IPM intelligent power module break-over voltage loss test method and related equipment

Abstract

The invention provides an IPM intelligent power module conduction voltage loss test method and related equipment, and relates to the technical field of electronic circuits. The PI controller is adopted to track and control the two current values, the corresponding first voltage loss value and the second voltage loss value are obtained, the switching voltage loss value and the dead time voltage loss value of the two tests are equal, the influence of the fixed loss can be eliminated by calculating the difference between the switching voltage loss value and the dead time voltage loss value, and the reliability of the system is improved. And the conduction voltage loss value corresponding to the current instruction value can be accurately obtained without an additional compensation circuit. According to the invention, the internal resistance of the IPM intelligent power device can be calculated based on the obtained conduction voltage loss value and the current instruction value, and then the target conduction voltage loss value under any current condition is predicted, so that the demand of carrying out an actual test on each working current point is avoided. Compared with a traditional method needing a complex compensation circuit or a large number of test points, the method can reduce the test cost while guaranteeing the test accuracy.

Description

Technical Field

[0001] The present application relates to the field of electronic circuit technology, and in particular to a method for testing the on-state voltage loss of an IPM intelligent power module and related equipment. Background Art

[0002] An Intelligent Power Module (IPM) is a modular power electronic device that integrates power switching devices (such as IGBTs or MOSFETs) and driver circuits. It is widely used in industrial automation, motor drives, new energy vehicles, and other fields. IPM modules offer advantages such as high efficiency, high integration, and convenience. However, in actual use, the on-state voltage loss of their internal power switching devices directly affects control accuracy and system efficiency. Therefore, to ensure high system accuracy and stability, the on-state voltage loss of the IPM module must be accurately tested and compensated to reduce control errors.

[0003] Related technologies typically test conduction voltage loss by adding current and voltage sensors to the switching transistors of IPM modules. This method calculates conduction loss by measuring the current and voltage of the switching device in real time. However, in practice, this method requires high sensor precision to ensure measurement accuracy, resulting in high testing costs. Summary of the Invention

[0004] The present application provides a method and related equipment for testing the conduction voltage loss of an IPM intelligent power module, which can reduce the testing cost while ensuring the test accuracy.

[0005] In a first aspect, the present application provides a method for testing an IPM intelligent power module on-state voltage loss, the method comprising: Connecting the IPM intelligent power module to a test circuit and inputting a current command value into the IPM intelligent power module; Keeping the switching frequency, the operating frequency, and the dead time unchanged, outputting a first current value and a second current value to the test circuit respectively, wherein the first current value is twice the second current value; Using a PI controller in the test circuit to track and control the first current value and the second current value respectively, to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value; Calculating a difference between the first voltage loss value and the second voltage loss value to obtain a conduction voltage loss value corresponding to the current command value; Calculating the internal resistance of the IPM intelligent power device according to the on-state voltage loss value and the current command value; Based on the internal resistance of the IPM intelligent power device, the target on-state voltage loss value of the IPM intelligent power module under different current conditions is calculated.

[0006] By adopting the above technical solution, a PI controller is used to track and control these two current values ​​to obtain the corresponding first and second voltage loss values. Since the switching voltage loss values ​​and dead time voltage loss values ​​of the two tests are equal, the influence of these fixed losses can be eliminated by calculating the difference between the two. The on-state voltage loss value corresponding to the current command value can be accurately obtained without the need for additional compensation circuits. Based on the obtained on-state voltage loss value and current command value, the internal resistance of the IPM intelligent power device can be calculated, and the target on-state voltage loss value under any current conditions can be predicted, avoiding the need for actual testing at each operating current point. Compared with traditional methods that require complex compensation circuits or a large number of test points, this method can reduce testing costs while ensuring test accuracy.

[0007] Optionally, the first voltage loss value is the sum of a first switching voltage loss value, a first dead time voltage loss value, and a first conduction voltage loss value; the second voltage loss value is the sum of a second switching voltage loss value, a second dead time voltage loss value, and a second conduction voltage loss value, wherein: The first switch voltage loss value is equal to the second switch voltage loss value; The first dead time voltage loss value is equal to the second dead time voltage loss value; The first conduction voltage loss value is equal to twice the second conduction voltage loss value.

