Dynamic correction method and system for metering equipment

Abstract

The invention relates to the technical field of weighing, in particular to a dynamic correction method and system for metering equipment, and the method comprises the steps: obtaining the jitter data of the metering equipment during the weighing period in real time; carrying out data fusion on the jitter data by adopting an envelope line extraction algorithm to obtain vibration attenuation trend characteristics; obtaining an attenuation curve according to the vibration attenuation trend characteristics in combination with the real-time weighing result; obtaining de-attenuation jitter data according to the jitter data and the vibration attenuation trend characteristics, and fitting the de-attenuation jitter data by adopting a least square method to obtain a target function; determining whether the metering equipment needs to be corrected currently according to comparison results of the target function, the attenuation curve and a standard target function and a standard attenuation curve preset by the system; if yes, dynamically correcting the metering equipment; according to the invention, the problem that measurement errors occur in the use process of the metering equipment due to the fact that the metering equipment cannot be dynamically calibrated in real time in a traditional metering equipment calibration method is solved, and the measurement accuracy of the metering equipment is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of weighing, and in particular to a dynamic calibration method and system for a metering device. Background Art

[0002] A metering device is a commonly used weighing instrument when weighing, such as an electronic scale. According to the weighing principle, metering devices are mainly divided into piezoelectric sensor type, capacitive sensor type, and electromagnetic induction sensor type; to ensure the accurate weighing of the metering device, the metering device usually needs to test the weighing curve and perform weighing calibration before leaving the factory to ensure accurate weighing.

[0003] However, during the use of the metering device, continuous heavy object weighing operations inevitably cause collisions to the metering device, which may in turn cause the measurement sensor of the metering device to become inaccurate, resulting in measurement errors. Calibrating the measurement errors of the metering device usually requires measuring the weighing curve through a complete set of calibration objects to obtain the weighing curve, and judging the specific measurement inaccuracy of the metering device according to the weighing curve. However, this calibration method is cumbersome and cannot complete the real-time calibration of the metering device. Because the traditional calibration method of the metering device cannot perform real-time dynamic calibration on the metering device, the measurement errors that occur during the use of the metering device cannot be identified, which in turn leads to a decrease in measurement accuracy. Summary of the Invention

[0004] In order to solve the above technical problems, an object of the present invention is to provide a dynamic calibration method and system for a metering device. According to one aspect of the present invention, a dynamic calibration method for a metering device is provided, and the method includes: Real-time acquiring jitter data during the weighing of the metering device; Performing data fusion on the jitter data by using an envelope extraction algorithm to obtain vibration attenuation trend characteristics; Obtaining an attenuation curve based on the vibration attenuation trend characteristics and the real-time weighing result; Obtaining de-attenuated jitter data based on the jitter data and the vibration attenuation trend characteristics, and fitting the de-attenuated jitter data by using the least squares method to obtain an objective function; Determining whether the metering device needs to be calibrated currently according to the comparison results of the objective function, the attenuation curve with a standard objective function and a standard attenuation curve preset by the system; If so, performing dynamic calibration on the metering device.

[0005] Further, the real-time acquiring of the jitter data during the weighing of the metering device further includes: When the measured weight value of the metering device is stable, acquiring the measured weight of the metering device; Meanwhile, taking the moment when the measured weight value of the measuring device is stable as the end moment, and the moment before a preset jitter duration in front of the end moment as the start moment, obtain the change curve of the measured weight of the measuring device within this preset jitter duration; wherein, the horizontal axis of the change curve is the moment, and the vertical axis is the measured weight. Record the change curve as jitter data.

[0006] Further, the data fusion of the jitter data by using the envelope extraction algorithm to obtain the vibration attenuation trend feature further includes: Taking the jitter data as input data, using the envelope extraction algorithm, and the output data are the upper envelope and the lower envelope of the jitter data. Symmetrically process the lower envelope along a preset straight line to obtain a symmetric lower envelope. Fuse the lower envelope and the upper envelope to obtain the vibration attenuation trend feature; wherein, the data form of the jitter data is a vector with a length of 3000, and the m-th element represents the measured weight of the measuring device at the m-th moment, m = 0 - 3000.

