Method and apparatus for testing thermoelectric devices

Abstract

The application discloses a testing method and a testing device for thermoelectric devices. The method comprises the following steps: sending a temperature setting instruction to a black body and a temperature control component according to temperature setting information in a test script to set a temperature parameter, sending a distance setting instruction to a displacement component to set a distance parameter and a rotation angle, obtaining a detection value measured by a collection component, sending a moving instruction to the displacement component to push a thermoelectric pile to a position not irradiated by the black body, and repeating the above measurement process if the test script contains next group temperature setting information; and processing a plurality of obtained detection values according to a data processing rule to obtain a test result. The above method is applied in the testing device to test a precision sensor such as a thermoelectric pile, can realize integrated and automatic performance testing of the thermoelectric pile device, and can adapt to different types of test scripts to perform different performance tests.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of sensor testing, in particular to a testing method and testing device of a thermoelectric device. BACKGROUND

[0002] Precise sensors such as thermoelectric devices need to be tested for performance before use. The traditional technical method is usually to measure data artificially through blackbody radiation, which leads to scattered test data, low test efficiency, large artificial error, and difficulty in efficient testing and obtaining accurate test results. Therefore, the existing technical method has the problem of low test efficiency when testing the thermoelectric device. SUMMARY

[0003] The embodiments of the present application provide a testing method and testing device of a thermoelectric device, aiming at solving the problem of low test efficiency when testing the thermoelectric device in the prior art.

[0004] In a first aspect, the embodiments of the present application provide a testing method of a thermoelectric device, which is applied to a controller of a testing device of the thermoelectric device, the testing device of the thermoelectric device further comprising a displacement assembly, a temperature control assembly, a blackbody, an acquisition assembly, a jig temperature sensor and a water tank temperature sensor in communication connection with the controller; the temperature control assembly comprises a water-cooled jig and a constant-temperature water tank, the water-cooled jig is arranged on the displacement assembly, the thermoelectric pile and the jig temperature sensor are both arranged in the water-cooled jig, the water-cooled jig and the constant-temperature water tank are connected through a pipeline to form a cooling water circulation, the water tank temperature sensor is arranged in the constant-temperature water tank, the acquisition assembly is electrically connected with sensing pins of the thermoelectric pile, and the method comprises:

[0005] sending a temperature setting instruction to the blackbody and the temperature control assembly according to a group of temperature setting information in a preset test script to set temperature parameters;

[0006] sending a distance setting instruction to the displacement assembly to set distance parameters between the thermoelectric pile and the blackbody and a rotation angle of the thermoelectric pile;

[0007] obtaining a group of detection values measured by the acquisition assembly on the thermoelectric pile; the detection values include current detection values and voltage detection values corresponding to at least one rotation angle of the thermoelectric pile respectively;

[0008] sending a moving instruction to the displacement assembly to push the thermoelectric pile to a position not irradiated by the blackbody;

[0009] If the next set of temperature setting information is contained in the test script, a temperature setting instruction corresponding to the temperature setting information is generated and the step of sending the temperature setting instruction to the black body and the temperature control assembly to set the temperature parameter is returned to be executed;

[0010] If the next set of temperature setting information is not contained in the test script, the obtained multiple sets of detection values are processed according to the data processing rule corresponding to the test script to obtain the corresponding test result.

[0011] In a second aspect, the embodiment of the present application further provides a test device for thermoelectric devices, wherein the controller in the test device for thermoelectric devices applies the test method for thermoelectric devices as described in the first aspect above, and the test device for thermoelectric devices further comprises a displacement assembly, a temperature control assembly, a black body, an acquisition assembly, a jig temperature sensor and a water tank temperature sensor which are in communication connection with the controller; the temperature control assembly comprises a water-cooled jig and a constant-temperature water tank, the water-cooled jig is arranged on the displacement assembly, the thermoelectric pile and the jig temperature sensor are both arranged in the water-cooled jig, the water-cooled jig and the constant-temperature water tank are connected through a pipeline to form a cooling water circulation, the water tank temperature sensor is arranged in the constant-temperature water tank, and the acquisition assembly is electrically connected with the sensing pin of the thermoelectric pile.

[0012] The embodiment of the present application provides a test method and a test device for thermoelectric devices, and the method comprises the following steps: sending a temperature setting instruction to a black body and a temperature control assembly according to temperature setting information in a test script to set a temperature parameter, sending a distance setting instruction to a displacement assembly to set a distance parameter and a rotation angle, obtaining detection values measured by an acquisition assembly, sending a moving instruction to the displacement assembly to push a thermoelectric pile to a position not irradiated by the black body, and repeating the above measurement process if the test script contains the next set of temperature setting information; and processing multiple sets of detection values obtained according to a data processing rule to obtain a test result. The above method is applied in a test device to test a thermoelectric pile and other precision sensors, can realize integrated and automated performance testing of thermoelectric pile devices, and can adapt to different types of test scripts to perform different performance tests. BRIEF DESCRIPTION OF DRAWINGS

[0013] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0014] Figure 1 The method flowchart of the test method for thermoelectric devices provided by the embodiment of the present application;

[0015] Figure 2 The application scenario diagram of the test method of the thermoelectric device provided by the embodiment of the present application is shown in the figure.

[0016] Figure 3 The partial structural diagram of the test device of the thermoelectric device provided by the embodiment of the present application is shown in the figure.

[0017] Figure 4 Another partial structural diagram of the test device of the thermoelectric device provided by the embodiment of the present application is shown in the figure.

[0018] Figure 5 The schematic block diagram of the computer equipment provided by the embodiment of the present application is shown in the figure.

