Wet film surface density measuring method and system and coating equipment

Abstract

The invention provides a wet film surface density measuring method, a wet film surface density measuring system and coating equipment, and relates to the technical field of coating control, the method creatively establishes a relation between a specifically treated wet film and a dry film, and ingeniously realizes the calibration of the wet film surface density by using the weighable characteristic of the dry film. The requirement for accurate measurement of the surface density of the wet film in the production process can be met, and the problems of low production efficiency, large measurement error and the like caused by poor measurement effect of the surface density of the wet film in the prior art are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of coating control, and in particular to a method and system for measuring the surface density of a wet film and a coating device. Background Art

[0002] Currently, during the process of measuring the surface density using a coating device, the measurement technology for the dry film surface density is relatively mature, while there are many technical problems in measuring the wet film surface density. Different from the dry film, the characteristics of the wet film itself make it inconvenient to perform the operation of cutting the film, which makes it impossible to obtain the accurate weight by directly weighing like the dry film, and thus it is difficult to establish an accurate method for calculating the surface density. The traditional method for measuring the dry film surface density fails when facing the wet film, making it impossible for the coating device to timely and accurately know the wet film surface density during the production process, seriously affecting the production quality. Summary of the Invention

[0003] In view of this, the purpose of the present invention is to provide a method and system for measuring the wet film surface density and a coating device. This method innovatively establishes a connection between the specifically processed wet film and the dry film, and cleverly uses the weighable characteristics of the dry film to calibrate the wet film surface density, thereby solving the above problems existing in the prior art.

[0004] In a first aspect, an embodiment of the present invention provides a method for measuring the wet film surface density. This method is applied to the wet film calibration process of a coating device, and the method includes: Determine multiple sets of pump speeds according to the type parameters of the coating device, and control the coating device to coat multiple sets of wet films based on the pump speeds; Control the ultrasonic measurement device corresponding to the coating device to measure the attenuation rate of each set of wet films, and obtain the position marks between each set of wet films; Control the oven corresponding to the coating device to dry each set of wet films, and cut the obtained dry films according to the position marks to obtain the dry film weights corresponding to each set of wet films; Construct a fitting curve corresponding to the attenuation rate and the dry film weight under each set of wet films based on the type parameters; Control the ultrasonic measurement device to obtain the real-time attenuation rate of the real-time wet film in the coating device, use the fitting curve to obtain the dry film fitting weight corresponding to the real-time attenuation rate, and determine the surface density corresponding to the real-time wet film based on the dry film fitting weight.

[0005] Optionally, the step of determining multiple sets of pump speeds according to the type parameters of the coating device and controlling the coating device to coat multiple sets of wet films based on the pump speeds includes: Obtain the type parameters corresponding to the coating device, and determine the surface density sample list of the coating device based on the type parameters; Obtain multiple coating calibration thicknesses corresponding to the coating device according to the surface density sample list, and determine multiple sets of pump speeds based on the coating calibration thicknesses; Control the coating equipment to coat multiple groups of wet films corresponding to the calibrated coating thickness according to the pump speed.

[0006] Optionally, the steps of controlling the ultrasonic measuring equipment corresponding to the coating equipment to measure the attenuation rate of each group of wet films and obtaining the position marks between each group of wet films include: Obtain the ultrasonic measuring equipment corresponding to the coating equipment; Determine the first group of wet films among the multiple groups of wet films. When it is detected that the first group of wet films is completely coated, control the coating equipment to stop suddenly, and obtain the first position mark corresponding to the first group of wet films based on the sudden stop position; Control the ultrasonic measuring equipment to scan and measure the average attenuation rate of the first group of wet films, and use the average attenuation rate to determine the first attenuation rate corresponding to the first group of wet films; Control the coating equipment to run, determine the second group of wet films adjacent to the first group of wet films among the multiple groups of wet films. When it is detected that the second group of wet films is completely coated, control the coating equipment to stop suddenly, and obtain the second position mark corresponding to the second group of wet films based on the sudden stop position; control the ultrasonic measuring equipment to scan and measure the average attenuation rate of the second group of wet films, and use the average attenuation rate to determine the second attenuation rate corresponding to the second group of wet films; Determine the attenuation rate corresponding to each group of wet films based on the first attenuation rate and the second attenuation rate.

[0007] Optionally, the steps of controlling the oven corresponding to the coating equipment to dry each group of wet films and obtaining the dry film weight corresponding to each group of wet films after cutting the obtained dry films according to the position marks include: Obtain the oven corresponding to the coating equipment; Determine the drying parameters of the oven based on the type parameters of the coating equipment, and use the drying parameters to control the oven to dry each group of wet films to obtain the dry films corresponding to each group of wet films; Determine the position marks included in the dry films, and cut the dry films according to the position marks and then weigh them in sequence to obtain the dry film weight corresponding to each group of wet films.

[0008] Optionally, the steps of constructing a fitting curve corresponding to the attenuation rate and the dry film weight under each group of wet films based on the type parameters include: Determine the data pairs corresponding to the attenuation rate and the dry film weight under each group of wet films according to the type parameters; Use the least squares method to fit the data pairs corresponding to each group of wet films to obtain a fitting curve; wherein, the abscissa of the fitting curve is the attenuation rate, and the ordinate of the fitting curve is the dry film weight.

[0009] Optionally, the steps of using the least squares method to fit the data pairs corresponding to each group of wet films to obtain a fitting curve include: Obtain the target straight line corresponding to the fitted curve; wherein, the target straight line is y = kx + b; y corresponds to the dry film weight, x corresponds to the attenuation rate, k corresponds to the slope coefficient, and b corresponds to the y-intercept coefficient; Input the corresponding attenuation rate and dry film weight in the data pair into the target straight line, and use the least squares method to update the slope coefficient and y-intercept coefficient corresponding to the target straight line; When the sum of the squares of the errors between the target straight line and the data points corresponding to the data pair is the smallest, determine the fitted curve using the current slope coefficient and y-intercept coefficient.

