Quartz crystal resonator testing, marking, detecting and packaging equipment

Abstract

The invention relates to quartz crystal resonator testing, marking, detecting and packaging equipment, which comprises a first module, a second module, a third module and a fourth module, the second module comprises a material taking assembly, the material taking assembly picks up the quartz crystal resonators output by the output end of the first module to the second module, and the second module tests, marks and detects the quartz crystal resonators to obtain qualified quartz crystal resonators. Qualified quartz crystal resonators are output through the material taking assembly; the input end of the third module receives the quartz crystal resonator output by the material taking assembly of the second module, and the third module packages the quartz crystal resonator. Through the arrangement, the production efficiency is improved, and management is convenient.

Description

Technical Field

[0001] The present invention relates to the technical field of quartz crystal resonator processing, and particularly to a device for testing, marking, detecting, and packaging quartz crystal resonators. Background Art

[0002] A quartz crystal resonator is an electronic component made using the inverse piezoelectric effect of quartz crystal material and used to generate a high-precision oscillation frequency. Quartz crystal resonators are widely used in electronic devices such as oscillators, timers, clock circuits, and wireless communication systems to ensure accurate timing and frequency stability.

[0003] In the prior art, the testing, marking, detecting, and packaging of quartz crystal resonators generally need to be completed by multiple different devices respectively. Using multiple devices has problems such as discontinuous processes, incompatible trays between devices, low efficiency of manual product handling between devices, high costs of multiple devices, and more operator requirements, which in turn lead to problems such as low production efficiency, increased production costs, and increased management complexity. Summary of the Invention

[0004] To solve the above defects, the present invention proposes a device for testing, marking, detecting, and packaging quartz crystal resonators.

[0005] The technical solution adopted by the present invention is a device for testing, marking, detecting, and packaging quartz crystal resonators, including:

[0006] A first module, whose output end outputs the quartz crystal resonator with the front side facing up;

[0007] A second module, which includes a picking component. The picking component picks up the quartz crystal resonator output from the output end of the first module to the second module. The second module tests, marks, and detects the quartz crystal resonator to obtain a qualified quartz crystal resonator, and the qualified quartz crystal resonator is output through the picking component;

[0008] A third module, whose input end receives the quartz crystal resonator output from the picking component of the second module and packages the quartz crystal resonator.

[0009] Preferably, the first module includes a vibrating disk. The vibrating disk includes a body, a spiral feed rail provided on the body, and a first air nozzle. The spiral feed rail is provided with a blowing section along its circumference; the quartz crystal resonator with the front side facing up is conveyed to the output end of the first module through the spiral feed rail, and the quartz crystal resonator with the front side facing down is blown by the first air nozzle to the body at the blowing section.

[0010] Preferably, the bottom width of the spiral material rail is reduced in the blowing section, and the first air nozzle blows air at the quartz crystal resonator in the blowing section.

[0011] Preferably, the second module includes a first turntable rotatable about its axis. The picking component includes a plurality of suction nozzles evenly distributed along the circumference of the first turntable. The picking component picks up / releases the quartz crystal resonator through the suction nozzles. The output end of the first module and the input end of the third module are respectively arranged opposite to one suction nozzle of the first turntable.

[0012] Preferably, the second module further includes a first positioning mechanism, a first testing mechanism, a second testing mechanism, a third positioning mechanism and a second detection mechanism. The first turntable is sequentially provided with a feeding station, a first positioning station, a first testing station, a second testing station, a third positioning station, a second detection station and a feeding station along its rotation direction;

[0013] The suction nozzle at the feeding station picks up the quartz crystal resonator at the output end of the first module. The first positioning mechanism positions the quartz crystal resonator picked up by the suction nozzle at the first positioning station. The first testing mechanism tests the electrical parameters of the quartz crystal resonator picked up by the suction nozzle at the first testing station. The second testing mechanism tests the insulation performance of the quartz crystal resonator picked up by the suction nozzle at the second testing station. The third positioning mechanism positions the quartz crystal resonator picked up by the suction nozzle at the third positioning station. The second detection mechanism performs a bottom vision inspection on the quartz crystal resonator picked up by the suction nozzle at the second detection station. The suction nozzle at the feeding station releases the quartz crystal resonator to the input end of the third module.

[0014] Preferably, the second module further includes a second turntable rotatable about its axis. A plurality of temporary placement platforms for temporarily placing quartz crystal resonators are evenly distributed along the circumference of the second turntable. An air suction port is provided in the middle of the temporary placement platform.

[0015] Preferably, the second module further includes a second positioning mechanism, a marking mechanism and a first detection mechanism. The second turntable is sequentially provided with a second positioning station, a marking station and a first detection station along its rotation direction;

[0016] The second positioning mechanism positions the quartz crystal resonator temporarily placed on the temporary placement platform at the second positioning station. The marking mechanism marks the quartz crystal resonator temporarily placed on the temporary placement platform at the marking station. The first detection mechanism performs a front vision inspection on the quartz crystal resonator temporarily placed on the temporary placement platform at the first detection station.

[0017] Preferably, the second module includes an exchange station, which is located at the position where the first turntable and the second turntable face each other. The exchange station is located between the first test station and the second test station of the first turntable, and the exchange station is located between the second positioning station and the first detection station of the second turntable;

[0018] At the exchange station, the nozzle releases one of the quartz crystal resonators to the temporary placement table and sucks one quartz crystal resonator from the next temporary placement table.

[0019] Preferably, the second module further includes a first waste material removing mechanism and a second waste material removing mechanism. A first waste material removing station is further provided between the first detection station and the exchange station of the second turntable, and a second waste material removing station is further provided between the second detection station and the feeding station of the first turntable;

[0020] The quartz crystal resonators that fail in the electrical parameter test or / and the front vision inspection are taken away and discarded by the first waste material removing mechanism at the first waste material removing station, and the quartz crystal resonators that fail in the insulation performance test or / and the bottom vision inspection are taken away and discarded by the second waste material removing mechanism at the second waste material removing station.

