A lightweight backlight module power-on test device

Abstract

The application relates to the field of electrical performance testing, and discloses a lightweight backlight module power-on testing device, which comprises a testing frame, a support is arranged at the top of the testing frame, a sensor is arranged on the support, and a power-on guide rail is arranged in the testing frame. In the horizontal movement of the power-on guide rail in the application, the actual position of the lamp bead pin can be detected in real time, and the guide rail groove is automatically stopped when it is horizontally aligned with the guide rail groove, and only the vertical plugging action is continued. In this way, the guide rail is prevented from sliding horizontally near the pin, the deviation caused by the difference in lamp bead spacing is significantly reduced, the plugging precision and the stability of the electrical connection are effectively improved. The adaptive positioning mechanism makes the application not need to depend on the fixed probe spacing, and can automatically match the arrangement characteristics of different modules, so that the testing equipment has higher universality and environmental adaptability, and is especially suitable for testing scenes of backlight modules with different lamp bead arrangement densities and large spacing spans.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electrical performance testing, and specifically relates to a lightweight backlight module power-on testing device. BACKGROUND

[0002] Backlight modules are widely used in large-size liquid crystal displays, televisions and professional displays. The structural feature is that LED lamp beads are arranged in a matrix form directly below the light guide plate. Light is emitted from the bottom upwards, and after passing through the diffusion plate and prism sheet, a uniform surface light source is formed. This design has the advantages of higher brightness and better light uniformity compared to the side-in type, but it also brings the problem of lamp bead spacing difference in the production and testing process.

[0003] Different models of direct type backlight modules are designed according to the size of the screen, resolution and optical performance. The arrangement density and spacing of LED lamp beads are optimized. This leads to significant differences in the spacing of lamp beads in each module. For example, larger size displays usually use wider lamp bead spacing to reduce light heat accumulation and optimize heat dissipation, while high-resolution small size displays use denser lamp bead arrays to improve brightness and picture delicacy.

[0004] This lamp bead spacing difference not only affects the optical performance of the backlight module, but also puts higher requirements on the power-on test. The traditional fixed probe or manual alignment method cannot adapt to such diverse spacing changes, and often needs to adjust the probe position frequently, which not only is inefficient, but also easily causes wear and poor contact of the LED electrode, affecting the accuracy and consistency of the test. SUMMARY

[0005] In view of the defects of the prior art, the present application provides a lightweight backlight module power-on testing device, which aims to at least alleviate the above problems to some extent.

[0006] The above technical purpose of the present application is realized by the following technical scheme:

[0007] A lightweight backlight module power-on testing device, comprising a test frame, a support is provided on the top of the test frame, a sensor is provided on the support, a power-on guide rail is provided in the test frame, a positioning component for positioning the module is provided on the test frame, a test component is provided between the test frame and the power-on guide rail, the test component is used to drive the power-on guide rail to adjust the position in different test states, and automatically cycle between the two modes;

[0008] In the horizontal lifting mode, the test component drives the power-on guide rail to move horizontally and makes a vertical fine adjustment, so that it stops after contacting the pin of the LED lamp bead for a preset time, and then switches to the next mode;

[0009] In the vertical descending mode, the test component driving power supply rail moves downward, and returns to the initial horizontal position after leaving the lamp bead pin, and enters the next round of position adjustment.

[0010] Preferably, the positioning component comprises a support frame connected in the test frame, the side wall of the test frame is connected with a pneumatic cylinder a, the telescopic shaft of the pneumatic cylinder a extends into the test frame and is connected with a positioning block, and the positioning block is provided with a rubber pad close to one side of the backlight module frame.

[0011] Preferably, a test horizontal bar is arranged in the test frame, the power supply rail is connected to the test horizontal bar, a positioning rod is connected in the test frame, the bottom of the test horizontal bar is provided with a support bar a in sliding connection with the positioning rod, and the bottom of the support frame is connected with a folding rod fixed with the support bar a.

[0012] Preferably, the test component comprises a lead screw a rotatably connected to the test frame, the bottom of the test horizontal bar is slidably connected with a support bar b, the support bar a and the support bar b are arranged along the vertical direction of the test horizontal bar and are in sliding connection with the test horizontal bar, and a spring a is arranged between the support bar a and the test horizontal bar, the support bar b is in threaded connection with the lead screw a, and the lead screw a is a reciprocating lead screw.

