Infrared temperature measurement method and system and train
Different emissivity parameters are set by multiple infrared thermometers, and temperature measurement is performed according to the emissivity step characteristics of the object being measured, which solves the measurement error problem of infrared thermometer when the temperature changes sharply, and realizes accurate measurement of the temperature of the train brake member.
Patent Information
- Application Number
- CN202510572391.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-30
- Publication Date
- 2025-07-18
AI Technical Summary
When the infrared thermometer measures the measured object with large temperature changes, the surface emissivity changes step by step. The conventional method cannot adjust the emissivity in real time, resulting in errors in the measurement result, especially during multiple braking of the train brake parts, the sharp change in temperature leads to inaccurate temperature measurement.
Multiple infrared thermometers are used to set different emissivity parameters according to the emissivity step characteristics of the object being measured, and temperature measurement is carried out through multiple infrared thermometers to generate temperature measurement results that conform to the real temperature changes.
It improves the convenience and accuracy of measurement, can accurately measure the temperature changes of the train brake members, and reduces operational difficulty and measurement errors.
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Figure CN120333628A_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the technical fields of infrared temperature measurement and rail trains. Specifically, it relates to an infrared temperature measurement method, system, and train. Background Art
[0002] Infrared thermometers have the advantages of fast response speed, non-contact, non-interference with the temperature field, and suitability for measurement in harsh environments. Therefore, they have been widely used in many fields.
[0003] In the process of implementing the concept of the present disclosure, the inventors found that there are at least the following problems in the related art: When using an infrared thermometer to measure the surface temperature of an object, the emissivity of the measured surface needs to be set in advance. For a measured object with a large temperature change during the temperature measurement process, such as a braking component of a train during multiple braking processes, the temperature rises from room temperature to a relatively high temperature, and even reaches 800 degrees in the case of emergency braking; for such measured objects, the surface state will change significantly during the temperature measurement process, resulting in a step change in the surface emissivity. Therefore, in the conventional measurement method, the tester cannot adjust the emissivity in real time according to the measured temperature value, resulting in measurement errors. Summary of the Invention
[0004] In view of this, the present disclosure provides an infrared temperature measurement method, system, and train.
[0005] One aspect of the present disclosure provides an infrared temperature measurement method, including: obtaining the emissivity step characteristics of a measured object, where the emissivity step characteristics are used to characterize: multiple step changes in the emissivity of the measured object within a predetermined temperature range; based on N target emissivities corresponding to the multiple step changes, setting parameters for N infrared thermometers, where N is a positive integer; using the N infrared thermometers with completed parameter settings to measure the temperature of the measured object to obtain the temperature measurement result of the measured object.
[0006] According to an embodiment of the present disclosure, where using the N infrared thermometers with completed parameter settings to measure the temperature of the measured object to obtain the temperature measurement result of the measured object includes: using the N infrared thermometers with completed parameter settings to measure the temperature of the measured object to obtain N reference temperature curves corresponding to the N target emissivities, where the reference temperature curves are used to characterize the change of temperature over time; based on the N reference temperature curves, generating the temperature measurement result of the measured object.
[0007] According to an embodiment of the present disclosure, generating a temperature measurement result of an object to be measured based on N reference temperature curves includes: dividing each reference temperature curve into a plurality of curve segments based on a plurality of time points at which a step change in temperature occurs in the reference temperature curve; determining a target curve segment that conforms to the true temperature change from the plurality of curve segments; and connecting the target curve segments corresponding to the N reference temperature curves respectively to generate a temperature measurement result for characterizing the true temperature change of the object to be measured.
[0008] According to an embodiment of the present disclosure, determining a target curve segment that conforms to the true temperature change from the plurality of curve segments includes: determining a target curve segment that conforms to the true temperature change from the plurality of curve segments according to the emissivity step characteristic.
[0009] According to an embodiment of the present disclosure, generating a temperature measurement result of an object to be measured based on N reference temperature curves includes: aligning the time coordinates of the N reference temperature curves and merging them into the same coordinate system; determining a plurality of time points at which a step change in temperature occurs in the N reference temperature curves in the same coordinate system, wherein, based on the plurality of time points, the N reference temperature curves are divided into a plurality of curve segments; and connecting a plurality of target curve segments with smooth temperature changes on both sides of the time point to generate a temperature measurement result for characterizing the true temperature change of the object to be measured.
[0010] According to an embodiment of the present disclosure, the above method further includes: generating a first feedback result when the number of the plurality of target curve segments is equal to the number of N target emissivities and there is a target time point among the plurality of time points, wherein there is no target curve segment with smooth temperature change on both sides of the target time point, and the first feedback result is used to characterize that: the temperature change data in the temperature measurement result greater than the target time point is inaccurate, the predetermined temperature range is smaller than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is incomplete.
[0011] According to an embodiment of the present disclosure, the above method further includes: generating a second feedback result when the number of the plurality of target curve segments is equal to the number of N target emissivities and there is no target time point among the plurality of time points, wherein the second feedback result is used to characterize that: the temperature measurement result is available, the predetermined temperature range matches the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is complete.
[0012] According to an embodiment of the present disclosure, the above method further includes: generating a third feedback result when the number of the plurality of target curve segments is less than the number of N target emissivities and there is no target time point among the plurality of time points, wherein the third feedback result is used to characterize that: the temperature measurement result is available, the predetermined temperature range is greater than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is complete.
[0013] According to an embodiment of the present disclosure, wherein: the object to be measured is a braking component of a train, and the infrared temperature measurement method is applied when the temperature of the braking component gradually rises due to multiple brakings of the train.
[0014] According to an embodiment of the present disclosure, wherein: the braking component includes a wheel and / or a brake disc.
[0015] According to an embodiment of the present disclosure, obtaining the emissivity step characteristic of the object to be measured includes: determining a predetermined temperature range according to the historical temperature change data of the object to be measured; heating a specimen having the same material as the object to be measured and making the temperature change of the specimen match the predetermined temperature range; measuring the experimental data of the emissivity of the specimen changing stepwise with temperature, wherein the experimental data is the emissivity step characteristic of the object to be measured.
[0016] According to an embodiment of the present disclosure, the heating of the specimen includes a first heating and a second heating, and measuring the experimental data of the emissivity of the specimen changing stepwise with temperature includes: during the first heating process, obtaining a plurality of temperature intervals corresponding to multiple changes in the surface state of the specimen, wherein the temperature of the specimen is measured by a surface thermometer; during the second heating process, measuring the emissivity corresponding to each temperature interval as the experimental data.
