Board test method, electronic device and storage medium

Abstract

The present application discloses a test method, electronic device and storage medium for a board card, which relates to the field of server technology, including: by obtaining the parameter information of the board card to be tested and calculating the matching value between the interface of the board card to be tested and the board card interface in the first preset rule base, accurately identifying the characteristics of the board card to be tested and determining the target control script of the board card test fixture suitable for the board card to be tested, ensuring that the board card test fixture uses the matching script when connected to the board card to be tested, and to a certain extent avoiding the risk of damage caused by version mismatch; at the same time, the board card test fixture determines the target test task and executes the test according to the parameter information of the board card to be tested, thereby realizing the automation and precision of the test process. In this way, not only the problem of reduced test accuracy and increased security risk caused by untimely or inaccurate transmission of version change information is effectively solved, but also the reliance on manual verification by engineers is reduced, work efficiency is improved, and the accuracy and security of the test are significantly improved.

Description

Technical Field

[0001] The present application relates to the field of server technology, and in particular to a board testing method, electronic equipment, and storage medium. Background Art

[0002] With the rapid development of cloud computing, big data, artificial intelligence, and 5G (5th Generation Mobile Communication Technology), the scale of global data center construction continues to expand, and the requirements for server hardware performance are increasing exponentially. As core components of servers, the stability and functionality of motherboards directly determine the overall performance and reliability of the server. Every motherboard in a computer undergoes multiple tests and verifications before leaving the factory, including FCT (Functional Circuit Test), ICT (In-Circuit Test), and BST (Boundary Scan Test).

[0003] To reduce testing costs during ICT, BSI, and FCT testing, board test fixtures are designed to be compatible with multiple board models. This means that multiple different board models can be tested using the same board test fixture. Furthermore, when the board under test undergoes version changes, the board test fixture must be compared to confirm compatibility with both the old and new versions of the board under test. The compatible board models and versions of each board test fixture are recorded in the fixture system and on fixture nameplates.

[0004] In the current testing process, when a board under test undergoes a version upgrade, the board test fixture must perform a compatibility comparison with the new version to ensure test accuracy and safety. However, if version change information is not transmitted promptly or accurately, the factory may place the new version of the board on the board test fixture for testing before the board test fixture has completed the comparison. This can lead to a series of safety risks, including damage to the board under test, damage to the board test fixture, and even serious consequences such as short circuits and burns of the board test fixture.

[0005] Therefore, when testing new versions of boards, factories rely on engineers to manually verify offline to ensure that the compatible version information of the board test fixtures is updated in a timely manner. This practice is not only inefficient but also prone to human negligence, resulting in delayed information updates, which in turn affects the accuracy and safety of the tests. Summary of the Invention

[0006] The present application provides a board testing method, electronic device and storage medium to at least solve the technical problem in the related art that due to the untimely or inaccurate transmission of version change information, the factory tests the new version of the board before the board test fixture completes the comparison, thereby affecting the test accuracy and safety.

[0007] The present application provides a testing method for a board, comprising: obtaining parameter information of a board to be tested, and determining a matching value between an interface of the board to be tested and an interface in a first preset rule library based on the parameter information of the board to be tested; determining a target control script of a board test fixture based on the parameter information of the board to be tested, interface parameter information in the first preset rule library, and the matching value; controlling the board test fixture to establish a connection with the board to be tested according to the target control script, determining a target test task of the board test fixture based on the parameter information of the board to be tested, and controlling the board test fixture to test the board to be tested according to the target test task.

[0008] The present application also provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the aforementioned board test method is implemented.

[0009] The present application also provides a computer-readable storage medium having a computer program stored thereon, which implements the aforementioned board test method when executed by a processor.

[0010] The present application also provides a computer program product, including a computer program / instruction, which implements the aforementioned board testing method when executed by a processor.

[0011] This application obtains the parameter information of the board to be tested and calculates the matching value between the interface of the board to be tested and the board interface in the first preset rule base, accurately identifies the characteristics of the board to be tested and determines the target control script of the board test fixture suitable for the board to be tested, ensuring that the board test fixture uses the matching script when connected to the board to be tested, thereby avoiding the risk of damage caused by version mismatch to a certain extent; at the same time, the board test fixture determines the target test task and executes the test based on the parameter information of the board to be tested, thereby realizing the automation and precision of the test process. In this way, it not only effectively solves the problem of reduced test accuracy and increased security risks caused by untimely or inaccurate transmission of version change information, but also reduces the reliance on manual verification by engineers, improves work efficiency, and significantly improves the accuracy and security of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0013] Figure 1 is a flowchart of a method for testing a board according to some embodiments of the present application;

[0014] Figure 2 Schematic diagram of the structure of a board test tool according to some embodiments of the present application;

[0015] Figure 3 is a flowchart of a method for testing a board according to other embodiments of the present application;

[0016] Figure 4 is a flowchart of a method for testing a board according to some other embodiments of the present application;

[0017] Figure 5 Flowchart of a method for testing a board according to some embodiments of the present application;

[0018] Figure 6 is a block diagram of an electronic device according to some embodiments of the present application. DETAILED DESCRIPTION

[0019] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0020] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0021] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0022] In conjunction with the specific application environment architecture or specific hardware architecture on which the execution of the board test method depends, the specific application environment architecture or specific hardware architecture is described here.

[0023] The following describes in detail the testing method, electronic device and storage medium of the patent name board of the embodiment of the present application with reference to the accompanying drawings.

[0024] Figure 1 Flowchart of a test method for a board according to some embodiments of the present application. Figure 1 The board testing method of the embodiment of the present application may include the following steps:

[0025] S110 , acquiring parameter information of the board to be tested, and determining a matching value between an interface of the board to be tested and an interface in a first preset rule base according to the parameter information of the board to be tested.

