General automatic test system and method meeting open-loop and closed-loop test requirements

Abstract

The invention relates to the technical field of automatic testing, and discloses a general automatic testing system and method meeting open-loop and closed-loop testing requirements, and the system comprises a general testing system development platform which is used for developing and generating a testing program and issuing the testing program to a general testing system operation platform; the general test system operation platform is used for controlling the general test equipment; and the general test equipment is used for executing the test program generated by the general test system development platform and carrying out physical signal interaction with the tested object. The system can be compatible with open-loop automatic testing and closed-loop automatic testing at the same time, and unification of the testing system is achieved. Therefore, the test efficiency is improved, and the test cost is reduced; in addition, the complexity that an open-loop test system and a closed-loop test system need to be respectively designed in a traditional test system is avoided.

Description

Technical Field

[0001] The present invention relates to the field of automated testing technology, and more particularly to a universal automated testing system and method that meets the requirements of open-loop and closed-loop testing. Background Art

[0002] In the field of automated testing, existing general-purpose testing systems are mainly focused on open-loop automated testing, which realizes the mapping of signals and hardware resources through mapping configuration files. However, there is currently little research on general-purpose automated testing systems that are compatible with both open-loop and closed-loop testing. Closed-loop testing usually requires the participation of dynamic models, while open-loop testing focuses on signal interaction in a "question-and-answer" mode. In the prior art, the invention patent with publication number CN112685341A realizes the versatility of the interface adapter through a modular adapter circuit board. For example, the invention patent with publication number CN113612671A introduces a matrix switch to realize signal routing and transfer. However, none of these technical solutions solves the problem of the test system being compatible with both open-loop and closed-loop testing. Summary of the Invention

[0003] The present invention aims to solve the problem that existing general test systems are not compatible with both open-loop and closed-loop automated testing, and proposes a general automated testing system and method that meets the requirements of open-loop and closed-loop testing.

[0004] In order to achieve the above-mentioned object of the invention, the technical solution of the present invention is as follows: The present invention discloses a universal automated testing system that meets the requirements of open-loop and closed-loop testing, comprising: Universal test system development platform, used to develop and generate test programs and send them to the universal test system operation platform; Universal test system operating platform, used to control universal test equipment; Universal test equipment, used to execute the test program generated by the universal test system development platform and perform physical signal interaction with the object under test; The general test system development platform includes: The UUT modeling module is used to model the electrical interface based on the connector of the product under test, model the communication interface based on the interface control file of the product under test, and describe the performance of the non-electrical interface signals of the product under test; Test system modeling module, used for test station modeling, adapter front panel modeling, and third-party test equipment modeling; Test strategy development module, used to develop and configure test strategies and model parameter configurations that meet open-loop and closed-loop test requirements; A mapping relationship configuration module is used to configure the mapping relationship between signals and hardware resources; The general test system operating platform includes: The lower computer management engine module is used for closed-loop automated testing, controlling the lower computer and receiving real-time data; Test strategy parsing engine module, used to merge test strategy files with resource-UUT mapping tables to form an open-loop automated test program; The test strategy execution engine module is used to execute the open-loop automated test strategy and send the adapter mapping table to the adapter.

[0005] Preferably, the universal testing equipment includes a testing station and an adapter; wherein, The test station consists of a controller and general test resources, which are used to run the dynamic model and drive the general test resources according to the dynamic model conditions; The adapter is used to complete the program-controlled configuration according to the adapter mapping table issued by the test strategy execution engine module.

[0006] Preferably, the test strategy development module includes: The test strategy editing unit performs sending and receiving operations based on the communication interface model and forms a test strategy XML file; The model configuration unit is used for closed-loop automated testing. It configures parameters according to the dynamic model port of the lower computer to form a model configuration XML file.

[0007] Preferably, the mapping relationship configuration module includes an electrical mapping table, a signal mapping table and a performance mapping table.

[0008] Preferably, the open-loop automated test refers to a test mode in which the test system sends an excitation signal and the object under test returns a response signal based on the excitation signal under the condition that the lower computer is not running a dynamic model; the closed-loop automated test refers to a test mode in which the lower computer is connected to the object under test and completes the interaction with the object under test on its own under the condition that the lower computer is running a dynamic model, and the general test system operation platform performs parameter configuration and data monitoring.

[0009] Preferably, for open-loop automated testing, the test execution engine module directly manipulates general test resources and third-party test equipment; for closed-loop automated testing tasks, the third-party test equipment and the controller collaborate to complete dynamic interaction with the object under test.

