Surface-mounted crystal oscillator high and low temperature automatic test device and test method

Through the combined design of the temperature control box and vibration component, the problem of long temperature adjustment time and poor contact in the surface crystal oscillator high and low temperature test is solved, and efficient and accurate test results are achieved.

CN120405257AActive Publication Date: 2025-08-01SHENZHEN FEISHI CLOTHING CO LTD
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Patent Information

Application Number
CN202510378646.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-28
Publication Date
2025-08-01
Estimated Expiration
2045-03-28

AI Technical Summary

Technical Problem

In the prior art, during the high and low temperature test of surface-mounted crystal oscillator, the temperature adjustment time is long and the testing efficiency is low. Moreover, the detector probe and the crystal oscillator connection terminal are prone to poor contact, resulting in large errors in the detection data and poor accuracy.

Method used

The combined design of the temperature control box, detection box, moving seat, temperature guide assembly and vibration assembly is adopted to simulate the real environment through rapid temperature change and slight vibration, and combine the spring and slide rail structure to ensure close contact of the probe, improving testing efficiency and accuracy.

Benefits of technology

It realizes rapid temperature transfer, improves testing efficiency and accuracy, and ensures the representativeness and stability of the test results.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a surface-mounted crystal oscillator high and low temperature automatic testing device and testing method, and belongs to the field of surface-mounted crystal oscillator testing. A surface-mounted crystal oscillator high and low temperature automatic testing device comprises a temperature control box, a detection box fixed to the top of the temperature control box and a detector fixed to the top of the detection box, and the bottom of an inner cavity of the detection box is fixedly connected with a detection table; according to the invention, through rotation of the temperature conduction blades, gas after temperature change rapidly moves towards the surface-mounted crystal oscillator, so that the airflow heat exchange speed in the detection box is accelerated, the temperature is more rapidly transmitted to the surface-mounted crystal oscillator, the time required for temperature adjustment is shortened, and the test efficiency is improved; and through a transmission effect, the spring telescopic rod is pushed in a reciprocating manner to collide with the side wall of the detection table, and then a slight vibration effect is generated, so that a more real use environment of the surface-mounted crystal oscillator is simulated, the working stability and reliability of the surface-mounted crystal oscillator under the condition are effectively evaluated, and the representativeness of a test result is improved.
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Description

Technical Field

[0001] The present invention relates to the technical field of surface-mounted crystal oscillator testing, and particularly relates to an automatic high and low temperature testing device and method for surface-mounted crystal oscillators. Background Art

[0002] A surface-mounted crystal oscillator is a micro-miniature pinless crystal oscillator manufactured and encapsulated using surface mount technology. It provides a reference signal for electronic products as a clock reference. In modern electronic technology, surface-mounted crystal oscillators are widely used in fields such as radar, communication, measurement and control, countermeasure, and navigation. With the development of modern electronic technology applications, the performance of electronic products has been continuously improved, and at the same time, higher requirements have been placed on surface-mounted crystal oscillators. Therefore, it is necessary to test the performance indicators of surface-mounted crystal oscillators to meet the usage requirements. And the performance indicators of surface-mounted crystal oscillators are closely related to temperature. Therefore, the performance indicators of surface-mounted crystal oscillators are usually tested under high and low temperature environments respectively to ensure the representativeness of the test data.

[0003] Currently, when performing high and low temperature tests on surface-mounted crystal oscillators, the waiting time required for each temperature adjustment is relatively long, and it is impossible to effectively make the temperature quickly cover the surrounding of the surface-mounted crystal oscillator, thereby reducing the test efficiency. Moreover, during the detection, the contact between the detector probe and the power connection end of the surface-mounted crystal oscillator is likely to be poor, resulting in errors in the detection data and reducing the detection accuracy. Therefore, an automatic high and low temperature testing device and method for surface-mounted crystal oscillators are proposed. Summary of the Invention

[0004] The purpose of the present invention is to solve the problems in the prior art that the waiting time required for each temperature adjustment is relatively long, reducing the test efficiency; and the contact between the detector probe and the power connection end of the surface-mounted crystal oscillator is likely to be poor, resulting in errors in the detection data and reducing the detection accuracy. An automatic high and low temperature testing device and method for surface-mounted crystal oscillators are proposed.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] An automatic high and low temperature testing device for surface-mounted crystal oscillators includes a temperature control box, a detection box fixed on the top of the temperature control box, and a detector fixed on the top of the detection box. A detection table is fixedly connected to the bottom of the inner cavity of the detection box. It further includes: a moving seat, which is arranged in the detection box. Among them, a positioning cylinder is fixedly connected to the bottom of the moving seat, and an adjusting part for adjusting the position of the moving seat is arranged in the detection box; a temperature guiding component, which is arranged in the detection box and is used to quickly push the temperature transported from the temperature control box into the detection area; a vibration component, which is arranged in the detection box and is used to apply a vibration effect to the detection table during the detection process.

