Automated analyzer
By controlling the combination of the heating device and the temperature sensor, the problem of slow temperature stability of the light detection element and the diffraction grating is solved, and fast temperature stabilization and high-precision analysis are achieved.
Patent Information
- Application Number
- CN202480011892.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2023-07-18
- Filing Date
- 2024-06-06
- Publication Date
- 2025-09-12
AI Technical Summary
In the prior art, the temperature stability of the light detection element and the diffraction grating is slow, which affects the analysis accuracy and startup time.
By setting up a heating device and a temperature sensor, the heating device is controlled to quickly stabilize the temperature of the light detection element and the diffraction grating, and the thermal time constant is within a specific range. By utilizing materials and component designs with different thermal conductivities, uniform heat transfer is ensured.
Rapid temperature stabilization of the light detection element and diffraction grating is achieved, enabling high-precision sample analysis to begin in a short time.
Smart Images

Figure CN120641757A_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to an automated analysis device. Background Art
[0002] An automatic analyzer is a device that analyzes by dispensing a test solution containing an analyte and a reaction reagent into a reaction vessel to react and optically measuring the reaction solution. For example, there are automatic analyzers that use blood, serum, urine, etc. as samples to detect specific biological components, chemical substances, etc. contained in the sample. The analysis method based on the automatic analyzer includes a process of irradiating the sample with light to measure its absorbance, etc. In the analysis method including such a process, the temperature fluctuation of the light detection element such as the photodiode as the element for detecting light and the diffraction grating for splitting the light has a great influence on the measurement accuracy. Therefore, it is preferable to minimize the temperature fluctuation of the light detection element and the diffraction grating. In addition, in order to be able to start the measurement quickly, it is preferable to stabilize the temperature of the light detection element and the diffraction grating as quickly as possible when the device is started.
[0003] In the past, as disclosed in Patent Document 1, there is known a spectrophotometer comprising: a spectroscopic chamber separated from a light source chamber by a heat insulating portion and comprising at least a spectroscopic element, a sample chamber, and a detector; a temperature measuring unit that measures the temperature within the spectroscopic chamber; a temperature regulating unit that heats and / or cools the interior of the spectroscopic chamber; and a control unit that obtains temperature information from the temperature measuring unit and operates the temperature regulating unit to maintain the spectroscopic chamber at a predetermined set temperature.
[0004] Prior art literature
[0005] Patent Literature
[0006] Patent Document 1: Japanese Patent Application Laid-Open No. 2014-48176 Summary of the Invention
[0007] Problems to be solved by the invention
[0008] However, in conventional technology such as that described in Patent Document 1, for example, when the temperature adjustment unit is a heater, the temperature measured by the temperature measurement unit may sometimes rise very quickly, particularly compared to the temperature of the light detection element. Consequently, even though the temperature of the light detection element is not yet fully stabilized, the output of the heater is suppressed, resulting in a problem of slow stabilization of the temperature of the light detection element and the diffraction grating. Conversely, because the temperature measured by the temperature measurement unit rises more slowly than the temperature of the light detection element, even though the temperature of the light detection element has actually reached the set value, the high output of the heater persists, causing the temperature of the light detection element to rise excessively, thus slowing down temperature stabilization. Thus, conventional technology presents the challenge of how to quickly stabilize the temperature of the light detection element and the diffraction grating.
[0009] In view of such circumstances, the present disclosure proposes an improved automatic analyzer that can start high-precision sample analysis in a short time by quickly stabilizing the temperature of a light detection element and a diffraction grating.
[0010] Means for solving problems
[0011] In order to solve the above-mentioned problems, the present disclosure proposes an automatic analysis device, which comprises: a light source, which irradiates light to a reaction container in which a sample and a reagent are mixed and reacted; a spectroscopic element, which spectroscopically analyzes the light transmitted through the reaction container; a light detecting element, which detects the light spectroscopically analyzed by the spectroscopic element; a fixing member, which fixes the light detecting element and the spectroscopic element; a measuring chamber, which accommodates the spectroscopic element and the light detecting element; a heating device, which is arranged on the fixing member; a control device, which controls the heating device; a temperature sensor supporting member, which is a fixing member arranged near the light detecting element and on the inner side of the measuring chamber; and a measuring chamber temperature sensor, which is arranged on the temperature sensor supporting member, wherein the thermal time constant from the heating device to the light detecting element is in the range of 80% to 120% of the thermal time constant from the heating device to the temperature sensor in the measuring chamber, and the control device controls the heating device so that the temperature detected by the temperature sensor in the measuring chamber becomes a specified temperature.
