Device and method for testing high-frequency magnetic performance of nanocrystalline strip

Abstract

The invention relates to a nanocrystalline strip high-frequency magnetic performance testing device and a testing method, and relates to the technical field of magnetic detection. Comprising a first roll shaft set and a second roll shaft set, the first roll shaft set is arranged on one side of the length direction of the detection chamber, and the second roll shaft set is arranged on the other side of the length direction of the detection chamber in a sliding mode. Pushing pieces are arranged on the two sides of the detection chamber in the width direction. According to the invention, the following problems in the magnetic detection process in the prior art can be solved: the nanocrystalline strip is tested under multiple bending conditions, the actual performance evolution of the material under complex working conditions is reflected, and a key experimental basis is provided for the reliability design of a high-frequency magnetic device. And secondly, by arranging a cooling circulating system, the bent part is cooled, so that magnetic parameter test errors caused by temperature rise are avoided, and the repeatability and comparability of test data are ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of magnetic detection, and in particular to a device and method for testing the high-frequency magnetic properties of nanocrystalline strips. Background Art

[0002] Nanocrystalline ribbon, typically referring to iron-based nanocrystalline alloy ribbon, is a soft magnetic material with excellent properties. Due to its superior soft magnetic properties, nanocrystalline ribbon plays a vital role in high-frequency applications such as power electronics and new energy. Its high-frequency magnetic properties directly determine the performance and efficiency of related equipment, making accurate testing of nanocrystalline ribbon's high-frequency magnetic properties crucial. However, current high-frequency magnetic property testing technology for nanocrystalline ribbon still faces numerous challenges.

[0003] On the one hand, existing testing equipment often only performs bending tests on a single spot on a nanocrystalline ribbon sample, ignoring the multi-dimensional, complex stress environments the ribbon may face during actual use. The limitations of this testing method lead to significant deviations between laboratory data and actual service performance. On the other hand, when repeatedly bending nanocrystalline ribbon, existing testing equipment generally lacks efficient temperature monitoring and control systems, making it impossible to accurately measure the ribbon temperature in a timely manner. Furthermore, it is difficult to stabilize the temperature within a reasonable range through effective heat dissipation or temperature control. Ultimately, errors introduced by temperature fluctuations interfere with the accuracy of test data.

[0004] For example, Chinese patent publication number CN118859054B discloses a nanocrystalline strip magnetic testing device. By cooperating with a friction wheel, a friction plate, and a clamping roller, the clamping roller actively rotates to deliver the nanocrystalline strip toward the center, minimizing the pulling force on the nanocrystalline strip. This reduces the effect of the pulling force on the magnetic performance results, making the final test results more accurate.

[0005] However, the above-mentioned nanocrystalline strip magnetic testing device has some shortcomings in actual use: 1. The above device uses the cooperation of friction wheels, friction plates and clamping rollers to drive the nanocrystalline strip to bend and detect the magnetic properties of the nanocrystalline strip at different bending angles. However, it can only detect the magnetic properties when there is only one bend, and it is difficult to capture the stress superposition effect caused by different bending points.

[0006] 2. The above-mentioned device can test the magnetic properties of nanocrystalline ribbons while they are bent, and can be bent repeatedly and dynamically. However, during the repeated bending process, friction and stress concentration within the nanocrystalline ribbon generate heat, causing the ribbon temperature to rise. This temperature change can significantly affect the magnetic properties of the nanocrystalline ribbon. Excessively high temperatures can alter performance parameters such as the material's magnetic permeability and loss, leading to errors introduced by temperature fluctuations that interfere with the accuracy of the test data.

[0007] Therefore, under the above-stated viewpoint, it is of great significance to improve and perfect the existing magnetic testing equipment for nanocrystalline strips. It can not only detect the magnetic properties of nanocrystalline strips when they are bent in multiple places, but also efficiently monitor and control the temperature. It can use temperature control methods to stabilize the temperature within a reasonable range, thereby reducing the problem of errors introduced by temperature changes interfering with the accuracy of test data. Summary of the Invention

[0008] In order to solve the above problems, the present invention provides a device and method for testing the high-frequency magnetic properties of nanocrystalline strips.

