Display panel diffraction ratio testing device and system

Abstract

The present application relates to a display panel diffraction ratio testing device and system, the display panel diffraction ratio testing device comprising a machine and a light emitting component, a collimating component, a first test platform, a second test platform and a light receiving component sequentially arranged on the machine, the collimating component being used to collimate the test light beam emitted by the light emitting component; the first test platform and the second test platform being used to carry the panel to be tested, when the panel to be tested is placed on the first test platform or the second test platform, the panel to be tested can receive the test light beam collimated by the collimating component, the first test platform being close to the collimating component, and the second test platform being close to the light receiving component; the light receiving component being able to collect the test light beam transmitted by the panel to be tested, and being used to analyze the transmitted test light beam. The light receiving component collects and analyzes the zero-order diffraction light or all diffraction light of the panel to be tested at two positions, and calculates the diffraction light ratio of the two positions, in order to test the transmittance and clarity of the panel to be tested.

Description

Technical Field

[0001] The present application relates to the technical field of display panel manufacturing, and in particular to a display panel diffraction ratio testing device and system. Background Art

[0002] With the advancement of display technology, display screen technology is constantly being upgraded. While pursuing high-quality visuals, the screen-to-body ratio has also become a goal of continuous improvement. To achieve a 100% screen-to-body ratio and realize a full-screen display, under-screen camera technology has emerged in response to this era. Under-screen camera technology hides the camera (such as the front camera on a mobile phone) under the screen, allowing the display to occupy the entire display surface. The display above the camera is used for screen display when the camera is off, and transforms into a transparent state when the camera is on, facilitating video recording.

[0003] Currently, existing display panels used for under-display camera technology require internal pixel circuits and other wiring because they need to implement the display function above the camera. However, these repetitive pixel circuits not only reduce the transparency of the screen, but also cause diffraction and interference when light enters the display panel during camera recording, ultimately resulting in blurry or abnormal camera images. Therefore, how to conduct transmittance testing on display panels used in under-display cameras during the factory process has become an urgent problem to be solved. Summary of the Invention

[0004] Based on this, it is necessary to provide a display panel diffraction ratio testing device and system to address the problem of transmittance testing of display panels currently used for under-screen cameras.

[0005] A display panel diffraction ratio testing device includes a machine platform and a light emitting component, a collimating component, a first testing platform, a second testing platform, and a light receiving component sequentially arranged on the machine platform. The collimating component is used to collimate the test light beam emitted by the light emitting component.

[0006] The first test platform and the second test platform are both used to carry a panel to be tested. When the panel to be tested is placed on the first test platform or the second test platform, the panel to be tested can receive the test light beam collimated by the collimating component. The first test platform is close to the collimating component, and the second test platform is close to the light receiving component.

[0007] The light collecting component can collect the test light beam transmitted by the panel to be tested and is used to analyze the transmitted test light beam.

[0008] In one embodiment, the display panel diffraction ratio testing device further includes an aperture assembly, the aperture assembly being disposed on the platform and located between the collimating assembly and the light receiving assembly, the aperture assembly being used to limit the test light beam collimated by the collimating assembly;

[0009] Among them, the first test platform is located between the collimating assembly and the aperture assembly, and the panel to be tested carried by the first test platform can receive the test light beam collimated by the collimating assembly; the second test platform is located between the aperture assembly and the light receiving assembly, and the panel to be tested carried by the second test platform can receive the test light beam restricted by the aperture assembly.

[0010] In one embodiment, the aperture assembly includes a first optical bench, a first adjustment module, a first connecting rod, a first mounting frame and a plurality of variable apertures, wherein the first optical bench is movably connected to the machine platform, the first adjustment module is disposed on the first optical bench, the first mounting frame is telescopically connected to the first adjustment module via the first connecting rod, and the plurality of variable apertures are spaced apart on the first mounting frame along the transmission direction of the test beam.

[0011] In one embodiment, the first test platform and the second test platform both include a movable frame, a second adjustment module and a carrier. The movable frame is movably disposed on the machine along the transmission direction of the test beam, the second adjustment module is disposed on the movable frame, and the carrier is detachably connected to the second adjustment module.

[0012] In one embodiment, the collimation assembly includes a second optical bench, a second connecting rod, a second mounting frame and a plurality of optical lenses. The second optical bench is movably connected to the machine platform. The second mounting frame is telescopically connected to the second optical bench via the second connecting rod, and the second mounting frame is movable relative to the second optical bench. The plurality of optical lenses are spaced apart on the second mounting frame along the transmission direction of the test beam.

