Microwave multichannel product on-line calibration automatic test system and method thereof

Abstract

The invention discloses a microwave multichannel product on-line calibration automatic test system and a method thereof. The system comprises an incubator / airflow instrument, a PXI case, a test instrument, an industrial personal computer, a first program control calibration piece group, a second program control calibration piece group and a power supply, the first program control calibration piece group comprises a plurality of first program control calibration pieces; the second program control calibration piece group comprises a plurality of second program control calibration pieces; the tested piece comprises a plurality of groups of channels, and each group of channels comprises a radio frequency channel and a straight-through channel; each group of paths, the first program control calibration parts and the second program control calibration parts are in one-to-one correspondence; the PXI case comprises a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix; and the first PXI radio frequency switch matrix is connected with any first program control calibration piece in the first program control calibration piece group. According to the invention, rapid and accurate testing of normal-temperature, low-temperature and high-temperature radio frequency performance of a microwave multi-channel product can be realized.

Description

Technical Field

[0001] This application relates to the technical field of radio frequency testing, and particularly to an on-line calibration automatic test system and method for microwave multi-channel products. Background Art

[0002] With the development of microsystem integration technology, the efficient and accurate testing of microwave products has become increasingly urgent. The current general testing method for microwave multi-channel components is as follows: 1) Calibrate the radio frequency test link to eliminate the errors of cables, connectors, and switches; 2) Connect the device under test to the test link in sequence or switch the test link through a microwave switch; 3) Set the environmental temperature parameters; 4) Set the instrument test parameters; 4) Read the test results. Points to note during the testing process include impedance matching, temperature stability, cable loss, and shielding grounding, etc.

[0003] The disadvantage of this testing method is that errors introduced by cable bending, continuous multiple plugging and unplugging or microwave switch switching, and stress changes of the cable under environmental temperature during the testing process cannot be eliminated; secondly, the calibration process is carried out in a normal temperature environment, and the calibration coefficients used during high and low temperature environmental tests are generated under normal temperature conditions, so the resulting errors cannot be eliminated.

[0004] The prior art CN104459647A "A Microwave Multi-Channel Product Testing System" discloses a testing system in which a single-pole multi-throw switch array, a multi-select-one switch array, and multi-channel test pieces are placed inside a high and low temperature chamber, and a test control computer, test instruments, test signal sources, and switch matrix controllers are placed outside the high and low temperature chamber, which can significantly reduce the number of high-frequency test cables that need to be connected inside and outside the high and low temperature chamber.

[0005] The disadvantages of this testing method are as follows: (1) It cannot solve the errors in tests such as phase and amplitude caused by the bending of high-frequency test cables inside and outside the temperature chamber; (2) It cannot solve the temperature drift errors brought by test cables under different temperature conditions; (3) It cannot eliminate the phase, amplitude, and other test errors caused by inconsistent contacts during the switching of the single-pole multi-throw switch array and the multi-select-one switch array; (4) If the single-pole multi-throw switch array and the multi-select-one switch array are placed inside the high and low temperature chamber, it is required that the switch array has reliable working ability under high and low temperature conditions, and the system construction cost is greatly increased. Summary of the Invention

[0006] In view of this, this application provides an on-line calibration automatic test system and method for microwave multi-channel products, which can be applied to the automatic testing of the radio frequency performance of microwave products under different temperature conditions, and has the advantages of wide application range, high compatibility, no need to repeatedly disassemble and assemble cables, high reliability, high test accuracy, and high efficiency.

[0007] The present application discloses an on-line calibration automatic test system for a microwave multi-channel product, which includes an incubator / airflow meter, a PXI chassis, test instruments, an industrial control computer, a first group of programmable calibration components, a second group of programmable calibration components, and a power supply; the first group of programmable calibration components includes multiple first programmable calibration components; the second group of programmable calibration components includes multiple second programmable calibration components; the device under test includes multiple groups of channels, and each group of channels includes a radio frequency channel and a direct-through channel; each group of channels, the first programmable calibration component, and the second programmable calibration component correspond one by one; the PXI chassis includes a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix; the first PXI radio frequency switch matrix is connected to any one of the first programmable calibration components in the first group of programmable calibration components; the first programmable calibration component is connected to any one of the second programmable calibration components in the second group of programmable calibration components through the radio frequency channel or the direct-through channel in each group of channels; the second PXI radio frequency switch matrix is connected to any one of the second programmable calibration components in the second group of programmable calibration components; The test instruments are respectively connected to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix; the industrial control computer is respectively connected to the first group of programmable calibration components, the second group of programmable calibration components, and the incubator / airflow meter; the device under test, the first group of programmable calibration components, and the second group of programmable calibration components are all placed in the incubator / airflow meter, and the incubator / airflow meter is used to provide a temperature environment; the power supply is respectively connected to the device under test and the industrial control computer; the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix are both used to realize the programmable switching of different test channels of the microwave multi-channel product; the test instruments are used to test the radio frequency performance of the device under test; the industrial control computer is used to control the test instruments to test the device under test; the first group of programmable calibration components and the second group of programmable calibration components are used to on-line calibrate the radio frequency test link of the device under test to complete the radio frequency performance test of the device under test in different temperature environments; different temperature environments include high temperature, normal temperature, and low temperature.

[0008] Further, a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card is installed in the PXI chassis; the PCI-type IO control card in the industrial control computer is connected to the device under test and is used to control the working state of the device under test, and the working state includes the receiving state, the transmitting state, the attenuation state, and the phase shift state of the device under test; the serial port in the industrial control computer is used to control and obtain the temperature of the incubator / airflow meter so that the device under test works in different temperature states; the PXI control card is used to control the conduction and disconnection of the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix; the PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis and is used to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instruments and the power supply and controls the test instruments and the power supply through the IEEE488.2 protocol.

