Detection device based on optical lever principle, high-precision assembly error detection method and flatness detection method

By using a detection device and method based on the principle of optical levers, assembly errors and flatness are detected by utilizing the relative displacement change of the light spot. This solves the problems of probe wear and high system complexity in traditional detection technologies, and achieves high-precision, low-cost, and dynamic response detection results.

CN120800192BActive Publication Date: 2025-11-21CHANGCHUN TONGSHI PHOTOELECTRIC TECH CO LTD
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Patent Information

Application Number
CN202511284597.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-09-10
Publication Date
2025-11-21
Estimated Expiration
2045-09-10

AI Technical Summary

Technical Problem

In existing assembly error detection technologies, contact measurement suffers from micro-deformation errors caused by probe wear and dynamic response hysteresis, while non-contact measurement has high system complexity and is difficult to work stably in ordinary industrial sites.

Method used

An optical lever-based detection device is used, which utilizes a laser emitter, a reflector, and a photosensitive position sensor to detect assembly errors and flatness by measuring the relative displacement of the light spot. By combining mechanical induction and optical amplification, a multi-level amplified assembly error detection system is constructed.

Benefits of technology

It achieves high-precision, low-cost, and simple-to-operate assembly error and flatness detection, has strong dynamic response capability, is adaptable to ordinary industrial environments, avoids errors caused by probe wear, and supports real-time continuous scanning and millisecond-level data updates.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application provides a detection device based on an optical lever principle, a high-precision assembly error detection method and a flatness detection method, and belongs to the field of precision measurement, and solves the problems of large error and slow dynamic response of existing detection technologies, wherein the mirror mounting plate is rotationally arranged on the support, the mirror is fixedly arranged on the mirror mounting plate, the mirror is located above the laser emitting device, the mirror can reflect the laser emitted by the laser emitting device to the photosensitive position sensor, the mirror mounting plate is provided with a sliding groove, a sliding block is slidably arranged in the sliding groove, the upper end of the displacement rod is hingedly connected with the sliding block, the mirror and the displacement rod are respectively located at two ends of the rotation center of the mirror mounting plate, the horizontal distance between the laser beam and the rotation center of the mirror mounting plate is greater than the horizontal distance between the displacement rod and the rotation center of the mirror mounting plate, and the lower end of the displacement rod is detachably provided with a probe. It has strong dynamic response capability, strong environmental adaptability and high detection precision.
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Description

Technical Field

[0001] This invention belongs to the field of precision measurement technology, and in particular relates to a detection device based on the optical lever principle, a high-precision assembly error detection method, and a flatness detection method. Background Technology

[0002] Current assembly error detection technology faces two levels of technical bottlenecks: In the field of contact measurement, traditional mechanical probes, such as dial indicators and micrometers, are limited by the inherent characteristics of their mechanical structures, resulting in measurement drift due to probe wear, micro-deformation errors caused by contact stress, and dynamic response hysteresis. In the field of non-contact measurement, although technologies such as laser interferometers avoid the shortcomings of contact measurement, their systems are too complex, requiring precise temperature control and vibration isolation environments, making it difficult to operate stably in ordinary industrial settings. Summary of the Invention

[0003] In view of this, in order to solve the problems of micro-deformation error and dynamic response hysteresis caused by probe wear in the field of existing assembly error detection technology, and the problems of excessive system complexity, high requirements for precise temperature control and vibration isolation environment in the field of non-contact measurement, and difficulty in stable operation in ordinary industrial sites, this invention proposes a detection device based on the optical lever principle, a high-precision assembly error detection method and a flatness detection method.

[0004] To achieve the above objectives, the present invention adopts the following technical solution:

[0005] A detection device based on the optical lever principle, comprising:

[0006] Reference base;

[0007] A laser emitting device, fixedly mounted on a reference base, is used to emit laser light upwards;

[0008] The sensor bracket and the photosensitive position sensor are fixedly mounted on one end of the reference base, and the photosensitive position sensor is fixedly mounted on the sensor bracket. The photosensitive position sensor and the laser emitting device are spaced apart.