[0013] Preferably, the test component further comprises a gear connected to the lead screw a, a ratchet mechanism is arranged between the gear and the lead screw a, an avoiding opening is formed in the folding rod, a connecting rod is connected to the side wall of the test horizontal bar, a connecting opening is formed in the side wall of the test frame, the connecting rod extends into the connecting opening through the avoiding opening, a lifting frame is slidably connected in the connecting opening, a rack adapted to the gear is connected to the lifting frame, and the lifting frame is located at the bottom of the connecting rod.

[0014] Preferably, a positioning frame is slidably connected to the top of the test horizontal bar, a spring b is arranged between the positioning frame and the test horizontal bar, a connecting ring is fixed to the outer wall of the lead screw a, a clamping strip is slidably connected to the connecting ring, a spring c is arranged between the clamping strip and the connecting ring, and a plurality of clamping grooves adapted to the clamping strip are formed in the inner wall of the ratchet structure of the ratchet mechanism.

[0015] Preferably, a lead screw b is rotatably connected to the support frame, an installation table is slidably connected to the support frame, the sensor is connected to the installation table, and the installation table is in threaded connection with the lead screw b.

[0016] Preferably, the test component can synchronously push the sensor to move along the support frame in execution mode one, and can reset the sensor to the initial position in execution mode two.

[0017] The guide pipe is rotationally connected to the folding rod, a spiral guide opening is formed in the outer wall of the guide pipe, a limiting rod is connected to the folding rod, a guide rod is slidably connected to the limiting rod and inserted into the spiral guide opening, a spring d is connected between the guide rod and the limiting rod, a connecting rod is rotationally connected to the connecting rod, the other end of the connecting rod is rotationally connected to the guide rod, and a chain mechanism is connected between the guide pipe and the lead screw b.

[0018] Preferably, the connecting rod is rotationally connected with a roller shaft.

[0019] Preferably, the test frame is connected with a cylinder b, the telescopic shaft of the cylinder b extends into the connecting opening and is connected with the lifting frame.

[0020] In summary, the present application mainly has the following beneficial effects:

[0021] The power supply guide rail with the guide rail groove structure is provided, and the horizontal lifting mode is matched, so that the different column LED lamp bead pins are quickly identified and high-precision insertion is realized. In the horizontal movement process of the power supply guide rail in the present application, the actual position of the lamp bead pin can be detected in real time, and the guide rail groove is automatically stopped when it is horizontally aligned, and only the vertical insertion action is continued. This way avoids the unnecessary horizontal sliding of the guide rail near the pin, significantly reduces the alignment deviation caused by the difference in lamp bead spacing, effectively improves the insertion accuracy and the stability of the electrical connection. The adaptive positioning mechanism makes the present application not dependent on the fixed probe spacing, and can automatically match the arrangement characteristics of different modules, thereby giving the test equipment higher universality and environmental adaptability, especially suitable for multi-specification backlight module test scenes with different lamp bead arrangement densities and large spacing spans.

[0022] In addition, in the temperature detection link, the "power-on and then power-off and detection" strategy adopted by the present application further improves the resolution ability of fault identification. Compared with the traditional method of directly measuring temperature under the condition of continuous power supply of LED, the traditional scheme is easy to cause the surface temperature of each lamp bead to tend to be consistent due to the accumulation of overall heat, thereby covering up the lamp beads with defects in heat dissipation structure, poor welding or abnormal packaging, and it is difficult to reflect the internal problems through the surface temperature difference, and the misjudgment rate is high. In contrast, after the lamp bead is powered on, the sensor immediately collects the temperature of the lamp bead that has just been powered off, and uses the temperature decay curve of LED in the natural cooling process as the judgment basis. Due to the difference in heat dissipation performance, the lamp bead with defects will show slow cooling rate, abnormal curve or temperature platform in the cooling process, so that the sensor can more accurately distinguish normal lamp beads from faulty lamp beads, and improve the sensitivity and reliability of the detection result.

[0023] Through the above-mentioned optimization setting, the application not only improves the electrical contact precision in the power-on test of the LED lamp bead, but also breaks through the limitation of the traditional method in the temperature detection aspect, improves the response ability of the equipment to the micro abnormalities, enhances the multi-model adaptability of the backlight module and the stability and quality control ability of the full-process automatic test. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 is the overall structure schematic diagram of the application;

[0025] Figure 2 is the schematic diagram of the application after hiding the test frame of the overall structure;

[0026] Figure 3 is the test horizontal strip structure schematic diagram of the application;

[0027] Figure 4 is another schematic diagram of the test horizontal strip structure of the application;

[0028] Figure 5 is the cross-sectional schematic diagram of the test horizontal strip structure of the application;

[0029] Figure 6 is the gear and rack structure schematic diagram of the application;

[0030] Figure 7 is the cross-sectional schematic diagram of the gear structure of the application;

[0031] Figure 8 is Figure 7 is the local structure enlarged schematic diagram at a in the application;

[0032] Figure 9 is the folding rod structure schematic diagram of the application;

[0033] Figure 10 is the guide pipe structure schematic diagram of the application;

[0034] Figure 11 is the sensor structure schematic diagram of the application.

