Aperture-divided polarization spectrometer of inclined subsystem and detection method of aperture-divided polarization spectrometer

Abstract

The invention relates to the technical field of polarization spectral imaging, in particular to a sub-aperture polarization spectrometer of an inclined subsystem, which comprises a sub-aperture telescopic system, a spectral system and a detector, and is characterized in that the sub-aperture telescopic system comprises four sub-aperture components which are obliquely arranged to realize four-channel imaging; the spectrum system comprises four slits corresponding to the sub-aperture assemblies and used for receiving light beams from the corresponding sub-aperture assemblies; the dispersion element splits the light beam; and the detector receives the light splitting imaging signal to realize multi-channel synchronous detection. Through the aperture division design, the inclined sub-aperture assembly, the corresponding spectrum system and the detector, high-precision analysis can be carried out on a rapidly-changed target, multi-channel signals are imaged in different areas of the detector to realize synchronous detection, the structure compactness and the system integration degree are improved, the system size and weight are remarkably reduced, and the cost is reduced. The problems that during deep space exploration, high-precision analysis cannot be conducted on a rapidly-changing target, and the system is complex in structure and large in size are solved.

Description

Technical Field

[0001] The present invention belongs to the technical field of polarization spectrum imaging, and in particular relates to a split-aperture polarization spectrometer with a tilting subsystem. Background Art

[0002] Deep space exploration is crucial for the search for extraterrestrial life. Currently, the polarization detection methods commonly used in celestial research payloads include rotating polarizers and Wollaston prisms, both of which have limitations that make them unsuitable for deep-space polarization spectroscopy. The rotating polarizer method, exemplified by the POLDER instrument (Polarization and Directionality of the Earth's Reflectances), uses a time-sharing measurement method, making it unsuitable for observing dynamic targets and difficult to perform high-precision analysis of rapidly changing objects such as plumes. The Wollaston prism-based APS (Astronomical Polarization Spectrograph) employs an amplitude-division method, requiring multiple detectors to detect different polarization components. This design results in a complex and bulky system, making it unsuitable for deep-space exploration missions. Summary of the Invention

[0003] In view of this, the present invention aims to provide a split-aperture polarization spectrometer with a tilting subsystem to solve the problems of being unable to perform high-precision analysis of rapidly changing targets during deep space exploration and the complex and bulky system structure.

[0004] To achieve the above object, the technical solution created by the present invention is implemented as follows: A split-aperture polarization spectrometer with a tilt subsystem, comprising: A split-aperture telescope system includes four sub-aperture components for performing four-channel imaging of a target area, and each of the sub-aperture components is tilted relative to the main optical axis of the system; The spectral system includes four slits and a dispersive element. The four slits correspond one-to-one to the four sub-aperture components and are used to receive light beams from the corresponding sub-aperture components. The dispersive element is arranged at the rear end of the slits and is used to split the light beams from the four sub-aperture components. A detector is also provided for receiving the spectroscopic imaging of the spectral system and displayed in different areas of the detector to achieve synchronous detection of multi-channel signals.

[0005] Furthermore, the four sub-aperture assemblies are arranged around the main optical axis in a 2×2 array, the direction of the main optical axis is defined as the X-axis direction, and two sub-aperture assemblies are respectively provided above and below the main optical axis; the two sub-aperture assemblies located above the main optical axis are rotated around the Y-axis and tilted downward, and the two sub-aperture assemblies located below the main optical axis are rotated around the Y-axis and tilted upward, and the four sub-aperture assemblies are symmetrically arranged with the main optical axis as the center axis.

[0006] Furthermore, the absolute value of the angle range of the Y-axis rotation tilt is 2°~4°.

[0007] Furthermore, each of the sub-aperture components includes a sub-channel, a polarizer and a lens. The sub-channel is rotated and tilted around the Y-axis. The polarizer and the lens are arranged in the sub-channel and are arranged at the same tilt angle as the sub-channel.

