Storage device data protection method, electronic device and storage medium

Abstract

The invention discloses a data protection method for a storage device, an electronic device and a storage medium, and relates to the technical field of data protection. Obtaining access exception parameters based on the data storage features; storing the data into a protection storage database based on the access exception parameters; acquiring new speed data and a new comparison area, and performing storage and exception protection on the data newly stored in the storage device; according to the present invention, in the existing storage device data protection method, when the data is stored in the storage device, i.e., the data is abnormal, the data has a data security risk in the process from the storage device to the warning information protection; therefore, the problem that the data which are stored in the storage device and have data security risks cannot be comprehensively, timely and effectively protected is solved.

Description

Technical Field

[0001] The present invention relates to the field of data protection technology, and in particular to a storage device data protection method, electronic device, and storage medium. Background Art

[0002] Storage devices refer to hardware devices used to store digital information. They write, save, and read data through electrical, magnetic, or optical means. They are indispensable core components in computer systems. Storage device data protection refers to the use of a series of technologies and measures to protect data in storage devices from unauthorized access, destruction, or loss. This includes physical security, access control, data encryption, redundant storage, fault-tolerant technology, and other aspects. Existing storage device data protection measures typically include access control, data encryption, firewalls, and multi-factor authentication.

[0003] Existing methods for data protection of storage devices are generally based on the signal density points and density features corresponding to the working parameters of each component in the data storage device and the transmission parameters at each moment, to obtain abnormal values ​​corresponding to the warning information for data protection, thereby realizing data security protection. Although this improved method can detect from two aspects of device operation and data transmission, thereby improving data security, the time interval between the data being stored in the storage device and the acquisition of the warning information is long due to the large amount of data. As a result, when the data is stored in the storage device and there is an abnormality, there is a risk of data damage or data leakage in the process from the storage device to the protection of the warning information, thereby failing to comprehensively, timely and effectively protect the data stored in the storage device and having data security risks. For example, in the patent application No. CN1165 Patent application No. 22386A discloses an e-commerce data protection method and server using artificial intelligence. The solution is to obtain the working parameters of each component in the data storage device, determine and generate a first abnormal value, determine a second abnormal value based on the signal density points and their density characteristics at each moment, and generate a warning message based on the second abnormal value and the first abnormal value. Other improvements for storage device data protection are usually improvements in data leakage and multi-layer data protection. They still cannot solve the problem that when an abnormality occurs when data is stored in the storage device, there is a risk of data damage or data leakage in the process from storage to protection by warning information, thereby failing to provide comprehensive, timely and effective protection for data stored in the storage device and with data security risks. In view of this, it is necessary to improve the existing storage device data protection method. Summary of the Invention

[0004] The present invention aims to solve at least one of the technical problems in the prior art to a certain extent, by proposing a storage device data protection method, an electronic device and a storage medium, so as to solve the problem in the existing storage device data protection method that when an abnormality occurs when data is stored in the storage device, there is a data security risk in the process from the time the data is stored in the storage device to the time it is protected by warning information, and thus the data stored in the storage device and which has data security risks cannot be comprehensively, timely and effectively protected.

[0005] To achieve the above objectives, in a first aspect, the present application provides a storage device data protection method, comprising the following steps:

[0006] Performing device analysis on the storage device and obtaining data storage characteristics of the storage device based on the analysis results; recording the data stored in the storage device as device data; obtaining normal data and abnormal data of the device data based on the data storage characteristics, obtaining normal device characteristics based on the normal data of the device data, and obtaining abnormal device characteristics based on the abnormal data of the device data;

[0007] Acquire access exception parameters of the storage device based on the normal characteristics of the device and the abnormal characteristics of the device; establish a protection storage database, and store data in the storage device into the protection storage database based on the access exception parameters, wherein the protection storage database includes a normal storage library and an abnormal protection library;

[0008] New speed data and a new comparison area corresponding to the data newly stored in the storage device are obtained, and the data newly stored in the storage device are stored and protected from abnormalities based on the new speed data and the new comparison area.

