Socket assembly

Abstract

The invention provides a socket assembly. The socket assembly comprises a main body, a plurality of shielding pieces and a plurality of elastic probes. The body has a plurality of perforations and a plurality of trenches. The plurality of through holes are used for accommodating a plurality of elastic probes. And at least one groove is formed between any two adjacent through holes. The plurality of shielding members are inserted into the plurality of grooves.

Description

Technical Field

[0001] The present disclosure relates to a socket assembly, and more particularly to a socket assembly with a shielding function, wherein the socket assembly is used for a chip test socket. Background Art

[0002] After chips are packaged into packaged ICs, they must be inspected to filter out defective ICs. Packaged ICs are typically inspected using a socket equipped with test probes, typically spring-loaded probes (pogo pins). One end of the pogo pin contacts the socket's circuit board, while the other end contacts the pins of the packaged IC, allowing testing.

[0003] However, because the socket's holes for accommodating the spring probes are closely spaced, signals from adjacent spring probes can interfere with each other during testing, leading to suboptimal test results. This interference is particularly pronounced during high-frequency signal testing. Therefore, improving signal interference to enhance test stability and accuracy remains an urgent challenge in the field.

[0004] The above description of “prior art” is merely to provide background technology, and does not admit that the above description of “prior art” discloses the subject matter of the present disclosure, does not constitute the prior art of the present disclosure, and any description of the above “prior art” should not be regarded as any part of the present disclosure. Summary of the Invention

[0005] In view of this, in order to solve the problem of test signal interference in the prior art, the present disclosure aims to provide a socket assembly.

[0006] One embodiment of the present disclosure provides a socket assembly for an IC test socket, the socket assembly comprising a main body, a plurality of first shielding members, a plurality of second shielding members, and a plurality of elastic probes. The main body comprises an upper surface, a lower surface opposite to the upper surface, a plurality of first perforation arrays, a plurality of second perforation arrays, a plurality of first grooves, and a plurality of second grooves. Each first perforation array comprises a plurality of first perforations, the first perforations being arranged along a first direction. Each second perforation array comprises a plurality of second perforations, the second perforations being arranged along a second direction. Each first groove extends along the first direction, with one first groove being provided between any two adjacent first perforation arrays. Each second groove extends along the second direction, with one second groove being provided between any two adjacent second perforation arrays. Each first shielding member comprises a first surface, with the plurality of first shielding members being inserted into the plurality of first grooves. Each second shielding member comprises a second surface, with the plurality of second shielding members being inserted into the plurality of second grooves. A plurality of elastic probes are provided in the plurality of first perforations and the plurality of second perforations. The first surfaces of the plurality of first shielding members are spaced apart from the lower surfaces by a first distance, while the second surfaces of the plurality of second shielding members are spaced apart from the lower surfaces by a second distance.

[0007] Another embodiment of the present disclosure provides a socket assembly comprising a main body, a plurality of shielding members, and a plurality of elastic probes. The perforations of at least a first portion of the plurality of perforations form a plurality of first perforation arrays. The perforations of at least a second portion of the plurality of perforations form a plurality of second perforation arrays. The grooves of at least a first portion of the plurality of grooves are disposed between any two adjacent first perforation arrays. The grooves of at least a second portion of the plurality of grooves are disposed between any two adjacent second perforation arrays. The plurality of shielding members are inserted into the plurality of grooves. The plurality of elastic probes are disposed in the plurality of perforations.

[0008] Accordingly, due to the socket assembly disclosed herein, signal interference between probes can be shielded by the shielding member during the test process, so as to more effectively improve signal interference and enhance the stability and accuracy of the test.

[0009] The above has been a fairly broad overview of the technical features and advantages of the present disclosure, so that the detailed description of the present disclosure below can be better understood. Other technical features and advantages that constitute the subject matter of the claims of the present disclosure will be described below. It should be understood by those skilled in the art to which the present disclosure belongs that the concepts and specific embodiments disclosed below can be readily utilized to modify or design other structures or processes to achieve the same purposes as those of the present disclosure. It should also be understood by those skilled in the art to which the present disclosure belongs that such equivalent constructions cannot depart from the spirit and scope of the present disclosure as defined by the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] A more complete understanding of the disclosure of the present invention may be obtained by referring to the detailed description and the claims in conjunction with the accompanying drawings, in which like reference numerals refer to like elements.

[0011] Figure 1A is a three-dimensional diagram of a socket assembly according to some embodiments of the present disclosure.

[0012] Figure 1B is a three-dimensional diagram of a socket assembly according to some embodiments of the present disclosure.

[0013] Figure 1C is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0014] Figure 1D is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0015] Figure 1E is a perspective view of the main body of some embodiments of the present disclosure.

