Electronic component temperature impact test device

Abstract

The invention belongs to the technical field of temperature shock tests, and particularly relates to an electronic component temperature shock test device which comprises a test box, a test groove is formed in the test box, an annular electric track is installed on the top in the test box, two sets of sliding blocks are installed on the annular electric track in a sliding mode, and the two sets of sliding blocks are connected with air cylinders. Output shafts of the two groups of cylinders are connected with a cover plate matched with the test tank, and the lower side of the cover plate is provided with a lifting basket; the lifting basket is composed of an outer barrel and an inner barrel, a plurality of first through holes which are evenly distributed are formed in the side wall of the outer barrel, and second through holes which are in one-to-one correspondence with the first through holes are formed in the side wall of the inner barrel; through simultaneous position alternation of the left and right groups of lifting baskets, simultaneous temperature impact tests of two groups of components can be realized, the overall test efficiency is remarkably improved, the lifting baskets are in a closed state in the component transfer process, temperature loss of the components can be reduced, and the test accuracy is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of temperature shock testing, and in particular relates to a temperature shock testing device for electronic components. Background Art

[0002] As fundamental components of various electronic devices, the performance and reliability of electronic components directly determine how well they operate in complex environments. In practical applications, electronic components often face extreme and rapidly changing temperature environments. For example, in aerospace, spacecraft experience a sudden transition from high to low temperatures while traversing the atmosphere. In automotive electronics systems, electronic components within the engine compartment experience significant temperature fluctuations during vehicle startup, driving, and stopping. In industrial automation control equipment, components may experience rapid temperature changes in a short period of time due to changes in the operating environment. These temperature shocks can cause electronic components to experience performance degradation, parameter drift, failure, or even damage, impacting the normal operation of the entire electronic system and even leading to serious safety incidents and economic losses.

[0003] To ensure electronic components can operate stably and reliably in various temperature shock environments, rigorous temperature shock testing is required throughout product development, manufacturing, and quality inspection. Temperature shock testing simulates the extreme temperature fluctuations electronic components may encounter in actual use. By rapidly switching components between high and low temperatures, the performance and reliability of the components during these sudden temperature changes are measured.

[0004] In the prior art, a liquid tank-type thermal shock chamber is often used to perform temperature shock tests on components. The liquid tank-type thermal shock chamber uses a basket to immerse the components in a high-temperature tank and then transfers them to a low-temperature tank. By simulating a rapid and drastic temperature change environment, the reliability, stability, and durability of the components under alternating hot and cold shocks are evaluated. However, the existing liquid tank-type thermal shock chamber uses a basket to switch back and forth between the high-temperature tank and the low-temperature tank, resulting in low overall test efficiency. In addition, the basket is easily transferred during the component temperature loss, reducing the accuracy of the test. Summary of the Invention

[0005] The purpose of the present invention is to provide an electronic component temperature shock test device to solve the problems raised in the background technology.

[0006] In order to achieve the above technical objectives, the technical solutions adopted by the present invention are as follows:

[0007] A temperature shock test device for electronic components, comprising a test box, wherein test slots are provided on both sides of the test box, the two test slots being a low-temperature slot and a high-temperature slot, respectively; an annular electric track is installed on the top of the test box, and two sets of sliding blocks are slidably installed on the annular electric track, and the two sets of sliding blocks are connected to cylinders, and the output shafts of the two sets of cylinders are connected to cover plates matching the test slots, and a basket is installed on the underside of the cover plates;

[0008] The basket is composed of an outer cylinder and an inner cylinder. The upper end of the outer cylinder is connected to a mounting ring, and the mounting ring is connected to the cover plate. The inner cylinder is rotatably mounted on the mounting ring and is located inside the outer cylinder. The side wall of the outer cylinder is provided with a plurality of evenly distributed first through holes, and the side wall of the inner cylinder is provided with second through holes corresponding to the plurality of first through holes. A rotating assembly is provided between the inner cylinder and the cover plate.

