Anti-mixing detection method and system for photovoltaic junction box

Abstract

The invention relates to a material mixing prevention detection method and system for a photovoltaic junction box, and belongs to the technical field of diode detection, and the method comprises the steps: receiving a predefined instruction which comprises the product type of a detected product; receiving a detection instruction, acquiring electrical data of all detection point locations included in the detected product, comparing the electrical data with a preset initial calibration range, and analyzing to obtain a judgment result; wherein the judgment result is used for representing whether a diode chip exists at each detection point position contained in the detected product or not; the judgment result is matched with the product type contained in the predefined instruction, and if matching succeeds, a performance detection result of the detected product is analyzed and output based on the electrical data; and if the matching is not successful, outputting material mixing warning information, so that a detector obtains the material mixing warning information or the performance detection result. According to the invention, when the performance of the diode in the photovoltaic junction box is detected, the poor performance of the diode and the non-diode chip state can be effectively distinguished.

Description

Technical Field

[0001] The present application relates to the field of diode detection technology, and in particular to a method and system for detecting anti-mixing materials in a photovoltaic junction box. Background Art

[0002] The bypass Schottky diode inside the solar junction box was originally welded to the inside of the junction box using finished axial diodes. To reduce costs and improve diode heat dissipation, the existing technology directly binds the diode chip to the metal frame inside the junction box and then fixes it with epoxy resin. When the junction box enters the traditional diode detection station on the assembly line, a start signal is given to the traditional diode detection machine, which starts testing the performance of each diode and transmits the detection results (OK / NG) to the assembly line in the form of digital signals to complete the detection.

[0003] With the advancement of technology and the emergence of photovoltaic tile modules, junction boxes that adapt to new tile modules have also emerged. Their features are similar to the appearance of traditional junction boxes, but in the junction boxes of new tile modules, among all the locations for diode chip installation (hereinafter referred to as installation points), some installation points can be left vacant, that is, no diode chips need to be installed. The purpose of vacant treatment includes: improving design flexibility, vacancy costs, simplifying maintenance, optimizing performance, and reserving positions for future upgrades or functional expansions. However, since the vacant installation points and the installation points with diodes installed are both encapsulated with epoxy resin on the outside, the internal structure of the finished product after encapsulation cannot be seen with the naked eye; and the existing traditional diode tester can only detect diode performance OK / NG, and cannot determine whether each installation point in the junction box is vacant, and thus cannot distinguish whether the cause of diode performance NG is the poor performance of the diode chip itself, or whether the corresponding installation point is vacant, so it needs to be improved. Summary of the invention

[0004] In order to effectively distinguish between poor diode performance and the absence of a diode chip when testing the performance of diodes in a photovoltaic junction box, the present application provides a photovoltaic junction box anti-mixing detection method and system.

[0005] In a first aspect, the present application provides a photovoltaic junction box anti-mixing material detection method, which adopts the following technical solution: receiving a predefined instruction, wherein the predefined instruction at least includes a product type of a product to be tested; Receive a detection instruction, obtain electrical data of all detection points included in the product under test, compare the electrical data with a preset initial calibration range, and analyze to obtain a determination result; wherein the determination result is used to characterize whether there is a diode chip at each detection point included in the product under test; Match the determination result with the product type included in the predefined instruction. If the match is successful, output the performance detection result of the product under test based on the electrical data analysis; if the match is unsuccessful, output a mixing warning message so that the tester can obtain the mixing warning message or the performance detection result.

[0006] By adopting the above technical solution, in the process of using an assembly line to batch detect the performance of diodes installed in a photovoltaic junction box, this application proposes to preset the product type of the product under test, that is, establish the corresponding relationship between the assembly line and the product type of the product under test, and limit that the current assembly line is only used to detect the products under test of this product type. After that, when using the current assembly line for detection, read the electrical data (such as VF, VB, IR) obtained at each detection point by using a traditional diode detector, and analyze whether there is a diode chip at each detection point by comparing the electrical data with the preset initial calibration range. Then, match the determination result with the preset product type of the product under test to verify whether the current product under test meets the preset product type of the product under test. If the match is unsuccessful, it means that there is a mixing situation in the current assembly line, that is, the products under test of other product types have been mixed into the current assembly line. At this time, a mixing warning message is triggered. If the match is successful, then determine the performance of the product under test according to the traditional electrical detection method. In summary, based on the traditional diode detector to detect whether the diode performance is OK / NG, this application adds two states of distinguishing between poor diode performance and no diode chip, adapts to the detection of the internal diodes of the new tile photovoltaic junction box, and avoids the problem of mixing due to the wrong position of the internal diodes of the tile photovoltaic junction box.

[0007] Optionally, the predefined instruction further includes the quantity of the product under test; The method further includes: Whenever a predefined instruction is received, predict and output the total detection duration required to execute the predefined instruction based on the product type of the product under test and the pre-stored detection duration correspondence table; wherein, the detection duration correspondence table pre-stores the detection durations of products under test of different product types. When there are multiple detection assembly lines, based on the completion time of all predefined instructions in the task queue corresponding to each detection assembly line and the currently predicted total detection duration, use the detection assembly line with the earliest completion time among all detection assembly lines as the target detection assembly line, and add the current predefined instruction to the task list of the target detection assembly line, so that the target detection assembly line sequentially executes all predefined instructions in the corresponding task list according to the addition time.

