Field effect transistor detection device

Abstract

The invention relates to the technical field of transistor detection equipment, in particular to a field effect transistor detection device, which solves the problem of low detection efficiency of a field effect transistor traditionally, and comprises a bearing device and a mounting frame, a contact terminal is used for being in contact with a pin to realize electric connection, and the mounting frame is fixedly connected with a stress part. The bearing device is provided with a stress part, the stress part is mounted at a position where the transistor body passes on the bearing device, when the transistor body passes through the stress part to be detected, the acting force of the movement of the transistor body acts on the stress part, and the stress part can drive the mounting frame to move, so that the contact terminal on the mounting frame moves to a position where the pins are not hindered from passing; when the transistor body passes through the stress piece, the installation frame returns to the original position, the contact terminals return to the original position, are located at the downstream positions of the corresponding pins and do not make contact with any pins so that the contact terminals can make contact with the corresponding pins on the transistor body, and when the transistor body continues to be conveyed, the pins make contact with the corresponding contact terminals.

Description

Technical Field

[0001] The present invention relates to the technical field of transistor detection equipment, and in particular to a field effect transistor detection device. Background Art

[0002] Field-effect transistors (FETs), key components in modern electronic devices, are widely used in numerous fields, including computers, communications, and consumer electronics. Their performance directly impacts the overall performance and stability of electronic devices, making accurate and efficient testing of FETs crucial.

[0003] Currently, when testing transistors, a common method is to insert and remove the transistors into a testing device for testing, as transistors typically have multiple pins with a certain amount of space between them. Existing operating modes mainly include manual insertion and insertion using devices such as robotic grippers.

[0004] Under the manual plug-in method, workers need to manually insert transistors one by one into the interface of the detection device. This process not only consumes a lot of manpower and time and is extremely inefficient, but also long-term repetitive operations can easily cause worker fatigue, which in turn causes detection errors and cannot meet the needs of large-scale, high-efficiency production detection.

[0005] While using gripping devices like robotic grippers improves inspection efficiency to a certain extent, the improvement in inspection efficiency is limited by the need for a series of actions, including gripping, moving, inserting, removing, and placing the components. Furthermore, these devices are complex, involving the coordinated operation of multiple systems, including mechanical transmission, automated control, and high-precision sensors. This significantly increases equipment costs, both in terms of purchase and ongoing maintenance. Summary of the Invention

[0006] (1) Technical problems solved

[0007] In view of the shortcomings of the prior art, the present invention provides a field effect transistor detection device to solve the problem of low efficiency of traditional field effect transistor detection.

[0008] (2) Technical solution

[0009] To achieve the above-mentioned objectives, the present invention provides the following technical solutions: a field effect transistor detection device, comprising a carrying device for carrying a transistor body, and the transistor body can be transported on the carrying device, and also comprising a mounting frame, the mounting frame being provided with contact terminals corresponding one-to-one to the pins on the transistor body, the contact terminals being used to contact the pins to achieve electrical connection, the mounting frame being fixedly connected to a force-bearing member, and the force-bearing member being installed at a position where the transistor body passes on the carrying device, when the transistor body passes through the force-bearing member to be detected, the force of the movement of the transistor body acts on the force-bearing member, and the force-bearing member can drive the mounting frame to move so that the contact terminals on the mounting frame move to a position that does not hinder the passage of the pins; after the transistor body passes through the force-bearing member, the mounting frame returns to its original position, causing the contact terminals to return to their original position and be located downstream of the corresponding pins, and not in contact with any pins, waiting to contact the corresponding pins on the transistor body, and when the transistor body continues to be transported, its pins contact each corresponding contact terminal one by one.

[0010] Furthermore, the contact terminal is an elastic contact piece.

[0011] Furthermore, the contact terminal has a force-bearing portion, a contact portion and a wiring portion, the force-bearing portion is bent, the end surface of the contact portion that contacts the pin is flat, and the wiring portion is used for wiring.

[0012] Furthermore, the force-bearing member drives the mounting frame to move in a rotational manner.

[0013] Furthermore, a connecting shaft is provided on the mounting frame, and the mounting frame and the force-bearing member are fixedly connected through the connecting shaft. A connecting member is installed on the connecting shaft, and the connecting member is rotatably connected to the connecting shaft. The connecting member is used to fix the installation position of the connecting shaft. When the force-bearing member drives the mounting frame to move in a rotational manner, the mounting frame rotates around the connecting shaft.

[0014] Furthermore, the force-bearing member drives the mounting frame to move in a linear direction.

[0015] Furthermore, a connecting plate is provided on the mounting frame, and the mounting frame and the force-bearing member are fixedly connected through the connecting plate. A guide shaft passing through the connecting plate is installed on the connecting plate, and the connecting plate and the guide shaft are slidably connected. The guide shaft guides the connecting plate for linear motion. When the force-bearing member drives the mounting frame to move in a linear direction, the mounting frame moves along the axial direction of the guide shaft.

[0016] Furthermore, the position of the contact terminal on the mounting frame is adjustable to accommodate transistor bodies with different pin pitches.

[0017] Furthermore, a mounting groove is provided on the mounting frame, and a connecting block installed in the mounting groove is provided on the contact terminal, and the connecting block can slide in the mounting groove. A mounting block is provided on the outer wall of the wiring terminal, and a screw is connected to the mounting block through a thread, and a stop block is provided at one end of the screw. The stop block at the end of the screw can be abutted against the mounting frame to fix the position of the contact terminal, and a screw for rotating the screw is provided on the screw, and an anti-slip pad is provided on the end face of the stop block.

[0018] Furthermore, a rotatable roller is installed on the force-bearing member.

