Intelligent test method and test system for PCBA (Printed Circuit Board Assembly)

Abstract

The invention relates to an intelligent testing method and system for a PCBA, and relates to the field of intelligent testing, the method is used for testing an MCU control unit of the system, and the MCU control unit is connected with an external PCBA to be tested; the method comprises the following steps: when a PCBA (Printed Circuit Board Assembly) is in a power-on state, acquiring first voltage signals at two ends of a sampling resistor; the first voltage signal is analyzed through the MCU control unit, and the display state of the digital driving display module is updated according to the analysis result; if the display state meets the preset requirement, outputting a passing identifier; and if the display state does not meet the preset requirement, prompting a detection error. Testing of electronic product PCBA circuit boards by technical teams in enterprises belongs to an important link in the research and development process, and a reasonable testing method needs to be applied to improve the working efficiency of engineers and reduce unnecessary errors. On the basis of the scheme, the test efficiency can be remarkably improved, and the accuracy degree of a test result can be improved.

Description

Technical Field

[0001] The present invention relates to the field of intelligent testing, and in particular to an intelligent testing method and testing system for PCBA. Background Art

[0002] Electronic products evolve rapidly and are produced in large quantities, requiring efficient testing to avoid becoming a bottleneck in R&D or production. Testing of electronic product PCBAs by technical teams is a crucial step in the R&D process, requiring the application of appropriate testing methods to improve engineers' efficiency and reduce unnecessary errors. Existing PCBA testing methods suffer from the following shortcomings: Test parameters are displayed using commonly used ammeters and voltmeters, each of which can only display a single parameter. For example, if a product requires testing for three parameters—quiescent current, charging current, and load voltage—three meters must be connected in series or parallel. Testing systems are expensive and complex to wire, and parameter qualification is heavily influenced by tester subjectivity, posing the risk of misjudgment. Therefore, the industry needs to design an intelligent testing method and system for PCBAs to address these technical issues. Summary of the Invention

[0003] The present application proposes an intelligent testing method and testing system for PCBAs, which have the following advantages: the system's display interface uses a common digital tube in the market, with a single digital tube displaying current parameters and voltage parameters in sequence. Embedded software collects the current parameters and voltage parameters on the PCBA to be tested, compares them with preset values, and automatically determines whether they are qualified. If qualified, the corresponding qualified parameters are displayed; otherwise, an error message "Er" is displayed and a buzzer continuously sounds to remind. No human judgment by engineers is required throughout the process, and no matter how many parameters are displayed, only a single digital tube needs to display them in sequence. Therefore, the cost of the testing process is significantly saved, the possibility of misjudgment is avoided, and the testing efficiency is improved.

[0004] In order to solve the above problems, in a first aspect, the present application proposes an intelligent testing method for PCBA, which is used for an MCU control unit of a test system, and the MCU control unit is connected to an external PCBA to be tested; the method includes: S1, when the PCBA is in a power-on state, obtaining a first voltage signal across a sampling resistor; S2, parsing the first voltage signal through the MCU control unit, and updating the display state of a digital drive display module according to the parsing result; S3, if the display state meets the preset requirements, outputting a pass mark.

[0005] A further technical solution is that in said S3, if the display state meets the preset requirements, after outputting a pass mark, the method further includes: S4, if the display state does not meet the preset requirements, prompting a detection error.

[0006] A further technical solution is that, when the PCBA is powered on, S1 obtains a first voltage signal across the sampling resistor, including: S31, detecting the static current of the PCBA to be tested by a static current detection module, and when it is detected that the PCBA to be tested is powered on, triggering the MCU control unit to switch the negative circuit of the PCBA to be tested to the sampling resistor end, thereby obtaining the first voltage signal across the sampling resistor.

