EMI emission comprehensive performance score calculation method, system and application

Abstract

The invention relates to the technical field of electromagnetic compatibility evaluation, and discloses an EMI emission comprehensive performance score calculation method and system and application, the method defines three lines including an original point line, a limit value line and a maximum value line, then calculates the Euclidean distance between radiation intensity and the original point, then carries out linear transformation, converts the Euclidean distance into a score between 0 and 100, and finally obtains a score between 0 and 100. The method is used for evaluating the comprehensive performance, the performance is better when the score is larger, the performance is unqualified when any standard exceeding point exists, and the method is applied to scoring the radiation intensity in the frequency band of 30 MHz to 1 GHz in automotive electronics, ranking the radiation performance of a high-frequency device according to the radiation intensity score, and establishing an EMI score database at the same time. According to the method, the system and the application, the influence degree of the equipment radiation intensity on other equipment is finely scored, the importance difference of each frequency band can be comprehensively considered, the evaluation data is more comprehensive, and the evaluation accuracy is improved. Standardized research and development evaluation of equipment, electronic modules and the like in automotive electronics and positioning of interference sources of high-frequency radar signals and the like are facilitated.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic compatibility evaluation, and particularly to a method, a system and an application for calculating the comprehensive performance score of EMI emission. Background Art

[0002] When electronic, electrical equipment or systems are operating, the electromagnetic energy released to the outside world through conduction or radiation may interfere with the normal operation of other equipment. To avoid interfering with equipment in highly sensitive fields such as medical and aviation, it is necessary to limit the emission intensity of the equipment. Before limiting the emission intensity of the equipment, it is necessary to accurately evaluate the electromagnetic energy. Currently, the commonly used method is to evaluate the maximum over-limit value in a certain frequency band, but this method has problems such as insufficient sufficiency of evaluation data, large subjective randomness of the evaluation method, and failure to fully consider the differences in the importance levels of each frequency band, making it difficult to accurately evaluate the comprehensive performance of the EMI (electromagnetic interference) emission of the equipment.

[0003] The prior art has the following disadvantages: 1. There is a lack of a method for quantitatively evaluating the comprehensive performance of the EMI emission of the equipment, making it difficult to accurately evaluate the degree of influence of the radiation intensity of the equipment on other equipment; 2. The existing evaluation methods mainly evaluate the maximum over-limit value in a certain frequency band, with insufficient sufficiency of evaluation data and failure to comprehensively consider the importance differences of each frequency band; 3. The existing evaluation methods have a problem of large subjective randomness, and the reliability and accuracy of the evaluation results need to be improved; 4. The existing evaluation methods lack an effective processing mechanism for over-limit points and cannot reasonably evaluate the performance of equipment with over-limit points; 5. The existing evaluation methods lack a quantitative standard for classifying the performance levels of the equipment, making it difficult to conduct hierarchical evaluation of the equipment performance.

[0004] In addition, when automotive electronic modules are put into use, it is necessary to evaluate their comprehensive EMI emission performance. However, due to significant differences between key factors such as the test environment, working conditions, load, wiring harness, power supply, and grounding and the real vehicle environment, the test results cannot fully and accurately predict the performance of the module in the actual vehicle. In addition, problems such as lagging standard updates, high costs, late problem discovery, and lack of a system-level perspective also restrict the effectiveness of the comprehensive EMI emission performance evaluation of automotive electronic modules. Summary of the Invention

[0005] In order to overcome the deficiencies of the above-mentioned prior art, the present invention provides a method that can define three known lines, including the origin line (radiation is 0), the limit line (known, defined by national standards or enterprise standards, etc.), and the maximum value line (known, user-defined or calculated); calculate the Euclidean distance between the radiation intensity and the origin; then perform a linear transformation to convert the Euclidean distance into a score between 0 and 100 to evaluate the comprehensive performance. This method can score the impact degree of the radiation intensity of the device on other devices. The smaller the radiation, the smaller the impact on other devices, and the higher the performance score. An EMI emission comprehensive performance scoring calculation method and application.

