Current sampling unit fault identification method and system based on short circuit impact analysis

Abstract

The invention discloses a current sampling unit fault identification method and system based on short-circuit impact analysis, and relates to the technical field of power monitoring, and the method comprises the steps: inputting a system connection circuit and unit configuration parameters of a current sampling unit, and calculating a self-recovery capability index; constructing a short-circuit impact test database, and recording sampling function fault data under different impact current sequences; based on the recovery capability index analysis database, extracting a characteristic short circuit impact current sequence of the current sampling unit; and when the short-circuit impact current sequence received in real time is matched with the characteristic sequence, a sampling protection command is triggered. According to the invention, the technical problem that an existing current sampling unit lacks an effective fault identification and self-recovery capability evaluation mechanism when encountering short-circuit impact and cannot realize accurate protection is solved, and a real-time fault identification and protection mechanism based on short-circuit impact analysis is established. The technical effects of accurate fault identification and real-time protection control under short circuit impact are achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of power monitoring, and in particular to a current sampling unit fault identification method and system based on short-circuit impact analysis. Background Art

[0002] With the widespread adoption of smart energy meters in power systems, the stability and shock resistance of the current sampling unit, a core metering component, are crucial. During operation, the current sampling unit is susceptible to interference from shocks such as short circuits and sudden current changes, which can lead to sampling errors, delays, and even failure. Existing technologies often rely on simple overcurrent protection measures, lacking the ability to assess the sampling unit's resilience to shocks and identify faults in real time. This makes it difficult to ensure reliable operation of the equipment under extreme operating conditions and fails to meet the requirements for the long-term safe operation of smart metering equipment. Summary of the Invention

[0003] The present application provides a current sampling unit fault identification method and system based on short-circuit impact analysis, which is used to solve the technical problem that existing current sampling units lack effective fault identification and self-recovery capability evaluation mechanisms when encountering short-circuit impacts, and cannot achieve accurate protection.

[0004] A first aspect of the present application provides a current sampling unit fault identification method based on short-circuit impact analysis, the method comprising: recording a system connection circuit in which the current sampling unit is located; calculating the recovery capability of the current sampling unit based on unit configuration parameters of the current sampling unit and system configuration parameters of the system connection circuit, and outputting a self-recovery capability index; constructing a short-circuit impact test database for the current sampling unit, the short-circuit impact test database comprising sampling function fault test data of the current sampling unit under a short-circuit impact current sequence; analyzing the short-circuit impact test database with the self-recovery capability index as a target to obtain a characteristic short-circuit impact current sequence of the current sampling unit; and obtaining a sampling protection command when a real-time short-circuit impact current sequence to be received by the current sampling unit matches the characteristic short-circuit impact current sequence.

[0005] According to a second aspect of the present application, a current sampling unit fault identification system based on short-circuit impact analysis is provided, the system comprising: a connection circuit entry module, the connection circuit entry module being used to enter the system connection circuit in which the current sampling unit is located; a recovery capacity calculation module, the recovery capacity calculation module being used to calculate the recovery capacity of the current sampling unit based on the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit, and output a self-recovery capacity index; a short-circuit impact test database construction module, the short-circuit impact test database construction module being used to construct a short-circuit impact test database for the current sampling unit, the short-circuit impact test database including sampling function fault test data of the current sampling unit under a short-circuit impact current sequence; a short-circuit impact current analysis module, the short-circuit impact current analysis module being used to analyze the short-circuit impact test database with the self-recovery capacity index as the target to obtain a characteristic short-circuit impact current sequence of the current sampling unit; and a sampling protection module, the sampling protection module being used to obtain a sampling protection command when the real-time short-circuit impact current sequence to be received by the current sampling unit matches the characteristic short-circuit impact current sequence.

[0006] One or more technical solutions provided in this application have at least the following technical effects or advantages: The present application provides a current sampling unit fault identification method and system based on short-circuit impact analysis, which relate to the field of power monitoring technology. By recording the current sampling unit and its system connection information, calculating the self-recovery capability index, and building a short-circuit impact test database containing fault data, a characteristic impact current sequence is extracted. When the real-time impact current matches the characteristic sequence, a sampling protection command is triggered to achieve fault identification and active protection of the current sampling unit. This solves the technical problem that existing current sampling units lack an effective fault identification and self-recovery capability evaluation mechanism when encountering short-circuit impacts, and are unable to achieve precise protection. This achieves the technical effect of achieving precise fault identification and real-time protection control under short-circuit impacts and improving system operation stability and safety by establishing a real-time fault identification and protection mechanism based on short-circuit impact analysis. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0008] Figure 1 A schematic flow chart of a current sampling unit fault identification method based on short-circuit impact analysis provided in an embodiment of the present application; Figure 2A schematic diagram of the structure of a current sampling unit fault identification system based on short-circuit impact analysis provided in an embodiment of the present application.

[0009] Description of the accompanying drawings: connection circuit entry module 11, recovery capacity calculation module 12, short-circuit impact test database construction module 13, short-circuit impact current analysis module 14, sampling protection module 15. DETAILED DESCRIPTION

[0010] The present application provides a current sampling unit fault identification method and system based on short-circuit impact analysis, which is used to solve the technical problem that existing current sampling units lack effective fault identification and self-recovery capability evaluation mechanisms when encountering short-circuit impacts, and cannot achieve accurate protection.