[0013] In one embodiment, the collimating assembly further includes a light inlet and a light outlet, the light inlet and the light outlet are spaced apart at opposite ends of the second mounting frame along the transmission direction of the test beam, and the light inlet is connected to the light outlet assembly.

[0014] In one embodiment, the collimation assembly further includes a color filter and a plurality of adjustment mounts;

[0015] The color filter is arranged on the second mounting frame and is used to filter the test light beam;

[0016] The plurality of adjustment frames are correspondingly connected to the plurality of optical lenses, and the adjustment frames are used to adjust the positions of the optical lenses.

[0017] In one embodiment, the light collecting assembly includes a mounting base, a third adjustment module, a fixing frame, an integrating sphere and a spectrometer. The mounting base is fixed to the machine, the third adjustment module is arranged on the mounting base, and the integrating sphere is rotatably connected to the third adjustment module through the fixing frame. The integrating sphere is used to collect the test light beam after being transmitted by the panel to be tested and is connected to the spectrometer.

[0018] In one embodiment, the display panel diffraction ratio testing device further includes a light shield, which is disposed on the machine and covers the outside of the light emitting component, the collimating component, the first testing platform, the second testing platform and the light receiving component.

[0019] A display panel diffraction ratio testing system, comprising:

[0020] A display panel diffraction ratio testing device as described in any of the above technical solutions.

[0021] In the above-mentioned display panel diffraction ratio testing device and system, the light-emitting component emits a test light beam and is collimated by the collimating component. The collimated test light beam can be projected onto the panel to be tested carried by the first test platform, and is collected and analyzed by the light-receiving component after passing through the panel to be tested carried by the first test platform. The collimated test light beam can also be projected onto the panel to be tested on the second test platform, and is collected and analyzed by the light-receiving component after passing through the panel to be tested carried by the second test platform. The display panel diffraction ratio testing device provided in the present application has a first test platform close to the collimating component and a long distance from the light-receiving component. When the test light beam is projected onto the panel to be tested carried by the first test platform, it is greatly affected by the diffraction and interference of the panel to be tested. Part of the test light beam is diffusely reflected to the outside due to diffraction and is not collected by the light-receiving component. The light-receiving component only collects part of the zero-order diffraction light that is not diverged to the outside. Since the second test platform is close to the light-receiving component, when the test light beam is projected onto the panel to be tested carried by the second test platform, it is less affected by the diffraction and interference of the panel to be tested. The transmitted test light beam is completely collected by the light-receiving component. The light-receiving component collects and analyzes the zero-order diffraction light or all the diffraction light of the panel to be tested at two positions, and calculates the diffraction light ratio of the two positions to test the transmittance and clarity of the panel to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 Schematic diagram of the structure of a display panel diffraction ratio testing device provided in some embodiments.

[0023] Figure 2 It is a side view of a display panel diffraction ratio testing device provided in some embodiments.

[0024] Figure 3 Schematic diagram of the test process flow of the display panel diffraction ratio testing device provided in some embodiments.

[0025] Figure 4 Schematic diagram of the test process flow of the display panel diffraction ratio testing device provided in some embodiments.

[0026] Figure 5 This is a flow chart of the testing process of the first testing platform provided in some embodiments.

[0027] Figure 6 This is a flow chart of the second test platform provided in some embodiments during the test process.

[0028] Figure 7 Schematic diagram of the structure of the aperture assembly provided in some embodiments.

[0029] Figure 8 Schematic diagram of the structure of the first test platform and the second test platform provided in some embodiments.

[0030] Figure 9 Schematic diagram of the structure of the collimation assembly provided in some embodiments.

[0031] Figure 10 Schematic diagram of the structure of the light receiving component provided in some embodiments.

[0032] Reference numerals:

[0033] 100. Display panel diffraction ratio testing device;

[0034] 110. Machine; 111. Isolation platform; 120. Light output assembly; 130. Collimation assembly; 131. Second optical bench; 132. Second connecting rod; 133. Second mounting bracket; 134. Optical lens; 135. Light inlet; 136. Light outlet; 137. Color filter; 138. Adjustment bracket; 140. First test platform; 150. Second test platform; 160. Light receiving assembly; 161. Mounting base; 162. Third adjustment module; 163. Fixed bracket; 164. Integrating sphere; 165. Spectrometer; 170. Aperture assembly; 171. First optical bench; 172. First adjustment module; 173. First connecting rod; 174. First mounting bracket; 175. Variable aperture; 180. Moving bracket; 181. Second adjustment module; 182. Carrier; 1821. Carrying cavity. DETAILED DESCRIPTION

[0035] To make the above-mentioned objects, features, and advantages of the present application more clearly understood, the specific embodiments of the present application are described in detail below with reference to the accompanying drawings. The following description sets forth many specific details to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar improvements without violating the scope of the present application. Therefore, the present application is not limited to the specific embodiments disclosed below.