[0007] In order to improve the test accuracy, preferably, a positioning pressure plate is slidably connected in the positioning cylinder, a first spring is fixedly connected between the top of the positioning pressure plate and the top of the positioning cylinder, a positioning pressure rod is fixedly connected to the bottom of the positioning cylinder, the positioning pressure rod extends to the bottom of the positioning cylinder, two groups of telescopic cylinders are rotatably connected on the outer wall of the positioning pressure rod, an electrical probe is slidably connected in the telescopic cylinder, and a second spring is fixedly connected between the top of the electrical probe and the top of the telescopic cylinder.

[0008] In order to improve the convenience of testing, preferably, the adjustment part includes a longitudinal slide rail, a longitudinal slide is slidably connected to the longitudinal slide rail, a guide slide is fixedly connected to the inner cavity of the longitudinal slide, and the movable seat is slidably sleeved on the guide slide.

[0009] In order to improve the test efficiency, preferably, the temperature conduction component includes two groups of temperature conduction boxes, and the two groups of temperature conduction boxes are respectively fixed on both sides of the inner cavity of the detection box. A driven shaft is rotatably connected in the temperature conduction box, and a temperature conduction blade is fixedly connected to the driven shaft. One end of the driven shaft passes through the temperature conduction box and is rotatably connected to the inner wall of the detection box. A driving shaft is rotatably connected in the detection box, and a driving motor is fixedly connected to the outer wall of the detection box. The output shaft of the driving motor is fixedly connected to the end of the driving shaft, and the driving shaft and the driven shaft are connected through a pulley group.

[0010] Furthermore, a temperature conduction groove is provided in the movable seat, a temperature conduction pipe is fixedly connected to the bottom of the inner cavity of the positioning cylinder, the bottom end of the temperature conduction pipe passes through the bottom of the positioning cylinder, the bottom end of the positioning cylinder is connected to the inner cavity of the temperature conduction groove, the temperature conduction box is fixed on the side facing the positioning cylinder and is connected to the heat conduction pipe, the other end of the heat conduction pipe is connected to the inner cavity of the temperature conduction groove, and an air inlet groove is provided on the side of the temperature conduction box away from the positioning cylinder.

[0011] In order to improve the comprehensiveness of the test results, preferably, the vibration assembly includes two groups of vibration boxes, and the two groups of vibration boxes are respectively fixed on both sides of the test platform, a piston plate is slidably connected in the vibration box, a spring telescopic rod is fixedly connected to the inner wall of the piston plate, and a push-pull rod is rotated on the outer wall of the piston plate, and linkage rods are rotatably connected on both sides of the top of the test box, a worm gear is fixedly connected to the linkage rod, a worm is fixedly connected to the driving shaft, and the worm and the worm gear are meshed for transmission, the bottom end of the linkage rod is fixedly connected to a turntable, and the other end of the push-pull rod is rotatably connected to the bottom of the turntable.

[0012] In order to improve the stability of the circuit board with a surface-mounted crystal oscillator, preferably, an adsorption groove is opened inside the detection table, and multiple groups of adsorption holes are opened on the top of the adsorption groove. The side wall of the vibration box is fixed and connected to an air suction pipe, the other end of the air suction pipe is connected to the inner cavity of the adsorption groove, and a one-way valve is provided in the air suction pipe.

[0013] In order to improve the tightness of the circuit connection, preferably, an inflation groove is provided in the moving seat, the inflation groove is communicated with the inner cavity of the positioning cylinder, both sides of the positioning cylinder are fixedly connected and communicated with air guide pipes, the other ends of the air guide pipes are communicated with the inner cavity of the telescopic cylinder, an inflation pipe is fixedly connected and communicated between the two vibration boxes, the other end of the inflation pipe is communicated with the inflation groove, and a one-way valve is arranged in the inflation pipe.