[0010] Optionally, after determining the fitted curve using the current slope coefficient and y-intercept coefficient, the method further includes: Obtain multiple groups of preset standard wet films in the wet films, and determine the standard attenuation rate and standard dry film weight corresponding to the standard wet films; Use the fitted curve to obtain the calculated dry film weight corresponding to the standard attenuation rate, and calculate the weight difference between the calculated dry film weight and the standard dry film weight; If the weight difference is not less than the preset weight threshold, update the fitted curve based on the weight difference, and use the updated fitted curve to update the weight difference between the calculated dry film weight and the standard dry film weight, until the weight difference is less than the preset weight threshold, and then obtain the current fitted curve.

[0011] Optionally, the steps of controlling the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film in the coating device, using the fitted curve to obtain the fitted dry film weight corresponding to the real-time attenuation rate, and determining the surface density corresponding to the real-time wet film based on the fitted dry film weight include: When it is detected that the coating device is in the wet film calibration stage, obtain the calibration pump speed corresponding to the coating device, and control the coating device to perform coating based on the calibration pump speed to obtain the real-time wet film; Control the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film, and calculate the fitted dry film weight corresponding to the real-time attenuation rate using the target straight line in the fitted curve; Determine the surface density corresponding to the real-time wet film under the current type parameter according to the fitted dry film weight.

[0012] In a second aspect, the present invention provides a wet film surface density measurement system, which is applied to the wet film calibration process of a coating device. The system includes: A wet film grouping unit, configured to determine multiple groups of pump speeds according to the type parameter of the coating device, and control the coating device to coat multiple groups of wet films based on the pump speeds; An attenuation rate measurement and marking unit, controlling the ultrasonic measurement device corresponding to the coating device to measure the attenuation rate of each group of wet films, and obtaining the position marking between each group of wet films; A dry weighing unit for controlling an oven corresponding to a coating device to perform a drying process on each group of wet films, and obtaining the dry film weight corresponding to each group of wet films after cutting the obtained dry films according to position marks; A fitting curve construction unit for constructing a fitting curve corresponding to the attenuation rate and the dry film weight under each group of wet films based on type parameters; A surface density acquisition unit for controlling an ultrasonic measurement device to acquire the real-time attenuation rate of the real-time wet film in the coating device, obtaining the dry film fitting weight corresponding to the real-time attenuation rate by using the fitting curve, and determining the surface density corresponding to the real-time wet film based on the dry film fitting weight.

[0013] In a third aspect, an embodiment of the present invention further provides a coating device, including a processor and a memory. The memory stores computer-executable instructions that can be executed by the processor, and the processor executes the computer-executable instructions to implement the steps of the wet film surface density measurement method provided in the first aspect.

[0014] A wet film surface density measurement method, system and coating device provided by an embodiment of the present invention, in the wet film calibration process of the coating device, first determine multiple groups of pump speeds according to the type parameters of the coating device, and control the coating device to coat multiple groups of wet films based on the pump speeds; then control an ultrasonic measurement device corresponding to the coating device to measure the attenuation rate of each group of wet films, and obtain the position marks between each group of wet films; subsequently control an oven corresponding to the coating device to perform a drying process on each group of wet films, and obtain the dry film weight corresponding to each group of wet films after cutting the obtained dry films according to the position marks; then construct a fitting curve corresponding to the attenuation rate and the dry film weight under each group of wet films based on the type parameters; finally control the ultrasonic measurement device to obtain the real-time attenuation rate of the real-time wet film in the coating device, obtain the dry film fitting weight corresponding to the real-time attenuation rate by using the fitting curve, and determine the surface density corresponding to the real-time wet film based on the dry film fitting weight. This method innovatively establishes a connection between the wet film after specific processing and the dry film, and cleverly uses the weighable characteristic of the dry film to calibrate the surface density of the wet film, which can meet the requirements of accurate measurement of the surface density of the wet film in the production process, solves the problems of low production efficiency and large measurement errors caused by poor measurement effect of the surface density of the wet film in the prior art, provides new ideas and methods for the application of the surface density measurement technology in the field of wet films, and promotes the progress of the industry.

[0015] Other features and advantages of the present invention will be described in the following specification, and, in part, will be obvious from the specification, or will be understood by implementing the present invention. The objectives and other advantages of the present invention are achieved and obtained by the structures specifically pointed out in the specification, the claims and the drawings.

[0016] To make the above objectives, features and advantages of the present invention more obvious and understandable, the following specific preferred embodiments are given, and in conjunction with the accompanying drawings, the detailed description is as follows. Brief Description of the Drawings

[0017] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0018] Figure 1 It is a flowchart of a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 2 It is a flowchart of step S101 in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 3 It is a flowchart of step S102 in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 4 It is a flowchart of step S103 in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 5 It is a flowchart of step S104 in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 6 It is a flowchart of step S502 in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 7 It is a flowchart after determining the fitting curve by using the current slope coefficient and intercept coefficient in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 8 It is a flowchart of step S105 in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 9 It is a flowchart of another method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 10 It is a schematic diagram of the fitting curve used in a method for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 11 It is a schematic structural diagram of a system for measuring the surface density of a wet film provided by an embodiment of the present invention; Figure 12 It is a schematic structural diagram of a coating device provided by an embodiment of the present invention.

