Microwave device test method and test system

Abstract

The invention discloses a microwave device testing method and a microwave device testing system. The microwave device testing method comprises the following steps: putting at least one microwave device into a low-temperature test box, adjusting the temperature of the low-temperature test box to a first preset temperature, and keeping the temperature for a first preset time until the temperature of the microwave device reaches a preset target temperature; taking out the target microwave device from the low-temperature test box, and connecting the target microwave device with the test fixture; placing the connected target microwave device and the test clamp in a heat preservation device of a heat flow meter; setting the heat preservation temperature of the heat preservation device of the heat flow meter as a preset target temperature, and testing the electrical performance of the target microwave device. According to the technical scheme, it can be ensured that the temperature deviation of the target microwave device in the testing process is small, the risk of testing failure when the microwave device is tested in the low-temperature environment is reduced, and the reliability of low-temperature testing of the microwave device is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of microwave devices, and in particular, to a method and a system for testing microwave devices. Background Art

[0002] The plastic package of microwave devices is usually a ceramic substrate with a metal cover. The ceramic package of circular small outline series microwave devices is limited by size, and its shell wall thickness is usually thin. In order to evaluate the performance of microwave devices under extreme conditions and ensure the reliability of microwave devices in aerospace, deep space exploration and other extreme applications, it is necessary to conduct low-temperature tests on microwave devices.

[0003] In the prior art, the steps for low-temperature testing of microwave devices are mainly to cool the microwave devices first and then conduct tests. However, this testing method does not consider the temperature fluctuations during the cooling process, the changes in device materials, and the influence of environmental factors, resulting in low reliability of the tests. Summary of the Invention

[0004] The present invention provides a method and a system for testing microwave devices to improve the reliability of testing microwave devices in a low-temperature environment.

[0005] According to one aspect of the present invention, there is provided a method for testing a microwave device, including:

[0006] Put at least one microwave device into a low-temperature test chamber, adjust the temperature of the low-temperature test chamber to a first preset temperature, and keep it warm for a first preset duration until the temperature of the microwave device reaches a preset target temperature;

[0007] Take out the target microwave device from the low-temperature test chamber and connect the target microwave device to a test fixture;

[0008] Place the connected target microwave device and the test fixture into the heat preservation device of a heat flux meter;

[0009] Set the heat preservation temperature of the heat preservation device of the heat flux meter to the preset target temperature and test the electrical performance of the target microwave device.

[0010] According to another aspect of the present invention, there is provided a system for testing a microwave device, including: a microwave device to be tested, a control unit, a low-temperature test chamber, a test fixture, and a heat flux meter. The control unit is respectively connected to the low-temperature test chamber, the test fixture, and the heat flux meter;

[0011] Before the electrical performance test, the microwave device to be tested is placed in the low-temperature test chamber, and the low-temperature test chamber is used to cool the microwave device to a target preset temperature;

[0012] During the electrical performance test, the test fixture is electrically connected to the target microwave device to be tested for testing the electrical performance of the target microwave device;

[0013] During the electrical performance test, the test fixture and the target microwave device are placed in the heat insulation device of the heat flow meter, and the heat flow meter is used to maintain the temperature of the target microwave device and the test fixture at the target preset temperature;

[0014] The control unit is used to execute the microwave device test method according to any embodiment of the present invention.

[0015] The technical solution of the embodiment of the present invention cools the microwave device to the preset target temperature through a low-temperature test chamber, and then ensures that the target microwave device and the test fixture are maintained at the preset target temperature during the test through the heat insulation device of the heat flow meter. The present invention can ensure that the temperature deviation of the target microwave device during the test is small, reduce the risk of test failure when the microwave device is tested in a low-temperature environment, and improve the reliability of the low-temperature test of the microwave device.

