Estimation value display device, estimation value display method, and estimation value display program

Abstract

A receiving unit (34) receives a range of values of one or more parameters that affect a phenomenon occurring in a product for one or more materials selected from a plurality of types of materials that are registered in advance as candidates for materials used in the product. The calculation unit (36) calculates a result of a simulation or experiment of a value indicating a phenomenon occurring in a product when the value of each of a plurality of parameters that affect the phenomenon occurring in the product has been changed. A calculation unit that calculates, as explanatory variables, an estimated value of a value indicating a phenomenon occurring in the product, the estimated value corresponding to each of the plurality of values, with a plurality of values included in a statistical model input accepted range, which is created using a portion of the plurality of parameters as explanatory variables and a result as a target variable; a display control unit (38) performs control so as to display, on a display device, an image in which the calculated estimated value is associated with each of the plurality of values.

Description

Technical Field

[0001] The present disclosure relates to an estimated value display device, an estimated value display method, and an estimated value display program. Background Art

[0002] Conventionally, in the case of selecting materials used in manufacturing a product, for example, according to the design of the product and the physical properties of the materials used, phenomena generated in the product are confirmed through simulation.

[0003] For example, a method for selecting materials for a panel used in manufacturing a semiconductor package has been proposed, that is, a method for selecting materials capable of manufacturing a panel with a sufficiently small amount of warpage (see Patent Document 1). The method described in Patent Document 1 relates to a method for selecting materials for a panel having a back coating, a plurality of semiconductor elements, a sealing layer, and an insulating layer. This method uses structural analysis software to construct a virtual model of the panel input with the characteristics of the materials constituting the back coating, the sealing layer, and the insulating layer. In addition, in this method, the amount of warpage of the virtual model is calculated, and the characteristics of the materials in the materials constituting the back coating, the sealing layer, and the insulating layer that affect the amount of warpage of the panel are grasped through structural analysis. And, based on the information grasped, at least one of the materials constituting the back coating, the sealing layer, and the insulating layer is reselected to reduce the amount of warpage of the virtual model.

[0004] [Prior Art Documents]

[0005] [Patent Documents]

[0006] [Patent Document 1] Japanese Unexamined Patent Application Publication No. 2020-38924 Summary of the Invention

[0007] [Technical Problem to be Solved by the Invention]

[0008] Phenomena generated in a product are affected by various parameters related to the product. Therefore, set values for each parameter to simulate the phenomena. When the product is a package substrate, the thickness of the substrate, the size of the substrate, the size of the chip mounted on the substrate, the type of material used, the number of stacked layers, etc. become parameters.

[0009] When confirming the phenomena generated in a product, compared with the case of confirming for a single mode in which specific values are set for each parameter, the case of confirming the phenomena for multiple modes in which multiple different values are set for each parameter is more common. In this case, since there are many types of parameters, due to the combinatorial explosion of the values of each parameter, a large number of modes are simulated separately. Therefore, it takes time to present the simulation results for confirming the tendency. For example, when evaluating the tendency of phenomena through communication with customers, the simulation results cannot be provided to the customers in a timely manner.

[0010] The present disclosure has been made in view of the above points, and an object thereof is to provide an estimated value display device, method, and program that can shorten the calculation time and promptly display an estimated value of a tendency of a phenomenon generated in a product with respect to a change in the value of a parameter.

[0011] [Means for Solving Technical Problems]

[0012] To achieve the above object, the estimated value display device of the present disclosure is configured to include: a reception unit that receives ranges of values of one or more parameters that affect a phenomenon generated in the product for one or more materials selected from a plurality of materials pre-registered as candidates for materials used in the product; a calculation unit that, based on the results of simulation or experiment of values representing the phenomenon generated in the product when values of a plurality of parameters that affect the phenomenon generated in the product are changed, inputs, as explanatory variables, the plurality of values included in the ranges received by the reception unit into a statistical model created by using a part of the plurality of parameters as explanatory variables and the results as target variables, and calculates estimated values of values representing the phenomenon generated in the product corresponding to the plurality of values; and a display control unit that controls to display, on a display device, an image in which the estimated values calculated by the calculation unit are respectively associated with the plurality of values. Thereby, it is possible to shorten the calculation time and promptly display the tendency of the phenomenon generated in the product with respect to the change in the value of the parameter.

