Safety test method and system based on ultraviolet laser element

Abstract

The invention discloses a safety test method and system based on an ultraviolet laser element, and relates to the technical field of element leakage current test. The safety test method based on the ultraviolet laser element comprises the following steps of ground loop interference detection, common-mode interference detection judgment and leakage test result output. Whether the loop interference suppression optimization instruction is sent or not is judged according to the loop interference detection result, if not, the leakage current test primary adjustment instruction is sent, and if not, the common-mode interference detection result is obtained after grounding loop interference suppression optimization is executed, and the leakage current test secondary adjustment instruction is sent. And finally, whether a common-mode interference suppression optimization instruction is sent or not is judged, so that the leakage current test of the electrical element in the ultraviolet laser can be carried out more accurately. The problem that in the prior art, in the leakage current testing process of electrical elements in an ultraviolet laser, the relevance between grounding loop interference and common-mode interference is not fully considered, and consequently the testing result is inaccurate is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of component leakage current testing, and in particular to a safety testing method and system based on ultraviolet laser components. Background Art

[0002] Leakage current testing is related to the isolation, voltage resistance, and reliability of electrical components in UV lasers. UV laser components requiring leakage current testing include driver circuits, optical components, and pump sources. For example, the pump source, as a core component of a UV laser, has electrical safety performance that directly impacts the stability, safety, and user safety of the UV laser. Conventional methods for testing leakage current in UV laser components involve connecting the test terminal of a leakage current tester to the power supply terminal of the component and ensuring that the ground terminal of the leakage current tester is connected to the ground terminal of the component. The component's power is then turned on to allow it to enter normal operation. The leakage current tester is then activated, and the leakage current reading is observed during normal operation. During the leakage current test, the leakage current tester's differential amplifier amplifies the leakage current signal, thereby obtaining a more accurate leakage current signal, facilitating subsequent leakage current determination. Furthermore, the leakage current tester's isolation amplifier provides electrical isolation between its input and output terminals, ensuring that signals from different circuits do not interfere with each other. Finally, the leakage current test results are compared with the corresponding standards (such as the leakage current limit of 0.5mA). If the leakage current exceeds the standard limit, it means that there is an electrical safety hazard in the electrical component.

[0003] For example, the multi-element leakage current measurement system disclosed in the Chinese patent application with publication number CN116754991A includes: multiple measurement stations, a measurement voltage source, and a current measuring device, wherein each of the multiple measurement stations is used to place the component to be measured, and each measurement station is provided with a current measuring device for measuring the leakage current of the component to be measured; the measurement voltage source is used to provide a first measurement voltage to the components to be measured in the multiple measurement stations; and the current measuring device includes a current limiting circuit, wherein the current limiting circuit is used to limit the current value of the current to be measured flowing through the current measuring device to not exceed a preset current threshold.

[0004] For example, the Chinese invention patent with announcement number CN117890825B discloses a leakage current testing method, device, equipment and storage medium for a charging gun, including: performing current testing on a target charging gun to obtain charging condition data; inputting the charging condition data into a principal component feature extraction model to extract condition features to obtain a condition-sensitive feature set; discretizing the condition-sensitive feature set to obtain discretized working condition features; feature encoding the discretized working condition features to obtain a coded feature vector; inputting the coded feature vector of each test voltage into a current anomaly detection model to perform current anomaly detection to obtain current anomaly detection data for each test voltage; inputting the current anomaly detection data into a preset Bayesian network to perform charging gun current leakage interface analysis to obtain a leakage current test result.

[0005] The above technology has at least the following technical problems: Electrical components in UV lasers (such as the pump source) may have different ground potentials due to differences in ground resistance between the component and the leakage current tester during leakage current testing. Normally, the grounds of both should be at the same potential, but this difference in ground potential can cause current to flow through ground wires or other conductive paths, forming a loop current. This loop current may contain signals of varying frequencies, while leakage current typically has a lower or more stable frequency. High-frequency noise or fluctuations in the loop current can affect the frequency response of the measuring instrument, making it impossible to accurately measure the leakage current of the electrical component.

[0006] Another thing to consider is that when loop current flows through the ground loop or power loop, it creates a potential difference along these paths, causing the same voltage fluctuations between the ground, signal, or power terminals of the electrical component, thus forming common-mode interference. Common-mode voltage can interfere with the signal input terminal of the electrical component, causing deviations in the signal measured by the test instrument. Therefore, the presence of common-mode interference can lead to low accuracy in leakage current testing. There is a problem with not fully considering the correlation between ground loop interference and common-mode interference during leakage current testing of electrical components in UV lasers, resulting in inaccurate test results. Summary of the Invention

[0007] The embodiments of the present application provide a safety testing method and system based on ultraviolet laser components, thereby solving the problem in the prior art that the correlation between ground loop interference and common mode interference is not fully considered during leakage current testing of electrical components in ultraviolet lasers, resulting in inaccurate test results, and achieving more accurate leakage current testing of electrical components in ultraviolet lasers.

[0008] An embodiment of the present application provides a safety testing method based on ultraviolet laser components, comprising the following steps: detecting the degree to which a leakage current test process of a preset batch of components to be tested is affected by ground loop interference, obtaining a loop interference detection result, and determining whether to send a loop interference suppression optimization instruction based on the obtained loop interference detection result; if the loop interference suppression optimization instruction is not sent, sending a leakage current test first-level adjustment instruction to prompt adjustment of test parameters of a leakage current tester in a subsequent leakage current test process in combination with the common-mode interference detection result; if the loop interference suppression optimization instruction is sent, detecting the degree to which a leakage current test process of a preset batch of components to be tested is affected by common-mode interference after executing ground loop interference suppression optimization, obtaining a common-mode interference detection result, and sending a leakage current test second-level adjustment instruction to prompt adjustment of test parameters of the leakage current tester in a leakage current test of a next batch of components to be tested in combination with the common-mode interference detection result, the test parameters including an initial test frequency, an initial test time length, and an initial test voltage; determining whether to send a common-mode interference suppression optimization instruction in combination with the obtained common-mode interference detection result; if sent, executing the common-mode interference suppression optimization; otherwise, sending an instruction to output the leakage current test result.

