Ssd periodic verification test method and storage device
By adjusting the SSD user capacity and using the short stroke method, the problem of excessively long SSD random write performance testing time was solved, enabling rapid performance evaluation and an efficient development process.
Patent Information
- Application Number
- CN202511270758.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-05
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2045-09-05
AI Technical Summary
In existing technologies, random write performance testing of SSDs takes too long, which cannot meet the need for rapid reporting of development progress.
By using the random write performance of the entire SSD capacity as the target performance, and adjusting the user capacity, a quick random write performance test was conducted, including using the short stroke method to reduce the range of physically accessible addresses, to ensure the consistency of performance test results.
It shortened testing time from hours/days to minutes, improved test coverage and development efficiency, quickly diagnosed anomalies, and increased development and iteration speed.
Smart Images

Figure CN120808860B_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of storage technology, and in particular to a phased verification test method and storage device for SSDs. Background Technology
[0002] The performance of a solid state disk (SSD) refers to its overall performance in terms of data read / write, response speed, multitasking, and durability. It determines the speed, stability, and applicable scenarios of an SSD in actual use.
[0003] SSDs are shipped in an empty state. As non-duplicate data is continuously written, the writable space decreases. When it drops to a certain threshold, garbage collection (GC) is triggered to release free space. When the GC load and the host write load reach equilibrium, the SSD's performance gradually stabilizes and remains in this state for a long time, known as steady state. In steady state, the SSD's performance fluctuates less and can truly reflect its performance over long-term use. Therefore, when testing SSDs, to obtain accurate performance data, preprocessing is performed to bring the disk to a steady state before subsequent testing.
[0004] During the development phase of a product's lifecycle, functionalities and technologies may not be fully developed, and version iterations are rapid, requiring multiple rounds of testing and improvements to ensure performance meets expectations. Using conventional performance testing methods would take too long, hindering rapid reporting and impacting development progress. Summary of the Invention
[0005] Based on this, it is necessary to address the above-mentioned technical problems by providing an SSD phased verification test method and storage device in this embodiment of the invention, so as to solve the problem of excessively long SSD random write performance test time.
[0006] In a first aspect, embodiments of the present invention provide a method for SSD phased verification testing, the method comprising:
[0007] The target performance is the random write performance of the entire SSD capacity.
[0008] Adjust user capacity based on the target performance, and obtain the target capacity through testing;
[0009] Clear all user data from the entire disk.
[0010] Set the SSD user capacity according to the target capacity, perform a quick random write performance test, and obtain the quick performance test results.
[0011] In some embodiments of this disclosure, adjusting user capacity based on the target performance and obtaining the target capacity through testing includes:
[0012] Adjust the available capacity of the SSD to the current user capacity, and set the current user capacity value as the first preset percentage of the total disk capacity;
[0013] Perform random write performance tests on the current user capacity of the SSD;
[0014] The performance test results of the current user capacity are compared with the target performance. If they are consistent, the value of the current user capacity is taken as the target capacity.
[0015] In some embodiments of this disclosure, the method further includes:
[0016] Compare the performance test results of the current user capacity with the target performance. If they are inconsistent, continue to adjust the current user capacity of the SSD and perform random write performance tests on the current user capacity of the SSD until the performance test results of the current user capacity are consistent with the target performance.
[0017] In some embodiments of this disclosure, the step of continuing to adjust the current user capacity of the SSD if inconsistent includes:
[0018] If the performance test result is less than the target performance, the current user capacity will be reduced; if the performance test result is greater than the target performance, the current user capacity will be increased.
[0019] In some embodiments of this disclosure, adjusting the current user capacity of the SSD includes:
[0020] Use the short stroke method to adjust the current user capacity of the SSD;
[0021] The short stroke method reduces the range of physically accessible addresses based on a set value, thereby reducing the SSD user capacity for adaptation, while still allowing the SSD to access all dies.
[0022] In some embodiments of this disclosure, comparing the performance test results of the current user capacity with the target performance, and if they are consistent, then using the value of the current user capacity as the target capacity includes:
[0023] Perform a predicted number of random write operations on the current user capacity. If the performance test results are consistent with the target performance, then the current user capacity value is taken as the target capacity.
