Testing method and system

Abstract

The present disclosure relates to a testing method and system, in which a terminal device is used to send first instruction data to a charging management unit of a device under test through a first USB to TTL device, so that the charging management unit sends the first instruction data to a second USB to TTL device through a data transmission channel between a TRX pin and a VIN pin; the second USB to TTL device is used to send the first instruction data to the terminal device; the terminal device is also used to send second instruction data to the charging management unit through the second USB to TTL device, so that the charging management unit sends the second instruction data to the first USB to TTL device through the data transmission channel; the first USB to TTL device is used to send the second instruction data to the terminal device; the terminal device is used to compare the issued first instruction data with the received first instruction data, and compare the issued second instruction data with the received second instruction data, to determine a test result of the device under test.

Description

Technical Field

[0001] The embodiments of the present disclosure relate to the field of device testing technology, and more specifically, to a testing method and system. Background Art

[0002] In the production process of electronic devices like headphone boxes, traditional testing methods typically rely on the device's main control unit (MCU) to complete communication testing. However, this approach presents the following challenges: low test efficiency, as the involvement of the MCU increases test complexity and time; high dependency, meaning that if the MCU fails or is improperly initialized, testing will be impossible; resource consumption, as the MCU requires certain resources during testing, potentially impacting the testing of other functions; and limited flexibility, making traditional methods difficult to adapt to diverse test scenarios and requirements. Therefore, a system that can complete communication testing without the involvement of the MCU is needed. Summary of the Invention

[0003] One object of the present disclosure is to provide a new technical solution for a testing system.

[0004] According to a first aspect of the present disclosure, a test system is provided, comprising: a terminal device, a first USB to TTL device, and a second USB to TTL device, wherein:

[0005] The terminal device is configured to, when the data transmission channel between the TRX pin and the VIN pin of the charge management unit of the device under test is opened, send first instruction data to the charge management unit through the first USB-to-TTL device, so that the charge management unit sends the received first instruction data to the second USB-to-TTL device through the data transmission channel;

[0006] The second USB to TTL device is used to send the received first instruction data to the terminal device;

[0007] The terminal device is further configured to send second instruction data to the charging management unit via the second USB to TTL device, so that the charging management unit sends the received second instruction data to the first USB to TTL device via the data transmission channel;

[0008] The first USB to TTL device is used to send the received second instruction data to the terminal device;

[0009] The terminal device is used to compare the first instruction data sent and the first instruction data received, and to compare the second instruction data sent and the second instruction data received, to determine the test result of the device under test.

[0010] Optionally, the test system further includes a proprietary protocol conversion device, wherein:

[0011] The terminal device is used to send a first target instruction to the private protocol conversion device, wherein the first target instruction is used to instruct to open a data transmission channel between the TRX pin and the VIN pin;

[0012] The private protocol conversion device is used to convert the format of the first target instruction into a format recognizable by the charging management unit, and send the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

[0013] Optionally, the terminal device is further configured to send a second target instruction to the proprietary protocol conversion device when the test of the device under test is completed, wherein the second target instruction is used to instruct to disconnect the data transmission channel between the TRX pin and the VIN pin;

[0014] The private protocol conversion device is used to convert the format of the second target instruction into a format recognizable by the charging management unit, and send the second target instruction after format conversion to the charging management unit, so that the charging management unit disconnects the data transmission channel between the TRX pin and the VIN pin.

[0015] Optionally, the test system further includes a switch, wherein one end of the switch is connected to the TRX pin of the charging management unit.

[0016] The terminal device is configured to control the other end of the switch to be connected to the RX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the first instruction data;

[0017] The terminal device is used to control the other end of the switch to be connected to the TX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the second instruction data.

[0018] Optionally, the test system further includes a first pull-up resistor and a second pull-up resistor, wherein:

[0019] One end of the first pull-up resistor is connected to the TX pin of the second USB-to-TTL device, and the other end of the first pull-up resistor is connected to the VCC pin of the second USB-to-TTL device.

