A wide-range current measurement device and a measurement method

By dynamically adjusting the resistor module to adapt to changes in graphics card current, the problems of current measurement accuracy and cost in traditional solutions are solved, achieving efficient and low-cost multi-channel current measurement.

CN120610052BActive Publication Date: 2025-11-25WUHAN LINGJIU MICROELECTRONICS CO LTD
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Patent Information

Application Number
CN202511123678.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-08-12
Publication Date
2025-11-25
Estimated Expiration
2045-08-12

AI Technical Summary

Technical Problem

Existing technologies suffer from large current value variations under different operating conditions of graphics cards, making sampling resistors unsuitable and reducing accuracy. Furthermore, traditional solutions require multiple current sensors or sampling resistors, increasing circuit area and cost.

Method used

The main control module controls the dynamic adjustment resistor module, and the voltage control module outputs the control voltage to adjust the resistor value to adapt to the current of the power supply being measured. Combined with the voltage and current monitoring module, the current is calculated, avoiding the need to replace the sampling resistor.

Benefits of technology

It improves the accuracy of current measurement, reduces circuit area and cost, enables efficient measurement of multiple currents, and simplifies the testing process.

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Patent Text Reader

Abstract

The application provides a wide-range current measurement device and a measurement method, which comprise a master control module, a voltage control module, a dynamic adjustment resistance module and a voltage and current monitoring module; the master control module determines a current gear according to the initial current size of a monitored power supply; and outputs corresponding control voltage to the dynamic adjustment resistance module according to the current gear, so that the resistance value of the dynamic adjustment resistance module is suitable for the current size of the monitored power supply; and the current size of the monitored power supply is measured. When the current size of the monitored power supply changes, only the control voltage corresponding to the current gear is needed to control the dynamic adjustment resistance module to adjust the sampling resistance, which is suitable for the current size of the monitored power supply, and the sampling resistance does not need to be replaced, and a plurality of sampling resistances with different ranges do not need to be prepared, only the resistance value of the dynamic adjustment resistance module needs to be adjusted, the area and cost of the circuit are reduced, and the current measurement precision is ensured.
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Description

Technical Field

[0001] This invention relates to the field of power supply current measurement, and more specifically, to a wide-range current measuring device and method. Background Technology

[0002] Currently developed circuit boards require high accuracy in power consumption testing, with current measurement accuracy being particularly critical. Graphics cards, with NPUs and GPUs at their cores, exhibit significant variations in power supply current under different operating conditions. Under varying computing power, the current range can extend from hundreds of milliamps to tens of amps, making traditional measurement methods insufficient for achieving high precision. Furthermore, the numerous power supplies on the circuit boards necessitate a large number of current measurements. To quickly obtain accurate current values, both measurement accuracy and testing efficiency must be improved. Therefore, a simple, cost-effective, and wide-range multi-current measurement solution is essential.

[0003] The traditional testing method uses current sensors with different ranges or sampling resistors with different resistance values, selected by a gating switch. However, the gating switch in this method also has a certain resistance value, which can lead to inaccurate sampling resistor values, thus reducing the accuracy of current measurement.

[0004] Furthermore, in traditional testing schemes, multiple current sensors or sampling resistors with different ranges are used for each current being measured to accommodate different current measurement ranges. As the number of current being measured increases, the corresponding number of current sensors or sampling resistors will increase exponentially, resulting in a large overall circuit area and high cost. Summary of the Invention

[0005] To address the issue that the sampling resistor is not suitable for a given measurement range due to significant variations in power supply current values ​​under different operating conditions of the graphics card, this invention provides a wide-range current measurement device and method.

[0006] According to a first aspect of the present invention, a wide-range current measuring device is provided, comprising:

[0007] It includes a main control module, a voltage control module, a dynamic adjustment resistor module, and a voltage and current monitoring module. The main control module and the voltage and current monitoring module are bidirectionally connected. The output terminal of the main control module is connected to the input terminal of the voltage control module. The output terminal of the voltage control module is connected to the input terminal of the dynamic adjustment resistor module. The output terminal of the dynamic adjustment resistor module is connected to the input terminal of the voltage and current monitoring module.

