Energy-saving MOS tube test bearing device

By designing a combination of a rotating disk and an elastic clamp, stable clamping and electrical connection of the MOSFET are achieved, solving the problem of poor applicability of existing devices, improving testing efficiency and compatibility, and reducing operational difficulty and risk of damage.

CN120352658BActive Publication Date: 2025-11-25SHENZHEN MENGQI TECH CO LTD

Patent Information

Application Number
CN202510541018.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-04-28
Publication Date
2025-11-25
Estimated Expiration
2045-04-28

AI Technical Summary

Technical Problem

Existing MOSFET testing devices have poor applicability, cannot adapt to different batches of MOSFET specifications, are inconvenient to operate, and the plugging and unplugging method can easily cause pin bending and damage, affecting testing efficiency.

Method used

A support device including a main component is designed. Through the combination of a rotating disk and an elastic clamp, a stable clamping and electrical connection of the MOSFET is achieved. Combined with a drive component and a slider guide, the MOSFET can be automatically rotated for testing. The device can also be adapted to different specifications through an adjustment plate and a clamping plate, making it easy to operate and remove.

Benefits of technology

It improves the applicability and efficiency of MOSFET testing, reduces operational difficulty, avoids pin damage, enhances compatibility, and facilitates batch testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application relates to an energy-saving MOS tube test bearing device and belongs to the technical field of MOS tube tests. The device comprises a main body assembly, the main body assembly comprises a shell, a rotating assembly is rotatably arranged on the shell, a driving assembly is rotatably arranged on the shell, a connecting column is arranged on the shell, the rotating assembly comprises a rotating disc, a vertical plate is fixedly arranged at the lower end of the rotating disc, an elastic clamp is fixedly arranged on the vertical plate, the elastic clamp is intermittently electrically connected with the connecting column, a placing assembly is fixedly arranged on the rotating disc, one end of the placing assembly is electrically connected with the elastic clamp at the corresponding position, the placing assembly clamps the MOS tube, the damage of MOS tube pins is reduced, the MOS tube is driven to rotate through the rotating disc, external test devices are conveniently connected, the position of the clamping plate and the adjusting plate is adjusted, MOS tubes of different specifications are conveniently applied, the MOS tube is automatically pushed out from the inside of the placing groove through the push plate and the rotating piece, and the device is convenient to operate.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of MOS tube testing, in particular to a bearing device for energy-saving MOS tube testing. BACKGROUND

[0002] In electronic design, energy-saving MOS (Metal-Oxide Semiconductor Field Effect Transistor) is the core component of improving system energy efficiency, especially in the fields of power management, motor drive and power conversion, which belongs to the insulated gate type device in field effect tube, and controls the conduction and cutoff of current through electric field effect, and is widely used in power conversion, motor drive, new energy and other fields. After the packaging of a large number of MOS tubes in the production of MOS tubes, each MOS tube needs to be tested to test whether the performance is normal. At present, when testing, a multimeter is mostly used to test the resistance, and the MOS tube is small in individual. When testing, each MOS tube is taken out for testing, which is complicated to operate and easy to drop, and is not convenient for testing. Therefore, a bearing device is needed to clamp and bear the MOS tube for convenient testing. However, the existing bearing device mostly has single function, and the specifications of different batches of MOS tubes are different, and the pin positions or sizes are different, so that the bearing device cannot be used for bearing different batches of MOS tubes, and the applicability is poor. Moreover, when bearing, the existing bearing device mostly adopts the bearing mode of pulling and inserting, which not only has the problem of laborious pulling and inserting, but also easily causes the pin to be bent when pulling and inserting, which causes damage and affects the testing efficiency. SUMMARY

[0003] In order to overcome the technical defects of the prior art, the present application provides a bearing device for energy-saving MOS tube testing, which has the advantages of convenient bearing, improved applicability of different specifications of MOS tubes in bearing, convenient operation, time and labor saving, and improved testing efficiency.

