Test system, test method and computer readable storage medium

Abstract

The invention provides a test system, a test method and a computer readable storage medium, and relates to the technical field of network testing, the test system comprises a configuration module, a test device, a monitoring module and a test determination module, the configuration module is used for sending a wake-up signal indicating a PHY chip to execute a corresponding sleep wake-up event; the monitoring module is used for receiving a first feedback signal and a second feedback signal and sending the first feedback signal and the second feedback signal to the test judgment module, and the first feedback signal is sent by the test equipment and generated according to a sleep wake-up event corresponding to the test equipment; the second feedback signal is sent by the tested equipment and is generated according to a sleep wake-up event corresponding to the tested equipment; and the test judgment module is used for determining the consistency of the sleep wake-up events corresponding to the test equipment and the tested equipment according to the received first feedback signal and the second feedback signal. The vehicle-mounted Ethernet TC10 sleep wake-up consistency test can be realized, and all requirements of sleep wake-up test standards are met.

Description

Technical Field

[0001] The present application relates to the field of network testing technology, and more particularly, to a testing system, a testing method, and a computer-readable storage medium in the field of network testing technology. Background Art

[0002] Currently, the only test equipment that can be used for auxiliary testing of the Automotive Ethernet Open Sleep / Wake-up Specification (TC10) is a 1000BASE-Tx (1000Mbps Base Twisted-paire Xtended specification, 1000Mbps using baseband transmission over two pairs of high-quality twisted pairs) to 1000BASE-T1 (1000Mbps Base A pair of twisted pairs, 1000Mbps using baseband transmission over one pair of twisted pairs) Ethernet adapter box. This means that the Automotive Ethernet TC10 sleep / wake-up conformance test can be implemented using a 1000BASE-Tx to 1000BASE-T1 Ethernet adapter box. However, the use of existing Ethernet adapter boxes to implement the automotive Ethernet TC10 sleep-wake consistency test cannot meet all the prerequisites for test equipment and test systems in the "1000BASE-T1 Interoperability Test Suite Specification" sleep-wake test standard. For example, it is impossible to record the time when the sleep-wake event occurs in real time, resulting in the automotive Ethernet TC10 sleep-wake consistency test failing to meet the sleep-wake test standard. Summary of the Invention

[0003] The present application provides a test system, a test method, and a computer-readable storage medium. The present application can meet all the prerequisite requirements of the sleep-wake test standard "1000BASE-T1 Interoperability Test Suite Specification" for test equipment and test systems.

[0004] In a first aspect, a test system is provided, comprising: a configuration module, a test device, a monitoring module, and a test determination module, wherein the test device is connected to the configuration module and the monitoring module respectively, and the monitoring module is connected to the test determination module;

[0005] A configuration module is used to send a wake-up signal, which is used to instruct the port physical layer chip to execute a corresponding sleep wake-up event;

[0006] a monitoring module, configured to receive a first feedback signal and a second feedback signal, and send the first feedback signal and the second feedback signal to the test determination module, wherein the first feedback signal is sent by the test device and is generated based on a sleep-wakeup event corresponding to the test device, and the second feedback signal is sent by the device under test and is generated based on a sleep-wakeup event corresponding to the device under test;

[0007] The test determination module is configured to determine the consistency between the sleep-wakeup event corresponding to the test device and the sleep-wakeup event corresponding to the device under test based on the received first feedback signal and the second feedback signal.

[0008] In the above technical solution, the test system provided by the embodiment of the present application includes: a configuration module, a test device, a monitoring module and a test determination module. The test device is connected to the configuration module and the monitoring module respectively, and the monitoring module is connected to the test determination module. The configuration module is used to send a wake-up signal to instruct the port physical layer (PHY) chip to execute a corresponding sleep wake-up event. After the test device and the device under test receive the wake-up signal sent by the configuration module, the PHY chips in the test device and the device under test respectively execute the corresponding sleep wake-up event. After the PHY chips in the test device and the device under test respectively complete the corresponding sleep wake-up event, the test device sends a first feedback signal to the monitoring module indicating that the PHY chip in the test device has completed the corresponding sleep wake-up event. The device under test sends a second feedback signal to the monitoring module indicating that the PHY chip in the device under test has completed the corresponding sleep wake-up event. The monitoring module sends the received first feedback signal and the second feedback signal to the test determination module. The test determination module determines the consistency of the sleep wake-up event corresponding to the test device and the sleep wake-up event corresponding to the device under test based on the received first feedback signal and the second feedback signal, thereby realizing consistency testing of the network protocol of the device under test and the standard Ethernet protocol, which can meet the "1000BASE-T1 Interoperability Test Suite Specification》The sleep-wake test standard has all the prerequisite requirements for test equipment and test systems.

[0009] In combination with the first aspect, in some possible implementations, the configuration module is connected to the test equipment, the device under test, and the monitoring module through an integrated test unit for controller function testing; the monitoring module includes M digital boards for simulating digital signal input or measuring digital signal output, the test equipment includes M first-port physical layer chips, and the device under test includes M second-port physical layer chips, where M is a positive integer and M≥2; the M digital boards are all connected to the configuration module through the integrated test unit, and the M first-port physical layer chips are connected one-to-one with the M second-port physical layer chips; the Xth second-port physical layer chip among the M second-port physical layer chips is connected to the X+1th second-port physical layer chip, where X is a positive integer and 1≤X<M; the M first-port physical layer chips are connected one-to-one with i digital boards among the M digital boards, and the M second-port physical layer chips are connected one-to-one with j digital boards among the M digital boards, where i and j are both positive integers and i+j=M.

[0010] In the above technical solution, when a hardware-based monitoring module is used in conjunction with a test device, a device under test, and a test judgment module to perform sleep-wake consistency testing, sleep-wake events can be uniformly fed back externally in the form of digital signals to achieve event monitoring testing with high time precision.

[0011] In combination with the first aspect and the above-mentioned implementation methods, in some possible implementation methods, each first-port physical layer chip in the test device and each second-port physical layer chip in the device under test supports at least 2 serial interfaces, and supports at least 6 digital input or output interfaces.

[0012] In combination with the first aspect and the above-mentioned implementation methods, in some possible implementation methods, the configuration module is connected to the test device and the device under test respectively through a preset communication protocol; the device under test includes an on-board Ethernet connection device, and the on-board Ethernet connection device is connected to the test device through an on-board Gigabit Ethernet cable.