[0026] Specifically, the boards to be tested include motherboards and storage control cards. Parameter information of the boards to be tested can be read through the hardware interfaces of the boards to be tested, such as the board type, number of interfaces, and interface models. The first preset rule base includes parameter information of multiple interfaces, such as the interface models of multiple interfaces and the interface plugging and unplugging parameters of each interface model.

[0027] After obtaining the parameter information of the board under test, the interface of the board under test is matched with the interfaces in the first preset rule base to determine a matching value, that is, to determine how many of the interfaces of the board under test exist in the first preset rule base. For example, the parameter information of the board under test can be input into a pre-trained matching model to output a matching value between the interface of the board under test and the interfaces in the first preset rule base.

[0028] S120 , determining a target control script of the board test fixture based on the parameter information of the board to be tested, the interface parameter information in the first preset rule library, and the matching value.

[0029] Specifically, when the matching value is relatively high, it means that most of the interfaces of the board to be tested exist in the first preset rule library. Then, the interface of the board to be tested that exists in the first preset rule library can be determined based on the parameter information of the board to be tested and the interface parameter information in the first preset rule library; then, the control parameters of the interface of the board to be tested, such as the plug-in and unplugging parameters of the interface, are directly obtained from the first preset rule library; finally, the target control script of the board test fixture is generated according to the control parameters of the interface of the board to be tested.

[0030] S130, controlling the board test fixture to establish a connection with the board to be tested according to the target control script, determining a target test task of the board test fixture based on parameter information of the board to be tested, and controlling the board test fixture to test the board to be tested according to the target test task.

[0031] Specifically, after determining the target control script, the board test fixture controls the board test fixture to establish a connection with the board to be tested according to the target control script. For example, the board test fixture parses the target control script to determine the control parameters of each interface of the board to be tested, such as the plug-in and pull-out force of each interface. The board test fixture will perform the insertion operation in sequence based on the plug-in and pull-out force of each interface of the board to be tested. After the insertion operation is completed, a connection can be established with the board to be tested.

[0032] After the board test fixture establishes a connection with the board to be tested, the target test task of the board test fixture can be determined based on the parameter information of the test board (such as the interface type of the board to be tested). For example, the test task corresponding to each interface of the board to be tested can be determined by looking up a two-dimensional relationship mapping table between the interface type and the interface test task of the board test fixture. The target test task of the board test fixture is determined based on the collection of test tasks corresponding to each interface. After determining the target test task, the board test fixture tests the board to be tested according to the target test task. After the test is completed, the board test fixture will perform the unplugging operation based on the plugging and unplugging force of each interface of the board to be tested. After the unplugging operation is completed, the board test fixture can be disconnected from the board to be tested.

[0033] This application obtains the parameter information of the board to be tested and calculates the matching value between the interface of the board to be tested and the board interface in the first preset rule base, accurately identifies the characteristics of the board to be tested and determines the target control script of the board test fixture suitable for the board to be tested, ensuring that the board test fixture uses the matching script when connected to the board to be tested, thereby avoiding the risk of damage caused by version mismatch to a certain extent; at the same time, the board test fixture determines the target test task and executes the test based on the parameter information of the board to be tested, thereby realizing the automation and precision of the test process. In this way, it not only effectively solves the problem of reduced test accuracy and increased security risks caused by untimely or inaccurate transmission of version change information, but also reduces the reliance on manual verification by engineers, improves work efficiency, and significantly improves the accuracy and security of the test.

[0034] In some embodiments, the interface parameter information in the first preset rule base includes multiple interface models and interface plug-in parameters corresponding to each interface model, the parameter information of the board to be tested includes the interface model of the board to be tested, and the target control script of the board test fixture is determined based on the parameter information of the board to be tested, the interface parameter information in the first preset rule base and the matching value, including: when the matching value is greater than or equal to the first preset matching threshold, matching the interface model of the board to be tested with the multiple interface models in the first preset rule base to determine the first interface set and the second interface set of the board to be tested, wherein the first interface set It is used to characterize the interface of the board to be tested that matches multiple interface models in the first preset rule base, and the second interface set is used to characterize the interface of the board to be tested that does not match multiple interface models in the first preset rule base; determine the plugging parameters of each first interface in the first interface set according to the multiple interface plugging parameters in the first preset rule base; collect the plugging force of each second interface in the second interface set after connecting it to the board test fixture, and determine the plugging parameters of each second interface according to the plugging force of each second interface; generate a target control script according to the plugging parameters of each first interface and the plugging parameters of each second interface. Among them, the first preset matching threshold can be calibrated according to the actual situation. For example, the first preset matching threshold can be 90%, and there is no specific restriction here.

[0035] Specifically, after determining the matching value between the interface of the board to be tested and the interfaces in the first preset rule base, the matching value is compared with the first preset matching threshold value. If the matching value is greater than or equal to the first preset matching threshold value, the interface model of each interface of the board to be tested needs to be determined based on the parameter information of the board to be tested, and the interface model of each interface is matched with multiple interface models in the first preset rule base. The interfaces of the board to be tested are divided into a first interface set and a second interface set according to the matching results. For example, the interfaces of the board to be tested with a successful matching result are divided into the first interface set, and the interfaces of the board to be tested with a failed matching result are divided into the second interface set.

[0036] After the division is completed, it can be determined that each first interface type in the first interface set exists in the first preset rule base, then the interface plug-in parameters corresponding to each first interface type can be directly searched in the first preset rule base, that is, the plug-in parameters of each first interface in the first interface set are determined. It can also be determined that each second interface type in the second interface set does not exist in the first preset rule base, that is, the plug-in parameters of the second interface cannot be obtained by querying the first preset rule base, then the board test fixture can be pre-connected to the second interface with a certain plug-in force, and the connection signal can be collected by the sensor set at the second interface. If the connection signal is successfully collected, the current plug-in force is determined as the plug-in parameter of the second interface. In this way, the plug-in force of each second interface is collected in turn, and the plug-in parameter of each second interface can be determined according to the plug-in force of each second interface.