[0014] In order to facilitate the removal of the circuit board with the surface-mounted crystal oscillator, preferably, a pressure discharge pipe is fixedly connected to the side wall of the moving seat, the pressure discharge pipe is communicated with the inner cavity of the inflation groove, and a solenoid valve is arranged in the pressure discharge pipe.

[0015] An automatic high and low temperature testing method for surface-mounted crystal oscillators is as follows:

[0016] Step 1: Place the circuit board with the surface-mounted crystal oscillator on the detection table;

[0017] Step 2: Connect the surface-mounted crystal oscillator to the detector;

[0018] Step 3: Change the test temperature in the detection box through the temperature control box;

[0019] Step 4: During the temperature change process, push the gas in the detection box to move towards the detection area of the detection table to achieve rapid temperature change;

[0020] Step 5: Apply a vibration effect to the detection table during the test;

[0021] Step 6: By observing the relevant data on the detector, obtain the test results of the surface-mounted crystal oscillator in high and low temperature environments, and then judge the quality of the surface-mounted crystal oscillator.

[0022] Compared with the prior art, the present invention provides an automatic high and low temperature testing device and method for surface-mounted crystal oscillators, which have the following beneficial effects:

[0023] 1. For this automatic high and low temperature testing device for surface-mounted crystal oscillators, through the rotation of the heat conduction blades, the gas around the output end of the temperature control box quickly moves towards the surface-mounted crystal oscillator, thereby accelerating the air flow heat exchange speed in the detection box, making the high temperature or low temperature effect more quickly transmitted to the surface-mounted crystal oscillator, and thus reducing the temperature adjustment time required and improving the test efficiency; and through the transmission effect, the spring telescopic rod is reciprocally pushed to collide with the side wall of the detection table, thereby generating a slight vibration effect, so as to simulate a more realistic use environment of the surface-mounted crystal oscillator, effectively evaluating the stability and reliability of the surface-mounted crystal oscillator working under such conditions, and improving the representativeness of the test results.

[0024] 2. The surface-mount crystal oscillator high and low temperature automatic testing device is provided with a longitudinal slide rail and a longitudinal slide plate, which facilitates the adjustment of the position of the positioning cylinder so that the power connection probe can contact the power connection end, improving the convenience of testing. And with the rebounding effect of the first spring and the second spring, the positioning pressure rod squeezes and fixes the surface-mount crystal oscillator, and makes the power connection probe closely fit with the power connection end, effectively avoiding the adverse impact of poor circuit contact on the test result and ensuring the accuracy of the detection result.

[0025] 3. The surface-mount crystal oscillator high and low temperature automatic testing device, through the reciprocating sliding of the piston plate in the vibration box, first makes the gas enter the positioning cylinder and the telescopic cylinder, so that the positioning pressure rod and the power connection probe are pushed downward, improving the squeezing and fixing effect on the surface-mount crystal oscillator and making the connection with the power connection end tighter, ensuring the test accuracy. Secondly, it can reduce the air pressure in the adsorption groove, so that the circuit board with the surface-mount crystal oscillator is adsorbed and fixed on the top of the detection table, further improving the stability of the surface-mount crystal oscillator during detection and ensuring the detection effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 is the overall front view structural schematic diagram of a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention;

[0027] Figure 2 is the internal structural schematic diagram of the detection box of a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention;

[0028] Figure 3 is the partial sectional structural schematic of the detection box of a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention Figure 1 ;

[0029] Figure 4 is a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention Figure 3 the enlarged structural schematic diagram of area A therein;

[0030] Figure 5 is a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention Figure 3 the enlarged structural schematic diagram of area B therein;

[0031] Figure 6 is the partial sectional structural schematic of the detection box of a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention Figure 2 ;

[0032] Figure 7 is a surface-mount crystal oscillator high and low temperature automatic testing device proposed by the present invention Figure 6 the enlarged structural schematic diagram of area C therein;

[0033] Figure 8Schematic diagram of the partial cross-section structure of the detection box of an automatic high and low temperature testing device for surface-mounted crystal oscillators proposed by the present invention Figure 3 。

[0034] In the figure: 1, temperature control box; 2, detection box; 21, detection table; 3, detector; 4, moving seat; 41, positioning cylinder; 411, positioning pressing plate; 412, first spring; 413, positioning pressing rod; 414, telescopic cylinder; 415, power connection probe; 416, second spring; 42, longitudinal slide rail; 421, longitudinal slide plate; 422, guiding slide rod; 5, heat conduction box; 51, driven shaft; 52, heat conduction blade; 53, driving shaft; 531, driving motor; 532, pulley group; 54, heat conduction groove; 541, heat conduction pipe; 542, heat conduction tube; 543, air inlet groove; 6, vibration box; 61, piston plate; 62, spring telescopic rod; 63, push-pull rod; 64, linkage rod; 641, worm gear; 642, worm; 643, turntable; 7, adsorption groove; 71, adsorption hole; 72, suction pipe; 73, inflation groove; 74, air guide pipe; 75, inflation pipe; 8, pressure discharge pipe. Detailed implementation manners

[0035] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments.