[0013] In addition, the one or more parameters are parameters selected from the plurality of parameters as explanatory variables of the statistical model. Thereby, a simple statistical model can be generated, and even when values of the parameters are set to a plurality of values to confirm the tendency of the phenomenon, the calculation time for calculating the estimated value of the phenomenon can be shortened.

[0014] Alternatively, the reception unit may display, for each of the one or more parameters, a reception screen including a designation area for receiving the range of the value, and receive the range of the value. Alternatively, the reception unit may display the reception screen further including a selection area for selecting the one or more materials from the plurality of pre-registered materials. Thereby, the user can confirm the image representing the tendency of the phenomenon by inputting only the minimum necessary information into the reception screen.

[0015] In addition, it may also be that the receiving unit receives the ranges of the values respectively related to the first parameter and the second parameter, the calculating unit calculates the estimated value corresponding to each value among the multiple values related to the second parameter for each value among the multiple values related to the first parameter, and the display control unit creates and displays an image in which the estimated value is associated with each value among the multiple values related to the first parameter for each value among the multiple values related to the second parameter. Thus, it is possible to confirm the combination of the tendency of the phenomenon with respect to the first parameter and the tendency of the phenomenon with respect to the second parameter.

[0016] Alternatively, it may also be that the receiving unit displays a receiving screen including a display component for designating any one of the multiple values related to the second parameter, and receives the value of the second parameter designated by operating the display component, and the display control unit switches and displays a plurality of images created for each value among the multiple values related to the second parameter according to the value of the second parameter received by the receiving unit. Thus, it becomes easier to confirm the tendency of the phenomenon with respect to the second parameter.

[0017] In addition, the estimated value display device of the present disclosure may also be configured to include a creating unit that creates the statistical model with a part of the multiple parameters as explanatory variables and the result as an objective variable based on the result of simulation or experiment of the value representing the phenomenon generated in the product.

[0018] In addition, when the product is a semiconductor package, the phenomenon is warping of the product, stress of the product, or the life of solder in the product.

[0019] In addition, the estimated value display method of the present disclosure is as follows: the receiving unit receives the ranges of one or more parameter values that affect the phenomenon generated in the product for one or more materials selected from a plurality of materials pre-registered as candidates for the materials used in the product; the calculating unit inputs the multiple values included in the ranges received by the receiving unit as explanatory variables into the statistical model created with a part of the multiple parameters as explanatory variables and the result as an objective variable based on the result of simulation or experiment of the value representing the phenomenon generated in the product when the values of the multiple parameters that affect the phenomenon generated in the product are changed, and calculates the estimated values of the values representing the phenomenon generated in the product corresponding to the multiple values respectively; the display control unit controls to display an image in which the estimated values calculated by the calculating unit are respectively associated with the multiple values in the display device.

[0020] In addition, the estimated value display program of the present disclosure causes a computer to function as a reception unit, a calculation unit, and a display control unit. The reception unit receives the ranges of values of one or more parameters that affect the phenomenon generated in the product for one or more materials selected from among a plurality of materials pre-registered as candidates for the materials used in the product. The calculation unit inputs, as explanatory variables, the plurality of values included in the ranges received by the reception unit into a statistical model created by using a part of the plurality of parameters as explanatory variables and the result as an objective variable, and calculates estimated values of the values representing the phenomenon generated in the product corresponding to the plurality of values, based on the results of simulation or experiment of the values representing the phenomenon generated in the product when the values of the plurality of parameters affecting the phenomenon generated in the product are changed. The display control unit controls to display, on a display device, an image in which the estimated values calculated by the calculation unit are respectively associated with the plurality of values. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is a block diagram showing the hardware configuration of the estimated value display device according to the present embodiment.

[0022] Figure 2 is a block diagram showing an example of the functional configuration of the estimated value display device according to the present embodiment.

[0023] Figure 3 is a diagram showing an example of simulation results.

[0024] Figure 4 is a diagram for explaining the creation of a statistical model.

[0025] Figure 5 is a diagram showing an example of a reception display screen.

[0026] Figure 6 is a diagram showing an example of a material DB.

[0027] Figure 7 is a diagram showing an example of a reception display screen.

[0028] Figure 8 is a diagram for explaining the switching of the display of a curve graph.

[0029] Figure 9 is a flowchart showing the flow of a production process.

[0030] Figure 10 is a flowchart showing the flow of a display process.

