A testing method, device, equipment and storage medium for a dual-motherboard server

Abstract

The present application discloses a testing method, device, equipment and storage medium for a dual-motherboard server, and relates to the field of server testing technology. By obtaining the test data corresponding to each motherboard of the dual-motherboard server under different working conditions, a comprehensive evaluation of the performance of each motherboard on the dual-motherboard server can be achieved. The deviation data between the test data corresponding to the first motherboard and the test data corresponding to the second motherboard under each working condition are counted, and the performance difference between the motherboards can be understood based on the deviation data. The test results are determined based on each deviation data and the deviation requirements corresponding to each component. Compared with the traditional solution of simply comparing the power consumption of the entire machine, the present application can more accurately evaluate the performance difference between each motherboard by evaluating whether the power supply meets the deviation requirements of each component of the dual-motherboard server under each working condition when the power supply is shared by the dual-motherboard server. The test results can provide an effective basis for adjusting the distribution of the power supply on the two motherboards, thereby achieving the best performance of the dual motherboard.

Description

Technical Field

[0001] The present application relates to the technical field of server testing, and in particular to a testing method, apparatus, device, and storage medium for a dual-motherboard server. Background Art

[0002] With the continuous iteration and upgrade of servers and the growing demand for high-density computing, energy efficiency optimization, and elastic resource expansion in data centers, dual-motherboard servers have emerged. Dual-motherboard servers integrate two independent motherboard systems within a single chassis, improving computing density and energy efficiency by sharing infrastructure resources. Current testing protocols target a power supply unit (PSU) powering a motherboard. By stress testing the entire system and then reading the current power consumption information, this provides a reference for customers to plan power configurations during server deployment.

[0003] When dual-motherboard servers are manufactured and their power supply is shared between the two motherboards, it's unclear whether the power supply can meet the demands of both motherboards, nor how the power consumption in this shared mode affects the performance of the components on both motherboards. Using current testing methods, dual-motherboard servers may experience underperformance on one motherboard during use, preventing them from fully realizing the performance advantages of dual-motherboard products.

[0004] It can be seen that how to give full play to the performance of dual motherboards is a problem that needs to be solved by those skilled in the art. Summary of the Invention

[0005] The present application provides a testing method, apparatus, device and storage medium for a dual-motherboard server, to at least solve the problem in the related art that the performance advantages of dual-motherboard products cannot be fully utilized.

[0006] This application provides a testing method for a dual-motherboard server, including:

[0007] Obtain test data corresponding to each motherboard of a dual-motherboard server under different operating conditions; wherein the dual-motherboard server includes a first motherboard and a second motherboard; the first motherboard and the second motherboard each include multiple components; the different operating conditions include static state, single component stress test, and all component stress test;

[0008] Count the deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition;

[0009] The test results are determined based on the deviation data and the deviation requirements corresponding to each component.

[0010] The present application also provides a testing device for a dual-motherboard server, comprising an acquisition unit, a statistics unit, and a determination unit;

[0011] an acquisition unit, configured to acquire test data corresponding to each motherboard of a dual-motherboard server under different operating conditions; wherein the dual-motherboard server includes a first motherboard and a second motherboard; each of the first motherboard and the second motherboard includes multiple components; and the different operating conditions include a static state, a single component stress test, and a stress test of all components;

[0012] A statistical unit, used for collecting statistical deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition;

[0013] The determination unit is used to determine the test result according to the deviation data and the deviation requirements corresponding to each component.

[0014] The present application also provides an electronic device, comprising: a memory for storing a computer program; and a processor for implementing the steps of any of the above-mentioned methods for testing a dual-motherboard server when executing the computer program.

[0015] The present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned methods for testing a dual-motherboard server are implemented.

[0016] The present application also provides a computer program product, including a computer program, which implements the steps of any of the above-mentioned dual-motherboard server testing methods when executed by a processor.

[0017] By obtaining test data corresponding to each motherboard in a dual-motherboard server under different operating conditions, this application enables a comprehensive performance evaluation of each motherboard in the dual-motherboard server. The dual-motherboard server includes a first motherboard and a second motherboard; each of the first and second motherboards contains multiple components. Different operating conditions can include static state, single-component stress testing, and all-component stress testing. The deviation data between the test data corresponding to the first motherboard and the test data corresponding to the second motherboard under each operating condition is calculated. Based on this deviation data, the performance balance between the motherboards can be understood. The test results are determined based on the deviation data and the deviation requirements corresponding to each component. Compared to traditional solutions that simply compare the power consumption of the entire system, this application sets deviation requirements for each component to evaluate whether the power supply shared by the dual-motherboard server meets the deviation requirements of each component in each operating condition. This allows for a more accurate assessment of the performance differences between the motherboards. The test results provide an effective basis for adjusting the power distribution between the two motherboards. Based on the test results, the power distribution between the two motherboards can be adjusted to ensure that the server achieves optimal dual-motherboard performance when in use, which helps improve product quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0019] Figure 1 A flowchart of a method for testing a dual-motherboard server provided in an embodiment of the present application;

[0020] Figure 2 A flowchart of a method for obtaining test data corresponding to each motherboard of a dual-motherboard server under different working conditions provided in an embodiment of the present application;

[0021] Figure 3 A schematic structural diagram of a testing device for a dual-motherboard server provided in an embodiment of the present application. DETAILED DESCRIPTION

[0022] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0023] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0024] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0025] A dual-motherboard server integrates two independent motherboard systems into a single chassis, improving computing density and energy efficiency by sharing infrastructure resources. As computing density increases, the PSU's support for the two motherboards requires multiple analyses to avoid performance degradation due to differences in power supply energy efficiency.