[0019] (3) Beneficial effects

[0020] Compared with the prior art, the present invention provides a field effect transistor detection device having the following

[0021] Beneficial effects:

[0022] This field effect transistor detection device, through the arrangement of a carrying device, a mounting frame and contact terminals, allows the transistor to automatically complete the electrical connection and detection steps by moving along the carrying device and passing through the contact terminals, greatly reducing the detection process and optimizing the detection process, without relying on traditional plugging and unplugging actions to complete the detection.

[0023] Traditional plug-in inspection methods, whether manual or using complex mechanical structures, are limited in speed. In this device, the transistor moves continuously on the carrier, eliminating the need for pausing for complex movements (holding, moving, inserting, removing, and placing the transistor down). Inspection can be completed while the transistor is being transported, significantly improving inspection efficiency.

[0024] Eliminating the complex mechanical structures (manipulators, fixtures, etc.) and supporting high-precision positioning equipment required for traditional plug-in / plug-out testing, this device requires only a simple combination of a carrier, contact terminals, and a mounting frame to complete the test. This greatly simplifies the overall structure of the device and significantly reduces costs, from equipment purchase to subsequent maintenance. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention;

[0026] Figure 2 It is a schematic diagram of the three-dimensional structure of the carrying device of the present invention;

[0027] Figure 3 This is a schematic diagram of the three-dimensional structure of the first movement mode of the force-bearing member of the present invention, wherein the transistor body passes through the force-bearing member;

[0028] Figure 4Schematic diagram of the three-dimensional structure of the first movement mode of the force-bearing member of the present invention, wherein when the transistor body passes through the force-bearing member;

[0029] Figure 5 A schematic diagram of the motion structure of the first motion mode of the force-bearing member of the present invention;

[0030] Figure 6 Schematic diagram of the three-dimensional structure of the second movement mode of the force-bearing member of the present invention, wherein the transistor body passes through the force-bearing member;

[0031] Figure 7 A schematic diagram of the motion structure of the second motion mode of the force-bearing member of the present invention;

[0032] Figure 8 Schematic diagram of the three-dimensional structure of the first movement mode of the force-bearing member of the present invention, wherein a force-bearing member is added downstream in the movement direction of the transistor body;

[0033] Figure 9 This is a side view of the first movement mode of the force-bearing member of the present invention, wherein a force-bearing member is provided downstream in the direction of movement of the transistor body;

[0034] Figure 10 Schematic diagram of the side structure of the second movement mode of the force-bearing member of the present invention, wherein a force-bearing member is additionally provided downstream in the direction of movement of the transistor body;

[0035] Figure 11 Schematic diagram of the side structure of the contact terminal of the present invention;

[0036] Figure 12 This is a schematic diagram of a three-dimensional structure in which the position of the contact terminal of the present invention is adjustable;

[0037] Figure 13 This is a schematic diagram of an exploded three-dimensional structure of the present invention in which the position of the contact terminal can be adjusted;

[0038] Figure 14 It is a schematic diagram of the three-dimensional structure of the limit plate installed in the carrying device of the present invention;

[0039] Figure 15 This is a bottom view of the structure of the limit plate installed in the carrying device of the present invention;

[0040] Figure 16 For the present invention Figure 6 A schematic diagram of the structure of the local enlargement shown in FIG;

[0041] Figure 17 For the present invention Figure 13 A schematic diagram of the structure of the local enlargement of point B is shown in FIG.

[0042] Figure: 1. Carrying device; 2. Transistor body; 3. Mounting frame; 4. Contact terminal; 5. Force-bearing member; 6. Pin; 7. Terminal block; 8. Wire; 9. Connecting shaft; 10. Connecting member; 11. Connecting plate; 12. Guide shaft; 13. Stop block; 14. Mounting slot; 15. Connecting block; 16. Mounting block; 17. Lead screw; 18. Stop block; 19. Anti-slip pad; 20. Screw piece; 21. Roller ; 22. Slide groove; 23. Opening; 24. Mounting port; 25. Support leg; 26. Conveyor belt; 27. Connecting rod; 28. Support member; 29. ​​Connecting part; 30. Rebound device; 31. Wire trough; 32. Inlet; 33. Rubber strip; 34. Limiting plate; 35. Threaded rod; 36. Screw block; 37. Guide rod; 38. Rotating shaft; 401. Force-bearing part; 402. Contact part; 403 Wiring part. DETAILED DESCRIPTION

[0043] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0044] In the prior art, the field-effect transistor (hereinafter referred to as the transistor body) is a vital semiconductor device that plays a diverse and critical role in the field of modern electronics. The transistor body 2 has a plurality of pins 6, which play a key role in the realization of the function. The pins 6 are made of conductive material, and their good conductivity ensures the efficient transmission of current, thereby ensuring that the transistor body 2 can work normally. On the transistor body 2, there is a certain gap between each pin 6. The design of these gaps is of great significance. It can effectively avoid problems such as short circuits caused by the close distance between the pins 6, and ensure that the pins 6 transmit electrical signals independently and stably, thereby ensuring that the transistor body 2 operates stably and reliably in various electronic devices, providing a solid foundation for the normal operation of the entire circuit system.

[0045] See also Figure 1-2 As shown, a field effect transistor testing device of the present invention includes a carrier device 1 for carrying a transistor body 2, and the transistor body 2 can be transported on the carrier device 1. In actual applications, the carrier device 1 has various forms, and common ones include traditional carrier racks, carrier frames, and carrier trays. These devices can effectively realize the operation of carrying and transporting the transistor body 2.

