Anti-radiation process fingerprint extraction system, method and equipment

Abstract

The invention discloses an anti-radiation process fingerprint extraction system, method and device, and relates to the technical field of semiconductor radiation effect mechanism research and application, and the system comprises a central control unit, and a user interaction interface and a COTS device test module which are connected with the central control unit. The central control unit at least comprises an anti-radiation process fingerprint extraction module, an anti-radiation process fingerprint database establishment and storage module and a to-be-tested device test scheme generation module; and the COTS device test module is used for applying test excitation to the to-be-tested device and returning a test characterization result to the central control unit. Microscopic feature characterization, electric heating test analysis, key node positioning and device function testing are carried out on the COTS device to be tested through the system, comprehensive analysis of an anti-radiation process fingerprint extraction algorithm is combined, extraction of anti-radiation process fingerprints of the COTS device is achieved, and the anti-radiation capacity of the COTS device is evaluated at low cost through electric heating test.

Description

Technical Field

[0001] The present invention relates to the field of semiconductor radiation effect mechanism research and application technology, and in particular to a radiation-resistant process fingerprint extraction system, method and equipment. Background Art

[0002] With the rapid development of commercial spaceflight and low-orbit mega-constellations, spacecraft complexity continues to increase, driving a surge in demand for radiation-hardened chips of all types (such as digital, storage, power, and hybrid digital-analog chips). This in turn places higher demands on the rapid selection of components. Because radiation-hardened integrated circuits face a performance-for-hardness trade-off, spacecraft must utilize advanced commercial-off-the-shelf (COTS) components to meet performance requirements. However, the radiation resistance of these COTS components is unknown. To ensure safe and reliable flight, all chips in spacecraft electronic systems must undergo ground-based radiation testing to determine their radiation resistance.

[0003] Currently, radiation resistance testing of COTS devices is primarily conducted using traditional full-scenario irradiation test sources. These tests place stringent requirements on test conditions, equipment, and operation, making it difficult to rapidly and cost-effectively assess the radiation resistance of COTS devices. Recent research indicates that electrothermal damage and radiation damage in devices share a certain physical similarity, providing the basis for simulating radiation testing through electrothermal testing. However, the mapping between electrothermal and radiation damage in components is affected by multiple process parameters, the combined influence of which is defined as the process fingerprint.

[0004] Therefore, there is an urgent need to provide a more reliable radiation-resistant process fingerprint extraction solution. Summary of the Invention

[0005] The purpose of the present invention is to provide a radiation resistance process fingerprint extraction system, method and equipment to solve the problem in the prior art that the radiation resistance process fingerprint of COTS devices cannot be extracted, and thus the radiation resistance of COTS devices cannot be evaluated at low cost through electrothermal testing.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] In a first aspect, the present invention provides a radiation-resistant process fingerprint extraction system, the system comprising:

[0008] User interface, central control unit, and COTS device test module;

[0009] The user interface is used to implement information interaction with the user; both the user interface and the COTS device test module are connected to the central control unit, and the central control unit at least includes: a radiation-hardened process fingerprint extraction module, a radiation-hardened process fingerprint database establishment and storage module, and a test plan generation module for the device under test.

[0010] The COTS device test module is used to apply test stimuli to the device under test and return test characterization results to the central control unit.

[0011] Optionally, the radiation-hardened process fingerprint extraction module is used to run a radiation-hardened process fingerprint extraction algorithm, the radiation-hardened process fingerprint database establishment and storage module is used to construct a radiation-hardened process fingerprint database and perform data storage, and the test plan generation module for the device under test is used to generate a test plan for the device under test.

[0012] Optionally, the COTS device test module includes:

[0013] a microscopic feature characterization unit, an electrothermal composite stress application unit, a sensitive node location unit, and a chip performance and function characterization unit;

[0014] The microscopic feature characterization unit is used to obtain the microscopic geometric features or physical-level information of the device under test; the electrothermal composite stress application unit is used to apply electrothermal composite stress to the device under test; the sensitive node location unit is used to locate the radiation-sensitive positions of the device under test; the chip performance and function characterization unit is used to analyze the device performance and function degradation degree of the device under test after stress and radiation tests.

[0015] Optionally, the user interface at least includes an interaction module; the interaction module is used to input the component type and the type of radiation effect to be tested.