[0026] Current testing methods cannot assess the performance balance and peak performance requirements between motherboards when power is shared between two motherboards. Testing according to the targeted testing plan may result in poor performance on one motherboard during use, failing to fully utilize the performance advantages of dual-motherboard products.

[0027] Therefore, the embodiments of the present application provide a testing method, device, equipment and storage medium for a dual-motherboard server. When the dual-motherboard server shares a power supply, the power consumption of the entire machine is tested in a static state, each component contained in each motherboard is stress tested, and all components of each motherboard are stress tested, that is, the entire machine is stress tested, and test data under different working conditions is obtained to evaluate whether the current power sharing mode meets the various working conditions of the current dual-motherboard server, so as to adjust the distribution of the power on the two motherboards, thereby ensuring that the dual-motherboard server can achieve the optimal performance of the dual motherboards when in use.

[0028] An embodiment of the present application provides a testing method for a dual-motherboard server. The method is described in detail in conjunction with the execution flow of the testing method for the dual-motherboard server.

[0029] Figure 1 A flowchart of a method for testing a dual-motherboard server provided in an embodiment of the present application includes:

[0030] S101: Obtain test data corresponding to each motherboard of a dual-motherboard server under different working conditions.

[0031] Among them, the dual-motherboard server includes a first motherboard and a second motherboard; the first motherboard and the second motherboard each contain multiple components, such as a processor (Central Processing Unit, CPU), memory, fans, storage devices, high-speed serial computer expansion bus (Peripheral Component Interconnect Express, PCIE) devices, etc.

[0032] To comprehensively evaluate the performance of each motherboard in a dual-motherboard server sharing a power supply, you can set different operating conditions to evaluate the performance of the dual motherboards under different operating conditions. These different operating conditions can include static state, single component stress testing, and all component stress testing.

[0033] The static state refers to the state in which no additional pressure is applied during system startup.

[0034] Single-component stress testing refers to applying stress to a component of the same type on both motherboards of a dual-motherboard server.

[0035] All-component stress testing refers to applying stress tests to all components on both motherboards of a dual-motherboard server at the same time. All-component stress testing can be called whole-machine testing.

[0036] Test data is collected when testing a dual-motherboard server. Given the strong correlation between power consumption and power distribution, power consumption can be collected separately during test data collection. In addition to power consumption, the performance parameters of each component can also reflect the impact of power distribution on component performance. Therefore, collected test data can include both performance parameters and power consumption.

[0037] S102: Counting deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition.

[0038] By comparing the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition, the deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition can be determined.

[0039] Comparing the test data on the first main board with the test data on the second main board refers to comparing the test data corresponding to components of the same category under the same working conditions.

[0040] For example, when performing a single component stress test on a CPU, test data corresponding to the CPU on a first mainboard is compared with test data corresponding to the CPU on a second mainboard to determine deviation data.

[0041] Deviation data can be expressed as a specific value or as a percentage. For ease of explanation, the following content uses deviation data expressed as a percentage as an example.

[0042] S103: Determine a test result based on each deviation data and the deviation requirements corresponding to each component.

[0043] The test data may include performance parameters and power consumption, and the corresponding deviation data may include deviations in performance parameters and power consumption between components of the same type.

[0044] For each type of component, a performance deviation requirement corresponding to its performance may be set, and for each type of component, a power consumption deviation requirement corresponding to its power consumption may be set.

[0045] Taking the deviation data in the form of percentage as an example, the performance deviation requirement for various components can be set to less than 5% of the performance parameter deviation, the power consumption deviation requirement corresponding to the fan can be set to less than 10% of the power consumption deviation, and the power consumption deviation requirement corresponding to other components except the fan can be set to less than 5% of the power consumption deviation.

[0046] The percentage values ​​included in the above deviation requirements can be flexibly adjusted according to actual needs. For example, when the performance balance requirements between motherboards are very high, the percentage values ​​included in the deviation requirements can be reduced; when the performance balance requirements between motherboards are not high, the percentage values ​​included in the deviation requirements can be appropriately increased.

[0047] If each deviation data satisfies its corresponding deviation requirement, the test result includes test passed; if there is deviation data that does not meet the deviation requirement, the test result includes test failed.

[0048] In order to facilitate management personnel to intuitively understand the distribution of power supplies on the dual motherboards based on the test results, the test results may include not only test pass or test fail, but also test data and deviation data corresponding to each component.

[0049] The test results can provide an effective reference for managers to adjust the power distribution and improve the performance of dual motherboards by adjusting the power distribution.

[0050] As can be seen from the above technical solution, this application obtains test data corresponding to each motherboard in a dual-motherboard server under different operating conditions, enabling a comprehensive performance evaluation of each motherboard in the dual-motherboard server. The dual-motherboard server includes a first motherboard and a second motherboard; each of the first and second motherboards contains multiple components. Different operating conditions may include static state, single-component stress testing, and all-component stress testing. The deviation data between the test data corresponding to the first motherboard and the test data corresponding to the second motherboard under each operating condition is calculated. Based on the deviation data and the deviation requirements corresponding to each component, the test results are determined. Compared to traditional solutions that simply compare the power consumption of the entire system, this application sets deviation requirements for each component to evaluate whether the power supply shared by the dual-motherboard server meets the deviation requirements of each component in each operating condition. This allows for a more accurate assessment of the performance differences between the motherboards. The test results provide an effective basis for adjusting the power distribution between the two motherboards. Based on the test results, the power distribution between the two motherboards can be adjusted to ensure that the server achieves optimal dual-motherboard performance during use, which helps improve product quality.