[0009] On the one hand, a high-frequency magnetic property testing device for nanocrystalline strips includes a shielding box, wherein the shielding box is internally separated by a partition into a detection chamber and a working chamber.

[0010] A clamp is provided in the detection chamber along its length direction, and the clamp includes roller group 1 and roller group 2. Roller group 1 is provided on one side of the detection chamber in the length direction, and roller group 2 is slidingly provided on the other side of the detection chamber in the length direction.

[0011] Pushing members are provided on both sides of the detection chamber in the width direction. The pushing members include moving blocks. Slide grooves are provided on both sides of the detection chamber. Multiple moving blocks are slidably arranged in the slide grooves. An electric push rod is installed on the side of the moving block close to the clamp, and a pushing roller is installed on the telescopic end of the electric push rod.

[0012] Preferably, a driving member that carries the moving block to slide in the slide groove is provided in the working chamber, and the driving member includes a driving screw symmetrically arranged inside the working chamber along the width direction of the detection chamber, and a connecting block is threadedly provided on the driving screw.

[0013] Electromagnets are installed on the corresponding sides of the connecting block and the moving block, and the magnetism of the electromagnets on the connecting block and the moving block is opposite.

[0014] Preferably, roller group 1 includes a fixed block, and roller group 2 includes a sliding block. Both the fixed block and the sliding block are provided with a control groove, a bidirectional screw is installed in the control groove, and a clamping roller is symmetrically threaded on the bidirectional screw.

[0015] Preferably, a linkage member is provided inside the detection chamber to drive the second roller group to slide close to the first roller group.

[0016] The linkage part includes a connecting rope, which is arranged between the fixed block and the sliding block. A special-shaped rod is installed at the telescopic end of the electric push rod. A clamping groove is opened at the end of the special-shaped rod away from the electric push rod, and the clamping groove is movably matched with the connecting rope.

[0017] Preferably, a tension member is further provided inside the detection chamber to drive the second roller assembly back to the initial position.

[0018] The tension piece comprises a rotating shaft which is arranged at the bottom of the detection chamber and is rotated by a torsion spring. A pulling rope is wound around the rotating shaft.

[0019] Preferably, friction discs are mounted on both upper and lower ends of the rotating shaft, and friction plates corresponding to the friction discs are inserted on the side walls of the shielding box.

[0020] Preferably, a circulation system for cooling the bending parts of the nanocrystalline strip is installed in the pushing roller. The circulation system includes a cooling pipe. A working chamber is opened in the pushing roller. The cooling pipe is spirally installed on the side wall of the working chamber. The cooling pipes on adjacent pushing rollers pass through the pushing rollers and are connected by spring tubes.

[0021] Preferably, a circulating water chamber is provided on the side of the studio away from the roller group through a partition, a water pump is installed in the shielding box, the water inlet ends of the two spring tubes are connected to the bottom of the circulating water chamber, the water outlet ends of the spring tubes are connected to the water inlet end of the water pump, and the water outlet end of the water pump is connected to the circulating water chamber.

[0022] Preferably, an electric telescopic rod is installed above the circulating water chamber, the telescopic end of the electric telescopic rod extends into the circulating water chamber, and a connecting plate is installed at one end of the two spring tubes located in the circulating water chamber, and the telescopic end of the electric telescopic rod is connected to the connecting plate.

[0023] On the other hand, a method for testing the high-frequency magnetic properties of nanocrystalline strips is as follows: During operation: S1. Sample clamping: Place the cut nanocrystalline ribbon sample inside the shielding box and clamp the two ends of the nanocrystalline ribbon sample with a clamp; S2. Sample bending: Use a push roller to gradually bend the stress points of the nanocrystalline ribbon sample to perform a bending test; S3. Sample cooling: When heat is generated at the bend of the nanocrystalline ribbon sample, the circulation system is used to cool the bend.