[0008] Furthermore, the polarization directions of the four polarizers corresponding to the four sub-aperture components are 0°, 45°, 90° and 135° respectively, and the light beam passes through the four polarizers to obtain target images with different polarization states.

[0009] Furthermore, the two slits located on the same straight line are merged into a long slit, and each of the long slits corresponds to two sub-aperture components.

[0010] Furthermore, the detector is a shared detector, which is divided into four sub-areas; the signals of the four sub-aperture components are detected synchronously and displayed in different sub-areas respectively, thereby realizing synchronous measurement of multi-channel signals.

[0011] Furthermore, the slit and its surrounding area are coated with an optical coating to reduce the impact of stray light on imaging quality.

[0012] A detection method for a split-aperture polarization spectrometer based on a tilt subsystem, comprising: Use a split-aperture telescope system to perform four-channel imaging of the target area; The four-channel light beams are subjected to spectroscopic imaging by a spectral system; The detector receives the optical signal after spectroscopic imaging, and records the imaging results of different channels in different areas of the detector, thereby realizing the synchronous detection of multi-channel signals.

[0013] Furthermore, the step of performing four-channel imaging of the target area using the sub-aperture telescopic system includes adjusting the tilt angle of the sub-aperture component.

[0014] Compared with the prior art, the present invention can achieve the following beneficial effects: The present invention uses a sub-aperture design and tilted sub-aperture components to perform four-channel imaging of the target area. By changing the incident angle of light, aberrations are reduced, improving the imaging quality of the system. Simultaneously, combined with a corresponding spectral system and detector, this system achieves synchronous detection and imaging of multi-channel signals, enabling high-precision analysis of rapidly changing targets. Furthermore, by imaging in different detector regions, the overall structural compactness and system integration are improved, significantly reducing the system's volume and weight. This addresses the inability to perform high-precision analysis of rapidly changing targets during deep space exploration, as well as the complex and bulky system structure. It also addresses the current lack of polarization spectral observation capabilities for deep-space objects. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The accompanying drawings, which constitute part of the present invention, are intended to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are intended to explain the present invention and do not constitute an undue limitation of the present invention. In the accompanying drawings: Figure 1 A schematic diagram of the overall principle of an embodiment of the present invention; Figure 2 A schematic structural diagram of a tilted subaperture assembly provided in an embodiment of the present invention; Figure 3 A three-dimensional diagram of a split-aperture telescope system provided by an embodiment of the present invention; Figure 4 A schematic diagram of the polarization modulation direction of the polarizer provided in an embodiment of the present invention; Figure 5 A schematic diagram of detector partitions provided in an embodiment of the present invention; Figure 6 A spot diagram of a divided-aperture telescope system provided by an embodiment of the present invention; Figure 7 A modulation transfer function diagram of a split-aperture telephoto system provided by an embodiment of the present invention; Figure 8 The image plane ray trace diagram provided by the embodiment of the present invention; Figure 9 A comparative analysis diagram of the effective radius of the tilted and non-tilted subsystems provided in an embodiment of the present invention.

[0016] Description of reference numerals: 1. Sub-aperture telescope system; 101. Sub-aperture assembly; 1011. Sub-channel; 1012. Polarizer; 1013. Lens; 2. Principal optical axis; 3. Spectroscopic system; 301. Slit; 302. Dispersion element; 4. Detector. DETAILED DESCRIPTION

[0017] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and do not constitute a limitation to the present invention. Similar elements in different embodiments use associated similar element numbers. In the following embodiments, many detailed descriptions are intended to enable the present invention to be better understood. However, those skilled in the art can easily recognize that some of the features can be omitted in different situations, or can be replaced by other elements, materials, or methods. In some cases, some operations related to the present invention are not shown or described in the specification. This is to avoid the core part of the present invention being overwhelmed by too much description. For those skilled in the art, it is not necessary to describe these related operations in detail. They can fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0018] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments of the present invention can be combined with each other to form various implementation methods. At the same time, the steps or actions in the method description can also be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the various orders in the description and the drawings are only for the purpose of clearly describing a certain embodiment and are not intended to be a required order, unless otherwise specified that a certain order must be followed.

