Scanning modeling method and device
By using the method of cutting workbench mark point and splicing key mark point in scanning modeling, the scanning data is automatically processed, and the scanning incompleteness caused by the bottom occlusion of the target to be modeled is solved, improving the convenience and accuracy of scanning modeling.
Patent Information
- Application Number
- CN202510446560.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-09
- Publication Date
- 2025-07-11
AI Technical Summary
In the prior art, the bottom of the target to be modeled is blocked by the workbench, resulting in the scanning equipment being unable to scan completely. It requires two scans and manually splicing, which makes the scanning modeling work less convenient.
By obtaining the workbench marking points in the first scan data, establishing a shear surface, cropping the workbench scanning data, and combining the key marking points in the second scan data, automatically splicing to obtain the target scanning data to reduce manual participation.
It realizes automated scanning modeling without manual manual stitching, improving the convenience and accuracy of scanning modeling.
Smart Images
Figure CN120298626A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of scanning and modeling, and particularly to a scanning and modeling method and apparatus. Background Art
[0002] When a target to be modeled is placed on a flat workbench for scanning, the bottom of the target to be modeled (which can be regarded as the target bottom surface) is blocked by the workbench, and the scanning device can only scan the effective observation surface of the target to be modeled (including the front, top, and side surfaces). Therefore, if a complete scan of the target to be modeled is required, the effective observation surface of the target to be modeled needs to be scanned first, and then the target to be modeled is flipped to scan the target bottom surface. For the two scanning processes, corresponding scanning projects need to be created, and then the scanning data of the two scanning projects are manually stitched together, and finally the target scanning data required for modeling can be obtained. The convenience of the overall scanning and modeling work is relatively poor. Summary of the Invention
[0003] This application provides a scanning and modeling method and apparatus, aiming to improve the convenience of scanning and modeling work.
[0004] To achieve the above object, this application provides the following technical solutions:
[0005] A scanning and modeling method, comprising:
[0006] Obtaining first scanning data of a first scanning object; the first scanning object includes a first partial surface of the target to be modeled and the workbench surface; the target to be modeled is placed on the workbench surface, and frame points are provided on both the surface of the target to be modeled and the workbench surface;
[0007] Based on the workbench landmark points corresponding to the frame points on the workbench surface in the first scanning data, establishing a corresponding shear plane;
[0008] According to the shear plane, cropping the workbench surface scanning data in the first scanning data to obtain partial surface scanning data;
[0009] Obtaining second scanning data of a second scanning object, and stitching the key landmark points in the second scanning data with the key landmark points in the partial surface scanning data to obtain target scanning data; the second scanning object includes a second partial surface of the target to be modeled; the second partial surface includes the other parts of the surface of the target to be modeled except the first partial surface; the key landmark points include the landmark points corresponding to the frame points on the surface of the target to be modeled; the target scanning data is used to participate in the modeling of the target to be modeled.
[0010] Optionally, establishing a corresponding shear plane based on the workbench fiducial points corresponding to the frame points on the workbench surface in the first scan data includes:
[0011] Using a non-linear optimization algorithm to optimize the coordinates of multiple fiducial points in the first scan data to obtain multiple optimized fiducial points;
[0012] Determining the workbench fiducial points corresponding to the frame points on the workbench surface from among the multiple optimized fiducial points;
[0013] Establishing a corresponding shear plane based on the workbench fiducial points.
[0014] Optionally, splicing the key fiducial points in the second scan data with the key fiducial points in the local surface scan data to obtain target scan data, including:
[0015] Deleting the non-common fiducial points in the local surface scan data; the non-common fiducial points include the key fiducial points corresponding to the first frame points; the first frame points include the frame points that are on the first local surface and not on the second local surface;
[0016] Splicing the key fiducial points in the second scan data with the remaining key fiducial points in the local surface scan data to obtain target scan data.
[0017] Optionally, splicing the key fiducial points in the second scan data with the remaining key fiducial points in the local surface scan data to obtain target scan data, including:
[0018] Determining the common fiducial points among the remaining key fiducial points in the local surface scan data; the common fiducial points include the key fiducial points corresponding to the second frame points; the second frame points include the frame points that are on both the first local surface and the second local surface;
[0019] Splicing the key fiducial points in the second scan data with the common fiducial points to obtain target scan data.