[0004] The technical scheme adopted by the present application is: an energy-saving MOS tube test bearing device, comprising a main body assembly, the main body assembly comprises a shell, a rotating assembly is rotatably installed on the shell, a driving assembly is rotatably installed on one side of the rotating assembly on the shell, the driving assembly drives the rotating assembly, connecting columns are fixedly installed on one side of the rotating assembly on the shell in an array, the rotating assembly comprises a rotating disc, a plurality of vertical plates are fixedly installed on the lower end of the rotating disc in a circumferential array, elastic clamps are fixedly installed on the vertical plates, the elastic clamps are intermittently electrically connected with the connecting columns, a placing assembly for fixing energy-saving MOS tubes is fixedly installed on one side of the rotating disc, one end of the placing assembly is electrically connected with the corresponding elastic clamp, in use, an external test device is clamped and connected with the connecting columns, and the MOS tubes to be tested are placed on the placing assembly one by one, the MOS tubes are clamped and fixed by the placing assembly, and the rotating disc drives the MOS tubes to rotate, when the driving assembly is manually driven, the driving assembly rotates one circle, the rotating distance of the rotating disc is the arc distance between the vertical plates, when the MOS tubes are installed, the pins on the MOS tubes are electrically connected with the elastic clamps, and when the vertical plates rotate to the position of the connecting columns, the elastic clamps are electrically connected with the connecting columns, so that the MOS tubes are electrically connected with the connecting columns, facilitating individual testing, and when testing, new MOS tubes can be installed on other placing assemblies without affecting the testing efficiency.

[0005] Preferably, a hollow groove is formed in the lower end of the shell, the rotating assembly and the driving assembly are connected inside the hollow groove, the shaft center position of the rotating disc extends through the shell to the inside of the hollow groove, a first pulley is fixedly installed at the lower end of the shaft center position of the rotating disc, and one end of the driving assembly is sleeved on the first pulley, in use, the lower end of the driving assembly rotates, the first pulley rotates, the rotating disc drives the placing assembly to rotate, and the placing assembly drives the external MOS tubes to rotate, facilitating operation.

[0006] Preferably, the upper surface of the shell is fixedly installed with a connecting plate on one side of the connecting column, a connecting sheet is fixedly installed on the connecting plate transversely, the connecting sheet is electrically connected with the connecting column, and the connecting sheet is intermittently contacted with the elastic clamp, the upper surface of the shell is provided with a placing groove for placing an external testing instrument on the other side of the connecting column, and the upper surface of the shell is fixedly installed with a sliding block for guiding the rotating disc, the rotating disc is rotatably installed on the sliding block, when the elastic clamp is moved to the position of the connecting sheet, the connecting sheet enters the inside of the elastic clamp, the connecting mode of the plug and the power strip is similar, the elastic clamp and the connecting sheet are electrically connected, and the elastic clamp and the connecting column are electrically connected, so that the MOS tube is conveniently tested, the rotation of the rotating disc is guided by the sliding block, and the stability of the rotating disc during rotation is improved.

[0007] Preferably, the upper surface of the shell is provided with a groove with a hemispherical structure on one side of the driving assembly, one end of the driving assembly is clamped in the inside of the groove, the upper surface of the shell is fixedly installed with a fixing frame on the other side, one end of the fixing frame is fixedly installed with a push plate, and one end of the push plate is of an inclined structure, the driving assembly is positioned by the groove when rotating one circle, one end of the driving assembly is clamped in the inside of the groove when the driving assembly rotates one circle, the driving assembly is stopped, one of the elastic clamps clamps the connecting sheet, the rotating disc drives the placing assembly to rotate, the rotating sheet is contacted with the push plate, the rotating sheet rotates along the inclined surface of the push plate, the MOS tube in the placing assembly is pushed out, the MOS tube is automatically popped out, and the MOS tube is conveniently taken out.

[0008] Preferably, the lower surface of the rotating disc is fixedly installed with a sliding groove, the sliding groove is matched with the sliding block, and the placing assembly is circumferentially arranged on the rotating disc, the rotation of the rotating disc is guided by the sliding groove, and the stability during rotation is improved.