[0008] By adopting the above technical solutions, for the batch product detection process involving different product types, this application proposes to predict the completion time of the products to be tested of the same batch and the same product type. When there are multiple production lines for performing detection operations, this application further proposes to reasonably select the detection pipeline using the prediction results, which can not only reduce the idle suspension time of the detection pipeline, but also ensure that the current predefined instructions are executed as early as possible, improving the detection efficiency.

[0009] Optionally, the product type includes the point identifier of each detection point and the chip status corresponding to each detection point, and the chip status is used to indicate whether there is a diode chip at the corresponding detection point; The obtaining of the electrical property data of all the detection points included in the product to be tested, comparing the electrical property data with a preset initial calibration range, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction includes: Based on the product type included in the predefined instruction, all the detection points of the product to be tested are divided into a coreless group and a cored group; among them, the coreless group refers to the set of detection points that do not need to install diode chips as specified by the corresponding product type, and correspondingly, the cored group refers to the set of detection points that are installed with diode chips as specified by the corresponding product type; Based on the number of detection points included in the coreless group, the first calibration range is obtained after correcting the preset initial calibration range. Based on the number of detection points included in the cored group, the second calibration range is obtained after correcting the preset initial calibration range; among them, both the first calibration range and the second calibration range are closed intervals; Obtain the electrical property data of all the detection points included in the product to be tested, and determine whether the sum of the electrical property data of all the detection points included in the coreless group is within the first calibration range; determine whether the sum of the electrical property data of all the detection points included in the cored group is within the second calibration range; If the sum of the electrical property data of all the detection points included in the coreless group is within the first calibration range and the sum of the electrical property data of all the detection points included in the cored group is within the second calibration range, it is considered that the matching is successful, otherwise it is considered that the matching is unsuccessful.

[0010] By adopting the above technical solution, the detection time for a single product under test will increase as the number of detection points increases. Therefore, in order to improve the detection efficiency as much as possible and reduce the detection time, this application proposes to classify all the detection points of the product under test according to whether a diode chip is installed. And since this application defines that the initial calibration range, as well as the first calibration range and the second calibration range, are all closed intervals, this application proposes to sum the electrical property data corresponding to the chip - with group and the chip - without group respectively, and compare the summed values with the first calibration range and the second calibration range, so as to achieve a one - time detection of all the detection points of the chip - without group and the chip - with group, reduce the detection time. If all the comparisons are consistent, it is considered that the matching is successful; if there is an inconsistent situation in the comparison, it is considered that the matching is unsuccessful.

[0011] Optionally, the difference between the two end - point values of the initial calibration range is the reference difference; The method of obtaining the electrical property data of all the detection points included in the product under test, comparing the electrical property data with a preset initial calibration range, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction further includes: Based on the electrical property data of all the detection points included in the chip - without group, determine a first detection point group from the chip - without group. Each first detection point group includes two first detection points, and the two first detection points satisfy: in the chip - without group, the difference between the corresponding electrical property data is greater than the reference difference; Based on the electrical property data of all the detection points included in the chip - with group, determine a second detection point group from the chip - with group. Each second detection group includes two second detection points, and the two second detection points satisfy: in the chip - with group, the difference between the corresponding electrical property data is greater than the reference difference; Compare all the first detection points and the second detection points with the preset initial calibration range respectively, analyze to obtain a determination result, and match the determination result with the product type included in the predefined instruction.

[0012] By adopting the above technical solution, in order to improve the detection accuracy, secondary detection and verification are carried out on the detection points (i.e., the first detection points) in the chip - without group where the difference between the corresponding electrical property data is greater than the difference between the two end - point values of the initial calibration range, and on the detection points (i.e., the second detection points) in the chip - with group where the difference between the corresponding electrical property data is greater than the difference between the two end - point values of the initial calibration range.

[0013] Optionally, the step of comparing all the first detection points and the second detection points with the preset initial calibration range respectively, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction includes: Based on the number of points at the first detection point and the second detection point, allocate a matching model with a quantity consistent with the number of points, and establish a one-to-one correspondence between the matching module and the corresponding detection point; Use all the matching modules to simultaneously compare the electrical data of the corresponding detection points with the initial calibration range, analyze and obtain the chip status, and then compare the chip status with the chip status of the corresponding detection points included in the product type to obtain a determination result; If the determination results of all the first detection points and the second detection points are consistent, it is considered a successful match; otherwise, it is an unsuccessful match.

[0014] By adopting the above technical solution, based on the total number of the first detection points and the second detection points (i.e., the number of points), allocate the corresponding number of matching modules, and use the parallel comparison method of all the matching modules to achieve the synchronous matching of all the first detection points and all the second detection points with the product type, further improving the detection efficiency.

[0015] Optionally, the receiving of the predefined instruction includes: Scan the label corresponding to the product under test moved to the detection production line and confirm the corresponding product type; If the product type at the current scanning moment is inconsistent with the product type scanned at the previous scanning moment, and the product type scanned at the next scanning moment after the current scanning moment is consistent, then after a specified duration, update the predefined instruction according to the product type at the current scanning moment.

[0016] By adopting the above technical solution, the method of manually triggering the predefined instruction and setting the product type of the product under test will, on the one hand, result in misoperations, thereby increasing the probability of inconsistent matching during subsequent matching; on the other hand, when it is necessary to switch the product type of the product under test detected on the current production line, it is easy to delay the detection efficiency due to untimely manual triggering. Therefore, this solution defines that the machine automatically identifies the label of the product under test on the detection production line and automatically confirms the product type based on the label, thereby realizing the automatic switching of the product type, that is, the automatic update of the predefined instruction.

