Bending loading device for in-situ observation without center displacement

Abstract

The invention relates to a bending loading device for in-situ observation without center displacement, and the device comprises a fixed part, the bottom of which is provided with a driving mechanism; the supporting piece is arranged at the top of the fixing piece and is used for supporting the sample and keeping the center position of the sample unchanged in the testing process; the pressing assembly comprises a pressing rod fixing seat and two pressing rods which are arranged on the pressing rod fixing seat and used for pressing the two ends of the sample, and the pressing rod fixing seat is connected with the driving mechanism; one end of the force sensor is fixed on the fixing piece, the other end of the force sensor is connected with the supporting piece, and the force sensor is used for measuring force borne by the sample; the butt joint support is arranged on the lower portion of the fixing piece and used for being in butt joint with a confinement platform including an X-ray diffractometer. According to the invention, a symmetrical loading structure design is adopted, so that the central test area of the sample does not generate spatial deviation in the bending process, the device can be effectively applied to in-situ test platforms such as XRD, Raman and the like, and the time sequence continuity and spatial positioning consistency of test data are remarkably improved.

Description

Technical Field

[0001] The invention relates to a bending loading device for in-situ observation with a non-displaced center, and belongs to the field of material mechanics loading and in-situ testing. Background Art

[0002] With the rapid development of new functional materials such as flexible devices, piezoelectric films, and ceramics, studying their microstructural changes and structure-property relationships under bending stress has become a research hotspot. In situ observational techniques such as X-ray diffraction (XRD), Raman spectroscopy, synchrotron radiation small-angle / wide-angle scattering (SAXS / WAXS), infrared absorption, digital image correlation (DIC), and surface potential imaging enable dynamic tracking of materials under realistic operating conditions. Bending loading is a key mechanical tool for these studies, particularly suitable for small deformation testing of rigid or brittle materials. For example, in oxide ceramics such as zirconium oxide (ZrO2) or barium titanate (BaTiO3) thin films, bending can induce stress-driven phase transitions or domain rearrangements, affecting their ferroelectric and piezoelectric behaviors. Reliability studies of metal foils (e.g., copper and aluminum foils) in flexible electronics also require bending fatigue testing under small strains. Furthermore, electrode films used in lithium-ion batteries (e.g., LiCoO2 / Al and graphite / Cu) are subject to localized mechanical stresses during operation, and studying their structural stability also relies on in situ bending loading scenarios. Therefore, in-situ bending testing has important research value in many material systems such as polymers, ceramics, metals, electrode composite membranes, etc. It is an indispensable experimental means to study the stress response mechanism of materials and the construction of structure-activity relationships.

[0003] Currently, some patents involve the design of in-situ loading devices, but in the in-situ bending loading scenario, the following key technical bottlenecks still exist: for example, patent CN110487628A discloses an in-situ micro-mechanical test bench. Although it has the characteristics of compact structure and fine force control, its loading method is linear push-pull type, which is only suitable for compression or tension testing. It does not have a structural design to achieve material bending loading and cannot be used to study materials, especially the in-situ structural response process of rigid materials under bending stress; patent CN113009256A discloses an in-situ bending device for flexible film performance testing, which is suitable for electrical, optical, magnetic transport and other test scenarios, and has certain in-situ measurement capabilities. However, this method achieves bending loading of the sample by inserting square pillars of varying thicknesses, which can cause significant displacement of the sample's center during loading. This makes it unsuitable for scenarios where the test area must remain stable during in-situ observation, such as in applications requiring high alignment accuracy in XRD or Raman focusing systems. Patent CN114414399A proposes a three-point bending fatigue test fixture for in-situ replica testing, featuring a support and limiting structure and specimen centering calibration, improving the stability of the in-situ loading process. However, this device uses an upper pressure chuck and support roller assembly to apply bending stress to the sample. During loading, the center of the sample surface is obscured by the structure, making it unsuitable for in-situ testing scenarios where the surface must remain unobstructed during loading to achieve beam irradiation or signal acquisition. This limits its application in XRD, Raman, and other equipment.