[0009] Preferably, the driving assembly comprises a handle, a rotating plate is rotatably installed at the lower end of the handle, the other end of the rotating plate is rotatably installed on the shell, a second pulley is fixedly installed below the position where the rotating plate is rotatably connected with the shell, a connecting belt is sleeved on the second pulley, the other end of the connecting belt is sleeved with the first pulley, an elastic telescopic rod is vertically fixedly installed on one side of the rotating plate, a ball is rotatably installed at the lower end of the elastic telescopic rod, the lower end of the ball is matched with the groove, the rotating plate is driven to rotate by the handle, the connecting belt is driven to rotate by the second pulley, and the first pulley in the rotating assembly is driven to rotate, the circumference of the second pulley is smaller than that of the first pulley, when the second pulley rotates one circle, the length of the rotation of the first pulley is the length of the arc formed between the placing assemblies, when rotating one circle, the ball is clamped in the groove, and the elastic clamp is connected with the connecting piece, when the ball is separated from the groove, the elastic telescopic rod is in the contraction state, and the ball rolls along the upper surface of the shell.

[0010] Preferably, the placing assembly comprises a placing plate, and the placing plate is fixedly connected with the upper surface of the rotating disc, a placing groove is formed in the middle position of the upper surface of the placing plate, adjusting plates are arrayed and clamped on one side of the placing groove, elastic sheets are fixedly installed on the upper surface of the adjusting plates, connecting flexible wires are fixedly installed on one side of the elastic sheets, the outer surface of the connecting flexible wires is covered with an insulating layer, and the other end of the connecting flexible wires is electrically connected with the elastic clamp, the MOS tube to be carried can be placed horizontally through the placing groove, after being placed, the pins on the MOS tube are in contact with the elastic sheets, the pins on the MOS tube are electrically connected with the elastic clamp through the connecting flexible wires, the connecting column is connected with the external testing device, the elastic sheets are deformed when being contacted, and the electrical connection effect between the MOS tube and the elastic clamp is improved.

[0011] Preferably, the inside of the placement groove is provided with a blind hole on both sides, the blind hole is inserted with a clamping plate, the opposite side upper end of the clamping plate is a bevel structure, the upper end of the blind hole on the placement plate is provided with a waist hole, and one side of the blind hole in the clamping plate is fixedly installed with springs in an array, the other end of the spring is fixedly installed with a push plate, the side upper end of the push plate is threadedly connected with a limiting bolt, the upper end of the limiting bolt is a T-shaped structure, one end of the limiting bolt extends through the waist hole to the upper surface of the placement plate, and the upper end of the limiting bolt is pressed against the upper surface of the placement plate. When placing the MOS tube, the MOS tube is placed between the two clamping plates, the clamping plates exert clamping force on the two sides of the MOS tube, facilitating the fixation and bearing of the MOS tube, avoiding activity during testing, and facilitating the adjustment of the distance between the two clamping plates by adjusting the position of the push plate when clamping and fixing different MOS tubes, improving the applicability during clamping, and fixing the position of the push plate after adjusting the position of the push plate through the limiting bolt.

[0012] Preferably, a notch is formed on one side of the placement plate at the placement groove, an L-shaped rotating piece is rotatably installed in the notch, and the rotating piece at the rotating angle position is an arc structure. When clamping the MOS tube, one end of the rotating piece is located inside the notch, and the rotating piece is in a vertical state L-shaped structure. When the rotating disc rotates, the rotating piece rotates after contacting the push plate, so that the rotating piece rotates in an inclined direction, one end of the rotating piece lifts the bottom of the MOS tube, and the MOS tube is pushed out between the clamping plates.

[0013] Preferably, one end of the adjusting plate is a U-shaped structure, one end of the adjusting plate below is fixedly installed with a clamping tongue, a clamping groove is formed on one side of the lower surface of the placement plate, the clamping tongue is clamped in the clamping groove, and a screw is threadedly connected to one side of the adjusting plate. One end of the screw is pressed against one side of the placement plate. When adjusting the position of the spring piece, the adjusting plate slides in the clamping groove through the clamping tongue, so that the distance between the spring pieces is adjusted. After the adjustment is completed, the screw is screwed to press one end of the screw against one side of the placement plate to limit the movement of the adjusting plate.