[0019] Icon: 1110 - Wet film grouping unit; 1120 - Attenuation rate measurement and marking unit; 1130 - Drying and weighing unit; 1140 - Fitting curve construction unit; 1150 - Surface density acquisition unit; 101 - Processor; 102 - Memory; 103 - Bus; 104 - Communication Interface. Detailed implementation manners

[0020] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0021] In the field of areal density measurement, the accurate acquisition of the areal density of film materials is crucial, and it is widely used in many industries such as electronics and materials science. Currently, the measurement technology of the areal density of dry films is relatively mature. For example, calibration is performed through means such as an ultrasonic areal density meter or X-rays to obtain the areal density. Taking the ultrasonic areal density meter as an example, its principle is based on the attenuation rate characteristic of the amplitude after the transmission-type ultrasonic wave penetrates the medium. Media with different compositions or composition ratios have different attenuation rates. By establishing the functional relationship between the attenuation rate and the areal density of the substance, the specific method is to select dry films with 7 different pump speeds, measure their attenuation rates, and weigh them to obtain the corresponding weights. Seven points are obtained in the coordinate system with the attenuation rate as the abscissa and the areal density of the substance as the ordinate, and then the least squares method is used to linearly fit these 7 points to obtain the value of the coefficient vector of the linear equation, realizing the calibration of dry films and the calculation of the areal density.

[0022] However, the measurement of the areal density of wet films faces many difficulties. Different from dry films, the characteristics of wet films themselves make it inconvenient to perform cutting operations, which makes it impossible to obtain accurate weights by directly weighing them like dry films, and thus it is difficult to establish an accurate method for calculating the areal density. Traditional dry film measurement methods will fail when dealing with wet films, making it impossible to timely and accurately know the areal density of wet films during related production and research processes, seriously affecting production quality control and product performance research.

[0023] Due to the lack of direct measurement and accurate control of the wet film state, a fully automatic closed-loop system with dry film measurement values as input will have a long uncontrollable area during the wet film production stage. Due to the existence of this uncontrollable area, a large amount of materials and production time will be wasted. For example, in the production process of lithium battery electrodes, from the wet film coating to the drying into a dry film, if only the dry film measurement value is used to control the wet film coating link, the surface density cannot be known in real time during the wet film coating, and it may be coated too thick or too thin. When coated too thick, not only a large amount of raw materials are wasted, increasing production costs, but also process problems may occur during the subsequent battery manufacturing process, such as an increase in battery internal resistance and a decrease in capacity; when coated too thin, it may not meet the performance requirements of the product, also causing product quality problems and material waste. Aiming at the technical problem in the prior art that the wet film is inconvenient to cut and weigh, and thus it is difficult to accurately obtain the surface density, the embodiments of the present invention provide a method, a system and a coating device for measuring the surface density of a wet film. This method innovatively establishes a connection between the specifically processed wet film and the dry film, and cleverly uses the weighable characteristics of the dry film to calibrate the surface density of the wet film, which can meet the requirements of accurate measurement of the surface density of the wet film during the production process, and solves the problems such as low production efficiency and large measurement errors caused by poor measurement effect of the surface density of the wet film in the prior art.

[0024] For the convenience of understanding this embodiment, first, a method for measuring the surface density of a wet film disclosed in the embodiments of the present invention will be introduced in detail. This method is applied to the wet film calibration process of a coating device, as Figure 1 shown, this method includes: Step S101, determine multiple groups of pump speeds according to the type parameters of the coating device, and control the coating device to coat multiple groups of wet films based on the pump speeds.

[0025] The device type parameters involve the core parameters of the coating device, including the coating head type (such as comma knife, slot die), pump body specifications (displacement of gear pump / screw pump), transmission system speed ratio, substrate running speed, etc., to clarify the flow control range and accuracy of the device. Specifically, refer to the device manual or historical process data to determine the initial range and gradient of pump speed adjustment to ensure that the flow range during normal production of the device is covered.

[0026] During the implementation process of wet film coating, substrates consistent with actual production (such as PET film, aluminum foil) can be selected, and the surface of the substrate can be cleaned (dust removal, degreasing) and tension calibrated to avoid the influence of the surface state on the wet film uniformity. Set the pump speed parameters through the relevant device control system (such as PLC or upper computer), and synchronously control the auxiliary parameters such as substrate running speed, coating gap, and tank liquid level to ensure that the coating conditions of each group of wet films are the same. When each group of wet films is coated, mark the corresponding relationship between the batch number and the pump speed at the edge of the substrate for subsequent data traceability.

[0027] Step S102 : Controlling the ultrasonic measuring device corresponding to the coating device to measure the attenuation rate of each group of wet films, and obtaining the position marks between each group of wet films.

[0028] Setting ultrasonic measurement parameters requires configuring ultrasonic measurement equipment, selecting an appropriate probe frequency (e.g., 5MHz-10MHz, adjusted based on wet film thickness and material acoustic impedance), calibrating the vertical distance between the probe and the wet film surface (typically controlled to 5-10mm to avoid the effects of coupling agents), and setting the measurement sampling frequency (e.g., 100Hz to ensure real-time performance). The attenuation rate is calculated using a related formula based on the amplitude difference between the transmitted and received ultrasonic signals. The ambient temperature during measurement can also be recorded (this affects the speed of sound and requires real-time compensation).

[0029] Position marking can be done using an optical positioning system or mechanical scale markers to precisely mark the start and end points of each wet film set on the substrate, avoiding edge effect areas. The decay rate data for each wet film set is stored synchronously with the position marking information (e.g., by associating pump speed, timestamp, and coordinate position in a database) to ensure accurate correlation during subsequent drying processes.

[0030] Step S103 , controlling the oven corresponding to the coating device to dry each set of wet films, cutting the obtained dry films according to the position marks, and obtaining the dry film weight corresponding to each set of wet films.

[0031] The drying process requires setting oven parameters. Parameters such as the heating rate, constant temperature, and holding time can be determined based on the wet film material's characteristics (such as the solvent's boiling point and curing temperature). The uniformity of the oven's temperature field must also be ensured. If the material is susceptible to oxidation, inert gas or ventilation can be introduced during the drying process to ensure complete solvent evaporation and prevent residual solvent from affecting weight accuracy.

[0032] The dry film cutting and weighing process follows the position marks from step S102. Use a precision cutter or laser cutter to cut the dry film along the marked lines. Standardize the cuts and trim the edges. Weigh each set of dry film using a precision measuring device. Calibrate the zero point before each weighing. Repeat the measurement three times and take the average. When recording the weight, note the ambient humidity (to avoid moisture absorption).