[0016] Figure 1F is a perspective view of the main body of some embodiments of the present disclosure.

[0017] Figure 1G is a perspective view of the main body of some embodiments of the present disclosure.

[0018] Figure 1H is a cross-sectional view of the body of some embodiments of the present disclosure.

[0019] Figure 1I is a cross-sectional view of the body of some embodiments of the present disclosure.

[0020] Figure 2A is a three-dimensional diagram of a socket assembly according to some embodiments of the present disclosure.

[0021] Figure 2B is a three-dimensional diagram of a socket assembly according to some embodiments of the present disclosure.

[0022] Figure 2C is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0023] Figure 2D is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0024] Figure 2E is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0025] Figure 2F is a perspective view of the main body of some embodiments of the present disclosure.

[0026] Figure 2G is a perspective view of the main body of some embodiments of the present disclosure.

[0027] Figure 2H is a perspective view of the main body of some embodiments of the present disclosure.

[0028] Figure 2I is a cross-sectional view of the body of some embodiments of the present disclosure.

[0029] Figure 2J is a cross-sectional view of the body of some embodiments of the present disclosure.

[0030] Figure 2K is a cross-sectional view of the body of some embodiments of the present disclosure.

[0031] Figure 2L is a cross-sectional view of a shield according to some embodiments of the present disclosure. Figure 2M is a three-dimensional diagram of a socket assembly according to some embodiments of the present disclosure.

[0032] Figure 2N is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0033] Figure 2O is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0034] Figure 2P It is an enlarged cross-sectional view of the socket assembly of some embodiments of the present disclosure.

[0035] Figure 3 is a three-dimensional diagram of a socket assembly according to some embodiments of the present disclosure.

[0036] Figure 4A is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0037] Figure 4B is a cross-sectional view of a socket assembly according to some embodiments of the present disclosure.

[0038] The description of the accompanying drawings is as follows:

[0039] 11:Socket assembly

[0040] 111: Subject

[0041] 111S1: Upper surface

[0042] 111S2: bottom surface

[0043] 1110, 1110A, 1110B: perforation

[0044] 1110AR1: First perforated array

[0045] 1110AR2: Second perforated array

[0046] 1112, 1112A: Groove

[0047] 11120: first groove

[0048] 11122: Second groove

[0049] 113, 113A: Shielding

[0050] 1131: First shielding member

[0051] 1131S: First surface

[0052] 1133: Second shielding member

[0053] 1133S: Second surface

[0054] 13, 13A, 13B: Elastic probe

[0055] 21, 21': socket assembly

[0056] 211: Subject

[0057] 211S1: Upper surface

[0058] 211S2: bottom surface

[0059] 2110AR1: First perforated array

[0060] 2110AR2: Second perforated array

[0061] 2110-1: First Puncture

[0062] 2110-2: Second Puncture

[0063] 2110A, 2110B: Perforation

[0064] 21120: First groove

[0065] 21120X: First opening

[0066] 21120Y: Second opening

[0067] 21122, 21122A: Second groove

[0068] 21122X: The third opening

[0069] 21122Y: The fourth opening

[0070] 213: Shielding

[0071] 2131, 2131': first shielding member

[0072] 2131S: First surface

[0073] 2131F: First fixed structure

[0074] 2131P: Protrusion

[0075] 2131PS: Third Surface

[0076] 21310: First joint

[0077] 2133, 2133A: Second shielding member

[0078] 2133S: Second surface

[0079] 2133E: End

[0080] 2133P: Protrusion

[0081] 2133PS: Fourth Surface

[0082] 21330: Second joint

[0083] 23, 23A, 23B: Elastic probe

[0084] 25: Circuit board

[0085] 251: Second fixed structure

[0086] D11, D21: first spacing

[0087] D12, D22: second spacing

[0088] D13, D23: First direction

[0089] D14, D24: Second direction

[0090] D25:Thickness

[0091] D26: third spacing

[0092] D27: fourth spacing

[0093] 31:Socket assembly

[0094] 311: Subject

[0095] 311S1: Upper surface

[0096] 3110:Piercing

[0097] 3112: Groove

[0098] 313: Shielding

[0099] 33: Elastic probe

[0100] 41, 41': socket assembly

[0101] 411: Subject

[0102] 411S1: Top surface

[0103] 4110:Piercing

[0104] 4112: Groove

[0105] 413: Shielding

[0106] 43: Elastic probe DETAILED DESCRIPTION

[0107] The following description of the present disclosure is accompanied by the accompanying drawings, which are incorporated in and constitute a part of the specification, and illustrates an embodiment of the present disclosure, but the present disclosure is not limited to the embodiment. In addition, the following embodiments can be appropriately combined to complete another embodiment.