[0036] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention.

[0037] Embodiment 1:

[0038] Refer to Figures 1-8, A surface-mount crystal oscillator high and low temperature automatic testing device, including a temperature control box 1. The temperature control box 1 uses existing mature technologies to heat (high temperature) or cool (low temperature) the internal environment of the detection box 2, achieving automatic detection of high and low temperatures and improving the convenience of testing. The detection box 2 is fixed on the top of the temperature control box 1, and the detector 3 is fixed on the top of the detection box 2. The output end of the temperature control box 1 is communicated with the inner cavity of the detection box 2. A detection table 21 is fixedly connected to the bottom of the inner cavity of the detection box 2. It also includes: a moving seat 4, which is arranged in the detection box 2. Among them, a positioning cylinder 41 is fixedly connected to the bottom of the moving seat 4, and an adjusting part for adjusting the position of the moving seat 4 is arranged in the detection box 2; a heat conduction component, which is arranged in the detection box 2 and is used to quickly push the temperature transported from the temperature control box 1 into the detection box 2 to the detection area; a vibration component, which is arranged in the detection box 2 and is used to apply a vibration effect to the detection table 21 during the detection process.

[0039] Refer to Figures 3-6 , Among them, a positioning pressing plate 411 is slidably connected in the positioning cylinder 41. A first spring 412 is fixedly connected between the top of the positioning pressing plate 411 and the inner top of the positioning cylinder 41. A positioning pressing rod 413 is fixedly connected to the bottom of the positioning pressing plate 411. The positioning pressing rod 413 penetrates below the positioning cylinder 41. Two sets of telescopic cylinders 414 are rotatably connected to the outer wall of the positioning pressing rod 413. A power connection probe 415 is slidably connected in the telescopic cylinder 414. A second spring 416 is fixedly connected between the top end of the power connection probe 415 and the inner top of the telescopic cylinder 414; the adjusting part includes a longitudinal slide rail 42, a longitudinal slide plate 421 is slidably connected in the longitudinal slide rail 42, a guiding slide rod 422 is fixedly connected to the inner cavity of the longitudinal slide plate 421, and the moving seat 4 is slidably sleeved on the guiding slide rod 422.

[0040] Through the setting of the above structure, pull the moving seat 4 to slide it along the longitudinal slide rail 42 and the longitudinal slide plate 421, adjust the positioning cylinder 41 above the surface-mount crystal oscillator, and make the positioning pressing rod 413 contact the top of the surface-mount crystal oscillator, so as to achieve positioning before testing. Then rotate the power connection probes 415 on both sides to align them with the power connection ends on both sides of the surface-mount crystal oscillator, so as to place the surface-mount crystal oscillator in the test circuit communicated with the detector 3. And under the rebounding action of the first spring 412 and the second spring 416, the extrusion fixation of the surface-mount crystal oscillator is realized, and the power connection probes 415 are closely attached to the power connection ends, effectively avoiding the adverse impact on the test results caused by poor circuit contact and ensuring the accuracy of the detection results.

[0041] Refer to Figures 1-4, wherein the temperature conducting assembly includes two sets of temperature conducting boxes 5, which are respectively fixed on both sides of the inner cavity of the detection box 2, and a driven shaft 51 is rotatably connected in the temperature conducting box 5, and a temperature conducting blade 52 is fixedly connected to the driven shaft 51. One end of the driven shaft 51 passes through the temperature conducting box 5 and is rotatably connected to the inner wall of the detection box 2. A driving shaft 53 is rotatably connected in the detection box 2, and a driving motor 531 is fixedly connected to the outer wall of the detection box 2. The output shaft of the driving motor 531 is fixedly connected to the end of the driving shaft 53, and the driving shaft 53 is connected to the driven shaft. The shafts 51 are connected through a pulley set 532; a heat conduction groove 54 is provided in the movable seat 4, and a heat conduction pipe 541 is fixedly connected to the bottom of the inner cavity of the positioning cylinder 41. The bottom end of the heat conduction pipe 541 passes through the bottom of the positioning cylinder 41, and the bottom end of the positioning cylinder 41 is connected to the inner cavity of the heat conduction groove 54. The heat conduction box 5 is fixed to the side facing the positioning cylinder 41 and is connected to the heat conduction pipe 542. The other end of the heat conduction pipe 542 is connected to the inner cavity of the heat conduction groove 54, and an air inlet groove 543 is provided on the side of the heat conduction box 5 away from the positioning cylinder 41.

