Testing device for testing double-table-board small-version silicon controlled rectifier and using method thereof

Abstract

The invention discloses a testing device for testing a double-table-board small-version silicon controlled rectifier and a using method thereof, and relates to the technical field of double-table-board small-version silicon controlled rectifiers, the testing device comprises a box body, a transportation channel and a testing groove, and the transportation channel is arranged on the outer wall of the box body. Through the arrangement of the box body, the conveying channel and the testing groove, the precise monitoring and positioning functions of the pin monitor part and the laser positioner part are combined, the state of the silicon controlled rectifier pin can be monitored in real time, the position of the silicon controlled rectifier pin can be precisely adjusted, and the processor part precisely regulates and controls the silicon controlled rectifier pin to be inserted into the testing groove according to laser positioning data. Meanwhile, a pin correction assembly is started by utilizing pin monitoring data, the pin correction assembly adjusts and keeps the pin structure stable through a first through groove, a first driving groove, a first driving block, a first multi-stage cylinder and a correction rod, meanwhile, a display screen is interacted, a test result and operation guidance can be visually displayed, the test efficiency and accuracy are improved, and the test cost is reduced. And therefore, efficient and accurate testing of the double-table-board small-version silicon controlled rectifier can be realized.

Description

Technical Field

[0001] The present invention relates to the technical field of double-table small-size thyristors, and particularly to a test device for testing double-table small-size thyristors and a using method thereof. Background Art

[0002] A double-table thyristor, also known as a double-table silicon-controlled rectifier, is a semiconductor device composed of four layers of alternating P-type and N-type materials (PNPN). Its structural feature is that there is no through isolation wall inside the device, but instead, it is composed of grooves with symmetrical positions on the front and back sides. During the preparation of the double-table thyristor, a test device is required to test and detect it.

[0003] The defects existing in the existing test devices for double-table small-size thyristors are as follows: 1. The patent document US4031431A discloses a ground fault circuit interrupter. However, the device in the above document cannot adjust and maintain the stability of the pin structure during use for testing, and there are technical problems of low test accuracy and efficiency. 2. The patent document US08068318B2 discloses a ground fault current interrupter device with an overall life termination indication and shutdown protection function. However, the device in the above document cannot limit and clamp thyristors of different specifications, and there are technical problems of poor stability during the test. 3. The patent document US4056776A discloses a combined thyristor connection and test device. However, during the transportation process of the thyristor in the above document, there is a technical problem that the thyristor cannot be transported smoothly and efficiently. 4. The patent document CN101581755A discloses a thyristor test device. However, during the use of the thyristor test device in the above document, there is a technical problem that it is impossible to achieve rapid and accurate sorting operations for thyristors. Summary of the Invention

[0004] The purpose of the present invention is to provide a test device for testing double-table small-size thyristors and a using method thereof, so as to solve the technical problems raised in the above background art.

[0005] To achieve the above purpose, the present invention provides the following technical solution: A test device for testing double-table small-size thyristors and a using method thereof, including a box body, a transportation channel, and a test slot. The outer wall of the box body is provided with a transportation channel, and the inner wall of the transportation channel is provided with a plurality of test slots. A number of pin monitors and laser locators are fitted at the top of the inner wall of the transport channel. The position of the pin monitors is above that of the laser locators, and the position of the laser locators is above the test slot. The pin monitors are used to collect the state data of the thyristor pins and send the collected data to the processor unit. The laser locators are used to ensure the set position of the thyristor movement and send the acquired data to the processor unit. The processor unit adjusts the insertion of the thyristor pins into the test slot according to the data sent by the laser locators and activates the pin correction assembly through the data collected by the pin monitors. The pin correction assembly is arranged inside the test slot and is used to adjust and maintain the stability of the pin structure. The processor unit is electrically connected to an interactive display screen, and the interactive display screen is installed on the top of the box body; The pin correction assembly includes a number of first through slots, and the first through slots are opened on the inner bottom wall of the test slot. A first drive slot is arranged at the bottom of the first through slot. A first drive block is movably connected inside the first drive slot. A number of first multi-stage cylinders are fitted at the top of the first drive block. The top of the first multi-stage cylinders is fixedly connected to a correction rod, and the outer wall of the correction rod is movably connected to the inner wall of the first through slot. One side of the first drive block is fixedly connected to a telescopic cylinder, and the outer wall of the telescopic cylinder is fitted inside the inner wall of the first drive slot.

[0006] Preferably, mounting slots are arranged on one side and the other side at the four corners inside the transport channel. Gears are arranged inside the mounting slots. One end of one group of gears is fixedly connected to a transmission rod. One end of the transmission rod penetrates through the box body and is connected to a second drive unit, and the second drive unit is fixedly connected to the bottom on one side of the box body.