[0009] Furthermore, the equipment analysis includes:

[0010] Back up the data in the storage device and then clear it, and record the maximum storage capacity allowed by the storage device as G, and record the backed-up data as backup storage data; obtain the storage capacity occupied by each data in the backup storage data, and record the maximum and minimum values ​​as gmax and gmin respectively;

[0011] The value of gmax minus gmin is recorded as gcz, and the amount of data in the backup storage data is recorded as f; the value of gcz divided by f is recorded as the data density; the value of G minus gmax is recorded as Gcs, the value of Gcs divided by the data density and rounded up is recorded as the high-density data volume, and the value of gmin divided by the data density and rounded up is recorded as the low-density data volume;

[0012] Establish a database and record it as the device analysis library, and store all backup storage data in the device analysis library; randomly obtain low-density data whose storage capacity is less than gmin and greater than 0, and store it in the device analysis library; randomly obtain high-density data whose storage capacity is less than or equal to G and greater than gmax, and store it in the device analysis library;

[0013] Based on the storage capacity occupied by all data in the device analysis library from small to large, data storage tests are performed on all data in the device analysis library in turn, and based on the data storage test results, the storage feature area corresponding to the storage capacity occupied by all data in the device analysis library is obtained.

[0014] Furthermore, data storage testing includes:

[0015] For any data A undergoing data storage testing, the storage capacity occupied by data A is recorded as R, the file type allowed to be stored in the storage device is recorded as the storage type, and the number of storage types is recorded as K. Based on the web crawler, K data with different file types and storage types and the same storage capacity of R are obtained and recorded as storage test data;

[0016] Each storage test data is stored in the cleared storage device in turn, and the data corresponding to the storage speed during each storage is recorded as the storage data of each storage test data.

[0017] Furthermore, data storage testing also includes:

[0018] Establish a plane rectangular coordinate system, recorded as the storage analysis coordinate system, wherein the unit of the X-axis of the storage analysis coordinate system is s, and the unit of the Y-axis is MB / s; for any stored data: record the total time for storing the test data in the stored data into the storage device as T, and record the value of T rounded down as T1; for any positive integer C less than or equal to T1 and greater than or equal to 1, record the average storage speed between C-1 and C during the process of storing the test data in the stored data into the storage device as V, and record the point (C, V) in the storage analysis coordinate system as the storage point; obtain all storage points corresponding to the horizontal coordinates from 1 to T1 in the storage analysis coordinate system, and record the curve obtained by fitting all the storage points as the storage analysis curve, wherein the horizontal coordinates of the rightmost point and the leftmost point of the storage analysis curve are T and 0, respectively;

[0019] Obtain the stored analysis curves corresponding to all stored data, and place all stored analysis curves in the same stored analysis coordinate system; mark the horizontal coordinate of the rightmost point of all stored analysis curves in the stored analysis coordinate system as T2, where T2 is a positive number greater than or equal to T.

[0020] Furthermore, data storage testing also includes:

[0021] For any value t stored in the analysis coordinate system that is less than or equal to T2 and greater than or equal to 0, record the point with the smallest ordinate and the point with the largest ordinate among the intersections of X=t and all stored analysis curves as the region valley point and region vertex, respectively; obtain the region valley points and region vertices of all values ​​stored in the analysis coordinate system that are less than or equal to T2 and greater than or equal to 0, and record the curve formed by all region valley points as the valley point curve, and record the curve formed by all region vertices as the vertex curve;

[0022] The closed area enclosed by the vertex curve, valley curve, X=T2 and X=0 is recorded as the stored feature area of ​​R;

[0023] Obtain the storage capacity occupied by all data in the device analysis library, and based on the acquisition method of the storage feature area of ​​R, obtain the storage feature area corresponding to each occupied storage capacity;

[0024] The stored characteristic areas corresponding to all occupied storage amounts are recorded as data storage characteristics of the storage device.

[0025] Furthermore, obtaining normal data and abnormal data of the device data based on the data storage characteristics, obtaining normal features of the device based on the normal data of the device data, and obtaining abnormal features of the device based on the abnormal data of the device data include:

[0026] The backup storage data is stored in the storage device again, and the storage speed of each data in the backup storage data when it is stored in the storage device is recorded, and recorded as speed data corresponding to each data;

[0027] For any data α in the backup storage data: record the storage capacity occupied by data α as B, and record the stored feature area corresponding to B in the data storage feature as the standard comparison area;

[0028] Draw a curve corresponding to the speed data of data α in the stored analysis coordinate system and record it as a comparison curve; when the comparison curve is completely in the standard comparison area, record the data α as normal data; when the comparison curve is not completely in the standard comparison area, record the data α as abnormal data;

[0029] All normal data and all abnormal data in the backup storage data are obtained, and the array corresponding to the storage occupied by all normal data is recorded as the normal feature of the device, and the array corresponding to the storage occupied by all abnormal data is recorded as the abnormal feature of the device.

