Relay comprehensive parameter test fixture

Abstract

The invention discloses a relay comprehensive parameter test fixture which comprises a base and a limiting support vertically arranged on the base, a limiting groove is formed in the vertical end of the limiting support, a mounting seat is mounted in the limiting groove, and a quick fixture is arranged on the mounting seat; a support, a guide seat and a product limiting seat are sequentially arranged on the upper end face of the base from bottom to top, a groove is formed in the product limiting seat, a test socket is further arranged in the guide seat, and the vertical center lines of the groove, the test socket and the quick clamp are located on the same line. A clamping piece probe assembly is placed in the test socket, and the flare angle and the corner of a reed on the upper portion of the clamping piece probe assembly are 60 degrees and 30 degrees respectively. According to the test fixture, the positioning, clamping and plugging modes of a traditional test fixture are changed, the structure and the shape of the reed assembly and the material of the socket are changed, and the defects of the traditional reed assembly and the socket are overcome.

Description

Technical Field

[0001] The invention belongs to the technical field of relay testing, and in particular relates to a relay comprehensive parameter testing fixture. Background Art

[0002] During the assembly process of high-end sealed relays, in order to achieve the most ideal electrical performance parameters of the product, it is necessary to adjust some of the product's mechanical and magnetic performance parameters multiple times and conduct repeated comprehensive parameter tests. In order to achieve high test accuracy, not only high-precision test equipment and reasonable test methods are required, but also high-reliability test fixtures. Therefore, this type of relay places high technical requirements on the design, manufacture, assembly and debugging of its test fixtures.

[0003] At present, the shapes of relay lead terminals are mainly divided into straight columns and curved hooks. The test method is generally based on four-terminal network testing. This test method can reduce or avoid the influence of lead resistance and contact resistance on the measurement results by separating the current and voltage paths, thereby achieving higher test accuracy. During measurement, the excitation end and the test end of each terminal (hook) need to be separated. Compared with the two-wire test method, this test method doubles the number of test points and lead wires. Currently, relays with straight column-shaped lead terminals can use a contact-type zero-plug-in force fixture to achieve four-terminal network testing. However, for relays with curved hook-shaped lead terminals, with a large number of wiring hooks, small column spacing, and a small hook diameter, such as Figure 1 and Figure 2 As shown, it is difficult to implement four-terminal network testing. The main difficulties are as follows:

[0004] 1. Due to the large number of wiring hooks in this relay, the hook diameter is less than 1mm, and the pin spacing is small (3.8mm), conventional clip probes cannot ensure reliable contact with the wiring hooks. Although test ejector pins can ensure reliable contact with the wiring hooks, they cannot effectively separate the test excitation terminal from the test terminal.

[0005] 2. For relays with hooked terminals, it is difficult to clamp them with a contact-type fixture without insertion and extraction force. Only a clip-type test fixture with insertion and extraction force can be used, but this can easily cause damage to the surface of the terminal hook, affecting the appearance quality of the product.

[0006] 3. When using manual plugging and unplugging, it is difficult to effectively control the force and direction of plugging and unplugging, which can easily cause the wiring hook to be skewed and deformed, resulting in damage to the glass insulator between the product post and the base plate, causing the sealing of the entire product to fail to meet the standards.

[0007] Chinese utility model patent publication number CN204065167U discloses a hook-shaped terminal relay test fixture. The fixture comprises a device housing, a top clamping plate at the top of the housing, one side of which is movably connected to the housing, a slot at the bottom of the housing, one end of which communicates with the bottom of the housing, and a spring-loaded ejector pin within the slot. One end of the spring-loaded ejector pin is located within the slot and the other end is fixed to the bottom terminal block. This fixture addresses existing issues with hook-shaped terminal relay testing, such as unstable test data, low test efficiency, and significant time and labor costs. However, it does not address the problem of the terminal hook easily becoming stuck during insertion and removal. Summary of the Invention

[0008] In order to solve the above problems, the present invention aims to provide a relay comprehensive parameter test fixture.