[0009] The present application also discloses an on-line calibration automatic test method for a microwave multi-channel product, which is applicable to the on-line calibration automatic test system for the microwave multi-channel product described above, and includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test. Step 2: The measurement and control software of the industrial control computer sends an instruction to the device under test to switch it to the through-through path. The measurement and control software of the industrial control computer sends an instruction to the test instrument to start the RF path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, short circuit, and through-through states to obtain calibration parameters and form a calibration file. Step 3: Repeat Step 1 and Step 2 until the calibration of all RF paths of the device under test is completed and the corresponding calibration files are formed. Step 4: The measurement and control software of the industrial control computer sends instructions to the power supply and the device under test to power on the device under test in accordance with the established power-on sequence and delay so that the device under test is in the working state. The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files of the corresponding test paths, and read the data of the test instrument to complete the normal temperature RF performance test of all paths of the device under test. Step 5: The measurement and control software of the industrial control computer sends instructions to the power supply and the device under test to power off the device under test in accordance with the established power-off sequence and delay so that the device under test is in the non-working state, and sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signals of the microwave multi-channel product. Step 6: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the device under test is located to a low temperature. After the duration of the low temperature reaches the required time of the device under test, repeat Step 2 to Step 3 until the calibration of all measured RF paths of the device under test in the low temperature state is completed and the corresponding calibration files are formed. Step 7: The measurement and control software of the industrial control computer sends commands to the power supply and the device under test, enabling the device under test to be powered on according to the established power-on sequence and delay, and putting the device under test into the working state. The measurement and control software of the industrial control computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieves the calibration file corresponding to the test path in the low-temperature environment, reads the data of the test instrument, and completes the low-temperature RF performance test of all paths of the device under test; Step 8: The measurement and control software of the industrial control computer sends commands to the power supply and the device under test through the GPIB and IO control cards to put the device under test into the non-working state according to the established power-off sequence and delay. The measurement and control software of the industrial control computer sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the device under test; Step 9: The measurement and control software of the industrial control computer sends commands to the temperature chamber / air flow meter to cool the device under test to room temperature and then take it out, and turn off each instrument and equipment to complete the RF performance test of the device under test in different temperature environments.

[0010] This application also discloses an on-line calibration automatic test system for microwave multi-channel products, which includes a temperature chamber / air flow meter, a PXI chassis, a test instrument, an industrial control computer, a first programmed calibration component group, a second programmed calibration component group, a power supply, and a through path; the first programmed calibration component group includes multiple first programmed calibration components; the second programmed calibration component group includes multiple second programmed calibration components; the device under test includes multiple RF channels; the PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix; Each RF channel, the first programmed calibration component, and the second programmed calibration component correspond one by one; the first PXI RF switch matrix is connected to any one of the first programmed calibration components in the first programmed calibration component group; the first programmed calibration component is connected to any one of the second programmed calibration components in the second programmed calibration component group through each RF channel; the second PXI RF switch matrix is connected to any one of the second programmed calibration components in the second programmed calibration component group; any one of the first programmed calibration components in the first programmed calibration component group is connected to any one of the second programmed calibration components in the second programmed calibration component group through the through path; The test instrument is respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial control computer is respectively connected to the first programmed calibration component group, the second programmed calibration component group, and the temperature chamber / air flow meter; the device under test, the first programmed calibration component group, and the second programmed calibration component group are all placed in the temperature chamber / air flow meter, and the temperature chamber / air flow meter is used to provide a temperature environment; the power supply is respectively connected to the device under test and the industrial control computer; both the first PXI RF switch matrix and the second PXI RF switch matrix are used to realize the programmed switching of different test channels of the microwave multi-channel product; the test instrument is used to test the RF performance of the device under test; the industrial control computer is used to control the test instrument to test the device under test; the first programmed calibration component group and the second programmed calibration component group are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in different temperature environments; different temperature environments include high temperature, normal temperature, and low temperature.

[0011] Further, a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card is installed in the PXI chassis; The PCI-type IO control card in the industrial control computer is connected to the device under test and is used to control the working state of the device under test. The working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial control computer is used to control and obtain the temperature of the temperature chamber / air flow meter, and the PXI control card is used to control the first PXI RF switch matrix and the second PXI RF switch matrix to conduct and disconnect; the PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis and is used to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instrument and the power supply and controls the test instrument and the power supply through the IEEE488.2 protocol.

[0012] This application also discloses an online calibration automatic test method for a microwave multi-channel product, which is applicable to the online calibration automatic test system for the microwave multi-channel product described above, and includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmed calibration component, the second programmed calibration component, and the device under test; Step 2: The measurement and control software of the industrial control computer sends instructions to the device under test to switch the device under test to an external through-path. The measurement and control software of the industrial control computer sends instructions to the test instrument to start the RF path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmed calibration component and the second programmed calibration component to make the first programmed calibration component and the second programmed calibration component respectively in the load, open circuit, short circuit, and through states to obtain calibration parameters and form a calibration file; Step 3: Loop steps 1 and 2 until all RF path calibrations of the device under test are completed and corresponding calibration files are formed; Step 4: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files for the corresponding test paths, read the data of the test instruments, and complete the normal-temperature RF performance tests for all paths of the DUT. Step 5: The measurement and control software of the industrial control computer sends instructions to the power supply and the DUT to power on the DUT and control the off state, and sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instruments to disconnect the RF signals of the microwave multi-channel product. Step 6: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the required time of the DUT, repeat Steps 2 to 3 until the calibration of all measured RF paths of the DUT is completed at the low temperature state and the corresponding calibration files are formed. Step 7: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files corresponding to the test paths in the low-temperature environment, read the data of the test instruments, and complete the low-temperature RF performance tests for all paths of the DUT. Step 8: The measurement and control software of the industrial control computer sends instructions to the power supply and the DUT through the GPIB card and the PCI-type IO control card to make the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instruments to disconnect the RF signals input to the DUT. Step 9: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / air flow meter to cool down the DUT to normal temperature and then take it out, and turn off all instrument devices to complete the RF performance tests of the DUT in different temperature environments.

