Direct-current resistance testing method, device and equipment of electrical equipment and medium

Abstract

The invention discloses a direct-current resistance testing method, device and equipment of electrical equipment and a medium. The method comprises the following steps: determining an optimal frequency combination according to inherent frequency characteristics and signal superposition interference minimization characteristics of to-be-tested electrical equipment; generating a multi-frequency excitation signal corresponding to the optimal frequency combination so as to apply the multi-frequency excitation signal to the to-be-tested electrical equipment; collecting a current signal and a voltage signal on the to-be-tested electrical equipment under the multi-frequency excitation signal; and performing time-domain integration processing on the current signal and the voltage signal to determine the direct-current resistance. According to the scheme, high-precision testing of the direct-current resistance of the electrical equipment is realized.

Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of electrical testing, and in particular, to a method, device, equipment and medium for testing the direct current resistance of electrical equipment. Background Art

[0002] In the condition monitoring and fault diagnosis of electrical equipment, the direct current resistance test is a commonly used diagnostic method. The direct current resistance test can effectively detect whether there are abnormalities in the conductive parts of the equipment, such as problems like excessive contact resistance or loose conductor connections.

[0003] However, traditional direct current resistance test methods usually adopt a single frequency or broadband excitation signal, which has the following disadvantages in practical applications: First, the single frequency excitation signal is easily affected by external interference, especially in a complex electromagnetic environment, which may lead to large errors in the test results and it is difficult to accurately reflect the true state of the equipment; Second, when using a broadband excitation signal, due to the large number of signal frequency components, superposition effects may occur between signals, thereby introducing test noise or interference signals, thus reducing the test accuracy. That is, the accuracy of the direct current resistance test of electrical equipment in the prior art is relatively low, and high-precision testing of direct current resistance cannot be achieved. Summary of the Invention

[0004] The present invention provides a method, device, equipment and medium for testing the direct current resistance of electrical equipment, realizing high-precision testing of the direct current resistance of electrical equipment.

[0005] To achieve the above object, in a first aspect, an embodiment of the present invention provides a method for testing the direct current resistance of electrical equipment, the method including:

[0006] Determine an optimal frequency combination according to the inherent frequency characteristics and the signal superposition interference minimization characteristics of the electrical equipment to be tested;

[0007] Generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical equipment to be tested;

[0008] Collect the current signal and voltage signal on the electrical equipment to be tested under the multi-frequency excitation signal;

[0009] Perform time-domain integration processing on the current signal and the voltage signal to determine the direct current resistance.

[0010] Optionally, before performing time-domain integration processing on the current signal and the voltage signal to determine the direct current resistance, it further includes:

[0011] Perform frequency-domain filtering processing on the current signal and the voltage signal.

[0012] Optionally, before performing frequency-domain filtering on the current signal and the voltage signal, the following steps are further included:

[0013] Normalize the current signal and the voltage signal.

[0014] Optionally, determining an optimal frequency combination according to the inherent frequency characteristics and signal superposition interference characteristics of the electrical equipment to be tested includes:

[0015] Based on all frequency pairs, determine the interference weight between each of the frequency pairs;

[0016] Select each of the frequency pairs with the interference weight less than a preset interference weight as a preset frequency combination;

[0017] Based on the inherent frequency characteristics of the electrical equipment to be tested and the preset frequency combination, determine the optimal frequency combination.

[0018] Optionally, generating a multi-frequency excitation signal corresponding to the optimal frequency combination and applying the multi-frequency excitation signal to the electrical equipment to be tested includes:

[0019] According to the characteristics of the electrical equipment to be tested, set the signal amplitude and signal linear increment for each frequency in the optimal frequency combination to generate sine signals for each frequency;

[0020] Superimpose the sine signals for each frequency to determine the multi-frequency excitation signal.

[0021] Optionally, performing frequency-domain filtering on the current signal and the voltage signal includes:

[0022] Based on the Fourier processing algorithm, perform frequency-domain processing on the current signal and the voltage signal;

[0023] Based on the cut-off frequency, perform low-pass filtering on the current signal and the voltage signal after frequency-domain processing.

