A diode chip high temperature electrical resistance test device and use method

Abstract

The present invention relates to the field of chip testing technology, specifically to a diode chip high-temperature electrical resistance test device and a method for use, comprising a test cabinet with a built-in chip mounting rack, and a cabinet door rotatably provided on the front of the test cabinet, a top plate fixedly provided on the inner top of the test cabinet, and a slide with a groove slidably connected to the top plate, and a pull rod with a hook provided on the inner side of the cabinet door. This diode chip high-temperature electrical resistance test device and method for use automatically controls the rotational movement of the isolation cover through a mechanical linkage device, forming a dynamic thermal barrier when the cabinet door is opened and closed, effectively separating the high-temperature test area and the operating area, maintaining the temperature stability of each area, and the movement of the isolation cover is synchronously linked with the opening and closing of the cabinet door to ensure that the high-temperature area is always physically isolated during operation, reducing the risk of personnel contacting the high-temperature surface. The system minimizes the heat loss area through precise positioning of the isolation cover, reduces the demand for heat energy replenishment during repeated testing, and improves overall energy efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a high-temperature electrical resistance testing device for a diode chip and a method for using the same. Background Art

[0002] As a core component in electronic devices, diode chips' high-temperature electrical resistance directly impacts device reliability. During chip manufacturing, high-temperature, live-current testing is required to simulate extreme operating conditions and screen out defective products. Traditional testing equipment often utilizes a closed, high-temperature chamber structure, but this presents the following technical bottlenecks in practical applications:

[0003] Inadequate safety protection: Existing equipment often uses manual door locking mechanisms, lacking dynamic interlocking with the test status. If the door accidentally opens due to vibration or misoperation during testing, high-temperature gases and arcs can easily leak out, posing serious burns and electrical safety hazards.

[0004] In view of this, we propose a diode chip high temperature electrical resistance testing device and its use method. Summary of the Invention

[0005] The object of the present invention is to provide a diode chip high-temperature electrical resistance test device and a method of use, so as to solve the problem of insufficient safety protection raised in the above-mentioned background technology. In order to achieve the above-mentioned purpose, the present invention provides the following technical solutions: a diode chip high-temperature electrical resistance test device, comprising a test cabinet with a built-in chip mounting rack, and a cabinet door is rotatably provided on the front of the test cabinet, a top plate is fixedly provided on the inner top of the test cabinet, and a slide with a groove is slidably connected to the top plate, a pull rod with a hook is provided on the inner side of the cabinet door, and the hook body at the end of the pull rod is slidably connected in the slide, when the cabinet door is opened outward, the pull rod drives the slide to move, a rack is fixedly connected to the slide, a gear is rotatably provided on the top plate, and the axle of the gear passes through the top plate and is fixedly connected to an isolation cover with a semi-cylindrical structure, and sealing edges that fit the isolation cover are fixedly provided on both sides of the inner wall of the test cabinet.

[0006] Preferably, an L-shaped locking frame is fixedly provided on the inner side of the cabinet door, a vertical slide groove is opened on the inner wall of the test cabinet, and a card slot extends horizontally at the top of the slide groove, and a locking pin is slidably connected in the card slot and the slide groove, and when the locking pin moves down along the slide groove, it is engaged with the locking frame to lock the cabinet door.

[0007] The outer side wall of the test cabinet is mirror-imaged with a card slot and a slide slot, and the outer card slot and slide slot are slidably connected to a handle, and the handle and the locking pin are both provided with magnetic blocks that are magnetically connected to each other.

[0008] Preferably, an inner groove is opened in the door panel of the cabinet door, and the inner groove passes through the cabinet door and is aligned with the inner card slot. An inner plate is slidably connected in the inner groove, and the outer end of the inner plate is cut with a bevel. When the locking pin enters the card slot from the sliding groove, it squeezes the inner plate along the bevel to slide inward.

[0009] A through opening connected to the inner groove is provided at the top of the cabinet door, one end of the pull rod is inserted into the through opening, and a bayonet is provided at the plug-in end of the pull rod, the inner end of the inner plate is fixedly connected with a latch, and when the inner plate slides inward, the latch is inserted into the bayonet to lock the pull rod, and the inner groove forms an open gap toward the inner side of the cabinet door, and an operating handle is fixedly connected to the surface of the inner plate along the gap. A spare operating port is also provided on the outside of the cabinet door to prevent failure of the locking pin control.

[0010] Preferably, the rotation angle range of the isolation cover is 0°-180°, and when in a closed state, it forms a complete sealed cavity with the sealing edge.