[0020] Optionally, the method further includes:
[0021] Creating a new scan project other than the current scan project before obtaining the second scan data; the current scan project is used to display the first scan data;
[0022] If the splicing of the key fiducial points in the second scan data with the common fiducial points is successful, deleting the new scan project;
[0023] If the key landmark points in the second scan data fail to be stitched with the common landmark points, display the second scan data in the new scan project.
[0024] Optionally, stitching the key landmark points in the second scan data with the common landmark points to obtain target scan data includes:
[0025] Using a non - linear optimization algorithm to optimize the coordinates of the key landmark points in the second scan data to obtain optimized key landmark points;
[0026] Based on the optimized key landmark points, stitch them with the common landmark points to obtain target scan data.
[0027] Optionally, based on the optimized key landmark points, stitching them with the common landmark points to obtain target scan data includes:
[0028] Pair the optimized key landmark points with the common landmark points to obtain corresponding landmark point pairs;
[0029] Based on the landmark point pairs, determine the corresponding coordinate transformation matrix;
[0030] According to the coordinate transformation matrix, perform coordinate transformation on the second scan data so that the second scan data is transformed to the coordinate system where the local surface scan data is located;
[0031] Fuse the second scan data and the local surface scan data in the same coordinate system to obtain target scan data.
[0032] A scanning and modeling device includes:
[0033] A data acquisition unit for obtaining first scan data of a first scan object; the first scan object includes a first local surface of a target to be modeled and a workbench surface; the target to be modeled is placed on the workbench surface, and frame points are provided on both the surface of the target to be modeled and the workbench surface;
[0034] A shear plane establishment unit for establishing a corresponding shear plane based on the workbench landmark points corresponding to the frame points on the workbench surface in the first scan data;
[0035] A data clipping unit for clipping the workbench surface scan data in the first scan data according to the shear plane to obtain local surface scan data;
[0036] A landmark stitching unit, configured to obtain second scan data of a second scan object, and stitch key landmarks in the second scan data with key landmarks in the local surface scan data to obtain target scan data; the second scan object includes a second local surface of the target to be modeled; the second local surface includes other parts of the surface of the target to be modeled except the first local surface; the key landmarks include landmarks corresponding to frame points on the surface of the target to be modeled; the target scan data is used to participate in the modeling of the target to be modeled.
[0037] A storage medium, the storage medium includes a stored program, wherein the program, when run by a processor, executes the scan modeling method described above.
[0038] An electronic device, comprising: a processor, a memory and a bus; the processor is connected to the memory through the bus;
[0039] The memory is used to store a program, and the processor is used to run the program, wherein the program, when run by the processor, executes the scan modeling method described above.
[0040] The technical solution provided in this application obtains first scan data of a first scan object. Based on the workbench landmarks corresponding to the frame points on the workbench surface in the first scan data, a corresponding shear plane is established. According to the shear plane, the workbench surface scan data in the first scan data is cropped to obtain local surface scan data. Obtain second scan data of a second scan object, and stitch the key landmarks in the second scan data with the key landmarks in the local surface scan data to obtain target scan data. This application determines the local surface scan data in the first scan data through the workbench landmarks, and fuses the second scan data with the local surface scan data into target scan data through the key landmarks, without the need for manual stitching of the two scan data by humans, making the operation of the scan modeling work of the target to be modeled more convenient. Description of the Drawings
[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.
[0042] Figure 1 It is a schematic flowchart of a scan modeling method provided by an embodiment of the present application;
[0043] Figure 2Schematic flowchart of another scanning modeling method provided by an embodiment of the present application;
[0044] Figure 3 Schematic flowchart of another scanning modeling method provided by an embodiment of the present application;
[0045] Figure 4 Schematic flowchart of another scanning modeling method provided by an embodiment of the present application;
[0046] Figure 5 Schematic flowchart of another scanning modeling method provided by an embodiment of the present application;
[0047] Figure 6 Schematic architecture diagram of a scanning modeling device provided by an embodiment of the present application. Detailed implementation manners
[0048] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.
[0049] In the present application, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. The terms "comprising", "including" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or further includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including a..." does not exclude the existence of additional identical elements in the process, method, article or device including the element.
[0050] As Figure 1 shown, it is a schematic flowchart of a scanning modeling method provided by an embodiment of the present application, including the following steps.
[0051] S101: Obtain first scanning data of a first scanning object.