[0004] Therefore, existing in-situ loading devices, when used for bending loading tests on materials (especially rigid or brittle materials), generally suffer from problems such as inability to achieve effective bending loading, displacement of the sample center during loading, and easy obstruction of the test surface by the fixture structure. These problems severely limit their application in in-situ characterization methods such as XRD and Raman, which require high spatial positioning accuracy and an unobstructed observation window. To meet the needs of high-resolution structural observation and performance response analysis of materials under real stress environments, it is urgent to develop a loading device with a compact structure, which can maintain the sample test center unchanged during loading, an unobstructed test area, and is suitable for in-situ bending testing. This will enable accurate research on the structural evolution mechanism and structure-activity relationship of various types of material systems under bending stress. Summary of the Invention

[0005] In response to the above technical problems, the present invention provides a bending loading device for in-situ observation with no center displacement. The device adopts a symmetrical loading structure design, so that the central test area of ​​the sample does not undergo spatial displacement during the bending process. It can be effectively applied to in-situ test platforms such as XRD and Raman that rely on a fixed observation area, significantly improving the temporal continuity and spatial positioning consistency of the test data.

[0006] To achieve the above object, the present invention adopts the following technical solutions:

[0007] A bending loading device for in-situ observation with no center displacement, comprising:

[0008] A fixing member, wherein a driving mechanism is provided at the bottom of the fixing member;

[0009] A support member, disposed on top of the fixing member, for supporting the sample and ensuring that the center position of the sample remains unchanged during the test;

[0010] A pressing assembly includes a pressing rod fixing base and two pressing rods provided on the pressing rod fixing base for pressing two ends of the sample, wherein the pressing rod fixing base is connected to the driving mechanism;

[0011] a force sensor, one end of which is fixed to the fixing member and the other end of which is connected to the supporting member, for measuring the force exerted on the sample;

[0012] The docking bracket is arranged at the lower part of the fixing member and is used for docking with the confined platform including the X-ray diffractometer.

[0013] The bending loading device for in-situ observation with no displacement of the center is preferably such that during the test, the support member tilts toward one of the pressing rods. When the two pressing rods move downward to a certain position, the sample tilts to one side and the inclination angle is limited by the two pressing rods so that it will not slide. At the same time, the two pressing rods apply a certain pre-tightening force to the sample to prevent the sample from sliding.

[0014] The bending loading device for in-situ observation without center displacement is preferably provided with two inverted L-shaped insertion components on the pressing rod fixing seat, and the insertion components are used to carry the pressing rod.

[0015] The bending loading device for in-situ observation without center displacement is preferably provided with a plurality of pressing rod insertion holes arranged in rows and spaced apart from each other on the insertion component, and the pressing rod insertion holes are used to accommodate the pressing rods.

[0016] The bending loading device for in-situ observation without center displacement, preferably, the driving mechanism includes a reduction motor and a screw, the output end of the reduction motor is connected to the bottom end of the screw, and the top end of the screw is connected to the fixing member through a bearing.

[0017] The bending loading device for in-situ observation without center displacement, preferably, the driving mechanism also includes a screw slider, the screw slider is sleeved on the screw and is tightly connected to the pressing rod fixing seat.

[0018] In the bending loading device for in-situ observation without center displacement, preferably, the bearing is fixed to the fixing member via a bearing fixing seat.

[0019] The bending loading device for in-situ observation without center displacement, preferably, the fixing member includes a mounting base and a back plate, the driving mechanism is mounted on the mounting base, and the supporting member is mounted on the top of the back plate.

[0020] For the bending loading device for in-situ observation without center displacement, preferably, the movement position repeatability of the reduction motor is 0.05 mm, and the movement resolution is 1.25 μm / step.

[0021] The bending loading device for in-situ observation without center displacement, preferably, the reduction motor is further provided with a housing and an electric control interface; and / or, the support member is a central support rod.

[0022] The present invention has the following advantages due to the adoption of the above technical solution:

[0023] 1. The center position of the test area of ​​the device of the present invention remains stationary during the loading process, ensuring the alignment accuracy of in-situ observation. The present invention adopts a symmetrical loading structure design, so that the central test area of ​​the sample does not undergo spatial displacement during the bending process. It can be effectively applied to in-situ test platforms such as XRD and Raman that rely on a fixed observation area, significantly improving the temporal continuity and spatial positioning consistency of the test data.