[0021] Preferably, the third module includes:

[0022] A guide rail loading mechanism, which receives the quartz crystal resonators output by the second module and outputs them;

[0023] A pinwheel mechanism, which drives the carrier tape to move past the guide rail loading mechanism under the drive of a motor, and the carrier tape receives the quartz crystal resonators output by the guide rail loading mechanism;

[0024] A cylinder tape pressing mechanism, which presses a film on the carrier tape under the drive of a cylinder, so that the quartz crystal resonator is heat-sealed between the film and the carrier tape;

[0025] A material collecting mechanism, which winds up the heat-sealed carrier tape.

[0026] Compared with the prior art, the present invention has the following beneficial effects:

[0027] The quartz crystal resonator testing, marking, detecting, and packaging equipment in the present invention can independently complete the testing, marking, detecting, and packaging of quartz crystal resonators without the need for multiple devices to cooperate with each other. There is no problem of incompatibility between devices, and there is no need for manual handling of products between devices, saving labor and equipment costs, improving production efficiency, and facilitating management. The quartz crystal resonator testing, marking, detecting, and packaging equipment uses a material taking component to take materials from the first module, then completes testing, marking, and detection inside the second module, and finally the material taking component sends the qualified quartz crystal resonators after testing, marking, and detection into the third module, where the third module performs the final packaging. With the assistance of the material taking component, a series of operations on the quartz crystal resonator are smoothly completed, which is efficient and reliable. Brief Description of the Drawings

[0028] The present invention will be described in detail below in conjunction with embodiments and drawings, where:

[0029] Figure 1 is the overall structural schematic diagram of the quartz crystal resonator testing, marking, detecting, and packaging equipment;

[0030] Figure 2 is the top view of the quartz crystal resonator testing, marking, detecting, and packaging equipment;

[0031] Figure 3 is the partial structural schematic diagram of the second module;

[0032] Figure 4 is the schematic diagram of the first module;

[0033] Figure 5 is the schematic diagram of the first turntable;

[0034] Figure 6 is the schematic diagram of the positioning mechanism one;

[0035] Figure 7 is the schematic diagram of the testing mechanism one;

[0036] Figure 8 is the schematic diagram of the second turntable;

[0037] Figure 9 is the schematic diagram of the positioning mechanism two;

[0038] Figure 10 is the schematic diagram of the marking mechanism;

[0039] Figure 11 is the schematic diagram of the detecting mechanism one;

[0040] Figure 12 is the schematic diagram of the detecting mechanism two;

[0041] Figure 13It is a schematic diagram of the collection mechanism;

[0042] Figure 14 It is a schematic diagram of the third module.

[0043] 100. First module; 110. Body; 111. Front and back detection optical fiber; 112. First air nozzle; 113. Blowing regulating valve; 114. Amplifying optical fiber; 115. Vibration disk circular vibration body; 120. Spiral feeding track; 130. Flat track; 131. In-place detection optical fiber; 132. Separation acceleration blowing device; 133. Full material detection optical fiber; 134. Missing material detection optical fiber; 135. Acceleration mechanism; 136. Flat track vibration body; 137. Material cleaning structure;

[0044] 200. Second module; 211. First turntable; 212. Second turntable; 213. Temporary placement table; 214. Insulation tester; 220. Collection mechanism; 221. Collection mechanism mounting seat; 222. Defective material cup; 223. Feeding pipe; 230. Suction nozzle; 231. Filter; 232. Vacuum breaking structure; 233. Solenoid valve; 240. Positioning mechanism 1; 241. Positioning claw; 242. Positioning cam mechanism; 243. Positioning motor 1; 250. Positioning mechanism 2; 251. Positioning motor 2; 252. Positioning slide; 253. Positioning piece; 254. Positioning mounting seat; 260. Testing mechanism 1; 261. Testing probe; 262. Testing probe board; 263. Testing probe board connecting wire; 264. Probe testing mechanism mounting seat; 265. Industrial control host; 270. Marking mechanism; 271. Marking adjustment mounting seat; 272. Laser head; 273. Laser; 274. Laser connecting control host wire; 275. Control host; 280. Detection mechanism 1; 281. Installation and adjustment bracket; 282. Red light annular light source; 283. Black and white camera; 284. Telecentric lens; 290. Detection mechanism 2; 291. Camera adjustment mounting seat; 292. Camera; 293. Protective cover; 294. Light source mounting seat; 295. Reflective prism; 296. Annular light source;

[0045] 300. Third module; 310. Motor; 320. Pinwheel mechanism; 330. Guide rail loading mechanism; 340. Cylinder strapping mechanism; 350. Tape cutting mechanism; 360. Material receiving mechanism;

[0046] 410. Loading station; 420. Positioning 1 station; 430. Testing 1 station; 440. Testing 2 station; 450. Positioning 3 station; 460. Detection 2 station; 470. Scrap 2 station; 480. Material identification 4 station; 490. Feeding station;

[0047] 510. Exchange station;

[0048] 610. Material Identification Station 1; 620. Positioning Station 2; 630. Marking Station; 640. Material Identification Station 2; 650. Inspection Station 1; 660. Scrap Discharge Station 1; 670. Material Identification Station 3;

[0049] 700. Quartz Crystal Resonator. Detailed Implementation Manner

[0050] To make the objectives, technical solutions, and advantages of the present invention clearer, the following will further describe the implementation manners of the present invention in detail with reference to the accompanying drawings. The examples of the embodiments are shown in the drawings, where the same or similar reference numerals represent the same or similar components or components with the same or similar functions from beginning to end. The embodiments described below by referring to the drawings are exemplary and are only used to explain the present invention and cannot be construed as a limitation to the present invention.

[0051] In one embodiment, as Figure 1-2 shown, a quartz crystal resonator testing, marking, inspecting, and packaging device includes a first module 100, a second module 200, and a third module 300. The first module 100 is used for feeding. The output end of the first module 100 outputs the quartz crystal resonator 700 with the front side facing up, so that the second module 200 and the third module 300 can perform subsequent operations on the correct surface of the quartz crystal resonator 700. The second module 200 includes a material taking component. The material taking component picks up the quartz crystal resonator 700 from the output end of the first module 100 and sends it to the second module 200. Then, the second module 200 tests, marks, and inspects the quartz crystal resonator 700 to obtain a qualified quartz crystal resonator 700. The qualified quartz crystal resonator 700 is then output to the third module 300 through the material taking component. The input end of the third module 300 receives the qualified quartz crystal resonator 700 output by the second module 200 and then packages it.