[0007] Preferably, a chain is meshed with the outer wall of the gear. A transmission metal plate is arranged inside the chain. And at every other transmission metal plate, an adjustment block is added on its top. A second drive slot is arranged on the top of the adjustment block. A second drive block is movably connected to the inner wall of the second drive slot. One side of the adjustment block is fixedly connected to a third drive unit. The output end of the third drive unit is fixedly connected to a second threaded rod structure, and the other end of the second threaded rod structure is threadedly penetrated through the second drive block and is arranged on the inner wall of the second drive slot through a bearing.

[0008] Preferably, a group of second through slots are arranged on the top of the second drive block. A third drive slot is arranged at the bottom of the second through slot. A group of third drive blocks are movably connected inside the third drive slot. A group of second multi-stage cylinders are fitted at the top of the third drive blocks. The outer walls of the second multi-stage cylinders are movably connected to the inner walls of the second through slots. The top of the second multi-stage cylinders is fixedly connected to a clamping plate, and a clamping soft pad is fixedly pasted on one side of the clamping plate.

[0009] Preferably, a fourth driving component is fixedly connected to the back side of the second driving block, a bidirectional lead screw is fixedly connected to the output end of the fourth driving component, and one end of the bidirectional lead screw is threadedly passed through a group of third driving blocks and is arranged on the inner wall of the third driving groove through a rotating shaft, a group of first suction cups are embedded on the top of the second driving block, the bottom of the first suction cup is connected to the first air pump through a pipeline, and the first air pump is arranged on the inner wall of the third driving groove.

[0010] Preferably, a transport box is provided at the front end of the top of the box body, the top of the transport box is movably connected to a limit cover, the top of the limit cover is fixedly connected to a group of pull rings, a transport groove is provided inside the transport box, one end of the transport groove is fixedly connected to a plurality of limit blocks, one side of the limit block is embedded with a laser ranging component, the laser ranging component is used to monitor in real time the distance between the double-table small-version thyristor and the limit block, a plurality of double-table small-version thyristors are placed inside the transport groove, the double-table small-version thyristor includes a first table, a second table and pins, and the second table is fixedly connected to the top of the first table, and the pins are arranged on one side of the first table, one end of the transport box is fixedly connected to a third multi-stage cylinder, the output end of the third multi-stage cylinder passes through the transport box and is fixedly connected to a push block, and the outer wall of the push block is movably connected to the inner wall of the transport groove.

[0011] Preferably, a good product storage slot and a bad product storage slot are respectively provided at the tail end of the top of the box body, a slide rail is provided at the tail end of the top of the box body, a moving block is provided on the front of the slide rail, a fourth multi-stage cylinder is provided on the front of the moving block, one end of the fourth multi-stage cylinder is fixedly connected to the second air pump, and the front of the second air pump is fixedly connected to the second suction cup.

[0012] Preferably, a fifth multi-stage cylinder is embedded in the inner top wall of the test slot, and a connecting contact is fixedly connected to the bottom of the fifth multi-stage cylinder. The connecting contact is electrically connected to a test unit, and the test unit is electrically connected to a processor component. The test unit includes a trigger current test module, a trigger voltage test module, a conduction voltage test module and a leakage current test module.

[0013] Preferably, the working steps of the testing device for testing the double-table small-size thyristor are as follows: S1. The laser locator component monitors the position of the small-size double-table thyristor in real time to ensure that it is accurately moved to the inside of the test slot during transportation; S2, the pin monitor component collects the state data of the thyristor pin in real time and sends the data to the processor component, which analyzes the pin data and activates the pin correction component once it finds that the pin position is deviated or the structure is unstable; S3, the pin correction component pushes the correction rod through the first multi-stage cylinder to adjust the pin position to the correct state to ensure the stability of the pin structure; S4. After the thyristor pins are correctly inserted into the test slots, the fifth multi-stage cylinder drives the connecting contact piece to contact the pins of the thyristor. The connecting contact piece transmits the test signal to the test unit through electrical connection. The test unit includes a trigger current test module, a trigger voltage test module, a conduction voltage test module, and a leakage current test module to conduct a comprehensive performance test on the thyristor; S5. The processor component judges the quality of the thyristor according to the test results and displays the test results through the interactive display screen.

[0014] Preferably, the following steps are further included in the S1: S11. The processor component precisely adjusts the position of the thyristor according to the data sent by the laser locator component so that its pins are aligned with the test slots; The following steps are further included in the S4: S41. The test data is sent to the processor component through electrical connection for processing and analysis.

