Material inspection device for cuprous oxide

Abstract

The invention discloses a cuprous oxide material inspection device, and relates to the field of material inspection, the cuprous oxide material inspection device comprises a support table, foot piers are uniformly arranged at the bottom of the support table, and a detection chamber is arranged at the top of the support table; the pretreatment unit is used for pretreating cuprous oxide; the placing unit is used for placing the cuprous oxide and driving the cuprous oxide to perform pretreatment and material detection; the micro-nano mechanical test module, the X-ray diffraction analysis module and the scanning probe microscope module are positioned in the detection chamber; firstly, a cuprous oxide material needs to be placed in the placing unit, the placing unit can drive the material to make contact with the pretreatment unit, impurities in the material are removed, and then continuous detection of different characteristics of the same sample is achieved through the probe microscope module, the micro-nano mechanical testing module 7 and the X-ray diffraction analysis module.

Description

Technical Field

[0001] The present invention relates to the technical field of material inspection, and particularly to a material inspection device for cuprous oxide. Background Art

[0002] In the field of material detection, cuprous oxide, as a key material widely used in industries such as electronics, chemical engineering, and medicine, its quality directly affects the performance and stability of end products. In the electronics industry, cuprous oxide is often used to manufacture precision components such as sensors and integrated circuits, and there are extremely high requirements for the flatness of its microscopic surface, defect density, and the integrity of its internal crystal structure. Even a slight flaw may lead to deterioration or failure of component performance. In the chemical engineering field, cuprous oxide participates in numerous chemical reactions as a catalyst, and its characteristics such as the distribution of surface active sites, mechanical strength, and internal lattice parameters will significantly affect the efficiency and selectivity of catalytic reactions. In the pharmaceutical industry, the application of cuprous oxide in drug carriers, antibacterial materials, etc. poses strict standards for its safety and quality consistency, and any quality fluctuation may endanger the health of patients.

[0003] The existing technology lacks a comprehensive inspection device that can quickly and accurately detect the microscopic surface defects of cuprous oxide and the relationship between its mechanical properties and internal structure. This results in difficulties in controlling the quality of cuprous oxide materials at the source during actual production and inability to meet the demand for high-quality materials. Summary of the Invention

[0004] In view of the deficiencies of the prior art, the technical solution adopted by the present invention to solve its technical problems is as follows: A material inspection device for cuprous oxide according to the present invention includes a support table, the bottom of the support table is uniformly provided with footstools, the top of the support table is provided with a detection chamber, and further includes: A pretreatment unit for pretreating cuprous oxide, a placement unit for placing cuprous oxide and driving cuprous oxide for pretreatment and material detection, and a micro-nano mechanical testing module, an X-ray diffraction analysis module, and a scanning probe microscope module located in the detection chamber; A curtain for closing the detection chamber is provided on one side of the detection chamber, a visual detector and a temperature sensor are provided on the inner wall of the detection chamber, and a control console for regulating the overall device is provided on the outer surface of the detection chamber; The scanning probe microscope module includes a reciprocating lead screw I, a moving block I is threadedly connected to the outer surface of the reciprocating lead screw I, a support plate I is fixedly connected to the outer surface of the moving block I, a soft brush is fixedly connected to the top of the support plate I, a telescopic rod I is provided at the bottom of the support plate I, an in-built motor is provided at the output end of the telescopic rod I, a rotating shaft I is fixedly connected to the output end of the in-built motor, a placement probe mechanism is fixedly connected to the outer surface of the rotating shaft I, and a replacement mechanism is provided on the outer surface of the support plate I.

[0005] Preferably, the probe placement mechanism includes a rotating arm, on the inner wall of which micro-cylinders are symmetrically arranged. The output end of each micro-cylinder is provided with a clamping block, and the inner wall of the clamping block is provided with a limiting hook plate. A probe assembly adapted to it is arranged in one of the clamping blocks; The probe tip reaches atomic-level accuracy through photolithography and etching processes and can be used in various modes such as scanning tunneling microscopes and atomic force microscopes.