[0024] In summary, this application includes at least one of the following beneficial technical effects: 1. The present invention installs multiple slidable moving blocks and arranges retractable pushing rollers on the moving blocks, so that the pushing rollers can control the bending of nanocrystalline ribbon samples at multiple positions and multiple angles. The high-frequency magnetic performance test of the nanocrystalline ribbon is performed under multiple bending conditions, which comprehensively reflects the actual performance evolution of the material under complex working conditions and provides a key experimental basis for the reliability design of high-frequency magnetic devices.

[0025] Second, the present invention provides a cooling circulation system to cool the bending part, thereby avoiding magnetic parameter test errors caused by temperature rise and ensuring the repeatability and comparability of test data.

[0026] 3. The present invention uses the various situations of repeated bending and less bending in the actual application process of nanocrystalline ribbons to simulate various bending situations. The nanocrystalline ribbon samples are subjected to two testing conditions: cooling treatment and temperature interference are introduced to evaluate the ultimate performance of the material under the coexistence of high temperature and high mechanical stress. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The present invention will be further described below with reference to the accompanying drawings and examples.

[0028] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0029] Figure 2 It is a schematic diagram of the structure inside the shielding box of the present invention.

[0030] Figure 3 It is a structural schematic diagram of the clamp of the present invention.

[0031] Figure 4 It is a structural diagram of the pushing member and the linkage member of the present invention.

[0032] Figure 5 It is a structural schematic diagram of the driving member of the present invention.

[0033] Figure 6 It is a schematic diagram of the structure inside the pushing roller of the present invention.

[0034] Figure 7 It is a structural schematic diagram of the circulation system of the present invention.

[0035] Figure 8 It is a structural schematic diagram of the synchronizer of the present invention.

[0036] Figure 9 This invention Figure 8 Schematic diagram of the structure at point A in the middle.

[0037] In the figure, 1. shielding box; 10. detection chamber; 11. working room; 2. clamp; 20. roller group 1; 200. fixed block; 21. roller group 2; 210. sliding block; 22. bidirectional screw; 23. clamping roller; 3. pushing member; 30. moving block; 31. electric push rod; 32. pushing roller; 4. driving member; 40. driving screw; 41. connecting block; 42. electromagnet; 5. linkage member; 50. connecting rope; 51. special-shaped rod; 6. tension member; 60. rotating shaft; 61. pull rope; 62. friction disc; 63. friction plate; 7. circulation system; 70. cooling pipe; 71. spring tube; 72. circulating water chamber; 73. water pump; 74. electric telescopic rod; 75. connecting plate; 8. synchronization member; 80. synchronization wheel 1; 81. support rod; 82. synchronization wheel 2; 83. synchronization belt; 84. control rope. DETAILED DESCRIPTION

[0038] The following combination Figures 1-9 The embodiments of the present invention are described in detail.

[0039] The embodiments of the present application disclose a high-frequency magnetic property testing device and a testing method for nanocrystalline strips. The present invention is mainly used in the process of magnetic detection. In terms of technical effect, it can avoid the problem in the prior art that only a single position can be detected after bending, and it is difficult to capture the stress superposition effect generated when there are different bending points, resulting in insufficient detection data. Furthermore, the present invention can also solve the problem in the prior art that the temperature of the local area of the nanocrystalline strip will increase during repeated bending, which leads to the problem of interference with the accuracy of the data due to the introduction of temperature changes.

[0040] Example 1: Reference Figure 1 、 Figure 2 and Figure 3 As shown, the device comprises a shielding box 1, which is separated by a partition into a detection chamber 10 and a working chamber 11. A sample of cut nanocrystalline ribbon is placed inside the shielding box 1, which is electromagnetically isolated by flexible conductive materials and a grounding design to prevent high-frequency testing from being interfered with by electromagnetic noise in the environment.

[0041] A clamp 2 is provided in the detection chamber 10 along its length direction, and the nanocrystalline strip sample is clamped by the clamp 2. The clamp 2 includes a roller group 1 20 and a roller group 2 21. The roller group 1 20 is provided on one side of the detection chamber 10 in the length direction, and the roller group 2 21 is slidingly provided on the other side of the detection chamber 10 in the length direction.