[0031] Figure 11 is a diagram showing an example of the display of a curve graph in Modification 3.

[0032] Figure 12 This is a block diagram showing the schematic configuration of the estimated value display system according to Modification 5. Detailed implementation

[0033] Hereinafter, an example of this embodiment will be described with reference to the accompanying drawings.

[0034] Figure 1 This is a block diagram showing the hardware configuration of the estimated value display device 10 according to this embodiment. As Figure 1 shown, the estimated value display device 10 includes a CPU (Central Processing Unit) 12, a memory 14, a storage device 16, an input device 18, an output device 20, a storage medium reading device 22, and a communication I / F (Interface) 24. Each component is connected via a bus 26 so as to be able to communicate with each other.

[0035] An estimated value display program for executing the production process and display process described later is stored in the storage device 16. The CPU 12 is a central arithmetic processing unit that executes various programs and controls each structure. That is, the CPU 12 reads a program from the storage device 16 and executes the program using the memory 14 as a work area. The CPU 12 controls the above-mentioned respective structures and performs various arithmetic processes according to the program stored in the storage device 16.

[0036] The memory 14 is composed of a RAM (Random Access Memory) and temporarily stores programs and data as a work area. The storage device 16 is composed of a ROM (Read Only Memory), an HDD (Hard Disk Drive), an SSD (Solid State Drive), etc., and stores various programs including an operating system and various data.

[0037] The input device 18 is, for example, a device for performing various inputs such as a keyboard and a mouse. The output device 20 is, for example, a device for outputting various information such as a display and a printer. As the output device 20, a touch panel display can also be used to function as the input device 18.

[0038] The storage medium reading device 22 reads data stored in various storage media such as CD (Compact Disc)-ROM, DVD (Digital Versatile Disc)-ROM, Blu-ray Disc, and USB (Universal Serial Bus) memory, and writes data to the storage medium. The communication I / F 24 is an interface for communicating with other devices and uses standards such as Ethernet (registered trademark), FDDI, or Wi-Fi (registered trademark).

[0039] Next, the functional configuration of the estimated value display device 10 of the present embodiment will be described. In the following embodiments, the following case will be taken as an example: the product as an object is a semiconductor package, and as a phenomenon occurring in the product, the tendency of warping of the semiconductor package substrate is estimated and displayed.

[0040] Figure 2 It is a block diagram showing an example of the functional configuration of the estimated value display device 10. As Figure 2 shown, the estimated value display device 10 includes a production unit 32, a reception unit 34, a calculation unit 36, and a display control unit 38 as functional configurations. In addition, a statistical model 40 and a material DB (database) 42 are stored in a prescribed storage area of the estimated value display device 10. Each functional configuration is realized by the CPU 12 reading the estimated value display program stored in the storage device 16 and expanding and executing it in the memory 14.

[0041] The production unit 32 obtains the results obtained by simulating the warping of the semiconductor package substrate using simulation software. Figure 3 It shows an example of the simulation results. In the simulation results, it includes the values of the respective parameters set to different multiple values as the values of the respective parameters affecting the warping of the semiconductor package substrate in each of the multiple modes, and the warping amount simulated for that mode. Figure 3 The parameters 1, 2, 3, etc. in are the thickness of the substrate, the size of the substrate, the size of the chip mounted on the substrate, the type of material used, the number of stacked layers, the Young's modulus of the material, the coefficient of thermal expansion, etc.

[0042] The production unit 32 selects the parameters that become the explanatory variables of the statistical model 40 to be produced from the parameters included in the obtained simulation results. The production unit 32 selects, for example, the parameters specified by the user. As Figure 4 shown, the production unit 32 uses the selected parameters included in the simulation results as explanatory variables and the warping amount included in the simulation results as the target variable to produce the statistical model 40.

[0043] Specifically, the production department 32 sets each value of the parameters selected as explanatory variables as x1, x2, ..., sets the warpage amount as y, and produces a function f of y = f(x1, x2, ...) as the statistical model 40. The statistical model 40 can be a machine learning model using multiple regression analysis, deep neural network, etc. More specifically, the production department 32 repeatedly updates the weights of the statistical model 40 until an end condition is satisfied in such a manner that the error between the estimated value calculated by inputting x1, x2, ... into the statistical model 40 and the warpage amount y included in the simulation result is minimized. The end condition can be set to a case where the number of weight updates reaches a specified number, a case where the error becomes less than or equal to a specified value, a case where the error converges, etc. The production department 32 stores the produced statistical model 40 in a specified storage area of the estimated value display device 10.