[0013] In the above technical solution, when the device under test is an in-vehicle Ethernet connection device, the test system provided by this application can be used to implement the in-vehicle Ethernet TC10 sleep wake-up consistency test.

[0014] In a second aspect, a testing method is provided, which is applied to the above-mentioned testing system. The testing method includes:

[0015] The configuration module sends a wake-up signal, which instructs the port physical layer chip to execute the corresponding sleep wake-up event;

[0016] The monitoring module receives a first feedback signal, wherein the first feedback signal is generated according to a sleep-wakeup event corresponding to the test device and sent by the test device;

[0017] The monitoring module receives a second feedback signal, wherein the second feedback signal is generated according to a sleep-wakeup event corresponding to the device under test and sent by the device under test;

[0018] The test determination module determines consistency between a sleep-wakeup event corresponding to the test device and a sleep-wakeup event corresponding to the device under test based on the first feedback signal and the second feedback signal.

[0019] In the above technical scheme, the test method provided by the present application sends a wake-up signal through the configuration module, the wake-up signal instructs the port physical layer chip to execute the corresponding sleep wake-up event, and the monitoring module receives a first feedback signal and a second feedback signal, wherein the first feedback signal is generated according to the sleep wake-up event corresponding to the test device and sent by the test device, and the second feedback signal is generated according to the sleep wake-up event corresponding to the device under test and sent by the device under test. The test judgment module determines the consistency of the sleep wake-up event corresponding to the test device and the sleep wake-up event corresponding to the device under test based on the first feedback signal and the second feedback signal, thereby realizing consistency testing of the network protocol of the device under test and the standard Ethernet protocol, and can meet all the prerequisite requirements of the sleep wake-up test standard of the "1000BASE-T1 Interoperability Test Suite Specification" for test equipment and test systems.

[0020] In conjunction with the second aspect, in some possible implementations, the configuration module sends a wake-up signal, where the wake-up signal instructs the port physical layer chip to execute a corresponding sleep wake-up event, including: the configuration module sends the wake-up signal to a first port physical layer chip in the test device, the first port physical layer chip sends the wake-up signal to a second port physical layer chip in the device under test, adjusts a first level signal of a first preset interface in the first port physical layer chip to a preset level signal, and sends the adjusted first level signal of the first preset interface to the monitoring module, so as to complete the sleep wake-up event corresponding to the test device; upon receiving the wake-up signal sent by the first port physical layer chip, the second port physical layer chip adjusts a second level signal of a second preset interface in the second port physical layer chip to a preset level signal, sends the adjusted second level signal of the second preset interface to the monitoring module, and establishes a connection between the device under test and the test device; and, when the connection between the device under test and the test device is established, the second port physical layer chip adjusts a third level signal of a third preset interface in the second port physical layer chip to a preset level signal, and sends the adjusted third level signal of the third preset interface to the monitoring module, so as to complete the sleep wake-up event corresponding to the device under test.

[0021] In combination with the second aspect and the above implementation manner, in some possible implementation manners, the monitoring module receiving the first feedback signal includes: the monitoring module receiving a first level signal of a first preset interface sent by a first port physical layer chip, and when determining that the first level signal of the first preset interface is a preset level signal, obtaining a first reception time of receiving the first level signal of the first preset interface; and using the first reception time as the first feedback signal;

[0022] The first feedback signal is sent to the test determination module.

[0023] In combination with the second aspect and the above-mentioned implementation methods, in some possible implementation methods, the monitoring module receives the second feedback signal, including: the monitoring module receives the second level signal of the second preset interface and the third level signal of the third preset interface sent by the second port physical layer chip; when it is determined that the second level signal of the second preset interface and the third level signal of the third preset interface are both preset level signals, obtains the second reception time of receiving the second level signal of the second preset interface and the third reception time of the third level signal of the third preset interface; detects the duration of the change of the third level signal of the third preset interface to the preset level signal; uses the second reception time, the third reception time and the duration as the second feedback signal; and sends the second feedback signal to the test judgment module.

[0024] In combination with the second aspect and the above-mentioned implementation methods, in some possible implementation methods, the test judgment module determines the consistency of the sleep wake-up event corresponding to the test device and the sleep wake-up event corresponding to the device under test based on the first feedback signal and the second feedback signal, including: the test judgment module calculates a first difference, a second difference, and a third difference, wherein the first difference is the difference between the first receiving time and the second receiving time, the second difference is the difference between the third receiving time and the second receiving time, and the third difference is the difference between the duration and the preset duration; if the first difference is less than the first threshold, the second difference is less than or equal to the second threshold, and the third difference is less than the third threshold, it is determined that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test; if the first difference is not less than the first threshold, the second difference is less than or equal to the second threshold, and the third difference is less than the third threshold, it is determined that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test.

[0025] In the above technical solution, if the first difference is less than the first threshold, the second difference is less than or equal to the second threshold, and the duration is greater than the preset duration, it indicates that the time between the test device sending the wake-up signal and the device under test receiving the wake-up signal is short, and the time between the device under test receiving the wake-up signal and linking up is short, and after wake-up, the link connection between the device under test and the test device is stable, then it is determined that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test, indicating that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test. If the first difference is not less than the first threshold, the second difference is less than or equal to the second threshold, and the duration is greater than the preset duration, it indicates that the time between the test device sending the wake-up signal and the device under test receiving the wake-up signal is long, or the time between the device under test receiving the wake-up signal and linking up is long, or after wake-up, the link connection between the device under test and the test device is unstable, then it is determined that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test, indicating that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test.

[0026] In a third aspect, a computer-readable storage medium is provided, which stores a computer program code. When the computer program code runs on a computer, the computer executes the test method in the above-mentioned second aspect or any possible implementation of the second aspect. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 A system block diagram of a test system provided by an embodiment of the present application is shown;

[0028] Figure 2 A schematic diagram showing an exemplary connection between a test system and a device under test provided in an embodiment of the present application is shown;

[0029] Figure 3 Shows a schematic diagram of the connection between the test equipment / device under test and the digital board;

[0030] Figure 4 Another exemplary connection diagram between the test system and the device under test provided in an embodiment of the present application is shown;

[0031] Figure 5 A schematic flow chart of a testing method provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0032] The following will clearly and thoroughly describe the technical solutions in this application in conjunction with the accompanying drawings. In the description of the embodiments of this application, unless otherwise specified, " / " means or, for example, A / B can mean A or B: "and / or" in the text is only a description of the association relationship of associated objects, indicating that there can be three relationships, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, in the description of the embodiments of this application, "multiple" means two or more than two.