[0024] Optionally, determining the DC resistance component by performing time-domain integration processing on the current signal and the voltage signal includes:

[0025] Based on the inverse Fourier processing algorithm, perform time-domain processing on the current signal and the voltage signal after low-pass filtering;

[0026] Perform integration processing on the current signal and the voltage signal after time-domain processing to determine the DC resistance component.

[0027] In a second aspect, an embodiment of the present invention further provides a DC resistance testing device for an electrical equipment, and the device includes:

[0028] An optimal frequency combination determination module, configured to determine an optimal frequency combination according to the inherent frequency characteristics of the electrical device to be tested and the characteristic of minimizing signal superposition interference;

[0029] An excitation signal generation module, configured to generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical device to be tested;

[0030] An acquisition module, configured to acquire the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal;

[0031] A processing module, configured to perform time-domain integration processing on the current signal and the voltage signal to determine the DC resistance component.

[0032] In a third aspect, an embodiment of the present invention further provides an electronic device, where the electronic device includes:

[0033] At least one processor; and

[0034] A memory communicatively connected to the at least one processor; wherein,

[0035] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the DC resistance test method for the electrical device described in the first aspect.

[0036] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, where the computer-readable storage medium stores computer instructions, and the computer instructions are used to implement the DC resistance test method for the electrical device described in the first aspect when executed by a processor.

[0037] In the embodiment of the present invention, by determining an optimal frequency combination according to the inherent frequency characteristics of the electrical device to be tested and the characteristic of minimizing signal superposition interference; generating a multi-frequency excitation signal corresponding to the optimal frequency combination and applying the multi-frequency excitation signal to the electrical device to be tested; acquiring the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal; performing time-domain integration processing on the current signal and the voltage signal to determine the DC resistance. Thus, compared with a single-frequency excitation signal, by performing DC resistance testing on the multi-frequency excitation signal corresponding to the optimal frequency combination, the non-linear error and noise interference in signal superposition are effectively reduced, ensuring the independence and orthogonality between signals, thereby reducing the influence of the external complex electromagnetic environment on the test result; at the same time, by performing time-domain integration processing on the current signal and the voltage signal, the measurement of the DC resistance is realized, and the suppression effect on random noise is also achieved, so as to ensure the measurement accuracy of the DC resistance.

[0038] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present invention, nor is it used to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. Description of the Drawings

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0040] Figure 1 It is a flowchart of a method for testing the DC resistance of an electrical device provided by an embodiment of the present invention;

[0041] Figure 2 It is a flowchart of another method for testing the DC resistance of an electrical device provided by an embodiment of the present invention;

[0042] Figure 3 It is a flowchart of another method for testing the DC resistance of an electrical device provided by an embodiment of the present invention;

[0043] Figure 4 It is a schematic structural diagram of a device for testing the DC resistance of an electrical device provided by an embodiment of the present invention;

[0044] Figure 5 It is a schematic structural diagram of an electronic device provided by an embodiment of the present invention. Detailed Embodiments

[0045] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of the present invention.

[0046] It should be noted that the terms "first", "second", etc. in the description, claims and above-mentioned drawings of the present invention are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present invention described here can be implemented in an order other than those illustrated or described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device including a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0047] Figure 1 FIG. Figure 1 is a flowchart of a method for testing the DC resistance of an electrical device provided by an embodiment of the present invention. This embodiment is applicable to the situation of measuring the DC resistance of an electrical device. This method can be executed by a DC resistance test device of the electrical device, such as Figure 1 shown, and the method specifically includes the following steps:

[0048] S110. Determine the optimal frequency combination according to the natural frequency characteristics and the signal superposition interference minimization characteristics of the electrical device to be tested.