[0033] Step S104 : constructing a fitting curve corresponding to the attenuation rate under each wet film and the dry film weight based on the type parameter.

[0034] During the data preprocessing process, the attenuation rate and dry film weight data of each group of wet films need to be normalized, outliers need to be eliminated, and the data need to be sorted from small to large according to the pump speed to ensure the logic of the data sequence.

[0035] Consider environmental factor correction. If the temperature and humidity change significantly before and after drying, temperature compensation for the attenuation rate data is required (such as the correction formula for the change in the speed of sound with temperature), and humidity correction for the dry film weight is required (such as deducting the moisture absorption by the weight loss method).

[0036] During the curve fitting and verification process, a fitting model needs to be selected. According to the characteristics of the data distribution, linear regression (suitable for linear relationships), polynomial fitting (such as quadratic / cubic polynomials, suitable for non-linear relationships), or machine learning algorithms (such as neural networks for dealing with complex mappings) are used to construct the functional relationship between the attenuation rate and the dry film weight. When evaluating the fitting, the reliability of the curve can be verified through indicators such as the coefficient of determination and the mean square error. If the fitting effect is not good, the measurement data needs to be rechecked or the fitting curve needs to be adjusted.

[0037] In step S105, control the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film in the coating device, use the fitting curve to obtain the dry film fitting weight corresponding to the real-time attenuation rate, and determine the surface density corresponding to the real-time wet film based on the dry film fitting weight.

[0038] The real-time attenuation rate acquisition is to continuously and real-time collect the attenuation rate of the wet film through the ultrasonic measurement device during the production process of the coating device and synchronously transmit it to the relevant control system. This control system automatically performs noise filtering (such as Kalman filtering) and temperature compensation on the real-time attenuation rate to ensure data accuracy.

[0039] During the surface density calculation and calibration process, use the fitting curve in step S104, substitute the real-time attenuation rate into the fitting curve to calculate the dry film fitting weight, and the surface density corresponding to the real-time wet film can be obtained through surface density = dry film weight / coating area.

[0040] In the actual scenario, the fitting curve can be calibrated regularly (such as before each batch of production) using a standard sample (a dry film with a known surface density). If the deviation between the measured weight and the fitting weight exceeds the relevant threshold, steps S101 - S104 need to be re-executed for calibration.

[0041] Optionally, step S101 of determining multiple sets of pump speeds according to the type parameters of the coating device and controlling the coating device to coat multiple sets of wet films based on the pump speeds, such as Figure 2 as shown, includes: Step S201, obtain the type parameters corresponding to the coating device, and determine the surface density sample list of the coating device based on the type parameters; Step S202, obtain multiple coating calibration thicknesses corresponding to the coating device according to the surface density sample list, and determine multiple sets of pump speeds based on the coating calibration thickness; Step S203, control the coating device to coat multiple sets of wet films corresponding to the coating calibration thickness according to the pump speeds.

[0042] The type parameter corresponds to different types of coating equipment, and different types of coating equipment correspond to wet films of different thicknesses. Therefore, the type parameter can be used as a characterization parameter for the coating equipment. Since different coating equipment corresponds to wet films of a specific thickness, by obtaining the list of areal density samples corresponding to the coating equipment, wet films of different thicknesses corresponding thereto can be obtained. Moreover, the thickness is related to the pump speed of the coating equipment. Therefore, multiple coating calibration thicknesses corresponding to the coating equipment can be obtained by using the list of areal density samples, and multiple sets of pump speeds can be determined based on the coating calibration thicknesses. Furthermore, the coating equipment can be controlled according to the control instructions corresponding to the pump speeds to coat multiple sets of wet films corresponding to the coating calibration thicknesses.

[0043] For example, in an actual scenario, 7 sets of wet films with different thicknesses need to be prepared. During the specific implementation process, the coating equipment is used to continuously coat 7 sets of wet films with different pump speeds. Different pump speeds determine the difference in the areal density of the wet films. In this way, 7 wet films with different areal densities can be obtained, and these 7 sets of wet films will be used as the basic samples for large calibration. By using the adjustable pump speed function of the coating equipment, the areal density of the wet film is precisely controlled, laying a foundation for establishing an accurate fitting curve in the subsequent process.

[0044] Optionally, step S102 of controlling the ultrasonic measurement device corresponding to the coating equipment to measure the attenuation rate of each set of wet films and obtaining the position marks between each set of wet films, as Figure 3 shown, includes: Step S301, obtaining the ultrasonic measurement device corresponding to the coating equipment; Step S302, determining the first set of wet films among multiple sets of wet films. When it is detected that the coating of the first set of wet films is completed, controlling the coating equipment to stop urgently, and obtaining the first position mark corresponding to the first set of wet films based on the urgent stop position; Step S303, controlling the ultrasonic measurement device to scan and measure the average attenuation rate of the first set of wet films, and using the average attenuation rate to determine the first attenuation rate corresponding to the first set of wet films; Step S304, controlling the coating equipment to operate, determining the second set of wet films adjacent to the first set of wet films among multiple sets of wet films. When it is detected that the coating of the second set of wet films is completed, controlling the coating equipment to stop urgently, and obtaining the second position mark corresponding to the second set of wet films based on the urgent stop position; controlling the ultrasonic measurement device to scan and measure the average attenuation rate of the second set of wet films, and using the average attenuation rate to determine the second attenuation rate corresponding to the second set of wet films; Step S305, determining the attenuation rate corresponding to each set of wet films based on the first attenuation rate and the second attenuation rate.