[0052] Among them, the first scanning object includes a first local surface of a target to be modeled and a workbench surface. The target to be modeled is placed on the workbench surface, and frame points are provided on the surface of the target to be modeled and the workbench surface.
[0053] In some examples, the object to be modeled is placed on the workbench, and the first local surface can be regarded as other local surfaces except the bottom surface of the object to be modeled. It can be understood that during the process of scanning the object to be modeled placed on the workbench, the bottom surface of the object to be modeled will not be directly scanned. Therefore, a secondary scan is required to completely scan the surface of the object to be modeled.
[0054] It should be noted that the surface of the object to be modeled is provided with frame points. The surface may include the first local surface and the bottom surface, and then both the first local surface and the bottom surface are also provided with frame points. In addition, the number of corresponding frame points on the first local surface and the bottom surface respectively can be set by technicians according to the actual situation. The frame points can be recognizable reflective and / or self-luminous marking points preset on the surface of the object and the surface of the workbench.
[0055] In some examples, the number of frame points set on the workbench is at least three.
[0056] In some examples, the first scan data includes the landmark points corresponding to multiple frame points, as well as the point clouds and meshes respectively corresponding to the first local surface and the workbench surface.
[0057] It should be noted that when performing the scanning work on the first scanning object, usually each frame point can be scanned first, and then the first local surface of the object to be modeled and the workbench surface can be scanned.
[0058] S102: Based on the workbench landmark points corresponding to the frame points on the workbench surface in the first scan data, establish the corresponding shear plane.
[0059] Among them, the workbench landmark points corresponding to the frame points on the workbench surface can be determined from the first scan data, and the corresponding shear plane is established based on at least three workbench landmark points.
[0060] It should be noted that during the scanning process, the same frame point will be scanned multiple times, and the corresponding landmark points will be reconstructed each time the frame point is scanned. There are differences in the coordinates of the landmark points obtained by each reconstruction. Therefore, in order to eliminate the stitching error between the first scan data and the second scan data, it is also necessary to optimize each landmark point in the first scan data.
[0061] Optionally, the process of establishing the corresponding shear plane based on the workbench landmark points corresponding to the frame points on the workbench surface in the first scan data can be: using a non-linear optimization algorithm to optimize the coordinates of multiple landmark points in the first scan data to obtain multiple optimized landmark points; determining the workbench landmark points corresponding to the frame points on the workbench surface from the multiple optimized landmark points; and establishing the corresponding shear plane based on the workbench landmark points.
[0062] It can be understood that the workbench landmark points are determined from multiple optimized landmark points, and the coordinates of the workbench landmark points have also been optimized. Therefore, the shear plane established based on the workbench landmark points is reliable.
[0063] S103: According to the shear plane, crop the workbench surface scan data in the first scan data to obtain local surface scan data.
[0064] Among them, after establishing the corresponding shear plane, the shear plane can be used as a reference for cropping, and the workbench surface scan data in the first scan data is cropped to obtain local surface scan data.
[0065] In some examples, the first scan data includes the scan data corresponding to the first local surface and the workbench surface respectively. The scan data includes point clouds and meshes. Using the shear plane, the workbench surface scan data (i.e., the point clouds and meshes of the workbench surface) and the local surface scan data (i.e., the point clouds and meshes of the first local surface) in the first scan data can be accurately identified, so as to crop the workbench surface scan data in the first scan data to obtain local surface scan data.
[0066] S104: Obtain the second scan data of the second scan object, and splice the key landmark points in the second scan data with the key landmark points in the local surface scan data to obtain the target scan data.
[0067] Among them, the second scan object includes the second local surface of the object to be modeled. The second local surface includes the other parts of the surface of the object to be modeled except the first local surface. In some examples, the second local surface can be understood as the bottom surface exposed after the object to be modeled is flipped. In addition, the key landmark points include the landmark points corresponding to the frame points on the surface of the object to be modeled, and the target scan data is used to participate in the modeling of the object to be modeled.
[0068] It should be noted that after the scanning process of the first scan object is completed, the object to be modeled can be flipped so that the second local surface of the object to be modeled is within the scanning range of the scanning device. By scanning the second local surface, the complete surface of the object to be modeled can be scanned.
[0069] It can be understood that after obtaining the second scan data, splicing the key landmark points in the second scan data with the key landmark points in the local surface scan data can obtain the complete scan data of the object to be modeled, and there is no need for manual participation in the splicing process between the first scan data and the second scan data.
