MOS tube testing device

Abstract

The invention discloses an MOS transistor testing device, and relates to the technical field of MOS transistor testing, the MOS transistor testing device comprises a base, a detection assembly and a cover body, and the upper end of the base is provided with a containing groove; the detection assembly comprises a detection circuit board arranged in the accommodating groove and a mounting seat mounted on the detection circuit board, and the mounting seat is used for bearing a to-be-detected MOS tube; the cover body is movably arranged on the base in a covering mode, a limiting structure is arranged on the cover body and comprises a limiting piece, a positioning piece and a driving piece, the limiting piece can move up and down relative to the mounting base, the driving piece can drive the positioning piece to move in the horizontal direction, and the positioning piece can move up and down relative to the mounting base. The positioning piece is provided with a positioning position which is close to the limiting piece and is used for positioning the limiting piece, and a loosening position which is far away from the limiting piece. The invention aims to provide a testing device adaptive to MOS (Metal Oxide Semiconductor) tubes with various heights and sizes.

Description

Technical Field

[0001] The present invention relates to the technical field of MOS tube testing, and in particular to a MOS tube testing device. Background Art

[0002] Currently, there are many types of MOS tubes with different sizes. The MOS tube test devices used on the market can generally only test MOS tubes of one size and have poor versatility. The few test devices that can test MOS tubes of multiple sizes need to be adjusted in advance according to the MOS tube size during testing, which is inconvenient to use and increases the testing cost. Summary of the Invention

[0003] The main purpose of the present invention is to provide a MOS tube testing device, aiming to provide a testing device that is suitable for MOS tubes of various heights and sizes.

[0004] To achieve the above-mentioned object, the present invention provides a MOS transistor testing device, wherein the MOS transistor testing device comprises:

[0005] The base has a receiving groove at the upper end;

[0006] A detection component, comprising a detection circuit board disposed in the receiving groove and a mounting base mounted on the detection circuit board, wherein the mounting base is used to carry the MOS tube to be tested; and

[0007] The cover body is movably covered on the base, and a limiting structure is provided on the cover body, the limiting structure includes a limiting member, a positioning member and a driving member, the limiting member can be movably arranged up and down relative to the mounting seat, and the driving member can drive the positioning member to move in the horizontal direction, so that the positioning member has a positioning position close to the limiting member to position the limiting member, and a loose position away from the limiting member.

[0008] In one embodiment, a threaded structure is provided between the limiting member and the positioning member, and the limiting member is engaged with the positioning member located at the positioning position to position the limiting member.

[0009] In one embodiment, a hand-operated portion is provided at a portion where the upper end of the limiting member extends out of the cover.

[0010] In one embodiment, the driving member can be movably arranged on the cover body up and down, and in the movable stroke of the driving member, it has an initial position in which its lower end extends out of the lower end surface of the cover body, and a driving position in which the base pushes the driving member back to the cover body. When the driving member is in the driving position, the driving member drives the positioning member to move to the positioning position.

[0011] In one embodiment, a driving inclined surface is provided on a side of the driving member, and the driving inclined surface is used to push and drive the positioning member to move to the positioning position.

[0012] In one embodiment, the end portion of the positioning member is correspondingly provided with a matching inclined surface.

[0013] In one embodiment, a first elastic member is provided between the driving member and the cover body, and the first elastic member is used to reset the driving member to the initial position.

[0014] In one embodiment, there are two positioning members, and the two positioning members are respectively arranged on both sides of the limiting member, and two driving members are correspondingly provided. A second elastic member is provided between the two positioning members, and the second elastic member is used to drive the two positioning members away from each other to the loose position.

[0015] In one embodiment, an elastic buffer is provided at the lower end of the limiting member.

[0016] In one embodiment, the cover and the base are positioned and locked by a locking assembly.

[0017] In the technical solution of the present invention, the MOS tube testing device comprises a base, a cover, and a detection assembly disposed on the base. The detection assembly primarily comprises a detection circuit board and a mounting base. The mounting base is used to position the MOS tube. When the MOS tube is placed at a mounting point on the mounting base, the pins of the MOS tube communicate with the circuit on the detection circuit board, enabling detection of the MOS tube via the detection circuit board. To ensure the stability of the MOS tube placed on the mounting base and to ensure detection stability, the cover is further provided with a limiting structure. Specifically, the limiting structure comprises a limiting member, a positioning member, and a driving member. The limiting member is mounted on the cover so as to be movable up and down. The limiting member is disposed corresponding to the mounting base and is configured to abut the top of the MOS tube, limiting the MOS tube on the mounting base and ensuring the stability of the MOS tube during detection. The driving member is configured to drive the positioning member toward or away from the limiting member. When the positioning member approaches the limiting member, it is configured to limit the movement of the limiting member in the vertical direction, thereby positioning the limiting member and limiting the position of the MOS tube. Based on the above structural arrangement, after MOS tubes of different sizes are placed on the mounting seat, when the cover body is closed on the base, the limiting member can move freely up and down and abuts against the top of the MOS tube due to its own gravity. At this time, regardless of the size of the MOS tube, the limiting member can maintain abutment against the top of the MOS tube, without the need for manual adjustment of the limiting member. The action of the driving member driving the positioning member to approach the limiting member is independent of the size of the MOS tube. After the driving member drives the positioning member to approach and position the limiting member, the limiting member maintains abutment against the top of the MOS tube, thereby stably limiting the MOS tube to the mounting seat. In this way, the MOS tube testing device is applicable to MOS tubes of multiple sizes. For MOS tubes of different sizes, the limiting structure can automatically adjust to ensure applicability without the need for active adjustment, thereby facilitating use and reducing testing costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying any creative work.