[0016] Optionally, the central control unit generates a test plan according to the component type and the type of radiation effect to be tested;

[0017] The central control unit sends the test plan to the COTS device test module for characterization, and runs a radiation-hardened process fingerprint extraction algorithm according to the test characterization results to extract the radiation-hardened process fingerprint of the COTS device;

[0018] The central control unit is used to establish a radiation-hardened process fingerprint database according to the radiation-hardened process fingerprint and store the radiation-hardened process fingerprint database in the central control unit;

[0019] The radiation-hardened process fingerprint database is displayed through the user interface.

[0020] Compared with the prior art, the present invention provides a system for extracting anti-radiation process fingerprints, which includes a user interaction interface, a central control unit, and a COTS device test module. The user interaction interface is used to implement information interaction with the user. Both the user interaction interface and the COTS device test module are connected to the central control unit. The central control unit at least includes an anti-radiation process fingerprint extraction module, an anti-radiation process fingerprint database establishment and storage module, and a test plan generation module for the device under test. The COTS device test module is used to apply test stimuli to the device under test and return test characterization results to the central control unit. Through this system, microscopic feature characterization, electrothermal test analysis, key node positioning, and device function testing are performed on the COTS device under test. Combining with the comprehensive analysis of the anti-radiation process fingerprint extraction algorithm, the anti-radiation process fingerprint of the COTS device is extracted, and the anti-radiation ability of the COTS device is evaluated at low cost through electrothermal testing.

[0021] In a second aspect, the present invention provides a method for extracting anti-radiation process fingerprints, which is applied to the above anti-radiation process fingerprint extraction system. The method includes:

[0022] The central control unit obtains the information input in the user interaction interface. The central control unit at least includes an anti-radiation process fingerprint extraction module, an anti-radiation process fingerprint database establishment and storage module, and a test plan generation module for the device under test.

[0023] Based on the information, a test plan is generated, and the test characterization results obtained by the COTS device test module based on the test plan are obtained.

[0024] According to the test characterization results, an anti-radiation process fingerprint extraction algorithm is run to extract the anti-radiation process fingerprint of the COTS device.

[0025] Optionally, generating a test plan based on the information and obtaining the test characterization results obtained by the COTS device test module based on the test plan includes:

[0026] Obtaining the microscopic geometric features or physical-level information of the device under test.

[0027] Applying stress to the device under test and performing irradiation testing to obtain the irradiation-sensitive positions of the device under test.

[0028] After stress and irradiation testing, the device performance and function degradation degree of the device under test are analyzed.

[0029] Optionally, running an anti-radiation process fingerprint extraction algorithm according to the test characterization results to extract the anti-radiation process fingerprint of the COTS device includes:

[0030] Obtain the test characterization result, and determine whether the test characterization result is invalid to obtain a judgment result;

[0031] If the judgment result indicates that the test characterization result is invalid, put the test characterization result into the anti-radiation process fingerprint database;

[0032] Output the anti-radiation process fingerprint extraction result.

[0033] Compared with the prior art, the present invention provides a method for extracting anti-radiation process fingerprints. Obtain the information input in the user interaction interface; generate a test plan based on the information, and obtain the test characterization result obtained by the COTS device test module for test characterization based on the test plan; run the anti-radiation process fingerprint extraction algorithm according to the test characterization result to extract the anti-radiation process fingerprint of the COTS device. Through this method, microscopic feature characterization, electrothermal test analysis, key node positioning, and device function test are performed on the COTS device to be tested. Combining with the comprehensive analysis of the anti-radiation process fingerprint extraction algorithm, the extraction of the anti-radiation process fingerprint of the COTS device is realized, and the anti-radiation ability of the COTS device is evaluated at low cost through electrothermal tests.

[0034] In a third aspect, the present invention provides an anti-radiation process fingerprint extraction device, which includes:

[0035] A memory, a processor, and a communication interface coupled to the processor; a computer program that can be run by the processor is stored on the memory; when the processor runs the computer program, it executes the above-mentioned anti-radiation process fingerprint extraction method. Description of the Drawings

[0036] The drawings described herein are used to provide a further understanding of the present invention, and constitute a part of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation to the present invention. In the drawings:

[0037] Figure 1 It is a structural framework diagram of an anti-radiation process fingerprint extraction system provided by the present invention;

[0038] Figure 2 It is a structural diagram of the COTS device test module provided by the present invention;

[0039] Figure 3 It is a flowchart of a method for extracting anti-radiation process fingerprints provided by the present invention;

[0040] Figure 4 It is a flowchart of the anti-radiation process fingerprint extraction algorithm provided by the present invention;

[0041] Figure 5 It is a structural schematic diagram of an anti-radiation process fingerprint extraction device provided by the present invention.