[0017] According to an embodiment of the present disclosure, measuring the emissivity corresponding to each temperature interval includes: reading the true experimental temperature of the specimen measured by the surface thermometer; measuring the first temperature of the specimen based on the first emissivity set for the experimental infrared thermometer; in the case where the first temperature and the true experimental temperature do not meet the predetermined numerical conditions, adjusting the first emissivity to the second emissivity so that the second temperature of the specimen measured based on the second emissivity and the true temperature meet the predetermined numerical conditions, wherein the second emissivity is the emissivity corresponding to the temperature interval.
[0018] Another aspect of the present disclosure provides an infrared temperature measurement system, including: N infrared thermometers, wherein the parameters of the N infrared thermometers are set based on N target emissivities, the N target emissivities correspond to multiple step changes of the emissivity of the object to be measured within a predetermined temperature range, and the N infrared thermometers that have completed the parameter setting are configured to perform temperature measurement on the object to be measured to obtain the temperature measurement result of the object to be measured, and N is a positive integer.
[0019] According to an embodiment of the present disclosure, the above system further includes: a specimen, which is made of the same material as the object to be measured; a heating device configured to heat the specimen and make the temperature change of the specimen match a predetermined temperature range; a surface thermometer configured to measure the true test temperature of the specimen during the heating process; and a test infrared thermometer configured to measure test data of the emissivity of the specimen changing stepwise with temperature based on the true test temperature, wherein the test data is used to characterize multiple stepwise changes in the emissivity of the object to be measured within a predetermined temperature range.
[0020] Another aspect of the present disclosure provides a train, including: a vehicle body; a braking member; and N infrared thermometers arranged at the braking member, wherein the parameters of the N infrared thermometers are set based on N target emissivities corresponding to multiple stepwise changes in the emissivity of the braking member within a predetermined temperature range, and the N infrared thermometers with the parameters set are configured to measure the temperature of the braking member during the process of the temperature of the braking member gradually rising due to multiple brakings of the train, where N is a positive integer.
[0021] According to an embodiment of the present disclosure, for the case where the emissivity of an object surface changes stepwise with temperature, compared with the method of using a single infrared thermometer calibrated with a fixed emissivity to measure temperature, by setting the parameters of multiple infrared thermometers based on the stepwise characteristics of the emissivity through the above method, since the emissivities of these several infrared thermometers cover the emissivity changes of the object to be measured, using these several infrared thermometers to measure temperature does not require adjusting the emissivity of the infrared thermometer in real time according to the measured temperature value, and can facilitate the measurement, solving the problem that the tester has no time to adjust the emissivity in real time, and improving the convenience of operation; at the same time, because different emissivities are set for different thermometers, accurate temperature values corresponding to different temperatures and emissivities can be measured, improving the measurement accuracy. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Through the following description of the embodiments of the present disclosure with reference to the drawings, the above and other objects, features, and advantages of the present disclosure will become clearer. In the drawings:
[0023] Figure 1 Schematically shows a test principle diagram of an infrared temperature measurement method to which the embodiments of the present disclosure can be applied;
[0024] Figure 2 Schematically shows a flowchart of an infrared temperature measurement method according to an embodiment of the present disclosure;
[0025] Figure 3 Schematically shows a first example diagram of the stepwise characteristics of the emissivity of an object to be measured according to an embodiment of the present disclosure;
[0026] Figure 4Schematically shows the principle diagram of measuring the emissivity of the surface of a sample according to an embodiment of the present disclosure;
[0027] Figure 5 Schematically shows the flowchart of a method for generating the temperature measurement result of an object to be measured based on N reference temperature curves according to an embodiment of the present disclosure;
[0028] Figure 6 Schematically shows based on Figure 3 an example of the emissivity step characteristic, and an operation example of generating the temperature measurement result of the object to be measured by using the operation method of Figure 5 the embodiment;
[0029] Figure 7 Schematically shows the flowchart of a method for generating the temperature measurement result of an object to be measured based on N reference temperature curves according to another embodiment of the present disclosure;
[0030] Figure 8 Schematically shows based on Figure 3 an example of the emissivity step characteristic, and an operation example of generating the temperature measurement result of the object to be measured by using the operation method of Figure 7 the embodiment;
[0031] Figure 9 Schematically shows the second example diagram of the emissivity step characteristic of the object to be measured according to an embodiment of the present disclosure;
[0032] Figure 10 Schematically shows based on Figure 9 an example of the emissivity step characteristic, and an operation example of generating the temperature measurement result of the object to be measured by using the operation method of Figure 7 the embodiment;
[0033] Figure 11 Schematically shows the third example diagram of the emissivity step characteristic of the object to be measured according to an embodiment of the present disclosure;
[0034] Figure 12 Schematically shows based on Figure 11 an example of the emissivity step characteristic, and an operation example of generating the temperature measurement result of the object to be measured by using the operation method of Figure 7 the embodiment. Detailed implementation manners
[0035] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the present disclosure. In the following detailed description, for the sake of explanation, many specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. However, it is obvious that one or more embodiments can be implemented without these specific details. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessarily obscuring the concepts of the present disclosure.
[0036] The terms used herein are merely for describing specific embodiments and are not intended to limit the present disclosure. The terms "including", "comprising", etc. used herein indicate the presence of the described features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.
[0037] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.
[0038] In the case of using expressions such as "at least one of A, B, and C, etc.", generally, it should be interpreted according to the meaning that those skilled in the art usually understand this expression (for example, "a system having at least one of A, B, and C" should include, but not be limited to, a system having only A, only B, only C, having A and B, having A and C, having B and C, and / or having A, B, and C, etc.).
[0039] In the embodiments of the present disclosure, in aspects such as the collection, update, analysis, processing, use, transmission, provision, disclosure, storage, etc. of the data involved (for example, including but not limited to user personal information), they all comply with the provisions of relevant laws and regulations, are used for legal purposes, and do not violate public order and good customs. In particular, necessary measures are taken for user personal information to prevent illegal access to user personal information data and to safeguard the security of user personal information, network security, and national security.
[0040] In the embodiments of the present disclosure, before obtaining or collecting user personal information, the authorization or consent of the user is obtained.
[0041] An embodiment of the present disclosure provides an infrared temperature measurement method, including: obtaining the emissivity step characteristic of the object to be measured, where the emissivity step characteristic is used to characterize: multiple step changes in the emissivity of the object to be measured within a predetermined temperature range; based on N target emissivities corresponding to the multiple step changes, setting parameters for N infrared thermometers, where N is a positive integer; using the N infrared thermometers with completed parameter settings to measure the temperature of the object to be measured to obtain the temperature measurement result of the object to be measured.
[0042] Figure 1 Schematically shows the test principle diagram of the infrared temperature measurement method according to an embodiment of the present disclosure. Figure 2 Schematically shows the flowchart of the infrared temperature measurement method according to an embodiment of the present disclosure. The following combines Figure 1 、 Figure 2 to describe the infrared temperature measurement method according to an embodiment of the present disclosure.
