STM probe tip preparation device

Abstract

The invention discloses an STM probe tip preparation device, and the device comprises a clamp which is used for clamping a metal wire; the shearing module comprises a cutter, and the included angle between the extending direction of the cutter and the first direction is a set angle; the first driving mechanism is used for driving the shearing module to shear the metal wire; the second driving mechanism is used for driving the clamp to move in the first direction so that the metal wire can get close to the cutter, and when the shearing module shears the metal wire, the second driving mechanism is used for driving the clamp to move in the direction opposite to the first direction so that the metal wire can be stretched. The first driving mechanism and the second driving mechanism drive the clamp to be matched with the shearing device, the metal wire shearing and stretching processes are accurately controlled, the metal wire is stretched in the shearing process, single-atomic-level STM probe tip preparation is achieved, the tip preparation efficiency and quality are improved, and the production cost is reduced. Therefore, the requirement of high-precision STM imaging is met.

Description

Technical Field

[0001] The invention belongs to the technical field of STM probe preparation, and in particular relates to an STM probe tip preparation device. Background Art

[0002] A scanning tunneling microscope (STM) uses a probe tip to scan the sample surface. The imaging accuracy of the STM is greatly dependent on the sharpness of the tip. The ideal tip should be close to the single-atom level, so the sharpness of the probe tip directly affects the imaging quality.

[0003] Currently, widely used needle tip materials include tungsten wire (W), platinum-iridium wire (Pt / ), or gold wire (Au), with diameters typically ranging from 0.5 to 0.25 mm. Tungsten needle tips are often produced by electrochemical etching, while Pt / iridium needle tips are generally produced by shearing.

[0004] The electrochemical corrosion method has significant application limitations in the field of needle tip preparation, especially for precious metal materials with high chemical stability such as platinum-iridium alloy and gold. Its process feasibility is low and the safety hazards are prominent. Taking the preparation of platinum-iridium needle tips as an example, the process requires the use of a high-concentration CaCl2 electrolyte system, which will continuously precipitate highly toxic chlorine gas (Cl2) under the action of the electric field. It not only requires strict gas protection facilities, but also poses a serious threat to the respiratory system of the operator. Such materials also exhibit nonlinear dissolution characteristics during the electrochemical corrosion process, which can easily lead to uncontrolled tip morphology, further limiting the engineering application value of this technology. Electrochemical corrosion equipment is mainly suitable for needle tip materials with high electrochemical activity (such as tungsten metal), and does not involve the preparation of needle tip materials with high chemical stability such as platinum-iridium. However, equipment specifically used for automatic batch fine shearing of needle tips is relatively scarce. Therefore, materials with high chemical stability still need to rely on manual shearing processes.

[0005] Traditional manual shearing processes present significant production efficiency bottlenecks, with only a single tip being produced in a single operation. This high reliance on operator experience leads to poor consistency in tip geometry and quality, impacting STM imaging accuracy and failing to meet the large-scale manufacturing requirements for standardized tip devices required by modern scanning probe microscopy.

[0006] Therefore, in order to solve the above technical problems, it is necessary to provide an STM probe tip preparation device. Summary of the Invention

[0007] The purpose of the present invention is to provide an STM probe tip preparation device, which can realize tip preparation at the single-atom level, improve the efficiency and quality of tip preparation, and meet the needs of high-precision STM imaging.

[0008] In order to achieve the above object, a technical solution provided by a specific embodiment of the present invention is as follows:

[0009] An STM probe tip preparation device, comprising:

[0010] a clamp for clamping a metal wire, wherein an extending direction of the metal wire is parallel to the first direction;

[0011] A shearing module, comprising a tool, wherein an angle between an extension direction of the tool and the first direction is a set angle;

[0012] a first driving mechanism, configured to drive the shearing module to shear the metal wire;

[0013] The second driving mechanism is used to drive the clamp to move along the first direction to bring the metal wire close to the cutter, and when the shearing module shears the metal wire, to drive the clamp to move in a direction opposite to the first direction to stretch the metal wire.