[0108] Terms such as "one embodiment," "an embodiment," "illustrative embodiment," "another embodiment," and "another embodiment" indicate that the embodiments described herein may include specific features, structures, or characteristics. However, not every embodiment is required to include such specific features, structures, or characteristics. Furthermore, repeated use of the phrase "in an embodiment" does not necessarily refer to the same embodiment, but may refer to the same embodiment. Furthermore, the socket assembly mentioned in this specification is primarily used for chip testing in semiconductor testing.

[0109] In order to make the present disclosure fully understandable, the following description provides detailed steps and structures. Obviously, the implementation of the present disclosure does not limit the specific details known to those skilled in the art. In addition, known structures and steps are not described in detail again to avoid unnecessarily limiting the present disclosure. The preferred embodiments of the present disclosure are described in detail below. However, in addition to the detailed description, the present disclosure can also be widely implemented in other embodiments. The scope of the present disclosure is not limited to the content of the detailed description, but is defined by the claims.

[0110] It should be understood that the following disclosure provides many different embodiments or examples for implementing the different features of the present disclosure. Specific embodiments or examples of components and arrangements are described below to simplify the present disclosure. Of course, the plurality is merely an example and is not intended to be limiting. For example, the dimensions of the components are not limited to the disclosed ranges or values, but may depend on the process conditions and / or the desired properties of the device. In addition, the following description of forming a first feature "above" or "on" a second feature may include embodiments in which the first and second features are formed to be in direct contact, and may also include embodiments in which additional features may be formed between the first and second features, thereby making it possible for the first and second features not to be in direct contact. For the sake of brevity and clarity, various features may be drawn arbitrarily at different scales. In the accompanying drawings, some layers / features may be omitted for simplicity.

[0111] Furthermore, for ease of description, spatially relative terms such as "beneath," "below," "lower," "above," and "upper" may be used herein to describe the relationship of one element or feature to another element or feature as illustrated in the figures. These spatially relative terms are intended to encompass different orientations of the elements in use or operation in addition to the orientation depicted in the figures. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein should be interpreted accordingly.

[0112] The embodiments of the present disclosure relate to a socket assembly for a chip test socket (IC test socket), comprising a main body, a plurality of shielding members, and a plurality of elastic probes. The plurality of elastic probes are used to test high-frequency signals. The main body is made of an insulating material, and has a plurality of through-holes and a plurality of grooves, and at least one of the grooves is provided between any two adjacent through-holes. The plurality of through-holes are used to accommodate a plurality of elastic probes. The plurality of shielding members are made of a conductive metal material and are inserted into the plurality of grooves. Through this structure, the insulation of the main body itself can block the electrical contact between the elastic probes, and the metal shielding members inserted between the through-holes for accommodating the elastic probes can effectively shield the elastic probes from signal interference during the test process, especially signal interference during high-frequency signal testing. In this way, when the socket assembly is installed in the corresponding socket, the socket assembly can more effectively improve signal interference to enhance the stability and accuracy of the test. The detailed structure and description are shown in the following embodiments.

[0113] refer to Figures 1A to 1D . Figure 1A is a three-dimensional diagram of a socket assembly 11 according to some embodiments of the present disclosure. Figure 1B is another perspective view of the socket assembly 11 of some embodiments of the present disclosure, Figure 1C is a cross-sectional view of the socket assembly 11 of some embodiments of the present disclosure, Figure 1D 1 is another cross-sectional view of the socket assembly 11 according to some embodiments of the present disclosure. Specifically, the socket assembly 11 includes a main body 111, a plurality of shielding members 113, and a plurality of elastic probes 13. The main body 111 has an upper surface 111S1 and a lower surface 111S2 opposite to the upper surface 111S1.

[0114] Please refer to Figure 1E to Figure 1I . Figure 1E and Figure 1F is a perspective view of the main body 111 of some embodiments of the present disclosure, Figure 1G is another perspective view of the main body 111 of some embodiments of the present disclosure, Figure 1H is a cross-sectional view of the main body 111 of some embodiments of the present disclosure, Figure 1I1 is another cross-sectional view of a main body 111 according to some embodiments of the present disclosure. Specifically, the main body 111 has a plurality of through-holes 1110 and a plurality of grooves 1112. At least a first portion of the plurality of through-holes 1110 form a plurality of first through-hole arrays 1110AR1. The through-holes 1110 in each first through-hole array 1110AR1 are considered first through-holes and are arranged along a first direction D13. At least a second portion of the plurality of through-holes 1110 form a plurality of second through-hole arrays 1110AR2. The through-holes 1110 in each second through-hole array 1110AR2 are considered second through-holes and are arranged along a second direction D14. In some embodiments, a first through-hole and a second through-hole may be the same through-hole, with the first through-hole and the second through-hole being simply distinguished by the angles of the different through-hole arrays.