[0007] Further, the data form of the vibration attenuation trend feature is the same as that of the jitter data. The obtaining of the attenuation curve based on the vibration attenuation trend feature in combination with the real-time weighing result further includes: Subtract the measured weight at the moment when the measured weight value of the measuring device is stable from each element in the vibration attenuation trend feature and record it as the attenuation curve.

[0008] Further, the obtaining of the de-attenuated jitter data based on the jitter data and the vibration attenuation trend feature, and using the least squares method to fit the de-attenuated jitter data to obtain the objective function further includes: Taking the result of subtracting the vibration attenuation trend feature from the jitter data as the de-attenuated jitter data. Perform curve fitting on the de-attenuated jitter data and the sine function using the least squares method, specifically: taking the sine function as the objective function, taking the de-attenuated jitter data as the input data, and taking the fitted sine function as the output data as the objective function. Wherein, the amplitude of the objective function is a physical property parameter of the elastic unit of the measuring device.

[0009] Further, the method further includes: Construct an external force interference weight based on the de-attenuated jitter data and the objective function.

[0010] Further, the determination of whether the measuring device needs to be calibrated currently based on the comparison results of the objective function, the attenuation curve with the standard objective function and the standard attenuation curve preset by the system further includes: Calculate a data credibility weight based on the external force interference weight and a standard external force interference weight preset in the system; Calculate an attenuation characteristic difference based on the attenuation curve, the data credibility weight, and a standard attenuation curve preset in the system; Calculate an amplitude characteristic difference based on the amplitude of the objective function and the amplitude of the objective function preset in the system; When the attenuation characteristic difference and / or the amplitude characteristic difference exceeds an error threshold preset in the system, determine that the metering device currently needs calibration.

[0011] Further, the dynamically calibrating the metering device further includes: Complete calibration based on a calibration unit and equipped weights in the metering device; Wherein, the calibration unit is specifically: form data pairs according to the voltage magnitude and the weight magnitude of the metering device, a plurality of data pairs form a weighing curve data set, then use the weighing curve data set as an input, calculate by using a mean interpolation algorithm, output a weighing curve function, and replace the original weighing curve function with the output weighing curve function to complete the calibration of the metering device.

[0012] According to another aspect of the present invention, there is provided a metering device dynamic calibration system, including: a processor, a memory, a communication interface, and a communication bus, and the processor, the memory, and the communication interface complete mutual communication through the communication bus; The memory is used to store at least one executable instruction, and the executable instruction causes the processor to execute the operations corresponding to the above-mentioned metering device dynamic calibration method.

[0013] The present invention has the following beneficial effects: The present invention obtains jitter data during the weighing of the metering device in real time; performs data fusion on the jitter data by using an envelope extraction algorithm to obtain vibration attenuation trend characteristics; obtains an attenuation curve based on the vibration attenuation trend characteristics combined with the real-time weighing result; obtains de-attenuated jitter data based on the jitter data and the vibration attenuation trend characteristics, and fits the de-attenuated jitter data by using the least square method to obtain an objective function; determines whether the metering device currently needs calibration according to the comparison results of the objective function, the attenuation curve with a standard objective function and a standard attenuation curve preset in the system; if so, dynamically calibrate the metering device; the present invention detects in real time whether the elastic shock absorption module and sensor parameters of the metering device have changed through the jitter data of the metering device, so it can dynamically determine whether there is an error in the measurement of the metering device, can timely detect measurement errors and calibrate the metering device, solves the problem that the traditional metering device calibration method cannot perform real-time dynamic calibration on the metering device, resulting in measurement errors during the use of the metering device, and improves the measurement accuracy of the metering device. Description of the Drawings