[0009] The bracket is fixedly installed at the other end of the reference base;

[0010] The system comprises a reflector mounting plate, a reflector, and a displacement rod. The reflector mounting plate is rotatably mounted on a bracket, and the reflector is fixedly mounted on the reflector mounting plate. The reflector is located above the laser emitting device and reflects the laser emitted by the laser emitting device onto the photosensitive position sensor. The reflector mounting plate has a sliding groove in which a slider is slidably mounted. The upper end of the displacement rod is hinged to the slider. The reflector and the displacement rod are located at opposite ends of the rotation center of the reflector mounting plate. The horizontal distance between the laser emitted by the laser emitting device and the rotation center of the reflector mounting plate is greater than the horizontal distance between the displacement rod and the rotation center of the reflector mounting plate. The displacement rod slidably passes through the bracket, and a probe is detachably mounted on the lower end of the displacement rod. The probe is used to contact the surface to be measured.

[0011] As a preferred embodiment of the aforementioned detection device based on the optical lever principle, the displacement rod is a telescopic rod with a fixed locking function.

[0012] As a preferred embodiment of the aforementioned detection device based on the optical lever principle, the bracket includes a first sub-bracket, a second sub-bracket, and two limiting brackets. The first and second sub-brackets are arranged vertically. The lower end of the second sub-bracket is fixedly connected to the first sub-bracket. The reflector mounting plate is rotatably disposed on the upper end of the second sub-bracket. One end of the first sub-bracket is fixedly connected to the reference base. The displacement rod slides through the other end of the first sub-bracket. Both limiting brackets are fixedly connected to the second sub-bracket. The two limiting brackets are spaced apart and are both located above the first sub-bracket. The displacement rod slides through the two limiting brackets.

[0013] As a preferred embodiment of the above-mentioned detection device based on the optical lever principle, the detection device based on the optical lever principle further includes a spring, which is sleeved on the displacement rod, and the two ends of the spring respectively abut against a limiting bracket and a first sub-bracket.

[0014] As a preferred embodiment of the aforementioned detection device based on the optical lever principle, a first linear bearing is provided between the first sub-support and the displacement rod, and a second linear bearing is provided between each of the two limiting supports and the displacement rod.

[0015] As a preferred embodiment of the above-mentioned detection device based on the optical lever principle, the reflector mounting plate is fixedly provided with a rotating shaft, which is rotatably inserted through the second sub-bracket, and a bearing is provided between the rotating shaft and the second sub-bracket.

[0016] This invention also provides a high-precision assembly error detection method, employing the aforementioned detection device based on the optical lever principle, comprising:

[0017] S1: Place the reference base on the assembly reference surface, and lightly touch the surface to be measured with the probe. At this time, the laser emitted by the laser emitting device is reflected by the reflector onto the photosensitive position sensor, forming a light spot.

[0018] S2: The reference base moves along the assembly reference surface, and the probe also moves on the surface to be measured. If the assembly reference surface is not parallel to the surface to be measured, the probe will have an axial displacement with the shape of the surface to be measured. The displacement rod drives the reflector mounting plate to rotate, and the reflector mounting plate drives the reflector to move. The position of the light spot on the photosensitive position sensor will change. The photosensitive position sensor outputs the relative displacement data of the light spot in real time.

[0019] S3: Obtain assembly error data based on the relative displacement data of the light spot;

[0020] S4: Repeat S1-S3 multiple times to obtain multiple assembly error data;

[0021] S5: Calculate the average of multiple assembly error data to obtain the assembly error value.

[0022] As a preferred embodiment of the aforementioned high-precision assembly error detection method, in step S3, the assembly error data obtained based on the relative displacement data of the light spot includes:

[0023] S31: Establish a coordinate graph, using the displacement data of the reference base as the horizontal axis and the light spot displacement data as the vertical axis to obtain a line graph of the light spot position.