[0115] In some embodiments, the plurality of grooves 1112 includes a plurality of first grooves 11120 and a plurality of second grooves 11122. Each first groove 11120 extends along a first direction D13, and one first groove 11120 is provided between any two adjacent first perforation arrays 1110AR1. Each second groove 11122 extends along a second direction D14, and one second groove 11122 is provided between any two adjacent second perforation arrays 1110AR2.

[0116] In some embodiments, the plurality of shielding members 113 include a plurality of first shielding members 1131 and a plurality of second shielding members 1133. The first shielding members 1131 are inserted into the plurality of first grooves 11120 from the upper surface 111S1, and the second shielding members 1133 are inserted into the plurality of second grooves 11122 from the upper surface 111S1. The plurality of through-holes 1110 are used to accommodate the plurality of elastic probes 13. In some embodiments, the first shielding members 1131 and the second shielding members 1133 may be arranged in an alternating manner. The alternating shielding members may have an interlocking structure.

[0117] In some embodiments, each first shielding member 1131 has a first surface 1131S, and each second shielding member 1133 has a second surface 1133S. The first surface 1131S, the second surface 1133S, and the lower surface 111S2 face substantially the same direction. When the first shielding member 1131 and the second shielding member 1133 are inserted into their corresponding slots, a first distance D11 is defined between the first surface 1131S and the lower surface 111S2, and a second distance D12 is defined between the second surface 1133S and the lower surface 111S2.

[0118] In some embodiments, the upper surface 111S1 and the lower surface 111S2 are substantially parallel, the first surface 1131S of the first shielding member 1131 is substantially coplanar, the second surface 1133S of the second shielding member 1133 is substantially coplanar, the first surface 1131S and the second surface 1133S are substantially coplanar, and the values ​​of the first spacing D11 and the second spacing D12 are substantially the same, but this is not intended to limit the embodiments of the present disclosure.

[0119] In this way, based on the structure of the aforementioned socket assembly 11, when the chip test is performed and the elastic probes 13 placed in the two adjacent through-holes 1110 are transmitting signals, the shielding member 113 inserted in the groove 1112 provided between the two adjacent through-holes 1110 can effectively shield the signal interference. Figure 1A For example, when the chip is tested and the elastic probes 13A and 13B disposed in the through-holes 1110A and 1110B transmit signals, the shielding member 113A inserted in the groove 1112A disposed between the two through-holes 1110A and 1110B can effectively shield the signal from interference.

[0120] refer to Figures 2A to 2E . Figure 2A is a perspective view of a socket assembly 21 according to some embodiments of the present disclosure. Figure 2B is another perspective view of the socket assembly 21 of some embodiments of the present disclosure, Figures 2C to 2E 2 is a cross-sectional view of a socket assembly 21 according to some embodiments of the present disclosure. Specifically, the socket assembly 21 includes a main body 211, a plurality of shielding members 213, and a plurality of elastic probes 23. The main body 211 has an upper surface 211S1 and a lower surface 211S2 opposite to the upper surface 211S1.

[0121] Please refer to Figures 2F to 2K . Figure 2F and Figure 2G is a perspective view of the main body 211 of some embodiments of the present disclosure, Figure 2H is another perspective view of the main body 211 of some embodiments of the present disclosure, Figures 2I to 2K2 is a cross-sectional view of a main body 211 according to some embodiments of the present disclosure. Specifically, the main body 211 may be block-shaped (e.g., a square block) and include multiple rows of first perforation arrays 2110AR1 and multiple rows of second perforation arrays 2110AR2. Each row of the first perforation array 2110AR1 includes multiple first perforations 2110-1, with the first perforations 2110-1 within the same row of the first perforation array 2110AR1 arranged along a first direction D23. Each row of the second perforation array 2110AR2 includes multiple second perforations 2110-2, with the second perforations 2110-2 within the same row of the second perforation array 2110AR2 arranged along a second direction D24. In these embodiments, the first direction D23 and the second direction D24 are substantially perpendicular, but this is not intended to limit the embodiments of the present disclosure. In some embodiments, a first through-hole 2110 - 1 and a second through-hole 2110 - 2 may be the same through-hole, and the first through-hole and the second through-hole are simply distinguished by the angles of different through-hole arrays.