[0042] Reference numerals:

[0043] 1 - User interface, 2 - Central control unit, 3 - COTS device test module, 21 - Anti - radiation process fingerprint extraction module, 22 - Anti - radiation process fingerprint database establishment and storage module, 23 - Test scheme generation module for the device under test, 4 - Micro - feature characterization unit, 5 - Electro - thermal composite stress application unit, 6 - Sensitive node location unit, 7 - Chip performance and function characterization unit. Detailed implementation manners

[0044] For the convenience of clearly describing the technical solutions of the embodiments of the present invention, in the embodiments of the present invention, terms such as "first" and "second" are used to distinguish the same items or similar items with basically the same functions and roles. For example, the first threshold and the second threshold are only used to distinguish different thresholds, and do not limit their sequence. Those skilled in the art can understand that terms such as "first" and "second" do not limit the quantity and execution order, and "first", "second", etc. do not necessarily mean different.

[0045] It should be noted that in the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design solution described as "exemplary" or "for example" in the present invention should not be construed as being more preferred or having more advantages than other embodiments or design solutions. Exactly, using words such as "exemplary" or "for example" aims to present relevant concepts in a specific way.

[0046] In the present invention, "at least one" means one or more, and "a plurality" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone, where A and B can be singular or plural. The character " / " generally represents an "or" relationship between the associated objects before and after. "At least one (item)" or its similar expression below refers to any combination of these items, including any combination of single item (item) or plural items (items). For example, at least one (item) of a, b or c can represent: a, b, c, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b and c, where a, b and c can be single or multiple.

[0047] Based on the deficiencies in the existing technology, if the anti-radiation process fingerprint of COTS devices can be extracted and the mapping relationship between device electro-thermal damage and radiation damage can be established, then it becomes possible to evaluate the anti-radiation ability of COTS devices at low cost through electro-thermal testing. In summary, designing an anti-radiation process fingerprint extraction system is a prerequisite for realizing the rapid evaluation of the anti-radiation ability of COTS devices. The anti-radiation process fingerprint extracted by this system is an important parameter for subsequent electro-thermal testing to simulate irradiation experiments. The extraction of the anti-radiation process fingerprint makes it possible to simulate irradiation experiments through electro-thermal testing, promotes the low-cost and rapid selection of aerospace COTS components, and is beneficial to the development of commercial aerospace.

[0048] In the existing technology, a formula modeling method for design process co-optimization (DTCO) based on multi-task deep learning symbolic regression has been provided. This method aims to establish a formula model for the complex relationship between device process parameters and electrical characteristics through deep learning algorithms in order to guide DTCO. According to the device process parameters and electrical characteristic data, a Spice Model formula model is constructed through a deep learning Transformer model to improve the prediction accuracy of the formula model. Using the Transformer model for formula modeling of the complex relationship between device process parameters and electrical characteristics can accurately and quickly capture the dependence between process parameters and electrical characteristics. However, the method provided in the existing technology is only applicable to the mapping analysis of process parameters and electrical characteristics, and it has not been proven that this technology can be used for the mapping analysis of COTS device process parameters and radiation effects; this technology only stays at the method level and has not been applied at the system level, so it is impossible to extract anti-radiation process fingerprints.

[0049] Therefore, in order to solve the problems existing in the existing technology, the present invention provides an anti-radiation process fingerprint extraction system, method and device. It can realize the extraction of anti-radiation process fingerprints for different types of COTS components such as digital, analog, power supply, and digital-analog hybrid. The extracted anti-radiation process fingerprints can provide guidance for the subsequent rapid evaluation of the anti-radiation ability of low-cost COTS devices, which is beneficial to the rapid selection of COTS components in the aerospace field and is expected to promote the development of commercial aerospace. Next, the solution provided in the embodiments of this specification will be described in conjunction with the accompanying drawings:

[0050] Embodiment 1

[0051] The present invention provides an anti-radiation process fingerprint extraction system. As Figure 1 shown, the system includes:

[0052] A user interface 1, a central control unit 2, and a COTS device test module 3;

[0053] The user interface 1 is used to implement information interaction with the user; both the user interface 1 and the COTS device test module 3 are connected to the central control unit 2, and the central control unit 2 at least includes: a radiation-hardened process fingerprint extraction module 21, a radiation-hardened process fingerprint database establishment and storage module 22, and a test device test plan generation module 23;

[0054] Among them, the radiation-hardened process fingerprint extraction module 21 is used to run the radiation-hardened process fingerprint extraction algorithm, the radiation-hardened process fingerprint database establishment and storage module 22 is used to construct a radiation-hardened process fingerprint database and perform data storage, and the test device test plan generation module 23 is used to generate a test plan for the test device;

[0055] The COTS device test module 3 is used to apply a test stimulus to the test device and return a test characterization result to the central control unit 2.