[0024] S32: In the line diagram of the light spot position, the difference in the vertical coordinate between the highest and lowest points of the line is the assembly error.

[0025] The present invention also provides a flatness detection method, employing the above-mentioned detection device based on the optical lever principle, comprising:

[0026] S1: The reference plane is parallel to the surface to be measured. Place the reference base on the reference plane and lightly touch the surface to be measured with the probe. At this time, the laser emitted by the laser emitting device is reflected by the mirror onto the photosensitive position sensor to form a light spot.

[0027] S2: The reference base moves along the reference plane, and the probe also moves on the surface to be measured. The probe is axially displaced according to the shape of the surface to be measured. The displacement rod drives the reflector mounting plate to rotate, and the position of the light spot on the photosensitive position sensor will change. The photosensitive position sensor outputs the relative displacement data of the light spot in real time.

[0028] S3: Obtain the flatness data of the surface to be tested based on the relative displacement data of the light spot;

[0029] S4: Repeat S1-S3 multiple times to obtain flatness data for multiple test surfaces;

[0030] S5: Calculate the average of the flatness data of multiple test surfaces to obtain the final flatness of the test surface.

[0031] As a preferred embodiment of the above-mentioned flatness detection method, in S3, the flatness data of the surface to be tested, obtained based on the relative displacement data of the light spot, includes:

[0032] S31: Establish a coordinate graph, using the displacement data of the reference base as the horizontal axis and the light spot displacement data as the vertical axis to obtain the light spot position waveform graph;

[0033] S32: In the waveform diagram of the spot position, the difference in the vertical coordinate between the highest and lowest points of the waveform is the flatness of the surface to be measured.

[0034] Compared with existing technologies, the beneficial effects of the detection device, high-precision assembly error detection method, and flatness detection method based on the optical lever principle provided by this invention are:

[0035] This invention provides a detection device, a high-precision assembly error detection method, and a flatness detection method based on the optical lever principle. In this detection device based on the optical lever principle, a laser emitting device emits a parallel laser beam with a very small spot diameter through a laser emitter and an optical system. The laser beam is reflected by a mirror and projected onto a photosensitive position sensor (PSD), forming a spot. The PSD can detect the relative displacement change of the spot on its surface. Because the assembly error data and flatness data are obtained through the relative displacement change of the spot, there is no problem of error in the detection results due to probe wear. Furthermore, the probe and displacement rod are detachably connected, allowing for probe replacement at any time. Moreover, the optical amplification and high-speed PSD detection work together, supporting real-time continuous scanning and millisecond-level data updates, thus improving dynamic response capabilities.

[0036] This detection device, based on the principle of optical levers, constructs a multi-stage amplification assembly error detection system of "mechanical induction-optical amplification," introducing an assembly error transmission mechanism. Through a precisely designed lever-type displacement transmission structure, surface topography changes are converted into controllable optical signal shifts. First-stage mechanical amplification: The support serves as the fulcrum of the mirror mounting plate. The laser strikes the mirror, and the mirror and displacement rod are located at opposite ends of the rotation center of the mirror mounting plate. The horizontal distance between the laser beam and the rotation center of the mirror is greater than the horizontal distance between the displacement rod and the rotation center of the mirror mounting plate. Utilizing the lever principle, the initial amplification of the displacement is achieved. Second-stage optical amplification: A spatial optical path is constructed through the mirror, converting changes in the mirror angle into a significant shift in the beam position.

[0037] This detection device, based on the principle of optical levers, can detect both assembly errors and flatness. Furthermore, by obtaining assembly error and flatness data through the relative displacement of the light spot, it avoids the problem of errors caused by wear detection. It also boasts strong dynamic response, simple structure, low cost, easy operation, strong environmental adaptability, and high detection accuracy, combining high precision with industrial practicality. It can rapidly capture and accurately assess micron-level assembly errors in conventional workshop environments. Attached Figure Description

[0038] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings:

[0039] Figure 1 This is a schematic diagram of the detection device based on the optical lever principle provided in a specific embodiment of the present invention;

[0040] Figure 2 This is a simplified diagram of a detection device based on the optical lever principle provided in a specific embodiment of the present invention;

[0041] Figure 3 This is an auxiliary diagram for calculating the mathematical formulas of the detection device based on the optical lever principle provided in a specific embodiment of the present invention;

[0042] Figure 4 The specific embodiment of the present invention provides a detection device based on the optical lever principle. When detecting assembly errors, the probe travels along the annular surface, and a line diagram of the light spot position is obtained.

