Electronic load aging test cabinet

Abstract

The invention relates to the technical field of electrical performance testing, and discloses an electronic load aging test cabinet which comprises an aging cabinet body, the aging cabinet body comprises an aging cavity and a control cabinet, and the aging cavity is internally provided with a storage plate and a jack socket; the storage plate is of a cavity structure provided with a plurality of air holes. The cavity structure comprises an exhaust cavity and an air inlet cavity; the temperature control gas cabin is used for introducing constant-temperature gas into the gas inlet cavity, and the gas return cabin is used for sucking back gas in the exhaust cavity; a sealing ring and a floating plug are arranged on the air hole; the sealing ring is used for sealing communication between the air hole and the exhaust cavity and can move to open communication between the air hole and the exhaust cavity, and an elastic assembly used for rebounding and resetting is arranged on the sealing ring; the floating plug is used for placing equipment to be aged, the floating plug can be pressed to move to control the movement of the sealing ring, and the temperature control cabinet has the advantages that accurate temperature control can be carried out, the problem of heat circulation of electronic components in an aging test is solved, and the situation that extra heat generated inside circulates in the aging cabinet for a long time and influences a constant-temperature environment is avoided.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical performance testing, and particularly to an electronic load aging test cabinet. Background Art

[0002] Aging test is an important reliability test link in electronic products. It simulates the environmental changes that electronic products are subjected to during long-term use to evaluate the quality and reliability of products. In the aging test, constant temperature control can simulate the temperature environment in which products are stored and operated, and verify whether the effects suffered by the products after being exposed to this environment for a period of time are within an acceptable range. Through constant temperature aging test, it can be ensured that the products to be detected are in the same temperature environment conditions, so as to more accurately evaluate their performance under various extreme conditions.

[0003] The electronic load aging test cabinet for aging test integrates a temperature control system and an adjustable electronic load system, and can simultaneously test dozens of devices to be aged, such as switching power supplies; in the aging test cabinet, the air inlet and outlet of its temperature control system are arranged at positions such as the side wall and the top wall of the aging cabinet. When the cabinet of the aging cabinet is small, such as a small aging cabinet with a low height and a narrow width, the circulating air system on the side wall can meet the aging constant temperature requirements of the corresponding electronic components. However, for industrial large-scale aging requirements, large cabinets are often used, and dozens or more components to be aged are simultaneously subjected to aging test. At this time, there is a certain distance between the air inlet and outlet of the circulating air, so that the heat of the electronic devices on the way is easily accumulated during the circulation process of the hot air before being discharged, and an accurate constant temperature environment cannot be maintained.

[0004] In summary, there is an urgent need for an electronic load aging test cabinet that can perform relatively accurate temperature control, solve the problems of heat circulation of electronic components and inability to be discharged in time during the aging test, and prevent the additional heat generated by the components to be tested inside the aging cabinet from gradually increasing the temperature on the moving path as the circulating air moves inside the aging cabinet, affecting the constant temperature environment of the aging test. Summary of the Invention

[0005] In view of the constant temperature control problems existing in the prior art, an electronic load aging test cabinet is proposed, which can perform relatively accurate temperature control, solve the problems of heat circulation of electronic components and inability to be discharged in time during the aging test, and prevent the additional heat generated by the components to be tested inside the aging cabinet from gradually increasing the temperature on the moving path as the circulating air moves inside the aging cabinet, affecting the constant temperature environment of the aging test.

[0006] To solve the above problems, the technical solution of the present invention is as follows:

[0007] An electronic load aging test cabinet, comprising an aging cabinet body, the aging cabinet body includes an aging chamber and a control cabinet, a storage board and a socket are arranged in the aging chamber, and the socket is electrically connected to the control cabinet; the storage board is of a cavity structure, and a plurality of air holes are arranged thereon, and the air holes penetrate through the storage board; the cavity structure of the storage board includes an exhaust cavity and an intake cavity; the intake cavity is communicated with a temperature control air chamber, and the temperature control air chamber is used for introducing a constant temperature gas into the intake cavity, the exhaust cavity is communicated with a return air chamber, and the return air chamber is used for sucking back the gas in the exhaust cavity; a sealing ring and a floating plug are arranged on the air hole; the sealing ring is used for sealing the communication between the air hole and the exhaust cavity and the sealing ring can movably open the communication between the air hole and the exhaust cavity, the floating plug is used for controlling the movement of the floating plug, and an elastic component for rebounding and resetting is arranged on the sealing ring; the floating plug is used for placing the device to be aged, and the floating plug can move under pressure.