[0009] The rotating assembly includes an annular groove formed in the mounting ring, a pushing block rotatably mounted in the annular groove is fixed to the upper end of the inner cylinder, a first inclined surface is machined on the upper end of the pushing block, a fixed block is fixed in the annular groove, and a first spring is provided between the pushing block and the fixed block;

[0010] The cover plate is provided with an installation groove, and a push rod is provided in the installation groove for vertical sliding. The lower end of the push rod slides into the annular groove and abuts against the first inclined surface of the push block. The side wall of the installation groove is provided with a push rod for horizontal sliding. The bottom of one side of the push rod extending out of the installation groove is processed with a second inclined surface. The push rod is located in the installation groove and is hinged to a hinged rod at one end, and the end of the hinged rod is hinged to the upper end of the push rod.

[0011] A plurality of convex strips matching the positions of the ejector rods are provided on the upper side of the side wall of the test tank, and the plurality of convex strips are linearly distributed.

[0012] The basket and the cover plate are detachably connected.

[0013] A fixing ring matching the mounting ring is fixed to the lower side of the cover plate, a sliding cavity is provided on the side wall of the fixing ring, a slide is provided slidingly in the sliding cavity, a second spring is provided between the outer side of the slide and the side wall of the sliding cavity, a locking block is fixed to the inner side of the slide, and a locking groove matching the locking block is provided on the side wall of the mounting ring.

[0014] A cavity is provided in the middle of the test box, located between the two test slots. A mounting bracket is slidably mounted in the cavity, and a circular seat is rotatably mounted above the mounting bracket. The circular seat is provided with four groups of circumferentially distributed placement slots, the size of which matches the size of the basket. The test box is provided with two groups of through slots connected to the cavity, which are arranged front and back and correspond to the placement slots.

[0015] A circular groove matching the fixing ring is provided on the upper side of the through groove, an iron block is connected to the outer side of the slide plate, and a magnetic block matching the iron block is provided on the side wall of the circular groove.

[0016] An electric telescopic rod is installed at the bottom of the mounting frame, a rotating ring is fixed to the output end of the electric telescopic rod, the circular seat rotates on the rotating ring, a motor is installed in the middle of the mounting frame, a vertical groove is opened in the middle of the circular seat, a slider is slidably provided in the vertical groove, and the output shaft of the motor is connected to the slider.

[0017] The present invention can realize simultaneous temperature shock testing of two groups of components by simultaneously alternating the positions of the left and right groups of baskets, thereby significantly improving the overall test efficiency.

[0018] The basket of the present invention is in a sealed state during the component transfer process, which can reduce the temperature loss of the components and improve the test accuracy.

[0019] After the test of the present invention is completed, the basket and the cover plate after the test can be automatically released through the cooperation of the circular electric track, cylinder, electric telescopic rod, motor and other components, and the basket for placing new components can be moved to the bottom of the cover plate and fixed, thereby realizing automatic replacement of the basket and automatic placement of new components for testing. The overall equipment has high working efficiency, and there is no need to open the test box door, thereby reducing temperature loss in the test tank. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The present invention is further illustrated by means of the following non-limiting examples.

[0021] Figure 1 This is a schematic diagram of the structure of an electronic component temperature shock test device embodiment of the present invention. Figure 1 ;

[0022] Figure 2 This is a schematic diagram of the structure of an electronic component temperature shock test device embodiment of the present invention. Figure 2 ;

[0023] Figure 3 This is a schematic cross-sectional view of an embodiment of a temperature shock test device for electronic components according to the present invention. Figure 1 ;

[0024] Figure 4 This is a schematic cross-sectional view of an embodiment of a temperature shock test device for electronic components according to the present invention. Figure 2 ;

[0025] Figure 5 for Figure 4 A schematic diagram of the structure at center A;

[0026] Figure 6 This is a schematic diagram of the overall structure of the cylinder, cover plate and basket of the present invention;

[0027] Figure 7 It is a schematic diagram of the cross-sectional structure of the basket of the present invention.