[0049] Among them, the natural frequency characteristic of the electrical device to be tested is the free oscillation frequency when there is no external excitation; the natural frequency characteristic of the electrical device to be tested will affect the optimal frequency combination for interference; the natural frequency should be avoided in the optimal frequency combination to reduce interference.

[0050] The signal superposition interference minimization characteristic is to select the frequency combination with the minimum influence of superposition interference from all frequency pairs, that is, the degree of mutual interference of signals under the frequency combination is the smallest, which can ensure the independence and orthogonality of each frequency signal; the signal superposition interference minimization characteristic can be determined by various methods, and this embodiment does not limit this;

[0051] The optimal frequency combination is a frequency combination that can ensure both the independence and orthogonality of each frequency signal and avoid the natural frequency interference of the electrical device to be tested at the same time.

[0052] S120. Generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical device to be tested.

[0053] Among them, the multi-frequency excitation signal generating the corresponding optimal frequency combination is specifically a sine signal at each frequency established based on the optimal frequency combination, and the sine signals at each frequency are superimposed to generate a multi-frequency excitation signal; compared with the single-frequency excitation signal, when the multi-frequency excitation signal corresponding to the optimal frequency combination is applied to the electrical device to be tested, the non-linear error and noise interference in the signal superposition are effectively reduced, ensuring the independence and orthogonality between signals, thereby reducing the influence of the external complex electromagnetic environment on the subsequent current, voltage and voltage signal acquisition, and thus improving the subsequent test accuracy.

[0054] S130. Collect the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal.

[0055] Among them, the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal are the current information and voltage information in the time domain.

[0056] S140. Perform time-domain integration processing on the current signal and voltage signal to determine the DC resistance.

[0057] Among them, performing time-domain integration processing on the current signal and voltage signal to determine the DC resistance is specifically as follows: perform integration processing on the current signal in the time domain and perform integration processing on the voltage signal; determine the DC resistance according to the integrated voltage signal and the integrated current signal, that is:

[0058]

[0059] Among them, R represents the DC resistance value, V(t) represents the function of the voltage signal changing with time, I(t) represents the function of the current signal changing with time, t represents time, and T represents the measurement period.

[0060] In this embodiment, performing time-domain integration processing on the current signal and voltage signal to determine the DC resistance utilizes the integration operation to focus the measurement on the overall trend of the signal, suppresses the interference of random noise and instantaneous fluctuations on the result, and ensures the stability and accuracy of the measurement result; at the same time, using the integration method to replace the instantaneous value calculation reduces the dependence on the data acquisition accuracy and simplifies the design of the component acquisition system.

[0061] In an embodiment of the present invention, an optimal frequency combination is determined according to the inherent frequency characteristics of the electrical device to be tested and the characteristic of minimizing signal superposition interference; a multi-frequency excitation signal corresponding to the optimal frequency combination is generated and applied to the electrical device to be tested; the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal are collected; the current signal and voltage signal are subjected to time-domain integration processing to determine the DC resistance. Thus, compared with a single-frequency excitation signal, by performing DC resistance testing with a multi-frequency excitation signal corresponding to the optimal frequency combination, the non-linear error and noise interference in signal superposition are effectively reduced, the independence and orthogonality between signals are ensured, and thus the influence of the external complex electromagnetic environment on the test result is reduced; at the same time, by subjecting the current signal and voltage signal to time-domain integration processing, the measurement of the DC resistance is realized, and the suppression effect on random noise is also achieved, so as to ensure the measurement accuracy of the DC resistance.

[0062] Optionally, on the basis of the above embodiment, the DC resistance testing method of the electrical device is further optimized. Figure 2 It is a flowchart of another DC resistance testing method of the electrical device provided by the embodiment of the present invention. As Figure 2 shown, the method includes the following steps:

[0063] S210. Determine an optimal frequency combination according to the inherent frequency characteristics of the electrical device to be tested and the characteristic of minimizing signal superposition interference.