[0008] As a preferred technical solution, the sealing ring is a cylindrical body with a through hole, and an outer edge is arranged thereon, and the outer edge is elastically connected to the cavity of the exhaust cavity through the elastic component.

[0009] As a preferred technical solution, the height of the sealing ring is less than the height of the intake cavity.

[0010] As a preferred technical solution, the floating plug includes a wind limiting column, a support column and a pressure plate; the wind limiting column is elastically connected to the cavity of the intake cavity; the pressure plate is arranged on the wind limiting column, and the pressure plate is adapted to the diameter of the sealing ring; the support column is arranged on the pressure plate.

[0011] As a preferred technical solution, there is a gap between the wind limiting column and the inner wall of the air hole.

[0012] As a preferred technical solution, the pressure plate is of a disc structure.

[0013] As a preferred technical solution, the intake cavity is communicated with the temperature control air chamber through a plurality of air pipes.

[0014] As a preferred technical solution, a temperature control electric valve is arranged on the air pipe.

[0015] As a preferred technical solution, the exhaust cavity is communicated with the return air chamber through a plurality of air outlet pipes.

[0016] As a preferred technical solution, the return air chamber is communicated with the temperature control air chamber.

[0017] The beneficial effects of the present invention:

[0018] 1. In the electronic load aging test cabinet of the present invention, the aging body includes an aging chamber and a control cabinet. The control cabinet is used to provide an electronic load and test control. The aging chamber can accommodate objects to be aged and provide a sealed and controllable test environment for the objects to be aged. Inside the aging chamber, there are object placement plates for placing a number of objects to be aged and a number of socket-outlets electrically connected to the control cabinet, which can provide aging tests for multiple devices to be aged simultaneously. In the present invention, the interior of the object placement plate has a cavity structure divided into an exhaust cavity and an intake cavity. There are also through air holes on the object placement plate. The constant-temperature air in the temperature control air chamber can enter the aging chamber relatively evenly along the air holes on the intake cavity, and the gas in the aging chamber can also be discharged from the exhaust cavity through the air holes at the bottom of the device to be aged, greatly reducing the gradient change of the temperature in the aging chamber. Compared with the limited inlet and outlet settings in the prior art, a more precise constant-temperature control environment is provided. And the opening and closing of the air outlet can be achieved through the cooperation of the sealing ring and the floating plug on the air hole.

[0019] 2. In the electronic load aging test cabinet of the present invention, the height of the sealing ring is less than the height of the intake cavity, so that after the sealing ring moves down, it will not affect the air output volume of the air holes in the lower layer of the object placement plate.

[0020] 3. In the electronic load aging test cabinet of the present invention, the floating plug includes a wind-limiting column, a support column, and a pressure plate. The wind-limiting column is elastically connected to the cavity of the intake cavity, and after the device to be aged is taken away after the test, the floating plug can be reset. The pressure plate is provided on the wind-limiting column, and the diameter of the pressure plate is adapted to that of the sealing ring, and it can drive the sealing ring to move down together to open the air outlet channel during the downward movement. The support column is provided on the pressure plate, which can not only provide space for downward movement but also keep the bottom of the device to be aged in a relatively suspended state after the downward movement is completed, preventing the accumulation of heat generated at the bottom.

[0021] 4. In the electronic load aging test of the present invention, there is a gap between the wind-limiting column and the inner wall of the air hole. This gap can allow gas to flow through and relatively reduce the gas flow rate of the upper air holes near the heat source area.

[0022] 5. In the electronic load aging test of the present invention, the pressure plate is a disc structure. When the pressure plate is combined with the sealing ring, it can completely seal the air hole connecting the intake cavity and the aging chamber here, avoiding the direct entry of the gas in the intake cavity into the exhaust cavity and causing waste of energy.