[0011] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0012] It should be noted that the terms "first", "second", etc. in the specification of the present application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or server that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or modules that are not clearly listed or inherent to these processes, methods, products or devices.

[0013] Example 1, as Figure 1 As shown, the present application provides a current sampling unit fault identification method based on short-circuit impact analysis, the method comprising: P10: Enter the system connection circuit where the current sampling unit is located.

[0014] Specifically, the system connection circuit information of the current sampling unit must first be entered. This operation serves as the initial input for the fault identification process, aiming to clarify the actual working conditions and electrical environment of the current sampling unit in the smart electricity meter system. The system connection circuit refers to the physical connection relationship and electrical parameter configuration between the current sampling unit and its upstream and downstream circuits (such as the power input loop, load output branch, metering chip input terminal, overcurrent protection device, etc.), including but not limited to the wire material, cable length, connection topology, impedance matching relationship, grounding method, and the type of power grid (such as three-phase three-wire or three-phase four-wire). This information constitutes the propagation path of the short-circuit shock during the conduction process and the boundary conditions of the current waveform response, directly affecting the waveform distortion, shock amplitude, and energy distribution of the shock borne by the sampling unit.

[0015] For example, first, it is necessary to clarify the installation location of the current sampling unit and its topological structure in the power system. The current sampling unit is usually installed in the current loop of the electric energy meter, connected in series between the load and the power supply, and is used to monitor the current signal in real time. Its connection method directly affects its stress condition and response characteristics under short-circuit impact. For example, in a three-phase circuit with a star connection, the current sampling unit is connected in series in the load circuit of each phase, while in a triangle connection, its connection position and method are different. Therefore, it is necessary to record in detail the connection method (star or triangle, etc.) of the current sampling unit, the installation position (such as the starting end or end of a phase load circuit), and the position and model of other circuit components connected to it (such as circuit breakers, transformers, etc.).

[0016] Secondly, enter the parameter information of the system connection circuit. These parameters include but are not limited to the circuit's impedance parameters (resistance, inductance, capacitance, etc.), power supply parameters (voltage level, frequency, number of phases, etc.), and load parameters (rated power, power factor, etc.). Taking the impedance parameters as an example, the resistance value determines the current magnitude that the current sampling unit will withstand under a short-circuit impact; the inductance value affects the current rise rate and attenuation characteristics; and the capacitance value may affect the circuit's resonant frequency and the waveform of the impact current. Accurately entering these parameters will help to accurately calculate the response characteristics of the current sampling unit under a short-circuit impact through subsequent simulation or theoretical analysis methods, providing an accurate basis for fault identification.

[0017] Thirdly, the configuration of the protection devices of the system connection circuits needs to be recorded. When a short circuit occurs, the protection devices (such as overcurrent protection, short-circuit protection, etc.) will quickly operate to cut off the circuit and protect the equipment from damage. Therefore, recording parameters such as the type of protection device, the action current threshold, and the action time is crucial for analyzing the actual stress of the current sampling unit under a short circuit impact. For example, if the action current threshold of the protection device is low and the action time is short, the current sampling unit may be protected at the beginning of the short circuit impact and the stress is relatively light; conversely, if the protection device operates slowly, the current sampling unit may be subjected to the impact current for a longer period of time, resulting in an increased risk of failure.

[0018] Next, enter the operating environment parameters of the system's connected circuits. These parameters include ambient temperature, humidity, and altitude. High ambient temperature may cause changes in the resistance of the current sampling unit, affecting its measurement accuracy; high humidity may degrade insulation performance and increase the risk of short circuits; and high altitudes may affect air insulation performance, placing higher demands on the device's insulation strength. Comprehensively considering these operating environment parameters helps comprehensively assess the current sampling unit's operating status and fault risks under actual operating conditions, providing a more accurate reference for subsequent fault identification and protection strategy development.

[0019] Finally, the structural parameters and physical properties are converted into a standardized data format (such as XML or JSON) and input into the short-circuit shock simulation subsystem. This input information should include the following fields: a connection topology diagram (reflecting the connection path between the sampling unit and other modules); a node electrical parameter table (recording the voltage level, impedance, and inductance / capacitance values ​​of key points); a shock propagation path (used to establish a short-circuit shock action path model); and thermal-electrical characteristic parameters (used to analyze the temperature rise effect and critical failure threshold caused by the shock).

[0020] Through the above operations, the structured modeling and parameter quantification of the operating environment of the current sampling unit can be achieved, providing an accurate and reproducible system foundation for subsequent recovery capacity calculation and short-circuit impact tolerance assessment, ensuring that the entire fault identification method has a complete closed-loop capability for engineering implementation.

[0021] P20: Calculate the recovery capability of the current sampling unit according to the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit, and output a self-recovery capability index.

[0022] Furthermore, step P20 in this embodiment of the present application further includes: P21: Evaluate according to the unit configuration parameters of the current sampling unit, including the material type score, impact resistance score, thermal recovery time and temperature rise threshold score; P22: Normalize and weight the material type score, impact resistance score, thermal recovery time and temperature rise threshold score, and output the unit-level recovery capability index; P23: Obtain the bypass branch score, circuit protection score, power supply voltage regulation capability score and load isolation structure according to the system configuration parameters of the system connection circuit; P24: Normalize and weight the bypass branch score, circuit protection score, power supply voltage regulation capability score and load isolation structure, and output the system-level recovery capability index; P25: Integrate the unit-level recovery capability index and the system-level recovery capability index, and output the self-recovery capability index.