[0044] The reception department 34 receives designation information for confirming the tendency of warpage of the semiconductor package substrate. Specifically, the reception department 34 displays the reception display screen 50 as shown in Figure 5 on the display and receives the designation information. Figure 5 The reception display screen 50 in the example of includes a first designation area 52, a second designation area 54, a slider 56, a material selection area 58, a display button 60, a save button 62, and a display area 64.

[0045] As described later, in the present embodiment, the tendency of the warpage amount is displayed as a graph with the value of the designated first parameter taken as the X-axis and the warpage amount taken as the Y-axis. In addition, in the present embodiment, a plurality of graphs representing the tendency of the warpage amount are produced for each value of the designated second parameter. The first designation area 52 is an area for designating the first parameter, and the second designation area 54 is an area for designating the second parameter.

[0046] The first designation area 52 includes an input area 52A for inputting the parameter name, an input area 52B for inputting the minimum value of the range of the parameter value, an input area 52C for inputting the maximum value of the range, and an input area 52D for inputting how many values are taken within the designated range. The second designation area 54 similarly includes an input area 54A, an input area 54B, an input area 54C, and an input area 54D. Each input area can be a text box for directly inputting the designation content, a drop-down menu for selecting the designation content from predetermined options, etc. In addition, how many values are taken within the designated range is not limited to the case designated by the user in the reception display screen 50. For example, a predetermined number of points can be taken. In this case, the input area 52D and the input area 54D can be omitted.

[0047] The slider 56 is a display component for specifying the value of a second parameter corresponding to any point within the specified range. For example, assume that the size of the substrate is specified as the second parameter, the minimum value is set to 60 mm and the maximum value is set to 100 mm as the value range, and three values within the range are specified. In this case, as Figure 5 shown, the reception unit 34 sets 60, 80, and 100 as the scales of the slider 56. By aligning the marker of the slider 56 with any scale, the value of the second parameter is specified.

[0048] The material selection area 58 is an area for selecting a material from the materials pre-registered in the material DB 42 for which the tendency of the warpage amount of the substrate is to be confirmed. In Figure 5 the example, the material names of the pre-registered materials are displayed in a list, and check boxes are provided corresponding to each material name. By checking the check box, the material corresponding to the check box is selected. The selected material can be one kind or multiple kinds.

[0049] Here, Figure 6 an example of the material DB 42 is shown. In Figure 6 the example, in the material DB 42, for each material, the "material name" of the material is stored in correspondence with physical property values such as "Young's modulus" and "thermal expansion rate". In addition, instead of the material name, or together with the material name, the product model name and number, unique identification number, etc. of the material can also be used.

[0050] The display button 60 is a button that is selected when the above-described curve graph is displayed based on the specified information specified in the first specified area 52, the second specified area 54, the slider 56, and the material selection area 58. The save button 62 is a button that is selected when at least one of the data of the estimated value of the warpage amount calculated by the calculation unit 36 described later and the image of the curve graph generated by the display control unit 38 described later is saved in a specified storage area. It is also possible to select whether to save the data of the estimated value, save the image of the curve graph, or save both when saving the data. In addition, a button for outputting the data of the estimated value of the warpage amount in a csv (Comma Separated Values) file or the like can also be provided. The display area 64 is an area for displaying a curve graph based on the specified information specified in the first specified area 52, the second specified area 54, the slider 56, and the material selection area 58.

[0051] When the display button 60 is selected on the acceptance display screen 50, the calculation unit 36 inputs, as explanatory variables, multiple values respectively related to the first parameter and the second parameter included in the specified information accepted by the acceptance unit 34 into the statistical model 40 produced by the production unit 32. For example, the thickness of the specified substrate is designated as the first parameter, the minimum value 800 μm and the maximum value 1600 μm are designated as the value range, and 5 values are taken within the range. In this case, the calculation unit 36 inputs 800, 1000, 1200, 1400, and 1600 as multiple values related to the first parameter into the statistical model 40. Additionally, regarding the second parameter, in the same example as the one used in the description of the slider 56, the calculation unit 36 inputs 60, 80, and 100 as multiple values related to the second parameter into the statistical model 40.