[0020] One end of the second pull-up resistor is connected to the RX pin of the second USB to TTL device, and the other end of the second pull-up resistor is connected to the VCC pin of the second USB to TTL device.

[0021] The resistance of the first pull-up resistor is smaller than the resistance of the second pull-up resistor.

[0022] Optionally, the TX pin and the RX pin of the first USB to TTL device are both connected to the VIN pin of the charging management unit.

[0023] Optionally, the terminal device is also used to determine that the test result of the device under test is unqualified when it is determined that the first instruction data issued and the first instruction data received are inconsistent, and / or that the second instruction data issued and the second instruction data received are inconsistent.

[0024] According to a second aspect of the present disclosure, a testing method is provided, which is applied to a testing system, wherein the testing system includes: a terminal device, a first USB to TTL device, and a second USB to TTL device, wherein:

[0025] The method includes: when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is opened, the terminal device sends first instruction data to the charging management unit through the first USB to TTL device, so that the charging management unit sends the received first instruction data to the second USB to TTL device through the data transmission channel;

[0026] The second USB to TTL device sends the received first instruction data to the terminal device;

[0027] The terminal device sends second instruction data to the charging management unit through the second USB to TTL device, so that the charging management unit sends the received second instruction data to the first USB to TTL device through the data transmission channel;

[0028] The first USB to TTL device sends the received second instruction data to the terminal device;

[0029] The terminal device compares the first instruction data sent and the first instruction data received, and compares the second instruction data sent and the second instruction data received, to determine a test result of the device under test.

[0030] Optionally, the test system further includes a proprietary protocol conversion device, wherein:

[0031] The method further includes: the terminal device sending a first target instruction to the private protocol conversion device, wherein the first target instruction is used to instruct to open a data transmission channel between the TRX pin and the VIN pin;

[0032] The private protocol conversion device converts the format of the first target instruction into a format recognizable by the charging management unit, and sends the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

[0033] Optionally, the test system further includes a switch, one end of which is connected to the TRX pin of the charging management unit, wherein:

[0034] The method further includes: when the second USB to TTL device is used to transmit the first instruction data, the terminal device controls the other end of the switch to be connected to the RX pin of the second USB to TTL device;

[0035] In a case where the second USB-to-TTL device is used to transmit the second instruction data, the terminal device controls the other end of the switch to be connected to the TX pin of the second USB-to-TTL device.

[0036] The test system provided by the present disclosure can complete the test of the device under test by only utilizing the charging management unit of the device under test, without requiring the participation of the control unit of the device under test and without occupying the resources of the control unit.

[0037] Features and advantages of the embodiments of the present specification will become apparent from the following detailed description of exemplary embodiments of the present specification with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the specification and, together with the description, serve to explain the principles of the embodiments of the specification.

[0039] Figure 1 is a structural block diagram of a test system according to an embodiment of the present invention.

[0040] Figure 2 is a structural block diagram of a test system according to an embodiment of the present invention.

[0041] Figure 3 FIG. 1 is a circuit diagram of a test system according to an embodiment of the present invention.

[0042] Figure 4is a processing flow chart of a testing method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0043] Various exemplary embodiments of the present specification will now be described in detail with reference to the accompanying drawings.

[0044] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the embodiments of this specification, its application, or uses.

[0045] It should be noted that like reference numerals and letters refer to like items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0046] To solve the above technical problems, an embodiment of the present disclosure provides a testing system. When testing a device under test, the test of the device under test can be completed by using only the charging management unit of the device under test, without the participation of the control unit of the device under test and no longer occupying the resources of the control unit.

[0047] An embodiment of the present invention provides a testing system. Figure 1 As shown, the test system 100 includes: a terminal device 110 , a first USB to TTL device 120 , and a second USB to TTL device 130 .