[0036] In the description of this application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing this application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.

[0037] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include at least one of such features. In the description of this application, if the term "plurality" appears, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0038] In this application, unless otherwise specified or limited, the terms "mounted," "connected," "connected," "fixed," etc., should be interpreted broadly. For example, these terms may refer to fixed connections, removable connections, or integration; mechanical connections or electrical connections; direct connections or indirect connections through an intermediary; and internal communication between two components or interaction between two components, unless otherwise specified. Those skilled in the art will understand the specific meanings of these terms in this application based on the specific circumstances.

[0039] In this application, unless otherwise expressly specified or limited, if a first feature is described as being "above" or "below" a second feature, or similar descriptions, this may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Furthermore, when a first feature is described as being "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is described as being "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0040] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only embodiment.

[0041] The technical solutions provided by the embodiments of the present application are described below with reference to the accompanying drawings.

[0042] See Figure 1-Figure 4 As shown, the present application provides a display panel diffraction ratio testing device 100, which includes a machine 110, a light emitting component 120, a collimating component 130, a first testing platform 140, a second testing platform 150, and a light receiving component 160. The display panel diffraction ratio testing device 100 is used to test the transmittance quality of the panel to be tested, so as to analyze the diffraction, interference and other issues of the incident light beam to the panel to be tested. Among them, the collimating component 130 is used to collimate the test light beam emitted by the light emitting component 120. For example, the light emitting component 120 includes a light source generator and an optical fiber. The light source generator is connected to the collimating component 130 through the optical fiber to project the test light beam to the collimating component 130. The test light beam is collimated by the collimating component 130 to improve the directional consistency and stability of the test light beam. In addition, the light-emitting component 120, the collimating component 130, the first test platform 140, the second test platform 150 and the light-receiving component 160 are all arranged on the machine 110. For example, the light-emitting component 120, the collimating component 130, the first test platform 140, the second test platform 150 and the light-receiving component 160 are arranged at intervals along the transmission direction of the test light beam. The machine 110 is provided with a vibration isolation platform 111, so that when the light-emitting component 120, the collimating component 130, the first test platform 140, the second test platform 150 and the light-receiving component 160 are arranged on the machine 110, the stability of each component can be improved, thereby improving the transmission quality of the test light beam.

[0043] The first test platform 140 and the second test platform 150 are both used to carry the panel to be tested. When the panel to be tested is placed on the first test platform 140 or the second test platform 150, the panel to be tested can receive the test light beam collimated by the collimating component 130. For example, when the panel to be tested is placed on the first test platform 140, the panel to be tested performs an incident light transmittance test on the first test platform 140, and when the panel to be tested is placed on the second test platform 150, the panel to be tested performs an incident light transmittance test on the second test platform 150. The first test platform 140 is close to the collimating component 130, and the second test platform 150 is close to the light receiving component 160. For example, in the transmission direction of the test light beam, the distance between the first test platform 140 and the light receiving component 160 is greater than the distance between the second test platform 150 and the light receiving component 160. It should be noted that, in this embodiment, placing the panel to be tested on the first test platform 140 or the second test platform 150 can be understood as: the panel to be tested is selectively placed on one of the first test platform 140 or the second test platform 150, that is, when the panel to be tested is placed on the first test platform 140, the second test platform 150 does not support the panel to be tested; when the panel to be tested is placed on the second test platform 150, the first test platform 140 does not support the panel to be tested.

[0044] The light receiving assembly 160 can collect the test light beam transmitted by the panel to be tested, and the light receiving assembly 160 is used to analyze the test light beam after transmission. Figure 3 As shown, when analyzing the incident light transmittance of the panel to be tested carried by the first test platform 140, the light emitting component 120 emits a test light beam and the test light beam, after being collimated by the collimating component 130 along the path a, can be projected onto the panel to be tested carried by the first test platform 140 along the path a. After being transmitted by the panel to be tested carried by the first test platform 140, the test light beam is collected and analyzed by the light receiving component 160. Figure 4 As shown, when the incident light transmittance analysis is performed on the panel to be tested carried by the second test platform 150, the light emitting component 120 emits a test light beam and the test light beam collimated by the collimating component 130 along path b can be projected onto the panel to be tested carried by the second test platform 150 along path b. After being transmitted through the panel to be tested carried by the second test platform 150, it is collected and analyzed by the light receiving component 160.

