Ground test item clipping method for satellite fault severity level

Abstract

The invention provides a ground test project clipping method oriented to the severity level of a satellite fault, and by clipping a ground test project, compared with an existing test project clipping method, the ground test project clipping method has the main advantages that: (1) faults with different severity levels can be fully screened through the test project clipping method, and the test project clipping method can be applied to the field of satellite fault severity levels; the risk of in-orbit operation of the spacecraft is reduced; and (3) through the test item clipping method, the number and severity of satellite faults can be comprehensively screened by considering different requirements of different satellites on reliability, so that the test scheme is more practical, and satellite purchasers or customers are more satisfactory.

Description

Technical Field

[0001] The present invention relates to the technical field of satellite environmental testing, and in particular to a method and device for processing ground test items according to the severity level of satellite faults. Background Art

[0002] Ground testing is an essential and critical step in the satellite development process, crucial for satellite performance verification and reliability assurance. To provide satellites with a fully effective ground testing plan and prevent under- and over-testing, the United States pioneered the concept of test effectiveness. TE (Test Effectiveness) is defined as the ratio of the number of faults discovered during ground testing to the total number of discoverable faults, including ground testing and early on-orbit operations. This reflects the test's ability to screen for faults.

[0003] However, this method only starts from the number of fault counts, without considering the impact of the severity of different faults on the satellite's functional performance and on-orbit operation reliability, resulting in low reliability. Summary of the Invention

[0004] In view of this, the present invention provides a method for tailoring ground test items based on satellite fault severity levels to address the technical deficiencies in the prior art.

[0005] The present invention provides a method for tailoring ground test items based on satellite fault severity levels, comprising:

[0006] Step 1: Determine the severity coefficient E of the spacecraft on-orbit fault i and ground fault j by sorting out the spacecraft failure modes i and E j And the failure frequency F i and F j ;

[0007] Step 2: Calculate the number of relatively early on-orbit failures N under previous test scenarios F and the relative ground fault number N G , and the number of ground faults N corresponding to each test item G.t ;

[0008] Step 3: Calculate the comprehensive effectiveness T of the spacecraft ground test G , and the comprehensive effectiveness of the ground test T of each test t G.t ;

[0009] Step 4: Evaluate the comprehensive effectiveness of the spacecraft ground test in the target test plan G , whether it meets the expected value T G ' ;

[0010] If not satisfied, skip to step 5.

[0011] If satisfied, jump to step 6;

[0012] Step 5: Adjust the comprehensive effectiveness T of test item t by tailoring the test item t G.t , skip to step 2;

[0013] Step 6: Determine the target test plan that meets the requirements.

[0014] In some embodiments, the severity coefficient E of the on-track fault i is i Methods of determination include:

[0015] According to the spacecraft reliability analysis method, the severity coefficient E of different fault severity levels of on-orbit fault i is determined based on the fault severity level evaluation results in the spacecraft quality zero report. i , the determination methods include:

[0016]

[0017] Where n is the total number of early failures on orbit.

[0018] In some embodiments, the severity coefficient E of the ground fault j is j Methods of determination include:

[0019] According to the spacecraft reliability analysis method, the severity coefficient E of different fault severity levels of ground fault j is determined based on the fault severity level evaluation results in the spacecraft quality zero report. j , the determination methods include:

[0020]

[0021] Where m is the total number of fault types in the ground test.

[0022] In some embodiments, the number of relatively early on-orbit failures N F The calculation formula includes:

[0023]

[0024] Where n represents the total number of early failures on-orbit.

[0025] In some embodiments, the number of relatively early ground faults N G The calculation formula includes:

[0026]

[0027] Where m represents the total number of early-stage failures on the ground.

[0028] In some embodiments, the number of ground failures N of the ground test item t G.t The calculation formula includes:

[0029]

[0030] Among them, m t is the total number of fault types in ground test item t.

[0031] In some embodiments, the number of relatively early ground faults N G The calculation formula can also include:

[0032]

[0033] Where y represents the total number of test items.

[0034] In some embodiments, spacecraft ground test items include:

[0035] Functional test, thermal vacuum test, thermal balance test, thermal cycle test, mechanical test, magnetic test, leak detection and assembly test.

[0036] In some embodiments, the method further comprises:

[0037] Step 7: Perform ground tests according to the target test plan, obtain ground fault data and save it;

[0038] Step 8: Launch the satellite according to the target test plan, obtain and save on-orbit fault data.