[0056] In the above structure, the user interface 1 is a medium for interaction and information exchange between the system and the user, and is an interface for the user to communicate with the system. A good user interface 1 should enable the user to operate and use the system conveniently and efficiently. The user interface 1 can receive the user's instructions and data input, such as through input devices such as keyboards, mice, and touchscreens. The user can input text, click buttons, slide the screen, etc. to express their needs and intentions. The user interface 1 can also display feedback information, processing results, data, etc. of the system to the user, such as displaying text, images, videos, etc. on the screen, or playing sounds through the speaker, etc., so that the user can understand the state and response of the system.

[0057] The central control unit 2 generally refers to a unit that, as the core control part in a system or device, is responsible for centralized control, management, coordination, and decision-making of the entire system, and controls the operation and operation of the system. It has control functions, data processing functions, coordination functions, and communication functions, etc.

[0058] The COTS (Commercial Off-The-Shelf) device test module is a module or system used to perform various tests on COTS devices to ensure that these devices can meet performance, reliability, etc. requirements under specific application environments and conditions.

[0059] The test stimuli can be different types of input signals, operating conditions, environmental factors, etc. The purpose is to simulate various situations that COTS devices may encounter during actual use, so as to comprehensively evaluate their performance, functions, reliability, etc. For example, when testing a COTS processor, the test stimuli may include clock signals of different frequencies, various instruction sequences, different temperature and voltage conditions, etc. By means of these stimuli, the responses and performances of the processor under different situations are observed. The COTS device test module 3 will perform a series of excitation operations on the device according to certain test procedures and requirements, and collect the response data of the device under these excitations, that is, the test characterization results.

[0060] Furthermore, in the embodiments provided in this specification, the user interface 1 mainly realizes information interaction with the user, including: obtaining the test device information input by the user and displaying the anti-radiation process fingerprint extraction result to the user. The user interface 1 may at least include an interaction module; the interaction module is used to input the component type and the type of radiation effect to be tested.

[0061] The main functions of the central control unit 2 include running the anti-radiation process fingerprint extraction algorithm, establishing and storing the anti-radiation process fingerprint database, and generating a test plan for the device to be tested.

[0062] The COTS device test module 3 mainly applies test stimuli to the device to be tested, returns the test results to the central control unit 2, and supports the running of the anti-radiation process fingerprint extraction algorithm. This module has four functions: microscopic feature characterization, electrothermal test, sensitive node positioning, and device performance characterization; an anti-radiation process fingerprint extraction system implemented by relying on algorithms, which includes a user interface 1, a central control module, and a COTS device test module 3. The central control module runs the anti-radiation process fingerprint extraction algorithm and other complex programs; a method for jointly realizing anti-radiation process fingerprint extraction through algorithms and test modules.

[0063] Furthermore, the structure diagram of the COTS device test module 3 is as Figure 2 shown, mainly including four major parts, namely a microscopic feature characterization unit 4, an electrothermal composite stress application unit 5, a sensitive node positioning unit 6, and a chip performance and function characterization unit 7. Next, the functions and components of each part of the COTS device test module 3 will be discussed:

[0064] Microscopic feature characterization unit 4: Obtain the microscopic geometric features or physical-level information of the device to be tested, including a microstructure scanning electron microscope and a microstructure analysis unit; specifically, the microscopic feature characterization unit 4 is a key module for obtaining the microscopic-level information of the device to be tested, and its core components include a microstructure scanning electron microscope and a microstructure analysis unit.