[0006] Preferably, the first reciprocating lead screw is arranged inside the detector and is driven by an external motor. The outer surface of the rotating arm is fixedly connected to the outer surface of the first rotating shaft.

[0007] Preferably, the replacement mechanism includes a storage block provided with a grading layer. A monitor with a high-definition camera is placed at the bottom of the storage block. Each grading layer is placed with a replacement probe assembly; The back surface of the storage block is fixedly connected to the outer surface of the first support plate.

[0008] Preferably, the micro-nano mechanical testing module includes a second reciprocating lead screw. A second moving block is threadedly connected to the outer surface of the second reciprocating lead screw. A second support plate is fixedly connected to the outer surface of the second moving block. A force loading device is arranged at the bottom of the second support plate. The output end of the force loading device is provided with a pressing head. A pressure sensor and a displacement sensor are arranged on the outer surface of the pressing head. A data collector is fixedly connected to the outer surface of the force loading device; The second reciprocating lead screw is also arranged on the inner wall of the inspection chamber and is driven by an external motor.

[0009] Preferably, the X-ray diffraction analysis module includes a third support plate. An X-ray generator is arranged at the bottom of the third support plate. X-ray tubes are symmetrically arranged at the bottom of the X-ray generator, namely a filament for emitting electrons and a target for receiving electron bombardment. A detector arm is also arranged at the bottom of the third support plate. A detector for receiving the diffracted X-ray is arranged at the bottom of the detector arm; The outer surface of the third support plate is fixedly connected to the inner wall of the detection chamber.

[0010] Preferably, the placement unit includes a first servo motor. The output end of the first servo motor is fixedly connected to a third reciprocating lead screw. A moving platform is threadedly connected to the outer surface of the third reciprocating lead screw. A storage box is fixedly connected to the outer surface of the moving platform. An inlet is arranged at the top of the storage box. A detachable removal plate is arranged on the outer surface of the storage box. A second telescopic rod is arranged on the inner wall of the storage box. The output end of the second telescopic rod is fixedly connected to a push plate. An isolation plate for separating impurities is arranged at the opening of the inner wall of the storage box. A side hole is also arranged on one side of the storage box. A storage mechanism is arranged on one side of the storage box close to the side hole; The isolation plate can be disassembled and a vacuum adsorption device can be installed thereon.

[0011] Preferably, the storage mechanism includes a placement bin, a rack is slidably connected to the top of the placement bin, a shovel plate is fixedly connected to one side of the rack, a gear is arranged on one side of the placement bin away from the side hole, and a cross hole is arranged on the outer surface of the gear.

[0012] Preferably, the first servo motor is arranged on the side surface of the support platform, and the placement bin is arranged on the outer surface of the storage box.

[0013] Preferably, the pretreatment unit includes a fixing plate, a top plate is fixedly connected to the top of the fixing plate, a second servo motor is arranged on the outer surface of the top plate, the second servo motor can rotate forward and backward, a second rotating shaft is fixedly connected to the output end of the second servo motor, a main gear is fixedly connected to one end of the second rotating shaft away from the second servo motor, a rotating column is rotatably connected to the inner wall of the fixing plate, a secondary gear meshing with the main gear is arranged at one end of the rotating column, a support rod is arranged at the other end of the rotating column, soft brushes are uniformly arranged on the outer surface of the support rod, and a cross block adapted to the cross hole is fixedly connected to one end of the support rod away from the rotating column; The brush is made of special material bristles that are soft and will not damage cuprous oxide.

[0014] The beneficial effects of the present invention are as follows: 1. The main body of the present invention adopts an integrated frame design, integrating a scanning probe microscope module, a micro-nano mechanical testing module, and an X-ray diffraction analysis module. The modules are connected by a high-precision displacement adjustment mechanism, and can quickly switch detection modes to realize continuous detection of different characteristics of the same sample.