[0012] Further features related to the present disclosure will become clear from the description and drawings of this specification. In addition, the solutions of the present disclosure are achieved through the combination of elements and various elements and the following detailed description and the attached technical solutions.
[0013] The description in this specification is merely a typical example and does not limit the technical solutions or application examples of the present disclosure in any sense.
[0014] Effects of the Invention
[0015] According to the technology disclosed in the present invention, the temperature of the light detection element and the diffraction grating can be quickly stabilized, and thus, high-precision sample analysis can be started in a short time. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 This is a diagram showing a configuration example of the automatic analyzer 100 according to the first embodiment as viewed from directly above.
[0017] Figure 2 It means from Figure 1 A diagram showing a configuration example of the side surface of the automatic analyzer 100 according to the first embodiment as viewed in the direction of the arrow.
[0018] Figure 3 This is a diagram showing an example of a method for fixing the thermistor 3 in the automatic analyzer 100 according to the present embodiment.
[0019] Figure 4 1 is a diagram showing a conventional mounting structure (direct mounting) of thermistor 3 on block 4 as a comparative example.
[0020] Figure 5A It indicates that the ambient temperature is low. Figure 4 Graph showing simulation results of temperature changes in the vicinity of the light detecting element 2, thermistor 3, and heater 5 of the block 4 in the structure of FIG.
[0021] Figure 5B This is a diagram showing the simulation results of the heater output.
[0022] Figure 6A This is based on the first embodiment ( Figures 1 to 3 ) is a diagram showing simulation results of temperature changes in the vicinity of the light detection element 2, thermistor 3, and heater 5 of the block 4 obtained by the setting method of the thermistor 3.
[0023] Figure 6B This is a diagram showing the simulation results of the heater output.
[0024] Figure 7 1 is a diagram showing the relationship between the ambient temperature detected by the ambient temperature sensor 17 and the target temperature of the thermistor 3 .
[0025] Figure 8 1 is a diagram showing a configuration example of an automatic analyzer 100 according to a second embodiment ( Figure 2 corresponding figure). DETAILED DESCRIPTION
[0026] Embodiments of the present disclosure relate, for example, to a clinical automated analyzer for analyzing biologically derived samples. More specifically, the present embodiment relates to an automated analyzer configured such that the thermal time constant τ1 from a heater to a light detection element is within a range of 80% to 120% of the thermal time constant τ2 from the heater to a thermistor. By controlling a heating device so that the temperature detected by the thermistor reaches a predetermined temperature, the temperature of the light detection element can be rapidly stabilized.
[0027] The following describes embodiments of the present disclosure with reference to the accompanying drawings. In the accompanying drawings, functionally identical elements are sometimes denoted by the same reference numerals. It should be noted that the accompanying drawings illustrate specific embodiments and installation examples based on the principles of the present disclosure. These drawings are intended to facilitate understanding of the present disclosure and are not intended to limit the present disclosure.
[0028] In this embodiment, the description is provided in sufficient detail to enable those skilled in the art to implement the present disclosure. However, it should be understood that other installations and methods are also possible, and that changes in structure and construction, and replacement of various elements can be made without departing from the scope and spirit of the technical concept of the present disclosure. Therefore, the following description should not be interpreted as being limited to this.
[0029] (1) First embodiment
[0030] Reference Figures 1 to 7 , an automatic analyzer according to a first embodiment is described.
