Test methods and apparatus

Abstract

The application discloses a test method and device, and relates to the technical field of servers, which comprises the following steps: obtaining a board card model of a to-be-tested board card, and a component model and a first weight of a first to-be-tested component, the to-be-tested board card being provided with a first slot for inserting the first to-be-tested component; and according to the board card model and the component model, a first target model for calculating the plug-in force of the first to-be-tested component is obtained by querying a model standard library, the model standard library comprising a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model; and according to the first weight, a first test plug-in force corresponding to the first to-be-tested component is accurately determined by using the first target model, so that the damage rate of the first to-be-tested component is reduced and the loss of the first to-be-tested component is reduced in the process of performing the plug-in test on the first to-be-tested component in the first slot according to the first test plug-in force.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of servers, and in particular to a test method and device. BACKGROUND

[0002] The plug-in test of the hardware (such as a hard disk) of an electronic device (such as a server) in a power-on (hot plug) or power-off (cold plug) state is an important link for verifying whether the hardware can be safely installed, removed, and kept stable.

[0003] In related technologies, a test personnel usually manually sets a test plug-in force based on experience, and performs plug-in test on the hardware based on the test plug-in force. However, in this process, the test plug-in force is often too large, resulting in damage to the hardware.

[0004] Therefore, how to reduce the damage to the hardware in the plug-in test process of the hardware is a problem to be solved. SUMMARY

[0005] The present application provides a test method and device to at least solve the problem of how to reduce the damage to the hardware in the plug-in test process of the hardware in related technologies.

[0006] The present application provides a test method applied to a test device, and the method comprises:

[0007] obtaining a board card model of a to-be-tested board card, the to-be-tested board card being provided with a first slot, and the first slot being used for inserting a first to-be-tested component;

[0008] obtaining a component model and a first weight of the first to-be-tested component, and querying a first target model corresponding to the first to-be-tested component in a model standard library according to the board card model and the component model, the model standard library comprising a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model;

[0009] determining a first test plug-in force corresponding to the first to-be-tested component through the first target model according to the first weight;

[0010] performing plug-in test on the first to-be-tested component in the first slot according to the first test plug-in force.

[0011] The present application also provides a test device applied to a test device, and the test device comprises:

[0012] an obtaining module, configured to obtain a board card model of a to-be-tested board card, the to-be-tested board card being provided with a first slot, and the first slot being used for inserting a first to-be-tested component;

[0013] the obtaining module is also configured to obtain a component model and a first weight of the first to-be-tested component;

[0014] The processing module is configured to query a first target model corresponding to the first to-be-tested component from a model standard library according to the board model and the component model, the model standard library including a plurality of board models, at least one component model corresponding to each board model, and a model corresponding to each component model.

[0015] The processing module is further configured to determine a first test plug force corresponding to the first to-be-tested component by using the first target model according to the first weight.

[0016] The processing module is further configured to perform a plug test on the first to-be-tested component in the first slot according to the first test plug force.

[0017] The present application also provides a test device, which is provided with a detection module and a processing module. The detection module is configured to be connected with a to-be-tested board card. The to-be-tested board card is provided with a first slot for inserting a first to-be-tested component. The processing module is configured to obtain a board model of the to-be-tested board card, a component model of the first to-be-tested component, and a first weight, and query a first target model corresponding to the first to-be-tested component from a model standard library according to the board model and the component model, and determine a first test plug force corresponding to the first to-be-tested component by using the first target model according to the first weight. The model standard library includes a plurality of board models, at least one component model corresponding to each board model, and a model corresponding to each component model.

[0018] The processing module is further configured to determine a first test plug force corresponding to the first to-be-tested component by using the first target model according to the first weight.

[0019] The detection module is configured to perform a plug test on the first to-be-tested component in the first slot according to the first test plug force.

[0020] The present application also provides a computer readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps of any of the above test methods are implemented.

[0021] The present application also provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps of any of the above test methods are implemented.

[0022] Through the application, in the test method, the test device can acquire the board card model of the to-be-tested board card, and the component model and the first weight of the first to-be-tested component, the to-be-tested board card is provided with a first slot for inserting the first to-be-tested component; and according to the board card model and the component model, a first target model for calculating the plug-in force suitable for the first to-be-tested component is obtained by querying a model standard library, the model standard library includes a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model; and according to the first weight, the first test plug-in force corresponding to the first to-be-tested component is accurately determined through the first target model, so that in the process of inserting and testing the first to-be-tested component in the first slot according to the first test plug-in force, the damage of the first to-be-tested component caused by the excessively large first test plug-in force is reduced, the damage rate of the first to-be-tested component is reduced, and the loss of the first to-be-tested component is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0023] In order to more clearly illustrate the embodiments of the present application, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0024] Figure 1 One of the structural schematic diagrams of the test system provided by the embodiments of the present application;

[0025] Figure 2 A schematic diagram of a plug-in force fitting curve provided by the embodiments of the present application;

[0026] Figure 3 The second structural schematic diagram of the test system provided by the embodiments of the present application;

[0027] Figure 4 The third structural schematic diagram of the test system provided by the embodiments of the present application;

[0028] Figure 5 The first flowchart of the test method provided by the embodiments of the present application;

[0029] Figure 6 The second flowchart of the test method provided by the embodiments of the present application;

[0030] Figure 7 The third flowchart of the test method provided by the embodiments of the present application;

[0031] Figure 8 The structural schematic diagram of the test device provided by the embodiments of the present application. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present application will be described clearly and completely in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0033] It should be noted that, in the description of the present application, the terms "comprise", "contain" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment comprising a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or equipment. The terms "first", "second" and the like in the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence.

[0034] It should be noted that, in the embodiments of the present application, some software, components, models and the like in the industry may be mentioned, which should be considered as exemplary, and the purpose is only to illustrate the feasibility of the implementation of the technical solutions of the present application, but it does not mean that the applicant has or will necessarily use the scheme.

[0035] It should be noted that the user information (including but not limited to user equipment information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or authorized by all parties, and the collection, use and processing of related data need to comply with relevant laws, regulations and standards, and provide corresponding operation portal for user to choose authorization or refusal.

[0036] In the process of plugging test of the hardware (such as hard disk) of the electronic equipment (such as server) in the state of power-on (hot plug) or power-off (cold plug), the test personnel usually artificially set a test plug force based on experience, and plug the hardware based on the test plug force. However, in this process, the situation that the test plug force is too large to cause damage to the hardware often occurs. Therefore, how to reduce the damage to the hardware in the process of plugging test of the hardware is a problem to be solved.

[0037] Optionally, the plugging can include insertion and extraction of the component to be tested.

[0038] In the embodiment of the present application, a test device can be provided, which is provided with a detection module and a processing module. The detection module can be used to connect with a to-be-tested board card. The to-be-tested board card is provided with a first slot, which is used to insert a first to-be-tested component. The test device can obtain the board card model of the to-be-tested board card, the component model and the first weight of the first to-be-tested component through the processing module. According to the board card model and the component model, the first target model corresponding to the first to-be-tested component is obtained by querying the model standard library. According to the first weight, the first test plug-in force suitable for the first to-be-tested component is accurately determined through the first target model. Therefore, in the process of the detection module inserting and pulling out the first to-be-tested component in the first slot according to the first test plug-in force, the damage of the first to-be-tested component caused by the excessive first test plug-in force can be reduced. Therefore, the damage rate of the first to-be-tested component in the plug-in test process can be reduced, and the loss of the first to-be-tested component can be reduced.