[0019] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0020] In the description of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art can understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0021] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0022] like Figures 1 to 9 As shown, the first aspect of this embodiment provides a sub-aperture polarization spectrometer with a tilted subsystem, including a sub-aperture telescope system 1, a spectroscopic system 3 and a detector 4. The three are designed with the same optical axis, which makes the alignment of the entire optical path simpler and more accurate, and can ensure that the light is efficiently transmitted from the sub-aperture telescope system 1 to the detector 4. The sub-aperture telescope system 1 may include four sub-aperture components 101, and the four sub-aperture components 101 can simultaneously image the target area, thereby realizing four-channel imaging, which means that multiple views or images of multiple bands of the target area can be obtained at the same time. Figure 2 and Figure 3 Each sub-aperture assembly 101 is tilted relative to the main optical axis 2 of the system. The tilted setting can minimize aberration and significantly improve the imaging quality of the system by changing the incident angle of the light.

[0023] Spectroscopic system 3 can include four slits 301 and a dispersive element 302. The four slits 301 can be located on a single plane, and each of the four slits 301 corresponds to each of the four sub-aperture assemblies 101. This ensures that the light beam from the target area captured by each sub-aperture assembly 101 accurately passes through the corresponding slit 301 and enters spectral system 3. This ensures the independence and integrity of the four-channel imaging, and the simultaneous measurement of the four channels greatly improves the efficiency and richness of data acquisition.

[0024] Dispersive element 302 is disposed at the rear end of slit 301. When the light beam passing through slit 301 is incident on dispersive element 302, it splits the light beam according to the wavelength differences. In this embodiment, a grating is used as an example. The grating uses the principle of diffraction to cause light of different wavelengths to be emitted at different angles, thereby forming a spatial spectrum. At the same time, slit 301 serves to limit the width and direction of the light beam, ensuring that the light beam entering dispersive element 302 has good directionality and stability, avoiding interference from stray light, and thus improving the accuracy and resolution of the splitting. It should be noted that in other embodiments, dispersive element 302 can also be a prism. The specific configuration can be based on actual needs and is not limited here.

[0025] Furthermore, integrating the four slits 301 and the dispersive element 302 into the spectral system 3, corresponding one-to-one with the four subaperture assemblies 101, makes the entire system more compact. This compact design reduces the space occupied by the optical components, reduces the system's size and weight, and facilitates installation, commissioning, and portability.

[0026] It should be noted that while tilting the subaperture assembly 101 reduces aberrations, it also causes the image plane to tilt. This prevents the images of the four channels from being formed on the same plane. However, since the spectrometer's observation field of view is the slit 301, the effect of image plane tilt caused by rotational tilt around the central axis, which passes through the center of the slit and extends along its long side, can be ignored.

[0027] After the spectral system 3 performs spectroscopic imaging, the image is displayed in different areas of the detector 4. The detector 4 is responsible for receiving these image images displayed in different areas and realizing the synchronous detection of multi-channel signals. Different areas of the detector 4 correspond to different sub-aperture components 101 and spectral channels. This one-to-one correspondence allows the signal of each channel to be clearly located on the detector 4. Figure 8 As shown, each color corresponds to a channel, and each channel can be imaged independently without interfering with each other. This design ensures the accuracy and independence of multi-channel signal acquisition. During subsequent data processing and analysis, researchers can clearly distinguish the signals from different channels and accurately extract the spectral information contained in each channel. Moreover, by dividing the detector 4 into different areas, it can simultaneously receive spectroscopic imaging signals from the four channels of the spectral system 3. This means that the signals of the four channels can be detected at the same time, greatly improving detection efficiency.