[0045] The above steps mainly implement the process of measuring the attenuation rate of the wet film and marking. The attenuation rate is achieved based on the ultrasonic measurement device corresponding to the coating equipment. Since multiple groups of wet films are involved, first obtain the first group of wet films among them. After its coating is completed, control the coating equipment to stop suddenly, and obtain the corresponding position mark based on the sudden stop position. Then control the ultrasonic measurement device to scan back and forth across the first group of wet films, measure and record the corresponding average attenuation rate, thereby completing the process of measuring the attenuation rate of the first group of wet films and obtaining the position mark.

[0046] Subsequently, control the coating equipment to operate, coat the second group of wet films adjacent to the first group of wet films, and subsequently obtain the attenuation rate and position mark of the second group of wet films in the same manner as the first group of wet films. In the actual scenario, it is not limited to only these two groups of wet films. It is just through the processing of these two groups of wet films to describe the process of obtaining the attenuation rate and position mark corresponding to multiple groups of wet films.

[0047] During the actual execution process, a standard group of wet films can be set, and the standard attenuation rate and standard dry film weight corresponding to this standard group of wet films can be accurately obtained. Specifically, for the standard group of wet films, not only the average attenuation rate value needs to be measured and recorded, but also the attenuation rate values of each partition need to be measured and recorded, and the position marks should also be made in the same way. This operation ensures that the attenuation rate information of the wet film can be comprehensively obtained, including the attenuation rate data of wet films with different thicknesses and different partitions of wet films with normal thickness, providing complete data support for constructing an accurate calibration curve.

[0048] Optionally, control the oven corresponding to the coating equipment to dry each group of wet films. The steps S103 of obtaining the dry film weight corresponding to each group of wet films by cutting the obtained dry film according to the position mark are as Figure 4 shown, including: Step S401, obtain the oven corresponding to the coating equipment; Step S402, determine the drying parameters of the oven based on the type parameters of the coating equipment, and use the drying parameters to control the oven to dry each group of wet films, and then obtain the dry film corresponding to each group of wet films; Step S403, determine the position marks included in the dry film, and cut the dry film according to the position marks and then weigh them in sequence to obtain the dry film weight corresponding to each group of wet films.

[0049] Send the wet film that has undergone the above measurement into the oven corresponding to the coating equipment for drying treatment to transform it into a dry film. During the drying treatment process, determine the drying parameters of the oven based on the type parameters of the coating equipment, and use the drying parameters to control the oven to dry each group of wet films. After drying is completed, cut the dry film according to the previous position mark of the wet film, weigh the cut dry film, and record the weight of each sample dry film, thereby realizing the transformation from the wet film to the dry film, and using the weighable characteristic of the dry film to build a bridge for establishing the relationship between the wet film attenuation rate and the dry film surface density.

[0050] Optionally, step S104 of constructing a fitting curve for each group of wet film attenuation rates corresponding to the dry film weight based on the type parameter is as follows Figure 5 shown and includes: Step S501, determining the data pairs corresponding to the wet film attenuation rate and the dry film weight for each group according to the type parameter; Step S502, performing fitting on the data pairs corresponding to each group of wet films using the least squares method to obtain a fitting curve; wherein, the abscissa of the fitting curve is the attenuation rate, and the ordinate of the fitting curve is the dry film weight.

[0051] For example, for 7 groups of wet films with different thicknesses, 7 groups of data pairs composed of the average attenuation rate of the wet film and the corresponding dry film weight are obtained, and a fitting curve is obtained by performing fitting on the data pairs corresponding to each group of wet films using the least squares method; wherein, the abscissa of the fitting curve is the attenuation rate, and the ordinate of the fitting curve is the dry film weight, thereby obtaining the functional relationship between the wet film attenuation rate and the dry film areal density.

[0052] Optionally, step S502 of performing fitting on the data pairs corresponding to each group of wet films using the least squares method to obtain a fitting curve is as follows Figure 6 shown and includes: Step S601, obtaining the target straight line corresponding to the fitting curve; wherein, the target straight line is y = kx + b; y corresponds to the dry film weight, x corresponds to the attenuation rate, k corresponds to the slope coefficient, and b corresponds to the axis intercept coefficient; Step S602, inputting the corresponding attenuation rate and dry film weight in the data pair into the target straight line, and updating the slope coefficient and the axis intercept coefficient corresponding to the target straight line using the least squares method; Step S603, when the sum of the squared errors between the target straight line and the data points corresponding to the data pair is the smallest, determining the fitting curve using the current slope coefficient and axis intercept coefficient.

[0053] Using the least squares method, the straight line y = kx + b is used to fit these 7 points, thereby determining the values of the coefficients k and b. The least squares method can find the optimal straight line fitting among numerous data points, making the sum of the squared errors between the straight line and each data point the smallest, thereby ensuring the accuracy of the functional relationship.

[0054] Optionally, after determining the fitting curve using the current slope coefficient and axis intercept coefficient, as Figure 7 shown, the method further includes: Step S701, obtaining the preset standard group of wet films among multiple groups of wet films, and determining the standard attenuation rate and the standard dry film weight corresponding to the standard group of wet films; Step S702: Obtain the calculated dry film weight corresponding to the standard attenuation rate using the fitting curve, and calculate the weight difference between the calculated dry film weight and the standard dry film weight. Step S703: If the weight difference is not less than the preset weight threshold, update the fitting curve based on the weight difference, and use the updated fitting curve to update the weight difference between the calculated dry film weight and the standard dry film weight until the weight difference is less than the preset weight threshold, and then obtain the current fitting curve.

[0055] In the actual scenario, the obtained fitting curve needs to be sampled and verified, which is specifically achieved through the standard wet film. After obtaining the standard attenuation rate and the standard dry film weight corresponding to the standard group of wet films, use the fitting curve to obtain the calculated dry film weight corresponding to the standard attenuation rate, and then calculate the weight difference between the calculated dry film weight and the standard dry film weight. If the weight difference is not less than the preset weight threshold, it indicates that the fitting curve has a poor effect and needs to be updated and optimized. Specifically, the fitting curve is updated based on the weight difference. Subsequently, use the updated fitting curve to update the weight difference between the calculated dry film weight and the standard dry film weight until the weight difference is less than the preset weight threshold, and then use the current fitting curve as the final fitting curve.

