A capacitor screen printing method and system

Abstract

The embodiment of the application discloses a capacitor silk-screen method and system, and relates to the technical field of capacitors.The method carries out similarity matching on a first image of a capacitor to be silk-screened and pre-silk-screen images of a plurality of standard capacitors in a database; then silk-screen operation parameters and a post-silk-screen image of a target standard capacitor with the highest similarity matching are extracted from the database; next, the capacitor is kept in the state of the first image, and the capacitor is silk-screened according to the silk-screen operation parameters of the target standard capacitor; then a second image of the capacitor after silk-screening is collected, and appearance full-inspection results for the capacitor are generated according to the comparison result of the second image and the post-silk-screen image of the target standard capacitor. In this way, image feature matching of the capacitor is constructed, parameter adaptive calling of the same-specification capacitor is realized, and an automatic process of appearance full inspection is realized, so that the method has the advantages of high silk-screen yield, fast appearance full-inspection speed and the like.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of capacitor production, and in particular to a capacitor silk-screen printing method and system. BACKGROUND

[0002] Silk-screen printing is a process of printing product specification information (such as model, parameters, etc.) on the surface of a capacitor, which requires that the products be upright and neat, the silk-screen printing position be centered, the printed characters be clear and not offset. Appearance inspection is a step after silk-screen printing in the production process of a capacitor, and is currently performed manually to check whether the printed characters are correct and clear, whether the position is not offset, and whether there are bubbles or damage on the appearance.

[0003] The current silk-screen printing and appearance inspection are independent steps, and are highly dependent on manual operation, which results in low production efficiency and yield. SUMMARY

[0004] The capacitor silk-screen printing method and system provided by the embodiments of the present application can automatically complete the process of silk-screen printing and appearance inspection, and have high silk-screen printing yield and fast appearance inspection speed.

[0005] To solve the above problems, from a first aspect, the embodiments of the present application disclose a capacitor silk-screen printing method, comprising:

[0006] acquiring a first image of a capacitor to be silk-screen printed;

[0007] performing similarity matching on the first image and pre-silk-screen printing images of a plurality of standard capacitors in a database; the plurality of standard capacitors include capacitors of multiple specifications;

[0008] extracting, from the database, silk-screen printing operation parameters and a post-silk-screen printing image of a target standard capacitor with the highest similarity matching;

[0009] maintaining the capacitor in the state of the first image, and performing silk-screen printing operation on the capacitor according to the silk-screen printing operation parameters of the target standard capacitor; wherein different standard capacitors correspond to different silk-screen printing operation parameters;

[0010] acquiring a second image of the capacitor after silk-screen printing, and generating an appearance inspection result for the capacitor according to a comparison result of the second image and the post-silk-screen printing image of the target standard capacitor.

[0011] According to some embodiments, in the database, the pre-silk-screen printing images, the post-silk-screen printing images and the silk-screen printing operation parameters of N standard capacitors of the same specification are stored, and N≥2.

[0012] The pre-silk-screen printing images of the N standard capacitors have the same shooting parameters but different shooting time periods, and the pre-silk-screen printing image and the post-silk-screen printing image of the same standard capacitor have the same shooting parameters and the same shooting time period.

[0013] According to some embodiments, the environment features corresponding to different shooting time periods are different, wherein the environment features include: light intensity, light angle, environment temperature, and environment humidity.

[0014] According to some embodiments, the step of performing similarity matching between the first image and the pre-printing images of the plurality of standard capacitors in the database comprises:

[0015] extracting a plurality of key regions of the capacitor from the first image;

[0016] calculating the similarity of the first image and the pre-printing images of the plurality of standard capacitors in the plurality of key regions;

[0017] calculating the sum of similarity scores of the pre-printing image of each standard capacitor in the plurality of key regions;

[0018] taking the standard capacitor with the highest sum of scores as the target standard capacitor.

[0019] According to some embodiments, the plurality of key regions include: a region to be printed on the capacitor, and upper left corner region, upper right corner region, lower left corner region, and lower right corner region of the capacitor outline.

[0020] According to some embodiments, the comparison features of the similarity include: shape and surface texture.

[0021] According to some embodiments, the appearance inspection result of the capacitor includes: qualified product and unqualified product.