[0009] The embodiment of the present application provides a safety test system based on ultraviolet laser elements, including: a ground loop interference detection module, a common mode interference detection and judgment module and a leakage test result output module; the ground loop interference detection module is used to detect the degree of influence of ground loop interference in the leakage current test process of a preset batch of components to be tested, obtain loop interference detection results, and judge whether to send loop interference suppression optimization instructions based on the obtained loop interference detection results; the common mode interference detection and judgment module is used to send a leakage current test first-level adjustment instruction to prompt the adjustment of the test parameters of the leakage current tester in the subsequent leakage current test process in combination with the common mode interference detection results if the loop interference suppression optimization instruction is not sent. Interference suppression optimization instruction, after executing the ground loop interference suppression optimization, the degree of influence of the common mode interference introduced in the leakage current test process of the preset batch of components to be tested is detected, the common mode interference detection result is obtained, and the leakage current test secondary adjustment instruction is sent to prompt the leakage current test parameters of the leakage current tester to be adjusted in the leakage current test of the next batch of components to be tested in combination with the common mode interference detection result. The test parameters include the initial test frequency, the initial test time length and the initial test voltage; the leakage test result output module is used to determine whether to send the common mode interference suppression optimization instruction in combination with the obtained common mode interference detection result. If sent, the common mode interference suppression optimization is executed; otherwise, the output leakage current test result instruction is sent.

[0010] One or more technical solutions provided in the embodiments of this application have at least the following technical effects or advantages: 1. During the leakage current test of the electrical components in the ultraviolet laser, such as the pump source production process, the presence of ground loop interference and common mode interference will have a significant impact on the test results, often leading to inaccurate test results. This application determines whether to send loop interference suppression optimization instructions based on the obtained loop interference detection results, thereby effectively improving the accuracy of the judgment of the degree of influence of ground loop interference on the leakage current test process of the electrical components in the ultraviolet laser. If not, the leakage current test first-level adjustment instruction is sent. Otherwise, after executing the ground loop interference suppression optimization, the common mode interference detection result is obtained and the leakage current test second-level adjustment instruction is sent. Instructions are sent, thereby effectively reducing the influence of ground loop interference and common mode interference during the leakage current test of electrical components in the ultraviolet laser. Finally, it is determined whether to send common mode interference suppression optimization instructions, which helps to effectively reduce the coupling effect of common mode interference and ground loop interference, and realizes the correlation analysis between ground loop interference and common mode interference, thereby realizing more accurate leakage current testing of electrical components in the ultraviolet laser, and effectively solving the problem in the prior art that the correlation between ground loop interference and common mode interference is not fully considered during the leakage current test of electrical components in the ultraviolet laser, resulting in inaccurate test results.

[0011] 2. By determining the difference between the test loop interference detection value and the preset loop interference limit range obtained from the preset database, the loop interference detection result is obtained, and the degree to which the leakage current test process is affected by the ground loop interference is detected in a quantitative manner. Compared with the existing analysis that considers the influence of a single variable of loop interference, the correlation and mutual influence relationship between various parameters are considered, and a more accurate judgment is achieved on the degree to which the leakage current test process of the electrical components in the ultraviolet laser is affected by the ground loop interference. Then, it is determined whether to send a loop interference suppression optimization instruction to ensure that the leakage current change is captured more clearly, which helps to improve the reliability of the test results during the leakage current test of the electrical components in the ultraviolet laser, and thus effectively suppresses the interference of the ground loop interference on the leakage current measurement process of the electrical components in the ultraviolet laser.

[0012] 3. By making a difference judgment between the common-mode interference detection value and the preset common-mode interference limit range obtained from the preset database, it is helpful to reduce the common-mode interference in the leakage current test of the electrical components in the ultraviolet laser to obtain more accurate test results, and realize a more accurate judgment of the common-mode interference during the test process. Then, combined with the obtained common-mode interference detection results, it is determined whether to send the common-mode interference suppression optimization instruction. The common-mode interference bandwidth limitation optimization can filter out the noise in the high-frequency part, focus on the low-frequency part of the leakage current signal, and reduce the impact of external high-frequency noise on the test results. The common-mode interference noise filtering optimization significantly improves the quality of the leakage current signal during the test process by filtering out the common-mode noise, which can prevent misreading or signal distortion, and realizes the correlation analysis of the ground loop interference and common-mode interference in the leakage current test of the electrical components in the ultraviolet laser, thereby realizing the improvement of the accuracy and reliability of the test results in the leakage current test of the electrical components in the ultraviolet laser. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 A logic diagram of a safety testing method based on ultraviolet laser elements provided in an embodiment of the present application; Figure 2 A flow chart of a safety testing method based on an ultraviolet laser element provided in an embodiment of the present application; Figure 3 A logic diagram for determining the common-mode interference detection result of a safety test method based on ultraviolet laser components provided in an embodiment of the present application; Figure 4 A schematic diagram of the structure of a safety testing system based on ultraviolet laser elements provided in an embodiment of the present application; Figure 5 One of the interface diagrams of the component test center of the safety test system based on ultraviolet laser components provided in an embodiment of the present application; Figure 6 This is a diagram of the test loop interference monitoring interface of the safety test system based on ultraviolet laser elements provided in an embodiment of the present application. DETAILED DESCRIPTION

[0014] The embodiments of the present application provide a safety testing method and system based on ultraviolet laser components, which solves the problem in the prior art that the correlation between ground loop interference and common mode interference is not fully considered during the leakage current test of electrical components in ultraviolet lasers, resulting in inaccurate test results. The loop interference detection result is obtained by detecting the degree of influence of ground loop interference during the leakage current test of a preset batch of components to be tested, and judging whether to send a loop interference suppression optimization instruction based on the obtained loop interference detection result. If the loop interference suppression optimization instruction is not sent, a leakage current test first-level adjustment instruction is sent to prompt the leakage current tester to adjust the measurement in the subsequent leakage current test process in combination with the common mode interference detection result. The test parameters are adjusted. If a loop interference suppression optimization instruction is sent, the degree of influence of the common-mode interference introduced in the leakage current test process of the preset batch of components to be tested is detected after the ground loop interference suppression optimization is executed to obtain the common-mode interference detection result, and a leakage current test secondary adjustment instruction is sent to prompt the leakage current test parameters of the leakage current tester to be adjusted in the leakage current test of the next batch of components to be tested in combination with the common-mode interference detection result. Finally, it is determined whether to send the common-mode interference suppression optimization instruction in combination with the obtained common-mode interference detection result. If sent, the common-mode interference suppression optimization is executed. Otherwise, the output leakage current test result instruction is sent, thereby achieving more accurate leakage current testing of electrical components in ultraviolet lasers.

[0015] The technical solution in the embodiments of the present application is to solve the problem that the correlation between ground loop interference and common mode interference is not fully considered during the leakage current test of the electrical components in the above-mentioned ultraviolet laser, resulting in inaccurate test results. The overall idea is as follows: The obtained loop interference detection result is used to determine whether to send a loop interference suppression optimization instruction. If not, a leakage current test first-level adjustment instruction is sent. Otherwise, after performing the ground loop interference suppression optimization, the common-mode interference detection result is obtained and a leakage current test second-level adjustment instruction is sent. Finally, it is determined whether to send a common-mode interference suppression optimization instruction, thereby achieving the effect of improving the accuracy of the test results of the leakage current test of electrical components in the ultraviolet laser.