[0033] In the following, the terms "first" and "second" are used for descriptive purposes only and should not be understood to imply or suggest relative importance or implicitly indicate the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features.

[0034] As shown in Table 1, Table 1 shows the full Chinese and English names and English abbreviations of multiple term descriptions involved in this application:

[0035] Table 1

[0036] English abbreviation Full English name Full Chinese name TC10 OPEN Sleep / Wake-up Specification OPEN sleep wake-up specification PHY Port Physical Layer Port physical layer DUT Device Under Test Device under test WUP Wake-Up Pulse Wake-up pulse WUR Wake-Up Request Wake-up request LPS Low Power Sleep Low power sleep I / O Input / Output Input / Output

[0037] To meet the test environment requirements of the 1000BASE-T1 Interoperability Test Suite Specification, the following prerequisites have been specified for test equipment and test systems:

[0038] 1. Link partner, or device that is connected to the DUT, shall be able to send awake-up pulse (WUP).

[0039] 2. Link partner, or device that is connected to the DUT, shall be able to send awake-up request (WUR).

[0040] 3. Link partner shall have local wake-up input available.

[0041] 4. Link partner, or device that is connected to the DUT, shall be able to receive a wake-up pulse (WUP).

[0042] 5. Link partner, or device that is connected to the DUT, shall be able to receive a wake-up request (WUR).

[0043] 6.The test system shall be able of providing time measurement capabilities synchronized with the test steps events.

[0044] Currently, the only test equipment available for TC10 sleep-wake auxiliary testing is a 1000BASE-Tx to 1000BASE-T1 Ethernet adapter box. Existing Ethernet adapter boxes meet conditions 1-5 of the aforementioned prerequisites, but the PHY chip in the test equipment lacks configuration capabilities and can only support standard sleep-wake testing. To meet the requirements of the TC10 sleep-wake consistency test, the PHY chip in the test equipment needs to actively configure and provide feedback to the test equipment. Furthermore, the sleep-wake events occurring on the test equipment and the device under test cannot be captured by a unified test system, meaning that condition 6 of the aforementioned prerequisites is not met. Consequently, the automotive Ethernet TC10 sleep-wake consistency test cannot meet the sleep-wake test standard. Therefore, there is currently no effective and comprehensive TC10 sleep-wake test equipment or test system that can implement automotive Ethernet TC10 sleep-wake consistency testing while meeting the sleep-wake test standard.

[0045] Based on the above-mentioned problems, the present application provides a test system, a test method and a computer-readable storage medium. The present application can not only meet all the prerequisite requirements of the sleep-wake test standard of the "1000BASE-T1 Interoperability Test Suite Specification" for test equipment and test systems, but also realize event monitoring testing with high time precision.

[0046] Figure 1 A system block diagram of a test system provided by an embodiment of the present application is shown in FIG. Figure 1 As shown, the test system 100 includes: a configuration module 101, a test device 102, a monitoring module 103 and a test determination module 104. The test device 102 is connected to the configuration module 101 and the monitoring module 103 respectively, and the monitoring module 103 is connected to the test determination module 104. The test system workflow is as follows:

[0047] The configuration module 101 is used to configure the PHY chip registers in the test device 102 and the device under test, and trigger the test device 102 and the PHY chip in the device under test to execute specific events, including sleep and wake-up events; the test device 102 acts as a link partner (LinkPartner) connected to the device under test; the monitoring module 103 is used to monitor the feedback signal of the device under test and the PHY chip in the test device actually executing the specific event; the test judgment module 104 is used to determine the test result based on the feedback signal sent by the monitoring module 103 that the device under test and the PHY chip in the test device actually execute the specific event.

[0048] The design description of each module in the test system is as follows:

[0049] 1. Configuration Module 101:

[0050] In some embodiments, the configuration module 101 communicates with the device under test 200 via a preset communication protocol. The preset communication protocol is any one of an IIC (Inter-Integrated Circuit) protocol, an SPI (Serial Peripheral Interface) protocol, a CAN (Controller Area Network) protocol, a USB (Universal Serial Bus) protocol, an RS485 protocol, an RS232 protocol, etc. The configuration module 101 communicates with the test device 102 and the device under test 200 via the preset communication protocol. The configuration module 101 issues a control command and receives a command response to the control command. The test device 102 and the device under test 200 receive the control command, issue a command response, and execute corresponding specific events.

[0051] In some embodiments, the configuration module 101, the test device 102, and the device under test 200 implement communication interaction through negotiated communication protocol commands, and the negotiated communication protocol commands are as follows:

[0052] 1. RST command: used to instruct the PHY chip to reset;

[0053] 2. SLEEP command: used to instruct PHY to enter sleep mode;

[0054] 3. SndWU command: used to instruct the PHY chip to send a WUP wake-up pulse when the Link is in the passive state; when the Link is in the active state, the PHY chip sends a WUR

[0055] Wake-up message.

[0056] 4. SndLPS command: used to instruct the PHY chip to send an LPS sleep request;

[0057] 5. SLRM command: used to instruct to obtain the Link status of the current PHY chip;

[0058] 6. SLPM command: used to instruct the PHY chip to be set to Master mode;

[0059] 7. SLPS command: used to instruct the PHY chip to be set to Slave mode;

[0060] 8. SPRM command: used to indicate the current mode of the PHY chip (such as Standby, Normal, Sleep);

[0061] 9. SCFGT#20 command: used to instruct the system program to complete the configuration of the PHY chip within the set time T. This command supports parameters, changes and takes effect within the time, and is only supported by the device under test 200. Among them, the default standard requirement for setting the time T is, for example, 20ms.

[0062] 10. EnFWD command: used to instruct to enable the Forward WakeUp function of the PHY chip. It is only supported by the device under test 200, and the device under test 200 needs to have two or more PHYs.