[0052] In addition, the calculation unit 36 sets the values of other parameters that are included as explanatory variables of the statistical model 40 and are not designated as the first parameter and the second parameter. Regarding the setting of the values of other parameters, either the designation of a fixed value can be accepted from the user, or a predetermined value can be set. Furthermore, in the case where the physical property value of the material is included as other parameters, the calculation unit 36 acquires the physical property value related to the selected material from the material DB 42 and sets it as the value of other parameters.

[0053] Then, the calculation unit 36 calculates the estimated values of the warpage amounts of the substrates respectively corresponding to the multiple values related to the first parameter and the second parameter by obtaining the output of the statistical model 40. Specifically, the calculation unit 36 calculates the estimated value corresponding to each value among the multiple values related to the first parameter for each value among the multiple values related to the second parameter.

[0054] The display control unit 38 creates an image that correlates the estimated values of the warpage amounts calculated by the calculation unit 36 with each value among the multiple values related to the first parameter for each value among the multiple values related to the second parameter. Specifically, the display control unit 38 creates a curve graph in which the multiple values of the first parameter are taken on the X-axis and the estimated values of the warpage amounts are taken on the Y-axis for each value of the second parameter. Then, the display control unit 38 displays the curve graph corresponding to the value of the second parameter specified by the slider 56 in the created curve graphs as Figure 7 shown in the display area 64 of the acceptance display screen 50. Whenever the display control unit 38 changes the specified value of the second parameter using the slider 56, as Figure 8 shown, it switches the curve graph displayed in the display area 64. Additionally, the display area 64 is not limited to being displayed within the acceptance display screen 50, and it can also be displayed through another window overlapping the acceptance display screen 50.

[0055] Next, the operation of the estimated value display device 10 of the present embodiment will be described.

[0056] Figure 9 is a flowchart showing the process flow of the production process executed by the CPU 12 of the estimated value display device 10. In addition, Figure 10 is a flowchart showing the process flow of the display process executed by the CPU 12 of the estimated value display device 10. The CPU 12 reads the estimated value display program from the storage device 16, expands and executes it in the memory 14. As a result, the CPU 12 functions as each functional component of the estimated value display device 10 and executes Figure 9 the production process shown in Figure 10 and the display process shown in

[0057] First, the Figure 9 production process shown in

[0058] will be described. In step S10, the production unit 32 obtains the result obtained by simulating the warpage of the semiconductor package substrate using simulation software. Next, in step S12, the production unit 32 selects, from the parameters included in the obtained simulation result, the parameters that will become the explanatory variables of the statistical model 40 for production. Next, in step S14, the production unit 32 uses the selected parameters included in the simulation result as explanatory variables and the warpage amount included in the simulation result as the objective variable to produce the statistical model 40. Then, the production unit 32 stores the produced statistical model 40 in a specified storage area of the estimated value display device 10, and the production process ends.

[0059] Next, the Figure 10 display process shown in

[0060] will be described. In step S20, the reception unit 34 displays the Figure 5 reception display screen 50 shown in

[0061] and receives the specified information. Next, in step S22, the calculation unit 36 determines whether the display button 60 of the reception display screen 50 has been selected, thereby determining whether the display of the curve graph has been instructed. If the display of the curve graph has been instructed, the process proceeds to step S24. If not, the determination in this step is repeated. In step S24, the calculation unit 36 inputs, as explanatory variables, multiple values related to the first parameter and the second parameter respectively included in the specified information received in the above step S20 into the statistical model 40 produced by the production unit 32. In addition, the calculation unit 36 sets the values of other parameters that are included as explanatory variables of the statistical model 40 and have not been specified as the first parameter and the second parameter. Then, the calculation unit 36 calculates the estimated values of the warpage amount of the substrate corresponding to the multiple values related to the first parameter and the second parameter respectively by obtaining the output of the statistical model 40.

[0062] Next, in step S26, the display control unit 38 creates a graph in which multiple values of the first parameter are taken on the X-axis and estimated values of the warpage amount are taken on the Y-axis for each value of the second parameter. Then, the display control unit 38 displays the graph corresponding to the value of the second parameter specified by the slider 56 in the created graph in the display area 64 of the acceptance display screen 50.