[0014] The beneficial effects of the present application are: by adopting the placing assembly to lay and clamp the MOS tube, and in the clamping process, the pin of the MOS tube is in contact with the elastic sheet, and the MOS tube is rotated by the rotating disc, when the elastic clamp is in contact with the connecting sheet, the MOS tube and the connecting column are in electrical connection, which is convenient for external testing device, improves the testing efficiency, and through the position adjustment of the clamping plate and the adjusting plate, it is convenient to apply to MOS tubes of different specifications, improves the application effect during bearing, and when the rotating disc rotates, through the dial plate and the rotating sheet, it is convenient to automatically dial out the MOS tube from the inside of the placing groove, which is convenient to take down, saves time and effort, has the effect of improving the testing efficiency, increasing the wide compatibility, convenient operation and convenient batch testing bearing. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is the overall structure schematic diagram of the present application.

[0016] Figure 2 It is the overall structure schematic diagram of the present application from another angle.

[0017] Figure 3 It is the structure schematic diagram of the lower end of the shell in the present application after being opened.

[0018] Figure 4 It is the structure schematic diagram of the main body assembly in the present application.

[0019] Figure 5 It is the structure schematic diagram of the present application Figure 4 after the position of A is enlarged.

[0020] Figure 6 It is the structure schematic diagram of the present application after removing the main body assembly.

[0021] Figure 7 It is the structure schematic diagram of the present application Figure 6 after the position of B is enlarged.

[0022] Figure 8 It is the structure schematic diagram of the present application from another angle after removing the main body assembly.

[0023] Figure 9 It is the structure schematic diagram of the present application Figure 8 after the position of C is enlarged.

[0024] Figure 10 It is the structure schematic diagram of the placing assembly in the present application.

[0025] Figure 11 It is the structure schematic diagram of the placing assembly in the present application after explosion.

[0026] Figure 12 It is the structure schematic diagram of the placing assembly in the present application from another angle after explosion.

[0027] Figure 13 Structure diagram for adjusting the position of the plate in the present application.

[0028] Marked as follows in the drawing: 1, main body assembly; 101, shell; 102, connecting column; 103, hollow groove; 104, connecting sheet; 105, storage groove; 106, sliding block; 107, recess; 108, fixing frame; 109, push plate; 1010, connecting plate; 2, rotating assembly; 201, rotating disc; 202, vertical plate; 203, elastic clamp; 204, first belt pulley; 205, sliding groove; 3, driving assembly; 301, handle; 302, rotating plate; 303, second belt pulley; 304, connecting belt; 305, elastic telescopic rod; 306, ball; 4, placing assembly; 401, placing plate; 402, placing groove; 403, adjusting plate; 404, elastic sheet; 405, connecting flexible wire; 406, blind hole; 407, clamping plate; 408, waist-shaped hole; 409, spring; 4010, push plate; 4011, limiting bolt; 4012, notch; 4013, rotating sheet; 4014, clamping tongue; 4015, clamping groove; 4016, screw. DETAILED DESCRIPTION

[0029] The present application is further described below in conjunction with the accompanying drawings:

[0030] As Figures 1-13As shown, the embodiment provides a kind of bearing device for energy-saving MOS tube test, including main component 1, main component 1 includes shell 101, rotating component 2 is rotatably installed on shell 101, and driving component 3 is rotatably installed on the side of shell 101 at rotating component 2, driving component 3 drives rotating component 2, connecting column 102 is fixedly installed in array on the side of shell 101 at rotating component 2, and rotating component 2 includes rotating disc 201, the lower end of rotating disc 201 is fixedly installed in circumferential array with riser 202, elastic clip 203 is fixedly installed on riser 202, elastic clip 203 and connecting column 102 are intermittently electrically connected, placing component 4 for fixing energy-saving MOS tube is fixedly installed on the side of rotating disc 201 at riser 202, one end of placing component 4 and the elastic clip 203 of corresponding position are electrically connected, when using, the test device of outside is clamped and connected with connecting column 102, and the MOS tube needing test is placed on placing component 4 one by one, MOS tube is clamped and fixed by placing component 4, and make rotating disc 201 drive MOS tube rotation, when manually driving driving component 3, driving component 3 rotates a circle, the distance of rotating disc 201 rotation is the arc distance between riser 202, when installing MOS tube, pin on MOS tube and elastic clip 203 are electrically connected, and when riser 202 rotates to the position of connecting column 102, elastic clip 203 and connecting column 102 are electrically connected, so that MOS tube and connecting column 102 are electrically connected, it is convenient for the test device of outside to test MOS tube, it is convenient to test one by one, and when testing, it does not affect the installation of new MOS tube on other placing component 4, improve test efficiency, it is convenient to test batch MOS tube, it is convenient to use.