[0070] Optionally, for the implementation process of splicing the key landmark points in the second scan data with the key landmark points in the local surface scan data to obtain the target scan data, reference can be made to Figure 2The steps shown above and the corresponding explanations.
[0071] For the process shown in S101 - S104 above, through the workbench landmark points, the local surface scan data in the first scan data is determined, and through the key landmark points, the second scan data and the local surface scan data are fused into the target scan data, without the need for manual splicing of the two scan data by humans, making the operation of the scan modeling work of the target to be modeled more convenient.
[0072] As Figure 2 shown, it is a schematic flowchart of another scan modeling method provided by an embodiment of the present application, including the steps shown below.
[0073] S201: Delete the non - common landmark points in the local surface scan data.
[0074] Among them, the non - common landmark points include the key landmark points corresponding to the first frame points. The first frame points include the frame points that are on the first local surface and not on the second local surface.
[0075] In some examples, if the first local surface contains frame point A and frame point B, and the second local surface contains frame point A, then frame point B can be regarded as the first frame point.
[0076] It should be noted that deleting the non - common landmark points in the local surface scan data can reduce the splicing error between the second scan data and the local surface scan data, and improve the accuracy of scan data splicing.
[0077] S202: Splice the key landmark points in the second scan data with the remaining key landmark points in the local surface scan data to obtain the target scan data.
[0078] Among them, the target scan data obtained by splicing the key landmark points in the second scan data with the remaining key landmark points in the local surface scan data can be understood as the complete scan data of the target to be modeled.
[0079] Optionally, for the implementation process of splicing the key landmark points in the second scan data with the remaining key landmark points in the local surface scan data to obtain the target scan data, reference can be made to Figure 3 the steps shown above and the corresponding explanations.
[0080] For the process shown in S201 - S202 above, by deleting the non - common landmark points in the local surface scan data, the splicing accuracy between the second scan data and the local surface scan data can be improved.
[0081] As Figure 3 shown, it is a schematic flowchart of another scan modeling method provided by an embodiment of the present application, including the steps shown below.
[0082] S301: Determine the common landmark points among the retained key landmark points in the local surface scan data.
[0083] Among them, the common landmark points include the key landmark points corresponding to the second frame points, and the second frame points include the frame points that are simultaneously on the first local surface and the second local surface.
[0084] In some examples, if the first local surface contains frame point A and frame point B, and the second local surface contains frame point A, then frame point A can be regarded as the second frame point.
[0085] S302: Stitch the key landmark points in the second scan data with the common landmark points to obtain the target scan data.
[0086] Among them, by stitching the key landmark points in the second scan data with the common landmark points, the stitching efficiency can be improved.
[0087] It should be noted that during the scanning process, the same frame point will be scanned multiple times, and a corresponding landmark point will be reconstructed each time the frame point is scanned. There are differences in the coordinates of the landmark points obtained by each reconstruction. Therefore, in order to reduce the stitching error between the common landmark points and the second scan data, it is also necessary to optimize each key landmark point in the second scan data.
[0088] Optionally, the implementation process of stitching the key landmark points in the second scan data with the common landmark points to obtain the target scan data can be: using a non - linear optimization algorithm to optimize the coordinates of the key landmark points in the second scan data to obtain the optimized key landmark points; based on the optimized key landmark points, stitching them with the common landmark points to obtain the target scan data.
[0089] It should be noted that the second scanning object does not include the workbench surface, so it is determined that the second scan data does not include the workbench landmark points. Generally speaking, through landmark point stitching, the two scan data can be combined into a unified scan model data.
[0090] Optionally, the implementation process of stitching the optimized key landmark points with the common landmark points to obtain the target scan data can refer to Figure 4 the steps shown and the corresponding explanatory notes.
[0091] In addition, for the case where the stitching of the key landmark points in the second scan data with the common landmark points fails, to ensure that the scanning and modeling process of the target to be modeled can be executed completely, optionally, it can refer to Figure 5 the steps shown and the corresponding explanatory notes.
[0092] The process shown in S301 - S302 above stitches the key landmark points in the second scan data with the common landmark points, which can improve the stitching efficiency between the second scan data and the local surface scan data.
[0093] As Figure 4 shown, it is a schematic flowchart of another scan modeling method provided by an embodiment of the present application, including the following steps.
[0094] S401: Pair the optimized key landmark points with the common landmark points to obtain corresponding landmark point pairs.