[0043] Figure 5 The specific embodiment of the present invention provides a detection device based on the optical lever principle. When detecting assembly errors, the probe travels along a straight line, and a line diagram of the light spot position is obtained.

[0044] Figure 6 This is a waveform diagram of the position of the light spot on the bearing end face obtained by the detection device based on the optical lever principle provided in a specific embodiment of the present invention when performing parallelism detection.

[0045] In the picture:

[0046] 1. Reference base; 2. Photosensitive position sensor; 3. Laser emitting device; 41. Second sub-support; 42. First sub-support; 43. Limiting support; 5. Reflector; 6. Displacement rod; 7. Probe; 8. Spring; 9. Sensor support; 10. Reflector mounting plate. Detailed Implementation

[0047] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of the present invention can be combined with each other, and the described embodiments are only some embodiments of the present invention, not all embodiments.

[0048] In the description of this invention, unless otherwise explicitly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0049] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0050] In the description of this embodiment, the terms "upper," "lower," "right," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the present invention. In addition, the terms "first" and "second" are used only for distinction in description and have no special meaning.

[0051] See Figure 1-6This invention provides a detection device, a high-precision assembly error detection method, and a flatness detection method based on the optical lever principle. The detection device includes a reference base 1, a laser emitting device 3, a sensor bracket 9, a photosensitive position sensor 2, a support, a reflector mounting plate 10, a reflector 5, and a displacement rod 6. The laser emitting device 3 is fixedly mounted on the reference base 1 and is used to emit laser light upwards. The sensor bracket 9 is fixedly mounted on one end of the reference base 1, and the photosensitive position sensor 2 is fixedly mounted on the sensor bracket 9, with the photosensitive position sensor 2 and the laser emitting device 3 spaced apart. The support is fixedly mounted on the other end of the reference base 1, and the reflector mounting plate 10 is rotatably mounted on the support. The reflector 5 is fixedly mounted on the reflector mounting plate 10. The reflector 5 is located above the laser emitting device 3. The reflector 5 can reflect the laser emitted by the laser emitting device 3 onto the photosensitive position sensor 2. The reflector mounting plate 10 is provided with a sliding groove, and a slider is slidably arranged in the sliding groove. The upper end of the displacement rod 6 is hinged to the slider. The reflector 5 and the displacement rod 6 are located at opposite ends of the rotation center of the reflector mounting plate 10. The horizontal distance between the laser emitted by the laser emitting device 3 and the rotation center of the reflector mounting plate 10 is greater than the horizontal distance between the displacement rod 6 and the rotation center of the reflector mounting plate 10. The displacement rod 6 is slidably inserted through the bracket. The lower end of the displacement rod 6 is detachably provided with a probe 7, which is used to contact the surface to be measured.

[0052] This detection device based on the optical lever principle can perform both assembly error detection and flatness detection. During assembly error detection, the reference base 1 moves along the assembly reference surface, and the probe 7 moves accordingly on the surface to be measured. If the assembly reference surface and the surface to be measured are not parallel, the distance between them will change. This causes the probe 7 at the lower end of the displacement rod 6 to undergo axial displacement following the shape of the surface to be measured. The displacement rod 6 drives the reflector mounting plate 10 to rotate, and the reflector 5 moves with the reflector mounting plate 10. Consequently, the position of the laser beam reflected by the reflector 5 and hitting the photosensitive position sensor 2 changes. The photosensitive position sensor 2 outputs spot displacement data in real time. Based on the spot displacement data, the assembly error data is obtained. This process is repeated multiple times, and the average of the obtained assembly error data is used to obtain the final assembly error value. During assembly error detection, the reference plane is parallel to the surface to be measured. The reference base 1 moves along the reference plane, and the probe 7 also moves on the surface to be measured. The probe 7 at the lower end of the displacement rod 6 undergoes axial displacement according to the shape of the surface to be measured. The displacement rod 6 drives the reflector mounting plate 10 to rotate, and the position of the light spot on the photosensitive position sensor 2 will change. The photosensitive position sensor 2 outputs the light spot displacement data in real time. Based on the light spot displacement data, the flatness data of the surface to be measured is obtained. The operation is repeated multiple times, and the average of the multiple flatness data is calculated to obtain the final flatness of the surface to be measured.