[0015] 2. By setting an X-ray diffraction analysis module in the present invention, before each detection, the built-in motor drives the rotating arm to rotate, so that the probe assembly contacts the soft brush at the top, and the dust and impurities adhered to the probe assembly are removed, avoiding affecting the detection effect.

[0016] 3. By setting a replacement mechanism in the present invention, during the rotation of the probe assembly, the high-definition camera detects whether there are signs of wear on the probe assembly. If wear occurs, the first telescopic rod will extend a certain distance, so that during the rotation of the rotating arm, another clamping block without a loaded probe assembly contacts the port for replacing the probe assembly and is caught by the limiting hook plate, so that the replacement of the probe assembly can be realized without manual operation, avoiding inaccurate detection results caused by probe wear.

[0017] 4. In the present invention, by providing a pretreatment unit, a brush gently sweeps the cuprous oxide powder to separate fine impurities from the cuprous oxide. Subsequently, the vacuum adsorption device is immediately activated to quickly suck away the impurities brushed off, ensuring that the sample enters the detection chamber in a clean state, thereby guaranteeing the accuracy of the detection result.

[0018] 5. In the present invention, by providing a placement unit, the cuprous oxide material is poured into the storage box through the inlet. Then, the second telescopic rod pushes the push plate to move and drives the cuprous oxide material through the isolation plate, thereby blocking and separating larger impurities. The cross plate will enter the cross hole. At this time, the second servo motor rotates forward and backward, driving the gear to rotate and causing the rack engaged with the gear to move in the placement bin, so that the shovel plate moves back and forth left and right, making the cuprous oxide powder on the shovel plate flip, preventing the materials at the bottom from not coming into contact with the brush. Description of the Drawings

[0019] Figure 1 is the rear view of the structure of the present invention.

[0020] Figure 2 is the front view of the structure of the present invention.

[0021] Figure 3 is the cross-sectional view of the structure of the present invention.

[0022] Figure 4 is the schematic structural diagram of the scanning probe microscope module of the present invention.

[0023] Figure 5 is the bottom view of the structure of the scanning probe microscope module of the present invention.

[0024] Figure 6 is the schematic structural diagram of the probe placement mechanism of the present invention.

[0025] Figure 7 is the schematic structural diagram of the replacement mechanism of the present invention.

[0026] Figure 8 is the schematic structural diagram of the micro-nano mechanical testing module of the present invention.

[0027] Figure 9 is the schematic structural diagram of the X-ray diffraction analysis module of the present invention.

[0028] Figure 10 is the schematic partial structural diagram of the placement unit of the present invention.

[0029] Figure 11 is the cross-sectional view of the structure of the placement unit of the present invention.

[0030] Figure 12 is the schematic structural diagram of the storage mechanism of the present invention.

[0031] Figure 13 It is a schematic structural diagram of the pretreatment unit of the present invention.

[0032] In the figure: 1, support platform; 2, foot pier; 3, pretreatment unit; 4, placement unit; 5, detection chamber; 6, scanning probe microscope module; 7, micro-nano mechanical testing module; 8, X-ray diffraction analysis module; 9, curtain; 10, vision detector; 11, temperature sensor; 12, console; 61, reciprocating screw rod 1; 62, moving block 1; 63, support plate 1; 64, soft brush; 65, telescopic rod 1; 66, built-in motor; 67, rotating shaft 1; 68, probe placement mechanism; 69, replacement mechanism; 681, rotating arm; 682, micro cylinder; 683, clamping block; 684, limiting hook plate; 685, probe assembly; 691, storage block; 692, grading layer; 693, monitor; 694, high-definition camera; 695, probe replacement assembly; 71, reciprocating screw rod 2; 72, moving block 2; 73, support plate 2; 74, force loading device; 75, indenter; 76, pressure sensor; 77, displacement sensor; 78, data collector; 81, support plate 3; 82, X-ray generator; 83, X-ray tube; 84, detector arm; 85, detector; 41, servo motor 1; 42, reciprocating screw rod 3; 43, moving platform; 44, storage box; 45, pouring inlet; 46, disassembly plate; 47, telescopic rod 2; 48, push plate; 49, storage mechanism; 410, side hole; 411, isolation plate; 491, placement bin; 492, rack; 493, shovel plate; 494, gear; 495, cross hole; 31, fixing plate; 32, top plate; 33, servo motor 2; 34, rotating shaft 2; 35, main gear; 36, sub gear; 37, rotating column; 38, support rod; 39, brush; 310, cross block. Specific embodiments