[0023] It should be understood that in order to comprehensively evaluate the recovery capability of the current sampling unit after a short circuit shock, it is necessary to comprehensively consider the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit.

[0024] During implementation, the structural material parameters, packaging process parameters, and service life data of the current sampling unit are first extracted from electricity meter production data or detection interfaces. Combined with actual testing or technical data, the system then performs a material type score, a shock endurance score, a thermal recovery time estimate, and a temperature rise threshold score. For example, the material type score can be graded based on the thermoelectric stability of conductive materials (such as manganese copper, constantan, and alloy film) under transient current shocks. The shock endurance score is obtained by consulting typical shock life data specified in MIL-HDBK-217F or State Grid standards. The thermal recovery time is obtained through thermal conduction model simulation or actual temperature rise testing. The temperature rise threshold is calculated by combining the thermal resistance, rated power, and maximum operating temperature limit of the sampling resistor. These scores are normalized using a unified dimensional standard and weighted according to preset weights to form a unit-level resilience indicator. The weights can be configured based on the reliability requirements of the actual operating scenario, for example, giving greater weight to thermal recovery performance and material stability in harsh power grid environments.

[0025] After completing the capability assessment of the current sampling unit itself, the structural parameters of the system connection circuit are further extracted, including whether there are bypass branches, current protection elements, power supply voltage regulator modules, and load isolation structures. The bypass branch score assesses the presence of parallel current limiting devices, bypass capacitors, TVS devices, and other components, measuring their ability to shunt inrush currents. The circuit protection score evaluates the protection response speed and disconnection accuracy based on parameters such as the operating time and voltage disconnection threshold of circuit breakers and fast fuses. The power supply voltage regulation capability score is completed based on parameters such as the voltage regulator adjustment speed and overvoltage response capability. The load isolation structure determines whether there is an isolation transformer, inductive current limiting structure, or current limiting device between the sampling unit and the subsequent load. After each structural parameter is assigned a score based on functional importance, it is normalized and weighted to output the system-level recovery capability indicator.

[0026] Finally, the unit-level and system-level indicators are integrated to form the final self-recovery capability indicator. This indicator not only reflects the anti-interference and recovery performance of the sampling unit under shock environment, but also quantifies the system's ability to mitigate and protect against shock energy at the topological and structural levels. The indicator integration method can adopt a linear weighted model, and the formula form is: ;in, is the self-recovery capability indicator, is the unit body recovery capability index, is the system structure recovery capability indicator, ∈[0,1] is the fusion weight coefficient, which reflects the ratio configuration of the unit body capability or the system structure capability in the recognition strategy. In practical applications, if the sampling unit is a standardized device and the system redundancy is strong, it is recommended to select ∈[0.6,0.8]. The resulting SRCI value will serve as the basis for determining the recovery capability boundary of the current sampling unit in the face of a shock impulse environment. It will then be directly used for decision-making in matching the shock current sequence, demonstrating high operability and adaptability to algorithm deployment.

[0027] P30: Constructing a short-circuit impact test database of the current sampling unit, wherein the short-circuit impact test database includes sampling function failure test data of the current sampling unit under a short-circuit impact current sequence.

[0028] Furthermore, to define the storage structure of the database, step P30 in the embodiment of the present application further includes: P31: Define the test data storage field, which includes the test number, the model of the current sampling unit under test, the short-circuit impact current sequence of the test input, the current sampling simulation output data of the test output, and the current sampling difference output data; P32: Define the storage structure of the short-circuit impact test database according to the test data storage field.

[0029] Optionally, a short-circuit shock test database for current sampling units can be constructed to store and manage various test data from current sampling units under short-circuit shock conditions. This database will provide data support for subsequent fault analysis and shock tolerance assessment, and provide a reference for comparative performance analysis of different devices and shock types.

[0030] In order to build a short-circuit impact test database for current sampling units, it is necessary to define the database's storage structure in detail to ensure that key data during the short-circuit impact test can be accurately recorded and stored. Specifically, the test data storage fields are first defined. These fields include the test number, the model of the current sampling unit under test, the short-circuit impact current sequence of the test input, the current sampling analog output data of the test output, and the current sampling difference output data. The test number is used to uniquely identify each test, facilitating subsequent query and management; the model of the current sampling unit under test records the specific model involved in the test, ensuring that the data corresponds to a specific model; the short-circuit impact current sequence records in detail the current parameters applied during the test, including amplitude, waveform, and duration. These parameters are key to analyzing the response characteristics of the current sampling unit; the current sampling analog output data records the actual output of the current sampling unit during the test, reflecting its working status under impact conditions; and the current sampling difference output data records the difference between the output data and the normal state, intuitively reflecting the impact of the short-circuit impact.