[0043] As Figure 1 shown, multiple infrared thermometers 101 (3 are shown in the figure) are used to measure the temperature of the object to be measured 102 at the same time. The emissivity parameters of these infrared thermometers 101 are set to different emissivities ε1, ε2, and ε3.
[0044] As Figure 2 shown, the infrared temperature measurement method includes operations S201 to S203.
[0045] In operation S201, the emissivity step characteristic of the object to be measured is obtained, where the emissivity step characteristic is used to characterize: multiple step changes in the emissivity of the object to be measured within a predetermined temperature range.
[0046] In operation S202, based on N target emissivities corresponding to the multiple step changes, the parameters of N infrared thermometers are set, where N is a positive integer.
[0047] In operation S203, the N infrared thermometers with the parameters set are used to measure the temperature of the object to be measured, and the temperature measurement result of the object to be measured is obtained.
[0048] According to the embodiments of the present disclosure, all objects with a temperature higher than absolute zero are constantly radiating infrared energy into the surrounding space. The magnitude of the radiated energy and the law of its distribution according to wavelength are closely related to the surface temperature. By measuring the radiated infrared energy, the surface temperature can be determined, which is the basis for temperature measurement of infrared thermometers.
[0049] When using an infrared thermometer to measure the surface temperature of an object, the emissivity of the surface to be measured needs to be set in advance. Emissivity refers to the ratio of the radiation ability of an object to the radiation ability of a black body at the same temperature. This coefficient represents the degree of approximation of the thermal radiation of an actual object to black body radiation, and its value is between 0 and 1.
[0050] The emissivity of the object surface is related to factors such as the material, texture, roughness, color, temperature of the object surface, and the relative position between the thermometer and the surface. Only by accurately obtaining the emissivity of the surface to be measured and setting the emissivity parameter of the infrared thermometer based on this emissivity, the temperature value measured by the infrared thermometer is the accurate temperature value.
[0051] However, for objects with large temperature changes during the temperature measurement process, such as the brake parts of a train, the temperature rises from room temperature to a higher temperature during multiple braking processes, and can even reach 800 degrees in the case of rapid braking; for such objects, the surface state will change significantly during the temperature measurement process, resulting in a step change in the surface emissivity. Therefore, conventional measurement methods, such as using an infrared thermometer calibrated with a fixed emissivity for temperature measurement, cannot adjust the emissivity of the infrared thermometer in real time according to the measured temperature value during the test (for example, for test conditions with rapid temperature changes, the tester does not have time to adjust the emissivity in real time; for another example, the tester does not know the emissivity values corresponding to different temperatures in advance), resulting in errors in the measurement results.
[0052] In the method of the embodiment of the present disclosure, multiple infrared thermometers are used to measure temperature at the same time, and the emissivity of these infrared thermometers is set to different emissivities. Furthermore, the number of infrared thermometers and the numerical value of the emissivity parameter need to match the emissivity step characteristics of the object under measurement within a predetermined temperature range.
[0053] Specifically, before determining the number of infrared thermometers and setting their emissivity parameters, the emissivity step characteristics of the object to be measured can be obtained in advance. The emissivity step characteristics are used to characterize: multiple step changes in the emissivity of the object to be measured within a predetermined temperature range. The predetermined temperature range refers to the temperature change range of the object to be measured that is pre-estimated for the current measurement process. For example, before measurement, it is pre-estimated that the temperature change range of the wheel during multiple braking processes is 20°C-800°C.
[0054] The emissivity step characteristic characterizes the multiple step changes of the emissivity of the measured object within a predetermined temperature range. Figure 3 A first example diagram of the emissivity step characteristic of the object under test according to an embodiment of the present disclosure is schematically shown.
[0055] like Figure 3 As shown, for the surface of the object being measured, in each temperature step range, the emissivity is approximately a piecewise constant. In the 0-T3 temperature measurement range, the emissivity is approximately a three-segment constant. The emissivity in the 0-T1 temperature measurement range is approximately constant ε1 (as shown in the figure, line a is a straight line segment marked by a solid line), the emissivity in the T1-T2 temperature measurement range is approximately constant ε2 (as shown in the figure, line b is a straight line segment marked by a dotted line), and the emissivity in the T2-T3 temperature measurement range is approximately constant ε3 (as shown in the figure, line c is a straight line segment marked by a dotted line).
[0056] After obtaining the emissivity step characteristics of the object under test, in operation S202, the parameter setting for N infrared thermometers based on N target emissivities corresponding to multiple step changes can be: set the number of infrared thermometers corresponding to the number of steps, that is, select as many infrared thermometers as there are step emissivity values. And based on N target emissivities corresponding to multiple step changes, the parameter settings for N infrared thermometers are carried out one by one. Take Figure 3 the following example for illustration. In the temperature measurement range of 0 - T3, the surface emissivity of the object is approximately three-segment constant. In this case, three identical infrared thermometers are selected to simultaneously measure the temperature of the temperature measurement area on the object surface. At the same time, the emissivities set in the three thermometers are ε1, ε2, and ε3 respectively.
[0057] It should be noted here that if the emissivity set by the infrared thermometer is lower than the actual surface emissivity, then the temperature value measured by the infrared thermometer will be higher than the actual surface temperature value; conversely, if the emissivity set by the infrared thermometer is higher than the actual surface emissivity, then the temperature value measured by the infrared thermometer will be lower than the actual surface temperature value. Using N infrared thermometers to measure the temperature of the object under test can obtain N sets of corresponding temperature change data. Each set of temperature change data is the temperature value measured based on one emissivity. In each set of data, due to the step change of the actual emissivity of the object, therefore, some data are the actual temperature data that conform to the real temperature change, and some data have inaccurate temperature values because the emissivity does not match the actual emissivity.
[0058] Based on this, in the above operation S203, use the N infrared thermometers with completed parameter settings to measure the temperature of the object under test to obtain the temperature measurement result of the object under test. For example, it can be to determine a set of actual temperature change interval data that conforms to the real temperature change from a set of temperature change data corresponding to each infrared thermometer, and combine the N sets of actual temperature change intervals corresponding to the N infrared thermometers to obtain the real temperature change of the object under test.
[0059] According to the embodiments of the present disclosure, for the case where the surface emissivity of the object changes stepwise with temperature, compared with the method of using a single infrared thermometer calibrated with a fixed emissivity for temperature measurement, by the above method, the parameter settings of multiple infrared thermometers are carried out based on the emissivity step characteristics. Since the emissivities of these several infrared thermometers cover the emissivity change of the object under test, using these several infrared thermometers for temperature measurement, there is no need to adjust the emissivity of the infrared thermometer in real time according to the measured temperature value, and the measurement can be conveniently carried out, solving the problem that the tester is too late to adjust the emissivity in real time and improving the convenience of operation; at the same time, because different thermometers are set with different emissivities, accurate temperature values corresponding to different temperature emissivities can be measured, improving the measurement accuracy.