[0008] By adopting the above technical solution, since the first on-state voltage loss value is equal to twice the second on-state voltage loss value, the on-state voltage loss value can be directly obtained after the difference calculation, without considering the influence of switching loss and dead time loss, thereby ensuring the accuracy of the on-state voltage loss test results.

[0009] Optionally, the adopting a PI controller in the test circuit to track and control the first current value and the second current value respectively to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value includes: inputting a difference between the current command value and the first current value into a PI controller in the test circuit to obtain a first voltage loss value corresponding to the first current value; The difference between the current command value and the second current value is input into a PI controller in the test circuit to obtain a second voltage loss value corresponding to the second current value.

[0010] By adopting the above technical solution, by inputting the difference between the current command value and the first current value, and the difference between the current command value and the second current value into the PI controller in the test circuit, accurate tracking and control of the first current value and the second current value can be achieved, thereby obtaining the corresponding first voltage loss value and the second voltage loss value. The PI controller can adjust the control amount in real time according to the input current difference, so that the actual current value can quickly and stably track the current command value, eliminating current fluctuations during the measurement process, thereby ensuring the accuracy and reliability of the measurement results of the first voltage loss value and the second voltage loss value. Optionally, in response to the input third current value, Ohm's law is used to calculate the product of the internal resistance of the IPM intelligent power device and the third current value to obtain a target on-state voltage loss value corresponding to the third current value.

[0011] By adopting this technical solution, Ohm's law is used to calculate the product of the IPM intelligent power device's internal resistance and the input third current value, directly obtaining the target on-state voltage loss value corresponding to the third current value, eliminating the need for actual testing at each operating current point. Based on the known internal resistance of the IPM intelligent power device, this method uses simple mathematical calculations to quickly and accurately predict the on-state voltage loss value at any current operating point.

[0012] In a second aspect, the present application provides a test circuit for an IPM intelligent power module on-state voltage loss, the test circuit comprising a PI controller, an adder, a subtractor, an analog resistor, and a load resistor, wherein: The IPM intelligent power module is connected to the first input terminal of the subtractor via the adder, and the IPM intelligent power module is connected to the first input terminal of the adder via the analog resistor; The input end of the PI controller is connected to the output end of the subtractor, and the output end of the PI controller is connected to the second input end of the adder; The output terminal of the adder is connected to the second input terminal of the subtractor via the load resistor.

[0013] Optionally, the resistance value of the simulation resistor in the test circuit is set to be the same as the resistance value of the load resistor.

[0014] Optionally, the acquisition frequency of the first current value and the second current value is set to 0.1 Hz.

[0015] In a third aspect, the present application provides a system for testing an IPM intelligent power module conduction voltage loss, the system comprising: an initialization module, configured to connect the IPM intelligent power module to a test circuit and input a current command value into the IPM intelligent power module; a test module, configured to maintain a switching frequency, an operating frequency, and a dead time unchanged, and output a first current value and a second current value to the test circuit, respectively, wherein the first current value is twice the second current value; a control module, configured to use a PI controller in the test circuit to track and control the first current value and the second current value, respectively, to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value; a first calculation module, configured to calculate a difference between the first voltage loss value and the second voltage loss value to obtain a conduction voltage loss value corresponding to the current command value; A second calculation module is used to calculate the internal resistance of the IPM intelligent power device according to the conduction voltage loss value and the current command value; The processing module is used to calculate the target on-state voltage loss value of the IPM intelligent power module under different current conditions based on the internal resistance of the IPM intelligent power device.

[0016] In a fourth aspect, the present application provides a computer storage medium, which stores a plurality of instructions, and the instructions are suitable for being loaded by a processor and executing any one of the above methods.

[0017] In a fifth aspect, the present application provides an electronic device comprising a processor, a memory and a transceiver, wherein the memory is used to store instructions, the transceiver is used to communicate with other devices, and the processor is used to execute the instructions stored in the memory so that the electronic device performs any one of the above methods.