[0019] Figure 1 A schematic diagram of the three-dimensional structure of an embodiment of a MOS tube testing device provided by the present invention;

[0020] Figure 2 for Figure 1A schematic cross-sectional view of the MOS tube testing device when the middle cover is closed on the base;

[0021] Figure 3 for Figure 1 A schematic cross-sectional view of the cover body when the middle cover body is not closed on the base;

[0022] Figure 4 for Figure 1 Schematic cross-section of the locking assembly.

[0023] Description of Figure Numbers:

[0024] 100. MOS tube testing device; 1. Base; 11. Receiving groove; 2. Detection assembly; 21. Detection circuit board; 22. Mounting seat; 3. Cover; 4. Limiting structure; 41. Limiting member; 411. Manual operation unit; 412. Elastic buffer member; 42. Positioning member; 421. Mating inclined surface; 43. Driving member; 431. Driving inclined surface; 44. Threaded structure; 45. First elastic member; 46. Second elastic member; 5. Locking assembly.

[0025] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0027] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture. If the specific posture changes, the directional indications will also change accordingly.

[0028] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or suggesting their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features limited to "first" and "second" may explicitly or implicitly include at least one of such features. In addition, if "and / or" or "and / or" appears in the full text, its meaning includes three parallel solutions. Taking "A and / or B" as an example, it includes solution A, solution B, or solutions that satisfy both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is mutually contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0029] Currently, there are many types of MOS tubes with different sizes. The MOS tube test devices used on the market can generally only test MOS tubes of one size and have poor versatility. The few test devices that can test MOS tubes of multiple sizes need to be adjusted in advance according to the MOS tube size during testing, which is inconvenient to use and increases the testing cost.

[0030] In view of this, the present invention proposes a MOS tube testing device, see Figures 1 to 4 , is an embodiment of the MOS tube testing device proposed in this application, and the MOS tube testing device will be described in detail below with reference to specific drawings.

[0031] See also Figures 1 to 4 The MOS transistor testing device 100 includes a base 1, a detection assembly 2, and a cover 3. The base 1 has a receiving groove 11 at its upper end. The detection assembly 2 includes a detection circuit board 21 disposed in the receiving groove 11 and a mounting base 22 mounted on the detection circuit board 21. The mounting base 22 is used to support the MOS transistor to be tested. The cover 3 is movably disposed on the base 1 and is provided with a limiting structure 4. The limiting structure 4 includes a limiting member 41, a positioning member 42, and a driving member 43. The limiting member 41 is movably disposed relative to the mounting base 22. The driving member 43 drives the positioning member 42 to move horizontally, so that the positioning member 42 has a positioning position close to the limiting member 41 to position the limiting member 41, and a release position away from the limiting member 41.

[0032] In the technical solution of the present invention, the MOS tube testing device 100 is composed of the base 1, the cover 3 and the detection component 2 arranged on the base 1. The detection component 2 mainly includes the detection circuit board 21 and the mounting base 22. The mounting base 22 is used to position the MOS tube. When the MOS tube is placed at the mounting point of the mounting base 22, the pins of the MOS tube are connected to the circuit on the detection circuit board 21, so that the MOS tube can be detected through the detection circuit board 21. In order to ensure the stability of the MOS tube placed on the mounting seat 22 and to ensure the stability of detection, the limiting structure 4 is further provided on the cover body 3. Specifically, the limiting structure 4 includes the limiting member 41, the positioning member 42 and the driving member 43. The limiting member 41 can be freely moved up and down and installed on the cover body 3, and the limiting member 41 is provided corresponding to the mounting seat 22 to abut the top of the MOS tube and limit the MOS tube to the mounting seat 22 to ensure the stability of the MOS tube during the detection process. The driving member 43 is used to drive the positioning member 42 to approach or move away from the limiting member 41. The positioning member 42 is used to limit the movement of the limiting member 41 in the up and down directions when approaching the limiting member 41, thereby positioning the limiting member 41 and limiting the MOS tube. Based on the above structural arrangement, after MOS tubes of different sizes are placed on the mounting seat 22 and the cover body 3 is closed on the base 1, the limiting member 41 can move freely up and down and abut the top of the MOS tube due to its own gravity. At this time, regardless of the size of the MOS tube, the limiting member 41 can maintain abutment against the top of the MOS tube, without the need for manual adjustment of the limiting member 41. The action of the driving member 43 driving the positioning member 42 to approach the limiting member 41 is independent of the size of the MOS tube. After the driving member 43 drives the positioning member 42 to approach and position the limiting member 41, the limiting member 41 maintains abutment against the top of the MOS tube, thereby stably limiting the MOS tube to the mounting seat 22. In this way, the MOS tube testing device 100 is applicable to MOS tubes of multiple sizes. For MOS tubes of different sizes, the limiting structure 4 can automatically adjust to ensure applicability without the need for active adjustment, thereby facilitating use and reducing testing costs.