[0065] Electrothermal Composite Stress Application Unit 5: Apply stresses such as overvoltage, overcurrent, and high temperature to the device under test, including an adjustable voltage source, current source or current monitoring unit, and infrared temperature monitoring unit, etc.; Specifically, the electrothermal composite stress application unit 5 is mainly used to apply stresses such as overvoltage, overcurrent, and high temperature to the device under test to simulate the complex working conditions that the device may encounter in actual applications, so as to comprehensively evaluate its performance and reliability. The adjustable voltage source can generate a voltage output within a certain range, and different overvoltage conditions can be applied to the device under test by adjustment to simulate the working state of the device when the voltage is too high. The current source can apply overcurrent stress to the device, and the current monitoring unit is used to monitor the magnitude of the current flowing through the device in real time. When the current exceeds the set threshold, it can be detected in time and corresponding measures can be taken to avoid damage to the device due to overcurrent. The infrared temperature monitoring unit can use infrared technology to perform non-contact measurement of the temperature on the surface of the device, and can quickly and accurately obtain the temperature change of the device under the action of stresses such as overvoltage, overcurrent, and high temperature, realizing real-time monitoring of the device temperature. The sensitive node positioning unit 6 can obtain the radiation-sensitive positions of the device under test, mainly realized by the method of pulsed laser positioning; the chip performance and function characterization unit 7 can analyze the degradation degree of the device performance and function after stress and radiation tests, mainly including a logic analyzer, device test analysis module, etc.

[0066] In the above-mentioned Embodiment 1, integrating the three major components of the user interaction interface 1, the central control unit 2, and the COTS device test module 3, the operation logic of the anti-radiation process fingerprint extraction system is as follows: First, the user inputs the component type and the type of radiation effect to be tested (such as single particle or total dose) through the interaction module, and the central control unit 2 generates a test plan according to the input information and hands it over to the COTS device test module 3 for characterization. According to the characterization results, the anti-radiation process fingerprint extraction algorithm in the central control unit 2 extracts the anti-radiation process fingerprint of the COTS device, and establishes an anti-radiation process fingerprint database, which is stored in the central control unit 2. Finally, the information in the anti-radiation process fingerprint database is displayed on the user interaction interface 1 for the user to use.

[0067] The system provided in the above-mentioned Embodiment 1 realizes the extraction of the anti-radiation process fingerprint of the COTS device through micro-characterization, electrothermal test analysis, key node positioning, and device function test of the COTS device under test, combined with the comprehensive analysis of the anti-radiation process fingerprint extraction algorithm. It can realize the extraction of anti-radiation process fingerprints for different types of COTS components such as digital, analog, power supply, and digital-analog hybrid. The extracted anti-radiation process fingerprints can provide guidance for the rapid evaluation of the anti-radiation capabilities of subsequent low-cost COTS devices, which is beneficial to the rapid selection of COTS components in the aerospace field and is expected to promote the development of commercial aerospace.

[0068] Embodiment 2

[0069] The present invention also provides a method for extracting anti-radiation process fingerprints. As Figure 3 shown, the method includes:

[0070] As Figure 3 shown, the process may include the following steps:

[0071] Step 310: The central control unit obtains the information input in the user interface; the central control unit at least includes: an anti-radiation process fingerprint extraction module, an anti-radiation process fingerprint database establishment and storage module, and a test plan generation module for the device under test.

[0072] Specifically, it may be to obtain the test device information input by the user in the user interface and display the anti-radiation process fingerprint extraction result to the user.

[0073] Step 320: Generate a test plan based on the information, and obtain the test characterization result obtained by the COTS device test module based on the test plan for test characterization.

[0074] In this step, the test plan may include the requirements and performance indicators for testing the COTS device to verify. Specifically, the test plan may include test objectives, test environments, test items, test methods, and test standards, etc.

[0075] The test characterization result is the final conclusion and data obtained after testing and characterizing the COTS device. These results may include the device data of the test, test methods, test processes, test data, and conclusions drawn based on these data, etc. The test characterization result can intuitively reflect the performance and quality status of the COTS device, and provide an important basis for product design improvement, quality control, and selection decision-making, etc. In the anti-radiation related tests for COTS devices, the test characterization result may include the performance change data of the device under a specific radiation dose, such as the working current, the stability of the output signal, and whether the function is abnormal, etc.

[0076] Step 330: Run the anti-radiation process fingerprint extraction algorithm according to the test characterization result to extract the anti-radiation process fingerprint of the COTS device.

[0077] Figure 3The method in [description] obtains the information input in the user interaction interface; generates a test plan based on the information, and obtains the test characterization results obtained by the COTS device test module through testing and characterization based on the test plan; runs the anti-radiation process fingerprint extraction algorithm according to the test characterization results to extract the anti-radiation process fingerprint of the COTS device. Through this method, microscopic feature characterization, electrothermal test analysis, key node positioning, and device function testing are performed on the COTS device to be tested. Combining the comprehensive analysis of the anti-radiation process fingerprint extraction algorithm, the extraction of the anti-radiation process fingerprint of the COTS device is realized, and the anti-radiation ability of the COTS device is evaluated at low cost through electrothermal testing.