[0028] In actual use, the target area is first imaged through four channels using the sub-aperture telescope system 1. Simultaneously, the tilt angle of the sub-aperture assembly 101 is adjusted according to the specific detection requirements and target characteristics to achieve the best imaging effect. The imaged light enters the spectral system 3, which receives the light through the slit 301 and uses the dispersion element 302 to perform spectroscopic imaging on the four channels. The spectroscopically separated light signals are transmitted to the detector 4, which receives the spectroscopically imaged light signals and records the imaging results of different channels in different areas of the detector 4, ultimately achieving synchronous measurement of multi-channel signals.

[0029] Through the above technical solution, four-channel imaging of the target area is performed through the sub-aperture design and the tilted sub-aperture component 101, and the aberration is reduced by changing the incident angle of the light, thereby improving the imaging quality of the system. At the same time, combined with the corresponding spectral system 3 and the detector 4, synchronous detection and imaging of multi-channel signals are achieved, which can perform high-precision analysis of rapidly changing targets. In addition, by imaging in different areas of the detector 4, the compactness of the overall structure and the system integration are improved, and the system volume and weight are significantly reduced, thereby solving the problems of not being able to perform high-precision analysis of rapidly changing targets during deep space exploration and the complex and bulky system structure. At the same time, it makes up for the current lack of polarization spectral observation capabilities for deep space celestial bodies.

[0030] In some embodiments, the four sub-aperture components 101 are arranged in a 2×2 array. This array arrangement makes the structure of the entire sub-aperture telescope system 1 more compact. Compared with a dispersed arrangement, this array arrangement can reasonably arrange each component in a limited space, effectively reducing the overall volume and space occupied by the system. Figure 2As shown, the direction of the principal optical axis 2 is defined as the X-axis, and two sub-aperture assemblies 101 are respectively positioned above and below the principal optical axis 2. The four sub-aperture assemblies 101 are arranged around the principal optical axis 2, and the optical paths of the four sub-aperture assemblies 101 extend along the X-axis. Then, the two sub-aperture assemblies 101 located above the principal optical axis 2 are rotated about the Y-axis so as to tilt downward, and the two sub-aperture assemblies 101 located below the principal optical axis 2 are rotated about the Y-axis so as to tilt upward. The four sub-aperture assemblies 101 are arranged symmetrically around the principal optical axis 2 as the central axis. This layout can effectively reduce aberrations. When light passes through the tilted sub-aperture assemblies 101, specific aberration patterns are introduced. The symmetrical layout allows the aberrations of the left and right, and upper and lower opposing sub-aperture assemblies 101 to mutually cancel each other out, thereby effectively reducing the overall aberrations of the entire split-aperture telescope system 1, improving the clarity and accuracy of imaging, ensuring higher quality of the acquired target image, and providing reliable basic data for subsequent spectral analysis. Furthermore, the axisymmetric design ensures that the four sub-aperture assemblies 101 have similar optical properties and positional relationships within the optical system, facilitating system commissioning and calibration. During commissioning, each sub-aperture assembly 101 can be adjusted using the same methods and standards, reducing commissioning complexity and workload.

[0031] In some embodiments, the absolute value of the angle range of the subaperture assembly 101 rotation and tilt around the Y-axis is 2° to 4°. Specifically, the tilt angle can be set to 3°. A tilt angle of 3° can maximize the clarity and accuracy of imaging while balancing various aberrations. At the same time, effective observation in the direction of the slit 301 is ensured. If the angle is too large, even if the tilt of the image plane has a relatively small impact on the observation of the slit 301, it may still exceed the effective receiving range of the detector 4 or affect the spectral resolution. If the angle is too small, the tilt subsystem cannot fully play its role in reducing aberrations.