[0037] After the plugging and unplugging parameters of each first interface and the plugging and unplugging parameters of each second interface are determined, a target control script may be generated according to the plugging and unplugging parameters of each first interface and the plugging and unplugging parameters of each second interface.

[0038] This application generates a target control script by matching the interface model of the board to be tested with the interface model in the first preset rule library, and combining it with the collected plug-in force data, to ensure that the board test fixture can accurately adjust the plug-in parameters according to different interface types when replacing the board, thereby improving the accuracy and reliability of the test, while reducing the test errors and equipment damage risks caused by interface mismatch or improper parameters.

[0039] In some embodiments, the above method further includes: when the matching value is less than the first preset matching threshold and greater than or equal to the second preset matching threshold, matching the interface model of the board to be tested with multiple interface models in the first preset rule base to determine the third interface set and the fourth interface set of the board to be tested, wherein the third interface set is used to characterize the board to be tested interfaces that match the multiple interface models in the first preset rule base, and the fourth interface set is used to characterize the board to be tested interfaces that do not match the multiple interface models in the first preset rule base; determining the plug-in parameters of each third interface in the third interface set according to the multiple interface plug-in parameters in the first preset rule base; determining the plug-in parameters of each fourth interface in the fourth interface set based on the candidate plug-in parameter set, the preset probability model and the preset acquisition function of each fourth interface in the fourth interface set; generating a target control script according to the plug-in parameters of each third interface and the plug-in parameters of each fourth interface. Wherein, the second preset matching threshold can be calibrated according to actual conditions, for example, the second preset matching threshold can be 50%, which is not specifically limited here.

[0040] Specifically, after determining the matching value between the interface of the board to be tested and the interfaces in the first preset rule base, the matching value is compared with the first preset matching threshold and the second preset matching threshold. If the matching value is less than the first preset matching threshold and greater than or equal to the second preset matching threshold, it is necessary to determine the interface model of each interface of the board to be tested based on the parameter information of the board to be tested, match the interface model of each interface with multiple interface models in the first preset rule base, and divide the interfaces of the board to be tested into a third interface set and a fourth interface set based on the matching results. For example, the interface of the board to be tested with a successful matching result is divided into the third interface set, and the interface of the board to be tested with a failed matching result is divided into the fourth interface set.

[0041] After the division is completed, it can be determined that each third interface type in the third interface set exists in the first preset rule base, then the interface plug-in parameters corresponding to each third interface type can be directly searched in the first preset rule base, that is, the plug-in parameters of each third interface in the third interface set can be determined.

[0042] It may also be determined that each fourth interface type in the fourth interface set does not exist in the first preset rule base, that is, the plugging parameters of the fourth interface cannot be obtained by querying the first preset rule base. In this case, the plugging parameters of each fourth interface may be predicted based on the candidate plugging parameter set, the preset probability model, and the preset acquisition function for each fourth interface in the fourth interface set. The candidate plugging parameter set for each fourth interface may be determined based on the interface plugging parameters in the first preset rule base, and the plugging parameters of each fourth interface may be selected from the candidate plugging parameter set for each fourth interface using the preset probability model and the preset acquisition function corresponding to each fourth interface.

[0043] Exemplarily, the preset probability model can be a Gaussian model. The preset probability model can be trained using the plug-in parameters with a relatively high probability of occurrence and the contact resistance corresponding to the plug-in parameters with a relatively high probability of occurrence, and the predicted contact resistance and the uncertainty of the predicted contact resistance of each candidate plug-in parameter are determined according to the preset probability model. Then, the potential of each candidate plug-in parameter is determined using the preset acquisition function, the predicted contact resistance of each candidate plug-in parameter, and the uncertainty of the predicted contact resistance, and the candidate plug-in parameter with the greatest potential is used as the next test plug-in parameter. The board test fixture is controlled to perform the plug-in operation with the next plug-in parameter to be tested, and the actual contact resistance is collected by the sensor set on the fourth interface. The preset probability model is further retrained using the test plug-in parameters and the actual contact resistance to re-determine the predicted contact resistance and the uncertainty of the predicted contact resistance of each candidate plug-in parameter, and then the next test plug-in parameter is continued to be searched until the preset stop condition is met, for example, the preset number of iterations is reached, and the test plug-in parameter corresponding to the minimum contact resistance is used as the plug-in parameter of the fourth interface.

[0044] This application accurately determines the matching status of the interface of the board to be tested with the interface model in the first preset rule library, and further divides the interfaces with a matching degree between the two thresholds into a third interface set and a fourth interface set. For the third interface set, the plug-in parameters are directly obtained from the preset rule library, while for the fourth interface set, the optimal plug-in parameters are dynamically determined by combining the candidate plug-in parameter set, the preset probability model and the preset acquisition function. Finally, the target control script is generated based on these parameters to guide the board test fixture to perform test operations, which not only improves the test efficiency, but also enhances the accuracy and reliability of the test, and effectively reduces the risk of test failure due to inappropriate parameters.

[0045] In some embodiments, based on the candidate plug-in parameter set, the preset probability model and the preset acquisition function of each fourth interface in the fourth interface set, the plug-in parameters of each fourth interface in the fourth interface set are determined, including: controlling the board test fixture to perform plug-in operations on the board to be tested according to the preset plug-in parameters of the fourth interface, and collecting corresponding contact resistance to form a model training set; using the model training set to train the preset probability model, the probability model is used to calculate the predicted contact resistance and the standard deviation of the predicted contact resistance of each candidate plug-in parameter in the candidate plug-in parameter set; calculating the acquisition function value of each candidate plug-in parameter based on the predicted contact resistance and the standard deviation of the predicted contact resistance of each candidate plug-in parameter in the candidate plug-in parameter set; determining the test plug-in parameters of the fourth interface according to the candidate plug-in parameters corresponding to the maximum value of the acquisition function; controlling the board test fixture to perform plug-in operations on the board to be tested according to the test plug-in parameters of the fourth interface, and collecting corresponding contact resistance to update the preset probability model; using the updated preset probability model to re-determine the test plug-in parameters of the fourth interface until the preset stop condition is met, and the test plug-in parameters corresponding to the minimum contact resistance of the fourth interface are determined as the plug-in parameters of the fourth interface.