[0017] Optionally, the method further includes: After the diode chips in the photovoltaic junction box are installed and before encapsulation, capture the installation image, where the installation image at least includes the images of all the detection stations in the photovoltaic junction box; Based on the installation image, analyze whether there are diode chips at each detection station, analyze and obtain the product type, and generate a label corresponding to the product type.

[0018] By adopting the above technical solution, this solution further provides a way to generate labels for the product under test, that is, after installation and before encapsulation, an imaging device automatically captures an installation image of the product under test with all detection points, then analyzes the installation image to obtain the corresponding product type, generates a label corresponding to the product type, and finally realizes the intelligent and efficient generation of labels for the product under test.

[0019] In a second aspect, the present application provides a photovoltaic junction box anti-mixing detection system, including: A model selection module for allowing a detection personnel to select the product type of the product under test, trigger a predefined instruction with the product type, and send the predefined instruction to the MCU module; A calibration module for allowing a detection personnel to define an initial calibration range, where the initial calibration range is a data range for determining whether there is a diode chip at each detection point of the product under test; A storage module for storing the product type corresponding to the model selection module and the initial calibration range corresponding to the calibration module; A communication module, which is connected to a diode performance detector for obtaining the electrical property data of each detection point of the product under test detected by the diode performance detector and transmitting the electrical property data to the MCU module; An MCU module for receiving the predefined instruction, obtaining the electrical property data of all detection points included in the product under test transmitted by the communication module, retrieving the initial calibration range from the storage module, comparing the electrical property data with the initial calibration range, and analyzing to obtain a determination result; where the determination result is used to represent whether there is a diode chip at each detection point included in the product under test; the MCU module is further used to match the determination result with the product type included in the predefined instruction, if the match is successful, then analyze the performance detection result of the product under test based on the electrical property data; if the match is unsuccessful, then generate a mixing warning message; An input / output module for outputting the performance detection result and the mixing warning message generated by the MCU module so that the detection personnel can know the performance detection result and the mixing warning message; A power supply module electrically connected to the MCU module for supplying power to the MCU module.

[0020] In a third aspect, the present application provides a photovoltaic junction box anti-mixing detection device, which is characterized by including a memory and a processor, and a computer program capable of being loaded and executed by the processor as described in any one of the methods in the first aspect is stored on the memory.

[0021] Fourthly, the present application provides a computer-readable storage medium, characterized in that it stores a computer program that can be loaded and executed by a processor to perform any one of the methods described in the first aspect.

[0022] In summary, the present application includes at least one of the following beneficial technical effects: 1. Based on the detection of the performance OK / NG of diodes by traditional diode detectors, the present application adds the distinction between two states of poor diode performance and no diode chip, adapting to the detection of diodes inside new tile photovoltaic junction boxes, and avoiding the problem of material mixing that occurs during the performance detection of tile photovoltaic junction boxes of a specified product type due to the mixing of tile photovoltaic junction boxes of other product types. Herein, the product type refers to different installation states of diode chips in tile photovoltaic junction boxes due to different setting results of whether each detection point in the tile photovoltaic junction box is vacant or not.

[0023] 2. Further, when replacing the tested products of different product types during use, only by triggering the update predefined instruction is needed, without changing the hardware line connection and adjusting the parameters of the traditional diode tester, saving production debugging time, improving the machine adjustment efficiency, and avoiding the phenomenon of errors in change and debugging. Description of the Drawings

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present invention, and those of ordinary skill in the art can obtain other drawings based on these drawings without creative efforts.

[0025] Figure 1 It is a schematic flow chart of a method for detecting anti-material mixing of a photovoltaic junction box disclosed in an embodiment of the present application.

[0026] Figure 2 It is a schematic diagram of a method for detecting material mixing of 4 product types exemplarily given in an embodiment of the present application.

[0027] Figure 3 It is a schematic structural diagram of a system for detecting anti-material mixing of a photovoltaic junction box disclosed in an embodiment of the present application.

[0028] Description of the reference numerals: 301, model selection module; 302, calibration module; 303, storage module; 304, communication module; 305, MCU module; 306, input / output module; 307, power supply module. Detailed Embodiments

[0029] The following will further elaborate on the present application in conjunction with the attached Figures 1-3 for a more detailed description.

[0030] An embodiment of the present application discloses a method for detecting anti-mixing of photovoltaic junction boxes (hereinafter simply referred to as the anti-mixing detection method), which is applied to the performance detection process of diode chips installed in photovoltaic junction boxes. It is used to distinguish between two states: poor diode performance and no diode chip installed, and realizes the performance detection of the diodes installed inside the new tile photovoltaic junction box. The execution subject of the anti-mixing detection method is the photovoltaic junction box anti-mixing detection system (hereinafter simply referred to as the anti-mixing detection system). The following will be combined with the attached Figures 1-2 Specifically elaborate on the specific execution steps of the anti-mixing detection system for the anti-mixing detection method.

[0031] S101, Receive a predefined instruction, and the predefined instruction at least includes the product type of the product to be tested.