[0042] During the detection process, roller group 1 20 and roller group 2 21 will clamp the two ends of the nanocrystalline strip sample. The reason for setting the sliding roller group 21 is that when the nanocrystalline strip sample needs to be bent for detection, in order to prevent the roller group 21 from generating a pulling force when clamping the nanocrystalline strip sample, it is necessary to drive the roller group 21 to slide along with the bending of the nanocrystalline strip sample to ensure that the nanocrystalline strip sample remains straight and will not be pulled to cause damage, thereby affecting the detection effect.

[0043] Reference Figure 2 、 Figure 3 and Figure 4 As shown, it is a schematic diagram of the structure that drives the sample to bend; specifically, pushers 3 are provided on both sides of the width direction of the detection chamber 10, and the pushers 3 push the nanocrystalline strip sample in the detection chamber 10 to make it bend. The bending test provides a multi-dimensional performance evaluation method for nanocrystalline strips for high-frequency applications through the correlation analysis of physical deformation and magnetic properties.

[0044] The pushing member 3 includes a moving block 30. Slide grooves are provided on both sides of the detection chamber 10. Multiple moving blocks 30 are slidably arranged in the slide grooves. An electric push rod 31 is installed on the side of the moving block 30 close to the clamp 2, and a pushing roller 32 is installed at the telescopic end of the electric push rod 31.

[0045] By moving the moving block 30, the electric push rod 31 is moved along the length direction of the slide slot. When the electric push rod 31 moves to the specified position, it stops. Then the telescopic end of the electric push rod 31 extends, and the pushing roller 32 on the telescopic end gradually approaches the nanocrystalline strip sample. Under the external force of the pushing roller 32, the force point of the nanocrystalline strip sample is gradually bent. The extension length of the telescopic end of the electric push rod 31 is different, and the bending angle of the nanocrystalline strip sample is different. By setting bending tests with different gradients, the magnetic property retention threshold of the material in a specific application scenario can be verified.

[0046] By installing multiple sliding moving blocks 30, multiple pushing rollers 32 on the moving blocks 30 can control the bending of the nanocrystalline strip sample at multiple positions and multiple angles, comprehensively reflecting the actual performance evolution of the material under complex working conditions, and providing a key experimental basis for the reliability design of high-frequency magnetic devices.

[0047] Reference Figure 4 and Figure 5 As shown, it is a schematic diagram of the structure that drives the pushing roller 32 to move; specifically, a driving member 4 is provided in the studio 11, which carries the moving block 30 to slide in the slide groove, and the driving member 4 includes a driving screw 40 symmetrically arranged inside the studio 11 along the width direction of the detection chamber 10, and a connecting block 41 is threadedly provided on the driving screw 40.

[0048] Electromagnets 42 are installed on corresponding sides of the connecting block 41 and the moving block 30 , and the magnetism of the electromagnets 42 on the connecting block 41 and the moving block 30 is opposite.

[0049] The driving screw 40 is rotated by an external drive control. When the driving screw 40 rotates in the forward direction, the electromagnet 42 on the connecting block 41 is always kept in the on state, while the electromagnets 42 on each moving block 30 are not always in the on state. When a single bending point test is required for the nanocrystalline strip sample, the electromagnet 42 on the moving block 30 close to the roller group 20 is turned on. When the connecting block 41 is close to the moving block 30, the two electromagnets 42 attract each other. At this time, the connecting block 41 moves with sliding, driving the electric push rod 31 on the moving block 30 to move with the pushing roller 32 to the specified position for bending test.

[0050] Furthermore, when multiple bending tests are required, the electromagnet 42 on the moving block 30 that has moved to the specified position is turned off, and the electromagnet 42 on the next moving block 30 is turned on. At this time, the driving screw 40 is rotated in the opposite direction, causing the connecting block 41 to move in the opposite direction until it approaches the next moving block 30. The electromagnet 42 on the connecting block 41 is connected to the electromagnet 42 on the next moving block 30, and moves the next moving block 30 to the specified position. Thus, by driving the rotation of the screw 40, the movement of the moving block 30 can be controlled, and by cooperating with the electromagnet 42 on the connecting block 41 and the moving block 30, the working number of the pushing roller 32 can be controlled to perform high-frequency magnetic performance tests at different numbers of bending points.