[0015] Compared with the prior art, the beneficial effects of the present invention are: 1. Through the settings of the box body, the transportation channel and the test slots, combined with the precise monitoring and positioning functions of the pin monitor component and the laser locator component, the present invention can realize the real-time monitoring of the thyristor pin state and the precise adjustment of the position. The processor component precisely regulates the insertion of the thyristor pins into the test slots according to the laser positioning data. At the same time, the pin correction component is started by using the pin monitoring data. The correction component adjusts and maintains the stability of the pin structure through the first through slot, the first driving slot, the first driving block, the first multi-stage cylinder and the correction rod. Meanwhile, the interactive display screen can intuitively display the test results and operation guides, improving the test efficiency and accuracy, and thus realizing the efficient and precise test of the double-sided small-size thyristor; 2. By starting the second driving component to drive the gear to rotate, driving the chain and the transmission metal plate to move, and driving the continuous conveying of the thyristor, through the settings of the second driving slot on the adjusting block, the third driving component and the second threaded rod structure, the position of the second driving block can be adjusted, and then the thyristor can be driven to move. Then, through the cooperation of the fourth driving component and the bidirectional lead screw, the third driving block and the second multi-stage cylinder can be driven to move in the third driving slot, so as to adjust the distance between the clamping plates to ensure the effective clamping of thyristors of different specifications. At the same time, the setting of the first suction cup and the first air pump provides an additional fixing method for the thyristor, enhancing its stability during the test process, and thus improving the automation level and test efficiency of the test device, ensuring the accuracy and reliability of the test; 3. The present invention provides an efficient and orderly transportation and positioning solution for double-sided small-sized thyristors by adding a transportation box. The transportation grooves and limiting blocks designed inside the transportation box, combined with the real-time monitoring function of the laser ranging component, can accurately control the position and distance of the double-sided small-sized thyristors during transportation, ensuring their accurate alignment before entering the testing process. The push block driven by the third multi-stage cylinder can smoothly push the thyristor to one end of the transportation groove and be restricted by the limiting block, thereby facilitating its clamping and movement by the clamping plate, improving the overall testing efficiency and accuracy; 4. The present invention sets up a qualified product storage groove and a defective product storage groove at the tail end of the top of the box body, as well as a sorting and handling structure composed of a supporting slide rail, a moving block, a fourth multi-stage cylinder, a second air pump, and a second suction cup. According to the test results, it can automatically sort the double-sided small-sized thyristors into the qualified product or defective product storage grooves. Driven by the moving block on the slide rail and the fourth multi-stage cylinder, the second air pump and the second suction cup can accurately adsorb and handle the thyristors, realizing fast and accurate sorting operations. This design not only improves the efficiency of the testing process but also ensures the accurate classification of products, providing convenience for subsequent processing. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is a schematic diagram of the overall structure of the present invention; Figure 2 is a schematic diagram of the chain structure of the present invention; Figure 3 is a schematic diagram of the transportation box structure of the present invention; Figure 4 is a schematic diagram of the transportation groove structure of the present invention; Figure 5 is a schematic diagram of the slide rail structure of the present invention; Figure 6 is a schematic diagram of the test groove structure of the present invention; Figure 7 is a schematic diagram of the second through groove structure of the present invention; Figure 8 is a schematic diagram of the transportation channel structure of the present invention; Figure 9 of the present invention Figure 8 schematic diagram of the structure at A; Figure 10 is a schematic diagram of the processor component process of the present invention; Figure 11 is a schematic diagram of the working process of the present invention.

[0017] In the figure: 1. Box body; 2. Transportation channel; 3. Test tank; 4. Pin monitor component; 5. Laser locator component; 6. Processor component; 7. First through slot; 8. First drive slot; 9. First drive block; 10. First multi-stage cylinder; 11. Correction rod; 12. Telescopic cylinder; 14. Interactive display screen; 15. Installation slot; 16. Gear; 17. Second drive component; 18. Chain; 19. Transmission metal plate; 20. Adjusting block; 21. Second drive slot; 22. Second drive block; 23. Third drive component; 24. Second threaded rod structure; 25. Second through slot; 26. Third drive slot; 27. Third drive block; 28. Second multi-stage cylinder; 29. Clamping plate; 30. Clamping soft pad; 31. Fourth drive component; 32. Bi-directional lead screw; 33. First suction cup; 34. First air pump; 35. Transportation box; 36. Limit cover; 37. Pull ring; 38. Laser distance measuring component; 39. Third multi-stage cylinder; 40. Pushing block; 41. Good product storage slot; 42. Defective product storage slot; 43. Slide rail; 44. Moving block; 45. Fourth multi-stage cylinder; 46. Second air pump; 47. Second suction cup; 48. Fifth multi-stage cylinder; 49. Connecting contact; 50. Test unit; 51. Transmission rod; 52. Transportation slot; 53. Limiting block. Detailed implementation manner