[0019] Reference signs: 50, controller; 10, displacement assembly; 20, temperature control assembly; 30, black body; 40, acquisition assembly; 211, jig temperature sensor; 221, water tank temperature sensor; 21, water-cooled jig; 22, constant-temperature water tank; 23, pipeline; 51, thermoelectric pile; 11, first translation table; 12, first rotary table; 13, second translation table; 14, third translation table; 15, second rotary table; 16, first adapter plate; 17, second adapter plate; 31, first black body; 32, second black body; 33, third black body. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0021] It should be understood that, when used in the specification and the appended claims, the terms “comprise” and “include” indicate the presence of described features, integers, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0022] It should also be understood that the terms used in the present application specification are only for the purpose of describing specific embodiments and are not intended to limit the present application. As used in the present application specification and the appended claims, unless otherwise clearly indicated by the context, the singular forms “a”, “an” and “the” are intended to include the plural forms.

[0023] It should be further understood that the term “and / or” used in the present application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0024] Referring to Figure 1 As shown, the embodiment of the present application provides a testing method of thermoelectric device, which is applied to a controller of a testing device of thermoelectric device, and is executed by application software installed in the controller. The specific application scenario is shown in Figure 2 The testing device of thermoelectric device further comprises a displacement assembly 10, a temperature control assembly 20, a black body 30, an acquisition assembly 40, a jig temperature sensor 211 and a water tank temperature sensor 221, which are in communication connection with the controller 50. The controller 50 is a device with instruction transceiving and data processing, such as an MCU chip. The controller 50 can send the test results to an external display device to visually display the relevant data information obtained by the test through the external display device. The controller 50 can also be a terminal device integrated with an MCU chip and a display, such as a desktop computer, a notebook computer, a tablet computer or a mobile phone, etc. The controller 50 can directly visually display the test results after obtaining the test results. The displacement assembly 10 is used to push the thermoelectric pile 51 to rotate and move, so as to control the distance and orientation of the thermoelectric pile 51 relative to the black body 30. The temperature control assembly 20 is used to control the ambient temperature around the thermoelectric pile 51, so as to maintain a constant temperature around the thermoelectric pile 51, thereby improving the accuracy of the test results. The temperature control assembly 20 comprises a water-cooled jig 21 and a constant-temperature water tank 22. The water-cooled jig 21 is used to place the thermoelectric pile 51 to control the ambient temperature of the thermoelectric pile 51. The constant-temperature water tank 22 is used for water-cooled heat dissipation temperature control. The jig temperature sensor 211 is arranged in the water-cooled jig 21, and the water tank temperature sensor 221 is arranged in the constant-temperature water tank 22. The jig temperature sensor 211 and the water tank temperature sensor 221 are respectively used for temperature detection. The water tank temperature sensor 221 can be a PTC (Positive Temperature Coefficient) device or a high-precision thermocouple. The acquisition assembly 40 is used to acquire the current signal and the voltage signal obtained by detection. The acquisition assembly 40 comprises a high-precision multimeter (for analog devices) or a data acquisition board (for digital devices).

[0025] As Figure 1 shown, the method comprises steps S110-S160.

[0026] S110, according to a set of temperature setting information in the preset test script, a temperature setting instruction is sent to the black body and the temperature control assembly to set the temperature parameters.

[0027] The tester can start the test script in the controller, one or more test scripts are configured for each performance test, and the test script is a system software program developed for performance testing. A set or multiple sets of temperature setting information can be set in the test script, the temperature setting information is used for temperature setting, the temperature setting information can correspond to generate temperature setting instructions, and the temperature setting instructions are used for temperature parameter setting of the black body and the temperature control assembly. The black body and the temperature control assembly receive the temperature setting instructions and adjust the temperature to meet the temperature requirements of the test.

[0028] A set of temperature setting information includes a target temperature and an environment temperature, the black body receives the temperature setting instructions corresponding to the target temperature, and the temperature of the black body is set to the target temperature; the water cooling jig and the constant temperature water tank receive the temperature setting instructions corresponding to the environment temperature, and the temperature of the water cooling jig and the constant temperature water tank is set to the environment temperature.

[0029] In specific embodiments, after step S110, the method further includes steps of: determining whether the temperature of the black body reaches the target temperature in the temperature setting instructions; determining whether the temperature values detected by the jig temperature sensor and the water tank temperature sensor both reach the environment temperature in the temperature setting instructions; and if the temperature of the black body reaches the target temperature and the detected temperature values both reach the environment temperature, executing the step of sending the distance setting instructions to the displacement assembly.

[0030] Specifically, after sending the temperature setting instructions, it can be determined whether the temperature values detected by the jig temperature sensor and the water tank temperature sensor both reach the environment temperature in the temperature setting instructions. For example, if the environment temperature is set to 25°C, it can be determined whether the temperature values detected by the two temperature sensors are both 25°C. Further, it can be determined whether the temperature of the black body reaches the target temperature in the temperature setting instructions. For example, if the target temperature is 200°C, it can be determined whether the temperature of the black body reaches 200°C.

[0031] If the temperature of the black body reaches the target temperature and the temperature values detected by the two temperature sensors both reach the environment temperature, the subsequent step S120 is continued. If the temperature of the black body does not reach the target temperature, or the temperature value detected by any one of the temperature sensors does not reach the environment temperature, a period of time is waited, and the above temperature determination process is executed again until the temperature satisfies the corresponding determination condition, and then the subsequent step S120 is continued.

[0032] S120, sending distance setting instructions to the displacement assembly to set the distance parameter between the thermoelectric pile and the black body and the rotation angle of the thermoelectric pile.

[0033] Further send the distance setting instruction to the displacement component, and the displacement component adjusts the distance between the thermoelectric pile and the black body to correspond to the distance parameter after receiving the distance setting instruction.

[0034] S130, obtain a group of detection values measured by the acquisition component on the thermoelectric pile.