[0056] Optionally, step S105 of controlling the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film in the coating device, using the fitting curve to obtain the dry film fitting weight corresponding to the real-time attenuation rate, and determining the surface density corresponding to the real-time wet film based on the dry film fitting weight, as Figure 8 shown, includes: Step S801: When it is detected that the coating device is in the wet film calibration stage, obtain the calibration pump speed corresponding to the coating device, and control the coating device to perform coating based on the calibration pump speed to obtain the real-time wet film. Step S802: Control the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film, and calculate the dry film fitting weight corresponding to the real-time attenuation rate using the target straight line in the fitting curve. Step S803: Determine the surface density corresponding to the real-time wet film under the current type parameters according to the dry film fitting weight.

[0057] When the coating device is in the wet film calibration stage, use the calibration pump speed corresponding to the coating device to obtain the real-time wet film, and it is difficult to directly cut and weigh the wet film in the traditional scheme. In this scheme, the ultrasonic measurement device is used to obtain the real-time attenuation rate corresponding to the real-time wet film, and the target straight line in the obtained fitting curve can be used to directly calculate the dry film fitting weight corresponding to the real-time attenuation rate, so as to determine the surface density corresponding to the real-time wet film under the current type parameters, and indirectly realize the calibration of the wet film surface density.

[0058] Traditional wet film calibration requires recoating new samples, which forces the equipment to be frequently started and stopped, bringing a lot of inconvenience to production. Frequent start and stop of the equipment not only consumes a large amount of time for equipment startup preheating and shutdown adjustment, but also disrupts the entire production rhythm and destroys the continuity of production. Moreover, each time the equipment is started, additional materials are required for debugging and calibration to ensure the normal operation of the equipment, which undoubtedly causes waste of materials.

[0059] This solution adopts the method of reusing basic materials. Each time wet film calibration is carried out, these electrodes are directly used for measurement, weighing and fitting operations, without stopping to coat new samples again. In this way, not only the production efficiency is greatly improved, the waste of production time and materials caused by frequent start and stop of the equipment is effectively avoided, but also the error that may be introduced by multiple stop coatings is reduced, strongly ensuring the stability of calibration.

[0060] Such as Figure 9 The flowchart of another wet film surface density measurement method is shown. Specifically, first coat a wet film with a specific pump speed, use an ultrasonic surface density meter to scan back and forth to obtain the average attenuation rate, and mark the edge of the wet film. After drying in a coating oven, cut it down and weigh it to obtain a set of real number pairs about the wet film attenuation rate and the dry film weighing value. Then, repeat the above operations with wet films of 7 different pump speeds (i.e., 7 different thicknesses) to obtain 7 sets of such real number pairs. After that, use the least squares method to fit these 7 points with a straight line to obtain the value of the coefficient vector, and construct a functional relationship with the wet film attenuation rate as the abscissa and the dry film weight as the ordinate. In this way, in the future, only need to measure the attenuation rate of the wet film by an ultrasonic surface density meter and substitute it into this straight line equation to obtain the corresponding dry film weight, thus indirectly realizing the calibration of the wet film surface density.

[0061] The schematic diagram of the fitting curve is as Figure 10 shown. The abscissa in this coordinate system corresponds to the attenuation rate, and the ordinate corresponds to the weight of the dry film weighing, with the unit of gram; Figure 10 The 7 dots in Figure 10 represent the weighing values collected corresponding to different attenuation rates, and the straight line in

[0062] is the fitting straight line obtained by fitting using the least squares method. The equation corresponding to this straight line is: y = -199775.638887707x + 427.060416073, and the involved coefficient of determination r2 = 0.999643572.In terms of measurement accuracy, the wet film surface density measurement method in this embodiment successfully overcomes the problem that wet films cannot be directly cut and weighed. By converting the wet film into a dry film, combining ultrasonic scanning to obtain the attenuation rate and dry film weighing data, and using the least squares method to fit the functional relationship, the accurate calibration of the wet film surface density is achieved. This greatly meets the requirements of production and research for high-precision measurement, can ensure the stable performance of products, and reduce quality problems.

[0063] In terms of production efficiency, the coating equipment is used to continuously prepare 7 groups of wet films with different pump speeds as reusable basic materials. During calibration, there is no need to stop coating multiple times. In large-scale production, both the output is increased, and the equipment loss and energy waste are reduced, significantly improving the production efficiency.

[0064] In terms of calibration stability, 7 groups of basic materials are fixedly used, reducing the differences and errors introduced by the preparation of new samples, reducing the impact of environmental and equipment fluctuations on the measurement results, and ensuring the consistency and reliability of calibration results for different batches.

[0065] As can be seen from the wet film surface density measurement method mentioned in the above embodiments, this method innovatively establishes a connection between the wet film after specific treatment and the dry film, and cleverly uses the weighable characteristics of the dry film to achieve the calibration of the wet film surface density, which can meet the requirements of accurate measurement of the wet film surface density in the production process, and solves the problems such as low production efficiency and large measurement errors caused by poor measurement effect of the wet film surface density in the prior art.

[0066] Corresponding to the wet film surface density measurement method provided in the foregoing embodiments, an embodiment of the present invention provides a wet film surface density measurement system, which is applied to the wet film calibration process of a coating equipment, such as Figure 11 shown, this system includes: A wet film grouping unit 1110, configured to determine multiple groups of pump speeds according to the type parameters of the coating equipment, and control the coating equipment to coat multiple groups of wet films based on the pump speeds; An attenuation rate measurement and marking unit 1120, controlling the ultrasonic measurement equipment corresponding to the coating equipment to measure the attenuation rate of each group of wet films, and obtaining the position marks between each group of wet films; A drying and weighing unit 1130, configured to control the oven corresponding to the coating equipment to dry each group of wet films, and obtain the dry film weight corresponding to each group of wet films after cutting the obtained dry films according to the position marks; A fitting curve construction unit 1140, configured to construct a fitting curve corresponding to the attenuation rate and the dry film weight under each group of wet films based on the type parameters; A surface density acquisition unit 1150, configured to control the ultrasonic measurement equipment to obtain the real-time attenuation rate of the real-time wet film in the coating equipment, use the fitting curve to obtain the dry film fitting weight corresponding to the real-time attenuation rate, and determine the surface density corresponding to the real-time wet film based on the dry film fitting weight.