[0013] This application also discloses an on-line calibration automatic test system for a microwave multi-channel product, which includes a first PXI RF switch matrix, a second PXI RF switch matrix, a PXI chassis, test instruments, an industrial control computer, a first group of programmable calibration components, a second group of programmable calibration components, a power supply, and a through path; the first group of programmable calibration components includes multiple first programmable calibration components; the second group of programmable calibration components includes multiple second programmable calibration components; the test instruments are respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial control computer is respectively connected to the first group of programmable calibration components and the second group of programmable calibration components; the power supply is connected to the industrial control computer. When connecting the device under test for full-duplex two-port calibration at room temperature, any one of the first programmable calibration components in the first programmable calibration component group is connected to the DC path; any one of the second programmable calibration components in the second programmable calibration component group is connected to the DC path; the test instrument is used to test the RF performance of the through path; the industrial computer is used to control the test instrument to test the through path; the first programmable calibration component group and the second programmable calibration component group are used to calibrate the through path online to complete the RF performance test of the through path in a room temperature environment. When performing single-port calibration on the device under test as needed after connecting it, it further includes an incubator / airflow meter. The device under test includes multiple RF channels; each RF channel, the first programmable calibration component, and the second programmable calibration component correspond one by one; the first PXI RF switch matrix is connected to any one of the first programmable calibration components in the first programmable calibration component group; the first programmable calibration component is connected to any one of the second programmable calibration components in the second programmable calibration component group through each RF channel; the second PXI RF switch matrix is connected to any one of the second programmable calibration components in the second programmable calibration component group; any one of the first programmable calibration components in the first programmable calibration component group is connected to any one of the second programmable calibration components in the second programmable calibration component group through the through path; the device under test, the first programmable calibration component group, and the second programmable calibration component group are all placed in the incubator / airflow meter, and the incubator / airflow meter is used to provide a temperature environment; the power supply is connected to the device under test; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to achieve programmable switching of different test channels of the microwave multi-channel product; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first programmable calibration component group and the second programmable calibration component group are used to calibrate the RF test link of the device under test online to complete the RF performance test of the device under test in low-temperature and high-temperature environments.

[0014] Furthermore, a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; a PXI control card and a PXI switch matrix are installed in the PXI chassis. The PCI-type IO control card in the industrial computer is connected to the device under test and is used to control the working state of the device under test. The working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the incubator / airflow meter; the PXI control card is used to control the first PXI RF switch matrix and the second PXI RF switch matrix to conduct and disconnect; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis and is used to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is respectively connected to the test instrument and the power supply, and controls the test instrument and the power supply through the IEEE488.2 protocol. The present application also discloses an on-line calibration automatic test method for a microwave multi-channel product, which is applicable to the on-line calibration automatic test system for the microwave multi-channel product described above, and includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test. Step 2: The measurement and control software of the industrial control computer sends an instruction to the device under test to switch it to the through path. The measurement and control software of the industrial control computer sends an instruction to the test instrument to start the RF path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, short circuit, and through states to obtain calibration parameters and form a calibration file. Step 3: Loop steps 1 and 2 until all RF path calibrations of the device under test are completed and corresponding calibration files are formed. Step 4: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files of the corresponding through paths, and read the test instrument data to complete the RF performance test of all through paths of the device under test at room temperature. Step 5: The measurement and control software of the industrial control computer sends instructions to the power supply and the device under test to power on the device under test and control the off state. Instructions are sent to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product. Step 6: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / air flow meter to adjust the temperature of the environment where the device under test is located to a low temperature. After the low temperature lasts for the required time of the device under test, loop steps 2 to 3 for single-port calibration until all single-port calibrations of the measured RF paths of the device under test in the low-temperature state are completed and corresponding calibration files are formed with the through calibrations of the corresponding paths obtained in step 2. Step 7: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files corresponding to the test paths in the low-temperature environment, and read the test instrument data to complete the low-temperature RF performance test of all paths of the device under test. Step 8: The measurement and control software of the industrial control computer sends instructions to the power supply and the device under test through the GPIB card and the PCI-type IO control card to make the device under test in a non-operating state according to the established power-off sequence and delayed power-off. The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the device under test. Step 9: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / airflow meter, cools the DUT to room temperature and then takes it out, shuts down each instrument and equipment, and completes the radio frequency performance test of the DUT in different temperature environments.

[0015] Due to the adoption of the above technical solutions, the present application has the following advantages: The present application can realize the rapid and accurate test of the radio frequency performance of microwave products at room temperature, low temperature, and high temperature. It has the following beneficial effects: (1) The temperature chamber is adopted to realize the automatic control and switching of the product at room temperature, low temperature, and high temperature, with accurate temperature control and high efficiency; (2) The PXI radio frequency switch matrix is adopted to realize the automatic switching of different radio frequency channels, improving the efficiency; (4) The measurement and control software is adopted to realize the automatic control of temperature rise and fall, power-on control on and off, radio frequency signal on and off, etc., and the automatic switching of different radio frequency or low-frequency channels, realizing the automation of the test process; (5) Online calibration is adopted to solve the problem of errors in tests such as phase and amplitude caused by the bending of high-frequency test cables inside and outside the temperature chamber; (6) Solve the temperature drift error brought by the test cable under different temperature conditions; (7) Solve the test errors such as phase and amplitude caused by inconsistent contacts during the switching of the single-pole multi-throw switch matrix and the one-out-of-many switch matrix; (8) Place the single-pole multi-throw switch matrix, one-out-of-many, etc. at room temperature, reducing the working conditions of the switch matrix and the system construction cost; (9) The system can perform online calibration as needed, reducing test errors; (10) The power-on sequence of the programmable power supply can avoid burning out the DUT. Description of the Drawings

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments recorded in the embodiments of the present application. For those of ordinary skill in the art, other drawings can also be obtained according to these drawings.

[0017] Figure 1 It is a schematic diagram of an online calibration automatic test system for a microwave multi-channel product according to an embodiment of the present application; Figure 2 It is a schematic diagram of an online calibration automatic test method for a microwave multi-channel product according to an embodiment of the present application; Figure 3 It is another schematic diagram of an online calibration automatic test system for a microwave multi-channel product according to an embodiment of the present application; Figure 4 It is another schematic diagram of an online calibration automatic test method for a microwave multi-channel product according to an embodiment of the present application; Figure 5(a) is another schematic diagram of an online calibration automatic test system for a microwave multi-channel product according to an embodiment of the present application; Figure 5(b) is another schematic diagram of an online calibration automatic test system for a microwave multi-channel product according to an embodiment of the present application; Figure 6 Schematic diagram of another online calibration automatic test method for microwave multi-channel products according to an embodiment of the present application. Detailed implementation manners

[0018] The present application will be further described in conjunction with the accompanying drawings and embodiments. The described embodiments are only a part of the embodiments of the present application, rather than all embodiments. All other embodiments obtained by those of ordinary skill in the art shall fall within the protection scope of the embodiments of the present application.

[0019] The present application proposes three online calibration modes: Mode 1: The device under test has a built-in RF through-path to achieve two-port online calibration (SOLT). The connection method of the microwave test system is as Figure 1 shown. This mode has a simple connection and can start short-circuit - open-circuit - load - through (SOLT) calibration online as needed. The disadvantage is that the device under test needs to have a built-in through-calibration channel.

