Deposition layer thickness determination method and device, equipment and medium

Abstract

The embodiment of the invention relates to a sedimentary layer thickness determination method and device, equipment and a medium. The method comprises the steps that an initial sedimentary layer model corresponding to a geological area is acquired; according to the first Bouguer gravity data of the geological area and the first sedimentary layer thickness of the calibrated position in the geological area, adjusting the initial sedimentary layer model to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological area, and the first sedimentary layer thickness is determined by measuring the sedimentary layer at the calibration position; and determining the thickness of the sedimentary layer at the position to be detected in the geological area according to the target sedimentary layer model. According to the embodiment of the invention, the uncertainty of the inversion process is remarkably reduced, the inversion accuracy and the geological rationality of the finally determined model are improved, and the deposition layer thickness with higher accuracy is determined in a larger area at lower cost.

Description

Technical Field

[0001] The present disclosure relates to the field of geological exploration technology, and in particular to a method, device, equipment and medium for determining the thickness of a sedimentary layer. Background Art

[0002] Three-dimensional spatial variations in sediment thickness in foreland thrust belts are crucial for geological structural analysis, seismic hazard assessment, resource exploration, engineering construction, and environmental geology. These data reveal sedimentary evolution, influence seismic wave propagation, and ground stability, and serve as essential foundational data for energy security, disaster prevention, and engineering site selection.

[0003] In scenarios such as earthquake hazard assessment, it is necessary to obtain accurate data on the thickness of sediment layers in a large area. However, in related technologies, it is difficult to achieve relatively accurate sediment thickness while covering a large area. Summary of the Invention

[0004] In order to solve the above technical problems or at least partially solve the above technical problems, the present disclosure provides a method, device, equipment and medium for determining the thickness of a deposition layer.

[0005] The present disclosure provides a method for determining the thickness of a deposited layer, comprising:

[0006] Obtaining an initial sedimentary layer model corresponding to the geological area;

[0007] adjusting the initial sedimentary layer model according to first Bouguer gravity data of the geological region and the thickness of a first sedimentary layer at a calibrated position within the geological region to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological region, and the first sedimentary layer thickness is determined by measuring the sedimentary layer at the calibrated position;

[0008] The thickness of the sediment layer at the location to be detected in the geological area is determined according to the target sediment layer model.

[0009] The present disclosure also provides a device for determining the thickness of a deposited layer, comprising:

[0010] The first acquisition module is used to obtain an initial sedimentary layer model corresponding to the geological area;

[0011] an adjustment module, configured to adjust the initial sedimentary layer model based on first Bouguer gravity data of the geological region and a first sedimentary layer thickness at a calibrated position within the geological region to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological region, and the first sedimentary layer thickness is determined by measuring the sedimentary layer at the calibrated position;

[0012] The determination module is used to determine the thickness of the sediment layer at the location to be detected in the geological area according to the target sediment layer model.

[0013] An embodiment of the present disclosure also provides an electronic device, which includes: a processor; a memory for storing instructions executable by the processor; the processor is used to read the executable instructions from the memory and execute the instructions to implement the method for determining the thickness of the deposition layer as provided in the embodiment of the present disclosure.

[0014] An embodiment of the present disclosure further provides a computer-readable storage medium, wherein the storage medium stores a computer program, and the computer program is used to execute the method for determining the thickness of a deposited layer provided in the embodiment of the present disclosure.

[0015] The technical solution provided by the embodiments of the present disclosure has the following advantages over the prior art: the sediment layer thickness determination solution provided in the embodiments of the present disclosure comprises: obtaining an initial sediment layer model corresponding to a geological region; adjusting and processing the initial sediment layer model according to the first Bouguer gravity data of the geological region and the first sediment layer thickness at a calibrated position within the geological region to obtain a target sediment layer model; wherein the first Bouguer gravity data is determined by observing the sediment layer of the geological region, and the first sediment layer thickness is determined by measuring the sediment layer at the calibrated position; and determining the sediment layer thickness at the position to be detected within the geological region according to the target sediment layer model. By adopting the above technical solution, on the basis of the initial sedimentary layer model, a large-scale rough adjustment of the initial sedimentary layer model is achieved through the first Bouguer gravity data corresponding to the entire geological area, thereby improving the smooth continuity of the model in a larger range, and the first sedimentary layer thickness corresponding to a specific calibration position in the geological area is used to achieve precise adjustment constraints on the initial sedimentary layer model under specific position constraints, so that the obtained target sedimentary layer model can combine the first Bouguer gravity data caused by density differences and match the measured first sedimentary layer thickness, which significantly reduces the uncertainty of the inversion process, improves the inversion accuracy and the geological rationality of the final determined model, and realizes the determination of sedimentary layer thickness with high accuracy in a larger area at a lower cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0017] In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 A schematic diagram of a process for determining the thickness of a deposited layer provided in an embodiment of the present disclosure;

[0019] Figure 2 A schematic flow chart of another method for determining the thickness of a deposited layer provided in an embodiment of the present disclosure;

[0020] Figure 3 A schematic diagram of a first deposition layer thickness and an updated deposition layer model provided in an embodiment of the present disclosure;

[0021] Figure 4 A schematic diagram of a method for determining the thickness of a deposited layer provided in an embodiment of the present disclosure;

[0022] Figure 5 A schematic structural diagram of a device for determining the thickness of a deposited layer provided in an embodiment of the present disclosure;

[0023] Figure 6 A schematic structural diagram of an electronic device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0024] In order to more clearly understand the above-mentioned objectives, features and advantages of the present disclosure, the scheme of the present disclosure will be further described below. It should be noted that the embodiments of the present disclosure and the features therein can be combined with each other in the absence of conflict.

[0025] In the following description, many specific details are set forth to facilitate a full understanding of the present disclosure, but the present disclosure may also be implemented in other ways different from those described herein; it is obvious that the embodiments in the specification are only part of the embodiments of the present disclosure, rather than all of the embodiments.