[0031] As a technical optimization scheme of the application, specifically as Figures 3-5As shown, the lower end of the shell 101 is provided with a hollow groove 103, and the rotating assembly 2 and the driving assembly 3 are connected inside the hollow groove 103. The shaft position of the rotating disc 201 extends to the inside of the hollow groove 103 through the shell 101, and the lower end of the shaft position of the rotating disc 201 is fixedly installed with a first belt pulley 204. One end of the driving assembly 3 is sleeved on the first belt pulley 204. During use, through the hollow groove 103, the lower end of the driving assembly 3 and the rotating assembly 2 is convenient to store. When the lower end of the driving assembly 3 rotates, the first belt pulley 204 rotates, thereby driving the rotating disc 201 to rotate, and the placing assembly 4 drives the external MOS tube to rotate. While carrying, the MOS tube is rotated and tested one by one, which is convenient to operate and improves the testing efficiency. The upper surface of the shell 101 is fixedly installed with a connecting plate 1010 on one side of the connecting column 102. The connecting plate 1010 is transversely fixedly installed with a connecting piece 104, which is electrically connected with the connecting column 102. The connecting piece 104 is intermittently in contact with the elastic clamp 203. The upper surface of the shell 101 is provided with a storage groove 105 on the other side of the connecting column 102 for placing external test instruments. The upper surface of the shell 101 is fixedly installed with a sliding block 106 for guiding the rotating disc 201. The rotating disc 201 is rotatably installed on the sliding block 106. When the rotating disc 201 drives the elastic clamp 203 to move, the connecting piece 104 enters the inside of the elastic clamp 203 after the elastic clamp 203 moves to the position of the connecting piece 104. The connecting piece 104 is electrically connected with the elastic clamp 203, thereby electrically connecting the elastic clamp 203 with the connecting column 102. The MOS tube is convenient to test. During testing, the external test device, such as a multimeter, is placed in the storage groove 105, which is convenient to place and store. The sliding block 106 guides the rotation of the rotating disc 201, improves the stability of the rotating disc 201 during rotation, and improves the stability of the rotating disc 201 during rotation. The upper surface of the shell 101 is provided with a semispherical recess 107 on one side of the driving assembly 3. One end of the driving assembly 3 is clamped in the recess 107. The upper surface of the shell 101 is fixedly installed with a fixing frame 108 on the other side. One end of the fixing frame 108 is fixedly installed with a lever 109. One end of the lever 109 is inclined. Through the recess 107, the driving assembly 3 is positioned when rotating a circle. When the driving assembly 3 rotates a circle, one end of the driving assembly 3 is clamped in the recess 107, which is stopped. The driving assembly 3 rotates a circle, drives the rotating assembly 2 to rotate a specific length, and thereby clamps one of the elastic clamps 203 to the connecting piece 104 when the driving assembly 3 is clamped in the recess 107.When the rotating piece 4013 in the placing assembly 4 is in contact with the push plate 109, the rotating piece 4013 rotates along the inclined surface on the push plate 109, so that the MOS tube in the placing assembly 4 is pushed out, which is convenient for automatic ejection, convenient for taking out the MOS tube, saves time and effort, the lower surface of the rotating disc 201 is fixedly installed with a sliding groove 205, the sliding groove 205 is matched with the sliding block 106, and the placing assembly 4 is distributed in a circular array on the rotating disc 201, so that the rotation of the rotating disc 201 is guided through the sliding groove 205, the stability during rotation is improved, and the MOS tube is conveniently carried and tested.