[0039] In the test method and device provided in the embodiment of the present application, the model standard library can include a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model. Therefore, the test device can flexibly and accurately determine the test plug-in force for a plurality of to-be-tested board cards in the plug-in test. In addition, the test plug-in force suitable for the to-be-tested component in the plug-in test can be accurately determined according to the component model of the to-be-tested component inserted in the slot of each to-be-tested board card. Therefore, the test device can be applied to a plurality of plug-in force test scenes.

[0040] The device manufacturer and the device user can cooperate to perform the plug-in process based on the model standard library.

[0041] Scenario 1: Plug-in test process before the device leaves the factory.

[0042] A plurality of device manufacturers can share the model standard library to improve component compatibility and ensure that the to-be-tested components manufactured by a plurality of device manufacturers can be tested based on a unified standard (such as a unified test plug-in force), so as to avoid different test results in the plug-in test process due to different plug-in force standards adopted by different device manufacturers.

[0043] Before the to-be-tested board card or to-be-tested component is shipped, each equipment manufacturer uses the test method provided in the present application to perform a plug-in test on the to-be-tested board card or to-be-tested component. During the test, multiple equipment manufacturers can obtain the same type of board card model and component model from the model standard library, and determine the test plug-in force of the to-be-tested component based on the model to ensure that the to-be-tested component can be smoothly installed in the to-be-tested board card, avoid damage to the to-be-tested component or to-be-tested board card due to excessive plug-in force during the insertion process of the to-be-tested board card, reduce hardware failure caused by improper plug-in, reduce the cost of loss, avoid mechanical wear and tear during the plug-in process, prolong the service life of the to-be-tested component and the to-be-tested board card, and reduce the occurrence of mechanical wear and tear of the slot spring or the gold finger due to excessive plug-in force, thereby prolonging the service life of the slot.

[0044] During the test, each equipment manufacturer can dynamically update the existing model of the to-be-tested component in the model standard library based on the test data, so that other equipment manufacturers can continue to use the latest model.

[0045] Scenario 2: Plug-in processing during the operation and maintenance process after the equipment is shipped.

[0046] After the equipment is shipped, the operation and maintenance personnel of the equipment user can also determine the test plug-in force based on the model standard library, and perform plug-in processing on the to-be-tested component based on the test plug-in force during the operation and maintenance process, thereby achieving the following advantages: reducing hardware failure caused by improper plug-in, reducing operation and maintenance costs, avoiding hidden failures caused by mechanical wear and tear during the plug-in process, prolonging the service life of the to-be-tested component and the to-be-tested board card, reducing the occurrence of mechanical wear and tear of the slot spring or the gold finger due to excessive plug-in force, and prolonging the service life of the slot.

[0047] In some embodiments, the personnel of the equipment manufacturer can determine the test plug-in force of the to-be-tested component corresponding to the component model through the model standard library, and determine the test plug-in force as an alarm threshold for plug-in processing of the to-be-tested component during the operation and maintenance process. When the subsequent operation and maintenance personnel need to replace the faulty to-be-tested component in the slot, if the plug-in force of the to-be-tested component is greater than the test plug-in force, an alarm will be triggered to prompt the operation and maintenance personnel to detect whether the to-be-tested component, the slot, or the to-be-tested board card is deformed or damaged, so as to better maintain the to-be-tested component or the to-be-tested board card. In this process, by explicitly determining the test plug-in force of the to-be-tested component, the operation and maintenance personnel can also avoid faults caused by “not plugged in enough”, for example, the operating system of the electronic device does not recognize when the Non-Volatile Memory Express (NVMe) hard disk is not completely inserted.

[0048] In some embodiments, although the insertion and extraction operation of the to-be-tested component can be guided by a physical structure (such as a mobile plate or a plug-in positioning assembly), this way relies on a fixed mechanical design, and when the component structure is changed or has a structural defect, it is not possible to determine whether the slot of the to-be-tested component or the to-be-tested board card meets the standard. Compared with this way, the embodiments of the present application can establish a mapping relationship between the board card model, the component model and the model by constructing a model standard library, so as to adapt the test equipment or test method to the insertion and extraction test process of more types of to-be-tested board cards or slots of to-be-tested board cards of the to-be-tested board card and more types of to-be-tested components, so as to detect whether more types of to-be-tested board cards or slots of to-be-tested board cards and more types of to-be-tested components meet the standard.

[0049] In the insertion and extraction process of hardware, by accurately setting the test insertion and extraction force, the smooth installation of hardware in electronic equipment can be ensured, hardware damage caused by excessive insertion and extraction force can be avoided, hardware failure caused by improper insertion and extraction can be reduced, and operation and maintenance cost can be reduced.

[0050] In order for those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0051] In combination with the specific application environment architecture or specific hardware architecture on which the test method is executed, the specific application environment architecture or specific hardware architecture is described herein. For reference Figure 1 , Figure 1 One of the structural diagrams of the test system provided by the embodiments of the present application.

[0052] Please refer to Figure 1 , the test system 10 includes a test equipment 100 and a to-be-tested board card 101.

[0053] (1) to-be-tested board card 101

[0054] The to-be-tested board card 101 is provided with a first slot, and the first slot can be used for inserting a first to-be-tested component.

[0055] In some embodiments, the to-be-tested board card can be a to-be-tested board card in an electronic equipment. There can be one or more to-be-tested board cards in the electronic equipment.

[0056] Exemplarily, the electronic equipment can be a server, and the to-be-tested board card can include but is not limited to a mainboard, a hard disk board card and a network interface card, and the first to-be-tested component can include but is not limited to a hard disk, a memory, a power supply, a network card and a fan. The network card can include but is not limited to a Peripheral Component Interconnect express (PCIe) card.

[0057] In some embodiments, the term "slot" can be replaced by the terms "socket", "interface", and "connector", and so on.

[0058] (2) Test device 100

[0059] The test device 100 is provided with a detection module 1000 and a processing module 1001. The detection module 1000 can be used to connect with a to-be-tested board card 101. The detection module 1000 can also be connected with the processing module 1001.

[0060] Optionally, the detection module can be provided with a placement area of the to-be-tested board card. In the case that the detection module is connected with the to-be-tested board card, the to-be-tested board card can be placed in the placement area of the detection module.

[0061] It should be noted that the detection module and the processing module can be coupled as an integrated test device. Alternatively, the detection module and the processing module can also be two independent devices.

[0062] A. Processing module 1001

[0063] The processing module can be used to control the detection module to perform the plugging test process on the to-be-tested board card. Optionally, the processing module can be provided with a processor, a memory, and a communication component. The processor, the memory, and the communication component can be connected through a bus. The processing module can also be provided with a display. For example, the processing module can be a control device used to control a mechanical hand.

[0064] The processing module can be used to obtain a board card model of the to-be-tested board card, a component model of the first to-be-tested component, and a first weight. According to the board card model and the component model, a first target model corresponding to the first to-be-tested component is obtained from a model standard library. According to the first weight, a first test plugging force corresponding to the first to-be-tested component is determined through the first target model.