[0035] Reference signs:

[0036] 100, test frame; 101, support; 102, sensor; 103, power-on guide rail;

[0037] 200, supporting frame; 201, air cylinder a; 202, positioning block; 203, rubber pad; 204, test horizontal strip; 205, positioning rod; 206, support a; 207, folding rod;

[0038] 300, screw a; 301, support b; 302, spring a; 303, gear; 304, ratchet mechanism; 305, avoiding opening; 306, connecting rod; 307, connecting opening; 308, lifting frame; 309, rack; 310, roller shaft; 311, cylinder b;

[0039] 400, positioning frame; 401, spring b; 402, connecting ring; 403, clamping strip; 404, spring c; 405, clamping groove;

[0040] 500, screw b; 501, mounting table; 502, guide pipe; 503, spiral guide opening; 504, limiting rod; 505, guide rod; 506, spring d; 507, connecting rod; 508, chain mechanism. DETAILED DESCRIPTION

[0041] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0042] REFERENCE Figures 1-11 A light-weight backlight module power-on testing device, comprising a test frame 100, a support 101 is arranged on the top of the test frame 100, a sensor 102 is arranged on the support 101, the sensor 102 can slide along the direction of the support 101 at the bottom of the support 101, a power-on guide rail 103 is arranged in the test frame 100, the guide rail groove on the power-on guide rail 103 is matched with the pin of the LED lamp bead, a positioning component for positioning the backlight module frame is arranged on the test frame 100, a test component is arranged between the test frame 100 and the power-on guide rail 103, a test component for adjusting the position of the power-on guide rail 103 is arranged between the test frame 100 and the power-on guide rail 103, the test component is used to drive the power-on guide rail 103 to adjust the position in different test states, and automatically cycle between the two modes;

[0043] Mode one is horizontal lifting mode, in the horizontal lifting mode, the test component drives the power-on guide rail 103 to move in the horizontal direction, and simultaneously performs height fine adjustment, so that the power-on guide rail 103 gradually approaches and contacts the pin of the LED lamp bead, stops horizontal movement after alignment, and stays for a preset time, and then enters the next mode;

[0044] Mode two is vertical descending mode, in the vertical descending mode, the test component drives the power-on guide rail 103 to descend in the vertical direction, so that the guide rail leaves the pin of the lamp bead, and after returning to the initial horizontal height, the next round of position adjustment is started;

[0045] In the horizontal lifting mode, the test component can synchronously push the sensor 102 to move along the direction of the bracket 101, and in the vertical descending mode, the sensor 102 can be reset to the initial position.

[0046] Through the above setting, at the beginning of the test, the LED backlight module to be tested is first placed in the test frame 100, the light-emitting end of the LED lamp bead is upward, the pin end of the lamp bead is directed to the energized rail 103, and the positioning component is arranged to position the frame of the backlight module, so that the module does not deviate during the test. The energized rail 103 is used for simultaneously energizing a column of LED lamp beads during the test, and is made of a high-conductivity metal strip. The upper surface of the conductive metal strip is provided with a groove matched with the pin of the lamp bead, so that reliable electrical connection can be formed after contact.

[0047] After positioning, the operator adjusts the position of the energized rail 103 through the test component to ensure that the rail groove can accurately butt joint the pin of the LED lamp bead. The test component first drives the energized rail 103 into the horizontal lifting mode, so that it moves along the horizontal direction and drives the bracket 101 to move synchronously (at the same time, the sensor 102 on the bracket 101 moves along the bracket 101, so as to prepare for the subsequent homing movement detection), so as to ensure that the rail groove is accurately aligned with the first column of lamp beads. In this process, the moving track of the rail is an upward track with an inclination, that is, the rail moves while being lifted. When the rail groove is horizontally aligned with the pin of the first column of lamp beads, the horizontal movement is automatically stopped, and only the vertical lifting action is continued until the rail groove is completely inserted with the pin of the lamp bead, and the energization is completed.

[0048] Subsequently, the test component maintains the energized state for a period of time, and after stable energization, the vertical descending mode is started, the rail descends along the vertical direction and gradually separates from the pin of the lamp bead, and the electrical connection is disconnected. At the same time, the sensor 102 starts homing movement and passes above the column of lamp beads just disconnected from the power supply in sequence, so as to collect the surface temperature of each lamp bead and record the data curve of the temperature change with time.