[0052] The quartz crystal resonator testing, marking, inspecting, and packaging device in this embodiment can independently complete the testing, marking, inspecting, and packaging of the quartz crystal resonator 700 without the need for multiple devices to cooperate with each other, eliminating the problem of incompatibility between devices and the need for manual handling of products between devices, saving labor and equipment costs, improving production efficiency, and facilitating management. The quartz crystal resonator testing, marking, inspecting, and packaging device uses the material taking component to pick up materials from the first module 100, then completes testing, marking, and inspection inside the second module 200, and finally sends the qualified quartz crystal resonator 700 after testing, marking, and inspection into the third module 300 by the material taking component, and the third module 300 performs the final packaging. With the assistance of the material taking component, a series of operations on the quartz crystal resonator 700 are smoothly completed, which is efficient and reliable.

[0053] In one embodiment, the first module 100 includes a vibrating bowl. The vibrating bowl includes a body 110, a spiral track 120, and a first air nozzle 112. The spiral track 120 is disposed on the body 110. The spiral track is composed of a bottom surface and a side surface. The side surface for carrying one side of the quartz crystal resonator 700 forms an obtuse angle with the horizontal plane, so that the quartz crystal resonator 700 can lean more stably on the side surface of the spiral track. The body 110 vibrates to vibrate the quartz crystal resonators 700 dispersed therein into the spiral track 120, and the spiral track 120 conveys the quartz crystal resonators 700 to the output end of the first module 100 through the rotation of its bottom surface. Among them, a blowing section is provided along the circumferential direction of the spiral track 120. The quartz crystal resonator 700 with the front side facing up passes through the blowing section of the spiral track 120 and is then conveyed to the output end of the first module 100; the quartz crystal resonator 700 with the front side facing down is blown by the first air nozzle 112 to fall into the body 110 at the blowing section of the spiral track, so as to ensure that the quartz crystal resonators 700 output from the output end of the first module 100 all have the front side facing up for subsequent marking, detection, etc.

[0054] Specifically, the bottom surface width of the spiral track 120 shrinks in the blowing section, that is, the support of the bottom surface of this section of the spiral track for the quartz crystal resonator 700 becomes weaker, so that the stability of the quartz crystal resonator 700 in the blowing section decreases. The front surface of the quartz crystal resonator 700 is usually relatively flat and even polished to ensure the smoothness of the front surface; the back surface of the quartz crystal resonator 700 needs to include other functional structures such as mounting brackets or additional electrodes, etc., so the roughness is higher. Therefore, when blown by the same air flow, the force on the back surface of the quartz crystal resonator 700 will be greater than the force on its front surface. The first air nozzle 112 continuously blows air against the quartz crystal resonator 700 in the blowing section. At this time, only by designing the air flow size of the first air nozzle 112 can the quartz crystal resonator 700 with the front side facing up smoothly pass through the blowing section of the spiral track, and the quartz crystal resonator 700 with the front side facing down falls into the body 110 from the blowing section under the blowing of the first air nozzle 112.

[0055] Among them, as Figure 4 shown, the vibrating bowl can be a piezoelectric vibrating bowl, etc., the spiral track 120 feeds the material upward step by step, and the bottom surface of the spiral track 120 is arranged at an inclination angle of 40-45 degrees to drive the quartz crystal resonator 700 to move; the bottom surface width of the spiral track 120 is designed according to the thickness of the quartz crystal resonator 700, for example, set to 0.6 mm - 0.7 mm. The vibrating bowl is provided with a piezoelectric frequency vibration by a vibrating bowl disk vibration body 115 to drive the material in the body 110 to move.

[0056] In other embodiments, the front and back of the quartz crystal resonator 700 can also be quickly detected by the front and back detection optical fiber 111, and then a command is sent to the first air nozzle 112 to blow the quartz crystal resonator 700 with its back facing up back into the main body 110. Multiple front and back detection optical fibers 111 and first air nozzles 112 can be provided to detect the front and back of the quartz crystal resonator 700 multiple times and blow the quartz crystal resonator 700 with its back facing up back into the main body 110 multiple times to ensure that the quartz crystal resonators 700 output from the output end of the first module 100 all have their fronts facing up. The multiple first air nozzles 112 can adjust the on / off and size of the air flow through the air blowing regulating valve 113. The front and back detection optical fiber 111 can also cooperate with the amplifying optical fiber 114 to more accurately and quickly detect the front and back of the quartz crystal resonator 700.

[0057] In one embodiment, the vibrating disk further includes a flat rail 130. The spiral rail 120 first transports the quartz crystal resonator 700 to one end of the flat rail 130, and the picking component picks up the quartz crystal resonator 700 from the other end of the flat rail 130. This end of the flat rail 130 is the output end of the first module 100. The flat rail 130 is set to be straight to ensure that the quartz crystal resonators 700 can be transported stably and orderly. The part of the flat rail 130 connected to the spiral rail 120 gradually becomes gentle along the rear section of the spiral rail 120 until it is horizontal. The flat rail 130 is driven by the piezoelectric frequency vibration provided by the flat rail vibrating body 136 to move the materials in the flat rail 130.

[0058] An in-place detection optical fiber 131 can be provided at the end of the flat rail 130 far from the spiral rail 120. When the in-place detection optical fiber 131 detects that there is a quartz crystal resonator 700 on the flat rail 130, the picking module starts to suck the quartz crystal resonator 700 from the flat rail 130; when the in-place detection optical fiber 131 fails to detect the material, the second module 200 and the third module 300 stop working and are in a waiting state.

[0059] A separation and acceleration air blowing device 132 can also be provided on the flat rail 130. When the material reaches the designated position on the flat rail 130, the separation and acceleration air blowing device 132 is started to make the material reach the position quickly, so that the in-place detection optical fiber 131 can detect the material, ensuring that the subsequent workstations can operate continuously and without interruption, thereby improving production efficiency.