[0032] As a technical optimization scheme of the present application, as shown in Figure 6 and Figure 7 The driving assembly 3 comprises a handle 301, the lower end of the handle 301 is rotatably installed with a rotating plate 302, the other end of the rotating plate 302 is rotatably installed on the shell 101, a second pulley 303 is fixedly installed below the position where the rotating plate 302 is rotatably connected with the shell 101, a connecting belt 304 is sleeved on the second pulley 303, the other end of the connecting belt 304 is sleeved with the first pulley 204, an elastic telescopic rod 305 is vertically fixedly installed on one side of the rotating plate 302, the lower end of the elastic telescopic rod 305 is rotatably installed with a ball 306, the lower end of the ball 306 is matched with the groove 107, the rotating plate 302 is driven to rotate by the handle 301, so that the second pulley 303 drives the connecting belt 304 to rotate, and then the first pulley 204 in the rotating assembly 2 is rotated, and the circumference of the second pulley 303 is smaller than the circumference of the first pulley 204, the circumference of the second pulley 303 multiplied by the number of the placing assemblies 4 is the same as the circumference of the first pulley 204, so that when the second pulley 303 rotates one circle, the length of the rotation of the first pulley 204 is the length of the arc formed between the placing assemblies 4, which is convenient for the placing assemblies 4 to be electrically connected with the connecting pieces 104 in the main body assembly 1 one by one, and through the elastic telescopic rod 305 and the ball 306, it is convenient to judge whether the second pulley 303 rotates one circle, when rotating one circle, the ball 306 is clamped in the inside of the groove 107, and a pause is formed, when the pause, it is indicated that the elastic clamps 203 are connected with the connecting pieces 104, when the ball 306 is separated from the groove 107, the elastic telescopic rod 305 is in a contraction state, and the ball 306 rolls along the upper surface of the shell 101.