[0032] In some embodiments, each sub-aperture assembly 101 includes a sub-channel 1011, a polarizer 1012, and a lens 1013. The sub-channel 1011 is rotated and tilted around the Y axis. The polarizer 1012 and the lens 1013 are arranged in the sub-channel 1011 and are arranged at the same tilt angle as the sub-channel 1011. Figure 1 As shown, subchannel 1011, polarizer 1012, and lens 1013 are arranged to rotate and tilt at the same angle around the Y-axis, ensuring the consistency of the optical path of light as it propagates within subaperture assembly 101. When light enters subchannel 1011, it passes through polarizer 1012 and lens 1013 in sequence. Because the three are tilted at the same angle, the light does not experience additional refractive deviation or optical path disturbance due to angular differences. This ensures that the light is accurately transmitted in the intended direction and path, maintaining the stability and accuracy of the entire optical system and laying a solid foundation for subsequent imaging.

[0033] In some embodiments, as Figure 4 As shown, the four polarizers 1012 corresponding to the four sub-aperture assemblies 101 have polarization directions of 0°, 45°, 90°, and 135°, respectively. After the light beam passes through the four polarizers 1012, target images with different polarization states can be obtained. Specifically, the four polarizers 1012 can each be a wire-grid polarizer that produces different polarization states. The linearly polarized light of 0°, 45°, 90°, and 135° generated by the light beam passing through the different polarizers 1012 can represent the entire polarization information of the detection target, and upon reaching the detector 4, polarization detection of the same target is achieved. Furthermore, these four different polarization directions improve measurement efficiency, accuracy, and reliability.

[0034] In some embodiments, two slits 301 located on the same line are combined into a single long slit, with each long slit corresponding to two subaperture assemblies 101. By combining the slits 301, the number of slits 301 is reduced, making the structure of the spectral system 3 more concise and compact. Originally, four independent slits 301 required different optical paths and structural designs. However, after combining, only the two long slits need to be optimized, which simplifies the design and assembly of the optical system to a certain extent.

[0035] In some embodiments, the detector 4 is a shared detector, which avoids the problem of increased volume and weight caused by using multiple independent detectors 4, greatly improving the integration of the entire spectrometer system. At the same time, the connection and layout complexity between the detectors 4 are reduced, the overall complexity of the system is reduced, and the reliability of the system is improved. Figure 5 As shown, the detector 4 is divided into four sub-areas. The signals of the four sub-aperture assemblies 101 are detected synchronously and displayed in different sub-areas, respectively, to achieve synchronous measurement of multi-channel signals. When the target changes rapidly, the signals of different channels need to be collected and recorded at the same time to accurately reflect the true state of the target. At the same time, the data of different sub-areas can be directly processed separately, or a fusion analysis of multi-channel data can be performed as needed. For example, when analyzing the polarization characteristics of the target, the sub-area data corresponding to different polarization states can be easily extracted for comparison and comprehensive analysis, thereby gaining a more comprehensive understanding of the polarization characteristics of the target.

[0036] In some embodiments, the slit 301 and its surrounding areas are coated with an optical coating to reduce the impact of stray light on imaging quality. The optical coating can effectively reduce the reflectivity of the slit 301 and its surrounding areas to stray light. When light enters the spectrometer system, in addition to the useful light that enters the subsequent optical elements through the slit 301, there will also be some stray light generated by reflection, scattering, and other reasons on the surface of the optical elements. If these stray lights enter the detector 4, they will interfere with normal imaging and signal acquisition, and reduce the contrast and clarity of the image. After applying the optical coating, the probability of stray light being reflected on the surface of the slit 301 and its surrounding areas is greatly reduced, reducing the possibility of stray light entering the detector 4, thereby improving the imaging quality.