[0006] The technical solution adopted by the present invention is: An EMI emission comprehensive performance scoring calculation method, including: S100. Define three known lines, including the origin line, the limit line, and the maximum value line, and obtain the corresponding data and represent them in vector form respectively; S200. Respectively obtain and calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z , and calculate the Euclidean distance between the limit line vector X and the origin Z ; S300. Judge Whether it is less than ; If so, then judge whether the radiation intensity vector Y is within both the maximum value line vector M and the limit line vector X; S400. If the radiation intensity vector Y is within the limit line vector X, mark it as qualified, calculate the Euclidean distance between the radiation intensity vector and the origin, and then perform a linear transformation on the calculated Euclidean distance to convert the Euclidean distance into a specific qualified score, and use the level of the qualified score to evaluate the level of the EMI emission comprehensive performance; S500. If one of the radiation intensity vectors Y is not within the limit line vector X, mark it as unqualified; when there are over-standard frequency points, perform a linear transformation on the over-standard frequency points, convert the corresponding Euclidean distance into an unqualified score of the EMI emission comprehensive performance, and use the level of the unqualified score to evaluate the unqualified degree of the EMI emission comprehensive performance, and convert the corresponding Euclidean distance into a score; for the remaining non-overclocking frequency points, set them to be the same as the limit to ensure that the score of one over-standard frequency point is lower than 60 points (it can also be other qualified score standards).

[0007] In this technical solution, in step S100, the origin line is set as a vector of all 0s, and the Euclidean distance between the limit line vector X and the origin in step S200 The calculation formula is: (1); The Euclidean distance between the maximum value line vector M and the origin vector X The calculation formula: (2); Among them: The limit line vector X is converted from the limit data x0, x1, x2,..., x n , that is, X = [x0, x1, x2,..., x n . The origin line vector Z is converted from the value 0, that is, Z = [0, 0, 0,..., 0], and the maximum value line vector M is converted from the maximum value data m0, m1, m2,..., m n , that is, M = [m0, m1, m2,..., m n .

[0008] In this technical solution, in step S400, the formula for calculating the Euclidean distance between the radiation intensity vector Y and the origin vector X is: (3); Perform a linear transformation on , and the Euclidean distance is converted to the score S y The formula is: S y = 100 - (100 - 60) / (4); Among them: The radiation intensity Y = , , ,..., .

[0009] In this technical solution, in step S500, if it is determined that the frequency point y i exceeds the standard, the frequency point value remains unchanged, and the Euclidean distance d i between the frequency point y yi and the origin is calculated: (5); Then perform a linear transformation on d yi , and convert the Euclidean distance d yi to the score S yi : S yi = 60 - (60 - 0) / (d max - d x ) (d y - d x ) (6); If the frequency point y j, first set its value to the value corresponding to the frequency point of the limit line vector X to correct the radiation intensity vector, then calculate the Euclidean distance between the corrected radiation intensity vector Y' and the origin vector Z, and finally perform a linear transformation based on the Euclidean distance to obtain the numerical score corresponding to the radiation intensity.

[0010] In this technical solution, when it is determined in step S300 that the radiation intensity vector Y exceeds the maximum value, the score is directly unified to 0 points.

[0011] An EMI emission comprehensive performance scoring system includes: a data acquisition module, which includes a radiation emission test module, a conducted emission test module, and a time-domain waveform acquisition module, and is respectively used to obtain radiation emission test data, conducted emission test data, and time-domain waveform acquisition data; and a calculation module, the index calculation module is used to calculate radiation intensity indexes, spectrum indexes, time-domain indexes, and standard compliance indexes according to the collected data; and a comprehensive scoring module, the comprehensive scoring module is used to perform EMI test comprehensive performance scoring according to the indexes in the index calculation module and the scoring calculation method.