[0008] The main control module is used to control the voltage and current monitoring module to acquire the initial current of the power supply under test, and to determine the range of the dynamic adjustment resistor module based on the detected initial current of the power supply under test; and to control the voltage control module to output a corresponding control voltage based on the range of the dynamic adjustment resistor module. The dynamic adjustment resistor module is configured such that its resistance value is suitable for the current magnitude of the power supply being tested.

[0009] The voltage signal across the dynamically adjusting resistor module is acquired by the voltage and current monitoring module. ;

[0010] According to the control voltage of the dynamically adjusted resistor module The voltage signal across the dynamically adjustable resistor module The current magnitude of the power supply under test is calculated by sampling the resistance value of the dynamically adjustable resistor module.

[0011] According to a second aspect of the present invention, a wide-range current measurement method is provided, comprising:

[0012] Step 1: After the power supply under test is powered on, the main control module controls the voltage and current monitoring module to collect the initial current of the power supply under test.

[0013] Step 2: The main control module determines the range of the dynamic adjustment resistor module based on the detected initial current of the power supply under test, and controls the voltage control module to output the corresponding control voltage to the dynamic adjustment resistor module based on the range of the dynamic adjustment resistor module.

[0014] Step 3: Based on the control voltage, control the resistance value of the dynamically adjustable resistor module to be suitable for the current of the power supply under test;

[0015] Step 4: Acquire the voltage signal across the dynamically adjusting resistor module based on the voltage and current monitoring module. ;

[0016] Step 5: Control the voltage according to the dynamically adjusted resistor module. The voltage signal across the dynamically adjustable resistor module The current magnitude of the power supply under test is calculated by sampling the resistance value of the dynamically adjustable resistor module.

[0017] This invention provides a wide-range current measurement device and method. The main control module determines the current setting level based on the initial current of the power supply under test. Based on the current setting level, the control voltage module outputs a corresponding control voltage to the dynamically adjusting resistor module, ensuring that the resistance value of the dynamically adjusting resistor module is suitable for the current of the power supply under test. The current of the power supply under test is then measured. When the current level of the power supply under test changes, only the control voltage based on the current level is needed to control the dynamically adjusting resistor module to adjust the sampling resistor value to suit the current current of the power supply under test. There is no need to replace the sampling resistor or prepare multiple sampling resistors with different ranges; only the resistance value of the dynamically adjusting resistor module needs to be adjusted. Compared to existing methods that require multiple current sensors and sampling resistors with different ranges, and introduce a selector switch with a certain resistance value to switch between different ranges, this invention reduces circuit area and cost while ensuring the accuracy of the sampling resistor, thereby guaranteeing the accuracy of current measurement. Attached Figure Description

[0018] Figure 1 This is a structural block diagram of a wide-range current measuring device provided in one embodiment of the present invention;

[0019] Figure 2 This is a circuit schematic diagram of a voltage control module according to an embodiment of the present invention;

[0020] Figure 3 This is a circuit schematic diagram of a dynamically adjustable resistor module according to an embodiment of the present invention;

[0021] Figure 4 This is a structural block diagram of a voltage and current monitoring module for measuring multiple power supplies according to an embodiment of the present invention;

[0022] Figure 5 This is a structural block diagram of a main control module and a voltage and current monitoring module provided in one embodiment of the present invention;

[0023] Figure 6 This is a flowchart of the main control module according to an embodiment of the present invention. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention. In addition, the technical features of the various embodiments or individual embodiments provided by the present invention can be arbitrarily combined with each other to form feasible technical solutions. Such combinations are not constrained by the order of steps and / or structural composition patterns, but must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.