[0051] Figure 2 A flowchart of a method for obtaining test data corresponding to each motherboard of a dual-motherboard server under different working conditions provided in an embodiment of the present application, the method comprising:

[0052] S201: During system startup, a first whole-machine power consumption corresponding to a first mainboard and a second whole-machine power consumption corresponding to a second mainboard of a dual-mainboard server are collected.

[0053] During system startup, the system is in a static state. This is when you can collect the total power consumption of each motherboard on a dual-motherboard server. For ease of distinction, the total power consumption corresponding to the first motherboard is referred to as the first total power consumption, and the total power consumption corresponding to the second motherboard is referred to as the second total power consumption.

[0054] In practical applications, the power consumption detection module can be used to monitor the power consumption changes of the dual mainboards in real time.

[0055] S202: After the system is powered on, single-component stress tests are performed on components of the same type on the first mainboard and the second mainboard at the same time, and within the monitoring period, first performance parameters and first power consumption of the components stress-tested on the first mainboard, second performance parameters and second power consumption of the components stress-tested on the second mainboard, and third whole-machine power consumption corresponding to the first mainboard and fourth whole-machine power consumption corresponding to the second mainboard are collected.

[0056] In an embodiment of the present application, the monitoring duration can be determined based on the test duration, and the value of the monitoring duration can be a value greater than the test duration.

[0057] The first mainboard and the second mainboard often include a large number of components. When performing a single-component stress test, components with higher power consumption can be selected for testing without performing separate single-component stress tests on all components.

[0058] There can be multiple components that perform a single component stress test. For example, the CPU, memory, fan, storage device, and PCIE device can be selected for single component stress testing. The process of performing a single component stress test on each component is similar. In the embodiment of this application, a component performing a single component stress test is used as an example to explain.

[0059] For ease of description, a component that performs a single-component stress test may be referred to as a stress test component, that is, the stress test component is any component that performs a single-component stress test among all components included in a dual-motherboard server.

[0060] When performing a single component stress test, it is necessary to obtain the power consumption and performance parameters corresponding to the component currently performing the single component stress test and the overall power consumption of the motherboard on which it is located.

[0061] In actual applications, the stress test program corresponding to the stress test component can be called to perform stress tests on the stress test component on the first main board and the stress test component on the second main board at the same time; the first power consumption and first performance parameter of the stress test component on the first main board, the second power consumption and second performance parameter of the stress test component on the second main board, and the third whole machine power consumption corresponding to the first main board and the fourth whole machine power consumption corresponding to the second main board are collected within the monitoring period according to the set sampling frequency.

[0062] The monitoring duration and sampling frequency can be pre-set based on actual needs. For example, the monitoring duration can be set to 24 hours (H), and test data of each component of two motherboards will be collected every 1 second within 24 hours.

[0063] There can be multiple components that perform single-component pressure testing, and there is no restriction on the order in which the single-component pressure testing is performed on these components.

[0064] Different types of pressure test components have their own corresponding pressure test programs. If a single component pressure test is required for a certain type of pressure test component, the corresponding pressure test program is called.

[0065] For example, when it is necessary to perform a single-component stress test on the CPU, the stress test program corresponding to the CPU can be called to simultaneously perform a single-component stress test on the CPU on the first motherboard and the CPU on the second motherboard, thereby collecting the power consumption and performance parameters of the CPU on the first motherboard, the power consumption and performance parameters of the CPU on the second motherboard, and the overall power consumption of the first motherboard and the overall power consumption of the second motherboard.

[0066] S203: Perform whole-machine testing on the first mainboard and the second mainboard simultaneously, and collect the fifth whole-machine power consumption of the first mainboard, the third performance parameters and the third power consumption of each component on the first mainboard within the monitoring period, and collect the sixth whole-machine power consumption of the second mainboard, the fourth performance parameters and the fourth power consumption of each component on the second mainboard.

[0067] The whole machine test requires applying pressure to all components on the motherboard at the same time. In order to quickly implement the whole machine test, the whole machine stress test program can be pre-packaged.

[0068] When the whole machine test is required, the whole machine stress test program is directly called to perform stress test on the first mainboard and the second mainboard at the same time; the third power consumption and third performance parameters of each component on the first mainboard, the fourth power consumption and fourth performance parameters of each component on the second mainboard, and the fifth whole machine power consumption corresponding to the first mainboard and the sixth whole machine power consumption corresponding to the second mainboard are collected within the monitoring period according to the set sampling frequency.

[0069] It should be noted that in the embodiment of the present application, the first, second, third, fourth, fifth, and sixth power consumptions are used to distinguish the power consumption of each motherboard under different operating conditions. The first to sixth power consumptions are not sequential; they are simply used to distinguish the power consumption of different motherboards under different operating conditions.

[0070] Similarly, the first, second, third, and fourth performance parameters are used for performance parameters only to distinguish the performance parameters of each component on each motherboard under different operating conditions. The first, second, third, and fourth power consumption are used for power consumption only to distinguish the power consumption of each component on each motherboard under different operating conditions.

[0071] In an embodiment of the present application, by collecting the power consumption and performance parameters of the components on each motherboard under different working conditions and the overall power consumption of the motherboard, more comprehensive test data can be obtained, providing comprehensive and reliable data support for the performance evaluation of each motherboard in a dual-motherboard server.