[0039] By tailoring ground test items, the present invention has the following main advantages over existing test item tailoring methods: ① Through this test item tailoring method, faults of different severity levels can be fully screened, reducing the risk of spacecraft on-orbit operation; ③ Through this test item tailoring method, the number and severity of satellite faults can be comprehensively screened considering the different reliability requirements of different satellites, making the test plan more practical and making satellite purchasers or customers more satisfied. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 The present invention provides a flow chart of a method for tailoring ground test items based on satellite fault severity levels. DETAILED DESCRIPTION

[0041] The following description sets forth many specific details to facilitate a thorough understanding of this specification. However, this specification can be implemented in many other ways than those described herein, and those skilled in the art can make similar generalizations without violating the scope of this specification. Therefore, this specification is not limited to the specific implementations disclosed below.

[0042] The terms used in one or more embodiments of this specification are for the purpose of describing specific embodiments only and are not intended to limit one or more embodiments of this specification. The singular forms of "a" and "the" used in one or more embodiments of this specification and the appended claims are also intended to include plural forms, unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used in one or more embodiments of this specification refers to and includes any or all possible combinations of one or more associated listed items. The modifications of "one" and "a plurality" mentioned in this disclosure are illustrative and not restrictive, and those skilled in the art should understand that unless the context clearly indicates otherwise, it should be understood as "one or more".

[0043] It should be understood that although the terms first, second, etc. may be used to describe various information in one or more embodiments of this specification, such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of one or more embodiments of this specification, the first may also be referred to as the second, and similarly, the second may also be referred to as the first. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0044] See also Figure 1 , Figure 1 A flowchart of a method for tailoring ground test items based on satellite fault severity levels is shown according to some embodiments of this specification, specifically including:

[0045] Step 1: Determine the severity coefficient E of spacecraft on-orbit fault i and ground fault j by sorting out the spacecraft failure modes i and E j And the failure frequency F i and F j ;

[0046] Step 2: Calculate the number of relatively early on-orbit failures N under previous test scenarios F and the relative ground fault number N G , and the number of ground faults N corresponding to each test item G.t ;

[0047] Step 3: Calculate the comprehensive effectiveness T of the spacecraft ground test G , and the comprehensive effectiveness of the ground test T of each test t G.t ;

[0048] Step 4: Evaluate the comprehensive effectiveness of the spacecraft ground test in the target test plan G , whether it meets the expected value T G ';

[0049] If not satisfied, skip to step 5.

[0050] If satisfied, jump to step 6;

[0051] Step 5: Adjust the comprehensive effectiveness T of test item t by tailoring the test item t G.t , skip to step 2;

[0052] Step 6: Determine the target test plan that meets the requirements.

[0053] In some optional implementations, the severity coefficient E of the on-orbit fault i is i Methods of determination include:

[0054] According to the spacecraft reliability analysis method, the severity coefficient E of different fault severity levels of on-orbit fault i is determined based on the fault severity level evaluation results in the spacecraft quality zero report. i , the determination methods include:

[0055]

[0056] Where n is the total number of early failures on orbit.

[0057] In some optional implementations, the severity coefficient E of the ground fault j is j Methods of determination include:

[0058] According to the spacecraft reliability analysis method, the severity coefficient E of different fault severity levels of ground fault j is determined based on the fault severity level evaluation results in the spacecraft quality zero report. j , the determination methods include:

[0059]

[0060] Where m is the total number of fault types in the ground test.

[0061] In some optional implementations, the number of relatively early on-orbit failures N F The calculation formula includes:

[0062]

[0063] Where n represents the total number of early failures on-orbit.

[0064] In some optional implementations, the number of relatively early ground faults N G The calculation formula includes:

[0065]

[0066] Where m represents the total number of early-stage failures on the ground.

[0067] In some optional implementations, the number of ground failures N of ground test item t is G.t The calculation formula includes:

[0068]

[0069] Among them, m t is the total number of fault types in ground test item t.

[0070] In some optional implementations, the number of relatively early ground faults N G The calculation formula can also include:

[0071]

[0072] Where y represents the total number of test items.

[0073] In some optional implementations, the spacecraft ground test items include:

[0074] Functional test, thermal vacuum test, thermal balance test, thermal cycle test, mechanical test, magnetic test, leak detection and assembly test.