[0024] In some embodiments of this disclosure, before setting the SSD user capacity according to the target capacity and performing a quick random write performance test, the method further includes:
[0025] The user capacity of the SSD is preprocessed to bring the SSD to a steady state.
[0026] In some embodiments of this disclosure, the preprocessing operation includes:
[0027] Perform a second preset number of sequential write operations under the first load, and perform a third preset number of random write operations under the second load.
[0028] In some embodiments of this disclosure, the clearing of user data across the entire disk capacity includes:
[0029] By executing the erase command, all user data on the SSD is completely erased.
[0030] Secondly, embodiments of this disclosure also provide a storage device, including: a memory and a processor, the processor including multiple cores, wherein the memory stores a computer program, and when the computer program is executed by the processor, the above-described SSD phased verification test method is implemented.
[0031] This disclosure provides a phased verification test method and storage device for SSDs. The technical solutions provided by the embodiments of this disclosure bring at least the following beneficial effects:
[0032] Performance can be quickly evaluated during the R&D phase. Compared to traditional performance testing methods, which take hours or days to test, rapid testing can reduce the testing time to minutes, thus shortening the testing cycle.
[0033] Because performance results can be obtained quickly, low-frequency, phased verification can be increased to multiple executions per day. This eliminates the need to occupy costly equipment for extended periods and allows for an increase in the types of tests performed within the same timeframe, thereby improving test coverage.
[0034] Accelerating the identification of performance issues during the development phase allows for rapid diagnosis of anomalies, improving development and iteration efficiency, and reducing the impact on the product by identifying more risk points.
[0035] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description
[0036] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0037] Figure 1A flowchart illustrating a phased verification test method for SSDs provided in this embodiment of the present disclosure;
[0038] Figure 2 A flowchart illustrating a phased verification test method for SSDs provided in this embodiment of the present disclosure;
[0039] Figure 3 This is a flowchart illustrating a method for obtaining the random write performance of the entire SSD capacity as a target performance, adjusting the user capacity based on the target performance, and obtaining the target capacity through testing, as provided in this embodiment of the disclosure.
[0040] Figure 4 This is a flowchart illustrating a method for setting the SSD user capacity to a target capacity, performing a random write performance test, and obtaining the performance test results, as provided in this embodiment of the disclosure.
[0041] Figure 5 A schematic diagram of IOPS for the SSD phased verification test method provided in this embodiment of the disclosure;
[0042] Figure 6 A schematic diagram of IOPS for a conventional performance testing method;
[0043] Figure 7 This is a schematic diagram of the structure of a storage device provided in an embodiment of this disclosure. Detailed Implementation
[0044] To make the objectives, technical solutions, and advantages of this disclosure clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of this disclosure.
[0045] In the relevant embodiments of this disclosure, 4KB random write is one of the key metrics for measuring SSD performance. 4KB is the size of each data block in a write operation; random write refers to a random write operation, meaning that the location of the data block on the storage device is random for each operation. It is typically measured in IOPS, which refers to the number of input / output operations an SSD can process per second. High IOPS indicates faster data processing capabilities.
[0046] Performance is a crucial parameter for SSDs, and capacity is another important one. SSD capacity is typically measured in GB or TB, representing the addressable capacity for a user, or "user capacity." Common capacities for consumer-grade SSDs include 256GB, 512GB, 1TB, 2TB, and 4TB, while enterprise-grade SSDs can reach capacities of 16TB, 32TB, 64TB, 128TB, or even higher. Larger capacity SSDs can store more files, applications, and data, meeting the ever-increasing demand for data storage.
[0047] Testing random write performance requires preprocessing, and larger capacity SSDs mean longer preprocessing times, which poses a challenge to quickly testing SSD random write performance.
[0048] Based on the aforementioned issues, the method provided in this disclosure obtains the random write performance of the entire SSD capacity as the target performance; adjusts the user capacity according to the target performance, and obtains the target capacity through testing; clears all user data on the entire disk; sets the SSD user capacity to the target capacity, and performs a rapid random write performance test to obtain the rapid performance test results. This method ensures consistent random write performance and significantly reduces testing time.