[0046] Since the transistor body 2 itself is relatively light, in order to improve its stability during transportation, the preferred carrier 1 should have the function of blocking the side walls of the transistor body 2 except for the direction of movement. Figure 1 As shown, the carrying device 1 takes the carrying frame as an example, and a slide groove 22 is provided inside the carrying frame. The slide groove 22 guides the movement of the transistor body 2, and the transistor body 2 can slide smoothly in the slide groove 22. An opening 23 is provided on the side wall of the carrying frame, and its function is to allow the pins 6 of the transistor body 2 to pass through and out, which not only ensures the effective connection between the pins 6 of the transistor body 2 and the external circuit, but also does not affect the normal sliding of the transistor body 2 in the carrying device 1. When the transistor body 2 slides in the slide groove 22 of the carrying frame, the inner wall of the slide groove 22 fits tightly with the outer wall of the transistor body 2. This improves the stability of the movement of the transistor body 2. The tightly fitting slide groove 22 and the outer wall of the transistor can effectively reduce the shaking and deviation of the transistor body 2 during the sliding process.

[0047] In the present invention, the aforementioned carrier frame is merely an example to explain the principle of the carrier device 1 carrying the transistor body 2. The slide groove 22 and opening 23 mentioned therein are primarily intended to help those skilled in the art understand the technical content more intuitively and vividly, but these descriptions do not constitute a limitation on the structure of the carrier device 1.

[0048] The present invention ensures stable transport of the transistor body 2 on the carrier 1 and ensures normal contact with the contact terminals 4, described in detail below, during transport. In other words, as long as the carrier 1 can achieve stable transport of the transistor body 2 and ensure stable contact between the pins 6 of the transistor body 2 and the contact terminals 4, regardless of the specific structure and form of the carrier 1, it falls within the scope of protection of the present invention.

[0049] The slide groove 22 in the carrier frame described above is adapted to the transistor body 2. The inner wall of the slide groove 22 fits tightly against the outer wall of the transistor, effectively improving the stability of the transistor body 2 during movement. However, this design has obvious limitations. It is difficult to transport transistor bodies 2 of different models (volumes), and its practicality is insufficient.

[0050] This issue has not been resolved, as Figure 14-15 As shown, improvements have been made to the design of the slide groove 22 of the carrier frame. The cross-sectional area of ​​the slide groove 22 is increased, and a limit plate 34 is installed on at least one side of the slide groove 22, such as the top wall and / or the side wall. By adjusting the position of the limit plate 34, it can adapt to transistor bodies 2 of different models (sizes and volumes).

[0051] Specifically, a threaded rod 35 is rotatably connected to the limit plate 34, and the threaded rod 35 is threadedly connected to the supporting frame. A screw block 36 is provided on the threaded rod 35 to facilitate the rotation of the operator. In addition, a guide rod 37 is also installed on the limit plate 34, and the guide rod 37 passes through the supporting frame and is slidably connected to the supporting frame. When the position of the limit plate 34 needs to be adjusted, the operator only needs to rotate the threaded rod 35. During the rotation process, the threaded rod 35 will drive the limit plate 34 to move along the direction of the guide rod 37 due to its threaded connection relationship with the supporting frame. The presence of the guide rod 37 plays a good guiding role when the limit plate 34 moves, which can significantly improve the stability of the limit plate 34 during movement, ensure that the adjustment process is accurate and reliable, and thus enable the entire slide 22 to better adapt to the transportation requirements of different models of transistor bodies 2.

[0052] In the direction of the limit plate 34 toward the transistor body 2, a rotating shaft 38 is rotatably installed. When the transistor body 2 contacts the rotating shaft 38 on the limit plate 34 during transportation, the rotating shaft 38 can rotate when the transistor body 2 is displaced. This improves the smoothness of the transportation of the transistor body 2. Compared with the direct contact between the limit plate 34 and the transistor body 2, the rotation of the rotating shaft 38 converts the original sliding friction into rolling friction, greatly reducing the resistance. This effectively avoids the situation where the transistor body 2 is stuck or unevenly stressed due to excessive friction, ensures the stability of the transistor body 2 during transportation, and ensures that the entire transportation process is smoother.

[0053] The carrier device 1, still using a carrier frame as an example, transports the transistor body 2. Support legs 25 are provided at the bottom of the carrier frame to stabilize the carrier frame and ensure its stability during operation. An installation opening 24 is provided on the outer wall of the carrier frame, which is primarily used to install a conveyor belt 26. The rotation of the conveyor belt 26 is used to transport the transistor body 2. Anti-slip grooves are provided on the conveyor belt 26, effectively increasing the friction between the conveyor belt 26 and the transistor body 2, preventing the transistor body 2 from slipping during transportation, thereby ensuring the stability and reliability of the transportation process.

[0054] Of course, the conveying method is not limited to conveying by conveyor belt 26. For example, a telescopic rod can be provided at one end of the conveying frame, and the transistor body 2 can be conveyed mechanically by extending and retracting the telescopic rod. In addition, if conveyor belt 26 is not used, manual operation can also be selected, where the hand directly pushes the transistor body 2 through the mounting opening 24 to move it within the carrier frame, completing the task of conveying the transistor body 2. This can meet the needs of different conveying methods for the transistor body 2.

[0055] The carrying device 1 serves as a carrier for conveying and transporting the transistor body 2 , and its function is to carry and transport the transistor body 2 efficiently and stably.

[0056] The carrier device 1 can be installed at a downstream position of the transistor production line, or it can be directly connected to the conveyor line of the production line. When the carrier device 1 is connected to the production line, the transistor that has just been produced can immediately enter the carrier device 1, and the subsequent conveying process can be continuously completed with the help of the carrier device 1. This allows the transistor to be connected to the original production process in the entire production process, especially the conveying process. It greatly improves production efficiency, reduces time loss and product damage risks caused by process conversion (traditionally, the transistor body 2 is inspected by clamping, which requires holding, moving, inserting, unplugging, putting down, etc.), and ensures the smoothness and efficiency of the entire production process.