[0011] The displacement stroke of the slide is linearly proportional to the opening and closing angle of the cabinet door. By limiting the rotation range of the isolation cover from 0° to 180° and dynamically cooperating with the sealing edge, the reliable closure of the sealed cavity is achieved. The linear linkage design of the slide stroke and the opening and closing angle of the cabinet door synchronizes the opening and closing of the isolation cover with the movement of the cabinet door. When the isolation cover is closed, it forms a complete sealed cavity with the sealing edge to prevent heat leakage during high-temperature testing and ensure the stability of the test environment. The linkage between the slide and the cabinet door realizes the automated process of "opening the door means opening the cover, and closing the door means closing the cover", which simplifies the operating steps and reduces human intervention.

[0012] Preferably, a multi-stage heating ring surrounding the chip mounting frame is provided inside the test cabinet and on the inner side of the isolation cover, and each stage of the heating ring is independently connected to the temperature control module.

[0013] The top plate is embedded with a temperature sensor, and the detection end of the temperature sensor extends to the inner cavity of the isolation cover.

[0014] The temperature control module dynamically adjusts the power of the heating ring based on feedback from the temperature sensor. It uses multi-stage independent temperature-controlled heating rings and embedded temperature sensors to achieve zoned temperature monitoring and dynamic power regulation. The multi-stage heating rings can set gradient temperatures for different areas of the chip to simulate complex operating conditions. The temperature control module adjusts the power in real time based on sensor feedback to avoid local overheating, improve temperature uniformity, and reduce test errors caused by uneven heat distribution. This makes it particularly suitable for high-precision electrical resistance performance evaluation.

[0015] Preferably, an explosion-proof pressure relief valve is provided on the back of the test cabinet.

[0016] A pressure-sensitive film is embedded inside the isolation cover, and an audible and visual alarm is triggered when the air pressure inside the cabinet exceeds 5kPa.

[0017] The bottom of the top plate is provided with an emergency exhaust shutter linked to the isolation cover, which integrates a pressure safety protection mechanism, including a pressure relief valve, a pressure sensing film and an emergency exhaust system. The pressure relief valve automatically opens to release pressure when overpressure occurs to prevent equipment from bursting. The pressure film triggers an audible and visual alarm to remind emergency shutdown. The emergency exhaust shutter is linked to the isolation cover to quickly reduce the cavity temperature and air pressure when the pressure is abnormal, avoiding chain failures and complying with industrial explosion-proof standards.

[0018] Preferably, the chip mounting frame adopts a quick-release guide rail structure, and its contact terminals are electrically connected through spring pins. The quick-release guide rail and spring pin structure design optimizes chip installation and electrical connection. The guide rail structure supports "plug-in" installation of chips, significantly improving test efficiency and being suitable for batch testing scenarios. The spring pins adapt to contact pressure to avoid poor contact caused by vibration or thermal expansion and contraction, ensuring stable test current.

[0019] A method for using a diode chip high-temperature electrical resistance test device comprises the following steps:

[0020] S1. After the chip is installed, close the cabinet door. The closed door panel pushes the locking pin in the card slot into the slide slot, causing it to slide down into the locking frame and lock the cabinet door, making it unable to be opened. The cabinet door can only be opened after the internal locking pin is pushed up by the external handle into the card slot and out of the locking frame.

[0021] S2. When the cabinet door is closed, the inner pull rod pushes the slide and rack to move, and drives the gear and isolation cover to rotate clockwise, so that the isolation cover cooperates with the sealing edge to separate the cabinet door from the high-temperature test area. When the cabinet door is opened, the isolation cover is controlled to reverse, exposing the mounting frame at the cabinet opening, thereby isolating most of the high-temperature area from the open cabinet opening;

[0022] S3. Before opening the cabinet door, unlock the locking pin according to the process and let it enter the slot. The locking pin will simultaneously squeeze the inner plate along the oblique edge and slide inward, so that the pin will be inserted into the slot to lock the pull rod on the cabinet door. At this time, the cabinet door will open and drive the isolation cover to separate the space inside the cabinet. If the cabinet door is opened without operating the locking pin, the inner plate will lack the locking pin control and the pull rod will not be locked on the cabinet door. Therefore, when the cabinet door is opened illegally, the isolation cover will not open.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] The present invention provides a double safeguard against accidental opening: when the cabinet door is closed, the locking pin is triggered to automatically fall into the L-shaped frame, forming a mechanical hard lock (the physical locking position is irreversible). Even if the equipment vibrates violently or the internal pressure suddenly changes (such as air pressure shock during testing), the cabinet door can be prevented from accidentally opening, avoiding the leakage of high-temperature / high-pressure media and causing safety accidents.