[0010] Preferably, the third-party test equipment modeling is divided into two parts, including the modeling of the third-party test equipment that interacts with the object under test through cable connection, and the modeling of the third-party test equipment that applies virtual interface technology to quantify the performance indicators of non-cable transmission for automatic matching with the object under test.

[0011] Based on the same inventive concept, the present invention further discloses a universal automated testing method that meets the requirements of open-loop and closed-loop testing. The testing method is implemented based on the above-mentioned testing system and includes the following steps: Step S1. Establish a general test system development platform, including modeling of the product under test, test system modeling, test strategy development and mapping relationship configuration; Step S2 deploys a general test system operating platform, including a lower-level management engine module, a test strategy parsing engine module, and a test strategy execution engine module; Step S3. Configure universal test equipment, including test stations and adapters; Step S4. Select open-loop test or closed-loop test mode according to test requirements, and perform corresponding tailoring and configuration; Step S5: Execute test tasks, including open-loop automated test tasks and closed-loop automated test tasks.

[0012] Preferably, in step S4, the tailoring and configuration of the open-loop test mode includes: Tailor the dynamic model interface and model configuration modules in the general test system development platform; Cut the model port-ICD binding relationship and model port-model port binding relationship in the mapping relationship configuration module; Tailor the lower-level computer management engine in the general test system operating platform; Tailoring controllers from general test equipment.

[0013] Preferably, in step S4, the tailoring and configuration of the closed-loop test mode includes: Tailor the test strategy editing unit in the general test system development platform; Tailor the test strategy execution engine module in the general test equipment, directly control the general test resources, and tailor the test strategy parsing engine module.

[0014] Beneficial effects of the present invention: This paper proposes a universal automated testing system and method within a unified framework, based on signal-oriented test system development, that meets the requirements of both open-loop and closed-loop testing. The system is compatible with both open-loop and closed-loop automated testing, achieving a unified test system. Consequently, this invention not only improves testing efficiency but also reduces testing costs; it also avoids the complexity of designing separate open-loop and closed-loop test systems in traditional test systems. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The foregoing and following detailed description of the present invention will become more apparent when read in conjunction with the following drawings, in which: Figure 1This is a system architecture diagram of the present invention; Figure 2 It is a schematic diagram of the dynamic model structure of the present invention. DETAILED DESCRIPTION

[0016] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the technical solutions for achieving the purposes of the present invention will be further illustrated below through specific embodiments. It should be noted that the technical solutions claimed for protection by the present invention include but are not limited to the following embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work should fall within the scope of protection of the present invention.

[0017] The embodiment of the present invention first proposes a universal automated testing system that meets the requirements of open-loop and closed-loop testing. Figure 1 This is the system architecture diagram of the present invention, as shown in Figure 1 As shown, the universal automated test system includes a universal test system development platform, a universal test system operation platform (i.e., a host computer) and universal test equipment (i.e., a slave computer, the number of which can be multiple); wherein, The general test system development platform is deployed in the office desktop system and is mainly used to develop and generate test programs and distribute and deploy the test programs to the test control host used in the test site; The universal test system operating platform is deployed in the test and control host used at the test site to control the universal test equipment; The universal test device is used to execute the test program generated by the universal test system development platform to achieve physical signal interaction with the object under test.

[0018] In the embodiment described in the present invention, the universal test system development platform includes four parts: a UUT (product under test) modeling module, a test system modeling module, a test strategy development module, and a mapping relationship configuration module.

[0019] Furthermore, the functions of the UUT modeling module mainly include the following three parts: first, electrical interface modeling based on the connector of the product under test; second, communication interface modeling based on the ICD (interface control file) of the product under test after the electrical interface modeling is completed; third, performance description of the non-electrical interface signal of the product under test. For example, if the product under test is a radio altimeter, the performance description of its non-electrical interface signal includes: maximum measuring altitude, maximum lifting speed, altitude accuracy, lifting speed accuracy, etc.

[0020] Furthermore, the test system modeling module is mainly used to model test stations, adapter front panels, and third-party test equipment. Test station modeling focuses on the electrical interfaces of general test equipment, including not only the functional boards inserted into them, but also their slots in the test stations and their corresponding test station numbers. The adapter front panel modeling targets the adapter's panel facing the UUT. The modeling content includes the constraints of its connectors and pins. The constraints are the connector numbers and the pin signal types. For example, pins 1 to 20 carry AD / DA signals, pins 21 to 40 carry DIO signals, pins 41 to 50 carry RS422 signals, and pins 51 to 60 carry CAN signals. The modeling of third-party test equipment can be divided into two parts. The first part is the content that can interact with the object under test through cable connection. Typical equipment includes throttles and pedals. Their modeling content is consistent with the electrical interface modeling and communication interface modeling of the UUT. They can be regarded as a special UUT. Therefore, the modeling of such third-party test equipment can be carried out in the UUT modeling; the second part is non-cable transmission information. Typical equipment includes altimeter test equipment that interacts with the radio altimeter through radio frequency space transmission, and atmospheric pressure simulation equipment that interacts with the atmospheric data system through air pressure simulation. Such equipment requires the application of virtual interface technology to quantify the performance indicators of non-cable transmission. The description content is consistent with the performance description of the non-electrical interface signal of the UUT modeling, which is used for automatic matching with the object under test to meet the test requirements.