[0024] 2. The sample test surface of the present invention is unobstructed and adaptable to multiple types of beam / signal acquisition paths. The loading structure of the device is compact and avoids the central area of ​​the sample surface, ensuring that X-ray, laser, synchrotron radiation and other beams can irradiate and penetrate the test area without interference. This effectively solves the problem of loading structure blocking the sample in existing devices and improves the efficiency and reliability of acquiring in-situ characterization data.

[0025] 3. The present invention realizes stable bending loading of rigid or brittle materials. Through structural optimization design, the present invention provides a small deformation bending path suitable for high modulus materials such as ceramics, metals, and electrode films, solving the problem that existing in-situ loading devices generally lack bending ability and are difficult to adapt to rigid materials, and expanding the material application range of the device.

[0026] 4. The bending fracture process of the device presented here is clear and controllable, and the mechanical response is captured with high precision. During loading, when the sample clearly fractures, the force curve exhibits a sudden, transient drop, demonstrating the device's excellent performance in stimulating controlled bending failure behavior and accurately capturing the transient mechanical response. This feature facilitates the study of the fracture mechanism of rigid materials and their corresponding structural evolution, and is particularly suitable for experiments requiring efficient, high-precision analysis of key mechanical parameters before and after fracture.

[0027] 5. The device of the present invention has a simple and compact structure and is suitable for in-situ test platforms within confined spaces. The device is modular and miniaturized and can be embedded in common XRD, synchrotron radiation, cryogenic probe stations and other space-constrained test cavities. It has good integrated adaptability and meets the requirements of mechanical-structural synchronous testing under multi-field coupling conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 This is the overall schematic diagram of the bending loading device for in-situ observation;

[0029] Figure 2 Schematic diagram of unobstructed XRD test using a bending loading device for in-situ observation;

[0030] Figure 3 This is the cyclic bending mechanical response curve of the rigid silicon battery;

[0031] Figure 4 This is the bending fracture mechanics response curve of the rigid silicon battery;

[0032] Figure 5 This is the mechanical response curve of the flexible ITO film under cyclic bending;

[0033] The reference numerals in the figures are as follows:

[0034] 1-back plate; 2-bearing fixing seat; 3-center support rod; 4-pressing rod; 5-screw; 6-housing; 7-reduction motor; 8-electrical control interface; 9-mounting base; 10-docking bracket; 11-sample; 12-screw slider; 13-pressing rod fixing seat; 14-force sensor. DETAILED DESCRIPTION

[0035] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention are described clearly and completely below. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. All other embodiments derived by ordinary persons in this field based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0036] Unless otherwise defined, the technical or scientific terms used in the present invention shall have the usual meanings understood by persons of ordinary skill in the field to which the present invention belongs. The words "first", "second", "third", "fourth" and similar terms used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. Words such as "include" or "comprise" mean that the elements or objects preceding the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Words such as "connect" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect.

[0037] For ease of description, spatially relative terms may be used herein to describe the relationship of one element or feature relative to another element or feature as shown in the figures, such as "inside," "outside," "inner side," "outer side," "lower," "upper," etc. Such spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures.

[0038] The existing in-situ loading devices have the following problems: 1. The existing central test area of ​​the sample is displaced during the loading process, affecting the focusing stability and data consistency of the in-situ observation. For example, the in-situ bending device described in patent CN113009256A can realize the step bending test of flexible films in low temperature or multi-field coupling environment, but its structure will cause the overall position of the sample to change during the loading process, especially the axial or radial displacement of the test center area. This problem is particularly serious in in-situ testing methods that rely on precise positioning of the focus point, such as X-ray diffraction, Raman spectroscopy, infrared imaging, confocal measurement, etc. Once the position of the test area changes, the light beam will deviate from the target area, resulting in signal defocus, data drift or ineffective collection, and it is impossible to achieve a complete stress-structure or stress-performance evolution process record for a single test point, which reduces the timing accuracy and spatial consistency of the experiment.