[0009] In order to achieve the above object, the present invention adopts the following technical solution: a relay comprehensive parameter test fixture, comprising a base, a limit support vertically arranged on the base, a limit slot being provided at a vertical end of the limit support, a mounting seat being installed in the limit slot, and a quick clamp being provided on the mounting seat;

[0010] A support, a guide seat and a product limit seat are sequentially arranged on the upper end surface of the base from bottom to top. A groove is opened on the product limit seat. A test socket is also arranged in the guide seat. The vertical center lines of the groove, the test socket and the quick clamp are on the same line.

[0011] A clip probe assembly is placed in the test socket, and the opening angle and the turning angle of the spring on the upper part of the clip probe assembly are 60 degrees and 30 degrees respectively.

[0012] Furthermore, the quick clamp includes a product pressing head, the upper end of the product pressing head is connected to the handle through a connecting piece, and the handle is lifted to drive the product pressing head to rise vertically.

[0013] Furthermore, the quick clamp is vertically mounted on the mounting seat, the product pressing head of the quick clamp passes through the horizontal end of the mounting seat, and the handle of the quick clamp is fixed to the vertical end of the mounting seat through a connecting piece.

[0014] Furthermore, the vertical end of the mounting seat is fixed in the limiting groove of the limiting support by means of screws, and the mounting seat slides up and down in the limiting groove.

[0015] Furthermore, the groove on the product limiting seat includes a limiting cavity and a wiring hook hiding groove opened at the lower part of the limiting cavity, and a return pin is also provided between the product limiting seat and the guide seat.

[0016] Furthermore, a mounting groove is provided in the guide seat, and the test socket is fixed in the mounting groove.

[0017] Furthermore, the product limiting seat, guide seat and support are connected in a limiting manner through the cooperation of a guide rod and a linear bearing.

[0018] Furthermore, the test socket includes a socket body and a plurality of clip probe assemblies vertically installed in the socket body.

[0019] Furthermore, the upper portion of the clip probe assembly is a spring, the middle portion is an insulating sleeve, and the lower portion is an excitation end and a test end.

[0020] Furthermore, insulating high-temperature glue is provided at the contact points between the excitation end and the test end and the socket body.

[0021] Compared with the prior art, the present invention has the following advantages:

[0022] 1. Improvements to the reed assembly enhance the product's guiding properties during insertion and removal of the hook, reducing resistance. They also increase the contact surface between the hook and the elastic reed, enhancing the flow conductivity between the hook and the reed. Processing the reed's stress-bearing section into a bow shape improves its toughness and fatigue strength, minimizing test circuit loss and ensuring accurate and stable test parameters.

[0023] 2. The product pressure head is controlled by the handle, and the downward pressure is mechanically controlled to ensure the smooth downward movement of the test product. At the same time, the relative position of the test product and the test socket is high, and the product's wiring hooks can enter the reed assembly of the test socket without jamming. The surface of the wiring hook is not damaged and the appearance quality is good. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the specific embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0025] Figure 1 Schematic diagram of a relay with a straight column-shaped lead-out terminal in the present invention Figure 1 ;

[0026] Figure 2 for Figure 1 AA cross-sectional view;

[0027] Figure 3 is a schematic diagram of a universal clip probe assembly;

[0028] Figure 4 A schematic diagram of the improved clip probe assembly of the present invention;

[0029] Figure 5 This is a schematic diagram of the test socket;

[0030] Figure 6 for Figure 5 A cross-sectional view of the clip probe assembly in FIG.

[0031] Figure 7 Schematic diagram of the relay comprehensive parameter test fixture in the present invention Figure 1 ;

[0032] Figure 8 Schematic diagram of the relay comprehensive parameter test fixture in the present invention Figure 2 ;

[0033] In the figure, 1-mounting seat, 2-product pressure head, 3-product limit seat, 4-guide rod, 5-linear bearing, 6-limit support, 7-return ejector, 8-guide seat, 9-base, 11-test socket, 11-1 socket body, 11-2 clip probe assembly, 11-21-spring, 11-22-insulating sleeve, 11-23-excitation end, 11-24-test end, 11-25-insulating high temperature glue, 11-26-excitation point, 11-27-test point, 12-quick clamp, 12-1 handle, 13-support, test product-A, a-wiring hook. DETAILED DESCRIPTION

[0034] The present invention is further described below with reference to the accompanying drawings and specific embodiments. However, it should not be understood that the scope of the subject matter described in the present invention is limited to the following embodiments. Without departing from the above technical ideas of the present invention, various modifications, substitutions and changes made according to common technical knowledge and customary means in the field are included in the scope of the present invention.