[0057] In the technical solution of the present invention, contact terminals 4 corresponding one-to-one to the pins 6 on the transistor body 2 are installed through the mounting frame 3 at the position where the pins 6 of the transistor body 2 must pass. The contact terminals 4 are made of conductive material. The function of the contact terminals 4 is to achieve electrical connection between the pins 6 after contacting them.

[0058] like Figure 11 As shown, in the present invention, the contact terminal 4 is a key component for achieving electrical connection with the pin 6, and its specific embodiment adopts an elastic contact piece.

[0059] Contact terminal 4 primarily consists of a force-bearing portion 401, a contact portion 402, and a connection portion 403. Force-bearing portion 401 is curved. Furthermore, when pin 6 passes through contact terminal 4, force-bearing portion 401 first contacts transistor body 2. Because force-bearing portion 401 is curved, the force applied by pin 6 can deform contact terminal 4, facilitating subsequent electrical connection.

[0060] The contact portion 402 has a certain length, and the end surface of the contact portion 402 in contact with the pin 6 is arranged in a plane. This planar design can increase the contact area with the pin 6 and ensure the stability of the electrical connection. When the pin 6 of the transistor body 2 passes through the contact terminal 4, the movement of the pin 6 will act on the force-bearing portion 401. Since the force-bearing portion 401 is elastic, the contact terminal 4 will deform under the force of the pin 6. Based on this elastic deformation, the end surface of the contact portion 402 will fit tightly with the pin 6. The close fit between the contact portion 402 and the pin 6 enables a good electrical connection between the two, ensuring that current can be stably transmitted between the transistor body 2 and the external circuit.

[0061] The wiring portion 403 plays an important role in connecting the entire transistor body 2 with the external circuit and is a key part for achieving connection with the external circuit. Its function is to be used for wiring and to effectively electrically connect the transistor body 2 to the external circuit. Specifically, a wiring terminal 7 is provided on the wiring portion 403, and a wire 8 is connected to the wiring terminal 7, and the wire 8 is connected to the detection equipment. When the contact terminal 4 contacts the corresponding pin 6 on the transistor body 2, the current or signal can be conducted in sequence through the contact terminal 4, the wiring terminal 7 and the wire 8. The detection equipment can use this complete electrical connection path to comprehensively detect the performance, parameters, etc. of the transistor body 2, and then determine whether the transistor meets the quality standards and whether it is working properly.

[0062] The shape of contact terminal 4 has been described in detail above primarily to help those skilled in the art better understand the operating principle of contact terminal 4 and how current flows through contact terminal 4 to establish a connection with pin 6, thereby enabling electrical signal transmission. However, it should be noted that the functionality of contact terminal 4 is not dependent on a specific shape or structure.

[0063] In fact, contact terminals 4 of various shapes and structures can be used in this technical solution as long as they can ensure good contact with pins 6 and successfully achieve a stable electrical connection. Whether the contact terminal 4 is a conventional inclined plate, a circular plate, a rotatable shaft, or a special-shaped structure designed to accommodate special space and functional requirements, as long as it can achieve a reliable connection with pins 6 and complete power or signal transmission, it meets the requirements of the present invention and is within the scope of protection covered by the present invention, and is not limited to the contact terminal 4 shapes described in detail above and shown in the drawings.

[0064] The function of the mounting frame 3 is to mount the contact terminals 4 and provide a stable mounting base for the contact terminals 4 . There are various embodiments for mounting the mounting frame 3 .

[0065] In the first embodiment, the mounting frame 3 is fixedly installed. The mounting frame 3 can be directly fixedly connected to the carrier device 1, and the carrier device 1 is used to provide it with a stable support base to ensure that the mounting frame 3 remains stable during the transportation of the transistor body 2 without displacement or shaking, thereby ensuring the accurate docking of the contact terminal 4 and the pin 6.

[0066] In addition, the mounting frame 3 can also be fixed in the designated position with the help of other supporting devices such as supporting frames. The supporting frames can be flexibly selected and set according to the actual space layout and equipment requirements to provide stable support for the mounting frame 3 so that it can be installed in the designated working position.

[0067] When the transistor body 2 is transported by the carrier 1, its pins 6 also move synchronously. When the transistor body 2 moves to the specified position, its pins 6 can contact the corresponding contact terminals 4 on the mounting frame 3, thereby achieving electrical connection, and the transistor body 2 can be inspected by the inspection equipment. This design allows the inspection of the transistor body 2 to be completed synchronously during the transportation process of the transistor body 2, eliminating the need for traditional plug-in and unplugging methods to inspect the transistor body 2, and eliminating the need for additional operation steps on the transistor body 2, effectively improving the overall inspection efficiency.

[0068] Contact terminal 4 plays a key role in testing transistor body 2. During testing, contact terminal 4 can remain energized. When contact terminal 4 successfully contacts the corresponding pin 6 of transistor body 2, a normal current path is established, enabling testing of the transistor.

[0069] Most transistors have the characteristic of not being able to conduct in the reverse direction, which is determined by their internal structure. When the non-matching contact terminal 4 contacts the pin 6, since the transistor itself cannot conduct reverse current, even if the contact terminal 4 is energized, it cannot establish an effective detection circuit, and naturally cannot complete normal detection. Only when the corresponding contact terminal 4 is in precise contact with the corresponding pin 6 can a complete and normal current circuit be formed, thereby displaying accurate detection values ​​and effectively detecting transistor performance parameters. Therefore, the contact terminal 4 can remain energized.