[0014] To more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0015] Figure 1 It is a flowchart of a dynamic calibration method for a metering device provided by an embodiment of the present invention; Figure 2 It is a schematic diagram of jitter data of a dynamic calibration method for a metering device provided by an embodiment of the present invention; Figure 3 It is a schematic structural diagram of an embodiment of a dynamic calibration system for a computing device of the present invention. Detailed implementation manners

[0016] To further elaborate on the technical means and effects adopted by the present invention to achieve the intended invention purpose, the following, in conjunction with the accompanying drawings and preferred embodiments, details the specific implementation manners, structures, features, and effects of a dynamic calibration method and system for a metering device proposed according to the present invention. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures, or characteristics in one or more embodiments can be combined in any suitable form.

[0017] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present invention belongs.

[0018] The following specifically describes the specific solutions of a dynamic calibration method and system for a metering device provided by the present invention with reference to the accompanying drawings.

[0019] Please refer to Figure 1 , which shows a dynamic calibration method for a metering device provided by an embodiment of the present invention. The method includes: Step S110: Real-time obtain the jitter data during the weighing of the metering device.

[0020] For a metering device, in this embodiment, an electronic scale is taken as an example for dynamic calibration analysis. The measurement principle of an electronic scale usually converts the mass of an object into gravity by means of gravity, converts the gravity into an electrical signal through a sensor, constructs a mapping relationship between the electrical signal and the object mass, and obtains the mass of the object according to the mapping relationship. Taking a capacitance sensor-based metering device as an example, the mapping relationship between the capacitance voltage of the capacitance sensor and the object mass can be called a weighing curve. The weighing curve is a function, with the horizontal axis being the capacitance voltage and the vertical axis being the object mass. When weighing, the mass of the object can be obtained according to the sensor voltage and the weighing curve.

[0021] When the parameters of the metering device sensor or the elastic shock absorption unit change due to factors such as collision, temperature and humidity changes, there will be a difference between the actual weighing curve and the weighing curve in the storage unit of the metering device, which will lead to measurement errors. Therefore, as long as it is detected whether the parameters of the metering device sensor change, it can be found whether the metering device has measurement errors. When an object is placed on the metering device, since the placement process is not stable, the force exerted on the metering device by the placed object will be briefly greater than the object's gravity, which will cause the elastic shock absorption unit of the metering device to vibrate. This vibration will cause the sensor data to vibrate within a certain period of time to form a sensor data change curve; the vibration of the sensor value in the sensor data change curve will gradually weaken over time, and the speed of this weakening is jointly determined by the elastic shock absorption unit and the sensor parameters of the metering device. Therefore, it can be judged whether the parameters of the elastic shock absorption unit or the sensor of the metering device change according to the weakening of the sensor data curve. A change indicates that the metering device may have measurement errors.

[0022] In an alternative embodiment, step S110 further includes: when the measured weight value of the metering device is stable, obtaining the measured weight of the metering device; at the same time, taking the moment when the measured weight value of the metering device is stable as the end moment, and taking a preset jitter duration before the end moment as the start moment, obtaining the change curve of the measured weight of the metering device within this preset jitter duration; wherein, the horizontal axis of the change curve is the moment and the vertical axis is the measured weight; the change curve is denoted as jitter data.

[0023] Figure 2 Schematic diagram of jitter data of a dynamic calibration method for a metering device provided by an embodiment of the present invention, as Figure 2As shown in the figure, the measured weight data obtained during the period from when the object to be measured is placed on the measuring device until the weight of the object is determined is called jitter data. Therefore, when the measured weight value of the measuring device is stable, the measured weight of the measuring device is obtained. At the same time, taking the moment when the measured weight value of the measuring device is stable as the end moment and Ts seconds before the end moment as the start moment, the change curve of the measured weight of the measuring device during this period is obtained and recorded as jitter data. The sampling rate of the curve is 1 millisecond, and the jitter duration Ts = 3 seconds. Finally, the measured weight of the measuring device and the change curve of the event during the nth measurement of the measuring device are obtained as jitter data. Among them, the jitter data is represented as a vector with a length of 3000 in the computer, and the mth element represents the magnitude of the measured weight of the measuring device at the mth moment.