[0012] In this technical solution, the EMI emission comprehensive performance scoring system further includes an application module, and the application module further includes an EMI compliance evaluation module for performing EMI comprehensive performance evaluation and a design optimization suggestion module for optimizing and updating EMI comprehensive performance evaluation; the comprehensive scoring module further includes an EMI test comprehensive performance scoring module and an EMI performance portrait module, wherein the EMI test comprehensive performance scoring module is used to adjust and display the EMI emission comprehensive performance score, and the EMI performance portrait module is used to visualize, generate, and display the scoring result.

[0013] An application of an EMI emission comprehensive performance scoring calculation method, the application includes: Establish an EMI emission comprehensive performance scoring system, and perform EMI emission comprehensive performance scoring on the radiation intensity in the 30 MHz - 1 GHz frequency band of automotive electronics; and construct an EMI scoring database, and rank the radiation performance of high-frequency devices in the 30 MHz - 1 GHz frequency band according to the EMI emission comprehensive performance score of the radiation intensity.

[0014] In this technical solution, the radiation intensity of each in-vehicle electronic module is quantified through EMI scoring to ensure that it does not affect the key control unit or sensor; and the radiation spectrum under different working conditions is tested in an anechoic chamber, and the EMI emission comprehensive performance score is calculated.

[0015] In this technical solution, the EMI emission comprehensive performance scores of similar in-vehicle electronic modules are ranked.

[0016] Compared with the prior art, the beneficial effects of the present invention are: 1. It is possible to quantitatively evaluate the influence degree of the radiation intensity of a device on other devices, and the evaluation results are more objective and accurate; 2. By defining the origin line, limit line and maximum value line, and calculating the Euclidean distance between the radiation intensity and the origin, the importance differences of each frequency band can be comprehensively considered, and the evaluation data is more sufficient; 3. By using linear transformation to convert the Euclidean distance into a score from 0 to 100, the performance of the device can be evaluated hierarchically, and the evaluation results are more intuitive; 4. For devices with exceeding standard points, through a special processing mechanism, their performance can be reasonably evaluated to avoid score distortion; 5. The score calculation method is simple and efficient, easy to realize automatic evaluation, and improves the evaluation efficiency; 6. An EMI score database is established, the radiation performance of high-frequency devices is ranked, the comprehensive EMI emission performance scores of similar in-vehicle electronic modules are standardized and ranked, unifying the comprehensive EMI emission performance differences caused by significant differences between key factors such as test environment, working conditions, load, wiring harness, power supply, and grounding and the real in-vehicle environment, realizing the standardized evaluation of the comprehensive EMI emission performance of automotive electronic modules, enhancing the process unity, authenticity, dynamics (real-time updating of the comprehensive EMI emission performance scoring system), effectiveness, and usability of various electronic devices in all aspects such as R & D, production, selection, evaluation, and use, reducing the cost of multiple tests and simulations, and shortening the test cycle.

[0017] A method, system and application for calculating the comprehensive EMI emission performance score of the present invention can refine the score of the influence degree of the radiation intensity of a device on other devices, comprehensively consider the importance differences of each frequency band, and the evaluation data is more comprehensive and sufficient, which is beneficial to enhancing the process unity, authenticity, dynamics (real-time updating of the comprehensive EMI emission performance scoring system), effectiveness, and usability of devices and electronic modules in automotive electronics in all aspects such as R & D, production, selection, evaluation, and use. Description of the Drawings

[0018] Figure 1 It is a flowchart of a method for calculating the comprehensive EMI emission performance score; Figure 2 It is a diagram for dividing the comprehensive EMI emission performance score standard; Figure 3 It is a flowchart of step S100; Figure 4 It is a flowchart of step S200; Figure 5 It is a flowchart of step S400; Figure 6It is a flowchart of step S500; Figure 7 It is a principle block diagram of an EMI emission comprehensive performance scoring system; Figure 8 It is an application flowchart of an EMI emission comprehensive performance scoring calculation method; Wherein: 100 - data acquisition module, 110 - radiation emission test module, 120 - conducted emission test module, 130 - time-domain waveform acquisition module; 200 - index calculation module, 210 - radiation intensity index, 220 - spectrum index, 230 - time-domain index, 240 - standard compliance index; 300 - comprehensive scoring module, 310 - EMI test comprehensive performance scoring module, 320 - EMI performance portrait module; 400 - application module, 410 - EMI compliance evaluation module, 420 - design optimization suggestion module. Specific implementation manner