[0053] In this detection device based on the optical lever principle, the laser emitting device 3 emits a parallel laser beam with a very small spot diameter through a laser emitter and an optical system. The laser beam is reflected by the reflector 5 and projected onto the photosensitive position sensor 2, forming a spot. The photosensitive position sensor 2 (PSD) can detect the relative displacement change of the spot on its surface. Because the assembly error data and flatness data are obtained through the relative displacement change of the spot, there is no problem of error in the detection results caused by probe wear. Furthermore, the probe 7 and the displacement rod 6 are detachably connected, allowing the probe 7 to be replaced at any time. Moreover, the optical magnification and high-speed PSD detection work together to support real-time continuous scanning and millisecond-level data updates, improving dynamic response capabilities.

[0054] This detection device, based on the optical lever principle, can detect both assembly errors and flatness. Furthermore, by obtaining assembly error and flatness data through the relative displacement of the light spot, it avoids the problem of errors caused by wear detection. It boasts strong dynamic response, simple structure, low cost, easy operation, strong environmental adaptability, and high detection accuracy, combining high precision with industrial practicality. It can rapidly capture and accurately assess micron-level assembly errors in conventional workshop environments. This technical solution is particularly suitable for industrial scenarios requiring high-precision assembly, such as precision mechanical assembly, microelectronic device packaging, and aerospace structural component docking, effectively resolving the technical contradictions between dynamic response, environmental adaptability, and measurement accuracy inherent in traditional measurement methods.

[0055] This detection device, based on the principle of optical levers, constructs a multi-stage amplification assembly error detection system of "mechanical induction-optical amplification," introducing an assembly error transmission mechanism. Through a precisely designed lever-type displacement transmission structure, surface topography changes are converted into controllable optical signal shifts. First-stage mechanical amplification: The support serves as the fulcrum of the reflector mounting plate 10. The laser strikes the reflector 5, and the reflector 5 and displacement rod 6 are at opposite ends of the rotation center of the reflector mounting plate 10. The horizontal distance between the upward-emitted laser beam and the rotation center of the reflector mounting plate 10 is greater than the horizontal distance between the displacement rod 6 and the rotation center of the reflector mounting plate 10. Utilizing the lever principle, the initial amplification of the displacement is achieved. Second-stage optical amplification: A spatial optical path is constructed through the reflector 5, converting changes in the angle of the reflector 5 into a significant shift in the beam position.

[0056] like Figure 3 As shown, the reflector 5 rotates from reflector position 1 to reflector position 2. The laser emitted by the laser emitting device 3 is the incident light. After hitting the reflector 5, the light reflected by the reflector 5 is the reflected light, which finally lands on the photosensitive position sensor 2. Based on the geometric relationship caused by the rotation of the reflector 5 with the reflector mounting plate 10 and the displacement of the light spot on the photosensitive position sensor 2, the displacement ab of the light spot on the photosensitive position sensor 2 can be derived.