[0045] In the display panel diffraction ratio testing device 100, since the first testing platform 140 is close to the collimating assembly 130 and the distance between the first testing platform 140 and the light receiving assembly 160 is relatively long, when the test beam is projected onto the panel under test supported by the first testing platform 140, the test beam is significantly affected by the diffraction and interference of the panel under test. Part of the test beam is diffusely reflected to the outside due to diffraction and is not collected by the light receiving assembly 160. The light receiving assembly 160 only collects the portion of zero-order diffracted light that is not dispersed to the outside. Figure 5 As shown, after the test beam a is collimated by the collimating assembly 130 and is diffracted and interfered by the panel under test carried by the first test platform 140, the test beam a is dispersed into beam a1 and beam a2. Due to the long distance between the first test platform 140 and the light receiving assembly 160, the beam a2 diverges to the outside of the light receiving assembly 160 and is not collected by the light receiving assembly 160. Only the beam a1 is not diverged to the outside and is collected by the light receiving assembly 160. Because the second test platform 150 is close to the light receiving assembly 160, when the test beam is projected onto the panel under test carried by the second test platform 150, the test beam is less affected by the diffraction and interference of the panel under test, and the entire test beam is collected by the light receiving assembly 160. Figure 6 As shown, after being collimated by collimation assembly 130, test beam b is diffracted and interfered by the panel under test supported by second test platform 150, resulting in the test beam being dispersed into beam b1 and beam b2. Due to the close distance between second test platform 150 and light receiving assembly 160, both beams b1 and b2 can enter light receiving assembly 160, which can collect all diffracted light. In this way, light receiving assembly 160 collects and analyzes zero-order diffracted light or all diffracted light from the panel under test at two locations and calculates the diffracted light ratio at the two locations to test the transmittance and clarity of the panel under test.

[0046] It should be noted that both the first test platform 140 and the second test platform 150 are hollow structures. When the panel to be tested is placed on the first test platform 140, the second test platform 150 will not interfere with the test light beam after it passes through the panel to be tested, and when the panel to be tested is placed on the second test platform 150, the first test platform 140 will not interfere with the test light beam after it passes through the panel to be tested. By calculating the diffracted light ratio at two positions through the light receiving component 160, the transmission performance of the panel to be tested at different distances from the light receiving component 160 can be characterized. After the panel to be tested is tested, the manufacturing and installation of the panel to be tested can be corrected to reduce the scattering effect of the panel to be tested on the incident light beam while ensuring that the panel to be tested has good light transmission performance, thereby reducing problems such as diffraction and interference of the incident light beam by the panel to be tested.

[0047] In one embodiment, see Figure 1 、 Figure 2 and Figure 7As shown, the display panel diffraction ratio testing apparatus 100 further includes an aperture assembly 170. Aperture assembly 170 is disposed on the platform 110 and positioned between the collimating assembly 130 and the light-receiving assembly 160. Aperture assembly 170 is used to limit the test beam collimated by the collimating assembly 130. For example, aperture assembly 170 can limit the aperture angle, field of view, and other parameters of the collimated test beam. Positioned between the collimating assembly 130 and the light-receiving assembly 160, aperture assembly 170 can further calibrate the parallelism of the test beam during transmission and filter test beams of specific colors, thereby ensuring the purity of the test beam and improving the reliability of the test after the test beam passes through the panel under test.

[0048] The first test platform 140 is located between the collimating assembly 130 and the aperture assembly 170. The panel under test carried by the first test platform 140 can receive the test beam collimated by the collimating assembly 130 to test the panel's transmittance with respect to the test beam collimated by the collimating assembly 130. The second test platform 150 is located between the aperture assembly 170 and the light receiving assembly 160. The panel under test carried by the second test platform 150 receives the test beam restricted by the aperture assembly 170 to test the panel's transmittance with respect to the test beam collimated by the collimating assembly 130 and the test beam restricted by the aperture assembly 170.

[0049] In this way, by disposing the aperture assembly 170 between the first test platform 140 and the second test platform 150 , it is possible to perform a characterization test on whether the transmittance performance of the test panel at two different positions is affected by the aperture assembly 170 .