[0033] As a technical optimization scheme of the present application, as shown in Figures 10-13As shown, the placing assembly 4 comprises a placing plate 401, and the placing plate 401 is fixedly connected with the upper surface of the rotating disc 201. An array of adjusting plates 403 is arranged on one side of the placing groove 402 in the middle of the upper surface of the placing plate 401. The upper surface of the adjusting plate 403 is fixedly connected with an elastic sheet 404. The elastic sheet 404 is fixedly connected with a connecting flexible wire 405 on one side. The outer surface of the connecting flexible wire 405 is covered with an insulating layer. The other end of the connecting flexible wire 405 is electrically connected with the elastic clamp 203. Through the placing groove 402, the MOS tube to be carried can be placed horizontally. After being placed, the pins on the MOS tube are in contact with the elastic sheet 404. Through the connecting flexible wire 405, the pins of the MOS tube are in electrical connection with the elastic clamp 203. Through the connecting column 102, the MOS tube can be connected with an external testing device. Through the adjusting plate 403, the position of the elastic sheet 404 can be adjusted. The MOS tube is suitable for MOS tubes of different specifications. The elastic sheet 404 is compatible with pins of different types. When the pins are contacted, the elastic sheet 404 is slightly deformed. The electrical connection effect between the MOS tube and the elastic clamp 203 is improved. Blind holes 406 are arranged on both sides of the inside of the placing groove 402. Clamping plates 407 are inserted into the blind holes 406. The opposite side of the clamping plate 407 is a beveled structure. A waist-shaped hole 408 is arranged on the upper end of the blind hole 406 on the placing plate 401. Springs 409 are fixedly arranged on one side of the inside of the blind hole 406 on the clamping plate 407 in an array. Push plates 4010 are fixedly arranged between the other ends of the springs 409. Limiting bolts 4011 are threadedly connected with one side of the upper end of the push plate 4010. The upper end of the limiting bolt 4011 is a T-shaped structure. One end of the limiting bolt 4011 extends to the upper surface of the placing plate 401 through the waist-shaped hole 408. The upper end of the limiting bolt 4011 is pressed against the upper surface of the placing plate 401. When the MOS tube is placed, the MOS tube is placed between the two clamping plates 407 and is pressed. The spring 409 is compressed. The clamping plate 407 moves towards the inside of the blind hole 406. The distance between the clamping plates 407 is increased. The clamping plate 407 exerts a clamping force on both sides of the MOS tube. The MOS tube is fixedly carried. The clamping plate 407 is arranged on one side of the upper surface of the clamping plate 407. The clamping plate 407 is moved towards the inside of the blind hole 406 automatically when the MOS tube is pressed. The spring 409 is compressed. The clamping effect is achieved. When different MOS tubes are clamped and fixed, the distance between the two clamping plates 407 is adjusted by adjusting the position of the push plate 4010. The applicability when clamping is improved. The position of the push plate 4010 is fixed after the position of the push plate 4010 is adjusted. The applicability when in use is improved.The rotating piece 4013 is in an arc structure, and when the MOS tube is clamped, one end of the rotating piece 4013 is located inside the notch 4012, and the rotating piece 4013 is in a vertical L-shaped structure. When the rotating disc 201 rotates, the rotating piece 4013 rotates after being in contact with the push plate 109, and then the rotating piece 4013 rotates in an inclined direction. One end of the rotating piece 4013 lifts the bottom of the MOS tube, so that the MOS tube is pushed out from between the clamping plates 407, which is convenient for automatic disassembly, convenient to use, one end of the adjusting plate 403 is in a U-shaped structure, one end of the adjusting plate 403 located below is fixedly installed with a clamping tongue 4014, a clamping groove 4015 is formed in one side of the lower surface of the placing plate 401, the clamping tongue 4014 is clamped in the clamping groove 4015, a screw 4016 is threadedly connected to one side of the adjusting plate 403, one end of the screw 4016 is pressed against one side of the placing plate 401, when the position of the elastic piece 404 is adjusted, the adjusting plate 403 slides in the clamping groove 4015 through the clamping tongue 4014, so that the distance between the elastic pieces 404 can be adjusted, which is suitable for use of different specifications of needle pins, and after the adjustment is completed, the screw 4016 is twisted to press one end of the screw 4016 against one side of the placing plate 401, so as to limit the movement of the adjusting plate 403, and then the fixing is convenient for use during testing.

[0034] The basic principles, main features and advantages of the present application are shown and described above. Those skilled in the art should understand that the present application is not limited to the above embodiments. The above embodiments and descriptions in the specification are only to illustrate the principles of the present application. Without departing from the spirit and scope of the present application, various changes and improvements can be made to the present application. These changes and improvements fall within the scope of the present application. The scope of protection of the present application is defined by the appended claims and their equivalents.

Claims

1. A carrier device for testing energy-saving MOSFETs, characterized in that: The system includes a main body component (1), which includes a housing (101). A rotating component (2) is rotatably mounted on the housing (101), and a driving component (3) is rotatably mounted on one side of the rotating component (2) on the housing (101). The driving component (3) drives the rotating component (2). Connecting columns (102) are fixedly mounted in an array on one side of the rotating component (2) on the housing (101). The rotating component (2) includes a rotating disk (201). A vertical plate (202) is fixedly mounted in a circumferential array at the lower end of the rotating disk (201). An elastic clamp (203) is fixedly mounted on the vertical plate (202). The elastic clamp (203) and... The connecting column (102) is intermittently electrically connected. A placement component (4) for fixing the energy-saving MOS tube is fixedly installed on one side of the vertical plate (202) on the rotating disk (201). One end of the placement component (4) is electrically connected to the elastic clip (203) at the corresponding position. A hollow groove (103) is opened at the lower end of the housing (101). The rotating component (2) and the driving component (3) are linked inside the hollow groove (103). The axis of the rotating disk (201) extends through the housing (101) into the hollow groove (103). A first pulley (204) is fixedly installed at the lower end of the axis of the rotating disk (201). One end of the drive assembly (3) is sleeved on the first pulley (204). A hemispherical groove (107) is provided on the upper surface of the housing (101) on one side of the drive assembly (3). One end of the drive assembly (3) is engaged inside the groove (107). A fixing bracket (108) is fixedly installed on the other side of the upper surface of the housing (101). A lever (109) is fixedly installed on one end of the fixing bracket (108). One end of the lever (109) is inclined. The placement assembly (4) includes a placement plate (401), and the placement plate (401) is fixedly connected to the upper surface of the rotating disk (201). The upper surface of the placement plate (401) A placement slot (402) is provided in the middle position. An adjustment plate (403) is attached to one side of the placement slot (402) in an array. A spring piece (404) is fixed on the upper surface of the adjustment plate (403). A connecting wire (405) is fixedly installed on one side of the spring piece (404). The outer surface of the connecting wire (405) is covered with an insulating layer, and the other end of the connecting wire (405) is electrically connected to the elastic clip (203). A notch (4012) is provided on one side of the placement slot (402) on the placement plate (401). An L-shaped rotating piece (4013) is rotatably installed inside the notch (4012). The corner of the rotating piece (4013) is an arc structure.