[0025] The main objective of this invention is to provide a current measurement circuit suitable for a wide measurement range, addressing the issue that the sampling resistor may be unsuitable for the given measurement range due to significant variations in power supply current values ​​under different operating conditions of the graphics card. For high-current measurements, a low-resistance sampling resistor is required to reduce power consumption and prevent overheating that could affect accuracy or damage the resistor. For low-current measurements, a higher-resistance sampling resistor is needed to obtain a sufficient voltage drop to improve the signal-to-noise ratio and prevent the signal from being overwhelmed by noise. The dynamic resistor value is adjusted by changing the resistance value of the MOSFET. This method achieves more accurate sampling resistor values, unaffected by the resistance of the selector switch itself. Furthermore, this invention can measure multiple current streams in real time, and the measurement circuit structure is simple and inexpensive. Specifically, this patent provides a method that adapts to the current of multiple power supplies under test across a wide range by dynamically adjusting the sampling resistor, without requiring manual soldering and replacement, significantly reducing testing time.

[0026] Figure 1 A wide-range current measuring device is provided as an embodiment of the present invention, such as Figure 1 As shown, the measuring device includes a main control module, a voltage control module, a dynamic adjustment resistor module, and a voltage and current monitoring module. The main control module and the voltage and current monitoring module are bidirectionally connected. The output terminal of the main control module is connected to the input terminal of the voltage control module. The output terminal of the voltage control module is connected to the input terminal of the dynamic adjustment resistor module. The output terminal of the dynamic adjustment resistor module is connected to the input terminal of the voltage and current monitoring module.

[0027] The main control module is used to control the voltage and current monitoring module to acquire the initial current of the power supply under test, and to determine the setting level of the dynamic adjustment resistor module based on the detected initial current of the power supply under test; and to control the voltage control module to output a corresponding control voltage based on the setting level of the dynamic adjustment resistor module. The dynamic adjustment resistor module is configured such that its resistance value is suitable for the current magnitude of the power supply being tested.

[0028] The voltage signal across the dynamically adjusting resistor module is acquired by the voltage and current monitoring module. ;

[0029] According to the control voltage of the dynamically adjusted resistor module The voltage signal across the dynamically adjustable resistor module The current magnitude of the power supply under test is calculated by sampling the resistance value of the dynamically adjustable resistor module.

[0030] Understandably, when the power supply under test is powered on, the main control module controls the voltage and current monitoring module to collect the initial current magnitude of the power supply under test. Based on the collected initial current magnitude, the current setting level of the power supply under test is determined. According to the current setting level, the voltage control module outputs the corresponding control voltage. To the dynamically adjustable resistor module to control the voltage This allows you to adjust the resistance value of the dynamic adjustment resistor module so that the resistance value adapts to the current magnitude of the power supply being tested.

[0031] After the resistance value of the dynamically adjustable resistor module is adjusted, the voltage and current monitoring module acquires the voltage signal across the dynamically adjustable resistor module. According to the control voltage 1. Dynamically adjust the voltage signal across the resistor module It also dynamically adjusts the sampling resistance value of the resistor module to calculate the current of the power supply under test.

[0032] In this embodiment of the invention, when the current of the power supply under test changes, it is only necessary to determine the current range based on the monitored current of the power supply under test, and then provide a control voltage to control the dynamic adjustment resistor module to adjust the sampling resistor to measure the current current of the power supply under test. When the range of the current of the power supply under test changes, it is not necessary to replace the sampling resistor; only the resistance value of the dynamic adjustment resistor module needs to be adjusted.

[0033] See Figure 2In one embodiment of the present invention, the voltage control module includes a DAC digital-to-analog converter, resistors R1, R2, and R3, a DC-DC converter, an inductor L1, a transient suppression diode D1, and a capacitor C1. The DC-DC converter includes an error comparator A1, a controller, and a MOSFET Q1.