[0095] Among them, the optimized key landmark points can be paired with the common landmark points through a landmark point matching algorithm to obtain corresponding landmark point pairs.
[0096] It should be noted that pairing the optimized key landmark points with the common landmark points is essentially stitching the optimized key landmark points with the common landmark points. If the pairing is successful, it means the stitching is successful; if the pairing fails, it means the stitching fails.
[0097] S402: Determine the corresponding coordinate transformation matrix based on the landmark point pairs.
[0098] Among them, a landmark point pair includes two landmark points. Calculating the corresponding coordinate transformation matrix through the coordinates of the two landmark points belongs to common knowledge in the field of mathematics and will not be elaborated here.
[0099] S403: Perform coordinate transformation on the second scan data according to the coordinate transformation matrix so that the second scan data is transformed to the coordinate system where the local surface scan data is located.
[0100] Among them, transforming the second scan data to the coordinate system where the local surface scan data is located can make the second scan data and the local surface scan data in the same coordinate system.
[0101] S404: Fuse the second scan data and the local surface scan data in the same coordinate system to obtain the target scan data.
[0102] Among them, by fusing the second scan data and the local surface scan data in the same coordinate system, the complete scan data of the target to be modeled can be obtained, without any manual processing of the target scan data, and the reliability of the target scan data can also be ensured.
[0103] The process shown in S401 - S404 above obtains the target scan data by stitching the optimized key landmark points with the common landmark points, reducing the manual participation steps in scan modeling and effectively improving the convenience of scan modeling.
[0104] AsFigure 5 As shown, it is a schematic flowchart of another scanning and modeling method provided by an embodiment of the present application, including the following steps.
[0105] S501: Before obtaining the second scanning data, create a new scanning project other than the current scanning project.
[0106] Wherein, the current scanning project is used to display the first scanning data.
[0107] It should be noted that the new scanning project will not be directly visible to the user in the UI interface, and the user is unaware of the creation process of the new scanning project.
[0108] S502: Determine whether the key landmark points in the second scanning data are successfully stitched with the common landmark points.
[0109] Wherein, if the key landmark points in the second scanning data are successfully stitched with the common landmark points, then execute S503; if the key landmark points in the second scanning data are not successfully stitched with the common landmark points, then execute S504.
[0110] S503: Delete the new scanning project.
[0111] Wherein, if the key landmark points in the second scanning data are successfully stitched with the common landmark points, the target scanning data can be directly obtained. Therefore, there is no need to rely on the new scanning project, so the new scanning project can be deleted.
[0112] S504: Display the second scanning data in the new scanning project.
[0113] Wherein, if the key landmark points in the second scanning data are not successfully stitched with the common landmark points and the target scanning data cannot be obtained, at this time, it is necessary to rely on the new scanning project to achieve the manual stitching of the first scanning data and the second scanning data, so as to complete the complete scanning and modeling process of the target to be modeled.
[0114] The process shown in the above S501 - S504 ensures that the scanning and modeling work of the target to be modeled can be fully executed through the created new scanning project.
[0115] As Figure 6 shown, it is a schematic architecture diagram of a scanning and modeling device provided by an embodiment of the present application, including the following units.
[0116] The data acquisition unit 100 is used to obtain the first scanning data of the first scanning object; the first scanning object includes the first partial surface of the target to be modeled and the workbench surface; the target to be modeled is placed on the workbench surface, and both the surface of the target to be modeled and the workbench surface are provided with frame points.
[0117] The shear plane establishing unit 200 is configured to establish a corresponding shear plane based on the workbench landmark points corresponding to the frame points on the workbench surface in the first scan data.
[0118] Optionally, the shear plane establishing unit 200 is specifically configured to: optimize the coordinates of multiple landmark points in the first scan data by using a non-linear optimization algorithm to obtain multiple optimized landmark points; determine the workbench landmark points corresponding to the frame points on the workbench surface from the multiple optimized landmark points; and establish a corresponding shear plane based on the workbench landmark points.
[0119] The data clipping unit 300 is configured to clip the workbench surface scan data in the first scan data according to the shear plane to obtain local surface scan data.
[0120] The landmark point splicing unit 400 is configured to obtain the second scan data of the second scan object, and splice the key landmark points in the second scan data with the key landmark points in the local surface scan data to obtain target scan data; the second scan object includes the second local surface of the object to be modeled; the second local surface includes the other parts of the surface of the object to be modeled except the first local surface; the key landmark points include the landmark points corresponding to the frame points on the surface of the object to be modeled; and the target scan data is used to participate in the modeling of the object to be modeled.