[0019] The embodiments of the present invention will be described in detail below. The embodiments described by referring to the accompanying drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation to the present invention.

[0020] As Figure 1 shown, an EMI emission comprehensive performance scoring calculation method includes: S100. Define three known lines, including the origin line, the limit line, and the maximum value line, and after obtaining their data, represent the corresponding data in vector form respectively; S200. Obtain and calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z , and calculate the Euclidean distance between the limit line vector X and the origin Z ; S300. Judge whether it is less than ; if so, judge whether the radiation intensity vector Y is within the maximum value line vector M and the limit line vector X; S400. If the radiation intensity vector Y is within the limit line vector X, mark it as qualified, calculate the Euclidean distance between the radiation intensity vector and the origin, and then perform a linear transformation on the calculated Euclidean distance to convert the Euclidean distance into a specific qualified score, and use the level of the qualified score to evaluate the level of the EMI emission comprehensive performance. For example, convert the Euclidean distance into a score between 60 - 100 to evaluate the level of the EMI emission comprehensive performance; S500. If a radiation intensity vector Y is not within the limit line vector X, it is marked as unqualified; when there are over-standard frequency points, linear transformation is performed on the over-standard frequency points, converting the corresponding Euclidean distance into the unqualified score of the comprehensive EMI emission performance, and using the level of the unqualified score to evaluate the level of unqualified of the comprehensive EMI emission performance, converting the corresponding Euclidean distance into a score; for the remaining non-over-frequency points, set them the same as the limit value to ensure that the over-standard score of one frequency point is lower than 60 points (it can also be other qualified score criteria).

[0021] As Figure 2 shown, it is described in a simplified manner and with straight lines. In actual operation, the spectrum is a broken line graph. In Figure 2 , three points are explained: 1. The solid line part is the defined origin, limit line, and maximum value line. Let the origin score be 100 (i.e., no radiation), the limit line be the passing line, and the maximum value be the 0-point line. 2. The dotted line part is to calculate the score based on the actual radiation value. The data between the origin and the limit line are qualified data with a score greater than 60 points, and the data between the limit line and the maximum value are unqualified data with a score less than 60 points. The larger the score, the better the performance. 3. The geometric meaning of the Euclidean distance is mainly to calculate the similarity, and the smaller the distance, the higher the similarity. After calculating the Euclidean distance, convert the similarity into a score.

[0022] Embodiment 1

[0023] A method for calculating the comprehensive EMI emission performance score in this embodiment includes the following steps: S100. Define three known lines, including the origin line (radiation is 0), the limit line (known, defined by national standards or enterprise standards, etc.), and the maximum value line (known, self-defined or calculated); As Figure 3 shown, step S100 further includes: step S101. Obtain the data of the origin line, the limit line, and the maximum value line. The origin line is a vector of all 0s, such as [0, 0, 0,..., 0]; the limit line is the quasi-peak limit line specified by national standards, such as [30, 37, 40,..., 60]; the maximum value line is the maximum allowable radiation value defined by oneself, such as [50, 60, 70,..., 90]; Step S102. Represent the origin line, the limit line, and the maximum value line in vector form respectively. For example, the origin line vector Z = [0, 0, 0,..., 0], the limit line vector X = [30, 37, 40,..., 60], and the maximum value line vector M = [50, 60, 70,..., 90]; S200. Calculate the Euclidean distance between the radiation intensity and the origin. The smaller the distance, the better the performance, and the larger the distance, the worse the performance. If there are any over-standard points, it is unqualified; See Figure 4, Step S200 further includes: S201. Obtain the radiation intensity data of the device under test, such as Y = [25, 32, 45,..., 55], and represent it in vector form; S202. Calculate the Euclidean distance d between the radiation intensity vector Y and the origin vector Z y： ; S203. Calculate the Euclidean distance d between the limit line vector X and the origin vector Z x： ; S204. Determine whether d y is less than d x . If it is less, mark it as qualified for the comprehensive performance of EMI emission; if it is greater, mark it as unqualified. In this example, d y < d x , and it is marked as qualified; S300. Determine whether all the radiation intensities are within the limit line vector X. If so, execute S400.