[0039] 2. The loading structure blocks the surface of the sample test area, interfering with the optical path or signal path of in-situ observation and affecting the application of various non-contact in-situ testing methods. For example, the three-point bending fatigue test fixture proposed in patent CN114414399A has a limit calibration structure and repeated loading capability, and performs well in general mechanical tests. However, its loading mechanism adopts an upper pressure chuck and a lower support roller, which will directly block the central area of ​​the sample surface during the bending loading process. For in-situ observation methods such as XRD, synchrotron radiation, Raman, and DIC that rely on unobstructed optical paths or scattering paths, the blocking of the loading head will cause the X-ray / laser to fail to irradiate the sample surface normally, or the detector will fail to accurately receive the diffraction signal, seriously interfering with the acquisition and analysis of in-situ data. In addition, the blocking will also bring about unexpected interference such as local heat accumulation and electric field disturbance, further reducing the reliability of the test results.

[0040] 3. The lack of an effective bending loading structure suitable for rigid or brittle materials limits its adaptability to various material systems. For example, the in-situ micromechanical test bench disclosed in patent CN110487628A adopts a motor-driven linear loading method, which is suitable for testing tensile or compression paths, but is not equipped with a bending loading structure that can form a stable curvature. This type of device is difficult to apply a stress field with a spatially curved path and cannot meet the controllable bending requirements of rigid materials such as ceramic films, electrode foils, and piezoelectric oxides under small deformation states. This limits its applicability in studying important microstructural evolution processes such as stress-induced phase transitions, domain structure rearrangement, and crack initiation. Especially in the context of high-resolution in-situ observations (such as XRD / SAXS), the research objects are often rigid samples with high modulus and low ductility, and traditional tension and compression platforms are difficult to handle.

[0041] In order to solve the key problems of existing in-situ loading devices, such as the sample center test area being easily displaced during the loading process, the test area surface being easily obscured by the loading structure, and the inability to achieve effective bending loading of rigid materials, the present invention provides a bending loading device for in-situ observation with a compact structure, controllable deformation process, and no displacement of the center. Without affecting the optical path or signal path of the sample observation area, the device achieves in-situ testing conditions in which the sample center remains stable and the test area is unobstructed during the loading process. The device is also applicable to in-situ testing using characterization platforms such as X-ray diffraction (XRD), Raman spectroscopy, synchrotron radiation, and small-angle / wide-angle scattering, to meet the needs of studying the microstructural evolution and structure-activity relationship of materials under real stress fields.

[0042] like Figure 1As shown, the bending loading device for in-situ observation with no center displacement involved in the present invention includes: a mounting base 9 and a back plate 1, a reduction motor 7 is provided on the mounting base 9, the reduction motor 7 is provided with a housing 6 and an electronic control interface 8, a center support rod 3 and a force sensor 14 are provided on the top of the back plate 1, one end of the force sensor 14 is fixed on the back plate 1, and the other end is connected to the center support rod 3, for measuring the force exerted on the sample 11; the output end of the reduction motor 7 is connected to the bottom end of the screw rod 5, the top end of the screw rod 5 is connected to the back plate 1 through a bearing and a bearing fixing seat 2, a screw slider 12 is sleeved on the screw rod 5, the screw slider 12 is connected to the pressing rod fixing seat 13, and two pressing rods 4 are provided on the pressing rod fixing seat 13 for pressing the two ends of the sample 11.

[0043] During the test, the central support rod 3 tilts toward one of the pressing rods 4. When the two pressing rods 4 move downward to a certain position, the sample 11 tilts to one side and the two pressing rods 4 limit the inclination angle, so that it will not slide. At the same time, the two pressing rods 4 apply a certain pre-tightening force to the sample 11 to prevent the sample 11 from sliding. Specifically, the sample 11 is placed on the central support rod 3, and the software sets the pressing rods 4 on both sides to move downward through the reduction motor 7, forming a three-point extrusion downward bending of the sample 11. During the bending process, the pressing rods 4 on both sides obtain mechanical data through the force sensor 14. During the bending process, the center position of the sample 11 will not be displaced and will maintain a constant position. The docking bracket 10 is located on the side of the housing 6 and is used to dock the device with other test platforms for in-situ synchronous testing. For example, when performing XRD in-situ testing (see Figure 2 ), since there is no obstruction above the sample 11, there will be no interference with the incidence and diffraction of X-rays, providing a clear channel for X-rays, lasers or other observation signals, ensuring the complete acquisition of in-situ data.