[0032] In implementation, the predefined instruction can be triggered manually. Exemplarily, a touch display screen is preset at a preset detection pipeline, and the touch display screen is electrically connected to the anti-mixing detection system. The detection personnel can use the touch display screen to enter the product type of the product to be tested, the quantity of the product to be tested, etc., so as to trigger the predefined instruction. The anti-mixing detection system is used to receive the predefined instruction, and correspondingly, the predefined instruction contains the product type, the quantity of the product to be tested, etc. entered by the detection personnel. Among them, when there are multiple positions (i.e., detection points) for installing diode chips in the photovoltaic junction box, since all detection points in the tile photovoltaic junction box can selectively install diode chips, that is, there may be vacant detection points, therefore, whether all detection points are vacant or not can be used as a distinguishing basis to distinguish different photovoltaic junction boxes, and the product type is used to characterize whether all detection points are vacant or not; and further, each detection point can be numbered in advance (i.e., generate a point identifier), and preset characters are used to represent the two states of vacancy and the presence of a chip (i.e., the chip state), such as using N to represent vacancy and Y to represent the presence of a chip. Correspondingly, the product type can be represented in the form of a point identifier and a chip state; Exemplarily, Figure 2 Four product types corresponding to the product to be tested with two detection points are given. The product types can be represented as 1N2Y, 1Y2N, 1Y2Y, 1N2N from top to bottom.

[0033] S102, Receive a detection instruction, obtain the electrical data of all detection points included in the product to be tested, compare the electrical data with a preset initial calibration range, and analyze to obtain a determination result; wherein, the determination result is used to characterize whether there is a diode chip at each detection point included in the product to be tested.

[0034] In implementation, a preset detection pipeline is used to convey the product under test to a preset work station. An optoelectronic sensor or other detection module can be preset at the preset work station to send a detection instruction to the anti-mixing detection system when the product under test is detected. The anti-mixing detection system is used to, when receiving the detection instruction, control a preset diode detector to perform electrical connection on the photovoltaic junction box at the preset work station and obtain electrical property data at each detection point. The electrical property data here specifically includes VF (Forward Voltage), VB (Breakdown Voltage), and IR (Reverse Leakage Current) corresponding to the detection point. Since the diode detector is a prior art, it will not be elaborated here.

[0035] Next, the anti-mixing detection system is used to obtain the electrical property data of all detection points detected by the diode detector and included in the product under test, that is, VF1, VB1, IR1; VF2, VB2, IR2... Then, the anti-mixing detection system, based on a preset corresponding relationship table, searches for an initial calibration range corresponding to the product type in the predefined instruction. The corresponding relationship table stores the initial calibration ranges corresponding to different product types, and the initial calibration range is a judgment basis for determining whether a detection point is vacant. The initial calibration range specifically includes a first initial range for determining that the detection point is vacant: (VFmin, VFmax), (VBmin, VBmax), (IRmin, IRmax); and a second initial range for determining that a chip is installed in the detection point: (VFmin’, VFmax’), (VBmin’, VBmax’), (IRmin’, IRmax’).

[0036] Specifically, if the electrical property data (VF, VB, IR) corresponding to the target detection point satisfies: VFmin < VF < VFmax, VBmin < VB < VBmax, IRmin < IR < IRmax; it is determined that there is no diode chip at the target detection point. If the electrical property data (VF, VB, IR) corresponding to the target detection point satisfies: VFmin’ < VF < VFmax’, VBmin’ < VB < VBmax’, IRmin’ < IR < IRmax’; it is determined that a diode chip is installed at the target detection point. Here, the target detection point refers to any detection point.

[0037] Based on the above method, the anti-mixing detection system compares the electrical data corresponding to each detection point of the product to be measured with the initial calibration range respectively, determines whether there is a diode chip at the corresponding detection point, and finally integrates to obtain a determination result. The determination result is based on the determination content of whether there is a diode chip at all detection points and can be represented in the same form as the product type, such as 1N2Y.

[0038] S103, match the determination result with the product type included in the predefined instruction. If the match is successful, output the performance detection result of the product to be measured based on the electrical data analysis; if the match is unsuccessful, output a mixing warning message so that the inspection personnel can obtain the mixing warning message or the performance detection result.

[0039] In implementation, after obtaining the determination result, the anti-mixing detection system is used to compare the determination result with the product type included in the predefined instruction. If the comparison is consistent, it is considered that the match is successful. At this time, the anti-mixing detection system controls the diode detector to determine the performance quality based on the electrical data and generates a performance detection result, which is used to represent the performance quality of the diode chips at each detection point where a diode chip is installed. If the comparison is inconsistent, it is considered that the match is unsuccessful, that is, a product to be measured of a different product type from the predefined instruction has been mixed into the detection pipeline. At this time, the anti-mixing detection system is used to output a mixing warning message, and the mixing warning message and the performance detection result can be displayed on the touch display screen so that the inspection personnel can obtain them.

[0040] Optionally, the anti-mixing detection method further includes the following steps: Whenever a predefined instruction is received, based on the product type of the product to be measured and the pre-stored detection time consumption correspondence table, predict and output the total detection duration required to complete the predefined instruction; where the detection time consumption correspondence table pre-stores the detection time consumption of products to be measured of different product types; When there are multiple detection pipelines, according to the completion time of all predefined instructions in the task queue corresponding to each detection pipeline and the currently predicted total detection duration, take the detection pipeline with the earliest completion time among all detection pipelines as the target detection pipeline, and add the current predefined instruction to the task list of the target detection pipeline so that the target detection pipeline sequentially executes all predefined instructions in the corresponding task list according to the addition time.

[0041] In implementation, a detection time consumption correspondence table is also pre-stored in the anti-mixing detection system. The detection time consumption correspondence table stores different product types and the detection time consumption corresponding to each product type. The detection time consumption is used to represent the total duration of completing the above steps S102 and S103 for a single product under test. The anti-mixing detection system is used to, each time it receives a predefined instruction and the predefined instruction includes the quantity of the product under test, look up, according to the product type in the predefined instruction, the detection time consumption corresponding to this product type from the detection time consumption correspondence table, and then calculate the total detection duration required to complete this predefined instruction. The total detection duration = the quantity of the product under test * the detection time consumption.