[0007] Its further technical solution is that the MCU control unit is connected to the air pump drive module, the load voltage detection module, and the charging current detection module; the S2 analyzes the first voltage signal through the MCU control unit and updates the display status of the digital drive display module according to the analysis result, including: S32, amplifying the first voltage signal through the operational amplifier and inputting it into the AD port of the MCU control unit for analysis. If the first value of the static current after analysis is within the preset first threshold range, the first value of the static current is displayed through the digital drive display module and S33 is executed, otherwise the buzzer drive module is triggered to alarm and display the first error code; S33, starting the air pump simulated suction state through the air pump drive module, switching the negative circuit of the PCBA to be tested to the direct grounding state, and obtaining the load voltage detection module. The load voltage signal collected by the block; S34, the load voltage signal is scaled down and input into the AD port of the MCU control unit for analysis. If the second numerical value corresponding to the analyzed load voltage is within the preset second threshold range, the display value of the digital drive display module is updated to be converted into the second numerical value and S35 is executed, otherwise the buzzer drive module is triggered to alarm and display the second error code; S35, the charging circuit is switched to the sampling resistor end through the charging current detection module, the third voltage signal corresponding to the charging current is obtained and input into the MCU control unit after amplification by the operational amplifier. If the third numerical value of the analyzed charging current is within the preset third threshold range, the display value of the digital drive display module is updated to be converted into the third numerical value and S36 is executed, otherwise the buzzer drive module is triggered to alarm and display the third error code.

[0008] Its further technical solution is that, in said S3, if the display status meets the preset requirements, a pass mark is output, including: S36, when step S32, step S34 and step S35 are all within the preset range and thus pass the detection, the digital drive display module is controlled to output a pass mark.

[0009] Its further technical solution is that the step S36 specifically includes: S41, when each associated step is within the preset range and passes the detection, respectively obtain the detection completion mark corresponding to each step; S42, perform a logical AND operation on all detection completion marks to generate an overall qualified mark; S43, trigger a pass control instruction through the overall qualified mark, and control the digital drive display module to output a pass mark.

[0010] Its further technical solution is that the step S43 specifically includes: S51, triggering the pass control instruction through the overall qualified mark to generate a module drive enable signal; S52, converting the pass control instruction into a display control timing signal of the digital drive display module; S53, loading the preset pass mark display data according to the display control timing signal; S54, driving the digital drive display module to perform a dynamic display refresh operation, and controlling the digital drive display module to output the pass mark.

[0011] In a second aspect, the present application proposes a testing system, which is used to implement the intelligent testing method as described in the first aspect, thereby realizing testing of PCBA.

[0012] The testing of PCBA circuit boards for electronic products by technical teams in enterprises is a critical step in the R&D process. Reasonable testing methods need to be applied to improve engineers' work efficiency and reduce unnecessary errors. The solution described in this application can significantly improve testing efficiency and the accuracy of test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0014] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0015] Figure 1 A flow chart of the intelligent testing method for PCBA provided by the present invention.

[0016] Figure 2 Another flow chart of the intelligent testing method for PCBA provided by the present invention.

[0017] Figure 3 This is a simplified framework diagram of the electronic equipment corresponding to the test system provided by the present invention. DETAILED DESCRIPTION

[0018] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0019] It will be understood that when used in this specification and the appended claims, the terms “include” and “comprising” indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or other features, integers, steps, operations, elements, components and / or collections thereof.

[0020] It should also be understood that the terms used in the present specification are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the present specification and the appended claims, the singular forms "a", "an" and "the" are intended to include the plural forms unless the context clearly indicates otherwise.

[0021] It should be further understood that the term "and / or" used in the present description and the appended claims refers to one or any combination and all possible combinations of the associated listed items, and includes these combinations.

[0022] As used in this specification and the appended claims, the term "if" can be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.

[0023] In this specification and the appended claims, there may be multiple ways of expressing the same technical feature or professional term, such as adopting different forms of expression such as superordinate generalization, subordinate limitation or synonym replacement; those skilled in the art can clearly understand the essentially same technical meaning pointed to by different ways of expression based on their professional knowledge and in combination with the overall content of the specification and the drawings; the differences between different ways of expression are only reflected in the diversity at the textual level, and do not constitute a substantial modification or restriction of the technical solution, and will not affect the certainty of the scope of protection of the claims of this patent and the full disclosure of the technical content of the specification.