[0016] In order to better understand the above technical solution, the above technical solution will be described in detail below with reference to the accompanying drawings and specific implementation methods.

[0017] like Figure 1As shown, it is a logic diagram of the safety testing method based on ultraviolet laser elements provided in an embodiment of the present application, and the corresponding logic is: the loop interference detection result is obtained by quantitatively detecting the degree of influence of ground loop interference on the leakage current test process of the preset batch of test elements through the obtained test loop interference detection value; if the loop interference detection result is that the loop interference limit is qualified, the loop interference suppression optimization instruction is not sent, and the leakage current test level adjustment is performed; if the loop interference detection result is that the loop interference limit is abnormal, it is determined whether the test loop interference detection value is within the preset loop interference out-of-control range; if so, the loop interference suppression optimization instruction is not sent, and the leakage current test level adjustment is performed. A preset batch of components under test is marked as having abnormal test loop interference. Otherwise, a loop interference suppression optimization command is issued and a secondary leakage current test adjustment is performed. The common-mode interference test results are simultaneously obtained. The common-mode interference test results include whether the common-mode interference limit is qualified or not. If the common-mode interference test result corresponds to the common-mode interference limit, the common-mode interference suppression optimization command is not issued, and the leakage current test result is output. The common-mode interference test value is continuously monitored to ensure it is within the preset common-mode interference limit. If the common-mode interference test result corresponds to the common-mode interference limit being not qualified, the common-mode interference suppression optimization command is issued and common-mode interference suppression optimization is performed. Ultraviolet laser components typically operate in high voltage or current environments. If leakage current occurs, the device casing may become electrified, posing a risk of electric shock. This is particularly true in devices that come into contact with the human body, where leakage current can pose a serious safety hazard. Therefore, electrical safety testing of electrical components in UV lasers, such as pump sources, must be strictly enforced.

[0018] This application is applied to the pump source in the electrical components of the ultraviolet laser. Since the pump source usually operates under high voltage and high current conditions, it needs to maintain good insulation performance. If the insulation is poor or damaged, current will leak out of the circuit. The current leakage may cause the internal circuit of the electrical component to short-circuit or overload the current, affecting the normal operation of the pump source, and causing potential harm to operators and equipment. Therefore, the leakage current test is particularly critical in the electrical safety test of the pump source. When the electrical components in the ultraviolet laser are tested for leakage current, both ground loop interference and common mode interference will cause errors, making the measured value of the leakage current inaccurate. The present application effectively links the ground loop interference and common mode interference in the process of leakage current testing of the electrical components in the ultraviolet laser, which helps to more accurately perform leakage current testing of the electrical components in the ultraviolet laser.

[0019] like Figure 2 As shown, it is a flow chart of a safety testing method based on ultraviolet laser elements provided in an embodiment of the present application, which method includes the following steps: ground loop interference detection, common mode interference detection and judgment, and leakage test result output.

[0020] As the first step in the UV laser component safety testing method, ground loop interference detection is performed on a predetermined batch of components to determine the extent to which ground loop interference affects the leakage current test. Loop interference detection results can include a pass (indicates that the test loop interference value is within the preset loop interference limit) and an exception (indicates that the test loop interference value is outside the preset loop interference limit).

[0021] It should be understood that during the leakage current test of the pump source, test equipment such as a leakage current tester is used to detect the leakage current of the component. If there is a potential difference in the ground loop, it may cause distortion of the measurement signal or additional current flow, thereby affecting the reading of the test equipment. By detecting the degree to which the leakage current test process is affected by ground loop interference to obtain a quantitative judgment result, compared with the existing analysis that considers the single variable influence of loop interference, the correlation and mutual influence relationship between various parameters are taken into account, thereby achieving a more accurate judgment on the degree to which the leakage current test process of the electrical component pump source in the ultraviolet laser is affected by ground loop interference, and thus achieving a more accurate analysis of the impact of ground loop interference on the accuracy of the test results during the leakage current test of the electrical component pump source in the ultraviolet laser.

[0022] As a further solution, the degree of influence of ground loop interference during the leakage current test of a preset batch of components to be tested is detected. The specific steps are as follows: First, obtain ground loop-test interference data during the leakage current test of a preset batch of components to be tested. The ground loop-test interference data includes ground voltage difference, ground current, and ground noise voltage. Specifically, obtain the ground voltage difference by connecting the input terminals of the two differential probes of the differential oscilloscope to the ground terminal of the leakage current tester and the ground terminal of the pump source, respectively; obtain the ground current by using a clamp ammeter deployed at the center of the ground wire of the leakage current tester; and obtain the ground noise voltage by connecting the probe of the noise analyzer to the ground terminal of the pump source.

[0023] Next, the corresponding loop interference relative deviation detection data is obtained based on the ground loop-test interference data. Specifically, the loop interference relative deviation detection data represents the result of taking the absolute value of the difference between the ground loop-test interference data and the corresponding loop interference limit and performing a ratio processing with the corresponding loop interference limit. The loop interference relative deviation detection data includes a ground voltage difference relative deviation index, a ground current relative deviation index, and a ground noise voltage relative deviation index; wherein, the loop interference limit corresponding to the ground loop-test interference data is set by professionals according to standards in the field. For example, the loop interference limit is set to the minimum value of the corresponding collected ground loop-test interference data, specifically including a ground voltage difference limit, a ground current limit, and a ground noise voltage limit.

[0024] Secondly, the loop interference relative deviation detection data are weighted and coupled to obtain the test loop interference detection value; wherein, the weights in the weighted operation are set in advance by the preset personnel and stored in the preset database, which are used to describe the degree of influence of the loop interference relative deviation detection data on the test loop interference detection value.

[0025] It should be understood that the test loop interference detection value is used to quantify the degree to which the leakage current test process of a preset batch of components under test is affected by ground loop interference; among them, the test loop interference detection value includes parameters in multiple aspects. Specifically, as the ground voltage difference relative deviation index, the ground current relative deviation index and the ground noise voltage relative deviation index increase, the test loop interference detection value increases accordingly; at the same time, the test loop interference detection value also takes into account the mutual influence relationship between the various parameters. For example, the ground voltage difference is the driving force of the ground current. If there is a large voltage difference between the pump source and the grounding point of the test equipment, the current will flow along the ground path to form a ground current. The magnitude of the ground current depends on the ground voltage difference and the resistance of the ground path. Specifically, as the ground voltage difference increases, the ground current increases accordingly, causing the test loop interference detection value to increase accordingly; the flow of ground current will generate an electromagnetic field in the grounding system, causing the emergence of ground noise voltage. As the ground current increases, the ground noise voltage also increases. The ultraviolet laser electrical component pump source leakage current test process is increasingly affected by ground loop interference, and the test loop interference detection value increases; the ground voltage difference in the loop interference relative deviation detection data drives the ground current to be generated, thereby causing the formation of ground noise voltage. The three are interrelated and influence each other, and jointly affect and act on the ground loop interference in the ultraviolet laser electrical component pump source leakage current test process.