[0048] Figure 1 The device under test 200 is also shown, and the device under test 200 includes a charging management unit 210. The device under test also includes a control unit ( Figure 1 (not shown). The control unit may be an MCU.

[0049] Testing of the device under test (DUT) includes SMT (Surface Mount Technology) testing, which involves testing the communication between the assembled MCU and the charging management unit. For example, the DUT is an earphone box.

[0050] according to Figure 1 As shown, the terminal device 110 is configured to send first instruction data to the charging management unit 210 via the first USB-to-TTL device 120 when the data transmission channel between the TRX pin and the VIN pin of the charging management unit 210 of the device under test 200 is enabled, so that the charging management unit 210 sends the received first instruction data to the second USB-to-TTL device 130 via the data transmission channel. The second USB-to-TTL device 130 is configured to send the received first instruction data to the terminal device 110.

[0051] When the charging management unit 210 opens the data transmission channel between the TRX pin and the VIN pin, the charging management unit 210 enters TRX mode. TRX mode means that the charging management unit can communicate with other devices to exchange data, allowing the charging management unit to perform not only charging but also data transmission.

[0052] The first command data received by the first USB-to-TTL device 120 is a USB signal. The first USB-to-TTL device 120 is configured to convert the USB signal corresponding to the first command data into a TTL signal, and then transmit the TTL signal corresponding to the first command data to the charging management unit 210. The charging management unit 210 transmits the TTL signal corresponding to the received first command data to the second USB-to-TTL device 130 via a data transmission channel. The first command data received by the second USB-to-TTL device 130 is a TTL signal. The second USB-to-TTL device 130 is configured to convert the TTL signal corresponding to the first command data into a USB signal, and then transmit the USB signal corresponding to the first command data to the terminal device 110.

[0053] The TX pin and the RX pin of the first USB to TTL device 120 are both connected to the VIN pin of the charging management unit 210. The first instruction data is transmitted through the connection between the TX pin of the first USB to TTL device and the VIN pin of the charging management unit.

[0054] The terminal device 110 is further configured to send second instruction data to the charging management unit 210 via the second USB-to-TTL device 130, so that the charging management unit 210 sends the received second instruction data to the first USB-to-TTL device 120 via the data transmission channel. The first USB-to-TTL device 120 is configured to send the received second instruction data to the terminal device 110.

[0055] The second command data received by the second USB-to-TTL device 130 is a USB signal. The second USB-to-TTL device 130 is configured to convert the USB signal corresponding to the second command data into a TTL signal, and then transmit the TTL signal corresponding to the second command data to the charging management unit 210. The charging management unit 210 transmits the TTL signal corresponding to the received second command data to the first USB-to-TTL device 120 via the data transmission channel. The second command data received by the first USB-to-TTL device 120 is a TTL signal. The first USB-to-TTL device 120 is configured to convert the TTL signal corresponding to the second command data into a USB signal, and then transmit the USB signal corresponding to the second command data to the terminal device 110.

[0056] The transmission of the second command data is achieved by connecting the RX pin of the first USB to TTL device 120 to the VIN pin of the charging management unit.

[0057] The first USB-to-TTL device 120 and the second USB-to-TTL device 130 can both convert USB signals into TTL signals or convert TTL signals into USB signals.

[0058] The first instruction data and the second instruction data may be the same or different.

[0059] The terminal device 110 is used to compare the sent first instruction data with the received first instruction data, and to compare the sent second instruction data with the received second instruction data, to determine the test result of the device under test.

[0060] In some embodiments, the terminal device 110 is further configured to determine that the test result of the device under test is unqualified when it is determined that the first command data issued and the first command data received are inconsistent, and / or when the second command data issued and the second command data received are inconsistent. In other words, regardless of whether the command data issued by the terminal device is sent to the first USB-to-TTL device or the command data issued by the terminal device is sent to the second USB-to-TTL device, as long as there is an inconsistency between the command data issued by the terminal device and the command data received by the terminal device, the test result of the device under test is determined to be unqualified.