[0042] Through the arrangement of the above structure, the driving motor 531 is turned on to drive the driving shaft 53 to rotate. In the transmission action of the pulley group 532, the temperature conducting blade 52 will rotate in the temperature conducting box 5, thereby sucking the gas around the output end of the temperature control box 1 into the temperature conducting box 5, and transporting it to the temperature conducting groove 54 along the heat conducting pipe 542, and then transporting it to the surface mounted crystal oscillator by the heat conducting pipe 541, thereby accelerating the heat exchange speed of the airflow in the detection box 2, so that the high temperature or low temperature effect is transmitted to the surface mounted crystal oscillator more quickly, thereby reducing the time required for temperature adjustment and improving the test efficiency.

[0043] Reference Figure 2 、 Figure 6 and Figure 7 , wherein, the vibration assembly includes two groups of vibration boxes 6, which are respectively fixed on both sides of the detection platform 21, a piston plate 61 is slidably connected in the vibration box 6, a spring telescopic rod 62 is fixedly connected to the inner side wall of the piston plate 61, and a push-pull rod 63 is rotated on the outer side wall of the piston plate 61, and a linkage rod 64 is rotatably connected on both sides of the top of the detection box 2, a worm gear 641 is fixedly connected to the linkage rod 64, a worm 642 is fixedly connected to the driving shaft 53, and the worm 642 and the worm gear 641 are engaged for transmission, the bottom end of the linkage rod 64 is fixedly connected to the turntable 643, and the other end of the push-pull rod 63 is rotatably connected to the bottom of the turntable 643.

[0044] With the above structure set, during the rotation of the driving shaft 53, due to the meshing drive between the worm 642 and the worm wheel 641, the linkage rod 64 and the turntable 643 will be driven to rotate. At this time, the turntable 643 will drive the push-pull rod 63 to repeatedly push and pull the piston plate 61. When the piston plate 61 moves towards the side wall of the detection table 21, the spring telescopic rod 62 will hit the side wall of the detection table 21, thereby generating a slight vibration effect on the detection table 21, and then simulating a more realistic usage environment for the surface-mounted crystal oscillator, effectively evaluating the stability and reliability of the surface-mounted crystal oscillator when working under such conditions, and improving the representativeness of the test results.

[0045] Refer to Figures 3-8 , wherein, an adsorption groove 7 is formed inside the detection table 21, and a plurality of adsorption holes 71 are formed at the top of the adsorption groove 7. The side wall of the vibration box 6 is fixedly connected and communicated with an air suction pipe 72, and the other end of the air suction pipe 72 is connected and communicated with the inner cavity of the adsorption groove 7, and a one-way valve is arranged in the air suction pipe 72; an air inflation groove 73 is formed inside the moving seat 4, the air inflation groove 73 is connected and communicated with the inner cavity of the positioning cylinder 41, and two sides of the positioning cylinder 41 are fixedly connected and communicated with an air guide pipe 74, and the other end of the air guide pipe 74 is connected and communicated with the inner cavity of the telescopic cylinder 414. An air inflation pipe 75 is fixedly connected and communicated between the two vibration boxes 6, and the other end of the air inflation pipe 75 is connected and communicated with the air inflation groove 73, and a one-way valve is arranged in the air inflation pipe 75.

[0046] It should be noted that the one-way valve in the air suction pipe 72 only allows the gas in the adsorption groove 7 to enter the vibration box 6; the one-way valve in the air inflation pipe 75 only allows the gas in the vibration box 6 to enter the positioning cylinder 41 and the telescopic cylinder 414.