[0063] Next, in step S28, the display control unit 38 determines whether the specification of the value of the second parameter has been changed by operating the slider 56 of the acceptance display screen 50. If the specification of the value of the second parameter has been changed, the process proceeds to step S30; if not, the process proceeds to step S32.

[0064] In step S30, the display control unit 38 switches the graph displayed in the display area 64 to the graph corresponding to the value of the second parameter specified by the slider 56, and returns to step S28. On the other hand, in step S32, the display control unit 38 determines whether to end the display of the acceptance display screen 50 by determining whether a command to end the display has been accepted or the like. If the display is not ended, the process returns to step S20; if the display is ended, the display process ends.

[0065] As described above, the estimated value display device according to the present embodiment accepts the range of values of one or more parameters that affect the warpage of the semiconductor package substrate for one or more materials selected from a plurality of materials pre-registered as candidates for the materials used in the semiconductor package. In addition, the estimated value display device holds the simulation results of the warpage amount of the substrate when the values of the multiple parameters that affect the warpage of the substrate are changed, and creates a statistical model with a part of the multiple parameters as explanatory variables and the warpage amount as the target variable. And the estimated value display device controls in the following manner: inputting the multiple values included in the accepted range as explanatory variables, calculating the estimated values of the warpage amount corresponding to the multiple values respectively, and displaying in the display device a graph in which the estimated values are respectively associated with the multiple values. Thereby, the calculation time can be shortened and the tendency of the warpage amount with respect to the change in the value of the parameter can be displayed in a timely manner. The user can confirm the graph showing the tendency of the warpage amount with respect to the parameter by inputting only the minimum specified information including the range of the values of the parameter whose tendency of the warpage amount is to be confirmed.

[0066] <Modification 1>

[0067] In the above-described embodiment, as a phenomenon occurring in a product, the case of showing a graph representing the tendency of warping of a semiconductor package substrate has been described, but it is not limited thereto. In Modification Example 1, a graph representing the tendency of, for example, the life of solder in a semiconductor package substrate, the stress of the semiconductor package substrate, etc. may also be shown. In this case, based on the simulation results related to the life of solder or stress, a statistical model is created with a part of a plurality of parameters affecting the life of solder or stress as explanatory variables. In the acceptance display screen, acceptance of specified information including the range of parameters affecting the life of solder or stress is input into the statistical model. Then, the estimated values of the life of solder or stress for each of a plurality of values within this range are calculated, and a graph showing these tendencies may be displayed.

[0068] <Modification Example 2>

[0069] In the above-described embodiment, the case of specifying the first parameter and the second parameter has been described, but the specification of the second parameter is not essential. In addition, two or more parameters may be specified as the second parameter. In this case, when creating a graph for each value among a plurality of values within the range specified for an arbitrary second parameter, the values of the other second parameters may be fixed.

[0070] <Modification Example 3>

[0071] In Modification Example 3, a plurality of values of other parameters are set according to the range of the value of the specified parameter. For example, the size of a chip mounted on a substrate is different depending on the size of the substrate. Therefore, when the size of the substrate is specified as the first parameter, within the range below a specified value within the specified value range, a first value is set as the chip size, and within the range exceeding the specified value, a second value larger than the first value is set. In this case, in the graph with the value of the first parameter taken as the X-axis, the range below the specified value and the range exceeding the specified value are clearly shown, and information on other parameters with different values set in each range is displayed.

[0072] Figure 11 Shows a display example of the graph in Modification Example 3. In Figure 11 the example, the X-axis is the size of the substrate specified as the first parameter, and a range of 60 mm to 100 mm is specified. Among them, it is shown that: in the range of 60 mm to 70 mm ( Figure 11 range A in), the chip size is set to 25 mm, and in the range of 80 mm to 100 mm ( Figure 11 range B in), the chip size is set to 50 mm.

[0073] <Modification Example 4>

[0074] In the above-described embodiment, the case of creating a statistical model based on the simulation results of the warpage amount using simulation software has been described, but it is not limited thereto. As Modification Example 4, a statistical model may be created based on the warpage amount obtained through experiments for each mode in which the values of a plurality of parameters that affect the phenomenon generated in the product are changed.