[0067] As can be seen from the wet film surface density measurement system mentioned in the above embodiments, the system innovatively establishes a connection between the wet film after specific treatment and the dry film, and cleverly uses the weighable characteristic of the dry film to calibrate the surface density of the wet film, which can meet the requirements of accurate measurement of the wet film surface density in the production process, and solves the problems of low production efficiency and large measurement errors caused by poor measurement effect of the wet film surface density in the prior art.

[0068] The wet film surface density measurement system provided by the embodiments of the present invention has the same implementation principle and technical effects as those of the foregoing embodiments of the wet film surface density measurement method. For a brief description, for the parts not mentioned in the system embodiments, reference may be made to the corresponding content in the foregoing embodiments of the wet film surface density measurement method.

[0069] This embodiment also provides a coating device, and the structural schematic diagram of the coating device is as Figure 12 shown. The device includes a processor 101 and a memory 102; wherein, the memory 102 is used to store one or more computer instructions, and the one or more computer instructions are executed by the processor to implement the steps of the above wet film surface density measurement method.

[0070] Figure 12 The coating device shown also includes a bus 103 and a communication interface 104, and the processor 101, the communication interface 104 and the memory 102 are connected through the bus 103.

[0071] Among them, the memory 102 may include a high-speed random access memory (RAM, Random Access Memory), and may also include a non-volatile memory, such as at least one disk memory. The bus 103 may be an ISA bus, a PCI bus or an EISA bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of convenience of representation, Figure 12 only a bidirectional arrow is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0072] The communication interface 104 is used to connect to at least one user terminal and other network units through a network interface, and send the encapsulated IPv4 packet or IPv4 packet to the user terminal through the network interface.

[0073] The processor 101 may be an integrated circuit chip with the ability to process signals. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware in the processor 101 or instructions in the form of software. The above-mentioned processor 101 may be a general-purpose processor, including a central processing unit (CPU for short), a network processor (NP for short), etc.; it may also be a digital signal processor (DSP for short), an application specific integrated circuit (ASIC for short), a field-programmable gate array (FPGA for short), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. It can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of the present disclosure. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc. The steps of the method disclosed in combination with the embodiments of the present disclosure can be directly embodied as being executed and completed by a hardware decoding processor, or can be executed and completed by a combination of hardware and software modules in the decoding processor. The software module may be located in a mature storage medium in the art such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. This storage medium is located in the memory 102, and the processor 101 reads the information in the memory 102 and combines its hardware to complete the steps of the method in the foregoing embodiments.

[0074] An embodiment of the present invention further provides a storage medium, on which a computer program is stored, and when the computer program is run by a processor, it executes the steps of the wet film surface density measurement method in the foregoing embodiments.

[0075] In several embodiments provided in the present application, it should be understood that the disclosed systems, devices, equipment, and methods can be implemented in other ways. The system embodiments described above are merely illustrative. For example, the division of the units is only a logical function division, and there may be other division methods in actual implementation. For another example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other may be through some communication interfaces, and the indirect coupling or communication connection of devices or units may be in an electrical, mechanical, or other form.

[0076] The unit described as a separation component may or may not be physically separated. The component shown as a unit may or may not be a physical unit, that is, it may be located in one place or distributed across multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0077] In addition, in each embodiment of the present invention, each functional unit may be integrated in a processing unit, may exist physically alone for each unit, or two or more units may be integrated in one unit.

[0078] If the above functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium executable by a processor. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to enable a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs.

[0079] Finally, it should be noted that: the above-described embodiments are only specific implementation manners of the present invention, used to illustrate the technical solutions of the present invention, and are not intended to limit it. The protection scope of the present invention is not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: any person skilled in the art within the technical scope disclosed by the present invention can still modify the technical solutions recorded in the foregoing embodiments, or can easily think of changes, or perform equivalent replacements for some of the technical features; and these modifications, changes, or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. A method for measuring the surface density of a wet film, characterized in that, The method is applied to the wet film calibration process of a coating device, and the method includes: Determine multiple sets of pump speeds according to the type parameters of the coating device, and control the coating device to coat multiple sets of wet films based on the pump speeds; Control the ultrasonic measurement device corresponding to the coating device to measure the attenuation rate of each set of wet films, and obtain the position marks between each set of wet films; Control the oven corresponding to the coating device to dry each set of wet films, and cut the obtained dry films according to the position marks to obtain the dry film weights corresponding to each set of wet films; Construct a fitting curve corresponding to the attenuation rate and the dry film weight under each set of wet films based on the type parameters; Control the ultrasonic measurement device to obtain the real-time attenuation rate of the real-time wet film in the coating device, use the fitting curve to obtain the dry film fitting weight corresponding to the real-time attenuation rate, and determine the surface density of the real-time wet film based on the dry film fitting weight.

2. The wet film surface density measurement method according to claim 1, characterized in that The step of determining multiple sets of pump speeds according to the type parameters of the coating device and controlling the coating device to coat multiple sets of wet films based on the pump speeds includes: Obtain the type parameters corresponding to the coating device, and determine the surface density sample list of the coating device based on the type parameters; Obtain multiple coating calibration thicknesses corresponding to the coating device according to the surface density sample list, and determine multiple sets of the pump speeds based on the coating calibration thicknesses; Control the coating device to coat the multiple sets of wet films corresponding to the coating calibration thickness according to the pump speeds.

