Conductive contact piece type rapid detection device

Abstract

The invention relates to the technical field of inspection and testing of industrial component products, and particularly discloses a conductive contact piece type rapid detection device which comprises a positioning test ring, a first circuit board, a second circuit board, a first telescopic spring probe, a red power-on wire, a second telescopic spring probe and a black power-on wire, the positioning test ring is a circular ring with a through hole in the middle; the first circuit board and the second circuit board are arranged on the side wall of the positioning test ring, the two ends of the first circuit board are connected with the first telescopic spring probe and the red power-on wire respectively, and the two ends of the second circuit board are connected with the second telescopic spring probe and the black power-on wire respectively; and the first telescopic spring probe and the second telescopic spring probe extend towards the inside of the positioning test ring.

Description

Technical Field

[0001] The present application relates to the technical field of inspection and testing of industrial component products, and in particular to a conductive contact-type rapid detection device. Background Art

[0002] In the production and quality inspection of industrial components, especially when testing the electrical performance of cylindrical workpieces (such as batteries, capacitors, and connectors), traditional testing methods are often plagued by cumbersome operations, low efficiency, and insufficient contact stability. The typical testing process requires manual clamping or welding of the positive and negative power supply wires to the workpiece electrodes, which is not only time-consuming and labor-intensive, but also prone to fluctuations in test results due to poor contact, compromising quality inspection accuracy. Summary of the Invention

[0003] The purpose of this application is to provide a conductive contact-type rapid detection device to solve the problems of cumbersome operation, low efficiency and insufficient contact stability commonly found in detection methods in the prior art.

[0004] To achieve the above-mentioned purpose, the embodiment of the present application provides a conductive contact-type rapid detection device, comprising: a positioning test ring, a first circuit board, a second circuit board, a first telescopic spring probe, a red energized wire, a second telescopic spring probe, and a black energized wire, wherein: The positioning test ring is a circular ring with a through hole in the middle; The first circuit board and the second circuit board are respectively arranged on the side walls of the positioning test ring, the two ends of the first circuit board are respectively connected to the first telescopic spring probe and the red energized wire, and the two ends of the second circuit board are respectively connected to the second telescopic spring probe and the black energized wire; The first telescopic spring probe and the second telescopic spring probe extend toward the interior of the positioning test ring.

[0005] Optionally, the inner wall of the positioning test ring is provided with an annular protrusion, the annular protrusion is located on the inner wall of one end of the positioning test ring, and the side wall of the other end of the positioning test ring is provided with an arc-shaped protrusion, and the first circuit board and the second circuit board are arranged on the arc-shaped protrusion.

[0006] Optionally, a first through hole and a second through hole are provided on the arc-shaped protrusion, and the first telescopic spring probe and the second telescopic spring probe are respectively disposed in the first through hole and the second through hole.

[0007] Optionally, the first circuit board is fixedly connected to the outer wall of the arc-shaped protrusion by a first screw and a second screw; the second circuit board is fixedly connected to the outer wall of the arc-shaped protrusion by a third screw and a fourth screw.

[0008] Optionally, the inner diameter of the positioning test ring is not larger than the outer diameter of the workpiece to be tested; The inner diameter of the annular protrusion is not less than the outer diameter of the workpiece to be tested.

[0009] Optionally, a first switch is connected between the first telescopic spring probe and the red energized wire; A second switch is connected between the second telescopic spring probe and the black energized wire; The first switch and the second switch are respectively disposed on the first circuit board and the second circuit board.

[0010] Optionally, a positive electrode pad is connected between the first switch and the red current-carrying wire; A negative electrode pad is connected between the second switch and the black current-carrying wire; The positive electrode pad and the negative electrode pad are respectively disposed on the first circuit board and the second circuit board.

[0011] Optionally, a single-chip microcomputer is further included, which is connected to the first circuit board and the second circuit board respectively, and the single-chip microcomputer model is STM32G031G8U6.

[0012] Optionally, the VDD pin of the microcontroller is respectively connected to the power supply VCC and one end of the capacitor C1, and the other end of the capacitor C1 is grounded; the PF2-NRST pin of the microcontroller is connected to one end of the capacitor C2, and the other end of the capacitor C2 is grounded, and the VSS pin of the microcontroller is grounded.

[0013] The embodiments of the present application have the following advantages: Compared to existing technologies, the conductive contact-type rapid detection device provided by the aforementioned technical solution utilizes simple and straightforward microcontroller technology to easily connect the positive and negative electrodes on the cylindrical surface of the test workpiece to an external input power source, making the wiring path clear and workpiece testing effortless. Its overall lightweight design, simple and compact structure, easy installation and commissioning, and stable and reliable performance significantly improve the work efficiency of workpiece test operators. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] To more clearly illustrate the embodiments of this application or the technical solutions in the prior art, the following briefly introduces the drawings required for the embodiments or the description of the prior art. Obviously, the drawings described below are merely illustrative, and those skilled in the art can, without inventive effort, derive other implementation drawings based on the provided drawings.