[0075] <Modification Example 5>

[0076] In the above-described embodiment, the configuration in which the device unit functions are displayed as estimated values has been described. However, in Modification Example 5, as Figure 12 shown, an estimated value display system 100 including an estimated value display server 110A and a person in charge terminal 110B will be described. The estimated value display server 110A and the person in charge terminal 110B are connected via a network. In addition, the number of each of the estimated value display server 110A and the person in charge terminal 110B included in the estimated value display system 100 is not limited to Figure 12 the example. In addition, in Modification Example 5, for points common to the above-described embodiment, the same reference numerals in the numerical part are used to indicate them, and mainly the points different from the above-described embodiment will be described, and detailed descriptions of the common functions will be omitted.

[0077] The estimated value display server 110A functionally includes a creation unit 32A, a calculation unit 36A, and a registration unit 46. In addition, a statistical model 40, a material DB 42, and a report DB 44 are stored in a specified storage area of the estimated value display server 110A.

[0078] The calculation unit 36A receives the specified information input via the acceptance display screen 50 from the person in charge terminal 110B. The calculation unit 36A calculates the estimated values related to the phenomenon generated in the product for each value among a plurality of values within the range of the specified parameters, and sends the estimated values to the person in charge terminal 110B. The registration unit 46 receives a report (details will be described later) from the person in charge terminal 110B, and registers the received report in the report DB 44.

[0079] The person in charge terminal 110B is an information processing terminal such as a personal computer, a tablet terminal, or a smartphone held by the person in charge. The person in charge terminal 110B functionally includes an acceptance unit 34B and a display control unit 38B.

[0080] The reception unit 34B sends the specified information input via the reception display screen 50 to the estimated value display server 110A. In addition, the reception unit 34B receives the customer ID as the identification information of the customer, and when ending the display of the reception display screen 50, creates a report associated with the customer ID. The reception unit 34B includes the specified information and the estimated value in the report. In addition, when any one material is selected from multiple materials, the reception unit 34B may also receive the information of the selected material and include it in the report. In addition, the reception unit 34B may also receive various information such as the customer's requests and include them in the report. The reception unit 34B sends the created report to the estimated value display server 110A.

[0081] According to Modification 5, multiple persons in charge can use the services provided by the estimated value display system 100 via their respective person-in-charge terminals 110B, and the processing in each person-in-charge terminal 110B can be reduced. In addition, the reports stored in the report DB 44 of the estimated value display server 110A can be shared and effectively used by each person in charge.

[0082] In addition, the processing in which the CPU reads and executes software (program) in the above-described embodiment may be executed by various processors other than the CPU. As the processor in this case, for example, a PLD (Programmable Logic Device) such as an FPGA (Field-Programmable Gate Array) whose circuit structure can be changed after manufacturing, a dedicated circuit such as an ASIC (Application Specific Integrated Circuit) having a circuit structure specifically designed to execute a specific process, etc. are exemplified. In addition, the estimated value display processing may be executed by one of these various processors, or may be executed by a combination of two or more processors of the same type or different types (for example, a combination of multiple FPGAs and a CPU and an FPGA). More specifically, the hardware structure of these various processors is a circuit combining circuit elements such as semiconductor elements.

[0083] In addition, in the above-described embodiment, the method of pre-storing (installing) the estimated value display program in the storage device has been described, but it is not limited thereto. The program may also be provided in a form stored in a storage medium such as a CD-ROM, DVD-ROM, USB memory, etc. In addition, the program may also be in a form downloaded from an external device via a network.

[0084] [Explanation of Reference Numerals]