[0060] A full material detection optical fiber 133 can also be provided on the flat rail 130. When the full material detection optical fiber 133 detects that the flat rail 130 is covered with quartz crystal resonators 700, the spiral rail 120 stops transporting materials to the flat rail 130, and the flat rail 130 continues to transport materials to the second module 200.

[0061] A material shortage detection optical fiber 134 can also be provided on the flat rail 130. When the material shortage detection optical fiber 134 detects that the material in the flat rail 130 is scarce, the spiral material rail 120 and the flat rail 130 accelerate until the full material optical fiber detects the material.

[0062] An acceleration mechanism 135 can also be provided on the flat rail 130. When the material movement in the flat rail 130 is not smooth or slow, the acceleration mechanism 135 can be activated to blow air into the flat rail 130, and the material is pushed by the jet airflow to move faster on the flat rail 130, thereby solving the problems of material accumulation or slow movement.

[0063] In one embodiment, the vibrating bowl further includes a material cleaning structure 137. The material cleaning structure 137 is provided on the main body 110. When it is necessary to replace quartz crystal resonators 700 with different parameter specifications or different customer batches, the material cleaning structure 137 can be quickly opened to clean the remaining quartz crystal resonators 700 in the main body 110 without stopping the vibrating bowl. The material cleaning structure can include a collection trough provided with a lid. When the lid of the collection trough is opened, the quartz crystal resonators 700 in the main body 110 can fall into the collection trough. In other embodiments, the material cleaning structure can also be set as other components.

[0064] In one embodiment, the blowing section is replaceably provided on the spiral material rail 120. The blowing section is a detachable part of the spiral material rail 120, and it is detachably connected to the spiral material rail 120 by means of snap connection, magnetic attraction, etc. When it is necessary to replace quartz crystal resonators with different specifications or types, the blowing section is removed from the main body 110, and then a new blowing section is installed. In this way, according to the characteristics of different quartz crystal resonators, the parameters of the blowing section, such as the bottom width, blowing angle, etc., can be adjusted, thereby improving the screening accuracy and efficiency.

[0065] In one embodiment, the second module 200 includes a first turntable 211, such as Figure 5As shown, the first turntable 211 can rotate along its axis. The picking component includes a plurality of suction nozzles 230, and the plurality of suction nozzles 230 are evenly distributed along the circumferential direction of the first turntable 211. Thus, when the first turntable 211 rotates, it can drive the plurality of suction nozzles 230 thereon to rotate synchronously around its axis. The picking component sucks or releases the quartz crystal resonator 700 through the suction nozzles 230. The output end of the first module 100 and the input end of the third module 300 are respectively arranged opposite to one suction nozzle 230 of the first turntable 211. Thus, the picking component sucks a quartz crystal resonator 700 at the output end of the first module 100 through one of its suction nozzles 230, and then drives the quartz crystal resonator 700 to reach other workstations of the second module 200 under the rotation of the first turntable 211 for testing, marking, and detection. Finally, the qualified quartz crystal resonator 700 is sucked by one suction nozzle 230 of the picking component and placed into the input end of the third module 300 for packaging.

[0066] In one embodiment, the second module 200 further includes a first positioning mechanism 240, a first testing mechanism 260, a second testing mechanism, a third positioning mechanism, and a second detection mechanism 290. The first turntable 211 is sequentially provided with a loading station 410, a first positioning station 420, a first testing station 430, a second testing station 440, a third positioning station 450, a second detection station 460, and a feeding station 490 along its rotation direction.

[0067] As Figure 3As shown, driven by the rotation of the first turntable 211, the suction nozzle 230 rotates to the loading station 410, and the suction nozzle 230 located at the loading station 410 sucks the quartz crystal resonator 700 at the output end of the first module 100; then the first turntable 211 drives the suction nozzle 230 to rotate to the first positioning station 420, and the first positioning mechanism 240 positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the first positioning station 420; then the first turntable 211 drives the suction nozzle 230 to rotate to the first testing station 430, and the first testing mechanism 260 performs electrical parameter testing on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the first testing station 430; then the first turntable 211 drives the suction nozzle 230 to rotate to the second testing station 440, and the second testing mechanism performs insulation performance testing on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the second testing station 440; then the first turntable 211 drives the suction nozzle 230 to rotate to the third positioning station 450, and the third positioning mechanism positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the third positioning station 450; then the first turntable 211 drives the suction nozzle 230 to rotate to the second inspection station 460, and the second inspection mechanism 290 performs bottom vision inspection on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the second inspection station 460; then the first turntable 211 drives the suction nozzle 230 to rotate to the feeding station 490, and the suction nozzle 230 at the feeding station 490 releases the quartz crystal resonator 700 to the input end of the third module 300.

[0068] In one embodiment, the second module 200 further includes a second turntable 212, as Figure 8 shown, the second turntable 212 can rotate along its axis, and a plurality of temporary placement platforms 213 for temporarily placing the quartz crystal resonators 700 are evenly distributed along the circumference of the second turntable 212. The second turntable 212 can drive the temporary placement platforms 213 thereon to rotate synchronously around its axis, and the temporary placement platforms 213 can reach different stations to perform different processes. An air suction port is provided in the middle of the temporary placement platform.

[0069] In one embodiment, both the first turntable 211 and the second turntable 212 can be indexing plates or other rotatable discs.

[0070] In one embodiment, the suction nozzle 230 and the air suction port can be respectively connected to a negative pressure vacuum pipe for sucking and releasing materials, and a filter 231 can be provided in the middle to filter the air entering the negative pressure vacuum pipe to remove dust and impurities. An automated sucking and releasing operation can also be achieved through a vacuum breaking structure 232 to improve production efficiency and reduce errors in manual operation. Specifically, the vacuum breaking structure 232 can be controlled to start and stop by a solenoid valve 233.