[0026] In related technologies, the thickness of foreland thrust belt sediments can be determined at specific points through drilling and other methods. While this method is highly accurate, it is expensive, and the sparse locations make it difficult to reflect three-dimensional changes. Furthermore, remote sensing, geoelectrical, and seismic receiver function methods can also be used to assist in determining sediment thickness under specific conditions. However, these methods for determining sediment thickness all focus on accurate detection at specific points and are limited in their ability to cover larger areas.

[0027] In order to solve at least one of the above problems, an embodiment of the present disclosure provides a method for determining the thickness of a deposition layer, which is described below in conjunction with specific embodiments.

[0028] Figure 1 The present invention provides a flow chart of a method for determining the thickness of a deposited layer. The method for determining the thickness of a deposited layer can be applied to a device for determining the thickness of a deposited layer. The device for determining the thickness of a deposited layer can be implemented using software and / or hardware. The device for determining the thickness of a deposited layer can generally be integrated into an electronic device. Figure 1 As shown, the method for determining the thickness of the deposited layer includes:

[0029] Step 101: Obtain an initial sedimentary layer model corresponding to a geological region.

[0030] The geological region may be a region where the thickness of the sedimentary layer is to be determined, and the geological region may be a region including a foreland thrust belt. This embodiment does not limit the scope of the geological region. For example, the scope of the geological region may be consistent with the scope of the region where Bouguer gravity data is measured, and the geological region is a larger region. The initial sedimentary layer model may be a three-dimensional model of a pre-set sedimentary layer. The initial sedimentary layer model may be used to represent the initial set thickness of the sedimentary layer at different locations within the geological region, and may be understood as the initial model based on which the model iteration for the sedimentary layer thickness is performed. Optionally, the initial sedimentary layer model may represent the average thickness of the initially set sedimentary layer.

[0031] Sedimentary layers, also known as foreland thrust belt sediments, are rock formations formed by sediments deposited during the formation and development of foreland thrust belts in a compressional orogenic setting. Foreland thrust belts can be tectonic units formed by plate convergence and collision. The thickness of these sedimentary layers is approximately the same as the depth of the detachment layer.

[0032] In the embodiment of the present disclosure, an initial sedimentary layer model may be generated for the sedimentary layer of the geological region in a manual or automated manner according to the geological characteristics of the geological region.

[0033] In some embodiments of the present disclosure, obtaining an initial sedimentary layer model corresponding to a geological region includes: constructing an initial sedimentary layer model according to geological prior information of the geological region and the thickness of a first sedimentary layer.

[0034] The geological prior information may be geological information related to the sedimentary layers of the geological region obtained through preliminary work before determining the sedimentary layer thickness. For example, the geological prior information may include the location of exposed rock layers on the surface, etc. The thickness of the first sedimentary layer may be the thickness of the sedimentary layer at a calibrated location determined by measurement, and the calibrated location may be a pre-calibrated location point within the geological region. This embodiment does not limit the measurement method of the first sedimentary layer thickness. In an optional embodiment, the thickness of the first sedimentary layer may be determined based on seismic reflection profiling technology, which can provide high-resolution underground stratum information.

[0035] Due to limitations in data coverage and acquisition costs, the thickness of the first sedimentary layer determined by seismic reflection profiling is limited in scope, making it unsuitable for large-scale earthquake risk assessment. The data directly determined by seismic reflection profiling is travel-time domain imaging data, which requires interpretation and identification of sedimentary layers to determine the locations of corresponding interfaces and, subsequently, the thickness boundaries between layers.

[0036] In this embodiment, the sediment layer thickness determination device may display the first sediment layer thickness and prior geological information to the user, and obtain an initial thickness model constructed by the user based on the first sediment layer thickness and prior geological information. Alternatively, the sediment layer thickness determination device may input the first sediment layer thickness and prior geological information into a pre-set function, which outputs a corresponding thickness, and then construct an initial thickness model based on the thickness output by the function.

[0037] Step 102: Adjust the initial sediment layer model based on the first Bouguer gravity data of the geological area and the thickness of the first sediment layer at the calibrated position in the geological area to obtain a target sediment layer model; wherein the first Bouguer gravity data is determined by observing the sediment layer of the geological area, and the thickness of the first sediment layer is determined by measuring the sediment layer at the calibrated position.

[0038] Among them, the first Bouguer gravity data can be the Bouguer gravity anomaly data corresponding to the sedimentary layer of the geological area obtained by ground or satellite observation. The underground rock density structure can be inferred through the Bouguer gravity anomaly data. Specifically, different lithologies or structural units have different density distributions, which will produce measurable anomaly signals in the gravity field. The Bouguer gravity anomaly data reflects the abnormal gravity field caused by the underground density difference by deducting the influence of one or more of the topography, seawater, and normal crust density distribution. Then, based on the Bouguer gravity anomaly data, the underground structure can be estimated. The large-scale structure of the lithosphere can be quickly obtained through the Bouguer gravity anomaly data. It can be applied to the undulations of the crust-mantle boundary (also known as the Moho surface), the identification of low-density sedimentary basins, rock boundaries, and the inference of crust thickness. It is especially suitable for studies covering a wide range of areas with limited geological outcrops, but its results are greatly affected by the complexity of the underground structure, the accuracy is limited, and there are problems such as low spatial resolution, non-uniqueness of interpretation, and low accuracy.

[0039] The target sedimentary layer model may be a three-dimensional model of the sedimentary layer finally determined through model adjustment, and the target sedimentary layer model may be used to characterize the final thickness of the sedimentary layer at different locations within the geological region.

[0040] In an embodiment of the present disclosure, the sediment layer thickness determination device can obtain the first Bouguer gravity data determined by observing the geological area, and the first Bouguer gravity data represents the underground density anomaly of the entire geological area; and can also obtain the first sediment layer thickness at a calibrated position within the geological area, and the first sediment layer thickness represents the more accurate sediment layer thickness determined by measurement at a specific calibrated position within the geological area.