[0016] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present invention, nor is it used to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0018] Figure 1 It is a flowchart of a microwave device test method provided by an embodiment of the present invention;

[0019] Figure 2 It is a flowchart of another microwave device test method provided by an embodiment of the present invention;

[0020] Figure 3 It is a flowchart of yet another microwave device test method provided by an embodiment of the present invention;

[0021] Figure 4 It is a flowchart of still another microwave device test method provided by an embodiment of the present invention;

[0022] Figure 5 It is a schematic diagram of the electrical performance test results when the working voltage of the embodiment of the present invention is 4.5V;

[0023] Figure 6 Schematic diagram of the electrical performance test results when the operating voltage is 5.0V provided by the embodiments of the present invention;

[0024] Figure 7 Schematic diagram of the electrical performance test results when the operating voltage is 5.5V provided by the embodiments of the present invention. Detailed implementation manners

[0025] In order to enable those skilled in the art to better understand the solution of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0026] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present invention described herein can be implemented in an order different from those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0027] Figure 1 Flowchart of a microwave device testing method provided by the embodiments of the present invention. This embodiment is applicable to testing microwave devices at low temperatures, and this method can be executed by a microwave device testing system. As Figure 1 shown, this method includes:

[0028] S110. Place at least one microwave device in a low-temperature test chamber, adjust the temperature of the low-temperature test chamber to a first preset temperature, and keep it warm for a first preset duration until the temperature of the microwave device reaches a preset target temperature.

[0029] Specifically, microwave devices refer to a type of electronic components that operate in the microwave frequency band, typically in the frequency range of 1 GHz to 300 GHz. Microwave devices are widely used in communication, radar, navigation, radio frequency (RF), and other wireless technologies. Common types of microwave devices include microwave amplifiers, mixers, detectors, and attenuators, etc. A low-temperature test chamber refers to a device used to test the performance of materials, devices, or systems in a low-temperature environment, which can provide stable and adjustable low-temperature conditions, usually adjustable to a temperature of -60 °C or lower. The first preset temperature refers to the target temperature set in the low-temperature test, which is used to evaluate the performance of microwave devices in a low-temperature environment. Exemplarily, the first preset temperature can be -55 °C. The first preset duration refers to the time for which the microwave device is kept warm in the low-temperature test chamber. Within the first preset duration, the microwave device can cool down to the preset target temperature. Exemplarily, the first preset duration is 30 minutes. The preset target temperature refers to the specific temperature that is expected for the microwave device to reach during the low-temperature test. Exemplarily, the preset target temperature is equal to the first preset temperature, both being -55 °C.

[0030] In the embodiments of the present invention, by using a low-temperature test chamber to bring the temperature of one or more microwave devices to the preset target temperature, the test temperature of the microwave devices can be ensured, so as to perform further performance evaluation and reliability testing.

[0031] S120. Take out the target microwave device from the low-temperature test chamber and connect the target microwave device to the test fixture.

[0032] Specifically, a test fixture refers to a tool or device used to fix and connect a device under test to a test equipment during the test process.

[0033] In the embodiments of the present invention, the test fixture can reliably connect the microwave device to the test equipment, ensuring the integrity and effectiveness of signal transmission.

[0034] S130. Place the connected target microwave device and test fixture into the heat-insulating device of the heat flux meter.

[0035] Specifically, the target microwave device refers to the microwave device to be tested among the microwave devices in the low-temperature test chamber. A heat flux meter refers to an instrument for measuring heat conduction, heat dissipation performance, and heat flux. The heat-insulating device refers to a device or structure in the heat flux meter used to maintain a specific temperature range and reduce heat dissipation.

[0036] In the embodiments of the present invention, the heat-insulating device of the heat flux meter can keep the target microwave device and the test fixture warm, ensuring the stability and accuracy of the test process.

[0037] S140. Set the heat-insulating temperature of the heat-insulating device of the heat flux meter to the preset target temperature and test the electrical performance of the target microwave device.

[0038] Specifically, electrical performance refers to the electrical characteristics and behaviors of microwave devices under specific voltage and current conditions. Exemplarily, electrical performance may include input impedance, output power, and / or noise figure, etc.

[0039] Exemplarily, the insulation temperature of the insulation device of the heat flux meter can be set to a preset target temperature first, and then the target microwave device can be transferred into the insulation device, which can reduce the temperature change or temperature shock of the target microwave device. It is also possible to transfer the target microwave device into the insulation device first, and then set the insulation temperature of the insulation device of the heat flux meter to the preset target temperature, which can reduce energy consumption.