[0050] Specifically, see Figure 1 、 Figure 2 and Figure 7As shown, the aperture assembly 170 includes a first optical bench 171, a first adjustment module 172, a first connecting rod 173, a first mounting bracket 174, and a plurality of variable apertures 175. The first optical bench 171 is movably connected to the machine platform 110. For example, if the machine platform 110 is equipped with a breadboard, the first optical bench 171 is movably connected to the machine platform 110 to movably connect the aperture assembly 170 to the machine platform 110. By adjusting the position of the aperture assembly 170, the alignment accuracy between the aperture assembly 170 and the test beam can be adjusted. The first adjustment module 172 is mounted on the first optical bench 171, and the first mounting bracket 174 is telescopically connected to the first adjustment module 172 via the first connecting rod 173. The plurality of variable apertures 175 are spaced apart on the first mounting bracket 174 along the transmission direction of the test beam. For example, if the first adjustment module 172 is an XYZ three-axis adjustment module, the first adjustment module 172 can adjust the position of the variable aperture 175 in three dimensions. The first connecting rod 173 is a telescopic rod. By extending and retracting the first connecting rod 173, the alignment between the variable aperture 175 and the test beam can be adjusted. Multiple variable apertures 175 can also be used to limit the collimated test beam. Preferably, multiple first connecting rods 173 are provided. This can improve the stability of the variable aperture 175, thereby ensuring the transmission stability of the test beam. Furthermore, in this embodiment, the first mounting bracket 174 is a cage mount, facilitating the installation of the variable aperture 175.

[0051] The display panel diffraction ratio testing apparatus 100, through the first optical bench 171, first adjustment module 172, and first connecting rod 173, increases the adjustable flexibility of the variable aperture 175, improving the alignment accuracy between the aperture assembly 170 and the test beam. Furthermore, the variable aperture 175 limits the test beam, allowing for characterization of whether the transmittance of the panel under test at two different positions is affected by the aperture assembly 170.

[0052] In one embodiment, see Figure 1 、 Figure 2 and Figure 8As shown, the first test platform 140 and the second test platform 150 both include a movable frame 180, a second adjustment module 181, and a carrier 182. The movable frame 180 is movably disposed on the machine 110 along the transmission direction of the test beam. For example, if the machine 110 is provided with a breadboard, the movable frame 180 is movably disposed on the machine 110 to movably dispose the first test platform 140 and the second test platform 150 on the machine 110. By adjusting the positions of the first test platform 140 and the second test platform 150, the distance between the panel under test supported by the first test platform 140 and the collimation assembly 130, and the distance between the panel under test supported by the first test platform 140 and the light receiving assembly 160 can be adjusted. The distance between the panel under test supported by the second test platform 150 and the collimation assembly 130, and the distance between the panel under test supported by the second test platform 150 and the light receiving assembly 160 can also be adjusted. In this way, the positions of the first test platform 140 and the second test platform 150 can be adjusted according to different requirements to test the transmittance performance of the panels under test at different positions. The second adjustment module 181 is arranged on the movable frame 180, and the carrier 182 is detachably connected to the second adjustment module 181. The carrier 182 is provided with a carrying cavity 1821, and the carrying cavity 1821 is used to carry the panel to be tested. Preferably, the carrying cavity 1821 is a contoured cavity to improve the stability of the panel to be tested placed on the carrier 182. For example, if the second adjustment module 181 is an XYZ three-axis adjustment module, the second adjustment module 181 can adjust the posture of the carrier 182 in three-dimensional space. The carrier 182 is detachably connected to the second adjustment module 181 by magnetic attraction, snap-on connection, etc. By replacing different carriers 182, it can adapt to the test operation of panels to be tested of different specifications, thereby expanding the application scenarios of the display panel diffraction ratio testing device 100.

[0053] The display panel diffraction ratio testing device 100 can increase the adjustment flexibility of the carrier 182 through the movable frame 180 and the second adjustment module 181, thereby improving the alignment accuracy between the panel to be tested carried by the carrier 182 and the test beam. The second adjustment module 181 adjusts the position of the carrier 182 to adapt to the transmittance performance test of the panel to be tested according to different requirements.