[0024] Example 1

[0025] See also Figures 1 to 2The figure shows an intelligent testing method for PCBAs proposed in an embodiment of the present invention. The method is used in a test system's MCU control unit, which is connected to an external PCBA under test. The method includes: S1, acquiring a first voltage signal across a sampling resistor when the PCBA is powered on; S2, analyzing the first voltage signal via the MCU control unit and updating the display status of a digital driver display module based on the analysis result; S3, outputting a pass indicator if the display status meets preset requirements. Furthermore, this intelligent testing method for PCBAs can significantly improve test efficiency and the accuracy of test results.

[0026] In one embodiment, after outputting a pass mark in S3 if the display state meets the preset requirements, the method further includes: S4, prompting a detection error if the display state does not meet the preset requirements.

[0027] In one embodiment, the step S1 of obtaining a first voltage signal across a sampling resistor when the PCBA is powered on includes: S31 of detecting a quiescent current of the PCBA to be tested by a quiescent current detection module, and triggering an MCU control unit to switch a negative circuit of the PCBA to be tested to a sampling resistor end when it is detected that the PCBA to be tested is powered on, thereby obtaining the first voltage signal across the sampling resistor.

[0028] In one embodiment, the MCU control unit is connected to the air pump drive module, the load voltage detection module, and the charging current detection module; the S2, parses the first voltage signal through the MCU control unit, and updates the display status of the digital drive display module according to the parsing result, including: S32, amplifies the first voltage signal through the operational amplifier and inputs it into the AD port of the MCU control unit for parsing. If the first value of the quiescent current after parsing is within the preset first threshold range, the first value of the quiescent current is displayed through the digital drive display module and S33 is executed, otherwise the buzzer drive module is triggered to alarm and display the first error code; S33, starts the air pump simulated suction state through the air pump drive module, switches the negative circuit of the PCBA to be tested to the direct grounding state, and obtains the load voltage detection module sampling The load voltage signal of the set; S34, the load voltage signal is scaled down and input into the AD port of the MCU control unit for analysis. If the second numerical value corresponding to the analyzed load voltage is within the preset second threshold range, the display value of the digital drive display module is updated to be converted into the second numerical value and S35 is executed; otherwise, the buzzer drive module is triggered to alarm and display the second error code; S35, the charging circuit is switched to the sampling resistor end through the charging current detection module, the third voltage signal corresponding to the charging current is obtained and amplified by the operational amplifier and input into the MCU control unit. If the third numerical value of the analyzed charging current is within the preset third threshold range, the display value of the digital drive display module is updated to be converted into the third numerical value and S36 is executed; otherwise, the buzzer drive module is triggered to alarm and display the third error code.

[0029] In one embodiment, the S3, if the display state meets the preset requirements, outputs a pass mark, including: S36, when step S32, step S34 and step S35 are all within the preset range and thus pass the test, controls the digital drive display module to output a pass mark.

[0030] In one embodiment, the step S36 specifically includes: S41, when step S32, step S34, and step S35 are all within the preset range and thus pass the detection, respectively obtain the detection completion flag corresponding to each step; S42, perform a logical AND operation on all detection completion flags to generate an overall qualified mark; S43, trigger a pass control instruction through the overall qualified mark, and control the digital drive display module to output a pass mark.

[0031] In one embodiment, step S43 specifically includes: S51, triggering a pass control instruction through an overall qualified mark to generate a module drive enable signal; S52, converting the pass control instruction into a display control timing signal of the digital drive display module; S53, loading preset pass mark display data according to the display control timing signal; S54, driving the digital drive display module to perform a dynamic display refresh operation, and controlling the digital drive display module to output a pass mark.