[0040] In the embodiments of the present invention, by performing electrical performance tests in an insulated state, the stability and consistency of the target microwave device can be better maintained, ensuring the accuracy and reliability of the test results.

[0041] The technical solution of the embodiments of the present invention cools the microwave device to the preset target temperature through a low-temperature test chamber, and then ensures that the target microwave device and the test fixture are maintained at the preset target temperature during the test through the insulation device of the heat flux meter. The present invention can ensure that the temperature deviation of the target microwave device during the test is small, reduce the risk of test failure when the microwave device is tested in a low-temperature environment, and improve the reliability of the low-temperature test of the microwave device.

[0042] Figure 2 It is a flowchart of another microwave device test method provided by the embodiments of the present invention. On the basis of the above embodiments, as Figure 2 shown, optionally, the method includes:

[0043] S210. Put n microwave devices into an anti-static container, and put the anti-static container containing n microwave devices into a low-temperature test chamber; where n is a positive integer greater than or equal to 1.

[0044] Specifically, an anti-static container refers to a container or packaging specially designed to protect sensitive electronic devices from electrostatic discharge. Anti-static containers usually have excellent anti-static performance, can effectively prevent the accumulation of static electricity, and thus reduce the potential damage caused by static electricity to the microwave devices or other electronic components stored inside.

[0045] In the embodiments of the present invention, the anti-static container can effectively protect multiple microwave devices from electrostatic discharge damage, reduce the risk of device failure, and ensure the reliability of their performance. Putting n microwave devices into the anti-static container and then into the low-temperature test chamber can achieve simultaneous cooling of multiple microwave devices, improving work efficiency.

[0046] S220. Adjust the temperature of the low-temperature test chamber to the first preset temperature and keep it warm for the first preset duration until the temperature of the microwave device reaches the preset target temperature.

[0047] S230. Take out the anti-static container containing n - i + 1 microwave devices from the low-temperature test chamber; where i is a positive integer and 1 ≤ i ≤ n.

[0048] Specifically, if i - 1 microwave devices have been detected in the heat flow meter, there are still n - i + 1 microwave devices in the anti-static container.

[0049] S240. Take out the i-th microwave device from the anti-static container and electrically connect it to the test fixture, with the pins of the i-th microwave device connected to the connection ports of the test fixture in one-to-one correspondence.

[0050] Specifically, the pins refer to the metal extension parts on the microwave device for electrical connection. The connection ports refer to the contacts on the test fixture for connecting the pins to enable electrical connection with the microwave device during the test.

[0051] In the embodiment of the present invention, connecting the pins of the i-th microwave device to the connection ports of the test fixture in one-to-one correspondence can ensure the stability of the microwave device during the test, reduce signal interference or loss caused by poor contact, and thus obtain reliable test results.

[0052] S250. Put the anti-static container containing n - i microwave devices back into the low-temperature test chamber.

[0053] In the embodiment of the present invention, after taking out the i-th microwave device from the anti-static container and putting the anti-static container containing n - i microwave devices back into the low-temperature test chamber, it can ensure that the remaining i - 1 microwave devices are maintained at the preset target temperature, prepare for the electrical performance test of the next microwave device, and reduce the waiting time due to device cooling in the future.

[0054] S260. Place the connected target microwave device and the test fixture into the heat preservation device of the heat flow meter.

[0055] S270. Set the heat preservation temperature of the heat preservation device of the heat flow meter to the preset target temperature and test the electrical performance of the target microwave device.

[0056] The technical solution of the embodiment of the present invention can avoid the interference of static electricity on the device by putting n microwave devices into the anti-static container and then into the low-temperature test chamber, thereby improving the stability and reliability of the test. In addition, cooling n microwave devices simultaneously can reduce the waiting time and improve the detection efficiency.

[0057] Figure 3This is a flowchart of another microwave device testing method provided by an embodiment of the present invention. On the basis of the above embodiments, as Figure 3 shown, the microwave device testing method includes:

[0058] S310. Place at least one microwave device in a low-temperature test chamber, adjust the temperature of the low-temperature test chamber to a first preset temperature, and keep it warm for a first preset duration until the temperature of the microwave device reaches a preset target temperature.