[0020] Refer to Figure 1 , the present application provides an embodiment of an online calibration automatic test system for microwave multi-channel products, which includes an incubator / air flow meter, a PXI chassis, test instruments, an industrial computer, a first group of programmable calibration components, a second group of programmable calibration components, and a power supply; the first group of programmable calibration components includes multiple first programmable calibration components; the second group of programmable calibration components includes multiple second programmable calibration components; the device under test includes multiple groups of paths, and each group of paths includes an RF channel and a through-path; each group of paths, the first programmable calibration component, and the second programmable calibration component correspond one by one; the PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix; the first PXI RF switch matrix is connected to any one of the first programmable calibration components in the first group of programmable calibration components; the first programmable calibration component is connected to any one of the second programmable calibration components in the second group of programmable calibration components through the RF channel or the through-path in each group of paths; the second PXI RF switch matrix is connected to any one of the second programmable calibration components in the second group of programmable calibration components; The test instruments are respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial computer is respectively connected to the first group of programmable calibration components, the second group of programmable calibration components, and the incubator / air flow meter; the device under test, the first group of programmable calibration components, and the second group of programmable calibration components are all placed in the incubator / air flow meter, and the incubator / air flow meter is used to provide a temperature environment; the power supply is respectively connected to the device under test and the industrial computer; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to achieve program-controlled switching of different test channels of the microwave multi-channel product; the test instruments are used to test the RF performance of the device under test; the industrial computer is used to control the test instruments to test the device under test; the first group of programmable calibration components and the second group of programmable calibration components are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in different temperature environments; different temperature environments include high temperature, normal temperature, and low temperature.

[0021] Optionally, a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card is installed in the PXI chassis; the PCI-type IO control card in the industrial control computer is connected to the device under test to control the working state of the device under test, and the working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial control computer is used for controlling and obtaining the temperature of the incubator / airflow meter, so that the device under test works in different temperature states; the PXI control card is used for controlling the conduction and disconnection of the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix; the PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instrument and the power supply, and controls the test instrument and the power supply through the IEEE488.2 protocol.

[0022] The low temperature, normal temperature, and high temperature in the embodiments of the present application are relative. For example, a certain temperature range can be divided into low temperature, normal temperature, and high temperature, and the normal temperature is higher than the low temperature and lower than the high temperature. This will not be elaborated further later.

[0023] The working principle of the test system is as follows. When the radio frequency cable connection and the ambient temperature do not change, the previous calibration file can be used to omit the calibration process, or the calibration process can be started at any time when needed to eliminate errors. See Figure 2 , the present application also provides an embodiment of an online calibration automatic test method for microwave multi-channel products, which is applicable to the online calibration automatic test system for microwave multi-channel products described in the above embodiments, and includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix to connect the radio frequency channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial control computer sends instructions to the device under test to switch the device under test to the through path. The measurement and control software of the industrial control computer sends instructions to the test instrument to start the radio frequency path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, and short circuit states to correct the directivity error of the single-port signal leaking to the receiving end, the source matching error of the signal source impedance mismatch reflection, and the reflection tracking error of the difference in the reflection transmission path, and make the first programmable calibration component and the second programmable calibration component in the through state to correct the transmission tracking error of the forward transmission amplitude and phase deviation and the load matching error of the impedance adaptation between ports, and finally obtain the calibration parameters and form a calibration file. The load, open circuit, short circuit, and through involved in the present application are all for this purpose, and this will not be elaborated further later.

[0024] Step 3: Loop through Step 1 and Step 2 until all RF paths of the DUT are calibrated and the corresponding calibration files are formed; Step 4: The measurement and control software of the industrial computer sends commands to the power supply and the DUT, powers on the DUT in the established power-on sequence and with a delay to make the DUT in the working state. The measurement and control software of the industrial computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieves the calibration files of the corresponding test paths, reads the data of the test instruments, and completes the room-temperature RF performance test of all paths of the DUT; When necessary (when the cable position, switch contacts or temperature change, the online calibration function (Step 2 to Step 3) can be started at any time), perform single-port calibration on the test instruments, then switch to the through-path of the DUT, and perform through-path calibration on the test instruments. The calibration end face is the input and output ports of the DUT to eliminate the errors caused by the bending of the RF cable, the change of the switch contacts and the temperature change within the calibration end face; Step 5: The measurement and control software of the industrial computer sends commands to the power supply and the DUT, powers off the DUT in the established power-off sequence and with a delay to make the DUT in the non-working state, and sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals of the microwave multi-channel product; Step 6: The measurement and control software of the industrial computer sends commands to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the required time of the DUT, loop through Step 2 to Step 3 until all the measured RF paths of the DUT in the low-temperature state are calibrated and the corresponding calibration files are formed; Step 7: The measurement and control software of the industrial computer sends commands to the power supply and the DUT, powers on the DUT in the established power-on sequence and with a delay to make the DUT in the working state. The measurement and control software of the industrial computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieves the calibration files corresponding to the test paths in the low-temperature environment, reads the data of the test instruments, and completes the low-temperature RF performance test of all paths of the DUT; When necessary (when the cable position, switch contacts or temperature change, the online calibration function (Step 2 to Step 3) can be started at any time) to eliminate the errors caused by the bending of the RF cable, the change of the switch contacts and the temperature change within the calibration end face; Step 8: The measurement and control software of the industrial computer sends commands to the power supply and the DUT through the GPIB and IO control cards, powers off the DUT in the established power-off sequence and with a delay to make the DUT in the non-working state. The measurement and control software of the industrial computer sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals input to the DUT; Step 9: The measurement and control software of the industrial computer sends instructions to the temperature chamber / airflow meter, cools the DUT to room temperature and then takes it out, turns off each instrument and equipment, and completes the RF performance test of the DUT in different temperature environments.

[0025] Mode 2: External RF direct-through path component microwave test system, external RF direct-through path connection method, the DUT is externally connected to the direct-through path, and is switched to the direct-through state by the RF switch matrix to achieve on-line two-port calibration (SOLT), as Figure 3 , this mode can start short-circuit - open-circuit - load - through (SOLT) calibration on-line as required, and the disadvantage is that the errors of the switches and cables connecting the programmable calibration components and the DUT cannot be calibrated, and the de-embedding of this part of the link that cannot be calibrated needs to be done in advance.