[0065] Optionally, the board card model can be a part number (PN) of the board card. The component model can be a part number (PN) of the component.

[0066] It should be noted that the process of obtaining the board card model, the component model, and the first weight by the processing module will be described in detail in subsequent test method embodiments.

[0067] In some embodiments, the processing module can fit the first target model according to historical test data of the first to-be-tested component. The historical test data can include a plurality of maximum plugging forces in a plurality of plugging test processes of the first to-be-tested component with the same component model in the to-be-tested board card in the first slot, and the weight of the first to-be-tested component each time the plugging test is performed in a historical period (for example, the past 3 months or 1 month, etc.).

[0068] In some embodiments, the first target model can be a polynomial regression model. For example, the polynomial regression model can be represented as , where, may represent the test plug-in force corresponding to the first to-be-tested component, and the unit can be Newton (N); may represent the first weight corresponding to the first to-be-tested component, and the unit can be kilogram (kg); , and may be coefficients obtained by fitting, for example,

[0069] As shown in Figure 2 , the polynomial regression model can correspond to a plug-in force fitting curve.

[0070] Figure 2 For a schematic diagram of a plug-in force fitting curve provided by an embodiment of the present application, please refer to Figure 2 , the horizontal coordinate of the plug-in force fitting curve can be the weight of the first to-be-tested component, and the vertical coordinate can be the maximum plug-in force of the first to-be-tested component.

[0071] For any one to-be-tested board card, a plurality of maximum plug-in forces in a plurality of plug-in test processes of the first to-be-tested component of the same component model in the first slot in a historical period (for example, the past 3 months or 1 month, etc.) and the weight of the first to-be-tested component each time the plug-in test is performed can be obtained; and according to the plurality of maximum plug-in forces and the plurality of weights of the first to-be-tested component corresponding to the plurality of maximum plug-in forces, fitting processing is performed to obtain the plug-in force fitting curve and further obtain the polynomial regression model corresponding to the plug-in force fitting curve.

[0072] For example, the historical test data of the first to-be-tested component can be as shown in Table 1.

[0073] Table 1

[0074]

[0075] Based on the historical test data shown in Table 1, the first target model that can be fitted is .

[0076] In some embodiments, in order to guarantee the calculation accuracy of the first target model, the fitting accuracy of the first target model needs to be greater than a preset accuracy. For example, in the fitting process of the polynomial regression model, by controlling the determination coefficient (R²) to be greater than a preset value, the fitting accuracy of the polynomial regression model can be guaranteed. For example, the preset accuracy can be 0.9, and in the actual fitting process, R²=0.9456, so it is determined that the fitting accuracy of the polynomial regression model meets the requirements.

[0077] It can be understood that, for any one first to-be-tested component, the more the data amount (including weight and maximum insertion force) of the historical test data corresponding to the first to-be-tested component, the higher the accuracy of the first target model obtained by fitting.

[0078] B, detection module 1000

[0079] The detection module can be used for performing insertion test on the first to-be-tested component in the first slot according to the first test insertion force.

[0080] The detection module can obtain the control instruction sent by the processing module, and perform insertion test on the first to-be-tested component in the first slot based on the control instruction.

[0081] The control instruction can include the first test insertion force, and the control instruction can be used to instruct the detection module to perform insertion test on the first to-be-tested component in the first slot based on the first test insertion force.

[0082] Exemplarily, the detection module can be a module for performing insertion test on the to-be-tested component in the to-be-tested board card. For example, the detection module can be a mechanical hand, which can perform insertion test on the first to-be-tested component in the first slot of the to-be-tested board card according to the control instruction of the processing module.

[0083] In some embodiments, the structure of the detection module can also be as shown in Figure 3 .

[0084] Figure 3 The second structural diagram of the test system provided by the embodiments of the present application is shown in Figure 3 , based on the structure of the to-be-tested board card 101 shown in Figure 1 , a plurality of slots can be arranged in the to-be-tested board card 101, the plurality of slots are used for inserting a plurality of to-be-tested components, the plurality of slots include a first slot, and the plurality of to-be-tested components include a first to-be-tested component.

[0085] It should be noted that, in Figure 3 and subsequent embodiments, four slots are taken as an example in the to-be-tested board card, and in some other embodiments, the number of slots in the to-be-tested board card can be any number greater than 2, and the present application does not limit the number of slots in the to-be-tested board card.

[0086] It can be understood that, the component types of any two to-be-tested components in the plurality of to-be-tested components can be the same or different. Exemplarily, the component types can include but are not limited to: hard disk type, memory type, power supply type, network card type and fan type.

[0087] Optionally, the plurality of components to be tested can include at least two components to be tested of the same type, and the component models of the two components to be tested can be the same or different. Optionally, the component model can be the PN of the component. For example, two components to be tested of the plurality of components to be tested are hard disks, and the PNs of the two hard disks can be the same or different.

[0088] As shown in Figure 3 The detection module 1000 can include a first detector, which can be connected with the force receiving parts of the plurality of slots. The first detector can be used to detect the maximum insertion force generated by the components to be tested during the insertion test of the corresponding slots.

[0089] For any slot, the force receiving part of the slot can be a plane in contact with the component to be tested.

[0090] It can be understood that the maximum insertion force is the actual insertion force generated by the component to be tested during the insertion test in the corresponding slot.

[0091] Optionally, the first detector can be used to detect the real-time insertion force of the component to be tested during the insertion test of the corresponding slot in real time. The real-time insertion force can include a plurality of insertion forces, which can include the maximum insertion force.

[0092] For example, the pressure sensor can convert the mechanical deformation of the force receiving part of the slot into a voltage signal.

[0093] In some embodiments, in the server, a hard disk insertion alarm system can be used to detect whether the hard disk is inserted or not, and to alarm after the hard disk is inserted to avoid loss of the hard disk. For example, the hard disk insertion alarm system can include a hard disk board and a trigger switch, which can be arranged around the hard disk interface on the hard disk board to be triggered to produce a state change when the hard disk interface has a hard disk inserted. However, in this process, only the state change can be used to feedback whether the insertion process is in place, and the insertion force in the insertion process cannot be determined. In the test device provided in the embodiments of the present application, a first detector can be integrated in the detection module, and the first detector can be connected with the force receiving parts of the plurality of slots, so that the detection module can detect the maximum insertion force generated by the components to be tested during the insertion test of the corresponding slots, so that the processing module can compare the maximum insertion force with the test insertion force set before the insertion test of the components to be tested, and according to the comparison result, it can be determined whether the first target model needs to be updated, so that the first target model can be continuously optimized during the test process, so that the test insertion force calculated by the first target model in the subsequent insertion test is more accurate.

[0094] Figure 4A third structural diagram of a test system provided by an embodiment of the present application is shown. Please refer to Figure 4 On the basis of the structure of the test device 100 shown in Figure 3 The detection module 1000 can further include a second detector and a third detector.

[0095] The second detector can be used to detect the board card model and the component model of the plurality of components to be tested.

[0096] Exemplarily, the second detector can be a scanner, which can be used to scan and read the board card model of the board card to be tested and the component model of the component to be tested.

[0097] The third detector can be used to detect the weight of the plurality of components to be tested.