[0059] S320. Take out the target microwave device from the low-temperature test chamber and connect the target microwave device to a test fixture.

[0060] S330. Place the connected target microwave device and test fixture into the heat-insulating device of a heat flux meter.

[0061] S340. Set the heat-insulating temperature of the heat flux meter to the preset target temperature and perform electrical performance testing on the target microwave device.

[0062] Specifically, the time for performing electrical performance testing on each microwave device is 2 - 4 minutes.

[0063] S350. Pause the electrical performance testing every second preset duration and perform defrosting operation on the test fixture.

[0064] Specifically, the second preset duration refers to a time interval preset in advance according to the frosting time of the test fixture during the testing process. Exemplarily, under the condition of -55°C, the test fixture starts to frost within 10 - 12 minutes, so the second preset duration can be set to 10 minutes or 12 minutes. The defrosting operation refers to the process of removing the accumulated frost or moisture on the surface of the test fixture or other equipment. Frost will cause moisture to condense on the surface of the test fixture, resulting in poor contact between the surface of the test fixture and the microwave device, thereby causing impedance changes in the electrical connection and affecting the accuracy of the test results.

[0065] In the embodiment of the present invention, through regular defrosting operations, the negative impact of frost on electrical performance testing can be prevented, ensuring the reliability of the testing.

[0066] S360. After the defrosting operation ends, continue to perform electrical performance testing on the target microwave device.

[0067] An optional implementation manner, S360. After the defrosting operation ends, continue to perform electrical performance testing on the target microwave device, which may include: after the defrosting operation ends, take out the target microwave device from the low-temperature test chamber; electrically connect the target microwave device to the defrosted test fixture and continue to perform electrical performance testing on the target microwave device.

[0068] Specifically, when the temperature of the heat flux meter is stabilized at a preset target temperature, the target microwave device and the test fixture are stabilized in the heat flux meter for a fourth preset duration. At the same time, within the fourth preset duration, the target microwave device is properly connected to the test fixture. Exemplarily, the fourth preset duration can be 90 seconds.

[0069] In the embodiments of the present invention, taking out the target microwave device from the low-temperature test chamber can ensure that subsequent tests are carried out as soon as possible after defrosting, thereby reducing the time the microwave device stays in different temperature environments, and further reducing the impact of temperature changes on its performance.

[0070] The technical solution of the embodiments of the present invention can maintain the stability and accuracy of the test environment by regularly defrosting the test fixture, which helps to improve the reliability and effectiveness of the test and avoid test errors caused by environmental factors.

[0071] Figure 4 It is a flowchart of another microwave device test method provided by the embodiments of the present invention. On the basis of the above embodiments, as Figure 4 shown, the microwave device test method includes:

[0072] S410. Put at least one microwave device into a low-temperature test chamber, adjust the temperature of the low-temperature test chamber to a first preset temperature, and keep it warm for a first preset duration until the temperature of the microwave device reaches the preset target temperature.

[0073] S420. Take out the target microwave device from the low-temperature test chamber and connect the target microwave device to the test fixture.

[0074] S430. Place the connected target microwave device and test fixture into the heat preservation device of the heat flux meter.

[0075] S440. Set the heat preservation temperature of the heat flux meter to the preset target temperature and perform electrical performance tests on the target microwave device.

[0076] S450. Pause the electrical performance test every second preset duration.

[0077] S460. Put the target microwave device connected to the test fixture back into the low-temperature test chamber, and the temperature of the low-temperature test chamber is the first preset temperature.

[0078] In the embodiments of the present invention, the low-temperature test chamber can provide a stable low-temperature environment. Putting the target microwave device connected to the test fixture back into the low-temperature test chamber can ensure that the temperature of the target microwave device does not change significantly, providing a basis for the smooth progress of subsequent tests.

[0079] S470. Perform a defrosting operation on the test fixture, and the operation duration of the defrosting operation is the third preset duration.