[0061] In some embodiments, according to Figure 2 As shown, the test system 100 further includes a proprietary protocol conversion device 140 .

[0062] The terminal device 110 is configured to send a first target instruction to the proprietary protocol conversion device 140. The first target instruction is configured to instruct the activation of a data transmission channel between the TRX pin and the VIN pin. The proprietary protocol conversion device 140 is configured to convert the format of the first target instruction into a format recognizable by the charging management unit 210 and send the converted first target instruction to the charging management unit 210, instructing the charging management unit 210 to activate the data transmission channel between the TRX pin and the VIN pin.

[0063] The first target instruction received by the proprietary protocol conversion device 140 is a USB signal. The proprietary protocol conversion device 140 is used to convert the USB signal corresponding to the first target instruction into a TTL signal, and then convert the TTL signal into a signal corresponding to a format recognizable by the charging management unit 210.

[0064] The terminal device 110 is further configured to, upon completion of testing the device under test, send a second target instruction to the proprietary protocol converter 140. The second target instruction is configured to instruct the disconnection of the data transmission channel between the TRX pin and the VIN pin. The proprietary protocol converter 140 is configured to convert the format of the second target instruction into a format recognizable by the charging management unit 210 and send the converted second target instruction to the charging management unit 210, instructing the charging management unit 210 to disconnect the data transmission channel between the TRX pin and the VIN pin.

[0065] The second target instruction received by the proprietary protocol conversion device 140 is a USB signal. The proprietary protocol conversion device 140 is used to convert the USB signal corresponding to the second target instruction into a TTL signal, and then convert the TTL signal into a signal corresponding to a format recognizable by the charging management unit 210.

[0066] In this way, the data transmission channel between the TRX pin and the VIN pin in the charging management unit can be opened and closed by the test system without the participation of the control unit in the device under test.

[0067] In some embodiments, according to Figure 2 As shown, the test system further includes a switch 150 . The switch 150 is, for example, a relay. The terminal device 110 is connected to the switch 150 .

[0068] One end of the switch is connected to the TRX pin of the charge management unit. The terminal device is configured to control the other end of the switch to switch to connect to the RX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the first command data. The terminal device is configured to control the other end of the switch to switch to connect to the TX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the second command data.

[0069] In this embodiment, the test system further includes a first pull-up resistor and a second pull-up resistor. One end of the first pull-up resistor is connected to the TX pin of the second USB-to-TTL device, and the other end of the first pull-up resistor is connected to the VCC pin of the second USB-to-TTL device. One end of the second pull-up resistor is connected to the RX pin of the second USB-to-TTL device, and the other end of the second pull-up resistor is connected to the VCC pin of the second USB-to-TTL device.

[0070] The resistance of the first pull-up resistor is smaller than the resistance of the second pull-up resistor. For example, the first pull-up resistor is a resistor with a resistance less than or equal to 1K, and the second pull-up resistor is a resistor with a resistance greater than or equal to 20K.

[0071] In this way, the level requirements of the charging management unit for transmitting the first instruction data and the second instruction data in the TRX mode can be met.

[0072] Figure 3 FIG. 1 is a circuit diagram of a test system according to an embodiment of the present invention. Figure 3 As shown, the test system 100 includes a terminal device 110 , a first USB to TTL device 120 , a second USB to TTL device 130 , a proprietary protocol converter 140 , a relay 150 , a first pull-up resistor 160 , and a second pull-up resistor 170 .

[0073] Figure 3 The device under test 200 is also shown. The device under test 200 includes a charging management unit 210 and a control unit 220. The control unit 220 may be an MCU. The control unit 220 is connected to the I 2 The C interface communicates with the charging management unit 210 .

[0074] In this embodiment, when the device under test is tested, the control unit 220 does not need to be involved.