[0121] Optionally, the landmark point splicing unit 400 is specifically configured to: delete the non-common landmark points in the local surface scan data; the non-common landmark points include the key landmark points corresponding to the first frame points; the first frame points include the frame points that are located on the first local surface and not on the second local surface; and splice the key landmark points in the second scan data with the remaining key landmark points in the local surface scan data to obtain target scan data.
[0122] Optionally, the landmark point splicing unit 400 is specifically configured to: determine the common landmark points among the remaining key landmark points in the local surface scan data; the common landmark points include the key landmark points corresponding to the second frame points; the second frame points include the frame points that are simultaneously located on the first local surface and the second local surface; and splice the key landmark points in the second scan data with the common landmark points to obtain target scan data.
[0123] Optionally, the landmark point splicing unit 400 is further configured to: create a new scan project other than the current scan project before obtaining the second scan data; the current scan project is used to display the first scan data; if the key landmark points in the second scan data are successfully spliced with the common landmark points, delete the new scan project; if the key landmark points in the second scan data are unsuccessfully spliced with the common landmark points, display the second scan data in the new scan project.
[0124] It should be emphasized that the scanning project in this embodiment refers to an independent data set including scanning data, coordinate system parameters, and processing logs, and each scanning project corresponds to a complete scanning operation process.
[0125] Optionally, the landmark stitching unit 400 is specifically configured to: use a non-linear optimization algorithm to optimize the coordinates of the key landmarks in the second scanning data to obtain the optimized key landmarks; based on the optimized key landmarks, stitch them with the common landmarks to obtain the target scanning data.
[0126] Optionally, the landmark stitching unit 400 is specifically configured to: pair the optimized key landmarks with the common landmarks to obtain the corresponding landmark pairs; based on the landmark pairs, determine the corresponding coordinate transformation matrix; according to the coordinate transformation matrix, perform coordinate transformation on the second scanning data so that the second scanning data is transformed to the coordinate system where the local surface scanning data is located; fuse the second scanning data and the local surface scanning data in the same coordinate system to obtain the target scanning data.
[0127] Each of the above-mentioned units determines the local surface scanning data in the first scanning data through the workbench landmarks, and fuses the second scanning data and the local surface scanning data into the target scanning data through the key landmarks, without the need for manual stitching of the two scanning data by humans, making the operation of the scanning and modeling work of the object to be modeled more convenient.
[0128] The present application also provides a computer-readable storage medium, which includes a stored program, wherein the program executes the scanning and modeling method provided by the present application.
[0129] The present application also provides an electronic device, including: a processor, a memory, and a bus. The processor is connected to the memory through the bus, the memory is used to store the program, and the processor is used to run the program, wherein the program executes the scanning and modeling method provided by the present application when running.
[0130] In addition, the functions described above in the embodiments of the present application can be at least partially executed by one or more hardware logic components. For example, without limitation, the exemplary types of hardware logic components that can be used include: Field Programmable Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), Application Specific Standard Product (ASSP), System on Chip (SOC), Complex Programmable Logic Device (CPLD), and so on.
[0131] Although several specific implementation details are included in the above description, these should not be construed as limiting the scope of the present application. Certain features described in the context of separate embodiments can also be implemented combinatorially in a single embodiment. Conversely, the various features described in the context of a single embodiment can also be implemented separately or in any suitable sub-combination in multiple embodiments.
[0132] The above description is only a preferred embodiment of the present application and an explanation of the applied technical principles. Those skilled in the art should understand that the scope of disclosure involved in the present application is not limited to the technical solutions formed by the specific combination of the above technical features, and should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the above disclosed concept. For example, the technical solutions formed by mutually replacing the above features with the technical features (but not limited to) having similar functions disclosed in the present application.
Claims
1. A scanning and modeling method, characterized in that, Including: Obtaining first scan data of a first scan object; The first scan object includes a first partial surface of a target to be modeled and a workbench surface; the target to be modeled is placed on the workbench surface, and frame points are provided on the surface of the target to be modeled and the workbench surface; Based on workbench landmark points corresponding to the frame points on the workbench surface in the first scan data, establishing a corresponding shear plane; According to the shear plane, cropping the workbench surface scan data in the first scan data to obtain partial surface scan data; Obtaining second scan data of a second scan object, and splicing key landmark points in the second scan data with key landmark points in the partial surface scan data to obtain target scan data; the second scan object includes a second partial surface of the target to be modeled; the second partial surface includes other parts of the surface of the target to be modeled except the first partial surface; the key landmark points include landmark points corresponding to the frame points on the surface of the target to be modeled; the target scan data is used to participate in the modeling of the target to be modeled.