[0098] The third detector can be located at a gravity tray of the component to be tested. Exemplarily, the third detector can be a gravity sensor, and a tester can manually place the component to be tested at the gravity tray, and the gravity sensor integrated in the gravity tray can detect the weight of the component to be tested.

[0099] In some embodiments, the detection module can further include at least one of the following detectors: a temperature detector, a humidity detector, a voltage detector, or a current detector, to detect the temperature, humidity, voltage, or current in the plugging test process, and determine the loss of the component to be tested in the plugging process in combination with the environmental factors such as temperature, humidity, voltage, or current and the maximum plugging force.

[0100] It should be noted that the present application provides a test device, and the structure of the test device 100 can refer to the structure of the test device in Figures 1 to 4 , which will not be described here in detail.

[0101] In the test device provided by the present application, the second detector and the third detector can be integrated in the detection module, so that the detection module can independently obtain the board card model of the board card to be tested, the component model of the component to be tested, and the weight, without relying on other devices to obtain the above information, so that the detection scenario of the detection module is more flexible.

[0102] The present application also provides a test method, which will be described below in combination with Figures 5 to 7 . It should be noted that the test method can be executed by the test device.

[0103] Figure 5 A first flowchart of a test method provided by an embodiment of the present application is shown in Figure 5 The present application provides a test method, and the method will be described in detail as follows:

[0104] S501, acquire the board model of the to-be-tested board card.

[0105] As shown in Figure 1 , the to-be-tested board card can be provided with a first slot, and the first slot can be used for inserting the first to-be-tested component.

[0106] Exemplarily, the to-be-tested board card can include but is not limited to a mainboard, a hard disk board card and a network interface card, and the first to-be-tested component can include but is not limited to a hard disk, a memory, a power supply, a network card and a fan. The network card can include but is not limited to a PCIe card.

[0107] As shown in Figure 2 , the to-be-tested board card can be provided with a plurality of slots, the plurality of slots can include the first slot, and the plurality of slots can be used for inserting a plurality of to-be-tested components, and the plurality of to-be-tested components can include the first to-be-tested component.

[0108] In some embodiments, as shown in Figure 4 , the detection module of the test device is provided with a second detector, and the detection module can detect the to-be-tested board card through the second detector to obtain the board model of the to-be-tested board card.

[0109] In some embodiments, the test device (or the processing module) can acquire the board model of the to-be-tested board card in the following manner: acquiring a test configuration file, the test configuration file being used for indicating plugging test on the to-be-tested board card; determining the board model according to the test configuration file; and determining the component model and the first weight of the first to-be-tested component according to the test configuration file.

[0110] The test configuration file can include board information of the to-be-tested board card and component information of the first to-be-tested component, the board model can be extracted from the board information, and the component model and the first weight can be extracted from the component information.

[0111] For example, the board information can include the name, the board model and the factory information of the to-be-tested board card, and the component information can include the component model, the component identifier and the first weight.

[0112] Optionally, the test configuration file can be sent by a user device, or the test device requests the user device to acquire. The user device can be a smartphone, a tablet computer, a laptop computer, a desktop computer or a laptop computer of a developer or a tester.

[0113] S502, acquire the component model and the first weight of the first to-be-tested component, and query a first target model corresponding to the first to-be-tested component in a model standard library according to the board model and the component model.

[0114] In some embodiments, as shown in Figure 4As shown, the detection module of the test device is provided with a second detector and a third detector. The detection module can detect the first to-be-tested component through the second detector to obtain the component model of the first to-be-tested component, and detect the first weight of the first to-be-tested component through the third detector.

[0115] Optionally, the test device (or the processing module) can obtain the test configuration file and extract the component identifier and the first weight from the component information of the first to-be-tested component in the test configuration file. If the first weight is not included in the component information, the test device (or the processing module) can determine the first weight based on the component identifier of the first to-be-tested component and the component standard library including a plurality of component identifiers and the weight corresponding to each component model.

[0116] For example, in the process of producing the first to-be-tested component, the production personnel can enter the component identifier and the first weight corresponding to the first to-be-tested component into the component standard library, so that the test device (or the processing module) can subsequently query the first weight in the component standard library based on the component identifier of the first to-be-tested component.

[0117] In some embodiments, the test device (or the processing module) can query the target model corresponding to the first to-be-tested component in the model standard library according to the board model and the component model. The model standard library can include a plurality of board models, at least one component model corresponding to each board model, and a model corresponding to each component model.

[0118] For example, the model standard library can be as shown in Table 2.

[0119] Table 2

[0120]

[0121] Before step S502 is performed, the model standard library can be created in advance. The test device (or the processing module) can obtain historical test data of a plurality of to-be-tested boards and determine the model standard library according to the historical test data of the plurality of to-be-tested boards.

[0122] The historical test data of each to-be-tested board includes the board model and slot information of each to-be-tested board, and plug-in test data corresponding to the slot on each to-be-tested board. The slot information can include the total number of slots of the to-be-tested board and the slot identifier of each slot. For any one slot of the to-be-tested board, the plug-in test data corresponding to the slot can include the component model of the to-be-tested component inserted into the slot and the model corresponding to the component model.

[0123] It should be noted that the process of determining the model corresponding to the to-be-tested component can refer to the process of determining the first target model, which will not be described herein again. Figure 1 In the embodiments, the process of determining the first target model will not be described herein again.

[0124] In the test method provided in the embodiments of the present application, the model standard library can be created in advance, so that when the first to-be-tested component is tested by plugging, the first target model corresponding to the first to-be-tested component can be quickly determined, so as to improve the speed and accuracy of determining the first test plugging force corresponding to the first to-be-tested component.

[0125] S503, determining the first test plugging force corresponding to the first to-be-tested component by the first target model according to the first weight.

[0126] In some embodiments, the first weight can be input into the first target model, and the first target model can output the first test plugging force.

[0127] For example, the first target model can be , and the first weight can be 1.28 kg, that is , the first weight is input into the first target model, and the first target model can calculate Newton, and output the test plugging force as 375.48 Newton.

[0128] It can be understood that if the first to-be-tested component is a newly added to-be-tested component in the to-be-tested board card, there can be a case that the model corresponding to the first to-be-tested component is missing in the model standard library. In the case that the first target model corresponding to the first to-be-tested component is not queried in the model standard library, the first test plugging force corresponding to the first to-be-tested component can be determined in the plugging force standard library according to the component model corresponding to the first to-be-tested component.

[0129] The plugging force standard library can include a plurality of component models and test plugging forces corresponding to each component model. The plurality of component models can include the component model of the first to-be-tested component.

[0130] Optionally, the plugging force standard library can be determined based on historical plugging force test data of a plurality of to-be-tested components. For any one to-be-tested component, the historical plugging force test data can include the component model of the to-be-tested component and the historical test plugging force corresponding to the to-be-tested component, and in the process of plugging test based on the historical test plugging force, the to-be-tested component can be normally identified.

[0131] In the process of plugging test of a plurality of weights and a plurality of component models of to-be-tested components, based on the test method provided in the present application, the test equipment can dynamically adjust the test plugging force of each to-be-tested component in the plugging process to avoid that the test plugging force is too large to cause the to-be-tested component to be damaged.

[0132] S504, performing plugging test on the first to-be-tested component in the first slot according to the first test plugging force.

[0133] The step can be performed by the testing device or by the detection module of the testing device.