[0044] Furthermore, if Figure 1 As shown, the pressing rod fixing base 13 is provided with two inverted L-shaped insertion members, each of which is provided with a plurality of pressing rod insertion holes arranged in rows and spaced apart, and the pressing rod insertion holes are used to accommodate the pressing rods 4. The arrangement of the rows of pressing rod insertion holes is to adjust the span of the two pressing rods 4 according to the size of the sample 11.

[0045] Furthermore, the central support rod 3 is made of a rigid material, not limited to metal, and can be flexibly selected from different materials according to the properties of the sample 11. A heater can be introduced to achieve heating and temperature control of the sample 11. The position repeatability of the reduction motor 7 is 0.05 mm, and the movement resolution is 1.25 μm / step.

[0046] The present invention will be further described below with reference to the accompanying drawings and through specific embodiments of bending experiments on a rigid N-type single crystal silicon solar cell and a flexible ITO conductive film.

[0047] Example 1

[0048] Sample 11: Rigid N-type monocrystalline silicon solar cell, size 5mm×25mm.

[0049] Experimental steps:

[0050] 1. Cyclic bending: Place the sample 11 on the central support rod 3, and set the software to move the pressing rods 4 on both sides downward at a speed of 0.15mm / s to a stroke of 0.70mm, forming a controlled bending state. After reaching the target displacement, the pressing rods 4 return upward to the initial position, completing a complete bending-release cycle. This process is performed 10 times in a row, and the system records the mechanical response data during the loading process in real time. The experimental results show ( Figure 3 ): Each time the cycle reaches the maximum stroke, the loading force is stable at about 1.14N with minimal fluctuation, indicating that the device of the present invention has good repeatability and loading stability under cyclic loading, and sample 11 does not show obvious damage or structural failure during the entire cycle.

[0051] 2. Bending fracture ( Figure 4 ): Place the sample 11 on the central support rod 3, and set the pressing rods 4 on both sides to move downward at a speed of 0.15mm / s at the same time through the software until the sample 11 breaks. The mechanical data is monitored in real time during the entire process. The mechanical changes are continuously monitored throughout the loading process, and real-time mechanical data are recorded. The results show that when the stroke reaches 2mm and the loading force reaches 3.76N, the sample 11 breaks significantly and the force value drops instantaneously, indicating that the device has good testing capabilities in achieving controlled bending failure and capturing high-precision mechanical responses.

[0052] Example 2

[0053] Sample 11: Flexible ITO conductive film, size 5mm×25mm

[0054] Experimental steps:

[0055] Cyclic bending: Place the sample 11 on the central support rod 3, and set the software to move the pressing rods 4 on both sides downward at a speed of 1.0mm / s to a stroke of 7.7mm to form a controlled bending state. After reaching the target displacement, the pressing rod 4 returns to the initial position, completing a complete bending-release cycle. This process is performed 10 times in a row, and the system records the mechanical response data during the loading process in real time. The experimental results show (such as Figure 5 Because the ITO conductive film is flexible, Sample 11 did not break even when bent to 7.7 mm. The loading force remained stable at approximately 0.21 N with minimal fluctuations during each cycle to the maximum stroke.