[0026] See Figure 3 , this application also provides an embodiment of an on-line calibration automatic test system for microwave multi-channel products, which includes a temperature chamber / airflow meter, a PXI chassis, test instruments, an industrial computer, a first group of programmable calibration components, a second group of programmable calibration components, a power supply, and a direct-through path; the first group of programmable calibration components includes multiple first programmable calibration components; the second group of programmable calibration components includes multiple second programmable calibration components; the DUT includes multiple RF channels; the PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix; Each RF channel, the first programmable calibration component, and the second programmable calibration component correspond one by one; the first PXI RF switch matrix is connected to any one of the first programmable calibration components in the first group of programmable calibration components; the first programmable calibration component is connected to any one of the second programmable calibration components in the second group of programmable calibration components through each RF channel; the second PXI RF switch matrix is connected to any one of the second programmable calibration components in the second group of programmable calibration components; any one of the first programmable calibration components in the first group of programmable calibration components is connected to any one of the second programmable calibration components in the second group of programmable calibration components through the direct-through path; The test instruments are respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial computer is respectively connected to the first group of programmable calibration components, the second group of programmable calibration components, and the temperature chamber / airflow meter; the DUT, the first group of programmable calibration components, and the second group of programmable calibration components are all placed in the temperature chamber / airflow meter, and the temperature chamber / airflow meter is used to provide a temperature environment; the power supply is respectively connected to the DUT and the industrial computer; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to achieve program-controlled switching of different test channels of microwave multi-channel products; the test instruments are used to test the RF performance of the DUT; the industrial computer is used to control the test instruments to test the DUT; the first group of programmable calibration components and the second group of programmable calibration components are used to on-line calibrate the RF test link of the DUT to complete the RF performance test of the DUT in different temperature environments; different temperature environments include high temperature, room temperature, and low temperature.

[0027] Optionally, a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card is installed in the PXI chassis; The PCI-type IO control card in the industrial control computer is connected to the device under test to control the working state of the device under test. The working states include the receiving state, transmitting state, attenuation state, and phase shift state of the device under test. The serial port in the industrial control computer is used to control and obtain the temperature of the incubator / airflow meter. The PXI control card is used to control the on and off of the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix. The PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial control computer. The GPIB card in the industrial control computer is respectively connected to the test instrument and the power supply, and controls the test instrument and the power supply through the IEEE488.2 protocol.

[0028] The working principle of the test system is as follows. When the radio frequency cable connection and the ambient temperature remain unchanged, the previous calibration file can be used to omit the calibration process. Alternatively, the calibration process can be started at any time when needed to eliminate errors. See Figure 4 , this application also provides an embodiment of an online calibration automatic test method for microwave multi-channel products, which is applicable to the online calibration automatic test system for microwave multi-channel products described in the above embodiment, and includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix to connect the radio frequency channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial control computer sends instructions to the device under test to switch it to an external through-path. The measurement and control software of the industrial control computer sends instructions to the test instrument to start the radio frequency path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, short circuit, and through states to obtain calibration parameters and form a calibration file; Step 3: Repeat Steps 1 and 2 until the calibration of all radio frequency paths of the device under test is completed and the corresponding calibration files are formed; Step 4: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files of the corresponding test paths, read the data of the test instruments, and complete the normal temperature RF performance test of all paths of the DUT. When necessary (if the cable position, switch contacts, or temperature change, the online calibration function (Steps 2 to 3) can be started at any time), perform single-port calibration on the test instruments, switch to the external through path, and perform through path calibration on the test instruments. The calibration end face is the port of the programmable calibration component to eliminate the errors caused by the bending of the RF cable, the change of switch contacts, and the temperature change within the calibration end face. Step 5: The measurement and control software of the industrial control computer sends instructions to the power supply and the DUT to control the power-on and power-off states of the DUT, and sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instruments to disconnect the RF signals of the microwave multi-channel product. Step 6: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the required time of the DUT, loop Steps 2 to 3 until the calibration of all measured RF paths of the DUT in the low temperature state is completed and the corresponding calibration files are formed. Step 7: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files corresponding to the test paths in the low temperature environment, read the data of the test instruments, and complete the low temperature RF performance test of all paths of the DUT. When necessary (if the cable position, switch contacts, or temperature change, the online calibration function (Steps 2 to 3) can be started at any time) to eliminate the errors caused by the bending of the RF cable, the change of switch contacts, and the temperature change within the calibration end face. Step 8: The measurement and control software of the industrial control computer sends instructions to the power supply and the DUT through the GPIB card and the PCI-type IO control card to make the DUT in a non-operating state according to the established power-off sequence and delay power-off. The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instruments to disconnect the RF signals input to the DUT. Step 9: The measurement and control software of the industrial control computer sends instructions to the temperature chamber / air flow meter to cool the DUT to normal temperature and then take it out, and turn off all instrument devices to complete the RF performance test of the DUT in different temperature environments.

[0029] Mode 3: Two-step calibration of the microwave test system. The advantage of this method is that online calibration can be achieved without adding hardware conditions. The disadvantage is that online calibration can only perform single-port reflection parameter calibration (SOL), and the transmission parameters obtained from the first-step offline calibration are used to achieve two-port calibration (SOLT). Referring to FIGS. 5(a) and 5(b), the present application also provides an embodiment of an online calibration automatic test system for a microwave multi-channel product, which includes a first PXI RF switch matrix, a second PXI RF switch matrix, a PXI chassis, test instruments, an industrial control computer, a first group of programmable calibration components, a second group of programmable calibration components, a power supply, and a direct-through path; the first group of programmable calibration components includes multiple first programmable calibration components; the second group of programmable calibration components includes multiple second programmable calibration components; the test instruments are respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial control computer is respectively connected to the first group of programmable calibration components and the second group of programmable calibration components; the power supply is connected to the industrial control computer; When connecting the device under test for full two-port calibration at room temperature, any one of the first programmable calibration components in the first group of programmable calibration components is connected to the direct-through path; any one of the second programmable calibration components in the second group of programmable calibration components is connected to the direct-through path; the test instrument is used to test the RF performance of the direct-through path; the industrial control computer is used to control the test instrument to test the direct-through path; the first group of programmable calibration components and the second group of programmable calibration components are used to online calibrate the direct-through path to complete the RF performance test of the direct-through path in a room temperature environment; When connecting the device under test and performing single-port calibration as needed, a temperature chamber / airflow meter is further included. The device under test includes multiple RF channels; each RF channel, the first programmable calibration component, and the second programmable calibration component are in one-to-one correspondence; the first PXI RF switch matrix is connected to any one of the first programmable calibration components in the first group of programmable calibration components; the first programmable calibration component is connected to any one of the second programmable calibration components in the second group of programmable calibration components through each RF channel; the second PXI RF switch matrix is connected to any one of the second programmable calibration components in the second group of programmable calibration components; any one of the first programmable calibration components in the first group of programmable calibration components is connected to any one of the second programmable calibration components in the second group of programmable calibration components through the direct-through path; the device under test, the first group of programmable calibration components, and the second group of programmable calibration components are all placed in the temperature chamber / airflow meter, and the temperature chamber / airflow meter is used to provide a temperature environment; the power supply is connected to the device under test; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to achieve programmable switching of different test channels of the microwave multi-channel product; the test instrument is used to test the RF performance of the device under test; the industrial control computer is used to control the test instrument to test the device under test; the first group of programmable calibration components and the second group of programmable calibration components are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in low-temperature and high-temperature environments.