[0080] Specifically, the third preset duration refers to the operation duration of the defrosting operation defined in advance. During the third preset duration, the frost in the test fixture will be completely removed. Exemplarily, the third preset duration is 15 minutes.

[0081] In the embodiment of the present invention, defrosting the test fixture can avoid the situation of stress mismatch between the test fixture and the target microwave device, thereby preventing the properties of the microwave device from changing and ensuring the effectiveness of the test.

[0082] Optionally, a defrosting operation is performed on the test fixture by an air gun of an air compressor.

[0083] Specifically, the air gun of the air compressor refers to a tool connected to the air compressor, which is mainly used for operations such as cleaning, dust removal, and defrosting using compressed air. Its working principle is that the air compressor inhales and compresses air, and then transports it to the air gun through a pipeline. After the air gun is started, compressed air is released to generate a strong and concentrated air flow to remove the frost in the test fixture.

[0084] In the embodiment of the present invention, performing a defrosting operation on the test fixture by an air gun of an air compressor can quickly and effectively remove the frost layer on the surface of the fixture, significantly shorten the time required for defrosting, and ensure the accuracy of the test process.

[0085] S480. After the defrosting operation ends, continue to perform an electrical performance test on the target microwave device.

[0086] The technical solution provided by the embodiment of the present invention places the target microwave device connected to the test fixture back into the low-temperature test chamber before defrosting, so that it will not be damaged or its performance will not decline due to instantaneous temperature changes. At the same time, a regular defrosting operation is performed on the test fixture by an air gun of an air compressor to avoid problems such as frosting of the test fixture. During the test, first verify the electrical performance of the test device through a vector network analyzer. After the electrical performance verification is completed, then perform a structural analysis and a board-level verification to ensure the reliability of the device. That is, the present invention improves the reliability and accuracy of the microwave device test.

[0087] After performing an electrical performance test on the target microwave device, the structure of the target microwave device can also be analyzed by devices such as a high-power microscope, an X-ray machine, and a bonding shear system, including analyzing the housing, internal interconnections, internal environment, and chips of the device. Among them, the housing analysis includes analyzing the pins, substrate, cover plate, and connection interface; the internal interconnection analysis includes bonding analysis; the internal environment analysis includes detecting whether there are foreign objects; the chip analysis includes analyzing the chip connection method and the structure of the chip itself. Specifically, the analysis elements for performing a structural analysis on the target microwave device are shown in Table 1 below:

[0088] Table 1: Microwave device structure analysis elements

[0089]

[0090] After the structure is analyzed, a microwave amplifier board-level function verification system can also be built through a microwave signal source, a spectrum analyzer, a programmable power supply, and a microwave amplifier verification device. The programmable power supply provides a first test voltage for the amplifier. At the first test voltage, the output signal frequency and power of the amplifier are tested by the spectrum analyzer to verify the microwave signal amplification function of the microwave amplifier. Then, the programmable power supply provides a second test voltage, a third test voltage, and a fourth test voltage for the amplifier respectively, and the amplification function of the amplifier is tested using the spectrum analyzer. Also, by monitoring the operating current of the amplifier under different test voltages, it is verified whether the electrical performance of the target microwave amplifier is normal under different voltages.

[0091] Taking the SX323MQ broadband amplifier as an example, an input signal with frequencies of 1268 MHz and 1588 MHz and a power of -20 dBm is provided for the amplifier by the microwave signal source, and a working voltage of 5.0 V is provided for the amplifier by the programmable power supply to verify the microwave signal amplification function of the SX323MQ broadband amplifier.