[0030] Furthermore, obtaining access abnormality parameters of the storage device based on the normal characteristics of the device and the abnormal characteristics of the device; establishing a protection storage database, and storing data in the storage device into the protection storage database based on the access abnormality parameters includes:

[0031] Will Denoted as access exception parameter, where q1 and q2 are the number of values ​​in the array corresponding to the normal characteristics of the device and the abnormal characteristics of the device, respectively. i is the ith value in the general characteristics of the device, Q j is the jth value in the device abnormality feature;

[0032] The normal data is stored in the normal storage library, the abnormal data is stored in the abnormal protection library, and the abnormal protection library is encrypted using the access abnormality parameter.

[0033] Furthermore, obtaining new speed data and a new comparison area corresponding to the data newly stored in the storage device, and storing and performing abnormal protection on the data newly stored in the storage device based on the new speed data and the new comparison area includes:

[0034] For any data β newly stored in the storage device, when the data β is stored in the storage device, the storage speed of the data β during the storage process will be recorded and recorded as the new speed data;

[0035] After the data β is stored in the storage device, the storage capacity occupied by the data β is recorded as L, and the stored feature area with the smallest difference between the occupied storage capacity and L among all the stored feature areas in the data storage feature is recorded as the new comparison area;

[0036] Draw the curve corresponding to the new velocity data in the stored analysis coordinate system and record it as the new comparison curve; when the new comparison curve is completely in the new comparison area, record the data β as regular data and store it in the regular database;

[0037] When the new alignment curve is not completely in the new alignment area, the data β is recorded as abnormal data and stored in the abnormal protection library.

[0038] In a second aspect, the present application provides an electronic device comprising a processor and a memory, wherein the memory stores computer-readable instructions. When the computer-readable instructions are executed by the processor, the steps in the above method are performed.

[0039] In a third aspect, the present application provides a storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps in the above method are performed.

[0040] Beneficial effects of the present invention: The present application first performs device analysis on a storage device, and obtains data storage characteristics of the storage device based on the analysis results; records the data stored in the storage device as device data; obtains normal data and abnormal data of the device data based on the data storage characteristics, obtains normal device characteristics based on the normal data of the device data, and obtains abnormal device characteristics based on the abnormal data of the device data. The advantage of this is that by obtaining data storage characteristics based on device analysis, the corresponding storage characteristics of the storage device when storing data of different sizes and types can be obtained, which helps to effectively distinguish data stored in the storage device and having storage anomalies in subsequent analysis, so as to obtain normal device characteristics and abnormal device characteristics for subsequent data protection;

[0041] The present application also obtains access exception parameters of the storage device based on the normal characteristics of the device and the abnormal characteristics of the device; establishes a protective storage database, and stores the data in the storage device into the protective storage database based on the access exception parameters; finally, obtains the new speed data and the new comparison area corresponding to the data newly stored in the storage device, and stores and performs abnormal protection on the data newly stored in the storage device based on the new speed data and the new comparison area. The advantage of this is that by obtaining the access exception parameters and establishing a protective storage database, the data stored in the storage device and having data security risks can be protected in a timely and effective manner after being stored in the storage device by encrypting the database, thereby providing an effective transition for subsequent data protection, and preventing the problem of data security risks due to lack of data protection during the process of being stored in the storage device and not obtaining warning information. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1 is a flow chart of the steps of the method of the present invention;

[0043] Figure 2 A schematic diagram of obtaining a stored feature area according to the present invention;

[0044] Figure 3 Schematic diagram of the structure of the electronic device of the present invention. DETAILED DESCRIPTION

[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0046] Example 1, please refer to Figure 1 As shown, the present application provides a storage device data protection method, comprising the following steps:

[0047] Step S1, performing device analysis on the storage device and obtaining data storage characteristics of the storage device based on the analysis results; recording the data stored in the storage device as device data; obtaining normal data and abnormal data of the device data based on the data storage characteristics, obtaining normal device characteristics based on the normal data of the device data, and obtaining abnormal device characteristics based on the abnormal data of the device data;

[0048] Step S1 includes: Step S101, device analysis includes: Step S1011, backing up the data in the storage device and then clearing it, and recording the maximum storage capacity allowed by the storage device as G, and recording the backed up data as backup storage data; obtaining the storage capacity occupied by each data in the backup storage data, and recording the maximum value and minimum value as gmax and gmin respectively;

[0049] Step S1012: record the value of gmin minus gmax as gcz, and the amount of data in the backup storage data as f; record the value of gcz divided by f as the data density; record the value of g minus gmax as Gcs, and round up the value of Gcs divided by the data density as the high-density data volume; and round up the value of gmin divided by the data density as the low-density data volume.