[0026] As a further solution, it is determined whether to send a loop interference suppression optimization instruction based on the obtained loop interference detection result. The loop interference detection result is obtained by judging the obtained test loop interference detection value, and it is determined whether to execute the corresponding loop interference suppression optimization. This effectively reduces the influence of ground loop interference on the leakage current test process of the ultraviolet laser electrical component pump source, so as to improve the reliability of the leakage current test result of the ultraviolet laser electrical component pump source.

[0027] The specific process of determining whether to send a loop interference suppression optimization instruction is as follows: First, the difference between the test loop interference detection value and the preset loop interference limit range obtained from the preset database is determined to obtain a loop interference detection result; the preset loop interference limit range is set by professionals according to standards in the field.

[0028] Secondly, if the loop interference detection result is that the loop interference limit is qualified, the loop interference suppression optimization instruction is not sent, and a leakage current test level adjustment instruction for performing the leakage current test level adjustment is sent. Specifically, the specific process of performing the leakage current test level adjustment is as follows: A1, updates the initial test frequency of the leakage current tester in the next test of the preset batch of components to be tested to the test first-level adjustment frequency. The test first-level adjustment frequency represents the result output after the test loop interference detection value is input into the loop interference test frequency adjustment linear regression mapping model.

[0029] A2, updates the initial test time length of the leakage current tester in the next test of the preset batch of components to be tested to the test first-level adjustment time length. The test first-level adjustment time length represents the result output after the test loop interference detection value is input into the loop interference test time adjustment linear regression mapping model.

[0030] A3, updates the initial test voltage of the leakage current tester in the next test of the preset batch of components to be tested to the test level 1 adjustment voltage, and performs a preset number of leakage current tests on the preset batch of components to be tested according to the test level 1 adjustment voltage and the test level 1 adjustment frequency within the test level 1 adjustment time length. The test level 1 adjustment voltage represents the result output after the test loop interference detection value is input into the loop interference test voltage adjustment linear regression mapping model.

[0031] A4, judging whether the loop interference detection results of the preset batch of components to be tested for the preset number of leakage current tests all correspond to the qualified loop interference limit. If so, a prompt indicating that the leakage current test first-level adjustment is completed is sent; otherwise, loop interference suppression optimization is performed.

[0032] It should be added that the loop interference test frequency adjustment linear regression mapping model, the loop interference test time adjustment linear regression mapping model and the loop interference test voltage adjustment linear regression mapping are pre-trained linear regression models for fitting the mapping relationship between the test loop interference detection value and the corresponding test first-level adjustment frequency, test first-level adjustment time length and test first-level adjustment voltage. The test frequency adjustment data, test time adjustment data and test voltage adjustment data are input into the linear regression model respectively, and the corresponding linear regression mapping model is obtained by training the scikit-learn framework based on the least squares method; the test frequency adjustment data includes the test loop interference detection value in the historical time period, and the test first-level adjustment frequency set by the preset staff according to the test loop interference detection value; the test time adjustment data includes the test loop interference detection value in the historical time period, and the test first-level adjustment time length set by the preset staff according to the test loop interference detection value; the test voltage adjustment data includes the test loop interference detection value in the historical time period, and the test first-level adjustment voltage set by the preset staff according to the test loop interference detection value.

[0033] The specific process of performing loop interference suppression optimization is as follows: Y1, inputs the differential gain adjustment strength into the differential amplifier of the leakage current tester to adjust the differential gain during the leakage current test of the device under test. The differential gain adjustment strength is the result of mapping the test loop interference detection value from the preset database.

[0034] Y2, input the noise filter adjustment strength into the ground noise filter of the leakage current tester to filter the ground noise during the leakage current test of the component to be tested. The noise filter adjustment strength is the result of mapping the test loop interference detection value from the preset database.

[0035] Y3, re-obtain the loop interference detection result, determine whether the re-obtained loop interference detection result corresponds to the loop interference limit qualification, if so, send a loop interference suppression optimization end prompt, and perform the leakage current test secondary adjustment, and obtain the common mode interference detection result at the same time, otherwise, return to Y1 until the common mode interference detection result is obtained; the common mode interference detection result includes common mode interference limit qualification and common mode interference limit abnormality.

[0036] It should be understood that during the leakage current test of the UV laser electrical component pump source, the leakage current signal is usually weak. Adjusting the differential gain can increase its signal strength, allowing the tester to more clearly capture tiny current changes. By enhancing the differential gain of the differential amplifier, the weak leakage current signal can be better amplified, thereby improving the sensitivity and accuracy of the measurement. By adjusting the noise filter to filter the ground noise, the noise from the ground loop can be effectively filtered out, and the interference current from the ground loop can be significantly reduced, thereby avoiding the impact of ground loop interference on leakage current measurement and improving the accuracy of the test results.

[0037] Specifically, the specific process for performing the secondary adjustment of the leakage current test is as follows: B1, update the initial test frequency of the leakage current tester in the leakage current test of the next batch of components to be tested to the test secondary adjustment frequency, and the test secondary adjustment frequency represents the result output after the test loop interference detection value is input into the interference optimization test frequency adjustment linear regression mapping model.

[0038] B2, update the initial test time length of the leakage current tester in the leakage current test of the next batch of components to be tested to the test secondary adjustment time length, and the test secondary adjustment time length represents the result output after the test loop interference detection value is input into the interference optimization test time adjustment linear regression mapping model.

[0039] B3. Update the initial test voltage of the leakage current tester in the leakage current test of the next batch of components to be tested to the test secondary adjustment voltage, and perform leakage current test on the next batch of components to be tested for a preset number of adjustments according to the test secondary adjustment voltage and the test secondary adjustment frequency within the test secondary adjustment time length. The test secondary adjustment voltage represents the result output after the test loop interference detection value is input into the interference optimization test voltage adjustment linear regression mapping model, and the number of adjustments is the result of mapping the test loop interference detection value from the preset database.