[0047] With the above structure set, when the piston plate 61 slides towards the side of the detection table 21, the piston plate 61 will compress the gas in the vibration box 6 and open the one-way valve in the air inflation pipe 75, so that the gas enters the air inflation groove 73 along the air inflation pipe 75, and then enters the positioning cylinder 41 from the air inflation groove 73 respectively. And a part of the gas entering the positioning cylinder 41 will enter the telescopic cylinder 414 along the air guide pipe 74. Thus, under the action of the increased air pressure, the positioning pressure rod 413 and the electrical connection probe 415 will be pushed downward, thereby improving the extrusion and fixing effect on the surface-mounted crystal oscillator and making the electrical connection probe 415 fit more closely with the electrical connection end, effectively improving the test accuracy; subsequently, when the push-pull rod 63 drives the piston plate 61 to slide back to its original position, a suction force will be generated in the vibration box 6, thereby opening the one-way valve in the air suction pipe 72, so that the gas in the adsorption groove 7 is sucked out. Thus, the air pressure in the adsorption groove 7 is reduced, and the circuit board with the surface-mounted crystal oscillator is adsorbed and fixed on the top of the detection table 21. In this way, combined with the downward pressing effect of the positioning pressure rod 413, the stability of the surface-mounted crystal oscillator during detection is further improved, ensuring the detection effect.

[0048] Refer to Figure 8, wherein, a pressure discharge pipe 8 is fixedly connected to the side wall of the moving seat 4, the pressure discharge pipe 8 is communicated with the inner cavity of the inflation groove 73, and a solenoid valve is arranged in the pressure discharge pipe 8; through the solenoid valve in the pressure discharge pipe 8, the airflow continuously charged into the inflation groove 73 can be discharged, the high-pressure effect in the inflation groove 73 is relieved, so as to take out the surface mount crystal oscillator.

[0049] Embodiment 2:

[0050] Referring to Figures 1-8 , which is basically the same as Embodiment 1. On the basis of Embodiment 1, an automatic high and low temperature test method for surface mount crystal oscillators is proposed, and the steps are as follows:

[0051] Step 1: Place the circuit board equipped with the surface mount crystal oscillator on the detection table 21;

[0052] Step 2: Connect the surface mount crystal oscillator to the detector 3;

[0053] Step 3: Change the test temperature in the detection box 2 through the temperature control box 1;

[0054] Step 4: During the temperature change process, push the gas in the detection box 2 to move towards the detection area of the detection table 21 to achieve rapid temperature change;

[0055] Step 5: Apply a slight vibration effect to the detection table 21 during the test;

[0056] Step 6: By observing the relevant data on the detector 3, obtain the test results of the surface mount crystal oscillator in high and low temperature environments, and then judge the quality of the surface mount crystal oscillator.

[0057] Referring to Figures 1-8 , in the present invention, when in use, first place the circuit board equipped with the surface mount crystal oscillator on the detection table 21, then pull the moving seat 4 to slide it along the longitudinal slide rail 42 and the longitudinal slide plate 421, adjust the positioning cylinder 41 above the surface mount crystal oscillator, and make the positioning pressure rod 413 abut against the top of the surface mount crystal oscillator, so as to achieve positioning before the test. Subsequently, rotate the power connection probes 415 on both sides to align them with the power connection ends on both sides of the surface mount crystal oscillator, so as to place the surface mount crystal oscillator in the test circuit communicated with the detector 3. And under the resilience of the first spring 412 and the second spring 416, the extrusion fixation of the surface mount crystal oscillator is realized, and the power connection probes 415 are in close fit with the power connection ends, effectively avoiding the adverse impact on the test results caused by poor circuit contact, and ensuring the accuracy of the detection results.

[0058] Subsequently, the detection box 2 is closed, and the internal environment of the detection box 2 is heated (high temperature) or cooled (low temperature) by the temperature control box 1, achieving automated high and low temperature detection and improving the convenience of testing. At the same time, the driving motor 531 is started to drive the rotation of the main shaft 53. Under the transmission of the pulley group 532, the heat conduction blades 52 will rotate in the heat conduction box 5, thereby sucking the gas around the output end of the temperature control box 1 into the heat conduction box 5, transporting it along the heat conduction pipe 542 to the heat conduction groove 54, and then through the heat conduction pipe 541 to the periphery of the surface-mounted crystal oscillator, thereby accelerating the air flow heat exchange speed in the detection box 2, enabling the high or low temperature effect to be transferred to the surface-mounted crystal oscillator more quickly, reducing the temperature adjustment time required, and improving the test efficiency;