[0028] The main component symbols are described as follows:

[0029] Test box 1, test slot 11, annular electric track 2, sliding block 21, cylinder 22, cover plate 23, basket 24, outer cylinder 241, inner cylinder 242, mounting ring 2411, first through hole 2412, second through hole 2421, annular groove 2413, pushing block 2422, first spring 2423, mounting slot 231, push rod 232, top rod 233, hinged rod 234, convex strip 111, fixing ring 3, sliding cavity 31, slide plate 32, second spring 33, locking block 34, locking groove 2414, cavity 4, mounting frame 41, circular seat 42, placement groove 43, through groove 44, circular groove 441, iron block 321, magnetic block 442, electric telescopic rod 5, rotating ring 51, motor 52, vertical groove 421, slider 422. DETAILED DESCRIPTION

[0030] In order to enable those skilled in the art to better understand the present invention, the technical solution of the present invention is further described below with reference to the accompanying drawings and embodiments.

[0031] like Figure 1-7 As shown, an electronic component temperature shock test device of the present invention includes a test box 1, with test slots 11 provided on both sides of the test box 1, the two test slots 11 being a low-temperature slot and a high-temperature slot respectively. An annular electric track 2 is installed on the top of the test box 1, and two sets of sliding blocks 21 are slidably installed on the annular electric track 2. The two sets of sliding blocks 21 are both connected to cylinders 22. The output shafts of the two sets of cylinders 22 are connected to cover plates 23 that match the test slots 11, and a basket 24 is installed on the lower side of the cover plate 23;

[0032] The basket 24 is composed of an outer cylinder 241 and an inner cylinder 242. The upper end of the outer cylinder 241 is connected to a mounting ring 2411, which is connected to the cover plate 23. The inner cylinder 242 is rotatably mounted on the mounting ring 2411 and is located on the inner side of the outer cylinder 241. The side wall of the outer cylinder 241 is provided with a plurality of evenly distributed first through holes 2412, and the side wall of the inner cylinder 242 is provided with second through holes 2421 corresponding one-to-one to the plurality of first through holes 2412. A rotating assembly is provided between the inner cylinder 242 and the cover plate 23.

[0033] The rotating assembly includes an annular groove 2413 defined by a mounting ring 2411. A push block 2422 is fixed to the upper end of the inner cylinder 2421 and is rotatably mounted in the annular groove 2413. A first inclined surface is machined on the upper end of the push block 2422. A fixed block is fixed in the annular groove 2413. A first spring 2423 is provided between the push block 2422 and the fixed block.

[0034] The cover plate 23 is provided with a mounting groove 231, in which a push rod 232 is vertically slidably provided. The lower end of the push rod 232 slides into the annular groove 2413 and abuts against the first inclined surface of the push block 2422. A push rod 233 is horizontally slidably provided on the side wall of the mounting groove 231. A second inclined surface is machined on the bottom of one side of the push rod 233 extending out of the mounting groove 231. One end of the push rod 233 located in the mounting groove 231 is hinged with a hinged rod 234, and the end of the hinged rod 234 is hinged to the upper end of the push rod 232.

[0035] The two test tanks 11 are respectively a low-temperature tank and a high-temperature tank. The high-temperature tank is mainly used to simulate a high-temperature environment. The liquid medium inside it can remain liquid at high temperatures and does not volatilize or evaporates very little, such as silicone oil. The low-temperature tank is mainly used to simulate a low-temperature environment. The liquid medium inside it can remain liquid at low temperatures and does not solidify or crystallize, such as alcohol or antifreeze.

[0036] When the sliding block 21 is located at the end of the circular electric track 2, the basket 24 is located directly above the test tank 11;

[0037] In the initial state, under the elastic force of the first spring 2423, the pushing block 2422 moves away from the fixed block in the annular groove 2413. At this time, the plurality of second through holes 2421 on the inner cylinder 242 and the plurality of first through holes 2412 on the outer cylinder 241 are staggered with each other, that is, the basket 24 is in a closed state;

[0038] When the basket 24 is installed on the lower side of the cover plate 23, the lower end of the push rod 232 extends into the annular groove 2413 and abuts against the first inclined surface of the push block 2422. At this time, the end of the push rod 233 extends out of the installation groove 231.