[0063] chip;

[0064] 11. DisFWD command: used to instruct to shut down the Forward WakeUp of the PHY chip

[0065] This function is only supported by the device under test 200, and the device under test 200 needs to have two or more PHY chips.

[0066] 2. Monitoring module 103:

[0067] In some embodiments, the monitoring module 103 includes M digital boards for simulating digital signal input or measuring digital signal output, where M is a positive integer and M≥2. For example, the digital boards are VECTOR VT2516A digital module boards. The digital boards can also be replaced with oscilloscopes with programming functions.

[0068] In some embodiments, the PHY chip in the test device 102 is a first PHY chip, and the PHY chip in the device under test 200 is a second PHY chip. Each first PHY chip in the test device 102 and each second PHY chip in the device under test 200 supports at least two serial interfaces and at least six digital input or output interfaces. Each digital board supports at least 12 digital input or output interfaces. The digital input or output interface of the PHY chip is used to map specific events. The test device 102 and the device under test 200 need to implement the following software requirements: after the PHY chip successfully executes a certain event, the level signal of the corresponding digital input or output interface is pulled high so that the corresponding digital board can capture the feedback event. Since the monitoring module 103 includes M digital boards, that is, the monitoring module is constructed by hardware, when the hardware-based monitoring module is used in conjunction with the test device, the device under test, and the test judgment module to perform sleep wakeup consistency testing, the sleep wakeup event can be uniformly fed back externally in the form of a digital signal, thereby achieving high-time precision event monitoring testing.

[0069] like Figure 3 As shown, Figure 3 The figure shows the connection diagram of the test equipment / device under test and the digital board. The negotiation command of the output interface (OutputPin) is implemented according to the following requirements:

[0070] 1. WU_SND command: used to instruct the PHY chip to successfully send a WUP wake-up pulse or WUR wake-up request message;

[0071] 2. WU_REC command: used to indicate that the PHY chip has received a remote WUP wake-up pulse or WUR wake-up request message;

[0072] 3. PSD_WAKE command: When used as input, the PHY chip receives the LOCAL wake-up request; when used as output, it transmits the wake-up request to another PHY chip in the device, that is, sends a LOCAL wake-up request to the PSD_WAKE of another PHY chip;

[0073] 4. LPS_SND command: used to instruct the PHY chip to successfully issue an LPS sleep request;

[0074] 5. LPS_SEC command: used to indicate that the PHY chip has received a remote LPS sleep request;

[0075] 6. LK_STUS command: When the Link state of the PHY chip is Linkup, it corresponds to a high level; when the Link state of the PHY chip is Linkdown, it corresponds to a low level.

[0076] 3. Test judgment module 104: writes test script use cases according to test standard requirements, uses the test script use cases to calculate and process the PHY chip events monitored by the monitoring module 103, judges the test results, and outputs a test report.

[0077] Figure 2 FIG. 1 shows an exemplary connection diagram of the test system and the device under test provided in an embodiment of the present application. Figure 2 As shown, when performing the sleep-wake consistency test, the test system is connected to the device under test 200. The specific connection process is: connecting the configuration module 101 to the device under test 200, connecting the device under test 200 to the monitoring module 103, and connecting the device under test 200 to the test device 102, thereby establishing a connection between the test system and the device under test.

[0078] In some embodiments, when a connection is established between the test system and the device under test, the configuration module 101 is connected to the test device 102 and the device under test 200 respectively through a preset communication protocol. That is, the configuration module 101 communicates with the test device 102 and the device under test 200 through a preset communication protocol, and a sleep-wake consistency test can be performed. The test process is as follows:

[0079] The configuration module 101 is used to send a wake-up signal, which is used to instruct the PHY chip to execute a corresponding sleep wake-up event; the monitoring module 102 is used to receive a first feedback signal and a second feedback signal, and send the first feedback signal and the second feedback signal to the test judgment module 104, wherein the first feedback signal is sent by the test device 102, and the first feedback signal is generated according to the sleep wake-up event corresponding to the test device 102, and the second feedback signal is sent by the device under test 200, and the second feedback signal is generated according to the sleep wake-up event corresponding to the device under test 200; the test judgment module 104 is used to determine the consistency of the sleep wake-up event corresponding to the test device 102 and the sleep wake-up event corresponding to the device under test 200 based on the received first feedback signal and the second feedback signal.

[0080] It should be understood that: the configuration module 101 sends a wake-up signal, and the test device 102 and the device under test 200 respectively receive the wake-up signal sent by the configuration module 101; after the test device 102 receives the wake-up signal sent by the configuration module 101, the first PHY chip in the test device 102 executes the corresponding sleep wake-up event, and after the first PHY chip completes the corresponding sleep wake-up event, the test device 102 sends a first feedback signal to the monitoring module 103 regarding the first PHY chip's completion of the corresponding sleep wake-up event. After the device under test 200 receives the wake-up signal sent by the configuration module 101, the second PHY chip in the device under test 200 executes the corresponding sleep wake-up event, and after the second PHY chip completes the corresponding sleep wake-up event, the device under test 200 sends a second feedback signal to the monitoring module 103 regarding the second PHY chip's completion of the corresponding sleep wake-up event; wherein the first feedback signal includes time information describing the time when the first PHY chip completed the corresponding sleep wake-up event, and the second feedback signal includes time information describing the time when the second PHY chip completed the corresponding sleep wake-up event. After the test judgment module 104 receives the first feedback signal and the second feedback signal sent by the monitoring module 103, it respectively determines whether the time information in the first feedback signal and the second feedback signal meets the specified time information conditions in the network sleep wake-up consistency test standard for the Ethernet protocol. If so, it is determined that the sleep wake-up event corresponding to the test device 102 is consistent with the sleep wake-up event corresponding to the device under test 200, that is, the network protocol of the device under test 200 is consistent with the standard Ethernet protocol; if not, it is determined that the sleep wake-up event corresponding to the test device 102 is inconsistent with the sleep wake-up event corresponding to the device under test 200, that is, the network protocol of the device under test 200 is inconsistent with the standard Ethernet protocol.