[0059] In addition, during the rotation of the main shaft 53, due to the meshing transmission between the worm 642 and the worm gear 641, the linkage rod 64 and the turntable 643 will be driven to rotate. At this time, the turntable 643 will drive the push-pull rod 63 to repeatedly push and pull the piston plate 61. When the piston plate 61 moves towards the side wall of the detection table 21, the spring telescopic rod 62 will hit the side wall of the detection table 21, thereby generating a slight vibration effect on the detection table 21, and then simulating a more realistic use environment for the surface-mounted crystal oscillator, effectively evaluating the stability and reliability of the surface-mounted crystal oscillator under such conditions, and improving the representativeness of the test results; and during this process, the piston plate 61 will compress the gas in the vibration box 6 and open the one-way valve in the air charging pipe 75, so that the gas enters the air charging groove 73 along the air charging pipe 75, and then enters the positioning cylinder 41 from the air charging groove 73 respectively. And a part of the gas entering the positioning cylinder 41 will enter the telescopic cylinder 414 along the air guide pipe 74. Thus, under the increasing air pressure, the positioning pressure rod 413 and the electrical connection probe 415 will be pushed downward, thereby improving the extrusion and fixing effect on the surface-mounted crystal oscillator and making the electrical connection probe 415 fit more closely with the electrical connection end, effectively improving the test accuracy; Subsequently, when the push-pull rod 63 drives the piston plate 61 to slide back to its original position, a suction effect will be generated in the vibration box 6, thereby opening the one-way valve in the air suction pipe 72, so that the gas in the adsorption groove 7 is sucked out, thus reducing the air pressure in the adsorption groove 7, and making the circuit board with the surface-mounted crystal oscillator adsorbed and fixed on the top of the detection table 21. In this way, combined with the downward pressing effect of the positioning pressure rod 413, the stability of the surface-mounted crystal oscillator during detection is further improved, ensuring the detection effect.

[0060] The above is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, according to the technical solution and inventive concept of the present invention, makes equivalent substitutions or changes, and should be covered by the protection scope of the present invention.

Claims

1. An automatic high and low temperature testing device for surface-mounted crystal oscillators, comprising a temperature control box (1), a detection box (2) fixed on the top of the temperature control box (1), and a detector (3) fixed on the top of the detection box (2), characterized in that, The bottom of the inner cavity of the detection box (2) is fixedly connected to a detection table (21), and further comprises: A movable seat (4), wherein the movable seat (4) is arranged in the detection box (2), The bottom of the movable seat (4) is fixedly connected to a positioning cylinder (41), and an adjusting portion for adjusting the position of the movable seat (4) is provided in the detection box (2); A temperature conducting component, the temperature conducting component being arranged in the detection box (2), and being used for quickly pushing the temperature conveyed from the temperature control box (1) to the detection box (2) to the detection area; A vibration component is provided in the detection box (2), and is used to apply a vibration effect to the detection table (21) during the detection process.

2. The automatic high and low temperature testing device for surface mount crystal oscillators according to claim 1, characterized in that, A positioning pressure plate (411) is slidably connected inside the positioning cylinder (41), a first spring (412) is fixedly connected between the top of the positioning pressure plate (411) and the top inside the positioning cylinder (41), a positioning pressure rod (413) is fixedly connected to the bottom of the positioning pressure plate (411), the positioning pressure rod (413) passes through the bottom of the positioning cylinder (41), two groups of telescopic cylinders (414) are rotatably connected on the outer wall of the positioning pressure rod (413), an electrical probe (415) is slidably connected inside the telescopic cylinder (414), and a second spring (416) is fixedly connected between the top of the electrical probe (415) and the top inside the telescopic cylinder (414).

3. The automatic high and low temperature testing device for surface-mounted crystal oscillators according to claim 1, characterized in that The adjusting portion comprises a longitudinal slide rail (42), a longitudinal slide plate (421) is slidably connected to the longitudinal slide rail (42), a guide slide bar (422) is fixedly connected to the inner cavity of the longitudinal slide bar (421), and the movable seat (4) is slidably sleeved on the guide slide bar (422).