[0075] In some optional implementations, the method further includes:

[0076] Step 7: Perform ground tests according to the target test plan, obtain ground fault data and save it;

[0077] Step 8: Launch the satellite according to the target test plan, obtain and save on-orbit fault data.

[0078] The present disclosure is further described below through a specific embodiment:

[0079] The object of analysis is a communication satellite, and the satellite test project is currently being tailored.

[0080] according to Figure 1 The specific steps of this method are as follows:

[0081] Step 1: Based on the satellite's historical fault data, sort out the fault severity levels of on-orbit fault i and ground test fault j, as shown in Table 1 and Table 2. According to the fault severity coefficient value method in step 2, the fault severity level is determined to obtain the fault severity coefficient E of on-orbit fault i and ground test fault j. i and E j And the failure frequency F i and F j ,Here, the total number of on-orbit faults n and the total number of ground faults m are 15 and 78, respectively.

[0082] Table 1

[0083] On-orbit fault Fault severity <![CDATA[Fault severity coefficient E i > <![CDATA[Failure frequency F i > On-orbit failure 1 Can be ignored 0 5 On-orbit failure 2 Non-major 0.2 1 On-orbit failure 3 Catastrophic 1 1 … … … … On-orbit failure 15 Non-major 0.2 4

[0084] Table 2

[0085] On-orbit failure Fault severity level <![CDATA[Fault severity coefficient E j > <![CDATA[Failure frequency F j > Test Project Ground Fault 1 Non-major 0 1 4 Ground Fault 2 Can be ignored 0.2 1 1 On-orbit failure 3 Criticality 0.8 1 4 … … … … Ground Fault 78 Can be ignored 0 1 4

[0086] Step 2: Calculate the number of relatively early on-orbit failures N F and the relative ground fault number N G . E in Table 1 i and F i , and the parameter values ​​are substituted into the calculation formula in step 2 to obtain the number of relatively early on-orbit failures N F The value is 10.2

[0087]

[0088] Number of relative ground faults N G It can be obtained from the following formula, and the value is 57.7

[0089]

[0090] Similarly, for a specific test such as the thermal cycling test, item t = 4, the parameter values ​​in Table 2 are substituted into the calculation formula in step 4 to obtain the number of failures N in the thermal cycling test relative to the ground test. G.4 It is 9.5.

[0091]

[0092] That is, the number of relative ground faults N in all tests G It can also be expressed as follows:

[0093]

[0094] Table 3

[0095] Test Project Name of test item t <![CDATA[Number of failures in ground tests N G.t > <![CDATA[Relative test effectiveness T G.t <!-- 5 -->]]> 1 Functional testing 22.6 33.53％ 2 Thermal vacuum test 11.8 17.53％ 3 Thermal balance test 0.9 1.32％ 4 Thermal cycling test 9.0 13.42％ 5 Mechanical testing 2.6 3.84％ 6 Magnetic test 0.2 0.22％ 7 Leak detection 3.3 4.97％ 8 Final assembly test 7.4 11.06％

[0096] Step 3: Calculate the comprehensive effectiveness of the ground test T G and comprehensive failure escape rate P F , replace N in step 4 F and N G Substitute the value into the calculation formula in step 3:

[0097]

[0098] Secondly, calculate the relative test effectiveness T of the thermal cycling test G.4 , replace N in step 2 G.4 、N F and NG Substitute the value into the calculation formula in step 3:

[0099]

[0100] Similarly, the effectiveness of the entire test plan is the relative test effectiveness T of all test items t G.t See Table 3.

[0101] Step 4: Evaluate the comprehensive effectiveness of the ground test under the test plan (test project) G Fault escape rate N F Whether the expected value T is met G ' and P F ' , assuming the expected ground test comprehensive effectiveness T G ' =0.95 and comprehensive failure escape rate P F ' =0.05, according to the calculation result of step 3, it is not satisfied, jump to step 6.

[0102] Step 5: Adjust the comprehensive effectiveness T of test item t by optimizing test item t G.t According to the statistical analysis results of the historical data of the specific test items, the comprehensive effectiveness of each test is evaluated. G.t Adjust (Note: In fact, it is based on the relationship between the test items and conditions and the number of failures in the ground test. Adjust the test items and conditions to increase or decrease the number of failures N in the ground test. G.t , thus achieving the test validity T G.t The fourth column value is the adjusted value, that is, the effectiveness values ​​of the functional test, thermal vacuum test and thermal cycle test are increased, that is, the test conditions are tightened, so that the effectiveness of the entire test program reaches 0.95, which meets the expected value, and you can jump to step 6.