[0021] Furthermore, the test strategy development module is compatible with open-loop and closed-loop test requirements and mainly includes the following two parts: 1) Test strategy editing unit Sending and receiving operations are performed based on the communication interface model, ultimately generating a test strategy XML file for closed-loop or open-loop automated testing. Specifically, the editing process must be based on the communication interface model (hereinafter referred to as the ICD model for ease of description). Key operations include sending and receiving. When sending data, variables defined in the ICD model are directly referenced, assigned values, and then sent. When receiving data, the corresponding parameter names in the ICD model are assigned to newly created variables for subsequent data processing, ultimately generating the corresponding test strategy XML file.

[0022] 2) Model configuration unit It is mainly used for closed-loop automated testing. According to the dynamic model port of the lower computer and the test requirements, parameters are configured and the model configuration XML file is finally formed.

[0023] It is understood that dynamic models fall into two categories (see Figure 2), one type is a pure model, which does not contain ICD-related modulation and demodulation information, and the parameters can be directly operated during model configuration; the other type is based on the pure model, with ICD-related modulation and demodulation information added. If you want to configure the model parameters, you need to modulate according to ICD before the model can be recognized.

[0024] Therefore, for the above two types of dynamic models, two paths are required during model configuration. For pure models, the dynamic model ports can be directly configured; for the other type, the parameters need to be encoded with the help of the ICD modulation module, which is designed based on the model port-ICD binding relationship table.

[0025] Furthermore, the mapping relationship configuration module is the core of the open-loop and closed-loop automated test system. The configuration table can be divided into three categories according to the signal type: electrical mapping table, signal mapping table and performance mapping table, as follows: (1) Electrical mapping table, including resource-UUT mapping table, resource-third-party mapping table, adapter mapping table and test cable connection table. The resource-UUT mapping table describes the electrical interface mapping relationship between the test station and the UUT. Based on the constraints of the adapter front panel, the resource-UUT mapping table can generate an adapter mapping table and a test cable wiring table. The adapter mapping table is used to guide or program the adapter to connect the corresponding pins on the front and back panels of the adapter. The test cable mapping table is used for test cable production. The resource-third-party mapping table describes the electrical interface mapping relationship between third-party test equipment and test stations.

[0026] (2) Signal class mapping table, including model port-ICD binding relationship table, model port-model port binding relationship table and model port-resource binding relationship table; among which, The model port-ICD binding relationship table describes the mapping relationship between dynamic model (pure model) port signals and ICD information, which is used for subsequent parsing of the model configuration XML file; The model port-resource binding relationship table describes which channel on which resource card in the test station the model port should use to communicate with the UUT when the model already has ICD modulation and demodulation functions. The relationship between the model port-resource binding relationship table is not clear in the figure because it requires manual analysis and configuration based on the modulation design of each port ICD in the dynamic model and the resource-UUT mapping table. The model port-model port binding relationship table describes the information interaction between different dynamic models, such as the information interaction between the avionics dynamic model and the flight control dynamic model ports running on different slave computers, and is used to implement multi-model collaborative simulation.

[0027] (3) Performance class mapping table, mainly UUT performance-third-party performance mapping table, which matches the performance parameters of the non-electrical performance parameters of the UUT model with the virtual interface of the third-party device for the selection of third-party test equipment.

[0028] In the embodiment described in the present invention, the universal test system operating platform (host computer) has three core engine modules, as follows: a) Lower computer management engine module, used for closed-loop automated testing. Its main functions include: lower computer control, such as starting and stopping, distribution of model parameters (based on the model configuration XML file), model port-ICD binding relationship tables, and model port-model port binding relationship tables; receiving and storing real-time data from the lower computer; b) The test strategy parsing engine module integrates the test strategy XML file with the resource-UUT mapping table to form an open-loop automated test program (XML file), and then sends it to the test strategy execution engine module to drive the hardware execution; c) The test strategy execution engine module is used to execute open-loop automated test tasks. Its main functions include: executing open-loop automated test strategies and issuing adapter mapping tables to adapters.