[0018] In summary, the beneficial effects brought about by the technical solution of this application include: By adopting the above technical solution, a PI controller is used to track and control these two current values ​​to obtain the corresponding first and second voltage loss values. Since the switching voltage loss values ​​and dead time voltage loss values ​​of the two tests are equal, the influence of these fixed losses can be eliminated by calculating the difference between the two. The on-state voltage loss value corresponding to the current command value can be accurately obtained without the need for additional compensation circuits. Based on the obtained on-state voltage loss value and current command value, the internal resistance of the IPM intelligent power device can be calculated, and the target on-state voltage loss value under any current conditions can be predicted, avoiding the need for actual testing at each operating current point. Compared with traditional methods that require complex compensation circuits or a large number of test points, this method can reduce testing costs while ensuring test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a flow chart of a method for testing the on-state voltage loss of an IPM intelligent power module according to an embodiment of the present application; Figure 2 This is a schematic diagram of a test circuit for an IPM intelligent power module on-state voltage loss provided in an embodiment of the present application; Figure 3 This is a structural diagram of a test system for an IPM intelligent power module on-state voltage loss according to an embodiment of the present application; Figure 4 This is a structural diagram of an electronic device provided in an embodiment of the present application.

[0020] Description of reference numerals: 400, electronic device; 401, processor; 402, communication bus; 403, user interface; 404, network interface; 405, memory. DETAILED DESCRIPTION

[0021] In order to enable people skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of this specification will be clearly and completely described below in conjunction with the drawings in the embodiments of this specification. Obviously, the described embodiments are only part of the embodiments of this application, not all of the embodiments.

[0022] In the description of the embodiments of this application, words such as "exemplary," "for example," or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary," "for example," or "for example" in the embodiments of this application should not be construed as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary," "for example," or "for example" is intended to present the relevant concepts in a concrete manner.

[0023] In the description of the embodiments of the present application, the term "multiple" means two or more. For example, multiple systems refer to two or more systems, and multiple screen terminals refer to two or more screen terminals. In addition, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized.

[0024] See Figure 1The following is a flow chart of a method for testing the on-state voltage loss of an IPM intelligent power module, provided in an embodiment of the present application. This method can be implemented using a computer program, a single-chip microcomputer, or run on a von Neumann-based IPM intelligent power module on-state voltage loss testing system. The computer program can be integrated into an application or run as a standalone tool application. The specific steps of the method for testing the on-state voltage loss of an IPM intelligent power module are described in detail below.

[0025] S101: Connect the IPM intelligent power module to the test circuit, and input a current command value into the IPM intelligent power module.

[0026] The current command value refers to the target current value set during the IPM intelligent power module test process, and in the embodiment of the present application, it can be understood as the expected current size that the IPM module to be tested needs to achieve under a stable working state.

[0027] In specific implementations, the output of the IPM intelligent power module is connected to the first input of a subtractor via an adder. Simultaneously, the IPM intelligent power module is connected to the first input of the adder via an analog resistor. This connection allows for precise acquisition and control of the IPM intelligent power module's output current. Once connected, a preset current command value is input to the IPM intelligent power module via the control system, serving as a reference signal for subsequent testing.

[0028] See Figure 2 , is a schematic diagram of the structure of a test circuit for on-state voltage loss of an IPM intelligent power module provided in an embodiment of the present application, which specifically includes a PI controller, an adder, a subtractor, an analog resistor, and a load resistor, wherein: The IPM intelligent power module is connected to the first input terminal of the subtractor via the adder, and the IPM intelligent power module is connected to the first input terminal of the adder via the analog resistor; The input end of the PI controller is connected to the output end of the subtractor, and the output end of the PI controller is connected to the second input end of the adder; The output terminal of the adder is connected to the second input terminal of the subtractor via a load resistor.

[0029] Specifically, the test circuit employs a current closed-loop control structure, using the input current command value I as a given signal to accurately measure the conduction voltage loss of the IPM intelligent power module. After the current command value I is input, a subtractor compares it with the actual current value I measured through the load resistor R to generate a current deviation signal. This deviation signal is then processed by a PI controller, which outputs a corresponding control signal through proportional and integral functions. The control signal is then superimposed on the feedback voltage from the analog resistor R0 through an adder to form a voltage command value V*. This voltage command value V is applied to the load resistor R, generating the actual current I. The actual current I returns to the negative input of the subtractor through a feedback loop and is compared with the current command value I, thus forming a complete closed-loop control system.