[0031] <Configuration Example of Automatic Analyzer>
[0032] Figure 1 and Figure 2 1 is a diagram showing an example of the internal configuration of the automatic analyzer 100 according to this embodiment. Figure 1 : is a diagram showing a structural example of the automatic analyzer 100 as viewed from directly above (the internal structure of the measurement chamber 1 is shown). Figure 2 It means from Figure 1 A diagram showing a configuration example of the side surface of the automatic analyzer 100 as viewed in the direction of the arrow (the internal structure of the measurement chamber 1 is shown).
[0033] exist Figure 1 and Figure 2In the embodiment, the automatic analysis device comprises: a measuring chamber 1, which accommodates a light detection element 2, a thermistor 3 as a temperature sensor, a heater 5, a diffraction grating 6 as a spectroscopic element, a light detection element support member 7, a thermistor support member 8 and a diffraction grating support member 9; a light source 10; a light source chamber 11, in which the light source 10 is arranged; a reaction disk 12, which accommodates constant temperature water 15 for reacting the sample with the reagent; a reaction container 13, which accommodates a reaction liquid (a solution obtained by the reaction of the sample with the reagent) 14; a control device 16; an ambient temperature sensor 17; and a block 4 (fixing member) such as metal, which is placed on the measuring chamber 1 and the light source chamber 11.
[0034] The reaction disk 12 is filled with constant temperature water 15 and is provided with a plurality of reaction containers 13 .
[0035] The light source 10 is composed of a halogen lamp, an LED lamp, or the like, and is installed in a light source chamber 11 . The light source chamber 11 is fixed to the block 4 .
[0036] The reaction disk 12 rotates to sequentially load multiple reaction vessels 13 as measurement targets. Samples and reagents are placed in the reaction vessels 13 to generate reaction solutions 14. Light emitted from the light source 10 irradiates the reaction solutions 14 in the reaction vessels 13. Light transmitted through the reaction solutions 14 enters the measurement chamber 1 through a light-transmitting window (not shown) provided in the measurement chamber 1. This light is incident on the diffraction grating 6, where it is split and detected by a light detection element 2, such as a photodiode array.
[0037] The measuring chamber 1 is formed into a structure (light-shielding structure) by the block 4 and the cover covering the upper part thereof, so that light from the outside cannot penetrate. The light detection element 2 and the diffraction grating 6 arranged in the measuring chamber 1 are fixed to the block 4 via the supporting members 7 and 9 respectively. In addition, in order to facilitate the adjustment of the optical system, the light source chamber 11 and the light detection element 2 and the diffraction grating 6 can be fixed to the common block 4. It should be noted that the block 4 can be constructed by integrally forming the portion for fixing the light source chamber 11 and the portion for fixing the components arranged in the measuring chamber 1, or can be constructed by joining separate portions (composed of the same material). In either case, the block 4 is constructed as a continuous fixed member so that heat is transferred evenly.
[0038] A heater 5 is provided within the block 4. The heater 5 is provided to quickly stabilize the temperature of the light detecting element 2 and the diffraction grating 6. The heater 5 is inserted into the block 4, for example, through a hole, and secured with screws. Applying thermally conductive grease between the heater 5 and the block 4 facilitates insertion of the heater 5 into the block 4. Furthermore, a thermistor 3, secured to a thermistor support member 8, is provided above the block 4 and within the measurement chamber 1. In other words, the thermistor 3 is not provided in direct contact with the block 4, but rather is provided via the thermistor support member 8.
[0039] The control device 16 controls the output of the heater 5 so that the temperature detected by the thermistor 3 reaches a predetermined temperature. When the heat from the heater 5 is quickly transferred to the light detection element 2 and the diffraction grating 6, their temperatures can be quickly stabilized. Therefore, the block 4 that transfers heat by heat conduction can be made of a material with high thermal conductivity such as aluminum. In addition, the control device 16 sets the target temperature of the thermistor 3 based on the ambient temperature of the device detected by the ambient temperature sensor 17 (for details, see Figure 7 ).