[0070] Here are some examples of FETs that will not conduct when reverse current is applied:

[0071] 1. N-channel enhancement MOSFET: When the N-channel enhancement MOSFET is working normally, the gate voltage is higher than the source voltage to form a conductive channel, and current flows from the drain to the source. When reverse power is applied, that is, when current attempts to flow from the source to the drain, there is not enough gate voltage to induce the formation of an N-type conductive channel, and its internal PN junction (except for the body diode) is in a reverse biased state, so it cannot conduct.

[0072] 2. P-channel enhancement MOSFET: A P-channel enhancement MOSFET requires the gate voltage to be lower than the source voltage, and the difference must reach the threshold voltage to form a P-type conductive channel, allowing current to flow from the source to the drain. If the current is reversed, that is, the current wants to flow from the drain to the source, the voltage between the gate and the source does not meet the conduction conditions. The internal PN junction is reverse biased, and a conductive channel cannot be formed, thus preventing conduction.

[0073] 3. Depletion-mode N-channel JFET: A depletion-mode N-channel JFET has a conductive channel at zero gate voltage. During normal operation, a negative gate voltage controls the channel current, with current flowing from the drain to the source. When reverse current is applied, the polarity of the source and drain voltages changes, causing the PN junction (the PN junction between the gate and the channel) to be reverse biased, preventing electron flow. Even if the gate voltage is 0, the JFET cannot conduct because the current direction is opposite to the normal flow of electrons in the channel.

[0074] 4. Depletion-mode P-channel JFET: When the depletion-mode P-channel JFET is operating normally, a positive voltage is applied to the gate to control the current, and the current flows from the source to the drain. When the power is reversed, the source-drain voltage is reversed, which causes the PN junction between the gate and the channel to be reverse biased, preventing the flow of holes and forming a current path, so it cannot conduct.

[0075] In actual applications, some field effect transistors are still in the on state when reverse current is applied. Considering the safety of the circuit system, in order to avoid unnecessary current loss or potential circuit failure risks, the contact terminal 4 may no longer be kept in the energized state.

[0076] To achieve this, an additional sensor and controller are required. The sensor detects the position of the transistor body 2. When the transistor body 2, while being transported on the carrier 1, reaches the position monitored by the sensor, the sensor immediately captures this signal. Based on the sensor's feedback, the controller energizes the contact terminals 4.

[0077] More precisely, when the transistor body 2 continues to move until its pins 6 reach the position corresponding to the corresponding contact terminals 4, the contact terminals 4 will be energized. This design only powers the contact terminals 4 when the transistor body 2 is in the optimal detection position, effectively avoiding the potential safety hazards and energy loss caused by continuously energizing the contact terminals 4, thereby improving safety.

[0078] Although the mounting frame 3 using a fixed mounting method can achieve contact between the contact terminal 4 and the pin 6 and realize the detection of the transistor body 2, it has significant shortcomings.

[0079] As the transistor body 2 is transported on the carrier 1, its multiple pins 6 sequentially come into contact with the contact terminals 4 during movement. For example, as the transistor body 2 is transported from one side of the carrier 1 to the other, the pins 6 on the transistor body 2 successively come into contact with the contact terminals 4, causing them to deform. This begins with the first contact terminal 4, then the second, and so on, until contact is complete with the corresponding contact terminal 4 and detection is performed.

[0080] However, after the test is complete, as the transistor body 2 continues to move downward, the pins 6 continue to move each contact terminal 4 it passes. This process becomes more problematic if the transistor body 2 has a large number of pins 6. Because each time a transistor body 2 passes through, the contact terminal 4 is moved by multiple pins 6, the repeated mechanical forces on the contact terminal 4 accumulate over time, making it susceptible to fatigue damage. This seriously shortens the service life of the contact terminal 4, increases the frequency of contact terminal 4 replacement, and increases the cost of use.

[0081] Therefore, the second embodiment, such as Figure 3-7 As shown, the mounting frame 3 is movably mounted, and a force-bearing member 5 is fixedly connected to the mounting frame 3. The force-bearing member 5 is installed at a position where the transistor body 2 must pass on the carrier device 1, and is located upstream of the detection of the transistor body 2. The force-bearing member 5 can be set to a curved shape or an inclined shape, but a force-bearing member 5 of any shape and structure can be used in the present invention, as long as it can move when subjected to force. When the transistor body 2 is transported on the carrier device 1 and passes through the force-bearing member 5, the force generated by its movement will act on the force-bearing member 5. The force-bearing member 5 is acted upon by the force to drive the mounting frame 3 to move, thereby moving the contact terminal 4 on the mounting frame 3 to a position that does not hinder the passage of the pin 6. In this way, during the transportation of the transistor body 2, the pin 6 will not make unnecessary contact with the contact terminal 4 during the non-detection stage.

[0082] After the transistor body 2 passes through the force-bearing member 5 smoothly, the mounting frame 3 can return to its original position by its own gravity or with the help of a pre-set rebound device 30. At the same time, it drives the contact terminal 4 to return to its original position synchronously. There are two situations. First, the position of the contact terminal 4 can be adjusted so that it directly contacts the pin 6 when it returns to its original position. However, in this way, the impact force generated when the contact terminal 4 returns can easily cause the pin 6 to deform, affecting the quality of the transistor. Therefore, a more reasonable design is that the contact terminal 4 is located downstream of the corresponding pin 6 when it returns to its original position, and remains in a non-contact state with any other pin 6. This setting can effectively prevent the pin 6 from being deformed due to the impact of the return of the contact terminal 4, protect the pin 6 from always being in good condition, and ensure the quality of the transistor body 2.