[0046] Exemplarily, for each fourth interface, multiple preset plug-in parameters of the fourth interface are obtained. For example, the preset plug-in parameters can be plug-in parameters with a relatively high probability of occurrence. The control board test fixture performs plug-in operations according to the preset plug-in parameters, and collects contact resistance through sensors set on the fourth interface to form a model training set. The model training set is used to train a preset probability model of the fourth interface (for example, a Gaussian model), and the preset probability model is used to characterize the relationship between the plug-in parameters and the contact resistance; then, each candidate plug-in parameter is input into the preset probability model in turn to obtain the predicted contact resistance and the standard deviation of the predicted contact resistance corresponding to each candidate plug-in parameter, wherein the standard deviation of the predicted contact resistance is used to characterize the uncertainty of the predicted contact resistance; then, each candidate plug-in parameter and the predicted contact resistance and the standard deviation of the predicted contact resistance corresponding to each candidate plug-in parameter are respectively input into the preset acquisition function (For example, the expected improvement amount) to output the acquisition function value corresponding to each candidate plug-in parameter, wherein the acquisition function value is used to characterize the potential of each candidate plug-in parameter, and the candidate plug-in parameter corresponding to the maximum value of the acquisition function value is determined as the next test plug-in parameter, that is, the candidate plug-in parameter with the greatest potential is determined as the next test plug-in parameter; the control board test fixture performs the plug-in operation with the next test plug-in parameter, and collects the actual contact resistance through the sensor set on the fourth interface, adds the next test plug-in parameter and the corresponding actual contact resistance to the model training set, retrains the preset probability model, and uses the updated preset probability model to update the predicted contact resistance and the standard deviation of the predicted contact resistance corresponding to each candidate plug-in parameter, thereby determining the next test plug-in parameter until the preset stop condition is met, such as reaching the preset number of iterations, and the test plug-in parameter corresponding to the minimum contact resistance is used as the plug-in parameter of the fourth interface. Similarly, the plug-in parameter of each fourth interface is determined using the above method.

[0047] In some embodiments, the above method also includes: when the matching value is less than a second preset matching threshold, collecting the interface plug-in force of each board to be tested after the board test fixture is connected to the interface of each board to be tested; determining the interface plug-in parameters of each board to be tested based on the interface plug-in force of each board to be tested; and generating a target control script based on the interface plug-in parameters of each board to be tested.

[0048] Specifically, after determining the matching value between the interface of the board to be tested and the interface in the first preset rule base, the matching value is compared with the second preset matching threshold. If the matching value is less than the second preset matching threshold, it means that most of the interface types of the board to be tested do not exist in the prediction rule base. Therefore, the board test fixture can be pre-connected to the interface of the board to be tested with a certain plug-in force, and the connection signal can be collected by the sensor set at the interface. If the connection signal is successfully collected, the current plug-in force is determined as the plug-in parameter of the interface. In this way, the plug-in force of each interface is collected in turn, and the plug-in parameter of each interface can be determined according to the plug-in force of each interface, and the target control script can be generated according to the plug-in parameter of each interface.

[0049] It should be noted that the target control script generated using the above method is not completely accurate, so the target control script can be marked as "to be optimized". After the test is completed, the tester can further optimize the target control script to be optimized to determine the accurate target control script, and at the same time store the plug-in and unplug parameters of the interface of the board into the first preset rule library.

[0050] In this way, when the matching value falls below a second preset threshold, the insertion and removal force of each board interface under test is collected through actual connection and sensor data, its insertion and removal parameters are determined, and a target control script is generated. This script can be improved by marking it as "for optimization" and allowing further adjustments by the tester after the test.

[0051] In addition, the first preset rule library can also establish dedicated rule subsets for different board models, which include all interface plug-in and unplug parameters for that board model. In other words, the board model of the board under test can be obtained and determined whether the board model of the board under test exists in the dedicated rule subset of the first preset rule library. If the board model exists in the dedicated rule subset of the first preset rule library, the interface plug-in and unplug parameters of the board under test can be directly searched in the dedicated rule subset of the first preset rule library.

[0052] In this way, exclusive rule subsets are established for different models of boards, which facilitates subsequent quick search and use, improves test efficiency and accuracy, and enhances adaptability and scalability.

[0053] In some embodiments, the interface parameter information in the first preset rule base includes multiple interface models, the parameter information of the board to be tested includes the interface model and the number of interfaces of the board to be tested, and determining the matching value between the interface of the board to be tested and the interface in the first preset rule base based on the parameter information of the board to be tested includes: determining the number of interfaces that match the interface model of the board to be tested and the interface model in the first preset rule base; and determining the matching value based on the ratio of the number of matched interfaces to the number of interfaces of the board to be tested.

[0054] Specifically, after obtaining the parameter information of the board to be tested, the number of interfaces of the board to be tested and the interface type of each interface can be directly determined based on the parameter information; then the interface type of the board to be tested is matched with the interface type in the first preset rule base, and the number of matched interfaces is recorded; finally, the ratio of the number of matched interfaces to the number of interfaces of the board to be tested is calculated, and this ratio is the matching degree value between the interface of the board to be tested and the interface in the first preset rule base.