[0071] In one embodiment, the second module 200 further includes a second positioning mechanism 250, a marking mechanism 270, and a first detection mechanism 280. The second turntable 212 is sequentially provided with a second positioning station 620, a marking station 630, and a first detection station 650 along its rotation direction. Driven by the rotation of the second turntable 212, the temporary table 213 drives the quartz crystal resonator 700 thereon to the second positioning station 620, and the second positioning mechanism 250 positions the quartz crystal resonator 700 temporarily placed on the temporary table 213 at the second positioning station 620; then the second turntable 212 drives the temporary table 213 to rotate to the marking station 630, and the marking mechanism 270 marks the quartz crystal resonator 700 temporarily placed on the temporary table 213 at the marking station 630; then the second turntable 212 drives the temporary table 213 to rotate to the first detection station 650, and the first detection mechanism 280 performs a front visual inspection on the quartz crystal resonator 700 temporarily placed on the temporary table 213 at the first detection station 650.

[0072] In one embodiment, the second module 200 includes an exchange station 510, which is located opposite the first turntable 211 and the second turntable 212. The exchange station 510 is located between the test station 1 430 and the test station 2 440 of the first turntable 211, and the exchange station 510 is located between the positioning station 2 620 and the detection station 1 650 of the second turntable 212.

[0073] When working, Figure 3 As shown, the first turntable 211 drives the suction nozzle 230 on the test station 1 430 to rotate to the exchange station 510; at the exchange station 510, the suction nozzle 230 releases a quartz crystal resonator 700 to the temporary table 213, then the first turntable 211 remains stationary, the second turntable 212 rotates an angle until the next temporary table 213 reaches the exchange station 510, and the suction nozzle 230 picks up a quartz crystal resonator 700 from the next temporary table 213 located at the exchange station 510; then the first turntable 211 drives the suction nozzle 230 on the exchange station 510 to rotate to the test station 2 440 to perform an insulation performance test on the quartz crystal resonator 700.

[0074] Among them, at the exchange station 510, the quartz crystal resonator 700 released by the suction nozzle 230 to the temporary placement table 213 moves synchronously with the temporary placement table 213, and the second turntable 212 rotates, driving the temporary placement table 213 to move to the second positioning station 620, the marking station 630 and the first inspection station 650 respectively, for positioning, marking and front visual inspection respectively. The quartz crystal resonator 700 that passes the inspection is driven by the second turntable 212 to move to the exchange station 510, and is sucked by the suction nozzle 230 on the first turntable 211 to complete the remaining processes on the first turntable 211.

[0075] In one embodiment, the second module 200 further includes a first waste material mechanism and a second waste material mechanism. A first waste material station 660 is further provided between the first detection station 650 and the exchange station 510 of the second turntable 212, and a second waste material station 470 is further provided between the second detection station 460 and the feeding station 490 of the first turntable 211. After the electrical parameter test and the front vision inspection, the unqualified quartz crystal resonators 700 are taken away and discarded by the first waste material mechanism at the first waste material station 660, and the qualified quartz crystal resonators 700 are taken to the exchange station 510 by the temporary placement table 213 and taken away by the suction nozzle 230 on the first turntable 211 for subsequent processes. After the insulation performance test or / and the bottom vision inspection, the unqualified quartz crystal resonators 700 are taken away and discarded by the second waste material mechanism at the second waste material station 470, and the qualified quartz crystal resonators 700 are driven by the suction nozzle 230 to the feeding station 490, and the quartz crystal resonators 700 are sent to the third module 300 at the feeding station 490.

[0076] Among them, the first waste material mechanism and the second waste material mechanism can be set to have the same structure, and both include a second air nozzle and a collection mechanism 220. The second turntable 212 rotates the temporary placement table 213 and the quartz crystal resonator 700 on the first detection station 650 to the first waste material station 660. The quartz crystal resonators 700 that are qualified in both the electrical parameter test and the front vision inspection smoothly pass through the first waste material station 660 and are then rotated by the second turntable 212 to the exchange station 510; the quartz crystal resonators 700 that are unqualified in the electrical parameter test and the front vision inspection are blown into the collection mechanism 220 by the second air nozzle at the first waste material station 660. The first turntable 211 rotates the suction nozzle 230 and the quartz crystal resonator 700 on the second detection station 460 to the second waste material station 470. The quartz crystal resonators 700 that are qualified in both the insulation performance test and the bottom vision inspection smoothly pass through the second waste material station 470 and are then rotated by the first turntable 211 to the feeding station 490; the quartz crystal resonators 700 that are unqualified in the insulation performance test and the bottom vision inspection are blown into the collection mechanism 220 by the second air nozzle at the second waste material station 470. Among them, the blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle 230, so that the second air nozzle can easily blow away the unqualified products sucked by the suction nozzle 230.

[0077] As Figure 13 shown, the collection mechanism 220 may include a collection mechanism mounting base 221, a defective material cup 222, and a material passing pipe 223. The defective material cup 222 and the material passing pipe 223 are fixed on the collection mechanism mounting base 221, and the unqualified quartz crystal resonators 700 fall into the defective material cup 222 through the material pipe 223.

[0078] In other embodiments, the collection mechanism 220 further includes a cylinder. There are two defective product cups 222. The two defective product cups 222 of the first waste material mechanism respectively load the quartz crystal resonators 700 that fail in electrical parameter testing and the quartz crystal resonators 700 that fail in front vision detection; the two defective product cups 222 of the second waste material mechanism respectively load the quartz crystal resonators 700 that fail in insulation performance testing and the quartz crystal resonators 700 that fail in bottom vision detection, so as to perform detection analysis, recycling, etc. on different defective products subsequently. The material passing pipe 223 includes two pipes and a pipe head. The quartz crystal resonator 700 enters different defective product cups 222 from the pipe head and the pipes. The pipe connected to the pipe head is switched according to the cylinder detection result, so as to realize the classified collection of different defective products.