[0134] In some embodiments, the processing module can send a control instruction to the detection module, the control instruction can include the first test insertion force, and the control instruction can be used to instruct the detection module to perform the insertion test on the first DUT in the first slot based on the first test insertion force.

[0135] In some embodiments, the detection module can fail to insert the first DUT into the first slot according to the first test insertion force, in which case the method can further include the following steps:

[0136] Step one: if the first DUT fails to be inserted into the first slot according to the first test insertion force, then the sum of the first test insertion force and a preset insertion force is determined as the first adjustment insertion force corresponding to the first DUT.

[0137] Optionally, the preset insertion force can be a value set in advance by the tester according to test experience, for example, the preset insertion force can be 0.1N or 0.05N.

[0138] Step two: if the first DUT still fails to be inserted into the first slot according to the first adjustment insertion force, then the sum of the ith adjustment insertion force and the preset insertion force is determined as the (i+1)th adjustment insertion force.

[0139] Wherein, i takes 1, 2, …, in turn, until the (i+1)th adjustment insertion force is less than the insertion force threshold and the first DUT is inserted into the first slot according to the (i+1)th adjustment insertion force, then the insertion test is performed on the first DUT in the first slot according to the (i+1)th adjustment insertion force; or, until the (i+1)th adjustment insertion force is greater than or equal to the insertion force threshold and still fails to insert the first DUT into the first slot, the insertion test on the first DUT is ended.

[0140] In the test method, the test device (or detection module) can fine-tune the first test insertion force based on a preset insertion force in a case where the first test insertion force fails to insert the first DUT component into the first slot, so that the test device (or detection module) inserts the first DUT component into the first slot. It can be understood that the fine-tuning process is not infinite, that is, the adjusted insertion force cannot be increased indefinitely, because the DUT board has a maximum bearing force during insertion (or pressing), and an adjusted insertion force exceeding the maximum bearing force can cause damage to the DUT board or the DUT component. In this case, an insertion force threshold can be set to limit the fine-tuning process, which can be less than or equal to the maximum bearing force corresponding to the DUT board, so that in a case where the first test insertion force fails to insert the first DUT component into the first slot, the first test insertion force can still be fine-tuned based on the insertion force threshold within the safe range that the DUT board can bear, so that the first DUT component can be inserted into the first slot to perform subsequent insertion tests. When the i+1 adjusted insertion force is greater than or equal to the insertion force threshold and still fails to insert the first DUT component into the first slot, the insertion test of the first DUT component can be immediately ended to avoid damaging the DUT board or the first DUT component.

[0141] The test method provided by the embodiments of the present application can obtain the board model of the DUT board, the component model of the first DUT component, and the first weight, query a first target model for calculating the insertion force of the first DUT component from the model standard library according to the board model and the component model, and accurately determine the first test insertion force suitable for the first DUT component through the first target model according to the first weight, so that the test device (or detection module) can reduce the occurrence of damage to the first DUT component caused by an excessively large first test insertion force during the insertion test of the first DUT component in the first slot according to the first test insertion force, thereby reducing the damage rate of the first DUT component during the insertion test and reducing the loss of the first DUT component.

[0142] After the plug-in test of the first to-be-tested component in the first slot according to the first test plug-in force, the test method provided by the embodiment of the application further can comprise: detecting a first maximum plug-in force generated by the first to-be-tested component in the plug-in test process in the first slot; if one of the following conditions is met: the first maximum plug-in force is less than or equal to the first test plug-in force, or the first maximum plug-in force is greater than the first test plug-in force and the first to-be-tested component can be normally identified, then updating the first target model according to the first weight and the first maximum plug-in force to obtain a second target model. And after obtaining the second target model, determining whether the number of plug-in tests of the first to-be-tested component is less than the maximum test number corresponding to the first to-be-tested component; in the case that the number of plug-in tests is less than the maximum test number, determining a second test plug-in force corresponding to the first to-be-tested component by the second target model according to the first weight, and performing the plug-in test of the first to-be-tested component in the first slot according to the second test plug-in force.

[0143] In the following, the process is described in detail in combination with Figure 6 The process is described in detail.

[0144] Figure 6 The flowchart of the test method provided by the embodiment of the application is shown in Figure 2, and the embodiment of the application provides a test method, which is described in detail as follows. Figure 6

[0145] S601, initialize j to 1.

[0146] S602, determine a jth test plug-in force corresponding to the first to-be-tested component by the jth target model according to the first weight.

[0147] It should be noted that the specific execution process of this step can refer to the specific execution process of step S503, which will not be described here.

[0148] S603, perform the jth plug-in test of the first to-be-tested component in the first slot according to the jth test plug-in force.

[0149] It should be noted that the specific execution process of this step can refer to the specific execution process of step S504, which will not be described here.

[0150] S604, detect a jth maximum plug-in force generated by the first to-be-tested component in the jth plug-in test process in the first slot.

[0151] Wherein, j takes 1, 2, 3, …, P in turn, wherein P represents the maximum test number corresponding to the first to-be-tested component.

[0152] As shown in Figure 2 ​As shown, the detection module is provided with a first detector (such as a pressure sensor), and the test device (or detection module) can detect the jth maximum plug force through the first detector.

[0153] S605, determine whether the jth maximum plug force is greater than the jth test plug force.

[0154] Wherein, in the case of j taking 1, the jth test plug force is the first test plug force determined based on the first target model.

[0155] If yes, step S606 is performed;

[0156] If no, step S607 is performed.

[0157] S606, determine whether the first to-be-tested component can be normally identified.

[0158] If yes, step S607 is performed;

[0159] If no, step S610 is performed.

[0160] The to-be-tested board card can be located in an electronic device, and the electronic device can check whether the first slot can normally identify the information of the first to-be-tested component under an operating system (OS), and send the identification state of the first to-be-tested component to the test device (or processing module), the identification state can be used to indicate whether the information of the first to-be-tested component can be normally identified by the first slot.

[0161] S607, update the jth target model according to the first weight and the jth maximum plug force, to obtain a j+1th target model.

[0162] Wherein, in the case of j taking 1, the jth target model is the first target model, and the j+1th target model is the second target model.

[0163] Optionally, in some embodiments, the first weight and the first maximum plug force can be added to the historical test data corresponding to the first to-be-tested component to obtain updated historical test data, and based on the updated historical test data, the fitting process is re-performed to obtain the second target model.

[0164] For example, (the first weight, the first maximum plug force) can be added to Table 1, and based on the updated data in Table 1, the fitting process is re-performed to obtain a new plug force fitting curve and a second target model corresponding to the new plug force fitting curve.

[0165] By detecting the maximum plug-in force of the to-be-tested component in real time during the plug-in process of the to-be-tested component, the parameters of the target model can be optimized in real time based on comparison of the maximum plug-in force and the test plug-in force, the deviation of the target model is continuously corrected, a target model corresponding to the component model and having higher prediction accuracy is obtained, and the plug-in process of the to-be-tested component corresponding to the component model is better guided and tested.