[0050] In this embodiment, for example, during a data analysis, the maximum storage capacity allowed by the storage device is 1000MB, and the storage capacity occupied by each data in the obtained backup storage data is 10MB, 50MB, 100MB, 20MB, and 500MB, respectively. Then, through analysis, it can be obtained that gmax is 500MB, gmin is 10MB, and f is 5; then gcz is 490MB, the data density is 98, and Gcs is 500MB; the high-density data volume is 6, and the low-density data volume is 1;

[0051] Step S1013: Establish a database and record it as the device analysis database. Store all backup storage data in the device analysis database. Randomly obtain low-density data whose storage space is less than gmin and greater than 0 and store it in the device analysis database. Randomly obtain high-density data whose storage space is less than or equal to G and greater than gmax and store it in the device analysis database.

[0052] In the specific implementation process, in addition to storing backup storage data in the device analysis library, low-density data with a storage capacity less than gmin and greater than 0, and high-density data with a storage capacity less than or equal to G and greater than gmax are also stored. The purpose is to enrich the scope of data storage features and ensure that the obtained data storage features are obtained by combining various storage situations in the storage device, so that the subsequent storage device can use the data storage features for data protection when storing files of different sizes.

[0053] Step S1014: performing a data storage test on all the data in the device analysis library in ascending order of the storage capacity occupied by all the data in the device analysis library, and obtaining a storage feature area corresponding to the storage capacity occupied by all the data in the device analysis library based on the data storage test result;

[0054] Step S102, the data storage test includes: Step S1021, for any data A undergoing the data storage test, the storage capacity occupied by the data A is recorded as R, the file type allowed to be stored in the storage device is recorded as the storage type, and the number of storage types is recorded as K; K data of different file types and storage types and each occupying R storage capacity are obtained using a web crawler, and recorded as storage test data;

[0055] In a specific implementation process, for example, in a data analysis, the value of R is 10MB, and the file types allowed to be stored in the storage device include .txt, .jpg, .gif, .wav, and .mp4. Then, through analysis, it can be obtained that the value of K is 5. K storage types with different file types can be obtained through a web crawler, namely, .txt, .jpg, .gif, .wav, and .mp4, and the storage capacity is 10MB. These data are recorded as storage test data;

[0056] Step S1022, storing each stored test data into the cleared storage device in sequence, and recording the data corresponding to the storage speed during each storage, which is recorded as the stored data of each stored test data;

[0057] Step S1023, establish a plane rectangular coordinate system, recorded as the storage analysis coordinate system, wherein the unit of the X-axis of the storage analysis coordinate system is s, and the unit of the Y-axis is MB / s; for any stored data: record the total time for storing the test data in the stored data into the storage device as T, and record the value of T rounded down as T1; for any positive integer C less than or equal to T1 and greater than or equal to 1, record the average value of the storage speed between C-1 and C during the process of storing the test data in the stored data into the storage device as V, and record the point (C, V) in the storage analysis coordinate system as the storage point; obtain all the storage points corresponding to the horizontal coordinates from 1 to T1 in the storage analysis coordinate system, and record the curve obtained by fitting all the storage points as the storage analysis curve, wherein the horizontal coordinates of the rightmost point and the leftmost point of the storage analysis curve are T and 0 respectively;

[0058] In a specific implementation, when obtaining V, V can be obtained by dividing the time period between C-1 and C. For example, when C is 4 seconds, the time period between 3 seconds and 4 seconds can be evenly divided into 10 time periods, and the storage speed corresponding to the center point of each time period is obtained. The average of the storage speeds of all the center points corresponding to the 10 time periods is recorded as the average of the storage speeds between 3 seconds and 4 seconds, thereby obtaining the value corresponding to V;