[0024] Since in this example, the radiation intensity vector Y = [25, 32, 45,..., 55] is all less than the limit line vector X = [30, 37, 40,..., 60], S400 is executed; S400. Perform a linear transformation to convert the Euclidean distance into a specific qualified score, such as a score between 60 - 100, to evaluate the comprehensive performance; As Figure 5 shown, step S400 further includes: S401. Calculate the Euclidean distance d between the limit line vector X and the origin vector Z x : ; S402. Calculate the Euclidean distance d between the radiation intensity vector Y and the origin Z y： ; S403. According to the formula S y = 100 - (100 - 60) / d x* d y perform a linear transformation to obtain a score S between 60 - 100 y , S y = 85 points. Therefore, the comprehensive performance score of the EMI emission of the device under test is 85 points.

[0025] Embodiment 2

[0026] A method for calculating the comprehensive performance score of EMI emission in this embodiment includes the following steps: S100. Define three known lines, including the origin line (radiation is 0), the limit line (known, defined by national standards or enterprise standards, etc.), and the maximum value line (known, user-defined or calculated); S101. Obtain the data of the origin line, the limit line, and the maximum value line: The origin line is a vector of all 0s, such as [0, 0, 0,..., 0]; The limit line is the quasi-peak limit line stipulated by the enterprise's internal standard, such as [25, 30, 35,..., 55]; The maximum value line is the maximum radiation value calculated based on the measured data, such as [40, 50, 60,..., 80]; S102. Represent the origin line, the limit line, and the maximum value line in vector form respectively, such as: The origin line vector Z = [0, 0, 0,..., 0], The limit line vector X = [25, 30, 35,..., 55], The maximum value line vector M = [40, 50, 60,..., 80]; S200. Calculate the Euclidean distance between the radiation intensity and the origin. The smaller the distance, the better the performance; the larger the distance, the worse the performance. If there are any over-standard points, it is unqualified; S201. Obtain the radiation intensity data of the device under test, such as Y = [20, 35, 40,..., 65], and represent it in vector form; S202. Calculate the Euclidean distance d between the radiation intensity vector Y and the origin vector Z y： ; S203. Calculate the Euclidean distance d between the limit line vector X and the origin vector Z x： ; S300. Determine whether the radiation intensity is all within the limit line vector X. If not, execute step S500; Since in this example, the radiation intensity Y = [20, 35, 40,..., 65] is greater than the limit line vector X = [25, 30, 35,..., 55], S500 is executed; S500. For the case where there are over-standard points, only calculate the impact brought by the over-standard points, and set the other points to be the same as the limit value to ensure that the score of one over-standard point is lower than 60 points. Here, 60 points is the passing standard score, and the passing standard score can also be other scores, which can be replaced correspondingly during specific implementation; See Figure 6, step S500 includes S501, determining which frequency points have exceeded the standard. In this example, frequency points 35, 40, and 65 exceed the limits 30, 35, and 55, and they are the frequency points that exceed the standard; S503. For the frequency points that do not exceed the standard determined in step S501, set their values to the values of the corresponding frequency points of the limit line vector X to correct the radiation intensity vector Y, and obtain Y', that is: Y' = [25, 35, 40,..., 65]; S504. For the frequency points that exceed the standard determined in step S501, first execute step S502 to keep the frequency point values unchanged, and then calculate the Euclidean distance d between the corrected radiation intensity vector Y' and the origin Z y' , for the frequency points that do not exceed the standard determined in step S501, first perform the correction of the radiation intensity vector in step S503, and then calculate the Euclidean distance d between the corrected radiation intensity vector Y' and the origin Z y' ; ; S505. Calculate the Euclidean distance d between the maximum value line vector M and the origin vector Z max : ; S506. According to the formula S y = 60 - (60 - 0) / (d max - d x ) (d y' - d x ) perform a linear transformation to obtain the score S between 0 and 60 y , S y = 45 points.