[0081] 4. Test equipment 102:

[0082] In some embodiments, the test device 102 includes M first PHY chips, the device under test 200 includes M second PHY chips, and the M digital boards are all connected to the configuration module 101 via an integrated test unit. The M first PHY chips are connected in a one-to-one correspondence with the M second PHY chips, and the Xth second PHY chip among the M second PHY chips is connected to the X+1th second PHY chip. The M first PHY chips are connected in a one-to-one correspondence with the ith digital board among the M digital boards, and the M second PHY chips are connected in a one-to-one correspondence with the jth digital board among the M digital boards, where X is a positive integer, 1≤X<M, i and j are both positive integers, i+j=M. The integrated test unit is used for controller function testing, and the integrated test unit is, for example, a VECTOR VT System. VT7001 represents a power supply board used to power the test device 102 and the device under test 200.

[0083] Figure 4 FIG. 1 shows another exemplary connection diagram between the test system and the device under test provided in an embodiment of the present application. Figure 1 and Figure 4 As shown, when M=2, the test device 102 includes two first PHY chips, the device under test 200 includes two second PHY chips, the monitoring module 103 includes two digital boards, the integrated test unit is VT System, and the monitoring module 103 is installed on a host computer equipped with a CANoe simulation test environment, corresponding to Figure 4 CANoe in.

[0084] LP1_P1 represents the first first PHY chip in the test device 102, and LP2_P1 represents the first first PHY chip in the test device 102; DUT_P1 represents the first second PHY chip in the device under test 200, and DUT_P2 represents the second second PHY chip in the device under test 200; VT2516A-A represents the first digital board in the monitoring module 103, and VT2516A-B represents the second digital board in the monitoring module 103.

[0085] The configuration module 101 is connected to the test device 102, the device under test 200 and the monitoring module 103 through the integrated test unit (VT System). The first first PHY chip and the second first PHY chip are connected to the first digital board, the first second PHY chip and the second second PHY chip are connected to the second digital board, the first first PHY chip is connected to the first second PHY chip, the second first PHY chip is connected to the second second PHY chip, and the first second PHY chip is connected to the second second PHY chip.

[0086] Figure 3 ①-⑦ represent connection instructions, for example, ① indicates that the configuration module 101 is connected to the test device 102 and the device under test 200 via the USB / RS232 protocol. C1-C2 within the dotted ellipse P correspond to the control commands corresponding to each digital input or output interface, respectively. C1 represents the WU_SND command, C2 represents the WU_REC command, C3 represents the PSD_WAKE command, C4 represents the LPS_SND command, C5 represents the LPS_SEC command, and C6 represents the LK_STUS command.

[0087] like Figure 1 and Figure 3 As shown, when M=2, the specific test process is as follows:

[0088] (1) Set the test objects to include: t_wkp_unpwrd, t_wkp_linkup, and link stability after wake-up; where t_wkp_unpwrd represents the time between the test device 102 sending the wake-up signal and the device under test 200 receiving the wake-up signal; t_wkp_linkup represents the time between the device under test 200 receiving the wake-up signal and linking up.

[0089] (2) Test settings include:

[0090] 1. Power the test device 102 and the device under test 200 through the VT7001;

[0091] 2. Set DUT_P1 to Slave through the SLPS command;

[0092] 3. Set LP1_P1 as Master through the SLPM command;

[0093] 4. Set DUT_P1 and LP1_P1 to sleep mode through the SLEEP command;

[0094] 5. Use the SLRM command to read the Link status of DUT_P1 and LP1_P1 respectively, and ensure that the Link status is LinkDown and the Link is in Passive state;

[0095] 6. Use the DCFGT#20 command to set the device under test 200 to complete the configuration of DUT_P1 within the set time T.

[0096] (3) Test steps:

[0097] 1. Configuration module 101 sends a wake-up signal to LP1_P1 in test device 102 through a preset protocol on the VT System;

[0098] 2. After receiving the wake-up signal, LP1_P1 sends a wake-up signal to DUT_P1 in the device under test 200 through the Ethernet harness;

[0099] 3. When LP1_P1 successfully sends a wake-up signal, it immediately pulls up the level signal of the corresponding interface WU_SND, and the DA7 interface of VT2516A-A in the monitoring module 103 detects a high level;

[0100] 4. VT2516A-A feeds back the first reception time when the DA7 interface receives a high level to VT System. VT System sends the first reception time t0 to the test determination module 104. The test determination module 104 records the first reception time t0 through CANoe.

[0101] 5. When DUT_P1 receives the wake-up signal from LP1_P1, it immediately pulls up the level signal of the corresponding interface of WU_REC, and the DB2 interface of VT2516A-B detects a high level;

[0102] 6. VT2516A-B feeds back the second receiving time t1 when the DB2 interface receives a high level to VT System. VT System sends the second receiving time t1 to the test determination module 104. The test determination module 104 records the second receiving time t1 through CANoe.

[0103] 7. CANoe calculation time parameters: t_wkp_unpwrd = t1 - t0;

[0104] 8. When DUT_P1 detects Link up, DUT_P1 immediately pulls up the level signal of the corresponding interface of LK_STU, and the DB6 interface of VT2516A-B detects a high level;

[0105] 9. VT2516A-B feeds back the third receiving time t2 when the DB6 interface receives a high level to VT System. VT System sends the third receiving time t2 to the test determination module 104. The test determination module 104 records the third receiving time t2 through CANoe.

[0106] 10. CANoe calculation time parameters: t_wkp_link-up = t2-t1;

[0107] 11. VT2516A-B continuously monitors the level signal of the DB6 interface and feeds the level signal of the DB6 interface back to the test determination module 104 through VTSystem. The test determination module 104 obtains the duration of the high level signal of the DB6 interface through CANoe.

[0108] The first receiving time is a first feedback signal, and the second receiving time, the third receiving time, and the duration are second feedback signals. After obtaining t_wkp_unpwrd, t_wkp_link-up, and the duration, if t_wkp_unpwrd is less than a first threshold, t_wkp_link-up is less than or equal to a second threshold, and the duration is greater than a preset duration, it indicates that the sleep wake-up event corresponding to the test device 102 is consistent with the sleep wake-up event corresponding to the device under test 200, that is, the network protocol of the device under test 200 is consistent with the standard Ethernet protocol. If t_wkp_unpwrd is less than the first threshold, t_wkp_link-up is less than or equal to the second threshold, and the duration is greater than the preset duration, it indicates that the sleep wake-up event corresponding to the test device 102 is inconsistent with the sleep wake-up event corresponding to the device under test 200, that is, the network protocol of the device under test 200 is inconsistent with the standard Ethernet protocol.