[0059] Step S1024: Obtain the stored analysis curves corresponding to all stored data, and place all stored analysis curves in the same stored analysis coordinate system; mark the rightmost point of all stored analysis curves in the stored analysis coordinate system as T2, where T2 is a positive number greater than or equal to T;

[0060] Step S1025: For any value t stored in the analysis coordinate system that is less than or equal to T2 and greater than or equal to 0, record the point with the smallest ordinate and the point with the largest ordinate among the intersections of X=t and all stored analysis curves as a region valley point and a region vertex, respectively; obtain the region valley points and region vertices of all values ​​stored in the analysis coordinate system that are less than or equal to T2 and greater than or equal to 0, and record the curve formed by all the region valley points as a valley point curve, and record the curve formed by all the region vertices as a vertex curve;

[0061] In the specific implementation process, for example, in a data analysis, T2 is 400s, and the obtained stored analysis coordinate system is as follows Figure 2 As shown, CF1 to CF5 are all stored analysis curves. For X=300s, point QG and point QD are the valley point and vertex of the region corresponding to 300s respectively. Through analysis, it can be obtained that GD and DD are the valley point curve and vertex curve respectively, and region CT is the stored feature region;

[0062] Step S1026, record the closed area enclosed by the vertex curve, the valley curve, X=T2, and X=0 as the stored feature area of ​​R;

[0063] Step S1027, obtaining the storage capacity occupied by all data in the device analysis library, and based on the method for obtaining the stored feature area of ​​R, obtaining the stored feature area corresponding to each occupied storage capacity;

[0064] In the specific implementation process, the purpose of obtaining the storage feature area is to obtain the area corresponding to the storage speed of the data corresponding to each occupied storage amount when it is stored in the storage device, which helps to effectively identify data with abnormalities in the storage process;

[0065] Step S1028: Record the stored characteristic areas corresponding to all occupied storage amounts as data storage characteristics of the storage device;

[0066] During the specific implementation process, by obtaining data storage characteristics, the corresponding storage characteristics of the storage device when storing data of different sizes and types can be obtained, which helps to effectively distinguish the data stored in the storage device and with storage anomalies in subsequent analysis, so as to obtain the device's regular characteristics and device abnormal characteristics for subsequent data protection.

[0067] Step S1 further includes: step S103, re-storing the backup storage data into the storage device, and recording the storage speed of each data in the backup storage data when it is stored into the storage device, and recording it as speed data corresponding to each data;

[0068] Step S104: for any data α in the backup storage data: record the storage capacity occupied by the data α as B, and record the stored feature area corresponding to B in the data storage feature as the standard comparison area;

[0069] In a specific implementation process, when there is no storage feature area corresponding to B in the data storage feature, the storage feature areas in the data storage feature can be screened, and the storage feature area with the smallest difference between the corresponding occupied storage amount and B is recorded as the standard comparison area;

[0070] Step S105: Draw a curve corresponding to the velocity data of data α in the stored analysis coordinate system and record it as a comparison curve; when the comparison curve is completely within the standard comparison area, record the data α as normal data; when the comparison curve is not completely within the standard comparison area, record the data α as abnormal data;

[0071] Step S106, obtaining all normal data and all abnormal data in the backup storage data, and recording the array corresponding to the storage volume occupied by all normal data as the normal feature of the device, and recording the array corresponding to the storage volume occupied by all abnormal data as the abnormal feature of the device;

[0072] In a specific implementation, for example, during a data processing, the storage capacity occupied by all regular data is 10MB, 50MB, 100MB, 20MB, and 500MB respectively, and the regular feature of the device is [10, 50, 100, 20, 500].

[0073] Step S2: obtaining access anomaly parameters of the storage device based on the normal characteristics and abnormal characteristics of the device; establishing a protection storage database, and storing the data in the storage device into the protection storage database based on the access anomaly parameters, wherein the protection storage database includes a normal storage library and an abnormal protection library;

[0074] Step S2 includes: Step S201, Denoted as access exception parameter, where q1 and q2 are the number of values ​​in the array corresponding to the normal characteristics of the device and the abnormal characteristics of the device, respectively. i is the ith value in the general characteristics of the device, Q j is the jth value in the device abnormality feature;

[0075] In a specific implementation process, for example, when processing data sequentially, the obtained device normal characteristics are [10, 50, 100, 20, 500], and the device abnormal characteristics are [70, 150]. Then, the values ​​of q1 and q2 are 5 and 2, respectively. By calculating, it can be obtained that the access abnormality parameter is 260. By obtaining the access abnormality parameter based on the device normal characteristics and the device abnormal characteristics, it can be ensured that the parameters used to encrypt the abnormality protection library are parameters associated with the normal data and abnormal data in the storage device, so that the abnormal access parameters can be effectively updated in real time after data changes occur in the storage device, thereby improving the stability and security of data protection.