[0054] In one embodiment, see Figure 1 、 Figure 2 and Figure 9As shown, collimation assembly 130 includes a second optical bench 131, a second connecting rod 132, a second mounting bracket 133, and a plurality of optical lenses 134. Second optical bench 131 is movably connected to platform 110. For example, if platform 110 is provided with a breadboard, second optical bench 131 is movably connected to platform 110 to movably connect collimation assembly 130 to platform 110. By adjusting collimation assembly 130, the alignment accuracy between collimation assembly 130 and the test beam can be adjusted. Second mounting bracket 133 is telescopically connected to second optical bench 131 via second connecting rod 132. A plurality of optical lenses 134 are spaced apart on second mounting bracket 133 along the transmission direction of the test beam. Exemplarily, second connecting rod 132 is a telescopic rod. By extending and retracting second connecting rod 132, the position of optical lens 134 and the test beam can be adjusted. When the test beam passes through optical lens 134, optical lens 134 redistributes the propagation path of the test beam, improving the parallelism of the test beam and collimating the test beam emitted by light output assembly 120. Preferably, multiple second connecting rods 132 are provided. The presence of multiple second connecting rods 132 can improve the stability of optical lens 134, thereby ensuring the transmission stability of the test beam. Furthermore, in this embodiment, second mounting bracket 133 is a cage-type mounting bracket to facilitate the installation of optical lens 134.

[0055] The display panel diffraction ratio testing device 100 can increase the adjustment flexibility of the optical lens 134 through the second optical bench 131 and the second connecting rod 132 , thereby improving the alignment accuracy between the optical lens 134 and the test beam.

[0056] Specifically, see Figure 1 、 Figure 2 and Figure 9 As shown, the collimation assembly 130 further includes a light inlet 135 and a light outlet 136. The light inlet 135 and the light outlet 136 are spaced apart at opposite ends of the second mounting frame 133 along the transmission direction of the test beam, and the light inlet 135 is connected to the light outlet assembly 120. For example, in this embodiment, the light inlet 135 is located at the top side of the second mounting frame 133, and the light outlet 136 is located at the bottom side of the second mounting frame 133. A fiberglass tube is provided between the light inlet 135 and the light outlet 136 to reduce loss of the test beam during transmission.

[0057] In the above-mentioned display panel diffraction ratio testing device 100, the test light beam emitted by the light output component 120 enters the collimating component 130 through the light inlet 135, is collimated by the collimating component 130, and is emitted from the light output port 136. During the collimated transmission process of the test light beam, the test light beam is transmitted in the glass fiber tube, thereby reducing the loss of the test light beam during the transmission process and improving the transmission stability of the test light beam.

[0058] Further, see Figure 1 、 Figure 2 and Figure 9 As shown, the collimation assembly 130 also includes a color filter 137 and a plurality of adjustment brackets 138. The color filter 137 is disposed on the second mounting bracket 133 and is used to filter the test beam. Exemplarily, the test beam is infrared light. When the test beam passes through the color filter 137, the color filter 137 eliminates other colored light in the test beam except the infrared light, thereby ensuring the purity of the test beam and improving the test reliability after the test beam passes through the panel to be tested. Of course, in other feasible embodiments, the color filter 137 can also eliminate other colored light in the test beam. This application does not limit the colored light that the color filter 137 needs to eliminate, and it can be set according to test requirements.

[0059] Multiple adjustment frames 138 are connected to the multiple optical lenses 134, and the adjustment frames 138 are used to adjust the posture of the optical lenses 134. For example, the number of adjustment frames 138 is the same as the number of optical lenses 134, that is, each optical lens 134 is connected to an adjustment frame 138. The adjustment frames 138 can adjust the position, angle, etc. of the optical lens 134 on the second mounting frame 133. By adjusting the posture of the optical lens 134, different testing requirements can be met.

[0060] In one embodiment, see Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 and Figure 10 As shown, light receiving assembly 160 includes a mounting base 161, a third adjustment module 162, a fixing bracket 163, an integrating sphere 164, and a spectrometer 165. Mounting base 161 is fixed to machine platform 110, for example, by welding, screwing, or the like, to secure light receiving assembly 160 to machine platform 110. Third adjustment module 162 is disposed on mounting base 161, and integrating sphere 164 is rotatably connected to third adjustment module 162 via fixing bracket 163. Integrating sphere 164 is used to collect the test light beam transmitted by the panel to be tested, and is connected to spectrometer 165, for example, via an optical fiber. For example, if the third adjustment module 162 is an XYZ three-axis adjustment module, the third adjustment module 162 can adjust the position of the integrating sphere 164 in the XYZ direction, and the integrating sphere 164 can be rotatable relative to the third adjustment module 162. In conjunction with the third adjustment module 162, the position of the integrating sphere 164 in three-dimensional space can be adjusted to adjust the relative position between the test light beam after being transmitted through the panel to be tested and the integrating sphere 164, so that the integrating sphere 164 can better collect the test light beam after being transmitted through the panel to be tested.