[0055] In some embodiments, the parameter information of the board to be tested includes the board type of the board to be tested, and the target test task of the board test fixture is determined based on the parameter information of the board to be tested, including: determining the target test task of the board test fixture according to the board type of the board to be tested and a second preset rule base, wherein the second preset rule base includes multiple board types and the target test task corresponding to each board type.

[0056] Specifically, after the board test fixture establishes a connection with the board to be tested, it is necessary to further determine the target test task of the board test fixture based on the parameter information of the board to be tested. Because the test tasks for the same board type are almost identical, the target test task of the board test fixture can be determined based on the type of board to be tested. For example, the target test task can be determined by searching a second preset rule base, where the second preset rule base includes multiple board types and the target test task of the board test fixture corresponding to each board type. This can shorten the search time for the target test task and improve testing efficiency.

[0057] In some embodiments, the above method further includes: obtaining environmental information of the test environment in which the board test fixture is located; determining a target fan speed of the board test fixture based on the environmental information; and generating a target control script based on the target fan speed.

[0058] Specifically, when the board test fixture is testing the board, it is necessary to ensure that the board test fixture is in a constant temperature state. However, when the board test fixture is being tested, the heat dissipation of its internal components will cause the temperature of the test environment in which the board test fixture is located to rise. Therefore, when generating a control script, it is also necessary to collect environmental information of the test environment in which the board test fixture is located through the temperature sensor provided on the board test fixture, such as the ambient temperature of the test environment, and determine the target fan speed based on the ambient temperature and generate a target control script. In the following description, the ambient temperature exceeding the preset temperature threshold (e.g., 25°C) is used as an example, but this is not intended to limit the present application. The target fan speed of the board test fixture is determined based on the ambient temperature. For example, the target fan speed can be determined by querying a two-dimensional relationship mapping table between the ambient temperature and the fan speed, wherein the two-dimensional relationship mapping table includes multiple ambient temperatures and the fan speed corresponding to each ambient temperature, and finally the target control script is generated based on the fan speed. When the board test fixture is running according to the target control script, it will run at the target fan speed, which can ensure that the board test fixture is in a constant temperature state to a certain extent.

[0059] In addition, it is also necessary to ensure that the board test fixture is in a constant humidity state. Therefore, when generating the control script, it is also necessary to collect the environmental information of the test environment in which the board test fixture is located through the humidity sensor provided on the board test fixture, such as the ambient humidity of the test environment, and determine the operating gear of the humidifier or dehumidifier of the board test fixture according to the ambient humidity. In the following description, the ambient humidity exceeds the preset humidity threshold (for example, 30%) as an example, but it is not a limitation of this application. The operating gear of the dehumidifier of the board test fixture is determined according to the ambient humidity. For example, the target operating gear can be determined by querying a two-dimensional relationship mapping table between the ambient humidity and the operating gear, wherein the two-dimensional relationship mapping table includes multiple ambient humidities and the operating gear corresponding to each ambient humidity, and finally a target control script is generated according to the operating gear. When the board test fixture runs according to the target control script, it will run at the target operating gear, which can ensure that the board test fixture is in a constant humidity state to a certain extent.

[0060] This application ensures that the board test fixture maintains a constant temperature and humidity during the test process by monitoring the temperature and humidity of the test environment in real time and dynamically adjusting the fan speed and the operating position of the dehumidifier or humidifier, thereby improving the accuracy and reliability of the test.

[0061] In some embodiments, after controlling the board test fixture to test the board to be tested according to the target test task, the method also includes: obtaining vibration data of the board test fixture; performing spectral analysis on the vibration data to determine the components and amplitude of the characteristic frequency; determining the fault type of the board test fixture based on the components and amplitude of the characteristic frequency; and maintaining the board test fixture based on the fault type.

[0062] Specifically, the board test fixture needs to be maintained every preset number of tests, for example, the board test fixture needs to be maintained after it has performed 5,000 board tests. However, if the fixture has shown signs of failure before 5,000 board tests, fixed-period maintenance may miss the best maintenance opportunity and cause damage to the board test fixture. Therefore, when controlling the board test fixture to test the board to be tested according to the target test task, the six-axis inertial measurement unit array built into the board test fixture can be used to monitor the vibration data of the board test fixture in real time. After the test, the collected vibration data can be spectrally analyzed to predict the fault type of the board test fixture, and then the board test fixture can be maintained according to the fault type, thereby extending the service life of the board test fixture and improving the stability and reliability of the test system.

[0063] For example, by using the FFT (Fast Fourier Transform) algorithm to perform vibration spectrum analysis on vibration data and performing an FFT transform on the vibration signal of the board test fixture, the time domain vibration signal can be converted into a frequency domain signal. In the frequency domain, the components and amplitudes of different characteristic frequencies correspond to different vibration sources and fault types, thereby identifying the early fault types of the board test fixture. For example, early faults such as electric cylinder gear wear and cylinder leakage in the board test fixture will produce characteristic vibration signals at specific frequencies. By analyzing the components and amplitudes of these characteristic frequencies in the frequency domain signal, possible faults of the board test fixture can be identified and predictive maintenance can be performed, thereby extending the service life of the board test fixture and improving the stability and reliability of the test.

[0064] In addition, the interface of the board will become loose after multiple plugging and unplugging, so the plugging and unplugging parameters of the board test fixture also need to be adjusted appropriately to avoid damage to the interface to a certain extent. Therefore, when controlling the board test fixture to test the board to be tested according to the target test task, the pressure sensor array and contact resistance sensor built into the board test fixture can be used to monitor the plugging and unplugging force and contact resistance of the interface to determine the interface status of the board. If the difference between the actual detected interface plugging and unplugging force and the interface plugging and unplugging force in the control script is relatively large, or the contact resistance fluctuation range of the interface is detected to exceed the preset value, it can be determined that the interface of the board has become loose. At this time, the plugging and unplugging force can be reduced by a preset percentage (for example, 5%). For example, if the initial plugging and unplugging force is 5N, it can be adjusted to 4.75N, which can avoid damage to the interface due to excessive plugging and unplugging force to a certain extent.