[0034] The input terminal of the DAC (Digital-to-Analog Converter) is connected to the output terminal of the main control module. The output terminal of the DAC is connected to the negative input terminal of the error comparator A1 via resistor R1. The positive input terminal of the error comparator A1 is connected to V. REF The output of the error comparator A1 is connected to the input of the controller, and the output of the controller is connected to the gate G of the MOSFET Q1. The source of the MOSFET Q1 is grounded, and the drain of the MOSFET Q1 outputs a control voltage through the transient suppression diode D1. In the aforementioned dynamic adjustment resistor module, the end of the transient suppression diode D1 closest to the MOSFET Q1 is connected to the power supply through inductor L1, and the end of the transient suppression diode D1 furthest from the MOSFET Q1 is grounded through capacitor C1.

[0035] The main control module determines the range of the dynamically adjusting resistor module based on the detected initial current of the power supply under test, and outputs the digital control signal for the DAC digital-to-analog converter according to the determined range. Digital control signals As the negative input of error comparator A1, the reference voltage As the positive input of error comparator A1, the output of error comparator A1 outputs a control voltage through the voltage control module. To the dynamically adjustable resistor module.

[0036] Among them, according to Figure 2 The circuit diagram of the voltage control module, and its working principle are as follows:

[0037] According to Kirchhoff's laws:

[0038] ;

[0039] ;

[0040] ;

[0041] ;

[0042] Based on the above formula, the output control voltage of the voltage control module can be derived. With digital control signals The relation is:

[0043] ;

[0044] in, For the preset reference voltage signal, , and This indicates the resistance value.

[0045] See Figure 3 The dynamic resistor adjustment module includes a MOSFET Q2 and a resistor R4, using a MOSFET connected in parallel with a sampling resistor of a certain value. Resistor R4 is configured as a coarse-adjustment sampling resistor, i.e., a sampling resistor value roughly configured based on the estimated current range; MOSFET Q2 is configured as a fine-adjustment sampling resistor, i.e., the sampling resistor is finely adjusted based on the measured current value, using the roughly configured sampling resistor R4 as a basis. The gate of MOSFET Q2 is connected to the control voltage output of the voltage control module. The source of MOSFET Q2 is grounded and serves as the output pin of V1. The drain of MOSFET Q2 is connected to the output current of the power supply under test and serves as the V1 output pin. 1_H The output pin is connected to the source and drain of the MOSFET Q2 via resistor R4.

[0046] According to the control voltage output by the voltage control module Control the gate of the MOSFET Q2 to adjust the on-state resistance of the source and drain of the MOSFET Q2. Then, the resistance value of the dynamically adjustable resistor module is adjusted to suit the current magnitude of the power supply being tested.

[0047] Understandably, the control voltage output by the voltage control module The drain current acts on the gate of MOSFET Q2. When the MOSFET is in the linear region, the drain current... and The relationship is approximately linear, as expressed by the following expression:

[0048] ;

[0049] When MOSFET Q2 is in the deep linear region, i.e. At this time, the leakage current MOSFET Q2 can be considered as the receiver. A voltage-controlled linear resistor connected between the source and drain terminals has a resistance value expressed by the following formula:

[0050] ;

[0051] in, This represents the voltage change between the drain and source of MOSFET Q2. This is the drain current of MOSFET Q2. For the electron migration rate, The capacitance per unit area of ​​the gate oxide layer, The aspect ratio of the oxide layer, This refers to the voltage between the gate and source of the MOSFET. This is the threshold voltage of the MOSFET. It is the source / drain on-state resistance.

[0052] By connecting a suitable sampling resistor R4 in parallel across the MOSFET Q2, the resistance value can be dynamically adjusted. That is, the main control module determines the sampling resistor level based on the sampled current value, and the voltage control module outputs a suitable control voltage. This controls the MOSFET Q2 to reach the appropriate sampling resistor level, allowing the sampling module to acquire V. 1_H The voltage signal across V1 The measured current value is calculated according to the following formula. :

[0053] ;

[0054] The voltage and current monitoring module is mainly used to collect and process the signal on the sampling resistor. In this embodiment of the invention, the LT2991 is used as the voltage and current monitoring chip, and the STM32f103 is used as the main control chip. The main control chip communicates with the voltage and current monitoring chip LT2991 through the I2C protocol.