[0025] Positive operation forced locking: The door closing action is linked to the downward movement of the locking pin. The operator does not need to perform additional locking actions. The cabinet door is automatically locked when it is closed, eliminating the risk of unlocking the door due to human negligence, and meeting the requirements of industrial equipment safety interlock regulations.

[0026] In the present invention, the rotational movement of the isolation cover is automatically controlled by a mechanical linkage device, forming a dynamic thermal barrier when the cabinet door is opened and closed, effectively separating the high-temperature test area and the operation area, and maintaining the temperature stability of each area. The movement of the isolation cover is synchronized with the opening and closing of the cabinet door to ensure that the high-temperature area is always physically isolated during operation, reducing the risk of personnel contacting high-temperature surfaces. The system minimizes the heat loss area through precise positioning of the isolation cover, reduces the need for heat energy replenishment during repeated testing, and improves overall energy efficiency.

[0027] In the present invention, the mechanical interlocking system deeply integrates the operating process with the equipment safety protection through an innovative oblique guide design. When the operator unlocks the locking pin according to the standard process, the pin body moves precisely along the oblique groove, and simultaneously generates a radial component of force during the axial advancement process, pushing the inner plate to complete the lateral positioning, and finally making the pin accurately embedded in the pull rod bayonet, forming a triple mechanical constraint. This process establishes a closed-loop safety logic of "operation permission-mechanical response", ensuring that the isolation cover and the cabinet door opening actions are strictly synchronized. The system is specially designed with a failure protection mechanism to automatically cut off the transmission link under non-standard operation conditions, keep the isolation cover in a locked state, and effectively maintain the thermal seal integrity. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention;

[0029] Figure 2 This is a schematic structural diagram of the top plate and the test cabinet of the present invention;

[0030] Figure 3 For the present invention Figure 2 Enlarged view of point A in the middle;

[0031] Figure 4 An exploded view of the carriage, pull rod, rack and gear of the present invention;

[0032] Figure 5 This is a structural diagram of the test cabinet and isolation cover of the present invention;

[0033] Figure 6 This is a sectional view of the three-dimensional structure of the test cabinet of the present invention;

[0034] Figure 7 For the present invention Figure 6 Enlarged view of point B in the middle;

[0035] Figure 8 This is a sectional view of the three-dimensional structure of the cabinet door of the present invention;

[0036] Figure 9 For the present invention Figure 8 Enlarged view of point C in the middle;

[0037] Figure 10 This is a schematic structural diagram of the cabinet door and the locking frame of the present invention;

[0038] Figure 11 For the present invention Figure 10 Enlarged view of point D in the middle.

[0039] In the figure: 1. Test cabinet; 2. Mounting frame; 3. Cabinet door; 4. Top plate; 5. Slide; 6. Pull rod; 7. Rack; 8. Gear; 9. Isolation cover; 10. Sealing edge; 11. Locking frame; 12. Slide; 13. Slot; 14. Locking pin; 15. Handle; 16. Magnetic block; 17. Inner groove; 18. Bevel; 19. Inner plate; 20. Latch; 21. Through hole; 22. Bayonet. DETAILED DESCRIPTION

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technical personnel in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0041] See also Figures 1 to 11 The present invention provides a technical solution: a diode chip high temperature electrical resistance test device

[0042] Structural composition:

[0043] 1. Test cabinet 1 main body

[0044] A chip mounting rack 2 is provided inside and a rotating cabinet door 3 is provided on the front.

[0045] The inner top is fixed with a top plate 4 and is slidably connected to a slotted slide 5.

[0046] The inner walls on both sides are provided with sealing edges 10 which fit the isolation cover 9 and are made of high-temperature resistant silicone material.

[0047] 2. Linkage Isolation System

[0048] A pull rod 6 with a hook is provided on the inner side of the cabinet door 3 , and the hook body is slidably connected to the groove of the slide 5 .

[0049] The carriage 5 fixes the rack 7 , and the axle of the gear 8 passes through the top plate 4 and is connected to the semi-cylindrical isolation cover 9 .

[0050] When the S2-linked cabinet door 3 is closed, the inner pull rod 6 pushes the slide 5 to move horizontally, the rack 7 drives the gear 8 to rotate clockwise, and the isolation cover 9 covers the test area, forming a high-temperature isolation cavity with the sealing edge 10. When the cabinet door 3 is opened, the movement is reversed, the isolation cover 9 reverses and retracts, and the chip mounting rack 2 is exposed at the cabinet opening.