[0035] A group of detection values can be obtained by measuring the thermoelectric pile by the acquisition component. During the process of measuring a group of detection values, the rotation angle of the thermoelectric pile can also be adjusted continuously, and each rotation angle corresponds to the current detection value and the voltage detection value measured respectively. The obtained group of detection values includes the current detection value and the voltage detection value corresponding to at least one rotation angle of the thermoelectric pile.

[0036] S140, send a moving instruction to the displacement component to push the thermoelectric pile to a position not illuminated by the black body.

[0037] Send the moving instruction to the displacement component, so as to push the thermoelectric pile to a position not illuminated by the black body through the displacement component.

[0038] S150, if the test script contains the next group of temperature setting information, generate a temperature setting instruction corresponding to the temperature setting information and return to execute the step of sending the temperature setting instruction to the black body and the temperature control component to set the temperature parameter.

[0039] Determine whether the test script contains the next group of temperature setting information. If the test script contains the next group of temperature setting information, generate a temperature setting instruction corresponding to the temperature setting information, and return to execute step S110.

[0040] S160, if the test script does not contain the next group of temperature setting information, process the obtained multiple groups of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result.

[0041] If there is no next group of temperature setting information, process the obtained multiple groups of detection values according to the data processing rule corresponding to the test script, so as to obtain the corresponding test result.

[0042] In a specific embodiment, before processing the multiple sets of detection values ​​obtained according to the data processing rules corresponding to the test script, the method further includes: determining whether the temperature of the blackbody, the temperature value detected by the fixture temperature sensor and the water tank temperature sensor have all reached the preset initial temperature value; if the temperature of the blackbody, the temperature value detected by the fixture temperature sensor and the water tank temperature sensor have all reached the initial temperature value, sending a shutdown command to the blackbody and the temperature control component.

[0043] Before processing the multiple sets of detection values ​​obtained according to the data processing rules, it is also possible to determine whether the temperature values ​​detected by the temperature sensor of the blackbody temperature fixture and the water tank temperature sensor have reached the preset initial temperature value (such as 25°C). If they have all reached the initial temperature value, a shutdown command is sent to the blackbody and the temperature control component to shut down the blackbody and the temperature control component (the power supply to the blackbody and the temperature control component is disconnected by the shutdown command).

[0044] In one specific embodiment, the test script is a voltage-temperature relationship test script; the step of processing the acquired multiple sets of detection values ​​according to the data processing rules corresponding to the test script to obtain the corresponding test results includes: calculating the average value of the voltage detection values ​​in each set of detection values ​​as the output voltage corresponding to each target temperature; each set of detection values ​​includes the current detection value and voltage detection value corresponding to the thermopile at a rotation angle; performing nonlinear fitting on multiple pairs of data corresponding to the target temperature and the output voltage to obtain the corresponding fitting curve; calculating the corresponding voltage value by taking the ambient temperature and the target temperature as dependent variables based on the fitting curve; subtracting the corresponding isothermal output voltage from each voltage value to obtain a voltage-temperature relationship table after correction of deviation as the corresponding test result; the isothermal output voltage is the output voltage when the ambient temperature and the target temperature are equal to the voltage value.

[0045] Example 1:

[0046] The blackbody includes a first blackbody, a second blackbody, and a third blackbody. Initially, the first blackbody, the second blackbody, and the third blackbody are all set to 25°C.

[0047] S1. The controller reads the current position information of the displacement component and determines whether the position information is at the initial position (the initial position is the position where the thermopile is not irradiated by the blackbody). If it is not at the initial position, the controller sends a position adjustment command to the displacement component to control the displacement component to adjust the thermopile to the initial position.

[0048] S2. Execute the voltage-temperature relationship test script and send a temperature setting command to the blackbody, setting the temperature of the blackbody to the target temperature;

[0049] S3. Send a temperature setting command to the temperature control component to set the constant temperature water bath to the ambient temperature.

[0050] S4, judging whether the temperature of the blackbody reaches the target temperature set above, if not, continuing to wait and then judging again;

[0051] S5, if yes, obtaining the temperature value of the water tank temperature sensor and judging whether it reaches the ambient temperature set above, if not, continuing to wait and then judging again;

[0052] S6, if yes, obtaining the temperature value of the jig temperature sensor and judging whether it reaches the ambient temperature set above, if not, fine-tuning the temperature value set for the constant-temperature water tank and repeating step S5 until the temperature value of the jig temperature sensor reaches the ambient temperature set in the current set of temperature setting information;

[0053] S7, sending a distance setting instruction to the displacement component to push the thermoelectric pile to the measurement position, ensuring that the thermoelectric pile at the measurement position is aligned with the center of the blackbody radiation surface, and the distance between the thermoelectric pile and the third blackbody is equal to the set measurement distance;

[0054] S8, collecting a set of detection values obtained by the thermoelectric pile measured by the collection component. Repeat collecting multiple voltage detection values and current detection values as a set of detection values;

[0055] S9, pushing the thermoelectric pile to the initial position to avoid the thermoelectric pile from being heated by irradiation; if there is the next set of temperature setting information in the voltage-temperature relationship test script, sending a new temperature setting instruction to the blackbody and the temperature control component based on the temperature setting information, and repeating steps S4-S9;

[0056] S10, after completing all data collection, setting the temperature of the blackbody to 25℃ and the temperature of the constant-temperature water tank to 25℃, waiting for the temperatures of the blackbody and the constant-temperature water tank to reach 25℃, and turning off the blackbody and the constant-temperature water tank.

[0057] The multiple sets of detection values obtained are processed by a data processing rule. First, abnormal voltage detection values in the detection values are removed according to an outlier exclusion strategy. For example, the voltage mean corresponding to the voltage detection values in the detection values is obtained, and the standard deviation corresponding to the voltage mean is further calculated. According to the standard deviation and the voltage mean, the voltage confidence interval is determined. The voltage detection values within the voltage confidence interval are excluded.