[0092] After that, an input signal with a frequency of 1268 MHz and a power of -20 dBm is provided for the SX323MQ broadband amplifier by the microwave signal source, and working voltages of 4.5 V, 5.0 V, and 5.5 V are provided for the amplifier by the programmable power supply respectively. The electrical performance test results of the SX323MQ broadband amplifier are shown in Table 2 below:

[0093] Table 2: Electrical performance test results of the SX323MQ broadband amplifier

[0094]

[0095] Figure 5 It is a schematic diagram of the electrical performance test results when the working voltage is 4.5 V provided by the embodiment of the present invention. Figure 6 It is a schematic diagram of the electrical performance test results when the working voltage is 5.0 V provided by the embodiment of the present invention. Figure 7 It is a schematic diagram of the electrical performance test results when the working voltage is 5.5 V provided by the embodiment of the present invention. On the basis of the above embodiments, as Figure 5 、 Figure 6 and Figure 7 shown, when the electrical performance tests are carried out under the conditions of 4.5 V, 5.0 V, and 5.5 V, the maximum amplification frequency amplitudes of the SX323MQ broadband amplifier correspond to the first peak point P1, the second peak point P2, and the third peak point P3 respectively. Combining Figure 5 、 Figure 6 、 Figure 7As can be seen from Table 2, the signal amplification function of the broadband amplifier is normal.

[0096] In addition, the thermal environment adaptability of the target microwave device can also be verified through temperature cycle tests. Taking the SX323MQ type broadband amplifier as an example, the experimental conditions for the temperature cycle test are as shown in Table 3 below:

[0097] Table 3 Temperature cycle test conditions:

[0098]

[0099] As can be seen from Table 3 above, the temperature range of the experiment is -40°C - 75°C; the temperature error is ±2°C at high temperature and ±3°C at low temperature; the heating rate is greater than or equal to 10°C / min, and the cooling rate is greater than or equal to ≥10°C / min. When controlling the temperature change, the one-chamber method should be used as much as possible. If the two-chamber method is used, ensure that the transfer time of the test device is no more than 3 minutes; the time for one cycle is 1.5 hours; the holding time at high temperature is greater than or equal to 25 minutes, and the holding time at low temperature is greater than or equal to 35 minutes; the number of cycles is 10 times. Among them, high temperature means the temperature is greater than or equal to 75°C, and low temperature means the temperature is less than or equal to -40°C.

[0100] The embodiment of the present invention also provides a microwave device test system, which includes: a microwave device to be tested, a control unit, a low-temperature test chamber, a test fixture, and a heat flux meter. The control unit is respectively connected to the low-temperature test chamber, the test fixture, and the heat flux meter; before the electrical performance test, the microwave device to be tested is placed in the low-temperature test chamber, and the low-temperature test chamber is used to cool the microwave device to be tested to the target preset temperature; during the electrical performance test, the test fixture is electrically connected to the target microwave device to be tested and is used to test the electrical performance of the target microwave device; during the electrical performance test, the test fixture and the target microwave device are placed in the heat preservation device of the heat flux meter, and the heat flux meter is used to keep the temperature of the target microwave device and the test fixture at the target preset temperature; the control unit is used to execute the microwave device test method provided in any embodiment of the present invention and has the corresponding functional modules and beneficial effects of the execution method.

[0101] Optionally, on the basis of the above embodiments, the microwave device test system further includes: an anti-static container; before the electrical performance test, the microwave device to be tested is placed in the anti-static container, and the anti-static container is placed in the low-temperature test chamber. The anti-static container is used to suppress the static electricity on the microwave device to be tested.

[0102] Optionally, on the basis of the above embodiments, the microwave device test system further includes: a defrosting device; the defrosting device is connected to the control unit, and during the electrical performance test, the defrosting device is used to defrost the test fixture.

[0103] The microwave device testing system provided by the embodiments of the present invention can execute the microwave device testing method provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects for executing the method.

[0104] It should be understood that various forms of the processes shown above can be used, steps can be reordered, added or deleted. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solutions of the present invention can be achieved, which are not limited herein.

[0105] The above specific embodiments do not constitute a limitation on the protection scope of the present invention. Those skilled in the art should understand that various modifications, combinations, sub - combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A method for testing a microwave device, characterized in that, Including: Put at least one microwave device into a low-temperature test chamber, adjust the temperature of the low-temperature test chamber to a first preset temperature, and keep it warm for a first preset duration until the temperature of the microwave device reaches a preset target temperature; Take out the target microwave device from the low-temperature test chamber, and connect the target microwave device to a test fixture; Place the connected target microwave device and the test fixture into the heat preservation device of a heat flux meter; Set the heat preservation temperature of the heat preservation device of the heat flux meter to the preset target temperature, and test the electrical performance of the target microwave device.