[0041] Furthermore, the sediment layer thickness determination device can use the first sediment layer thickness corresponding to the calibration position as a constraint, perform forward processing and inversion processing based on the first Bouguer gravity data, and perform model adjustment processing with the initial sediment layer model as the initial model to obtain the target sediment layer model.

[0042] Figure 2 A flow chart of another method for determining the thickness of a deposited layer provided in an embodiment of the present disclosure is shown as follows: Figure 2 As shown, in some embodiments of the present disclosure, the initial sedimentary layer model is adjusted based on the first Bouguer gravity data of the geological region and the thickness of the first sedimentary layer at a calibrated position in the geological region to obtain a target sedimentary layer model, including:

[0043] Step 201: Determine an intermediate sedimentary layer model based on the initial sedimentary layer model.

[0044] The intermediate sedimentary layer model may be a sedimentary layer model determined during the process of model adjustment based on the initial sedimentary layer model.

[0045] In this embodiment, the device for determining the thickness of a deposition layer may determine a corresponding intermediate deposition layer model based on the initial deposition layer model according to different model adjustment methods.

[0046] In some embodiments of the present disclosure, the model adjustment method employed may be to first adjust the model in various ways and then determine a final model from multiple adjusted models. Accordingly, determining the intermediate deposition layer model based on the initial deposition layer model includes: adjusting the thickness of the initial deposition layer model according to multiple preset thickness adjustment values, thereby obtaining multiple intermediate deposition layer models corresponding to the multiple thickness adjustment values.

[0047] The thickness adjustment value may be a value for adjusting the thickness of the entire initial sedimentary layer model, and may be set according to geological characteristics of the geological region, etc., and is not limited in this embodiment.

[0048] In this embodiment, the deposition layer thickness determination device can obtain multiple pre-set thickness adjustment values, and for each thickness adjustment value, adjust the deposition layer thickness of the intermediate deposition layer based on the thickness adjustment value to obtain an intermediate deposition layer model that corresponds one-to-one to the thickness adjustment value.

[0049] In some embodiments of the present disclosure, the model adjustment method may be model iteration. Accordingly, determining the intermediate deposition layer model according to the initial deposition layer model includes: determining the initial deposition layer as the intermediate deposition layer model.

[0050] In this embodiment, the initial sedimentary layer model is used as the original model in the model iteration process, and the initial sedimentary layer model is determined as the intermediate sedimentary layer model.

[0051] Step 202: forward model the intermediate sedimentary layer model using a gravity field forward modeling algorithm to obtain second Bouguer gravity data.

[0052] The gravity field forward algorithm can be an algorithm for converting a geological model into Bouguer gravity anomaly data. Due to the significant density difference between the sedimentary layer and the underlying basement, this gravity field forward algorithm can establish a functional relationship between the sedimentary layer thickness and the Bouguer gravity anomaly data. The second Bouguer gravity data is the Bouguer gravity anomaly data determined by forward modeling the sedimentary layer model of the geological region.

[0053] In this embodiment, the sediment layer thickness determination device may use the intermediate sediment layer model as the input of the gravity field forward algorithm to obtain the second Bouguer gravity data corresponding to the intermediate sediment layer model output by the gravity field forward algorithm.

[0054] Step 203 : performing disturbance addition processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model.

[0055] The updated sedimentary layer model may be obtained by adding a disturbance thickness to the intermediate sedimentary layer model. The disturbance thickness may be used to fine-tune the thickness based on the intermediate sedimentary layer model.

[0056] In this embodiment, the sediment layer thickness determination device may perform inversion processing based on the difference between the first Bouguer gravity data and the second Bouguer gravity data, and increase the perturbation thickness of the intermediate sediment layer model based on the inversion result to obtain an updated sediment layer model. The inversion processing may be a process of inferring the spatial morphology of the underground density interface based on the Bouguer gravity anomaly data.

[0057] In some embodiments of the present disclosure, a disturbance-adding process is performed on the intermediate sedimentary layer model based on the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model, including:

[0058] The first Bouguer gravity data and the second Bouguer gravity data are subtracted to obtain Bouguer gravity residual data; the Bouguer gravity residual data are converted to obtain a sedimentary layer disturbance model corresponding to the geological region; and the intermediate sedimentary layer model is updated according to the sedimentary layer disturbance model to obtain an updated sedimentary layer model.

[0059] The Bouguer gravity residual data can represent the difference between the Bouguer gravity data obtained from actual measurements and the Bouguer gravity data obtained through forward modeling based on the sedimentary layer model. The sedimentary layer perturbation model can represent the changes in sedimentary layer thickness based on the intermediate sedimentary layer model and can record the thickness adjustments made to the intermediate sedimentary layer model at different locations.

[0060] In this embodiment, after determining the second Bouguer gravity data through forward modeling, the sediment layer thickness determination device can subtract the second Bouguer gravity data from the first Bouguer gravity data to obtain gravity residual data reflecting the difference between the two Bouguer gravity data. This gravity residual data is then transformed using a gravity field inversion algorithm to obtain a sediment layer disturbance model. Furthermore, for each location, the sediment layer thickness recorded by the sediment layer disturbance model is superimposed on the sediment layer thickness recorded by the intermediate sediment layer model to obtain an updated sediment layer model.

[0061] In the above scheme, by comparing the observed Bouguer gravity data with the Bouguer gravity data obtained by forward modeling, and then performing inversion processing, an updated sedimentary layer model with thickness adjustment at different positions of the intermediate sedimentary layer model is obtained, thereby achieving fine adjustment of the sedimentary layer model through forward modeling and inversion processing.

[0062] Step 204 : determining the thickness of a second deposition layer of the updated deposition layer model at the calibrated position, and determining a thickness error value between the thickness of the second deposition layer and the thickness of the first deposition layer.