[0049] The above process continues to circulate until the whole module test is completed. After the test is completed, the positioning component cancels the positioning of the frame of the backlight module, and the backlight module is taken out. The homing of the energized rail 103 is performed, and the energized test is waited for the next time.

[0050] The application realizes the quick identification and high-precision insertion of different column LED lamp bead pins by setting the power-on guide rail 103 with a guide rail groove structure and cooperating with the horizontal lifting mode. Traditional test equipment usually adopts fixed spacing or manual alignment mode, which is difficult to adapt to the differences in lamp bead spacing caused by different screen sizes, brightness requirements or design structures in different backlight modules. For example, large-size modules often adopt sparse arrangement to enhance heat dissipation, while small-size or high-brightness modules tend to be densely arranged. Such structural differences are prone to cause insertion misalignment or poor pin contact during testing, affecting the test reliability.

[0051] To solve the above problems, the power-on guide rail 103 in the application can detect the actual position of the lamp bead pin in real time during horizontal movement, and automatically stop when the guide rail groove is horizontally aligned with it, and only continue to perform the vertical insertion action. This way avoids unnecessary lateral sliding of the guide rail near the pin, significantly reduces the alignment deviation caused by the difference in lamp bead spacing, effectively improves the insertion accuracy and the stability of electrical connection. The adaptive positioning mechanism makes the application not dependent on fixed probe spacing, and can automatically match the arrangement characteristics of different modules, thereby giving the test equipment higher universality and environmental adaptability, especially suitable for multi-specification backlight module testing scenarios with different lamp bead arrangement densities and large spacing spans.

[0052] In addition, in the temperature detection link, the "power-on and then power-off and detection" strategy adopted by the application further improves the resolution capability of fault identification. Compared with the traditional method of directly measuring temperature under the condition of continuous power supply of LED, the traditional scheme is prone to cause the surface temperature of each lamp bead to tend to be consistent due to the accumulation of overall heat, thereby masking the lamp beads with defects in heat dissipation structure, poor welding or abnormal packaging, making it difficult to reflect internal problems through surface temperature difference, and the misjudgment rate is high. In contrast, after the lamp bead is powered on, the sensor 102 immediately collects the temperature of the just powered-off lamp bead, and uses the temperature decay curve of LED in the natural cooling process as the judgment basis. Due to the difference in heat dissipation performance, the lamp bead with defects will show slow cooling rate, abnormal curve or temperature platform during the cooling process, so that the sensor 102 can more accurately distinguish between normal lamp beads and faulty lamp beads, improving the sensitivity and reliability of the detection result.

[0053] Through the above optimization design, the application not only improves the electrical contact precision in the power-on test of LED lamp beads, but also breaks through the limitations of traditional methods in the temperature detection level, improves the response capability of the equipment to minor abnormalities, enhances the multi-model adaptability of the backlight module and the stability and quality control capability of the full-process automatic test.

[0054] As a further scheme of the present application, the positioning component comprises a support frame 200 connected to the test frame 100, a side wall of the test frame 100 is connected with a pneumatic cylinder a 201, the pneumatic cylinder a 201 extends into the test frame 100 and is connected with a positioning block 202, and the positioning block 202 is provided with a rubber pad 203 close to one side of the backlight module frame;

[0055] Through the above arrangement, after the backlight module is placed in the test frame 100, the positioning block 202 is driven by the pneumatic cylinder a 201 to move inward, so that the rubber pad 203 contacts the side surface of the frame of the backlight module, thereby reliably limiting and clamping the module, and avoiding position deviation caused by vibration or rail insertion in the subsequent test process. The arrangement of the rubber pad 203 not only enhances the friction and improves the clamping stability, but also buffers the impact force in the pushing process of the pneumatic cylinder, prevents damage to the surface of the module, and ensures the accuracy and safety of the test. The structure realizes quick adaptation and positioning of modules of different sizes, and improves the universality and automation level of the test system.

[0056] As a further scheme of the present application, a test horizontal bar 204 is arranged in the test frame 100, the power supply rail 103 is connected to the test horizontal bar 204, a positioning rod 205 is connected in the test frame 100, the bottom of the test horizontal bar 204 is provided with a support bar a 206 in sliding connection with the positioning rod 205, and the bottom of the support 101 is connected with a folding rod 207 fixed with the support bar a 206;

[0057] Through the above arrangement, the test horizontal bar 204 serves as a mounting and moving platform of the power supply rail 103, and can drive the power supply rail 103 to move in the horizontal and vertical directions in the test frame 100, so as to realize accurate positioning and insertion of the LED lamp bead pins. At the same time that the power supply rail 103 is connected to the test horizontal bar 204, the support 101 is also connected to the test horizontal bar 204 through the support bar, so that the support 101 always maintains perpendicularity with the power supply rail 103 during horizontal movement of the power supply rail 103, thereby adapting to the current position of the lamp bead. To meet the functional requirement of synchronous horizontal movement of the power supply rail 103 and the support 101.