[0040] In particular, to quickly stabilize the temperature of the photodetector 2, whose temperature easily affects measurement accuracy, it is desirable to keep the temperature of the photodetector 2 as close as possible to the temperature detected by the thermistor 3. Therefore, it is possible to directly mount the thermistor 3 on the substrate of the photodetector 2. However, this is not preferred due to concerns about the installation space, noise, and the effects of heat generated by the thermistor 3 itself. Therefore, to keep the temperature of the photodetector 2 as close as possible to the temperature detected by the thermistor 3, the thermal time constant τ1 (the time required to reach the target temperature) from the heater 5 to the photodetector 2 and the thermal time constant τ2 from the heater 5 to the thermistor 3 should be set within a predetermined range (for example, τ1 is between 80% and 120% of τ2), or more preferably, approximately equal. These thermal time constants τ1 and τ2 are determined by the thermal resistance and heat capacity of each component, as well as the amount of heat dissipated from each component to the air. By adjusting the material and dimensions of the support member (mounting member) 8 of the thermistor 3, the relationship between the thermal time constants τ1 and τ2 can be set within this range or made approximately equal. As a material of the thermistor support member 8, a resin member having a lower thermal conductivity than the block 4 can be used. Examples of such a material include polyacetal, polycarbonate, and polyphenylene ether.
[0041] <How to Fix the Thermistor 3>
[0042] Figure 3 This figure shows an example of a method for fixing the thermistor 3. The thermistor 3 is fixed to the upper portion of a resin thermistor support member 8 via a thermistor fixing member 24. The thermistor support member 8 is fixed to the block 4 via a joint 25 provided at its lower portion. For example, the thermistor support member 8 can be fixed by screwing a threaded hole (not shown) provided in the block 4 into the joint 25 using a bolt inserted into a threaded hole 26. The joint 25 may also be provided at multiple locations around the thermistor support member 8. Reference numeral 27 denotes thermistor wiring.
[0043] <Thermistor of Comparative Example>
[0044] Reference Figure 4 、 Figure 5A as well as Figure 5B , a comparative example will be described. Figure 4 1 is a diagram showing a conventional mounting structure (direct mounting) of thermistor 3 on block 4 as a comparative example. Figure 5A It indicates that the ambient temperature is low. Figure 4 Graph showing simulation results of temperature changes in the vicinity of the light detecting element 2, thermistor 3, and heater 5 of the block 4 in the structure of FIG. Figure 5B : is a diagram showing the simulation results of the heater output. It should be noted that the heater output is feedback controlled by PID control based on the temperature detected by the thermistor 3.
[0045] exist Figure 5A In this case, block 4 is directly heated by the heater, causing its temperature to rise rapidly. Furthermore, since thermistor 3 is in contact with block 4, its temperature also rises rapidly. On the other hand, the heat from heater 5 is delayed in being transferred to light detecting element 2, causing the temperature rise of light detecting element 2 to be relatively slow. At this point, when the temperature of thermistor 3 reaches the target temperature, the output of heater 5 decreases, further slowing the temperature rise of light detecting element 2. Therefore, it takes a long time for the temperature of light detecting element 2 to stabilize.
[0046] <Thermistor of this embodiment>
[0047] Figure 6A This means that based on this embodiment ( Figures 1 to 3 ) is a diagram showing simulation results of temperature changes in the vicinity of the light detection element 2, thermistor 3, and heater 5 of the block 4 obtained by the setting method of the thermistor 3. Figure 6B This is a diagram showing the simulation results of the heater output.
[0048] Reference Figure 6A It can be seen that the temperature rise rate of thermistor 3 is close to that of light detection element 2, and the thermal time constant τ2 from heater 5 to thermistor 3 is close to the thermal time constant τ1 from heater 5 to light detection element 2. Since heater 5 heats thermistor 3 until it reaches near the target temperature, the temperature of light detection element 2 rises rapidly and stabilizes early.
[0049] <Results of Examination of the Quantitative Relationship between the Thermistor Support Member 8 and the Photodetection Element Support Member 7>
[0050] The present inventors examined and verified the quantitative relationship between the thermistor support member 8 and the light detecting element support member 7 and confirmed the following relationship.