[0014] In one or more embodiments of the present invention, the clamp includes a shell, which is provided with a plurality of openings for accommodating the metal wires. The clamp is used to clamp a plurality of metal wires, the plurality of metal wires are distributed at intervals, and the first ends of the plurality of metal wires are located on a first straight line, and the angle between the extension direction of the first straight line and the first direction is a set angle.

[0015] In one or more embodiments of the present invention, the tool includes a first blade and a second blade disposed opposite to each other, the second blade being located above the first blade;

[0016] The first blade is fixedly arranged, and the second blade is movably connected to the first driving mechanism. The first driving mechanism drives the second blade to move up and down to perform a shearing action on the metal wire.

[0017] In one or more embodiments of the present invention, the first driving mechanism includes a first motor and at least one first gear, and the second blade is provided with teeth on a side close to the first motor, and the teeth are engaged with the first gear. The first motor is used to control the up and down movement of the second blade by driving the first gear to rotate.

[0018] In one or more embodiments of the present invention, the second driving mechanism includes a first connecting member, a second motor, a first screw and at least one second gear;

[0019] One end of the first screw is connected to the clamp via a first connecting member;

[0020] The second motor is movably connected to the first screw via the second gear, and the second gear cooperates with the thread of the first screw. The second motor is used to control the movement of the first screw by driving the second gear to rotate.

[0021] In one or more embodiments of the present invention, the STM probe tip preparation device also includes a fixed base and a slide rail fixed on the fixed base, a sliding assembly that cooperates with the slide rail is provided at the bottom of the fixture, and the fixture is slidably connected to the fixed base through the sliding assembly.

[0022] In one or more embodiments of the present invention, the clamp includes a second screw, the housing includes a first side wall and a second side wall perpendicular to each other, the first side wall is provided with spaced openings, the first end of the metal wire extends out of the opening, the second side wall is provided with spaced fixing holes, the positions of the fixing holes correspond to the positions of the openings, the inner wall of the fixing hole is provided with a thread, and the size of the fixing hole matches the size of the second screw, the second screw is threadedly connected to the fixing hole, and the tail end of the second screw abuts against the metal wire to fix the metal wire; and / or,

[0023] The clamp includes a fixing component, the shell is provided with openings distributed at intervals, the first end of the metal wire extends out of the opening, the fixing component includes a fastener and a nut, the fastener is fixedly welded to the outside of the shell and is arranged around the opening, the outer diameter of the fastener gradually increases in the direction away from the shell, the side wall of the fastener is provided with a gap passing through the inner and outer walls, the side wall of the fastener is provided with a thread, the nut is threadedly connected to the outer side surface of the fastener, the inner diameter of the nut is larger than the minimum outer diameter of the fastener, and the inner diameter of the nut is smaller than the maximum outer diameter of the fastener.

[0024] In one or more embodiments of the present invention, the STM probe tip preparation device also includes a controller and a sensor, wherein the sensor is used to generate a sensing signal based on the position of the metal wire, the shearing state of the metal wire and / or the state of the tool, and the controller is used to generate a corresponding control signal based on the sensing signal to control the first drive mechanism and the second drive mechanism.

[0025] In one or more embodiments of the present invention, the sensor includes an optical sensor, a capacitive sensor and / or a displacement sensor; and / or,

[0026] The controller includes one of a CPU, an MCU or an FPGA.

[0027] In one or more embodiments of the present invention, the shearing module further includes a storage device, which is arranged below the cutter to accommodate wire waste; and / or the setting angle range is 25° to 40°.

[0028] Compared with the prior art, the STM probe tip preparation device of the present invention uses a first drive mechanism and a second drive mechanism to respectively drive the clamp and the shearing device to cooperate, accurately controlling the process of shearing and stretching the metal wire. By stretching the metal wire during the shearing process, the STM probe tip preparation at the single-atom level is achieved, thereby improving the efficiency and quality of the tip preparation, thereby meeting the requirements of high-precision STM imaging.