[0166] In the test method provided in the embodiments of the present application, the first target model corresponding to the first to-be-tested component can be dynamically updated or optimized based on the plug-in test data of the first to-be-tested component, which is beneficial to improving the prediction accuracy of the model, so that the test plug-in force can be more accurately determined based on the second target model during the subsequent plug-in test process of the first to-be-tested component or the plug-in test process of a second to-be-tested component having the same component model as the first to-be-tested component, so as to further reduce the damage rate of the first to-be-tested component or the second to-be-tested component in the subsequent plug-in test process, reduce the loss of the first to-be-tested component or the second to-be-tested component, and improve the use time of the first to-be-tested component or the second to-be-tested component.

[0167] It can be understood that in some test scenarios (for example, pre-delivery hardware testing), the first to-be-tested component can be tested multiple times, and in this case, the test method can further include the following steps S608-S610.

[0168] S608, determining whether j is less than the maximum test number P corresponding to the first to-be-tested component.

[0169] If yes, that is, in the case that the number of plug-in tests is less than the maximum test number, step S609 is performed;

[0170] If no, that is, in the case that the number of plug-in tests is greater than or equal to the maximum test number, step S610 is performed.

[0171] S609, updating j to j+1.

[0172] After step S609 is performed, step S602 can be performed.

[0173] S610, ending the plug-in test of the first to-be-tested component.

[0174] In some embodiments, historical plug-in test data of the first to-be-tested component can also be obtained, the historical plug-in test data can include the number of plug-in tests of the first to-be-tested component and the plug-in force corresponding to each plug-in test of the first to-be-tested component, and a mapping relationship between the plug-in force and the number of plug-in tests corresponding to the first to-be-tested component is established according to the historical plug-in test data.

[0175] It should be noted that the plug-in force can be a test plug-in force set before the plug-in test, or a maximum plug-in force generated in the actual plug-in test process.

[0176] If the first to-be-tested component is tested M1 times in the first plug-in test process, the average of the plug-in force corresponding to the first to-be-tested component in the M1 plug-in test processes is N1; if the first to-be-tested component is tested M2 times in the second plug-in test process, the average of the plug-in force corresponding to the first to-be-tested component in the M1+M2 plug-in test processes is N2; and so on, a plurality of groups of data (M1, N1), (M1+M2, N2), (M1+M2+M3, N3), … can be obtained, and the mapping relationship can be obtained based on the plurality of groups of data. It should be noted that M1, M2, and M3 are integers greater than or equal to 1, and N1, N2, and N3 are numbers greater than 0.

[0177] Optionally, a mapping curve can also be established based on the mapping relationship between the plug-in force corresponding to the first to-be-tested component and the number of plug-in tests, which can be used to determine the influence of the value of the plug-in force on the plug-in test, to optimize the plug-in force value mathematical model, reduce the damage to the first to-be-tested component in the plug-in test process, and prolong the service life of the first to-be-tested component. For example, according to the mapping relationship, it can be determined that the smaller the plug-in force, the more the number of plug-in tests of the first to-be-tested component in the first slot under the same service life.

[0178] In some embodiments, the device manufacturer and the device user can predict the service life of the to-be-tested component or the slot of the to-be-tested board card based on the mapping relationship and the number of plug-in tests of the to-be-tested component, so that the to-be-tested component or the to-be-tested board card can be replaced in time to better maintain the to-be-tested component or the to-be-tested board card.

[0179] The test method provided by the embodiments of the present application can dynamically optimize the target model corresponding to the first to-be-tested component in the previous plug-in test process (such as the first plug-in test process) based on the first weight and the maximum plug-in force obtained in the previous plug-in test process, so as to iteratively update the target model corresponding to the first to-be-tested component in the plug-in test process, so as to guarantee the prediction accuracy of the target model; and based on the optimized target model, the test plug-in force in the subsequent plug-in test process (such as the second plug-in test process) can be dynamically adjusted, so that the test plug-in force can be more accurately determined based on the updated target model in the subsequent plug-in test process of the first to-be-tested component, to further reduce the damage rate of the first to-be-tested component in the subsequent plug-in test process and reduce the damage to the first to-be-tested component.

[0180] In some embodiments, the to-be-tested board card further has a second slot position, the second slot position can be used to insert a second to-be-tested component, the second to-be-tested component has the same component model as the first to-be-tested component, and the test method can further include the following steps: obtaining a second weight of the second to-be-tested component; determining, according to the second weight, a third test plug-pull force corresponding to the second to-be-tested component through the second target model; and performing plug-pull test on the second to-be-tested component in the second slot position according to the third test plug-pull force.

[0181] It should be noted that the process of obtaining the second weight of the second to-be-tested component can refer to the process of obtaining the first weight in step S502, which will not be described here.

[0182] Similarly, the second to-be-tested component can also be tested multiple times, and after one plug-pull test of the second to-be-tested component is performed, the second target model can be updated according to the steps of steps S601-S607, and subsequent plug-pull test of the second to-be-tested component can be performed based on the updated target model, which will not be described here.

[0183] Next, the plug-pull test process of the to-be-tested board card will be described in combination with Figure 7 For example, the to-be-tested board card is a hard disk board card, and the hard disk board card includes multiple slot positions, and the to-be-tested components inserted into the multiple slot positions have the same component model.

[0184] Figure 7 A third flowchart of the test method provided by the embodiments of the present application is shown in Figure 6 The embodiments of the present application provide a test method, which will be described in detail as follows.

[0185] S701, obtaining a board card model of a to-be-tested board card.

[0186] It should be noted that the specific execution process of this step can refer to the specific execution process of step S501, which will not be described here.

[0187] S702, determining a total number N of slot positions provided in the to-be-tested board card.

[0188] Wherein, N is an integer greater than 1.

[0189] In some embodiments, the total number can be determined based on a test configuration file. Alternatively, the total number can also be determined based on a detector (such as a second detector) in a detection module.

[0190] S703, initializing i to 1.

[0191] S704, acquire the i-th component model and the i-th weight of the i-th to-be-tested component corresponding to the i-th slot.

[0192] wherein i takes 1, 2, 3, …, N-1 in turn.

[0193] It should be noted that the specific execution process of this step can refer to the specific execution process of step S502, which will not be repeated here.

[0194] S705, determine whether there is an i-th target model corresponding to the i-th to-be-tested component in the model standard library according to the board model and the i-th component model.

[0195] If there is, step S706 is performed;

[0196] If there is not, step S707 is performed.

[0197] It should be noted that the specific content of the model standard library in this step can refer to the specific content of the model standard library in step S502, which will not be repeated here.

[0198] S706, determine the i-th test insertion force corresponding to the i-th to-be-tested component through the i-th target model according to the i-th weight.

[0199] It should be noted that the specific execution process of this step can refer to the specific execution process of step S503, which will not be repeated here.

[0200] S707, determine the i-th test insertion force corresponding to the i-th to-be-tested component based on the insertion force standard library according to the i-th component model.

[0201] It should be noted that the specific content of the insertion force standard library in this step can refer to the specific content of the insertion force standard library in step S503, which will not be repeated here.

[0202] S708, perform insertion test on the i-th to-be-tested component in the i-th slot according to the i-th test insertion force, and detect the i-th maximum insertion force generated by the i-th to-be-tested component in the process of insertion test in the i-th slot.

[0203] It should be noted that the specific execution process of this step “performing insertion test on the i-th to-be-tested component in the i-th slot according to the i-th test insertion force” can refer to the specific execution process of step S504; the specific execution process of this step “detecting the i-th maximum insertion force generated by the i-th to-be-tested component in the process of insertion test in the i-th slot” can refer to the specific execution process of step S604, which will not be repeated here.