[0055] The wide-range current measuring device provided by this invention can simultaneously measure multiple power supplies under test. See [link to related document]. Figure 4 The multi-source power supply current measurement device includes a main control module, multiple measured power supply current modules, multiple voltage control modules, multiple dynamically adjustable resistor modules, and a voltage and current monitoring module. The main control module and the voltage and current monitoring module are bidirectionally connected. The output terminal of the main control module is connected to the input terminal of each voltage control module. The output terminal of each voltage control module is connected to the input terminal of the corresponding dynamically adjustable resistor module. The output terminal of each dynamically adjustable resistor module is connected to the input terminal of the voltage and current monitoring module.

[0056] The main control module is used to control the voltage and current monitoring module to simultaneously collect the initial current magnitude of each power supply under test, and to determine the current setting level corresponding to each power supply under test based on the detected initial current magnitude of each power supply under test; and to control the corresponding voltage control module to output a corresponding control voltage to the corresponding dynamic adjustment resistor module based on the current setting level corresponding to each power supply under test, so that the resistance value of the dynamic adjustment resistor module is suitable for the current magnitude of the corresponding power supply under test.

[0057] The voltage and current monitoring module can simultaneously acquire the initial current magnitude of multiple power supplies and dynamically adjust the resistance value of the dynamic adjustment resistor module for each power supply under test to adapt to the current magnitude of each power supply. The adjustment of the sampling resistor value for each power supply under test is independent of each other. The specific dynamic adjustment method for the sampling resistor of each power supply under test can be found in the aforementioned embodiment and will not be repeated here.

[0058] See Figure 5 One LT2991 voltage and current monitoring module can monitor up to four current signals simultaneously. The LT2991 uses differential mode to acquire current signals and communicates with the main control module via the I2C protocol. The main control module adjusts the control signal based on the initial current value to obtain a suitable sampling resistor value. The LT2991 continues to acquire current signals, sends them to the main control module for processing, and outputs the final sampled current value.

[0059] See Figure 6 The present invention also provides a method for wide-range current measurement based on a wide-range current measuring device, which can be found in [reference needed]. Figure 6 The measurement method mainly includes the following steps:

[0060] Step 1: After the power supply under test is powered on, the main control module controls the voltage and current monitoring module to collect the initial current of the power supply under test.

[0061] Step 2: The main control module determines the current setting level of the power supply under test based on the detected initial current magnitude, and controls the voltage control module to output the corresponding control voltage to the dynamic adjustment resistor module based on the current setting level.

[0062] Step 3: Based on the control voltage, control the resistance value of the dynamically adjustable resistor module to be suitable for the current of the power supply under test;

[0063] Step 4: Acquire the voltage signal across the dynamically adjusting resistor module based on the voltage and current monitoring module. ;

[0064] Step 5: Control the voltage according to the dynamically adjusted resistor module. The voltage signal across the dynamically adjustable resistor module The current magnitude of the power supply under test is calculated by sampling the resistance value of the dynamically adjustable resistor module.

[0065] Step 6: Repeat steps 1 to 4 to monitor the current range of the power supply under test in real time and dynamically adjust the resistance value of the dynamic adjustment resistor module to suit the current current of the power supply under test.

[0066] It is understood that the specific implementation of each step of the wide-range current measurement method provided in the embodiments of the present invention can be referred to the foregoing technical features, and will not be described in detail here.

[0067] The wide-range current measuring device and method provided by this invention have the following beneficial effects:

[0068] (1) The wide-range current detection device designed can automatically switch the dynamic adjustment resistor module range by detecting which range the current of the power supply under test belongs to, and obtain the sampling resistor value that is suitable for the current under test. It does not introduce a gating device with a certain resistance value itself, which improves the detection accuracy, reduces the power consumption of the resistor, solves the problem of having to manually solder and replace the sampling resistor, automates the test, and improves the test efficiency.

[0069] (2) It is suitable for wide range and multi-channel current measurement. It can be expanded according to the number of power sources being measured, which is more flexible.