[0029] Multiple metal wires are clamped by a fixture to ensure that the tool can shear multiple metal wires at the same time, and the angle between the tool and the metal wire to be processed is set to a set angle to ensure the consistency of the shearing angle. At the same time, it avoids the STM probe tip being too thick due to too small or too large a shearing angle, thereby meeting the control of the curvature radius of the tip of the STM probe tip. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0031] Figure 1 Schematic diagram of the structure of an STM probe tip preparation device in one embodiment of the present invention;

[0032] Figure 2 A top view of an STM probe tip preparation device according to an embodiment of the present invention;

[0033] Figure 3 In one embodiment of the present invention Figure 2 A sectional view of the STM probe tip preparation device shown;

[0034] Figure 4 A block diagram of the principle of a fixed component in one embodiment of the present invention

[0035] Figure 5 This is a principle block diagram of a controller and a sensor in one embodiment of the present invention. DETAILED DESCRIPTION

[0036] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0037] Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations such as "include" or "comprising", etc., will be understood to include the stated elements or components but not to exclude other elements or other components.

[0038] The terms "coupled," "connected," or "connected" as used in this specification encompass both direct and indirect connections. An indirect connection is a connection made through an intermediate medium, such as an electrically conductive medium, which may have parasitic inductance or capacitance. An indirect connection may also include a connection through other active or passive devices, such as switches, follower circuits, or other circuits or components, to achieve the same or similar functional objectives. Furthermore, in the present invention, terms such as "first" and "second" are primarily used to distinguish one technical feature from another and do not necessarily require or imply a specific relationship, quantity, or order between these technical features.

[0039] In the detailed description of the specification, reference is made to the accompanying drawings forming a part hereof, wherein like reference numerals designate like parts throughout, and wherein exemplary embodiments that may be implemented are shown by way of example. It should be understood that other embodiments may be utilized and structural or logical changes may be made without departing from the scope of the present application. Therefore, the following detailed description should not be construed in a limiting sense.

[0040] The various operations in the specification may be described as multiple discrete actions or operations in a manner that is most helpful in understanding the claimed subject matter. However, the order of description should not be interpreted as implying that these operations must be sequentially related. Specifically, these operations may not be performed in the order presented. The described operations may be performed in an order different from the described embodiments. Various additional operations may be performed and / or the described operations may be omitted in additional embodiments.

[0041] For the purposes of this application, the phrase "A and / or B" means (A), (B), or (A and B). For the purposes of this application, the phrase "A, B and / or C" means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B and C).

[0042] Various components and devices may be referred to or shown in the singular form in this document (for example, "MOS tube", "transistor", "switch", etc.), but this is only for convenience of discussion, and any element referred to in the singular form may include multiple such elements according to the teachings of this document.

[0043] The description uses the phrases "in this embodiment" or "in other embodiments" or "in some embodiments", which can each refer to one or more of the same or different embodiments. In addition, the terms "including", "comprising", "having", etc. used in relation to the embodiments of this application are synonymous.

[0044] The present invention discloses an STM probe tip preparation device, comprising:

[0045] a clamp for clamping a metal wire, wherein an extending direction of the metal wire is parallel to the first direction;

[0046] The shearing module includes a tool, wherein the angle between the extension direction of the tool and the first direction is a set angle, wherein the set angle range is 25° to 40°.

[0047] The first driving mechanism is used to drive the shearing module to perform shearing action on the metal wire.

[0048] The second driving mechanism is used to drive the clamp to move in a first direction to bring the metal wire close to the cutter, and when the shearing module shears the metal wire, to drive the clamp to move in a direction opposite to the first direction to stretch the metal wire.

[0049] The present invention proposes an automatic precision shearing scanning tunneling microscope tip preparation device for platinum and iridium, which require a shearing process to prepare the tip materials. The device controls the coordinated movement of the transmission structure and the shearing module with high precision, realizing the automated batch preparation of metal STM probe tips. It achieves significant improvements in key indicators such as tip curvature radius control, shear angle consistency, and preparation efficiency, effectively solving technical problems such as low yield and poor process stability in the manual preparation process.

[0050] The present invention will be further described below with reference to specific embodiments.

[0051] Example 1:

[0052] Ginseng Figures 1 to 4 As shown, an STM probe tip preparation device includes a fixed base 50, a fixture 10, a shearing module 20, a first drive mechanism 30 and a second drive mechanism 40, wherein the fixture 10, the shearing module 20, the first drive mechanism 30 and the second drive mechanism 40 are all located above the fixed base 50.