[0060] According to an embodiment of the present disclosure, the above measurement method can be applied to the scenario of monitoring the temperature change of the train braking component during the train's travel. In this scenario, the object to be measured is the train braking component, and the infrared temperature measurement method is applied when the train undergoes multiple brakings, causing the temperature of the braking component to gradually rise. Further, the braking component may include wheels and / or brake discs.
[0061] When the train brakes at high speed, due to the high-speed friction between the wheels, brake discs, etc. and the brake shoes and brake pads, the temperature of the wheels and brake discs rises sharply. After experiencing multiple rounds of braking, the temperature can reach a very high level. The excessive temperature will affect the safe operation of the train. Therefore, it is necessary to monitor the temperature change of the braking component in real time. Also, because the braking components of the train have a large temperature change range during multiple braking processes, for example, rising from room temperature to about 800 degrees. For such objects to be measured, the surface state will change significantly during the temperature measurement process, resulting in a step change in the surface emissivity. The accurate temperature cannot be measured using conventional measurement methods, but the method of the embodiment of the present disclosure can achieve accurate temperature measurement, is easy to operate, and has a low implementation difficulty.
[0062] According to an embodiment of the present disclosure, before determining the number of infrared thermometers and setting the emissivity parameters for them, it is necessary to pre-obtain the emissivity step characteristics of the object to be measured. The emissivity step characteristics are used to characterize the multiple step changes in the emissivity of the object to be measured within a predetermined temperature range. Among them, the predetermined temperature range refers to the temperature change range of the object to be measured estimated in advance for the current measurement process.
[0063] Further, the predetermined temperature range can be determined according to the historical temperature change data of the object to be measured. It can be based on the historical lowest temperature and the historical highest temperature to determine the temperature change range. For example, according to the historical temperature data of the wheels of the train collected during multiple historical trips, the historical lowest temperature of the wheels is 30°C, and the historical highest temperature is 750°C; the determined temperature change range is 30°C - 750°C.
[0064] Furthermore, at the same time, in order to ensure that the number and emissivity parameter settings of the infrared thermometer are more accurate, it is necessary to ensure that the emissivity step characteristics within the predetermined temperature range cover the emissivity changes within the true temperature range of the object to be measured. The historical minimum temperature can be lowered by a predetermined ratio, and the historical maximum temperature can be raised by a predetermined ratio to determine the temperature change range. For example, the historical minimum temperature of the wheel is 30°C, and the historical maximum temperature is 750°C; the estimated lower temperature limit is further lowered by 10%-50%, and at the same time, the estimated upper temperature limit is further raised by 10%-50%, and the determined temperature change range is 25°C-900°C. In this way, by expanding the historical temperature change range to obtain the predetermined temperature range to obtain the emissivity step characteristics, the emissivity changes within the true temperature range of the object to be measured can be covered, avoiding the situation where the number and emissivity parameter settings of the infrared thermometer are incomplete, resulting in unavailable measurement data.
[0065] Based on this, obtaining the emissivity step characteristics of the object to be measured includes the following operations.
[0066] First, determine the predetermined temperature range according to the historical temperature change data of the object to be measured, referring to the method described in the foregoing embodiments.
[0067] Then, heat a specimen with the same material as the object to be measured and make the temperature change of the specimen match the predetermined temperature range; for example, cut out a specimen from an object with the same or similar surface properties as the surface of the object to be measured, place it on a temperature-controlled heating platform, and heat it from the estimated lower temperature limit until the upper temperature limit.
[0068] After that, measure the experimental data of the emissivity of the specimen changing step by step with temperature, where the experimental data is the emissivity step characteristics of the object to be measured. For example, obtain the experimental data shown for the specimen as Figure 3 the emissivity step characteristics of the object to be measured.
[0069] According to an embodiment of the present disclosure, wherein the heating of the specimen includes a first heating and a second heating.
[0070] Among them, during the first heating process, obtain multiple temperature intervals corresponding to multiple changes in the surface state of the specimen as the reference basis for subsequent emissivity measurement. Among them, the temperature of the specimen is measured by a surface thermometer. The surface thermometer can be, for example, a contact-type temperature measuring instrument such as a thermocouple or a thermal resistance. This type of thermometer does not require emissivity calibration and can obtain the true temperature of the object surface.
[0071] The first heating is mainly used to observe the sudden changes in the surface state of the object (such as color mutation, etc.) during this process and make records. Among them, the sudden change in the surface state of the object corresponds to the sudden change in the emissivity. And, according to the number of sudden changes in the surface state of the object and the corresponding temperature values, the estimated entire temperature range is divided into several sub-ranges, and the temperature interval of each sub-range corresponds to a surface state of the object (at the same time, it also corresponds to an emissivity value).
[0072] Among them, the second heating is used to measure the emissivity. During the second heating process, the emissivity corresponding to each temperature interval is measured as test data.
[0073] The above combination method of the two heating processes is well applicable to the process of calibrating the emissivity of the measured object with a step change in emissivity, reducing the difficulty of emissivity calibration and improving the accuracy of emissivity measurement.
[0074] According to an embodiment of the present disclosure, among them, measuring the emissivity corresponding to each temperature interval includes the following operations.
[0075] First, read the true test temperature of the specimen measured by the surface thermometer. Then, based on the first emissivity set for the test infrared thermometer, measure the first temperature of the specimen. Then, when the first temperature and the true test temperature do not meet the predetermined numerical conditions, adjust the first emissivity to the second emissivity so that the second temperature of the specimen measured based on the second emissivity and the true temperature meet the predetermined numerical conditions, where the second emissivity is the emissivity corresponding to the temperature interval.
[0076] Figure 4 Schematically shows the principle diagram of measuring the emissivity of the surface of the specimen according to an embodiment of the present disclosure.
[0077] As Figure 4 shown, for each temperature interval, heat the heating platform 401 to the average temperature value of this temperature range and keep it constant (since within this temperature interval, the emissivity basically does not change, so in fact it can be heated to any temperature value within this temperature interval), then use the surface thermometer 402 (contact temperature measurement) to measure the true temperature of the temperature measurement area on the surface of the specimen (the area shown by the dotted line in the figure). At the same time, the infrared thermometer 403 measures the temperature of the temperature measurement area on the surface of the specimen, and adjusts the emissivity in the infrared thermometer 403 and observes the temperature measurement value. When the temperature measurement value is consistent with the temperature measurement value of the surface thermometer 402, it is considered that the set emissivity at this time is the true emissivity of the surface of the object at this temperature. Thus, the emissivity value of the surface of the object within each temperature interval can be obtained.