[0063] The second sedimentary layer thickness can be the sedimentary layer thickness at the calibration location determined using the sedimentary layer model. The thickness error value can represent the error between the first and second sedimentary layer thicknesses corresponding to each calibration location and is used to evaluate the degree of consistency between the updated sedimentary layer model and the actual sedimentary layer thickness within the geological area.

[0064] In this embodiment, the sediment layer thickness determination device can extract the second sediment layer thickness corresponding to the calibration location based on the updated sediment layer model, and compare the second sediment layer thickness with the first sediment layer thickness obtained from seismic interpretation using an error algorithm to obtain a thickness error value. This embodiment of the present disclosure does not limit the error algorithm; for example, the error algorithm can be a two-norm error algorithm. Figure 3 A schematic diagram of a first deposition layer thickness and an updated deposition layer model provided in an embodiment of the present disclosure, such as Figure 3 As shown, Figure 3 The dots in the figure represent the calibration positions, and the color depth of the dots represents the thickness of the first deposition layer corresponding to the calibration positions. Figure 3The background image in represents the updated sedimentary layer model. The color depth of the background image indicates the thickness of the sedimentary layer at each location in the updated sedimentary layer model. Through adjustments such as model iteration, the thickness of the first sedimentary layer at the same calibration location can be brought closer to the thickness of the sedimentary layer corresponding to the updated sedimentary layer model.

[0065] In some embodiments of the present disclosure, determining a thickness error between the thickness of the second deposition layer and the thickness of the first deposition layer includes:

[0066] Acquire multiple wave velocities. For each wave velocity, determine the first sedimentary layer thickness corresponding to each calibration position based on the wave velocity and the travel time information corresponding to each calibration position, and divide the first sedimentary layer thickness corresponding to the same wave velocity into the same sedimentary layer thickness group; calculate the second sedimentary layer thickness and the thickness error candidate values ​​corresponding to each sedimentary layer thickness group; and determine the minimum value among the thickness error candidate values ​​as the thickness error value.

[0067] The wave velocity can be the speed of wave propagation in the corresponding geological structure, which can be recorded in the regional wave structure data. Travel time information can represent the time interval it takes for a wave to travel from the source, reflect from the underground rock interface, and reach the receiving point. A sediment layer thickness group can include the first sediment layer thickness corresponding to each calibration location determined based on the same wave velocity.

[0068] In some embodiments of the present disclosure, if the wave velocity has been obtained through well logging or geophysical methods, the travel time information corresponding to each calibration position can be converted into the first sedimentary layer thickness corresponding to each calibration position based on the wave velocity, thereby realizing the conversion from the travel time domain to the depth domain, and the first sedimentary layer thickness corresponding to each calibration position is determined. Furthermore, the sedimentary layer thickness determination device can calculate a thickness error value based on the first sedimentary layer thickness and the second sedimentary layer thickness corresponding to each calibration position, and perform subsequent processing based on the thickness error value. In the above scheme, the high-precision wave velocity provides a more accurate spatial position constraint for the subsequent three-dimensional sedimentary layer thickness inversion, which can effectively improve the accuracy of the sedimentary layer thickness inversion results, reduce the non-uniqueness and uncertainty of the sedimentary layer model, and achieve an improvement in the overall inversion quality.

[0069] In some embodiments of the present disclosure, if the wave velocity is an unknown quantity, the wave velocity can be used as a parameter to be solved during the inversion process. The user can pre-set multiple wave velocities based on experience, and the sedimentation layer thickness determination device can obtain these multiple wave velocities. For each wave velocity, the sedimentation layer thickness determination device can convert the travel time information corresponding to each calibration position into the first sedimentation layer thickness corresponding to each calibration position based on the wave velocity. The first sedimentation layer thickness corresponding to the same wave velocity is divided into the same sedimentation layer thickness group, thereby obtaining a sedimentation layer thickness group corresponding to each wave velocity. Furthermore, for each sedimentation layer thickness group, the sedimentation layer thickness determination device can determine a candidate thickness error value corresponding to each wave velocity based on the first sedimentation layer thickness corresponding to each calibration position in the sedimentation layer thickness group and the second sedimentation layer thickness corresponding to the calibration position in the updated sedimentation layer model. The minimum value among the multiple thickness error candidate values ​​is determined as the thickness error value. In the above scheme, the thickness error value is determined when the wave velocity is unknown, which is applicable to a wide range of scenarios and has a certain degree of flexibility.

[0070] Step 205 : determining a target sedimentary layer model according to the thickness error value and the intermediate sedimentary layer model.

[0071] In this embodiment, the deposition layer thickness determining device may determine the corresponding intermediate deposition layer model according to the thickness error value and the intermediate deposition layer model based on different adjustment methods of the initial deposition layer model.

[0072] In some embodiments of the present disclosure, the adjustment method adopted may be to first adjust the model in different ways and then determine a final model from multiple adjusted models. Accordingly, the target deposition layer model is determined based on the thickness error value and the intermediate deposition layer model, including: determining the intermediate deposition layer model corresponding to the minimum value among the multiple thickness error values ​​as the target deposition layer model.

[0073] In this embodiment, after determining the thickness error value corresponding to each intermediate deposition layer model, the deposition layer thickness determination device can determine the minimum value among the multiple thickness error values ​​and determine the intermediate deposition layer model corresponding to the minimum value as the target deposition layer model. In the above solution, the target deposition layer model is determined by enumerating the intermediate deposition layer models, thereby achieving the determination of the target deposition layer model.

[0074] In some embodiments of the present disclosure, the model adjustment method adopted may be model iteration. Accordingly, a target sedimentation layer model is determined based on the thickness error value and the intermediate sedimentation layer model, including: if the thickness error value is not less than the error value threshold, adjusting the thickness of the intermediate sedimentation layer model based on the thickness error value to obtain an adjusted sedimentation layer model; returning the adjusted sedimentation layer model as a new intermediate sedimentation layer model to determine a new thickness error value until an iteration termination condition is satisfied, and determining the new intermediate sedimentation layer model as the target sedimentation layer model.