[0022] The capacitor printing method can further include:

[0023] presenting a second image of the plurality of capacitors as qualified products to the user interface;

[0024] in response to the user's storage operation for the target capacitor as a qualified product, storing the second image of the target capacitor, the first image, and the printing operation parameters into the database, so as to add the target capacitor as a standard capacitor or replace a certain standard capacitor.

[0025] According to some embodiments, the capacitor printing method can further include:

[0026] determining one or more printing quality indicators of the capacitor;

[0027] for a plurality of capacitors of the same specification, analyzing the change of each printing quality indicator according to the printing time sequence of the second image of the plurality of capacitors;

[0028] for any printing quality indicator, when the change presents a significant deterioration trend, generating printing warning information for the printing quality indicator.

[0029] According to some embodiments, the capacitor printing method can further include:

[0030] correlate the first image of the capacitor with the printing content of the capacitor;

[0031] generate an anti-counterfeiting code for the capacitor based on the correlation;

[0032] print the anti-counterfeiting code and the printing content on the capacitor in the process of performing the printing operation on the capacitor according to the printing operation parameters of the target standard capacitor.

[0033] In the second aspect, the embodiment of the present application also discloses a capacitor printing system, comprising a processor, which is used to execute the capacitor printing method according to the first aspect of the embodiment of the present application.

[0034] The embodiment of the present application has the following advantages:

[0035] The embodiment of the present application discloses a capacitor printing method, which performs similarity matching between a first image of a capacitor to be printed and pre-printing images of a plurality of standard capacitors in a database; then extracts printing operation parameters and post-printing images of a target standard capacitor with the highest similarity matching from the database; then keeps the capacitor in the state of the first image, and performs a printing operation on the capacitor according to the printing operation parameters of the target standard capacitor; and finally acquires a second image of the capacitor after printing, and generates an appearance full inspection result for the capacitor according to the comparison result of the second image and the post-printing image of the target standard capacitor. In this way, the image feature matching of the capacitor is constructed, the parameter adaptive calling of the same specification capacitor is realized, and the automatic process of the appearance full inspection is realized, so that the printing yield is high, and the appearance full inspection speed is fast. BRIEF DESCRIPTION OF DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0037] Figure 1 is a step flow chart of a capacitor printing method according to an embodiment of the present application;

[0038] Figure 2 is a schematic block diagram of a capacitor printing system according to an embodiment of the present application. DETAILED DESCRIPTION

[0039] With reference to the drawings of the embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0040] The inventors find that the current silk screen printing and appearance full inspection are independent steps, and are highly dependent on manual work, and the production efficiency and yield are low. Specifically, when multi-specification capacitors are produced in mixed lines, manual switching of silk screen printing parameters is prone to errors; environmental changes (such as light, temperature and humidity) affect the consistency of appearance judgment; manual full inspection is slow and has a high rate of missed detection, which makes it difficult to guarantee the production efficiency and product quality stability.

[0041] The present application provides a capacitor silk screen printing method, which refers to Figure 1 The capacitor silk screen printing method can include the following steps:

[0042] Step S101, a first image of a capacitor to be silk screen printed is collected;

[0043] Step S102, the first image is similarity matched with pre-silk screen printed images of a plurality of standard capacitors in a database; the plurality of standard capacitors include a plurality of specifications;

[0044] Step S103, silk screen printing operation parameters and a post-silk screen printed image of a target standard capacitor with the highest similarity matching are extracted from the database;

[0045] Step S104, the capacitor is kept in the state of the first image, and silk screen printing operation is performed on the capacitor according to the silk screen printing operation parameters of the target standard capacitor; wherein different standard capacitors correspond to different silk screen printing operation parameters;

[0046] Step S105, a second image of the capacitor after silk screen printing is collected, and an appearance full inspection result for the capacitor is generated according to a comparison result of the second image and the post-silk screen printed image of the target standard capacitor.