[0083] When returning to their original positions, contact terminals 4 are positioned downstream of their corresponding pins 6 and remain out of contact with them, allowing the transistor body 2 to be transported further. As the transistor body 2 continues to move, its pins 6 make contact with each corresponding contact terminal 4, allowing the testing device to inspect the transistor body 2. This effectively prevents unnecessary contact between the pins 6 and the contact terminals 4 during transport, significantly extending the life of the contact terminals 4 and ensuring the stability and accuracy of the testing process.

[0084] like Figure 3-5 As shown, the first motion mode of the force-bearing member 5 is rotational motion. The mounting frame 3 is provided with a connecting shaft 9, which securely connects the force-bearing member 5 to the mounting frame 3. When the force-bearing member 5 moves, it drives the mounting frame 3 to move synchronously, ensuring consistent motion between the two.

[0085] Connecting shaft 9 is mounted with a connecting member 10, which is rotatably connected to connecting shaft 9. Connecting member 10 can be mounted directly on carrier 1, providing a stable support base, or it can be mounted on the support frame used to support mounting bracket 3, as described above, with the support frame securing connecting member 10. Regardless of the mounting method, once the support frame or carrier 1 is fixedly connected to connecting member 10, the mounting position of connecting shaft 9 can be effectively fixed, thereby ensuring the stability of the mounting of connecting shaft 9.

[0086] When the force bearing member 5 drives the mounting frame 3 to move, as shown in FIG. Figure 5 The mounting frame 3 rotates with the connecting shaft 9 as the axis. Figure 5 The mounting frame 3 is ensured to rotate under the driving of the force-bearing member 5, thereby driving the position of the contact terminal 4 to change.

[0087] In the second movement mode of the force-bearing member 5, the force-bearing member 5 drives the mounting frame 3 to move in a straight line. A connecting plate 11 is provided on the mounting frame 3, which fixedly connects the mounting frame 3 and the force-bearing member 5 to ensure that the two remain synchronized during the movement.

[0088] like Figure 6-7 As shown, a guide shaft 12 is installed on the connecting plate 11. The guide shaft 12 passes through the connecting plate 11, and the connecting plate 11 and the guide shaft 12 are in a sliding connection state. Similarly, the guide shaft 12 can be directly installed on the load-bearing device 1, with the help of the load-bearing device 1 to provide a stable support base; it can also be installed on the support frame used to support the mounting frame 3 mentioned above, and the position of the guide shaft 12 is fixed by the support frame. The guide shaft 12 plays a guiding role, and it provides a precise guide path for the movement of the connecting plate 11 in the straight direction. When the force-bearing member 5 applies a driving force to the mounting frame 3, as shown in FIG. Figure 7The mounting bracket 3 moves along the axial direction of the guide shaft 12, as shown in FIG. Figure 7 This linear motion design based on the guide shaft 12 effectively ensures the accuracy and stability of the movement of the mounting frame 3, avoids offset or shaking during movement, and enables the mounting frame 3 to accurately achieve linear displacement under the drive of the force-bearing member 5. A limit block 13 is installed at the end of the guide shaft 12. The limit block 13 and the guide shaft 12 can be fixedly connected, integrally formed, or detachably connected. The function of the limit block 13 is to prevent the connection plate 11 from detaching from the guide shaft 12, and the connection plate 11 cannot pass through the limit block 13.

[0089] During the transistor testing process, when the transistor body 2 moves to a designated position, its pins 6 contact the contact terminals 4, thereby achieving testing. After the test is completed, to facilitate the removal of the tested transistor body 2, an outlet can be provided on the side of the carrier 1 along the length of the pins 6.

[0090] The transistor body 2 can be taken out of the outlet manually by holding it along the length of the pin 6; or it can be pushed out of the outlet by automated equipment such as a cylinder, an electric telescopic rod or other telescopic device.

[0091] In addition, during the production process of the transistor body 2, the feeding (transistor body 2 delivery) gap can be controlled. For example, the feeding time of the transistor body 2 is set by the device to ensure that the transistor maintains a suitable spacing when moving on the carrier 1. When one transistor is detected and moves downstream, the next transistor moves to the force-bearing member 5. At this time, the force-bearing member 5 drives the contact terminal 4 to move to a position that does not hinder the movement of the pin 6, ensuring that the contact terminal 4 will not block the transistor body 2 when it moves downstream after the detection is completed, and then the pin 6 of the transistor body 2 will not contact the contact terminal 4 when it moves downstream after the detection is completed.

[0092] like Figure 8-10 As shown, a force-bearing member 5 can be added at a downstream position where the transistor can move. The force-bearing member 5 has a corresponding installation method according to different movement modes.

[0093] like Figure 8-9As shown, in the first installation method, when the first movement method is adopted, the force-bearing member 5 located downstream is fixedly connected to the connecting shaft 9 through the connecting rod 27. In the process of the transistor body 2 completing the detection and moving downstream, once it contacts the force-bearing member 5 located downstream, the force-bearing member 5 will be forced to move. Since it is connected to the connecting shaft 9 through the connecting rod 27, this force action will be transmitted to the connecting shaft 9, and then drive the mounting bracket 3 to rotate again. The rotation of the mounting bracket 3 can drive the contact terminal 4 to move to a position that does not hinder the movement of the pin 6, thereby ensuring that when the transistor body 2 moves downstream after the detection is completed, the contact terminal 4 will not come into contact with the pin 6, avoiding unnecessary contact between the pin 6 and the contact terminal 4 during the non-detection stage, thereby ensuring the service life of the contact terminal 4.