[0078] Based on Figure 3 For the method of [description], some specific embodiments of this method are also provided in the embodiments of this specification, which will be described below.

[0079] Step 320, in specific implementation, the detailed steps may include:

[0080] Obtain the microscopic geometric features or physical-level information of the device to be tested;

[0081] Apply stress to the device to be tested and perform irradiation testing to obtain the irradiation-sensitive positions of the device to be tested;

[0082] Analyze the device performance and function degradation degree of the device to be tested after stress and irradiation testing.

[0083] In the above steps, the purpose of obtaining the microscopic geometric features or physical-level information of the device to be tested is to deeply understand the internal structure and physical characteristics of the device to be tested, provide basic data for subsequent analysis of the device's performance under stress and irradiation, help accurately evaluate the reasons for device performance and function degradation, and also provide a basis for establishing device models, predicting device life, etc.

[0084] The microscopic geometric feature information may refer to features such as the shape, size, and structural layout of the device at the microscopic scale. For example, for an integrated circuit chip, the microscopic geometric features may include the gate length of the transistor, the channel width, the line width and spacing of the metal interconnects, and the relative positional relationship between different functional modules. It can be realized through a variety of microscopic imaging and analysis techniques. For example, a scanning electron microscope (SEM) can use an electron beam to scan the surface of the device to generate a high-resolution image, clearly presenting the microscopic structure and morphology of the device surface; a transmission electron microscope (TEM) can penetrate the sample to observe more subtle structures inside the device, such as crystal defects and atomic arrangements; the focused ion beam (FIB) technology can not only perform high-precision cutting on the device to observe the internal structure, but also perform deposition or etching operations at specific positions to assist in obtaining microscopic geometric information. The physical-level information may include the physical properties of the device.

[0085] Applying stress to the device under test and performing irradiation tests to obtain the irradiation-sensitive positions of the device under test aims to simulate the harsh environment that the device may face in actual applications, identify the parts of the device that are prone to performance degradation or functional failure under the combined action of stress and irradiation, and provide key information for subsequent device improvement design, reliability assessment, and formulation of protection measures.

[0086] The applied stress includes various forms, such as electrical stress (applying excessive voltage, current, or rapid changes in voltage / current). Electrical stress can precisely control the voltage, current waveforms, and amplitudes applied to the device through devices such as programmable power supplies and signal generators.

[0087] Irradiation tests can expose the device to different types and doses of radiation environments. Common radiation types include gamma rays, X-rays, neutrons, protons, etc. The impact mechanisms of different radiation types on the device are different. For example, gamma rays and X-rays mainly generate electron-hole pairs inside the device through ionization, resulting in changes in the electrical properties of the device; neutrons mainly cause atomic displacement damage by elastic or inelastic scattering with the atomic nuclei of the device, destroy the lattice structure, and affect the carrier mobility of the device.

[0088] During the stress and irradiation tests, by real-time monitoring the performance parameters (such as current, voltage, output signal, etc.) and functional states of the device, when significant changes in the performance parameters of certain regions or parts are found or the function is abnormal, these regions or parts are the irradiation-sensitive positions.

[0089] The purpose of analyzing the device performance and functional degradation degree of the device under test after stress and irradiation tests is to comprehensively evaluate the performance and functional changes of the device under the combined action of stress and irradiation, quantify the degradation degree, and provide a quantitative basis for device reliability assessment, life prediction, and formulation of improvement measures.

[0090] Device performance usually refers to the electrical, thermal, optical, etc. characteristics exhibited by the device under specific working conditions. Performance degradation analysis is to compare the various performance parameters of the device before and after the test and observe their changes.

[0091] Functional degradation can refer to the decline in the ability of the device to complete specific tasks or achieve specific functions. For example, a digital circuit device may not be able to correctly perform the expected logical operations, and a sensor may not be able to accurately sense external signals and convert them into effective electrical signals.

[0092] When specifically implemented in step 330, the flowchart of the anti-radiation process fingerprint extraction algorithm is as Figure 4 shown. After the user inputs the information of the device under test and generates the corresponding test stimuli, the implementation steps may further include:

[0093] Obtain the test characterization result and determine whether the test characterization result is invalid to obtain a judgment result;

[0094] If the judgment result indicates that the test characterization result is invalid, put the test characterization result into the anti-radiation process fingerprint database;

[0095] Output the anti-radiation process fingerprint extraction result.