[0204] S709, determine whether the i-th maximum insertion force is greater than the i-th test insertion force.

[0205] If yes, step S710 is performed;

[0206] If no, step S711 is performed.

[0207] S710, determining whether the ith to-be-tested component can be normally recognized.

[0208] If yes, step S711 is performed;

[0209] If no, step S714 is performed.

[0210] It should be noted that the specific execution process of this step can refer to the specific execution process of step S606, which will not be described here.

[0211] S711, updating the ith target model according to the ith weight and the ith maximum insertion and extraction force, to obtain an ith+1 target model.

[0212] It should be noted that the specific execution process of this step can refer to the specific execution process of step S607, which will not be described here.

[0213] S712, determining whether i is less than N.

[0214] If yes, step S713 is performed;

[0215] If no, step S714 is performed.

[0216] S713, updating i to i+1.

[0217] After step S713 is performed, step S704 can be returned to be performed.

[0218] S714, ending the insertion and extraction test of the to-be-tested board card.

[0219] The test method provided by the embodiment of the present application can sequentially perform insertion and extraction tests on multiple slots on a to-be-tested board card, and in the process of the insertion and extraction test, the target model corresponding to the insertion and extraction test of the previous slot can be dynamically optimized based on the weight and the maximum insertion and extraction force of the to-be-tested component obtained in the process of the insertion and extraction test of the previous slot, so that in the process of the insertion and extraction test of the to-be-tested board card, the target model corresponding to the to-be-tested component of the same component model can be iteratively updated to guarantee the prediction accuracy of the target model; and based on the optimized target model, the test insertion and extraction force in the process of the insertion and extraction test of the next slot can be dynamically adjusted, so that in the process of the insertion and extraction test of the to-be-tested component of the next slot, the test insertion and extraction force can be more accurately determined based on the updated target model, to further reduce the damage rate of the to-be-tested component in the subsequent insertion and extraction test and reduce the loss of the to-be-tested component.

[0220] Through the description of the above embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be realized by means of software on a general hardware platform as necessary, and of course can also be realized by hardware, but in many cases the former is a better embodiment.

[0221] Figure 8 A structural schematic diagram of a test device provided by the embodiments of the present application is shown in FIG. 1. As shown in FIG. 1, the embodiments of the present application also provide a test device 800 applied to the test equipment described above, which comprises an acquisition module 801 and a processing module 802. Figure 8

[0222] The acquisition module 801 is configured to acquire a board card model of a to-be-tested board card, and the to-be-tested board card is provided with a first slot, and the first slot is configured to insert a first to-be-tested component;

[0223] The acquisition module 801 is further configured to acquire a component model and a first weight of the first to-be-tested component;

[0224] The processing module 802 is configured to acquire a first target model corresponding to the first to-be-tested component from a model standard library according to the board card model and the component model, and the model standard library comprises a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model;

[0225] The processing module 802 is further configured to determine a first test plugging force corresponding to the first to-be-tested component by the first target model according to the first weight;

[0226] The processing module 802 is further configured to perform plugging test on the first to-be-tested component in the first slot according to the first test plugging force.

[0227] In some embodiments, the processing module 802 is further configured to:

[0228] detect a first maximum plugging force generated by the first to-be-tested component during the plugging test in the first slot;

[0229] if one of the following conditions is met: the first maximum plugging force is less than or equal to the first test plugging force, or the first maximum plugging force is greater than the first test plugging force and the first to-be-tested component can be normally recognized, then the first target model is updated according to the first weight and the first maximum plugging force to obtain a second target model.

[0230] In some embodiments, after obtaining the second target model, the processing module 802 is further configured to:

[0231] determine whether a plugging test number of the first to-be-tested component is less than a maximum test number corresponding to the first to-be-tested component;

[0232] ​In a case where the number of plug-in tests is less than the maximum number of tests, the second test plug-in force corresponding to the first to-be-tested component is determined according to the first weight and the second target model, and the first to-be-tested component is tested in the first slot according to the second test plug-in force.

[0233] In some embodiments, the to-be-tested board card further has a second slot for inserting a second to-be-tested component, the second to-be-tested component having the same component model as the first to-be-tested component.

[0234] The obtaining module 801 is further configured to obtain a second weight of the second to-be-tested component.

[0235] The processing module 802 is further configured to determine a third test plug-in force corresponding to the second to-be-tested component according to the second weight and the second target model, and test the second to-be-tested component in the second slot according to the third test plug-in force.

[0236] In some embodiments, the obtaining module 801 is further configured to obtain a test configuration file, the test configuration file being used to indicate the plug-in test of the to-be-tested board card.

[0237] The processing module 802 is further configured to determine the board card model according to the test configuration file, and determine the component model and the first weight of the first to-be-tested component according to the test configuration file.

[0238] In some embodiments, the obtaining module 801 is further configured to obtain historical plug-in test data of the first to-be-tested component, the historical plug-in test data including the number of plug-in tests of the first to-be-tested component and the corresponding plug-in force in each plug-in test process of the first to-be-tested component.

[0239] The processing module 802 is further configured to establish a mapping relationship between the plug-in force and the number of plug-in tests of the first to-be-tested component according to the historical plug-in test data.

[0240] In some embodiments, the processing module 802 is further configured to:

[0241] If the first to-be-tested component cannot be inserted into the first slot according to the first test plug-in force, the sum of the first test plug-in force and a preset plug-in force is determined as the first adjusted plug-in force corresponding to the first to-be-tested component.

[0242] If the first to-be-tested component still cannot be inserted into the first slot according to the first adjusted plug-in force, the sum of the i-th adjusted plug-in force and the preset plug-in force is determined as the i+1-th adjusted plug-in force.

[0243] Wherein, i takes 1, 2, …, until the i+1 adjustment plug force is less than the plug force threshold, and the first test component is inserted into the first slot according to the i+1 adjustment plug force, then the first test component is inserted into the first slot according to the i+1 adjustment plug force; or, until the i+1 adjustment plug force is greater than or equal to the plug force threshold and still cannot insert the first test component into the first slot, end the plug test of the first test component.

[0244] In some embodiments, in the case that the first target model corresponding to the first test component is not queried in the model standard library, the processing module 802 is further configured to:

[0245] According to the component model corresponding to the first test component, the first test plug force corresponding to the first test component is determined in the plug force standard library, wherein the plug force standard library comprises a plurality of component models and test plug forces corresponding to each component model.

[0246] In some embodiments, the acquisition module 801 is further configured to acquire historical test data of a plurality of test board cards, wherein the historical test data of each test board card comprises a board card model and slot information of each test board card, and plug test data corresponding to the slot on each test board card, and the plug test data comprises a component model of a test component inserted in the slot and a model corresponding to the component model.

[0247] The processing module 802 is further configured to determine the model standard library according to the historical test data of the plurality of test board cards.

[0248] The features of the embodiments corresponding to the test device can be referred to the related description of the embodiments corresponding to the test method, which will not be repeated here.

[0249] In the above embodiments, it should be understood that the processor can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc. The steps of the method disclosed in the application can be directly embodied as hardware processor execution, or executed by a combination of hardware and software modules in the processor.