[0040] Among them, it should be noted that the interference optimization test frequency adjustment linear regression mapping model, the interference optimization test time adjustment linear regression mapping model and the interference optimization test voltage adjustment linear regression mapping are pre-trained linear regression models for fitting the mapping relationship between the test loop interference detection value and the corresponding test secondary adjustment frequency, test secondary adjustment time length and test secondary adjustment voltage. The test frequency optimization adjustment data, the test time optimization adjustment data and the test voltage optimization adjustment data are input into the linear regression model respectively, and the corresponding linear regression mapping model is obtained by training the scikit-learn framework based on the least squares method; the test frequency optimization adjustment data includes the test loop interference detection value in the historical time period, and the test secondary adjustment frequency set by the preset staff according to the test loop interference detection value; the test time adjustment data includes the test loop interference detection value in the historical time period, and the test secondary adjustment time length set by the preset staff according to the test loop interference detection value; the test voltage adjustment data includes the test loop interference detection value in the historical time period, and the test secondary adjustment voltage set by the preset staff according to the test loop interference detection value.

[0041] like Figure 3 As shown, it is a common-mode interference detection result judgment logic diagram of the safety test method based on ultraviolet laser elements provided in an embodiment of the present application. The corresponding logic is: based on the common-mode interference-test detection data, the common-mode interference detection value is obtained, and the difference between the common-mode interference detection value and the preset common-mode interference limit range is judged; if the common-mode interference detection value is within the preset common-mode interference limit range, the corresponding common-mode interference detection result is output as the common-mode interference limit qualified, and the common-mode interference suppression optimization instruction is not sent, and the leakage current test result is output, while continuously monitoring whether the common-mode interference detection value is within the preset common-mode interference limit range; if the common-mode interference detection value is not within the preset common-mode interference limit range, the corresponding common-mode interference detection result is output as the common-mode interference limit abnormality, and the common-mode interference suppression optimization instruction is sent and the common-mode interference suppression optimization is executed. Specifically, to obtain the common-mode interference detection result, the specific process is as follows: Y31, obtain the common-mode interference-test detection data during the leakage current test of a preset batch of components to be tested. The common-mode interference-test detection data includes the common-mode voltage, common-mode noise current and test loop interference detection value; specifically, the common-mode voltage is obtained by connecting an oscilloscope probe to the input terminal and the ground terminal of the pump source, and the common-mode noise current is obtained through a spectrum analyzer.

[0042] Y32, the common-mode interference coupling result and the test loop interference detection value are subjected to interference interaction processing to obtain the common-mode interference detection value. The numerical expression of the common-mode interference detection value is as follows: ; Where G represents the common-mode interference detection value, C represents the test loop interference detection value, Q1 represents the common-mode voltage interference weight, Q2 represents the common-mode noise current interference weight, M1 represents the common-mode voltage, M2 represents the common-mode voltage limit, S1 represents the common-mode noise current, and S2 represents the common-mode noise current limit.

[0043] Among them, the common-mode interference coupling result represents the result of weighted coupling corresponding to the relative deviation of common-mode voltage and the relative deviation of common-mode noise current, that is, the numerical expression of the common-mode interference detection value Part; The relative deviation of the common-mode voltage represents the result of taking the absolute value of the difference between the common-mode voltage and the common-mode voltage limit and proportioning it with the corresponding common-mode voltage limit. The relative deviation of the common-mode noise current represents the result of taking the absolute value of the difference between the common-mode noise current and the common-mode noise current limit and proportioning it with the corresponding common-mode noise current limit. The common-mode voltage limit and the common-mode noise current limit are set by professionals according to the standards in the field. For example, the common-mode voltage limit and the common-mode noise current limit are set as the results of averaging the corresponding historical common-mode voltage and common-mode noise current collected, respectively.

[0044] The common-mode interference detection value represents the quantitative data of the common-mode interference-test detection data on the degree of influence of common-mode interference introduced during the leakage current test of the device under test. The common-mode interference detection value includes multiple parameters. By considering the mutual influence relationship and the correlation of the joint action between the various parameters, the degree of influence of common-mode interference during the leakage current test of the ultraviolet laser electrical component pump source is quantitatively determined. Specifically, as the test loop interference detection value increases, that is, the degree to which the leakage current test process is affected by the ground loop interference increases, the relative deviation of the common-mode voltage and the relative deviation of the common-mode noise current both increase accordingly, and the common-mode interference detection value increases accordingly. In addition, the common-mode voltage is the driving force of the common-mode noise current. As the common-mode voltage increases, the common-mode noise current increases accordingly. At the same time, ground loop interference is one of the sources of common-mode noise current. The existence of ground potential difference can cause the generation of common-mode noise current. The various parameters in the common-mode interference detection value are closely related and interrelated, and together act on the common-mode interference during the leakage current test of the ultraviolet laser electrical component pump source.

[0045] Y32, determine the difference between the common-mode interference detection value and the preset common-mode interference limit range obtained from the preset database; if the common-mode interference detection value is within the preset common-mode interference limit range, the corresponding common-mode interference detection result is output as common-mode interference limit qualified; if the common-mode interference detection value is not within the preset common-mode interference limit range, the corresponding common-mode interference detection result is output as common-mode interference limit abnormal; the preset common-mode interference limit is set by professionals according to standards in the field.

[0046] In addition, if the loop interference detection result is a loop interference limit abnormality, it is determined whether the test loop interference detection value is within the preset loop interference out-of-control range obtained from the preset database. If so, the loop interference suppression optimization instruction is not sent, and the preset batch of components to be tested is marked as a test loop interference abnormality batch. The preset loop interference out-of-control range is set by professionals according to standards in the field; otherwise, a loop interference suppression optimization instruction is sent to prompt the differential gain of the differential amplifier to be adjusted, and the leakage current test process of the component to be tested is subjected to ground noise filtering processing, and the leakage current test secondary adjustment is performed, and the common mode interference detection result is obtained at the same time. By combining the common mode interference detection value to determine the degree to which the leakage current test process of the electrical component is affected by the ground loop interference to obtain the loop interference detection result, and to determine whether to send the loop interference suppression optimization instruction, the problem of low reliability of the test result due to ground loop interference in the leakage current test process of the electrical component in the ultraviolet laser is effectively solved.

[0047] As the second step of the UV laser component safety test method, common mode interference detection and judgment: If the loop interference suppression optimization instruction is not sent, the leakage current test first-level adjustment instruction is sent to prompt the leakage current tester to adjust the test parameters in the subsequent leakage current test process in combination with the common-mode interference detection results. By adjusting the test parameters, the working conditions of the component to be tested can be accurately matched, making the test results more accurate and representative.

[0048] If a loop interference suppression optimization instruction is sent, the degree of influence of common-mode interference introduced during the leakage current test of a preset batch of components to be tested is detected after the ground loop interference suppression optimization is executed, the common-mode interference detection result is obtained, and a leakage current test secondary adjustment instruction is sent to prompt the adjustment of the test parameters of the leakage current tester in the leakage current test of the next batch of components to be tested in combination with the common-mode interference detection result. The test parameters include the initial test frequency, the initial test time length and the initial test voltage. Although common-mode interference and ground loop interference have different sources, they usually interact with each other. By correlating and analyzing the ground loop interference and common-mode interference during the leakage current test of the ultraviolet laser electrical component pump source, it is helpful to effectively reduce the coupling effect of common-mode interference and ground loop interference, and thus more accurately perform the leakage current test of the ultraviolet laser electrical component pump source.