[0024] Step S120: Use the envelope extraction algorithm to perform data fusion on the jitter data to obtain the vibration attenuation trend characteristics.

[0025] In an optional implementation manner, step S120 further includes: taking the jitter data as the input data, using the envelope extraction algorithm, and the output data is the upper envelope and the lower envelope of the jitter data; symmetrically process the lower envelope along a preset straight line to obtain a symmetric lower envelope; perform data fusion on the lower envelope and the upper envelope to obtain the vibration attenuation trend characteristics.

[0026] Step S130: Obtain the attenuation curve based on the vibration attenuation trend characteristics combined with the real-time weighing result.

[0027] In an optional implementation manner, the data form of the vibration attenuation trend characteristics is the same as that of the jitter data; step S130 further includes: subtracting the measured weight when the measured weight value of the measuring device is stable from each element in the vibration attenuation trend characteristics and recording it as the attenuation curve.

[0028] When the object is placed on the electronic scale, in the absence of external force interference, its elastic shock absorption unit will cause the sensor measurement data to vibrate regularly. When the parameters of the elastic shock absorption unit or the sensor remain unchanged, this rule will not change. However, due to the external forces such as the hand pressing on the object during the placement process, it will cause this jitter characteristic to be difficult to compare. Therefore, it is necessary to eliminate the influence of such external force interference on the vibration characteristics of the sensor data.

[0029] Analyze the vibration factors of the object on the measuring device. The change curve of the jitter data is composed of three factors: one is the vibration of the object caused by the elastic device installed on the measuring device, and this kind of vibration can be summarized by Hooke's law as a physical model; the second is the influence of the shock absorption device of the measuring device, which makes the elastic potential energy of the object vibrating on the measuring device gradually decrease, and then causes the vibration data to gradually decrease. The third is the influence of short-term external forces, which causes the object on the measuring device to vibrate.

[0030] Therefore, in order to eliminate external force interference, in this embodiment, the attenuation factors in the jitter data are extracted. Since the periodic change of the jitter data affects the extraction of the attenuation factors, in this embodiment, the characteristics of the attenuation factors are characterized by the numerical change of the envelope line in the jitter data. Therefore, taking the jitter data as the input data, using the envelope line extraction algorithm, the output data are the upper envelope line and the lower envelope line of the jitter data. The change trends of the upper and lower envelope lines both represent the vibration attenuation process brought by the shock absorption device to the jitter data, and the numerical value of the lower envelope line is opposite to the vibration attenuation trend. Therefore, first, the lower envelope line is symmetrically processed along a straight line to obtain the symmetric lower envelope line. The straight line is specifically: a straight line parallel to the x-axis with a weight value equal to the weighing weight of the weighing device. Then, the lower envelope line and the symmetric upper envelope line are fused to obtain the vibration attenuation trend characteristics.

[0031] Since the upper envelope line and the lower envelope line are obtained by fitting the data, there is a fitting error. The point that fits the original data best and has the smallest error is the intersection point of the envelope line and the original data. The intersection points of the upper envelope line and the lower envelope line with the original data are poorly arranged. Therefore, when fusing the data to obtain the vibration attenuation trend characteristics, in order to ensure the accuracy of the final calculation result and avoid calibration errors caused by systematic errors, the horizontal distance between the envelope line and the intersection point of the nearest original data is used as the weight for data fusion. The larger the horizontal distance, the lower the weight.

[0032] When actually calculating the vibration attenuation trend characteristics, the calculation methods include but are not limited to: for the data at the m-th moment of the upper envelope line, the horizontal distance between it and the intersection point of the nearest upper envelope line and the jitter data is recorded as the credibility of the upper envelope line. For the data at the m-th moment of the lower envelope line, the credibility of the lower envelope line can be obtained in the same way. The credibility of the upper envelope line and the credibility of the lower envelope line at the m-th moment are normalized. After normalization, they are used as the weights of the function values of the upper envelope line and the symmetric lower envelope line at the m-th moment respectively. The two function values are weighted and added to obtain the function value of the vibration attenuation trend characteristics at the m-th moment. Finally, the vibration attenuation trend characteristics are calculated for all moments.