[0078] Through the method of the embodiments of the present disclosure, accurate calibration of the emissivity of the object to be measured in each different step temperature interval is achieved, and the step characteristics of the emissivity of the object to be measured with reference value are obtained, providing a data basis for subsequent temperature measurement.
[0079] According to an embodiment of the present disclosure, in the aforementioned operation S203, the temperature of the object to be measured is measured by using N infrared thermometers with parameter settings completed, and the temperature measurement results of the object to be measured include:
[0080] First, the temperature of the object to be measured is measured by using N infrared thermometers with parameter settings completed, and N reference temperature curves corresponding to N target emissivities are obtained. The reference temperature curves are used to characterize the change of temperature over time; for example, multiple measured data points can be connected to obtain a temperature curve; then, based on the N reference temperature curves, the temperature measurement results of the object to be measured are generated.
[0081] The temperature change curve can more intuitively express the trend of temperature change. Compared with the originally collected array, it is convenient to intuitively analyze the data change rule, so as to quickly extract available data from it, that is, a set of actual temperature change interval data that conforms to the real temperature change can be quickly determined from a set of temperature change data corresponding to each infrared thermometer, so as to obtain the final measurement result. Among them, there are various implementation methods for generating the temperature measurement results of the object to be measured based on the N reference temperature curves. The following two feasible implementation methods are exemplified to describe this data processing process.
[0082] Figure 5 The flowchart of the method for generating the temperature measurement results of the object to be measured based on N reference temperature curves according to an embodiment of the present disclosure is schematically shown.
[0083] As Figure 5 shown, the method includes operations S501 to S503.
[0084] In operation S501, based on multiple time points at which the temperature undergoes a step change in the reference temperature curve, each reference temperature curve is divided into multiple curve segments.
[0085] In operation S502, the target curve segments that conform to the real temperature change are determined from the multiple curve segments.
[0086] In operation S503, the target curve segments corresponding to the N reference temperature curves are connected to generate the temperature measurement results for characterizing the real temperature change of the object to be measured.
[0087] That is, select the same number of infrared thermometers according to the number of step emissivities within the temperature measurement range, and set a step emissivity value for each thermometer; according to the correspondence between "temperature-step emissivity", connect the test temperature curves of the infrared thermometers with the corresponding step emissivities at different temperatures, and the temperature change curve of the object surface during the entire temperature measurement process can be obtained.
[0088] Figure 6 Schematically shows an example of the emissivity step characteristic based on Figure 3 and an example of the operation of generating the temperature measurement result of the object to be measured using the operation method of the Figure 5 embodiment. The following will describe the method of the embodiments of the present disclosure in conjunction with Figure 6 this.
[0089] As Figure 6 shown, using 3 infrared thermometers with emissivities calibrated as ε1, ε2, and ε3 respectively, the 3 sets of reference temperature curves measured are shown in (1), (2), and (3) in the figure; in curve (1), the temperature change is represented by the solid line of the line type a in the figure; in curve (2), the temperature change is represented by the dotted line of the line type b in the figure; in curve (3), the temperature change is represented by the dashed line of the line type c in the figure.
[0090] Among them, since each set of temperatures is measured based on the same constant emissivity, there is a partial mismatch between the measured temperature and the actual temperature. Therefore, the temperature of each set of curves shows a step change. According to the law of the emissivity and temperature change of the object surface, it can be inferred that the time point at which the temperature value undergoes a step change is the time point at which the emissivity undergoes a step change. Based on these step points, each curve can be divided into 3 curve segments.
[0091] Among them, within the temperature change range of each curve, there is only one time period in which the emissivity matches the temperature change. Therefore, among the 3 curve segments corresponding to each curve, only one curve segment has the correct temperature value. Therefore, it is necessary to determine a target curve segment that conforms to the true temperature change from the multiple curve segments included in each curve, and connect these target curve segments, which is the correct temperature change within multiple emissivity ranges.
[0092] As Figure 6 shown, for curve (1), the target curve segment that conforms to the true temperature change is the curve segment numbered ① in the figure; for curve (2), the target curve segment that conforms to the true temperature change is the curve segment numbered ② in the figure; for curve (3), the target curve segment that conforms to the true temperature change is the curve segment numbered ③ in the figure. Connect these 3 curve segments to form a temperature change curve as shown by curve (4) in the figure, and the correct temperature change data can be obtained.
[0093] According to an embodiment of the present disclosure, determining a target curve segment that conforms to the true temperature change from multiple curve segments includes: determining a target curve segment that conforms to the true temperature change from multiple curve segments according to the emissivity step characteristic. Specifically, it may be to determine a curve segment whose temperature value matches the emissivity from multiple curve segments as the target curve segment.
[0094] The emissivity step characteristic is as Figure 3 shown. In the temperature measurement range of 0 - T3, the emissivity is approximately three-segment constant. In the temperature measurement range of 0 - T1, the emissivity is approximately constant ε1 (the linear type a in the figure is the straight line segment marked by a solid line). In the temperature measurement range of T1 - T2, the emissivity is approximately constant ε2 (the linear type b in the figure is the straight line segment marked by a dotted line). In the temperature measurement range of T2 - T3, the emissivity is approximately constant ε3 (the linear type c in the figure is the straight line segment marked by a dashed line).
[0095] Based on this, for curve (1), in the temperature range of 0 - T1, the temperature change matches the emissivity ε1; for curve (2), in the temperature range of T1 - T2, the temperature change matches the emissivity ε2; for curve (3), in the temperature range of T2 - T3, the temperature change matches the emissivity ε3.
[0096] Figure 7 Schematically shows a method flow chart for generating a temperature measurement result of a measured object based on N reference temperature curves according to another embodiment of the present disclosure; as Figure 7 shown, the method includes operations S701 to S703.
[0097] In operation S701, align the time coordinates of N reference temperature curves and merge them into the same coordinate system.
[0098] In operation S702, determine multiple time points at which the temperature undergoes a step change among the N reference temperature curves in the same coordinate system. Among them, based on the multiple time points, the N reference temperature curves are divided into multiple curve segments; among these N reference temperature curves, the multiple time points at which the temperature undergoes a step change are the same.
[0099] In operation S703, connect multiple target curve segments with smooth temperature changes on both sides of the time point to generate a temperature measurement result for characterizing the true temperature change of the measured object.