[0015] Figure 1 A schematic diagram of the three-dimensional structure of a conductive contact-type rapid detection device provided in at least one embodiment of the present application; Figure 2A cross-sectional view of a positioning test ring of a conductive contact-type rapid detection device provided by at least one embodiment of the present application; Figure 3 A circuit schematic diagram of a conductive contact-type rapid detection device provided in at least one embodiment of the present application.

[0016] Description of reference numerals: 1 Positioning test ring, 2 First circuit board, 3 Second circuit board, 4 First telescopic spring probe, 5 Red energized wire, 6 Second telescopic spring probe, 7 Black energized wire, 8 First switch, 9 Second switch, 10 Positive pad, 11 Negative pad, 12 Annular protrusion, 13 Arc-shaped protrusion, 14 First through hole, 15 Second through hole, 16 First screw, 17 Second screw, 18 Third screw, 19 Fourth screw, 20 Microcontroller. DETAILED DESCRIPTION

[0017] The following specific embodiments illustrate the implementation of this application. Those familiar with the art can easily understand the other advantages and functions of this application from the content disclosed in this specification. Obviously, the described embodiments are part of the embodiments of this application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0018] In the description of the present application, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third" and the like are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. Unless otherwise expressly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be a communication between the internal parts of two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to the specific circumstances.

[0019] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0020] The present application provides a conductive contact type rapid detection device, referring to Figures 1 to 3,include: Positioning test ring 1, first circuit board 2, second circuit board 3, first telescopic spring probe 4, red energized wire 5, second telescopic spring probe 6, black energized wire 7, wherein, The positioning test ring 1 is a circular ring with a through hole in the middle; The first circuit board 2 and the second circuit board 3 are respectively arranged on the side walls of the positioning test ring 1. The two ends of the first circuit board 2 are respectively connected to the first telescopic spring probe 4 and the red energized wire 5. The two ends of the second circuit board 3 are respectively connected to the second telescopic spring probe 6 and the black energized wire 7. The first telescopic spring probe 4 and the second telescopic spring probe 6 extend toward the interior of the positioning test ring 1 .

[0021] Specifically, the first and second retractable spring probes 4 and 6 are respectively intended to connect to the positive and negative electrodes of the test workpiece. In some embodiments, the first and second retractable spring probes 4 and 6 are required to be made of brass with a gold-plated surface, and the springs of 304 stainless steel with moderate spring force. In some embodiments, the wires required for the current flow are: 22AWG, rated voltage: 600V, temperature: 200°C, 30cm long, and colored red or black.

[0022] refer to Figure 2 In some embodiments, the inner wall of the positioning test ring 1 is provided with an annular protrusion 12, and the annular protrusion 12 is located on the inner wall of one end of the positioning test ring 1. The side wall of the other end of the positioning test ring 1 is provided with an arc-shaped protrusion 13, and the first circuit board 2 and the second circuit board 3 are arranged on the arc-shaped protrusion 13.

[0023] In some embodiments, a first through hole 14 and a second through hole 15 are defined on the arc-shaped protrusion 13 , and the first telescopic spring probe 4 and the second telescopic spring probe 6 are disposed in the first through hole 14 and the second through hole 15 , respectively.

[0024] In some embodiments, the first circuit board 2 is fixedly connected to the outer wall of the arc-shaped protrusion 13 by a first screw 16 and a second screw 17; the second circuit board 3 is fixedly connected to the outer wall of the arc-shaped protrusion 13 by a third screw 18 and a fourth screw 19.

[0025] In some embodiments, the inner diameter of the positioning test ring 1 is not larger than the outer diameter of the workpiece to be tested; The inner diameter of the annular protrusion 12 is not less than the outer diameter of the workpiece to be tested.

[0026] refer to Figure 3 , in some embodiments, a first switch 8 is connected between the first telescopic spring probe 4 and the red energized wire 5; A second switch 9 is connected between the second telescopic spring probe 6 and the black current-carrying wire 7; The first switch 8 and the second switch 9 are respectively arranged on the first circuit board 2 and the second circuit board 3 .

[0027] refer to Figure 3 , in some embodiments, a positive electrode pad 10 is connected between the first switch 8 and the red current-carrying wire 5; A negative electrode pad 11 is connected between the second switch 9 and the black current-carrying wire 7; The positive electrode pad 10 and the negative electrode pad 11 are respectively disposed on the first circuit board 2 and the second circuit board 3 .

[0028] refer to Figure 3 In some embodiments, a single-chip microcomputer 20 is further included, and the single-chip microcomputer 20 is connected to the first circuit board 2 and the second circuit board 3 respectively. The model of the single-chip microcomputer 20 is STM32G031G8U6.