[0031] Based on the above field definitions, the storage structure of the short-circuit impact test database is further constructed. For example, a relational database management system (such as MySQL or PostgreSQL) is used to implement it, and a data table is created. Each row in the table represents a test record, and each column corresponds to a field. For example, the data table can be named "ShortCircuitTestDatabase", and its structure is as follows: the first column is the test number, the second column is the model of the current sampling unit under test, the third column is the short-circuit impact current sequence of the test input, the fourth column is the current sampling simulation output data of the test output, and the fifth column is the current sampling difference output data. Through this structured storage method, test data can be efficiently stored and retrieved, and subsequent data analysis and processing operations can be supported. This database structure not only facilitates data query and statistical analysis, but also enables data interaction with other systems, thereby improving the efficiency and reliability of the entire fault identification system. For example, as shown in Table 1: Table 1: Example of a short-circuit impulse test database

[0032] illustrate: Test Number: A number that uniquely identifies each test. Tested Current Sampling Unit Model: The specific model of the current sampling unit involved in the test. Impact Current Peak (A): The maximum value of the short-circuit impact current. Impact Current Slope (A / ms): The rate of rise of the short-circuit impact current. Duration (ms): The duration of the short-circuit impact current. Sampling Delay (ms): The time interval from the impact occurrence to the current sampling unit outputting valid data. Response Distortion (%): The degree of deviation between the output signal of the current sampling unit and the actual input signal. Thermal Recovery Time (s): The time required for the current sampling unit to recover from the high temperature state after the impact to the normal operating temperature. Current Sampling Difference Output Data (A): The difference between the actual output current of the current sampling unit and the theoretical output current. Recovery Degree (%): The degree of performance recovery of the current sampling unit after the short-circuit impact, calculated by the difference amplitude of the difference data.

[0033] Furthermore, the data is entered to generate a short-circuit impact test database. Step P30 of the embodiment of the present application further includes: P33: Set the impact injection sample data, the impact injection sample data includes multiple short-circuit impact current sequences, each short-circuit impact current sequence includes an impact current peak, a current slope and a duration; P34: Select the sample current sampling unit of the current sampling unit; P35: Connect a controllable impact current source, perform multiple impact simulations on the sample current sampling unit with the impact injection sample data, and record the current sampling simulation output data after the impact, wherein the current sampling simulation output data includes sampling delay, response distortion and thermal recovery time; P36: Compare the current sampling simulation output data with the current sampling theoretical output data, and store the extracted current sampling difference output data as sampling function fault test data in the short-circuit impact test database.

[0034] Specifically, in order to further improve the construction of the short-circuit impact test database, it is necessary to specifically perform data entry and generation of the short-circuit impact test database.

[0035] First, set the impulse injection sample data. This data includes multiple short-circuit impulse current sequences, each of which defines in detail the impulse current peak value, current slope, and duration. These parameter settings should cover various short-circuit impulse scenarios that the current sampling unit may encounter in actual operation to ensure the comprehensiveness and effectiveness of the test. For example, the impulse current peak value can be set to multiple levels from low to high, the current slope can simulate different situations of rapid and slow rise, and the duration can vary from short instantaneous impulses to longer continuous impulses.

[0036] Next, select sample current sampling units. These samples should be representative and reflect the performance differences between current sampling units of different models or batches under short-circuit shocks. Sample selection should be based on the diversity of actual application scenarios to ensure the universality of the test results.

[0037] Next, a controllable surge current source is connected, and multiple surge simulations are performed on the sample current sampling unit using the previously set surge injection sample data. After each surge simulation, the current sampling simulation output data is recorded. This data includes sampling delay, response distortion, and thermal recovery time. Sampling delay refers to the time interval from the occurrence of the surge to the output of valid data by the current sampling unit; response distortion reflects the degree of deviation between the output signal of the current sampling unit under the surge and the actual input signal; and thermal recovery time refers to the time required for the current sampling unit to recover from the high temperature state after the surge to its normal operating temperature. These parameters can comprehensively reflect the dynamic performance and recovery ability of the current sampling unit under short-circuit surges.

[0038] Finally, the recorded simulated current sampling output data is compared with the theoretical current sampling output data. The theoretical output data is calculated based on the current sampling unit's design parameters and ideal operating conditions and serves as a reference. Through this comparison, current sampling difference output data is extracted. This difference data can intuitively reflect the actual impact of short-circuit shock on the current sampling unit's performance. This difference data is stored as sampling function fault test data in the short-circuit shock test database, providing rich data support for subsequent fault feature extraction and model building.

[0039] Through the above steps, the complete entry of test data is achieved, and a complete short-circuit impulse test database is generated, which can provide an effective data source for further fault identification and impulse tolerance evaluation.

[0040] Furthermore, the embodiment of the present application also includes step P31a: the test data storage field of the short-circuit impact test database also includes the recovery degree of the current sampling unit after the impact, wherein the recovery degree of the current sampling unit is obtained through the difference amplitude of the current sampling difference output data.

[0041] In one possible embodiment of the present application, to more comprehensively record the performance of the current sampling unit during a short-circuit shock test, when constructing the short-circuit shock test database, the test data storage field includes not only the test number, the model of the current sampling unit under test, the short-circuit shock current sequence, the current sampling simulation output data, and the current sampling difference output data, but also specifically adds the degree of recovery of the current sampling unit after the shock. The introduction of this parameter enables the database to more completely reflect the performance changes and recovery of the current sampling unit after a short-circuit shock.

[0042] Among them, the degree of recovery of the current sampling unit is obtained by the difference amplitude of the current sampling difference output data. For example, after the short-circuit impact test, the difference between the output data of the current sampling unit and the theoretical output data is recorded, that is, the current sampling difference output data. Then, the amplitude of this difference data is calculated, which reflects the degree of performance deviation of the current sampling unit after the impact. The smaller the difference amplitude, the better the recovery degree of the current sampling unit; the larger the difference amplitude, the poorer the recovery degree. In this way, the recovery of the current sampling unit after the short-circuit impact can be quantitatively evaluated and stored as important test data in the short-circuit impact test database.