[0100] During the temperature measurement process, although the emissivity of the object surface shows a step change, according to the physical characteristics of the object temperature change, it can be known that the temperature of the object changes continuously and there will be no step change of sudden rise and fall. Therefore, after aligning the time coordinates of these N reference temperature curves and merging them into the same coordinate system, there must be a continuously changing and smooth temperature change curve, which is the real temperature change curve. This smooth curve is composed of multiple curve segments connected together, and these curve segments are distributed in different reference curves respectively.
[0101] Figure 8 Schematically shows an example based on Figure 3 the step characteristic of emissivity, and an operation example of generating the temperature measurement result of the object to be measured by using the operation method of Figure 7 the embodiment.
[0102] As Figure 3 , Figure 8 shown, the emissivity of the object surface shows a step change, and the emissivities in different temperature ranges are ε1, ε2, and ε3 respectively. Based on this characteristic, using 3 infrared thermometers with emissivities calibrated as ε1, ε2, and ε3 respectively, 3 groups of reference temperature curves measured are merged to obtain Figure 8 curve (1) in
[0103] In curve (1), the line types a - solid line, b - dash - dot line, and c - dotted line in the figure respectively represent the reference temperature curves measured by these three infrared thermometers. Figure 8 The multiple time points at which the temperature shows a step change in these 3 reference temperature curves are synchronous, such as the time points t1 and t2 in the figure; connecting the multiple target curve segments with smooth temperature changes on both sides of these time points, the real temperature change curve can be obtained, such as
[0104] curve (2) in
[0105] Referring to Figure 8As can be seen from curve (1), in the time range of 0 - t1 (temperature range of 0 - T1), the true emissivity of the object surface is ε1. At this time, the solid line measured by thermometer 1 is the true temperature curve of the measured surface. Since the emissivities set in thermometers 2 and 3 are higher than the true emissivity of the object surface, the temperature curves measured by these two are lower than the true temperature curve of the object surface; in the time range of t1 - t2 (temperature range of T1 - T2), the true emissivity of the object surface is ε2. At this time, the dotted line measured by thermometer 2 is the true temperature curve of the object surface. Since the emissivity set in thermometer 1 is lower than the true emissivity, the temperature curve it measures is higher than the true temperature curve of the object surface. The emissivity set in thermometer 3 is higher than the true emissivity, so the temperature curve it measures is lower than the true temperature curve of the object surface; in the time range of t2 - t3 (temperature range > T2), the true emissivity of the object surface is ε3. At this time, the dashed line measured by thermometer 3 is the true temperature curve of the object surface. Since the emissivities set in thermometers 1 and 2 are lower than the true emissivity, the temperature curves measured by these two are higher than the true temperature curve of the object surface. According to this method, it can also be used as a basis for determining the target curve segment that conforms to the true temperature change from the temperature curves measured by each thermometer.
[0106] As can be seen from the above analysis, as long as the accurate temperature test curves in the above time ranges (i.e., the corresponding temperature ranges) are connected before and after, the complete and accurate temperature curve of the surface of the object to be measured within the entire test time (within the entire test temperature range) can be obtained. For Figure 8 curve (1) in it, connecting the solid line in the time range of 0 - t1 in the figure, the dotted line in the time range of t1 - t2, and the dashed line in the time range of t2 - t3 forms the true temperature curve of the object surface within the entire test time range.
[0107] According to the embodiments of the present disclosure, based on Figure 7 the operation method of the embodiments to generate the temperature measurement result of the object to be measured, it can also be used to inversely determine whether the predetermined temperature range of the object to be measured is accurate, and further determine whether the emissivity step characteristic determined based on the predetermined temperature range is correct. This further improves the accuracy of temperature measurement. The following is a specific description.
[0108] As can be seen from the description of the foregoing embodiments, whether the emissivity step characteristic calibration of the object to be measured is accurate determines whether the measurement result is accurate and available. If the estimated predetermined temperature range of the object to be measured is consistent with the actual temperature change, at least it is ensured that the predetermined temperature range used when calibrating the emissivity step characteristic should be greater than the actual temperature change range, then the calibrated emissivity step characteristic is complete, the number of infrared thermometers and the emissivity setting are reasonable, and the measurement result is available.
[0109] Conversely, if the predetermined temperature range used for calibrating the emissivity step characteristic is smaller than the actual temperature change range, there may be an incomplete emissivity step characteristic during calibration. In this case, the number of infrared thermometers and the emissivity settings are unreasonable, and at least some of the measured temperature data are incorrect.
[0110] Based on this, the first scenario of the above method is as follows: When the number of multiple target curve segments is equal to the number of N target emissivities and there are target time points among multiple time points, a first feedback result is generated. Here, there are no target curve segments with smooth temperature changes on both sides of the target time point. The first feedback result is used to indicate that the temperature change data greater than the target time point in the temperature measurement result is inaccurate, the predetermined temperature range is smaller than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is incomplete.
[0111] Figure 9 Schematically shows a second example diagram of the emissivity step characteristic of the object to be measured according to an embodiment of the present disclosure; Figure 10 Schematically shows based on Figure 9 the example of the emissivity step characteristic, and an operation example of generating the temperature measurement result of the object to be measured by using the operation method of Figure 7 the embodiment. The following will be described in conjunction with Figure 3 , Figure 9 , Figure 10 .
[0112] Assume that the correct emissivity step characteristic of the object to be measured is as Figure 3 shown. During the process of calibrating the emissivity step characteristic of the object to be measured, due to inaccurate estimated temperature, if the predetermined temperature range used for calibrating the emissivity step characteristic is smaller than the actual temperature change range. For example, the actual temperature change range is 0 - T3, and the estimated temperature change range is 0 - T2; T2 is less than T3. Then, based on the estimated temperature change range, the calibrated emissivity step characteristic is as Figure 9 shown, where for the temperature range of T2 - T3, the emissivity calibration is not performed.
[0113] Using 2 infrared thermometers with emissivities calibrated as ε1 and ε2 respectively, and combining the 2 sets of reference temperature curves measured, the curve (1) in Figure 10 is obtained. In curve (1), the solid line of line type a and the dotted line of line type b in the figure respectively represent the reference temperature curves measured by these two infrared thermometers. Among them, at the time point t2, there is no smoothly connected curve segment before and after, that is, the temperature shows a step, indicating that the temperature change data after the time point t2 is inaccurate, the predetermined temperature range is smaller than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is incomplete.
[0114] According to an embodiment of the present disclosure, the second case is: when the number of multiple target curve segments is equal to the number of N target emissivities and there is no target time point among multiple time points, a second feedback result is generated, where the second feedback result is used to characterize that the temperature measurement result is available, the predetermined temperature range matches the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is complete.