[0122] On the other hand, the main body 211 has a plurality of first grooves 21120 and a plurality of second grooves 21122. Each first groove 21120 extends along the first direction D23, and one first groove 21120 is provided between any two adjacent rows of the first perforation arrays 2110AR1. Each second groove 21122 extends along the second direction D24, and one second groove 21122 is provided between any two adjacent rows of the second perforation arrays 2110AR2. In some embodiments, the first grooves 21120 and the second grooves 21122 are arranged in an alternating manner.

[0123] In some embodiments, the plurality of shielding members 213 include a plurality of first shielding members 2131 and a plurality of second shielding members 2133. The plurality of first shielding members 2131 are inserted into the plurality of first grooves 21120 from the upper surface 211S1 into the interior of the main body 211, and the first shielding members 2131 and the first grooves 21120 are arranged one-to-one. The plurality of second shielding members 2133 are inserted into the plurality of second grooves 21122 from the upper surface 211S1 into the interior of the main body 211, and the second shielding members 2133 and the second grooves 21122 are arranged one-to-one. The first shielding members 2131 and the second shielding members 2133 are arranged in an alternating manner. The plurality of first through-holes 2110-1 and the second through-holes 2110-2 are used to accommodate the plurality of elastic probes 23.

[0124] In some embodiments, each first shielding member 2131 has a first surface 2131S, and each second shielding member 2133 has a second surface 2133S. The first surface 2131S, the second surface 2133S, and the lower surface 211S2 face substantially the same direction. The first groove 21120 and the second groove 21122 have the same bottom surface 211S3 within the main body 211. The main body 211 has a thickness D25 between the bottom surface 211S3 and the lower surface 211S2. When the first shielding member 2131 is inserted into the corresponding slot, the first surface 2131S abuts the bottom surface 211S3 of the main body 211, and a first distance D21 is defined between the first surface 2131S and the lower surface 211S2. When the second shielding member 2133 is inserted into the corresponding slot, the second surface 2133S is adjacent to the bottom surface 211S3 of the main body 211, and a second distance D22 is defined between the second surface 2133S and the lower surface 211S2. In some embodiments, the thickness D25, the first distance D21, and the second distance D22 are the same.

[0125] In some embodiments, the two first grooves 21120 and the two second grooves 21122 form a tic-tac-toe pattern, and within a single tic-tac-toe pattern, each of the nine spaces is formed with a perforation (e.g., the first perforation 2110-1 or the second perforation 2110-2). With this structure, at least one groove (e.g., the first groove 21120 or the second groove 21122) is provided between any two adjacent perforations (e.g., the first perforation 2110-1 and the second perforation 2110-2). Furthermore, between any two adjacent perforations (e.g., the first perforation 2110-1 and the second perforation 2110-2), the elastic probes 23 are provided with: a first shielding member 2131 inserted into the first groove 21120; or a second shielding member 2133 inserted into the second groove 21122.

[0126] In some embodiments, the first groove 21120 has a first opening 21120X on the upper surface 211S1 of the main body 211 and a plurality of second openings 21120Y on the lower surface 211S2 of the main body 211. The second openings 21120Y are spaced apart along the extending direction of the first groove 21120, and each second opening 21120Y is smaller than the first opening 21120X. The first shield 2131 has a plurality of protrusions 2131P. When the first shield 2131 is inserted into the first groove 21120 through the first opening 21120X, the corresponding protrusions 2131P extend through the second openings 21120Y of the first groove 21120 and protrude from the lower surface 211S2 (i.e., the protrusions 2131P protrude outward from the lower surface 211S2).

[0127] In some embodiments, the second groove 21122 has a third opening 21122X on the upper surface 211S1 of the main body 211 and a plurality of fourth openings 21122Y on the lower surface 211S2 of the main body 211. The fourth openings 21122Y are spaced apart along the extending direction of the second groove 21122, and each fourth opening 21122Y is smaller than the third opening 21122X. The second shield 2133 has a plurality of protrusions 2133P. When the second shield 2133 is inserted into the second groove 21122 through the third opening 21122X, the corresponding protrusions 2133P extend through the fourth openings 21122Y of the second groove 21122 and protrude from the lower surface 211S2 (i.e., the protrusions 2133P protrude outward from the lower surface 211S2).

[0128] In some embodiments, each first protrusion 2131P of the first shield 2131 has a third surface 2131PS, and all third surfaces 2131PS are substantially coplanar. Each second protrusion 2133P of the second shield 2133 has a fourth surface 2133PS, and all fourth surfaces 2133PS are substantially coplanar. In some embodiments, all third surfaces 2131PS and all fourth surfaces 2133PS are substantially coplanar.