[0051] Reference Figure 3 As shown, it is a schematic diagram of the structure for clamping the nanocrystalline strip sample; specifically, the roller group 1 20 includes a fixed block 200, and the roller group 21 includes a sliding block 210. The fixed block 200 and the sliding block 210 are both provided with a control groove, and a bidirectional screw 22 is installed in the control groove, and a clamping roller 23 is symmetrically threaded on the bidirectional screw 22.

[0052] The two ends of the nanocrystalline ribbon sample placed in the detection chamber 10 are placed between the two clamping rollers 23. The two clamping rollers 23 are controlled by the bidirectional screw 22 to move closer to each other, thereby clamping and fixing the two ends of the nanocrystalline ribbon sample.

[0053] Reference Figure 3 and Figure 4 As shown, it is a schematic structural diagram of driving the sliding block 210 to move; specifically, a linkage member 5 is provided inside the detection chamber 10 to drive the roller group 21 to slide close to the roller group 1 20.

[0054] The linkage part 5 includes a connecting rope 50, which is arranged between the fixed block 200 and the sliding block 210. A special-shaped rod 51 is installed at the telescopic end of the electric push rod 31. A clamping groove is provided at the end of the special-shaped rod 51 away from the electric push rod 31, and the clamping groove is movably matched with the connecting rope 50.

[0055] When the electric push rod 31 brings the pushing roller 32 close to the nanocrystalline strip sample, it will simultaneously bring the shaped rod 51 close to the connecting rope 50. When the pushing roller 32 contacts the nanocrystalline strip sample and pushes it to bend, the shaped rod 51 simultaneously contacts the connecting rope 50 and pushes the connecting rope 50. At this time, the connecting rope 50 bends under the push of the shaped rod 51, and at this time, it will pull the sliding block 210 to move toward the fixed block 200.

[0056] Reference Figure 8 and Figure 9 , which is a schematic diagram of the structure for returning the slide block 210 to its initial position. Specifically, a tension member 6 is provided inside the testing chamber 10 to drive the roller assembly 21 back to its initial position. Upon completion of the test, the tension member 6 drives the slide block 210 back to its initial position, preparing for the next test.

[0057] The tension member 6 comprises a shaft 60, which is rotated by a torsion spring and disposed at the bottom of the detection chamber 10. A pull rope 61 is wound around the shaft 60. When the sliding block 210 slides toward the fixed block 200 under the action of the connecting rope 50, the tension of the connecting rope 50 drives the shaft 60 in the reverse direction, at which point the torsion spring accumulates force. When the test is completed, the sliding block 210 loses the tension of the connecting rope 50, and the torsion spring rotates the shaft 60 in the reverse direction. The pull rope 61 on the shaft 60 pulls the sliding block 210 in the reverse direction, returning it to its initial state.

[0058] Friction discs 62 are mounted on both upper and lower ends of the rotating shaft 60 , and friction plates 63 corresponding to the friction discs 62 are inserted into the side walls of the shielding box 1 .

[0059] Since the rotating shaft 60 is arranged in the detection chamber 10 through the torsion spring, after the sliding block 210 loses the tension of the connecting rope 50, the rotating shaft 60 will also lose the tension of the pull rope 61. Due to the instantaneous rebound characteristic of the torsion spring, in order to prevent the instantaneous rebound of the torsion spring from causing the pull rope 61 to instantly pull the sliding block 210, causing damage to the nanocrystalline strip sample, a friction disk 62 and a friction plate 63 are provided. Through the friction force between the friction disk 62 and the friction plate 63, the rotation speed of the rotating shaft 60 is slowed down, so that the pull rope 61 can slowly pull back the sliding block 210 without damaging the nanocrystalline strip sample.

[0060] Reference Figure 6 and Figure 7As shown, it is a schematic structural diagram of cooling the bending portion of the nanocrystalline ribbon sample; specifically, a circulation system 7 for cooling the bending portion of the nanocrystalline ribbon is installed in the pushing roller 32.