[0109] In some embodiments, the device under test includes an in-vehicle Ethernet connection device, which is connected to the test device via an in-vehicle Gigabit Ethernet cable (1000BASE-T1). The in-vehicle Ethernet connection device, for example, is an in-vehicle controller. When the device under test is an in-vehicle Ethernet connection device, the test system provided herein can be used to perform in-vehicle Ethernet TC10 sleep / wake consistency testing.

[0110] When the test system provided in this application is applied to the automotive Ethernet TC10 sleep-wake consistency test, it has the following advantages:

[0111] 1. Since the PHY chip provides a wealth of TC10 functions and PHY status-related registers, the test equipment and the device under test can configure the PHY and trigger sleep wake-up interrupts to pull up the I / O port, enabling the test system to configure and monitor the PHY chip.

[0112] 2. The VT2516A digital board has an output accuracy of 2µs and an input accuracy of 50µs, meeting the millisecond-level accuracy requirements of the automotive Ethernet sleep / wakeup test in the 1000BASE-T1 Interoperability Test Suite Specification.

[0113] 3. VECTORCANoe and VT System are mainly designed for the development, simulation, testing, diagnosis and analysis of automotive buses. Due to their powerful and rich functions, they are used in vehicle simulation and network testing in the automotive industry, and can meet the communication control, signal processing, test calculation and judgment requirements required for the above tests.

[0114] 4. The test system provided in this application can meet all the prerequisite requirements of the sleep-wake test standard "1000BASE-T1 Interoperability Test Suite Specification" for test equipment and test systems. During the automotive Ethernet TC10 sleep-wake consistency test, the PHY chip of the test equipment and the device under test is controlled and the status is obtained through the negotiated communication protocol commands. Through the internal registers and interrupts of the PHY chip, combined with the internal interrupts and digital I / O of the test equipment and chip, the sleep-wake events are uniformly fed back to the outside in the form of digital signals, realizing event monitoring tests with high time precision.

[0115] The following is a test method provided in an embodiment of the present application.

[0116] Figure 5 A schematic flow chart of a test method provided in an embodiment of the present application is shown, as follows: Figure 5 As shown, the test method provided in the embodiment of the present application is applied to an electronic device, the electronic device includes the above-mentioned test system, and the test method includes the following scheme:

[0117] S510: The configuration module sends a wake-up signal, which instructs the port physical layer chip to execute a corresponding sleep wake-up event;

[0118] S520: The monitoring module receives a first feedback signal and a second feedback signal, wherein the first feedback signal is generated according to a sleep-wakeup event corresponding to the test device and sent by the test device, and the second feedback signal is generated according to a sleep-wakeup event corresponding to the device under test and sent by the device under test;

[0119] S530: The test determination module determines consistency between the sleep-wakeup event corresponding to the testing device and the sleep-wakeup event corresponding to the device under test based on the first feedback signal and the second feedback signal.

[0120] In an exemplary embodiment, the configuration module sends a wake-up signal, and the test device and the device under test respectively receive the wake-up signal sent by the configuration module; after the test device receives the wake-up signal sent by the configuration module, the first PHY chip in the test device executes the corresponding sleep wake-up event, and after the first PHY chip completes the corresponding sleep wake-up event, the test device sends a first feedback signal to the monitoring module regarding the first PHY chip completing the corresponding sleep wake-up event; after the device under test receives the wake-up signal sent by the configuration module, the second PHY chip in the device under test executes the corresponding sleep wake-up event, and after the second PHY chip completes the corresponding sleep wake-up event, the device under test sends a second feedback signal to the monitoring module regarding the second PHY chip completing the corresponding sleep wake-up event; wherein the first feedback signal includes a method for describing The first PHY chip executes the time information of the corresponding sleep wake-up event, and the second feedback signal includes the time information used to describe the second PHY chip executes the corresponding sleep wake-up event; after the test judgment module receives the first feedback signal and the second feedback signal sent by the monitoring module, it respectively determines whether the time information in the first feedback signal and the second feedback signal meets the specified time information conditions in the network sleep wake-up consistency test standard for the Ethernet protocol. If so, it is determined that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test, that is, the network protocol of the device under test is consistent with the standard Ethernet protocol; if not, it is determined that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test, that is, the network protocol of the device under test is inconsistent with the standard Ethernet protocol.

[0121] The test method provided in the present application sends a wake-up signal through a configuration module, and the wake-up signal instructs the port physical layer chip to execute a corresponding sleep wake-up event. The monitoring module receives a first feedback signal and a second feedback signal, wherein the first feedback signal is generated according to the sleep wake-up event corresponding to the test device and sent by the test device, and the second feedback signal is generated according to the sleep wake-up event corresponding to the device under test and sent by the device under test. The test judgment module determines the consistency of the sleep wake-up event corresponding to the test device and the sleep wake-up event corresponding to the device under test based on the first feedback signal and the second feedback signal, thereby realizing consistency testing of the network protocol of the device under test and the standard Ethernet protocol, and can meet all the prerequisite requirements of the sleep wake-up test standard of the "1000BASE-T1 Interoperability Test Suite Specification" for the test equipment and the test system.

[0122] In a possible implementation, the configuration module sends a wake-up signal, and the wake-up signal instructs the port physical layer chip to execute a corresponding sleep wake-up event, including the following schemes:

[0123] A wake-up signal is sent to the first-port physical layer chip in the test device through the configuration module. The first-port physical layer chip sends the wake-up signal to the second-port physical layer chip in the device under test, and adjusts the first level signal of the first preset interface in the first-port physical layer chip to a preset level signal, and sends the adjusted first level signal of the first preset interface to the monitoring module to execute the sleep wake-up event corresponding to the test device; when the second-port physical layer chip receives the wake-up signal sent by the first-port physical layer chip, it adjusts the second level signal of the second preset interface in the second-port physical layer chip to a preset level signal, sends the adjusted second level signal of the second preset interface to the monitoring module, and establishes a connection between the device under test and the test device; and, when the device under test is connected to the test device, the second-port physical layer chip adjusts the third level signal of the third preset interface in the second-port physical layer chip to a preset level signal, and sends the adjusted third level signal of the third preset interface to the monitoring module to execute the sleep wake-up event corresponding to the device under test.