[0030] Optionally, a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card and a PXI switch matrix are installed in the PXI chassis; The PCI-type IO control card in the industrial control computer is connected to the device under test to control the working state of the device under test. The working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial control computer is used for controlling and obtaining the temperature of the incubator / airflow meter; the PXI control card is used for controlling the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix to conduct and disconnect; the PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instrument and the power supply, and controls the test instrument and the power supply through the IEEE488.2 protocol. The working principle of the test system is as Figure 6 , perform full-duplex port calibration by connecting the device under test at room temperature, then perform single-port calibration separately as needed after connecting the device under test, and then complete the online calibration using the full-port calibration data at room temperature. Perform a full-parameter calibration before the test and perform single-port calibration during the test to correct the first calibration data.

[0031] See Figure 6 , this application also provides an embodiment of an online calibration automatic test method for a microwave multi-channel product, which is applicable to the online calibration automatic test system for a microwave multi-channel product described in the above embodiment, and includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix to connect the radio frequency channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial control computer sends instructions to the device under test to switch it to the through path. The measurement and control software of the industrial control computer sends instructions to the test instrument to start radio frequency path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, short circuit, and through states to obtain calibration parameters and form a calibration file; Step 3: Loop steps 1 and 2 until all radio frequency path calibrations of the device under test are completed and corresponding calibration files are formed; Step 4: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files for the corresponding through paths, read the data of the test instruments, and complete the RF performance tests for all through paths of the DUT under normal temperature environment; When necessary (if the cable position, switch contacts or temperature change, the online calibration function (Steps 2 to 3) can be started at any time), perform single-port calibration on the test instruments, that is, calibrate each RF channel of the DUT to form a single-port calibration file. The calibration end face is the input and output ports of the DUT. Combine the single-port file and the calibration file of the through path in Step 2 to form a two-port full calibration file to eliminate the errors caused by the bending of the RF cable, the change of switch contacts and the temperature change within the calibration end face; Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off states of the DUT, and sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals of the microwave multi-channel product; Step 6: The measurement and control software of the industrial computer sends instructions to the temperature chamber / air flow meter to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the required time of the DUT, loop Steps 2 to 3 to perform single-port calibration until the single-port calibration of all measured RF paths of the DUT under the low temperature state is completed and forms corresponding calibration files with the through calibrations of the corresponding paths obtained in Step 2; Step 7: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files corresponding to the test paths under the low temperature environment, read the data of the test instruments, and complete the low temperature RF performance tests for all paths of the DUT; When necessary (if the cable position, switch contacts or temperature change, the online calibration function (Steps 2 to 3) can be started at any time) to eliminate the errors caused by the bending of the RF cable, the change of switch contacts and the temperature change within the calibration end face; Step 8: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT through the GPIB card and the PCI-type IO control card to make the DUT in a non-operating state according to the established power-off sequence and delay power-off. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals input to the DUT; Step 9: The measurement and control software of the industrial computer sends instructions to the temperature chamber / air flow meter to cool down the DUT to normal temperature and then take it out, and turn off each instrument and equipment to complete the RF performance tests of the DUT in different temperature environments.

[0032] This application can set the power-on sequence and interval time through program control, thus avoiding burning the device under test due to incorrect power-on sequence. As the main control unit, the industrial control computer utilizes the PCI and PCI-e bus expansion in the industrial control computer and the PXI bus in the PXI chassis, can match PCI, PCI-e and PXI boards, and has stronger system expansion capabilities. The measurement and control software of the industrial control computer sends temperature control instructions and performs the next operation after responding to the ready interrupt sent by the temperature chamber / airflow meter, without having to use a timed loop to query the status word of the temperature chamber / airflow meter to determine the next operation, which can effectively reduce the computing load of the industrial control computer and improve the response speed. The device under test proposed can be multiple pieces, which are connected through a switch matrix to implement on-line calibration, and its test accuracy is not affected by the added switches and cables.

[0033] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and not to limit them. Although the present application has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: modifications or equivalent replacements can still be made to the specific implementation manners of the present application, and any modification or equivalent replacement that does not depart from the spirit and scope of the present application should be covered by the protection scope of the claims of the present application.

Claims

1. An on-line calibration automatic test system for microwave multi-channel products, characterized in that, It includes an incubator / airflow meter, a PXI chassis, test instruments, an industrial control computer, a first group of programmable calibration components, a second group of programmable calibration components, and a power supply; The first group of programmable calibration components includes multiple first programmable calibration components; The second group of programmable calibration components includes multiple second programmable calibration components; the device under test includes multiple groups of channels, and each group of channels includes a radio frequency channel and a through path; Each group of channels, the first programmable calibration component, and the second programmable calibration component are in one-to-one correspondence; the PXI chassis includes a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix; The first PXI radio frequency switch matrix is connected to any one of the first programmable calibration components in the first group of programmable calibration components; The first programmable calibration component is connected to any one of the second programmable calibration components in the second group of programmable calibration components through the radio frequency channel or the through path in each group of channels; The second PXI radio frequency switch matrix is connected to any one of the second programmable calibration components in the second group of programmable calibration components; The test instruments are respectively connected to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix; The industrial control computer is respectively connected to the first group of programmable calibration components, the second group of programmable calibration components, and the incubator / airflow meter; the device under test, the first group of programmable calibration components, and the second group of programmable calibration components are all placed in the incubator / airflow meter, and the incubator / airflow meter is used to provide a temperature environment; the power supply is respectively connected to the device under test and the industrial control computer; both the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix are used to realize the programmable switching of different test channels of microwave multi-channel products; The test instruments are used to test the radio frequency performance of the device under test; the industrial control computer is used to control the test instruments to test the device under test; The first group of programmable calibration components and the second group of programmable calibration components are used to online calibrate the radio frequency test link of the device under test to complete the radio frequency performance test of the device under test in different temperature environments; different temperature environments include high temperature, normal temperature, and low temperature.