[0070] (3) Unlike the measurement scheme that requires selecting multiple ranges of sampling resistors through gating devices, the wide range, multi-current detection circuit only requires one set of sampling resistors for each current being measured, which has the advantages of simple structure, small circuit area and low cost.

[0071] It should be noted that the descriptions of each embodiment in the above embodiments have different focuses. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0072] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0073] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A wide-range current measuring device, characterized in that, It includes a main control module, a voltage control module, a dynamic adjustment resistor module, and a voltage and current monitoring module. The main control module and the voltage and current monitoring module are bidirectionally connected. The output terminal of the main control module is connected to the input terminal of the voltage control module. The output terminal of the voltage control module is connected to the input terminal of the dynamic adjustment resistor module. The output terminal of the dynamic adjustment resistor module is connected to the input terminal of the voltage and current monitoring module. The main control module is used to control the voltage and current monitoring module to acquire the initial current of the power supply under test, and to determine the range of the dynamic adjustment resistor module based on the detected initial current of the power supply under test; and to control the voltage control module to output a corresponding control voltage based on the range of the dynamic adjustment resistor module. The dynamic adjustment resistor module is configured such that its resistance value is suitable for the current magnitude of the power supply being tested. The voltage signal across the dynamically adjusting resistor module is acquired by the voltage and current monitoring module. ; According to the control voltage of the dynamically adjusted resistor module The voltage signal across the dynamically adjustable resistor module And the sampling resistance value of the dynamically adjustable resistor module is used to calculate the current of the power supply under test; The voltage control module includes a DAC digital-to-analog converter, resistors R1, R2, and R3, a DC-DC converter, an inductor L1, a transient suppression diode D1, and a capacitor C1. The DC-DC converter includes an error comparator A1, a controller, and a MOSFET Q1. The input terminal of the DAC (Digital-to-Analog Converter) is connected to the output terminal of the main control module. The output terminal of the DAC is connected to the negative input terminal of the error comparator A1 via resistor R1. The positive input terminal of the error comparator A1 is connected to V. REF The output of the error comparator A1 is connected to the input of the controller, and the output of the controller is connected to the gate G of the MOSFET Q1. The source of the MOSFET Q1 is grounded, and the drain of the MOSFET Q1 outputs a control voltage through the transient suppression diode D1. In the aforementioned dynamic adjustment resistor module, the end of the transient suppression diode D1 closest to the MOSFET Q1 is connected to the power supply through inductor L1, and the end of the transient suppression diode D1 furthest from the MOSFET Q1 is grounded through capacitor C1. The main control module is used to determine the range of the dynamic adjustment resistor module based on the detected initial current of the power supply under test, and output a digital control signal according to the determined range. The voltage is fed to the DAC (digital-to-analog converter) and then output as a control voltage via the voltage control module. To the dynamically adjustable resistor module.

2. The wide-range current measuring device according to claim 1, characterized in that, The voltage control module outputs a control voltage. With the digital control signal The relation is: ; in, For the preset reference voltage signal, , and This indicates the resistance value.

3. The wide-range current measuring device according to claim 1, characterized in that, The dynamically adjustable resistor module includes a MOSFET Q2 and a resistor R4. The MOSFET Q2 is configured as a fine-tuning sampling resistor, and the resistor R4 is configured as a coarse-tuning sampling resistor. The gate of the MOSFET Q2 is connected to the output terminal of the voltage control module, the source of the MOSFET Q2 is grounded and serves as the V1 output pin, and the drain of the MOSFET Q2 is connected to the output current of the power supply being measured and serves as the V1 output pin. 1_H The output pin is connected to the source and drain of the MOSFET Q2 via resistor R4. According to the control voltage output by the voltage control module Control the gate of the MOSFET Q2 to adjust the on-state resistance of the source and drain of the MOSFET Q2. Then, the resistance value of the dynamically adjustable resistor module is adjusted to suit the current magnitude of the power supply being tested.