[0129] Please refer to Figure 2L , is a side view of the first shielding member 2131 and the second shielding member 2133 according to some embodiments of the present disclosure. Specifically, each first shielding member 2131 has a plurality of first joints 21310, and each second shielding member 2133 has a plurality of second joints 21330. When the first shielding members 2131 and the second shielding members 2133 are arranged in an alternating manner, the first joints 21310 receive the second shielding member 2133, and the second joints 21330 receive the first shielding member 2131.

[0130] In some embodiments, the first joint 21310 and the second joint 21330 are both grooves that engage with each other. It should be noted that in these embodiments, the depth of the groove at the first joint 21310 is approximately half the height of the first shielding member 2131, and the depth of the groove at the second joint 21330 is approximately half the height of the second shielding member 2133. Accordingly, when the heights of the first shielding member 2131 and the second shielding member 2133 are the same, the total height of the first and second shielding members 2131 and 2133 after engaging with each other is also the same as the original height of the first and second shielding members 2131 and 2133.

[0131] It should be noted that the aforementioned embodiment does not apply to the implementation of the first shielding member 2131 and the second shielding member 2133. In some embodiments, the height of the first shielding member 2131 is the same as the height of the second shielding member 2133. The depth of the groove at the first joint 21310 plus the depth of the groove at the second joint 21330 is approximately equal to the height of the first shielding member 2131 or the second shielding member 2133. In this way, the total height of the first shielding member 2131 and the second shielding member 2133 after being engaged with each other is also the same as the original height of the first shielding member 2131 or the second shielding member 2133. In some embodiments, the first shielding member 2131 and the second shielding member 2133 may also be formed as a single piece.

[0132] Thus, based on the structure of the socket assembly 21, when chip testing is performed and the spring probes 23 located within two adjacent through-holes (e.g., the first through-hole 2110-1 or the second through-hole 2110-2) are transmitting signals, the first shielding member 2131 inserted in the first groove 21120 or the second shielding member 2133 inserted in the second groove 21122 disposed between the two adjacent through-holes (e.g., the first through-hole 2110-1 and the second through-hole 2110-2) effectively shields the signals from interference. Furthermore, the protrusions 2131P and 2133P of the first and second shielding members 2131 and 2133 increase the shielding range between the spring probes 23, thereby enhancing shielding against signal interference.

[0133] Please refer to Figure 2A For example, when chip testing is performed and the elastic probes 23A and 23B placed in the through-holes 2110A and 2110B transmit signals, the second shielding member 2133A inserted in the second groove 21122A set between the two through-holes 2110A and 2110B can effectively shield signal interference, and the protrusion 2133P of the second shielding member 2133A can increase the shielding range.

[0134] Please refer to Figures 2M to 2O . Figure 2M is a perspective view of a socket assembly 21 ′ according to some embodiments of the present disclosure. Figure 2N is a cross-sectional view of a socket assembly 21' according to some embodiments of the present disclosure. Figure 2O This is another cross-sectional view of the socket assembly 21' according to some embodiments of the present disclosure. Specifically, the socket assembly 21' includes a circuit substrate 25, which is located on the upper surface 211S1 of the main body 211 and electrically connected to the elastic probe 23 to transmit test-related signals. The other end of the elastic probe 23 is used to contact the object under test (not shown). In some embodiments, the first shield 2131, the second shield 2133, and the circuit substrate 25 are electrically connected to form a ground loop.

[0135] In some embodiments, the receptacle assembly 21' includes a first shield 2131'. Compared to the first shield 2131, the first shield 2131' has a first fixing structure 2131F, and the circuit substrate 25 has a second fixing structure 251 that corresponds in shape to the first fixing structure 2131F. The engagement of the first fixing structure 2131F and the second fixing structure 251 allows for a more secure assembly of the first shield 2131' and the circuit substrate 25. It should be noted that in these embodiments, the first fixing structure 2131F is hook-shaped, and the second fixing structure 251 is slot-shaped corresponding to the hook. However, this is not intended to limit the embodiments of the present disclosure. In other embodiments, the second fixing structure 251 is hook-shaped, and the first fixing structure 2131F is slot-shaped corresponding to the hook. In some embodiments, the first fixing structure 2131F of the first shield 2131' and the second fixing structure 251 of the circuit substrate 25 are electrically connected to form a ground loop. Likewise, the second shielding member 2133 may also form the same fixing structure to be coupled to the circuit substrate 25 , which will not be further described herein.