[0023] 6. In the electronic load aging test of the present invention, the intake cavity is communicated with the temperature control air chamber through a number of air pipes, and the exhaust cavity is communicated with the return air chamber through a number of outlet pipes, which can reduce the travel of the gas flow during gas circulation and avoid the long-term flow of the gas with temperature change in the aging chamber, affecting the stability of constant temperature. Description of the Drawings

[0024] Figure 1 Schematic three-dimensional view of the electronic load aging test cabinet according to the present invention;

[0025] Figure 2 Partial cross-sectional view of the placement board of the electronic load aging test cabinet according to the present invention;

[0026] Figure 3 Schematic view of the socketing fit between the sealing ring and the floating plug of the electronic load aging test cabinet according to the present invention;

[0027] Figure 4 Schematic views of the sealing rings and floating plugs in different states on the placement board of the electronic load aging test cabinet according to the present invention:

[0028] The reference numerals and components involved in the drawings are as follows:

[0029] 1. Aging cabinet body; 2. Placement board; 3. Temperature control air chamber; 4. Sealing ring; 5. Floating plug; 6. Return air chamber; 11. Aging chamber; 12. Socket and plug; 13. Control cabinet; 21. Air holes; 22. Exhaust cavity; 23. Intake cavity; 31. Air conveying pipe; 41. Outer edge; 42. Elastic component; 51. Wind limiting column; 52. Support column; 53. Elastic plate; 54. Pressure plate; 61. Air outlet pipe. Detailed implementation manners

[0030] In order to make the above objects, features and advantages of the present invention more obvious and understandable, the following will describe the detailed implementation manners of the present invention in conjunction with the drawings of the specification. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0031] To better understand an electronic load aging test cabinet provided in this embodiment, the following first briefly introduces the existing aging test cabinets. The existing aging test cabinets include a test area for placing devices to be aged, such as switching power supplies, and a load area for providing load connections for the devices to be aged. The so-called load area refers to electronic load devices and connectors distributed on the inner wall of the cabinet. The so-called test area refers to the storage space inside the cabinet. The cabinet usually has several layers, and each layer can place multiple devices to be aged. Air inlets are provided on the inner walls on both sides of the test area to control the temperature inside the test area through a temperature control system. When the temperature sensor detects a temperature drop, it will input air at an appropriate temperature into the cabinet through the air inlets to increase the temperature inside the cabinet. When it detects a temperature rise, it will discharge the high-temperature gas inside the cabinet through the air outlet, which is usually located at the top of the cabinet. During the load test, the test voltage should be more than 1.2 times the rated voltage, the test current should be more than 1.5 times the rated current, and the test temperature should be more than 1.2 times the product operating temperature. Therefore, in the cabinet, a large number of devices to be aged operate simultaneously, and they are more likely to generate a large amount of heat by themselves, greatly increasing the difficulty of constant temperature control. The original aging environment already exceeds the normal working environment of the devices to be aged. If precise constant temperature cannot be maintained, it is easy to increase the failure rate of the devices to be aged. Obviously, in order to continuously maintain a constant temperature in the existing aging test cabinets, generally, the air inlet and the air outlet work continuously at the same time to maintain a dynamic balance. However, limited by the positions of the air outlet and the air inlet, the air flow direction and speed at the positions of each device to be aged are inconsistent, and the heat generated by the devices to be aged far from the air outlet will pass through other devices being tested, forming a concentration of high temperature. Therefore, a stable constant temperature environment cannot be provided.

[0032] Please refer to the attached Figure 1 , Figure 1 FIG. is a three-dimensional schematic diagram of the electronic load aging test cabinet of the present invention; to solve the above problems, the present invention provides an electronic load aging test cabinet, including an aging cabinet body 1. Preferably, in order to facilitate movement, casters can be provided at the bottom of the aging cabinet body 1, which are not shown in the prior art figure. In this embodiment, the aging cabinet body 1 is provided with a double-opening transparent door for closing the aging chamber 11 inside the aging cabinet body 1. The aging chamber 11 is surrounded by a larger chamber wall and four other chamber walls. A plurality of socket connectors 12 for plugging in connection wire harnesses are arranged on that larger chamber wall. The sockets are electrically connected to the electronic loads provided in the control cabinet 13 at the top of the aging cabinet. In some embodiments, the control cabinet 13 can be a vertical cabinet provided on the side of the aging cabinet. The control cabinet 13 and the control system therein are prior art.