[0042] If there are multiple detection pipelines, it is possible to determine which detection pipeline to add the currently received predefined instruction to according to the time points (i.e., completion times) when each detection pipeline completes all the predefined instructions in its corresponding task list, so as to ensure that the currently received predefined instruction can start execution as quickly as possible. Correspondingly, each detection pipeline corresponds to a task list, and the task list contains the predefined instructions that need to be executed by this detection pipeline. And as can be seen from the previous text, each predefined instruction corresponds to a total detection duration. Therefore, it is possible to determine the completion time of the corresponding detection pipeline based on the total detection durations of all the predefined instructions, and then select the detection pipeline with the earliest completion time from all the detection pipelines as the target detection pipeline, and add the currently received predefined instruction to the task list corresponding to the target detection pipeline.

[0043] Optionally, "matching the determination result with the product type included in the predefined instruction" in S102 and S103 specifically includes: Based on the product type included in the predefined instruction, all the detection points of the product under test are divided into a coreless group and a cored group; among them, the coreless group refers to the set of detection points that do not require the installation of a diode chip as specified for the corresponding product type. Correspondingly, the cored group refers to the set of detection points that are installed with a diode chip as specified for the corresponding product type; Based on the number of detection points included in the coreless group, the preset initial calibration range is corrected to obtain a first calibration range. Based on the number of detection points included in the cored group, the preset initial calibration range is corrected to obtain a second calibration range; among them, both the first calibration range and the second calibration range are closed intervals; Obtain the electrical property data of all the detection points included in the product under test, and determine whether the sum of the electrical property data of all the detection points included in the coreless group is within the first calibration range; determine whether the sum of the electrical property data of all the detection points included in the cored group is within the second calibration range; If the sum of the electrical property data of all the detection points included in the coreless group is within the first calibration range, and the sum of the electrical property data of all the detection points included in the cored group is within the second calibration range, it is considered that the matching is successful; otherwise, it is considered that the matching is unsuccessful. Based on the electrical property data of all the detection points included in the coreless group, a first detection point group is determined from the coreless group. Each first detection point group includes two first detection points, and the two first detection points satisfy that in the coreless group, the difference between the corresponding electrical property data is greater than the reference difference. Based on the electrical property data of all the detection points included in the cored group, a second detection point group is determined from the cored group. Each second detection group includes two second detection points, and the two second detection points satisfy that in the cored group, the difference between the corresponding electrical property data is greater than the reference difference. Based on the number of points of the first detection points and the second detection points, a matching model with a quantity consistent with the number of points is allocated, and a one-to-one correspondence is established between the matching module and the corresponding detection points. Use all the matching modules to compare the electrical property data of the corresponding detection points with the initial calibration range at the same time, analyze and obtain the chip state, and then compare the chip state with the chip state of the corresponding detection points included in the product type to obtain a determination result. If the determination results of all the first detection points and the second detection points are consistent, it is considered that the matching is successful; otherwise, the matching is unsuccessful.

[0044] In implementation, before comparing the electrical property data of all the detection points with the initial calibration range, the present application proposes to divide all the detection points of the product to be tested into two categories, namely a coreless group and a cored group, according to the product type included in the predefined instruction. The coreless group includes the point identifiers of all the detection points with the chip state of N in the product type; correspondingly, the cored group includes the point identifiers of all the detection points with the chip state of Y in the product type. And the detection points (i.e., the first detection points) with the difference between any two electrical property data in the coreless group greater than the difference between the two endpoint values of the initial calibration range (i.e., the reference difference) are used as a first detection point group; the detection points (i.e., the second detection points) with the difference between any two electrical property data in the cored group greater than the reference difference are used as a second detection point group.

[0045] Next, the anti-mixing detection system is used to correct the first initial range included in the initial calibration range based on the number M of the detection points in the coreless group according to the above grouping. The correction method is to correct the first initial range (VFmin, VFmax), (VBmin, VBmax), (IRmin, IRmax) to the first calibration range: (M*VFmin, M*VFmax), (M*VBmin, M*VBmax), (M*IRmin, M*IRmax); Based on the number of detection points N in the cored group, the second initial range included in the initial calibration range is corrected. The correction method is: correcting the second initial ranges (VFmin’, VFmax’), (VBmin’, VBmax’), (IRmin’, IRmax’) to the second calibration ranges: (N*VFmin’, N*VFmax’), (N*VBmin’, N*VBmax’), (N*IRmin’, N*IRmax’); Then sum up the electrical property data of all detection points included in the non-cored group, that is 1 ≤ i ≤ M. Then compare the sum of the electrical property data with the corresponding corrected first calibration range. If it is considered that the sum of the electrical property data of all detection points included in the non-cored group is within the first calibration range; Then sum up the electrical property data of all detection points included in the cored group, that is 1 ≤ j ≤ N. Then compare the sum of the electrical property data with the corresponding corrected second calibration range. If it is considered that the sum of the electrical property data of all detection points included in the cored group is within the second calibration range; if all are within the corresponding calibration ranges, it is considered that the matching is unsuccessful, and if there is a situation where it is not within, it is considered that the matching is unsuccessful. Moreover, the matching model will be used to perform secondary detection on each first detection point and each second detection point respectively. Specifically: The anti-mixing detection system is used to allocate a number of matching modules consistent with the number of points P based on the number of points P of the first detection points and the second detection points, and establish a one-to-one correspondence between the matching modules and the detection points. Through all the matching modules, the electrical property data of the corresponding detection points are compared with the initial calibration range, that is, the electrical property data corresponding to the first detection points are compared with the first initial range, and the electrical property data corresponding to the second detection points are compared with the second initial range; if the electrical property data corresponding to all the first detection points are within the first initial range, and the electrical property data corresponding to all the second detection points are within the second initial range, it is considered that the matching is successful, otherwise the matching is unsuccessful.