3. The wet film surface density measurement method according to claim 1, wherein The step of controlling the ultrasonic measurement device corresponding to the coating device to measure the attenuation rate of each set of wet films and obtain the position marks between each set of wet films includes: Obtain the ultrasonic measurement device corresponding to the coating device; Determine the first set of wet films among the multiple sets of wet films. When it is detected that the coating of the first set of wet films is completed, control the coating device to stop suddenly, and obtain the first position mark corresponding to the first set of wet films based on the sudden stop position; Control the ultrasonic measurement device to scan and measure the average attenuation rate of the first set of wet films, and use the average attenuation rate to determine the first attenuation rate corresponding to the first set of wet films; Control the coating device to run, determine the second set of wet films adjacent to the first set of wet films among the multiple sets of wet films. When it is detected that the coating of the second set of wet films is completed, control the coating device to stop suddenly, and obtain the second position mark corresponding to the second set of wet films based on the sudden stop position; control the ultrasonic measurement device to scan and measure the average attenuation rate of the second set of wet films, and use the average attenuation rate to determine the second attenuation rate corresponding to the second set of wet films; Determine the attenuation rate corresponding to each set of wet films based on the first attenuation rate and the second attenuation rate.

4. The wet film surface density measurement method according to claim 1, characterized in that, The step of controlling the oven corresponding to the coating device to dry each set of wet films, and cutting the obtained dry films according to the position marks to obtain the dry film weights corresponding to each set of wet films includes: Obtain the oven corresponding to the coating device; Determine the drying parameters of the oven based on the type parameters of the coating equipment, and use the drying parameters to control the oven to dry each group of wet films, and then obtain the dry films corresponding to each group of wet films; Determine the position marks included in the dry film, and cut the dry film according to the position marks and then weigh them in sequence to obtain the dry film weights corresponding to each group of wet films.

5. The wet film surface density measurement method according to claim 1, characterized in that, The step of constructing a fitting curve corresponding to the attenuation rate and the dry film weight under each group of wet films based on the type parameters includes: Determine the data pairs corresponding to the attenuation rate and the dry film weight under each group of wet films according to the type parameters; Use the least squares method to fit the data pairs corresponding to each group of wet films to obtain the fitting curve; wherein, the abscissa of the fitting curve is the attenuation rate, and the ordinate of the fitting curve is the dry film weight.

6. The wet film surface density measurement method according to claim 5, characterized in that, The step of using the least squares method to fit the data pairs corresponding to each group of wet films to obtain the fitting curve includes: Obtain the target straight line corresponding to the fitting curve; wherein, the target straight line is y = kx + b; y corresponds to the dry film weight, x corresponds to the attenuation rate, k corresponds to the slope coefficient, and b corresponds to the axis intercept coefficient; Input the corresponding attenuation rate and dry film weight in the data pairs into the target straight line, and use the least squares method to update the slope coefficient and the axis intercept coefficient corresponding to the target straight line; When the sum of the squared errors between the target straight line and the data points corresponding to the data pairs is the smallest, determine the fitting curve using the current slope coefficient and axis intercept coefficient.

7. The wet film surface density measurement method according to claim 6, wherein After determining the fitting curve using the current slope coefficient and axis intercept coefficient, the method further includes: Obtain the preset standard group of wet films among the multiple groups of wet films, and determine the standard attenuation rate and the standard dry film weight corresponding to the standard group of wet films; Use the fitting curve to obtain the calculated dry film weight corresponding to the standard attenuation rate, and calculate the weight difference between the calculated dry film weight and the standard dry film weight; If the weight difference is not less than the preset weight threshold, update the fitting curve based on the weight difference, and use the updated fitting curve to update the weight difference between the calculated dry film weight and the standard dry film weight until the weight difference is less than the preset weight threshold, and then obtain the current fitting curve.

8. The wet film surface density measurement method according to claim 6, wherein The step of controlling the ultrasonic measurement device to obtain the real-time attenuation rate of the real-time wet film in the coating equipment, using the fitting curve to obtain the dry film fitting weight corresponding to the real-time attenuation rate, and determining the surface density corresponding to the real-time wet film based on the dry film fitting weight includes: When it is detected that the coating equipment is in the wet film calibration stage, obtain the calibration pump speed corresponding to the coating equipment, and control the coating equipment to perform coating based on the calibration pump speed to obtain the real-time wet film; Control the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film, and calculate the dry film fitting weight corresponding to the real-time attenuation rate using the target straight line corresponding to the fitting curve; Determine the areal density corresponding to the current wet film under the type parameter according to the dry film fitting weight.

9. A wet film surface density measurement system, characterized in that, The system is applied to the wet film calibration process of a coating device, and the system includes: A wet film grouping unit, configured to determine multiple groups of pump speeds according to the type parameter of the coating device, and control the coating device to coat multiple groups of wet films based on the pump speeds; An attenuation rate measurement and marking unit, configured to control an ultrasonic measurement device corresponding to the coating device to measure the attenuation rate of each group of wet films, and obtain the position marks between each group of wet films; A drying and weighing unit, configured to control an oven corresponding to the coating device to perform drying treatment on each group of wet films, and obtain the dry film weight corresponding to each group of wet films after cutting the obtained dry films according to the position marks; A fitting curve construction unit, configured to construct a fitting curve corresponding to the attenuation rate and the dry film weight under each group of wet films based on the type parameter; An areal density acquisition unit, configured to control the ultrasonic measurement device to obtain the real-time attenuation rate corresponding to the real-time wet film in the coating device, obtain the dry film fitting weight corresponding to the real-time attenuation rate by using the fitting curve, and determine the areal density corresponding to the real-time wet film based on the dry film fitting weight.

10. A coating device, characterized in that, It includes a processor and a memory, the memory stores computer-executable instructions that can be executed by the processor, and the processor executes the computer-executable instructions to implement the steps of the wet film areal density measurement method according to any one of claims 1 to 8.

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