[0035] Reference Figure 7 and Figure 8 In order to improve the positioning accuracy of the wiring hook to each reed component, increase the stability and guidance of the product plugging and unplugging, and reduce the risk of the wiring hook skewing and deformation and damage to the glass insulator; in order to reduce the labor intensity of the operator and improve the controllability of the test fixture, the test fixture is mainly composed of a mounting base 1, a product pressure head 2, a product limit seat 3, a guide rod 4, a linear bearing 5, a limit support 6, a return pin 7, a guide seat 8, a base 9, a pressure bar 10, a test socket 11, a quick clamp 12, and a support 13.

[0036] The base 9 is vertically connected to the limit support 6. A slidable mounting seat 1 is installed in the limit groove of the limit support 6. A quick clamp 12 is connected to the mounting seat 1. The upper end of the base 9 is arranged with a support 13, a guide seat 8, and a product limit seat 3 from bottom to top. The three are connected through a guide rod and a linear bearing 5 to ensure that the relative position is stable and the movement is smooth; the test socket 11 is embedded in the mounting groove of the guide seat 8, and the product pressure head 2, the groove of the product limit seat 3, and the axis of the test socket 11 are collinear to ensure the docking accuracy.

[0037] The limiting support 6 provides vertical guidance for the mounting base 1, and the quick clamp 12 drives the product pressure head 2 through the handle 12-1 to control the insertion depth of the wiring hook; the quick clamp 12 consists of the product pressure head 2 and the handle 12-1, and the two are connected by a rotating shaft; the quick clamp 12 is vertically installed on the mounting base 1, the product pressure head 2 passes through the horizontal end of the mounting base 1, and the handle 12-1 is hinged to the vertical end of the mounting base 1.

[0038] More common clip probe assemblies such as Figure 3 As shown, although it can meet the requirements of four-terminal network testing, when the product wiring hook is inserted into it, the test excitation end and the test end can be effectively separated, meeting the requirements of four-terminal network testing. However, due to the large opening angle and corner of the elastic reed, the wiring hook is easily stuck when plugging and unplugging. The stress-bearing section of the elastic reed is in an upright state, and the tensile strength of the reed is poor, which makes it easy for the reed elasticity to fail or break, resulting in poor contact between the reed and the wiring hook.

[0039] In order to overcome the above shortcomings and defects, the present invention improves it into Figure 4 The shape of the springs 11-21 has been adjusted to 90° before the modification and 60° and 30° after the modification. This not only enhances the guidance of the product's hook during insertion and removal, reducing resistance, but also increases the contact surface between the hook and the elastic spring, improving the flow conductivity between the hook and the spring. The stress-bearing section of the spring is processed into a bow shape to improve its toughness and fatigue strength.

[0040] Reference Figure 5 and Figure 6 Multiple clip probe assemblies 11-2 are installed at specific angles into a socket made of polytetrafluoroethylene (PTFE), which exhibits excellent toughness and self-lubrication. The test socket 11 comprises a socket body 11-1 and several clip probe assemblies 11-2 vertically mounted within the socket body 11-1. The clip probe assemblies 11-2 have a spring 11-21 at the top, an insulating sleeve 11-22 in the middle, and an excitation terminal 11-23 and a test terminal 11-24 at the bottom. Insulating high-temperature adhesive 11-25 is applied to the contact areas between the excitation terminal 11-23 and the test terminal 11-24 and the socket body 11-1. With the inner wall of the socket as support, the stress point of the spring is effectively protected to ensure the reliability of the contact pressure between the spring 11-21 and the wiring hook a, and the bottom of the socket 11-1 is sealed with glue to keep the clip probe assembly 11-2 and the socket 11-1 relatively fixed, so that the clip probe assembly 11-2 will not twist or be pulled out during the stress process.