[0051] 3. Double locking mechanism

[0052] An L-shaped locking frame 11 is fixed on the inner side of the cabinet door 3 , and a vertical sliding groove 12 and a horizontal locking groove 13 are opened on the inner side wall of the test cabinet 1 .

[0053] The locking pin 14 slides in the sliding groove 12 / the locking groove 13 , and the external handle 15 and the locking pin 14 are magnetically linked via the magnet 16 .

[0054] When S1 locks the cabinet door 3 and closes it, the door panel presses the locking pin 14 down along the slide groove 12, and the locking pin 14 snaps into the L-shaped locking frame 11 to lock the cabinet door 3. The door can then be unlocked and opened only after the external handle 15 is pushed upward to drive the locking pin 14 into the slot 13 and out of the locking frame 11.

[0055] During S3 linkage unlocking, the locking pin 14 slides inward along the inner groove 17 of the cabinet door 3, pressing the inner plate 19 with the oblique opening 18. The inner plate 19 latch 20 is inserted into the slot 22 of the pull rod 6, and the locking pull rod 6 moves synchronously with the cabinet door 3.

[0056] 4. Safety redundancy design

[0057] The inner groove 17 of the cabinet door 3 is slidably connected to the inner plate 19 with an oblique opening 18. The end of the inner plate 19 is provided with an operating handle and a spare operating port.

[0058] S3 Anti-accidental opening If the locking pin 14 is not unlocked according to the process and the latch 20 of the inner plate 19 is not triggered, the pull rod 6 and the slide 5 will be disconnected when the cabinet door 3 is opened - the isolation cover 9 remains closed to avoid exposure to high temperature areas.

[0059] The isolation cover 9 and the sealing edge 10 form a physical isolation layer to reduce the risk of heat conduction.

[0060] Run a logic closed loop‌

[0061] 1. Compliance Operations

[0062] Close the cabinet door 3 - trigger the locking pin 14 to slide down and lock S1 - link the isolation cover 9 to close the test area S2 - when unlocking, the locking pin 14 synchronously locks the pull rod 6 S3 - after opening the door, the isolation cover 9 automatically separates the high temperature area.

[0063] 2. Fault tolerance for illegal operations

[0064] Forcefully open the cabinet door 3 - the pull rod 6 is separated from the slide 5 - the isolation cover 9 remains closed - the high temperature area protection does not fail. Example

[0065] 1. Equipment startup preparation

[0066] Pre-inspection process:

[0067] Check the lubrication status of the slide 12;

[0068] Verify the magnetic attraction of the locking pin 14;

[0069] The test isolation cover 9 is limited to rotate 180°±2°.

[0070] Chip loading:

[0071] Before opening the cabinet door 3, make sure that the handle 15 is in the unlocked position;

[0072] Push the chip mounting rack 2 to the "LOAD" mark;

[0073] Do not directly touch metal parts in high temperature areas.

[0074] 2. Standard operating procedures

[0075] Steps Operation Points Safety Verification:

[0076] 1. After you hear a "click" sound when closing and locking the door, manually pull the door 3 to verify that the locking pin 14 is completely locked.

[0077] 2. Confirm through the observation window that the isolation cover 9 completely covers the test area sealing edge 10 with no visible gaps;

[0078] 3. To unlock and open the door, first push up the handle 15 to the limit point and then pull the cabinet door 3. The isolation cover 9 should retract synchronously.

[0079] 3. Exception handling

[0080] Mechanical failure:

[0081] When the cabinet door 3 is stuck: manually reset the inner plate 19 through the spare operation port;

[0082] Isolation cover 9 stops rotating: immediately cut off the power supply and use the cooling air pump.

[0083] Emergency unlock:

[0084] Use the special tool with hexagon socket to rotate the emergency gear 8 axis;

[0085] After forced unlocking, the damaged sealing edge 10 needs to be replaced.

[0086] The above shows and describes the basic principles, main features and advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely preferred examples of the present invention and are not intended to limit the present invention. Various changes and modifications may be made to the present invention without departing from the spirit and scope of the present invention, and such changes and modifications fall within the scope of the present invention. The scope of protection claimed in the present invention is defined by the appended claims and their equivalents.