[0075] The thickness error value may be a pre-set threshold for the thickness error value, and this embodiment does not impose any restrictions on this thickness error value. The adjusted deposition layer model may be a new deposition layer model obtained by adjusting the thickness of the intermediate deposition layer model based on the current thickness error value. The iteration termination condition may be a pre-set condition for terminating model iteration, and this embodiment does not impose any restrictions on this iteration termination condition. For example, the iteration termination condition may include the new thickness error value being less than the error value threshold, or the number of iterations being greater than the number threshold.

[0076] In this embodiment, if the thickness error value is not less than the error value threshold, it means that the current thickness error value is too large. Then, the thickness error value is used as a constraint condition, and the thickness of the intermediate sedimentary layer model is updated through a pre-set error adjustment algorithm to obtain an adjusted sedimentary layer model. The error adjustment algorithm can be a function that calculates the corresponding thickness adjustment size based on the input thickness error value. This embodiment does not limit the error adjustment algorithm. Furthermore, the adjusted sedimentary layer model is returned as the new intermediate sedimentary layer model, and the inversion of the Bouguer gravity anomaly data is re-executed to achieve iterative adjustment of the model thickness, and a new thickness error value corresponding to the new intermediate sedimentary layer model is obtained. Until the new thickness error value is less than the error value threshold, or the number of iterations is greater than the number threshold, the new intermediate sedimentary layer model is determined as the target sedimentary layer model. In the above scheme, the target sedimentary layer model is determined through an iterative method with the thickness error value as a constraint, thereby improving the accuracy of the target sedimentary layer model.

[0077] Because the inversion of Bouguer gravity anomaly data is non-unique, the inversion results are subject to significant spatial errors and uncertainties. The above scheme introduces the thickness of the first sedimentary layer, determined by actual measurements, as an external constraint and correction for the inversion results, thereby improving the accuracy and geological rationality of the final target sedimentary layer model.

[0078] Step 103: Determine the thickness of the sediment layer at the location to be detected in the geological area according to the target sediment layer model.

[0079] The location to be detected may be any location within the geological area.

[0080] In an embodiment of the present disclosure, the device for determining the thickness of a deposition layer may obtain a position to be detected, and query the deposition layer thickness corresponding to the position to be detected in the target deposition layer model.

[0081] The method for determining the sediment layer thickness provided by the embodiment of the present disclosure includes: obtaining an initial sediment layer model corresponding to a geological region; adjusting and processing the initial sediment layer model based on first Bouguer gravity data of the geological region and the first sediment layer thickness at a calibrated position within the geological region to obtain a target sediment layer model; wherein the first Bouguer gravity data is determined by observing the sediment layer of the geological region, and the first sediment layer thickness is determined by measuring the sediment layer at the calibrated position; and determining the sediment layer thickness at the position to be detected within the geological region based on the target sediment layer model. By adopting the above technical solution, on the basis of the initial sedimentary layer model, a large-scale rough adjustment of the initial sedimentary layer model is achieved through the first Bouguer gravity data corresponding to the entire geological area, thereby improving the smooth continuity of the model in a larger range, and the first sedimentary layer thickness corresponding to a specific calibration position in the geological area is used to achieve precise adjustment constraints on the initial sedimentary layer model under specific position constraints, so that the obtained target sedimentary layer model can combine the first Bouguer gravity data caused by density differences and match the measured first sedimentary layer thickness, which significantly reduces the uncertainty of the inversion process, improves the inversion accuracy and the geological rationality of the final determined model, and realizes the determination of sedimentary layer thickness with high accuracy in a larger area at a lower cost.

[0082] In some embodiments of the present disclosure, before adjusting the initial sedimentary layer model based on the first Bouguer gravity data of the geological region and the thickness of the first sedimentary layer at a calibrated position within the geological region to obtain the target sedimentary layer model, the sedimentary layer thickness determination method further includes:

[0083] Original Bouguer gravity data determined by observing the geological area is obtained; the original Bouguer gravity data is filtered according to a wavelength interval corresponding to the sedimentary layer to obtain first Bouguer gravity data.

[0084] The raw Bouguer gravity data can be raw Bouguer gravity anomaly data obtained through ground-based or satellite observations. This raw Bouguer gravity data reflects the combined effects of density differences among different subsurface layers. This raw Bouguer gravity data is influenced by multiple density interfaces, including the sedimentary interface, the Moho discontinuity of the crust, and the bottom of the lithosphere. The wavelength region corresponding to the sedimentary layer can be the wavelength range corresponding to the sedimentary layer in the Bouguer gravity data.

[0085] The deeper the density anomaly interface, the longer the wavelength of the Bouguer gravity anomaly it produces on the surface. Generally speaking, the crust is approximately 40–100 km thick, while the sedimentary layer is typically 0.5–10 km thick. Therefore, the Bouguer gravity anomaly data caused by the density boundary of the sedimentary layer has a shorter spatial wavelength, manifesting as a small-scale gravity anomaly at a local scale. In this embodiment, to effectively extract data related to the sedimentary layer from the raw Bouguer gravity anomaly data, before inverting the sedimentary layer thickness, the sedimentary layer thickness determination device can perform high-pass filtering on the raw Bouguer gravity data based on the wavelength range corresponding to the sedimentary layer to obtain the first Bouguer gravity data.

[0086] In the above scheme, by filtering out long wavelengths, the influence of the deep structure of the Moho surface and the bottom interface of the lithosphere is filtered out, and the short-wavelength Bouguer gravity anomaly data mainly caused by density changes in shallow sediment layers is retained, thereby improving the accuracy and pertinence of subsequent model inversion.