[0049] Figure 1 This is a flowchart illustrating an SSD phased verification test method 100 provided in Embodiment 1 of this disclosure, as shown below. Figure 1 As shown, it includes the following steps:
[0050] In step S101, the random write performance of the entire SSD capacity is obtained as the target performance.
[0051] In step S102, the user capacity is adjusted according to the target performance, and the target capacity is obtained through testing;
[0052] In step S103, all user data for the entire disk capacity is cleared;
[0053] In step S104, the SSD user capacity is set according to the target capacity, and a quick random write performance test is performed to obtain the quick performance test results.
[0054] In some embodiments, a phased verification test method for SSDs provided in this disclosure is described in detail. Figure 2 This is a flowchart illustrating an SSD phased verification test method 200 provided in Embodiment 2 of this disclosure, as shown below. Figure 2 As shown, it includes the following steps:
[0055] In step S201, the random write performance of the entire SSD capacity is tested, and the test performance result of the entire capacity is used as the target performance.
[0056] In step S202, the available capacity of the SSD is adjusted to the current user capacity using the short stroke method.
[0057] In step S203, a random write performance test is performed on the current user capacity of the SSD.
[0058] In step S204, the current user capacity performance test result is compared with the target performance. If they match, step S205 is executed. If they do not match, steps S202-S204 are repeated until the current user capacity performance test result matches the target performance.
[0059] In some embodiments, if the performance test result of the current user capacity is less than the target performance, the shortstroke method is used to reduce the current user capacity; if the performance test result is greater than the target performance, the shortstroke method is used to increase the current user capacity.
[0060] In step S205, the current user capacity value is used as the target capacity.
[0061] In step S206, all user data on the entire SSD disk is cleared.
[0062] By executing the erase command, all user data on the SSD is completely erased.
[0063] In some embodiments, a sanitize operation is performed to erase data on a standard capacity disk. The sanitize function is a data security erasure technology primarily used to completely erase data on an SSD, ensuring that the data cannot be recovered.
[0064] In step S207, the SSD user capacity is set according to the target capacity.
[0065] In some embodiments, the target capacity is obtained in step S205.
[0066] In step S208, a random write performance test is performed on the set user capacity to obtain the performance test results. The following will describe the above method in detail with reference to some specific embodiments:
[0067] Figure 3 The flowchart of the method 300 for obtaining the target capacity by measuring the random write performance of the entire SSD disk as the target performance in Embodiment 3 of this disclosure, and testing the target capacity based on the target performance, is shown below. Figure 3 As shown, it includes the following steps:
[0068] In step S301, a preprocessing operation is performed on the standard capacity SSD to bring the SSD to a steady state.
[0069] In some embodiments, the standard capacity SSD can be a consumer-grade SSD with capacities including 256GB, 512GB, 1TB, 2TB, and 4TB; or an enterprise-grade SSD with capacities including 16TB, 32TB, 64TB, 128TB, or even higher.
[0070] In some embodiments, the preprocessing operation includes two workload operations: performing a second preset number of sequential write operations under a first workload, and performing a third preset number of random write operations under a second workload.
[0071] In some embodiments, the first workload operation is: setting the performance testing tool parameters blocksize=128KB, iodepth=1024, numjobs=1, and performing two sequential write operations on the entire disk; the second workload operation is: setting the performance testing tool parameters blocksize=4KB, iodepth=8, numjobs=64, and performing two random write operations on the entire disk.
[0072] The two workload operations described above completed the preprocessing of the standard capacity SSD, bringing it to a steady state.
[0073] In step S302, a random write performance test is performed on the standard capacity, and the result of the random write performance test on the standard capacity is used as the target performance.
[0074] In some embodiments, the current user capacity is the standard SSD capacity, i.e., the total disk capacity.
[0075] In some embodiments, the performance testing tool uses FIO. FIO is an I / O tool used to stress test and verify SSD hardware. The parameters blocksize, iodepth, numjobs, and runtime are the test runtime (in seconds).
[0076] In some embodiments, performance test parameters blocksize=4KB, iodepth=8, numjobs=64, runtime=600 are set to perform random write performance test on the current user capacity.
[0077] In some embodiments, after obtaining the random write performance of the entire SSD capacity as the target performance, the user capacity is adjusted using the short stroke method based on the target performance, and the target capacity is obtained through testing.