[0041] The depth of the product's wiring hook a inserted into the test socket 11 is effectively controlled so that the product is inserted to a specific depth. This can shorten the friction distance between the reed 11-21 and the wiring hook a, reduce or avoid damage to the surface of the wiring hook, and enable the reed assembly to effectively separate the excitation point 11-26 and the test point 11-27 of the wiring hook test, meeting the requirements of four-terminal network testing.

[0042] Reference Figure 7 and Figure 8 , the main functions of each part of the test fixture are as follows:

[0043] The limiting support 6 and the base 9 are fastened together by positioning pins and screws to ensure their relative position and verticality;

[0044] The limiting groove in the limiting support 6 is used for vertical guidance of the mounting base 1. Tightening the screws on the back of the limiting support 6 can fix the mounting base 1 in the limiting support 6;

[0045] The quick clamp 12 is vertically mounted on the mounting base 1 and can slide up and down in the slot of the limit support 6. By adjusting the height of the quick clamp 12, the depth of the test product wiring hook a pressed into the test socket 11 is controlled;

[0046] The product limit seat 3 has a certain depth of limit cavity and wiring hook hiding groove, which can ensure that the test product is in a natural positioning state after being placed in and will not shift in position during the downward process;

[0047] The test socket 11 is limited in the guide seat 8 through the installation groove in the guide seat 8 and is fastened with screws;

[0048] The product limit seat 3, guide seat 8, and support 13 are connected by the guide rod 4 and linear bearing 5, which can not only ensure the relative position between them, so that the product limit seat 3 can move vertically freely, but also ensure that the product is always in a stable state during the movement, so that the product wiring hook and the reed assembly in the test socket are accurately connected;

[0049] The clamp of the present invention applies vertical and stable pressure to the bottom of the test product A by pressing the product pressure head 2 downward, driving the product limit seat 3 to move vertically and smoothly, so that the product wiring hook a is accurately inserted into the test socket 11 to reach the ideal depth; when the handle of the quick clamp 12 is lifted, the product pressure head 2 rises, and the four return pins 7 provide reverse thrust, lifting the product limit seat 3 vertically and smoothly, so that the test product A is separated from the test socket 11.

[0050] The steps for clamping and testing the product using this test fixture are as follows:

[0051] Step 1. Lift the handle of the quick clamp 12 to the highest point, so that the product pressure head 2 rises to the starting position:

[0052] Step 2. Place the test product A into the positioning cavity of the product limit seat 3 according to the direction of the wiring hook groove and confirm that it is correct;

[0053] Step 3. Slowly and evenly press the handle of the quick clamp 12 downward to the dead center. The product indenter 2 smoothly descends to the preset height, inserting the wire hook a of the test product A into the clip probe assembly 11-2 of the test socket 11, contacting the excitation point 11-26 and the test point 11-27, and ensuring that the insertion depth reaches the desired state.

[0054] Step 4. Start the product comprehensive parameter tester and perform comprehensive parameter test on the test product according to the set program;

[0055] Step 5. When the test instruction is completed, lift the quick clamp handle to the starting point and remove the product under test from the test fixture to complete a clamping and testing cycle.

[0056] The use effect of the test fixture, through careful debugging, the test fixture has been successfully put into production, various performances have been fully verified, and the expected design effect has been achieved.

[0057] 1. The relative position accuracy between the product and the test socket is high, and each wiring hook of the product can enter the reed assembly of the test socket without any jamming. The surface of the wiring hook is not damaged and the appearance quality is good;

[0058] 2. The product was tested to operate smoothly both up and down, the product's wiring hook was twisted and deformed, and the glass insulator between the wiring hook and the base plate did not break when plugged in or out, indicating that the product's sealing performance has been improved to a certain extent;

[0059] 3. The product's terminal and the reed assembly in the test socket have reliable contact, the test line loss is small, and the test parameters are accurate and stable;

[0060] 4. The mechanical mechanism for inserting and removing test products not only eliminates the uncertainty of manual operation, but also reduces the labor intensity of the operator and improves labor efficiency.