[0033] Specifically, the positioning member 42 can be used to position the limiting member 41 in a variety of ways, including but not limited to providing a matching structure that can match in the up and down directions on the positioning member 42 and the limiting member 41, so that when the positioning member 42 approaches the limiting member 41, the matching structure cooperates to limit the upward movement of the limiting member 41 that is under the influence of gravity and abuts the MOS tube downward, thereby achieving the positioning of the limiting member 41 and the limitation of the MOS tube to meet functional requirements. However, different sizes of MOS tubes need to be separately provided with a set of matching structures, so that the above matching structure can only correspond to a limited number of MOS tubes, although manual adjustment is not required. The embodiment of the present invention is simple, but the cost is high and the applicability is poor. In this embodiment, a threaded structure 44 is provided between the limiting member 41 and the positioning member 42. The limiting member 41 engages with the positioning member 42 located at the positioning position to position the limiting member 41. By providing the threaded structure 44 between the limiting member 41 and the positioning member 42, the engagement of the threaded structure 44 enables the limiting member 41 and the positioning member 42 to be adjusted almost steplessly in the vertical direction, that is, almost covering all positions within the range of movement of the limiting member 41. There is no need to make targeted settings according to the size of the MOS tube, and the applicable MOS tube size range is wide, and the applicability is high.

[0034] Based on the above arrangement, the positioning member 42 cooperates with the limiting member 41 via the threaded structure 44 to position the limiting member 41. The limiting member 41 can move along the threaded structure 44 to further abut the MOS tube downward, applying a certain pressure to the MOS tube and ensuring the stability of the contact-type electrical connection between the MOS tube and the detection circuit board 21. Therefore, in this embodiment, a manual operation portion 411 is provided at the portion where the upper end of the limiting member 41 extends beyond the cover 3. The limiting member 41 can be rotated via the manual operation portion 411, allowing the limiting member 41 to move along the threaded structure 44. This achieves the above-mentioned function, meets the requirements, and improves the stability of the MOS tube testing device 100. Furthermore, in the case where the limiting member 41 is capable of applying pressure to the MOS tube, to prevent the limiting member 41 from rigidly abutting the MOS tube and causing damage to the MOS tube, an elastic buffer member 412 is further provided at the lower end of the limiting member 41 in this embodiment.

[0035] In addition, the setting of the driving member 43 is not limited. It can drive the positioning member 42 to approach the limit member 41 when the cover body 3 is covered on the base 1. Therefore, the driving member 43 can be set as an electric structure, and the driving member 43 is driven by the electric control to drive the positioning member 42 to move, so as to meet the functional requirements. In this embodiment, the driving member 43 can be movably arranged on the cover body 3 up and down, and in the movable stroke of the driving member 43, it has an initial position in which its lower end extends out of the lower end surface of the cover body 3, and the base 1 pushes the driving member 43 to return to the driving position of the cover body 3. When the driving member 43 is in the driving position, the driving member 43 drives the positioning member 42 to move to the positioning position. By combining the movement of the driving member 43 with the action of the cover body 3 covering the base 1, compared with the above-mentioned electric control scheme, the control operation steps are further reduced, and it is more practical.

[0036] Regarding the driving and matching structure of the driving member 43 and the positioning member 42, the upward movement of the driving member 43 when the cover body 3 is covered on the base 1 has been described above, and the horizontal movement of the positioning member 42 to approach the limit member 41 has also been described above. That is, it is necessary to convert the vertical movement of the driving member 43 into the horizontal movement of the positioning member 42. Therefore, in this embodiment, a driving inclined surface 431 is provided on the side of the driving member 43. The driving inclined surface 431 is used to push and drive the positioning member 42 to move to the positioning position. On this basis, the end of the positioning member 42 is correspondingly provided with a matching inclined surface 421, so that the above-mentioned driving function is achieved through the cooperation between the driving inclined surface 431 and the matching inclined surface 421.