[0043] For example, in a short-circuit shock test, the theoretical output current of the current sampling unit is 100A, but the actual output current is 98A. Therefore, the current sampling difference output data is 2A. If, in another shock test, the theoretical output current is still 100A, but the actual output current is 95A, the difference output data is 5A. By comparing the difference amplitudes of these two tests (2A and 5A), it can be determined that the current sampling unit's recovery after the second shock is relatively poor.

[0044] Incorporating the current sampling unit's recovery level into the short-circuit impulse test database not only enriches the database's content but also provides more comprehensive data support for subsequent fault diagnosis and recovery capability assessment. This helps more accurately identify the current sampling unit's failure mode, optimizes fault protection strategies, and provides a basis for design improvements of the current sampling unit.

[0045] Furthermore, by comparing the current sampling simulation output data with the current sampling theoretical output data, step P36 of the embodiment of the present application further includes: P36-1: Continuously monitor the current sampling analog output change data of the current sampling unit after the impact; P36-2: Construct a current sampling simulation curve based on the current sampling analog output change data; P36-3: Record the current sampling simulation stable output data when the current sampling simulation curve is stable; P36-4: Compare the current sampling simulation stable output data with the current sampling theoretical output data to obtain the current sampling difference output data.

[0046] Optionally, in order to more accurately obtain the performance changes of the current sampling unit after a short-circuit shock, the output changes of the current sampling unit can be continuously monitored and analyzed to construct a current sampling simulation curve and ultimately determine the current sampling difference output data.

[0047] Specifically, the current sampling unit's analog output data after the impact is continuously monitored. This process requires the use of high-precision monitoring equipment to record the changes in the current sampling unit's output current in real time after the short-circuit impact. The monitoring time should be long enough to cover the entire process of the current sampling unit recovering from the unstable state after the impact to the stable state. For example, the monitoring time can be set to 10 seconds to 1 minute after the short-circuit impact occurs, depending on the recovery characteristics of the current sampling unit.

[0048] Next, a current sampling simulation curve is constructed based on the monitored current sampling analog output change data. This curve intuitively demonstrates the dynamic response of the current sampling unit after a short-circuit shock. By analyzing the curve's shape and changing trends, a preliminary assessment of the current sampling unit's recovery capacity and performance changes can be made. For example, if the curve quickly stabilizes within a short period of time, it indicates strong recovery capacity; conversely, if the curve fluctuates significantly over a long period of time, it indicates weak recovery capacity.

[0049] Subsequently, the current sampling simulation stable output data is recorded when the current sampling simulation curve stabilizes. This data reflects the output current value of the current sampling unit when it finally recovers to a stable operating state after the short-circuit shock. Stable output data is obtained by analyzing the current sampling simulation curve, determining the time point when the curve stabilizes, and recording the output current value corresponding to that time point. For example, when the curve stabilizes 30 seconds after the short-circuit shock, the output current value at this time is recorded as the stable output data.

[0050] Finally, the simulated stable output data of the current sampling is compared with the theoretical output data of the current sampling to obtain the current sampling difference output data. The theoretical output data of the current sampling is calculated based on the design parameters and ideal operating conditions of the current sampling unit and serves as a reference. By calculating the difference between the stable output data and the theoretical output data, the performance deviation of the current sampling unit after a short-circuit shock can be quantitatively evaluated. For example, if the theoretical output current is 100A and the stable output current is 98A, the current sampling difference output data is 2A. This difference data is stored as sampling function fault test data in the short-circuit shock test database, providing an important basis for subsequent fault diagnosis and analysis.

[0051] Through the above steps, not only can the performance changes of the current sampling unit after a short-circuit shock be obtained more accurately, but also more comprehensive data support can be provided for fault identification and optimization of protection strategies, which helps to improve the reliability of the current sampling unit and ensure the stable operation of the power system.

[0052] P40: Analyze the short-circuit impact test database with the self-recovery capability index as the target to obtain a characteristic short-circuit impact current sequence of the current sampling unit.

[0053] Furthermore, step P40 in this embodiment of the present application further includes: P41: Obtain historical impact test samples that match the current sampling unit model in the short-circuit impact test database; P42: Evaluate the recovery degree sample of the current sampling unit after the historical impact test samples; P43: Select the first historical impact test sample that is less than the self-recovery capability index from the recovery degree sample; P44: Obtain the short-circuit impact current sequence corresponding to the first historical impact test sample as the characteristic short-circuit impact current sequence of the current sampling unit.

[0054] It should be understood that in order to obtain the characteristic short-circuit impulse current sequence of the current sampling unit, it is necessary to conduct an in-depth analysis of the short-circuit impulse test database with the self-recovery capability index as the target.

[0055] First, historical impulse test samples matching the current sampling unit model are retrieved from the short-circuit impulse test database. By matching the current sampling unit model in the test database, test records that match the current sampling unit model under investigation are selected from the database to ensure that the selected test samples accurately reflect the behavior of the specific device model under short-circuit impulse. These records contain test data under different short-circuit impulse current sequences and the corresponding recovery data. By matching the model, the analyzed data is guaranteed to have the same characteristics as the target current sampling unit, thereby improving the accuracy of the analysis results.