[0078] In step S303, it is determined whether this is the first performance test; if yes, proceed to step S304; if no, proceed to step S305.
[0079] In step S304, the short stroke method is used to set the current user capacity value to the first preset ratio of the total disk capacity, and then step S308 is executed.
[0080] In some embodiments, the first preset ratio is 1 / 4. Taking 16 channels as an example, when the first preset ratio is 1 / 4, all LUNs are used, that is, it is still a full 16-channel configuration, but each LUN only uses 1 / 4 of the physical block count.
[0081] In some embodiments, the short stroke method reduces the physically accessible address range by a set value, thereby reducing the SSD user capacity for adaptation, while still allowing the SSD to access all dies internally. Specifically, the short stroke method is defined in JESD218B section 6.2.1 Short Stroke Extrapolation Method. By artificially reducing the SSD user capacity, some flash chips will not be written to, while the remaining flash chips will be cycled (P / E) more quickly. This method is often called "short stroke," similar to the technique of using a hard drive to access only a portion of the storage disk. The short stroke method is not simply about reducing the logical range of written data. While reducing the logical range of written data, the normal internal operation of the SSD must not be distorted, and all dies must still be accessible. For example, it may be necessary to reduce the number of free storage blocks, while ensuring that the write amplification factor and the SSD's ability to accommodate bad blocks remain unchanged.
[0082] Here, a die refers to an individual flash memory chip, which is the basic building block of NAND Flash. Each die contains multiple channels and storage cells, responsible for storing and transmitting data.
[0083] In step S305, the performance test result of the current user capacity is compared with the target performance. If the performance test result is less than the target performance, step S306 is executed: the current user capacity is reduced using the short stroke method; if the performance test result is greater than the target performance, step S307 is executed: the current user capacity is increased using the short stroke method. The performance tested here can be random write performance.
[0084] In some embodiments, the current user capacity is reduced / increased according to the capacity formula; the capacity formula used is the formula provided in Section 4 of JESD218B, SSD Capacity: User-addressable LBA count = 21168 + (1953504 x SSD Capacity in Gbytes).
[0085] In step S308, the current user capacity is preprocessed to bring the SSD to a steady state.
[0086] In some embodiments, the preprocessing operation includes two workload operations: a first workload performing a preset number of sequential writes and a second workload performing a preset number of random writes.
[0087] In some embodiments, the first workload operation is: setting the performance testing tool parameters blocksize=128KB, iodepth=1024, numjobs=1, and performing two sequential write operations on the current user capacity; the second workload operation is: setting the performance testing tool parameters blocksize=4KB, iodepth=8, numjobs=64, and performing two random write operations on the current user capacity.
[0088] The two workload operations described above completed the preprocessing of the current user capacity, bringing the SSD to a steady state.
[0089] In step S309, a random write performance test is performed on the current user capacity of the SSD.
[0090] In some embodiments, performance test parameters blocksize=4KB, iodepth=8, numjobs=64, runtime=600 are set to perform random write performance tests on the current user capacity.
[0091] In step S310, the performance test results of the current user capacity are compared with the target performance. If they are inconsistent, steps S305-S310 are executed; if they are consistent, step S311 is executed.
[0092] In step S311, the first prediction number of random write operations is performed on the current user capacity.
[0093] In some embodiments, the performance test parameters blocksize=4KB, iodepth=8, numjobs=64, runtime=600 are set to perform a random write performance test on the current user capacity based on the predicted number of writes.
[0094] In some embodiments, the first preset number of times is a positive integer greater than or equal to 0, for example, it can be 6 times.
[0095] In step S312, the performance test results of the first prediction count are compared with the target performance. If they are inconsistent, steps S305-S312 are executed; if they are consistent, step S313 is executed.
[0096] In some embodiments, if any comparison is inconsistent, steps S305-S312 are executed.
[0097] In some embodiments, if all comparisons are consistent, then step S313 is performed.
[0098] In step S313, the current user capacity value is used as the target capacity, which will be used as the user capacity value for quick performance testing.
[0099] In some embodiments, if the preset number of times is 0, then in step S311, the current user capacity value is used as the target capacity, and the target capacity is used as the user capacity value for quick performance testing.