[0087] Next, the method for determining the thickness of the deposited layer in the embodiment of the present disclosure is further explained through a specific example. Figure 4 A schematic diagram of a method for determining the thickness of a deposited layer provided in an embodiment of the present disclosure is shown in FIG. Figure 4 As shown, the method for determining the thickness of the deposited layer includes:

[0088] First, the wave velocity and two-dimensional seismic reflection profile are obtained by collecting and organizing geological prior data and geophysical information.

[0089] Specifically, the wave velocity can be recorded in the regional wave velocity structure data obtained by well logging or geophysical methods. Seismic reflection profiles can be used to characterize the geometric morphology of the stratum interface. The wave velocity can be used selectively according to specific needs. Optionally, the wave velocity can be used as a known input parameter to assist in calculating the thickness of the first sedimentary layer; or the wave velocity can be set as an unknown quantity to be solved during the inversion process, thereby giving the inversion process a certain degree of flexibility. High-precision wave velocity can effectively improve the accuracy of the sedimentary layer thickness inversion results, reduce the non-uniqueness and uncertainty of the sedimentary layer model, and thus improve the overall inversion quality.

[0090] Furthermore, the two-dimensional seismic reflection profile is interpreted according to the wave velocity to obtain the two-dimensional thickness of the first sedimentary layer.

[0091] Specifically, seismic reflection profiles are travel-time domain imaging data, which requires interpretation to identify the interface locations of sedimentary layers and determine the thickness boundaries between layers. This step is key to understanding the formation geometry. If accurate wave velocities are available, travel-time information can be converted into the depth of the first sedimentary layer based on the interpretation. This conversion from the travel-time domain to the depth domain allows accurate determination of the thickness of the first sedimentary layer, providing more accurate spatial position constraints for subsequent three-dimensional sedimentary layer thickness inversion.

[0092] Furthermore, the original Bouguer gravity data determined by satellite observations are subjected to high-pass filtering to obtain the first Bouguer gravity anomaly data.

[0093] Specifically, raw Bouguer gravity data reflects the combined effects of density differences across different subsurface layers, influenced by multiple density interfaces, including those at the sedimentary interface, the crustal Moho, and the base of the lithosphere. The deeper the density anomaly interface, the longer the wavelength of the Bouguer gravity anomaly it produces at the surface. Generally speaking, the crust is approximately 40–100 km thick, while sedimentary layers are typically 0.5–10 km thick. Therefore, the Bouguer anomaly signal caused by density boundaries in the sedimentary layer has a shorter spatial wavelength, manifesting as a small, localized gravity anomaly.

[0094] To effectively extract sediment-related signals from raw Bouguer gravity data, high-pass filtering is performed on the data before inverting the sediment model. By filtering out the long-wavelength influence of deep structures, the short-wavelength gravity anomalies, primarily caused by density changes in shallow sediment layers, are retained. This yields the first Bouguer gravity anomaly data, thereby improving the accuracy and pertinence of subsequent sediment model inversion.

[0095] Furthermore, the model is iteratively corrected based on the first Bouguer gravity anomaly data and the two-dimensional thickness of the first sedimentary layer to obtain a three-dimensional target sedimentary layer model.

[0096] Specifically, changes in the density of the subsurface medium can cause anomalous changes in the surface gravity field. The inversion process involves inferring the spatial morphology of the subsurface density interface based on surface Bouguer gravity data. Because sedimentary layers differ significantly in density from the underlying basement, a functional relationship between sedimentary layer thickness and Bouguer gravity data can be established by constructing a reasonable forward model. The iterative optimization may include: establishing an initial sedimentary layer model based on geological prior information and the thickness of the first sedimentary layer, using the initial sedimentary layer model as an intermediate sedimentary layer model, forward modeling the Bouguer gravity anomaly according to the intermediate sedimentary layer model to obtain second Bouguer gravity data, subtracting the second Bouguer gravity data from the first Bouguer gravity data to obtain Bouguer gravity residual data, converting the Bouguer gravity residual data into a sedimentary layer disturbance model, superimposing the sedimentary layer disturbance model on the intermediate sedimentary layer model to obtain an updated sedimentary layer model, determining the thickness of the second sedimentary layer according to the updated sedimentary layer model, determining a thickness error value according to the thickness of the first sedimentary layer and the thickness of the second sedimentary layer corresponding to each calibration position, and if the thickness error value is not less than an error value threshold, returning to adjust the intermediate sedimentary layer model according to the thickness error value, and repeating the iteration until the thickness error value is less than the error value threshold.

[0097] During the iterative process, the inversion results of the Bouguer gravity anomaly are non-unique, resulting in large spatial errors and uncertainties. To improve model accuracy and geological rationality, the thickness of the first sedimentary layer is introduced to provide external constraints and corrections to the updated sedimentary layer model determined by the inversion.

[0098] The sediment thickness determination method provided by the disclosed embodiments combines Bouguer gravity data with the first sediment layer thickness determined from seismic reflection profiles to construct forward and inversion models for iterative modeling. During the iterative process, the first sediment layer thickness is used as a geometric constraint, enabling dynamic correction of the Bouguer gravity data inversion results and achieving data-driven, accurate inversion of sediment layer thickness. This method organically combines the advantages of Bouguer gravity data's wide range with the high accuracy and resolution of the first sediment layer thickness. It provides precise horizons and geometric boundaries for scenarios such as seismic data hazard assessment, while Bouguer gravity data supplements density information. The complementary nature of these two methods effectively improves the stability and spatial resolution of the inversion. This method reduces reliance on dense seismic and drilling data, saving exploration costs and enabling the cost-effective acquisition of the three-dimensional spatial distribution of sediment layer thickness across a large area of ​​a foreland thrust belt. It exhibits significant advantages in areas where the first sediment layer thickness determined from seismic reflection profiles is relatively sparse. The results are smooth and continuous, demonstrating good adaptability and scalability, and have broad application prospects in fields such as earthquake risk assessment, geological surveys, resource exploration, and project site selection. It demonstrates significant advantages in data utilization efficiency, precision control, engineering feasibility, and environmental protection.

