameter of the magnetic ceramic microspheres is 0.1 mm.

4. An automatic test device for the temperature characteristics of a capacitor according to claim 1, characterized in that, The bottom layer bin (41) is filled with ceramic ball particles and SMA particles. The diameter of the ceramic balls is 0.5 mm, and the diameter of the SMA particles is 0.5 - 1 mm.

5. The automatic test device for the temperature characteristics of a capacitor according to claim 3, wherein, The middle layer bin (42) includes a storage box (421) slidably connected to the inner wall of the temperature measurement box (3). A connection block (423) is fixedly connected to the top of the storage box (421). Through holes (429) are formed in the upper and lower surfaces of the storage box (421). A feed door (4291) is rotatably connected to the top surface of the storage box (421) through a hinge. A limiting ring (44) is attached to the bottom surface of the storage box (421). A fixing ring (422) is fixed to the top of the storage box (421).

6. An automatic test device for the temperature characteristics of a capacitor according to claim 5, characterized in that, A connection block (423) is fixed to the top surface of the fixing ring (422). A limiting groove (427) is formed in one side surface of the connection block (423). A pull rod (424) is slidably connected to the inner wall of the connection block (423). A clamping block (425) is fixed to one end of the pull rod (424). The clamping block (425) is slidably connected in the limiting groove (427). An extrusion spring (426) is fixed between the clamping block (425) and the limiting groove (427). The extrusion spring (426) is sleeved on the surface of the pull rod (424). Claw slots (428) are formed in the inner walls on both sides of the temperature measurement box (3).

7. An automatic test device for the temperature characteristics of a capacitor according to claim 6, characterized in that, A driving part (61) is installed on the temperature measurement box (3). A sensor (64) is installed on the inner wall of the storage box (421) of the middle layer bin (42). A controller (62) is installed on the outer wall of the temperature measurement box (3). The controller (62) is electrically connected to the driving part (61) and the sensor (64).

8. An automatic test device for the temperature characteristics of a capacitor according to claim 7, characterized in that, Magnetic coils (63) are installed on the inner wall of the storage box (421) at equal intervals. The magnetic coils (63) are electrically connected to the controller (62). The magnetic coils (63) are adapted to the medium particles in the middle layer bin (42).

9. The automatic test device for the temperature characteristics of a capacitor according to claim 8, characterized in that, The vibration component includes a card seat (7) installed in the bottom bin (41) through a buckle. A groove (71) is formed on the top surface of the card seat (7). A capacitor (5) is installed in the groove (71). A fixed iron sleeve (73) is sleeved on the surface of the capacitor (5). An electromagnetic block (72) is embedded in the inner wall of the groove (71). The electromagnetic block (72) is electrically connected to the controller (62) through a wire.

10. An automatic test device for the temperature characteristics of a capacitor according to claim 1, characterized in that, An exhaust fan (8) is provided on the test cabinet (1). A heat conduction film (9) is installed on the bottom inner wall of the temperature measurement box (3). One end of the heat conduction film (9) penetrates through the temperature measurement box (3) to the outside and is electrically connected to the heating system in the test cabinet (1).

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