[0037] It should be noted that if the optical coating is not applied uniformly on the slit 301 and its surrounding areas, inconsistent reflectivity or absorptivity will result in different locations. Thus, when stray light passes through the coating, its reflection or absorption conditions will also be different, making it impossible to effectively reduce the impact of stray light. For example, in areas where the coating is thicker, stray light may be excessively reflected or absorbed, while in areas where the coating is thinner, stray light may partially pass through, forming new stray light interference. Therefore, vacuum coating technology can be used in the coating process to ensure the uniformity of the coating. In a vacuum environment, by precisely controlling the evaporation rate and deposition conditions of the coating material, the coating can be uniformly deposited on the slit 301 and its surrounding areas, thereby improving the stray light suppression effect.

[0038] A second aspect of this embodiment provides a detection method of a split-aperture polarization spectrometer based on a tilt subsystem, comprising: S100: Perform four-channel imaging of the target area using the split-aperture telescope system 1.

[0039] Specifically, in step S100 , the tilt angle of the sub-aperture assembly 101 is adjusted to reduce aberrations and improve the imaging quality of the system.

[0040] S200: Spectroscopic imaging is performed on the four-channel light beams through the spectral system 3.

[0041] S300: Receive the optical signal after spectroscopic imaging through the detector 4, and record the imaging results of different channels in different areas of the detector 4 respectively, so as to realize synchronous detection of multi-channel signals.

[0042] In the imaging stage of step S100, four-channel imaging of the target area is performed using the four sub-aperture components 101 of the aperture telescope system 1. Specifically, the sub-aperture components 101 are arranged in a 2×2 array, and the sub-channels 1011, polarizers 1012, and lenses 1013 of each component are designed to be tilted 3° along the Y-axis direction of the main optical axis 2. At the same time, the polarization directions of the polarizer 1012 are set to 0°, 45°, 90°, and 135°, respectively. In this way, by adjusting the tilt angle of the sub-aperture component 101, the aberration can be minimized to make the imaging clearer and more accurate, thereby improving the imaging quality and detection accuracy of the target area. Figure 6 As shown in the figure, it can be seen from the point diagram that the sub-image in the first row of sub-images corresponds to a field of view angle of 0° (i.e., the leftmost sub-image in the first row), which represents the situation of the on-axis point, and the remaining sub-images correspond to different off-axis field of view angles. In contrast, the light spot distribution in the leftmost sub-image in the first row is more concentrated and compact, and is similar in size to the Airy disk; and as the field of view angle increases, such as the second and third rows of sub-images, the degree of diffusion and shape difference of the light spot gradually increase. Therefore, from the above comparison, it can be seen that the image quality of the on-axis point is better than that of the off-axis point, indicating that the system has a higher spatial resolution capability. Figure 7 As shown in the figure, the MTF (Modulation Transfer Function) curve is still higher than 0.6 at 33 (lp / mm), indicating that the system has good contrast transmission capability throughout the entire imaging range. Therefore, it can be judged that the aperture telescope system 1 has excellent imaging quality. Figure 9 The figure shows the root mean square radius (RMS radius) of subaperture assembly 101 under tilted and non-tilted conditions. The figure shows that after tilting subaperture assembly 101, the image quality of the edge field of view improves by approximately 30%, demonstrating that tilting subaperture assembly 101 significantly and effectively improves image quality. Furthermore, target information can be acquired from multiple angles and polarization states, enriching the dimensions of target representation, improving the comprehensiveness and accuracy of information acquisition, and enhancing the ability to analyze and identify target features.

[0043] During the spectroscopic imaging phase of step S200, the four slits 301 (or the two long slits after merging) of the spectral system 3 correspond one-to-one with the four subaperture assemblies 101. Light beams from the subaperture assemblies 101 enter the corresponding slits 301, each with a width of 20 μm, providing preliminary filtering. The light beams then reach the dispersive element 302 (such as a grating or prism) positioned behind the slits 301. This disperser 302 splits the light beams according to their wavelengths, achieving spectroscopic imaging.