[0075] according to Figure 3 As shown, the terminal device 110 is connected to the proprietary protocol converter 140. The CMD pin of the proprietary protocol converter 140 is connected to the VIN pin of the charging management unit 210. Through the connection between the CMD pin of the proprietary protocol converter 140 and the VIN pin of the charging management unit 210, the first target instruction and the second target instruction are transmitted, thereby enabling or disconnecting the data transmission channel between the TRX pin and the VIN pin of the charging management unit 210.

[0076] according to Figure 3 As shown, the terminal device 110 is connected to the first USB to TTL device 120 and the second USB to TTL device 130 .

[0077] according to Figure 3 As shown, the TX pin and the RX pin of the first USB to TTL device 120 are both connected to the VIN pin of the charge management unit 210 . The GND pin of the first USB to TTL device 120 is connected to the GND pin of the charge management unit 210 .

[0078] according to Figure 3 As shown, the terminal device 110 is connected to the relay 150. The TRX pin of the first USB-to-TTL device 120 is connected to the COM pin of the relay 150. The COM1 pin of the relay 150 is connected to the TX pin of the second USB-to-TTL device 130. The COM2 pin of the relay 150 is connected to the RX pin of the second USB-to-TTL device 130.

[0079] The terminal device 110 is configured to connect the COM pin of the control relay to the COM2 pin when the second USB-to-TTL device 130 is configured to transmit the first instruction data.

[0080] The terminal device 110 is configured to connect the COM pin of the control relay to the COM1 pin when the second USB-to-TTL device 130 is configured to transmit the second instruction data.

[0081] according to Figure 3 As shown, one end of a first pull-up resistor 160 is connected to the TX pin of the second USB-to-TTL device 130, and the other end of the first pull-up resistor 160 is connected to the VCC pin of the second USB-to-TTL device 130. One end of a second pull-up resistor 170 is connected to the RX pin of the second USB-to-TTL device 130, and the other end of the second pull-up resistor 170 is connected to the VCC pin of the second USB-to-TTL device 130. The resistance of the first pull-up resistor 160 is 1K. The resistance of the second pull-up resistor 170 is 20K.

[0082] One embodiment of the present invention provides a testing method. The method is applied to a testing system. The testing system includes: a terminal device, a first USB to TTL device, and a second USB to TTL device.

[0083] according to Figure 4 As shown, the testing method includes steps S410 to S450.

[0084] In step S410, when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is opened, the terminal device sends first instruction data to the charging management unit through the first USB to TTL device, so that the charging management unit sends the received first instruction data to the second USB to TTL device through the data transmission channel.

[0085] In step S420 , the second USB-to-TTL device sends the received first instruction data to the terminal device.

[0086] In step S430 , the terminal device sends second instruction data to the charging management unit through the second USB to TTL device, so that the charging management unit sends the received second instruction data to the first USB to TTL device through the data transmission channel.

[0087] In step S440 , the first USB-to-TTL device sends the received second instruction data to the terminal device.

[0088] In step S450 , the terminal device compares the first instruction data sent and the first instruction data received, and compares the second instruction data sent and the second instruction data received, to determine a test result of the device under test.

[0089] In some embodiments, the test system further includes a proprietary protocol conversion device.

[0090] In this embodiment, the method also includes: the terminal device sends a first target instruction to a private protocol conversion device, wherein the first target instruction is used to instruct the opening of a data transmission channel between the TRX pin and the VIN pin; the private protocol conversion device converts the format of the first target instruction into a format recognizable by the charging management unit, and sends the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

[0091] In this embodiment, the method also includes: the terminal device is further used to send a second target instruction to a private protocol conversion device when the test of the device to be tested is completed, wherein the second target instruction is used to instruct to disconnect the data transmission channel between the TRX pin and the VIN pin; the private protocol conversion device is used to convert the format of the second target instruction into a format recognizable by the charging management unit, and send the second target instruction after format conversion to the charging management unit, so that the charging management unit disconnects the data transmission channel between the TRX pin and the VIN pin.