[0099] In addition, by extracting shallow density anomaly signals through high-pass filtering, the physical rationality of the model can be enhanced by introducing prior information such as wave velocity, significantly reducing the non-uniqueness and uncertainty of the inversion results.

[0100] Figure 5 An embodiment of the present disclosure provides a schematic structural diagram of a device for determining the thickness of a deposition layer. The device may be implemented by software and / or hardware, and the device may also be integrated into an electronic device.

[0101] like Figure 5 As shown, the device for determining the thickness of the deposited layer comprises:

[0102] The first acquisition module 501 is used to obtain an initial sedimentary layer model corresponding to the geological region;

[0103] An adjustment module 502 is configured to adjust the initial sedimentary layer model based on first Bouguer gravity data of the geological region and a first sedimentary layer thickness at a calibration location within the geological region to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological region, and the first sedimentary layer thickness is determined by measuring the sedimentary layer at the calibration location;

[0104] The determination module 503 is configured to determine the thickness of the sediment layer at the location to be detected in the geological area according to the target sediment layer model.

[0105] Optionally, the adjustment module 502 includes:

[0106] A first determining submodule is configured to determine an intermediate sedimentary layer model based on the initial sedimentary layer model;

[0107] A forward modeling submodule is used to perform forward modeling on the intermediate sedimentary layer model using a gravity field forward modeling algorithm to obtain second Bouguer gravity data;

[0108] a processing submodule, configured to perform disturbance addition processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model;

[0109] a second determining submodule, configured to determine a thickness of a second sedimentary layer of the updated sedimentary layer model at the calibrated position, and to determine a thickness error value between the thickness of the second sedimentary layer and the thickness of the first sedimentary layer;

[0110] The third determination submodule is configured to determine the target deposition layer model according to the thickness error value and the intermediate deposition layer model.

[0111] Optionally, the first determining submodule is specifically configured to:

[0112] Adjusting the thickness of the initial deposition layer model according to a plurality of preset thickness adjustment values ​​to obtain a plurality of intermediate deposition layer models corresponding to the plurality of thickness adjustment values;

[0113] Accordingly, the third determining submodule is specifically configured to:

[0114] The intermediate deposition layer model corresponding to the minimum value among the plurality of thickness error values ​​is determined as the target deposition layer model.

[0115] Optionally, the first determining submodule is specifically configured to:

[0116] determining the initial sedimentary layer as the intermediate sedimentary layer model;

[0117] Accordingly, the third determining submodule is specifically configured to:

[0118] If the thickness error value is not less than the error value threshold, adjusting the thickness of the intermediate deposition layer model according to the thickness error value to obtain an adjusted deposition layer model;

[0119] The adjusted deposition layer model is returned as a new intermediate deposition layer model to determine a new thickness error value until an iteration termination condition is met, and the new intermediate deposition layer model is determined as the target deposition layer model.

[0120] Optionally, the processing submodule is specifically configured to:

[0121] subtracting the first Bouguer gravity data from the second Bouguer gravity data to obtain Bouguer gravity residual data;

[0122] Converting the Bouguer gravity residual data to obtain a sedimentary layer disturbance model corresponding to the geological region;

[0123] The intermediate sedimentary layer model is updated according to the sedimentary layer disturbance model to obtain the updated sedimentary layer model.

[0124] Optionally, determining a thickness error between the thickness of the second deposition layer and the thickness of the first deposition layer includes:

[0125] Acquire multiple wave velocities, and for each of the wave velocities, determine the first sedimentary layer thickness corresponding to each of the calibration positions based on the wave velocities and travel time information corresponding to each of the calibration positions, and divide the first sedimentary layer thicknesses corresponding to the same wave velocities into the same sedimentary layer thickness group;

[0126] Calculating candidate thickness error values ​​corresponding to the thickness of the second deposition layer and each of the deposition layer thickness groups;

[0127] The minimum value among the thickness error candidate values ​​is determined as the thickness error value.

[0128] Optionally, the device further comprises:

[0129] A second acquisition module is used to acquire original Bouguer gravity data determined by observation of the geological area;

[0130] A filtering module is used to filter the original Bouguer gravity data according to the wavelength range corresponding to the sedimentary layer to obtain the first Bouguer gravity data.

[0131] The device for determining the thickness of a deposition layer provided in the embodiments of the present disclosure can execute the method for determining the thickness of a deposition layer provided in any embodiment of the present disclosure, and has the corresponding functional modules and beneficial effects of the execution method.

[0132] Figure 6 This is a schematic diagram of the structure of an electronic device provided by an embodiment of the present disclosure. Figure 6 As shown, electronic device 600 includes one or more processors 601 and memory 602 .

[0133] The processor 601 may be a central processing unit (CPU) or other forms of processing units having deposition layer thickness determination capability and / or instruction execution capability, and may control other components in the electronic device 600 to perform desired functions.

[0134] The memory 602 may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, random access memory (RAM) and / or cache memory. The non-volatile memory may include, for example, read-only memory (ROM), a hard disk, a flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor 601 may execute the program instructions to implement the deposited layer thickness determination method of the embodiment of the present disclosure described above and / or other desired functions. Various contents such as input signals, signal components, noise components, etc. may also be stored in the computer-readable storage medium.

[0135] In one example, the electronic device 600 may further include an input device 603 and an output device 604 , and these components are interconnected via a bus system and / or other forms of connection mechanisms (not shown).

[0136] In addition, the input device 603 may also include, for example, a keyboard, a mouse, and the like.

[0137] The output device 604 can output various information to the outside, including determined distance information, direction information, etc. The output device 604 can include, for example, a display, a speaker, a printer, a communication network and its connected remote output device, etc.

[0138] Of course, to simplify, Figure 6 Only some of the components related to the present disclosure in the electronic device 600 are shown, and components such as buses, input / output interfaces, etc. are omitted. In addition, the electronic device 600 may further include any other appropriate components according to specific application scenarios.