[0044] During the detection phase, step S300, a shared detector 4 is used, divided into four sub-areas, to receive the optical signals generated by spectroscopic imaging. The imaging results from different channels are recorded in their corresponding sub-areas, achieving simultaneous multi-channel signal detection. This ensures real-time monitoring of rapidly changing targets, improves system integration, and reduces device size and weight. Furthermore, an optical coating is applied to the slit 301 and its surroundings to reduce stray light interference, further enhancing imaging quality.

[0045] Although the embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art may make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present invention.

[0046] The above specific embodiments of the present invention do not constitute a limitation on the scope of protection of the present invention. Any other corresponding changes and modifications made based on the technical concept of the present invention should be included in the scope of protection of the claims of the present invention.

Claims

1. A split-aperture polarization spectrometer with a tilt subsystem, characterized in that: include A split-aperture telescope system includes four sub-aperture components for performing four-channel imaging of a target area, and each of the sub-aperture components is tilted relative to the main optical axis of the system; A spectroscopy system comprising four slits and a dispersive element, wherein the four slits correspond one-to-one to the four sub-aperture components and are configured to receive light beams from the corresponding sub-aperture components; The dispersive element is arranged at the rear end of the slit and is used to split the light beams of the four sub-aperture components; and a detector for receiving the spectroscopic imaging of the spectral system and displaying it in different areas of the detector to achieve synchronous detection of multi-channel signals.

2. The split-aperture polarization spectrometer of the tilt subsystem according to claim 1, characterized in that: The four sub-aperture assemblies are arranged around the main optical axis in a 2×2 array, the direction of the main optical axis is defined as the X-axis direction, and two sub-aperture assemblies are respectively provided above and below the main optical axis; the two sub-aperture assemblies located above the main optical axis are rotated around the Y-axis and tilted downward, and the two sub-aperture assemblies located below the main optical axis are rotated around the Y-axis and tilted upward, and the four sub-aperture assemblies are symmetrically arranged with the main optical axis as the center axis.

3. The split-aperture polarization spectrometer of the tilt subsystem according to claim 2, characterized in that: The absolute value of the angle range of the Y-axis rotation tilt is 2°~4°.

4. The split-aperture polarization spectrometer with a tilt subsystem according to claim 2, characterized in that: Each sub-aperture assembly includes a sub-channel, a polarizer and a lens. The sub-channel is rotated and tilted around the Y-axis. The polarizer and the lens are arranged in the sub-channel and are arranged at the same tilt angle as the sub-channel.

5. The split-aperture polarization spectrometer with a tilt subsystem according to claim 4, characterized in that: The polarization directions of the four polarizers corresponding to the four sub-aperture components are 0°, 45°, 90° and 135° respectively. After the light beam passes through the four polarizers, target images with different polarization states are obtained.

6. The split-aperture polarization spectrometer with a tilt subsystem according to claim 1, characterized in that: The two slits located on the same straight line are combined into a long slit, and each of the long slits corresponds to two sub-aperture components.

7. The split-aperture polarization spectrometer with a tilt subsystem according to claim 1, characterized in that: The detector is a shared detector, which is divided into four sub-areas; the signals of the four sub-aperture components are detected synchronously and displayed in different sub-areas respectively, thereby realizing synchronous measurement of multi-channel signals.

8. The split-aperture polarization spectrometer with a tilt subsystem according to claim 1, characterized in that: The slit and its surrounding area are coated with an optical coating to reduce the influence of stray light on imaging quality.

9. A detection method for a split-aperture polarization spectrometer based on a tilt subsystem, characterized in that: include: Use a split-aperture telescope system to perform four-channel imaging of the target area; The four-channel light beams are subjected to spectroscopic imaging by a spectral system; The detector receives the optical signal after spectroscopic imaging, and records the imaging results of different channels in different areas of the detector, thereby realizing the synchronous detection of multi-channel signals.

10. The detection method according to claim 9, characterized in that: The step of performing four-channel imaging of the target area using the sub-aperture telescopic system includes adjusting the tilt angle of the sub-aperture component.

Images