[0030] During this closed-loop control process, the PI controller continuously adjusts its output, causing the actual current I to gradually approach the current command value I* until the system reaches steady state. When the system stabilizes, the actual current I accurately tracks the current command value I*, allowing the corresponding voltage loss to be accurately measured. By varying the current command value I*, voltage loss values ​​can be obtained under different current conditions.

[0031] Specifically, the resistance value of the simulation resistor in the test circuit is set to be the same as the resistance value of the load resistor.

[0032] In this embodiment, when the two resistors have equal values, the feedback voltage generated by the simulated resistor and the actual voltage across the load resistor will exhibit the same variation characteristics, helping the system establish an accurate voltage-current relationship. Under the PI controller, the voltage command is superimposed on the simulated resistor's feedback voltage via an adder and then applied to the load resistor. Because the two resistors have the same value, the system can more accurately track the current command value, reducing measurement errors.

[0033] Specifically, the acquisition frequency of the first current value and the second current value is set to 0.1 Hz.

[0034] In an embodiment of the present application, the acquisition frequency of the first current value and the second current value is set to 0.1 Hz, mainly considering the influence of the motor inductance during the actual test process. The inductance existing in the motor winding will generate inductive reactance, and its inductive reactance value is proportional to the current frequency. When the test current frequency is high, the inductive reactance will increase significantly. This inductive reactance will interfere with the measurement of voltage loss, causing the measured voltage value to deviate from the actual conduction voltage drop of the IPM intelligent power module. By reducing the test current frequency to 0.1 Hz, the influence of the inductive reactance value can be effectively reduced, making the measurement result closer to the actual conduction characteristic of the IPM module. In specific implementation, a sampling clock of 0.1 Hz is set by the sampling control module of the system, and current data is collected every 10 seconds.

[0035] S102: Keep the switching frequency, operating frequency, and dead time unchanged, and output a first current value and a second current value to the test circuit respectively, where the first current value is twice the second current value.

[0036] The first current value refers to the larger current value output by the test circuit while keeping the switching frequency, operating frequency, and dead time unchanged. The second current value refers to the smaller current value output by the test circuit while keeping the switching frequency, operating frequency, and dead time unchanged, and this current value is half of the first current value. Since the second current value is half of the first current value, according to the characteristic that the on-state voltage loss is proportional to the current, the on-state voltage loss generated by the second current value should also be half of the on-state voltage loss generated by the first current value, while the switching loss and dead time loss remain unchanged at the two current values. By measuring the total voltage loss generated by these two different current values ​​and utilizing the numerical relationship between them, the influence of the switching loss and dead time loss can be eliminated, thereby accurately calculating the on-state voltage loss value of the IPM intelligent power module under different current conditions.

[0037] During testing, to accurately determine the on-state voltage loss of the IPM intelligent power module, it is necessary to eliminate interference from other factors. During operation, the IPM intelligent power module generates three main voltage losses: switching loss, dead-time loss, and on-state voltage loss. Switching loss is the energy loss caused by the overlap of voltage and current during the switching process of the power device. The switching frequency determines the number of switches per unit time; the operating frequency represents the basic operating cycle of the IPM intelligent power module; and the dead-time is the time interval set to prevent the upper and lower transistors of the bridge arm from being turned on simultaneously, which generates corresponding voltage loss. By maintaining these three parameters constant during testing, the switching and dead-time losses can be ensured to remain constant at different test currents. Furthermore, since the on-state voltage loss is linearly related to the current, while the switching and dead-time losses are independent of the current, the on-state voltage loss generated under the first current value will be twice that under the second current value, while the switching and dead-time losses remain the same under both operating conditions.

[0038] S103: Using a PI controller in the test circuit to track and control the first current value and the second current value respectively, to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value.

[0039] The first voltage loss value refers to the total voltage loss value of the IPM intelligent power module obtained by tracking and controlling the PI controller when the test circuit outputs the first current value. This loss value includes the sum of the first switching voltage loss value, the first dead-time voltage loss value, and the first conduction voltage loss value. In the embodiment of the present application, it can be understood as the voltage value that needs to be compensated when the PI controller performs closed-loop control of the first current value in order to make the actual current reach the current command value.