[0018] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0019] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "upper", "lower", "inner", "outer", "front end", "rear end", "both ends", "one end", "the other end", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0020] In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, terms such as "installation", "provided with", "connection", etc. should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0021] Embodiment 1: Please refer to Figure 1 , Figure 6 , Figure 9 and Figure 10 , an embodiment provided by the present invention: A test device for testing a double-sided small-size thyristor and its usage method, including a box body 1, a transportation channel 2, and a test slot 3. The outer wall of the box body 1 is provided with the transportation channel 2, and the inner wall of the transportation channel 2 is provided with a plurality of test slots 3; A plurality of pin monitors 4 and laser locators 5 are fitted on the top of the inner wall of the transportation channel 2. The position of the pin monitor 4 is above the laser locator 5, and the position of the laser locator 5 is above the test slot 3. The pin monitor 4 is used to collect the status data of the thyristor pins and send the collected data to the processor component 6. The laser locator 5 is used to ensure the set position of the thyristor movement and send the obtained data to the processor component 6. The processor component 6 adjusts the insertion of the thyristor pins into the test slot according to the data sent by the laser locator 5, and starts the pin correction component through the data collected by the pin monitor 4. The pin correction component is arranged inside the test slot 3 and is used to adjust and maintain the stability of the pin structure. The processor component 6 is electrically connected to an interactive display screen 14, and the interactive display screen 14 is installed on the top of the box body 1; The pin correction component includes a plurality of groups of first through slots 7, and the first through slots 7 are opened on the inner bottom wall of the test slot 3. The bottom of the first through slot 7 is provided with a first drive slot 8. A first drive block 9 is movably connected inside the first drive slot 8. A plurality of first multi-stage cylinders 10 are fitted on the top of the first drive block 9. The top of the first multi-stage cylinder 10 is fixedly connected to a correction rod 11, and the outer wall of the correction rod 11 is movably connected to the inner wall of the first through slot 7. One side of the first drive block 9 is fixedly connected to a telescopic cylinder 12, and the outer wall of the telescopic cylinder 12 is fitted on the inner wall of the first drive slot 8; Furthermore, through the setting of the box 1, the transport channel 2 and the test slot 3, combined with the precise monitoring and positioning functions of the pin monitor component 4 and the laser locator component 5, the real-time monitoring of the state of the thyristor pin and the precise adjustment of the position can be achieved. The processor component 6 accurately adjusts the thyristor pin to be inserted into the test slot 3 according to the laser positioning data, and at the same time uses the pin monitoring data to start the pin correction component, which adjusts and maintains the pin structure stable through the first through slot 7, the first drive slot 8, the first drive block 9, the first multi-stage cylinder 10 and the correction rod 11. At the same time, the interactive display screen 14 can intuitively display the test results and operation instructions, improve the test efficiency and accuracy, and thus achieve efficient and accurate testing of double-table small-size thyristors.

[0022] Example 2: Please refer to Figure 1 , Figure 2 , Figure 7 and Figure 8 , an embodiment provided by the present invention: a mounting groove 15 is provided on one side and the other side of the four corners inside the transport channel 2, a gear 16 is provided inside the mounting groove 15, one end of a group of gears 16 is fixedly connected to a transmission rod 51, one end of the transmission rod 51 passes through the box body 1 and is connected to a second driving component 17, and the second driving component 17 is fixedly connected to the bottom of one side of the box body 1; The outer wall of the gear 16 is meshedly connected with a chain 18, and the inner wall of the chain 18 is provided with a transmission metal plate 19, and an adjustment block 20 is added on the top of each transmission metal plate 19, and a second driving groove 21 is provided on the top of the adjustment block 20, and the inner wall of the second driving groove 21 is movably connected with a second driving block 22, and a third driving component 23 is fixedly connected to one side of the adjustment block 20, and the output end of the third driving component 23 is fixedly connected to a second threaded rod structure 24, and the other end of the second threaded rod structure 24 is threaded through the second driving block 22 and is arranged on the inner wall of the second driving groove 21 through a bearing; A group of second through slots 25 are provided on the top of the second driving block 22, a third driving slot 26 is provided on the bottom of the second through slot 25, a group of third driving blocks 27 are movably connected inside the third driving slot 26, a group of second multi-stage cylinders 28 are embedded on the top of the third driving block 27, and the outer wall of the second multi-stage cylinder 28 is movably connected to the inner wall of the second through slot 25, a clamping plate 29 is fixedly connected to the top of the second multi-stage cylinder 28, and a clamping cushion 30 is fixedly attached to one side of the clamping plate 29; The back of the second driving block 22 is fixedly connected with a fourth driving component 31, and the output end of the fourth driving component 31 is fixedly connected with a bidirectional lead screw 32, and one end of the bidirectional lead screw 32 is threaded through a group of third driving blocks 27 and is arranged on the inner wall of the third driving groove 26 through a rotating shaft, and a group of first suction cups 33 are embedded on the top of the second driving block 22, and the bottom of the first suction cups 33 is connected to a first air pump 34 through a pipeline, and the first air pump 34 is arranged on the inner wall of the third driving groove 26; Furthermore, the transmission and adjustment system composed of the mounting groove 15, the gear 16, the transmission rod 51, the second driving component 17, the chain 18, the transmission metal plate 19 and the adjustment block 20 realizes the automatic transmission and precise positioning of the thyristor in the transportation channel 2. The second driving component 17 is started to drive the gear 16 to rotate, drive the chain 18 and the transmission metal plate 19 to move, and drive the continuous transportation of the thyristor. The second driving groove 21, the third driving component 23 and the second threaded rod structure 24 on the adjustment block 20 can be set to adjust the position of the second driving block 22. The fourth driving component 31 and the bidirectional lead screw 32 are used together to drive the third driving block 27 and the second multistage cylinder 28 to move in the third driving groove 26, so as to adjust the distance between the clamping plates 29 to ensure the effective clamping of thyristors of different specifications. At the same time, the setting of the first suction cup 33 and the first air pump 34 can provide an additional fixing method for the thyristor, enhance its stability during the test, thereby improving the automation level and test efficiency of the test device and ensuring the accuracy and reliability of the test.