[0033] Step S140: Obtain the de-attenuated jitter data based on the jitter data and the vibration attenuation trend characteristics, and use the least squares method to fit the de-attenuated jitter data to obtain the objective function.

[0034] In an alternative embodiment, step S140 further includes: using the result of subtracting the vibration attenuation trend characteristics from the jitter data as the de-attenuated jitter data; performing curve fitting on the de-attenuated jitter data and the sine function using the least squares method. Specifically: taking the sine function as the objective function, taking the de-attenuated jitter data as the input data, and taking the fitted sine function as the output data as the objective function. Among them, the amplitude of the objective function is a physical property parameter of the elastic unit of the weighing device.

[0035] In this step, the vibration attenuation trend characteristic characterizes the vibration attenuation characteristic brought by the shock absorbing device of the measuring equipment to the jitter data, and its data form is a vector with the same length as the jitter data; finally, the vibration attenuation trend characteristic is subtracted from the jitter data to obtain the de-attenuated jitter data, thereby achieving the goal of separating the attenuation factor from the jitter data; at the same time, each element in the vibration attenuation trend characteristic is subtracted from the measured weight of the measuring equipment and recorded as an attenuation curve. This step is because the measured weight will affect the numerical value of the vibration attenuation trend characteristic, and numerical correction is required to characterize the attenuation trend of the jitter characteristics of weighing objects of different weights on the measuring equipment.

[0036] In the jitter data after de-attenuation, the data can be decomposed into a data model based on Hooke's law and a data model under external force interference; when the data satisfies Hooke's law, the vibration of the object on the measuring equipment should be a simple harmonic vibration. At the same time, since the elastic force on the object should be proportional to the object's movement distance, in the absence of external force interference, the jitter data will present the shape of a sine function. Therefore, the jitter data after de-attenuation is curve fitted with the sine function. The part with a good fitting effect in the fitting result is the data part that is not interfered by external force. Using the data of this part to judge whether the elastic shock absorbing unit and sensor parameters of the measuring equipment have changed can obtain more accurate judgment results.

[0037] In the process of fitting the sine function with the de-attenuated jitter data, a higher weight should be given to the position with a larger index number of the de-attenuated jitter data. This is because during the use of the measuring equipment, the impact of external forces on the measuring equipment is concentrated in the early stage of the stabilization of the measuring equipment data. The closer to the moment of data stabilization, the less likely the object on the measuring equipment is to be affected by external forces. In actual operation, this is manifested as the weighing object having left the user's palm when the user weighs the object. The data index signal is used as a weight to eliminate systematic errors and improve the accuracy of the final calculation results, so as to avoid misjudgment caused by excessive errors in the fitting results, and thus make it impossible to correct the weighing results of the measuring equipment.

[0038] The method of fitting the sine function to the de-attenuated jitter data includes but is not limited to fitting using the least squares method. When this method is used for fitting, the sine function is used as the target function, the fitting parameters are the amplitude A and phase φ of the sine function, and the input is the de-attenuated jitter data. When calculating the residual in the set, the time m of the data can be selected as the weight. The larger the data position at the time m, the higher the weight when calculating the residual. The final output is the fitted sine function, i.e., the target function, wherein the amplitude A of the target function is the physical property parameter of the elastic unit of the measuring equipment. When the physical property of the unit changes, the amplitude A usually changes accordingly.

[0039] Step S150: Determine whether the metering device needs to be calibrated currently according to the comparison result between the objective function, the attenuation curve and the standard objective function and the standard attenuation curve preset by the system.

[0040] In an optional implementation manner, the method further includes: constructing an external force interference weight according to the de-attenuated jitter data and the objective function.