[0058] As a further scheme of the present application, the test component comprises a lead screw a 300 rotatably connected to the test frame 100, the bottom of the test horizontal bar 204 is slidably connected with a support bar b 301, the support bar a 206 and the support bar b 301 are arranged along the vertical direction of the test horizontal bar 204 and are in sliding connection with the test horizontal bar 204, and a spring a 302 is connected between the test horizontal bar 204 and the support bar a 206, the support bar b 301 is in threaded cooperation with the lead screw a 300, and the lead screw a 300 is a reciprocating lead screw;

[0059] Through the above setting, the support a 206 and the support b 301 are slidingly fitted in the vertical direction of the test horizontal bar 204, and are elastically supported by the spring a 302, so that the test horizontal bar 204 can be lifted in the vertical direction. The support b 301 and the lead screw a 300 are threadedly fitted, and under the rotation of the lead screw a 300, the movement stroke of the test horizontal bar 204 in the horizontal direction can be accurately controlled. The lead screw a 300 adopts a reciprocating lead screw structure, that is, the threaded track has a bidirectional circulation characteristic in the axial direction of the screw rod. When the power track 103 completes the test on the backlight module, the support b 301 can continue to move along the preset path under the guidance of the lead screw thread by continuing to rotate in the same direction. In the design of the reciprocating lead screw, there is a threaded turning point, and when the terminal point of the thread in a certain direction is reached, the lead of the lead screw a 300 is reversed, so that the support b 301 automatically starts the homing stroke in the opposite direction (for example, to the left), so as to prepare for the next test.

[0060] As a further scheme of the present application, the test component further comprises a gear 303 connected to the lead screw a 300, a ratchet mechanism 304 is arranged between the gear 303 and the lead screw a 300, an avoiding opening 305 is arranged on the folding rod 207, a connecting rod 306 is connected to the side wall of the test horizontal bar 204, a connecting opening 307 is arranged on the side wall of the test frame 100, the connecting rod 306 extends to the connecting opening 307 through the avoiding opening 305, a lifting frame 308 is slidingly connected in the connecting opening 307, a rack 309 adapted to the gear 303 is connected to the lifting frame 308, and the lifting frame 308 is located at the bottom of the connecting rod 306;

[0061] By the above setting, in the mode one (horizontal lifting mode), the position of the lifting frame 308 is vertically moved upward, so that the lifting frame 308 moves upward with the connecting rod 306 at the top of the lifting frame 308, the connecting rod 306 is fixed with the test crossbar 204, and the test crossbar 204 can be moved upward with the test crossbar 204, the height of the support bar a 206 and the support bar b 301 is unchanged, and the test crossbar 204 slides on the support bar a 206 and the support bar b 301. At the same time, the rack 309 arranged is lifted in the vertical direction under the driving of the lifting frame 308, and due to the meshing relationship between the rack 309 and the gear 303, the gear 303 is rotated and the lead screw a 300 is rotated through the ratchet mechanism 304, so that the threaded structure on the lead screw a 300 pushes the support bar b 301 transversely, and the test crossbar 204 is further driven to move transversely on the horizontal plane through the movement of the support bar b 301. The composite action not only realizes the accurate alignment of the power supply rail 103 in the horizontal direction, but also ensures the slow lifting of the rail in the vertical direction, forming a horizontal + vertical composite motion path. When the test crossbar 204 completes the plug-in positioning of the first column of lamp beads in the horizontal lifting mode and the lamp beads are powered for a preset time, the test component switches to mode two (vertical descending mode). In this mode, the position of the lifting frame 308 is reset downward, the connecting rod 306 is lowered synchronously with the lifting frame 308, the test crossbar 204 is slowly lowered under the guidance of the support bar a 206 and the support bar b 301 and the potential energy of the spring a 302, the rail groove is separated from the lamp bead needle, and the electrical connection is disconnected. In this process, although the gear 303 is reversely rotated, the gear 303 can be idle on the lead screw a 300 without changing the current angle of the lead screw a 300 due to the ratchet mechanism 304 between the gear 303 and the lead screw a 300. This structure ensures that the horizontal position of the lead screw a 300 does not change during vertical descent, that is, the test crossbar 204 will not be horizontally displaced due to the reverse rotation of the gear 303 when it is vertically reset, and that the current column position is locked. The main purpose of this design is that when the rail groove is completely separated from the needle of the current column of lamp beads, the sensor 102 can be kept above the current column of lamp beads in the horizontal direction to detect the surface temperature of each lamp bead in this column that has just been powered off, so as to avoid position misalignment caused by horizontal position drift during vertical descent. This structure ensures that the sensor 102 only passes above the current column of lamp beads one by one during the reset process, and will not accidentally deviate to the position of other columns of lamp beads, thereby ensuring the accuracy of the temperature data.