[0061] Because nanocrystalline ribbon samples need to be repeatedly bent, both static and dynamic bending tests are performed. Dynamic repeated bending can cause friction and stress concentration within the material to generate heat, leading to an increase in the ribbon's temperature. Temperature changes can significantly affect the magnetic properties of the nanocrystalline ribbon. Excessively high temperatures can alter performance parameters such as the material's magnetic permeability and loss, leading to errors introduced by temperature variations that interfere with the accuracy of the test data. Therefore, a cooling circulation system 7 is required to cool the bends to avoid errors in magnetic parameter testing caused by temperature rise and ensure the repeatability and comparability of the test data.

[0062] The circulation system 7 includes a cooling pipe 70 . A working chamber is opened in the pushing roller 32 . The cooling pipe 70 is spirally installed on the side wall of the working chamber. The cooling pipes 70 on adjacent pushing rollers 32 pass through the pushing rollers 32 and are connected by spring tubes 71 .

[0063] The circulating water in the cooling pipe 70 keeps the pushing roller 32 at a constant temperature. When heat is generated at the bend of the nanocrystalline ribbon sample, the pushing roller 32 with a lower temperature will cool the bend.

[0064] Reference Figure 6 and Figure 7 As shown, it is a structural diagram for ensuring that the water temperature in the cooling pipe 70 is maintained at a low temperature; specifically, a circulating water chamber 72 is provided on the side of the studio 11 away from the roller group 20 through a partition, and a water pump 73 is installed in the shielding box 1. The water inlet ends of the two spring tubes 71 are connected to the bottom of the circulating water chamber 72, the water outlet ends of the spring tubes 71 are connected to the water inlet end of the water pump 73, and the water outlet end of the water pump 73 is connected to the circulating water chamber 72.

[0065] The water in the circulating water chamber 72 can be sucked into the spring tube 71 by the water pump 73, and then enters the cooling tube 70 through the spring tube 71. After passing through the cooling tube 70, it will enter the circulating water chamber 72 by the water pump 73. By exchanging heat between the cooling tube 70 and the water in the circulating water chamber 72, the water in the cooling tube 70 can be kept at a low temperature at all times.

[0066] Reference Figure 6 and Figure 7 As shown, this is a schematic diagram of the structure for controlling the amount of water in the cooling pipe 70; specifically, an electric telescopic rod 74 is installed above the circulating water chamber 72, and the telescopic end of the electric telescopic rod 74 extends into the circulating water chamber 72. A connecting plate 75 is commonly installed at one end of the two spring tubes 71 located in the circulating water chamber 72, and the telescopic end of the electric telescopic rod 74 is connected to the connecting plate 75.

[0067] The electric telescopic rod 74 moves the water inlet end of the spring tube 71 upward, so that it is away from the water in the circulating water chamber 72 and will not circulate through the water pump 73. After the water in the cooling tube 70 is pumped out, no new water will enter the spring tube 71.

[0068] The design of the spring tube 71 can adapt to the lifting and lowering of the connecting plate 75.

[0069] The purpose of this setting is that in the actual application process of nanocrystalline strips, there are various situations such as repeated bending and less bending. In order to simulate the repeated bending situation, the nanocrystalline strip samples are not cooled, temperature interference is introduced, and the ultimate performance of the material in the coexistence of high temperature and high mechanical stress is evaluated.

[0070] Example 2: On the basis of Example 1, in order to further improve the synchronization of roller group 1 20 and roller group 2 21 in clamping the nanocrystalline strip sample, a synchronization member 8 is also proposed, which is conducive to the synchronous clamping of the two ends of the nanocrystalline strip sample to ensure that the clamping tightness remains consistent.

[0071] Reference Figure 8 and Figure 9 As shown, it is a schematic diagram of the structure for controlling the synchronous rotation of the two bidirectional screws 22; specifically, the fixed block 200 and the sliding block 210 are respectively passed through one end of the bidirectional screws 22 on the fixed block 200 and the movable block 30, and a synchronous wheel 80 is installed on each of the two bidirectional screws 22, and a support rod 81 is installed at the bottom of the shielding box 1, and a support block is slidingly provided on the support rod 81, and a synchronous wheel 2 82 is rotatably installed on the support block, and a synchronous belt 83 is commonly provided on the synchronous wheel 1 80 and the synchronous wheel 2 82.