[0076] Step S202: storing regular data in a regular storage library, storing abnormal data in an abnormal protection library, and encrypting the abnormal protection library using access abnormality parameters.

[0077] Step S3: obtaining new speed data and a new comparison area corresponding to the data newly stored in the storage device, and storing and protecting the data newly stored in the storage device from abnormalities based on the new speed data and the new comparison area.

[0078] In this embodiment, the abnormality protection is the protection of the database, that is, the data is stored in the abnormality protection library and the abnormality protection library is encrypted, thereby realizing the protection of the data;

[0079] Step S3 includes: step S301, for any data β newly stored in the storage device, when the data β is stored in the storage device, the storage speed of the data β during the storage process is recorded and recorded as new speed data;

[0080] Step S302: After the data β is stored in the storage device, the storage capacity occupied by the data β is recorded as L, and the stored feature region with the smallest difference between the occupied storage capacity and L among all the stored feature regions in the data storage feature is recorded as a new comparison region;

[0081] In a specific implementation, for example, if the value of L is 40MB, and the corresponding occupied storage amounts of all stored feature areas in the data storage feature are 10MB, 50MB, 100MB, 20MB, and 500MB respectively, then the stored feature area corresponding to 50MB can be recorded as the new comparison area;

[0082] Step S303: Draw a curve corresponding to the new velocity data in the stored analysis coordinate system and record it as a new alignment curve; when the new alignment curve is completely within the new alignment area, record the data β as regular data and store it in a regular database;

[0083] Step S304: When the new comparison curve is not completely within the new comparison area, the data β is recorded as abnormal data and stored in the abnormality protection library.

[0084] Example 2, please refer to Figure 3 As shown, Figure 3 The present invention provides a structural schematic diagram of an electronic device, which may include: a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other via the communication bus. The memory stores computer-readable instructions, and the processor can call the instructions in the memory. When the computer-readable instructions are executed by the processor, the steps of a storage device data protection method are executed to implement the following functions: first, a device analysis is performed on the storage device, and data storage characteristics of the storage device are obtained based on the analysis results; the data stored in the storage device is recorded as device data; normal data and abnormal data of the device data are obtained based on the data storage characteristics, and normal device characteristics are obtained based on the normal data of the device data, and abnormal device characteristics are obtained based on the abnormal data of the device data; then, access anomaly parameters of the storage device are obtained based on the normal device characteristics and the abnormal device characteristics; a protection storage database is established, and data in the storage device is stored in the protection storage database based on the access anomaly parameters; finally, new speed data and a new comparison area corresponding to the data newly stored in the storage device are obtained, and the data newly stored in the storage device are stored and protected against anomalies based on the new speed data and the new comparison area.

[0085] In addition, the logical instructions in the above-mentioned memory can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application, or the part that contributes to the existing technology, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, and other media that can store program code.

[0086] Example 3. The present application also provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute a storage device data protection method provided by the above methods, the method including: first, performing a device analysis on the storage device, and obtaining the data storage characteristics of the storage device based on the analysis results; recording the data stored in the storage device as device data; obtaining normal data and abnormal data of the device data based on the data storage characteristics, and obtaining normal device characteristics based on the normal data of the device data, and obtaining abnormal device characteristics based on the abnormal data of the device data; then obtaining access abnormality parameters of the storage device based on the normal device characteristics and the abnormal device characteristics; establishing a protection storage database, and storing the data in the storage device into the protection storage database based on the access abnormality parameters; finally, obtaining new speed data and new comparison area corresponding to the data newly stored in the storage device, and storing and performing abnormality protection on the data newly stored in the storage device based on the new speed data and the new comparison area.