[0049] The third step in the UV laser component safety testing method, namely, outputting leakage test results, is to determine whether to issue a common-mode interference suppression optimization instruction based on the common-mode interference detection results. If so, the common-mode interference suppression optimization is executed; otherwise, an instruction to output leakage current test results is issued. By combining the common-mode interference detection results to quantitatively determine the degree to which the leakage current test process of electrical components is affected by common-mode interference, this effectively improves the problem of low test accuracy during leakage current testing of electrical components in UV lasers due to the correlation between ground loop interference and common-mode interference.

[0050] As a further solution, the common mode interference detection results are combined to determine whether to send a common mode interference suppression optimization instruction. The specific process is as follows: First, if the common-mode interference detection result corresponds to the common-mode interference limit being qualified, the common-mode interference suppression optimization instruction is not sent, and the leakage current test result is output, while continuously monitoring whether the common-mode interference detection value is within the preset common-mode interference limit range.

[0051] Secondly, if the common-mode interference detection result corresponds to a common-mode interference limit abnormality, a common-mode interference suppression optimization instruction is sent and common-mode interference suppression optimization is executed. Common-mode interference suppression optimization means amplifying the bandwidth limit range of the isolation amplifier in combination with the common-mode interference detection result, and performing common-mode noise filtering on the leakage current test process of the component under test. Common-mode interference suppression optimization includes common-mode interference bandwidth limit optimization and common-mode interference noise filtering optimization; common-mode interference bandwidth limit optimization means amplifying the bandwidth limit range of the isolation amplifier in combination with the bandwidth limit adjustment strength; common-mode interference noise filtering optimization means performing common-mode noise filtering on the leakage current test process of the component under test in combination with the common-mode noise filtering strength.

[0052] Specifically, the specific process of performing common-mode interference suppression optimization is as follows: C1, inputs the bandwidth limit adjustment force into the isolation amplifier of the leakage current tester to amplify the bandwidth limit range during the leakage current test of the component under test. The bandwidth limit adjustment force is the result of mapping the common mode interference detection value from the preset database.

[0053] C2, inputting the common mode noise filtering strength into the common mode filter of the leakage current tester to filter the common mode noise during the leakage current test of the component to be tested. The common mode noise filtering strength is the result of mapping the common mode interference detection value from the preset database.

[0054] C3, determine whether the re-acquired common-mode interference detection result corresponds to the common-mode interference limit qualification. If so, send a common-mode interference suppression optimization end prompt and output the leakage current test result. Otherwise, return to C1 until the leakage current test result is output.

[0055] During leakage current testing, common-mode interference typically includes noise signals within a certain frequency range, particularly high-frequency noise. Bandwidth limiting filters out this high-frequency noise, focusing on the low-frequency portion of the leakage current signal and reducing the impact of external high-frequency noise on test results. Common-mode noise, generated by the power supply and grounding system, often interferes with leakage current testing. A common-mode noise filter effectively removes this unnecessary noise from the test signal, improving test accuracy. By filtering out common-mode noise, the quality of the leakage current signal during testing is significantly improved, preventing misinterpretations and signal distortion, resulting in more accurate test results.

[0056] In this embodiment, during the leakage current test of the pump source in the production process of ultraviolet laser electrical components, the test instrument may be affected by the common-mode interference and the ground loop interference, resulting in inaccurate test results. This application conducts a correlation analysis of the ground loop interference and the common-mode interference introduced during the leakage current test of the ultraviolet laser component, specifically taking the pump source as an example. This effectively suppresses the ground loop interference and common-mode interference present in the leakage current test of the ultraviolet laser electrical component pump source, thereby contributing to more accurate testing of the leakage current of the ultraviolet laser electrical component pump source, thereby improving the accuracy and reliability of the test results in the leakage current test of the ultraviolet laser electrical component pump source.

[0057] like Figure 4Figure 1 is a schematic diagram of the structure of a safety testing system for ultraviolet laser components provided in an embodiment of the present application. The safety testing system for ultraviolet laser components provided in an embodiment of the present application includes: a ground loop interference detection module, a common-mode interference detection and judgment module, and a leakage test result output module. Specifically, the ground loop interference detection module is used to detect the degree to which ground loop interference affects the leakage current test process of a preset batch of components under test, obtain a loop interference detection result, and determine whether to issue a loop interference suppression optimization instruction based on the obtained loop interference detection result. The common-mode interference detection and judgment module is used to send a leakage current test first-level adjustment instruction to prompt the leakage current tester to adjust the test parameters of the subsequent leakage current test in combination with the common-mode interference detection results if the loop interference suppression optimization instruction is not sent. If the loop interference suppression optimization instruction is sent, after performing the ground loop interference suppression optimization, the leakage current test process of the preset batch of components to be tested is tested to determine the degree of influence of the common-mode interference introduced, obtain the common-mode interference detection results, and send a leakage current test second-level adjustment instruction to prompt the leakage current tester to adjust the test parameters of the leakage current tester in the leakage current test of the next batch of components to be tested in combination with the common-mode interference detection results. The test parameters include the initial test frequency, the initial test time length, and the initial test voltage. The leakage test result output module is used to determine whether to send a common-mode interference suppression optimization instruction based on the obtained common-mode interference detection results. If sent, the common-mode interference suppression optimization is executed; otherwise, the leakage current test result output instruction is sent.

[0058] like Figure 5 As shown, it is one of the interface diagrams of the component test center of the safety test system based on ultraviolet laser components provided by the embodiment of the present application; Figure 5 It can be seen that the navigation bar of the ultraviolet laser component safety testing system provided in the embodiment of the present application includes a home page, a component test center, a test result record, and user management settings; wherein, the component test center includes laser medium components, pump sources, optical cavity components, gain medium components, and output coupling components; when the component test center corresponds to a pump source, basic information preview of electrical component testing, loop interference test results display, and common-mode interference test results display can be performed.

[0059] like Figure 6 As shown, it is a diagram of the test loop interference monitoring interface of the safety test system based on the ultraviolet laser element provided by the embodiment of the present application; Figure 6 It can be seen that the test loop interference monitoring interface of the ultraviolet laser element safety testing system provided in the embodiment of the present application is used to display the test loop interference monitoring information and provide prompts and suggestions; at the same time, the test loop interference monitoring interface can also be used to display whether the loop interference suppression optimization and leakage current test secondary adjustment have been executed.