[0047] In the embodiment, the image capturing device (such as an industrial camera) can capture an image of one side of the capacitor to be silk-screened, and obtain a first image clearly reflecting the appearance features of the capacitor before silk-screening. Similarly, after silk-screening, the image capturing device can continue to capture an image of the capacitor after silk-screening while the capacitor remains stationary, and obtain a second image. The first image and the second image are captured at the same position and at the same time as much as possible, so as to improve the accuracy of the similarity comparison and the effectiveness of the silk-screening operation. The first image and the second image both clearly contain the visual features (such as size, pin number, shell shape, etc.) related to the specifications of the capacitor, the position of the area to be silk-screened, and the surface state.

[0048] The standard capacitor is a qualified product, and both the capacitor itself and the silk-screened pattern on the capacitor meet the factory requirements. The database can specifically store the pre-silk-screening image, post-silk-screening image, and silk-screening operation parameter information of a plurality of standard capacitors. The target standard capacitor is the standard capacitor with the highest similarity to the capacitor to be silk-screened, and provides a parameter benchmark for silk-screening.

[0049] The plurality of standard capacitors include a plurality of specifications. Alternatively, the specifications of different standard capacitors are different; or alternatively, one specification corresponds to N standard capacitors, and N≥2. The different specifications can specifically refer to differences in capacity, voltage, size, packaging type, etc. The silk-screening operation parameter refers to the process parameter in the silk-screening process, such as silk-screening speed, pressure, ink type, etc. Different standard capacitors correspond to different silk-screening operation parameters.

[0050] In steps S102-S104, the embodiment can quickly determine the target standard capacitor with the highest similarity to the capacitor to be silk-screened by performing similarity matching between the first image of the capacitor to be silk-screened and the pre-silk-screening images of the plurality of standard capacitors in the database (it can be understood that the target standard capacitor is at least a standard capacitor of the same specification as the capacitor). Then, the capacitor is kept in the state of the first image, i.e., the posture (such as the vertical angle and position coordinates) of the capacitor when the first image is captured is kept unchanged (keeping the posture of the capacitor unchanged can avoid positioning deviation and ensure the silk-screening position accuracy), and the silk-screening operation of the capacitor is performed using the silk-screening operation parameter of the target standard capacitor, so as to quickly and accurately complete the silk-screening process. After silk-screening, step S105 is performed, and the embodiment can keep the capacitor in the position after the silk-screening operation is completed, then capture the second image of the capacitor after silk-screening, and generate the appearance full inspection result for the capacitor according to the comparison result between the second image and the post-silk-screening image of the target standard capacitor.

[0051] The above process, the embodiment of the application constructs the image feature matching of the capacitor, the parameter adaptive call to the same specification capacitor, and the automatic process of the appearance full inspection. Compared with the prior art, the whole silk screen process does not need to repeatedly adjust the silk screen parameters manually, and the silk screen parameters are accurately called. The silk screen and the appearance full inspection link are integrated, which is more intelligent, improves the silk screen yield and the accuracy of the appearance full inspection, and improves the speed of the silk screen and the appearance full inspection.

[0052] The silk screen production process of the capacitor is long, such as the working time period of the working day. Therefore, the shooting time period of the first image of each capacitor is different in different batches of the same specification capacitor or in the same batch. The environmental characteristics corresponding to different time periods are different, so that the environment influences on the silk screen of each capacitor are different. In order to improve the effect of the silk screen and the appearance full inspection qualified rate, the embodiment of the application further proposes the following scheme: in the database, the silk screen pre-image, the silk screen post-image and the silk screen operation parameter of N standard capacitors corresponding to the same specification, N≥2; wherein, the shooting parameters of the silk screen pre-images of the N standard capacitors are the same but the shooting time periods are different, and the shooting parameters of the silk screen pre-image and the silk screen post-image of the same standard capacitor are the same and the shooting time periods are the same.

[0053] The shooting parameters can specifically refer to the shooting operation parameters of the image acquisition device, such as resolution, focal length, exposure time, etc. Under the same shooting parameters, the same capacitor is shot, which can eliminate the interference of the shooting parameters on the silk screen pre-images of the N standard capacitors, and provides a reliable image reference for the subsequent similarity comparison.