[0051] The bottom area of the thermistor support member 8 is represented by A1, the height of the thermistor support member 8 is represented by H1, the thermal conductivity of the thermistor support member 8 is represented by k1, the specific heat capacity of the thermistor support member 8 is represented by c1, and the density of the thermistor support member 8 is represented by ρ1. The bottom area of the light detecting element support member 7 is represented by A2, the height of the light detecting element support member 7 is represented by H2, the thermal conductivity of the light detecting element support member 7 is represented by k2, the specific heat capacity of the light detecting element support member 7 is represented by c2, and the density of the light detecting element support member 7 is represented by ρ2. When it is defined as follows:
[0052] R1=H1 / (k1×A1),
[0053] C1=c1×ρ1×A1×H1,
[0054] R2=H2 / (k2·A2),
[0055] C2=c2×ρ2×A2×H2,
[0056] The thermistor support member 8 and the light detecting element support member 7 satisfy the following relationship:
[0057] 0.8×R2×C2≤R1×C1≤1.2×R2×C2.
[0058] Note that here, the product of R and C represents the thermal time constant. The thermal time constants of the block 4 (fixing member) are substantially equal, and the thermal time constants of the thermistor 3 and the photodetector 2 are small and therefore assumed to be negligible.
[0059] <Relationship between Ambient Temperature and Target Temperature of Thermistor 3>
[0060] Figure 7 1 is a diagram showing the relationship between the ambient temperature detected by the ambient temperature sensor 17 and the target temperature of the thermistor 3 .
[0061] The control device 16 sets the target temperature of the thermistor 3 based on the relationship between the ambient temperature and the target temperature of the thermistor 3, which is pre-stored in the storage device 23. The relationship between the ambient temperature and the target temperature of the thermistor 3 is such that the temperature detected by the thermistor 3 when the heater 5 is stopped and stabilized at the ambient temperature is used as the target temperature. Therefore, the higher the ambient temperature, the higher the target temperature of the thermistor 3 is set. The temperature when the heater 5 is stopped is not necessarily the same as the ambient temperature. Since heat is gradually transferred from the light source 10 or the reaction container 13, the temperature inside the measurement chamber 1 when it is stable is higher than the ambient temperature. The temperature at this time is defined as the temperature when the heater 5 is stopped. In this way, by setting the target temperature of the thermistor 3 to the temperature when the heater 5 is stopped and stabilized, the output of the heater 5 can be stopped when stable, thereby suppressing the power consumption of the automatic analyzer 100.
[0062] As described above, the temperature of the light detection element 2 can be quickly stabilized, and therefore, high-precision sample analysis can be started in a short time.
[0063] (2) Second Implementation
[0064] Figure 8 1 is a diagram showing a configuration example of an automatic analyzer 100 according to a second embodiment ( Figure 2 corresponding figure).
[0065] In this embodiment, the heater 5 can be positioned midway between the photodetector 2 and the diffraction grating 6, such that the thermal time constant τ1 from the heater 5 to the photodetector 2 and the thermal time constant τ3 from the heater 5 to the diffraction grating 6 are within a predetermined range (e.g., τ1 is in the range of 80% to 120% of τ3), more preferably, substantially equal. The thermistor 3 and the thermistor support member 8 are positioned within the measurement chamber 1, midway between the photodetector 2 and the diffraction grating 6. The material and dimensions of the thermistor support member 8 are adjusted so that the thermal time constant τ2 from the heater 5 to the thermistor 3 and the thermal time constant τ1 from the heater 5 to the photodetector 2 are within a predetermined range (e.g., τ1 is in the range of 80% to 120% of τ2), more preferably, substantially equal. Furthermore, the thermal time constant τ3 from the heater 5 to the diffraction grating 6 can be set at a position within a predetermined range (for example, τ3 is in the range of 80% to 120% of τ2), and more preferably at a substantially equal position (inside the block 4).
[0066] As described above, by setting the thermal time constants τ1 to τ3 of each element, the thermal time constant τ1 from the heater 5 to the light detecting element 2 and the thermal time constant τ3 from the heater 5 to the diffraction grating 6 can be made to be within the range of 80% to 120% of the thermal time constant τ2 from the heater 5 to the thermistor 3, and more preferably, to be approximately equal.