[0033] In this embodiment, there are five placement plates 2 provided in the aging chamber 11. Preferably, the number of layers of the placement plates 2 can be 4 layers, 6 layers, etc. The placement plates 2 are used for placing the devices to be aged. In this embodiment, taking the aging of a switching power supply as an example, a number of switching power supplies can be placed side by side on the placement plates 2, and each switching power supply corresponds to a socket.

[0034] Please refer to the attached Figure 2 , Figure 2 which is a partial sectional view of the placement plate of the electronic load aging test cabinet according to the present invention. The attached Figure 2 figure is intended to show the cooperation between the placement plate 2, the air holes 21 thereon, and the sealing ring 4 and the floating plug 5; in the electronic load aging test cabinet according to the present invention, the placement plate 2 is a cavity structure, and a number of through air holes 21 are provided on the top and bottom surfaces. The switching power supplies are placed on the top surface. In this embodiment, a temperature control air chamber 3 is provided at the rear of the aging cabinet. The hot air in the temperature control air chamber 3 is input into the intake cavity 23 of the placement plate 2 through the air delivery pipe 31, and then enters the aging chamber 11 through the air holes 21 of the placement plate 2. Preferably, a number of air delivery pipes 31 are connected to the side walls of each placement plate 2, so that the hot air in the temperature control air chamber 3 can enter different areas inside the placement plate 2 at the same time. At the same time, the presence of the air holes 21 reduces the contact area between the placement plate 2 and the switching power supply, and can effectively prevent the accumulation of heat generated at the bottom of the device to be aged. The heat diffuses to other areas through the air holes 21, making the environmental temperature of the aging test more stable and accurate.

[0035] In order to solve the problem that in the air circulation, the heat generated by some switching power supplies will first pass through other devices under test with the circulating air and then be discharged, in the electronic load aging test cabinet according to the present invention, the circulating air is discharged from the area where the device to be aged is located, so that the heat generated by the switching power supply itself, for example, will be timely extracted and will not spread to other areas in the aging chamber 11, avoiding the heating of the environment in other areas by these uncontrollable heat sources and affecting the test results.

[0036] Specifically, the cavity of the storage board 2 is divided into two layers. The upper exhaust cavity 22 is used for exhausting gas, that is, the gas in the aging cavity 11 can be sent out of the aging cavity 11 through the exhaust cavity 22. The lower intake cavity 23 is used for intake. The gas input by the air delivery pipe 31 is input into the intake cavity 23. The gas in the intake cavity 23 can enter the aging cavity 11 through the air holes 21 on the upper and lower surfaces respectively, and the air holes 21 leading to the aging cavity 11 are in an always-open state in the initial state. In this embodiment, the gas entering the exhaust cavity 22 also enters through the air holes 21, but a sealing ring 4 is provided at the interface between the air holes 21 and the exhaust cavity 22. The sealing ring 4 is movably fixed in the exhaust cavity 22 through an elastic component 42. The sealing ring 4 can be pressed downwards to connect the exhaust cavity 22 with the air holes 21. When the pressure disappears, the sealing ring 4 rebounds to close the connection between the air holes 21 and the exhaust cavity 22 again. Specifically, the sealing ring 4 is a through-cylindrical body, that is, a ring-shaped columnar structure with openings at both ends and hollow inside. An outer edge 41 is provided on the outer circle of the through-cylindrical body and a spring is clamped. The spring is clamped between the hollow cylinder and the lower wall surface of the exhaust cavity 22. At the same time, the outer edge 41 can provide a limit to prevent the sealing ring 4 from completely popping out and detaching from the air holes 21. It should be understood that the sealing ring 4 closing the exhaust passage can save energy and reduce unnecessary heat consumption.