[0124] like Figure 5 As shown, LP1_P1 represents the first PHY chip in the test equipment, LP2_P1 represents the first PHY chip in the test equipment; DUT_P1 represents the first PHY chip in the device under test, and DUT_P2 represents the second PHY chip in the device under test; VT2516A-A represents the first digital board in the monitoring module, and VT2516A-B represents the second digital board in the monitoring module. The first preset interface is, for example, the interface of LP1_P1 corresponding to WU_SND, the second preset interface is, for example, an interface of DUT_P1 corresponding to WU_REC, and the third preset interface is, for example, another interface of DUT_P1 corresponding to LK_STU. The preset level signal is, for example, a high level.

[0125] The configuration module sends a wake-up signal to LP1_P1 in the test device through the preset protocol on the VT System. After receiving the wake-up signal, LP1_P1 sends a wake-up signal to DUT_P1 in the device under test through the Ethernet harness. After successfully sending the wake-up signal to DUT_P1 in the device under test, LP1_P1 adjusts the first level signal of the first preset interface of LP1_P1 to a preset level signal, and sends the adjusted first level signal of the first preset interface to VT2516A-A in the monitoring module. The DA7 interface of VT2516A-A can receive the first level signal of the first preset interface of LP1_P1. At this point, the test device completes the sleep wake-up event corresponding to the test device.

[0126] After DUT_P1 receives the wake-up signal sent by LP1_P1, DUT_P1 adjusts the second level signal of the second preset interface of DUT_P1 to the preset level signal, and sends the adjusted second level signal of the second preset interface to VT2516A-B in the monitoring module. The DB2 interface of VT2516A-B can receive the second level signal of the second preset interface of DUT_P1, and then the device under test establishes a connection with the test device; if the device under test establishes a connection with the test device, that is, DUT_P1 monitors Link up, DUT_P1 adjusts the third level signal of the third preset interface of DUT_P1 to the preset level signal, and sends the adjusted third level signal of the third preset interface to VT2516A-B. The DB6 interface of VT2516A-B can receive the third level signal of the third preset interface of DUT_P1. At this point, the device under test completes the sleep wake-up event corresponding to the device under test.

[0127] In a possible implementation, the monitoring module receives the first feedback signal in the following manner:

[0128] The monitoring module receives a first level signal of a first preset interface sent by the first port physical layer chip, and when determining that the first level signal of the first preset interface is a preset level signal, obtains a first receiving time when the first level signal of the first preset interface is received;

[0129] using the first receiving time as a first feedback signal;

[0130] The first feedback signal is sent to the test determination module.

[0131] like Figure 5 As shown, after the DA7 interface of VT2516A-A in the monitoring module receives the first level signal of the first preset interface of LP1_P1, the monitoring module determines whether the first level signal of the first preset interface is a preset level signal. If so, the monitoring module obtains the first receiving time t0 when the DA7 interface receives the first level signal of the first preset interface, uses the first receiving time t0 as the first feedback signal, and then sends the first feedback signal to the test determination module. The test determination module receives the first feedback signal sent by the monitoring module.

[0132] In a possible implementation, the monitoring module receives the second feedback signal in the following manner:

[0133] The monitoring module receives the second level signal of the second preset interface and the third level signal of the third preset interface sent by the second port physical layer chip;

[0134] When it is determined that the second level signal of the second preset interface and the third level signal of the third preset interface are both preset level signals, obtaining a second reception time of the second level signal of the second preset interface and a third reception time of the third level signal of the third preset interface;

[0135] Detecting a duration during which the third level signal of the third preset interface changes to a preset level signal;

[0136] The second receiving time, the third receiving time and the duration are used as a second feedback signal;

[0137] The second feedback signal is sent to the test determination module.

[0138] like Figure 5 As shown, after the DB2 interface of VT2516A-B in the monitoring module receives the second level signal of the second preset interface of DUT_P1 and the DB6 interface of VT2516A-B receives the third level signal of the third preset interface of DUT_P1, it is determined whether the second level signal of the second preset interface and the third level signal of the third preset interface are both preset level signals. If so, the second receiving time t1 of the DB2 interface receiving the second level signal of the second preset interface and the third receiving time t2 of the DB6 interface receiving the third level signal of the third preset interface are obtained, and the duration of the change of the third level signal of the third preset interface to the preset level signal is detected. The duration is also the duration of the third level signal of the third preset interface received by the DB6 interface as the preset level signal. The second receiving time t1, the third receiving time t2 and the duration are used as the second feedback signal, and then the second feedback signal is sent to the test determination module. The test determination module receives the second feedback signal sent by the monitoring module.

[0139] In one possible implementation, the test determination module determines, based on the first feedback signal and the second feedback signal, the consistency between the sleep-wakeup event corresponding to the test device and the sleep-wakeup event corresponding to the device under test, including:

[0140] The test determination module calculates a first difference and a second difference;

[0141] If the first difference is less than the first threshold, the second difference is less than or equal to the second threshold, and the duration is greater than the preset duration, it is determined that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test, indicating that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test;

[0142] If the first difference is less than the first threshold, the second difference is less than or equal to the second threshold, and the duration is greater than the preset duration, it is determined that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test, indicating that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test.

[0143] Among them, the first difference is the difference between the first receiving time and the second receiving time, that is, the above-mentioned t_wkp_unpwrd, and the second difference is the difference between the third receiving time and the second receiving time, that is, the above-mentioned t_wkp_link-up. The first difference is less than the first threshold, indicating that the time between the test device sending the wake-up signal and the device under test receiving the wake-up signal is short, and the second difference is less than or equal to the second threshold, indicating that the time between the device under test receiving the wake-up signal and Link up is short. The duration is greater than the preset duration, indicating that after wake-up, the link connection between the device under test and the test device is stable; the first difference is greater than or equal to the first threshold, indicating that the time between the test device sending the wake-up signal and the device under test receiving the wake-up signal is long, and the second difference is greater than the second threshold, indicating that the time between the device under test receiving the wake-up signal and Link up is long. The duration is less than or equal to the preset duration, indicating that after wake-up, the link connection between the device under test and the test device is stable.