[0087] Example 4. The present application also provides a computer-readable storage medium. The present application provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps in the above storage device data protection method are executed to achieve the following functions: first, the storage device is analyzed, and the data storage characteristics of the storage device are obtained based on the analysis results; the data stored in the storage device is recorded as device data; the normal data and abnormal data of the device data are obtained based on the data storage characteristics, and the normal characteristics of the device are obtained based on the normal data of the device data, and the abnormal characteristics of the device are obtained based on the abnormal data of the device data; then, the access abnormality parameters of the storage device are obtained based on the normal characteristics of the device and the abnormal characteristics of the device; a protection storage database is established, and the data in the storage device is stored in the protection storage database based on the access abnormality parameters; finally, the new speed data and the new comparison area corresponding to the data newly stored in the storage device are obtained, and the data newly stored in the storage device are stored and protected from abnormalities based on the new speed data and the new comparison area.

[0088] Through the description of the above embodiments, the embodiments of the present invention can be provided as methods, systems, or computer program products. Based on this understanding, the essence of the above technical solutions or the portion that contributes to the prior art can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, or an optical disk, and includes a number of instructions for enabling a computer device (such as a personal computer, server, or network device) to execute the methods described in various embodiments or certain portions of the embodiments.

[0089] In the embodiments provided in this application, it should be understood that the disclosed system or method can be implemented in other ways. The embodiments described above are merely illustrative. For example, the division of modules or units is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of systems, modules and units can be electrical, mechanical or other forms.

[0090] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A storage device data protection method, characterized in that: The steps include: Performing device analysis on the storage device and obtaining data storage characteristics of the storage device based on the analysis results; recording the data stored in the storage device as device data; obtaining normal data and abnormal data of the device data based on the data storage characteristics, obtaining normal device characteristics based on the normal data of the device data, and obtaining abnormal device characteristics based on the abnormal data of the device data; Acquire access exception parameters of the storage device based on the normal characteristics of the device and the abnormal characteristics of the device; establish a protection storage database, and store data in the storage device into the protection storage database based on the access exception parameters, wherein the protection storage database includes a normal storage library and an abnormal protection library; New speed data and a new comparison area corresponding to the data newly stored in the storage device are obtained, and the data newly stored in the storage device are stored and protected from abnormalities based on the new speed data and the new comparison area.

2. A storage device data protection method according to claim 1, characterized in that: Equipment analysis includes: Back up the data in the storage device and then clear it, and record the maximum storage capacity allowed by the storage device as G, and record the backed-up data as backup storage data; obtain the storage capacity occupied by each data in the backup storage data, and record the maximum and minimum values ​​as gmax and gmin respectively; The value of gmax minus gmin is recorded as gcz, and the amount of data in the backup storage data is recorded as f; the value of gcz divided by f is recorded as the data density; the value of G minus gmax is recorded as Gcs, the value of Gcs divided by the data density and rounded up is recorded as the high-density data volume, and the value of gmin divided by the data density and rounded up is recorded as the low-density data volume; Establish a database and record it as the device analysis library, and store all backup storage data in the device analysis library; randomly obtain low-density data whose storage capacity is less than gmin and greater than 0, and store it in the device analysis library; randomly obtain high-density data whose storage capacity is less than or equal to G and greater than gmax, and store it in the device analysis library; Based on the storage capacity occupied by all data in the device analysis library from small to large, data storage tests are performed on all data in the device analysis library in turn, and based on the data storage test results, the storage feature area corresponding to the storage capacity occupied by all data in the device analysis library is obtained.

3. A storage device data protection method according to claim 2, characterized in that: Data storage testing includes: For any data A undergoing data storage testing, the storage capacity occupied by data A is recorded as R, the file type allowed to be stored in the storage device is recorded as the storage type, and the number of storage types is recorded as K. Based on the web crawler, K data with different file types and storage types and the same storage capacity of R are obtained and recorded as storage test data; Each storage test data is stored in the cleared storage device in turn, and the data corresponding to the storage speed during each storage is recorded as the storage data of each storage test data.