[0023] Example 3: Please refer to Figure 1 , Figure 3 and Figure 4 , an embodiment provided by the present invention: a transport box 35 is arranged at the front end of the top of the box body 1, the top of the transport box 35 is movably connected to a limit cover 36, the top of the limit cover 36 is fixedly connected to a group of pull rings 37, a transport groove 52 is arranged inside the transport box 35, one end of the transport groove 52 is fixedly connected to a plurality of limit blocks 53, a laser distance measuring component 38 is embedded and installed on one side of the limit block 53, the laser distance measuring component 38 is used to monitor the distance between the double-table small-size thyristor and the limit block 53 in real time, a plurality of double-table small-size thyristors are placed inside the transport groove 52, the double-table small-size thyristor includes a first table, a second table and a pin, and the second table is fixedly connected to the top of the first table, and the pin is arranged on one side of the first table, one end of the transport box 35 is fixedly connected to a third multi-stage cylinder 39, the output end of the third multi-stage cylinder 39 passes through the transport box 35 and is fixedly connected to a push block 40, and the outer wall of the push block 40 is movably connected to the inner wall of the transport groove 52; Furthermore, by adding a transport box 35, it is used to provide an efficient and orderly transportation and positioning solution for the small-sized double-table thyristor. The transport slot 52 and the limiting block 53 designed inside the transport box 35, combined with the real-time monitoring function of the laser ranging component 38, can accurately control the position and distance of the small-sized double-table thyristor during transportation, ensuring its accurate alignment before entering the test process. The push block 40 driven by the third multi-stage cylinder 39 can smoothly push the thyristor to one end of the transport slot 52 and be restricted by the limiting block 53, thereby facilitating the movement of the clamping plate 29, thereby improving the overall test efficiency and accuracy.

[0024] Example 4: Please refer to Figure 1 and Figure 5 , an embodiment provided by the present invention: a good product storage slot 41 and a bad product storage slot 42 are respectively provided at the tail end of the top of the box body 1, a slide rail 43 is provided at the tail end of the top of the box body 1, a moving block 44 is provided on the front of the slide rail 43, a fourth multi-stage cylinder 45 is provided on the front of the moving block 44, one end of the fourth multi-stage cylinder 45 is fixedly connected to a second air pump 46, and a second suction cup 47 is fixedly connected to the front of the second air pump 46; Furthermore, by arranging a good product storage slot 41 and a bad product storage slot 42 at the tail end of the top of the box body 1, and a matching slide rail 43, a moving block 44, a fourth multi-stage cylinder 45, a second air pump 46 and a second suction cup 47 to form a sorting and transportation structure, the double-table small-size thyristors can be automatically sorted into the good product or bad product storage slot 42 according to the test results. Driven by the moving block 44 and the fourth multi-stage cylinder 45 on the slide rail 43, the second air pump 46 and the second suction cup 47 can accurately absorb and transport the thyristors, thereby realizing fast and accurate sorting operations. This design not only improves the efficiency of the testing process, but also ensures the accuracy of product classification, providing convenience for subsequent processing.

[0025] Example 5: Please refer to Figure 6 and Figure 10 , an embodiment provided by the present invention: a fifth multi-stage cylinder 48 is embedded in the inner top wall of the test slot 3, a connecting contact 49 is fixedly connected to the bottom of the fifth multi-stage cylinder 48, the connecting contact 49 is electrically connected to a test unit 50, and the test unit 50 is electrically connected to the processor component 6, and the test unit 50 includes a trigger current test module, a trigger voltage test module, a conduction voltage test module and a leakage current test module; Furthermore, through the fifth multi-stage cylinder 48, the connection contact piece 49 connected to its bottom is closely connected to the test unit 50, forming a comprehensive and efficient test system. This system integrates a trigger current test module, a trigger voltage test module, a conduction voltage test module, and a leakage current test module, and can comprehensively test the performance of the double-sided small-sized thyristor. Through the electrical connection between the processor component 6 and the test unit 50, test data can be collected and analyzed in real time, ensuring the accuracy and reliability of the test. Furthermore, not only the test efficiency is improved, but also the comprehensiveness and accuracy of the test results are significantly enhanced, providing a strong guarantee for product quality control.