[0057] When reflector 5 is at position 1, the incident angle is α. The laser hits reflector 5 at position Q1, and the position of the laser hitting photosensitive position sensor 2 is denoted as b. Reflector 5 rotates from position 1 to position 2, and displacement rod 6 moves downward a distance L, with a rotation angle of γ. When reflector 5 is at position 2, the incident angle is β. The laser hits reflector 5 at position Q2, and the position of the laser hitting photosensitive position sensor 2 is denoted as a. The horizontal distance between the incident laser ray and photosensitive position sensor 2 is M. The distance from the rotation center of reflector 5 to the incident laser ray is K. The horizontal distance from displacement rod 6 to the rotation center of reflector 5 is S. When reflector 5 is at position 1, the vertical distance between the upper end of displacement rod 6 and the rotation center of reflector 5 is H. According to the law of reflection, α + γ = β.

[0058] In △QQ1O, ∠QOQ1 = 90° - ∠QQ1O = α; QQ1 = QO•tanα = K•tanα;

[0059] In △Q1bO4, ;

[0060] but, .

[0061] Similarly, we can obtain Substituting α+γ=β, we get:

[0062] From ab = QQ5 - QQ4, we can obtain: After sorting, we get: .

[0063] Since L is relatively small, then ; Thus, the relationship between L and ab can be obtained.

[0064] Optionally, the displacement rod 6 is a telescopic rod with a locking function. Before measurement, the length of the displacement rod 6 is adjusted according to the distance between the assembly reference surface and the surface to be measured, which broadens the application range of the detection device based on the optical lever principle. During the measurement process, the displacement rod 6 is locked in place, and its length remains unchanged to ensure accurate measurement results.

[0065] Optionally, the bracket includes a first sub-branch 42, a second sub-branch 41, and two limiting brackets 43. The first sub-branch 42 and the second sub-branch 41 are arranged vertically. The lower end of the second sub-branch 41 is fixedly connected to the first sub-branch 42. The reflector mounting plate 10 is rotatably arranged on the upper end of the second sub-branch 41. One end of the first sub-branch 42 is fixedly connected to the reference base 1. The displacement rod 6 slides through the other end of the first sub-branch 42. Both limiting brackets 43 are fixedly connected to the second sub-branch 41. The two limiting brackets 43 are spaced apart and are both located above the first sub-branch 42. The displacement rod 6 slides through the two limiting brackets 43.

[0066] Optionally, the detection device based on the optical lever principle further includes a spring 8, which is sleeved on the displacement rod 6, with its two ends abutting against a limiting bracket 43 and a first sub-bracket 42, respectively. The spring 8 is used to reset the displacement rod 6.

[0067] Optionally, a first linear bearing is provided between the first sub-support 42 and the displacement rod 6, and a second linear bearing is provided between each of the two limiting supports 43 and the displacement rod 6. The first and second linear bearings can guide the movement of the displacement rod 6 and ensure detection accuracy.

[0068] Optionally, the reflector mounting plate 10 is fixedly provided with a rotating shaft, which is rotatably inserted through the second sub-branch 41, and a bearing is provided between the rotating shaft and the second sub-branch 41.

[0069] This invention also provides a high-precision assembly error detection method, employing the aforementioned detection device based on the optical lever principle, comprising:

[0070] S1: Place the reference base 1 on the assembly reference surface, and the probe 7 lightly touches the surface to be tested. At this time, the laser emitted by the laser emitting device 3 is reflected by the reflector 5 onto the photosensitive position sensor 2, forming a light spot.

[0071] S2: The reference base 1 moves along the assembly reference surface, and the probe 7 also moves on the surface to be measured. If the assembly reference surface is not parallel to the surface to be measured, the probe 7 will have an axial displacement with the shape of the surface to be measured. The displacement rod 6 drives the reflector mounting plate 10 to rotate, and the reflector mounting plate 10 drives the reflector 5 to move. The position of the light spot on the photosensitive position sensor 2 will change, and the photosensitive position sensor 2 will output the relative displacement data of the light spot in real time.

[0072] S3: Obtain assembly error data based on the relative displacement data of the light spot.

[0073] Specifically, in S3, based on the relative displacement data of the light spot, the assembly error data includes:

[0074] S31: Establish a coordinate graph, using the displacement data of reference pedestal 1 as the horizontal axis and the light spot displacement data as the vertical axis to obtain a line graph of the light spot position.