[0032] In one embodiment, the present invention proposes a test system, which is used to implement the intelligent testing method described in any of the above embodiments, and its advantages are as follows: the system's display interface uses a common digital tube on the market, and a single digital tube displays current parameters and voltage parameters in sequence. The embedded software collects the current parameters and voltage parameters on the PCBA to be tested and compares them with preset values ​​to automatically determine whether they are qualified. If qualified, the corresponding qualified parameters are displayed, otherwise Er error is displayed and a buzzer continues to beep to remind; no engineer is required to make manual judgments throughout the process, and no matter how many parameters are displayed, only a single digital tube is required to display them in sequence; therefore, the cost of the testing link is significantly saved, the possibility of misjudgment is avoided, and the testing efficiency is improved.

[0033] The solution described in this application focuses on the core aspects of PCBA functional testing and innovatively designs an intelligent testing method and test system for PCBAs. The method uses an MCU as a central control unit to achieve automated and sequential acquisition of key PCBA parameters (such as quiescent current, load voltage, and charging current) through precise circuit switching and signal conditioning. After the acquired signal is input into the MCU for digital analysis, the embedded software automatically compares the analysis result with the preset qualified threshold range. The comparison result is dynamically displayed or indicated by an integrated digital drive display module, supplemented by a buzzer drive module for acoustic alarm.

[0034] In summary, electronic products have a fast iteration speed and a large output, so their testing process must be efficient enough to avoid becoming a bottleneck in R&D or production; the testing of electronic product PCBA circuit boards by the technical team in the enterprise is an important part of the R&D process, and reasonable testing methods need to be applied to improve the work efficiency of engineers and reduce unnecessary mistakes. The PCBA testing method in the existing technology has the following main shortcomings: the display of test parameters uses the common ammeter and voltmeter on the market, and each meter can only display one parameter; for example, if a product needs to detect the three parameters of static current, charging current, and load voltage, it is necessary to connect three meters in series / parallel; the test system is expensive and the wiring is complicated, and the qualified judgment of the parameters is closely related to the subjectivity of the tester, and there is a risk of misjudgment; based on this, the present application proposes an intelligent testing method and test system for PCBA, which can significantly improve the test efficiency and improve the accuracy of the test results.

[0035] Example 2

[0036] See also Figure 3 , Figure 3This is a block diagram of an electronic device provided by the present invention. This electronic device can be a terminal or a server. A terminal can be a smartphone, tablet computer, laptop computer, desktop computer, personal digital assistant, wearable device, or other electronic device with communication capabilities. The device includes a processor 111, a communication interface 112, a memory 113, and a communication bus 114. The processor 111, communication interface 112, and memory 113 communicate with each other via the communication bus 114.

[0037] In one embodiment of the present invention, the memory 113 is used to store computer programs.

[0038] In one embodiment of the present invention, the processor 111 is configured to implement the method provided by any one of the aforementioned method embodiments when executing a program stored in the memory 113 .

[0039] It should be understood that in the embodiment of the present application, the processor 111 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc.

[0040] Those skilled in the art will appreciate that all or part of the steps in the method of the above-described embodiment can be implemented by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. The computer program is executed by at least one processor in the computer system to implement the steps in the method of the above-described embodiment.

[0041] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians can use different methods to implement the described functions, but such implementation should not be considered to be beyond the scope of the present invention.

[0042] In the several embodiments provided herein, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the various units is merely a logical functional division, and actual implementation may employ other division methods. For example, units or components may be combined or integrated into another system, or some features may be omitted or not implemented.

[0043] The steps in the methods of the embodiments of the present invention may be adjusted in order, combined, or deleted as needed. The units in the devices of the embodiments of the present invention may be combined, divided, or deleted as needed. Furthermore, the functional units in the various embodiments of the present invention may be integrated into a single processing unit, each unit may exist physically separately, or two or more units may be integrated into a single unit.

[0044] If this integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the existing technology, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes a number of instructions for causing a computer device (which can be a personal computer, terminal, or network device, etc.) to execute all or part of the steps of the method described in various embodiments of the present invention.

[0045] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0046] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, to the extent such changes and modifications fall within the scope of the claims and their equivalents, the present invention is intended to encompass such changes and modifications.