[0026] Embodiment 6: Please refer to Figure 11 , an embodiment provided by the present invention: The working steps of the test device for testing the double-sided small-sized thyristor are as follows: S1. The laser locator component 5 monitors the position of the double-sided small-sized thyristor in real time to ensure that it is accurately moved into the test slot 3 during transportation; S2. The pin monitor component 4 collects the status data of the thyristor pins in real time and sends the data to the processor component 6. The processor component 6 analyzes the pin data. Once a pin position deviation or structural instability is found, the pin correction component is activated; S3. The pin correction component pushes the correction rod 11 through the first multi-stage cylinder 10 to adjust the pin position to the correct state to ensure the stability of the pin structure; S4. The position of the thyristor is adjusted by the cooperation of the adjustment block 20, the second drive block 22, and the second multi-stage cylinder 28. Then, the thyristor is clamped by the clamping plate 29 and the clamping soft pad 30, or the first suction cup 33 and the first air pump 34 are used in combination, and the position of the suction cup is adjusted by the fourth drive component 31 and the bidirectional lead screw 32 to adsorb and fix the thyristor; S5. After the thyristor pins are correctly inserted into the test slot 3, the fifth multi-stage cylinder 48 drives the connection contact piece 49 to contact the thyristor pins. The connection contact piece 49 transmits the test signal to the test unit 50 through electrical connection. The test unit 50 includes a trigger current test module, a trigger voltage test module, a conduction voltage test module, and a leakage current test module to comprehensively test the performance of the thyristor; S6. The processor component 6 judges the quality of the thyristor according to the test results, displays the test results through the interactive display screen 14, and classifies and stores the thyristor into the good product storage slot 41 or the defective product storage slot 42 by using the fourth multi-stage cylinder 45, the second air pump 46, and the second suction cup 47 according to the test results; S7. Repeat the above steps to continue testing the next group of double-sided small-sized thyristors until all the samples to be tested are completed; The following steps are also included in S1: S11. The processor component 6 precisely adjusts the position of the thyristor according to the data sent by the laser locator component 5 so that its pins are aligned with the test slot 3; The following steps are further included in S5: S51. The test data is sent through electrical connection to the processor component 6 for processing and analysis.

[0027] Working principle: Through the settings of the box body 1, the transportation channel 2, and the test slot 3, combined with the precise monitoring and positioning functions of the pin monitor component 4 and the laser locator component 5, the real-time monitoring of the thyristor pin status and the precise adjustment of the position can be achieved. The processor component 6 precisely controls the insertion of the thyristor pins into the test slot 3 according to the laser positioning data, and at the same time activates the pin correction component by using the pin monitoring data. The correction component adjusts and maintains the stability of the pin structure through the first through slot 7, the first drive slot 8, the first drive block 9, the first multi-stage cylinder 10, and the correction rod 11. At the same time, the interactive display screen 14 can intuitively display the test results and operation guides, improving the test efficiency and accuracy, and thus realizing the efficient and precise testing of the double-sided small-size thyristor. Through the transmission and adjustment system composed of the installation slot 15, the gear 16, the transmission rod 51, the second drive component 17, the chain 18, the transmission metal plate 19, and the adjustment block 20, the automatic transmission and precise positioning of the thyristor in the transportation channel 2 are realized. Starting the second drive component 17 drives the gear 16 to rotate, drives the chain 18 and the transmission metal plate 19 to move, and drives the continuous transportation of the thyristor. Through the settings of the second drive slot 21 on the adjustment block 20, the third drive component 23, and the second threaded rod structure 24, the position of the second drive block 22 can be adjusted, thereby driving the thyristor to move. Then, through the cooperation of the fourth drive component 31 and the bidirectional lead screw 32, the third drive block 27 and the second multi-stage cylinder 28 can be driven to move in the third drive slot 26, so as to adjust the distance between the clamping plates 29 to ensure the effective clamping of thyristors of different specifications. At the same time, the setting of the first suction cup 33 and the first air pump 34 provides an additional fixing method for the thyristor, enhancing its stability during the test process, and thus improving the automation level and test efficiency of the test device, ensuring the accuracy and reliability of the test. By adding a transportation box 35, it provides an efficient and orderly transportation and positioning solution for the double-sided small-size thyristor. The transportation slot 52 and the limiting block 53 designed inside the transportation box 35, combined with the real-time monitoring function of the laser ranging component 38, can accurately control the position and distance of the double-sided small-size thyristor during the transportation process, ensuring its accurate alignment before entering the test process. The push block 40 driven by the third multi-stage cylinder 39 can smoothly push the thyristor to one end of the transportation slot 52 and be restricted by the limiting block 53, and then be easily clamped and moved by the clamping plate 29, improving the overall test efficiency and accuracy. By setting a good product storage slot 41 and a defective product storage slot 42 at the end of the top of the box body 1, as well as the supporting slide rail 43, the moving block 44, the fourth multi-stage cylinder 45, the second air pump 46, and the second suction cup 47 to form a sorting and handling structure, the double-sided small-size thyristor can be automatically sorted into the good product or defective product storage slot 42 according to the test results. Driven by the moving block 44 on the slide rail 43 and the fourth multi-stage cylinder 45, the second air pump 46 and the second suction cup 47 can accurately adsorb and handle the thyristor to achieve fast and accurate sorting operations. This design not only improves the efficiency of the test process,It also ensures the accuracy of product classification, providing convenience for subsequent processing. Through the fifth multi-stage cylinder 48, the connecting contact piece 49 connected to its bottom is closely connected to the test unit 50, forming a comprehensive and efficient test system. This system integrates a trigger current test module, a trigger voltage test module, a conduction voltage test module, and a leakage current test module, and can comprehensively test the performance of the double-sided small-sized thyristor. Through the electrical connection between the processor component 6 and the test unit 50, test data can be collected and analyzed in real time, ensuring the accuracy and reliability of the test. Furthermore, it not only improves the test efficiency, but also significantly enhances the comprehensiveness and accuracy of the test results, providing a strong guarantee for product quality control.