[0100] Figure 4 A flowchart illustrating the method 400 provided in Embodiment 4 of this disclosure for setting the SSD user capacity to the target capacity, performing a random write performance quick test, and obtaining the performance quick test results is shown below. Figure 4 As shown, it includes the following steps:
[0101] In step S401, the SSD user capacity is set according to the target capacity.
[0102] In some embodiments, the short stroke method is used to set the SSD user capacity according to the target capacity using the capacity formula. The capacity formula used is the one provided in Section 4 of JESD218B, SSD Capacity: User-addressable LBA count = 21168 + (1953504 x SSD Capacity in Gbytes).
[0103] In step S402, the SSD user capacity is preprocessed to bring the SSD to a steady state.
[0104] In some embodiments, the preprocessing operation includes two workload operations: performing a second preset number of sequential write operations under a first workload, and performing a third preset number of random write operations under a second workload.
[0105] In some embodiments, the first workload involves setting the performance testing tool's parameters blocksize=128KB, iodepth=1024, and numjobs=1 to perform two sequential write operations on the SSD user capacity; the second workload involves setting the performance testing tool's parameters blocksize=4KB, iodepth=8, and numjobs=64 to perform two random write operations on the SSD user capacity.
[0106] The two workload operations described above completed the preprocessing of the SSD user capacity, bringing the SSD to a steady state.
[0107] In step S403, a random write performance test is performed on the SSD user capacity.
[0108] In some embodiments, performance test parameters blocksize=4KB, iodepth=8, numjobs=64, runtime=600 are set to perform random write performance tests on SSD user capacity.
[0109] In step S404, the performance test results of the random write performance test are recorded, and the current version is analyzed to determine if it is abnormal.
[0110] Figure 5 The diagram shows the IOPS of an embodiment of this disclosure. As can be seen from the performance curve of random write, the random write performance consistency of this test method exceeds 95%, and the random write performance curve does not have large abnormal fluctuations, so the data results can be guaranteed.
[0111] contrast Figure 6 The time taken to preprocess to steady-state and random write performance in the IOPS diagram without using the method of this disclosure is reduced by a factor of two after using the testing method of this disclosure. Figure 6 and Figure 5 As shown, for a 16TB user-capacity hard drive, from the start of preprocessing until reaching steady state, Figure 5 The time to start random write testing was reduced to [time to be specified]. Figure 6 It reduces testing efficiency by one-quarter of that of conventional testing methods, significantly shortening the preprocessing time and improving testing efficiency.
[0112] The method disclosed herein has the following technical effects:
[0113] Rapid performance evaluation during the R&D phase can reduce testing time from hours or days to minutes, shortening the testing cycle.
[0114] Because performance results can be obtained quickly, low-frequency, phased verification can be increased to multiple executions per day. This eliminates the need to occupy costly equipment for extended periods and allows for an increase in the types of tests performed within the same timeframe, thereby improving test coverage.
[0115] Accelerating the identification of performance issues during the development phase allows for rapid diagnosis of anomalies, improving development and iteration efficiency, and reducing the impact on the product by identifying more risk points.
[0116] It should be understood that, although Figure 1-4 The steps in the flowchart are shown sequentially as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order in which these steps are executed, and they can be performed in other orders. Figure 1-4 At least some of the steps in the process may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but may be executed at different times. The execution order of these steps or stages is not necessarily sequential, but may be executed in turn or alternately with other steps or at least some of the steps or stages in other steps.
[0117] It is understood that the same / similar parts between the various embodiments of the methods described above in this specification can be referred to each other. Each embodiment focuses on the differences from other embodiments, and relevant parts can be referred to the description of other method embodiments.
[0118] This disclosure also provides a storage device, which includes a processor and a memory. The processor contains multiple cores, and the memory stores a computer program. When the computer program is executed by the processor, it can implement the methods of any of the above embodiments. The execution method and beneficial effects are similar and will not be described again here.
[0119] Figure 7 This is a schematic diagram of the structure of a storage device provided in an embodiment of this disclosure, such as... Figure 7 As shown, the storage device may include a processor 710 and a memory 720, wherein the memory 720 stores a computer program. When the computer program is executed by the processor 710, it can implement the method provided in any of the above embodiments. The execution method and beneficial effects are similar and will not be described again here.