[0079] In one embodiment, the second module 200 further includes a plurality of optical fiber detection mechanisms, and the plurality of optical fiber detection mechanisms are used to detect whether there is a quartz crystal resonator 700 on the nozzle 230 or the temporary placement table 213. For example, a material identification station 610 is arranged between the exchange station 510 and the positioning station 620 of the second turntable 212. The optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the temporary placement table 213 at the material identification station 610. If so, when the temporary placement table 213 rotates to the subsequent station, positioning, marking, etc. of the subsequent station are performed. If not, the temporary placement table 213 rotates idly. A material identification station 640 is arranged between the marking station 630 and the detection station 650 of the second turntable 212. The optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the temporary placement table 213 at the material identification station 640. If so, when the temporary placement table 213 rotates to the subsequent station, material detection of the subsequent station is performed, etc. If not, the temporary placement table 213 rotates idly. A material identification station 670 is arranged between the waste material station 660 and the exchange station 510 of the second turntable 212. The optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the temporary placement table 213 at the material identification station 670. If so, when the temporary placement table 213 rotates to the subsequent station, material exchange, testing, etc. of the subsequent station are performed. If not, the temporary placement table 213 rotates idly. A material identification station 480 is arranged between the waste material station 470 and the feeding station 490 of the first turntable 211. The optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the nozzle 230 at the material identification station 480. If so, when the nozzle 230 rotates to the subsequent station, feeding of the subsequent station is performed, etc. If not, the nozzle 230 rotates idly.

[0080] The plurality of optical fiber detection mechanisms can detect the presence or absence of materials and control the operations of subsequent stations, avoiding unnecessary operations and improving production efficiency.

[0081] In one embodiment, such as Figure 14As shown in the figure, the third module 300 includes a guide rail loading mechanism 330, a pinwheel mechanism 320, a cylinder tape punching mechanism 340, and a material receiving mechanism 360. The guide rail loading mechanism 330 receives the quartz crystal resonator 700 output by the second module and outputs it. It is usually equipped with a high-precision docking interface, which can accurately dock with the output end of the second module to ensure the smooth transition of the quartz crystal resonator 700. A dedicated guiding track can also be provided inside it. The track matches the outer dimensions of the quartz crystal resonator 700 and can guide the resonator to accurately reach the preset loading position. At the same time, a fine-tuning device, such as a micro mechanical gripper or a pneumatic adjustment component, may be provided on the track to perform the final precise calibration of the position of the quartz crystal resonator 700 to ensure that it can be accurately placed on the carrier tape. When the quartz crystal resonator 700 reaches the loading position, the guide rail loading mechanism 330 will output it to the carrier tape waiting area, ready to be combined with the carrier tape.

[0082] Driven by the motor 310, the pinwheel mechanism 320 drives the carrier tape to move past the guide rail loading mechanism 330, and the carrier tape receives the quartz crystal resonator 700 output by the guide rail loading mechanism 330. The pinwheel mechanism 320 is powered by the motor 310. The output shaft of the motor 310 is tightly connected to the central shaft of the pinwheel through a coupling or a gear transmission device. When the motor 310 starts, it will drive the pinwheel to rotate at high speed. Needle-shaped protrusions are evenly distributed on the outer circumference of the pinwheel. These protrusions precisely engage with the tooth holes on the edge of the carrier tape (if the carrier tape is of the toothed hole type), thereby driving the carrier tape to move smoothly along the track of the guide rail loading mechanism 330. During the movement of the carrier tape, it will successively pass through the output position of the quartz crystal resonator 700. When the carrying groove of the carrier tape is aligned with the quartz crystal resonator 700, the quartz crystal resonator 700 will accurately fall into the groove of the carrier tape under the action of gravity or an auxiliary pushing device, realizing the preliminary loading of the quartz crystal resonator 700 on the carrier tape.

[0083] The cylinder tape - applying mechanism 340 presses the film onto the carrier tape under the drive of the cylinder, so that the quartz crystal resonator 700 is heat - sealed between the film and the carrier tape. The cylinder tape - applying mechanism 340 mainly consists of a cylinder, a heat - sealing die, and a film. The cylinder serves as the power source and is connected to the heat - sealing die through a piston rod. When the carrier tape carrying the quartz crystal resonator 700 moves under the cylinder tape - applying mechanism 340, the control system triggers the cylinder to act. The piston rod of the cylinder quickly extends, pushing the heat - sealing die downward until the heat - sealing die is in close contact with the film and the carrier tape. The heat - sealing die integrates efficient heating elements, such as resistance wires or ceramic heating sheets, etc. Under the precise control of the temperature control system, these heating elements can quickly raise the temperature of the heat - sealing die to the appropriate heat - sealing temperature range. Generally, for common plastic film and carrier tape materials, the temperature range is between 150 - 250 °C. Under the combined action of high temperature and pressure, the film and the carrier tape are tightly fused, firmly encapsulating the quartz crystal resonator 700 between them and completing the heat - sealing operation.

[0084] The take - up mechanism 360 winds up the heat - sealed carrier tape. The take - up mechanism 360 can be composed of a take - up reel, a driving motor 310, and a tension - adjusting device. The driving motor 310 is connected to the take - up reel through belt drive or gear drive, continuously providing rotational power for the take - up reel. When the heat - sealed carrier tape is output from the cylinder tape - applying mechanism 340, it is guided onto the take - up reel. The take - up reel starts to wind up the carrier tape at a stable speed under the drive of the driving motor 310. The tension - adjusting device usually combines a sensor with a feedback control system. For example, it uses a pressure sensor to detect the pulling force of the carrier tape on the take - up reel and then feeds the signal back to the control system.

[0085] Furthermore, the third module 300 also includes a tape - cutting mechanism 350. When the take - up mechanism 360 detects the full - material state, the tape - cutting mechanism 350 precisely cuts the carrier tape, completing a complete loading and heat - sealing cycle. The tape - cutting mechanism 350 can be composed of a cutter and a driving device. The driving device (such as a cylinder or an electric push rod) drives the cutter to quickly descend to precisely cut the carrier tape, separating the carrier tape filled with quartz crystal resonators 700 from the subsequent unused carrier tape. Among them, the carrier tape is a thin - strip material used for the packaging and transportation of electronic components, usually made of plastic or paper materials.