[0064] Specifically, determining the optimal frequency combination includes:

[0065] 1) Based on all frequency pairs, determine the interference weight between each frequency pair; specifically:

[0066]

[0067] Among them, W ij represents the interference weight between two frequencies, wi represents the i-th frequency in the candidate frequency set, wj represents the j-th frequency in the candidate frequency set, and i and j represent different frequency indices in the candidate frequency set;

[0068] 2) Select each frequency pair with an interference weight less than the preset interference weight as the preset frequency combination;

[0069] Among them, the preset interference weight W0 is the maximum interference weight determined by two frequencies that can ensure the minimum mutual interference degree between two frequency signals and can ensure the independence and orthogonality between two frequency signals. Selecting each frequency pair with an interference weight less than the preset interference weight as the preset frequency combination, the interference degree between two frequency signals under the preset frequency combination is the smallest.

[0070] 3) Determine the optimal frequency combination based on the natural frequency characteristics of the electrical device to be tested and the preset frequency combination.

[0071] Specifically, the natural frequencies in the natural frequency characteristics can be avoided from the preset frequency combination, so that the optimal frequency combination can be determined.

[0072] S220. Generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical device to be tested.

[0073] Among them, generating a multi-frequency excitation signal corresponding to the optimal frequency combination and applying the multi-frequency excitation signal to the electrical device to be tested includes: setting the signal amplitude A l and the signal linear increment value kt for each frequency in the optimal frequency combination to generate sine signals for each frequency; superimposing the sine signals for each frequency to determine the multi-frequency excitation signal; the multi-frequency excitation signal is specifically:

[0074]

[0075] Among them, x(t) represents the superimposed multi-frequency excitation signal, t represents time, n represents the total number of frequency signals, Al represents the amplitude of the l-th frequency component, fl represents the frequency value of the l-th frequency component, k represents the coefficient of the linear growth term, cos(2πf l t) represents the sine wave function of the l-th frequency component, and l represents the index of the frequency component in the candidate frequency set.

[0076] It should be noted that on the basis of the signal amplitude A l by introducing the linear growth term k, not only can the time dynamic response characteristics of the signal be enhanced, but also the influence of environmental interference that may occur during the measurement on the signal stability can be suppressed, so as to form an accurate multi-frequency excitation signal, thereby improving the reliability and accuracy of the subsequent test method.

[0077] Specifically, the coefficient k of the linear growth term is specifically: k = ΔB / T; where k represents the coefficient of the linear growth term, ΔB represents the amplitude range of the allowable change range based on the signal amplitude A l ΔB = Bmax - Bmin; Bmax represents the maximum amplitude of the allowable change range, Bmin represents the minimum amplitude of the allowable change range; T represents the measurement period. By calculating the amplitude range ΔB of the allowable change range and superimposing the signal amplitude A lAccurately describes the dynamic changes of the excitation signal within the entire amplitude range. Specifically, the maximum amplitude Bmax and the minimum amplitude Bmin are key parameters preset during the generation of the multi-frequency excitation signal, used to define the upper and lower limits of the amplitude range of the allowable change range. By reasonably setting ΔB, the dynamic amplitude range of the signal can be precisely controlled, ensuring that the excitation signal not only meets the time dynamic response characteristics of the test object and the environmental interference that appears, but also avoids problems such as equipment overload caused by excessive amplitude or a decrease in signal-to-noise ratio caused by too small amplitude. It can be understood that Bmax and Bmin can be adjusted to adapt to the requirements of different test environments and different electrical equipment to be tested, improving the flexibility of the measurement method.

[0078] In addition, the signal amplitude A in this embodiment l Specifically: Among them, A l represents the amplitude of the l-th frequency component, P represents the total signal power, and n represents the total number of frequency signals.

[0079] Based on the principle of power conservation, by assigning a unified amplitude A l to each frequency component, to ensure that the signal power is evenly distributed during the multi-frequency excitation process. This design ensures that the total power after signal superposition is consistent with the target power, and at the same time avoids signal distortion problems caused by too large or too small amplitude of a single frequency component; the signal amplitude A l The uniform design can also minimize the non-linear coupling between multi-frequency signals, reduce the measurement error caused by signal superposition, and thus significantly improve the accuracy of DC resistance measurement.