[0029] In the embodiment described in the present invention, the universal testing device mainly includes two parts: a testing station and an adapter; wherein, The test station consists of a controller and general test resources. The controller is equipped with a real-time operating system (RTOS) for running dynamic models. Similar to the two dynamic model scenarios described in the test strategy development section above, for pure models, modulation and demodulation based on the model port-ICD binding table are required to drive the general test resources. For models that already have ICD modulation and demodulation capabilities, the general test resources can be driven directly.

[0030] It is worth noting that in order for the controller to know which port of a specific test resource the dynamic model parameters are communicated with the test object, the following two points must be met during implementation: 1) For pure models, you also need to know the resource-UUT mapping table.

[0031] 2) For models that already have ICD modulation and demodulation functions, you also need to know the model port-resource binding relationship table.

[0032] When third-party test equipment is present, there are two situations (which can exist simultaneously): 1) The third-party device port interacts directly with the UUT, and the two are connected by a test cable. The test cable is made based on the resource-third-party mapping table in the above mapping relationship configuration description section.

[0033] 2) The third-party device port is connected to the universal test resource through an adapter. The modeling of this type of third-party device is completed in the UUT modeling environment. Therefore, the mapping relationship between it and the universal test resource can be directly queried in the test cable wiring table. The test cable is made according to the table to complete the connection between this type of third-party device and the universal test resource.

[0034] Therefore, for the open-loop automated testing tasks of the present invention, the test execution engine module can directly manipulate the general test resources and third-party test equipment. For closed-loop automated testing tasks, the third-party test equipment and the controller collaborate to complete dynamic interaction with the object under test.

[0035] Furthermore, the open-loop automated test refers to a test mode in which the test system sends an excitation signal and the object under test returns a response signal based on the excitation signal under the condition that the lower computer is not running a dynamic model; the closed-loop automated test refers to a test mode in which the lower computer is connected to the object under test and independently completes the interaction with the object under test under the condition that the lower computer is running a dynamic model, and the general test system operation platform performs parameter configuration and data monitoring.

[0036] In the present invention, if the adapter is a reconfigurable adapter, the program-controlled configuration can be directly completed according to the adapter mapping table issued by the test strategy execution engine. If it is a traditional adapter, the connection is completed according to the adapter mapping table.

[0037] Based on the same inventive concept, an embodiment of the present invention further discloses a universal automated testing method that meets the requirements of open-loop and closed-loop testing. The method is implemented based on the above-mentioned universal automated testing system and specifically includes the following steps: Step S1. Establish a general test system development platform, including modeling of the product under test, test system modeling, test strategy development and mapping relationship configuration; Step S2 deploys a general test system operating platform, including a lower-level management engine module, a test strategy parsing engine module, and a test strategy execution engine module; Step S3. Configure universal test equipment, including test stations and adapters; Step S4. Select open-loop test or closed-loop test mode according to test requirements, and perform corresponding tailoring and configuration; Step S5: Execute test tasks, including open-loop automated test tasks and closed-loop automated test tasks.

[0038] In the embodiments described herein, the entire universal automated testing system can meet the needs of both open-loop and closed-loop testing, with both operating under a unified framework. For open-loop testing only, modules related to closed-loop testing can be tailored; for closed-loop testing only, only the universal test system operating platform can be tailored. The details are as follows: Preferably, the open-loop test mode corresponds to an open-loop automated test task. Figure 1 Cutting is based on: 1. In the general test system development platform 1.1) In the test strategy development part, the dynamic model interface and model configuration modules are cut out; 1.2) In the mapping relationship configuration section, trim the model port-ICD binding relationship and the model port-model port binding relationship; 2. On the general test system operating platform 2.1) Tailoring the lower-level management engine; 3. In general test equipment 3.1) Clipping controller.

[0039] Preferably, the closed-loop test mode corresponds to a closed-loop automated test task. Figure 1 Cutting is based on: 4. In the general test system operation platform 4.1) Tailor the test strategy parsing engine module.

[0040] 4.2) Tailor the test strategy execution engine module's direct control over common test resources.

[0041] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Any simple modification or equivalent change made to the above embodiment based on the technical essence of the present invention shall fall within the scope of protection of the present invention.