[0072] The deviation requirements corresponding to each component may include the allowable deviation range of each component.

[0073] The evaluation of the test data in the static state can determine whether the deviation between the first and second total power consumptions is within a first preset range. If the deviation between the first and second total power consumptions is within the preset range, the test passes, and the dual-motherboard server can be determined to have normal stability in the static state. If the deviation between the first and second total power consumptions is not within the preset range, the test fails, and the dual-motherboard server can be determined to have abnormal stability in the static state.

[0074] Taking the deviation between the first and second whole-machine power consumptions expressed in percentage as an example, the preset range can be set to 0 to 10%. When the deviation between the first and second whole-machine power consumptions is less than or equal to 10%, it indicates that the deviation is within a normal range; when the deviation between the first and second whole-machine power consumptions is greater than 10%, it indicates that the deviation is too large. In this case, it is determined that the stability of the dual-motherboard server in the static state is abnormal, and the abnormality can be recorded in the test results.

[0075] For the evaluation of test data under single-component stress testing, it can be determined whether the deviation between the third whole-machine power consumption of the first motherboard and the fourth whole-machine power consumption of the second motherboard is within a second preset range, whether the deviation between the first power consumption of the stress test component on the first motherboard and the second power consumption of the stress test component on the second motherboard is within the deviation range of the stress test component matching, and whether the first performance parameter of the stress test component on the first motherboard and the second performance parameter of the stress test component on the second motherboard meet the performance requirements of the stress test component matching; wherein, the stress test component is any component that performs a single-component stress test among all the components contained in the dual-motherboard server.

[0076] If the deviation between the third whole-machine power consumption of the first motherboard and the fourth whole-machine power consumption of the second motherboard is not within the second preset range, the deviation between the first power consumption of the stress test component on the first motherboard and the second power consumption of the stress test component on the second motherboard is not within the deviation range of the stress test component matching, or the first performance parameter of the stress test component on the first motherboard and the second performance parameter of the stress test component on the second motherboard do not meet the performance requirements of the stress test component matching, it means that the test has failed, and it can be determined that the power supply distribution of the stress test component on the dual-motherboard server is uneven.

[0077] For the evaluation of test data under the whole-machine stress test, it can be determined whether the deviation between the fifth whole-machine power consumption of the first motherboard and the sixth whole-machine power consumption of the second motherboard is within the third preset range, whether the deviation between the third power consumption of the target component on the first motherboard and the fourth power consumption of the target component on the second motherboard is within the deviation range of the target component matching, and whether the third performance parameter of the target component on the first motherboard and the fourth performance parameter of the target component on the second motherboard meet the performance requirements of the target component matching; wherein, the target component is any one of all the components contained in the dual-motherboard server.

[0078] If the deviation between the fifth whole-machine power consumption of the first motherboard and the sixth whole-machine power consumption of the second motherboard is not within the third preset range, the deviation between the third power consumption of the target component on the first motherboard and the fourth power consumption of the target component on the second motherboard is not within the deviation range of the target component matching, or the third performance parameter of the target component on the first motherboard and the fourth performance parameter of the target component on the second motherboard do not meet the performance requirements of the target component matching, it means that the test has failed, and it can be determined that the power distribution of the dual-motherboard server is uneven.

[0079] The first preset range, the second preset range, and the third preset range may be the same or different. In the embodiment of the present application, the description is made by taking the preset ranges being the same, that is, 0 to 10%.

[0080] For power consumption, the tolerance ranges for different components can be the same or different. Considering that the power consumption of fans on different motherboards often varies significantly, the tolerance range for fans can be 0 to 10%, and the tolerance range for components other than fans can be 0 to 5%.

[0081] For performance parameters, performance requirements may include two aspects: one is to compare whether the deviation of performance parameters of the same type of components on two main boards meets the requirements; the other is to determine whether the performance parameters of each component on each main board are within their corresponding parameter range.

[0082] Therefore, determining whether the first performance parameter of the pressure test component on the first mainboard and the second performance parameter of the pressure test component on the second mainboard meet the performance requirements for pressure test component matching can include determining whether the first performance parameter of the pressure test component on the first mainboard and the second performance parameter of the pressure test component on the second mainboard both meet the parameter range of the pressure test component; and determining whether the deviation between the first performance parameter of the pressure test component on the first mainboard and the second performance parameter of the pressure test component on the second mainboard is within a preset performance deviation range.

[0083] The performance deviation range can be set according to actual needs, for example, it can be set to 0 to 5%.

[0084] For single-component stress testing, in addition to evaluating the overall power consumption of both motherboards, only the performance parameters and power consumption of the component being stress-tested need to be evaluated. For full-system testing, in addition to evaluating the overall power consumption of both motherboards, the performance parameters and power consumption of all components on each motherboard need to be evaluated.

[0085] Taking the CPU, memory, fan, storage device, and PCIE device as an example, the power consumption of the CPU on motherboard 1 (MB1) is represented by cpu_power1, and the power consumption of the CPU on motherboard 2 (MB2) is represented by cpu_power2. The power consumption of the memory on motherboard 1 is represented by men_power1, and the power consumption of the memory on motherboard 2 is represented by men_power2. The power consumption of the fan on motherboard 1 is represented by fan_power1, and the power consumption of the fan on motherboard 2 is represented by fan_power2. The power consumption of the storage device on motherboard 1 is represented by bp_power1, and the power consumption of the storage device on motherboard 2 is represented by bp_power2. The power consumption of the PCIE device on motherboard 1 is represented by pcie_power1, and the power consumption of the PCIE device on motherboard 2 is represented by pcie_power2. The total power consumption of motherboard 1 is represented by total_power1, and the total power consumption of motherboard 2 is represented by total_power2.