[0039] When in use, both the low-temperature tank and the high-temperature tank are filled with liquid media. Reasonable high and low temperature values ​​are set according to the actual use environment and standard requirements of the components. The staff places the electronic components to be tested in the left and right baskets 24. The baskets 24 are now directly above the test tank 11. The cylinder 22 drives the cover plate 23 and the baskets 24 to move downward synchronously. The baskets 24 will first enter the guide test tank 11. When the cover plate 23 enters the guide test tank 11, the second inclined surface on the lower side of the push rod 233 will abut against the side wall of the test tank 11, pushing the push rod 233 into the installation groove 231. The push rod 233 moves horizontally in the installation groove 231 and can push the push rod 232 downward through the hinged rod 234. Since the lower end of the push rod 232 extends into the guide test tank 11, the push rod 232 can move downward. The push rod 232 is in the annular groove 2413 and abuts against the first inclined surface of the pushing block 2422. Therefore, the downward movement of the push rod 232 can push the first inclined surface of the pushing block 2422, so that the pushing block 2422 moves in the annular groove 2413, driving the inner cylinder 242 to rotate relative to the outer cylinder 241, so that the multiple second through holes 2421 on the inner cylinder 242 will be aligned with the multiple first through holes 2412 on the outer cylinder 241. In this way, the basket 24 continues to move downward in this state and extends into the liquid medium. The liquid medium enters the inner cylinder 242 through the aligned first through holes 2412 and second through holes 2421 and contacts the internal components. The components are maintained in the high temperature and low temperature tanks for a certain period of time to ensure that the components are fully stable.

[0040] When switching between hot and cold, the cylinder 22 is started to drive the cover plate 23 and the lifting basket 24 to move upward. After the lifting basket 24 leaves the liquid medium, the upper end of the cover plate 23 will also leave the test tank 11. At this time, the elastic force of the first spring 2423 pushes the pushing block 2422 to reset. The push rod 232 moves upward under the action of the first inclined surface of the pushing block 2422, and then drives the end of the push rod 233 to extend out of the mounting groove 231 through the hinge rod 234 to reset. Then, the second through hole 2421 and the first through hole 2412 are staggered with each other, and the lifting basket 24 is in a closed state.

[0041] The circular electric track 2 drives the sliding block 21 to move, causing the two sets of baskets 24 to move and exchange positions. The cylinder 22 then drives the baskets 24 downward, allowing them to enter different test tanks 11. The internal components complete the transition from high temperature to low temperature in a short period of time, simulating a real temperature change scenario.

[0042] The data acquisition system inside the test chamber 1 records parameters such as temperature and time during the test, providing a basis for subsequent analysis. After the test, the components should be fully tested for performance, including electrical and mechanical properties, and compared with pre-test results to assess changes. For components that fail, a detailed failure analysis should be conducted to identify the cause of the failure and provide a basis for improvement.

[0043] The size of the cover plate 24 matches the size of the test tank 11, which can reduce the temperature loss inside the test tank 11 during the test. The upper end of the test tank 11 can be provided with an electric sealing plate. After the basket 24 leaves the test tank 11, the electric sealing plate automatically blocks the upper end of the test tank 11 to prevent large temperature changes inside the test tank 11.

[0044] The present application can realize simultaneous temperature shock testing of two groups of components by alternating the positions of the left and right groups of baskets 24 at the same time, thereby improving the overall test efficiency. At the same time, during the component transfer process, the baskets 24 are in a closed state, which can reduce the temperature loss of the components and improve the accuracy of the test.

[0045] The upper side of the side wall of the test tank 11 is provided with a plurality of ridges 111 that match the position of the push rod 233, and the plurality of ridges 111 are linearly distributed; during the upward movement of the cover plate 23, after the lifting basket 24 leaves the liquid medium, the push rod 233 will contact the plurality of downwardly distributed ridges 111, pushing the push rod 233 to move in a small arc, that is, driving the push rod 232 to push the pushing block 2422 downward in a small arc to achieve the shaking of the inner cylinder 242, which can assist in shaking out the liquid in the inner cylinder 242, reduce the liquid medium remaining on the lifting basket 24, prevent high-temperature liquid medium from entering the low-temperature tank, and avoid causing temperature control failure, equipment damage, safety hazards and distortion of test results.

[0046] The basket 24 and the cover plate 23 are detachably connected.