2. The energy-saving MOS transistor testing support device according to claim 1, characterized in that: A connecting plate (1010) is fixedly installed on the upper surface of the housing (101) on one side of the connecting post (102). A connecting piece (104) is fixedly installed horizontally on the connecting plate (1010). The connecting piece (104) is electrically connected to the connecting post (102), and the connecting piece (104) is in intermittent contact with the elastic clamp (203). A storage slot (105) for placing external testing instruments is opened on the upper surface of the housing (101) on the other side of the connecting post (102). A slider (106) for guiding the rotating disk (201) is fixedly installed on the upper surface of the housing (101). The rotating disk (201) is rotatably mounted on the slider (106).

3. The energy-saving MOS transistor testing support device according to claim 2, characterized in that: The lower surface of the rotating disk (201) is fixedly equipped with a slide groove (205), which matches the slider (106), and the placement components (4) are arranged in a circular array on the rotating disk (201).

4. The energy-saving MOS transistor testing support device according to claim 1, characterized in that: The drive assembly (3) includes a handle (301), a rotating plate (302) is rotatably mounted on the lower end of the handle (301), and the other end of the rotating plate (302) is rotatably mounted on the housing (101). A second pulley (303) is fixedly mounted below the position where the rotating plate (302) is rotatably connected to the housing (101). A connecting belt (304) is sleeved on the second pulley (303), and the other end of the connecting belt (304) is sleeved with the first pulley (204). An elastic telescopic rod (305) is vertically fixedly mounted on the rotating plate (302) on one side of the handle (301). A ball bearing (306) is rotatably mounted on the lower end of the elastic telescopic rod (305), and the lower end of the ball bearing (306) matches the groove (107).

5. The energy-saving MOS transistor testing support device according to claim 1, characterized in that: Blind holes (406) are provided on both sides of the interior of the placement slot (402). A clamping plate (407) is inserted into the interior of the blind hole (406). The upper end of the opposite side of the clamping plate (407) is a sloping structure. An oblong hole (408) is provided on the placement plate (401) at the upper end of the blind hole (406). Springs (409) are fixedly installed in an array on one side of the clamping plate (407) inside the blind hole (406). A push plate (4010) is fixedly installed between the other ends of (409). A limit bolt (4011) is threadedly connected to the upper end of one side of the push plate (4010). The upper end of the limit bolt (4011) is a T-shaped structure, and one end of the limit bolt (4011) extends through the waist-shaped hole (408) to the upper surface of the placement plate (401). The upper end of the limit bolt (4011) is pressed against the upper surface of the placement plate (401).

6. The energy-saving MOS transistor testing support device according to claim 5, characterized in that: One end of the adjusting plate (403) has a U-shaped structure, and a latch (4014) is fixedly installed on the lower end of the adjusting plate (403). A slot (4015) is provided on one side of the lower surface of the placement plate (401), and the latch (4014) is engaged in the slot (4015). A screw (4016) is threadedly connected to one side of the adjusting plate (403), and one end of the screw (4016) is pressed against one side of the placement plate (401).

Citation Information

Patent Citations

  • A testing device for MOS chip manufacturing

    CN114937617A

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