4. A storage device data protection method according to claim 3, characterized in that: Data storage testing also includes: Establish a plane rectangular coordinate system, recorded as the storage analysis coordinate system, wherein the unit of the X-axis of the storage analysis coordinate system is s, and the unit of the Y-axis is MB / s; for any stored data: record the total time for storing the test data in the stored data into the storage device as T, and record the value of T rounded down as T1; for any positive integer C less than or equal to T1 and greater than or equal to 1, record the average storage speed between C-1 and C during the process of storing the test data in the stored data into the storage device as V, and record the point (C, V) in the storage analysis coordinate system as the storage point; obtain all storage points corresponding to the horizontal coordinates from 1 to T1 in the storage analysis coordinate system, and record the curve obtained by fitting all the storage points as the storage analysis curve, wherein the horizontal coordinates of the rightmost point and the leftmost point of the storage analysis curve are T and 0, respectively; Obtain the stored analysis curves corresponding to all stored data, and place all stored analysis curves in the same stored analysis coordinate system; mark the horizontal coordinate of the rightmost point of all stored analysis curves in the stored analysis coordinate system as T2, where T2 is a positive number greater than or equal to T.

5. A storage device data protection method according to claim 4, characterized in that: Data storage testing also includes: For any value t stored in the analysis coordinate system that is less than or equal to T2 and greater than or equal to 0, record the point with the smallest ordinate and the point with the largest ordinate among the intersections of X=t and all stored analysis curves as the region valley point and region vertex, respectively; obtain the region valley points and region vertices of all values ​​stored in the analysis coordinate system that are less than or equal to T2 and greater than or equal to 0, and record the curve formed by all region valley points as the valley point curve, and record the curve formed by all region vertices as the vertex curve; The closed area enclosed by the vertex curve, valley curve, X=T2 and X=0 is recorded as the stored feature area of ​​R; Obtain the storage capacity occupied by all data in the device analysis library, and based on the acquisition method of the storage feature area of ​​R, obtain the storage feature area corresponding to each occupied storage capacity; The stored characteristic areas corresponding to all occupied storage amounts are recorded as data storage characteristics of the storage device.

6. A storage device data protection method according to claim 5, characterized in that: Acquiring normal data and abnormal data of device data based on data storage characteristics, acquiring normal features of the device based on normal data of the device data, and acquiring abnormal features of the device based on abnormal data of the device data include: The backup storage data is stored in the storage device again, and the storage speed of each data in the backup storage data when it is stored in the storage device is recorded, and recorded as speed data corresponding to each data; For any data α in the backup storage data: record the storage capacity occupied by data α as B, and record the stored feature area corresponding to B in the data storage feature as the standard comparison area; Draw a curve corresponding to the speed data of data α in the stored analysis coordinate system and record it as a comparison curve; when the comparison curve is completely in the standard comparison area, record the data α as normal data; when the comparison curve is not completely in the standard comparison area, record the data α as abnormal data; All normal data and all abnormal data in the backup storage data are obtained, and the array corresponding to the storage occupied by all normal data is recorded as the normal feature of the device, and the array corresponding to the storage occupied by all abnormal data is recorded as the abnormal feature of the device.

7. A storage device data protection method according to claim 6, characterized in that: Acquiring access exception parameters of a storage device based on regular features and abnormal features of the device; establishing a protection storage database, and storing data in the storage device into the protection storage database based on the access exception parameters includes: Will Denoted as access exception parameter, where q1 and q2 are the number of values ​​in the array corresponding to the normal characteristics of the device and the abnormal characteristics of the device, respectively. i is the ith value in the general characteristics of the device, Q j is the jth value in the device abnormality feature; The normal data is stored in the normal storage library, the abnormal data is stored in the abnormal protection library, and the abnormal protection library is encrypted using the access abnormality parameter.

8. A storage device data protection method according to claim 7, characterized in that: Obtaining new speed data and a new comparison area corresponding to data newly stored in the storage device, and storing and performing abnormal protection on the data newly stored in the storage device based on the new speed data and the new comparison area includes: For any data β newly stored in the storage device, when the data β is stored in the storage device, the storage speed of the data β during the storage process will be recorded and recorded as the new speed data; After the data β is stored in the storage device, the storage capacity occupied by the data β is recorded as L, and the stored feature area with the smallest difference between the occupied storage capacity and L among all the stored feature areas in the data storage feature is recorded as the new comparison area; Draw the curve corresponding to the new velocity data in the stored analysis coordinate system and record it as the new comparison curve; when the new comparison curve is completely in the new comparison area, record the data β as regular data and store it in the regular database; When the new alignment curve is not completely in the new alignment area, the data β is recorded as abnormal data and stored in the abnormal protection library.

9. An electronic device, characterized in that: The method comprises a processor and a memory, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the steps in the method according to any one of claims 1 to 8 are executed.

10. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are executed.

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