[0040] The second voltage loss value refers to the total voltage loss value of the IPM intelligent power module obtained by tracking and controlling the PI controller when the test circuit outputs the second current value. This loss value includes the sum of the second switching voltage loss value, the second dead-time voltage loss value, and the second conduction voltage loss value. In the embodiment of the present application, it can be understood as the voltage value required to compensate for the actual current to reach the current command value when the PI controller performs closed-loop control of the second current value.

[0041] During the on-state voltage loss test of an IPM intelligent power module, a PI controller is required to accurately track and control the current. The PI controller, through its proportional and integral functions, can quickly respond to current deviations and achieve stable control. First, the current command value is compared with the actual detected first current value to generate a current deviation signal, which is then fed into the PI controller for processing. Based on the deviation signal, the PI controller calculates a corresponding compensation voltage, which is the first voltage loss value. This compensation voltage comprises the first switching voltage loss value, the first dead-time voltage loss value, and the first on-state voltage loss value. Similarly, when a second current value is input, the PI controller calculates a second voltage loss value based on the current deviation, comprising the second switching voltage loss value, the second dead-time voltage loss value, and the second on-state voltage loss value. Because the switching frequency, operating frequency, and dead-time remain constant during the test, the switching loss and dead-time loss in the first and second voltage loss values ​​remain equal, while the on-state voltage loss is proportional to the current value.

[0042] Specifically, the first voltage loss value is the sum of the first switching voltage loss value, the first dead time voltage loss value, and the first conduction voltage loss value; the second voltage loss value is the sum of the second switching voltage loss value, the second dead time voltage loss value, and the second conduction voltage loss value, wherein: The first switch voltage loss value is equal to the second switch voltage loss value; The voltage loss value during the first dead time is equal to the voltage loss value during the second dead time; The first conduction voltage loss value is equal to twice the second conduction voltage loss value.

[0043] In this embodiment, the first and second voltage loss values ​​measured by the PI controller are each composed of three components: a switching voltage loss, a dead-time voltage loss, and a conduction voltage loss. Switching voltage loss is caused by the voltage-current overlap during the switching process of a power device. At the same switching frequency, switching loss is primarily determined by the voltage stress during the switching process and has little to do with the current magnitude. Therefore, the first switching voltage loss equals the second switching voltage loss. Dead-time voltage loss is caused by the dead time set to prevent bridge arm shoot-through. When the dead time remains constant, its loss primarily depends on the voltage stress during the dead time and has little to do with the current magnitude. Therefore, the first dead-time voltage loss equals the second dead-time voltage loss. The conduction voltage loss is primarily determined by the product of the IPM's internal resistance and the current passing through it, which exhibits a linear relationship. Therefore, when the first current is twice the second current, the first conduction voltage loss naturally equals twice the second conduction voltage loss. By establishing this mathematical relationship between the voltage loss components, the effects of switching loss and dead-time loss can be eliminated in subsequent calculations, resulting in an accurate determination of the conduction voltage loss.

[0044] In an optional embodiment, the difference between the current command value and the first current value is input into a PI controller in the test circuit to obtain a first voltage loss value corresponding to the first current value; The difference between the current command value and the second current value is input into a PI controller in the test circuit to obtain a second voltage loss value corresponding to the second current value.

[0045] During specific implementation, the current command value is first compared with the actually detected first current value to obtain a current deviation signal. After receiving the deviation signal, the PI controller calculates the voltage value that needs to be compensated through the synergistic effect of the proportional link and the integral link. The proportional link can quickly respond to deviation changes, while the integral link can eliminate steady-state errors to ensure that the output current can accurately track the current command value. The compensation voltage output by the PI controller is the first voltage loss value, which includes all loss components of the IPM intelligent power module under the first current value condition. The same control process is also applied to the test of the second current value. The second voltage loss value is obtained by inputting the difference between the current command value and the second current value into the PI controller. This test method based on closed-loop control can effectively overcome the influence of adverse factors such as system parameter fluctuations and external interference, and ensure the accuracy and reliability of the measured voltage loss value.

[0046] S104: Calculate the difference between the first voltage loss value and the second voltage loss value to obtain a conduction voltage loss value corresponding to the current command value.