[0086] In one embodiment, as Figure 6As shown in the figure, the first positioning mechanism 240 includes positioning claw pieces 241, a positioning cam mechanism 242, and a first positioning motor 243. When the suction nozzle 230 on the first turntable 211 picks up a material and moves to the first positioning mechanism 240, the first positioning motor 243 controls the movement of the positioning cam mechanism 242 to open or close the positioning claw pieces 241, so as to correct the position of the picked quartz crystal resonator 700. Among them, there are four positioning claw pieces 241 arranged orthogonally, and the four positioning claw pieces 241 calibrate the position of the quartz crystal resonator 700 located in the middle of them. Through the coordinated actions of the motor, cam, and claw pieces, the position of the quartz crystal resonator 700 can be accurately adjusted, ensuring the efficient progress of subsequent processes and the quality of products. The structure of the third positioning mechanism is the same as that of the first positioning mechanism 240. In other embodiments, the first positioning mechanism 240 and the third positioning mechanism can also be designed as other positioning structures.

[0087] In one embodiment, as Figure 9 shown, the second positioning mechanism 250 includes a second positioning motor 251, a positioning slide 252, a positioning piece 253, and a positioning mounting seat 254. The second positioning motor 251 provides power to drive the movement of the entire positioning mechanism; the positioning slide 252 serves as a moving platform to carry the positioning piece 253 and perform linear forward and backward movements; the positioning piece 253 directly contacts and corrects the position of the quartz crystal resonator 700; the positioning mounting seat 254 provides a fixing and supporting function to ensure the stability and accuracy of the entire positioning mechanism. The second positioning motor 251 drives the positioning slide 252 and the positioning piece 253 to perform linear forward and backward movements as power, thereby correcting the position of the quartz crystal resonator 700 on the temporary placement table 213 to ensure its accurate position in subsequent processes.

[0088] In one embodiment, as Figure 7 shown, the first testing mechanism 260 includes testing probes 261, a testing probe board 262, connecting wires of the testing probe board 262, and a mounting seat 264 for the probe testing mechanism. The testing probes 261 are used to contact the electrodes of the quartz crystal resonator 700 to obtain electrical parameter signals. The testing probe board 262 fixes a plurality of testing probes 261 to ensure that they can stably and accurately contact the quartz crystal resonator 700. The connecting wires 263 of the testing probe board are used to connect the testing probe board 262 and the testing board to transmit testing signals, and the testing board displays and records the electrical parameter testing results through the software of the industrial control host 265. The mounting seat 264 for the probe testing mechanism is used to fix and support the testing probe board 262 and its components to ensure the stable operation of the testing probes 261. The function of the first testing mechanism 260 is to perform electrical parameter testing on the quartz crystal resonator 700 to ensure that each packaged quartz crystal resonator 700 meets the electrical performance requirements.

[0089] In one embodiment, the second testing mechanism can be a common insulation tester 214, which is used to test the insulation performance of the quartz crystal resonator 700 to ensure that the insulation performance of each quartz crystal resonator 700 meets the standards, providing reliable quality assurance for subsequent use.

[0090] In one embodiment, as Figure 10 shown, the marking mechanism 270 includes a marking adjustment mounting base 271, a laser head 272, a laser 273, and a laser connection control host wire 274. The marking adjustment mounting base 271 provides the mounting positions for the laser head 272 and the laser 273 and allows for fine adjustment of the positions. The laser head 272 emits a laser beam for marking. The laser 273 generates the laser used for marking. The laser connection control host wire 274 connects the laser 273 and the control host 275 to transmit control signals.

[0091] After the laser 273 and the laser head 272 are installed as a unit, they are uniformly installed on the marking adjustment mounting base 271, facilitating vertical and horizontal adjustment to the appropriate positions; the laser head 272 uses red light to correct the position, is equipped with a 100 mm adjustment lens, and uses a 20 W power for laser marking and engraving. The control host 275 has built-in marking control software. The operator inputs various marking parameters, such as detailed information like laser power, pulse frequency, marking speed, and marking pattern, on the human-machine interface of the control host 275. Based on these instructions, the control host 275 sends corresponding electrical signals to the laser 273 through the laser connection control host wire 274 to achieve real-time and precise control of the working state of the laser 273. For example, when it is necessary to change the laser power, the control host 275 sends a digital signal containing the power adjustment value to the laser 273. After receiving it, the internal power adjustment circuit of the laser 273 responds quickly and adjusts the output laser power to the set value to ensure that the marking process is flexible and accurate. In this way, the marking mechanism 270 can achieve precise and efficient marking operations during the production process, improving the traceability and marking quality of the product.

[0092] In one embodiment, as Figure 11As shown in the figure, the first detection mechanism 280 performs a front visual inspection on the quartz crystal resonator 700. It includes an installation and adjustment bracket 281, a red light annular light source 282, a 1.3 megapixel black and white camera 283, and a telecentric lens 284. The installation and adjustment bracket 281 provides the installation position for the components of the detection mechanism and allows for fine adjustment of the position. The red light annular light source 282 provides uniform illumination, eliminates shadows and reflections, and ensures that the camera 292 can clearly capture the image of the quartz crystal resonator 700. The 1.3 megapixel black and white camera 283 captures high-resolution images for subsequent visual inspection. The telecentric lens 284 provides distortion-free high-precision imaging. The first detection mechanism 280 performs font detection and detection of whether there is missing marking on the quartz crystal resonator 700 after laser marking and engraving.

[0093] In one embodiment, as Figure 12 shown, the second detection mechanism 290 performs a bottom visual inspection on the quartz crystal resonator 700. It consists of two parts, namely the camera 292 part and the light source irradiation part, and specifically includes a camera adjustment and installation base 291, a camera 292, a protective cover 293, a light source installation base 294, a reflection prism 295, and an annular light source 296. First, the camera installation and adjustment base 291, the camera 292, and the protective cover 293 are installed as a whole, and then the light source installation base 294, the reflection prism 295, and the annular light source 296 are installed as another whole. Moreover, the centers of the camera 292 and the reflection prism 295 must be on the same horizontal line. The reflection prism 295 reflects the image at a 45-degree angle through the annular light source 296 for the camera 292 to receive the detection, and the imaging effect is displayed on the display screen by the image host. The second detection mechanism 290 can perform real-time and accurate bottom visual inspection during the production process, ensuring that the bottom quality of each quartz crystal resonator 700 meets the standards and providing reliable quality assurance for subsequent processes.

[0094] In the description of this specification, if terms such as "Embodiment 1", "this embodiment", "in one embodiment", etc. appear, it means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the invention or the invention. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example; moreover, the specific features, structures, materials, or characteristics described can be combined in any one or more embodiments or examples in an appropriate manner.