[0096] In the above detailed steps, the purpose of determining whether the test characterization result is invalid to obtain a judgment result is to determine whether the device has exhibited unexpected performance or functional behaviors during the test, that is, to determine whether the device is invalid. This step is crucial for screening out problematic devices, further analyzing the failure causes, and evaluating the reliability of the device.

[0097] The anti-radiation process fingerprint extraction system of the above Embodiment 1 can extract key anti-radiation process parameters (i.e., anti-radiation process fingerprints) according to the type of COTS devices through various mature test technologies such as electrothermal tests and microscopic characterizations. The extraction of anti-radiation process fingerprints is a prerequisite for the rapid selection of COTS devices in aerospace applications, and can also provide data support for the anti-radiation hardening of components, which is beneficial to the further application of COTS devices in the aerospace field.

[0098] Based on the same idea, the present invention also provides an anti-radiation process fingerprint extraction device. As Figure 5 shown, the device includes:

[0099] A memory, a processor, and a communication interface coupled to the processor; a computer program that can be run by the processor is stored on the memory; when the processor runs the computer program, it executes the anti-radiation process fingerprint extraction method of the foregoing Embodiment 2.

[0100] As Figure 5 shown, the above processor can be a general-purpose central processing unit (CPU), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits for controlling the execution of the program of the present invention. The above communication interface can be one or more. The communication interface can use any transceiver-like device for communicating with other devices or communication networks.

[0101] As Figure 5 shown, the above terminal device may further include a communication line. The communication line may include a path for transmitting information between the above components.

[0102] Optionally, asFigure 5 As shown, the terminal device may further include a memory. A computer program that can be run by the processor is stored on the memory; when the processor runs the computer program, the method provided by the embodiments of the present invention is implemented.

[0103] As Figure 5 shown, the memory may be a read-only memory (ROM) or other type of static storage device that can store static information and instructions, a random access memory (RAM) or other type of dynamic storage device that can store information and instructions, or may also be an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM) or other optical disc storage, optical disc storage (including compact discs, laser discs, optical discs, digital versatile discs, Blu-ray discs, etc.), magnetic disk storage media or other magnetic storage devices, or any other medium that can be used to carry or store the desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto. The memory may exist independently and be connected to the processor through a communication line. The memory may also be integrated with the processor.

[0104] Optionally, the computer-executable instructions in the embodiments of the present invention may also be referred to as application code, and the embodiments of the present invention do not make specific limitations thereto.

[0105] In a specific implementation, as an embodiment, as Figure 5 shown, the processor may include one or more CPUs, such as Figure 5 CPU0 and CPU1 in

[0106] In a specific implementation, as an embodiment, as Figure 5 shown, the terminal device may include multiple processors, such as Figure 5 the processors in

[0107] The above mainly introduces the solution provided by the embodiments of the present invention from the perspective of the interaction between various modules. It can be understood that, in order to implement the above functions, each module includes the corresponding hardware structure and / or software unit for executing each function. Those skilled in the art should easily realize that, in combination with the units and algorithm steps of each example described in the embodiments disclosed herein, the present invention can be implemented in the form of hardware or a combination of hardware and computer software. Whether a certain function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0108] The embodiments of the present invention can perform the division of functional modules according to the above method examples. For example, each functional module can be divided corresponding to each function, or two or more functions can be integrated into one processing module. The above integrated module can be implemented in the form of hardware or in the form of a software functional module. It should be noted that the division of modules in the embodiments of the present invention is illustrative, only a logical function division, and there can be other division methods in actual implementation.

[0109] The processor in this specification can also have the function of a memory. The memory is used to store the computer execution instructions for executing the solution of the present invention and is controlled by the processor to execute. The processor is used to execute the computer execution instructions stored in the memory, thereby implementing the method provided by the embodiments of the present invention.

[0110] Although the present invention has been described in combination with various embodiments herein, however, in the process of implementing the claimed present invention, those skilled in the art can understand and implement other variations of the disclosed embodiments by viewing the drawings, the disclosure content, and the appended claims. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "one" does not exclude a plurality of situations. A single processor or other unit can implement several functions listed in the claims. Certain measures are recited in mutually different dependent claims, but this does not mean that these measures cannot be combined to produce good results.