[0041] In this step, the de-attenuated jitter data and the objective function are compared to construct an external force interference weight. The greater the comparison difference, the more seriously the position is affected by the external force, and the less the jitter data at this position should be used to judge whether the parameters of the elastic shock absorption unit or the sensor change. The external force interference weight of the data at the corresponding moment m is greater. The calculation method of the external force interference weight includes, but is not limited to, taking the absolute value of the difference between the de-attenuated jitter data and the fitted sine function as the external force interference weight.

[0042] Since the amplitudes of the attenuation curve and the objective function characterize the change characteristics of the parameters of the elastic shock absorption unit or the sensor of the metering device, when calibrating the metering device last time, the jitter data is obtained during the last calibration measurement. The amplitudes and attenuation curves are calculated from the jitter data according to the method described in this embodiment, and are respectively recorded as the standard amplitude and the standard attenuation curve. At the same time, the external force interference weight of the standard attenuation curve is recorded as the standard external force interference weight.

[0043] In an optional implementation manner, step S150 further includes: calculating a data credibility weight according to the external force interference weight and the standard external force interference weight preset by the system; calculating an attenuation characteristic difference according to the attenuation curve, the data credibility weight, and the standard attenuation curve preset by the system; calculating an amplitude characteristic difference according to the amplitude of the objective function and the amplitude of the objective function preset by the system; when the attenuation characteristic difference and / or the amplitude characteristic difference exceed the error threshold preset by the system, determine that the metering device needs to be calibrated currently.

[0044] Finally, the attenuation curve and the amplitude of the objective function during this weighing are compared with the standard attenuation curve and the standard amplitude. When comparing the attenuation curves, the external force interference weight and the standard external force interference weight are first summed and then inverted, and all the inversions are normalized to obtain the data credibility weight. The greater the data credibility weight, the smaller the influence of the external force on the data at the m-th moment, and the comparison result at this time can accurately characterize whether the parameters of the elastic shock absorption unit and the sensor of the metering device change; and the greater the difference in the final comparison result, the more likely it is that there is a measurement error in the n-th weighing and calibration is required.

[0045] The comparison methods include, but are not limited to: taking the absolute value of the difference between the standard decay curve function value and the decay curve function value at time m, then dividing it by the sum of the two function values, and then summing the sum value with the data credibility weight as the weight to obtain the decay characteristic difference; taking the absolute value of the difference between the target function amplitude and the standard amplitude, and then dividing it by the sum of the two to obtain the amplitude characteristic difference.

[0046] Among them, the amplitude characteristic difference mainly characterizes whether there are changes in physical parameters including the spring coefficient in the elastic shock absorption unit of the measuring device, resulting in changes in the amplitude of its fitting function. If there are changes, it means that the measuring device needs to be calibrated; the decay characteristic difference mainly characterizes whether the weighing curve function of the sensor changes when measuring the weight. When the degree of variation is large, it means that the measuring device needs to be calibrated.

[0047] When the decay characteristic difference or the amplitude characteristic difference is greater than the error threshold preset by the system, it is determined that there is a measurement error in this weighing and correction is required. At this time, the reminder module works, otherwise the weighed weight is normally displayed. Among them, the error threshold is 0.05 according to the empirical value.

[0048] Step S160: If it is determined that the measuring device currently needs to be calibrated, perform dynamic calibration on the measuring device.

[0049] In an alternative embodiment, step S160 further includes: completing calibration according to the calibration unit and the equipped weights in the measuring device; specifically, the calibration unit is: forming data pairs according to the voltage magnitude and the weight magnitude of the measuring device, and multiple data pairs form a weighing curve data set. Then, taking the weighing curve data set as the input and using the mean interpolation algorithm to calculate, output the weighing curve function, and replace the original weighing curve function with the output weighing curve function to complete the calibration of the measuring device.