[0053] Specifically, the clamp 10 is used to clamp a metal wire 60, with the extension direction of the metal wire 60 being parallel to a first direction (i.e., the X direction shown in the figure). Furthermore, the clamp 10 in this embodiment is used to clamp multiple metal wires 60, such that the extension directions of the multiple metal wires 60 are all parallel to the first direction, the multiple metal wires 60 are spaced apart, and the first ends of the multiple metal wires 60 are all located on a first straight line, and the angle between the extension direction of the first straight line and the first direction is a predetermined angle.

[0054] The shearing module 20 includes a cutter, and an angle between an extending direction of the cutter and the first direction is a set angle.

[0055] Furthermore, the setting angle in this embodiment is 30°. It is understood that the arrangement angle of the metal wires 60 is coordinated with the setting angle of the cutter to ensure that the cutter can shear multiple metal wires 60 simultaneously, ensuring the consistency of the shearing angle. The setting angle range is 25° to 40°, avoiding excessively small or large shearing angles that would result in the STM probe tip being too thick, thereby satisfying the control of the curvature radius of the STM probe tip.

[0056] Furthermore, the cutter in this embodiment includes a first blade 22 and a second blade 21 disposed opposite each other, with the second blade 21 being located above the first blade 22. The first blade 22 is fixed, and the second blade 21 is movably connected to a first drive mechanism 30, which drives the second blade 21 to move up and down to cut the wire 60.

[0057] The first driving mechanism 30 is used to drive the shearing module 20 to shear the metal wire 60 .

[0058] Furthermore, the first driving mechanism 30 in this embodiment includes a first motor 31 and at least one first gear 32. The second blade 21 is provided with teeth on the side close to the first motor 31, and the teeth are engaged with the first gear 32. The first motor 31 is used to control the up and down movement of the second blade 21 by driving the first gear 32 to rotate.

[0059] The second driving mechanism 40 is used to drive the clamp 10 to move in a first direction to bring the wire 60 close to the cutter, and to drive the clamp 10 to move in a direction opposite to the first direction to stretch the wire 60 when the shearing module 20 shears the wire 60.

[0060] Furthermore, the second driving mechanism 40 in this embodiment includes a first connecting member 41, a second motor 42, a first screw 43 and at least one second gear 44. One end of the first screw 43 is connected to the clamp 10 through the first connecting member 41, and the second motor 42 is movably connected to the first screw 43 through the second gear 44. The second gear 44 cooperates with the thread of the first screw 43, and the second motor 42 is used to control the movement of the first screw 43 by driving the second gear 44 to rotate.

[0061] In other alternative embodiments, other components may be used to achieve the movable connection between the second motor 42 and the first screw 43. It is understandable that any known or unknown clamp 10 may be used here without restriction and will not be described in detail here.

[0062] Furthermore, the STM probe tip preparation device also includes a slide rail fixedly arranged on the fixed base 50 , a sliding assembly matching the slide rail is provided at the bottom of the fixture 10 , and the fixture 10 is slidably connected to the fixed base 50 via the sliding assembly.

[0063] The clamp 10 in this embodiment includes a shell and a second screw 13. The shell includes a first side wall 101 and a second side wall that are perpendicular to each other. The first side wall 101 is provided with spaced openings 11, and the first end of the metal wire 60 extends out of the opening 11. The second side wall is provided with spaced fixing holes 12. The position of the fixing hole 12 corresponds to the position of the opening 11. The inner wall of the fixing hole 12 is provided with a thread, and the size of the fixing hole 12 matches the size of the second screw 13. The second screw 13 is threadedly connected to the fixing hole 12 and the tail end of the second screw 13 abuts against the metal wire 60 to fix the metal wire 60.