[0103] Table 4

[0104] Test Project Name of test item t <![CDATA[Relative test effectiveness T G.t > <![CDATA[Optimized relative test effectiveness T G.t > 1 Functional testing 33.53％ 35.69％ 2 Thermal vacuum test 17.53％ 19.35％ 3 Thermal balance test 1.32％ 1.28％ 4 Thermal cycling test 13.42％ 19.33％ 5 Mechanical testing 3.84％ 3.83％ 6 Magnetic test 0.22％ 0.32％ 7 Leak detection 4.97％ 3.83％ 8 Final assembly test 11.06％ 11.36％ total All trials 87.23％ 95.00％

[0105] Step 6: Determine the pilot project plan.

[0106] Step 7: Conduct ground testing according to the customized test project plan, and update the ground fault data. For example, if five faults occur during the thermal cycle test after the ground test, the data of these five faults needs to be updated according to the requirements of Step 2 to provide timely data support for subsequent satellite ground test customization.

[0107] Step 8: After the satellite is in orbit, the on-orbit fault data must be updated. For example, if two early-stage on-orbit faults occur, the on-orbit fault data for these two must be updated according to the requirements of Step 2 to provide timely data support for subsequent ground test customization of the satellite.

[0108] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0109] The preferred embodiments disclosed above are intended only to help illustrate this specification. The optional embodiments do not exhaustively describe all details, nor do they limit the invention to the specific embodiments described. Obviously, many modifications and variations are possible based on the content of the present invention. These embodiments are selected and described in detail in this specification to better explain the principles and practical applications of the present invention, thereby enabling those skilled in the art to better understand and utilize this specification. This specification is limited only by the claims and their full scope and equivalents.

Claims

1. A method for tailoring ground test items based on satellite fault severity levels, characterized in that: include: Step 1: Determine the severity coefficient E of the spacecraft on-orbit fault i and ground fault j i and E j And the failure frequency F i and F j ; Step 2: Calculate the number of relatively early on-orbit failures N under previous test scenarios F and the relative ground fault number N G , and the number of ground faults N corresponding to each test item G.t ; Step 3: Calculate the comprehensive effectiveness T of the spacecraft ground test G , and the comprehensive effectiveness of the ground test T of each test t G.t ; Step 4: Evaluate the comprehensive effectiveness of the spacecraft ground test in the target test plan G , whether it meets the expected value T G ' ; If not satisfied, skip to step 5. If satisfied, jump to step 6; Step 5: Adjust the comprehensive effectiveness T of test item t by tailoring the test item t G.t , skip to step 2; Step 6: Determine the target test plan that meets the requirements.

2. The method according to claim 1, characterized in that Severity coefficient E of on-orbit fault i i Methods of determination include: According to the spacecraft reliability analysis method, the severity coefficient E of different fault severity levels of on-orbit fault i is determined based on the fault severity level evaluation results in the spacecraft quality zero report. i , the determination methods include: Where n represents the total number of early failures on-orbit.

3. The method according to claim 1, characterized in that Severity coefficient E of ground fault j j Methods of determination include: According to the spacecraft reliability analysis method, the severity coefficient E of different fault severity levels of ground fault j is determined based on the fault severity level evaluation results in the spacecraft quality zero report. j , the determination methods include: Where m represents the total number of fault types in the ground test.

4. The method according to claim 1, wherein Relatively early number of on-orbit failures N F The calculation formula includes: Where n represents the total number of early failures on-orbit.

5. The method according to claim 1, wherein Number of relatively early ground faults N G The calculation formula includes: Where m represents the total number of early-stage failures on the ground.

6. The method according to claim 1, characterized in that Number of ground failures N for ground test item t G.t The calculation formula includes: Among them, m t is the total number of fault types in ground test item t.

7. The method according to claim 5, characterized in that Number of relatively early ground faults N G The calculation formula can also include: Where y represents the total number of test items.

8. The method according to claim 1, characterized in that Spacecraft ground test projects include: Functional test, thermal vacuum test, thermal balance test, thermal cycle test, mechanical test, magnetic test, leak detection and assembly test.

9. The method according to claim 1, characterized in that The method further comprises: Step 7: Perform ground tests according to the target test plan, obtain ground fault data and save it; Step 8: Launch the satellite according to the target test plan, obtain and save on-orbit fault data.

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