2. The method according to claim 1, characterized in that Based on workbench landmark points corresponding to the frame points on the workbench surface in the first scan data, establishing a corresponding shear plane, including: Using a non-linear optimization algorithm to optimize the coordinates of multiple landmark points in the first scan data to obtain multiple optimized landmark points; Determining workbench landmark points corresponding to the frame points on the workbench surface from the multiple optimized landmark points; Based on the workbench landmark points, establishing a corresponding shear plane.
3. The method according to claim 1, wherein Splicing key landmark points in the second scan data with key landmark points in the partial surface scan data to obtain target scan data, including: Deleting non-common landmark points in the partial surface scan data; the non-common landmark points include key landmark points corresponding to first frame points; the first frame points include frame points that are on the first partial surface and not on the second partial surface; Splicing key landmark points in the second scan data with the remaining key landmark points in the partial surface scan data to obtain target scan data.
4. The method according to claim 3, characterized in that, Splicing key landmark points in the second scan data with the remaining key landmark points in the partial surface scan data to obtain target scan data, including: Determining common landmark points among the remaining key landmark points in the partial surface scan data; the common landmark points include key landmark points corresponding to second frame points; the second frame points include frame points that are on both the first partial surface and the second partial surface; Splicing key landmark points in the second scan data with the common landmark points to obtain target scan data.
5. The method according to claim 4, wherein The method further includes: Before obtaining the second scan data, creating a new scan project other than the current scan project; the current scan project is used to display the first scan data; If the splicing of the key landmark points in the second scan data and the common landmark points is successful, deleting the new scan project; If the key landmark points in the second scan data fail to be stitched with the common landmark points, display the second scan data in the new scan project.
6. The method according to claim 4, wherein Stitch the key landmark points in the second scan data with the common landmark points to obtain target scan data, including: Use a non-linear optimization algorithm to optimize the coordinates of the key landmark points in the second scan data to obtain optimized key landmark points; Based on the optimized key landmark points, stitch them with the common landmark points to obtain target scan data.
7. The method according to claim 6, wherein Based on the optimized key landmark points, stitch them with the common landmark points to obtain target scan data, including: Pair the optimized key landmark points with the common landmark points to obtain corresponding landmark point pairs; Based on the landmark point pairs, determine the corresponding coordinate transformation matrix; According to the coordinate transformation matrix, perform coordinate transformation on the second scan data so that the second scan data is transformed to the coordinate system where the local surface scan data is located; Based on the second scan data and the local surface scan data in the same coordinate system, fuse them to obtain target scan data.
8. A scanning and modeling device, characterized in that, Including: A data acquisition unit for obtaining first scan data of a first scan object; the first scan object includes a first local surface of a target to be modeled and a workbench surface; the target to be modeled is placed on the workbench surface, and frame points are provided on both the surface of the target to be modeled and the workbench surface; A shear plane establishment unit for establishing a corresponding shear plane based on the workbench landmark points corresponding to the frame points on the workbench surface in the first scan data; A data clipping unit for clipping the workbench surface scan data in the first scan data according to the shear plane to obtain local surface scan data; A landmark point stitching unit for obtaining second scan data of a second scan object and stitching the key landmark points in the second scan data with the key landmark points in the local surface scan data to obtain target scan data; the second scan object includes a second local surface of the target to be modeled; the second local surface includes the other parts of the surface of the target to be modeled except the first local surface; the key landmark points include the landmark points corresponding to the frame points on the surface of the target to be modeled; the target scan data is used to participate in the modeling of the target to be modeled.
9. A storage medium, characterized in that, The storage medium includes a stored program, wherein the program, when executed by a processor, implements the scan modeling method according to any one of claims 1-7.
10. An electronic device, characterized in that, Including: A processor, a memory, and a bus; The processor is connected to the memory through the bus; The memory is used to store a program, and the processor is used to run the program, wherein the program, when executed by the processor, implements the scan modeling method according to any one of claims 1-7.