[0054] The environmental characteristics corresponding to different shooting time periods are different, which include: light intensity, light angle, environmental temperature and environmental humidity. Among them, the light intensity and the light angle affect the similarity comparison result, and the environmental temperature and the environmental humidity affect the ink viscosity during the silk screen. Exemplarily: three standard capacitors corresponding to the same specification, the shooting time periods of the three standard capacitors are morning, noon and afternoon respectively. Since the light intensity, light angle, environmental temperature and environmental humidity of the morning, noon and afternoon are different, the silk screen pre-images of the three standard capacitors will be different, and the silk screen operation parameters will also be slightly different, which will finally affect the silk screen effect. Similarly, the silk screen post-images of the three standard capacitors will also be different, which will affect the accuracy of the appearance full inspection.

[0055] On the basis of constructing the image feature matching of the capacitor, the parameter adaptive calling of the same specification capacitor, and the automatic process of the appearance full inspection, the embodiment of the application further considers the influence factors of the capacitor silk screen production period, that is, the reference data of the capacitor silk screen production and detection (that is, the database stores the silk screen pre-image, the silk screen post-image and the silk screen operation parameter of N standard capacitors corresponding to the same specification) is constructed and matched to effectively solve the adverse effects of the environmental feature differences in different time periods on the silk screen effect and quality detection in the long production process.

[0056] Specifically, when the same specification capacitor is silk screened in the same day, if the capacitor A is silk screened in the morning, the target standard capacitor with the highest similarity to the capacitor A should be the standard capacitor of the same specification which is photographed and silk screened in the morning based on the embodiment. Since the photographing parameters of the pre-silk screen image and the post-silk screen image of the same standard capacitor are the same and the photographing time period is the same, the silk screen time of the target standard capacitor and the photographing time period of the post-silk screen image are in the same time period, the silk screen operation is performed according to the silk screen operation parameter of the target standard capacitor, and the comparison is performed according to the post-silk screen image and the second image, which greatly improves the silk screen quality and the accuracy of the appearance full inspection.

[0057] In a feasible embodiment, the step of similarity matching the first image with the pre-silk screen images of the plurality of standard capacitors in the database in step S103 can include:

[0058] Sub-step S103-1, extracting a plurality of key regions of the capacitor from the first image;

[0059] Sub-step S103-2, calculating the similarity of the first image and the pre-silk screen images of the plurality of standard capacitors in the plurality of key regions;

[0060] Sub-step S103-3, calculating the total sum of the similarity scores of the pre-silk screen image of each standard capacitor in the plurality of key regions;

[0061] Sub-step S103-4, taking the standard capacitor with the highest total sum as the target standard capacitor.

[0062] The key region can be understood as a local region in the image which plays a decisive role in matching. The plurality of key regions can include: a to-be-silk screened region of the capacitor, and a left upper corner region, a right upper corner region, a left lower corner region and a right lower corner region of the capacitor contour. The to-be-silk screened region can reflect the surface texture of the capacitor; the left upper corner region, the right upper corner region, the left lower corner region and the right lower corner region of the capacitor contour can not only reflect the overall shape difference of capacitors of different specifications, but also reflect the difference of capacitors of the same specification under the influence of different environmental features (such as light).

[0063] In the sub-step S103-2, the similarity of the first image and the pre-printing image of the plurality of standard capacitors in the plurality of key regions is calculated, and the comparison features of the similarity can include: shape, surface texture. The surface textures of capacitors of different specifications can be different. In addition, due to the influence of processing, the surface textures of capacitors of the same specification can also be different, and some can be unqualified products. The sum of the similarity scores refers to the weighted sum of the similarity scores of the key regions, which quantifies the overall matching degree.

[0064] According to the sub-step S103-1 to the sub-step S103-4, the embodiment sets and selects the standard capacitor with the highest sum of similarity scores in the plurality of key regions as the target standard capacitor, realizes feature focusing, reduces redundant information, and improves matching efficiency and similarity comparison accuracy. The similarity comparison method for each key region can refer to the corresponding existing image comparison technology, which is not limited in the embodiment.

[0065] In some embodiments of the application, the appearance inspection result of the capacitor can include: qualified products and unqualified products. The method (not shown in the figure) can also include the following steps:

[0066] In step S201, a second image of a plurality of capacitors qualified is presented to a user interface;

[0067] In step S202, in response to the storage operation of the user for the target capacitor qualified, the second image, the first image and the printing operation parameter of the target capacitor are stored in the database, so that the target capacitor is added as a standard capacitor or replaces a certain standard capacitor.