[0033] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. The embodiments of the present invention are given for purposes of illustration and description, and are not intended to be exhaustive or to limit the invention to the disclosed form. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiments are chosen and described in order to better illustrate the principles of the invention and its practical application, and to enable those of ordinary skill in the art to understand the invention and design various embodiments with various modifications suitable for specific purposes.

[0034] Embodiment 1, use Figures 1-13 A material inspection device for cuprous oxide according to an embodiment of the present invention will be described as follows.

[0035] As Figures 1-3As shown in the figure, a material inspection device for cuprous oxide according to the present invention includes a support table 1. The bottom of the support table 1 is evenly provided with footrests 2. The top of the support table 1 is provided with a detection chamber 5. It further includes: A pretreatment unit 3 for pretreating cuprous oxide, a placement unit 4 for placing cuprous oxide and driving the cuprous oxide for pretreatment and material detection, and a micro-nano mechanical testing module 7, an X-ray diffraction analysis module 8 and a scanning probe microscope module 6 located in the detection chamber 5; One side of the detection chamber 5 is provided with a curtain 9 for closing the detection chamber 5. The inner wall of the detection chamber 5 is provided with a visual detector 10 and a temperature sensor 11. The outer surface of the detection chamber 5 is provided with a control console 12 for regulating the overall device; When the present invention works, first, the cuprous oxide material needs to be placed in the placement unit 4. The placement unit 4 will drive the material to contact the pretreatment unit 3 to remove impurities in the material. Then, it will pass through the probe microscope module, the micro-nano mechanical testing module 7 and the X-ray diffraction analysis module 8 to realize continuous detection of different characteristics of the same sample.

[0036] As Figures 4-5 shown, the scanning probe microscope module 6 includes a reciprocating lead screw 61. A moving block 62 is threadedly connected to the outer surface of the reciprocating lead screw 61. A support plate 63 is fixedly connected to the outer surface of the moving block 62. A soft brush 64 is fixedly connected to the top of the support plate 63. A telescopic rod 65 is provided at the bottom of the support plate 63. An in-built motor 66 is provided at the output end of the telescopic rod 65. A rotating shaft 67 is fixedly connected to the output end of the in-built motor 66. A placement probe mechanism 68 is fixedly connected to the outer surface of the rotating shaft 67. A replacement mechanism 69 is provided on the outer surface of the support plate 63.

[0037] The probe microscope module is used for high-resolution imaging to detect microscopic defects on the surface of cuprous oxide.

[0038] As Figure 6 shown, the placement probe mechanism 68 includes a rotating arm 681. Miniature cylinders 682 are symmetrically arranged on the inner wall of the rotating arm 681. A clamping block 683 is provided at the output end of the miniature cylinder 682. A limiting hook plate 684 is provided on the inner wall of the clamping block 683. A probe assembly 685 adapted to it is provided in one of the clamping blocks 683; The probe tip reaches atomic-level precision through lithography and etching processes and can be used in various modes such as scanning tunneling microscopy and atomic force microscopy.

[0039] By operating the control console 12, an external motor is driven to drive the reciprocating lead screw 61 to rotate, thereby controlling the downward movement of the first moving block 62 and the first support plate 63, so that the placed probe assembly 685 is close enough to the surface of cuprous oxide. Electrons will pass through the potential barrier between the two to form a tunneling current. By detecting the change of the tunneling current, information at the atomic scale of the sample surface can be obtained. Before each detection, the built-in motor 66 will drive the rotating arm 681 to rotate, so that the probe assembly 685 contacts the soft brush 64 at the top, so that the dust and impurities adhered to the probe assembly 685 are removed, avoiding affecting the detection effect.