2. The on-line calibration automatic test system for microwave multi-channel products according to claim 1, characterized in that, A PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card is installed in the PXI chassis; the PCI-type IO control card in the industrial control computer is connected to the device under test and is used to control the working state of the device under test, and the working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial control computer is used for the control and acquisition of the temperature of the incubator / airflow meter to make the device under test work in different temperature states; The PXI control card is used to control the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix to conduct and disconnect; The PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis and is used to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instruments and the power supply and controls the test instruments and the power supply through the IEEE488.2 protocol.

3. A method for on-line calibration automatic testing of a microwave multi-channel product, applicable to the on-line calibration automatic testing system of the microwave multi-channel product described in claim 1 or 2, characterized in that, It includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix to connect the radio frequency channels of the test instruments, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial computer sends instructions to the device under test, causing the device under test to switch to the direct-through "Through" path. The measurement and control software of the industrial computer sends instructions to the test instrument to start the RF path calibration. The measurement and control software of the industrial computer simultaneously sends instructions to the first programmable calibration component and the second programmable calibration component, causing the first programmable calibration component and the second programmable calibration component to be in the load, open circuit, short circuit, and direct-through states respectively to obtain calibration parameters and form a calibration file. Step 3: Loop Steps 1 and 2 until all RF path calibrations of the device under test are completed and the corresponding calibration files are formed. Step 4: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test to power on the device under test in the established power-on sequence and with the established delay to make the device under test in the working state. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, and retrieves the calibration files of the corresponding test paths, reads the data of the test instrument, and completes the normal temperature RF performance test of all paths of the device under test. Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test to power off the device under test in the established power-off sequence and with the established delay to make the device under test in the non-working state, and sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signals input to the device under test. Step 6: The measurement and control software of the industrial computer sends instructions to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the device under test is located to a low temperature. After the low temperature lasts for the required time of the device under test, loop Steps 2 to 3 until all the measured RF path calibrations of the device under test in the low temperature state are completed and the corresponding calibration files are formed. Step 7: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test to power on the device under test in the established power-on sequence and with the established delay and make the device under test in the working state. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, and retrieves the calibration files corresponding to the test paths in the low temperature environment, reads the data of the test instrument, and completes the low temperature RF performance test of all paths of the device under test. Step 8: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test through the GPIB and IO control cards to power off the device under test in the established power-off sequence and with the established delay to make the device under test in the non-working state. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signals input to the device under test. Step 9: The measurement and control software of the industrial computer sends instructions to the temperature chamber / air flow meter to cool the device under test to normal temperature and then take it out, and turn off each instrument and equipment to complete the RF performance test of the device under test in different temperature environments.

4. A microwave multi-channel product on-line calibration automatic test system, characterized in that Including a temperature chamber / air flow meter, a PXI chassis, a test instrument, an industrial computer, a first group of programmable calibration components, a second group of programmable calibration components, a power supply, and a direct-through path; The first group of programmable calibration components includes multiple first programmable calibration components; The second group of programmable calibration components includes multiple second programmable calibration components; the device under test includes multiple RF channels; The PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix; Each RF channel, the first programmable calibration component, and the second programmable calibration component correspond to each other one by one; The first PXI RF switch matrix is connected to any one of the first programmable calibration components in the first programmable calibration component group; The first programmable calibration component is connected to any one of the second programmable calibration components in the second programmable calibration component group through each RF channel; The second PXI RF switch matrix is connected to any one of the second programmable calibration components in the second programmable calibration component group; Any one of the first programmable calibration components in the first programmable calibration component group is connected to any one of the second programmable calibration components in the second programmable calibration component group through a direct-through path; The test instrument is respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; The industrial control computer is respectively connected to the first programmable calibration component group, the second programmable calibration component group, and the temperature chamber / air flow meter; the device under test, the first programmable calibration component group, and the second programmable calibration component group are all placed in the temperature chamber / air flow meter, and the temperature chamber / air flow meter is used to provide a temperature environment; the power supply is respectively connected to the device under test and the industrial control computer; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize the programmable switching of different test channels of the microwave multi-channel product; The test instrument is used to test the RF performance of the device under test; the industrial control computer is used to control the test instrument to test the device under test; The first programmable calibration component group and the second programmable calibration component group are used to calibrate the RF test link of the device under test online to complete the RF performance test of the device under test in different temperature environments; different temperature environments include high temperature, normal temperature, and low temperature.

5. The on-line calibration automatic test system for microwave multi-channel products according to claim 4, characterized in that, A PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial control computer; a PXI control card is installed in the PXI chassis; The PCI-type IO control card in the industrial control computer is connected to the device under test and is used to control the working state of the device under test. The working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial control computer is used to control and obtain the temperature of the temperature chamber / air flow meter, and the PXI control card is used to control the first PXI RF switch matrix and the second PXI RF switch matrix to conduct and disconnect; The PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis and is used to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instrument and the power supply, and controls the test instrument and the power supply through the IEEE488.2 protocol.