[0065] In some embodiments, obtaining parameter information of the board to be tested includes: identifying an identification code of the board to be tested; and determining parameter information of the board to be tested based on the identification code of the board to be tested if the identification code of the board to be tested is successfully identified.

[0066] Specifically, the board test fixture can scan and identify the identification code of the board to be tested (such as a QR code or barcode). If the identification code of the board to be tested is successfully identified, the parameter information of the board to be tested can be determined based on the identification code of the board to be tested, such as the board type, board model, number of board interfaces, and board interface type of the board to be tested.

[0067] This application scans and identifies the identification code (such as a QR code or barcode) of the board to be tested. If the identification code is successfully identified, the parameter information of the board to be tested can be quickly and accurately determined, including the board type, model, number and type of interfaces, etc., which can significantly improve the efficiency of the test preparation stage, reduce the time and error rate of manual input of parameter information, ensure the smooth progress of the test process, and enhance the level of automation and intelligence.

[0068] In some embodiments, the method further comprises: if identification code recognition of the board under test fails, collecting image information of at least one board under test; and determining parameter information of the board under test based on feature information of the at least one image information of the board under test.

[0069] Specifically, if the identification code of the board to be tested is damaged or blocked, the identification code recognition of the board to be tested will fail. Therefore, the image information of at least one board to be tested can be collected by a camera set on the board test fixture, and the image information of the board to be tested can be extracted, and the parameter information of the board to be tested can be determined based on the extracted feature information.

[0070] In some embodiments, the characteristic information of the image information of at least one board to be tested includes text characteristic information and / or shape characteristic information, and determining the parameter information of the board to be tested based on the characteristic information of the image information of at least one board to be tested includes: determining the board model of the board to be tested based on the text characteristic information and / or shape characteristic information of the image information of at least one board to be tested; and determining the parameter information of the board to be tested based on the board model of the board to be tested.

[0071] Specifically, the feature information of the image information of the board to be tested includes text feature information, shape feature information, or text feature information and shape feature information. Specifically, the image information of the board to be tested can be input into a preset feature extraction model to output the shape feature information of the board to be tested. The shape feature information includes the shape feature information of the entire board to be tested and the shape feature information of the interface of the board to be tested. The shape feature information is then input into a preset board model recognition model to determine the board model of the board to be tested, and other parameter information is further determined based on the board model of the board to be tested. Optical character recognition (OCR) can be performed on the image information of the board to be tested, and fuzzy characters can be corrected using an NLP (Natural Language Processing) algorithm to determine the text feature information of the board to be tested, such as the model code, to determine the board model of the board to be tested, and other parameter information can be further determined based on the board model of the board to be tested. The model of the board to be tested can also be determined by combining text feature information and shape feature information. For example, the text feature information and shape feature information are input into a preset board model recognition model to determine the board model of the board to be tested, thereby improving the accuracy of the parameter information of the board to be tested.

[0072] As a specific example, see Figure 2, the board test fixture 1 of the present application includes: an information identification module 11, a fixture control module 12, a plurality of plug-in modules 13 and a central server 14. Among them, after the board test fixture 1 is powered on, the information identification module 11 automatically scans the identification code of the board to be tested 2. After the scan is completed, the parameter information of the board to be tested 2 can be stored in the information identification module 11. Then the fixture control module 12 calls the parameter information of the board to be tested 2 to the information identification module 11 through the serial port, and at the same time determines the matching value of the interface of the board to be tested 2 and the interface in the first preset rule library pre-stored in the fixture control module 12 according to the parameter information of the board to be tested 2, and determines the target control script of the board test according to the matching value, the parameter information of the board to be tested 2 and the interface parameter information in the first preset rule library. After determining the target control script, the fixture control module 12 will control the board test fixture 1 to automatically close the cover according to the target control script, and automatically control each plug-in module 13 to be plugged in and out, and then the board test fixture 1 will automatically start up. If the target control script cannot be determined, the board test fixture 1 will automatically alarm and will not be able to test the board 2 to be tested. Then, the fixture control module 12 calls the target test task that matches it in the central server 14 according to the parameter information of the board 2 to be tested, and then automatically starts the test. If there is no target test task that matches it in the central server 14, the board test fixture 1 will automatically alarm and terminate the test. It should be noted that the central server 14 will store various target test scripts for the board 2 to be tested. After the board test fixture 1 is turned on, it will automatically connect to the central server 14 to automatically download the target test task that matches the parameter information of the board 2 to be tested, and start the test. After the test is completed, the board test fixture 1 will automatically upload the test log to the central server 14 for archiving, which is convenient for engineers to analyze the test results.

[0073] Reference Figure 3 , the board testing method may further include the following steps:

[0074] S301, start.

[0075] S302: The information identification module identifies parameter information of the board to be tested.

[0076] S303: The fixture control module calls the information identification module for parameter information of the board to be tested.

[0077] S304: Check whether the fixture control module has determined a target control script based on the parameter information of the board to be tested, the interface parameter information in the first preset rule base, and the matching value. If yes, execute S305; otherwise, execute S310.

[0078] S305, multiple plug-in modules are automatically plugged in and out according to the target control script.

[0079] S306, the board test fixture is turned on.

[0080] S307: Check whether the fixture control module successfully calls the target test task that matches the board under test from the central server according to the parameter information of the board under test. If yes, execute S308; otherwise, execute S310.

[0081] S308, the target test task is started.

[0082] S309, start testing.

[0083] S310, end.

[0084] The information recognition module includes a barcode scanning unit, a visual recognition unit and a text recognition unit. Figure 4 The method for obtaining parameter information of the board to be tested includes the following steps:

[0085] S401, start.