[0040] The first reciprocating lead screw 61 is arranged inside the detector and driven by an external motor. The outer surface of the rotating arm 681 is fixedly connected to the outer surface of the first rotating shaft 67.

[0041] As Figure 7 shown, the replacement mechanism 69 includes a storage block 691 provided with a grading layer 692. A monitor 693 with a high-definition camera 694 is arranged at the bottom of the storage block 691. A replacement probe assembly 695 is placed on each grading layer 692; The back surface of the storage block 691 is fixedly connected to the outer surface of the first support plate 63.

[0042] During the rotation of the probe assembly 685, the high-definition camera 694 will detect whether there are signs of wear on the probe assembly 685. If wear occurs, the first telescopic rod 65 will extend a certain distance, so that during the rotation of the rotating arm 681, another clamping block 683 without a loaded probe assembly 685 contacts the port of the replacement probe assembly 695 and is caught by the limit hook plate 684, so that the replacement of the probe assembly 685 can be realized without manual operation, avoiding inaccurate detection results caused by probe wear.

[0043] As Figure 8 shown, the micro-nano mechanical testing module 7 includes a second reciprocating lead screw 71. A second moving block 72 is threadedly connected to the outer surface of the second reciprocating lead screw 71. A second support plate 73 is fixedly connected to the outer surface of the second moving block 72. A force loading device 74 is arranged at the bottom of the second support plate 73. A indenter 75 is arranged at the output end of the force loading device 74. A pressure sensor 76 and a displacement sensor 77 are arranged on the outer surface of the indenter 75. A data collector 78 is fixedly connected to the outer surface of the force loading device 74; It is also driven by an external motor to drive the second reciprocating lead screw 71 to rotate, so that the overall second support plate 73 approaches the material. Then the force loading device 74 drives the indenter 75 to contact the material. Then the data collector 78 will collect the data generated by the force loading device 74, the displacement detection sensor and the pressure sensor 76, convert it into a digital signal, and transmit it to the computer for processing to obtain its mechanical property parameters such as hardness and elastic modulus.

[0044] The reciprocating screw rod II 71 is also arranged on the inner wall of the inspection chamber and is externally connected to a motor for driving.

[0045] As Figure 9 As shown, the X-ray diffraction analysis module 8 includes a support plate III 81. At the bottom of the support plate III 81, there is an X-ray generator 82. Symmetrically arranged at the bottom of the X-ray generator 82 are X-ray tubes 83, which are respectively a filament for emitting electrons and a target for receiving electron bombardment. At the bottom of the support plate III 81, there is also a detector arm 84. At the bottom of the detector arm 84, there is a detector 85 for receiving the diffracted X-rays. The X-ray generator 82 will emit electrons through the X-ray tube 83 to rapidly strike the target. Part of the kinetic energy is converted into X-ray radiation energy. Then, the detector arm 84 will collect the diffracted X-rays through the detector 85 and process and analyze the data. The data is converted into a diffraction pattern through professional software, and the crystal plane distance of the sample is calculated based on the X-rays with known wavelengths and the diffraction peak directions, realizing the precise analysis of the crystal structure and phase composition of cuprous oxide.

[0046] The outer surface of the support plate III 81 is fixedly connected to the inner wall of the detection chamber 5.