[0094] like Figure 10 As shown, the second movement mode, if the second movement mode is used, the connecting plate 11 can be extended in the downstream direction, and a force-bearing member 5 is set under the extended connecting plate 11. Similarly, when the transistor body 2 that has completed the inspection moves downstream and touches the force-bearing member 5, the force-bearing member 5 will push the connecting plate 11 to move linearly due to the force. In this process, since the contact terminal 4 is installed on the mounting frame 3 connected to the connecting plate 11, as the connecting plate 11 moves linearly, the contact terminal 4 will also move accordingly, so that when the transistor body 2 moves downstream, its pin 6 will not contact the contact terminal 4, which also avoids unnecessary contact between the pin 6 and the contact terminal 4 during the non-inspection stage, thereby ensuring the service life of the contact terminal 4.

[0095] like Figure 12 As shown, in order to ensure that the transmission of the force when the force-bearing member 5 contacts the transistor body 2 is smoother, a rotatable roller 21 is installed on the force-bearing member 5. When the transistor body 2 moves on the carrier 1 and contacts the force-bearing member 5, the roller 21 can contact the transistor body 2 and rotate. On the one hand, the rotation of the roller 21 effectively reduces the friction between the force-bearing member 5 and the transistor body 2. Compared with the traditional rigid contact, the presence of the roller 21 converts the original sliding friction into rolling friction, greatly reducing the contact resistance, thereby avoiding the situation where the transistor body 2 is stuck in transportation or uneven force due to excessive friction.

[0096] The present invention also includes a support member 28, whose primary function is to define the position of the mounting bracket 3 when it returns to its original position and to securely maintain it there. The support member 28 can be fixedly mounted on the carrier 1 or on the aforementioned support frame, providing a reliable support base. When the mounting bracket 3 returns to its original position, the support member 28 plays a crucial role. It precisely defines the position of the mounting bracket 3, preventing displacement or shaking, and ensuring that the mounting bracket 3 accurately returns to its original position.

[0097] The rebound device 30 described above is a key device that ensures the mounting frame 3 returns to its original position smoothly. Common rebound devices 30 include springs, elastic bands, torsion springs, etc. These devices use their elastic properties to provide the required elastic force for the mounting frame 3 to return to its original position. This elastic force acts as a driving force, allowing the mounting frame 3 to return to its original position after completing the corresponding movement.

[0098] like Figure 3-4 To effectively reposition mounting bracket 3, a connection portion 29 is provided at the bottom of support member 28. A rebound device 30, such as a spring or elastic band, can be installed between connection portion 29 and mounting bracket 3. When mounting bracket 3 moves from its initial position to another position under the action of an external force, rebound device 30, through its own elastic force, provides the force for mounting bracket 3 to return to its original position, thereby ensuring its return to its original position.

[0099] Regarding the first movement mode in which the force-bearing member 5 drives the mounting frame 3: If the force-bearing member 5 drives the mounting frame 3 to rotate via the connecting shaft 9, a torsion spring can be installed on the connecting shaft 9. When the force-bearing member 5 drives the mounting frame 3 to rotate, the torsion spring accumulates elastic potential energy. When the force-bearing member 5 is no longer in effect, the torsion spring releases the elastic potential energy, generating a reverse torque, which drives the mounting frame 3 to rotate in the opposite direction around the connecting shaft 9, thereby returning to its initial position.

[0100] like Figure 6 As shown in Figures 10 or 16 , regarding the second motion mode in which the force-bearing member 5 drives the mounting frame 3, when the force-bearing member 5 drives the mounting frame 3 in a linear motion, a spring is installed outside the guide shaft 12, between the stop block 13 and the connecting plate 11. As the mounting frame 3 moves linearly along the guide shaft 12 driven by the force-bearing member 5, the spring is compressed, storing elastic potential energy. When the external force disappears, the spring, due to its elastic restoring force, pushes the connecting plate 11 and the connected mounting frame 3 in the opposite linear motion along the guide shaft 12, returning the mounting frame 3 to its initial position.

[0101] Different types of field-effect transistors have different pitches between their pins 6. Fixed-position contact terminals 4 are limited in their practicality when testing different types of field-effect transistors, making them incapable of effectively testing transistor bodies 2 of varying sizes. To address this issue, the position of contact terminals 4 on mounting bracket 3 is adjustable to accommodate transistor bodies 2 with varying pitches between their pins 6, thereby improving the practicality of the testing device.

[0102] Specifically, if Figure 12-13 as well as Figure 17As shown, a mounting groove 14 is provided on the mounting frame 3, and a connecting block 15 is provided on the contact terminal 4 to be installed in the mounting groove 14. The connecting block 15 can slide freely in the mounting groove 14, which enables the contact terminal 4 to adjust its position according to actual detection requirements. A mounting block 16 is provided on the outer wall of the contact terminal 4, and the mounting block 16 is connected to the lead screw 17 by a thread, and a stop block 18 is provided at one end of the lead screw 17. When the position of the contact terminal 4 needs to be fixed, the operator can achieve it by rotating the lead screw 17. A screw 20 is provided on the lead screw 17 for rotating the lead screw 17. When the lead screw 17 is rotated to make the stop block 18 move away from the mounting frame 3, the contact terminal 4 can move freely; and when the lead screw 17 is rotated to make the stop block 18 tightly contact the mounting frame 3, the position of the contact terminal 4 can be fixed.

[0103] Furthermore, to precisely adjust the position of the contact terminal 4, a scale is provided on the mounting frame 3, allowing the operator to make precise adjustments based on the scale to accommodate the different spacing requirements of the pins 6. Anti-slip pads 19 are also provided on the stop 18 to increase the friction between the stop 18 and the mounting frame 3, further ensuring the stability of the contact terminal 4 after it is secured.