[0061] Integrating sphere 164 is connected to spectrometer 165, for example, via an optical fiber. In this manner, after the test beam is transmitted through the panel to be tested, it is collected by integrating sphere 164. Because the inner wall of integrating sphere 164 is coated with a diffusely reflective material, the test beam is uniformly diffusely reflected by the highly reflective inner wall of integrating sphere 164. This homogenizes the collected zero-order diffracted light or all diffracted light. Spectrometer 165 then analyzes the quantity and quality of the homogenized diffracted light to test the transmittance and clarity of the panel to be tested.

[0062] In one embodiment, see Figure 1 and Figure 2 As shown, the display panel diffraction ratio testing device 100 further includes a light shield. The light shield is disposed on the machine platform 110, and the light shield is disposed outside the light emitting component 120, the collimating component 130, the first test platform 140, the second test platform 150, and the light receiving component 160. Exemplarily, the light shield is a black plate with poor or no light transmittance, and the light shield is disposed outside the light emitting component 120, the collimating component 130, the first test platform 140, the second test platform 150, and the light receiving component 160 to ensure the environmental stability of the display panel diffraction ratio testing device 100 during the test process, prevent external light from interfering with the internal test light path of the display panel diffraction ratio testing device 100, ensure that the light emitting component 120, the collimating component 130, the first test platform 140, the second test platform 150, and the light receiving component 160 are in a completely dark state, and improve the reliability and stability of the panel to be tested during the test process.

[0063] Also, see Figure 1-Figure 4 As shown, the present application also provides a display panel diffraction ratio testing system, which includes a display panel diffraction ratio testing device 100 as described in the above technical solution. The display panel diffraction ratio testing system is used to test the transmittance quality of the panel to be tested, so as to analyze the diffraction, interference and other problems of the incident light beam caused by the panel to be tested.

[0064] In the above-mentioned display panel diffraction ratio testing system, the light-emitting component 120 emits a test light beam and is collimated by the collimating component 130. The collimated test light beam can be projected onto the panel to be tested carried by the first test platform 140, and is collected and analyzed by the light-receiving component 160 after being transmitted through the panel to be tested carried by the first test platform 140. The collimated test light beam can also be projected onto the panel to be tested on the second test platform 150, and is collected and analyzed by the light-receiving component 160 after being transmitted through the panel to be tested carried by the second test platform 150. Since the first test platform 140 is close to the collimating assembly 130 and the first test platform 140 is far away from the light receiving assembly 160, when the test light beam is projected onto the panel to be tested carried by the first test platform 140, it is greatly affected by the diffraction and interference of the panel to be tested. Part of the test light beam is diffusely reflected to the outside due to diffraction and is not collected by the light receiving assembly 160. The light receiving assembly 160 only collects part of the zero-order diffraction light that is not diverged to the outside. Since the second test platform 150 is close to the light receiving assembly 160, when the test light beam is projected onto the panel to be tested carried by the second test platform 150, it is less affected by the diffraction and interference of the panel to be tested. The transmitted test light beam is completely collected by the light receiving assembly 160. The light receiving assembly 160 collects and analyzes the zero-order diffraction light or all the diffraction light of the panel to be tested at the two positions, and calculates the diffraction light ratio of the two positions to test the transmittance and clarity of the panel to be tested.

[0065] The following combination Figures 1-10 The transmittance test process of the panel to be tested in this application is analyzed in detail.

[0066] If it is necessary to perform a transmittance test on the panel to be tested carried by the first test platform 140, refer to Figure 3 and Figure 5 As shown, first, the light-emitting component 120 emits a test light beam and projects it along path a to the collimating component 130; then, the collimating component 130 collimates the test light beam and projects it along path a to the first test platform 140; then, the test light beam a collimated by the collimating component 130 is diffracted and interfered by the panel to be tested carried by the first test platform 140, and the test light beam a is dispersed into light beam a1 and light beam a2; continuing, due to the long distance between the first test platform 140 and the light receiving component 160, the light beam a2 diverges to the outside of the light receiving component 160 and is not collected by the light receiving component 160, and only the light beam a1 is not diverged to the outside and is collected by the light receiving component 160; finally, the spectrometer 165 performs quantity, quality and other analysis on the light beam a2 collected by the light receiving component 160.