[0037] Please refer to the appendix Figure 3 , Figure 3 which is a schematic diagram of the socketing and matching of the sealing ring and the floating plug of the electronic load aging test cabinet described in the present invention. The appendix Figure 3It is intended to show the structures of the closed ring 4 and the floating plug 5; in order to cooperate with the closed ring 4 to realize the controlled opening and closing of the exhaust passage, floating plugs 5 are provided on each air hole 21 of the placement plate 2. The floating plug 5 includes a wind limiting column 51, a support column 52, an elastic plate 53, and a pressure plate 54. The elastic plate 53 and the pressure plate 54 are arranged on the wind limiting column 51, and the support column 52 is provided on the pressure plate 54. The elastic plate 53 is located in the intake cavity 23 and is supported on the lower wall surface of the intake cavity 23 by a spring. The pressure plate 54 is located in the aging cavity 11 on the air hole 21, and the pressure plate 54 is of a disc structure, and its outer diameter is adapted to the wall diameter of the closed ring 4. That is, when the spring is compressed, the floating plug 5 moves downward, the pressure plate 54 contacts the closed ring 4 and blocks the opening of the closed ring 4. That is, at this time, the air hole 21 of the intake passage communicating with this area is closed and the floating plug 5 drives the closed ring 4 to continue to move downward to open the passage between the air hole 21 and the exhaust cavity 22. In this embodiment, the wind limiting column 51 is of an inverted frustum structure with a smaller diameter at the lower end. In the initial state, at least a part of the wind limiting column 51 is located in the air hole 21 on the upper layer of the placement plate 2. The support column 52 is of a regular frustum structure with a smaller diameter at the upper end surface, reducing the contact area with the device to be aged. In some other embodiments, both the wind limiting column 51 and the support column 52 are of a cylindrical structure. It should be understood that the diameters of the wind limiting column 51 and the support column 52 are smaller than the diameter of the middle cavity of the closed ring 4, that is, there is a gap between the wind limiting column 51 and the inner wall of the air hole 21.

[0038] It should be noted that: in this embodiment, the pressure plate 54 is of a circular plate structure and can completely block the opening of the closed ring 4. On this basis, in order to keep the pressure plate 54 and the closed ring 4 coaxial and not deviate, so that the pressure plate 54 can stably block the opening of the closed ring 4 during the downward movement, as Figure 4 shown, a support rod that can slide up and down along the inner wall of the closed ring 4 is provided on the wind limiting column 51. It should be understood that when the pressure plate 54 cannot completely block the opening of the closed ring 4 and can only drive the closed ring 4 to move downward, an air outlet passage through the bottom of the switching power supply can still be constructed, but a part of the gas will directly enter the exhaust cavity 22 from the intake cavity 23, which will greatly reduce the air outlet efficiency.

[0039] Please refer to the attached Figure 4 , Figure 4 For the schematic diagrams of the closed ring and the floating plug in different states on the placement plate of the electronic load aging test cabinet described in the present invention, the corresponding spring and other rebounding structures are not shown in the figure. The attached Figure 4It is intended to show the floating plug 5 and the sealing ring 4 in the pressed-down state and the initial state, and the intake direction of part of the air is shown by the dotted arrow, and the outlet direction of part of the air is shown by the solid arrow; it should be understood that the air-limiting column 51 is stuck at the air holes 21 in the upper layer, reducing the amount of constant-temperature air entering from above the storage plate 2 relative to the air holes 21 at the bottom of the storage plate 2. It can solve the heating problem of the heat source concentration area in the aging chamber 11 by reducing the introduction of high-temperature gas. The constant-temperature gas is introduced from a position far from the heat source, reducing the risk of being heated; in the constant-temperature aging test, only the area where the equipment to be aged is located will open the connection with the exhaust cavity 22, which not only quickly takes away the heat of the heat source itself but also reduces the energy loss in the area without the test object; the support column 52 facilitates the heat dissipation at the bottom of the aging equipment. When a group of support columns 52 decrease in height under the pressure of the aging equipment waiting for the switch power supply, the support columns 52 that do not decrease in height around the switch power supply can provide a clamping and limiting function for the aging equipment waiting for the switch power supply.

[0040] In the constant-temperature air circulation with constant-temperature control, similar to the gas delivery pipe 31, there are several air outlet pipes 61 connected to the exhaust cavity. Each air outlet pipe 61 is connected to the air return chamber 6. Preferably, the air return chamber 6 is connected to the temperature control air chamber 3. In some preferred embodiments, the air return chamber 6 is connected to the temperature control air chamber 3, and the gas coming out of the aging chamber 11 returns to the temperature control air chamber 3, reducing the energy consumed for heating the air and forming a complete cycle.