[0086] The performance parameters corresponding to each component on motherboard 1 are represented by perf1, and the performance parameters corresponding to each component on motherboard 2 are represented by perf2. The performance parameters corresponding to different components can be prefixed with the component name. For example, the performance parameters corresponding to the CPU on motherboard 1 are represented by cpu_perf1, and the performance parameters corresponding to the CPU on motherboard 2 are represented by cpu_perf2.

[0087] Table 1 is a list of test data and their corresponding deviation requirements during whole machine testing.

[0088]

[0089] If all deviation data of motherboard 1 and motherboard 2 meet their corresponding deviation requirements, the test passes. At this time, the dual-motherboard server can exert the performance advantages of the dual-motherboard server when sharing power.

[0090] By evaluating the power consumption deviation of the two motherboards, the power consumption deviation of each component on the two motherboards, and the performance deviation, we can quickly and accurately assess whether the power modules are fully utilizing the performance advantages of dual-motherboard products when supplying power to the dual-motherboard server. Based on this deviation data, we can make more targeted adjustments to the distribution of power modules in the dual-motherboard server.

[0091] In the embodiments of the present application, in addition to considering power consumption and performance parameters, temperature is also an important evaluation parameter. Therefore, during the phase of simultaneously performing single-component stress tests on components of the same type on both the first and second mainboards, first temperature information of the component undergoing stress testing on the first mainboard and second temperature information of the component undergoing stress testing on the second mainboard can be collected during the monitoring period.

[0092] Temperature is often positively correlated with power consumption. After obtaining the temperature information, it can be determined whether the first temperature information and the first power consumption have the same change trend, and whether the second temperature information and the second power consumption have the same change trend within the monitoring period.

[0093] When the changing trends of the first temperature information and the first power consumption are inconsistent during the monitoring period, an abnormal prompt including the first temperature information and the first power consumption is output; when the changing trends of the second temperature information and the second power consumption are inconsistent during the monitoring period, an abnormal prompt including the second temperature information and the second power consumption is output.

[0094] In addition to comparing the temperature information with the power consumption trend, each component has a corresponding upper temperature limit. When the temperature of a component exceeds its corresponding upper temperature limit, an alarm can be issued to prevent high temperature from damaging the component.

[0095] After determining the test results based on the deviation data and the deviation requirements corresponding to each component, it also includes:

[0096] A target adjustment strategy that matches the test results is retrieved from pre-established power adjustment strategies, and the power distribution on the first mainboard and the second mainboard is adjusted according to the target adjustment strategy; wherein the power adjustment strategy includes adjustment methods corresponding to the power consumption and performance differences of the same type of components on the two mainboards.

[0097] For example, if the deviation between the power consumption of the CPU on the first motherboard and the power consumption of the CPU on the second motherboard is greater than 5%, and the power consumption of the CPU on the first motherboard is higher, the power supply can be adjusted to provide higher power to the CPU on the first motherboard.

[0098] In an embodiment of the present application, by constructing a power adjustment strategy, after testing the dual-motherboard server and obtaining the test results, the power adjustment strategy can be relied upon to quickly and accurately determine the power adjustment method that matches the current test results, thereby automatically adjusting the distribution of power on the dual motherboards.

[0099] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method.

[0100] Figure 3 A schematic structural diagram of a testing device for a dual-motherboard server provided in an embodiment of the present application, comprising an acquiring unit 31, a statistical unit 32, and a determining unit 33;

[0101] An acquisition unit 31 is configured to acquire test data corresponding to each motherboard of a dual-motherboard server under different operating conditions; wherein the dual-motherboard server includes a first motherboard and a second motherboard; each of the first motherboard and the second motherboard includes multiple components; and the different operating conditions include a static state, a single component stress test, and a stress test of all components;

[0102] A statistical unit 32 is used to collect statistical deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition;

[0103] The determination unit 33 is configured to determine a test result based on the deviation data and the deviation requirements corresponding to the components.

[0104] In some embodiments, the acquisition unit includes a first acquisition subunit, a single component pressure testing subunit, a second acquisition subunit, a whole device testing subunit, and a third acquisition subunit;

[0105] The first collection subunit is used to collect a first whole-machine power consumption corresponding to the first mainboard and a second whole-machine power consumption corresponding to the second mainboard of the dual-mainboard server during system startup;

[0106] A single component stress test subunit, configured to perform single component stress tests on components of the same type on both the first and second mainboards after the system is powered on;

[0107] a second collection subunit, configured to collect, within a monitoring period, a first performance parameter and a first power consumption of a component undergoing stress testing on the first mainboard, a second performance parameter and a second power consumption of a component undergoing stress testing on the second mainboard, and a third whole-machine power consumption corresponding to the first mainboard and a fourth whole-machine power consumption corresponding to the second mainboard;

[0108] A whole-machine test subunit, used to perform whole-machine test on the first mainboard and the second mainboard simultaneously;

[0109] The third acquisition subunit is used to collect the fifth whole-machine power consumption of the first mainboard, the third performance parameters and the third power consumption of each component on the first mainboard within the monitoring period, and collect the sixth whole-machine power consumption of the second mainboard, the fourth performance parameters and the fourth power consumption of each component on the second mainboard.