[0027] Therefore, the comprehensive performance score of the EMI emission of the device under test is 45 points, which is lower than 60 points and there is a situation of exceeding the standard. Here, 60 points can be 70 or 75 or 80, etc. The specific value can be confirmed according to the corresponding electromagnetic compatibility design requirements. Replace 60 in the corresponding above linear calculation formula S y = 60 - (60 - 0) / (d max - d x ) (d y' - d x ) and that's it.

[0028] Embodiment 3

[0029] Such as Figure 7As shown, an EMI emission comprehensive performance scoring system includes a data acquisition module 100, an index calculation module 200, and a comprehensive scoring module 300. The data acquisition module 100 includes a radiation emission test module 110, a conducted emission test module 120, and a time-domain waveform acquisition module 130, which are respectively used to obtain radiation emission test data, conducted emission test data, and time-domain waveform acquisition data. The index calculation module 200 is used to calculate a radiation intensity index, a spectrum index, a time-domain index, and a standard compliance index based on the acquired data. The comprehensive scoring module 300 is used to perform a comprehensive performance score for EMI testing according to the indexes in the index calculation module 200 and a scoring calculation method. By using this EMI emission comprehensive performance scoring system, the acquired radiation emission test data, conducted emission test data, and time-domain waveform acquisition data can be first calculated into a radiation intensity index 210, a spectrum index 220, a time-domain index 230, and a standard compliance index 240, and then statistically analyzed and displayed in the comprehensive scoring module 300, so as to uniformly plan and manage the relevant EMI emission comprehensive performance of the same system or large equipment, and improve the fine management performance and visual evaluation ability of EMI emission comprehensive performance.

[0030] In some embodiments, the EMI emission comprehensive performance scoring system further includes an application module 400. The application module 400 further includes an EMI compliance evaluation module 410 for performing EMI comprehensive performance evaluation and a design optimization suggestion module 420 for optimizing and updating EMI comprehensive performance evaluation, so as to provide selection, design, and usage references and standards for EMI emission comprehensive performance during the research and development and use of electronic devices, and achieve real-time update.

[0031] In some embodiments, the comprehensive scoring module 300 further includes an EMI test comprehensive performance scoring module 310 and an EMI performance portrait module 320. The EMI test comprehensive performance scoring module 310 is used to adjust and display the EMI emission comprehensive performance score, and the EMI performance portrait module 320 is used to visually generate and display the scoring result for facilitating the evaluation and use of the EMI emission comprehensive performance of a single device.

[0032] Embodiment 4

[0033] An application of an EMI emission comprehensive performance scoring calculation method, as Figure 8 shown, the application includes: S1. Establish an EMI emission comprehensive performance scoring system and perform an EMI emission comprehensive performance score on the radiation intensity in the 30 MHz - 1 GHz frequency band in automotive electronics; and S2. Construct an EMI scoring database, and rank the radiation performance of high-frequency devices in the 30 MHz - 1 GHz frequency band according to the comprehensive EMI emission performance score of radiation intensity. In the specific implementation process, the establishment of the EMI scoring database can be referred to Table 1 for establishment.