[0111] Although the present invention has been described in connection with specific features and their embodiments, it is obvious that various modifications and combinations can be made thereto without departing from the spirit and scope of the present invention. Accordingly, the present specification and the drawings are merely exemplary illustrations of the present invention defined by the appended claims, and are considered to cover any and all modifications, variations, combinations or equivalents within the scope of the present invention. Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention is also intended to include these changes and modifications.

Claims

1. An anti-radiation process fingerprint extraction system, characterized in that, The system includes: a user interface, a central control unit, and a COTS device test module; The user interface is used to achieve information interaction with the user; Both the user interface and the COTS device test module are connected to the central control unit, and the central control unit at least includes: a radiation-resistant process fingerprint extraction module, a radiation-resistant process fingerprint database establishment and storage module, and a test scheme generation module for the device under test; The COTS device test module is used to apply a test excitation to the device under test and return a test characterization result to the central control unit.

2. The anti-radiation process fingerprint extraction system according to claim 1, characterized in that, The radiation-resistant process fingerprint extraction module is used to run a radiation-resistant process fingerprint extraction algorithm, the radiation-resistant process fingerprint database establishment and storage module is used to construct a radiation-resistant process fingerprint database and perform data storage, and the test scheme generation module for the device under test is used to generate a test scheme for the device under test.

3. The anti-radiation process fingerprint extraction system according to claim 1, characterized in that, The COTS device test module includes: a microscopic feature characterization unit, an electrothermal composite stress application unit, a sensitive node positioning unit, and a chip performance and function characterization unit; The microscopic feature characterization unit is used to obtain the microscopic geometric features or physical-level information of the device under test; the electrothermal composite stress application unit is used to apply an electrothermal composite stress to the device under test; the sensitive node positioning unit is used to locate the radiation-sensitive positions of the device under test; the chip performance and function characterization unit is used to analyze the device performance and function degradation degree of the device under test after stress and radiation tests.

4. The anti-radiation process fingerprint extraction system according to claim 1, wherein The user interface at least includes an interaction module; the interaction module is used to input the component type and the type of radiation effect to be tested.

5. The anti-radiation process fingerprint extraction system according to claim 4, wherein, The central control unit generates a test scheme according to the component type and the type of radiation effect to be tested; The central control unit sends the test scheme to the COTS device test module for characterization, and runs a radiation-resistant process fingerprint extraction algorithm according to the test characterization result to extract the radiation-resistant process fingerprint of the COTS device; The central control unit is used to establish a radiation-resistant process fingerprint database according to the radiation-resistant process fingerprint and store the radiation-resistant process fingerprint database in the central control unit; The radiation-resistant process fingerprint database is displayed through the user interface.

6. A method for extracting anti-radiation process fingerprints, characterized in that, The method is applied to a radiation-resistant process fingerprint extraction system, and the method includes: The central control unit obtains the information input in the user interface; the central control unit at least includes: a radiation-resistant process fingerprint extraction module, a radiation-resistant process fingerprint database establishment and storage module, and a test scheme generation module for the device under test; Generate a test scheme based on the information, and obtain the test characterization result obtained by the COTS device test module for test characterization based on the test scheme; Run a radiation-resistant process fingerprint extraction algorithm according to the test characterization result to extract the radiation-resistant process fingerprint of the COTS device.

7. The anti-radiation process fingerprint extraction method according to claim 6, wherein Generating a test scheme based on the information, and obtaining the test characterization result obtained by the COTS device test module for test characterization based on the test scheme, includes: Obtain the microscopic geometric features or physical-level information of the device under test; Apply stress to the device under test and perform irradiation testing to obtain the irradiation-sensitive positions of the device under test; Analyze the device performance and functional degradation degree of the device under test after stress and irradiation testing.

8. The anti-radiation process fingerprint extraction method according to claim 6, wherein, Run the anti-radiation process fingerprint extraction algorithm according to the test characterization results to extract the anti-radiation process fingerprints of COTS devices, including: Obtain the test characterization results and determine whether the test characterization results are invalid to obtain a judgment result; If the judgment result indicates that the test characterization results are invalid, put the test characterization results into the anti-radiation process fingerprint database; Output the anti-radiation process fingerprint extraction result.

9. An anti-radiation process fingerprint extraction device, characterized in that the device Including: A memory, a processor, and a communication interface coupled to the processor; A computer program executable by the processor is stored on the memory; When the processor runs the computer program, it executes the anti-radiation process fingerprint extraction method according to any one of claims 6 to 8.

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