Claims

1. A diode chip high temperature electrical resistance test device, characterized in that: include: A test cabinet (1) having a chip mounting frame (2) disposed therein and having a cabinet door (3) connected thereto by rotating the front side; A top plate (4) is fixedly arranged on the top of the test cabinet (1), and its surface is slidably connected to the grooved slide (5); A pull rod (6) is arranged on the inner side of the cabinet door (3), and a hook body is provided at the end thereof for sliding engagement with the slide (5); A linkage mechanism comprising a rack (7) fixed to the carriage (5), a gear (8) rotatably connected to the top plate (4), and a semi-cylindrical isolation cover (9) connected to the gear (8) via a wheel shaft; Sealing edges (10) are arranged in pairs on both sides of the inner wall of the test cabinet (1) and form a dynamic seal with the isolation cover (9); An L-shaped locking frame (11) is provided on the inner side of the cabinet door (3), and a vertical sliding groove (12) and a horizontally extending card slot (13) are provided on the inner side wall of the test cabinet (1); The locking pin (14) is slidably disposed in the slide groove (12) and the clamping groove (13); The handle (15) is slidably connected to the outer wall of the test cabinet (1) through a mirror-image sliding groove (12) and a clamping groove (13); The locking pin (14) and the handle (15) form a magnetic linkage via the magnetic block (16); The cabinet door (3) has an inner groove (17) extending therethrough, into which an inner plate (19) with an oblique opening (18) is slidably connected; The inner end of the inner plate (19) is connected to the latch (20), and the outer end is provided with an operating handle; The top of the cabinet door (3) is provided with a through opening (21) communicating with the inner groove (17), and the plug-in end of the pull rod (6) is provided with a bayonet (22) cooperating with the latch (20).

2. The diode chip high temperature electrical resistance test equipment according to claim 1, characterized in that: The rotation angle range of the isolation cover (9) is 0°-180°, and when in a closed state, it forms a complete sealed cavity with the sealing edge (10); The displacement stroke of the slide (5) is in a linear proportional relationship with the opening and closing angle of the cabinet door (3).

3. The diode chip high temperature electrical resistance test equipment according to claim 2, characterized in that: A multi-stage heating ring surrounding the chip mounting frame (2) is provided inside the test cabinet (1) and on the inner side of the isolation cover (9), and each stage of the heating ring is independently connected to a temperature control module; The top plate (4) is embedded with a temperature sensor, the detection end of which extends to the inner cavity of the isolation cover (9); The temperature control module dynamically adjusts the power of the heating ring according to the feedback data from the temperature sensor.

4. The diode chip high temperature electrical resistance test equipment according to claim 3, characterized in that: The back of the test cabinet (1) is provided with an explosion-proof pressure relief valve; A pressure-sensitive film is embedded inside the isolation cover (9), and an audible and visual alarm is triggered when the air pressure inside the cabinet exceeds 5 kPa; An emergency exhaust shutter linked to the isolation cover (9) is provided at the bottom of the top plate (4).

5. The diode chip high temperature electrical resistance test equipment according to claim 4, characterized in that: The chip mounting frame (2) adopts a quick-release guide rail structure, and its contact terminals are electrically connected via spring pins.

6. A method for using a diode chip high temperature electrical resistance test device, using the diode chip high temperature electrical resistance test device according to claim 5, characterized in that: The steps include: S1. After the chip is installed, the cabinet door (3) is closed. The closed door panel pushes the locking pin (14) in the card slot (13) into the slide slot (12), causing it to slide down into the locking frame (11) and lock the cabinet door (3) so that it cannot be opened. After the internal locking pin (14) is pushed up by the external handle (15) into the card slot (13) and separated from the locking frame (11), the cabinet door (3) can be opened; S2. When the cabinet door (3) is closed, the inner pull rod (6) pushes the slide (5) and the rack (7) to move, and drives the gear (8) and the isolation cover (9) to rotate clockwise, so that the isolation cover (9) cooperates with the sealing edge (10) to separate the cabinet door (3) from the high-temperature test area. When the cabinet door (3) is opened, the isolation cover (9) is controlled to reverse, and the mounting frame (2) is exposed at the cabinet opening, so as to separate most of the high-temperature area from the opened cabinet opening; S3. Before opening the cabinet door (3), unlock the locking pin (14) according to the process and enter the card slot (13). The locking pin (14) simultaneously presses the inner plate (19) along the bevel (18) to slide inward, so that the latch (20) is inserted into the card slot (22) to lock the pull rod (6) on the cabinet door (3). At this time, the cabinet door (3) is opened to drive the isolation cover (9) to separate the space inside the cabinet. If the cabinet door (3) is opened without operating the locking pin (14), the inner plate (19) lacks the control of the locking pin (14), and the pull rod (6) will not be locked on the cabinet door (3). Therefore, when the cabinet door (3) is opened illegally, the isolation cover (9) will not be opened.

Images