[0080] S230. Collect the current signal and voltage signal on the electrical equipment to be tested under the multi-frequency excitation signal.

[0081] S240. Perform frequency-domain filtering processing on the current signal and voltage signal.

[0082] Among them, performing frequency-domain filtering processing on the current signal and voltage signal means converting the current signal and voltage signal in the time domain into the current signal and voltage signal in the frequency domain to analyze the characteristics such as amplitude and phase of different frequency components; and performing filtering processing on the current signal and voltage signal in the frequency domain to separate the DC component and low-frequency signals, while filtering out high-frequency noise and further suppressing environmental interference, so as to further ensure the accuracy and reliability of the subsequent DC resistance measurement result.

[0083] In this embodiment, the frequency-domain analysis method for converting current signals and voltage signals in the time domain into current signals and voltage signals in the frequency domain includes Fourier Transform (FT), Fast Fourier Transform (FFT), Wavelet Transform, etc. This embodiment does not make specific limitations on this.

[0084] S250. Perform time-domain integration processing on the current signal and voltage signal after frequency-domain filtering to determine the DC resistance.

[0085] Among them, performing time-domain integration processing on the current signal and voltage signal after frequency-domain filtering means converting the current signal and voltage signal after frequency-domain filtering into current signals and voltage signals in the time domain; then perform integration processing on the current signal and voltage signal in the time domain to determine the DC resistance; specifically:

[0086]

[0087] Among them, R represents the DC resistance value, V’(t) represents the function of the voltage signal after frequency-domain filtering changing with time, I’(t) represents the function of the current signal after frequency-domain filtering changing with time, t represents time, and T represents the measurement period.

[0088] In this embodiment, performing time-domain integration processing on the current signal and voltage signal after frequency-domain filtering, after frequency-domain filtering, extracting its low-frequency components or DC components can reduce the interference of high-frequency noise and further perform environmental interference, so as to further ensure the stability and accuracy of the DC resistance measurement result.

[0089] Optionally, on the basis of the above embodiment, further optimize the DC resistance test method for electrical equipment. Figure 3 It is a flowchart of another DC resistance test method for electrical equipment provided by an embodiment of the present invention. As Figure 3 shown, this method includes the following steps:

[0090] S310. Determine the optimal frequency combination according to the inherent frequency characteristics of the electrical equipment to be tested and the characteristic of minimizing signal superposition interference.

[0091] S320. Generate multi-frequency excitation signals corresponding to the optimal frequency combination and apply the multi-frequency excitation signals to the electrical equipment to be tested.

[0092] S330. Collect the current signal and voltage signal on the electrical equipment to be tested under the multi-frequency excitation signal.

[0093] S340. Normalize the current signal and voltage signal.

[0094] Among them, the current signal and the voltage signal are normalized, specifically as follows:

[0095]

[0096] Among them, v[m] represents the normalized voltage signal or current signal, u[m] represents the sampled voltage signal or current signal, min(u) represents the minimum value of the signal u[m], max(u) represents the maximum value of the signal u[m], and m represents the index of the sampling point;

[0097] The core of normalizing the current signal and the voltage signal in this embodiment is to compress the signal values of all sampled current signals or voltage signals into the range of [0, 1]. By calculating the maximum and minimum values of the voltage signal or current signal, the absolute size difference of the signal amplitude is eliminated, and the relative change trend of the signal is retained, which can improve the robustness of the data analysis process and make the subsequent analysis more stable and accurate; at the same time, regardless of the range of the signal amplitude, by normalizing the current signal and the voltage signal with this method, the test method is applicable to different types of measurement devices and test scenarios.