[0047] A fixing ring 3 that matches the mounting ring 2411 is fixed to the underside of the cover plate 23. A sliding cavity 31 is defined in the sidewall of the fixing ring 3. A slide plate 32 slides within the sliding cavity 31. A second spring 33 is provided between the outer side of the slide plate 32 and the sidewall of the sliding cavity 31. A locking block 34 is fixed to the inner side of the slide plate 32. A locking groove 2414 that matches the locking block 34 is defined in the sidewall of the mounting ring 2411.

[0048] In the initial state, the elastic force of the second spring 33 can make the locking block 34 located in the locking groove 2414, thereby realizing the connection between the basket 24 and the cover 23. With this design, the staff can drive the locking block 34 out of the locking groove 2414 by sliding the slide plate 34, and then move the mounting ring 2411 downward out of the fixing ring 3, thereby removing the basket 24.

[0049] A cavity 4 is provided in the middle of the test box 1, located between the two test slots 11. A mounting bracket 41 is slidably mounted in the cavity 4. A circular seat 42 is rotatably mounted above the mounting bracket 41. The circular seat 42 is provided with four sets of circumferentially distributed placement slots 43. The size of the placement slots 43 matches the size of the basket 24. The test box 1 is provided with two sets of through slots 44 communicating with the cavity 4. The two sets of through slots 44 are arranged front and back and correspond to the placement slots 43.

[0050] A circular groove 441 matching the fixing ring 3 is formed on the upper side of the through groove 44 , an iron block 321 is connected to the outer side of the slide plate 32 , and a magnetic block 442 matching the iron block 321 is provided on the side wall of the circular groove 441 .

[0051] An electric telescopic rod 5 is installed at the bottom of the mounting frame 41, and a rotating ring 51 is fixed to the output end of the electric telescopic rod 5. The circular seat 42 rotates on the rotating ring 51. A motor 52 is installed in the middle of the mounting frame 41. A vertical groove 421 is opened in the middle of the circular seat 42. A slider 422 is slidingly provided in the vertical groove 421, and the output shaft of the motor 52 is connected to the slider 422.

[0052] The placement groove 43 on the circular seat 42 matches the basket 24 and can be used to place the basket 24. The two sets of through grooves 44 provided on the test box 1 correspond to the front and rear placement grooves 43.

[0053] When conducting a continuous test on components, during the test process, the staff can first prepare two sets of baskets 24, place new components in the baskets 24, then slide the mounting frame 41 forward out of the cavity 4, place the two sets of baskets 24 on the left and right placement slots 43, and then push the mounting frame 41 back into the cavity 4, so that the two empty placement slots 43 at the front and rear are aligned with the two sets of through slots 44;

[0054] After the cooling shock test of the components in the test box 1 is completed, the circular electric track 2 is started to move the two groups of baskets 24 to the middle and align them with the through slot 44. The baskets 24 are driven downward by the cylinder 22. The baskets 24 pass through the through slot 44 and move downward to the placement slot 43, and the fixing ring 3 moves into the circular slot 441. The iron block 321 on the fixing ring 3 is aligned with the magnetic block 442 on the side wall of the circular slot 441. The magnetic block 442 adsorbs the iron block 321, which can make the locking block 34 exit the locking slot 2414. The basket 24 will be released from the cover plate 23, and the circular seat 42 will be driven downward by the electric telescopic rod 5 at the bottom of the mounting frame 41. In this way, the basket 24 will be away from the cover plate 23 and the motor 52 drives the circular seat 42 to rotate 90 degrees, and moves the basket 24 with new components to the bottom of the cover plate 23. The circular seat 42 is driven upward by the electric telescopic rod 5, and the mounting ring 2411 at the upper end of the new basket 24 enters the fixed ring 3. Then the cylinder 22 drives the cover plate 23 to move upward. During this process, the circular seat 42 moves upward for a short distance. After the fixed ring 3 leaves the circular groove 441, the locking block 34 enters the locking groove 2414 under the elastic force of the second spring 33. At this time, the cover plate 23 and the new basket 24 are fixed to each other, and the circular seat 42 no longer moves upward, thus completing the automatic replacement of the basket 24, and automatically placing the new components into the test box 1 for testing;

[0055] The staff slides the mounting frame 41 forward out of the cavity 4 and takes out the components in the basket 24;

[0056] This design can automatically place new components into the test chamber 1 for testing, which improves the overall equipment working efficiency. It does not require opening the door of the test chamber 1, and can reduce the temperature loss in the test tank 11.