[0115] In this case, the predetermined temperature range estimated for the object to be measured is consistent with the actual temperature change, so the calibrated emissivity step characteristic is complete, the number of infrared thermometers and the emissivity setting are reasonable, and the measurement result is available. For example Figure 3 、 Figure 8 the situation shown is this case.
[0116] According to an embodiment of the present disclosure, the third case is: when the number of multiple target curve segments is less than the number of N target emissivities and there is no target time point among multiple time points, a third feedback result is generated, where the third feedback result is used to characterize that the temperature measurement result is available, the predetermined temperature range is greater than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is complete.
[0117] This case means that the predetermined temperature range estimated for the object to be measured is greater than the actual temperature change range, so the calibrated emissivity step characteristic completely covers and exceeds the actual emissivity step change situation, and the number of infrared thermometers exceeds the actual demand. In this case, the measurement result is still available.
[0118] Figure 11 FIG. schematically shows a third example diagram of the emissivity step characteristic of the object to be measured according to an embodiment of the present disclosure; Figure 12 is schematically shown based on Figure 11 the emissivity step characteristic example, and an operation example of generating the temperature measurement result of the object to be measured by using Figure 7 the operation method of the embodiment. The following will be described in conjunction with Figure 3 、 Figure 11 、 Figure 12 for illustration.
[0119] Assume that the correct emissivity step characteristic of the object to be measured is as Figure 3 shown, presenting a three-stage step distribution; during the process of calibrating the emissivity step characteristic of the object to be measured, the estimated temperature is greater than the actual temperature. For example, the actual temperature change range is 0 - T3, and the estimated temperature change range is 0 - T4; T3 is less than T4. Then, based on the estimated temperature change range, the calibrated emissivity step characteristic is as Figure 11As shown, in the temperature range of 0 - T1, the emissivity is approximately a constant ε1 (the straight line segment marked by the solid line in the figure, such as the linear type a), in the temperature range of T1 - T2, the emissivity is approximately a constant ε2 (the straight line segment marked by the dotted line in the figure, such as the linear type b), in the temperature range of T2 - T3, the emissivity is approximately a constant ε3 (the straight line segment marked by the dashed line in the figure, such as the linear type c), and in the temperature range of T3 - T4, the emissivity is approximately a constant ε4 (the straight line segment marked by the dotted line in the figure, such as the linear type d). Among them, the actual temperature change range is 0 - T3, and the part of T3 - T4 is the over-calibrated part.
[0120] Based on this emissivity step characteristic, using 4 infrared thermometers with emissivities calibrated as ε1, ε2, ε3, and ε4 respectively, 4 groups of reference temperature curves obtained by measurement are merged to obtain Figure 12 the curve (1) in. In curve (1), in the figure, the linear type a - solid line, the linear type b - dotted line, the linear type c - dashed line, and the linear type d - dotted line respectively represent the reference temperature curves measured by these 4 infrared thermometers.
[0121] Among them, at the time points t1 and t2 of each temperature step, there are smoothly connected curve segments before and after. Connect the curve segments smoothly connected before and after the time points t1 and t2 to form the correct temperature change curve, as Figure 12 shown by curve (2) in. Among them, the data of one thermometer (emissivity ε4) is not used because the actual temperature does not reach the temperature range corresponding to this emissivity ε4. Therefore, the data measured by this thermometer is unavailable and can be discarded. Discarding this group of data does not affect the accuracy of the final temperature measurement result.
[0122] According to the embodiments of the present disclosure, it can be seen from the comparison of the above several situations that in order to ensure the accuracy of the temperature measurement result, it is necessary to ensure that the temperature change during the temperature measurement process matches the selection of the emissivity and the number of infrared thermometers, and ensure that the emissivity step characteristic within the predicted predetermined temperature range covers the emissivity change situation within the true temperature range of the object to be measured. Therefore, when determining the predicted predetermined temperature range before measurement, a relatively wide temperature range can be selected. For example, the historical lowest temperature is lowered by a predetermined ratio, and the historical highest temperature is raised by a predetermined ratio to ensure that the predicted temperature change range is greater than or equal to the actual temperature change range of the object to be measured.
[0123] Based on the above infrared temperature measurement method, another aspect of the present disclosure provides an infrared temperature measurement system, including: N infrared thermometers, where the parameters of the N infrared thermometers are set based on N target emissivities, and the N target emissivities correspond to multiple step changes in the emissivity of the object to be measured within a predetermined temperature range. The N infrared thermometers that have completed parameter setting are configured to perform temperature measurement on the object to be measured to obtain the temperature measurement result of the object to be measured, and N is a positive integer.
[0124] According to an embodiment of the present disclosure, for the method of temperature measurement and data processing based on the N infrared thermometers, reference may be made to the descriptions of operations S201 to S203 in the foregoing embodiments, which will not be elaborated herein.
[0125] According to an embodiment of the present disclosure, in order to obtain the emissivity step characteristics of the object to be measured before temperature measurement, the above system further includes a specimen, a heating device, a surface thermometer, and a test infrared thermometer.
[0126] Among them, the specimen is made of the same material as the object to be measured; the heating device is configured to heat the specimen and make the temperature change of the specimen match a predetermined temperature range; the surface thermometer is configured to measure the true test temperature of the specimen during the heating process; the test infrared thermometer is configured to measure the test data of the emissivity of the specimen changing stepwise with temperature based on the true test temperature, where the test data is used to characterize the multiple step changes in the emissivity of the object to be measured within a predetermined temperature range. Among them, for the method of measuring the test data of the emissivity of the specimen changing stepwise with temperature, reference may be made to the relevant descriptions in the foregoing embodiments, which will not be elaborated herein.
[0127] Another aspect of the present disclosure provides a train, including a vehicle body, a braking member, and N infrared thermometers.
[0128] Among them, the N infrared thermometers are arranged at the braking member. Among them, the parameters of the N infrared thermometers are set based on N target emissivities, and the N target emissivities correspond to the multiple step changes in the emissivity of the braking member within a predetermined temperature range. The N infrared thermometers after the parameter setting are configured to: measure the temperature of the braking member during the process of the temperature of the braking member gradually rising caused by multiple brakings of the train. N is a positive integer. For the method of temperature measurement and data processing based on the N infrared thermometers, reference may be made to the descriptions of operations S201 to S203 in the foregoing embodiments, which will not be elaborated herein.
[0129] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagram may represent a module, a segment of a program, or a portion of code, which contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions noted in the blocks may occur in a different order than noted in the accompanying drawings. For example, two consecutive blocks shown may actually be executed substantially in parallel, or they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram or flowchart, and combinations of blocks in the block diagram or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or operations, or by a combination of dedicated hardware and computer instructions. Those skilled in the art will understand that the features described in the various embodiments of the present disclosure can be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in the present disclosure. In particular, without departing from the spirit and teachings of the present disclosure, the features described in the various embodiments of the present disclosure can be combined and / or combined in various ways. All such combinations and / or combinations fall within the scope of the present disclosure.