[0056] Next, the recovery degree samples of the current sampling unit after these historical shock test samples are evaluated. For example, this is done by analyzing the recovery process after each historical test sample, specifically assessing metrics such as the time it takes for the device to reach a stable operating state after the shock and the recovery accuracy. Specifically, the recovery degree sample can be a quantitative metric, such as the error percentage after recovery or the recovery time. By evaluating these metrics, the degree of impact of each historical shock test sample on the performance of the current sampling unit can be determined.

[0057] Then, the first historical shock test sample with a value less than the self-recovery capability index is selected from the recovery degree samples. The self-recovery capability index is calculated based on the current sampling unit's configuration parameters and system configuration parameters, and reflects the current sampling unit's maximum ability to recover after a short-circuit shock. By comparing the recovery degree samples with the self-recovery capability index, historical test samples in which the current sampling unit still recovered to an acceptable range after the shock are selected. These samples represent the maximum shock intensity that the current sampling unit can withstand in actual operation.

[0058] Finally, the short-circuit impulse current sequence corresponding to the first historical impulse test sample is obtained. This current sequence will serve as the characteristic short-circuit impulse current sequence of the current sampling unit, used to further analyze the sampling unit's performance characteristics such as impulse tolerance, recovery capability, and accuracy degradation. This characteristic sequence will serve as a standard reference in subsequent steps, used for comparison with real-time test data to determine whether the current sampling unit's recovery capability in actual operation meets design requirements.

[0059] For example, assume that the self-recovery capability indicator is that the error percentage does not exceed 5% and the recovery time does not exceed 10 seconds. In the short-circuit impact test database, after screening out the historical test samples that match the target current sampling unit model, evaluate the recovery degree of each sample. If the error percentage of a sample after a short-circuit impact is 3% and the recovery time is 8 seconds, then the recovery degree of this sample is less than the self-recovery capability indicator and can be selected as the first historical impact test sample. Obtain the short-circuit impact current sequence corresponding to the sample (for example, the impact current peak is 100A, the current slope is 10A / ms, and the duration is 20ms) and use it as the characteristic short-circuit impact current sequence.

[0060] Through the above steps, the characteristic short-circuit impulse current sequence of the current sampling unit under short-circuit impulse can be accurately determined, providing basic data support for subsequent impulse performance evaluation and equipment optimization.

[0061] P50: When the real-time short-circuit impulse current sequence to be received by the current sampling unit matches the characteristic short-circuit impulse current sequence, a sampling protection command is obtained.

[0062] Furthermore, step P50 in the embodiment of the present application further includes: P51: Acquire multiple functional units connected to the current sampling unit; P52: Collect the real-time short-circuit impact current sequences of the output ends of the multiple functional units respectively. If the real-time short-circuit impact current sequence matches the characteristic short-circuit impact current sequence, obtain a sampling protection command to interrupt transmission.

[0063] Specifically, to implement fault protection for the current sampling unit, it is necessary to monitor the incoming short-circuit impulse current sequence in real time and match it with the characteristic short-circuit impulse current sequence. When a match is successful, a sampling protection command is obtained to interrupt transmission and prevent a fault from occurring.

[0064] First, multiple functional units connected to the current sampling unit are acquired. These functional units can include power modules, load devices, protection devices, and so on, and together with the current sampling unit, they form a complete power system. The output current of these functional units directly affects the operating status of the current sampling unit, so the output terminals of these functional units need to be monitored in real time.

[0065] Next, the real-time short-circuit surge current sequence is collected from the output terminals of each functional unit, recording the current waveform at each unit's output in real time, including parameters such as current amplitude, slope, and duration. The collected real-time short-circuit surge current sequence is then compared with the characteristic short-circuit surge current sequence. When the real-time short-circuit surge current sequence of any functional unit matches the characteristic sequence, it indicates that the current sampling unit of that unit is experiencing a condition consistent with a historical surge test. The system must immediately trigger a sampling protection command and implement appropriate protective measures, such as interrupting signal transmission, limiting current input, or activating bypass protection, to prevent the current sampling unit from malfunctioning or damaging. The sampling protection command can be a signal that triggers a protective device (such as a circuit breaker or relay) to quickly disconnect the current sampling unit from the functional unit to prevent damage due to the short-circuit surge. This process must be completed extremely quickly to ensure the timeliness and effectiveness of the protective action.

[0066] For example, assume the characteristic short-circuit impulse current sequence is: impulse current peak 100A, current slope 10A / ms, duration 20ms. During real-time monitoring, if the real-time short-circuit impulse current sequence at the output of a functional unit is: impulse current peak 98A, current slope 11A / ms, duration 19ms, and the set matching threshold is ±5%, the two are considered to match, and the system will immediately issue a sampling protection command, interrupting current transmission and protecting the current sampling unit from damage.

[0067] Through this process, real-time protection of the current sampling unit can be achieved, and when the current impact condition approaches its tolerance limit, system damage can be effectively avoided, ensuring stable operation of the equipment.

[0068] In summary, the embodiments of the present application have at least the following technical effects: This application records the system connection circuit and unit configuration parameters of the current sampling unit, calculates its recovery capability and outputs the self-recovery capability index, builds a short-circuit impact test database, records the sampling function failure data under different impact current sequences, analyzes the database based on the recovery capability index, extracts the characteristic short-circuit impact current sequence of the current sampling unit, and triggers a sampling protection command when the short-circuit impact current sequence received in real time matches the characteristic sequence to protect the current sampling unit from damage.