[0028] For those skilled in the art, it is obvious that the present invention is not limited to the details of the above exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic characteristics of the present invention. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting. The scope of the present invention is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present invention. Any reference signs in the claims should not be regarded as limiting the claims involved.

Claims

1. A test device for testing a double-sided small-sized thyristor, comprising a box body (1), a transport channel (2) and a test slot (3), characterized in that: The outer wall of the box body (1) is provided with a transportation channel (2), and the inner wall of the transportation channel (2) is provided with a number of test slots (3); At the top of the inner wall of the transportation channel (2), a number of pin monitors (4) and laser locators (5) are fitted. The position of the pin monitors (4) is above that of the laser locators (5), and the position of the laser locators (5) is above the test slots (3). The pin monitors (4) are used to collect the state data of the thyristor pins and send the collected data to the processor unit (6). The laser locators (5) are used to ensure the set position of the thyristor movement and send the acquired data to the processor unit (6). The processor unit (6) adjusts the insertion of the thyristor pins into the test slots according to the data sent by the laser locators (5), and activates the pin correction component through the data collected by the pin monitors (4). The pin correction component is arranged inside the test slots (3) and is used to adjust and maintain the stability of the pin structure. The processor unit (6) is electrically connected to an interactive display screen (14), and the interactive display screen (14) is installed on the top of the box body (1); The pin correction component includes a number of groups of first through slots (7), and the first through slots (7) are opened on the inner bottom wall of the test slots (3). A first drive slot (8) is arranged at the bottom of the first through slots (7). A first drive block (9) is movably connected inside the first drive slot (8). A number of first multi-stage cylinders (10) are fitted and installed on the top of the first drive block (9). A correction rod (11) is fixedly connected to the top of the first multi-stage cylinders (10), and the outer wall of the correction rod (11) is movably connected to the inner wall of the first through slots (7). A telescopic cylinder (12) is fixedly connected to one side of the first drive block (9), and the outer wall of the telescopic cylinder (12) is fitted to the inner wall of the first drive slot (8).

2. The test device for testing a double-sided small-sized thyristor according to claim 1, characterized in that: On one side and the other side of the four corners inside the transportation channel (2), mounting slots (15) are provided. Gears (16) are arranged inside the mounting slots (15). One end of one group of gears (16) is fixedly connected to a transmission rod (51). One end of the transmission rod (51) penetrates through the box body (1) and is connected to a second drive component (17), and the second drive component (17) is fixedly connected to the bottom of one side of the box body (1).

3. The test device for testing a double-sided small-sized thyristor according to claim 2, characterized in that: The outer walls of the gears (16) are meshed with a chain (18). A transmission metal plate (19) is arranged on the inner wall of the chain (18). And at every other transmission metal plate (19), an adjustment block (20) is added on its top. A second drive slot (21) is arranged on the top of the adjustment block (20). A second drive block (22) is movably connected to the inner wall of the second drive slot (21). One side of the adjustment block (20) is fixedly connected to a third drive component (23). The output end of the third drive component (23) is fixedly connected to a second threaded rod structure (24), and the other end of the second threaded rod structure (24) is threaded through the second drive block (22) and is arranged on the inner wall of the second drive slot (21) through a bearing.