[0086] S402: The barcode scanning unit identifies the identification code of the board to be tested.

[0087] S403: Whether the barcode scanning unit successfully recognizes the identification code of the board to be tested. If yes, execute S406; otherwise, execute S404.

[0088] S404: The visual recognition unit collects shape feature information of the board to be tested, and the text recognition unit collects text feature information of the board to be tested.

[0089] S405 , determining parameter information of the board to be tested according to the shape feature information and the text feature information.

[0090] Among them, the visual recognition unit can collect image information of the board to be tested and input the image information into a preset feature extraction model to output the shape features and defect features of the board to be tested. It can further input the shape features of the board to be tested into the board recognition model to output the board model of the board to be tested, and determine other parameter information based on the board model, for example, it can be determined by querying a two-dimensional relationship mapping table between the board model and the board parameter information, and the two-dimensional relationship mapping table includes multiple board models and parameter information corresponding to each board model; at the same time, the defect features can also be input into the preset defect recognition model to output the defect type of the board to be tested, such as defects such as solder joint detachment, interface deformation, and component missing, and generate a visual inspection report, which is equivalent to conducting an appearance inspection of the board to be tested before the test begins. If defects are found in the appearance of the board to be tested at this time, the production line operator can directly identify the problem points of the board to be tested based on the automatically generated visual inspection report, thereby improving the test accuracy.

[0091] The text recognition unit can use OCR to perform optical character recognition on the image information of the board to be tested, and combine it with the NLP algorithm to correct fuzzy characters to determine the text feature information of the board to be tested, such as the model code, to determine the board model of the board to be tested, and further determine other parameter information based on the model of the board to be tested. The specific determination method is not repeated here.

[0092] S406: Output parameter information of the board to be tested.

[0093] S407, end.

[0094] In summary, the three verification mechanisms above operate in a specific order. The barcode is prioritized for obtaining the test board's parameter information. If the barcode is damaged or missing, the visual recognition unit and the text recognition unit are automatically triggered to complete the information. Simultaneously, a 3D feature database is established, mapping the identification code information, shape features, and text features into a unified board ID format (e.g., [manufacturer-type-version-physical feature hash value]), which is then transmitted to the fixture control module.

[0095] Reference Figure 5 , the board testing method may further include the following steps:

[0096] S501: Input parameter information of the board to be tested.

[0097] S502 : Determine, based on parameter information of the board to be tested, a matching value between an interface of the board to be tested and an interface in a first preset rule base.

[0098] S503, quickly generate a target control script.

[0099] S504 : Based on the candidate plugging parameter set of each interface, a preset probability model, and a preset acquisition function, determine the plugging parameters of the interface and generate a target control script.

[0100] S505 , performing a safety mode exploratory test and collecting the plugging force of each interface, determining the plugging parameter of each interface according to the plugging force of each interface, and generating a target control script.

[0101] To sum up, the testing method of the present application can automatically detect the identification code of the board to be tested before starting the test to obtain the parameter information of the board to be tested, and calculate the matching value between the interface of the board to be tested and the board interface in the first preset rule library based on the parameter information of the board to be tested, accurately identify the characteristics of the board to be tested and determine the target control script of the board test fixture suitable for the board to be tested based on the matching value, the parameter information of the board to be tested and the interface parameter information in the first preset rule library, and automatically match the related test tasks, thereby avoiding to a certain extent the risk of delays or information errors in manual verification, which ultimately leads to damage to the board to be tested or the board test fixture, thereby improving test efficiency and reducing test costs.

[0102] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method.

[0103] The embodiment of the present application also provides an electronic device, referring to Figure 6 , including a memory 610, a processor 620 and a computer program stored in the memory 610 and executable on the processor 620. When the processor 620 executes the computer program, the aforementioned board test method is implemented.

[0104] An embodiment of the present application further provides a computer-readable storage medium having a computer program stored thereon, which implements the aforementioned board test method when executed by a processor.

[0105] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0106] An embodiment of the present application further provides a computer program product, including a computer program / instruction, which implements the aforementioned board testing method when executed by a processor.

[0107] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned board test method embodiments.

[0108] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0109] The above describes in detail a test method for a board, an electronic device, and a storage medium provided by the present application. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only intended to help understand the method and core concept of the present application. It should be noted that, for those skilled in the art, without departing from the principles of the present application, various improvements and modifications may be made to the present application, and such improvements and modifications also fall within the scope of protection of the claims of the present application.

Claims

1. A method for testing a board, characterized in that: The method comprises: Acquiring parameter information of the board to be tested, and determining a matching value between an interface of the board to be tested and an interface in a first preset rule base according to the parameter information of the board to be tested; Determining a target control script of a board test fixture based on the parameter information of the board to be tested, the interface parameter information in the first preset rule base, and the matching value; Controlling the board test fixture to establish a connection with the board to be tested according to the target control script, determining a target test task of the board test fixture based on parameter information of the board to be tested, and controlling the board test fixture to test the board to be tested according to the target test task; The interface parameter information in the first preset rule base includes multiple interface models and interface plug-in parameters corresponding to each interface model, the parameter information of the board to be tested includes the interface model of the board to be tested, and a target control script of a board test fixture is determined based on the parameter information of the board to be tested, the interface parameter information in the first preset rule base, and the matching value, including: When the matching value is greater than or equal to the first preset matching threshold, the interface model of the board to be tested is matched with multiple interface models in the first preset rule base to determine the first interface set and the second interface set of the board to be tested, wherein the first interface set is used to characterize the interface of the board to be tested that matches the multiple interface models in the first preset rule base, and the second interface set is used to characterize the interface of the board to be tested that does not match the multiple interface models in the first preset rule base; the plug-in parameters of each first interface in the first interface set are determined according to the multiple interface plug-in parameters in the first preset rule base; the plug-in force of each second interface in the second interface set after being connected to the board test fixture is collected, and the plug-in parameters of each second interface are determined according to the plug-in force of each second interface; the target control script is generated according to the plug-in parameters of each first interface and the plug-in parameters of each second interface.