[0067] With this configuration, the temperature changes of both the light detection element 2 and the diffraction grating 6 are close to the temperature changes of the thermistor 3, and the temperatures of both the light detection element 2 and the diffraction grating 6 can be quickly stabilized. Therefore, high-precision sample analysis can be started in a short time.
[0068] (3) Others
[0069] In the first and second embodiments, the automatic analyzer 100 including the light source 10 is exemplified. However, the present invention is also applicable to an automatic analyzer that does not include the light source 10 and causes the reaction solution 14 of the sample and the reagent to emit light.
[0070] Furthermore, although the first and second embodiments are directed to a biochemical analysis apparatus, they are also applicable to other analysis apparatuses.
[0071] (4) Summary
[0072] (i) In the automatic analyzer 100 of this embodiment, the thermal time constant τ1 from the heater (heating device) 5 to the light detecting element 2 is set to a range of 80% to 120% of the thermal time constant τ2 from the heater 5 to the thermistor (measurement room temperature sensor) 3. Then, the control device 16 controls the heater 5 so that the temperature detected by the thermistor 3 reaches a predetermined temperature. More specifically, the storage device 23 within the control device 16 (which may also be provided externally as a structure separate from the control device 16) stores the relationship between the ambient temperature and the temperature detected by the thermistor 3 when the heater 5 is stopped and stabilized (see Figure 7 At this time, the control device 16 sets the target temperature of thermistor 3 to the temperature at which the heater 5 is stopped and stabilized, stored in the storage device 23, based on the temperature detected by the ambient temperature sensor. The heater 5 is then controlled so that the temperature detected by thermistor 3 reaches the target temperature. This allows the temperature of the light detection element 2 to be quickly stabilized. Consequently, high-precision analysis of the sample can be initiated in a short period of time.
[0073] The photodetection element 2 is provided on a photodetection element support member 7 provided inside the measurement chamber 1. This prevents direct heat transfer from the module body 4 to the photodetection element 2, and allows the thermal time constant τ1 to be appropriately adjusted.
[0074] (ii) In this embodiment, block 4 is used as a member to secure light source 10 (light source chamber 11) and to secure light detection element 2 and diffraction grating 6 (spectrometer). Specifically, by using a continuous or integrated block 4 as a member to secure light source 10 and components within measurement chamber 1, heat transfer is uniform. By ensuring uniform heat transfer, optical adjustments can be easily performed on both the light source (light emitting) side and the light receiving side (optical components within measurement chamber 1).
[0075] (iii) More specifically, herein, the bottom area of the thermistor support member 8 is represented as A1, the height of the thermistor support member 8 is represented as H1, the thermal conductivity of the temperature sensor support member is represented as k1, the specific heat capacity of the thermistor support member 8 is represented as c1, and the density of the thermistor support member 8 is represented as ρ1. The bottom area of the light detecting element support member 7 is represented as A2, the height of the light detecting element support member 7 is represented as H2, the thermal conductivity of the light detecting element support member 7 is represented as k2, the specific heat capacity of the light detecting element support member 7 is represented as c2, and the density of the light detecting element support member 7 is represented as ρ2.
[0076] In addition, it is defined as follows:
[0077] R1=H1 / (k1×A1),
[0078] C1=c1×ρ1×A1×H1,
[0079] R2=H2 / (k2×A2),
[0080] C2=c2×ρ2×A2×H2.
[0081] At this time, the thermistor support member 8 and the light detecting element support member 7 are configured to satisfy the following relationship:
[0082] 0.8×R2×C2≤R1×C1≤1.2×R2×C2.
[0083] Thus, the thermal time constant τ1 from the heater 5 to the light detecting element 2 can be set within a range of 80% to 120% of the thermal time constant τ2 from the heater 5 to the thermistor 3 .
[0084] (iv) Furthermore, in this embodiment, the thermal time constant τ1 from the heater 5 to the photodetector 2 and the thermal time constant τ3 from the heater 5 to the diffraction grating 6 may each be set within a range of 80% to 120% of the thermal time constant τ2 from the heater 5 to the thermistor 3 .