Claims

1. A universal automated testing system that meets the requirements of open-loop and closed-loop testing, characterized in that: The system comprises: Universal test system development platform, used to develop and generate test programs and send them to the universal test system operation platform; Universal test system operating platform, used to control universal test equipment; Universal test equipment, used to execute the test program generated by the universal test system development platform and perform physical signal interaction with the object under test; The general test system development platform includes: The UUT modeling module is used to model the electrical interface based on the connector of the product under test, model the communication interface based on the interface control file of the product under test, and describe the performance of the non-electrical interface signals of the product under test; Test system modeling module, used for test station modeling, adapter front panel modeling, and third-party test equipment modeling; Test strategy development module, used to develop and configure test strategies and model parameter configurations that meet open-loop and closed-loop test requirements; A mapping relationship configuration module is used to configure the mapping relationship between signals and hardware resources; The universal test system operating platform includes: The lower computer management engine module is used for closed-loop automated testing, controlling the lower computer and receiving real-time data; Test strategy parsing engine module, used to merge test strategy files with resource-UUT mapping tables to form an open-loop automated test program; The test strategy execution engine module is used to execute the open-loop automated test program and send the adapter mapping table to the adapter.

2. A universal automated testing system that meets the requirements of open-loop and closed-loop testing according to claim 1, characterized in that: The universal testing equipment includes a testing station and an adapter; wherein, The test station consists of a controller and general test resources, which are used to run the dynamic model and drive the general test resources according to the dynamic model conditions; The adapter is used to complete the program-controlled configuration according to the adapter mapping table issued by the test strategy execution engine module.

3. A universal automated testing system that meets the requirements of open-loop and closed-loop testing according to claim 1, characterized in that: The test strategy development module includes: The test strategy editing unit performs sending and receiving operations based on the communication interface model and forms a test strategy XML file; The model configuration unit is used for closed-loop automated testing. It configures parameters according to the dynamic model port of the lower computer to form a model configuration XML file.

4. A universal automated testing system that meets the requirements of open-loop and closed-loop testing according to claim 1, characterized in that: The mapping relationship configuration module includes an electrical mapping table, a signal mapping table and a performance mapping table.

5. A universal automated testing system that meets the requirements of open-loop and closed-loop testing according to claim 1, characterized in that: The open-loop automated test refers to a test mode in which the test system sends an excitation signal and the object under test returns a response signal based on the excitation signal under the condition that the lower computer is not running a dynamic model; the closed-loop automated test refers to a test mode in which the lower computer is connected to the object under test and independently completes the interaction with the object under test under the condition that the lower computer is running a dynamic model, and the general test system operation platform performs parameter configuration and data monitoring.

6. A universal automated testing system that meets the requirements of open-loop and closed-loop testing according to claim 1, characterized in that: For open-loop automated testing, the test execution engine module directly manipulates general test resources and third-party test equipment; for closed-loop automated testing tasks, third-party test equipment and the controller collaborate to complete dynamic interaction with the object under test.

7. A universal automated testing system that meets the requirements of open-loop and closed-loop testing according to claim 1, characterized in that: The third-party test equipment modeling is divided into two parts, including the third-party test equipment modeling that interacts with the object under test through cable connection, and the third-party test equipment modeling that applies virtual interface technology to quantify the performance indicators of non-cable transmission for automatic matching with the object under test.

8. A general automated testing method that meets the requirements of open-loop and closed-loop testing, the method being implemented based on the testing system according to any one of claims 1 to 7, characterized in that: The following steps are involved: Step S1. Establish a general test system development platform, including modeling of the product under test, test system modeling, test strategy development and mapping relationship configuration; Step S2 deploys a general test system operating platform, including a lower-level management engine module, a test strategy parsing engine module, and a test strategy execution engine module; Step S3. Configure universal test equipment, including test stations and adapters; Step S4. Select open-loop test or closed-loop test mode according to test requirements, and perform corresponding tailoring and configuration; Step S5: Execute test tasks, including open-loop automated test tasks and closed-loop automated test tasks.

9. A universal automated testing method that meets the requirements of open-loop and closed-loop testing according to claim 8, characterized in that: In step S4, the tailoring and configuration of the open-loop test mode includes: Tailor the dynamic model interface and model configuration modules in the general test system development platform; Cut the model port-ICD binding relationship and model port-model port binding relationship in the mapping relationship configuration module; Tailor the lower-level computer management engine in the general test system operating platform; Tailoring controllers from general test equipment.

10. A universal automated testing method that meets the requirements of open-loop and closed-loop testing according to claim 8, characterized in that: In step S4, the tailoring and configuration of the closed-loop test pattern includes: Tailor the test strategy editing unit in the general test system development platform; Tailor the test strategy execution engine module in the general test equipment, directly control the general test resources, and tailor the test strategy parsing engine module.

Images