[0058] Since the rotation angle of the thermoelectric element is not adjusted in the above embodiment, each group of detection values corresponds to a group of temperature setting information in the voltage-temperature relationship test script; a group of temperature setting information includes a target temperature and an ambient temperature, and the voltage-temperature relationship test only needs to set a plurality of different target temperatures, and one target temperature corresponds to one group of detection values. The temperature setting range of the first black body is-40℃-80℃, and the temperature setting range of the second black body is 25℃-500℃, so as to cover the test range of the voltage-temperature relationship (VT) test. The temperature setting range of the third black body is 25℃-300℃.

[0059] The average value of the remaining voltage detection values of each group of detection values after excluding the abnormal voltage detection values is calculated as the output voltage corresponding to each target temperature. One target temperature corresponds to one output voltage, and one target temperature and one output voltage form a pair of data. Then, the obtained multiple pairs of data can be subjected to nonlinear fitting to obtain a corresponding fitting curve. Using the obtained fitting curve, the ambient temperature and the target temperature in each group of temperature setting information are used as dependent variables to calculate the corresponding voltage values; the obtained voltage values are subtracted by the corresponding isothermal output voltage to obtain the voltage values after correction deviation, and the corresponding relationship between the corrected voltage values and the target temperature can constitute a voltage-temperature relationship table, which is used as the corresponding test result. The isothermal output voltage corresponding to the voltage value is the output voltage when the ambient temperature and the target temperature corresponding to the voltage value in the fitting curve are equal.

[0060] In another specific embodiment, the test script is a field of view angle test script; and the processing of the obtained multiple groups of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result comprises: calculating the average value of the voltage detection values with the same rotation angle in each group of detection values as the output voltage corresponding to each rotation angle; each group of detection values includes current detection values and voltage detection values corresponding to multiple rotation angles of the thermoelectric element; performing nonlinear fitting on multiple pairs of data corresponding to the rotation angle and the output voltage to obtain a corresponding fitting curve; obtaining the voltage highest point in the fitting curve as the center point of the field of view angle; according to the voltage ratio in the field of view angle test script and the voltage value of the center point of the field of view angle, obtaining the clockwise angle point and the counterclockwise angle point in the fitting curve corresponding to the voltage ratio; calculating the angle between the angle points corresponding to each voltage ratio to obtain the field of view angle of each voltage ratio as the corresponding test result.

[0061] Embodiment 2:

[0062] When the test script is a field of view angle test script, the voltage value output by the thermoelectric element in the rotation angle range of 90° clockwise to 90° counterclockwise needs to be collected.

[0063] S1, the controller reads the current position information of the displacement assembly, and determines whether the position information is located at an initial position (the initial position is a position where the thermoelectric element is not irradiated by the black body); if not, a position adjustment instruction is sent to the displacement assembly to control the displacement assembly to adjust the thermoelectric element to the initial position;

[0064] S2, a voltage-temperature relationship test script is executed, and a temperature setting instruction is sent to the black body to set the temperature of the black body to a target temperature (the target temperature for executing the field of view angle test by default is 200°C);

[0065] S3, a temperature setting instruction is sent to the temperature control assembly to set the constant temperature water tank to an ambient temperature (the ambient temperature for executing the field of view angle test by default is 25°C);

[0066] S4, it is determined whether the temperature of the black body reaches the above-mentioned set target temperature, if not, it continues to wait and then determines again;

[0067] S5, if it reaches, the temperature value of the water tank temperature sensor is obtained and it is determined whether it reaches the above-mentioned set ambient temperature, if not, it continues to wait and then determines again;

[0068] S6, if it reaches, the temperature value of the jig temperature sensor is obtained, and it is determined whether the temperature value reaches the above-mentioned set ambient temperature, if it does not reach the set ambient temperature, the temperature value set by the constant temperature water tank is fine-tuned and step S5 is repeatedly executed until the temperature value of the jig temperature sensor reaches the ambient temperature set in the current set of temperature setting information;

[0069] S7, a distance setting instruction is sent to the displacement assembly to push the thermoelectric element to a measurement position, to ensure that the thermoelectric element at the measurement position is aligned with the center of the black body radiation surface, the second rotating table is placed at the 0° position (the rotating angle of the thermoelectric element is 0°), and the distance between the thermoelectric element and the third black body is equal to the set measurement distance (the measurement distance for executing the field of view angle test by default is greater than 1 meter);

[0070] S8, a set of detection values obtained by the acquisition assembly measuring the thermoelectric element;

[0071] S9, the second rotating table in the displacement assembly is controlled by the displacement assembly to rotate clockwise by 0.5° (the rotating angle of the thermoelectric element corresponds to rotating clockwise by 0.5°);

[0072] S10, a set of detection values obtained by the acquisition assembly measuring the thermoelectric element again;

[0073] S11, it is determined whether the data acquisition in the clockwise direction is completed, if not, steps S9-S10 are repeatedly executed;

[0074] S12. Send a position reset command to the displacement component to control the displacement component to push the thermopile to the measurement position, ensuring that the thermopile at the measurement position is aligned with the center of the radiation surface of the third blackbody and the second rotary table is placed at 0°.

[0075] S13. Control the second rotary table in the displacement component to rotate counterclockwise by 0.5° through the displacement component;

[0076] S14. A set of detection values ​​obtained by the acquisition component measuring the thermopile again;

[0077] S15. Determine whether the counterclockwise data acquisition is complete. If not, repeat steps S13-S14.