[0046] Optionally, the anti-mixing detection method further includes: After the installation of the diode chips in the photovoltaic junction box is completed and before encapsulation, take an installation image, where the installation image at least includes the images of all detection stations in the photovoltaic junction box; Analyze whether there is a diode chip at each detection station based on the installation image, analyze to obtain the product type, and generate a label corresponding to the product type. S101 further includes: Scan the label corresponding to the product under test moving on the detection production line, and confirm the corresponding product type. If the product type at the current scanning moment is inconsistent with the product type scanned at the previous scanning moment, and is consistent with the product type scanned at the next scanning moment after the current scanning moment, then after a specified duration, update the predefined instruction according to the product type at the current scanning moment. If the product type at the current scanning moment is inconsistent with the product types corresponding to the previous scanning moment and the next scanning moment, then output a material mixing warning message.

[0047] In implementation, after the installation of the diode chip in the photovoltaic junction box is completed and before encapsulation using epoxy resin or other methods, use a preset camera device to capture the installation image. The installation image is an image of the side surface of the photovoltaic junction box with the detection position. The anti-material mixing detection system is used to compare the installation image with the preset reference images one by one. Among them, the anti-material mixing detection system stores the reference image corresponding to each product type and the label corresponding to each product type. Therefore, when the comparison is consistent, the product type corresponding to the installation image can be determined, and a preset marking device (such as a printing device or a device related to pasting labels) is controlled to imprint the label on the surface of the photovoltaic junction box. Exemplarily, the label can be in the form of a two-dimensional code or an image. Correspondingly, a preset identification device (such as a barcode reader or a camera) is provided on the detection production line. The identification device and the preset station are arranged in sequence along the conveying direction of the detection production line, that is, the product under test will be first conveyed to the identification device and then to the preset station. The identification device is used to scan the label and send the scanning result to the anti-material mixing detection system so that the anti-material mixing detection system can know the product type of the product under test.

[0048] The anti-material mixing detection system is also used to output a material mixing warning message when the product type at the current scanning moment is inconsistent with the product types corresponding to the previous scanning moment and the next scanning moment, that is, the product type of the product under test is detected before it moves to the preset station.

[0049] If the product type at the current scanning moment is inconsistent with the product type obtained by scanning at the previous scanning moment (hereinafter referred to as type A), and is consistent with the product type (type B) obtained by scanning at the next scanning moment after the current scanning moment, then the current scanning moment is considered to be the transition moment of the tested products of type A and type B. That is, the tested products of type A have been detected, and next, the tested products of type B will be detected. At this time, the anti-mixing detection system will automatically generate a predefined instruction pre-carried with type B, calculate the duration (i.e., the specified duration) for the tested product corresponding to the current scanning moment to move to the preset work station, and use the currently generated predefined instruction to replace the predefined instruction being executed before the current scanning moment after the specified duration. Correspondingly, the specified duration can be a fixed value obtained by manual pre-measurement, so as to achieve the automatic update trigger of the predefined instruction, replace the manual setting method, improve the switching efficiency of the predefined instruction, and further improve the detection continuity and detection efficiency of the detection pipeline for the tested products.

[0050] An embodiment of the present application also discloses a photovoltaic junction box anti-mixing detection system. Refer to Figure 3 , including: A model selection module 301, configured to allow a tester to select the product type of the tested product, trigger a predefined instruction with the product type, and send the predefined instruction to the MCU module; A calibration module 302, configured to allow a tester to define an initial calibration range, where the initial calibration range is a data range for determining whether there is a diode chip at each detection point of the tested product; A storage module 303, configured to store the product type corresponding to the model selection module and the initial calibration range corresponding to the calibration module; A communication module 304, the communication module is connected to a diode performance detector, and is configured to obtain the electrical property data of each detection point of the tested product detected by the diode performance detector and transmit the electrical property data to the MCU module; an MCU module 305, configured to receive the predefined instruction, obtain the electrical property data of all detection points included in the tested product transmitted by the communication module, retrieve the initial calibration range from the storage module, compare the electrical property data with the initial calibration range, and analyze to obtain a determination result; where the determination result is used to represent whether there is a diode chip at each detection point included in the tested product; the MCU module is further configured to match the determination result with the product type included in the predefined instruction. If the match is successful, the performance detection result of the tested product is obtained based on the electrical property data analysis; if the match is unsuccessful, a mixing warning message is generated; An input / output module 306, configured to output the performance detection result and the mixing warning message generated by the MCU module, so that the tester can know the performance detection result and the mixing warning message; The power supply module 307 is electrically connected to the MCU module for supplying power to the MCU module.

[0051] Optionally, the MCU module 305 is further configured to, whenever a predefined instruction is received, predict and output the total detection duration required to complete the predefined instruction based on the product type of the product under test and a pre-stored detection duration correspondence table; wherein, the detection duration correspondence table pre-stores the detection durations of products under test of different product types; and is further configured to, when there are multiple detection pipelines, based on the completion times of all predefined instructions in the task queue corresponding to each detection pipeline and the currently predicted total detection duration, select the detection pipeline with the earliest completion time among all detection pipelines as the target detection pipeline, and add the current predefined instruction to the task list of the target detection pipeline, so that the target detection pipeline sequentially executes all predefined instructions in the corresponding task list according to the addition time.