[0250] The memory can include a random access memory (RAM) and can also include a non-volatile memory (NVM), such as at least one disk memory.

[0251] The bus can be an industry standard architecture (ISA) bus, a peripheral component (PCI) bus, an extended industry standard architecture (EISA) bus, or the like. The bus can be divided into an address bus, a data bus, a control bus, and the like. For ease of representation, the bus in the present application does not limit to only one bus or one type of bus.

[0252] Embodiments of the present application also provide a computer readable storage medium, which stores a computer program, wherein the computer program is configured to execute the steps in any of the above test method embodiments when running.

[0253] In an example embodiment, the above computer readable storage medium can include, but is not limited to, a U disk, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk, and various media that can store computer programs.

[0254] Embodiments of the present application also provide a computer program product, which includes a computer program, and the computer program is executed by a processor to implement the steps in any of the above test method embodiments.

[0255] Embodiments of the present application also provide another computer program product, which includes a non-volatile computer readable storage medium, and the non-volatile computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps in any of the above test method embodiments.

[0256] Those skilled in the art will further realize that the mere conception of the examples described herein is sufficient to enable practitioners to practice the examples as further described below. Therefore, many modifications and adaptations will be apparent to those skilled in the art (e.g., variations in sizes, dimensions, structures, materials, and / or use of the or aspects of the examples described herein to provide a device or an arrangement other than that specifically described herein). Therefore, the scope of the disclosure is not intended to be limited to the above-described examples; rather, they are meant to cover all suitable structures, methods, and / or uses falling within the scope of the disclosure as further described herein and as defined by the claims. As used herein, the term "exemplary" is used interchangeably with "for illustration," "for convenience," and "for the purpose of example," and is not used to imply "ideal" or "preferred."

[0257] The above has carried on the detailed introduction to the test method and the equipment provided by the application. The principle and the implementation of the application are described by applying the specific examples in this paper. The above example description is only applicable to help understanding the method and the core idea of the application. It should be pointed out that for the ordinary skilled in the art, some improvements and modifications can be made to the application without departing from the principle of the application. These improvements and modifications also fall within the protection scope of the claims of the application.

Claims

1. A test method characterized by, Applied to a test device, the method comprises: obtaining a board card model of a to-be-tested board card, the to-be-tested board card being provided with a first slot, the first slot being used for inserting a first to-be-tested component; obtaining a component model and a first weight of the first to-be-tested component, and querying a first target model corresponding to the first to-be-tested component in a model standard library according to the board card model and the component model, the model standard library comprising a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model; determining a first test plugging force corresponding to the first to-be-tested component through the first target model according to the first weight; performing plugging test on the first to-be-tested component in the first slot according to the first test plugging force.

2. The method of claim 1, wherein, The method further comprises: detecting a first maximum plugging force generated by the first to-be-tested component during plugging test in the first slot; if one of the following conditions is met: the first maximum plugging force is less than or equal to the first test plugging force, or the first maximum plugging force is greater than the first test plugging force and the first to-be-tested component can be normally recognized, updating the first target model to obtain a second target model according to the first weight and the first maximum plugging force.

3. The method of claim 2, wherein, After obtaining the second target model, the method further comprises: determining whether a plugging test number of the first to-be-tested component is less than a maximum test number corresponding to the first to-be-tested component; in a case where the plugging test number is less than the maximum test number, determining a second test plugging force corresponding to the first to-be-tested component through the second target model according to the first weight, and performing plugging test on the first to-be-tested component in the first slot according to the second test plugging force.

4. The method of claim 2, wherein, The to-be-tested board card is further provided with a second slot, the second slot being used for inserting a second to-be-tested component, the second to-be-tested component having the same component model as the first to-be-tested component; the method further comprises: obtaining a second weight of the second to-be-tested component; determining a third test plugging force corresponding to the second to-be-tested component through the second target model according to the second weight; performing plugging test on the second to-be-tested component in the second slot according to the third test plugging force.

5. The method according to any one of claims 1 to 4, characterized in that, The method further comprises: obtaining a test configuration file, the test configuration file being used for instructing plugging test on the to-be-tested board card; obtaining a board card model of a to-be-tested board card, the to-be-tested board card being provided with a first slot, the first slot being used for inserting a first to-be-tested component; determining the board card model according to the test configuration file; obtaining a component model and a first weight of the first to-be-tested component, the method further comprising: determining the component model and the first weight of the first to-be-tested component according to the test configuration file.

6. The method according to any one of claims 1 to 4, characterized in that, The method further comprises: obtaining historical plugging test data of the first to-be-tested component, the historical plugging test data comprising a plugging test number of the first to-be-tested component and a corresponding plugging force in each plugging test process of the first to-be-tested component; According to the historical plug-in test data, a mapping relationship between a plug-in force corresponding to the first component to be tested and a plug-in test number is established.

7. The method according to any one of claims 1 to 4, characterized in that, The method further comprises: If the first component to be tested cannot be inserted into the first slot according to the first test plug-in force, a sum of the first test plug-in force and a preset plug-in force is determined as a first adjusted plug-in force corresponding to the first component to be tested; If the first component to be tested still cannot be inserted into the first slot according to the first adjusted plug-in force, a sum of an i-th adjusted plug-in force and the preset plug-in force is determined as an (i+1)-th adjusted plug-in force; wherein the i is sequentially taken as 1, 2, …, until the (i+1)-th adjusted plug-in force is less than a plug-in force threshold and the first component to be tested is inserted into the first slot according to the (i+1)-th adjusted plug-in force, plug-in test is performed on the first component to be tested in the first slot according to the (i+1)-th adjusted plug-in force; or until the (i+1)-th adjusted plug-in force is greater than or equal to the plug-in force threshold and the first component to be tested still cannot be inserted into the first slot, plug-in test on the first component to be tested is ended.

8. The method according to any one of claims 1 to 4, characterized in that, In a case where the first target model corresponding to the first component to be tested is not queried in the model standard library, the method further comprises: determining a first test plug-in force corresponding to the first component to be tested in a plug-in force standard library according to a component model corresponding to the first component to be tested, wherein the plug-in force standard library comprises a plurality of component models and a test plug-in force corresponding to each component model.

9. The method according to any one of claims 1 to 4, characterized in that, The method further comprises: obtaining historical test data of a plurality of board cards to be tested, the historical test data of each board card to be tested comprising a board card model and slot information of each board card to be tested, and plug-in test data corresponding to a slot on each board card to be tested, the plug-in test data comprising a component model of a component to be tested inserted in the slot and a model corresponding to the component model; determining the model standard library according to the historical test data of the plurality of board cards to be tested.

10. A test apparatus, characterized by, The test device is provided with a detection module and a processing module, the detection module is used to connect with a board card to be tested, the board card to be tested is provided with a first slot, and the first slot is used to insert a first component to be tested; wherein, the processing module is used to obtain a board card model of the board card to be tested, a component model and a first weight of the first component to be tested, query a first target model corresponding to the first component to be tested in a model standard library according to the board card model and the component model, and determine a first test plug-in force corresponding to the first component to be tested through the first target model according to the first weight, the model standard library comprises a plurality of board card models, at least one component model corresponding to each board card model, and a model corresponding to each component model; the detection module is used to perform plug-in test on the first component to be tested in the first slot according to the first test plug-in force.

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