[0047] In this embodiment, since both the first and second voltage loss values ​​include equal switching voltage loss and dead-time voltage loss values, and the conduction voltage loss value is proportional to the current, calculating the difference between these two voltage loss values ​​effectively eliminates the effects of switching loss and dead-time loss. Specifically, the first voltage loss value includes the first switching voltage loss value, the first dead-time voltage loss value, and the first conduction voltage loss value, while the second voltage loss value includes the second switching voltage loss value, the second dead-time voltage loss value, and the second conduction voltage loss value. When calculating the difference between the two, the equal switching voltage loss value and the dead-time voltage loss value cancel each other out, leaving a difference equal to the difference between the first and second conduction voltage loss values, i.e., the conduction voltage loss value corresponding to the current command value.

[0048] S105: Calculating the internal resistance of the IPM intelligent power device according to the on-state voltage loss value and the current command value.

[0049] In this embodiment, after obtaining the on-state voltage loss value, in order to quickly predict the on-state voltage loss of the IPM intelligent power module at any operating current, it is necessary to calculate its internal resistance value. According to Ohm's law, the on-state voltage loss value is equal to the product of the internal resistance and the current. Therefore, the internal resistance of the IPM intelligent power module can be calculated by dividing the on-state voltage loss value by the current command value. This calculation method is based on the linear relationship between the on-state voltage loss and the current, and uses known test data to reversely calculate the internal resistance value. Since the effects of switching loss and dead time loss have been eliminated during the test process, the calculated internal resistance value can accurately reflect the on-state characteristics of the IPM intelligent power module.

[0050] S106: Calculating target on-state voltage loss values ​​of the IPM intelligent power module under different current conditions based on the internal resistance of the IPM intelligent power device.

[0051] In this embodiment, since the on-state voltage loss is primarily determined by the internal resistance of the IPM intelligent power module and is linearly related to the current, the corresponding target on-state voltage loss value can be obtained by simply multiplying the known internal resistance value by the target operating current. This internal resistance calculation method eliminates the need for repeated complex experimental testing and avoids the tedious steps of eliminating the effects of switching loss and dead time loss for each test. Furthermore, because the calculation process is directly based on the physical characteristics of the on-state loss, the resulting target on-state voltage loss value has a high degree of accuracy.

[0052] In an optional implementation, in response to the input third current value, Ohm's law is used to calculate the product of the internal resistance of the IPM intelligent power device and the third current value to obtain a target on-state voltage loss value corresponding to the third current value.

[0053] After obtaining the internal resistance of the IPM intelligent power module, the on-state voltage loss at any current value can be directly calculated based on Ohm's law, thus avoiding repeated complex experimental tests. When it is necessary to obtain the on-state voltage loss corresponding to the third current value, it is only necessary to multiply the known internal resistance of the IPM intelligent power module by the input third current value to obtain the target on-state voltage loss value. This calculation method is based on the physical property that the on-state voltage loss is proportional to the current and conforms to the basic principle of Ohm's law. Compared with traditional experimental test methods, this method based on internal resistance calculation has the advantages of simple operation and fast calculation, and can quickly obtain the on-state voltage loss value at any operating current. At the same time, since the calculation process does not involve actual testing and is not affected by switching loss and dead time loss, the calculated target on-state voltage loss value has a higher accuracy.

[0054] The following are system embodiments of the present application, which can be used to implement the method embodiments of the present application. For details not disclosed in the system embodiments of the present application, please refer to the method embodiments of the present application.

[0055] See Figure 3 , which shows a schematic diagram of the structure of an IPM intelligent power module conduction voltage loss test system provided by an exemplary embodiment of the present application. The system can be implemented as all or part of a system through software, hardware, or a combination of both. The IPM intelligent power module conduction voltage loss test system includes: An initialization module is used to connect the IPM intelligent power module to the test circuit and input a current command value to the IPM intelligent power module; a test module, configured to maintain a switching frequency, an operating frequency, and a dead time constant, and output a first current value and a second current value to a test circuit, respectively, wherein the first current value is twice the second current value; a control module, configured to use a PI controller in the test circuit to track and control the first current value and the second current value, respectively, to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value; A first calculation module is used to calculate the difference between the first voltage loss value and the second voltage loss value to obtain a conduction voltage loss value corresponding to the current command value; The second calculation module is used to calculate the internal resistance of the IPM intelligent power device according to the conduction voltage loss value and the current command value; The processing module is used to calculate the target on-state voltage loss value of the IPM intelligent power module under different current conditions based on the internal resistance of the IPM intelligent power device.