[0034] Table 1_EMI Scoring Table

[0035] In some embodiments, during the research and development of in-vehicle electronic modules, the radiation intensity of each in-vehicle electronic module is quantified through EMI scoring to ensure that it does not affect the key control unit or sensor; and the radiation spectrum under different working conditions is tested in an anechoic chamber, and the comprehensive EMI emission performance score is calculated. The radiation intensity of each in-vehicle electronic module is determined through the calculated comprehensive EMI emission performance score to ensure that the designed in-vehicle electronic module can ensure that it does not affect the key control unit or sensor of automotive electronics during use, thereby ensuring the reliability and safety performance of automotive electronics during operation. In the specific implementation process, it is also possible to establish a ranking of the radiation performance of high-frequency devices such as key control units, such as DC-DC converters and clock crystals, and establish an EMI scoring database for quick selection during the later research and development and design of automotive electronics.

[0036] In some embodiments, ranking the comprehensive EMI emission performance scores of similar in-vehicle electronic modules can also facilitate quick selection during the later research and development and design of automotive electronics.

[0037] In some embodiments, an EMI emission comprehensive performance scoring system for automotive electronics is established to locate the interference sources where high-frequency radar signals may interfere with in-vehicle communication buses through the EMI emission comprehensive performance scoring system. It can achieve functions such as shielding effectiveness verification and certification test classification management. During shielding effectiveness verification, the influence of the opening size of the metal shell on radiation leakage is quantified by comparing 3D electromagnetic simulation with actual measurement (such as a sharp drop in score when the aperture ≥ λ / 20). In the research and development of automotive electronics, the design of the honeycomb structure of ventilation holes improves the radiation score in the 30 - 300 MHz frequency band. During certification test classification management, it is used to achieve rapid screening on the production line: in the mass production stage, simplified tests (such as 3m method scanning in the 30 - 200 MHz frequency band) are adopted, and a scoring threshold is set (such as triggering a re-inspection when the score is not good). The production line can greatly reduce the failure rate of EMC certification through this solution. It is also possible to bind the functional safety in certain fields with EMI scoring in specific practices to evaluate whether the functional safety in this field meets the requirements.

[0038] The embodiments disclosed in the present invention are preferred embodiments, but are not limited thereto. Those of ordinary skill in the art can easily understand the spirit of the present invention based on the above embodiments and make different extensions and changes. However, as long as they do not depart from the spirit of the present invention, they are within the protection scope of the present invention.

Claims

1. A calculation method for the comprehensive performance score of EMI emission, characterized in that, Including: S100. Define three known lines, including the origin line, the limit line, and the maximum value line, and after obtaining their data, represent the corresponding data in vector form respectively; S200. Obtain the radiation intensity and form the radiation intensity vector Y, calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z , and calculate the Euclidean distance between the limit line vector X and the origin vector Z , and judge whether it is less than ; S300. If less than , further determine whether all the radiation intensity vectors Y are within the maximum value line vector M and the limit line vector X; S400. If the radiation intensity vector Y is all within the limit line vector X, it is marked as qualified. Calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z, and then perform a linear transformation on the calculated Euclidean distance to convert the Euclidean distance into a specific qualified score for evaluating the level of the comprehensive EMI emission performance; S500. If one of the radiation intensity vectors Y is not within the limit line vector X, it is marked as unqualified, then there are out-of-limit frequency points. When there are out-of-limit frequency points, perform a linear transformation on the out-of-limit frequency points to convert the corresponding Euclidean distance into an unqualified score of the comprehensive EMI emission performance for evaluating the level of the unqualified degree of the comprehensive EMI emission performance.

2. The EMI emission comprehensive performance scoring calculation method according to claim 1, characterized in that: The origin line is set as a vector of all zeros in step S100, and the Euclidean distance between the limit line vector X and the origin vector Z in step S200 The calculation formula is as follows: （1）； The Euclidean distance between the maximum value line vector M and the origin vector Z Calculation formula: （2）； Among them: the limit line vector X is converted from the limit data x0, x1, x2,..., x n , that is, X = [x0, x1, x2,..., x n . The origin line vector Z is converted from the value 0, that is, Z = [0, 0, 0,..., 0], and the maximum line vector M is converted from the maximum data m0, m1, m2,..., m n , that is, M = [m0, m1, m2,..., m n .