[0056] Through the above experiments, it is not difficult to find that the device of the present invention has the following advantages: 1. The bending loading structure design in which the center position remains unchanged. The present invention uses a symmetrical loading mechanism and a precise structural layout to keep the central test area of ​​the sample in a constant position in space during the bending loading process, and can stably align with the in-situ observation light path of XRD, Raman, etc., overcoming the problem of the test point of the existing device shifting with loading. 2. Unobstructed test area layout. In the loading structure design, the present invention ensures that the loading mechanism does not block the central area of ​​the sample surface, provides a clear channel for X-rays, lasers or other observation signals, and ensures the complete acquisition of in-situ data. It is suitable for multiple platforms such as XRD, synchrotron radiation, and Raman. 3. Micro-deformation bending path control mechanism suitable for rigid materials. The device of the present invention supports small-amplitude controllable bending of rigid or brittle samples (such as ceramics, metals, electrode films, etc.), provides stable curvature loading conditions, and is suitable for material systems that are difficult to be compatible with traditional bending and pulling loading systems. This feature improves the material adaptability and practicality of the device. 4. The structure is compact and adaptable to confined space in-situ characterization equipment. The overall device is miniaturized (the overall size is 90mm×81mm×242mm) and modular, which makes it easy to integrate into test environments with limited space such as XRD chambers, synchrotron radiation chambers, and low-temperature probe stations, broadening its application range in multi-field coupling experimental scenarios. 5. It can be expanded to adapt to a variety of in-situ test platforms. The device of the present invention is not only suitable for XRD, but can also be expanded to in-situ observation methods such as Raman, infrared, DIC, four-probe, and electrical measurement. It has good platform compatibility and technical scalability. 6. Controllable induction of bending fracture behavior and high-precision mechanical response capture mechanism. The present invention can realize controlled bending of rigid samples until fracture under set paths and rates. The mechanical data shows a clear mutation at the moment of sample fracture, indicating that the device has a high-timeliness force signal capture capability. This feature supports the mechanistic study of material fracture behavior and is particularly suitable for in-situ mechanical analysis tasks that require high-resolution force-displacement response recording.

[0057] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A bending loading device for in-situ observation with no center displacement, characterized in that: include: A fixing member, wherein a driving mechanism is provided at the bottom of the fixing member; A support member, disposed on top of the fixing member, for supporting the sample (11) and ensuring that the center position of the sample (11) remains unchanged during the test; A pressing assembly comprises a pressing rod fixing seat (13) and two pressing rods (4) arranged on the pressing rod fixing seat (13) for pressing two ends of the sample (11), wherein the pressing rod fixing seat (13) is connected to the driving mechanism; a force sensor (14), one end of the force sensor (14) being fixed to the fixing member and the other end being connected to the supporting member, for measuring the force exerted on the sample (11); A docking bracket (10) is arranged at the lower part of the fixing member and is used for docking with a confined platform including an X-ray diffractometer.

2. The bending loading device for in-situ observation without center displacement according to claim 1, characterized in that: During the test, the support member tilts toward one of the pressing rods (4). When the two pressing rods (4) move downward to a certain position, the sample (11) tilts toward one side and is limited in inclination by the two pressing rods (4), thereby preventing it from sliding. At the same time, the two pressing rods (4) apply a certain pre-tightening force to the sample (11), thereby preventing the sample (11) from sliding.

3. The bending loading device for in-situ observation without center displacement according to claim 2, characterized in that: Two inverted L-shaped insertion components are provided on the pressing rod fixing seat (13), and the insertion components are used to carry the pressing rod (4).

4. The bending loading device for in-situ observation without center displacement according to claim 3, characterized in that: The insertion component is provided with a plurality of pressing rod insertion holes arranged in rows and at intervals, and the pressing rod insertion holes are used to accommodate the pressing rods (4).

5. The bending loading device for in-situ observation without center displacement according to claim 4, characterized in that: The driving mechanism comprises a reduction motor (7) and a screw rod (5), wherein the output end of the reduction motor (7) is connected to the bottom end of the screw rod (5), and the top end of the screw rod (5) is connected to the fixing member via a bearing.

6. The bending loading device for in-situ observation without center displacement according to claim 5, characterized in that: The driving mechanism further comprises a screw slider (12), which is sleeved on the screw (5) and is fixedly connected to the pressing rod fixing seat (13).

7. The bending loading device for in-situ observation without center displacement according to claim 5, characterized in that: The bearing is fixed on the fixing member via a bearing fixing seat (2).

8. The bending loading device for in-situ observation without center displacement according to claim 1, characterized in that: The fixing member comprises a mounting base (9) and a back plate (1), the driving mechanism is mounted on the mounting base (9), and the supporting member is mounted on the top of the back plate (1).

9. The bending loading device for in-situ observation without center displacement according to claim 5, characterized in that: The movement position repeatability of the reduction motor (7) is 0.05 mm, and the movement resolution is 1.25 μm / step.

10. The bending loading device for in-situ observation without center displacement according to claim 5, characterized in that: The reduction motor (7) is further provided with a housing (6) and an electric control interface (8); and / or, The support member is a central support rod (3).

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