[0069] The technical effect of achieving accurate fault identification and real-time protection control under short-circuit impact is achieved by establishing a real-time fault identification and protection mechanism based on short-circuit impact analysis.

[0070] Embodiment 2 is based on the same inventive concept as the current sampling unit fault identification method based on short-circuit impact analysis in the previous embodiment. Figure 2 As shown, the present application provides a current sampling unit fault identification system based on short-circuit impact analysis. The system and method embodiments in the present application are based on the same inventive concept. The system includes: The connection circuit recording module 11 is used to record the system connection circuit where the current sampling unit is located.

[0071] The recovery capability calculation module 12 is configured to calculate the recovery capability of the current sampling unit according to the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit, and output a self-recovery capability index.

[0072] The short-circuit impact test database construction module 13 is used to construct a short-circuit impact test database of the current sampling unit, and the short-circuit impact test database includes sampling function failure test data of the current sampling unit under a short-circuit impact current sequence.

[0073] The short-circuit impulse current analysis module 14 is configured to analyze the short-circuit impulse test database with the self-recovery capability index as a target, and obtain a characteristic short-circuit impulse current sequence of the current sampling unit.

[0074] The sampling protection module 15 is configured to obtain a sampling protection command when the real-time short-circuit impulse current sequence to be received by the current sampling unit matches the characteristic short-circuit impulse current sequence.

[0075] Furthermore, the recovery capability calculation module 12 is further configured to perform the following steps: An evaluation is performed based on the unit configuration parameters of the current sampling unit, including a material type score, an impact resistance score, a thermal recovery time, and a temperature rise threshold score; the material type score, impact resistance score, thermal recovery time, and temperature rise threshold score are normalized and weighted, and a unit-level recovery capability index is output; based on the system configuration parameters of the system connection circuit, a bypass branch score, a circuit protection score, a power supply voltage regulation capability score, and a load isolation structure are obtained; the bypass branch score, circuit protection score, power supply voltage regulation capability score, and load isolation structure are normalized and weighted, and a system-level recovery capability index is output; the unit-level recovery capability index and the system-level recovery capability index are integrated to output a self-recovery capability index.

[0076] Furthermore, the short-circuit impact test database construction module 13 is further configured to perform the following steps: Define a test data storage field, which includes the test number, the model of the current sampling unit under test, the short-circuit impact current sequence of the test input, the current sampling simulation output data of the test output, and the current sampling difference output data; define the storage structure of the short-circuit impact test database according to the test data storage field.

[0077] Furthermore, the short-circuit impact test database construction module 13 is further configured to perform the following steps: Set impact injection sample data, the impact injection sample data includes multiple short-circuit impact current sequences, each short-circuit impact current sequence includes an impact current peak, a current slope and a duration; select a sample current sampling unit of the current sampling unit; connect a controllable impact current source, perform multiple impact simulations on the sample current sampling unit with the impact injection sample data, and record the current sampling simulation output data after the impact, wherein the current sampling simulation output data includes sampling delay, response distortion and thermal recovery time; compare the current sampling simulation output data with the current sampling theoretical output data, and store the extracted current sampling difference output data as sampling function fault test data in the short-circuit impact test database.

[0078] Furthermore, the short-circuit impact test database construction module 13 is further configured to perform the following steps: The test data storage field of the short-circuit impact test database further includes the recovery degree of the current sampling unit after the impact, wherein the recovery degree of the current sampling unit is obtained through the difference amplitude of the current sampling difference output data.

[0079] Furthermore, the short-circuit impact test database construction module 13 is further configured to perform the following steps: Continuously monitor the current sampling analog output change data of the current sampling unit after the impact; construct a current sampling simulation curve based on the current sampling analog output change data; record the current sampling simulation stable output data when the current sampling simulation curve is stable; compare the current sampling simulation stable output data with the current sampling theoretical output data to obtain the current sampling difference output data.

[0080] Furthermore, the short-circuit impulse current analysis module 14 is further configured to perform the following steps: Obtain historical impact test samples matching the current sampling unit model in the short-circuit impact test database; evaluate the recovery degree samples of the current sampling unit after the historical impact test samples; select a first historical impact test sample that is less than the self-recovery capability index from the recovery degree samples; and obtain a short-circuit impact current sequence corresponding to the first historical impact test sample as a characteristic short-circuit impact current sequence of the current sampling unit.

[0081] Furthermore, the sampling protection module 15 is further configured to perform the following steps: Acquire multiple functional units connected to the current sampling unit; respectively collect real-time short-circuit impulse current sequences at the output ends of the multiple functional units, and if the real-time short-circuit impulse current sequence matches the characteristic short-circuit impulse current sequence, obtain a sampling protection command to interrupt transmission.

[0082] It should be noted that the order in which the embodiments of the present application are presented is for illustrative purposes only and does not necessarily represent the superiority or inferiority of the embodiments. Furthermore, the foregoing descriptions of specific embodiments of this specification are provided. Furthermore, the processes depicted in the accompanying drawings do not necessarily require the specific order or sequential sequence shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0083] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

[0084] This specification and drawings are merely illustrative of the present application and are intended to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Obviously, those skilled in the art may make various modifications and variations to this application without departing from the scope of this application. Thus, this application is intended to include such modifications and variations as fall within the scope of this application and its equivalents.