[0110] In some embodiments, the single component stress test subunit is used to call the stress test program of the target component to simultaneously stress test the stress test component on the first mainboard and the stress test component on the second mainboard; wherein the stress test component is any component that performs a single component stress test among all components included in the dual-mainboard server;

[0111] The second acquisition sub-unit is used to collect the first power consumption and first performance parameter of the stress test component on the first mainboard, the second power consumption and second performance parameter of the stress test component on the second mainboard, and the third whole machine power consumption corresponding to the first mainboard and the fourth whole machine power consumption corresponding to the second mainboard during the monitoring period according to the set sampling frequency.

[0112] In some embodiments, the whole-machine testing subunit is used to call a whole-machine stress testing program to perform stress testing on the first mainboard and the second mainboard simultaneously;

[0113] The third acquisition subunit is used to collect the third power consumption and third performance parameters of each component on the first mainboard during the monitoring period, the fourth power consumption and fourth performance parameters of each component on the second mainboard, and the fifth whole-machine power consumption corresponding to the first mainboard and the sixth whole-machine power consumption corresponding to the second mainboard according to the set sampling frequency.

[0114] In some embodiments, the determining unit includes a first determining subunit, a first determining subunit, a second determining subunit, a second determining subunit, a third determining subunit, and a third determining subunit;

[0115] The first judging subunit is configured to judge whether a deviation between the first whole machine power consumption and the second whole machine power consumption is within a first preset range;

[0116] The first determination subunit is configured to determine that the stability of the dual-mainboard server in a static state is abnormal when a deviation between the first whole-machine power consumption and the second whole-machine power consumption is not within a preset range;

[0117] a second judgment subunit, configured to judge whether a deviation between a third whole-machine power consumption of the first motherboard and a fourth whole-machine power consumption of the second motherboard is within a second preset range, whether a deviation between a first power consumption of a stress test component on the first motherboard and a second power consumption of the stress test component on the second motherboard is within a deviation range of stress test component matching, and whether a first performance parameter of the stress test component on the first motherboard and a second performance parameter of the stress test component on the second motherboard meet performance requirements of stress test component matching; wherein the stress test component is any component that performs a single-component stress test among all components included in a dual-motherboard server;

[0118] The second determination subunit is configured to determine that power distribution of the stress test components on the dual-mainboard server is uneven when a deviation between the third whole-machine power consumption of the first mainboard and the fourth whole-machine power consumption of the second mainboard is not within a second preset range, a deviation between the first power consumption of the stress test component on the first mainboard and the second power consumption of the stress test component on the second mainboard is not within a deviation range of stress test component matching, or a first performance parameter of the stress test component on the first mainboard and the second performance parameter of the stress test component on the second mainboard do not meet performance requirements of stress test component matching;

[0119] a third judgment subunit, configured to judge whether a deviation between a fifth whole-machine power consumption of the first motherboard and a sixth whole-machine power consumption of the second motherboard is within a third preset range, whether a deviation between a third power consumption of a target component on the first motherboard and a fourth power consumption of the target component on the second motherboard is within a deviation range for target component matching, and whether a third performance parameter of the target component on the first motherboard and a fourth performance parameter of the target component on the second motherboard meet performance requirements for target component matching; wherein the target component is any one of all components included in the dual-motherboard server;

[0120] The third determination subunit is used to determine that the power distribution of the dual-mainboard server is uneven when the deviation of the fifth whole-machine power consumption of the first mainboard and the sixth whole-machine power consumption of the second mainboard is not within the third preset range, the deviation of the third power consumption of the target component on the first mainboard and the fourth power consumption of the target component on the second mainboard is not within the deviation range of the target component matching, or the third performance parameter of the target component on the first mainboard and the fourth performance parameter of the target component on the second mainboard do not meet the performance requirements of the target component matching.

[0121] In some embodiments, the second determination subunit is used to determine whether the first performance parameter of the stress test component on the first mainboard and the second performance parameter of the stress test component on the second mainboard both meet the parameter range of the stress test component; and to determine whether the deviation between the first performance parameter of the stress test component on the first mainboard and the second performance parameter of the stress test component on the second mainboard is within a preset performance deviation range.

[0122] In some embodiments, it further includes a temperature acquisition unit, a judgment unit, and an output unit;

[0123] a temperature collection unit configured to collect, during a monitoring period, first temperature information of a component undergoing stress testing on the first mainboard and second temperature information of a component undergoing stress testing on the second mainboard during a phase of simultaneously performing single-component stress testing on components of the same type on the first and second mainboards;

[0124] a judging unit, configured to judge whether the changing trends of the first temperature information and the first power consumption are consistent and whether the changing trends of the second temperature information and the second power consumption are consistent within the monitoring period;

[0125] The output unit is used to output an abnormal prompt including the first temperature information and the first power consumption when the changing trends of the first temperature information and the first power consumption are inconsistent within the monitoring period; and to output an abnormal prompt including the second temperature information and the second power consumption when the changing trends of the second temperature information and the second power consumption are inconsistent within the monitoring period.

[0126] For the description of the features in the embodiment corresponding to the testing device for a dual-motherboard server, reference can be made to the relevant description of the embodiment corresponding to the testing method for a dual-motherboard server, which will not be repeated here.