[0047] The specific working process is as follows: During operation, the probe microscope module is used for high-resolution imaging to detect the microscopic defects on the surface of cuprous oxide. The micro-nano mechanical testing module 7 is equipped with a high-precision force sensor and can indent cuprous oxide at the microscopic scale to obtain mechanical property parameters such as its hardness and elastic modulus. The X-ray diffraction analysis module 8 is used to analyze the crystal structure and phase composition of cuprous oxide. Each time the X-ray diffraction analysis module 8 operates, the built-in motor 66 will drive the rotating arm 681 to rotate, so that the probe assembly 685 comes into contact with the soft brush 64 at the top, and the dust and impurities adhered to the probe assembly 685 are removed to avoid affecting the detection effect. At the same time, the high-definition camera 694 will detect whether there are signs of wear on the probe assembly 685. If wear occurs, the telescopic rod I 65 will extend a certain distance, so that during the rotation of the rotating arm 681, another clamping block 683 without the probe assembly 685 is in contact with the port for replacing the probe assembly 695 and is clamped by the limiting hook plate 684, so that the replacement of the probe assembly 685 can be realized without manual operation, avoiding inaccurate detection results caused by probe wear.

[0048] Embodiment 2, using Figures 1-13 A material inspection device for cuprous oxide in an embodiment of the present invention will be described as follows.

[0049] As Figures 10-11As shown in the figure, a material inspection device for cuprous oxide according to the present invention, on the basis of Embodiment 1, the placement unit 4 includes a servo motor 41. The output end of the servo motor 41 is fixedly connected to a reciprocating screw rod 42. The outer surface of the reciprocating screw rod 42 is threadedly connected to a moving platform 43. The outer surface of the moving platform 43 is fixedly connected to a storage box 44. The top of the storage box 44 is provided with an inlet 45. The outer surface of the storage box 44 is provided with a detachable disassembly plate 46. The inner wall of the storage box 44 is provided with a telescopic rod 47. The output end of the telescopic rod 47 is fixedly connected to a push plate 48. The opening of the inner wall of the storage box 44 is provided with a separator 411 for separating impurities. One side of the storage box 44 is also provided with a side hole 410. A storage mechanism 49 is provided on one side of the storage box 44 close to the side hole 410; The separator 411 can be disassembled and a vacuum adsorption device can be installed.

[0050] The servo motor 41 drives the reciprocating screw rod 42 to rotate, thereby controlling the movement of the overall moving platform 43 and the devices fixed thereto. The cuprous oxide material can be poured into the storage box 44 through the inlet. Then, the telescopic rod 47 pushes the push plate 48 to move and drives the cuprous oxide material to pass through the separator 411, thereby separating larger impurities.

[0051] As Figure 12 As shown in the figure, the storage mechanism 49 includes a placement bin 491. The top of the placement bin 491 is slidably connected to a rack 492. One side of the rack 492 is fixedly connected to a shovel plate 493. A gear 494 is provided on one side of the placement bin 491 away from the side hole 410. The outer surface of the gear 494 is provided with a cross hole 495.

[0052] As Figure 13 As shown in the figure, during the process of the pretreatment unit 3 removing fine impurities, as the storage box 44 moves further, the cross plate will enter the cross hole 495. At this time, the servo motor 33 will rotate forward and backward, thereby driving the gear 494 to rotate and making the rack 492 engaged with the gear 494 move in the placement bin 491, so that the shovel plate 493 makes a left-right reciprocating movement, causing the cuprous oxide powder on the shovel plate 493 to turn over, avoiding the situation that the materials at the bottom layer cannot contact the brush 39.

[0053] The servo motor 41 is arranged on the side of the support platform 1, and the placement bin 491 is arranged on the outer surface of the storage box.

[0054] The pretreatment unit 3 includes a fixing plate 31. A top plate 32 is fixedly connected to the top of the fixing plate 31. A second servo motor 33 is disposed on the outer surface of the top plate 32. The second servo motor 33 can rotate forward and backward. The output end of the second servo motor 33 is fixedly connected to a second rotating shaft 34. One end of the second rotating shaft 34 away from the second servo motor 33 is fixedly connected to a main gear 35. A rotating column 37 is rotatably connected to the inner wall of the fixing plate 31. A secondary gear 494 meshing with the main gear 35 is disposed at one end of the rotating column 37. A support rod 38 is disposed at the other end of the rotating column 37. Brushes 39 are uniformly disposed on the outer surface of the support rod 38. One end of the support rod 38 away from the rotating column 37 is fixedly connected to a cross block 310 adapted to a cross hole 495; The brush 39 is made of a special material brush hair that is soft and will not damage cuprous oxide.