[0078] S16. After completing all data acquisition, set the temperature of the blackbody to 25℃ and the temperature of the constant temperature water bath to 25℃. Wait for the temperatures of the blackbody and the constant temperature water bath to reach 25℃, then turn off the blackbody and the constant temperature water bath.

[0079] The data processing rules are used to process the multiple sets of detection values. First, abnormal voltage detection values ​​are removed from the detection values ​​according to the outlier exclusion strategy. For example, the average voltage value corresponding to the voltage detection value is obtained, and the standard deviation corresponding to the average voltage value is further calculated. The corresponding voltage confidence interval is determined based on the standard deviation and the average voltage value. Voltage detection values ​​that are located within the voltage confidence interval are excluded.

[0080] The average value of voltage detection values ​​with the same rotation angle is calculated in each group of detection values. Since one rotation angle corresponds to multiple voltage detection values, the average value of these multiple voltage detection values ​​corresponding to the same rotation angle can be calculated to obtain the output voltage corresponding to each rotation angle. A rotation angle and an output voltage are combined into a data pair. Multiple data pairs can then be nonlinearly fitted to obtain the corresponding fitting curve. The point of highest voltage in the fitting curve (which is also the center point of the curve) is taken as the corresponding center point of the field of view. Furthermore,

[0081] Based on the voltage ratio in the field of view test script and the voltage value at the center point of the field of view, obtain the clockwise and counterclockwise angle points in the fitted curve corresponding to the voltage ratio; for example, if the voltage ratio is 50% and 90%, then the voltage value V at the center point of the field of view is used. z To achieve 100%, obtain 50% V respectively. z and 90% V z The corresponding clockwise and counterclockwise angle points.

[0082] Calculate the angles between the angle points corresponding to each voltage ratio, and obtain the corresponding field of view as the test result. For example, 50%V can be calculated.z the angle between the corresponding two angle points (the clockwise angle point and the counterclockwise angle point); obtain the field of view angle at 50% signal intensity and the angle between the corresponding two angle points (the clockwise angle point and the counterclockwise angle point) at 90% V z the angle between the corresponding two angle points (the clockwise angle point and the counterclockwise angle point); obtain the field of view angle at 50% signal intensity and the angle between the corresponding two angle points (the clockwise angle point and the counterclockwise angle point) at 90% V z the field of view angle at 50% signal intensity and the angle between the corresponding two angle points (the clockwise angle point and the counterclockwise angle point) at 90% V, and take the two obtained field of view angles (FOV angle values) as the corresponding test results.

[0083] In the above embodiments, before the average value of the voltage detection values in each group of detection values is calculated as the output voltage corresponding to each target temperature, or before the average value of the voltage detection values with the same rotation angle in each group of detection values is calculated, the abnormal voltage detection values in the detection values are removed according to a preset abnormal value exclusion strategy.

[0084] Before the obtained detection values are actually processed, the abnormal voltage detection values in the detection values can also be removed, and the specific processing process is described in detail in Embodiments 1 and 2 above, which will not be repeated here.

[0085] In another specific embodiment, the test script is a resistance temperature coefficient test script, and the processing of the obtained multiple groups of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result includes: calculating first and second resistance values corresponding to two groups of detection values at two different environmental temperatures; removing abnormal resistance values in the first and second resistance values according to a preset abnormal value exclusion strategy to obtain first and second effective resistance values; calculating first and second resistance average values corresponding to the first and second effective resistance values; and calculating the first and second resistance average values, the second environmental temperature, and the resistance temperature coefficient calculation formula corresponding to the resistance temperature coefficient test script to obtain a resistance temperature coefficient as the corresponding test result.

[0086] Embodiment 3

[0087] If the test script is a resistance temperature coefficient test script, the voltage values output by the thermoelectric element in the range of 90° clockwise rotation angle to 90° counterclockwise rotation angle need to be collected. In this embodiment, the environmental temperature for testing is adjusted.

[0088] S1, control the first black body, the second black body and the third black body to be closed, and set two environmental temperatures for resistance temperature coefficient testing as T1 and T2 (for example, T1 is 25°C and T2 is 50°C);

[0089] S2, send a temperature setting instruction to the temperature control component to set the constant-temperature water tank to the first environmental temperature T1;

[0090] S3, obtaining the temperature value of the water tank temperature sensor and determining whether the above set environment temperature is reached, if not, continuing to wait and then determining again;

[0091] S4, if reached, obtaining the temperature value of the jig temperature sensor, and determining whether the temperature value reaches the above set environment temperature, if not, fine-tuning the temperature value set by the constant temperature water tank and repeating step S3 until the temperature value of the jig temperature sensor reaches the environment temperature set in the current set of temperature setting information (i.e. the first environment temperature T1);

[0092] S5, collecting a set of detection values obtained by the thermoelectric element measured by the collecting assembly. Repeatedly collecting a plurality of voltage detection values and current detection values as a set of detection values, and each current detection value and voltage detection value can correspond to a first resistance value R T1 ;

[0093] S6, sending a temperature setting instruction to the temperature control assembly according to a new set of temperature setting information, and setting the constant temperature water tank to the second environment temperature T2;

[0094] S7, obtaining the temperature value of the water tank temperature sensor and determining whether the above set environment temperature is reached, if not, continuing to wait and then determining again;

[0095] S8, if reached, obtaining the temperature value of the jig temperature sensor, and determining whether the temperature value reaches the above set environment temperature, if not, fine-tuning the temperature value set by the constant temperature water tank and repeating step S7 until the temperature value of the jig temperature sensor reaches the environment temperature set in the current set of temperature setting information (i.e. the second environment temperature T2);

[0096] S9, collecting a set of detection values obtained by the thermoelectric element measured again by the collecting assembly. Repeatedly collecting a plurality of voltage detection values and current detection values as a set of detection values, and each current detection value and voltage detection value can correspond to a second resistance value R T2 ;

[0097] S10, after completing all data collection, setting the temperature of the constant temperature water tank to 25℃, waiting for the temperature of the constant temperature water tank to reach 25℃, and closing the constant temperature water tank.