[0067] For example, when the transmittance test is required for the panel to be tested carried by the second test platform 150, Figure 4 and Figure 6As shown, first, the light-emitting component 120 emits a test beam and projects it along path b to the collimating component 130; then, the collimating component 130 collimates the test beam and projects it along path b to the aperture component 170; then, the aperture component 170 limits the test beam and projects it along path b to the second test platform 150; then, after the test beam b is limited by the aperture component 170, it is diffracted and interfered by the panel to be tested carried by the second test platform 150, and the test beam b is dispersed into beam b1 and beam b2; then, since the distance between the second test platform 150 and the light-receiving component 160 is relatively close, both beam b1 and beam b2 can enter the light-receiving component 160, and the light-receiving component 160 can collect all the diffracted light; finally, the spectrometer 165 performs quantity and quality analysis on the beams b1 and beam b2 collected by the light-receiving component 160.

[0068] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0069] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A display panel diffraction ratio testing device, characterized in that: The display panel diffraction ratio testing device includes a machine platform, an aperture assembly, and a light emitting assembly, a collimating assembly, a first testing platform, a second testing platform, and a light receiving assembly sequentially arranged on the machine platform. The collimating assembly is used to collimate the test light beam emitted by the light emitting assembly. The first test platform and the second test platform are both used to carry a panel to be tested. When the panel to be tested is placed on the first test platform or the second test platform, the panel to be tested can receive the test light beam collimated by the collimating component. The first test platform is close to the collimating component, and the second test platform is close to the light receiving component. The light receiving assembly is capable of collecting the test light beam transmitted by the panel to be tested and is used to analyze the transmitted test light beam; The aperture assembly is disposed on the machine platform and is located between the collimating assembly and the light receiving assembly. The first test platform is located between the collimating assembly and the aperture assembly. The second test platform is located between the aperture assembly and the light receiving assembly.

2. The display panel diffraction ratio testing device according to claim 1, characterized in that: The aperture assembly is used to limit the test light beam collimated by the collimation assembly; The panel to be tested carried by the first test platform can receive the test light beam collimated by the collimating assembly, and the panel to be tested carried by the second test platform can receive the test light beam restricted by the aperture assembly.

3. The display panel diffraction ratio testing device according to claim 2, wherein: The aperture assembly includes a first optical bench, a first adjustment module, a first connecting rod, a first mounting frame and a plurality of variable apertures. The first optical bench is movably connected to the machine platform, the first adjustment module is set on the first optical bench, the first mounting frame is telescopically connected to the first adjustment module through the first connecting rod, and the plurality of variable apertures are spaced apart on the first mounting frame along the transmission direction of the test beam.

4. The display panel diffraction ratio testing device according to any one of claims 1 or 2, characterized in that: The first test platform and the second test platform both include a movable frame, a second adjustment module and a carrier. The movable frame is movably arranged on the machine along the transmission direction of the test beam. The second adjustment module is arranged on the movable frame. The carrier is detachably connected to the second adjustment module.

5. The display panel diffraction ratio testing device according to claim 1, wherein: The collimation assembly includes a second optical bench, a second connecting rod, a second mounting frame and a plurality of optical lenses. The second optical bench is movably connected to the machine platform. The second mounting frame is telescopically connected to the second optical bench via the second connecting rod, and the second mounting frame is movable relative to the second optical bench. The plurality of optical lenses are spaced apart on the second mounting frame along the transmission direction of the test beam.

6. The display panel diffraction ratio testing device according to claim 5, characterized in that: The collimating assembly further includes a light inlet and a light outlet. The light inlet and the light outlet are spaced apart at opposite ends of the second mounting frame along the transmission direction of the test beam. The light inlet is connected to the light outlet assembly.

7. The display panel diffraction ratio testing device according to any one of claims 5 or 6, characterized in that: The collimation assembly also includes a color filter and a plurality of adjustment frames; The color filter is arranged on the second mounting frame and is used to filter the test light beam; The plurality of adjustment frames are correspondingly connected to the plurality of optical lenses, and the adjustment frames are used to adjust the positions of the optical lenses.

8. The display panel diffraction ratio testing device according to claim 1, wherein: The light collecting assembly includes a mounting base, a third adjustment module, a fixing frame, an integrating sphere and a spectrometer. The mounting base is fixed to the machine, the third adjustment module is arranged on the mounting base, and the integrating sphere is rotatably connected to the third adjustment module through the fixing frame. The integrating sphere is used to collect the test light beam after being transmitted by the panel to be tested and is connected to the spectrometer.

9. The display panel diffraction ratio testing device according to claim 1, wherein: The display panel diffraction ratio testing device further includes a light shield, which is disposed on the machine platform and covers the outside of the light emitting component, the collimating component, the first testing platform, the second testing platform and the light receiving component.

10. A display panel diffraction ratio testing system, characterized in that: The display panel diffraction ratio testing system includes: A display panel diffraction ratio testing device as described in any one of claims 1 to 9.

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