[0127] As can be seen from the above technical solution, this application obtains test data corresponding to each motherboard in a dual-motherboard server under different operating conditions, enabling a comprehensive performance evaluation of each motherboard in the dual-motherboard server. The dual-motherboard server includes a first motherboard and a second motherboard; each of the first and second motherboards contains multiple components. Different operating conditions may include static state, single-component stress testing, and all-component stress testing. The deviation data between the test data corresponding to the first motherboard and the test data corresponding to the second motherboard under each operating condition is calculated. Based on the deviation data and the deviation requirements corresponding to each component, the test results are determined. Compared to traditional solutions that simply compare the power consumption of the entire system, this application sets deviation requirements for each component to evaluate whether the power supply shared by the dual-motherboard server meets the deviation requirements of each component in each operating condition. This allows for a more accurate assessment of the performance differences between the motherboards. The test results provide an effective basis for adjusting the power distribution between the two motherboards. Based on the test results, the power distribution between the two motherboards can be adjusted to ensure that the server achieves optimal dual-motherboard performance during use, which helps improve product quality.

[0128] An embodiment of the present application further provides an electronic device including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any of the above-mentioned embodiments of the test method for a dual-motherboard server.

[0129] An embodiment of the present application further provides a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps of any of the above-mentioned embodiments of the test method for a dual-motherboard server when running.

[0130] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0131] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps of any of the above-mentioned test method embodiments for a dual-motherboard server are implemented.

[0132] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned dual-motherboard server test method embodiments.

[0133] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0134] The above describes in detail the testing method, apparatus, device, and storage medium for a dual-motherboard server provided by this application. This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only intended to help understand the method and core concept of this application. It should be noted that for ordinary technicians in this technical field, without departing from the principles of this application, various improvements and modifications can be made to this application, and these improvements and modifications also fall within the scope of protection of the claims of this application.

Claims

1. A testing method for a dual-motherboard server, characterized in that: include: Obtain test data corresponding to each motherboard of a dual-motherboard server under different operating conditions; wherein the dual-motherboard server includes a first motherboard and a second motherboard; the first motherboard and the second motherboard each include multiple components; the different operating conditions include a static state, a single component stress test, and a stress test of all components; Counting the deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition; Determine the test results based on the deviation data and the deviation requirements corresponding to each component; Obtain test data corresponding to each motherboard of a dual-motherboard server under different working conditions, including: During system startup, a first whole-machine power consumption corresponding to a first mainboard of a dual-mainboard server and a second whole-machine power consumption corresponding to a second mainboard are collected; After the system is powered on, single-component stress tests are simultaneously performed on components of the same type on the first mainboard and the second mainboard, and within a monitoring period, a first performance parameter and a first power consumption of the component on the first mainboard undergoing the stress test, a second performance parameter and a second power consumption of the component on the second mainboard undergoing the stress test, and a third whole-machine power consumption corresponding to the first mainboard and a fourth whole-machine power consumption corresponding to the second mainboard are collected; The first mainboard and the second mainboard are tested as a whole at the same time, and the fifth whole-machine power consumption of the first mainboard, the third performance parameters and the third power consumption of each component on the first mainboard are collected during the monitoring period, and the sixth whole-machine power consumption of the second mainboard, the fourth performance parameters and the fourth power consumption of each component on the second mainboard are collected.

2. The method for testing a dual-motherboard server according to claim 1, wherein: After the system is powered on, single-component stress tests are simultaneously performed on components of the same type on the first mainboard and the second mainboard, and a first performance parameter and a first power consumption of the component undergoing the stress test on the first mainboard, a second performance parameter and a second power consumption of the component undergoing the stress test on the second mainboard, and a third whole-machine power consumption corresponding to the first mainboard and a fourth whole-machine power consumption corresponding to the second mainboard are collected within a monitoring period, including: Calling a stress test program of a stress test component to simultaneously perform stress tests on the stress test component on the first mainboard and the stress test component on the second mainboard; wherein the stress test component is any component that performs a single component stress test among all components included in the dual-mainboard server; According to the set sampling frequency, the first power consumption and first performance parameter of the stress test component on the first mainboard, the second power consumption and second performance parameter of the stress test component on the second mainboard, and the third whole machine power consumption corresponding to the first mainboard and the fourth whole machine power consumption corresponding to the second mainboard are collected during the monitoring period.

3. The method for testing a dual-motherboard server according to claim 1, wherein: Performing whole-machine testing on the first mainboard and the second mainboard simultaneously, and collecting, within a monitoring period, a fifth whole-machine power consumption of the first mainboard, a third performance parameter and a third power consumption of each component on the first mainboard, and collecting a sixth whole-machine power consumption of the second mainboard, a fourth performance parameter and a fourth power consumption of each component on the second mainboard, including: Invoking a whole-machine stress test program to perform stress tests on the first mainboard and the second mainboard simultaneously; According to the set sampling frequency, the third power consumption and third performance parameters of each component on the first mainboard during the monitoring period, the fourth power consumption and fourth performance parameters of each component on the second mainboard, and the fifth whole-machine power consumption corresponding to the first mainboard and the sixth whole-machine power consumption corresponding to the second mainboard are collected.