[0098] Through data processing rules, the plurality of sets of detection values obtained are processed, and the first resistance value and the second resistance value corresponding to the two sets of detection values at two different environment temperatures are calculated; the first detection value can correspond to a plurality of first resistance values R T1 , and the second detection value can correspond to a plurality of second resistance values R T2According to the outlier elimination strategy, the abnormal resistance values in the first resistance values and the second resistance values are removed, and the process of removing the abnormal resistance values is similar to the process of removing the abnormal values in the above-mentioned embodiments 1 and 2, and only the physical unit of the value is converted from voltage to resistance. The abnormal resistance values in the first resistance values are removed to obtain the first effective resistance values, and the abnormal resistance values in the second resistance values are removed to obtain the second effective resistance values.

[0099] The average of the plurality of first effective resistance values is calculated to obtain a first resistance average R' T1 The average of the plurality of second effective resistance values is calculated to obtain a second resistance average R' T2 According to the coefficient calculation formula corresponding to the resistance temperature coefficient test script, the first resistance average, the second resistance average and two different environmental temperatures are calculated to obtain the resistance temperature coefficient as the corresponding test result. The coefficient calculation formula can be expressed by formula (1):

[0100] (1);

[0101] TCR is the calculated resistance temperature coefficient.

[0102] In the test method of the thermoelectric device disclosed in the above-mentioned embodiments, the method comprises: sending a temperature setting instruction to the black body and the temperature control assembly according to the temperature setting information in the test script to set the temperature parameter, sending a distance setting instruction to the displacement assembly to set the distance parameter and the rotation angle, obtaining the detection value measured by the collection assembly, sending a moving instruction to the displacement assembly to push the thermoelectric pile to a position not irradiated by the black body, and repeating the above-mentioned measurement process if the test script contains the next group of temperature setting information; and processing the plurality of groups of detection values obtained according to the data processing rule to obtain the test result. The above-mentioned method is applied in the test device to test the thermoelectric pile and other precision sensors, and can realize integrated and automated performance testing of the thermoelectric pile device; and can adapt to different types of test scripts to perform different performance tests.

[0103] The present application can realize the automatic testing of the VT, FOV and TCR of the thermoelectric pile device, and solve the problems of dispersed test results, low efficiency and large human error of the traditional test method. Meanwhile, the present device can adapt to thermoelectric pile sensors of different sizes and field angles, and the test program modules can be written for different thermoelectric pile sensors to meet specific needs.

[0104] The present application also provides a test device for a thermoelectric device, and the controller in the test device applies any one of the above-mentioned embodiments of the test method for the thermoelectric device. Specifically, please refer to Figures 2 to 4 .

[0105] As Figures 2 to 4As shown, the test device further comprises a displacement assembly 10, a temperature control assembly 20, a black body 30, a collection assembly 40, a jig temperature sensor 211 and a water tank temperature sensor 221, which are in communication connection with the controller 50; the temperature control assembly 20 comprises a water-cooled jig 21 and a constant-temperature water tank 22, the water-cooled jig 21 is arranged on the displacement assembly 10, the thermoelectric element 51 and the jig temperature sensor 211 are arranged in the water-cooled jig 21, the water-cooled jig 21 and the constant-temperature water tank 22 are connected through a pipeline 23 to form a cooling water circulation, the water tank temperature sensor 221 is arranged in the constant-temperature water tank 22, and the collection assembly 40 is electrically connected with the sensing pin of the thermoelectric element 51.

[0106] In a more specific embodiment, the displacement assembly 10 comprises a first translation stage 11, a first rotation stage 12, a second translation stage 13, a third translation stage 14, a second rotation stage 15, a first adapter plate 16 and a second adapter plate 17; the first rotation stage 12 is slidably arranged on the first translation stage 11; the second translation stage 13 is rotatably arranged on the first rotation stage 12; the first adapter plate 16 is slidably arranged on the second translation stage 13, and the third translation stage is fixedly arranged on the side of the first adapter plate 16; the second adapter plate 17 is slidably arranged on the third translation stage, and the second rotation stage 15 is rotatably arranged on the third translation stage.

[0107] In a more specific embodiment, the black body 30 comprises a first black body 31, a second black body 32 and a third black body 33; the first black body 31 and the second black body 32 are arranged in close proximity and serve as radiation sources; when the detection value is measured, the first connecting line between the third black body 33 and the thermoelectric element 51 is parallel to the second connecting line, which is the connecting line between the first black body 31 and the second black body 32.

[0108] In the test device for the thermoelectric device provided in the embodiment of the present application, the controller applies the above-mentioned test method for the thermoelectric device, sends temperature setting instructions to the black body and the temperature control assembly according to the temperature setting information in the test script to set the temperature parameters, sends distance setting instructions to the displacement assembly to set the distance parameters and the rotation angle, obtains the detection values measured by the collection assembly, sends movement instructions to the displacement assembly to push the thermoelectric element to a position not irradiated by the black body, and repeats the above-mentioned measurement process if the test script contains the next set of temperature setting information; and processes the obtained multiple sets of detection values according to the data processing rules to obtain the test results. The above-mentioned method is applied in the test device to test the thermoelectric element and other precision sensors, can realize integrated and automated performance testing of the thermoelectric device, and can adapt to different types of test scripts to perform different performance tests.

[0109] The test method of the thermoelectric device can be implemented in the form of a computer program, which can run on a computer device as shown in Figure 5 The controller can be implemented as a computer device as shown in Figure 5 .