[0098] Of course, in some embodiments, before normalizing the current signal and the voltage signal, it also includes: preprocessing the current signal and the voltage signal in the time domain through a low-pass filter; through the preprocessing of the voltage data and the current data, using the low-pass filter to filter out high-frequency noise and environmental interference signals to ensure that the collected signals are smoother and more stable. The cut-off frequency of the low-pass filter is set to the upper limit of the frequency range of the multi-frequency excitation signal to retain the effective signal components and remove the high-frequency interference components at the same time. Provide high-quality data for subsequent data analysis, such as frequency-domain filtering transformation or time-domain integral operation, and further improve the measurement accuracy and anti-interference ability of the DC resistance test. That is, preliminary signal cleaning is completed at the sampling stage, which can effectively cope with electromagnetic interference and other noise sources in a complex measurement environment.

[0099] S350. Perform frequency-domain filtering processing on the normalized current signal and voltage signal.

[0100] Specifically, performing frequency-domain filtering processing on the current signal and the voltage signal includes: performing frequency-domain processing on the current signal and the voltage signal based on the Fourier processing algorithm; performing low-pass filtering processing on the current signal and the voltage signal after frequency-domain processing based on the cut-off frequency. Specifically, based on the cut-off frequency, a low-pass filter is used to remove high-frequency noise and only retain low-frequency or DC components. In the spectrum, the DC component corresponds to the 0Hz frequency point, and the low-frequency component is in the lower frequency range. Applying an appropriate cut-off frequency (such as below 10Hz) for filtering can extract the required components.

[0101] S360. Perform time-domain integration processing on the current signal and voltage signal after frequency-domain filtering processing to determine the DC resistance.

[0102] Specifically, based on the inverse Fourier processing algorithm, perform time-domain processing on the current signal and voltage signal after low-pass filtering; perform integration processing on the current signal and voltage signal after time-domain processing to determine the DC resistance component.

[0103] It should be noted that after determining the DC resistance, the DC resistance can also be measured multiple times in chronological order to generate a time-varying trend curve of the DC resistance, which is used to observe the fluctuation of the resistance value over time. This trend curve can reflect the change of the resistance characteristics of the measured object in different time periods, helping to judge whether there is an abnormal phenomenon of resistance drift; thus, the electrical fault characteristics of the electrical equipment to be measured can be comprehensively evaluated according to the DC resistance and the change rate of the DC resistance.

[0104] In this embodiment, by performing normalization processing on the current signal and voltage signal before the frequency-domain filtering processing of the current signal and voltage signal, preliminary signal cleaning is completed at the sampling stage, which can effectively cope with electromagnetic interference and other noise sources in a complex measurement environment, and further improve the overall measurement accuracy and anti-interference ability of the DC resistance test. At the same time, after determining the DC resistance, the electrical fault characteristics of the electrical equipment to be measured can be comprehensively evaluated according to the measured DC resistance and the change rate of the DC resistance, thus improving the diagnostic efficiency.

[0105] The embodiment of the present invention also provides a DC resistance test device for an electrical equipment; the DC resistance test device for an electrical equipment provided by the embodiment of the present invention can execute the DC resistance test method for an electrical equipment provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects for executing the method. Figure 4 It is a schematic structural diagram of a DC resistance test device for an electrical equipment provided by an embodiment of the present invention; as shown in Figure 4 As shown, the DC resistance test device for an electrical equipment includes:

[0106] An optimal frequency combination determination module 10, configured to determine an optimal frequency combination according to the inherent frequency characteristics of the electrical equipment to be tested and the characteristic of minimizing signal superposition interference;

[0107] An excitation signal generation module 20, configured to generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical equipment to be tested;

[0108] An acquisition module 30, configured to acquire the current signal and voltage signal on the electrical equipment to be tested under the multi-frequency excitation signal;

[0109] A processing module 40, configured to perform time-domain integration processing on the current signal and voltage signal to determine the DC resistance component.

[0110] Optionally, the DC resistance testing device for the electrical equipment further includes: a frequency-domain filtering processing module, configured to perform frequency-domain filtering processing on the current signal and the voltage signal before performing time-domain integration processing on the current signal and the voltage signal to determine the DC resistance component.