[0029] refer to Figure 3 In some embodiments, the VDD pin of the microcontroller 20 is connected to the power supply VCC and one end of the capacitor C1, respectively, and the other end of the capacitor C1 is grounded; the PF2-NRST pin of the microcontroller 20 is connected to one end of the capacitor C2, and the other end of the capacitor C2 is grounded, and the VSS pin of the microcontroller 20 is grounded.

[0030] In summary, compared to existing technologies, this conductive contact-type rapid detection device utilizes simple and straightforward microcontroller technology to easily connect the positive and negative electrodes on the cylindrical surface of the test workpiece to an external input power source, making the wiring path clear and workpiece testing effortless. Its overall lightweight design, simple and compact structure, easy installation and commissioning, and stable and reliable performance significantly improve the work efficiency of workpiece test operators.

[0031] Note that, unless otherwise explicitly stated, all features disclosed in this specification (including any accompanying claims, abstracts, and drawings) may be replaced by alternative features that achieve the same, equivalent, or similar purposes. Therefore, unless explicitly stated otherwise, each feature disclosed is merely an example of a group of equivalent or similar features. Where used, further, preferably, further, and more preferably are simply the beginning of another embodiment based on the previous embodiment, and the content following further, preferably, further, or more preferably is combined with the previous embodiment as a complete construction of another embodiment. Several further, preferably, further, or more preferably settings following the same embodiment can be arbitrarily combined to form another embodiment.

[0032] In the implementation of functions and steps, the corresponding functions and steps in various embodiments may also occur in a different order than shown. For example, two consecutive functions and steps can actually be performed or implemented substantially in parallel, or they can sometimes be performed or implemented in the opposite order, depending on the functions involved.

[0033] Although the present application has been described in detail above using general descriptions and specific embodiments, it will be apparent to those skilled in the art that modifications or improvements may be made based on the present application. Therefore, such modifications or improvements, which do not depart from the spirit of the present application, are within the scope of protection claimed in the present application.

Claims

1. A conductive contact type rapid detection device, characterized in that: include: Positioning test ring, first circuit board, second circuit board, first telescopic spring probe, red energized wire, second telescopic spring probe, black energized wire, wherein, The positioning test ring is a circular ring with a through hole in the middle; The first circuit board and the second circuit board are respectively arranged on the side walls of the positioning test ring, the two ends of the first circuit board are respectively connected to the first telescopic spring probe and the red energized wire, and the two ends of the second circuit board are respectively connected to the second telescopic spring probe and the black energized wire; The first telescopic spring probe and the second telescopic spring probe extend toward the interior of the positioning test ring.

2. The conductive contact type rapid detection device according to claim 1, characterized in that: The inner wall of the positioning test ring is provided with an annular protrusion, which is located on the inner wall of one end of the positioning test ring. The side wall of the other end of the positioning test ring is provided with an arc-shaped protrusion, and the first circuit board and the second circuit board are arranged on the arc-shaped protrusion.

3. The conductive contact type rapid detection device according to claim 2, characterized in that: The arc-shaped protrusion is provided with a first through hole and a second through hole, and the first telescopic spring probe and the second telescopic spring probe are respectively disposed in the first through hole and the second through hole.

4. The conductive contact-type rapid detection device according to claim 2, characterized in that: The first circuit board is fixedly connected to the outer wall of the arc-shaped protrusion by a first screw and a second screw; the second circuit board is fixedly connected to the outer wall of the arc-shaped protrusion by a third screw and a fourth screw.

5. The conductive contact-type rapid detection device according to claim 2, characterized in that: The inner diameter of the positioning test ring is not larger than the outer diameter of the workpiece to be tested; The inner diameter of the annular protrusion is not less than the outer diameter of the workpiece to be tested.

6. The conductive contact-type rapid detection device according to claim 1, characterized in that: A first switch is connected between the first telescopic spring probe and the red energized wire; A second switch is connected between the second telescopic spring probe and the black energized wire; The first switch and the second switch are respectively disposed on the first circuit board and the second circuit board.

7. The conductive contact-type rapid detection device according to claim 6, characterized in that: A positive electrode pad is connected between the first switch and the red current-carrying wire; A negative electrode pad is connected between the second switch and the black current-carrying wire; The positive electrode pad and the negative electrode pad are respectively disposed on the first circuit board and the second circuit board.

8. The conductive contact-type rapid detection device according to claim 1, characterized in that: It also includes a single-chip microcomputer, which is connected to the first circuit board and the second circuit board respectively, and the single-chip microcomputer model is STM32G031G8U6.

9. The conductive contact-type rapid detection device according to claim 8, characterized in that: The VDD pin of the microcontroller is connected to the power supply VCC and one end of the capacitor C1 respectively, and the other end of the capacitor C1 is grounded; the PF2-NRST pin of the microcontroller is connected to one end of the capacitor C2, and the other end of the capacitor C2 is grounded, and the VSS pin of the microcontroller is grounded.

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