2. The microwave device testing method according to claim 1, wherein, The step of putting at least one microwave device into a low-temperature test chamber, adjusting the temperature of the low-temperature test chamber to a first preset temperature, and keeping it warm for a first preset duration until the temperature of the microwave device reaches a preset target temperature includes: Put n microwave devices into an anti-static container, and put the anti-static container containing the n microwave devices into a low-temperature test chamber; where n is a positive integer greater than or equal to 1; Adjust the temperature of the low-temperature test chamber to a first preset temperature, and keep it warm for a first preset duration until the temperature of the microwave device reaches a preset target temperature.

3. The microwave device testing method according to claim 2, characterized in that, The step of taking out the target microwave device from the low-temperature test chamber and connecting the target microwave device to a test fixture includes: Take out the anti-static container containing n - i + 1 microwave devices from the low-temperature test chamber; where i is a positive integer and 1 ≤ i ≤ n; Take out the i-th microwave device from the anti-static container, and electrically connect it to the test fixture, and the pins of the i-th microwave device are connected to the connection ports of the test fixture one by one; Put the anti-static container containing n - i microwave devices back into the low-temperature test chamber.

4. The microwave device testing method according to claim 1, characterized in that The step of setting the heat preservation temperature of the heat preservation device of the heat flux meter to the preset target temperature and testing the electrical performance of the target microwave device includes: Set the heat preservation temperature of the heat flux meter to the preset target temperature, and conduct an electrical performance test on the target microwave device; Pause the electrical performance test every second preset duration, and perform a defrosting operation on the test fixture; After the defrosting operation ends, continue to conduct an electrical performance test on the target microwave device.

5. The microwave device testing method according to claim 4, characterized in that, The step of pausing the electrical performance test every second preset duration and performing a defrosting operation on the test fixture includes: Pause the electrical performance test every second preset duration; Put the target microwave device connected to the test fixture back into the low-temperature test chamber, and the temperature of the low-temperature test chamber is the first preset temperature; Perform a defrosting operation on the test fixture, and the operation duration of the defrosting operation is a third preset duration.

6. The microwave device testing method according to claim 5, wherein The step of performing a defrosting operation on the test fixture includes: Perform a defrosting operation on the test fixture through an air compressor air gun.

7. The microwave device testing method according to claim 4, characterized in that, The step of continuing to conduct an electrical performance test on the target microwave device after the defrosting operation ends includes: After the defrosting operation ends, take out the target microwave device from the low-temperature test chamber; Electrically connect the target microwave device to the defrosted test fixture, and continue to conduct an electrical performance test on the target microwave device.

8. A microwave device testing system, characterized in that, Including: A microwave device to be tested, a control unit, a low-temperature test chamber, a test fixture, and a heat flux meter, wherein the control unit is respectively connected to the low-temperature test chamber, the test fixture, and the heat flux meter; Before the electrical performance test, the microwave device to be tested is placed in the low-temperature test chamber, and the low-temperature test chamber is used to cool the microwave device to be tested to a target preset temperature; During the electrical performance test, the test fixture is electrically connected to the target microwave device to be tested and is used to test the electrical performance of the target microwave device; During the electrical performance test, the test fixture and the target microwave device are placed in the heat preservation device of the heat flux meter, and the heat flux meter is used to keep the temperature of the target microwave device and the test fixture at the target preset temperature; The control unit is used to execute the microwave device test method according to any one of claims 1-7.

9. The microwave device test system according to claim 8, characterized in that The microwave device test system further includes: an anti-static container; Before the electrical performance test, the microwave device to be tested is placed in the anti-static container, and the anti-static container is placed in the low-temperature test chamber. The anti-static container is used to suppress static electricity on the microwave device to be tested.

10. The microwave device testing system according to claim 8, wherein, The microwave device test system further includes: a defrosting device; The defrosting device is connected to the control unit, and during the electrical performance test, the defrosting device is used to defrost the test fixture.

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