4. The automatic high and low temperature testing device for surface mount crystal oscillators according to claim 2, wherein, The heat conduction assembly comprises two groups of heat conduction boxes (5), the two groups of heat conduction boxes (5) are respectively fixed on both sides of the inner cavity of the detection box (2), a driven shaft (51) is rotatably connected in the heat conduction box (5), a heat conduction blade (52) is fixedly connected to the driven shaft (51), one end of the driven shaft (51) passes through the heat conduction box (5) and is rotatably connected to the inner wall of the detection box (2), a driving shaft (53) is rotatably connected in the detection box (2), a driving motor (531) is fixedly connected to the outer wall of the detection box (2), an output shaft of the driving motor (531) is fixedly connected to the end of the driving shaft (53), and the driving shaft (53) and the driven shaft (51) are connected by a pulley group (532).

5. An automatic high and low temperature testing device for surface-mounted crystal oscillators according to claim 4, characterized in that A heat conducting groove (54) is provided in the movable seat (4); a heat conducting pipe (541) is fixedly connected to the bottom of the inner cavity of the positioning cylinder (41); the bottom end of the heat conducting pipe (541) passes through the bottom of the positioning cylinder (41); the bottom end of the positioning cylinder (41) is communicated with the inner cavity of the heat conducting groove (54); the heat conducting box (5) is fixed on one side facing the positioning cylinder (41) and is communicated with a heat conducting pipe (542); the other end of the heat conducting pipe (542) is communicated with the inner cavity of the heat conducting groove (54); and an air inlet groove (543) is provided on the side of the heat conducting box (5) away from the positioning cylinder (41).

6. The automatic high and low temperature testing device for surface mount crystal oscillators according to claim 4, wherein, The vibration assembly includes two vibration boxes (6), and the two vibration boxes (6) are respectively fixed on both sides of the detection table (21). A piston plate (61) is slidably connected in the vibration box (6). A spring telescopic rod (62) is fixedly connected to the inner side wall of the piston plate (61). A push-pull rod (63) is rotatably connected to the outer side wall of the piston plate (61). Linkage rods (64) are rotatably connected to both sides of the top of the detection box (2). A worm gear (641) is fixedly connected to the linkage rod (64). A worm (642) is fixedly connected to the driving shaft (53). The worm (642) and the worm gear (641) are meshed and driven. A turntable (643) is fixedly connected to the bottom end of the linkage rod (64). The other end of the push-pull rod (63) is rotatably connected to the bottom of the turntable (643).

7. An automatic high and low temperature testing device for surface mount crystal oscillators according to claim 6, characterized in that An adsorption groove (7) is formed inside the detection table (21). A plurality of adsorption holes (71) are formed at the top of the adsorption groove (7). An air suction pipe (72) is fixedly connected and communicated with the side wall of the vibration box (6). The other end of the air suction pipe (72) is communicated with the inner cavity of the adsorption groove (7), and a one-way valve is arranged in the air suction pipe (72).

8. The automatic high and low temperature testing device for surface mount crystal oscillators according to claim 6, characterized in that, An air inflation groove (73) is formed inside the moving seat (4). The air inflation groove (73) is communicated with the inner cavity of the positioning cylinder (41). Air guide pipes (74) are fixedly connected and communicated with both sides of the positioning cylinder (41). The other ends of the air guide pipes (74) are communicated with the inner cavity of the telescopic cylinder (414). An air inflation pipe (75) is fixedly connected and communicated between the two vibration boxes (6). The other end of the air inflation pipe (75) is connected to the air inflation groove (73), and a one-way valve is arranged in the air inflation pipe (75).

9. The automatic high and low temperature testing device for surface mount crystal oscillators according to claim 1, wherein A pressure discharge pipe (8) is fixedly connected to the side wall of the moving seat (4). The pressure discharge pipe (8) is communicated with the inner cavity of the air inflation groove (73), and an electromagnetic valve is arranged in the pressure discharge pipe (8).

10. An automated high and low temperature testing method for surface mount crystal oscillators, using an automated high and low temperature testing device for surface mount crystal oscillators as described in any one of claims 1-9, characterized in that, The steps are as follows: Step 1: Place the circuit board with the surface-mounted crystal oscillator on the detection table (21); Step 2: Connect the surface-mounted crystal oscillator to the detector (3); Step 3: Change the test temperature inside the detection box (2) through the temperature control box (1); Step 4: During the temperature change process, push the gas inside the detection box (2) to move towards the detection area of the detection table (21) to achieve rapid temperature change; Step 5: Apply a vibration effect to the detection table (21) during the test; Step 6: Observe the relevant data on the detector (3) to obtain the test results of the surface-mounted crystal oscillator in high and low temperature environments, and then judge the quality of the surface-mounted crystal oscillator.

Citation Information

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