[0062] As a further scheme of the present application, the top of the test crossbar 204 is slidably connected with a positioning frame 400, a spring b 401 is connected between the positioning frame 400 and the test crossbar 204, a connecting ring 402 is fixed to the outer wall of the lead screw a 300, a clamping strip 403 is slidably connected to the connecting ring 402, a spring c 404 is connected between the clamping strip 403 and the connecting ring 402, and a plurality of clamping grooves 405 adapted to the clamping strip 403 are formed in the inner wall of the ratchet structure in the ratchet mechanism 304.

[0063] Through the above setting, when the lifting frame 308 moves upward, the mode one (horizontal lifting mode) is executed, the rack 309 drives the gear 303 to rotate, and the gear 303 drives the ratchet structure to rotate synchronously through the pawl structure. At this time, since the clamping strip 403 and the clamping groove 405 form a sleeving relationship through the spring c 404, the pre-tightening force of the spring c 404 makes the clamping strip 403 abut against the clamping groove 405, forming a certain friction force. The friction force is used to make the lead screw a 300 rotate synchronously when the ratchet structure rotates, thereby pushing the test cross strip 204 to move horizontally.

[0064] In the process of horizontal and vertical composite movement of the test cross strip 204, when the positioning frame 400 gradually approaches the lamp bead pin, since the height of the positioning frame 400 is higher than that of the electrified guide rail 103 on the test cross strip 204, the positioning frame 400 will preferentially contact the lamp bead pin. At this time, the horizontal movement of the positioning frame 400 will be limited by the height of the pin, causing the continued movement of the test cross strip 204 in the horizontal direction to be blocked.

[0065] However, in this state, the electrified guide rail 103 on the test cross strip 204 can not have been completely inserted with the lamp bead pin, and the test cross strip 204 still needs to continue to move upward to complete the insertion. If the lead screw a 300 continues to rotate forcibly at this time, it can cause the positioning frame 400 to laterally press the pin, causing the pin to be bent or mechanically damaged.

[0066] Therefore, the follow-up assembly composed of the clamping strip 403, the clamping groove 405 and the spring c 404 is arranged. When the positioning frame 400 contacts the lamp bead pin, causing the horizontal position of the test cross strip 204 to be limited, the lifting frame 308 that continues to rise will continue to push the test cross strip 204 to vertically rise through the connecting rod 306. At this time, the rotating resistance of the lead screw a 300 will rapidly increase, exceeding the friction force between the clamping strip 403 and the clamping groove 405, the spring c 404 will be compressed, the clamping strip 403 will shrink from the clamping groove 405 to avoid, and the synchronous linkage between the ratchet structure and the lead screw a 300 will be instantaneously released. This structure design makes the lead screw a 300 be able to stop rotating to avoid in the case of horizontal obstruction, and the test cross strip 204 can still continue to vertically rise.

[0067] The active avoidance mechanism not only ensures that the test horizontal bar 204 can automatically stop horizontal displacement when the positioning frame 400 contacts the pin, but also further enhances the adaptive ability of the test equipment to different lamp bead spacings. The core principle is that when the positioning frame 400 has not encountered the pin during horizontal movement, it means that the pin spacing of the current lamp bead row is larger, and the test horizontal bar 204 can continue to move horizontally to find the position of the next pin row. At this time, since the clamping bar 403 is still in the clamping groove 405 and is in contact, the spring c404 is in a pre-pressed state, and the synchronous linkage of the ratchet structure and the lead screw a300 is normal, and the test horizontal bar 204 can move synchronously in the horizontal and vertical directions, realizing accurate inter-row positioning.