[0110] Please refer to Figure 5 , Figure 5 is a schematic block diagram of a computer device provided by an embodiment of the present application. The computer device can be a controller for executing a test method of a thermoelectric device to test the performance of the thermoelectric device.

[0111] Please refer to Figure 5 , the computer device 500 includes a processor 502, a memory and a network interface 505 connected through a communication bus 501, wherein the memory can include a storage medium 503 and an internal memory 504.

[0112] The storage medium 503 can store an operating system 5031 and a computer program 5032. The computer program 5032, when executed, can cause the processor 502 to execute the test method of the thermoelectric device, wherein the storage medium 503 can be a volatile storage medium or a non-volatile storage medium.

[0113] The processor 502 is configured to provide computing and control capabilities to support the operation of the entire computer device 500.

[0114] The internal memory 504 provides an environment for the execution of the computer program 5032 in the storage medium 503, and the computer program 5032, when executed by the processor 502, can cause the processor 502 to execute the test method of the thermoelectric device.

[0115] The network interface 505 is configured to perform network communication, such as providing transmission of data information, etc. Those skilled in the art can understand that Figure 5 The structure shown in the figure is only a block diagram of part of the structure related to the present application, and does not constitute a limitation on the computer device 500 to which the present application is applied. The specific computer device 500 can include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0116] The processor 502 is configured to run the computer program 5032 stored in the memory to implement the corresponding functions in the above-mentioned test method of the thermoelectric device.

[0117] Those skilled in the art can understand that Figure 5The embodiments of the computer device shown in the figures do not constitute a limitation on the specific structure of the computer device, and in other embodiments, the computer device can include more or fewer components than shown, or combine certain components, or arrange the components differently. For example, in some embodiments, the computer device can only include the memory and the processor, and in such embodiments, the structure and function of the memory and the processor are consistent with the embodiments shown, and will not be described again here. Figure 5

[0118] It should be understood that, in the embodiments of the present application, the processor 502 can be a central processing unit (CPU), and the processor 502 can also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gates or transistor logic components, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor.

[0119] In another embodiment of the present application, a computer readable storage medium is provided. The computer readable storage medium can be a volatile or non-volatile computer readable storage medium. The computer readable storage medium stores a computer program, wherein the computer program is executed by a processor to implement the steps contained in the above-mentioned testing method of thermoelectric devices.

[0120] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described devices, apparatuses and units can refer to the corresponding processes in the foregoing method embodiments, which will not be described again here. Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized in electronic hardware, computer software or a combination of both. In order to clearly illustrate the interchangeability of hardware and software, each example has been described in the above description in terms of its general functionality, and the implementation of such functionality in terms of hardware and software is a matter of choice and design constraints. The skilled person can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0121] ​In several embodiments of the present application, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and the division of the units is merely logical function division. Actual implementation can have another division, or units with the same function can be combined into one unit. For example, multiple units or components can be combined or integrated into another system, or some features can be omitted or not implemented. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interfaces, devices, or units, and can be electrical, mechanical, or other forms of connection.

[0122] The units described as separate components can or can not be physically separated, and the components shown as units can or can not be physical units, i.e., can be located in one place or distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiments of the present application.

[0123] In addition, the functional units in each embodiment of the present application can be integrated into one processing unit, or each unit can exist physically, or two or more units can be integrated into one unit. The integrated unit can be implemented in the form of hardware or software functional units.

[0124] The integrated unit, if implemented in the form of software functional units and sold or used as an independent product, can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application essentially or the part that contributes to the prior art, or all or part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a computer readable storage medium, including a plurality of instructions to make a computer device (which can be a personal computer, a server, or a network device, etc.) execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned computer readable storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a magnetic disk or an optical disk, and various storage media that can store program codes.

[0125] The above is merely a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical range disclosed by the present application, and these modifications or replacements should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A testing method for a thermoelectric device, characterized in that, The method is applied to the controller of a testing device for thermoelectric devices. The testing device further includes a displacement component, a temperature control component, a blackbody, a data acquisition component, a fixture temperature sensor, and a water bath temperature sensor, all communicatively connected to the controller. The temperature control component includes a water-cooled fixture and a constant-temperature water bath. The water-cooled fixture is mounted on the displacement component. The thermopile and the fixture temperature sensor are both located within the water-cooled fixture. The water-cooled fixture and the constant-temperature water bath are connected via a pipeline to form a cooling water circulation. The water bath temperature sensor is located within the constant-temperature water bath. The data acquisition component is electrically connected to the sensing pin of the thermopile. The method includes: According to a set of temperature setting information in the preset test script, a temperature setting command is sent to the blackbody and the temperature control component to set the temperature parameters. Send a distance setting command to the displacement component to set the distance parameters between the thermopile and the blackbody, as well as the rotation angle of the thermopile; The acquisition component obtains a set of detection values ​​by measuring the thermopile; the detection values ​​include the current detection value and voltage detection value corresponding to at least one rotation angle of the thermopile; Send a movement command to the displacement component to move the thermopile to a position where it is not exposed to the blackbody; If the test script contains the next set of temperature setting information, then generate a temperature setting instruction corresponding to the temperature setting information and return to execute the step of sending the temperature setting instruction to the blackbody and the temperature control component to set the temperature parameters; If the test script does not contain the next set of temperature setting information, the multiple sets of detection values ​​obtained are processed according to the data processing rules corresponding to the test script to obtain the corresponding test results.

2. The testing method for thermoelectric devices according to claim 1, characterized in that, After sending the temperature setting command to the blackbody and the temperature control component to set the temperature parameters, the method further includes: Determine whether the temperature of the blackbody has reached the target temperature in the temperature setting command; Determine whether the temperature values ​​detected by the fixture temperature sensor and the water tank temperature sensor both reach the ambient temperature in the temperature setting command. If the temperature of the blackbody reaches the target temperature and the temperature values ​​detected by the fixture temperature sensor and the water tank temperature sensor both reach the ambient temperature, then the step of sending the distance setting command to the displacement component is executed.