[0130] The embodiments of the present disclosure have been described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments have been described separately above, this does not mean that the measures in the various embodiments cannot be used advantageously in combination. Without departing from the scope of the present disclosure, those skilled in the art can make various substitutions and modifications, and all such substitutions and modifications should fall within the scope of the present disclosure.
Claims
1. An infrared temperature measurement method, comprising: Obtaining the emissivity step characteristic of the object to be measured, where the emissivity step characteristic is used to characterize: multiple step changes in the emissivity of the object to be measured within a predetermined temperature range; Based on N target emissivities corresponding to the multiple step changes, setting parameters for N infrared thermometers, where N is a positive integer; Using the N infrared thermometers with the parameters set to measure the temperature of the object to be measured, and obtaining the temperature measurement result of the object to be measured.
2. The method according to claim 1, wherein, Using the N infrared thermometers with the parameters set to measure the temperature of the object to be measured, and obtaining the temperature measurement result of the object to be measured includes: Using the N infrared thermometers with the parameters set to measure the temperature of the object to be measured, and obtaining N reference temperature curves corresponding to the N target emissivities, where the reference temperature curve is used to characterize the change of temperature over time; Based on the N reference temperature curves, generating the temperature measurement result of the object to be measured.
3. The method according to claim 2, wherein Based on the N reference temperature curves, generating the temperature measurement result of the object to be measured includes: Based on multiple time points at which the temperature undergoes step changes in the reference temperature curve, dividing each reference temperature curve into multiple curve segments; Determining target curve segments that conform to the true temperature change from the multiple curve segments; Connecting the target curve segments corresponding to the N reference temperature curves respectively, and generating a temperature measurement result for characterizing the true temperature change of the object to be measured.
4. The method according to claim 3, wherein Determining target curve segments that conform to the true temperature change from the multiple curve segments includes: According to the emissivity step characteristic, determining target curve segments that conform to the true temperature change from the multiple curve segments.
5. The method according to claim 2, wherein Based on the N reference temperature curves, generating the temperature measurement result of the object to be measured includes: Aligning the time coordinates of the N reference temperature curves and merging them into the same coordinate system; Determining multiple time points at which the temperature undergoes step changes in the N reference temperature curves in the same coordinate system, where, based on the multiple time points, the N reference temperature curves are divided into multiple curve segments; Connecting multiple target curve segments with smooth temperature changes on both sides of the time point, and generating a temperature measurement result for characterizing the true temperature change of the object to be measured.
6. The method according to claim 5, the method further comprising: When the number of the multiple target curve segments is equal to the number of the N target emissivities and there is a target time point among the multiple time points, generating a first feedback result, where there are no target curve segments with smooth temperature changes on both sides of the target time point, and the first feedback result is used to characterize: the temperature change data greater than the target time point in the temperature measurement result is inaccurate, the predetermined temperature range is smaller than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is incomplete.
7. The method according to claim 6, the method further comprising: When the number of the multiple target curve segments is equal to the number of the N target emissivities and there is no target time point among the multiple time points, a second feedback result is generated, where the second feedback result is used to characterize that the temperature measurement result is available, the predetermined temperature range matches the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is complete.
8. The method according to claim 6, wherein the method further comprises: When the number of the multiple target curve segments is less than the number of the N target emissivities and there is no target time point among the multiple time points, a third feedback result is generated, where the third feedback result is used to characterize that the temperature measurement result is available, the predetermined temperature range is greater than the true temperature change range of the object to be measured, and the emissivity step characteristic of the object to be measured obtained based on the predetermined temperature range is complete.
9. The method according to claim 1, wherein: The object to be measured is a braking component of a train, and the infrared temperature measurement method is applied when the train brakes multiple times, causing the temperature of the braking component to gradually rise.
10. The method according to claim 9, wherein: The braking component includes a wheel and / or a brake disc.
11. According to the method according to any one of claims 1-10, wherein Obtaining the emissivity step characteristic of the object to be measured includes: Determining the predetermined temperature range according to the historical temperature change data of the object to be measured; Heating a specimen having the same material as the object to be measured and making the temperature change of the specimen match the predetermined temperature range; Measuring the test data of the emissivity of the specimen changing stepwise with temperature, where the test data is the emissivity step characteristic of the object to be measured.
12. The method according to claim 11, wherein, The heating of the specimen includes a first heating and a second heating. Measuring the test data of the emissivity of the specimen changing stepwise with temperature includes: During the first heating process, obtaining multiple temperature intervals corresponding to multiple changes in the surface state of the specimen, where the temperature of the specimen is measured by a surface thermometer; During the second heating process, measuring the emissivity corresponding to each of the temperature intervals as the test data.
13. The method according to claim 12, wherein, Measuring the emissivity corresponding to each of the temperature intervals includes: Reading the true test temperature of the specimen measured by the surface thermometer; Based on a first emissivity set for the test infrared thermometer, measuring a first temperature of the specimen; When the first temperature and the true test temperature do not meet a predetermined numerical condition, adjusting the first emissivity to a second emissivity so that a second temperature of the specimen measured based on the second emissivity and the true temperature meet the predetermined numerical condition, where the second emissivity is the emissivity corresponding to the temperature interval.
14. An infrared temperature measurement system, comprising: N infrared thermometers, wherein the parameters of the N infrared thermometers are set based on N target emissivities, the N target emissivities corresponding to multiple step changes in the emissivity of the object to be measured within a predetermined temperature range, and the N infrared thermometers after parameter setting are configured to measure the temperature of the object to be measured to obtain the temperature measurement result of the object to be measured, where N is a positive integer.
15. The system according to claim 14, further comprising: a specimen having the same material as the object to be measured; a heating device configured to heat the specimen and make the temperature change of the specimen match the predetermined temperature range; a surface thermometer configured to measure the true test temperature of the specimen during heating; a test infrared thermometer configured to, based on the true test temperature, measure test data on the emissivity of the specimen changing stepwise with temperature, wherein the test data is used to characterize multiple step changes in the emissivity of the object to be measured within a predetermined temperature range.
16. A train, comprising: a car body; a braking member; N infrared thermometers arranged at the braking member, wherein the parameters of the N infrared thermometers are set based on N target emissivities, the N target emissivities corresponding to multiple step changes in the emissivity of the braking member within a predetermined temperature range, and the N infrared thermometers after parameter setting are configured to: during the process of the temperature of the braking member gradually rising due to multiple brakings of the train, measure the temperature of the braking member, where N is a positive integer.