[0068] When the positioning frame 400 encounters a pin during horizontal movement, it means that the pin spacing of the current lamp bead row is relatively small, or that the target row position has been reached. At this time, the positioning frame 400 will preferentially contact the pin, limiting the continued advancement of the test horizontal bar 204 in the horizontal direction, ensuring that the power supply rail 103 can be accurately inserted into the pin position. Thus, the horizontal movement range of the test horizontal bar 204 is automatically adjusted according to the actual situation of the pin spacing, allowing longer horizontal movement when the spacing is larger, and quickly locking the position when the spacing is smaller, avoiding unnecessary excessive insertion and mechanical interference. This adaptive ability significantly improves the universality and compatibility of the test equipment in different models of modules, reducing the need for manual adjustment and secondary calibration.

[0069] As a further scheme of the present application, the bracket 101 is rotatably connected with a lead screw b500, and the bracket 101 is slidably connected with a mounting table 501, and the sensor 102 is connected to the mounting table 501, and the mounting table 501 is threadedly connected with the lead screw b500;

[0070] Through the above setting, the lead screw b500 is rotatably connected on the bracket 101 and threadedly connected with the mounting table 501, which can drive the mounting table 501 to slide along the direction of the bracket 101 when the lead screw b500 rotates. Since the sensor 102 is fixedly connected to the mounting table 501, the sensor 102 also moves synchronously along the direction of the bracket 101 when the lead screw b500 rotates. The purpose of allowing the sensor 102 to displace can be achieved when the test component executes mode one or mode two.

[0071] As a further scheme of the present application, the folding rod 207 is rotationally connected with a guide pipe 502, the outer wall of the guide pipe 502 is provided with a spiral guide opening 503, the folding rod 207 is connected with a limiting rod 504, the limiting rod 504 is slidingly connected with a guide rod 505 inserted into the spiral guide opening 503, the guide rod 505 and the limiting rod 504 are connected with a spring d 506, the connecting rod 306 is rotationally connected with a connecting rod 507, the other end of the connecting rod 507 is rotationally connected with the guide rod 505, and the guide pipe 502 and the lead screw b 500 are connected with a chain mechanism 508.

[0072] Through the above arrangement, when the test horizontal bar 204 executes mode one (horizontal lifting mode) and mode two (vertical descending mode), the synchronous movement of the sensor 102 on the support 101 can be realized through the linkage structure of the guide pipe 502, the guide rod 505, the limiting rod 504 and the connecting rod 507.

[0073] Specifically, when executing mode one, the test horizontal bar 204 moves upward under the drive of the lifting frame 308, and drives the connecting rod 306 on it to be lifted upward. In this process, the upper end of the connecting rod 306 gradually touches the lower end of the connecting rod 507, forcing the connecting rod 507 to rotate. The swing of the connecting rod 507 further pushes the guide rod 505 to slide along the limiting rod 504, and transmits the force to the spiral guide opening 503, and then pushes the guide pipe 502 to rotate under the guidance of the spiral guide opening 503, and the rotation of the guide pipe 502 is transmitted to the lead screw b 500 through the chain mechanism 508, driving the mounting table 501 on the support 101 and the sensor 102 to move along the support 101, providing conditions for subsequent homing displacement detection.

[0074] When executing mode two, the test horizontal bar 204 starts to reset downward, the connecting rod 306 moves downward, the spring d 506 helps the guide rod 505 to reset, the rotating direction of the connecting rod 507 is reversed, the guide rod 505 continues to touch the spiral guide opening 503, the guide pipe 502 is reversely rotated, the lead screw b 500 is reversely rotated, and the sensor 102 on the mounting table 501 is pushed back to the initial position. In this process, the sensor 102 can pass through multiple lamp beads in this column, thereby realizing the purpose of collecting temperature data of all lamp beads in this column one by one. The purpose of such arrangement is to ensure that the sensor 102 can collect temperature data after the lamp beads are powered off, instead of measuring in the powered-on state. Avoiding temperature data errors caused by heat accumulation or electromagnetic interference in the powered-on state, significantly improving the accuracy of temperature detection.

[0075] As a further scheme of the present application, the connecting rod 306 is rotationally connected with a roller shaft 310;

[0076] Through the above setting, when the lifting frame 308 drives the connecting rod 306 to move upward, and the test cross 204 is pushed to rise in the vertical direction, the rotation of the lead screw a 300 will drive the test cross 204 to move laterally. In order to reduce the frictional resistance of the connecting rod 306 on the surface of the lifting frame 308, the roller shaft 310 is additionally arranged to reduce the frictional force generated by the lateral displacement.

[0077] As a further scheme of the present application, the test frame 100 is connected with a cylinder b 311, the telescopic shaft of the cylinder b 311 extends into the connecting opening 307 and is connected with the lifting frame 308.