[0050] Specifically, if it is determined that the measuring device currently needs to be calibrated, send a reminder message to the user of the measuring device through the indicator light, reminding the user that there is a measurement error in this measurement and the measurement result is not credible, and at the same time reminding the user to perform weighing curve calibration on the measuring device.

[0051] The calibration of the weighing curve can be completed by the calibration unit and the equipped weights in the measuring device; among them, the user needs to put the equipped weights of the measuring device into the measuring device in sequence according to the prompt of the measuring device, and the measuring device records the voltage information of the capacitance sensor at this time.

[0052] Among them, the mean interpolation algorithm is a common technique in the field of computer data processing. Optionally, in order to improve the accuracy, algorithms such as polynomial interpolation algorithm and cubic spline interpolation algorithm can be used to replace the mean interpolation algorithm.

[0053] Optionally, the calibration of the measuring device can also be that the customer sends the measuring device to the manufacturer, and the manufacturer performs the calibration operation on the measuring device and then returns it to the user.

[0054] By using the method of this embodiment, the jitter data of the metering device is used to detect in real time whether the elastic shock absorption module and sensor parameters of the metering device have changed. Therefore, it is possible to dynamically determine whether there is an error in the measurement of the metering device, and it is possible to timely detect the measurement error and calibrate the metering device, solving the problem that the traditional metering device calibration method cannot perform real-time dynamic calibration on the metering device, resulting in measurement errors during the use of the metering device, and improving the measurement accuracy of the metering device.

[0055] Figure 3 FIG. shows a schematic structural diagram of an embodiment of a dynamic calibration system for a metering device according to the present invention. The specific implementation of the calibration system in the specific embodiment of the present invention is not limited.

[0056] As Figure 3 shown, the calibration system may include: A processor, a communications interface, a memory, and a communication bus.

[0057] Wherein: the processor, the communication interface, and the memory complete mutual communication through the communication bus. The communication interface is used to communicate with network elements of other devices such as clients or other servers. The processor is used to execute a program, and specifically can execute the relevant steps in the above-mentioned embodiment of the dynamic calibration method for a metering device.

[0058] Specifically, the program may include program code, and the program code includes computer operation instructions.

[0059] The processor may be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present invention. One or more processors included in the server may be of the same type of processor, such as one or more CPUs; or may be of different types of processors, such as one or more CPUs and one or more ASICs.

[0060] The memory is used to store the program. The memory may include high-speed RAM memory, and may also include non-volatile memory, such as at least one disk memory.

[0061] The program is specifically used to cause the processor to perform the following operations: Obtain the jitter data of the metering device in real time during weighing; The envelope extraction algorithm is used to fuse the jitter data to obtain the vibration attenuation trend characteristics; According to the vibration attenuation trend characteristics and combined with the real-time weighing result, an attenuation curve is obtained; Based on the jitter data and the vibration attenuation trend characteristics, the de-attenuated jitter data is obtained, and the least squares method is used to fit the de-attenuated jitter data to obtain the objective function; According to the comparison results of the objective function, the attenuation curve with the preset standard objective function and standard attenuation curve of the system, it is determined whether the metering device needs to be calibrated currently; If so, the metering device is dynamically calibrated.

[0062] It should be noted that: the above-mentioned sequence of the embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0063] Each embodiment in this specification is described in a progressive manner. The same or similar parts among the embodiments can be referred to each other, and the key points of each embodiment are the differences from other embodiments.