[0064] Ginseng Figure 4 As shown, in other alternative embodiments, the clamp 10 includes a shell and a fixing assembly, the shell is provided with spaced openings 11, the first end of the metal wire 60 extends out of the opening 11, the fixing assembly includes a fastener 14 and a nut 15, the fastener 14 is fixedly welded to the outside of the shell (i.e., on the first side wall 101 of the shell) and is arranged around the opening 11, the outer diameter of the fastener 14 gradually increases in the direction away from the shell, the side wall of the fastener 14 is provided with a gap 141 passing through the inner and outer walls, the side wall of the fastener 14 is provided with a thread, the nut 15 is threadedly connected to the outer side surface of the fastener 14, the inner diameter of the nut 15 is larger than the minimum outer diameter of the fastener 14, and the inner diameter of the nut 15 is smaller than the maximum outer diameter of the fastener 14.

[0065] It is understandable that any known or unknown clamp 10 can be used here without limitation and will not be described in detail here.

[0066] Ginseng Figure 5As shown, the STM probe tip preparation device also includes a controller and a sensor in communication with the controller. The controller is in communication with the first drive mechanism 30 and the second drive mechanism 40. The sensor is used to generate a sensor signal based on the position of the metal wire 60, the shear state of the metal wire 60, and the state of the tool. The controller is used to generate a corresponding control signal based on the sensor signal to control the first drive mechanism 30 and the second drive mechanism 40. The sensor in this embodiment includes an optical sensor, a capacitive sensor, or a displacement sensor. The controller includes one of a CPU, an MCU, or an FPGA.

[0067] The working process of the STM probe tip preparation device includes:

[0068] The controller generates a corresponding control signal based on the sensing signal, and the first driving mechanism 30 drives the second blade 21 to move upward based on the corresponding control signal, and a gap is reserved between the first blade 22 and the second blade 21 to accommodate the metal wire 60;

[0069] The controller generates a corresponding control signal based on the sensor signal, and the second drive mechanism 40 drives the tool to move in the first direction based on the corresponding control signal. When the portion of the metal wire 60 moves between the first blade 22 and the second blade 21, the second drive mechanism 40 drives the tool to stop moving based on the corresponding control signal.

[0070] The first driving mechanism 30 drives the second blade 21 to move downward based on the corresponding control signal, so that the metal wire 60 is clamped by the first blade 22 and the second blade 21;

[0071] The first drive mechanism 30 drives the second blade 21 to continue to move downward based on the corresponding control signal, so that the first blade 22 and the second blade 21 start to perform a shearing action on the metal wire 60, and at the same time as the shearing action starts, the second drive mechanism 40 drives the tool to move in the opposite direction based on the corresponding control signal. It can be understood that, under the joint action of the tool and the fixture 10, the metal wire 60 extends along the incision formed by the shearing action to form an STM probe tip at the single-atom level.

[0072] In other alternative embodiments, after the shearing action begins and before the wire 60 is shortened, the second drive mechanism 40 drives the tool to move in the opposite direction based on the corresponding control signal, and an STM probe tip that meets the requirements of high-precision STM imaging can also be prepared.

[0073] Furthermore, the shearing module 20 includes a storage device 70, which is disposed below the cutting tool and is used to accommodate waste metal wire 60. It is understood that after the transmission mechanism moves in a direction opposite to the first direction, a portion of the metal wire 60 (i.e., the portion where the target STM probe tip is prepared) is fixedly clamped by the shearing device, and the remaining portion of the metal wire 60 can directly fall into the storage device 70.

[0074] It can be seen from the above technical solutions that the present invention has the following beneficial effects:

[0075] The present invention uses a first drive mechanism and a second drive mechanism to drive the clamp and the shearing device to cooperate, accurately controlling the process of shearing and stretching the metal wire. By stretching the metal wire during the shearing process, the STM probe tip is prepared at the single-atom level, improving the efficiency and quality of the tip preparation, thereby meeting the requirements of high-precision STM imaging.

[0076] Multiple metal wires are clamped by a fixture to ensure that the tool can shear multiple metal wires at the same time, and the angle between the tool and the metal wire to be processed is set to a set angle to ensure the consistency of the shearing angle. At the same time, it avoids the STM probe tip being too thick due to too small or too large a shearing angle, thereby meeting the control of the curvature radius of the tip of the STM probe tip.