[0057] The circular seat 42 is connected to the electric telescopic rod 5 through a rotating ring 51. When the electric telescopic rod 5 drives the circular seat 42 to move up and down, the circular seat 42 itself can also rotate. The output shaft of the motor 52 drives the slider 422 to rotate, so that the circular seat 42 can rotate as a whole. When the circular seat 42 moves up and down, the slider 422 can slide in the vertical slot 421.

[0058] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the present invention. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical principles disclosed herein are intended to be covered by the claims of the present invention.

Claims

1. An electronic component temperature shock test device, comprising a test box, wherein test slots are provided on both sides of the test box, the two test slots being a low temperature slot and a high temperature slot, respectively, and characterized in that: A circular electric track is installed on the top of the test box, and two sets of sliding blocks are slidably installed on the circular electric track. The two sets of sliding blocks are connected to cylinders. The output shafts of the two sets of cylinders are connected to a cover plate that matches the test slot, and a basket is installed on the lower side of the cover plate; The basket is composed of an outer cylinder and an inner cylinder. The upper end of the outer cylinder is connected to a mounting ring, and the mounting ring is connected to the cover plate. The inner cylinder is rotatably mounted on the mounting ring and is located inside the outer cylinder. The side wall of the outer cylinder is provided with a plurality of evenly distributed first through holes, and the side wall of the inner cylinder is provided with second through holes corresponding to the plurality of first through holes. A rotating assembly is provided between the inner cylinder and the cover plate.

2. The electronic component temperature shock test device according to claim 1, characterized in that: The rotating assembly includes an annular groove formed in the mounting ring, a pushing block rotatably mounted in the annular groove is fixed to the upper end of the inner cylinder, a first inclined surface is machined on the upper end of the pushing block, a fixed block is fixed in the annular groove, and a first spring is provided between the pushing block and the fixed block; The cover plate is provided with an installation groove, and a push rod is provided in the installation groove for vertical sliding. The lower end of the push rod slides into the annular groove and abuts against the first inclined surface of the push block. The side wall of the installation groove is provided with a push rod for horizontal sliding. The bottom of one side of the push rod extending out of the installation groove is processed with a second inclined surface. The push rod is located in the installation groove and is hinged to a hinged rod at one end, and the end of the hinged rod is hinged to the upper end of the push rod.

3. The electronic component temperature shock test device according to claim 2, characterized in that: A plurality of convex strips matching the positions of the ejector rods are provided on the upper side of the side wall of the test tank, and the plurality of convex strips are linearly distributed.

4. The electronic component temperature shock test device according to claim 3, characterized in that: The basket and the cover plate are detachably connected.

5. The electronic component temperature shock test device according to claim 4, characterized in that: A fixing ring matching the mounting ring is fixed to the lower side of the cover plate, a sliding cavity is provided on the side wall of the fixing ring, a slide is provided slidingly in the sliding cavity, a second spring is provided between the outer side of the slide and the side wall of the sliding cavity, a locking block is fixed to the inner side of the slide, and a locking groove matching the locking block is provided on the side wall of the mounting ring.

6. The electronic component temperature shock test device according to claim 5, characterized in that: A cavity is provided in the middle of the test box, located between the two test slots. A mounting bracket is slidably mounted in the cavity, and a circular seat is rotatably mounted above the mounting bracket. The circular seat is provided with four groups of circumferentially distributed placement slots, the size of which matches the size of the basket. The test box is provided with two groups of through slots connected to the cavity, which are arranged front and back and correspond to the placement slots. A circular groove matching the fixing ring is provided on the upper side of the through groove, an iron block is connected to the outer side of the slide plate, and a magnetic block matching the iron block is provided on the side wall of the circular groove.

7. The electronic component temperature shock test device according to claim 6, characterized in that: An electric telescopic rod is installed at the bottom of the mounting frame, a rotating ring is fixed to the output end of the electric telescopic rod, the circular seat rotates on the rotating ring, a motor is installed in the middle of the mounting frame, a vertical groove is opened in the middle of the circular seat, a slider is slidably provided in the vertical groove, and the output shaft of the motor is connected to the slider.

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