[0068] On the basis of integrating the printing and the appearance inspection in steps S101-S105, the user can update the database according to the actual production situation by selecting high-quality qualified product information with the help of the second images of the plurality of capacitors, so that the database can be continuously enriched and optimized. By storing the related information of high-quality qualified products in the database, the standard capacitors are added or replaced, which can make the standard capacitors more representative and adaptive, and improve the accuracy of subsequent similarity matching. With the production, the database will continuously accumulate high-quality cases (pre-printing image, post-printing image and printing operation parameter of the standard capacitor) in actual production, further improving the accuracy of printing parameter setting and the stability of product quality.

[0069] In the existing silk screen printing process, a sample is randomly taken for re-inspection at intervals to find problems such as screen wear and insufficient ink, which is a redundant and inefficient process. The manual re-inspection method cannot find the problems such as screen wear and insufficient ink in time, resulting in a low silk screen printing yield. Therefore, the embodiments of the present application can further include the following steps (not shown in the figure):

[0070] In step S301, one or more silk screen printing quality indicators of the capacitor are determined.

[0071] In step S302, for a plurality of capacitors of the same specification, the change of each silk screen printing quality indicator is analyzed according to the silk screen printing time sequence of the second image of the plurality of capacitors.

[0072] In step S303, for any silk screen printing quality indicator, when the change shows a significant deterioration trend, silk screen printing warning information for the silk screen printing quality indicator is generated.

[0073] In the embodiments, the silk screen printing quality indicator can be any one of silk screen printing clarity, pattern integrity, color uniformity, and text edge smoothness. The change of each silk screen printing quality indicator is analyzed according to the silk screen printing time sequence of the second image of the plurality of capacitors of the same specification, and the quality indicator fluctuation over time is tracked. For any silk screen printing quality indicator, when the change shows a significant deterioration trend, silk screen printing warning information for the silk screen printing quality indicator is generated. For example, when the silk screen printing clarity continuously decreases and exceeds a set threshold, a warning is issued.

[0074] On the basis of integrating the silk screen printing with the appearance inspection as in steps S101-S105, the second image for the appearance inspection can also be used to simultaneously analyze the time sequence and trend of the silk screen printing quality indicator, so that potential quality problems in the silk screen printing process, such as screen wear and insufficient ink, can be found in time. When the quality indicator shows a significant deterioration trend, a warning information is issued in advance, so that the operator can timely troubleshoot the equipment, adjust the process parameters, or replace the consumables, thereby avoiding the generation of a large number of unqualified products, reducing the production cost, and ensuring the stability and continuity of the production process.

[0075] Further, in some embodiments, the capacitor silk screen printing method of the present application can further include the following steps:

[0076] In step S401, the first image of the capacitor is associated with the silk screen printing content of the capacitor.

[0077] In step S402, based on the association, an anti-counterfeiting code for the capacitor is generated.

[0078] Step S403, in the process of performing the silk printing operation on the capacitor according to the silk printing operation parameters of the target standard capacitor, the anti-counterfeiting code is printed on the capacitor together with the silk printing content.

[0079] On the basis of integrating the silk printing with the appearance full inspection link as steps S101-S105, the capacitor anti-counterfeiting function can also be realized conveniently and at low cost by means of the first image for similarity comparison. Specifically, the first image of the capacitor is associated with the silk printing content (such as model and parameters) before silk printing, so that the two form a one-to-one mapping. Then, based on the association, a unique anti-counterfeiting code for the capacitor can be generated through the related algorithm in the prior art (not limited by the embodiments of the present application), and the code is associated with the individual characteristics and silk printing information of the capacitor. Next, in the silk printing process, the anti-counterfeiting code is printed on the capacitor together with the silk printing content, so that each capacitor has a unique anti-counterfeiting mark. Since the anti-counterfeiting code is associated with the first image of the capacitor and the silk printing content, it has uniqueness and non-replicability, and consumers or relevant detection personnel can verify the authenticity of the capacitor by identifying the anti-counterfeiting code, effectively curbing the circulation of counterfeit and inferior products, and protecting the brand image of the enterprise and the legitimate rights and interests of consumers. At the same time, the anti-counterfeiting code also provides convenience for product traceability, facilitating the tracking of product production information and circulation path.