4. The wide-range current measuring device according to claim 3, characterized in that, When the MOSFET Q2 is in the deep linear region, the MOSFET Q2 is considered as the receiver. A voltage-controlled linear resistor connected between the source and drain terminals is used for control, and its resistance value is... for: ; in, This represents the voltage change between the drain and source of MOSFET Q2. This is the drain current of MOSFET Q2. For the electron migration rate, The capacitance per unit area of ​​the gate oxide layer, The aspect ratio of the oxide layer, This is the voltage between the gate and source of the MOSFET Q2, i.e., the control voltage. This is the threshold voltage of MOSFET Q2. It is the on-state resistance between the source and drain of MOSFET Q2.

5. The wide-range current measuring device according to claim 4, characterized in that, According to the control voltage of the dynamically adjusted resistor module and the voltage signal across the dynamically adjustable resistor module Calculate the magnitude of the current in the power supply being tested, including: ; in, The magnitude of the current of the power supply being measured. This is the drain current of MOSFET Q2 when it is in the linear region. The current flowing through resistor R4, For the electron migration rate, The capacitance per unit area of ​​the gate oxide layer, The aspect ratio of the oxide layer, This is the voltage between the gate and source of the MOSFET Q2, i.e., the control voltage. This is the threshold voltage of MOSFET Q2. This represents the resistance value.

6. The wide-range current measuring device according to claim 1, characterized in that, The main control module uses an STM32f103 main control chip, and the voltage and current monitoring module uses an LT2991 chip.

7. The wide-range current measuring device according to claim 1, characterized in that, The power supply under test, the voltage control module, and the dynamic adjustment resistor module are all multi-channel. The main control module is bidirectionally connected to the voltage and current monitoring module. The output terminal of the main control module is connected to the input terminal of each voltage control module. The output terminal of each voltage control module is connected to the input terminal of the corresponding dynamic adjustment resistor module. The output terminal of each dynamic adjustment resistor module is connected to the input terminal of the voltage and current monitoring module. The main control module is used to control the voltage and current monitoring module to simultaneously collect the initial current magnitudes of multiple power supplies under test, and to determine the setting level of the dynamic adjustment resistor module corresponding to each power supply under test based on the collected initial current magnitudes of each power supply under test; and to control the corresponding voltage control module to output a corresponding control voltage to the corresponding dynamic adjustment resistor module based on the setting level of each dynamic adjustment resistor module, so that the setting level of the dynamic adjustment resistor module reaches the set value, that is, the sampling resistance value is suitable for the current magnitude of the corresponding power supply under test.

8. A wide-range current measurement method based on the wide-range current measuring device according to claim 1, characterized in that, include: Step 1: After the power supply under test is powered on, the main control module controls the voltage and current monitoring module to collect the initial current of the power supply under test. Step 2: The main control module determines the setting level of the dynamic adjustment resistor module based on the detected initial current of the power supply under test, and controls the voltage control module to output the corresponding control voltage to the dynamic adjustment resistor module based on the setting level of the dynamic adjustment resistor module. Step 3: Based on the control voltage, control the resistance value of the dynamically adjustable resistor module to be suitable for the current of the power supply under test; Step 4: Acquire the voltage signal across the dynamically adjusting resistor module based on the voltage and current monitoring module. ; Step 5: Control the voltage according to the dynamically adjusted resistor module. The voltage signal across the dynamically adjustable resistor module The current magnitude of the power supply under test is calculated by sampling the resistance value of the dynamically adjustable resistor module.

9. The wide-range current measurement method according to claim 8, characterized in that, In step 5, the voltage is controlled according to the dynamically adjusted resistor module. The voltage signal across the dynamically adjustable resistor module The method includes sampling the resistance value of the dynamically adjusted resistor module, calculating the current of the power supply under test, and then further including: Repeat steps 1 to 4 to monitor the current value of the power supply under test in real time and dynamically adjust the resistance value of the dynamic adjustment resistor module according to the current range to suit the current magnitude of the current under test.

Citation Information

Patent Citations

  • Simplified four-quadrant change test method and circuit

    CN112147533A

  • Current sampling circuit, device and equipment

    CN120405219A