[0075] S32: In the line diagram of the light spot position, the difference in the vertical coordinate between the highest and lowest points of the line is the assembly error.

[0076] S4: Repeat S1-S3 multiple times to obtain multiple assembly error data.

[0077] S5: Calculate the average of multiple assembly error data to obtain the assembly error value.

[0078] This high-precision assembly error detection method can detect both annular and ordinary flat surfaces. When detecting assembly errors on annular surfaces, probe 7 travels along the annular surface. For example, in detecting assembly errors on the bearing end face, probe 7 travels along the annular region of the bearing end face, and the resulting line diagram of the light spot position on the bearing end face is shown below. Figure 4 As shown in the figure, the difference in the vertical coordinate between the highest and lowest points of the line is the assembly error of the bearing.

[0079] When detecting assembly errors on a typical flat surface, probe 7 travels from one end of the surface to the other along a straight line, obtaining a line diagram showing the position of the light spot on the surface, as shown below. Figure 5 As shown in the figure, the difference in the vertical coordinates between the highest and lowest points of the line is the assembly error of the plane.

[0080] The present invention also provides a flatness detection method, employing the above-mentioned detection device based on the optical lever principle, comprising:

[0081] S1: The reference plane is parallel to the surface to be measured. The reference base 1 is placed on the reference plane, and the probe 7 lightly touches the surface to be measured. At this time, the laser emitted by the laser emitting device 3 is reflected by the reflector 5 onto the photosensitive position sensor 2, forming a light spot. The reference plane is a smooth plane, that is, a plane with infinitesimal roughness.

[0082] S2: The reference base 1 moves along the reference plane, and the probe 7 also moves on the surface to be measured. The probe 7 generates axial displacement according to the shape of the surface to be measured. The displacement rod 6 drives the reflector mounting plate 10 to rotate, and the position of the light spot on the photosensitive position sensor 2 will change. The photosensitive position sensor 2 outputs the relative displacement data of the light spot in real time.

[0083] S3: Obtain the flatness data of the surface to be tested based on the relative displacement data of the light spot.

[0084] Specifically, in S3, the flatness data of the surface to be measured is obtained based on the relative displacement data of the light spot, including:

[0085] S31: Establish a coordinate graph, using the displacement data of reference pedestal 1 as the horizontal axis and the light spot displacement data as the vertical axis to obtain the light spot position waveform graph.

[0086] S32: In the waveform diagram of the light spot position, the difference in the vertical coordinate between the highest and lowest points of the waveform represents the flatness of the surface to be measured. The waveform diagram of the light spot position is shown below. Figure 6 As shown, the difference in the vertical coordinates between the highest and lowest points of the waveform represents the flatness of the surface being measured.

[0087] S4: Repeat S1-S3 multiple times to obtain flatness data for multiple test surfaces.

[0088] S5: Calculate the average of the flatness data of multiple test surfaces to obtain the final flatness of the test surface.

[0089] Obviously, the above-disclosed embodiments of the present invention are merely illustrative of the invention. The embodiments do not exhaustively describe all details, nor do they limit the invention to the specific implementations described. Many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of the invention, thereby enabling those skilled in the art to better understand and utilize the invention. It is neither necessary nor possible to exhaustively describe all embodiments herein.