[0060] In summary, in the embodiment of the present application, when conducting leakage current testing on electrical components such as pump sources in the production process of ultraviolet lasers, the presence of ground loop interference and common mode interference will have a significant impact on the test results, often leading to inaccurate test results. The present application determines whether to send loop interference suppression optimization instructions based on the obtained loop interference detection results, thereby effectively improving the accuracy of judging the degree of influence of ground loop interference on the leakage current testing process of electrical components in ultraviolet lasers. If not, a leakage current test first-level adjustment instruction is sent. Otherwise, after executing the ground loop interference suppression optimization, the common mode interference detection result is obtained and the leakage current test is sent. The secondary adjustment instructions effectively reduce the influence of ground loop interference and common mode interference during the leakage current test of the electrical components in the ultraviolet laser. Finally, it is determined whether to send the common mode interference suppression optimization instruction, which helps to effectively reduce the coupling effect of common mode interference and ground loop interference, and realizes the correlation analysis between ground loop interference and common mode interference, thereby realizing more accurate leakage current testing of the electrical components in the ultraviolet laser, and effectively solves the problem in the prior art that the correlation between ground loop interference and common mode interference is not fully considered during the leakage current test of the electrical components in the ultraviolet laser, resulting in inaccurate test results.

[0061] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0062] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0063] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0064] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 The steps for the function specified in one or more boxes.

[0065] Although the preferred embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0066] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if such changes and modifications fall within the scope of the claims and their equivalents, the present invention is intended to include such changes and modifications.

Claims

1. A safety testing method based on ultraviolet laser components, characterized in that: The following steps are involved: Detecting the degree of influence of ground loop interference during the leakage current test of a preset batch of components to be tested, obtaining a loop interference detection result, and determining whether to send a loop interference suppression optimization instruction based on the obtained loop interference detection result; If the loop interference suppression optimization instruction is not sent, a leakage current test first-level adjustment instruction is sent to prompt the test parameters of the leakage current tester to be adjusted in the subsequent leakage current test process in combination with the common-mode interference detection result. If the loop interference suppression optimization instruction is sent, after executing the ground loop interference suppression optimization, the degree of influence of the common-mode interference introduction on the leakage current test process of the preset batch of components to be tested is detected, the common-mode interference detection result is obtained, and a leakage current test second-level adjustment instruction is sent to prompt the test parameters of the leakage current tester to be adjusted in the leakage current test of the next batch of components to be tested in combination with the common-mode interference detection result. The test parameters include the initial test frequency, the initial test time length and the initial test voltage; Based on the obtained common mode interference detection result, it is determined whether to send a common mode interference suppression optimization instruction. If sent, the common mode interference suppression optimization is performed. Otherwise, an output leakage current test result instruction is sent.

2. The safety testing method based on ultraviolet laser elements according to claim 1, characterized in that: The specific steps of detecting the degree of influence of ground loop interference during the leakage current test of the preset batch of components to be tested are as follows: Obtaining ground loop-test interference data during a leakage current test of a preset batch of components under test, and obtaining corresponding loop interference relative deviation detection data based on the ground loop-test interference data, wherein the ground loop-test interference data includes a ground voltage difference, a ground current, and a ground noise voltage; The loop interference relative deviation detection data includes a ground voltage difference relative deviation index, a ground current relative deviation index, and a ground noise voltage relative deviation index. The loop interference relative deviation detection data represents the result of taking the absolute value of the difference between the ground loop-test interference data and the corresponding loop interference limit and performing a ratio processing with the corresponding loop interference limit; The loop interference relative deviation detection data are weighted and coupled to obtain a test loop interference detection value, which is used to quantify the degree to which the leakage current test process of a preset batch of test components is affected by the ground loop interference.

3. The safety testing method based on ultraviolet laser elements according to claim 2, characterized in that: The specific process of determining whether to send a loop interference suppression optimization instruction based on the obtained loop interference detection result is as follows: Determine the difference between the test loop interference detection value and the preset loop interference limit range obtained from the preset database to obtain a loop interference detection result, wherein the loop interference detection result includes a loop interference limit qualified, indicating that the test loop interference detection value is within the preset loop interference limit range, and a loop interference limit abnormal, indicating that the test loop interference detection value is not within the preset loop interference limit range; If the loop interference detection result is that the loop interference limit is qualified, the loop interference suppression optimization instruction is not sent, and a leakage current test first-level adjustment instruction for performing the leakage current test first-level adjustment is sent; If the loop interference detection result is a loop interference limit abnormality, it is determined whether the test loop interference detection value is within the preset loop interference out-of-control range obtained from the preset database. If so, the loop interference suppression optimization instruction is not sent, and the preset batch of components to be tested is marked as a test loop interference abnormality batch. Otherwise, a loop interference suppression optimization instruction is sent to prompt the adjustment of the differential gain of the differential amplifier, and the ground noise filtering process of the leakage current test process of the component to be tested is performed, and the leakage current test secondary adjustment is performed, and the common mode interference detection result is obtained at the same time.

4. The safety testing method based on ultraviolet laser elements according to claim 3, characterized in that: The specific process of performing the first-level adjustment of the leakage current test is as follows: A1, updating the initial test frequency of the leakage current tester in the next test of the preset batch of components to the test level 1 adjustment frequency, wherein the test level 1 adjustment frequency represents the result output after the test loop interference detection value is input into the loop interference test frequency adjustment linear regression mapping model; A2: updating the initial test time of the leakage current tester in the next test of the preset batch of components to the first-level test adjustment time, where the first-level test adjustment time represents the result output after the test loop interference detection value is input into the loop interference test time adjustment linear regression mapping model; A3, updating the initial test voltage of the leakage current tester in the next test of the preset batch of components under test to the test level 1 adjustment voltage, and performing a preset number of leakage current tests on the preset batch of components under test according to the test level 1 adjustment voltage and the test level 1 adjustment frequency within the test level 1 adjustment time length, wherein the test level 1 adjustment voltage represents the result output after the test loop interference detection value is input into the loop interference test voltage adjustment linear regression mapping model; A4, judging whether the loop interference detection results of the preset batch of components to be tested for the preset number of leakage current tests all correspond to the qualified loop interference limit. If so, a prompt indicating that the leakage current test first-level adjustment is completed is sent; otherwise, loop interference suppression optimization is performed.