[0139] In addition to the above-mentioned method and device, the embodiment of the present disclosure may also be a computer program product, which includes computer program instructions. When the computer program instructions are executed by a processor, the processor executes the deposition layer thickness determination method provided by the embodiment of the present disclosure.

[0140] The computer program product may be written in any combination of one or more programming languages ​​to implement the operations of the disclosed embodiments, including object-oriented programming languages ​​such as Java, C++, and conventional procedural programming languages ​​such as C or similar programming languages. The program code may be executed entirely on the user's computing device, partially on the user's computing device, as a standalone software package, partially on the user's computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0141] In addition, the embodiment of the present disclosure may also be a computer-readable storage medium having computer program instructions stored thereon. When the computer program instructions are executed by a processor, the processor executes the deposition layer thickness determination method provided by the embodiment of the present disclosure.

[0142] The computer-readable storage medium can adopt any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can, for example, include but is not limited to a system, device or component of electricity, magnetism, light, electromagnetic, infrared, or semiconductor, or any combination thereof. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof.

[0143] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0144] The foregoing description is intended only to provide specific embodiments of the present disclosure, intended to enable those skilled in the art to understand and implement the present disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present disclosure. Therefore, the present disclosure is not intended to be limited to the embodiments described herein, but rather to be construed in the broadest manner consistent with the principles and novel features disclosed herein.

Claims

1. A method for determining the thickness of a deposited layer, characterized in that: include: Obtaining an initial sedimentary layer model corresponding to the geological area; adjusting the initial sedimentary layer model according to first Bouguer gravity data of the geological region and the thickness of a first sedimentary layer at a calibrated position within the geological region to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological region, and the first sedimentary layer thickness is determined by measuring the sedimentary layer at the calibrated position; The thickness of the sediment layer at the location to be detected in the geological area is determined according to the target sediment layer model.

2. The method according to claim 1, characterized in that The adjusting process of the initial sedimentary layer model according to the first Bouguer gravity data of the geological region and the thickness of the first sedimentary layer at a calibrated position in the geological region to obtain a target sedimentary layer model includes: determining an intermediate sedimentary layer model according to the initial sedimentary layer model; Performing forward processing on the intermediate sedimentary layer model by using a gravity field forward algorithm to obtain second Bouguer gravity data; performing disturbance addition processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model; Determining a second sediment layer thickness of the updated sediment layer model at the calibration position, and determining a thickness error value between the second sediment layer thickness and the first sediment layer thickness; The target deposition layer model is determined according to the thickness error value and the intermediate deposition layer model.

3. The method according to claim 2, characterized in that The determining of the intermediate sedimentary layer model according to the initial sedimentary layer model comprises: Adjusting the thickness of the initial deposition layer model according to a plurality of preset thickness adjustment values ​​to obtain a plurality of intermediate deposition layer models corresponding to the plurality of thickness adjustment values; Accordingly, determining the target deposition layer model according to the thickness error value and the intermediate deposition layer model includes: The intermediate deposition layer model corresponding to the minimum value among the plurality of thickness error values ​​is determined as the target deposition layer model.

4. The method according to claim 2, characterized in that The determining of the intermediate sedimentary layer model according to the initial sedimentary layer model comprises: determining the initial sedimentary layer as the intermediate sedimentary layer model; Accordingly, determining the target deposition layer model according to the thickness error value and the intermediate deposition layer model includes: If the thickness error value is not less than the error value threshold, adjusting the thickness of the intermediate deposition layer model according to the thickness error value to obtain an adjusted deposition layer model; The adjusted deposition layer model is returned as a new intermediate deposition layer model to determine a new thickness error value until an iteration termination condition is met, and the new intermediate deposition layer model is determined as the target deposition layer model.

5. The method according to claim 2, characterized in that The method of performing disturbance addition processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model includes: subtracting the first Bouguer gravity data from the second Bouguer gravity data to obtain Bouguer gravity residual data; Converting the Bouguer gravity residual data to obtain a sedimentary layer disturbance model corresponding to the geological region; The intermediate sedimentary layer model is updated according to the sedimentary layer disturbance model to obtain the updated sedimentary layer model.

6. The method according to claim 2, characterized in that Determining a thickness error between the thickness of the second deposition layer and the thickness of the first deposition layer includes: Acquire multiple wave velocities, and for each of the wave velocities, determine the first sedimentary layer thickness corresponding to each of the calibration positions based on the wave velocities and travel time information corresponding to each of the calibration positions, and divide the first sedimentary layer thicknesses corresponding to the same wave velocities into the same sedimentary layer thickness group; Calculating candidate thickness error values ​​corresponding to the thickness of the second deposition layer and each of the deposition layer thickness groups; The minimum value among the thickness error candidate values ​​is determined as the thickness error value.

7. The method according to claim 1, characterized in that The method further comprises: obtaining original Bouguer gravity data determined by observation of the geological area; The original Bouguer gravity data is filtered according to the wavelength range corresponding to the sedimentary layer to obtain the first Bouguer gravity data.

8. A device for determining the thickness of a deposited layer, characterized in that: include: The first acquisition module is used to obtain an initial sedimentary layer model corresponding to the geological area; an adjustment module, configured to adjust the initial sedimentary layer model based on first Bouguer gravity data of the geological region and a first sedimentary layer thickness at a calibrated position within the geological region to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological region, and the first sedimentary layer thickness is determined by measuring the sedimentary layer at the calibrated position; The determination module is used to determine the thickness of the sediment layer at the location to be detected in the geological area according to the target sediment layer model.

9. An electronic device, characterized in that: The electronic device comprises: processor; a memory for storing instructions executable by the processor; The processor is configured to read the executable instructions from the memory and execute the instructions to implement the deposition layer thickness determination method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The storage medium stores a computer program, and the computer program is used to execute the method for determining the thickness of a deposited layer according to any one of claims 1 to 7.

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