[0111] Optionally, the DC resistance testing device for the electrical equipment further includes: a normalization processing module, configured to perform normalization processing on the current signal and the voltage signal before performing frequency-domain filtering processing on the current signal and the voltage signal.

[0112] Optionally, the optimal frequency combination determination module 10 includes:

[0113] A weight unit, configured to determine the interference weight between each frequency pair based on all frequency pairs;

[0114] A preset frequency combination determination unit, configured to select each frequency pair with an interference weight less than a preset interference weight as a preset frequency combination;

[0115] An optimal frequency combination determination unit, configured to determine an optimal frequency combination based on the inherent frequency characteristics of the electrical equipment to be tested and the preset frequency combination.

[0116] Optionally, the excitation signal generation module 20 includes:

[0117] A generation unit, configured to set the signal amplitude and the signal linear increment value for each frequency on the optimal frequency combination according to the characteristics of the electrical equipment to be tested to generate sine signals for each frequency;

[0118] A superimposing unit, configured to superimpose the sine signals for each frequency to determine a multi-frequency excitation signal.

[0119] Optionally, the frequency-domain filtering processing module includes:

[0120] A frequency-domain processing unit, configured to perform frequency-domain processing on the current signal and the voltage signal based on the Fourier processing algorithm;

[0121] A filtering processing unit, configured to perform low-pass filtering processing on the current signal and the voltage signal after frequency-domain processing based on a cut-off frequency.

[0122] Optionally, the processing module 40 includes:

[0123] A time-domain processing unit, configured to perform time-domain processing on the current signal and the voltage signal after low-pass filtering based on the inverse Fourier processing algorithm;

[0124] An integration processing unit, configured to perform integration processing on the current signal and the voltage signal after time-domain processing to determine the DC resistance component.

[0125] An embodiment of the present invention also provides an electronic device. Figure 5 Figure 5 is a schematic structural diagram of an electronic device provided by an embodiment of the present invention. The electronic device is intended to represent various forms of digital computers, such as, embedded computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as, personal digital processors, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are only examples and are not intended to limit the implementation of the present invention described and / or claimed herein.

[0126] As Figure 5 shown, the electronic device 01 includes at least one processor 11, and a memory communicatively connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc. The memory stores a computer program executable by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 into the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 100 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. The input / output (I / O) interface 15 is also connected to the bus 14.

[0127] Multiple components in the electronic device 01 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a magnetic disk, an optical disc, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 100 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0128] The processor 11 can be various general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the processor 11 include but are not limited to a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as a method for testing the DC resistance of an electrical device.

[0129] In some embodiments, a method for testing the DC resistance of an electrical device can be implemented as a computer program tangibly embodied in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 01 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the method for testing the DC resistance of an electrical device described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform a method for testing the DC resistance of an electrical device by any other suitable means (e.g., by means of firmware).

[0130] The various embodiments of the systems and techniques described above in this document can be implemented in digital electronic circuitry, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SOCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special-purpose or general-purpose programmable processor that receives data and instructions from a storage system, at least one input device, and at least one output device, and transmits the data and instructions to the storage system, the at least one input device, and the at least one output device.

[0131] The computer programs for implementing the methods of the present invention can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when the computer programs are executed by the processor, the functions / operations specified in the flowchart and / or block diagram are implemented. The computer programs can be executed entirely on the machine, partially on the machine, as a stand-alone software package partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0132] In the context of the present invention, a computer-readable storage medium can be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer-readable storage medium can include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any suitable combination of the foregoing. Alternatively, the computer-readable storage medium can be a machine-readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0133] In order to provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, speech input, or tactile input).

[0134] The systems and techniques described herein can be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer having a graphical user interface or a web browser through which the user can interact with an implementation of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local area network (LAN), wide area network (WAN), blockchain network, and the Internet.