[0047] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and such modifications or substitutions are intended to be within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be subject to the scope of protection of the claims.

Claims

1. An intelligent testing method for PCBA, characterized in that: An MCU control unit for a test system, wherein the MCU control unit is connected to an external PCBA to be tested; the method includes: S1, when the PCBA is in a powered-on state, obtaining a first voltage signal across the sampling resistor; S2, analyzing the first voltage signal through the MCU control unit, and updating the display state of the digital drive display module according to the analysis result; S3: If the displayed status meets the preset requirements, the pass mark is output.

2. The intelligent testing method for PCBA according to claim 1, characterized in that: In step S3, if the display state meets the preset requirements and a pass mark is output, the method further includes: S4: If the displayed status does not meet the preset requirements, it prompts that the detection is wrong.

3. The intelligent testing method for PCBA according to claim 2, characterized in that: The step S1, when the PCBA is in a powered-on state, obtaining a first voltage signal across the sampling resistor, includes: S31, detecting the static current of the PCBA to be tested by the static current detection module. When detecting that the PCBA to be tested is powered on, triggering the MCU control unit to switch the negative circuit of the PCBA to be tested to the sampling resistor end, and obtaining a first voltage signal across the sampling resistor.

4. The intelligent testing method for PCBA according to claim 3, characterized in that: The MCU control unit is connected to the air pump drive module, the load voltage detection module, and the charging current detection module; S2, parsing the first voltage signal through the MCU control unit and updating the display state of the digital drive display module according to the parsing result, includes: S32, amplifying the first voltage signal through an operational amplifier and inputting it into an AD port of the MCU control unit for analysis. If the analyzed first value of the quiescent current is within a preset first threshold range, the first value of the quiescent current is displayed by the digital drive display module and S33 is executed. Otherwise, the buzzer drive module is triggered to alarm and display a first error code; S33, starting the air pump to simulate the suction state through the air pump driving module, switching the negative circuit of the PCBA to be tested to a direct grounding state, and obtaining the load voltage signal collected by the load voltage detection module; S34, scaling down the load voltage signal and inputting it into the AD port of the MCU control unit for parsing. If the second value corresponding to the parsed load voltage is within a preset second threshold range, updating the display value of the digital driver display module to the second value and executing S35; otherwise, triggering the buzzer driver module to alarm and display a second error code; S35, switching the charging circuit to the sampling resistor end through the charging current detection module, obtaining a third voltage signal corresponding to the charging current, and inputting the third voltage signal into the MCU control unit after amplification by the operational amplifier. If the analyzed third value of the charging current is within a preset third threshold range, the display value of the digital driver display module is updated to the third value and S36 is executed. Otherwise, the buzzer driver module is triggered to alarm and display a third error code.

5. The intelligent testing method for PCBA according to claim 4, characterized in that: In step S3, if the displayed status meets the preset requirements, a pass mark is output, including: S36, when step S32, step S34 and step S35 are all within the preset range and thus pass the test, the digital drive display module is controlled to output a pass mark.

6. The intelligent testing method for PCBA according to claim 5, characterized in that: The step S36 specifically includes: S41, when all associated steps are within the preset range and thus pass the test, respectively obtain the test completion flag corresponding to each step; S42, performing a logical AND operation on all the detection completion flags to generate an overall qualified flag; S43, triggering a pass control instruction through the overall pass mark to control the digital drive display module to output a pass mark.

7. The intelligent testing method for PCBA according to claim 6, characterized in that: The step S43 specifically includes: S51, triggering a pass control instruction through the overall qualified flag to generate a module drive enable signal; S52, converting the control instruction into a display control timing signal of the digital drive display module; S53, loading preset pass mark display data according to the display control timing signal; S54, driving the digital drive display module to perform a dynamic display refresh operation, and controlling the digital drive display module to output a pass mark.

8. A testing system, characterized in that: The testing system is used to implement the intelligent testing method according to any one of claims 1 to 7, thereby implementing testing of PCBA.

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