[0072] The two bidirectional screws 22 can rotate synchronously through the cooperation of the synchronous belt 83, the synchronous wheel 1 80 and the synchronous wheel 2 82, ensuring that the clamping roller 23 synchronously clamps the nanocrystalline strip sample, ensuring that the tension at each point of the strip is consistent during movement or testing, preventing uneven stretching due to asynchronous roller speed, and reducing the risk of microcracks or lattice distortion inside the material.

[0073] A control rope 84 is commonly connected between the support block and the sliding block 210 .

[0074] When the sliding block 210 slides close to the fixed block 200 under the action of the connecting rope 50, the sliding block 210 will move downward on the support rod 81 with the support block through the control rope 84. At this time, the synchronous wheel 2 82 on the support block moves synchronously and always contacts the synchronous belt 83, ensuring that the synchronous belt 83 is in a taut state to ensure its working effect.

[0075] During operation: First, the cut nanocrystalline ribbon sample is placed inside the shielding box 1 , and the roller group 1 20 and the roller group 2 21 clamp the two ends of the nanocrystalline ribbon sample.

[0076] Step 2: The moving block 30 moves along the length of the chute with the electric push rod 31, and stops when the electric push rod 31 moves to the designated position. Then the telescopic end of the electric push rod 31 extends, and the pushing roller 32 on the telescopic end gradually approaches the nanocrystalline strip sample. Under the external force of the pushing roller 32, the force point of the nanocrystalline strip sample gradually bends. The different extension lengths of the telescopic end of the electric push rod 31 result in different bending angles of the nanocrystalline strip sample, and bending tests with different gradients are performed. Step 3: When the electric push rod 31 brings the pushing roller 32 close to the nanocrystalline ribbon sample, it will simultaneously bring the shaped rod 51 close to the connecting rope 50. When the pushing roller 32 contacts the nanocrystalline ribbon sample and pushes it to bend, the shaped rod 51 synchronously contacts the connecting rope 50 and pushes the connecting rope 50. At this time, the connecting rope 50 bends under the push of the shaped rod 51, and at this time, it will pull the sliding block 210 to move toward the fixed block 200, preventing the roller group 21 on the sliding block 210 from generating a pulling force when clamping the nanocrystalline ribbon sample.

[0077] Step 4: When the sliding block 210 slides toward the fixed block 200 under the action of the connecting rope 50, the tension of the connecting rope 50 will drive the rotating shaft 60 to rotate in the reverse direction. At this time, the torsion spring will accumulate force. When the test is completed, the sliding block 210 loses the tension of the connecting rope 50. At this time, the torsion spring will drive the rotating shaft 60 to rotate in the reverse direction. The pull rope 61 on the rotating shaft 60 will pull the sliding block 210 in the reverse direction and bring the sliding block 210 back to the initial state.

[0078] Step 5: During the testing process, if it is necessary to cool the bend of the sample, the water in the circulating water chamber 72 can be sucked into the spring tube 71 by using the water pump 73, and then enters the cooling tube 70 through the spring tube 71. After passing through the cooling tube 70, the water will enter the circulating water chamber 72 by the water pump 73. By exchanging heat between the cooling tube 70 and the water in the circulating water chamber 72, it can be ensured that the water in the cooling tube 70 always maintains a low temperature. When heat is generated at the bend of the nanocrystalline strip sample, the pushing roller 32 with a lower temperature will cool the bend.

[0079] It is obvious to those skilled in the art that the present invention is not limited to the details of the above-mentioned exemplary embodiments, and that the present invention can be implemented in other specific forms without departing from the spirit or basic characteristics of the present invention. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-restrictive.