4. The test device for testing a double-sided small-sized thyristor according to claim 3, wherein: A set of second through grooves (25) are provided at the top of the second driving block (22). A third driving groove (26) is provided at the bottom of the second through groove (25). A set of third driving blocks (27) are movably connected inside the third driving groove (26). A set of second multi-stage cylinders (28) are fitted and arranged at the top of the third driving block (27). The outer wall of the second multi-stage cylinder (28) is movably connected to the inner wall of the second through groove (25). A clamping plate (29) is fixedly connected to the top of the second multi-stage cylinder (28). A clamping soft pad (30) is fixedly pasted on one side of the clamping plate (29).

5. The test device for testing a double-sided small-size thyristor according to claim 3, characterized in that: A fourth driving component (31) is fixedly connected to the back of the second driving block (22). The output end of the fourth driving component (31) is fixedly connected to a bidirectional lead screw (32). One end of the bidirectional lead screw (32) threadedly penetrates through a set of third driving blocks (27) and is arranged on the inner wall of the third driving groove (26) through a rotating shaft. A set of first suction cups (33) are fitted and arranged at the top of the second driving block (22). The bottom of the first suction cup (33) is connected to a first air pump (34) through a pipeline. The first air pump (34) is arranged on the inner wall of the third driving groove (26).

6. The test device for testing a double-sided small-sized thyristor according to claim 1, characterized in that: A transport box (35) is provided at the front end of the top of the box body (1). A limit cover (36) is movably connected to the top of the transport box (35). A set of pull rings (37) are fixedly connected to the top of the limit cover (36). A transport groove (52) is provided inside the transport box (35). A number of limiting blocks (53) are fixedly connected to one end of the transport groove (52). A laser ranging component (38) is fitted and installed on one side of the limiting block (53). The laser ranging component (38) is used to monitor the distance between the double-sided small-sized thyristor and the limiting block (53) in real time. A number of double-sided small-sized thyristors are placed inside the transport groove (52). The double-sided small-sized thyristor includes a first surface, a second surface and leads. The second surface is fixedly connected to the top of the first surface. The leads are arranged on one side of the first surface. A third multi-stage cylinder (39) is fixedly connected to one end of the transport box (35). The output end of the third multi-stage cylinder (39) penetrates through the transport box (35) and is fixedly connected to a push block (40). The outer wall of the push block (40) is movably connected to the inner wall of the transport groove (52).

7. A test device for testing a double-sided small-size thyristor according to claim 1, characterized in that: A good product storage groove (41) and a defective product storage groove (42) are respectively provided at the tail end of the top of the box body (1). A slide rail (43) is provided at the tail end of the top of the box body (1). A moving block (44) is provided on the front of the slide rail (43). A fourth multi-stage cylinder (45) is provided on the front of the moving block (44). One end of the fourth multi-stage cylinder (45) is fixedly connected to a second air pump (46). A second suction cup (47) is fixedly connected to the front of the second air pump (46).

8. The test device for testing a double-sided small-sized thyristor according to claim 1, characterized in that: A fifth multi-stage cylinder (48) is fitted and set on the inner top wall of the test slot (3). A connecting contact piece (49) is fixedly connected to the bottom of the fifth multi-stage cylinder (48). The connecting contact piece (49) is electrically connected to a test unit (50), and the test unit (50) is electrically connected to the processor component (6). The test unit (50) includes a trigger current test module, a trigger voltage test module, a conduction voltage test module, and a leakage current test module.

9. The usage method of a test device for testing a double-sided small-sized thyristor according to claim 8, characterized in that, The working steps of the test device for the double-sided small-sized thyristor are as follows: S1. The laser locator component (5) monitors the position of the double-sided small-sized thyristor in real time to ensure that it is accurately moved into the test slot (3) during transportation. S2. The pin monitor component (4) collects the status data of the thyristor pins in real time and sends the data to the processor component (6). The processor component (6) analyzes the pin data. Once a pin position deviation or unstable structure is found, the pin correction component is started. S3. The pin correction component pushes the correction rod (11) through the first multi-stage cylinder (10) to adjust the pin position to the correct state and ensure the stability of the pin structure. S4. After the thyristor pins are correctly inserted into the test slot (3), the fifth multi-stage cylinder (48) drives the connecting contact piece (49) to contact the thyristor pins. The connecting contact piece (49) transmits the test signal to the test unit (50) through electrical connection. The test unit (50) includes a trigger current test module, a trigger voltage test module, a conduction voltage test module, and a leakage current test module to conduct a comprehensive performance test on the thyristor. S5. The processor component (6) judges the quality of the thyristor according to the test results and displays the test results through the interactive display screen (14).

10. The method of using a test device for testing a double-sided small-sized thyristor according to claim 9, characterized in that, In the said S1, the following steps are further included: S11. The processor component (6) accurately adjusts the position of the thyristor according to the data sent by the laser locator component (5) so that its pins are aligned with the test slot (3). In the said S4, the following steps are further included: S41. The test data is sent to the processor component (6) through electrical connection for processing and analysis.

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