[0104] In addition to the currently used screw 17 and stop 18 adjustment and fixation method, the position of the contact terminal 4 can also be adjusted by other devices. For example, a screw is directly threadedly connected to the contact terminal 4, and the position of the contact terminal 4 is changed by rotating the screw. Alternatively, a clamping block device can be used to clamp the clamping block in different slots of the mounting frame 3 to limit the position of the contact terminal 4 and meet different adjustment methods.

[0105] like Figure 10 Specifically, a wire trough 31 for wiring is provided on the mounting frame 3. The provision of the wire trough 31 optimizes the overall layout of the wiring. The wire trough 31 has an inlet 32 ​​for inserting the wire 8. The wire 8 can be inserted into the wire trough 31 through the inlet 32. A rubber strip 33 is installed at the inlet 32. The rubber strip 33 increases friction with the wire 8, preventing the wire 8 from falling out of the inlet 32 ​​after being inserted into the wire trough 31.

[0106] In summary, when using this field-effect transistor testing device, the transistor body 2 to be tested is first placed on the carrier 1 and transported. During the transport process, when the pins 6 of the transistor body 2 move to the contact terminals 4, the pins 6 contact the corresponding contact terminals 4 and establish an electrical connection. At this point, the testing device performs testing on the transistor body 2.

[0107] The entire inspection process does not need to rely on manual or complex mechanical structures to complete complex actions such as holding, moving, inserting, unplugging, and putting down as in traditional inspection processes. Instead, the inspection is completed during the transportation of the transistor body 2, which greatly improves the inspection efficiency of the transistor body 2 and simplifies the inspection process.

[0108] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.

Claims

1. A field effect transistor detection device, comprising a carrier device (1) for carrying a transistor body (2), wherein the transistor body (2) can be transported on the carrier device (1), characterized in that: The device further comprises a mounting frame (3), wherein contact terminals (4) corresponding to the pins (6) on the transistor body (2) are provided on the mounting frame (3), and the contact terminals (4) are used to contact the pins (6) to achieve electrical connection. A force-bearing member (5) is fixedly connected to the mounting frame (3), and the force-bearing member (5) is installed at a position where the transistor body (2) passes on the carrying device (1). When the transistor body (2) passes the force-bearing member (5) to be detected, the force of the movement of the transistor body (2) acts on the force-bearing member (5), and the force-bearing member (5) can The mounting frame (3) is driven to move so that the contact terminal (4) on the mounting frame (3) moves to a position that does not hinder the pin (6) from passing through; when the transistor body (2) passes through the force-bearing member (5), the mounting frame (3) returns to its original position, so that the contact terminal (4) returns to its original position and is located downstream of the corresponding pin (6) without contacting any pin (6), waiting to contact the corresponding pin (6) on the transistor body (2); when the transistor body (2) continues to move, its pin (6) contacts each corresponding contact terminal (4) one by one.

2. A field effect transistor detection device according to claim 1, characterized in that: The contact terminal (4) is an elastic contact piece.

3. A field effect transistor detection device according to claim 2, characterized in that: The contact terminal (4) comprises a force-bearing portion (401), a contact portion (402) and a wiring portion (403); the force-bearing portion (401) is arranged in a curved manner; the end surface of the contact portion (402) in contact with the pin (6) is arranged in a flat manner; and the wiring portion (403) is used for wiring.

4. The field effect transistor detection device according to claim 1, characterized in that: The force-bearing member (5) drives the mounting frame (3) to move in a rotational manner.

5. The field effect transistor detection device according to claim 4, characterized in that: A connecting shaft (9) is provided on the mounting frame (3), and the mounting frame (3) and the force-bearing member (5) are fixedly connected via the connecting shaft (9). A connecting member (10) is installed on the connecting shaft (9), and the connecting member (10) is rotatably connected to the connecting shaft (9). The connecting member (10) is used to fix the installation position of the connecting shaft (9). When the force-bearing member (5) drives the mounting frame (3) to move in a rotational manner, the mounting frame (3) rotates around the connecting shaft (9).

6. The field effect transistor detection device according to claim 1, characterized in that: The force-bearing member (5) drives the mounting frame (3) to move in a linear direction.

7. The field effect transistor detection device according to claim 6, characterized in that: A connecting plate (11) is provided on the mounting frame (3), and the mounting frame (3) and the force-bearing member (5) are fixedly connected via the connecting plate (11). A guide shaft (12) penetrating the connecting plate (11) is installed on the connecting plate (11), and the connecting plate (11) and the guide shaft (12) are slidably connected. The guide shaft (12) guides the connecting plate (11) to move along a straight line. When the force-bearing member (5) drives the mounting frame (3) to move along a straight line, the mounting frame (3) moves along the axial direction of the guide shaft (12).

8. The field effect transistor detection device according to claim 1, characterized in that: The position of the contact terminal (4) on the mounting frame (3) is adjustable to adapt to transistor bodies (2) with different pin (6) spacings.

9. The field effect transistor detection device according to claim 8, characterized in that: The mounting frame (3) is provided with a mounting groove (14), the contact terminal (4) is provided with a connecting block (15) installed in the mounting groove (14), the connecting block (15) can slide in the mounting groove (14), the outer wall of the wiring terminal (7) is provided with a mounting block (16), the mounting block (16) is connected to a lead screw (17) by a thread, one end of the lead screw (17) is provided with a stop block (18), the stop block (18) at the end of the lead screw (17) can be abutted against the mounting frame (3) to fix the position of the contact terminal (4), the lead screw (17) is provided with a screw (20) for rotating the lead screw (17), and an anti-slip pad (19) is provided on the end surface of the stop block (18).

10. A field effect transistor detection device according to any one of claims 1 to 9, characterized in that: A rotatable roller (21) is mounted on the force-bearing member (5).

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