[0092] In some embodiments, the test system further includes a switch, one end of which is connected to the TRX pin of the charging management unit.

[0093] In this embodiment, the method also includes: when the second USB to TTL device is used to transmit the first instruction data, the terminal device controls the other end of the switching switch to switch to be connected to the RX pin of the second USB to TTL device; when the second USB to TTL device is used to transmit the second instruction data, the terminal device controls the other end of the switching switch to switch to be connected to the TX pin of the second USB to TTL device.

[0094] The various embodiments in this specification are described in a progressive manner. The same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments. For the device embodiments, the relevant parts can be referred to the partial description of the method embodiments.

[0095] The foregoing description of this specification describes specific embodiments. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be performed in an order different from that described in the embodiments and still achieve the desired results. Furthermore, the processes depicted in the accompanying drawings do not necessarily require the specific order shown or the sequential order to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0096] The embodiments of this specification may be systems, methods, and / or computer program products. The computer program product may include a computer-readable storage medium carrying computer instructions for causing a processor to implement various aspects of the embodiments of this specification.

[0097] A computer-readable storage medium can be a tangible device that can retain and store computer instructions for use by a computer instruction execution device. A computer-readable storage medium can be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punched card or raised-in-groove structure on which computer instructions are stored, and any suitable combination thereof. As used herein, a computer-readable storage medium is not to be construed as a transient signal per se, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., a light pulse through a fiber-optic cable), or an electrical signal transmitted through an electrical wire.

[0098] The computer instructions described herein can be downloaded from a computer-readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device via a network layer, such as the Internet, a local area network, a wide area network, and / or a wireless network. The network layer can include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. A network layer adapter card or network layer interface in each computing / processing device receives computer instructions from the network layer and forwards the computer instructions for storage in a computer-readable storage medium in each computing / processing device.

[0099] The flowcharts and block diagrams in the accompanying drawings show the possible implementation architectures, functions and operations of the systems, methods and computer program products according to multiple embodiments of this specification. In this regard, each box in the flowchart or block diagram can represent a module, program segment or part of a computer instruction, and the module, program segment or part of a computer instruction contains one or more executable computer instructions for implementing the specified logical function. In some alternative implementations, the functions marked in the box can also occur in an order different from that marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of boxes in the block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or can be implemented using a combination of dedicated hardware and computer instructions. It is well known to those skilled in the art that implementation by hardware, implementation by software, and implementation by a combination of software and hardware are all equivalent.

[0100] The embodiments of the present specification have been described above. The above description is illustrative and not exhaustive, and is not limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope of the described embodiments. The terminology used herein is selected to best explain the principles of the embodiments, their practical applications, or improvements to existing technologies, or to enable others skilled in the art to understand the embodiments disclosed herein.

Claims

1. A testing system, characterized in that: include: Terminal equipment, a first USB to TTL device, a second USB to TTL device, wherein: The terminal device is configured to, when the data transmission channel between the TRX pin and the VIN pin of the charge management unit of the device under test is opened, send first instruction data to the charge management unit through the first USB-to-TTL device, so that the charge management unit sends the received first instruction data to the second USB-to-TTL device through the data transmission channel; The second USB to TTL device is used to send the received first instruction data to the terminal device; The terminal device is further configured to send second instruction data to the charging management unit via the second USB to TTL device, so that the charging management unit sends the received second instruction data to the first USB to TTL device via the data transmission channel; The first USB to TTL device is used to send the received second instruction data to the terminal device; The terminal device is used to compare the first instruction data sent and the first instruction data received, and to compare the second instruction data sent and the second instruction data received, to determine the test result of the device under test, The terminal device is further configured to determine that the test result of the device under test is unqualified when it is determined that the first instruction data sent and the first instruction data received are inconsistent, and / or that the second instruction data sent and the second instruction data received are inconsistent.