[0085] (v) In the second embodiment, the thermistor support member 8 is formed of a member having a thermal conductivity lower than that of the block 4. The heater 5 is provided inside the block 4 and between the light detecting element 2 (see Figure 8 At this point, the control device 16 controls the heater 5 so that the temperature detected by the thermistor 3 reaches a predetermined temperature (the aforementioned target temperature). The thermal conductivity of the block 4 is uniform, and while heat is transferred throughout the block 4, it takes some time for the block 4 to reach a uniform temperature. Therefore, by positioning the heater 5 between the light detection element 2 and the diffraction grating 6, their thermal time constants can be set to be approximately equal, allowing their temperatures to stabilize quickly. This allows for high-precision analysis of the sample to begin in a short period of time.
[0086] (vi) It should be noted that, instead of using light source 10, diffraction grating 6 may be used to disperse light emitted from reaction vessel 13, where a sample and reagent are mixed and reacted, and the dispersed light may be detected by light detection element 2. In this case, as described above, the thermal time constant τ1 from heater 5 to light detection element 2 can be set within a range of 80% to 120% of the thermal time constant τ2 from heater 5 to thermistor 3.
[0087] (vii) While specific embodiments are described in this disclosure, these are for illustrative purposes (understanding the technology of this disclosure) and are not intended to be limiting in all respects. Those skilled in the art will readily understand that there are multiple combinations of hardware, software, and firmware that can implement the technology of this disclosure. Furthermore, in the above-described embodiments, control lines and information lines are shown as necessary for illustration; not all control lines and information lines may be shown in the product. All components may be interconnected.
[0088] Furthermore, those skilled in the art will be able to clearly understand other implementations of the present disclosure based on consideration of this embodiment. The description and specific examples are merely typical, and the technical scope and spirit of the present disclosure are shown in the following technical claims.
[0089] Description of reference numerals:
[0090] 1 Measurement Room
[0091] 2 Light detection element
[0092] 3 Thermistors
[0093] 4 Blocks (metal blocks)
[0094] 5. Heater
[0095] 6 Diffraction grating
[0096] 7 Light detection element supporting member
[0097] 8 Thermistor support member
[0098] 9 Diffraction grating support member
[0099] 10 Light Source
[0100] 11 Light Source Room
[0101] 12 reaction trays
[0102] 13 reaction vessel
[0103] 14 Reaction solution
[0104] 15 Constant temperature water
[0105] 16 Control Device
[0106] 17 Ambient temperature sensor
[0107] 23 Storage Device
[0108] 24 Thermistor fixing parts
[0109] 25 Joint between thermistor fixing member and block
[0110] 26 Threaded hole for thermistor fixing member
[0111] 27 Thermistor Wiring
[0112] 100 Automatic analysis device.
Claims
1. An automatic analysis device, wherein: The automatic analysis device comprises: a light source for irradiating light to a reaction container in which a sample and a reagent are mixed and reacted; a spectroscopic element for spectroscopically splitting the light transmitted through the reaction container; a light detecting element for detecting the light split by the light splitting element; a fixing member for fixing the light detecting element and the light splitting element; a measuring chamber accommodating the spectroscopic element and the light detecting element; a heating device, which is provided on the fixing member; a control device for controlling the heating device, a temperature sensor supporting member disposed near the light detecting element and on the fixing member inside the measurement chamber; and a sensor for measuring the indoor temperature, which is provided on the temperature sensor supporting member; The thermal time constant from the heating device to the light detecting element is in the range of 80% to 120% of the thermal time constant from the heating device to the measurement room temperature sensor. The control device controls the heating device so that the temperature detected by the measurement room temperature sensor becomes a predetermined temperature.
2. The automatic analysis device according to claim 1, wherein The automatic analysis device further comprises: an ambient temperature sensor that detects the ambient temperature; and a storage device for storing a relationship between the ambient temperature and the temperature detected by the indoor temperature sensor when the heating device is stopped and stabilized; The control device sets the target temperature of the measurement room temperature sensor to the temperature when the heating device is stopped and stabilized, which is stored in the storage device, based on the temperature detected by the ambient temperature sensor. The control device controls the heating device so that the temperature detected by the measurement room temperature sensor becomes the target temperature.