[0095] In the description of this specification, terms such as "connection", "installation", "fixation", "setting", "having", etc. are understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0096] In the description of this specification, relative terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprising", "including" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including one..." does not exclude the existence of another identical element in the process, method, article or device including the said element.

[0097] The above description of the embodiments is for the convenience of those of ordinary skill in the art to understand and apply the technology of this case. Obviously, those who are familiar with the technology in this field can easily make various modifications to these examples and apply the general principles described here to other embodiments without creative labor. Therefore, this case is not limited to the above embodiments, and the following modifications should all be within the protection scope of this case: ① A new technical solution implemented based on the technical solution of the present invention and combined with the existing common knowledge, and the technical effect produced by this new technical solution does not exceed the technical effect of the present invention; ② An equivalent replacement of some features of the technical solution of the present invention using well-known technologies, and the technical effect produced is the same as the technical effect of the present invention; ③ Expansion based on the technical solution of the present invention, and the substantial content of the expanded technical solution does not exceed the technical solution of the present invention; ④ An equivalent transformation made using the content of the specification and drawings of the present invention, directly or indirectly applied in other related technical fields.

Claims

1. A quartz crystal resonator testing, marking, detecting, and packaging device, characterized in that, Comprising: A first module, whose output end outputs the quartz crystal resonator with the front side facing up; A second module, which includes a picking component. The picking component picks up the quartz crystal resonator output from the output end of the first module to the second module. The second module tests, marks, and inspects the quartz crystal resonator to obtain the qualified quartz crystal resonator, and the qualified quartz crystal resonator is output through the picking component; A third module, whose input end receives the quartz crystal resonator output from the picking component of the second module and packages the quartz crystal resonator.

2. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 1, wherein The first module includes a vibrating disk. The vibrating disk includes a body, a spiral feeding track arranged on the body, and a first air nozzle. The spiral feeding track is provided with a blowing section along its circumferential direction; the quartz crystal resonator with the front side facing up is conveyed to the output end of the first module through the spiral feeding track, and the quartz crystal resonator with the front side facing down is blown by the first air nozzle to the body at the blowing section.

3. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 2, wherein The bottom width of the spiral feeding track shrinks at the blowing section, and the first air nozzle blows air against the quartz crystal resonator at the blowing section.

4. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 1, characterized in that, The second module includes a first turntable that can rotate along its axis. The picking component includes a plurality of suction nozzles evenly distributed along the circumferential direction of the first turntable. The picking component sucks / releases the quartz crystal resonator through the suction nozzles. The output end of the first module and the input end of the third module are respectively arranged opposite to one suction nozzle of the first turntable.

5. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 4, characterized in that, The second module further includes a first positioning mechanism, a first testing mechanism, a second testing mechanism, a third positioning mechanism, and a second detection mechanism. The first turntable is sequentially provided with a feeding station, a first positioning station, a first testing station, a second testing station, a third positioning station, a second detection station, and a feeding station along its rotation direction; The suction nozzle at the feeding station sucks the quartz crystal resonator at the output end of the first module. The first positioning mechanism positions the quartz crystal resonator sucked by the suction nozzle at the first positioning station. The first testing mechanism performs electrical parameter testing on the quartz crystal resonator sucked by the suction nozzle at the first testing station. The second testing mechanism performs insulation performance testing on the quartz crystal resonator sucked by the suction nozzle at the second testing station. The third positioning mechanism positions the quartz crystal resonator sucked by the suction nozzle at the third positioning station. The second detection mechanism performs bottom vision detection on the quartz crystal resonator sucked by the suction nozzle at the second detection station. The suction nozzle at the feeding station releases the quartz crystal resonator to the input end of the third module.

6. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 5, characterized in that, The second module further includes a second turntable that can rotate along its axis. A plurality of temporary placement platforms for temporarily placing quartz crystal resonators are evenly distributed along the circumferential direction of the second turntable, and an air suction port is arranged in the middle of the temporary placement platform.

7. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 6, characterized in that, The second module further includes a second positioning mechanism, a marking mechanism, and a first detection mechanism. The second turntable is sequentially provided with a second positioning station, a marking station, and a first detection station along its rotation direction; The second positioning mechanism positions the quartz crystal resonators temporarily placed on the temporary placement table at the second positioning station. The marking mechanism marks the quartz crystal resonators temporarily placed on the temporary placement table at the marking station. The first detection mechanism performs a front visual inspection on the quartz crystal resonators temporarily placed on the temporary placement table at the first detection station.

8. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 7, wherein, The second module includes an exchange station, which is located at the position where the first turntable and the second turntable face each other. The exchange station is located between the first test station and the second test station of the first turntable, and the exchange station is located between the second positioning station and the first detection station of the second turntable. At the exchange station, the suction nozzle releases one of the quartz crystal resonators onto the temporary placement table and picks up one of the quartz crystal resonators from the next temporary placement table.

9. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 8, characterized in that, The second module further includes a first waste material removing mechanism and a second waste material removing mechanism. A first waste material removing station is also provided between the first detection station and the exchange station of the second turntable. A second waste material removing station is also provided between the second detection station and the feeding station of the first turntable. The quartz crystal resonators that fail in electrical parameter testing or / and front visual inspection are taken away and discarded by the first waste material removing mechanism at the first waste material removing station. The quartz crystal resonators that fail in insulation performance testing or / and bottom visual inspection are taken away and discarded by the second waste material removing mechanism at the second waste material removing station.

10. The quartz crystal resonator testing, marking, detecting, and packaging equipment according to claim 1, characterized in that, The third module includes: A guide rail loading mechanism, which receives and outputs the quartz crystal resonators output by the second module. A pinwheel mechanism, which drives the carrier tape to move past the guide rail loading mechanism under the drive of a motor, and the carrier tape receives the quartz crystal resonators output by the guide rail loading mechanism. A cylinder tape pressing mechanism, which presses a film onto the carrier tape under the drive of a cylinder, so that the quartz crystal resonator is heat-sealed between the film and the carrier tape. A material collecting mechanism, which winds up the heat-sealed carrier tape.

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