5. The safety testing method based on ultraviolet laser elements according to claim 4, characterized in that: The specific process of performing loop interference suppression optimization is as follows: Y1, inputting the differential gain adjustment force into the differential amplifier of the leakage current tester to adjust the differential gain during the leakage current test of the device under test, wherein the differential gain adjustment force is the result of mapping the test loop interference detection value from the preset database; Y2, inputting the noise filtering adjustment strength into the ground noise filter of the leakage current tester to filter the ground noise during the leakage current test of the component under test, wherein the noise filtering adjustment strength is the result of mapping the test loop interference detection value from the preset database; Y3, re-obtain the loop interference detection result, determine whether the re-obtained loop interference detection result corresponds to the qualified loop interference limit, if so, send a loop interference suppression optimization end prompt, and perform the leakage current test secondary adjustment, and obtain the common mode interference detection result at the same time, otherwise, return to Y1 until the common mode interference detection result is obtained.

6. The safety testing method based on ultraviolet laser elements according to claim 5, characterized in that: The specific process of performing the secondary adjustment of the leakage current test is as follows: B1, updating the initial test frequency of the leakage current tester in the leakage current test of the next batch of components to be tested to the test secondary adjustment frequency, wherein the test secondary adjustment frequency represents the result output after the test loop interference detection value is input into the interference optimization test frequency adjustment linear regression mapping model; B2, updating the initial test time length of the leakage current tester in the leakage current test of the next batch of components to the test secondary adjustment time length, wherein the test secondary adjustment time length represents the result output after the test loop interference detection value is input into the interference optimization test time adjustment linear regression mapping model; B3. Update the initial test voltage of the leakage current tester in the leakage current test of the next batch of components to be tested to the test secondary adjustment voltage, and perform a preset number of adjustment leakage current tests on the next batch of components to be tested according to the test secondary adjustment voltage and the test secondary adjustment frequency within the test secondary adjustment time length. The test secondary adjustment voltage represents the result output after the test loop interference detection value is input into the interference optimization test voltage adjustment linear regression mapping model, and the number of adjustments is the result of mapping the test loop interference detection value from the preset database.

7. The safety testing method based on ultraviolet laser elements according to claim 5, characterized in that: The specific process of obtaining the common mode interference detection result is as follows: Acquire common-mode interference-test detection data during a leakage current test of a preset batch of components under test, wherein the common-mode interference-test detection data includes common-mode voltage, common-mode noise current, and test loop interference detection value; Perform interference interaction processing on the common-mode interference coupling result and the test loop interference detection value to obtain a common-mode interference detection value, wherein the common-mode interference detection value represents quantitative data of the degree of influence of the common-mode interference introduced during the leakage current test of the DUT on the common-mode interference-test detection data, and the common-mode interference coupling result represents the result of weighted coupling corresponding to the relative deviation of the common-mode voltage and the relative deviation of the common-mode noise current; The common-mode voltage relative deviation represents the result of performing a ratio processing on the absolute value of the difference between the common-mode voltage and the common-mode voltage limit and the corresponding common-mode voltage limit; the common-mode noise current relative deviation represents the result of performing a ratio processing on the absolute value of the difference between the common-mode noise current and the common-mode noise current limit and the corresponding common-mode noise current limit; Determine the difference between the common mode interference detection value and the preset common mode interference limit range obtained from the preset database; If the common mode interference detection value is within the preset common mode interference limit range, the corresponding common mode interference detection result is output as common mode interference limit qualified; If the common mode interference detection value is not within the preset common mode interference limit range, the corresponding common mode interference detection result is output as common mode interference limit abnormality; The common mode interference detection result includes common mode interference qualification qualified and common mode interference qualification abnormal.

8. The safety testing method based on ultraviolet laser elements according to claim 7, characterized in that: The combined common mode interference detection result is used to determine whether to send a common mode interference suppression optimization instruction. The specific process is as follows: If the common-mode interference detection result corresponds to the common-mode interference limit being qualified, the common-mode interference suppression optimization instruction is not sent, and the leakage current test result is output, while continuously monitoring whether the common-mode interference detection value is within the preset common-mode interference limit range; If the common-mode interference detection result corresponds to a common-mode interference limit exception, a common-mode interference suppression optimization instruction is sent and common-mode interference suppression optimization is performed. The common-mode interference suppression optimization indicates that the bandwidth limit range of the isolation amplifier is amplified in combination with the common-mode interference detection result, and common-mode noise filtering is performed on the leakage current test process of the device under test. The common-mode interference suppression optimization includes common-mode interference bandwidth limitation optimization and common-mode interference noise filtering optimization; The common mode interference bandwidth limitation optimization means amplifying the bandwidth limitation range of the isolation amplifier in combination with the bandwidth limitation adjustment strength; The common-mode interference noise filtering optimization refers to performing common-mode noise filtering processing on the leakage current test process of the device under test in combination with the common-mode noise filtering strength.

9. The safety testing method based on ultraviolet laser components according to claim 8, characterized in that: The specific process of performing common mode interference suppression optimization is as follows: C1, inputting the bandwidth limit adjustment force into the isolation amplifier of the leakage current tester to amplify the bandwidth limit range during the leakage current test of the component under test, wherein the bandwidth limit adjustment force is the result of mapping the common mode interference detection value from the preset database; C2, inputting the common mode noise filtering strength into the common mode filter of the leakage current tester to filter the common mode noise during the leakage current test of the component under test, wherein the common mode noise filtering strength is the result of mapping the common mode interference detection value from the preset database; C3, determine whether the re-acquired common-mode interference detection result corresponds to the common-mode interference limit qualification. If so, send a common-mode interference suppression optimization end prompt and output the leakage current test result. Otherwise, return to C1 until the leakage current test result is output.

10. A safety test system based on ultraviolet laser elements, characterized in that: include: Ground loop interference detection module, common mode interference detection and judgment module and leakage test result output module; The ground loop interference detection module is used to detect the degree of influence of ground loop interference during the leakage current test of a preset batch of components to be tested, obtain a loop interference detection result, and determine whether to send a loop interference suppression optimization instruction based on the obtained loop interference detection result; The common-mode interference detection and judgment module is used to, if the loop interference suppression optimization instruction is not sent, send a leakage current test first-level adjustment instruction to prompt the adjustment of the test parameters of the leakage current tester in the subsequent leakage current test process in combination with the common-mode interference detection result; if the loop interference suppression optimization instruction is sent, after executing the ground loop interference suppression optimization, the degree of influence of the common-mode interference introduction on the leakage current test process of the preset batch of components to be tested is detected, the common-mode interference detection result is obtained, and the leakage current test second-level adjustment instruction is sent to prompt the adjustment of the test parameters of the leakage current tester in the leakage current test of the next batch of components to be tested in combination with the common-mode interference detection result, wherein the test parameters include the initial test frequency, the initial test time length and the initial test voltage; The leakage test result output module is used to determine whether to send a common mode interference suppression optimization instruction based on the obtained common mode interference detection result. If sent, the common mode interference suppression optimization is performed; otherwise, an output leakage current test result instruction is sent.

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