[0077] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be included therein. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

[0078] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

Claims

1. An STM probe tip preparation device, characterized in that: include: a clamp for clamping a metal wire, wherein an extending direction of the metal wire is parallel to the first direction; A shearing module, comprising a tool, wherein an angle between an extension direction of the tool and the first direction is a set angle; a first driving mechanism, configured to drive the shearing module to shear the metal wire; The second driving mechanism is used to drive the clamp to move along a first direction to bring the metal wire close to the cutter, and when the shearing module shears the metal wire, to drive the clamp to move in a direction opposite to the first direction to stretch the metal wire.

2. The STM probe tip preparation device according to claim 1, characterized in that: The clamp includes a shell, which is provided with multiple openings for accommodating the metal wires. The clamp is used to clamp multiple metal wires, the multiple metal wires are distributed at intervals, and the first ends of the multiple metal wires are located on a first straight line, and the angle between the extension direction of the first straight line and the first direction is a set angle.

3. The STM probe tip preparation device according to claim 1, characterized in that: The cutter comprises a first blade and a second blade arranged opposite to each other, wherein the second blade is located above the first blade; The first blade is fixedly arranged, and the second blade is movably connected to the first driving mechanism. The first driving mechanism drives the second blade to move up and down to perform a shearing action on the metal wire.

4. The STM probe tip preparation device according to claim 3, characterized in that: The first driving mechanism includes a first motor and at least one first gear. The second blade is provided with teeth on a side close to the first motor, and the teeth are engaged with the first gear. The first motor is used to control the up and down movement of the second blade by driving the first gear to rotate.

5. The STM probe tip preparation device according to claim 1, characterized in that: The second driving mechanism includes a first connecting member, a second motor, a first screw and at least one second gear; One end of the first screw is connected to the clamp via a first connecting member; The second motor is movably connected to the first screw via the second gear, and the second gear cooperates with the thread of the first screw. The second motor is used to control the movement of the first screw by driving the second gear to rotate.

6. The STM probe tip preparation device according to claim 1, characterized in that: The STM probe tip preparation device also includes a fixed base and a slide rail fixedly arranged on the fixed base. The bottom of the fixture is provided with a sliding component that matches the slide rail. The fixture is slidably connected to the fixed base through the sliding component.

7. The STM probe tip preparation device according to claim 2, characterized in that: The clamp further includes a second screw, the housing includes a first side wall and a second side wall perpendicular to each other, the first side wall is provided with apertures spaced apart, the first end of the metal wire extends out of the aperture, the second side wall is provided with a fixing hole, the position of the fixing hole corresponds to the position of the aperture, the inner wall of the fixing hole is provided with a thread, and the size of the fixing hole matches the size of the second screw, the second screw is threadedly connected to the fixing hole, and the tail end of the second screw abuts against the metal wire to fix the metal wire; and / or, The clamp also includes a fixing component, the shell is provided with openings distributed at intervals, the first end of the metal wire extends out of the opening, the fixing component includes a fastener and a nut, the fastener is fixedly welded to the outside of the shell and is arranged around the opening, the outer diameter of the fastener gradually increases in the direction away from the shell, the side wall of the fastener is provided with a gap passing through the inner and outer walls, the side wall of the fastener is provided with a thread, the nut is threadedly connected to the outer side surface of the fastener, the inner diameter of the nut is larger than the minimum outer diameter of the fastener, and the inner diameter of the nut is smaller than the maximum outer diameter of the fastener.

8. The STM probe tip preparation device according to claim 1, characterized in that: The STM probe tip preparation device also includes a controller and a sensor, wherein the sensor is used to generate a sensing signal based on the position of the metal wire, the shearing state of the metal wire and / or the state of the tool, and the controller is used to generate a corresponding control signal based on the sensing signal to control the first drive mechanism and the second drive mechanism.

9. The STM probe tip preparation device according to claim 8, characterized in that: The sensor includes an optical sensor, a capacitive sensor and / or a displacement sensor; and / or, The controller includes one of a CPU, an MCU or an FPGA.

10. The STM probe tip preparation device according to claim 1, characterized in that: The shearing module further includes a storage device, which is arranged below the cutter and is used to accommodate metal wire waste; and / or the set angle range is 25° to 40°.

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