[0120] Of course, for the sake of simplicity, Figure 7 Only some of the components of the storage device relevant to this invention are shown; components such as buses, input / output interfaces, input devices, and output devices are omitted. In addition, the storage device may include any other suitable components depending on the specific application.
[0121] This disclosure provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, it can implement the methods of any of the above embodiments. The execution method and beneficial effects are similar, and will not be described again here.
[0122] The aforementioned computer-readable storage medium may be any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may, for example, include, but is not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: electrical connections having one or more wires, portable disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.
[0123] The computer program described above can be written in any combination of one or more programming languages to perform the operations of the embodiments of this disclosure. The programming languages include object-oriented programming languages such as Java and C++, as well as conventional procedural programming languages such as C or similar languages. The program code can be executed entirely on the user's computer device, partially on the user's device, as a standalone software package, partially on the user's computer device and partially on a remote computer device, or entirely on a remote computer device or server.
[0124] Furthermore, while the operations are described in a specific order, this should not be construed as requiring these operations to be performed in the specific order shown or in a sequential order. In certain environments, multitasking and parallel processing may be advantageous. Similarly, while several specific implementation details are included in the above discussion, these should not be construed as limiting the scope of this disclosure. Certain features described in the context of individual embodiments may also be implemented in combination in a single embodiment. Conversely, various features described in the context of a single embodiment may also be implemented individually or in any suitable sub-combination in multiple embodiments.
[0125] The above description is merely a specific embodiment of this disclosure, enabling those skilled in the art to understand or implement it. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this disclosure. Therefore, this disclosure is not to be limited to the embodiments described herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A phased verification test method for SSDs, characterized in that, The method includes: The target performance is the random write performance of the entire SSD capacity. Adjust user capacity based on the target performance, and obtain the target capacity through testing; Clear all user data from the entire disk. Set the SSD user capacity according to the target capacity, perform a quick random write performance test, and obtain the quick performance test results. The step of adjusting user capacity according to the target performance and obtaining the target capacity through testing includes: adjusting the available capacity of the SSD to the current user capacity, setting the current user capacity value as a first preset proportion of the total disk capacity; performing a random write performance test on the current user capacity of the SSD; comparing the performance test result of the current user capacity with the target performance, and if they are consistent, then using the value of the current user capacity as the target capacity. The method further includes: comparing the performance test results of the current user capacity with the target performance; if they are inconsistent, then continuing to adjust the current user capacity of the SSD and performing random write performance tests on the current user capacity of the SSD until the performance test results of the current user capacity are consistent with the target performance. The adjustment of the current user capacity of the SSD includes: adjusting the current user capacity of the SSD using the short stroke method; wherein the short stroke method reduces the physically accessible address range according to a set value under the premise that the actual physical space remains unchanged, thereby reducing the user capacity of the SSD for adaptation, and the SSD can still access all dies, wherein the die is the basic building block of NAND Flash.
2. The method according to claim 1, characterized in that, If there is a discrepancy, the current user capacity of the SSD will continue to be adjusted, including: If the performance test result is less than the target performance, the current user capacity will be reduced; if the performance test result is greater than the target performance, the current user capacity will be increased.
3. The method according to claim 1, characterized in that, The step of comparing the performance test results of the current user capacity with the target performance, and if they are consistent, then using the current user capacity value as the target capacity, includes: Perform a first prediction number of random write operations on the current user capacity. If the performance test results are consistent with the target performance, then the current user capacity value is taken as the target capacity.
4. The method according to any one of claims 1-3, characterized in that, Before setting the SSD user capacity according to the target capacity and conducting a quick random write performance test, the following steps are also included: The user capacity of the SSD is preprocessed to bring the SSD to a steady state.
5. The method according to claim 4, characterized in that, The preprocessing operations include: Perform a second preset number of sequential write operations under the first load, and perform a third preset number of random write operations under the second load.
6. The method according to claim 5, characterized in that, The user data whose entire disk space is wiped includes: By executing the erase command, all user data on the SSD is completely erased.
7. A storage device, characterized in that, include: The system includes a memory and a processor, wherein the processor contains multiple cores, and the memory stores a computer program that, when executed by the processor, implements the SSD phased verification test method as described in any one of claims 1-6.
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