[0056] An embodiment of the present application also provides a computer storage medium, which can store multiple instructions. The instructions are suitable for being loaded and executed by a processor for the test method for the on-state voltage loss of the IPM intelligent power module as in the above embodiment. The specific execution process can be found in the specific description of the embodiment and will not be repeated here.

[0057] See Figure 3 , is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Figure 3 As shown, the electronic device 400 may include: at least one processor 401 , at least one network interface 404 , a user interface 403 , a memory 405 , and at least one communication bus 402 .

[0058] The communication bus 402 is used to implement the connection and communication between these components.

[0059] The user interface 403 may include a standard wired interface or a wireless interface.

[0060] The network interface 404 may optionally include a standard wired interface or a wireless interface (such as a WI-FI interface).

[0061] Processor 401 may include one or more processing cores. Using various interfaces and circuits, processor 401 connects to various components within the server. It executes instructions, programs, code sets, or instruction sets stored in memory 405, as well as accesses data stored in memory 405, to perform various server functions and process data. Optionally, processor 401 may be implemented using at least one of the following hardware forms: a digital signal processing (DSP), a field-programmable gate array (FPGA), or a programmable logic array (PLA). Processor 401 may integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. The CPU primarily processes the operating system, user interface, and application programs; the GPU is responsible for rendering and drawing content displayed on the display screen; and the modem handles wireless communications. It is understood that the modem may also be implemented independently of the processor 401 and implemented as a separate chip.

[0062] Among them, the memory 405 may include a random access memory (RAM) or a read-only memory (Read-Only Memory). Optionally, the memory 405 includes a non-transitory computer-readable storage medium. The memory 405 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 405 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc.; the data storage area may store data involved in the above-mentioned various method embodiments, etc. The memory 405 may also be optionally at least one storage device located away from the aforementioned processor 401. As Figure 3 As shown, the memory 405 as a computer storage medium may include an operating system, a network communication module, a user interface module, and an application program for a method for testing an on-state voltage loss of an IPM intelligent power module.

[0063] exist Figure 3 In the electronic device 400 shown, the user interface 403 is mainly used to provide an input interface for the user and obtain data input by the user; and the processor 401 can be used to call an application program stored in the memory 405 for a method for testing the conduction voltage loss of an IPM intelligent power module. When executed by one or more processors, the electronic device executes one or more methods in the above-mentioned embodiments.

[0064] An electronic device readable storage medium stores instructions, which, when executed by one or more processors, enable the electronic device to execute one or more methods in the above embodiments.

[0065] It should be noted that for the aforementioned method embodiments, for simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required for this application.

[0066] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0067] In the several embodiments provided in this application, it should be understood that the disclosed devices can be implemented in other ways. For example, the device embodiments described above are merely schematic, such as the division of units, which is only a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some service interface, and the indirect coupling or communication connection of devices or units can be electrical or other forms.

[0068] Units described as separate components may or may not be physically separate, and components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0069] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0070] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of this application, or the portion that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the various embodiments of the method of this application. The aforementioned memory includes various media that can store program code, such as USB flash drives, mobile hard drives, magnetic disks, or optical disks.

[0071] The above are merely exemplary embodiments of the present disclosure and are not intended to limit the scope of the present disclosure. That is, any equivalent changes and modifications made in accordance with the teachings of the present disclosure are still within the scope of the present disclosure. After considering the disclosure of the specification and the truth of practice, those skilled in the art will easily think of other embodiments of the present disclosure. This application is intended to cover any variations, uses or adaptive changes of the present disclosure, which follow the general principles of the present disclosure and include common knowledge or customary technical means in the field of the present technology that are not recorded in the present disclosure.