[0055] After the placement bin 491 containing cuprous oxide comes into contact with the pretreatment unit 3, the second servo motor 33 will drive the second rotating shaft 34 and the main gear 35 to rotate, thereby driving the secondary gear 36 and the rotating column 37 to rotate, and finally the brush 39 gently cleans the cuprous oxide powder, separating fine impurities from the cuprous oxide. Subsequently, the vacuum adsorption device is immediately started to quickly suck away the brushed-off impurities, ensuring that the sample enters the detection chamber 5 in a clean state, thereby guaranteeing the accuracy of the detection result.

[0056] The specific working process is as follows: During operation, the first servo motor 41 will drive the reciprocating lead screw three 42 to rotate, thereby controlling the overall moving platform 43 and the device fixed thereto to move. Cuprous oxide materials can be poured into the storage box 44 through the inlet. Then, the second telescopic rod 47 will push the push plate 48 to move and drive the cuprous oxide materials to pass through the isolation plate 411, thereby blocking and separating larger impurities. Then, the second servo motor 33 will drive the second rotating shaft 34 and the main gear 35 to rotate, thereby driving the secondary gear 36 and the rotating column 37 to rotate, and finally the brush 39 gently cleans the cuprous oxide powder, separating fine impurities from the cuprous oxide. Subsequently, the vacuum adsorption device is immediately started to quickly suck away the brushed-off impurities. Finally, as the storage box 44 further moves, the cross plate will enter the cross hole 495. At this time, the second servo motor 33 will rotate forward and backward, thereby driving the gear 494 to rotate and causing the rack 492 meshing with the gear 494 to move in the placement bin 491, so that the shovel plate 493 makes a reciprocating movement left and right, causing the cuprous oxide powder on the shovel plate 493 to turn over, preventing the materials at the bottom layer from not being able to contact the brush 39.

[0057] Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of them. All other embodiments obtained by those of ordinary skill in the art and related fields based on the embodiments of the present invention without creative efforts shall fall within the scope of protection of the present invention. Structures, devices, and operation methods not specifically described and explained in the present invention, unless otherwise specified and limited, shall be implemented by conventional means in the art.

Claims

1. A material inspection device for cuprous oxide, comprising a support platform, the bottom of the support platform is uniformly provided with footstools, and a detection chamber is arranged on the top of the support platform, characterized in that, Further included are: a pretreatment unit for pretreating cuprous oxide, a placement unit for placing cuprous oxide and driving cuprous oxide for pretreatment and material detection, and a micro-nano mechanical testing module, an X-ray diffraction analysis module, and a scanning probe microscope module located in the detection chamber; A curtain for enclosing the detection chamber is provided on one side of the detection chamber. A visual detector and a temperature sensor are provided on the inner wall of the detection chamber, and a console for controlling the overall device is provided on the outer surface of the detection chamber; The scanning probe microscope module includes a reciprocating lead screw 1. A moving block 1 is threadedly connected to the outer surface of the reciprocating lead screw 1. A support plate 1 is fixedly connected to the outer surface of the moving block 1. A soft brush is fixedly connected to the top of the support plate 1. A telescopic rod 1 is provided at the bottom of the support plate 1. An in-built motor is provided at the output end of the telescopic rod 1. A rotating shaft 1 is fixedly connected to the output end of the in-built motor. A probe placement mechanism is fixedly connected to the outer surface of the rotating shaft 1. A replacement mechanism is provided on the outer surface of the support plate 1.

2. The material inspection device for cuprous oxide according to claim 1, wherein: The probe placement mechanism includes a rotating arm. Micro-cylinders are symmetrically provided on the inner wall of the rotating arm. A clamping block is provided at the output end of the micro-cylinder. A limiting hook plate is provided on the inner wall of the clamping block. A probe assembly adapted to it is provided in one of the clamping blocks.