[0080] The embodiments of the present application also provide a capacitor silk printing system, referring to Figure 2 , comprising a processor configured to execute the capacitor silk printing method described in the embodiments of the present application. The system realizes the automation and intelligentization of the whole capacitor silk printing process by executing the above-mentioned silk printing method through the processor. Integrating various functions in the system ensures the coherence and efficiency of the method execution, improves the production efficiency and quality level of capacitor silk printing, and reduces the errors and costs caused by manual intervention.

Claims

1. A method of screen printing a capacitor, characterized by, The method comprises: collecting a first image of a capacitor to be silk-screened; performing similarity matching of the first image with pre-silk-screening images of a plurality of standard capacitors in a database; the plurality of standard capacitors comprises capacitors of multiple specifications; extracting, from the database, silk-screening operation parameters and post-silk-screening images of a target standard capacitor with the highest similarity matching result; keeping the capacitor in the state of the first image, and performing silk-screening operation on the capacitor according to the silk-screening operation parameters of the target standard capacitor; wherein different standard capacitors correspond to different silk-screening operation parameters; collecting a second image of the capacitor after silk-screening, and generating appearance full-inspection result of the capacitor according to the comparison result of the second image and the post-silk-screening image of the target standard capacitor; wherein the step of performing similarity matching of the first image with pre-silk-screening images of a plurality of standard capacitors in a database comprises: extracting a plurality of key areas of the capacitor from the first image; calculating the similarity of the first image and the pre-silk-screening images of the plurality of standard capacitors in the plurality of key areas; calculating the total sum of the similarity scores of the pre-silk-screening image of each standard capacitor in the plurality of key areas; selecting the standard capacitor with the highest total sum as the target standard capacitor.

2. The capacitor silk-screening method according to claim 1, wherein in the database, for capacitors of the same specification, there are N pre-silk-screening images, post-silk-screening images and silk-screening operation parameters, N≥2; wherein the N pre-silk-screening images of the standard capacitors have the same shooting parameters but different shooting time periods, and the pre-silk-screening image and the post-silk-screening image of the same standard capacitor have the same shooting parameters and the same shooting time period. The environment features corresponding to different shooting time periods are different, wherein the environment features include illumination intensity, illumination angle, ambient temperature and ambient humidity.

3. The capacitor silk screening method according to claim 2, wherein 4. The capacitor silk-screening method according to claim 1, wherein the plurality of key areas include the area to be silk-screened of the capacitor, and the upper-left corner area, the upper-right corner area, the lower-left corner area and the lower-right corner area of the capacitor profile.

5. The capacitor silk-screening method according to claim 1, wherein the comparison features of the similarity include shape and surface texture. The appearance full-inspection result of the capacitor includes qualified products and unqualified products; the method further comprises: presenting the second images of the plurality of capacitors as qualified products to a user interface; in response to a user storing operation on a target capacitor as a qualified product, storing the second image, the first image and the silk-screening operation parameters of the target capacitor into the database, so as to add the target capacitor as a standard capacitor or replace a certain standard capacitor.

6. The capacitor silk screening method according to claim 1, wherein The method further comprises: determining one or more silk-screening quality indicators of the capacitor; for capacitors of the same specification, analyzing the change of each silk-screening quality indicator according to the silk-screening time sequence of the second images of the plurality of capacitors; 7. The capacitor silk screening method according to claim 1, wherein for any silk-screening quality indicator, when the change presents a significant deterioration trend, generating silk-screening warning information for the silk-screening quality indicator. The method further comprises: ​ ​ 8. The capacitor silk screening method of claim 1, wherein ​ correlate the first image of the capacitor with printing content of the capacitor; generate an anti-counterfeiting code for the capacitor based on the correlation; print the anti-counterfeiting code and the printing content on the capacitor in a process of performing printing operation on the capacitor according to the printing operation parameters of the target standard capacitor.

9. A capacitor screen printing system characterized by, A capacitor printing method comprises a processor configured to perform the capacitor printing method according to any one of claims 1-8.

Images