[0135] A computing system may include a client and a server. The client and the server are generally far from each other and usually interact via a communication network. The relationship between the client and the server is created by computer programs running on respective computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or a cloud host, which is a host product in the cloud computing service system, solving the defects of difficult management and weak business scalability existing in traditional physical hosts and VPS services.

[0136] It should be understood that various forms of the processes shown above can be used, with steps reordered, added, or deleted. For example, the steps recited in the present invention can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of the present invention can be achieved, and no limitation is made herein.

[0137] The above specific embodiments do not constitute a limitation to the protection scope of the present invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

[0138] Note that the above is only a preferred embodiment of the present invention and the technical principles applied. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments only. Without departing from the concept of the present invention, more other equivalent embodiments can be included, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A method for measuring the DC resistance of an electrical device, characterized in that, Including: Determine the optimal frequency combination according to the inherent frequency characteristics of the electrical device to be tested and the characteristic of minimizing signal superposition interference; Generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical device to be tested; Collect the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal; Perform time-domain integration processing on the current signal and the voltage signal to determine the DC resistance.

2. The DC resistance testing method for the electrical equipment according to claim 1, characterized in that Before performing time-domain integration processing on the current signal and the voltage signal to determine the DC resistance, it further includes: Perform frequency-domain filtering processing on the current signal and the voltage signal.

3. The method for testing the DC resistance of the electrical equipment according to claim 2, characterized in that, Before performing frequency-domain filtering processing on the current signal and the voltage signal, it further includes: Perform normalization processing on the current signal and the voltage signal.

4. The method for testing the DC resistance of the electrical equipment according to claim 1, characterized in that, Determine the optimal frequency combination according to the inherent frequency characteristics of the electrical device to be tested and the signal superposition interference characteristics, including: Based on all frequency pairs, determine the interference weight between each of the frequency pairs; Select each of the frequency pairs corresponding to the interference weight less than the preset interference weight as the preset frequency combination; Based on the inherent frequency characteristics of the electrical device to be tested and the preset frequency combination, determine the optimal frequency combination.

5. The method for testing the DC resistance of the electrical equipment according to claim 1, wherein Generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical device to be tested, including: According to the characteristics of the electrical device to be tested, set the signal amplitude and signal linear increment value for each frequency in the optimal frequency combination to generate each frequency sine signal; Superimpose each frequency sine signal to determine the multi-frequency excitation signal.

6. The method for testing the DC resistance of an electrical device according to claim 2, characterized in that, Perform frequency-domain filtering processing on the current signal and the voltage signal, including: Based on the Fourier processing algorithm, perform frequency-domain processing on the current signal and the voltage signal; Based on the cut-off frequency, perform low-pass filtering processing on the current signal and the voltage signal after frequency-domain processing.

7. The method for testing the DC resistance of the electrical equipment according to claim 6, characterized in that, Perform time-domain integration processing on the current signal and the voltage signal to determine the DC resistance component, including: Based on the inverse Fourier processing algorithm, perform time-domain processing on the current signal and the voltage signal after low-pass filtering; Perform integration processing on the current signal and the voltage signal after time-domain processing to determine the DC resistance component.

8. A DC resistance testing device for an electrical equipment, characterized in that Including: An optimal frequency combination determination module, configured to determine the optimal frequency combination according to the inherent frequency characteristics of the electrical device to be tested and the characteristic of minimizing signal superposition interference; An excitation signal generation module, configured to generate a multi-frequency excitation signal corresponding to the optimal frequency combination and apply the multi-frequency excitation signal to the electrical device to be tested; A collection module, configured to collect the current signal and voltage signal on the electrical device to be tested under the multi-frequency excitation signal; A processing module, configured to perform time-domain integration processing on the current signal and the voltage signal to determine the DC resistance component.

9. An electronic device, characterized in that, The electronic device includes: At least one processor; and A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and when the computer program is executed by the at least one processor, the at least one processor is enabled to execute the method for testing the DC resistance of the electrical device according to any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for implementing the method for testing the DC resistance of the electrical device according to any one of claims 1-7 when executed by a processor.

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