2. The test system according to claim 1, wherein: The test system also includes a proprietary protocol conversion device, wherein: The terminal device is used to send a first target instruction to the private protocol conversion device, wherein the first target instruction is used to instruct to open a data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device is used to convert the format of the first target instruction into a format recognizable by the charging management unit, and send the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

3. The test system according to claim 2, wherein: The terminal device is further configured to send a second target instruction to the proprietary protocol conversion device when the test of the device under test is completed, wherein the second target instruction is used to instruct to disconnect the data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device is used to convert the format of the second target instruction into a format recognizable by the charging management unit, and send the second target instruction after format conversion to the charging management unit, so that the charging management unit disconnects the data transmission channel between the TRX pin and the VIN pin.

4. The test system according to claim 1, wherein: The test system further includes a switch, wherein one end of the switch is connected to the TRX pin of the charging management unit. The terminal device is configured to control the other end of the switch to be connected to the RX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the first instruction data; The terminal device is used to control the other end of the switch to be connected to the TX pin of the second USB-to-TTL device when the second USB-to-TTL device is used to transmit the second instruction data.

5. The test system according to claim 4, characterized in that: The test system further includes a first pull-up resistor and a second pull-up resistor, wherein: One end of the first pull-up resistor is connected to the TX pin of the second USB-to-TTL device, and the other end of the first pull-up resistor is connected to the VCC pin of the second USB-to-TTL device. One end of the second pull-up resistor is connected to the RX pin of the second USB to TTL device, and the other end of the second pull-up resistor is connected to the VCC pin of the second USB to TTL device. The resistance of the first pull-up resistor is smaller than the resistance of the second pull-up resistor.

6. The test system according to claim 1, wherein: The TX pin and the RX pin of the first USB to TTL device are both connected to the VIN pin of the charging management unit.

7. A testing method, characterized in that: Applied to a test system, the test system includes: a terminal device, a first USB to TTL device, a second USB to TTL device, wherein, The method includes: when the data transmission channel between the TRX pin and the VIN pin of the charging management unit of the device under test is opened, the terminal device sends first instruction data to the charging management unit through the first USB to TTL device, so that the charging management unit sends the received first instruction data to the second USB to TTL device through the data transmission channel; The second USB to TTL device sends the received first instruction data to the terminal device; The terminal device sends second instruction data to the charging management unit through the second USB to TTL device, so that the charging management unit sends the received second instruction data to the first USB to TTL device through the data transmission channel; The first USB to TTL device sends the received second instruction data to the terminal device; The terminal device compares the first instruction data issued and the first instruction data received, and compares the second instruction data issued and the second instruction data received to determine the test result of the device under test. When the terminal device determines that the first instruction data issued and the first instruction data received are inconsistent, and / or that the second instruction data issued and the second instruction data received are inconsistent, the terminal device determines that the test result of the device under test is unqualified.

8. The method according to claim 7, characterized in that The test system also includes a proprietary protocol conversion device, wherein: The method further includes: the terminal device sending a first target instruction to the private protocol conversion device, wherein the first target instruction is used to instruct to open a data transmission channel between the TRX pin and the VIN pin; The private protocol conversion device converts the format of the first target instruction into a format recognizable by the charging management unit, and sends the first target instruction after format conversion to the charging management unit, so that the charging management unit opens the data transmission channel between the TRX pin and the VIN pin.

9. The method according to claim 7, characterized in that The test system further includes a switch, one end of which is connected to the TRX pin of the charging management unit, wherein: The method further includes: when the second USB to TTL device is used to transmit the first instruction data, the terminal device controls the other end of the switch to be connected to the RX pin of the second USB to TTL device; In a case where the second USB-to-TTL device is used to transmit the second instruction data, the terminal device controls the other end of the switch to be connected to the TX pin of the second USB-to-TTL device.

Images