Claims

1. A dynamic calibration method for a metering device, characterized in that, The method includes: Obtaining jitter data during the weighing of a metering device in real time; Performing data fusion on the jitter data using an envelope extraction algorithm to obtain vibration attenuation trend characteristics; Obtaining an attenuation curve based on the vibration attenuation trend characteristics in combination with the real-time weighing result; Obtaining de-attenuated jitter data based on the jitter data and the vibration attenuation trend characteristics, and fitting the de-attenuated jitter data using the least squares method to obtain an objective function; Determining whether the metering device needs to be calibrated currently based on the comparison results of the objective function, the attenuation curve with the standard objective function and the standard attenuation curve preset by the system; If so, performing dynamic calibration on the metering device; The step of performing data fusion on the jitter data using an envelope extraction algorithm to obtain vibration attenuation trend characteristics further includes: Using the jitter data as input data and adopting an envelope extraction algorithm, and the output data being the upper envelope and the lower envelope of the jitter data; Symmetrically processing the lower envelope along a preset straight line to obtain a symmetric lower envelope; Performing data fusion on the lower envelope and the upper envelope to obtain vibration attenuation trend characteristics; wherein, the data form of the jitter data is a vector with a length of 3000, and the m-th element represents the measured weight of the metering device at the m-th moment, m = 0 - 3000; The data form of the vibration attenuation trend characteristics is the same as the data form of the jitter data; The step of obtaining an attenuation curve based on the vibration attenuation trend characteristics in combination with the real-time weighing result further includes: Subtracting the measured weight when the measured weight value of the metering device is stable from each element in the vibration attenuation trend characteristics and denoting it as the attenuation curve; The step of obtaining de-attenuated jitter data based on the jitter data and the vibration attenuation trend characteristics, and fitting the de-attenuated jitter data using the least squares method to obtain an objective function further includes: Using the result of subtracting the vibration attenuation trend characteristics from the jitter data as the de-attenuated jitter data; Performing curve fitting on the de-attenuated jitter data and the sine function using the least squares method, specifically: using the sine function as the objective function, using the de-attenuated jitter data as input data, and using the fitted sine function as the output data as the objective function; Wherein, the amplitude of the objective function is a physical property parameter of the elastic unit of the metering device.

2. A dynamic calibration method for a metering device according to claim 1, characterized in that, The step of obtaining jitter data during the weighing of a metering device in real time further includes: When the measured weight value of the metering device is stable, obtaining the measured weight of the metering device; Meanwhile, taking the moment when the measured weight value of the metering device is stable as the end moment, and taking a preset jitter duration before the end moment as the start moment, and obtaining the change curve of the measured weight of the metering device within this preset jitter duration; wherein, the horizontal axis of the change curve is the moment, and the vertical axis is the measured weight; Denoting the change curve as jitter data.

3. A dynamic calibration method for a metering device according to claim 1, characterized in that, The method further includes: Constructing an external force interference weight based on the de-attenuated jitter data and the objective function.

4. A dynamic calibration method for a metering device according to claim 3, characterized in that, The step of determining whether the metering device needs to be calibrated currently based on the comparison results of the objective function, the attenuation curve with the standard objective function and the standard attenuation curve preset by the system further includes: Calculate the data credibility weight based on the external force interference weight and the standard external force interference weight preset by the system; Calculate the attenuation characteristic difference based on the attenuation curve, the data credibility weight, and the standard attenuation curve preset by the system; Calculate the amplitude characteristic difference based on the target function amplitude and the target function amplitude preset by the system; When the attenuation characteristic difference and / or the amplitude characteristic difference exceeds the error threshold preset by the system, it is determined that the metering device needs to be calibrated currently.

5. A dynamic calibration method for a metering device according to claim 4, characterized in that The dynamic calibration of the metering device further includes: Complete the calibration based on the calibration unit and the equipped weights in the metering device; Among them, the calibration unit is specifically: form data pairs according to the voltage magnitude and the weight magnitude of the metering device, a plurality of data pairs form a weighing curve data set, then use the weighing curve data set as the input, calculate using the mean interpolation algorithm, output the weighing curve function, and replace the original weighing curve function with the output weighing curve function to complete the calibration of the metering device.

6. A dynamic calibration system for a metering device, characterized in that, Include: A processor, a memory, a communication interface, and a communication bus. The processor, the memory, and the communication interface complete communication with each other through the communication bus; The memory is used to store at least one executable instruction, and the executable instruction causes the processor to perform the operations corresponding to a method for dynamically calibrating a metering device according to any one of claims 1-5.

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