3. The EMI emission comprehensive performance scoring calculation method according to claim 2, characterized in that: In step S400, calculate the Euclidean distance between the radiation intensity vector Y and the origin vector Z The formula is as follows: （3）； Pair Perform a linear transformation, Euclidean distance Convert to a score S y The formula is as follows: S y =100-（100-60） / （4）； Wherein: the radiation intensity vector Y = , , ,..., .

4. A method for calculating the comprehensive performance score of EMI emission according to claim 3, characterized in that: In step S500, if it is determined that the frequency point y i exceeds the standard, the frequency point value remains unchanged, and the Euclidean distance d i between the frequency point y and the origin vector Z is calculated yi : （5）； Then perform a linear transformation on d yi to convert the Euclidean distance d yi into a score S yi : S yi =60 - (60 - 0) / (d max -d x ) (d y -d x )(6); If the frequency point y that does not exceed the standard j , first set its value to the value of the corresponding frequency point of the limit line vector X to correct the radiation intensity vector Y, then calculate the Euclidean distance between the corrected radiation intensity vector Y' and the origin vector Z, and finally perform a linear transformation based on the Euclidean distance to obtain the numerical score corresponding to the radiation intensity.

5. The EMI emission comprehensive performance scoring calculation method according to claim 1, characterized in that: When it is judged in step S300 that the radiation intensity vector Y exceeds the maximum value, the score is directly unified to 0 points.

6. An EMI emission comprehensive performance scoring system, characterized in that, Including: A data acquisition module (100), the data acquisition module (100) includes a radiation emission test module (110), a conducted emission test module (120), and a time-domain waveform acquisition module (130), which are respectively used to obtain radiation emission test data, conducted emission test data, and time-domain waveform acquisition data; And An index calculation module (200), the index calculation module (200) is used to calculate a radiation intensity index (210), a spectrum index (220), a time-domain index (230), and a standard compliance index (240) according to the collected data; and A comprehensive scoring module (300), the comprehensive scoring module (300) is used to perform a comprehensive performance score of the EMI test according to the indexes in the index calculation module (200) and the scoring calculation method of any one of claims 1-5.

7. An EMI emission comprehensive performance scoring system according to claim 6, characterized in that, The EMI emission comprehensive performance scoring system further includes an application module (400), and the application module (400) further includes an EMI compliance evaluation module (410) for performing an EMI comprehensive performance evaluation and a design optimization suggestion module (420) for optimizing and updating the EMI comprehensive performance evaluation.

8. An EMI emission comprehensive performance scoring system according to claim 7, characterized in that, The comprehensive scoring module (300) further includes an EMI test comprehensive performance scoring module (310) and an EMI performance portrait module (320), wherein the EMI test comprehensive performance scoring module (310) is used to adjust and display the comprehensive EMI emission performance score, and the EMI performance portrait module (320) is used to visualize and display the scoring result.

9. Application of a calculation method for comprehensive performance scoring of EMI emissions, characterized in that, The application includes: Establish the EMI emission comprehensive performance scoring system described in claim 6 or 7 or 8, and perform a comprehensive performance score of the EMI emission on the radiation intensity in the 30 MHz - 1 GHz frequency band in automotive electronics; and Construct an EMI scoring database, and rank the radiation performance of high-frequency devices in the 30 MHz - 1 GHz frequency band according to the comprehensive EMI emission performance score of the radiation intensity.

10. Application of a calculation method for comprehensive performance scoring of EMI emissions, as claimed in claim 9, characterized in that: Quantify the radiation intensity of in-vehicle electronic modules through EMI scoring; and test the radiation spectrum under different working conditions in an anechoic chamber, and calculate the comprehensive EMI emission performance score.

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