[0078] Through the above setting, the telescopic shaft of the cylinder b 311 can drive the lifting frame 308 to move in the vertical direction during the extension or retraction, thereby achieving the purpose of providing driving force for the movement of the lifting frame 308.

[0079] Although the embodiments of the present application have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and variations can be made to the embodiments without departing from the principles and spirits of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A lightweight backlight module power-on test device, comprising a test frame, a bracket provided on the top of the test frame, and a sensor provided on the bracket, characterized in that: The test frame is provided with a power rail, and a positioning component for positioning the module is provided on the test frame. A test component is provided between the test frame and the power rail. The test component is used to drive the power rail to adjust its position under different test conditions and automatically cycle between the two modes. The sensor sequentially collects the temperature of the lamp beads that have just been powered off; The power rail is used to simultaneously power a row of LED lamp beads during the test process. It is made of a highly conductive metal strip, and the upper surface of the conductive metal strip is provided with grooves adapted to the pins of the lamp beads. In the horizontal lifting mode, the test component drives the powered rail to move horizontally and make vertical fine adjustments so that it contacts the pins of the LED lamp beads and stays for a preset time, then switches to the next mode; In vertical descent mode, the test component drives the energized rail to move downward, and after leaving the pins of the lamp beads, it returns to its initial horizontal position and enters the next round of position adjustment; The test component includes a screw a rotatably connected to the test frame, and also includes a gear connected to the screw a. The side wall of the test frame is provided with a connecting opening, and a lifting frame is slidably connected to the connecting opening. The lifting frame is connected to a rack adapted to the gear.

2. The lightweight backlight module power-on test device according to claim 1, characterized in that: The positioning component includes a support bracket connected to the test frame, the side wall of the test frame is connected to a cylinder a, the telescopic shaft of the cylinder a extends into the test frame and is connected to a positioning block, and a rubber pad is provided on the side of the positioning block close to the backlight module frame.

3. The lightweight backlight module power-on test device according to claim 1, characterized in that: A test bar is provided in the test frame, the power rail is connected to the test bar, a positioning rod is connected in the test frame, a support bar a is provided at the bottom of the test bar and is slidably connected to the positioning rod, and a folding rod fixed to the support bar a is connected to the bottom of the bracket.

4. The lightweight backlight module power-on test device according to claim 3, characterized in that: The bottom of the test bar is slidably connected to a support bar b, and the support bars a and b are both arranged along the vertical direction of the test bar and slidably connected to the test bar, and a spring a is connected between the support bar and the test bar, and the support bar b is threadedly engaged with the screw a, and the screw a is a reciprocating screw.

5. The lightweight backlight module power-on test device according to claim 4, characterized in that: A ratchet mechanism is provided between the gear and the lead screw a, a avoidance opening is provided on the folding rod, a connecting rod is connected to the side wall of the test horizontal bar, the connecting rod passes through the avoidance opening and extends into the connecting opening, and the lifting frame is located at the bottom of the connecting rod.

6. The lightweight backlight module power-on test device according to claim 5, characterized in that: The top of the test bar is slidably connected to a positioning frame, a spring b is connected between the positioning frame and the test bar, a connecting ring is fixed to the outer wall of the screw a, a clamping strip is slidably connected to the connecting ring, a spring c is connected between the clamping strip and the connecting ring, and the inner wall of the ratchet structure in the ratchet mechanism is provided with a plurality of clamping grooves adapted to the clamping strip.

7. The lightweight backlight module power-on test device according to claim 5, characterized in that: The bracket is rotatably connected to a lead screw b, the bracket is slidably connected to a mounting platform, the sensor is connected to the mounting platform, and the mounting platform is threadedly matched with the lead screw b.

8. The lightweight backlight module power-on test device according to claim 7, characterized in that: The test component can synchronously push the sensor to move along the support when executing the horizontal lifting mode, and can reset the sensor to the initial position when executing the vertical descending mode; The folding rod is rotatably connected to a guide tube, an outer wall of the guide tube is provided with a spiral guide opening, the folding rod is connected to a limit rod, the limit rod is slidably connected to a guide rod inserted into the spiral guide opening, a spring d is connected between the guide rod and the limit rod, a connecting rod is rotatably connected to the connecting rod, the other end of the connecting rod is rotatably connected to the guide rod, and a chain mechanism is connected between the guide tube and the lead screw b.

9. The lightweight backlight module power-on test device according to claim 5, characterized in that: The connecting rod is rotatably connected with a roller shaft.

10. The lightweight backlight module power-on test device according to claim 5, characterized in that: The test frame is connected to a cylinder b, and the telescopic shaft of the cylinder b extends into the connecting opening and is connected to the lifting frame.

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