2. The board testing method according to claim 1, wherein: The method further includes: when the matching value is less than a first preset matching value threshold and greater than or equal to a second preset matching value threshold, matching the interface model of the board to be tested with multiple interface models in the first preset rule base to determine a third interface set and a fourth interface set of the board to be tested, wherein the third interface set is used to characterize the interfaces of the board to be tested that match the multiple interface models in the first preset rule base, and the fourth interface set is used to characterize the interfaces of the board to be tested that do not match the multiple interface models in the first preset rule base; determining the plug-in parameters of each of the third interfaces in the third interface set according to the multiple interface plug-in parameters in the first preset rule base; Determining a plug parameter for each of the fourth interfaces in the fourth interface set based on a candidate plug parameter set for each of the fourth interfaces in the fourth interface set, a preset probability model, and a preset acquisition function; The target control script is generated according to the plug-in and unplug-out parameters of each of the third interfaces and the plug-in and unplug-out parameters of each of the fourth interfaces.

3. The board testing method according to claim 2, wherein: Determining the plugging parameter of each of the fourth interfaces in the fourth interface set based on a candidate plugging parameter set of each of the fourth interfaces in the fourth interface set, a preset probability model, and a preset acquisition function includes: Controlling the board test fixture to perform plugging and unplugging operations on the board to be tested according to the preset plugging and unplugging parameters of the fourth interface, and collecting corresponding contact resistance to form a model training set; The preset probability model is trained using the model training set, where the probability model is used to calculate the predicted contact resistance and the standard deviation of the predicted contact resistance for each candidate plugging parameter in the candidate plugging parameter set; Calculating an acquisition function value of each candidate plugging parameter in the candidate plugging parameter set based on the predicted contact resistance of each candidate plugging parameter and the standard deviation of the predicted contact resistance; Determining the test plugging parameter of the fourth interface according to the candidate plugging parameter corresponding to the maximum value of the acquisition function value; Controlling the board test fixture to perform plugging and unplugging operations on the board to be tested according to the test plug-in and unplugging parameters of the fourth interface, and collecting corresponding contact resistance to update the preset probability model; The updated preset probability model is used to re-determine the test plugging parameters of the fourth interface until a preset stop condition is met, and the test plugging parameters corresponding to the minimum contact resistance of the fourth interface are determined as the plugging parameters of the fourth interface.

4. The board testing method according to claim 1, wherein: The method further comprises: When the matching value is less than a second preset matching threshold, collecting the interface insertion and extraction force of each board to be tested after the board test fixture is connected to the interface of each board to be tested; Determining the interface plug-in / out parameter of each of the boards to be tested according to the interface plug-in / out force of each of the boards to be tested; The target control script is generated according to the interface plug-in and pull-out parameters of each board to be tested.

5. The board testing method according to claim 1, wherein: The interface parameter information in the first preset rule base includes multiple interface models, the parameter information of the board to be tested includes the interface model and the number of interfaces of the board to be tested, and determining the matching value between the interface of the board to be tested and the interface in the first preset rule base according to the parameter information of the board to be tested includes: Determine the number of interfaces whose interface models of the board to be tested match the interface models in the first preset rule base; The matching degree value is determined based on a ratio of the number of matched interfaces to the number of interfaces of the board to be tested.

6. The board testing method according to claim 1, wherein: The parameter information of the board to be tested includes the board type of the board to be tested, and determining the target test task of the board test fixture based on the parameter information of the board to be tested includes: The target test task of the board test fixture is determined according to the board type of the board to be tested and a second preset rule base, wherein the second preset rule base includes a plurality of the board types and a target test task corresponding to each of the board types.

7. The board testing method according to claim 1, wherein: The method further comprises: Obtaining environmental information of the test environment in which the board test fixture is located; Determining a target fan speed of the board test fixture according to the environmental information; The target control script is generated according to the target fan speed.

8. The board testing method according to any one of claims 1 to 7, characterized in that: After controlling the board test fixture to test the board to be tested according to the target test task, the method further includes: Acquiring vibration data of the board test fixture; performing a spectral analysis on the vibration data to determine the components and amplitudes of characteristic frequencies; Determining a fault type of the board test fixture according to the component and amplitude of the characteristic frequency; Maintain the board test fixture according to the fault type.

9. The board testing method according to claim 1, wherein: Get the parameter information of the board under test, including: Identify the identification code of the board to be tested; When the identification code of the board to be tested is successfully recognized, parameter information of the board to be tested is determined based on the identification code of the board to be tested.

10. The board testing method according to claim 9, wherein: The method further comprises: If the identification code of the board to be tested fails to be recognized, collecting image information of at least one piece of the board to be tested; The parameter information of the board to be tested is determined according to the feature information of the image information of the at least one board to be tested.

11. The board testing method according to claim 10, wherein: The feature information of the image information of the at least one board to be tested includes text feature information and / or shape feature information, and determining the parameter information of the board to be tested based on the feature information of the image information of the at least one board to be tested includes: Determining the card model of the card to be tested based on the text feature information and / or shape feature information of the image information of the at least one card to be tested; The parameter information of the board to be tested is determined according to the board model of the board to be tested.

12. A computer-readable storage medium, characterized in that A computer program is stored thereon, and when the computer program is executed by a processor, the board test method according to any one of claims 1 to 11 is implemented.

13. An electronic device, characterized in that: The method comprises a memory, a processor and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the method for testing a board according to any one of claims 1 to 11 is implemented.

14. A computer program product comprising a computer program / instructions, characterized in that When the computer program / instruction is executed by a processor, the board testing method according to any one of claims 1 to 11 is implemented.

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