3. The testing method for thermoelectric devices according to claim 1, characterized in that, Before processing the multiple sets of detection values ​​obtained according to the data processing rules corresponding to the test script, the method further includes: Determine whether the temperature values ​​detected by the blackbody, the fixture temperature sensor, and the water tank temperature sensor have all reached the preset initial temperature value. If the temperature values ​​detected by the blackbody, the fixture temperature sensor, and the water tank temperature sensor all reach the initial temperature value, a shutdown command is sent to the blackbody and the temperature control component.

4. The testing method for thermoelectric devices according to claim 2, characterized in that, The test script is a voltage-temperature relationship test script; The process of processing the acquired multiple sets of detection values ​​according to the data processing rules corresponding to the test script to obtain the corresponding test results includes: The average value of the voltage detection values ​​in each group of detection values ​​is calculated as the output voltage corresponding to each target temperature; each group of detection values ​​includes the current detection value and voltage detection value corresponding to the thermopile at one rotation angle; Nonlinear fitting is performed on multiple pairs of data corresponding to the target temperature and the output voltage to obtain the corresponding fitting curve; Based on the fitted curve, the ambient temperature and the target temperature are used as dependent variables to calculate the corresponding voltage value; Subtract the corresponding isothermal output voltage from each of the voltage values ​​to obtain the corrected voltage-temperature relationship table as the corresponding test result; the isothermal output voltage is the output voltage when the ambient temperature and the target temperature are equal to the voltage value.

5. The testing method for thermoelectric devices according to claim 2, characterized in that, The test script is a field of view test script; The process of processing the acquired multiple sets of detection values ​​according to the data processing rules corresponding to the test script to obtain the corresponding test results includes: Calculate the average value of the voltage detection values ​​with the same rotation angle in each group of detection values, and use it as the output voltage corresponding to each rotation angle; each group of detection values ​​includes the current detection value and voltage detection value corresponding to the thermopile at multiple rotation angles respectively. Nonlinear fitting is performed on multiple pairs of data corresponding to the rotation angle and the output voltage to obtain the corresponding fitting curve; The point with the highest voltage in the fitted curve is taken as the corresponding center point of the field of view. Based on the voltage ratio in the field of view test script and the voltage value at the center point of the field of view, obtain the clockwise and counterclockwise angle points in the fitted curve corresponding to the voltage ratio; Calculate the angle between the angle points corresponding to each voltage ratio, and obtain the field of view angle of each voltage ratio as the corresponding test result.

6. The test method for thermoelectric devices according to claim 4 or 5, characterized in that, Before calculating the average of the voltage detection values ​​in each group of detection values ​​as the output voltage corresponding to each target temperature, or before calculating the average of the voltage detection values ​​with the same rotation angle in each group of detection values, the method further includes: Abnormal voltage detection values ​​are removed from the detection values ​​according to a preset outlier removal strategy.

7. The testing method for thermoelectric devices according to claim 2, characterized in that, The test script is a resistance temperature coefficient test script. The multiple sets of detected values ​​are processed according to the data processing rules corresponding to the test script to obtain the corresponding test results, including: Calculate the first resistance value and the second resistance value corresponding to two sets of detection values ​​at two different ambient temperatures, respectively; Abnormal resistance values ​​are removed from the first resistance value and the second resistance value according to the preset outlier removal strategy to obtain the first effective resistance value and the second effective resistance value. Calculate the first average resistance value and the second average resistance value corresponding to the first effective resistance value and the second effective resistance value, respectively; The average value of the first resistance, the average value of the second resistance, and two different ambient temperatures are calculated according to the coefficient calculation formula corresponding to the resistance temperature coefficient test script to obtain the resistance temperature coefficient as the corresponding test result.

8. A testing device for a thermoelectric device, characterized in that, The controller in the thermoelectric device testing apparatus uses the testing method for thermoelectric devices as described in any one of claims 1-7. The testing apparatus for thermoelectric devices further includes a displacement component, a temperature control component, a blackbody, a data acquisition component, a fixture temperature sensor, and a water bath temperature sensor that are communicatively connected to the controller. The temperature control component includes a water-cooled fixture and a constant-temperature water bath. The water-cooled fixture is disposed on the displacement component. The thermopile and the fixture temperature sensor are both placed inside the water-cooled fixture. The water-cooled fixture and the constant-temperature water bath are connected by a pipeline to form a cooling water circulation. The water bath temperature sensor is placed inside the constant-temperature water bath. The data acquisition component is electrically connected to the sensing pin of the thermopile.

9. The testing apparatus for thermoelectric devices according to claim 8, characterized in that, The displacement assembly includes a first translation stage, a first rotary stage, a second translation stage, a third translation stage, a second rotary stage, a first adapter plate, and a second adapter plate; The first rotary table is slidably disposed on the first translation platform; the second translation platform is rotatably disposed on the first rotary platform; the first adapter plate is slidably disposed on the second translation platform; the third translation platform is fixedly disposed on the side of the first adapter plate; the second adapter plate is slidably disposed on the third translation platform; and the second rotary table is rotatably disposed on the third translation platform.

10. The testing apparatus for thermoelectric devices according to claim 8 or 9, characterized in that, The blackbody includes a first blackbody, a second blackbody, and a third blackbody; The first blackbody and the second blackbody are arranged adjacent to each other and serve as radiation sources; When the detection value is obtained by measurement, the first line connecting the third blackbody and the thermopile is parallel to the second line, and the second line is the line connecting the first blackbody and the second blackbody.

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