[0041] Furthermore, in order to achieve precise control of the constant temperature in the aging chamber 11, the electronic load aging test cabinet of the present invention is also provided with several temperature sensors. Preferably, each gas delivery pipe 31 is provided with a temperature control electric valve, and the temperature sensors of each temperature control electric valve are arranged in an array in the aging chamber 11. This is a prior art. The opening and closing of the gas delivery pipe 31 can be controlled through the temperature control electric valve. When the temperature is monitored to decrease, the opening of the gas delivery pipe 31 is changed to control the intake amount of hot air, which can also save energy, especially when the aging chamber 11 is not fully filled with the objects to be aged.

[0042] Testing method applied to the electronic load aging test cabinet of the present invention: Set test parameters: Set appropriate voltage, current and temperature parameters according to the actual situation of the electronic product. The parameter setting and display position are on the top control cabinet 13; Connect the test circuit: Connect the electronic product to be tested with the electronic aging load cabinet, that is, insert the electronic product to be aged and tested, such as a switching power supply, into the socket through a wire harness to ensure correct circuit connection. The switching power supply is placed on the support column 52 of the floating plug 5. The floating plug 5 that bears the switching power supply moves downward under force, that is, the air outlet channel under the switching power supply is opened. The temperature control air chamber 3 sends the gas at the set temperature into the aging chamber 11 through the air holes 21 on the intake cavity 23. The air in the temperature control air chamber 3 can be heated, and the heating temperature can be controlled. This belongs to the prior art, and the air supply device can be a blower, etc., which is also the prior art. The gas in the aging chamber is drawn out from below the switching power supply into the return air chamber 6. It should be understood that the air supply device is arranged in the channel between the return air chamber 6 and the temperature control air chamber 3 to realize gas circulation. When the temperature sensor monitors that the temperature in the aging chamber approaches the set temperature, the temperature control electric valve in the air delivery pipe 31 gradually closes. Preferably, in some embodiments, in order to cope with the heat dissipation effect of the aging body, the temperature control electric valve does not completely close the air delivery pipe 31. In the constant temperature cycle control, since the gas near the switching power supply is being drawn out, the temperature sensor in the corresponding area will monitor the temperature and control the intake air volume in this area through the temperature control electric valve. When the temperature in the aging chamber 11 reaches the preset temperature for aging test, the test can start: Start the test of the electronic aging load cabinet according to the set test parameters.

[0043] It should be noted that: for the electronic load aging test cabinet of the present invention, the aging cabinet body 1 includes an aging chamber 11 and a control cabinet 13. The control cabinet 13 is used to provide the electronic load and test control. The aging chamber 11 can accommodate the objects to be aged and provide a sealed and controllable test environment for them. Inside the aging chamber 11, there are a placement board 2 for placing several objects to be aged and several socket-outlets 12 electrically connected to the control cabinet 13, which can provide aging tests for multiple devices to be aged simultaneously. The interior of the placement board 2 of the present invention is a cavity structure divided into an exhaust cavity 22 and an intake cavity 23. There are also through air holes 21 on the placement board 2. The constant-temperature air in the temperature control air chamber 3 can enter the aging chamber 11 relatively evenly along the air holes 21 on the intake cavity 23, and the gas in the aging chamber 11 can also be discharged from the exhaust cavity 22 through the air holes 21 at the bottom of the device to be aged, greatly reducing the gradient change of the temperature in the aging chamber 11 and providing a more precise constant-temperature control environment compared to the limited inlet and outlet settings in the prior art. The opening and closing of the air outlet can be realized through the cooperation of the sealing ring 4 and the floating plug 5 on the air hole 21. The height of the sealing ring 4 of the electronic load aging test cabinet of the present invention is less than the height of the intake cavity, so that after the sealing ring 4 moves downward, it will not affect the air output of the air holes 21 in the lower layer of the placement board 2. The floating plug 5 of the electronic load aging test cabinet of the present invention includes a wind-limiting column 51, a support column 52, and a pressure plate 54. The wind-limiting column 51 is elastically connected to the cavity of the intake cavity 23, and after the device to be aged finishes the test and is taken away, the floating plug 5 can be reset. The pressure plate 54 is provided on the wind-limiting column 51 and is adapted to the diameter of the sealing ring 4, and can drive the sealing ring 4 to move downward together to open the air outlet channel during the downward movement. The support column 52 is provided on the pressure plate 54, which can not only provide space for downward movement but also keep the bottom of the device to be aged in a relatively suspended state after the downward movement is completed, preventing the accumulation of heat generated at the bottom. There is a gap between the wind-limiting column 51 and the inner wall of the air hole 21 in the electronic load aging test of the present invention. This gap can allow the gas to flow through and relatively reduce the gas flow rate of the upper air holes 21 near the heat source area. The pressure plate 54 in the electronic load aging test of the present invention is a disc structure. When the pressure plate 54 is combined with the sealing ring 4, it can completely seal the air hole 21 connecting the intake cavity 23 and the aging chamber 11, avoiding the direct entry of the gas in the intake cavity 23 into the exhaust cavity 22 and causing waste of energy. The intake cavity 23 of the electronic load aging test of the present invention is connected to the temperature control air chamber 3 through several air pipes 31, and the exhaust cavity 22 is connected to the air return chamber 6 through several air pipes 61, which can reduce the travel of the gas flow during gas circulation and avoid the long-term flow of the gas with temperature change in the aging chamber 11, affecting the stability of constant temperature.