[0136] Please refer to Figure 2P , which is Figure 2N A partially enlarged view of the portion of the second shielding member 2133 is shown. In some embodiments, a third distance D26 is defined between the end 2133E of the protrusion 2133P of the second shielding member 2133 and the lower surface 211S2 (i.e., between the third surface 2131PS and the lower surface 211S2). When the adjacent elastic probe 23 is accommodated in the corresponding through-hole, it has a fourth distance D27 from the lower surface 211S2. The fourth distance D27 is greater than the third distance D26, and the difference between the fourth distance D27 and the third distance D26 is greater than or equal to the compression stroke of the elastic probe 23. This prevents the elastic probe 23 from being stuck on the protrusion 2133P of the second shielding member 2133 after compression. Similarly, the first shielding member 2131 also has similar features to prevent the elastic probe 23 from being stuck on the protrusion 2131P of the first shielding member 2131 after compression. This will not be further described here.

[0137] refer to Figure 3 , is a three-dimensional diagram of a socket assembly 31 of some embodiments of the present disclosure. Specifically, the socket assembly 31 includes a main body 311 and a plurality of shielding members 313. The main body 311 has an upper surface 311S1. The main body 311 has a plurality of through-holes 3110 and a plurality of independent grooves 3112, and the grooves 3112 are not connected to each other. Among them, a groove 3112 is provided between any two adjacent through-holes 3110. The plurality of shielding members 313 are inserted into the plurality of grooves 3112. The plurality of through-holes 3110 are used to accommodate a plurality of elastic probes 33.

[0138] refer to Figure 4A, is a three-dimensional diagram of a socket assembly 41 according to some embodiments of the present disclosure. Specifically, the socket assembly 41 includes a main body 411 and a plurality of shielding members 413. The main body 411 has an upper surface 411S1. The main body 411 has a plurality of through-holes 4110 and a plurality of grooves 4112. Two grooves 4112 are provided between any two adjacent through-holes 4110. The plurality of shielding members 413 are inserted into the plurality of grooves 4112. The plurality of through-holes 4110 are used to accommodate a plurality of elastic probes 43.

[0139] refer to Figure 4B , is a perspective view of a socket assembly 41' according to some embodiments of the present disclosure. Specifically, the socket assembly 41' differs from the socket assembly 41 in that the grooves 4112 and shielding members 413 of the socket assembly 41' are spaced apart, which also achieves a shielding effect.

[0140] In some embodiments, the width of each groove in the aforementioned embodiments is less than the thickness of the corresponding spring probe. In some embodiments, the body of the aforementioned embodiments comprises an insulating material to isolate electrical contact between the spring probes, and the body can be integrally formed (e.g., by injection molding) into a solid block having perforations and grooves. In some embodiments, the shield comprises a metal material (e.g., a conductive metal material) to shield against signal interference.

[0141] It should be noted that in the aforementioned embodiments, a shielding member is provided between any two elastic probes. However, this is not intended to limit the implementation of the present disclosure. Those skilled in the art should understand that in some embodiments, not every signal generated by an elastic probe needs to be shielded. Therefore, a shielding member can be provided between the elastic probes that need to be shielded (for example, elastic probes used to detect high-frequency signals).

[0142] It should be noted that in the aforementioned embodiments, for the purpose of simplicity and clarity, only a single element is marked on the drawings for some repetitive elements. However, this is not intended to limit the implementation of the present disclosure. Those skilled in the art should be able to understand the multiple repetitive elements shown in the drawings.

[0143] In summary, the socket assembly of the embodiment of the present disclosure generates a shielding effect between different elastic probes through its embedded shielding member, thereby reducing signal interference during the test process, thereby more effectively improving the stability and accuracy of the test.

[0144] Although the present disclosure and its advantages have been described in detail, it should be understood that various changes, substitutions and replacements can be made without departing from the spirit and scope of the present disclosure as defined in the claims. For example, many of the above processes can be implemented in different ways, and many of the above processes can be replaced by other processes or combinations thereof.

[0145] Furthermore, the scope of the present disclosure is not limited to the specific embodiments of the processes, machines, manufacture, compositions of matter, means, methods, and steps described in the specification. Those skilled in the art will understand from the disclosure herein that existing or future developed processes, machines, manufacture, compositions of matter, means, methods, or steps that function the same as or achieve substantially the same results as the corresponding embodiments described herein may be used in accordance with the present disclosure. Accordingly, such processes, machines, manufacture, compositions of matter, means, methods, or steps are intended to be encompassed within the claims of the present disclosure.