Claims

1. A method for testing the conduction voltage loss of an IPM intelligent power module, characterized in that: The method comprises: Connecting the IPM intelligent power module to a test circuit and inputting a current command value into the IPM intelligent power module; Keeping the switching frequency, the operating frequency, and the dead time unchanged, outputting a first current value and a second current value to the test circuit respectively, wherein the first current value is twice the second current value; Using a PI controller in the test circuit to track and control the first current value and the second current value respectively, to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value; Calculating a difference between the first voltage loss value and the second voltage loss value to obtain a conduction voltage loss value corresponding to the current command value; Calculating the internal resistance of the IPM intelligent power device according to the on-state voltage loss value and the current command value; Based on the internal resistance of the IPM intelligent power device, the target on-state voltage loss value of the IPM intelligent power module under different current conditions is calculated.

2. The method according to claim 1, characterized in that The first voltage loss value is the sum of the first switching voltage loss value, the first dead time voltage loss value, and the first conduction voltage loss value; the second voltage loss value is the sum of the second switching voltage loss value, the second dead time voltage loss value, and the second conduction voltage loss value, wherein: The first switch voltage loss value is equal to the second switch voltage loss value; The first dead time voltage loss value is equal to the second dead time voltage loss value; The first conduction voltage loss value is equal to twice the second conduction voltage loss value.

3. The method according to claim 1, characterized in that The method of using a PI controller in the test circuit to track and control the first current value and the second current value respectively to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value includes: inputting a difference between the current command value and the first current value into a PI controller in the test circuit to obtain a first voltage loss value corresponding to the first current value; The difference between the current command value and the second current value is input into a PI controller in the test circuit to obtain a second voltage loss value corresponding to the second current value.

4. The method according to claim 1, wherein The calculating, based on the internal resistance of the IPM intelligent power device, the target on-state voltage loss value of the IPM intelligent power module under different current conditions includes: In response to the input third current value, Ohm's law is used to calculate the product of the internal resistance of the IPM intelligent power device and the third current value to obtain a target on-state voltage loss value corresponding to the third current value.

5. A test circuit for on-state voltage loss of an IPM intelligent power module, applied to the test method for on-state voltage loss of an IPM intelligent power module according to any one of claims 1 to 4, characterized in that: The test circuit includes a PI controller, an adder, a subtractor, an analog resistor, and a load resistor, wherein: The IPM intelligent power module is connected to the first input terminal of the subtractor via the adder, and the IPM intelligent power module is connected to the first input terminal of the adder via the analog resistor; The input end of the PI controller is connected to the output end of the subtractor, and the output end of the PI controller is connected to the second input end of the adder; The output terminal of the adder is connected to the second input terminal of the subtractor via the load resistor.

6. The test circuit according to claim 5, characterized in that: The resistance value of the simulation resistor in the test circuit is set to be the same as the resistance value of the load resistor.

7. The test circuit according to claim 5, characterized in that: The acquisition frequency of the first current value and the second current value is set to 0.1 Hz.

8. A test system for IPM intelligent power module conduction voltage loss, characterized in that: The system comprises: an initialization module, configured to connect the IPM intelligent power module to a test circuit and input a current command value into the IPM intelligent power module; a test module, configured to maintain a switching frequency, an operating frequency, and a dead time unchanged, and output a first current value and a second current value to the test circuit, respectively, wherein the first current value is twice the second current value; a control module, configured to use a PI controller in the test circuit to track and control the first current value and the second current value, respectively, to obtain a first voltage loss value corresponding to the first current value and a second voltage loss value corresponding to the second current value; a first calculation module, configured to calculate a difference between the first voltage loss value and the second voltage loss value to obtain a conduction voltage loss value corresponding to the current command value; A second calculation module is used to calculate the internal resistance of the IPM intelligent power device according to the conduction voltage loss value and the current command value; The processing module is used to calculate the target on-state voltage loss value of the IPM intelligent power module under different current conditions based on the internal resistance of the IPM intelligent power device.

9. A computer storage medium, characterized in that The computer storage medium stores a plurality of instructions, and the instructions are suitable for being loaded by a processor and executing the method according to any one of claims 1 to 4.

10. An electronic device, characterized in that: The electronic device comprises a processor, a memory and a transceiver, wherein the memory is used to store instructions, the transceiver is used to communicate with other devices, and the processor is used to execute the instructions stored in the memory so that the electronic device executes the method according to any one of claims 1 to 4.

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