[0085] 10 Estimated value display device

[0086] 12 CPU

[0087] 14 Memory

[0088] 16 Storage Device

[0089] 18 Input Device

[0090] 20 Output Device

[0091] 22 Storage Medium Reading Device

[0092] 24 Communication I / F

[0093] 26 Bus

[0094] 32, 32A Production Department

[0095] 34, 34B Receiving Department

[0096] 36, 36A Calculation Department

[0097] 38, 38B Display Control Department

[0098] 40 Statistical Model

[0099] 42 Material DB

[0100] 44 Report DB

[0101] 46 Registration Department

[0102] 50 Receiving Display Screen

[0103] 52 First Designated Area

[0104] 52A, 52B, 52C, 52D Input Areas

[0105] 54 Second Designated Area

[0106] 54A, 54B, 54C, 54D Input Areas

[0107] 56 Scroll Bar

[0108] 58 Material Selection Area

[0109] 60 Display Button

[0110] 62 Save Button

[0111] 64 Display Area

[0112] 100 Estimated Value Display System

[0113] 110A Estimated Value Display Server

[0114] 110B Responsible Person Terminal

Claims

1. A predicted value display device, characterized in that, Comprising: An acceptance unit that accepts the range of values of one or more parameters that affect the phenomenon occurring in the product, for one or more materials selected from a plurality of materials pre-registered as candidates for the materials used in the product; A calculation unit that, based on the results of simulation or experiment of the value representing the phenomenon occurring in the product when the values of a plurality of parameters that affect the phenomenon occurring in the product are changed, inputs the plurality of values included in the range accepted by the acceptance unit as explanatory variables into a statistical model created with a part of the plurality of parameters as explanatory variables and the result as the target variable, and calculates the estimated values of the values representing the phenomenon occurring in the product corresponding to the plurality of values respectively; And A display control unit that controls to display, on a display device, an image in which the estimated values calculated by the calculation unit are respectively associated with the plurality of values.

2. The estimated value display device according to claim 1, wherein The one or more parameters are the parameters selected from the plurality of parameters as the explanatory variables of the statistical model.

3. The estimated value display device according to claim 1 or 2, wherein The acceptance unit displays an acceptance screen including a specified area for accepting the range of the value for each of the one or more parameters, and accepts the range of the value.

4. The estimated value display device according to claim 3, wherein The acceptance unit displays the acceptance screen further including a selection area for selecting the one or more materials from the plurality of pre-registered materials.

5. The estimated value display device according to claim 1 or 2, wherein The acceptance unit accepts the ranges of values respectively related to a first parameter and a second parameter, The calculation unit calculates, for each value of the plurality of values related to the second parameter, the estimated value corresponding to each value of the plurality of values related to the first parameter, The display control unit creates and displays, for each value of the plurality of values related to the second parameter, an image in which the estimated value is associated with each value of the plurality of values related to the first parameter.

6. The estimated value display device according to claim 5, wherein The acceptance unit displays an acceptance screen including a display component for designating any one of the plurality of values related to the second parameter, and accepts the value of the second parameter designated by operating the display component, The display control unit switches and displays a plurality of images created for each value of the plurality of values related to the second parameter according to the value of the second parameter accepted by the acceptance unit.

7. The estimated value display device according to claim 1 or 2, wherein The estimated value display device includes a creation unit that creates the statistical model with a part of the plurality of parameters as explanatory variables and the result as the target variable based on the results of simulation or experiment of the value representing the phenomenon occurring in the product.

8. The estimated value display device according to claim 1 or 2, wherein In the case where the product is a semiconductor package, the phenomenon is the warpage of the product, the stress of the product, or the life of the solder in the product.

9. A method for displaying estimated values, comprising the following steps: An acceptance unit accepts the ranges of values of one or more parameters that affect a phenomenon occurring in the product for one or more materials selected from a plurality of materials pre-registered as candidates for the materials used in the product; Based on the results of simulation or experiment of the values representing the phenomenon occurring in the product when the values of a plurality of parameters that affect the phenomenon occurring in the product are changed, a calculation unit inputs, as explanatory variables, the plurality of values included in the ranges accepted by the acceptance unit into a statistical model created by taking a part of the plurality of parameters as explanatory variables and the results as objective variables, and calculates estimated values of the values representing the phenomenon occurring in the product corresponding to the plurality of values respectively; A display control unit controls to display, on a display device, an image in which the estimated values calculated by the calculation unit are respectively associated with the plurality of values.

10. An estimated value display program for causing a computer to function as an acceptance unit, a calculation unit, and a display control unit, wherein the acceptance unit accepts the ranges of values of one or more parameters that affect a phenomenon occurring in the product for one or more materials selected from a plurality of materials pre-registered as candidates for the materials used in the product; based on the results of simulation or experiment of the values representing the phenomenon occurring in the product when the values of a plurality of parameters that affect the phenomenon occurring in the product are changed, the calculation unit inputs, as explanatory variables, the plurality of values included in the ranges accepted by the acceptance unit into a statistical model created by taking a part of the plurality of parameters as explanatory variables and the results as objective variables, and calculates estimated values of the values representing the phenomenon occurring in the product corresponding to the plurality of values respectively; and the display control unit controls to display, on a display device, an image in which the estimated values calculated by the calculation unit are respectively associated with the plurality of values.

Images