4. The method for testing a dual-motherboard server according to claim 1, wherein: Determine the test results based on the deviation data and the deviation requirements corresponding to each component, including: Determining whether a deviation between the first whole device power consumption and the second whole device power consumption is within a first preset range; If a deviation between the first whole-machine power consumption and the second whole-machine power consumption is not within a preset range, determining that the stability of the dual-motherboard server in a static state is abnormal; Determine whether a deviation between the third whole-machine power consumption of the first motherboard and the fourth whole-machine power consumption of the second motherboard is within a second preset range, whether a deviation between the first power consumption of the stress test component on the first motherboard and the second power consumption of the stress test component on the second motherboard is within a deviation range for stress test component matching, and whether the first performance parameter of the stress test component on the first motherboard and the second performance parameter of the stress test component on the second motherboard meet performance requirements for stress test component matching; wherein the stress test component is any component that performs a single-component stress test among all components included in the dual-motherboard server; When a deviation between the third whole-machine power consumption of the first motherboard and the fourth whole-machine power consumption of the second motherboard is not within the second preset range, a deviation between the first power consumption of the stress test component on the first motherboard and the second power consumption of the stress test component on the second motherboard is not within the deviation range of stress test component matching, or a first performance parameter of the stress test component on the first motherboard and the second performance parameter of the stress test component on the second motherboard do not meet the performance requirements of stress test component matching, it is determined that the power supply distribution of the stress test component on the dual-motherboard server is uneven; Determine whether a deviation between a fifth whole-machine power consumption of the first motherboard and a sixth whole-machine power consumption of the second motherboard is within a third preset range, whether a deviation between a third power consumption of a target component on the first motherboard and a fourth power consumption of a target component on the second motherboard is within a deviation range of the target component match, and whether a third performance parameter of the target component on the first motherboard and a fourth performance parameter of the target component on the second motherboard meet performance requirements of the target component match; wherein the target component is any one of all components included in the dual-motherboard server; When the deviation between the fifth whole-machine power consumption of the first motherboard and the sixth whole-machine power consumption of the second motherboard is not within the third preset range, the deviation between the third power consumption of the target component on the first motherboard and the fourth power consumption of the target component on the second motherboard is not within the deviation range of the target component matching, or the third performance parameter of the target component on the first motherboard and the fourth performance parameter of the target component on the second motherboard do not meet the performance requirements of the target component matching, it is determined that the power distribution of the dual-motherboard server is uneven.

5. The method for testing a dual-motherboard server according to claim 4, wherein: Determining whether a first performance parameter of the pressure test component on the first mainboard and a second performance parameter of the pressure test component on the second mainboard meet performance requirements for pressure test component matching includes: Determine whether the first performance parameter of the pressure test component on the first mainboard and the second performance parameter of the pressure test component on the second mainboard both meet the parameter range of the pressure test component; and determine whether the deviation between the first performance parameter of the pressure test component on the first mainboard and the second performance parameter of the pressure test component on the second mainboard is within a preset performance deviation range.

6. The method for testing a dual-motherboard server according to claim 1, wherein: Also includes: During a phase of simultaneously performing single-component stress tests on components of the same type on the first mainboard and the second mainboard, collecting first temperature information of the component undergoing stress testing on the first mainboard and second temperature information of the component undergoing stress testing on the second mainboard within a monitoring period; Determining whether the first temperature information and the first power consumption have a consistent change trend and whether the second temperature information and the second power consumption have a consistent change trend within the monitoring period; When the change trends of the first temperature information and the first power consumption are inconsistent within the monitoring period, outputting an abnormality prompt including the first temperature information and the first power consumption; When the change trends of the second temperature information and the second power consumption are inconsistent within the monitoring period, an abnormality prompt including the second temperature information and the second power consumption is output.

7. A test device for a dual-motherboard server, characterized in that: It includes an acquisition unit, a statistics unit and a determination unit; The acquisition unit is configured to acquire test data corresponding to each motherboard of a dual-motherboard server under different operating conditions; wherein the dual-motherboard server includes a first motherboard and a second motherboard; the first motherboard and the second motherboard each include multiple components; and the different operating conditions include a static state, a single component stress test, and a stress test of all components; The statistical unit is used to collect statistical deviation data between the test data corresponding to the first mainboard and the test data corresponding to the second mainboard under each working condition; The determining unit is configured to determine a test result based on the deviation data and the deviation requirements corresponding to each component; The acquisition unit includes a first acquisition subunit, a single-component stress test subunit, a second acquisition subunit, a whole-machine test subunit and a third acquisition subunit; the first acquisition subunit is used to collect the first whole-machine power consumption corresponding to the first mainboard and the second whole-machine power consumption corresponding to the second mainboard of the dual-mainboard server during system startup; the single-component stress test subunit is used to perform single-component stress testing on the same type of components on the first mainboard and the second mainboard at the same time after the system is started; the second acquisition subunit is used to collect the first performance parameter and first power consumption of the component subjected to stress testing on the first mainboard, the second performance parameter and second power consumption of the component subjected to stress testing on the second mainboard, and the third whole-machine power consumption corresponding to the first mainboard and the fourth whole-machine power consumption corresponding to the second mainboard within the monitoring period; the whole-machine test subunit is used to perform whole-machine testing on the first mainboard and the second mainboard at the same time; the third acquisition subunit is used to collect the fifth whole-machine power consumption of the first mainboard, the third performance parameter and third power consumption of each component on the first mainboard, and the sixth whole-machine power consumption of the second mainboard, and the fourth performance parameter and fourth power consumption of each component on the second mainboard within the monitoring period.

8. An electronic device, characterized in that: include: memory for storing computer programs; A processor, configured to implement the steps of the method for testing a dual-motherboard server as claimed in any one of claims 1 to 6 when executing the computer program.

9. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the steps of the test method for a dual-motherboard server according to any one of claims 1 to 6 are implemented.

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