Claims

1. A high-precision assembly error detection method, characterized in that, A detection device based on the optical lever principle is used. The optical lever principle-based detection device includes: Reference mount (1); A laser emitting device (3) is fixedly mounted on a reference base (1) and is used to emit laser light upwards; The sensor bracket (9) and the photosensitive position sensor (2) are fixedly mounted on one end of the reference base (1), and the photosensitive position sensor (2) is fixedly mounted on the sensor bracket (9). The photosensitive position sensor (2) and the laser emitting device (3) are spaced apart. The bracket is fixedly installed at the other end of the reference base (1); The reflector mounting plate (10), the reflector (5), and the displacement rod (6) are arranged in a bracket. The reflector mounting plate (10) is rotatably mounted on the bracket. The reflector (5) is fixedly mounted on the reflector mounting plate (10). The reflector (5) is located above the laser emitting device (3). The reflector (5) can reflect the laser emitted by the laser emitting device (3) onto the photosensitive position sensor (2). The reflector mounting plate (10) is provided with a sliding groove. A slider is slidably mounted in the sliding groove. The upper end of the displacement rod (6) is hinged to the slider. The reflector (5) and the displacement rod (6) are located at the two ends of the rotation center of the reflector mounting plate (10), respectively. The horizontal distance between the laser emitted by the laser emitting device (3) and the rotation center of the reflector mounting plate (10) is greater than the horizontal distance between the displacement rod (6) and the rotation center of the reflector mounting plate (10). The displacement rod (6) is slidably mounted on the bracket. The lower end of the displacement rod (6) is detachably provided with a probe (7). The probe (7) is used to contact the surface to be measured. High-precision assembly error detection methods include: S1: Place the reference base (1) on the assembly reference surface, and the probe (7) lightly touches the surface to be measured. At this time, the laser emitted by the laser emitting device (3) is reflected by the reflector (5) onto the photosensitive position sensor (2) to form a light spot. S2: The reference base (1) moves along the assembly reference surface, and the probe (7) also moves on the surface to be measured. If the assembly reference surface is not parallel to the surface to be measured, the probe (7) will have an axial displacement with the shape of the surface to be measured. The displacement rod (6) drives the reflector mounting plate (10) to rotate, and the reflector mounting plate (10) drives the reflector (5) to move. The position of the light spot on the photosensitive position sensor (2) will change, and the photosensitive position sensor (2) will output the relative displacement data of the light spot in real time. S3: Obtain assembly error data based on the relative displacement data of the light spot; S31: Establish a coordinate diagram, using the displacement data of the reference base (1) as the horizontal axis and the relative displacement data of the light spot as the vertical axis to obtain a line diagram of the light spot position; S32: In the line diagram of the light spot position, the difference in the vertical coordinate between the highest and lowest points of the line is the assembly error; S4: Repeat S1-S3 multiple times to obtain multiple assembly error data; S5: Calculate the average of multiple assembly error data to obtain the assembly error value.

2. The high-precision assembly error detection method according to claim 1, characterized in that: The displacement rod (6) is a telescopic rod with a fixed locking function.

3. The high-precision assembly error detection method according to claim 1, characterized in that: The bracket includes a first sub-branch (42), a second sub-branch (41), and two limiting brackets (43). The first sub-branch (42) and the second sub-branch (41) are arranged vertically. The lower end of the second sub-branch (41) is fixedly connected to the first sub-branch (42). The reflector mounting plate (10) is rotatably arranged on the upper end of the second sub-branch (41). One end of the first sub-branch (42) is fixedly connected to the reference base (1). The displacement rod (6) slides through the other end of the first sub-branch (42). The two limiting brackets (43) are both fixedly connected to the second sub-branch (41). The two limiting brackets (43) are spaced apart and are both located above the first sub-branch (42). The displacement rod (6) slides through the two limiting brackets (43).

4. The high-precision assembly error detection method according to claim 3, characterized in that: It also includes a spring (8), which is sleeved on the displacement rod (6), and the two ends of the spring (8) abut against a limiting bracket (43) and a first sub-bracket (42) respectively.

5. The high-precision assembly error detection method according to claim 3, characterized in that: A first linear bearing is provided between the first sub-bracket (42) and the displacement rod (6), and a second linear bearing is provided between each of the two limiting brackets (43) and the displacement rod (6).

6. The high-precision assembly error detection method according to claim 3, characterized in that: The reflector mounting plate (10) is fixedly provided with a rotating shaft, which is rotatably inserted through the second sub-bracket (41), and a bearing is provided between the rotating shaft and the second sub-bracket (41).

Citation Information

Patent Citations

  • Optical lever laser graticule projection testing device

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