[0080] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

Claims

1. A device for testing the high-frequency magnetic properties of nanocrystalline strips, comprising a shielding box (1), characterized in that: The shielding box (1) is internally separated by a partition into a detection chamber (10) and a working chamber (11); A clamp (2) is provided in the detection chamber (10) along its length direction, the clamp (2) comprising a roller group 1 (20) and a roller group 2 (21), the roller group 1 (20) being provided on one side of the detection chamber (10) in the length direction, and the roller group 2 (21) being slidably provided on the other side of the detection chamber (10) in the length direction; Pushing members (3) are provided on both sides of the detection chamber (10) in the width direction. The pushing members (3) include moving blocks (30). Slide grooves are provided on both sides of the detection chamber (10). A plurality of moving blocks (30) are slidably arranged in the slide grooves. An electric push rod (31) is installed on one side of the moving block (30) close to the clamp (2). A pushing roller (32) is installed at the telescopic end of the electric push rod (31).

2. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: A driving member (4) is provided in the working room (11) and is configured to slide in the chute with the moving block (30). The driving member (4) includes a driving screw (40) symmetrically arranged in the working room (11) along the width direction of the detection room (10). A connecting block (41) is threadedly provided on the driving screw (40). Electromagnets (42) are installed on the corresponding sides of the connecting block (41) and the moving block (30), and the electromagnets (42) on the connecting block (41) and the moving block (30) have opposite magnetic properties.

3. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: The roller assembly (20) includes a fixed block (200), and the roller assembly (21) includes a sliding block (210). The fixed block (200) and the sliding block (210) are both provided with a control groove, a bidirectional screw (22) is installed in the control groove, and a clamping roller (23) is symmetrically threadedly installed on the bidirectional screw (22).

4. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: A linkage member (5) is provided inside the detection chamber (10) for driving the second roller group (21) to slide close to the first roller group (20); The linkage member (5) includes a connecting rope (50), which is arranged between the fixed block (200) and the sliding block (210). A special-shaped rod (51) is installed at the telescopic end of the electric push rod (31). A clamping groove is provided at one end of the special-shaped rod (51) away from the electric push rod (31), and the clamping groove is movably matched with the connecting rope (50).

5. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: A tension member (6) is also provided inside the detection chamber (10) for driving the second roller group (21) back to the initial position; The tension member (6) comprises a rotating shaft (60) which is arranged at the bottom of the detection chamber (10) and is rotated by a torsion spring, and a pulling rope (61) is wound around the rotating shaft (60).

6. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 5, characterized in that: Friction discs (62) are clamped and mounted on both upper and lower ends of the rotating shaft (60), and friction plates (63) corresponding to the friction discs (62) are inserted on the side walls of the shielding box (1).

7. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: A circulation system (7) for cooling the bending portion of the nanocrystalline strip is installed in the pushing roller (32). The circulation system (7) includes a cooling pipe (70). A working chamber is opened in the pushing roller (32). The cooling pipe (70) is spirally installed on the side wall of the working chamber. The cooling pipes (70) on adjacent pushing rollers (32) pass through the pushing rollers (32) and are connected through spring tubes (71).

8. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 7, characterized in that: A circulating water chamber (72) is provided on one side of the studio (11) away from the roller group (20) through a partition. A water pump (73) is installed in the shielding box (1). The water inlet ends of the two spring tubes (71) are connected to the bottom of the circulating water chamber (72), the water outlet ends of the spring tubes (71) are connected to the water inlet end of the water pump (73), and the water outlet end of the water pump (73) is connected to the circulating water chamber (72).

9. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 8, characterized in that: An electric telescopic rod (74) is installed above the circulating water chamber (72), and the telescopic end of the electric telescopic rod (74) extends into the circulating water chamber (72). A connecting plate (75) is installed on one end of the two spring tubes (71) located in the circulating water chamber (72), and the telescopic end of the electric telescopic rod (74) is connected to the connecting plate (75).

10. A method for testing high-frequency magnetic properties of nanocrystalline ribbons, further comprising a device for testing high-frequency magnetic properties of nanocrystalline ribbons according to any one of claims 1 to 9, characterized in that: The test method is as follows: S1. Sample clamping: placing the cut nanocrystalline ribbon sample inside the shielding box (1), and clamping the two ends of the nanocrystalline ribbon sample with a clamp (2); S2, sample bending: using a pushing roller (32) to gradually bend the stress points of the nanocrystalline strip sample to perform a bending test; S3. Sample cooling: When heat is generated at the bend of the nanocrystalline ribbon sample, the bend is cooled using the circulation system (7).

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