[0037] In addition, the above only describes the step in which the driving member 43 is pushed by the base 1 to drive the positioning member 42 to movably position the limit member 41. After the MOS tube test is completed, the MOS tube needs to be removed and a new MOS tube needs to be replaced. To ensure the convenience of using the MOS tube testing device 100, this embodiment further provides a first elastic member 45 between the driving member 43 and the cover body 3. The first elastic member 45 is used to reset the driving member 43 to the initial position, so that there is no need to manually adjust the driving member 43. When the cover body 3 is separated from the base 1, the first elastic member 45 automatically resets the driving member 43, thereby simplifying the use process and facilitating use.

[0038] Based on the reset setting structure of the driving member 43, the positioning member 42 should also have a corresponding reset structure to reset the positioning member 42 after the driving member 43 is automatically reset. It can be understood that a corresponding reset member can also be set between the positioning member 42 and the cover body 3. When the driving member 43 is reset, the driving member 43 and the positioning member 42 are separated from the driving relationship, and the reset structure corresponding to the positioning member 42 can reset the positioning member 42. In this embodiment, there are two positioning members 42, and the two positioning members 42 are respectively arranged on both sides of the limit member 41. The driving member 43 There are two corresponding ones, and a second elastic member 46 is provided between the two positioning members 42. The second elastic member 46 is used to drive the two positioning members 42 to move away from each other to the loose position. On the one hand, by arranging the two positioning members 42 to clamp the limiting member 41, the stability of the limiting cooperation between the limiting member 41 and the positioning member 42 is guaranteed. On the other hand, the second elastic member 46 can be provided between the two positioning members 42, so that there is no need to provide a reset structure between the positioning member 42 and the cover body 3. It is relatively easy to set up, and can ensure the separation of the positioning member 42 from the limiting member 41, meeting functional requirements.

[0039] In addition, in order to further ensure the stability of the MOS tube detection process, in some embodiments, the cover body 3 and the base 1 are also positioned and locked by a locking component 5 to ensure that the cover body 3 is stably covered on the base 1. The locking component 5 is not specifically limited and can achieve the above-mentioned effect.

[0040] The above description is merely an exemplary embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural transformation made by utilizing the contents of the present invention's description and drawings under the technical concept of the present invention, or directly / indirectly applied in other related technical fields, is included in the patent protection scope of the present invention.

Claims

1. A MOS tube testing device, characterized in that: include: The base has a receiving groove at the upper end; A detection component, comprising a detection circuit board disposed in the receiving groove and a mounting base mounted on the detection circuit board, wherein the mounting base is used to carry the MOS tube to be tested; and The cover body is movably covered on the base, and a limiting structure is provided on the cover body, the limiting structure includes a limiting member, a positioning member and a driving member, the limiting member can be movably arranged up and down relative to the mounting seat, and the driving member can drive the positioning member to move in the horizontal direction, so that the positioning member has a positioning position close to the limiting member to position the limiting member, and a loose position away from the limiting member.

2. The MOS tube testing device according to claim 1, wherein: A threaded structure is provided between the limiting member and the positioning member, and the limiting member is engaged with the positioning member located at the positioning position to position the limiting member.

3. The MOS tube testing device according to claim 2, wherein: A hand-operated portion is provided at a portion where the upper end of the limiting member extends out of the cover body.

4. The MOS tube testing device according to claim 1, wherein: The driving member can be movably arranged on the cover body up and down, and in the movable stroke of the driving member, it has an initial position where its lower end extends out of the lower end surface of the cover body, and a driving position where the base pushes the driving member to return to the cover body. When the driving member is in the driving position, the driving member drives the positioning member to move to the positioning position.

5. The MOS tube testing device according to claim 4, characterized in that: A driving slope is provided on the side of the driving member, and the driving slope is used to push and drive the positioning member to move to the positioning position.

6. The MOS tube testing device according to claim 5, characterized in that: The end of the positioning piece is correspondingly provided with a matching inclined surface.

7. The MOS tube testing device according to claim 4, wherein: A first elastic member is provided between the driving member and the cover body, and the first elastic member is used to reset the driving member to the initial position.

8. The MOS tube testing device according to claim 4, wherein: There are two positioning members, and the two positioning members are respectively arranged on both sides of the limiting member. There are correspondingly two driving members. A second elastic member is arranged between the two positioning members, and the second elastic member is used to drive the two positioning members to move away from each other to the loose position.

9. The MOS tube testing device according to claim 1, wherein: An elastic buffer is provided at the lower end of the limiting member.

10. The MOS transistor testing device according to claim 1, wherein: The cover and the base are positioned and locked via a locking assembly.

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