3. The material inspection device for cuprous oxide according to claim 2, wherein: The reciprocating lead screw 1 is arranged inside the detection chamber and is driven by an external motor. The outer surface of the rotating arm is fixedly connected to the outer surface of the rotating shaft 1.

4. The material inspection device for cuprous oxide according to claim 1, characterized in that: The replacement mechanism includes a storage block provided with grading layers. A monitor with a high-definition camera is placed at the bottom of the storage block. Replacement probe assemblies are placed on each grading layer; The back surface of the storage block is fixedly connected to the outer surface of the support plate 1.

5. The material inspection device for cuprous oxide according to claim 1, characterized in that: The micro-nano mechanical testing module includes a reciprocating lead screw 2. A moving block 2 is threadedly connected to the outer surface of the reciprocating lead screw 2. A support plate 2 is fixedly connected to the outer surface of the moving block 2. A force loading device is provided at the bottom of the support plate 2. A indenter is provided at the output end of the force loading device. A pressure sensor and a displacement sensor are provided on the outer surface of the indenter. A data collector is fixedly connected to the outer surface of the force loading device; The reciprocating lead screw 2 is also arranged on the inner wall of the inspection chamber and is driven by an external motor.

6. The material inspection device for cuprous oxide according to claim 1, characterized in that: The X-ray diffraction analysis module includes a support plate 3. An X-ray generator is provided at the bottom of the support plate 3. X-ray tubes are symmetrically provided at the bottom of the X-ray generator, which are respectively a filament for emitting electrons and a target for receiving electron bombardment. A detector arm is also provided at the bottom of the support plate 3. A detector for receiving the diffracted X-ray is provided at the bottom of the detector arm; The outer surface of the support plate 3 is fixedly connected to the inner wall of the detection chamber.

7. An inspection device for a cuprous oxide material according to claim 1, characterized in that: The placement unit includes a first servo motor. The output end of the first servo motor is fixedly connected to a reciprocating screw rod III. A moving platform is threadedly connected to the outer surface of the reciprocating screw rod III. A storage box is fixedly connected to the outer surface of the moving platform. An inlet is provided at the top of the storage box. A detachable disassembly plate is provided on the outer surface of the storage box. A second telescopic rod is provided on the inner wall of the storage box. The output end of the second telescopic rod is fixedly connected to a push plate. A separation impurity isolation plate is provided at the opening of the inner wall of the storage box. A side hole is further provided on one side of the storage box. A storage mechanism is provided on one side of the storage box close to the side hole; The isolation plate is detachable and a vacuum adsorption device is installed.

8. An inspection device for a cuprous oxide material according to claim 7, characterized in that: The storage mechanism includes a placement bin. A rack is slidably connected to the top of the placement bin. A shovel plate is fixedly connected to one side of the rack. A gear is provided on one side of the placement bin away from the side hole. A cross hole is provided on the outer surface of the gear.

9. The material inspection device for cuprous oxide according to claim 8, characterized in that: The first servo motor is arranged on the side surface of the support platform. The placement bin is arranged on the outer surface of the storage box.

10. The material inspection device for cuprous oxide according to claim 1, wherein: The pretreatment unit includes a fixing plate. A top plate is fixedly connected to the top of the fixing plate. A second servo motor is provided on the outer surface of the top plate. The second servo motor can rotate forward and backward. The output end of the second servo motor is fixedly connected to a second rotating shaft. The end of the second rotating shaft away from the second servo motor is fixedly connected to a main gear. A rotating column is rotatably connected to the inner wall of the fixing plate. A secondary gear meshing with the main gear is provided at one end of the rotating column. A support rod is provided at the other end of the rotating column. Brushes are evenly arranged on the outer surface of the support rod. A cross block adapted to the cross hole is fixedly connected to the end of the support rod away from the rotating column; The brushes are made of special material bristles that are soft and will not damage cuprous oxide.

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