3. The automatic analysis device according to claim 1, wherein The fixing member that fixes the light source and the fixing member that fixes the light detecting element and the spectroscopic element are continuous, and are configured so that heat is evenly transferred.
4. The automatic analysis device according to claim 1, wherein The fixing member that fixes the light source and the fixing member that fixes the light detection element and the spectroscopic element are integrally formed.
5. The automatic analysis device according to claim 1, wherein The light detecting element is provided on a light detecting element supporting member provided inside the measurement chamber and supporting the light detecting element. The automatic analysis device according to claim 5 , wherein: The bottom area of the temperature sensor support member is represented by A1, the height of the temperature sensor support member is represented by H1, the thermal conductivity of the temperature sensor support member is represented by k1, the specific heat capacity of the temperature sensor support member is represented by c1, the density of the temperature sensor support member is represented by ρ1, the bottom area of the light detecting element support member is represented by A2, the height of the light detecting element support member is represented by H2, the thermal conductivity of the light detecting element support member is represented by k2, the specific heat capacity of the light detecting element support member is represented by c2, and the density of the light detecting element support member is represented by ρ2. When it is defined as follows: R1=H1 / (k1×A1), C1=c1×ρ1×A1×H1, R2=H2 / (k2×A2), C2=c2×ρ2×A2×H2, The temperature sensor support member and the light detection element support member satisfy the following relationship: 0.8×R2×C2≤R1×C1≤1.2×R2×C2.
7. An automatic analysis device, wherein: The automatic analysis device comprises: a light source for irradiating light to a reaction container in which a sample and a reagent are mixed and reacted; a spectroscopic element for spectroscopically splitting the light transmitted through the reaction container; a light detecting element for detecting the light split by the light splitting element; a fixing member for fixing the light detecting element and the light splitting element; a measuring chamber in which the spectroscopic element and the light detecting element are installed; a heating device, which is provided on the fixing member; a control device for controlling the heating device; a temperature sensor supporting member disposed near the light detecting element and on the fixing member inside the measurement chamber; as well as a sensor for measuring the indoor temperature, which is provided on the temperature sensor supporting member; A thermal time constant from the heating device to the light detecting element and a thermal time constant from the heating device to the spectroscopic element are within a range of 80% to 120% of a thermal time constant from the heating device to the measurement room temperature sensor.
8. An automatic analysis device, wherein: The automatic analysis device comprises: a light source for irradiating light to a reaction container in which a sample and a reagent are mixed and reacted; a spectroscopic element for spectroscopically splitting the light transmitted through the reaction container; a light detecting element for detecting the light split by the light splitting element; a fixing member for fixing the light detecting element and the light splitting element; a measuring chamber in which the spectroscopic element and the light detecting element are installed; a heating device, which is provided on the fixing member; a control device for controlling the heating device; a temperature sensor supporting member disposed near the light detecting element and on the fixing member inside the measurement chamber; as well as a temperature sensor provided on the temperature sensor support member, The temperature sensor support member is a member having a thermal conductivity lower than that of the fixing member, The heating device is arranged between the light detecting element and the spectroscopic element. The control device controls the heating device so that the temperature detected by the temperature sensor becomes a predetermined temperature.
9. An automatic analysis device, wherein: The automatic analysis device comprises: a spectroscopic element for spectroscopically spectroscopically analyzing light emitted from a reaction vessel in which a sample and a reagent are mixed and reacted; a light detecting element for detecting the light split by the light splitting element; a fixing member for fixing the light detecting element and the light splitting element; a measuring chamber in which the spectroscopic element and the light detecting element are installed; a heating device, which is provided on the fixing member; a control device for controlling the heating device; a temperature sensor supporting member disposed near the light detecting element and on the fixing member inside the measurement chamber; as well as a temperature sensor provided on the temperature sensor support member, The thermal time constant from the heating device to the light detecting element is in the range of 80% to 120% of the thermal time constant from the heating device to the temperature sensor, The control device controls the heating device so that the temperature detected by the temperature sensor becomes a predetermined temperature.
Citation Information
Patent Citations
Spectrophotometer
JP2014048176A