[0052] Optionally, the MCU module 305 is further configured to divide all detection points of the product under test into a coreless group and a cored group based on the product type included in the predefined instruction; wherein, the coreless group refers to the set of detection points that do not require the installation of diode chips as specified for the corresponding product type, and correspondingly, the cored group refers to the set of detection points that are installed with diode chips as specified for the corresponding product type; and is further configured to correct the preset initial calibration range based on the number of detection points included in the coreless group to obtain a first calibration range, and correct the preset initial calibration range based on the number of detection points included in the cored group to obtain a second calibration range; wherein, both the first calibration range and the second calibration range are closed intervals; obtain the electrical property data of all detection points included in the product under test, and determine whether the sum of the electrical property data of all detection points included in the coreless group is within the first calibration range; determine whether the sum of the electrical property data of all detection points included in the cored group is within the second calibration range; The MCU module 305 is further configured to consider that the matching is successful if the sum of the electrical property data of all detection points included in the coreless group is within the first calibration range and the sum of the electrical property data of all detection points included in the cored group is within the second calibration range, and consider that the matching is unsuccessful otherwise.

[0053] Optionally, the MCU module 305 is further configured to determine a first detection point group from the coreless group based on the electrical data of all the detection points included in the coreless group, where each first detection point group includes two first detection points, and the two first detection points satisfy that in the coreless group, the difference in the corresponding electrical data is greater than the reference difference; determine a second detection point group from the cored group based on the electrical data of all the detection points included in the cored group, where each second detection group includes two second detection points, and the two second detection points satisfy that in the cored group, the difference in the corresponding electrical data is greater than the reference difference; The MCU module 305 is further configured to compare all the first detection points and the second detection points with a preset initial calibration range respectively, analyze and obtain a determination result, and match the determination result with the product type included in the predefined specification.

[0054] Optionally, the MCU module 305 is further configured to allocate a matching model with a quantity consistent with the number of detection points based on the number of the first detection points and the second detection points, and establish a one-to-one correspondence between the matching module and the corresponding detection points; use all the matching modules to compare the electrical data of the corresponding detection points with the initial calibration range at the same time, analyze and obtain the chip status, and then compare the chip status with the chip status of the corresponding detection points included in the product type to obtain a determination result; if the determination results of all the first detection points and the second detection points are consistent, it is considered that the matching is successful, otherwise the matching is unsuccessful.

[0055] Optionally, the MCU module 305 is further configured to scan and confirm the label corresponding to the product to be tested moved to the detection production line, and confirm the corresponding product type; if the product type at the current scanning moment is inconsistent with the product type scanned at the previous scanning moment, and the product type scanned at the next scanning moment after the current scanning moment is consistent, then after a specified duration, update the predefined instruction according to the product type at the current scanning moment.

[0056] Optionally, the MCU module 305 is further configured to capture an installation image after the diode chips in the photovoltaic junction box are installed and before encapsulation, where the installation image at least includes the images of all the detection stations in the photovoltaic junction box; and is further configured to analyze whether there are diode chips at each detection station based on the installation image, analyze and obtain the product type, and generate a label corresponding to the product type.

[0057] The embodiment of the present application also discloses a photovoltaic junction box anti-mixing detection device, which includes a memory and a processor, and a computer program capable of being loaded and executed by the processor to perform the photovoltaic junction box anti-mixing detection method as described above is stored on the memory.

[0058] The embodiments of the present application also disclose a computer-readable storage medium, which stores a computer program that can be loaded and executed by a processor to perform the photovoltaic junction box anti-mixing detection method as described above. The computer-readable storage medium includes, for example, various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical discs.

[0059] It should be noted that, in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations.

[0060] The above embodiments are only used to illustrate the technical solutions of the present application, rather than limiting the protection scope of the application. Obviously, the described embodiments are only partial embodiments of the present application, rather than all embodiments. Based on these embodiments, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope to be protected by the present application.

Claims

1. A method for detecting material mixing prevention of a photovoltaic junction box, characterized in that, Including: Receiving a predefined instruction, where the predefined instruction at least includes the product type of the product under test; Receiving a detection instruction, obtaining the electrical property data of all detection points included in the product under test, comparing the electrical property data with a preset initial calibration range, and analyzing to obtain a determination result; wherein, the determination result is used to represent whether there is a diode chip at each detection point included in the product under test; Matching the determination result with the product type included in the predefined instruction. If the match is successful, outputting the performance detection result of the product under test based on the analysis of the electrical property data; if the match is unsuccessful, outputting a mixing warning message so that the detection personnel can obtain the mixing warning message or the performance detection result.

2. The photovoltaic junction box anti-mixing detection method according to claim 1, wherein, The predefined instruction further includes the quantity of the products under test; The method further includes: Whenever a predefined instruction is received, predicting and outputting the total detection duration required to complete the predefined instruction based on the product type of the product under test and a pre-stored detection time consumption correspondence table; wherein, the detection time consumption correspondence table pre-stores the detection time consumption of products under test of different product types; When there are multiple detection pipelines, based on the completion time of all predefined instructions in the task queue corresponding to each detection pipeline and the currently predicted total detection duration, taking the detection pipeline with the earliest completion time among all detection pipelines as the target detection pipeline, and adding the current predefined instruction to the task list of the target detection pipeline, so that the target detection pipeline sequentially executes all predefined instructions in the corresponding task list according to the addition time.