Claims

1. A current sampling unit fault identification method based on short-circuit impact analysis is characterized in that: The method comprises: Enter the system connection circuit where the current sampling unit is located; Calculating the recovery capability of the current sampling unit according to the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit, and outputting a self-recovery capability index; Constructing a short-circuit impact test database of the current sampling unit, wherein the short-circuit impact test database includes sampling function failure test data of the current sampling unit under a short-circuit impact current sequence; Analyzing the short-circuit impact test database with the self-recovery capability index as a target to obtain a characteristic short-circuit impact current sequence of the current sampling unit; When the real-time short-circuit impulse current sequence to be received by the current sampling unit matches the characteristic short-circuit impulse current sequence, a sampling protection command is obtained.

2. The method according to claim 1, wherein Calculating the recovery capability of the current sampling unit according to the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit, and outputting a self-recovery capability index, the method comprising: Evaluate the current sampling unit based on its configuration parameters, including material type score, impact resistance score, thermal recovery time, and temperature rise threshold score; Performing normalized weighted scoring on the material type score, impact resistance score, thermal recovery time, and temperature rise threshold score, and outputting a unit-level recovery capability index; Obtaining a bypass branch score, a circuit protection score, a power supply voltage regulation capability score, and a load isolation structure based on system configuration parameters of the system connection circuit; Performing normalized weighted scoring on the bypass branch score, circuit protection score, power supply voltage regulation capability score, and load isolation structure, and outputting a system-level recovery capability index; The unit-level recovery capability index and the system-level recovery capability index are integrated to output a self-recovery capability index.

3. The method according to claim 1, wherein Constructing a short-circuit impact test database of the current sampling unit, the method includes: Define a test data storage field, wherein the test data storage field includes a test number, a model of a current sampling unit under test, a short-circuit impulse current sequence input by the test, current sampling simulation output data of the test output, and current sampling difference output data; The storage structure of the short-circuit impact test database is defined according to the test data storage field.

4. The method according to claim 3, wherein Constructing a short-circuit impact test database of the current sampling unit, the method includes: Setting impulse injection sample data, wherein the impulse injection sample data includes a plurality of short-circuit impulse current sequences, each of which includes an impulse current peak value, a current slope, and a duration; selecting a sample current sampling unit of the current sampling unit; Connecting a controllable impulse current source, performing multiple impulse simulations on the sample current sampling unit using the impulse injection sample data, and recording the current sampling simulation output data after the impulse, wherein the current sampling simulation output data includes sampling delay, response distortion, and thermal recovery time; The current sampling simulation output data and the current sampling theoretical output data are compared, and the extracted current sampling difference output data is stored as sampling function fault test data in the short-circuit impact test database.

5. The method according to claim 4, wherein The test data storage field of the short-circuit impact test database further includes the recovery degree of the current sampling unit after the impact, wherein the recovery degree of the current sampling unit is obtained through the difference amplitude of the current sampling difference output data.

6. The method according to claim 4, wherein It is characterized by: Comparing the current sampling simulated output data with the current sampling theoretical output data, the method further includes: Continuously monitoring the current sampling analog output change data of the current sampling unit after the impact; Constructing a current sampling simulation curve based on the current sampling simulation output change data; Recording the current sampling simulation stable output data when the current sampling simulation curve is stable; The current sampling simulated stable output data and the current sampling theoretical output data are compared to obtain the current sampling difference output data.

7. The method according to claim 4, wherein The short-circuit impact test database is analyzed with the self-recovery capability index as a target to obtain a characteristic short-circuit impact current sequence of the current sampling unit, the method comprising: Acquire historical impact test samples matching the current sampling unit model in the short-circuit impact test database; evaluating a recovery degree sample of the current sampling unit after the historical impact test sample; Selecting a first historical impact test sample smaller than the self-recovery capability index from the recovery degree samples; A short-circuit impulse current sequence corresponding to the first historical impulse test sample is obtained as a characteristic short-circuit impulse current sequence of the current sampling unit.

8. The method according to claim 1, wherein when the real-time short-circuit impulse current sequence to be received by the current sampling unit matches the characteristic short-circuit impulse current sequence, a sampling protection command is obtained, the method comprising: Acquire multiple functional units connected to the current sampling unit; Real-time short-circuit impulse current sequences of the output terminals of the plurality of functional units are collected respectively, and if the real-time short-circuit impulse current sequence matches the characteristic short-circuit impulse current sequence, a sampling protection command is obtained to interrupt transmission.

9. A current sampling unit fault identification system based on short-circuit impact analysis is characterized in that: The system comprises: A connection circuit recording module, which is used to record the system connection circuit where the current sampling unit is located; a recovery capability calculation module, configured to calculate the recovery capability of the current sampling unit according to the unit configuration parameters of the current sampling unit and the system configuration parameters of the system connection circuit, and output a self-recovery capability index; A short-circuit impact test database construction module, wherein the short-circuit impact test database construction module is used to construct a short-circuit impact test database of the current sampling unit, wherein the short-circuit impact test database includes sampling function failure test data of the current sampling unit under a short-circuit impact current sequence; a short-circuit impulse current analysis module, configured to analyze the short-circuit impulse test database with the self-recovery capability index as a target, and obtain a characteristic short-circuit impulse current sequence of the current sampling unit; A sampling protection module is configured to obtain a sampling protection command when the real-time short-circuit impulse current sequence to be received by the current sampling unit matches the characteristic short-circuit impulse current sequence.

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