[0144] This embodiment further provides a computer-readable storage medium, in which a computer program code is stored. When the computer program code is run on a computer, the computer executes the above-mentioned related method steps to implement a testing method in the above-mentioned embodiment.

[0145] Among them, the computer-readable storage medium provided in this embodiment is used to execute the corresponding test method provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding test method provided above, and will not be repeated here.

[0146] The above content is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A testing system, characterized in that: The test system includes: a configuration module, a test device, a monitoring module and a test determination module, wherein the test device is connected to the configuration module and the monitoring module respectively, and the monitoring module is connected to the test determination module; The configuration module is used to send a wake-up signal, and the wake-up signal is used to instruct the port physical layer chip to execute a corresponding sleep wake-up event; The monitoring module is configured to receive a first feedback signal and a second feedback signal, and send the first feedback signal and the second feedback signal to the test determination module, wherein the first feedback signal is sent by the test device and is generated according to a sleep-wake-up event corresponding to the test device, and the second feedback signal is sent by the device under test and is generated according to a sleep-wake-up event corresponding to the device under test; The test determination module is configured to determine consistency between the sleep-wakeup event corresponding to the test device and the sleep-wakeup event corresponding to the device under test based on the received first feedback signal and the second feedback signal.

2. The test system according to claim 1, wherein: The configuration module is connected to the test device, the device under test and the monitoring module through an integrated test unit for controller function testing; The monitoring module includes M digital boards for simulating digital signal input or measuring digital signal output, the test device includes M first-port physical layer chips, and the device under test includes M second-port physical layer chips, where M is a positive integer and M≥2; The M digital boards are all connected to the configuration module through the integrated test unit, and the M first-port physical layer chips are connected to the M second-port physical layer chips in a one-to-one correspondence; The Xth second port physical layer chip among the M second port physical layer chips is connected to the X+1th second port physical layer chip, where X is a positive integer, 1≤X<M; The M first-port physical layer chips are connected to i digital boards among the M digital boards in a one-to-one correspondence, and the M second-port physical layer chips are connected to j digital boards among the M digital boards in a one-to-one correspondence, wherein i and j are both positive integers, i+j=M.

3. The test system according to claim 2, wherein: Each first-port physical layer chip in the test device and each second-port physical layer chip in the device under test supports at least two serial interfaces and at least six digital input or output interfaces.

4. The test system according to any one of claims 1 to 3, characterized in that: The configuration module is connected to the test device and the device under test respectively through a preset communication protocol; The device under test includes an in-vehicle Ethernet connection device, which is connected to the test device via an in-vehicle Gigabit Ethernet cable.

5. A testing method, characterized in that: Applied to the test system according to any one of claims 1 to 4, the test method comprises: The configuration module sends a wake-up signal, wherein the wake-up signal instructs the port physical layer chip to execute a corresponding sleep wake-up event; The monitoring module receives a first feedback signal, wherein the first feedback signal is generated according to a sleep-wake-up event corresponding to the test device and sent by the test device; The monitoring module receives a second feedback signal, wherein the second feedback signal is generated according to a sleep-wakeup event corresponding to the device under test and sent by the device under test; The test determination module determines consistency between the sleep-wakeup event corresponding to the test device and the sleep-wakeup event corresponding to the device under test based on the first feedback signal and the second feedback signal.

6. The testing method according to claim 5, characterized in that: The configuration module sends a wake-up signal, and the wake-up signal instructs the port physical layer chip to execute a corresponding sleep wake-up event, including: The configuration module sends a wake-up signal to the first port physical layer chip in the test device, the first port physical layer chip sends the wake-up signal to the second port physical layer chip in the device under test, adjusts the first level signal of the first preset interface in the first port physical layer chip to a preset level signal, and sends the adjusted first level signal of the first preset interface to the monitoring module to execute and complete the sleep wake-up event corresponding to the test device; When the second port physical layer chip receives the wake-up signal sent by the first port physical layer chip, the second port physical layer chip adjusts the second level signal of the second preset interface in the second port physical layer chip to the preset level signal, sends the adjusted second level signal of the second preset interface to the monitoring module, and establishes a connection between the device under test and the test device; and When the device under test establishes a connection with the test device, the second port physical layer chip adjusts the third level signal of the third preset interface in the second port physical layer chip to the preset level signal, and sends the adjusted third level signal of the third preset interface to the monitoring module to execute the sleep wake-up event corresponding to the device under test.

7. The testing method according to claim 6, characterized in that: The monitoring module receiving the first feedback signal includes: The monitoring module receives the first level signal of the first preset interface sent by the first port physical layer chip, and when determining that the first level signal of the first preset interface is the preset level signal, obtains a first receiving time when the first level signal of the first preset interface is received; using the first receiving time as the first feedback signal; The first feedback signal is sent to the test determination module.

8. The testing method according to claim 7, characterized in that: The monitoring module receiving the second feedback signal includes: The monitoring module receives the second level signal of the second preset interface and the third level signal of the third preset interface sent by the second port physical layer chip; When it is determined that the second level signal of the second preset interface and the third level signal of the third preset interface are both the preset level signals, obtaining a second reception time of receiving the second level signal of the second preset interface and a third reception time of receiving the third level signal of the third preset interface; detecting a duration during which the third level signal of the third preset interface changes to the preset level signal; using the second receiving time, the third receiving time, and the duration as the second feedback signal; The second feedback signal is sent to the test determination module.

9. The testing method according to claim 8, characterized in that: The test determination module determines, based on the first feedback signal and the second feedback signal, that the sleep-wake-up event corresponding to the test device is consistent with the sleep-wake-up event corresponding to the device under test: The test determination module calculates a first difference and a second difference, wherein the first difference is a difference between the first receiving time and the second receiving time, and the second difference is a difference between the third receiving time and the second receiving time; If the first difference is less than a first threshold, the second difference is less than or equal to a second threshold, and the duration is greater than a preset duration, it is determined that the sleep wake-up event corresponding to the test device is consistent with the sleep wake-up event corresponding to the device under test; If the first difference is less than the first threshold, the second difference is less than or equal to the second threshold, and the duration is greater than the preset duration, it is determined that the sleep wake-up event corresponding to the test device is inconsistent with the sleep wake-up event corresponding to the device under test.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed, the testing method according to any one of claims 5 to 9 is implemented.

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