3. The photovoltaic junction box anti-mixing detection method according to claim 1, characterized in that, The product type includes the point identification of each detection point and the chip state corresponding to each detection point, and the chip state is used to represent whether there is a diode chip at the corresponding detection point; The obtaining the electrical property data of all detection points included in the product under test, comparing the electrical property data with a preset initial calibration range, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction includes: Based on the product type included in the predefined instruction, dividing all detection points of the product under test into a coreless group and a cored group; wherein, the coreless group refers to the set of detection points that do not need to install diode chips as stipulated by the corresponding product type, and correspondingly, the cored group refers to the set of detection points that are installed with diode chips as stipulated by the corresponding product type; Based on the number of detection points included in the coreless group, correcting the preset initial calibration range to obtain a first calibration range, and based on the number of detection points included in the cored group, correcting the preset initial calibration range to obtain a second calibration range; wherein, both the first calibration range and the second calibration range are closed intervals; Obtaining the electrical property data of all detection points included in the product under test, determining whether the sum of the electrical property data of all detection points included in the coreless group is within the first calibration range; determining whether the sum of the electrical property data of all detection points included in the cored group is within the second calibration range; If the sum of the electrical property data of all the detection points included in the coreless group is within the first calibration range, and the sum of the electrical property data of all the detection points included in the cored group is within the second calibration range, it is considered that the matching is successful; otherwise, it is considered that the matching is unsuccessful.

4. The photovoltaic junction box anti-mixing detection method according to claim 3, wherein The difference between the two endpoint values of the initial calibration range is the reference difference; The method of obtaining the electrical property data of all the detection points included in the product to be measured, comparing the electrical property data with the preset initial calibration range, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction further includes: Based on the electrical property data of all the detection points included in the coreless group, determining a first detection point group from the coreless group, where each first detection point group includes two first detection points, and the two first detection points satisfy: in the coreless group, the difference between the corresponding electrical property data is greater than the reference difference; Based on the electrical property data of all the detection points included in the cored group, determining a second detection point group from the cored group, where each second detection group includes two second detection points, and the two second detection points satisfy: in the cored group, the difference between the corresponding electrical property data is greater than the reference difference; Comparing all the first detection points and the second detection points with the preset initial calibration range respectively, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction.

5. The photovoltaic junction box anti-mixing detection method according to claim 4, characterized in that, The step of comparing all the first detection points and the second detection points with the preset initial calibration range respectively, analyzing to obtain a determination result, and matching the determination result with the product type included in the predefined instruction includes: Based on the number of the first detection points and the second detection points, allocating matching models with the same number as the number of the points, and establishing a one-to-one correspondence between the matching module and the corresponding detection point; Using all the matching modules to compare the electrical property data of the corresponding detection points with the initial calibration range simultaneously, analyzing to obtain the chip state, and then comparing the chip state with the chip state of the corresponding detection points included in the product type to obtain a determination result; If the determination results of all the first detection points and the second detection points are consistent, it is considered that the matching is successful; otherwise, the matching is unsuccessful.

6. The photovoltaic junction box anti-mixing detection method according to claim 1, characterized in that, The step of receiving the predefined instruction includes: Scanning the label corresponding to the product to be measured moving on the detection production line, and confirming the corresponding product type; If the product type at the current scanning moment is different from the product type scanned at the previous scanning moment, and the product type scanned at the next scanning moment after the current scanning moment is the same, then after a specified duration, updating the predefined instruction according to the product type at the current scanning moment.

7. The photovoltaic junction box anti-mixing detection method according to claim 6, characterized in that The method further includes: After the diode chips in the photovoltaic junction box are installed and before encapsulation, taking an installation image, where the installation image at least includes the images of all the detection stations in the photovoltaic junction box; Analyzing whether there are diode chips at each detection station based on the installation image, analyzing to obtain the product type, and generating a label corresponding to the product type.

8. A photovoltaic junction box anti-mixing detection system, characterized in that, including a model selection module (301) for allowing a tester to select the product type of the product under test, trigger a predefined instruction with the product type, and send the predefined instruction to the MCU module; a calibration module (302) for allowing a tester to define an initial calibration range, where the initial calibration range is a data range for determining whether there is a diode chip at each detection point of the product under test; a storage module (303) for storing the product type corresponding to the model selection module and the initial calibration range corresponding to the calibration module; a communication module (304) connected to the diode performance detector for obtaining the electrical property data of each detection point of the product under test detected by the diode performance detector and transmitting the electrical property data to the MCU module; an MCU module (305) for receiving the predefined instruction, obtaining the electrical property data of all detection points included in the product under test transmitted by the communication module, retrieving the initial calibration range from the storage module, comparing the electrical property data with the initial calibration range, and analyzing to obtain a determination result; where the determination result is used to indicate whether there is a diode chip at each detection point included in the product under test; the MCU module is further used to match the determination result with the product type included in the predefined instruction, and if the match is successful, obtain the performance detection result of the product under test based on the analysis of the electrical property data; if the match is unsuccessful, generate a mixing warning message; an input / output module (306) for outputting the performance detection result and the mixing warning message generated by the MCU module so that the tester can know the performance detection result and the mixing warning message; a power supply module (307) electrically connected to the MCU module for supplying power to the MCU module.

9. A photovoltaic junction box anti-mixing detection device, characterized in that, including a memory and a processor, where a computer program capable of being loaded and executed by the processor as any one of the methods according to claims 1 to 7 is stored on the memory.

10. A computer-readable storage medium, characterized in that, storing a computer program capable of being loaded and executed by the processor as any one of the methods according to claims 1 to 7.

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