Claims

1. A socket assembly for a chip test socket, the socket assembly comprising: A subject having: an upper surface; a lower surface, the lower surface being arranged corresponding to the upper surface; a plurality of first perforated arrays, wherein Each first perforation array includes a plurality of first perforations, and the plurality of first perforations are arranged along a first direction; a plurality of second perforation arrays, wherein each second perforation array comprises a plurality of second perforations, and the plurality of second perforations are arranged along a second direction; a plurality of first grooves, each of which extends along the first direction, wherein one first groove is provided between any two adjacent first perforation arrays; and a plurality of second grooves, each second groove extending along the second direction, wherein one second groove is provided between any two adjacent second perforation arrays; A plurality of first shielding members, each of the first shielding members having a first surface, the plurality of first shielding members being inserted into the plurality of first grooves from the upper surface; a plurality of second shielding members, each second shielding member having a second surface, the plurality of second shielding members being inserted into the plurality of second grooves from the upper surface; and A plurality of elastic probes, disposed in the plurality of first through-holes and the plurality of second through-holes; wherein the first surfaces of the first shielding members are spaced from the lower surface by a first distance; Wherein, the second surfaces of the second shielding elements have a second distance from the lower surface.

2. The socket assembly according to claim 1, wherein: The plurality of first surfaces are coplanar, and the plurality of second surfaces are coplanar.

3. The socket assembly according to claim 2, wherein: The plurality of first surfaces are coplanar with the plurality of second surfaces.

4. The socket assembly according to claim 1, wherein: The first spacing and the second spacing have the same value.

5. The socket assembly according to claim 1, wherein: The first direction is perpendicular to the second direction, the plurality of first grooves are arranged alternately with the plurality of second grooves, and the plurality of first shielding members are arranged alternately with the plurality of second shielding members.

6. The socket assembly according to claim 5, wherein: Each first shield has a plurality of first junctions that receive the plurality of second shields.

7. The socket assembly according to claim 6, wherein: Each second shield has a plurality of second joints that receive the plurality of first shields.

8. The socket assembly according to claim 1, wherein: Each first groove has a first opening on the upper surface of the main body, and each first groove has a plurality of second openings on the lower surface of the main body, wherein a size of each second opening is smaller than that of the first opening; and Each second groove has a third opening on the upper surface of the main body, and each second groove has a plurality of fourth openings on the lower surface of the main body, wherein a size of each fourth opening is smaller than that of the third opening.

9. The socket assembly according to claim 8, wherein: At least one of the first shielding elements has a plurality of first protrusions, and the first protrusions are respectively disposed through the second openings of the corresponding first grooves, and the first protrusions protrude from the lower surface.

10. The socket assembly according to claim 9, wherein: At least one of the second shielding elements has a plurality of second protrusions, and the second protrusions are respectively disposed through the corresponding fourth openings of the second grooves, and the second protrusions protrude from the lower surface.

11. The socket assembly according to claim 10, wherein: The ends of the multiple first protrusions and the multiple second protrusions have a third distance from the lower surface. When a first elastic probe of the multiple elastic probes is accommodated in the corresponding through-hole, the end of the first elastic probe has a fourth distance from the lower surface. The difference between the fourth distance and the third distance is greater than or equal to the compression stroke of the first elastic probe.

12. The socket assembly according to claim 10, wherein: Each first protrusion has a third surface, and the third surfaces are coplanar. Each second protrusion has a fourth surface, and the fourth surfaces are coplanar.

13. The socket assembly according to claim 12, wherein: The plurality of third surfaces are coplanar with the plurality of fourth surfaces.

14. The socket assembly according to claim 1, further comprising: a circuit substrate, disposed on the upper surface of the main body; in, The plurality of first shielding components and the plurality of second shielding components are electrically connected to the circuit substrate to form a ground loop.

15. The socket assembly of claim 1, further comprising: a circuit substrate, disposed on the upper surface of the main body, in, The plurality of first shielding members and the plurality of second shielding members have a plurality of first fixing structures that are engaged with a plurality of second fixing structures of the circuit substrate.

16. The socket assembly according to claim 15, wherein: The plurality of first fixing structures are electrically connected to the plurality of second fixing structures.

17. The socket assembly according to claim 1, wherein: The width of each first groove and each second groove is smaller than the thickness of an elastic probe.

18. The socket assembly according to claim 1, wherein: The main body is formed of an insulating material, and the materials of the plurality of first shielding members and the plurality of second shielding members include a conductive metal material.

19. The socket assembly according to claim 1, wherein: The plurality of first grooves and the plurality of second grooves have a same bottom surface in the main body, and the main body has a thickness between the bottom surface and the lower surface of the main body.

20. A socket assembly comprising: A subject having: A plurality of perforations, wherein The plurality of through-holes of at least one first portion form a plurality of first through-hole arrays, and the plurality of through-holes of at least one second portion form a plurality of second through-hole arrays; as well as A plurality of grooves, wherein at least a first portion of the plurality of grooves are disposed between any two adjacent first perforation arrays, and at least a second portion of the plurality of grooves are disposed between any two adjacent second perforation arrays; a plurality of shielding members inserted into the plurality of grooves; and A plurality of elastic probes are disposed in the plurality of through holes.

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