[0044] The above are only the preferred embodiments of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and supplements can be made, and these improvements and supplements should also be regarded as the protection scope of the present invention.

Claims

1. An electronic load aging test cabinet, characterized in that It includes an aging cabinet body, and the aging cabinet body includes an aging chamber and a control cabinet. A storage board and a socket are arranged in the aging chamber, and the socket is electrically connected to the control cabinet; The storage board has a cavity structure, and a number of air holes are provided thereon, and the air holes penetrate through the storage board; the cavity structure of the storage board includes an exhaust cavity and an intake cavity; the intake cavity is communicated with a temperature control air chamber, and the temperature control air chamber is used to introduce a constant temperature gas into the intake cavity, and the exhaust cavity is communicated with a return air chamber, and the return air chamber is used to suck back the gas in the exhaust cavity; A sealing ring and a floating plug are provided on the air hole; the sealing ring is used to seal the connection between the air hole and the exhaust cavity and the sealing ring can move to open the connection between the air hole and the exhaust cavity, the floating plug is used to control the movement of the floating plug, and the sealing ring is provided with an elastic component for rebounding and resetting; The floating plug is used to place the device to be aged, and the floating plug can move under pressure.

2. The electronic load aging test cabinet according to claim 1, wherein The sealing ring is a cylindrical structure with a middle through hole, and an outer edge is provided thereon, and the outer edge is elastically connected to the cavity of the exhaust cavity through the elastic component.

3. The electronic load aging test cabinet according to claim 2, characterized in that, The height of the sealing ring is less than the height of the intake cavity.

4. The electronic load aging test cabinet according to claim 1, characterized in that The floating plug includes a wind limiting column, a support column and a pressure plate; the wind limiting column is elastically connected to the cavity of the intake cavity; the pressure plate is provided on the wind limiting column, and the pressure plate is adapted to the diameter of the sealing ring; the support column is provided on the pressure plate.

5. The electronic load aging test cabinet according to claim 4, wherein, There is a gap between the wind limiting column and the inner wall of the air hole.

6. The electronic load aging test cabinet according to claim 4, characterized in that, The pressure plate is of a disc structure.

7. The electronic load aging test cabinet according to claim 1, characterized in that The intake cavity is communicated with the temperature control air chamber through a number of air pipes.

8. The electronic load aging test cabinet according to claim 7, wherein, A temperature control electric valve is provided on the air pipe.

9. The electronic load aging test cabinet according to claim 1, wherein The exhaust cavity is communicated with the return air chamber through a number of air outlet pipes.

10. The electronic load aging test cabinet according to claim 1, wherein The return air chamber is communicated with the temperature control air chamber.

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