6. A method for on-line calibration automatic testing of a microwave multi-channel product, applicable to the on-line calibration automatic testing system of the microwave multi-channel product described in claim 4 or 5, characterized in that, Including: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial control computer sends instructions to the device under test to make the device under test switch to an external direct-through path. The measurement and control software of the industrial control computer sends instructions to the test instrument to start RF path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively be in the load, open circuit, short circuit, and direct-through states to obtain calibration parameters and form a calibration file; Step 3: Loop through Step 1 and Step 2 until all RF paths of the DUT are calibrated and the corresponding calibration files are formed; Step 4: The measurement and control software of the industrial computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files of the corresponding test paths, read the data of the test instruments, and complete the room temperature RF performance test of all paths of the DUT; Step 5: The measurement and control software of the industrial computer sends commands to the power supply and the DUT to power on the DUT and control the on / off state, and sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals input to the DUT; Step 6: The measurement and control software of the industrial computer sends commands to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the duration of the low temperature reaches the required time of the DUT, loop through Step 2 to Step 3 until all measured RF paths of the DUT are calibrated at the low temperature state and the corresponding calibration files are formed; Step 7: The measurement and control software of the industrial computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files of the test paths corresponding to the low temperature environment, read the data of the test instruments, and complete the low temperature RF performance test of all paths of the DUT; Step 8: The measurement and control software of the industrial computer sends commands to the power supply and the DUT through the GPIB card and the PCI type IO control card to make the DUT in a non-operating state according to the established power-off sequence and delay power-off. The measurement and control software of the industrial computer sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals input to the DUT; Step 9: The measurement and control software of the industrial computer sends commands to the temperature chamber / air flow meter to cool down the DUT to room temperature and then take it out, and turn off each instrument and equipment to complete the RF performance test of the DUT in different temperature environments.

7. An on-line calibration automatic test system for microwave multi-channel products, characterized in that, Including the first PXI RF switch matrix, the second PXI RF switch matrix, the PXI chassis, the test instruments, the industrial computer, the first programmable calibration component group, the second programmable calibration component group, the power supply, and the through path; The first programmable calibration component group includes multiple first programmable calibration components; The second programmable calibration component group includes multiple second programmable calibration components; The test instruments are respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial computer is respectively connected to the first programmable calibration component group and the second programmable calibration component group; The power supply is connected to the industrial computer; When performing full-duplex calibration on the DUT in the room temperature state, any one of the first programmable calibration components in the first programmable calibration component group is connected to the DC path; Any one of the second programmable calibration components in the second programmable calibration component group is connected to the DC path; Test The instrument is used to test the RF performance of the through path; the industrial computer is used to control the test instrument to test the through path; The first programmable calibration component group and the second programmable calibration component group are used to calibrate the through path online to complete the RF performance test of the through path in the room temperature environment; When the device under test is calibrated separately in single-port according to requirements, it further includes an incubator / airflow meter. The device under test includes multiple RF channels; each RF channel, the first programmable calibration component, and the second programmable calibration component correspond one by one; The first PXI RF switch matrix is connected to any one of the first programmable calibration components in the first programmable calibration component group; The first programmable calibration component is connected to any one of the second programmable calibration components in the second programmable calibration component group through each RF channel; The second PXI RF switch matrix is connected to any one of the second programmable calibration components in the second programmable calibration component group; Any one of the first programmable calibration components in the first programmable calibration component group is connected to any one of the second programmable calibration components in the second programmable calibration component group through a direct connection path; the device under test, the first programmable calibration component group, and the second programmable calibration component group are all placed in the incubator / airflow meter, and the incubator / airflow meter is used to provide a temperature environment; the power supply is connected to the device under test; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to achieve program-controlled switching of different test channels of microwave multi-channel products; The test instrument is used to test the RF performance of the device under test; the industrial control computer is used to control the test instrument to test the device under test; The first programmable calibration component group and the second programmable calibration component group are used to calibrate the RF test link of the device under test online to complete the RF performance test of the device under test in low-temperature and high-temperature environments.

8. The on-line calibration automatic test system for microwave multi-channel products according to claim 7, characterized in that The industrial control computer is installed with a PCI-type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software; the PXI chassis is installed with a PXI control card and a PXI switch matrix; The PCI-type IO control card in the industrial control computer is connected to the device under test and is used to control the working state of the device under test. The working state includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial control computer is used to control and obtain the temperature of the incubator / airflow meter; the PXI control card is used to control the first PXI RF switch matrix and the second PXI RF switch matrix to conduct and disconnect; The PCI-PXI control card in the industrial control computer is connected to the PXI control card in the PXI chassis and is used to incorporate the resources in the PXI chassis into the control system of the industrial control computer; the GPIB card in the industrial control computer is respectively connected to the test instrument and the power supply, and controls the test instrument and the power supply through the IEEE488.2 protocol.

9. A method for on-line calibration automatic testing of a microwave multi-channel product, applicable to the on-line calibration automatic testing system of the microwave multi-channel product described in claim 7 or 8, characterized in that, It includes: Step 1: The measurement and control software of the industrial control computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the test instrument, the first programmable calibration component, the second programmable calibration component, and the RF channels of the device under test; Step 2: The measurement and control software of the industrial control computer sends instructions to the device under test to switch the device under test to the direct connection path. The measurement and control software of the industrial control computer sends instructions to the test instrument to start RF path calibration. The measurement and control software of the industrial control computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component to make the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, short circuit, and direct connection states to obtain calibration parameters and form a calibration file; Step 3: Loop Step 1 and Step 2 until all RF paths of the device under test are calibrated and the corresponding calibration files are formed; Step 4: The measurement and control software of the industrial control computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files of the corresponding through paths, read the data of the test instruments, and complete the RF performance tests of all through paths of the DUT under normal temperature environment; Step 5: The measurement and control software of the industrial control computer sends commands to the power supply and the DUT to power on the DUT and control the off state, and sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals of the microwave multi-channel product; Step 6: The measurement and control software of the industrial control computer sends commands to the temperature chamber / air flow meter to adjust the temperature of the environment where the DUT is located to a low temperature. After the duration of the low temperature reaches the required time of the DUT, loop Steps 2 to 3 to perform single-port calibration until the single-port calibration of all measured RF paths of the DUT under the low temperature state is completed and forms corresponding calibration files with the through calibration of the corresponding paths obtained in Step 2; Step 7: The measurement and control software of the industrial control computer sends commands to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF paths, retrieve the calibration files corresponding to the test paths in the low temperature environment, read the data of the test instruments, and complete the low temperature RF performance tests of all paths of the DUT; Step 8: The measurement and control software of the industrial control computer sends commands to the power supply and the DUT through the GPIB card and the PCI-type IO control card to make the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The measurement and control software of the industrial control computer sends commands to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instruments to disconnect the RF signals input to the DUT; Step 9: The measurement and control software of the industrial control computer sends commands to the temperature chamber / air flow meter to cool down the DUT to normal temperature and then take it out, and turn off each instrument and equipment to complete the RF performance tests of the DUT in different temperature environments.

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