[0061] The test fixture and improved probe assembly of the present invention cooperate to test products, ensuring that each of the product's connection hooks (a) makes reliable contact with the excitation end (11-23) and test end (11-24) of the clip probe. The excitation end and test end of the clip probe are effectively separated, reducing measurement errors and improving measurement accuracy. The risk of elastic clip failure in the clip probe assembly (11-2) is reduced, improving its reliability. The insertion and removal depth of the connection hook (a) and the reed assembly are effectively controlled, minimizing damage to the terminal post surface. A mechanical insertion and removal mechanism replaces manual insertion and removal, improving insertion and removal stability and guidance, and reducing the risk of connection hook skew and deformation, and damage to the glass insulator.

[0062] This test fixture changes the positioning, clamping, and plugging methods of traditional test fixtures. The changes in the structure, shape, and socket material of the reed assembly have completely overcome the shortcomings of traditional reed assemblies and sockets, providing a certain technical reference for the design and production of test fixtures similar to relays, and has certain promotion and reference value.

[0063] The above describes in detail the electrical equipment comprehensive parameter test fixture provided by the present invention. This article uses specific examples to illustrate the structure and operating principles of the present invention. The description of the above embodiments is intended only to facilitate understanding of the method and core concept of the present invention. It should be noted that those skilled in the art may make various improvements and modifications to the present invention without departing from the principles of the present invention, and such improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. A relay comprehensive parameter test fixture, characterized by: It comprises a base (9), a limiting support (6) vertically arranged on the base (9), a limiting groove being provided at a vertical end of the limiting support (6), a mounting seat (1) being installed in the limiting groove, and a quick clamp (12) being provided on the mounting seat (1); A support (13), a guide seat (8) and a product limiting seat (3) are sequentially arranged on the upper end surface of the base (9) from bottom to top, a groove is provided on the product limiting seat (3), and a test socket (11) is further provided in the guide seat (8), wherein the vertical center lines of the groove, the test socket (11) and the quick clamp (12) are located on the same line; A clip probe assembly (11-2) is placed in the test socket (11), and the opening angle and the turning angle of the upper spring of the clip probe assembly (11-2) are 60° and 30° respectively.

2. The relay comprehensive parameter test fixture according to claim 1, characterized in that: The quick clamp (12) comprises a product pressing head (2), the upper end of the product pressing head (2) is connected to a handle (12-1) via a connecting piece, and the handle (12-1) is lifted to drive the product pressing head (2) to rise vertically.

3. The relay comprehensive parameter test fixture according to claim 2, characterized in that: The quick clamp (12) is vertically mounted on the mounting base (1), the product pressing head (2) of the quick clamp (12) passes through the horizontal end of the mounting base (1), and the handle (12-1) of the quick clamp (12) is fixed to the vertical end of the mounting base (1) through a connecting piece.

4. The relay comprehensive parameter test fixture according to claim 1, characterized in that: The vertical end of the mounting seat (1) is fixed in the limiting groove of the limiting support (6) by means of screws, and the mounting seat (1) slides up and down in the limiting groove.

5. The relay comprehensive parameter test fixture according to claim 1, characterized in that: The groove on the product limiting seat (3) includes a limiting cavity and a wiring hook avoidance groove provided at the lower part of the limiting cavity. A return ejector pin (7) is also provided between the product limiting seat (3) and the guide seat (8).

6. The relay comprehensive parameter test fixture according to claim 1, characterized in that: A mounting groove is provided in the guide seat (8), and the test socket (11) is fixed in the mounting groove.

7. The relay comprehensive parameter test fixture according to claim 1, characterized in that: The product limiting seat (3), the guide seat (8) and the support (13) are connected in a limiting manner through the cooperation of the guide rod (4) and the linear bearing (5).

8. The relay comprehensive parameter test fixture according to claim 1, characterized in that: The test socket (11) comprises a socket body (11-1) and a plurality of clip probe assemblies (11-2) vertically mounted in the socket body (11-1).

9. The relay comprehensive parameter test fixture according to claim 8, characterized in that: The upper portion of the clip probe assembly (11-2) is a spring (11-21), the middle portion is an insulating sleeve (11-22), and the lower portion is an excitation end (11-23) and a test end (11-24).

10. The relay comprehensive parameter test fixture according to claim 9, characterized in that: Insulating high-temperature glue (11-25) is provided at the contact points between the excitation end (11-23) and the test end (11-24) and the socket body (11-1).

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